System and method for measuring change in position of a conductor
Patent Information
- Application Number
- IN202421097169
- Authority / Receiving Office
- IN · IN
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2024-12-09
- Publication Date
- 2026-10-09
- Estimated Expiration
- 2044-12-09
Abstract
Description
TECHNICAL FIELD
[001] The embodiments herein generally relate to position measurementsensors and more particularly, to a system and method for measuring change inthe position of a conductor which provides contactless measurement with highsensitivity.BACKGROUND
[002] Contactless position measurement of conductors, such as wires, isessential in various high-precision applications where high sensitivity andresolution are paramount. These applications range from diamond wire-sawingmachines used in precision cutting processes to wire electrical discharge machining(EDM) and even the acoustics of musical instruments. Furthermore, in applicationssuch as semiconductor manufacturing, where abrasive wire cutting is employed todice semiconductor wafers into individual chips, or in solar cell manufacturing andthe aerospace industry, where the materials being cut include advanced compositeslike carbon fiber-reinforced polymers, accurately measuring the dynamic behaviorof moving wires during the cutting process is crucial. This precise measurementcapability enables materials to be cut without inducing damage, such asdelamination, which could compromise the structural integrity of the material.Moreover, measuring the position of moving wires, such as in abrasive wire cuttingin semiconductor manufacturing, allows for the calibration of wire-cutting devicesto reduce defects and material loss due to transverse vibrations of the wires, therebyimproving the device's output.
[003] However, position measurement of small moving objects with highprecision is challenging due to several factors. One of the primary challenges is thesmall size of the objects being measured, typically ranging from micrometers tomillimeters. This scale places stringent demands on the measurement system,rendering the use of general-purpose position sensors, such as accelerometers,impractical. These sensors are often inadequate for such applications due to theirinherent limitations in sensitivity and resolution when dealing with objects of suchdiminutive size. Additionally, sensors that require contact with the object may notbe suitable for certain applications. Therefore, contactless position sensors, such aslaser position sensors, ultrasonic sensors, and vision sensor systems, are used forthe contactless measurement of object positions. Laser position sensors offer highresolution and can provide precise measurements; however, they require a clear lineof sight to the target, which can be difficult to maintain in dynamic environmentswhere wires are rapidly moving or where dust and other particulates may obstructthe sensor's view. Ultrasonic sensors, on the other hand, are less dependent on targetvisibility and can function in a broader range of environmental conditions.However, ultrasonic sensors are typically better suited for detecting larger objectsand may struggle with the fine precision required for wire measurement. Visionsensor systems, which utilize image processing algorithms to determine the positionof an object, can be effective in some scenarios but are similarly constrained byissues related to visibility, alignment, and signal noise. Additionally, these systemsoften require complex setups and are sensitive to variations in lighting and otherenvironmental factors, which can introduce errors in the measurement process.
[004] In some applications, capacitive sensors are used for contactlessposition measurement and wire position sensing due to their potential for highsensitivity and resolution. These sensors operate based on the principle of detectingchanges in capacitance as the position of the conductor varies. While this approachcan be highly effective, it also introduces a significant level of complexity,particularly in the design of the readout scheme. The capacitance changes that needto be measured are often extremely small, requiring sophisticated electronics toaccurately detect and interpret these signals. Additionally, the proximity of otherconductive materials in the environment can introduce noise and interference,further complicating the measurement process.
[005] Therefore, there exists a need for a system and a method for measuringthe change in position of a conductor which obviates the aforementioneddrawbacks.OBJECTS
[006] The principal object of embodiments herein is to provide a system formeasuring the change in position of a conductor which allows contactlessmeasurement with high sensitivity.
[007] Another object of embodiments herein is to provide the system whichincludes a giant magneto-resistive sensor coupled with an amplifier that allowscontactless measurement of change in position of a conductor such as a wire, withhigh sensitivity, resolution, and precision.
