A push-down chip test auxiliary device

Abstract

The utility model discloses a kind of down-pressing chip test auxiliary devices, it is related to chip test technical field;And the utility model includes shell, the lower surface of shell is rotatably equipped with base, the inside of shell is equipped with reset mechanism, the upper surface of shell is fixedly equipped with down-pressing mechanism, the reset mechanism includes top plate, and the inner surface of shell is slidably cooperated with top plate, the lower surface of top plate is slidably connected with multiple reset rods, the outside of multiple reset rods is all equipped with reset spring, the lower end of multiple reset rods is commonly fixedly equipped with reset plate, the upper surface of reset plate is fixedly equipped with multiple rectangular array distribution limit rods, the utility model is reset mechanism, after the automatic reset function of chip test equipment in testing is realized, the stability and accuracy of reset process are also ensured, improve the overall performance and reliability of down-pressing chip test auxiliary device.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically a pressure-type chip testing auxiliary device. Background Technology

[0002] The pressure-type chip testing auxiliary device is suitable for fields such as electronic manufacturing and semiconductor testing. It is especially useful on production lines that require frequent pressure testing, functional verification, or quality inspection of chips. It can stably and accurately apply pressure to the chip to simulate the stress state under actual working conditions, thereby effectively evaluating the chip's performance and reliability.

[0003] However, existing technologies still have the following problems:

[0004] Existing pressure-type chip testing auxiliary devices still suffer from technical problems such as difficulty in automatic reset after testing, instability in the reset process, and poor accuracy. In most existing devices, manual intervention is often required for reset after testing. This not only increases operational complexity but also makes it easy for human factors to cause inaccurate resets, thus affecting the accuracy and efficiency of subsequent tests. In addition, instability in the reset process may cause additional stress or damage to the chip testing equipment, shortening its service life.

[0005] To address the aforementioned problems, the inventors propose a pressure-type chip testing auxiliary device to solve them. Utility Model Content

[0006] To address the problems of difficulty in automatic reset, instability in the reset process, and poor accuracy, the purpose of this utility model is to provide a pressure-type chip testing auxiliary device.

[0007] To solve the above technical problems, this utility model adopts the following technical solution: a pressure-type chip testing auxiliary device, including a housing, a base rotatably mounted on the lower surface of the housing, a reset mechanism mounted on the inner side of the housing, and a pressure mechanism fixedly mounted on the upper surface of the housing. The reset mechanism includes a top plate, which slides in cooperation with the inner surface of the housing. A plurality of reset rods are slidably connected to the lower surface of the top plate. A reset spring is sleeved on the outer side of each of the plurality of reset rods. A reset plate is fixedly mounted on the lower end of the plurality of reset rods. A plurality of limiting rods arranged in a rectangular array are fixedly mounted on the upper surface of the reset plate. The limiting rods slide in contact with the outer side of the top plate. A chip testing device is fixedly mounted on the upper surface of the reset plate.

[0008] Preferably, the pressing mechanism includes a pressing frame, the lower surface of which is fixedly connected to the outer shell. A knob is provided on the upper part of the pressing frame, and a pressing screw is fixedly provided on the lower surface of the knob. The pressing screw is threadedly engaged with the inner side of the pressing frame. A pressure plate is rotatably provided at the lower end of the pressing screw. The lower surface of the pressure plate is in contact with the upper surface of the top plate. A storage groove is provided on the upper surface of the base.

[0009] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0010] This invention enables the chip testing equipment to automatically reset after testing through a reset mechanism, while also ensuring the stability and accuracy of the reset process, thus improving the overall performance and reliability of the pressure-type chip testing auxiliary device. Attached Figure Description

[0011] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0012] Figure 1 This is a schematic diagram of the structure of this utility model.

[0013] Figure 2 This is a schematic diagram of the reset mechanism of this utility model.

[0014] Figure 3 This is a cross-sectional schematic diagram of the pressing mechanism of this utility model.

