Double-station 3D line scanning measuring instrument
By employing a dual-station design and a multi-directional moving module drive, the problem of low working efficiency in existing 3D line scanning measuring instruments has been solved, enabling efficient and continuous operation of workpiece inspection and convenient disassembly and assembly of the probe, thereby improving inspection efficiency and accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- DONGGUAN KOMANI PRECISION OPTICAL MEASUREMENT TECH CO LTD
- Filing Date
- 2025-09-04
- Publication Date
- 2026-06-19
AI Technical Summary
Existing 3D line scanning measurement equipment suffers from low working efficiency and inconvenient probe disassembly, assembly, and movement, resulting in low detection efficiency and failing to meet the demand for rapid detection of batch workpieces.
A dual-station 3D line scanning measuring instrument was designed. It uses two independent workpiece placement plates and a multi-directional moving module to drive the probe, realizing the alternating operation of the workpiece in two stations and the flexible movement of the probe. Combined with magnetic attraction and quick-release connection, the installation and replacement of the probe are simplified.
It enables efficient and continuous operation of workpiece inspection, reduces waiting time, increases the effective working time of the probe, simplifies the installation and disassembly process of the probe, and improves inspection efficiency and accuracy.
Smart Images

Figure CN224382551U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of measuring instrument technology, specifically a dual-station 3D line scan measuring instrument. Background Technology
[0002] In the current field of 3D line scanning measurement, most measuring equipment used for precision workpiece inspection in industrial applications adopts a single-station design. This means the equipment is equipped with only one support structure for placing the workpiece, and this support structure typically lacks an independent moving drive mechanism. In actual inspection operations, when the probe performs 3D line scanning inspection on the workpiece on the support structure, the operator must wait until the entire inspection process is completely finished, and the probe has stopped working and the support structure is stationary before approaching the equipment to remove the inspected workpiece and place the workpiece to be inspected.
[0003] During this process, the workstations remain idle for extended periods, preventing simultaneous inspection and workpiece loading / unloading, resulting in significant time waste and a slow overall workflow. Furthermore, the existing equipment's probes can only be adjusted in a single direction, lacking a flexible multi-directional movement mechanism. After inspecting one workpiece, to inspect the next, the machine must be stopped to adjust the probe position to accommodate the new workpiece, or the workpiece's placement on the support structure must be manually adjusted. This frequently leaves the probes idle, drastically reducing the equipment's effective working time and failing to fully utilize the probe's inspection capabilities. Ultimately, this leads to low overall efficiency of the measuring equipment, making it difficult to meet the actual needs of rapid inspection of batch workpieces.
[0004] In addition, most probes are fixed by multiple sets of bolts, which require repeated calibration of the probe position during installation and the use of special tools to tighten each bolt one by one. The operation is cumbersome and time-consuming. Although some equipment attempts to simplify the installation structure, it lacks an effective pre-positioning mechanism, which is prone to probe installation misalignment. Multiple disassemblies and adjustments are required to ensure positioning accuracy. Utility Model Content
[0005] In order to overcome the shortcomings of existing technical solutions, this utility model provides a dual-station 3D line scanning measuring instrument, which can effectively solve the technical problems of low working efficiency and inconvenient disassembly and assembly of the probe in current 3D line scanning measuring instruments.
[0006] The technical solution adopted by this utility model to solve its technical problem is:
[0007] The dual-station 3D line scanning measuring instrument includes a test platform and a gantry frame fixedly installed on both sides of the test platform. The test platform is provided with two workpiece placement plates for placing the workpieces to be inspected. Each workpiece placement plate is correspondingly configured with a first moving module. The first moving module is connected to the workpiece placement plate in a transmission manner and drives the corresponding workpiece placement plate to move in the front-back direction.
[0008] The gantry frame is equipped with a probe for 3D line scanning inspection of the workpiece. A second moving module is connected between the probe and the gantry frame. The second moving module is used to drive the probe to move in the left and right direction. A third moving module is also connected between the probe and the second moving module. The third moving module is used to drive the probe to move in the up and down direction.
[0009] One end of the probe is connected to the third moving module via a mounting plate. The mounting plate has a slot, and the probe has a protrusion that inserts into the slot to form a limiting fit. The contact surfaces of the slot and the protrusion are respectively provided with magnetic blocks that magnetically engage. The probe is locked by a locking member inserted from the outside of the mounting plate.
[0010] Furthermore, the first moving module is distributed inside the test bench. The first moving module includes a first guide rail fixed in the front-to-back direction, a first slider that slides on the first guide rail and is fixed to the workpiece plate, and a first driving cylinder that drives the first slider to slide.
[0011] Furthermore, the test platform has an elongated hole extending in the front-to-back direction, and one end of the first slider extends through the elongated hole upwards towards the test platform and is fixed to the corresponding workpiece plate.