[008] Another object of embodiments herein is to provide the system whichincludes an adjustable platform that allows adjusting the position of the sensor withrespect to the conductor to provide optimum measurement sensitivity.
[009] Another object of embodiments herein is to provide the system whichprovides ease in measurement of change in position and has a simple readoutscheme.
[0010] Another object of embodiments herein is to provide the systemwhich facilitates in determining characteristics such as sensitivity, and resolution ofa sensing unit of the system.
[0011] Another object of embodiments herein is to provide a method formeasuring change in position of the conductor which facilitates in contactlessmeasurement of the position of the conductor with high sensitivity.
[0012] Another object of embodiments herein is to provide a method fordetermining characteristics of the sensing unit of the system for measuring changein position of the conductor.
[0013] These and other objects of embodiments herein will be betterappreciated and understood when considered in conjunction with followingdescription and accompanying drawings. It should be understood, however, that thefollowing descriptions, while indicating embodiments and numerous specificdetails thereof, are given by way of illustration and not of limitation. Many changesand modifications may be made within the scope of the embodiments herein withoutdeparting from the spirit thereof, and the embodiments herein include all suchmodifications.BRIEF DESCRIPTION OF DRAWINGS
[0014] The embodiments are illustrated in the accompanying drawings,throughout which like reference letters indicate corresponding parts in variousfigures. The embodiments herein will be better understood from the followingdescription with reference to the drawings, in which:
[0015] Fig. 1 depicts a block diagram of a system for measuring change inposition of a conductor, according to embodiments as disclosed herein;
[0016] Fig. 2 depicts an example of a circuit diagram of the system formeasuring change in position of the conductor, according to embodiments asdisclosed herein;
[0017] Fig. 3 depicts an isometric view of the system for measuring changein position of the conductor, according to embodiments as disclosed herein;
[0018] Fig. 4 depicts a top view of the system for measuring change inposition of the conductor, according to embodiments as disclosed herein;
[0019] Fig. 5 depicts a side view of the system for measuring change inposition of the conductor, according to embodiments as disclosed herein;
[0020] Fig. 6 depicts a front view of the system for measuring change inposition of the conductor, according to embodiments as disclosed herein;
[0021] Fig. 7 depicts a noise distribution plot at different sampling rates,according to an experimental example of embodiments as disclosed herein;
[0022] Fig. 8 depicts a graphical scatter plot of variation in output voltageof a sensing unit relative to input positional change between the conductor and themagneto-resistive sensor, according to the experimental example of embodimentsas disclosed herein;
[0023] Fig. 9 depicts graph of output voltage with respect to the linearvoltage range of position, according to the experimental example of theembodiments as disclosed herein;
[0024] Fig. 10 depicts a graph of variation in sensitivity with positionalchange between the conductor and the magneto-resistive sensor, according to theexperimental example of the embodiments as disclosed herein;
[0025] Fig. 11 depicts a graph showing variation in resolution with inputpositional change between the conductor and the magneto-resistive sensor,according to the experimental example of the embodiments as disclosed herein;
[0026] Figs 12A depicts a graph of variation in drift with respect to variationin positional change between the conductor and the magneto-resistive sensor,according to the experimental example of the embodiments as disclosed herein;
[0027] Fig. 12B depicts a graph of variation error in drift with respect tovariation in positional change between the conductor and the magneto-resistivesensor, respectively, according to the experimental example of the embodiments asdisclosed herein;
[0028] Fig. 13 depicts a flowchart of a method for measuring change inposition of the conductor, according to embodiments as disclosed herein; and
[0029] Fig. 14 depicts a flowchart of a method for determiningcharacteristics of the sensing unit of the system, according to embodiments asdisclosed herein.DETAILED DESCRIPTION
[0030] The embodiments here in and the various features and advantageousdetails thereof are explained more fully with reference to the non-limitingembodiments that are illustrated in the accompanying drawings and detailed in thefollowing description. Descriptions of well-known components and processingtechniques are omitted so as to not unnecessarily obscure the embodiments herein.The examples used herein are intended merely to facilitate an understanding ofways in which the embodiments herein may be practiced and to further enable thoseof skill in the art to practice the embodiments herein. Accordingly, the examplesshould not be construed as limiting the scope of the embodiments herein.