[0015] In the diagram: 1. Outer shell; 2. Reset mechanism; 3. Pressing mechanism; 4. Base; 20. Reset plate; 21. Chip testing equipment; 22. Reset spring; 23. Reset rod; 24. Reset hole; 25. Top plate; 26. Limiting groove; 27. Limiting rod; 30. Pressing frame; 31. Knob; 32. Anti-slip texture; 33. Pressing screw; 34. Pressure plate; 35. Storage slot; 36. Anti-slip coating; 37. Moving slot. Detailed Implementation

[0016] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0017] Example: Figure 1-3 As shown, this utility model provides a downward-pressing chip testing auxiliary device, including a housing 1. A base 4 is rotatably mounted on the lower surface of the housing 1. A reset mechanism 2 is provided on the inner side of the housing 1. A downward-pressing mechanism 3 is fixedly mounted on the upper surface of the housing 1. The reset mechanism 2 includes a top plate 25, which slides with the inner surface of the housing 1. Multiple reset rods 23 are slidably connected to the lower surface of the top plate 25. A reset spring 22 is sleeved on the outer side of each of the multiple reset rods 23. A reset plate 20 is fixedly mounted on the lower end of the multiple reset rods 23. Multiple limiting rods 27 arranged in a rectangular array are fixedly mounted on the upper surface of the reset plate 20. The limiting rods 27 slide against the outer side of the top plate 25. A chip testing device 21 is fixedly mounted on the upper surface of the reset plate 20. When using the reset mechanism 2, first ensure that the top plate 25 slides well with the inner surface of the housing 1. When chip testing is performed, the top plate 25 moves downward with the testing action. At this time, the reset rods 23 slide down synchronously under the action of the top plate 25, and the reset springs 22 are compressed, storing elastic potential energy. After the test is completed, the reset spring 22 releases its elastic potential energy, pushing the reset rod 23 to slide upwards, thereby resetting the top plate 25. During the reset process, the limiting rod 27 slides and engages with the limiting groove 26 on the outer side of the top plate 25, ensuring that the reset process of the top plate 25 is stable and accurate. At the same time, the chip testing device 21 on the reset plate 20 also resets along with the reset plate 20, preparing for the next test.

[0018] The pressing mechanism 3 includes a pressing frame 30, the lower surface of which is fixedly connected to the outer casing 1. A knob 31 is located above the pressing frame 30, and a pressing screw 33 is fixedly mounted on the lower surface of the knob 31. The pressing screw 33 engages with the inner thread of the pressing frame 30. A pressure plate 34 is rotatably mounted at the lower end of the pressing screw 33, and the lower surface of the pressure plate 34 is in contact with the upper surface of the top plate 25. A storage slot 35 is provided on the upper surface of the base 4. When using the pressing mechanism 3, the operator first rotates the knob 31, causing the pressing screw 33 on the lower surface of the knob 31 to rotate accordingly. Because the pressing screw 33 engages with the inner thread of the pressing frame 30, rotating the knob 31 drives the pressing screw 33 to move downwards. The pressure plate 34 is rotatably mounted at the lower end of the pressing screw 33, and the pressure plate 34 presses downwards as the pressing screw 33 moves until its lower surface is tightly in contact with the upper surface of the top plate 25. At this time, the pressure plate 34 applies pressure to the top plate 25, which is then transmitted to the chip testing equipment 21 through the reset mechanism 2 to test the chip. After the test is completed, the knob 31 is rotated in the opposite direction, and the lower screw 33 and the pressure plate 34 rise accordingly, releasing the pressure on the top plate 25 and completing one test cycle.

[0019] Multiple reset holes 24 are formed on the upper surface of the top plate 25, and the reset holes 24 are slidably connected to the reset rod 23. This design makes the sliding of the reset rod 23 on the top plate 25 smoother, reduces frictional resistance, and improves the sensitivity and response speed of the reset mechanism 2, thereby ensuring that the chip testing equipment 21 can be reset quickly and accurately. Multiple limiting grooves 26 are formed on the outer side of the top plate 25, and the limiting grooves 26 are slidably engaged with the limiting rod 27. The cooperation between the limiting grooves 26 and the limiting rod 27 provides precise guidance and positioning for the reset process, effectively preventing offset and shaking during the reset process, and further improving the stability and accuracy of the reset mechanism 2.

[0020] The lower inner wall of the storage slot 35 is coated with an anti-slip coating 36. The addition of the anti-slip coating 36 enhances the friction between the storage slot 35 and the chip under test, preventing the chip from sliding or shifting during testing, thereby ensuring the accuracy and reliability of the test. The inner side of the pressure holder 30 is provided with a moving groove 37, which slides in conjunction with the pressure plate 34. The design of the moving groove 37 provides a stable track for the up and down movement of the pressure plate 34, reducing the shaking and deviation of the pressure plate 34 during movement, and improving the stability and testing accuracy of the pressure mechanism 3. The outer side of the knob 31 is provided with multiple anti-slip patterns 32 distributed in a ring. The addition of the anti-slip patterns 32 increases the friction on the surface of the knob 31, making it easier and less slippery for the operator to rotate the knob 31, thereby improving the convenience and accuracy of operation.