[0012] Furthermore, the second moving module includes a second guide rail fixed in the left-right direction on one side of the portal frame, a second slider sliding on the second guide rail and connected to the third moving module, and a second drive motor for driving the second slider to slide; the output end of the second drive motor is connected to a second drive screw arranged coaxially, and the second drive screw passes through the interior of the second slider and is connected by a screw thread to form a helical transmission.
[0013] Furthermore, the third moving module includes a fixed plate fixed to the second slider, a third guide rail fixed vertically on the fixed plate, a third slider sliding on the third guide rail and connected to the mounting plate, and a third drive cylinder for driving the third slider to slide.
[0014] Furthermore, the bottom of the test bench is connected to a frame for support and fixation. The test bench is covered with a semi-enclosed cover. The outer side of the cover is provided with two openable doors, a display screen for displaying test data, and a control panel for operation and control. The doors are distributed on opposite sides of the cover.
[0015] Compared with the prior art, the beneficial effects of this utility model are:
[0016] (1) By setting two workpiece placement plates independently controlled by the corresponding first moving module on the test bench, when one workpiece placement plate moves the workpiece to the underside of the probe for testing, the operator can place the workpiece to be tested or remove the tested workpiece on the other workpiece placement plate without waiting for the current test to end, thus eliminating the idle time of the workstation.
[0017] (2) The probe can move flexibly left and right and up and down through the second and third moving modules, and can quickly switch to the workstation to complete the loading and unloading of the workpiece. It does not need to stop for a long time due to the change of workpieces in a single workstation, which greatly improves the effective working time of the probe.
[0018] (3) The probe and the mounting plate are connected in a specific way to form a quick-release and quick-install structure, which is convenient for assembly and replacement. Attached Figure Description
[0019] Figure 1 This is a schematic diagram of the overall structure of an embodiment of the present utility model;
[0020] Figure 2 This is a schematic diagram of the test platform end face connection structure according to an embodiment of the present invention;
[0021] Figure 3 This is a schematic diagram of the internal connection structure of the test bench in an embodiment of this utility model;
[0022] Figure 4 This is an exploded view of the probe mounting structure according to an embodiment of the present invention;
[0023] Figure 5 This is an embodiment of the present utility model. Figure 4 Enlarged schematic diagram of section A in the middle;
[0024] Figure 6 This is a schematic diagram of the probe structure according to an embodiment of the present invention;
[0025] Numbering on the map:
[0026] 1-Testing platform, 2-Gantry frame, 3-Workpiece placement plate, 4-First moving module, 5-Probe, 6-Second moving module, 7-Third moving module, 8-Mounting plate, 9-Magnetic block, 10-Locking component, 11-Frame, 12-Machine cover, 13-Door leaf, 14-Display screen, 15-Control panel;
[0027] 101 - Elongated hole;
[0028] 401 - First guide rail, 402 - First slider, 403 - First drive cylinder;
[0029] 501 - Protrusion;
[0030] 601-Second guide rail, 602-Second slider, 603-Second drive motor, 604-Second drive screw;
[0031] 701-Fixed plate, 702-Third guide rail, 703-Third slider, 704-Third drive cylinder;
[0032] 801-slot. Detailed Implementation
[0033] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0034] like Figure 1-6 As shown, this utility model provides a dual-station 3D line scanning measuring instrument, which is mainly used for three-dimensional dimension inspection, appearance defect screening and geometric tolerance analysis of precision workpieces (such as automotive parts, electronic components, mold accessories, etc.) in the industrial field. It achieves efficient inspection through "alternating operation of dual stations + three-dimensional line scanning inspection".
[0035] The main structure of this measuring instrument consists of a test platform 1, a gantry frame 2, a workpiece placement plate 3, a first moving module 4, a probe 5, a second moving module 6, and a third moving module 7. The components work together to achieve dual-station 3D line scanning inspection of the workpiece, improving inspection efficiency and convenience.
[0036] The test bench 1 serves as the basic load-bearing component of the device, with gantry frames 2 fixedly installed on both sides. The gantry frames 2 span across the test bench 1, providing stable support for the subsequent installation of the probe 5 and related moving modules. The test bench 1 is equipped with two workpiece placement plates 3, arranged side-by-side, for placing the workpieces to be tested, enabling dual-station operation. While testing is being performed at one station, the other station can handle the loading and unloading of workpieces, reducing waiting time.
[0037] Each workpiece placement plate 3 is equipped with a corresponding first moving module 4, which is connected to the workpiece placement plate 3 via a transmission mechanism and is used to drive the workpiece placement plate 3 to move in the front-back direction. The first moving module 4 is distributed inside the test bench 1, and its specific structure includes a first guide rail 401, a first slider 402, and a first driving cylinder 403. The first guide rail 401 is fixed inside the test bench 1 in the front-back direction, and the first slider 402 is disposed on the first guide rail 401 and can slide along the extension direction of the first guide rail 401. The first slider 402 is fixedly connected to the corresponding workpiece placement plate 3.