[0031] The embodiments herein achieve a system for measuring change inposition of a conductor which allows contactless measurement with high sensitivity.Further, embodiments herein achieve a method for measuring change in position ofthe conductor which facilitates in contactless measurement of position of theconductor with high sensitivity. Furthermore, embodiments herein achieve amethod for determining characteristics of a sensing unit of the system for measuringchange in position of the conductor. Referring now to the drawings Figs. 1 through14, where similar reference characters denote corresponding features consistentlythroughout the figures, there are shown embodiments.
[0032] Fig. 1 depicts a block diagram of a system (100) for measuringchange in position of a conductor, according to embodiments as disclosed herein.The system (100) includes a sensing unit (102), and an adjustable platform (200)(shown in figs. 3 to 6), wherein the sensing unit (102) includes a magneto-resistivesensor (104), and an amplifier (106) coupled with the magneto-resistive sensor(104). For the purpose of this description and ease of understanding, the system(100) is explained herein with below reference to a conducting wire. However, it isalso within the scope of the invention to use / practice the components of the system(100) for any other conductor without otherwise deterring the intended function ofthe system (100) as can be deduced from the description and correspondingdrawings.
[0033] Fig. 2 depicts an example of a circuit diagram of the sensing unit(102) of the system (100). The magneto-resistive sensor (104) is configured todetect change in magnetic field of the conductor (10) in accordance with a relativepositional change between the magneto-resistive sensor (104) and the conductor(10). The amplifier (106) is coupled with the magneto-resistive sensor (104) and isconfigured to amplify an output of the magneto-resistive sensor (104). In anembodiment, the magneto-resistive sensor (104) is a giant magneto-resistive(GMR) sensor, and the amplifier (106) is an instrumentation amplifier. To detectthe change in position of the conductor (10) through a change in the magnetic field,the current is supplied to the conductor (10), wherein the magnetic field generatedin the conductor (10) is proportional to the current passing through the conductor(10). In an embodiment, a direct current of pre-defined value is supplied to theconductor (10) through a power source. The magnetic field of the conductor (10)increases linearly with distance inside the conductor (10) and is proportional to thecurrent's magnitude. Outside the conductor (10), the intensity of the magnetic fielddecreases inversely as the distance from an outer surface of the conductor (10)increases. The magneto-resistive sensor (104) is configured to sense this change inthe magnetic field of the conductor (10), wherein an electrical resistance of activematerial of the magneto-resistive sensor (104) changes under the action of theexternally applied magnetic field. Therefore, with a change in the magnetic fielddue to a relative change in position between the conductor (10) and the magnetoresistive sensor (104), the output voltage of the magneto-resistive sensor (104)varies, wherein the value of the output voltage is proportional to the strength ofmagnetic field detected by the magneto-resistive sensor (104). Since the conductor(10) such as a vibrating wire may have very diminutive displacement, the outputvoltage of the magneto-resistive sensor (104) may have lower values, making itdifficult to detect small changes in the position of the conductor (10). The amplifier(106) is configured to amplify the output voltage of the magneto-resistive sensor(104) to generate an amplified output signal with low drift, high common moderejection ratio (CMRR), and low noise. Amplification of the output voltage of themagneto-resistive sensor (104) enables it to sense minor changes in position,thereby increasing the sensitivity of the magneto-resistive sensor (104). In anembodiment, the sensing unit (102) is configured to have a resolution of 10μm andsensitivity ranging from 3.5 V / mm to 4.5 V / mm.