[0021] The chip testing equipment 21 is existing technology and will not be described in detail here. In addition, this utility model also includes a power supply, a controller and a switch, etc., which are not the main technical points of this patent and will not be described in detail here.

[0022] Working principle: When using the reset mechanism 2, first ensure that the top plate 25 and the inner surface of the outer shell 1 slide well together. When chip testing is performed, the top plate 25 moves downward with the test action. At this time, the reset rod 23 slides down synchronously under the action of the top plate 25, and the reset spring 22 is compressed, storing elastic potential energy. After the test is completed, the reset spring 22 releases the elastic potential energy, pushing the reset rod 23 to slide upward, thereby driving the top plate 25 to reset. During the reset process, the limiting rod 27 slides and engages with the limiting groove 26 on the outer side of the top plate 25, ensuring that the reset process of the top plate 25 is stable and accurate. At the same time, the chip testing device 21 on the reset plate 20 also resets along with the reset plate 20, preparing for the next test.

[0023] When using the pressing mechanism 3, the operator first rotates the knob 31, causing the pressing screw 33 on the lower surface of the knob 31 to rotate accordingly. Since the pressing screw 33 is threaded into the inner side of the pressing frame 30, rotating the knob 31 drives the pressing screw 33 to move downwards. A pressure plate 34 is rotatably mounted at the lower end of the pressing screw 33. The pressure plate 34 presses downwards as the pressing screw 33 moves until its lower surface is tightly against the upper surface of the top plate 25. At this time, the pressure plate 34 applies pressure to the top plate 25, which is then transmitted to the chip testing equipment 21 through the reset mechanism 2, thus enabling chip testing. After the test is completed, the knob 31 is rotated in the opposite direction, causing the pressing screw 33 and the pressure plate 34 to rise, releasing the pressure on the top plate 25 and completing one test cycle.

[0024] Obviously, those skilled in the art can make various modifications and variations to this utility model without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this utility model and their equivalents, this utility model also intends to include these modifications and variations.

Claims

1. A push-down chip testing aid comprising a housing (1), characterized in that: The lower surface of the outer shell (1) is rotatably provided with a base (4), the inner side of the outer shell (1) is provided with a reset mechanism (2), and the upper surface of the outer shell (1) is fixedly provided with a pressing mechanism (3).

2. A downset test chip aid as described in claim 1, wherein, The reset mechanism (2) includes a top plate (25), which is slidably engaged with the inner surface of the outer shell (1). A plurality of reset rods (23) are slidably connected to the lower surface of the top plate (25). A reset spring (22) is sleeved on the outer side of each of the plurality of reset rods (23). A reset plate (20) is fixedly mounted at the lower end of the plurality of reset rods (23). A plurality of limiting rods (27) arranged in a rectangular array are fixedly mounted on the upper surface of the reset plate (20). The limiting rods (27) are slidably attached to the outer side of the top plate (25). A chip testing device (21) is fixedly mounted on the upper surface of the reset plate (20).

3. The push-down chip test aid of claim 1, wherein, The pressing mechanism (3) includes a pressing frame (30), the lower surface of which is fixedly connected to the outer shell (1). A knob (31) is provided above the pressing frame (30), and a pressing screw (33) is fixedly provided on the lower surface of the knob (31). The pressing screw (33) is threadedly engaged with the inner side of the pressing frame (30). A pressure plate (34) is rotatably provided at the lower end of the pressing screw (33). The lower surface of the pressure plate (34) is in contact with the upper surface of the top plate (25). A storage groove (35) is provided on the upper surface of the base (4).

4. The push-down chip test aid of claim 2, wherein, The top plate (25) has multiple reset holes (24) on its upper surface, and the reset holes (24) are slidably connected to the reset rod (23).

5. The push-down chip test aid of claim 2, wherein, The top plate (25) has multiple limiting grooves (26) on its outer side, and the limiting grooves (26) slide against the limiting rod (27).

6. A push down chip test aid as defined in claim 3, wherein, The lower inner wall of the storage slot (35) is coated with an anti-slip coating (36).

7. The push down chip test aid of claim 3 wherein, The inner side of the lower pressure frame (30) is provided with a moving groove (37), and the inner side of the moving groove (37) is slidably engaged with the pressure plate (34).

8. The push down chip test aid of claim 3 wherein, The knob (31) has multiple anti-slip textures (32) arranged in a ring on its outer side.

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