[0038] To connect the first slider 402 with the workpiece placement plate 3, the test bench 1 has an elongated hole 101 extending in the front-to-back direction. One end of the first slider 402 passes through the elongated hole 101 and extends upwards towards the test bench 1, thereby fixing it to the workpiece placement plate 3. When the first drive cylinder 403 operates, it can drive the first slider 402 to slide along the first guide rail 401, thereby driving the workpiece placement plate 3 to move together with the first slider 402 in the front-to-back direction, conveying the workpiece to or from the detection position.
[0039] A probe 5 for 3D line scanning inspection of workpieces is mounted on the gantry frame 2. A second moving module 6 is connected between the probe 5 and the gantry frame 2, and the second moving module 6 drives the probe 5 to move in the left-right direction. The second moving module 6 includes a second guide rail 601, a second slider 602, and a second drive motor 603. The second guide rail 601 is fixed to one side of the gantry frame 2 in the left-right direction. The second slider 602 is disposed on the second guide rail 601 and can slide along the second guide rail 601. The second slider 602 is connected to a third moving module 7. The output end of the second drive motor 603 is connected to a second drive screw 604. The second drive screw 604 cooperates with the second slider 602. When the second drive motor 603 is working, the second drive screw 604 drives the second slider 602 to slide along the second guide rail 601, thereby driving the third moving module 7 and the probe 5 to move together in the left-right direction, realizing the position adjustment of the probe 5 in the left-right direction to adapt to the inspection requirements of workpieces of different widths.
[0040] A third moving module 7 is connected between the probe 5 and the second moving module 6. The third moving module 7 is used to drive the probe 5 to move vertically. The third moving module 7 includes a fixed plate 701, a third guide rail 702, a third slider 703, and a third driving cylinder 704. The fixed plate 701 is fixedly connected to the second slider 602 and moves with it. The third guide rail 702 is fixed to the fixed plate 701 vertically. The third slider 703 is mounted on the third guide rail 702 and can slide along it. The third slider 703 is connected to a mounting plate 8, which in turn is connected to the probe 5. When the third driving cylinder 704 operates, it drives the third slider 703 to slide along the third guide rail 702, thereby driving the probe 5 to move vertically via the mounting plate 8. This allows for position adjustment of the probe 5 in the vertical direction to meet the inspection requirements of workpieces of different heights.
[0041] One end of the probe 5 is connected to the third slider 703 of the third moving module 7 via a mounting plate 8. The mounting plate 8 has a slot 801, and the probe 5 has a protrusion 501. The protrusion 501 inserts into the slot 801, forming a limiting fit, which initially positions the probe 5 and prevents it from shifting horizontally. To further enhance the stability of the connection, magnetic blocks 9 are respectively provided on the contact surfaces of the slot 801 and the protrusion 501. The two sets of magnetic blocks 9 attract each other, forming a magnetic attraction fit, making the connection between the protrusion 501 and the slot 801 tighter. Simultaneously, the probe 5 is locked by a locking member 10 inserted from the outside of the mounting plate 8. The locking member 10 passes through the mounting plate 8 and engages with the protrusion 501 of the probe 5, firmly fixing the probe 5 to the mounting plate 8, preventing loosening during the testing process and ensuring testing accuracy. When it is necessary to replace or maintain the probe 5, simply remove the locking part 10 and overcome the attraction of the magnetic block 9 to remove the probe 5 from the mounting plate 8. The operation is convenient.
[0042] The bottom of the test bench 1 is connected to a support frame 11, which supports the entire device, ensuring its stability during operation and preventing it from shaking. A semi-enclosed cover 12 is installed on the test bench 1. The cover 12 protects the workpiece placement plate 3, the first moving module 4, and the probe 5 on the test bench 1, preventing external dust and impurities from entering the device and affecting the normal operation and testing accuracy of the components. It also prevents accidental injury to operators during the testing process.
[0043] The outer side of the machine cover 12 is equipped with two openable doors 13, a display screen 14 for displaying test data, and a control panel 15 for operation and control. The doors 13 are located on opposite sides of the machine cover 12. Operators can open the doors 13 to maintain the inside of the equipment; the display screen 14 can display the relevant test data of the workpiece detected by the probe 5 in real time, making it convenient for operators to view the test results; the control panel 15 is used by operators to operate and control the device, such as starting / stopping the test, adjusting the movement status of each moving module, etc., to achieve convenient control of the entire testing process.