[0034] Figs. 3, 4, 5, and 6 depict isometric, top, side, and front views of theadjustable platform (200), respectively, according to embodiments of the inventionas disclosed herein. The adjustable platform (200) is configured to facilitateadjustment in the position of the magneto-resistive sensor (104) with respect to theconductor (10) in at least one of x-axis, y-axis, and z-axis. In an embodiment, theadjustable platform (200) is configured to facilitate adjustment of the position ofthe magneto-resistive sensor (104) with respect to the conductor (10) to determinethe characteristics of the sensing unit (102). In an embodiment, the adjustableplatform (200) includes a fixed member (202), and a movable arm (210). Themovable arm (210) is mounted on the fixed member (202) and is adapted to moverelative to the fixed member (202, and hold the magneto restive sensor (104). In anembodiment, the fixed member (202) includes a base (204), and a connectingmember (206). The base (204) is adapted to at least accommodate the amplifier(106), and a power source thereon. Further, the connecting member (206) extendsoutwards from the base (204). The connecting member (206) includes a guidingslot (208), wherein the movable arm (210) is slidably connected with the connectingmember (206). The guiding slot (208) is adapted to guide the movement of themovable arm (210) on the connecting member (206) along the z-axis. In anembodiment, the movable arm (210) includes at least one tightening member (212)adapted to fix the position of the movable arm (210) on the connecting member(206). In an embodiment, the connecting member (206) is configured to be adjustedalong the x-axis and the y-axis with respect to the base (204).
[0035] Further, the system (100) includes a data acquisition device (108)(shown in fig. 1) provided in communication with the amplifier (106). The dataacquisition device (108) is configured to store data sensed by the sensing unit (102).The system (100) further includes a control unit (110) (shown in fig. 1). The controlunit (110) is configured to process data stored in the data acquisition device (108),and provide position measurement as an output corresponding to the output voltageof the sensing unit (102). In an embodiment, the control unit (110) includes at leastany one of a microcontroller, microprocessor, field-programmable gate arrays(FPGAs), application-specific integrated circuits (ASICs), and other electroniccircuitry configured to execute control logic. Further, in an embodiment the controlunit (110) is configured to incorporate processing environments for advancedcomputation, including simulation, modeling, and algorithm optimization tools,such as MATLAB, Simulink, or equivalent platforms.
[0036] As a non-limiting example, the system (100), may be provided incommunication with a multi-wire slurry sawing device used for slicing siliconwafers. The position of the magneto-resistive sensor (104) can be adjusted withrespect to the wires of the device to enable contactless measurement of change inthe position of the wires. During the operation of the device, due to transversevibrations of the wires, excessive material loss may occur during the slicing ofsilicon wafers. The system (100) may allow for the detection of vibration of wires,thereby enabling tuning of the wires to reduce transverse vibrations. Further, asanother non-limiting example, the system (100) may be provided in communicationwith a pantograph-catenary system of a train, wherein the system (100) allowsadjustment in the positioning of the magneto-resistive sensor (104) with respect tothe pantograph-catenary system and facilitates in the contactless measurement ofchange in position of the catenary with respect to the pantograph (connecting arm)of the train. The system (100) may therefore facilitate in detecting the engagementand disengagement of the pantograph with the catenary, thereby enabling indetection of faults to minimize the engagement and disengagement between thecatenary and pantograph. As an experimental example, to determine characteristicsof the sensing unit (102), the position of the conductor (10) is fixed and the positionof the magneto-resistive sensor (104) is varied with respect to the conductor (10).In an embodiment, the conductor (10) is a wire having a diameter of 0.25mm fixedat two ends through a clamping device (12) (shown in figs. 3 to 6). A constant directcurrent of a pre-defined value is supplied to the conductor. In an embodiment, theposition of the magneto-resistive sensor (104) is varied with pre-determineddistance along the x, y, and z axes with respect to the conductor (10) through theadjustable platform (200) for data acquisition, wherein data is collected at samplingrates of 5 to 50 kHz in the step of 5 kHz step size. Fig. 7 depicts a noise distributionplot at different sampling rates, according to the experimental example ofembodiments as disclosed herein. Noise distribution is largely normal across allsampling rates, with different standard deviations, wherein the standard deviationis lower for the 10kHz sampling rate. As an experimental example, the 10 kHzsampling rate having a standard deviation of 5.8mV is selected for determiningthe characteristics of the sensing unit (102).
