A depth micrometer error detector

Abstract

The utility model discloses a kind of depth micrometer indication error testing tools, including testing tool base, support leg, depth micrometer and detection mechanism, four support legs are symmetrically fixed at the bottom four corners of testing tool base, detection mechanism is set at the top of testing tool base, and depth micrometer is connected and locked in detection mechanism.In the utility model, by setting detection mechanism, and then by depth micrometer measuring plate, baffle, standard gauge block are jointly combined to form detection structure, and by the connecting point of vertical and parallel arrangement, so that depth micrometer is detected, its measuring end is completely parallel with standard gauge block, avoid skew and cause data deviation, simultaneously adopt standard gauge block as reference, only need to compare micrometer reading and gauge block calibration size directly when detecting, eliminate the sight error of artificial alignment scale line, significantly improve detection reliability, traditional method needs to read micrometer and testing tool scale simultaneously.

Description

Technical Field

[0001] This utility model relates to an indication error gauge, specifically a depth micrometer indication error gauge, and belongs to the technical field of indication error gauges. Background Technology

[0002] A depth micrometer is a high-precision length measuring tool designed based on the principle of screw pair transmission. It consists of a micrometer drum, a fixed sleeve, a measuring rod, a base, a force measuring device, and a locking device. It is mainly used to measure geometric dimensions such as hole depth, groove depth, step height, and shoulder length. As a high-precision measuring tool, the indication error of the depth micrometer directly affects the reliability of engineering measurement results. In order to ensure the measurement accuracy of the depth micrometer, it is generally necessary to use an indication error checker to inspect the depth micrometer.

[0003] However, most existing indication error gauges have various problems. For example, in the depth micrometer indication error gauge disclosed in publication number CN201637364U, although it can reduce the discrepancy caused by reading parallax and improve the accuracy of judging whether the depth micrometer indication is qualified, in this technical solution and most current indication error gauges, when testing the depth micrometer, some gauges are limited by mechanical structure. The coaxiality of the micrometer screw and the micrometer drum is easily affected by wear, resulting in axial movement and radial oscillation of the screw, which easily leads to data fluctuations during measurement. In addition, current gauges rely on the operator's naked eye to align the micrometer drum scale line with the fixed sleeve baseline. Affected by factors such as viewing angle deviation and lighting conditions, parallax error is easily generated, which leads to inaccurate readings and makes accurate measurement impossible. Utility Model Content

[0004] This utility model provides a solution that is significantly different from existing technologies, addressing the problem that existing technologies are too simplistic. Specifically, the purpose of this utility model is to solve the aforementioned shortcomings of existing technologies by proposing a depth micrometer indication error gauge.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] A depth micrometer indication error gauge includes a gauge base, support legs, a depth micrometer, and a detection mechanism. The four support legs are symmetrically fixed at the four corners of the bottom of the gauge base. The detection mechanism is located on the top of the gauge base, and the depth micrometer is connected and locked inside the detection mechanism.

[0007] The testing mechanism includes a micrometer measuring plate, a baffle, standard gauge blocks, and a locking unit. A through hole is provided through the center of the micrometer measuring plate. One end of the micrometer is connected to the through hole, and the other end is provided with a micrometer ratchet. The baffle is located on the top of the fixture base. The standard gauge blocks are located between the micrometer measuring plate and the baffle, and the standard gauge blocks are respectively perpendicular to the micrometer measuring plate and the baffle.

[0008] As a further embodiment of this utility model: the locking unit includes a support rod, a docking rod, and a locking rod. The support rod is vertically fixed to the top of the fixture base and has a circular hole through it. One end of the docking rod is inserted into the circular hole, and the locking rod is coaxially fixed to the other end of the docking rod.

[0009] As a further embodiment of this utility model: a threaded hole is provided through the end of the locking rod away from the connecting rod, and a clamping screw is connected in the threaded hole by threaded engagement. One end of the clamping screw abuts against the depth micrometer measuring plate, and at least two sets of locking units are symmetrically arranged on the gauge base.

[0010] As a further improvement of this utility model: the baffle has fixing holes through both ends, and locking screws are inserted into the fixing holes; the top of the inspection base has locking screw holes, and the locking screws are screwed into the locking screw holes.

[0011] As a further improvement of this utility model: the top of the inspection tool base is recessed with a slot, the slot is perpendicular to the baffle, and the standard gauge block is placed in the slot.

[0012] As a further improvement of this utility model: two card slots and two standard gauge blocks are respectively arranged in parallel, and the two are arranged in a one-to-one correspondence.