[0044] When using this dual-station 3D line scanning measuring instrument for workpiece inspection, the operator first starts the device via the control panel 15, places the workpiece to be inspected on one of the workpiece placement plates 3, and controls the first moving module 4 corresponding to the workpiece placement plate 3 via the control panel 15. The first moving module 4 drives the workpiece placement plate 3 to move in the back-and-forth direction, conveying the workpiece to the inspection area below the probe 5. Subsequently, according to the size of the workpiece, the operator controls the second moving module 6 and the third moving module 7 via the control panel 15. The second moving module 6 drives the probe 5 to move in the left-right direction, and the third moving module 7 drives the probe 5 to move in the up-and-down direction, adjusting the probe 5 to a suitable inspection position. The probe 5 begins 3D line scanning inspection of the workpiece, and the test data generated during the inspection process is transmitted to the display screen 14 in real time, allowing the operator to view the inspection data.
[0045] During the workpiece inspection process at this station, the operator can place the next workpiece to be inspected on another workpiece placement plate 3, thus achieving pre-placement of the workpiece. After the first workpiece is inspected, the first moving module 4 drives the corresponding workpiece placement plate 3 to move the inspected workpiece out of the inspection area. At the same time, the other workpiece placement plate 3, driven by the corresponding first moving module 4, transports the workpiece to be inspected to the inspection area, and the probe 5 continues to perform inspection. This cycle is repeated to achieve continuous inspection at two stations, greatly improving inspection efficiency.
[0046] Compared with traditional technologies, this technical solution sets up two workpiece placement plates 3 on the test bench 1, each independently controlled by a corresponding first moving module 4. When one workpiece placement plate 3 moves a workpiece to be inspected under the probe 5, the operator can place the workpiece to be inspected or remove the inspected workpiece on the other workpiece placement plate 3 without waiting for the current inspection to finish, thus eliminating station idle time. The probe 5 can move flexibly left and right and up and down through the second moving module 6 and the third moving module 7, and can quickly switch to the station where workpiece loading and unloading is completed, without long downtime due to workpiece changes at a single station, greatly increasing the effective working time of the probe 5. The probe 5 and the mounting plate 8 can form a quick-release and quick-install structure through a specific connection method, which is convenient for assembly and replacement.
[0047] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within this invention, and no reference numerals in the claims should be construed as limiting the scope of the claims.
Claims
1. A double-station 3D line scanning measuring instrument comprising a test table and a portal frame fixedly installed on both sides of the test table, characterized in that: The test bench is provided with two workpiece placement plates for placing the workpieces to be tested. Each workpiece placement plate is equipped with a first moving module. The first moving module is connected to the workpiece placement plate in a transmission manner and drives the corresponding workpiece placement plate to move in the front-back direction. The gantry frame is equipped with a probe for 3D line scanning inspection of the workpiece. A second moving module is connected between the probe and the gantry frame. The second moving module is used to drive the probe to move in the left and right direction. A third moving module is also connected between the probe and the second moving module. The third moving module is used to drive the probe to move in the up and down direction. One end of the probe is connected to the third moving module via a mounting plate. The mounting plate has a slot, and the probe has a protrusion that inserts into the slot to form a limiting fit. The contact surfaces of the slot and the protrusion are respectively provided with magnetic blocks that magnetically engage. The probe is locked by a locking member inserted from the outside of the mounting plate.
2. The dual-station 3D line scan measurement instrument of claim 1, wherein: The first moving module is distributed inside the test bench. The first moving module includes a first guide rail fixed in the front-to-back direction, a first slider that slides on the first guide rail and is fixed to the workpiece plate, and a first driving cylinder that drives the first slider to slide.
3. The dual-station 3D line scanning measuring instrument according to claim 2, characterized in that: The test bench has an elongated hole extending in the front-to-back direction. One end of the first slider passes through the elongated hole and extends upwards towards the test bench, where it is fixed to the corresponding workpiece plate.
4. The dual-station 3D line scanning measuring instrument according to claim 1, characterized in that: The second moving module includes a second guide rail fixed in the left-right direction on one side of the portal frame, a second slider sliding on the second guide rail and connected to the third moving module, and a second drive motor for driving the second slider to slide. The output end of the second drive motor is connected to a second drive screw arranged coaxially. The second drive screw passes through the interior of the second slider and is connected by a screw thread to form a helical transmission.
5. The dual-station 3D line scanning measuring instrument according to claim 4, characterized in that: The third moving module includes a fixed plate fixed to the second slider, a third guide rail fixed vertically on the fixed plate, a third slider sliding on the third guide rail and connected to the mounting plate, and a third drive cylinder for driving the third slider to slide.
6. The dual-station 3D line scanning measuring instrument according to any one of claims 1-5, characterized in that: The bottom of the test bench is connected to a frame for support and fixation. The test bench is covered with a semi-enclosed cover. On the outside of the cover, there are two openable doors, a display screen for displaying test data, and a control panel for operation and control. The doors are distributed on opposite sides of the cover.