[0037] Fig. 8 depicts a graphical scatter plot of variation in output voltageof the sensing unit (102) relative to input positional change between the conductor(10) and the magneto-resistive sensor (104), according to the experimental exampleof embodiments as disclosed herein. The magnetic field intensity inside theconductor (10) carrying a constant current exhibits a linear variation, ranging fromzero at the center of the conductor (10) to a maximum at the periphery of theconductor (10). The strength of the magnetic field reduces with increase in distanceoutwards from the periphery of the conductor (10) along a radial direction of theconductor, resulting in a high change in resistance in elements of the magnetoresistive sensor (104). Consequently, the rate of change in voltage per unit ofposition ΔV / Δx is high. As the distance from the conductor (10) increases, thechange of slope ΔV / Δx change becomes small, leading to a logarithmic behaviorin the output voltage of the sensing unit (102) relative to the input positional changebetween the conductor (10) and the magneto-resistive sensor (104), as depicted infig. 8. Fig. 9 depicts a graph of output voltage with respect to the linear voltagerange of position, according to the experimental example of the embodiments asdisclosed herein. To improve the sensing unit's accuracy and to simplifythe calibration and interpolation process of the sensing unit, a linear relationshipbetween the output voltage of the sensing unit (102) and the change in position isrequired. Although the full-scale range of output voltage of the sensing unit (104)follows a logarithmic behavior relative to the input positional change between theconductor (10) and the magneto-resistive sensor (104) (shown in fig. 8), however,specific sub-ranges of the output voltage of the sensing unit (102) have anapproximate linear range within the 1.45mm to 1.95 mm position. Within this linearrange, the maximum voltage deviation is 15 mV, as shown in fig. 9. A linear fullscale range for the sensing unit is obtained through regression analysis. As depictedin fig. 9, a plot of the predicted position against the actual position shows anapproximate linear fit relative to the actual position. (Remove mapping error graphfrom fig. 9). Fig. 10 depicts a graph of variation in sensitivity with positional changebetween the conductor (10) and the magneto-resistive sensor (104), according tothe experimental example of the embodiments as disclosed herein. Sensitivity playsa crucial role in the performance of the sensing unit (102), as sensitivity determinesthe magnitude of change in output voltage for a corresponding change in the inputposition (relative positional change between the conductor (10) and the magneto-resistive sensor (104)), and is defined by the slope of a curve ΔV / Δx. As anexperimental example, the position of the magneto-resistive sensor (104) is variedat pre-determined steps along x, y, and z-axes through the adjustable platform (200)to determine the sensitivity of the sensing unit (102). At the periphery of theconductor (10), the intensity of the magnetic field is stronger, resulting in a highervoltage change per unit of position ΔV / Δx. However, the intensity of the magneticfield reduces away from the periphery in the radial direction of the conductor,thereby resulting in lower voltage change per unit of position ΔV / Δx. Therefore,the sensitivity of the sensing unit (102) is higher when placed in proximity to theconductor (10) and diminishes as the sensing unit (102) is moved away from theconductor (10), following an approximate logarithmic pattern. As an example, asdepicted in fig. 10, the sensing unit (102) has a maximum sensitivity of 4.2V / mm.Fig. 11 depicts a graph showing variation in resolution with input positionalchange between the conductor (10) and the magneto-resistive sensor (104),according to the experimental example of the embodiments as disclosed herein.Resolution of the sensing unit (102) is higher near the conductor (10) due to highersignal strength, and lower 1 / SNR (signal to noise ratio), resulting in a low standarddeviation. The resolution of the sensing unit (102) decreases with an increase indistance between the conductor (10) and the magneto-resistive sensor (104). As anexample, as depicted in fig. 11, the sensing unit (102) has a resolution of 10 μm.Figs 12A and 12B depict graphs of variation in drift and error in drift with respectto variation in positional change between the conductor (10) and the magnetoresistive sensor (104), respectively, according to the experimental example of theembodiments as disclosed herein. Drift quantifies the extent of the output voltage'schange over a specified time duration under static conditions. The drift of thesensing unit (102) is lower in proximity to the conductor due to a high signal-tonoise ratio (SNR) resulting in minimal deviation of the output voltage. As anexample, as shown in fig. 12 A, the sensing unit (102) has a maximum drift of 115μm at a radial position of 3.05 mm away from the periphery of the conductor (10).