[0013] The beneficial effects of this utility model are:

[0014] In this invention, a detection mechanism is set up, and a detection structure is formed by combining a depth micrometer measuring plate, a baffle, and a standard gauge block. Through vertical and parallel connection points, the measuring end of the depth micrometer is completely parallel to the standard gauge block when being tested, avoiding data deviation caused by skew. At the same time, using the standard gauge block as a reference, during the test, only the micrometer reading needs to be directly compared with the gauge block's calibrated size, eliminating the line-of-sight error caused by manual alignment of the scale lines, and significantly improving the reliability of the test. Traditional methods require simultaneous reading of the micrometer and the gauge scale, while the new solution only requires a single reading of the micrometer data, reducing operation steps and human intervention, and improving the testing efficiency. In addition, the setting of the locking unit ensures that the depth micrometer can be firmly locked, preventing shaking during the test. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0016] Figure 2 This is a schematic diagram of the inspection fixture base and its connection structure of the present invention;

[0017] Figure 3 This is a top view of the structure of this utility model;

[0018] Figure 4 This is a schematic diagram of the elevation structure of this utility model.

[0019] In the diagram: 1. Inspection base, 2. Support leg, 3. Depth micrometer, 4. Inspection mechanism, 41. Depth micrometer measuring plate, 42. Baffle, 43. Standard gauge block, 44. Support rod, 45. Connecting rod, 46. Locking rod, 47. Clamping screw, 5. Depth micrometer ratchet, 6. Fixing hole, 7. Locking screw hole, 8. Locking screw, 9. Slot. Detailed Implementation

[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0021] Example 1, as Figures 1 to 4 As shown, a depth micrometer indication error gauge includes a gauge base 1, support legs 2, a depth micrometer 3, and a detection mechanism 4. The four support legs 2 are symmetrically fixed at the four corners of the bottom of the gauge base 1. The detection mechanism 4 is set on the top of the gauge base 1, and the depth micrometer 3 is connected and locked in the detection mechanism 4.

[0022] The inspection mechanism 4 includes a micrometer measuring plate 41, a baffle 42, a standard gauge block 43, and a locking unit. A through hole is provided through the center of the micrometer measuring plate 41. One end of the micrometer 3 is connected to the through hole, and the other end is provided with a micrometer ratchet 5. The baffle 42 is provided on the top of the inspection tool base 1. The standard gauge block 43 is provided between the micrometer measuring plate 41 and the baffle 42, and the standard gauge block 43 is perpendicular to the micrometer measuring plate 41 and the baffle 42 respectively.

[0023] The locking unit includes a support rod 44, a connecting rod 45, and a locking rod 46. The support rod 44 is vertically fixed to the top of the fixture base 1, and a round hole is provided through the support rod 44. One end of the connecting rod 45 is inserted into the round hole, and the locking rod 46 is coaxially fixed to the other end of the connecting rod 45. A threaded hole is provided through the end of the locking rod 46 away from the connecting rod 45, and a clamping screw 47 is connected in the threaded hole through the threaded engagement. One end of the clamping screw 47 abuts against the depth micrometer measuring plate 41, and at least two sets of locking units are symmetrically arranged on the fixture base 1.

[0024] In this invention, a detection mechanism 4 is set up, and a detection structure is formed by combining a depth micrometer measuring plate 41, a baffle 42, and a standard gauge block 43. Through vertical and parallel connection points, the measuring end of the depth micrometer 3 is completely parallel to the standard gauge block 43 when being tested, avoiding data deviation caused by skew. At the same time, using the standard gauge block 43 as a reference, during the test, only the micrometer reading needs to be directly compared with the gauge block's calibrated size, eliminating the line-of-sight error caused by manual alignment of the scale lines, and significantly improving the reliability of the test. Traditional methods require simultaneous reading of the micrometer and the gauge scale, while the new solution only requires a single reading of the micrometer data, reducing operation steps and human intervention, and improving the testing efficiency. At the same time, the setting of the locking unit ensures that the depth micrometer 3 can be firmly locked, preventing shaking during the test.

[0025] Example 2, as Figures 1 to 4 As shown, in addition to all the technical features included in Embodiment 1, this embodiment also includes:

[0026] The baffle 42 has fixing holes 6 through both ends, and locking screws 8 are inserted into the fixing holes 6. The top of the inspection base 1 has locking screw holes 7, and the locking screws 8 are screwed into the locking screw holes 7. The baffle 42 can be quickly disassembled and assembled through the locking screws 8.