[0038] Fig. 13 depicts a flowchart of a method (300) for measuring changein position of the conductor (10), according to embodiments as disclosed herein.The method (300) includes, at step (302) positioning, through the adjustableplatform (200), the sensing unit (102) including the magneto-resistive sensor (104)in proximity to the conductor (10). In an embodiment, step (302) includes placingthe magneto-resistive sensor (104) on the movable arm (210) of the adjustableplatform (200); adjusting, the position of the movable arm (210) on the connectingmember (206) of the adjustable platform (200); and fixing, by tightening members(212), the position of the movable arm (210) on the connecting member (206). Atstep (304), the method (300) includes supplying, through the power source, acurrent through the conductor (10) to produce a magnetic field around the conductor(10). In an embodiment, step (304) includes supplying a direct current ofpredetermined value through the conductor (10). Further, at step (306), the method(300) includes displacing the conductor (10) relative to the magneto-resistive sensor(104). At step (308), the method (300) includes sensing, by the sensing unit (102)positional change between the magneto-resistive sensor (104) and the conductor(10). Step (308) includes sensing, by the magneto-resistive sensor (104), change inthe magnetic field created by the positional change between the conductor (10) andthe magneto-resistive sensor (104), and providing, by the magneto-resistive sensor(104), output voltage corresponding to change in magnetic field created by thepositional change. Step (308) further includes amplifying, by the amplifier (106),the output voltage of the magneto-resistive sensor (104), and providing, by theamplifier (106), an amplified output voltage corresponding to the output voltage ofthe magneto-resistive sensor (104). Furthermore, at step (310), the method (300)includes acquiring and storing, by the data acquisition device (108), the output ofthe sensing unit (102) as data, wherein the output of the sensing unit (102) is theamplified output voltage of the amplifier (106). The method (300) includes at step(312), processing, by the control unit (110), the data stored in the data acquisitiondevice (108). Moreover, at step (314), the method (300) includes providing, by thecontrol unit (110), position measurement as an output corresponding to theamplified output voltage of the amplifier (104). In an embodiment, step (308)includes sensing, by the sensing unit (102) with micro-meter resolution positionalchange between the conductor and the magneto-resistive sensor.
[0039] Fig. 14 depicts a flowchart of a method (400) for determiningcharacteristics of the sensing unit (102) of the system (100), according toembodiments as disclosed herein. The method (400), at step (402) includes fixing,by the clamping device (12), and position of the conductor (10). At step (404), themethod (400) includes supplying, by the power source, constant direct current tothe conductor (10) to produce a magnetic field around the conductor (10). At step(406), the method (400) includes varying, through the adjustable platform (200),the position of the magneto-resistive sensor (104) with respect to the conductor(10), at pre-determined intervals of distance along the x-axis, y-axis, and z-axis.Further, at step (408), the method (400) includes sensing, by the sensing unit (102)positional change between the magneto-resistive sensor (104) and the conductor(10). The method (400), at step (410) includes acquiring and storing, by the dataacquisition device (108), the output of the sensing unit (102) as data. Further, atstep (412), the method (400) includes processing, by the control unit (110), datastored by the data acquisition device (108) to determine the range of sensitivity ofthe sensing unit (102), range of resolution of the sensing unit (102), and provide alinear relationship between output voltage of the sensing unit (102) and change inposition of the conductor (10). In an embodiment, the method (400), at step (412)includes processing, by the control unit (110) to provide linear relationship betweenoutput voltage of said sensing unit (102) and the change in position of the conductor(10) comprises applying regression analysis on actual positional change forobtaining predicted positional change for a full-scale range of output voltage.
[0040] The technical advantages of the system (100) and method formeasuring change in position of a conductor (10) are as follows. High sensitivity,high resolution, ease in measurement, and ease in calibration.
[0041] The foregoing description of the specific embodiments will so fullyreveal the general nature of the embodiments herein that others can, by applyingcurrent knowledge, readily modify and / or adapt for various applications suchspecific embodiments without departing from the generic concept, and, therefore,such adaptations and modifications should and are intended to be comprehendedwithin the meaning and range of equivalents of the disclosed embodiments. It is tobe understood that the phraseology or terminology employed herein is for thepurpose of description and not of limitation. Therefore, while the embodimentsherein have been described in terms of embodiments, those skilled in the art willrecognize that the embodiments herein can be practiced with modifications withinthe spirit and scope of the embodiments as described herein.
Claims
1. A system (100) for measuring change in position of a conductor (10), said system (100) comprising: a sensing unit (102), said sensing unit (102) comprising: a magneto-resistive sensor (104) configured to detect change in magnetic field of the conductor (10) by a relative positional change between said magneto-resistive sensor (104) and the conductor (10); and an amplifier (106) coupled with said magneto-resistive sensor (104), wherein said amplifier (106) is configured to amplify an output of said magneto-resistive sensor (104); and an adjustable platform (200), wherein said adjustable platform (200) is configured to facilitate adjustment in position of said magneto-resistive sensor (104) with respect to the conductor (10) along at least any one of xaxis, y-axis, and z-axis.
2. The system (100) as claimed in claim 1, wherein said magneto-resistive sensor (104) is a giant magneto-resistive sensor.
3. The system (100) as claimed in claim 1, wherein said sensing unit (102) is configured to have a micro-meter scale resolution.
4. The system (100) as claimed in claim 1, wherein said amplifier (106) is an instrumentation amplifier configured to amplify an output voltage of said magneto-resistive sensor (104).
5. The system (100) as claimed in claim 1, wherein said adjustable platform comprises: a fixed member (202); and a movable arm (210) mounted on the fixed member (202) and adapted to move relative to the fixed member (202), wherein said movable arm (210) is adapted to hold said magneto-resistive sensor (104).
6. The system (100) as claimed in claim 5, wherein said fixed member (202) comprises: a base (204) adapted to at least accommodate said amplifier (202), and a power source; a connecting member (206) extending outwards from said base (206), wherein said connecting member has a guiding slot (208), wherein said movable arm (210) is slidably connected with said connecting member (206); and said guiding slot (208) is adapted to guide the movement of said movable arm (210) on the connecting member (206) along z-axis.
7. The system (100) as claimed in claim 5, wherein the position of said connecting member (206) is configured to be adjusted along the x-axis, and y-axis with respect to said base (204).
8. The system (100) as claimed in claim 1, wherein said system (100) comprises: a data acquisition device (108) provided in communication with said amplifier (106), wherein said data acquisition device (108) is configured to store data sensed by said sensing unit (102); and a control unit (110) configured to: process data stored in said data acquisition device (108); and provide position measurement as an output corresponding to said output voltage of said sensing unit (102).
9. The system (100) as claimed in claim 3, wherein said sensing unit (102) has a resolution of 10μm, and a sensitivity ranging from 3.5 V / mm to 4.5V / mm.
10. The system (100) as claimed in claim 1, wherein said adjustable platform (200) is configured to facilitate adjustment in position of said magnetoresistive sensor (104) with respect to said conductor (10) to determine characteristics comprising highest sensitivity zone, resolution, and sensitivity of said sensing unit (102).