[0027] The top of the fixture base 1 is recessed with a slot 9. The slot 9 is perpendicular to the baffle 42, and the standard gauge block 43 is placed in the slot 9. The slot 9 limits the standard gauge block 43 so that it can be quickly placed on the fixture base 1.

[0028] There are two parallel slots 9 and two standard gauge blocks 43, and they are arranged in a one-to-one correspondence. By setting the slots 9 and standard gauge blocks 43 in parallel, it is ensured that the standard gauge blocks 43 are completely perpendicular to the depth micrometer measuring plate 41 and the baffle 42, so as to avoid measurement errors caused by skew.

[0029] When using this indication error gauge, measurements are taken at points 0, 5.12, 10.24, 15.36, 21.5, and 25 on the depth micrometer 3. The depth micrometer 3 is fixed to the gauge, and the baffle 42 is fixed to the gauge base 1 as the measuring surface, contacting and perpendicular to the measuring rod. The depth micrometer measuring plate 41 is then tightened by the clamping screw 47. Two high-precision, equal standard gauge blocks 43 are placed in the middle to ensure that the measuring rod, baffle 42, and depth micrometer measuring plate 41 are all perpendicular. During measurement, for different points, standard gauge blocks 43 of different specifications are placed between the measuring rod and baffle 42, and the micrometer head sleeve is rotated. After the probe contacts the standard gauge block 43, rotate the depth micrometer ratchet 5. A fixed measuring force will be output to ensure that the measuring surface of the probe and the measuring surface of the standard gauge block 43 are in close and constant contact. Compare the value of the mechanical micrometer head or the value of the electronic reading head with the value of the measured block. If there is an error, it is the indication error. The detection values ​​at different points and the corresponding standard gauge blocks 43 can be plotted as a line graph. By observing the linear relationship of the indicated values, we can see whether the indicated values ​​correspond one-to-one with the standard values ​​of the standard gauge blocks 43. This allows for multi-point detection of indication error. Alternatively, different gauge blocks can be used as depth detection values ​​across the entire range. The final error value can be used as a reference to calibrate or adjust the depth micrometer.

[0030] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0031] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A depth micrometer indication error gauge, comprising a gauge base (1), a support leg (2), a depth micrometer (3), and a detection mechanism (4), characterized in that, The four support legs (2) are symmetrically fixed at the four corners of the bottom of the inspection base (1), the inspection mechanism (4) is set on the top of the inspection base (1), and the depth micrometer (3) is connected and locked inside the inspection mechanism (4). The testing mechanism (4) includes a micrometer measuring plate (41), a baffle (42), a standard gauge block (43), and a locking unit. A through hole is provided in the center of the micrometer measuring plate (41). One end of the micrometer (3) is connected to the through hole, and the other end is provided with a micrometer ratchet (5). The baffle (42) is provided on the top of the fixture base (1). The standard gauge block (43) is provided between the micrometer measuring plate (41) and the baffle (42), and the standard gauge block (43) is perpendicular to the micrometer measuring plate (41) and the baffle (42) respectively.

2. The depth micrometer indication error gauge according to claim 1, characterized in that: The locking unit includes a support rod (44), a docking rod (45), and a locking rod (46). The support rod (44) is vertically fixed to the top of the fixture base (1), and a round hole is provided through the support rod (44). One end of the docking rod (45) is inserted into the round hole, and the locking rod (46) is coaxially fixed to the other end of the docking rod (45).

3. The depth micrometer indication error measuring tool according to claim 2, characterized in that: The locking rod (46) has a threaded hole at one end away from the docking rod (45), and a clamping screw (47) is connected in the threaded hole by threaded engagement. One end of the clamping screw (47) abuts against the depth micrometer measuring plate (41), and at least two sets of locking units are symmetrically arranged on the gauge base (1).

4. The depth micrometer indication error measuring tool according to claim 1, characterized in that: The baffle (42) has a fixing hole (6) through both ends, and a locking screw (8) is inserted into the fixing hole (6). The top of the inspection base (1) has a locking screw hole (7), and the locking screw (8) is screwed into the locking screw hole (7).

5. The depth micrometer indication error measuring tool according to claim 1, characterized in that: The top of the gauge base (1) is recessed with a slot (9), the slot (9) is perpendicular to the baffle (42), and the standard gauge block (43) is placed in the slot (9).

6. The depth micrometer indication error measuring tool according to claim 5, characterized in that: The card slot (9) and the standard gauge block (43) are arranged in parallel with each other, and the two are arranged in a one-to-one correspondence.

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