11. A method (300) for measuring change in position of a conductor (10), said method (300) comprising: positioning, through an adjustable platform (200), a sensing unit (102) comprising a magneto-resistive sensor (104) in proximity to the conductor (10); supplying, through a power source, a current through the conductor to produce a magnetic field around the conductor (10); displacing the conductor (10) relative to said magneto-resistive sensor (104); sensing, by said sensing unit (102) positional change between said magneto-resistive sensor (104) and the conductor (10), wherein said sensing by said sensing unit (102) comprises: sensing, by said magneto-resistive sensor (104), change in magnetic field created by the positional change between the conductor (10) and said magneto-resistive sensor (104); providing, by said magneto-resistive sensor (104), an output voltage corresponding to change in magnetic field created by the positional change; amplifying, by an amplifier (106), said output voltage of said magneto-resistive sensor (104); and providing, by said amplifier (106), an amplified output voltage corresponding to the output voltage of said magnetoresistive sensor (104); acquiring and storing, by a data acquisition device (108), output of said sensing unit (102) as data, wherein the output of the sensing unit (102) is the amplified output voltage of the amplifier (106); processing, by a control unit (110), the data stored in the data acquisition device (108) ; and providing, by said control unit (110), position measurement as an output corresponding to the amplified output voltage of the amplifier (104).
12. The method (300) as claimed in claim 11, wherein said sensing, by said sensing unit (102) comprises sensing with micro-meter resolution positional change between the conductor (10) and said magneto-resistive sensor (104), wherein said magneto-restive sensor (104) is a giant magneto-resistive sensor, and said amplifier (106) is an instrumentational amplifier.
13. The method (300) as claimed in claim 11, wherein the positioning through the adjustable platform (200) comprises: placing said magneto-resistive sensor (104) on a movable arm (210) of said adjustable platform (200); adjusting, position of said movable arm (210) on a connecting member (206) of said adjustable platform (200); and fixing, by tightening members (212), position of said movable arm (210) on said connecting member (206), wherein the supplying, through the power source, the current through the conductor (10) includes supplying a direct current through the conductor (10).
14. A method (400) for determining characteristics of a sensing unit (102) of a system (100) for measuring change in position of a conductor (10), said method (400) comprising: fixing, by a clamping device (12), position of the conductor (10); suppling, by a power source, a constant direct current to the conductor (10) to produce a magnetic field around the conductor (10); varying, through an adjustable platform (200), position of a magneto-resistive sensor (102) with respect to the conductor (10), at predetermined intervals of distance along x-axis, y-axis, and z-axis; sensing, by said sensing unit (102) positional change between said magneto- resistive sensor (104) and said conductor (10), wherein said sensing by said sensing unit (102) comprises: sensing, by said magneto-resistive sensor (104), change in magnetic field created by the positional change between the conductor (10) and said magneto-resistive sensor (104); providing, by said magneto-resistive sensor (104), an output voltage corresponding to change in the magnetic field created by the positional change; amplifying, by an amplifier (106), said output voltage of said magneto-resistive sensor (104); and providing, by said amplifier (106), an amplified output voltage corresponding to the output voltage of said magnetoresistive sensor (104); acquiring and storing, by a data acquisition device (108), output of said sensing unit (102) as data, wherein the output of the sensing unit (102) is the amplified output voltage of the amplifier (106); and processing, by said control unit (110), data stored by said data acquisition device (108) to determine range of sensitivity of said sensing unit (102), range of resolution of said sensing unit (102), and provide linear relationship between output voltage of said sensing unit (102) and change in position of the conductor (10).
15. The method (400) as claimed in claim 14, wherein said processing, by said control unit (110) to provide the linear relationship between the output voltage of said sensing unit (102) and the change in position of the conductor (10) comprises applying regression analysis on actual positional change for obtaining predicted positional change for a full-scale range of output voltage.