Defect inspection device

Abstract

To provide a defect inspection device that can detect a defect in a display unit without using a sensor defect data.SOLUTION: A defect inspection device of the present disclosure detects a defect in a display unit having a plurality of pixels arranged therein, and the defect inspection device comprises an image acquisition unit that acquires an image of the pixels in the display unit, and a determination unit that determines a defect in the display unit on the basis of the image acquired by the image acquisition unit. The image acquisition unit acquires, with a plurality of sensor pixels, an image of one pixel of the plurality of pixels in the display unit.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to a defect inspection device for a display device such as a μOLED, and in particular to a defect inspection device that detects defects from a captured image of the display device. [Background technology]

[0002] In recent years, with the increasing number of pixels in solid-state imaging devices such as large-format CMOS sensors, a method has been proposed for inspecting defects in high-pixel display devices by capturing an inspection image of the display device using a camera equipped with a high-pixel sensor and analyzing the inspection image using a defect detection program. When capturing the inspection image, a so-called long-exposure shooting is performed with a long exposure time. In this case, if the number of defects in the dark level of the sensor exceeds the number of defects that can be corrected by the camera, pixels of abnormal levels caused by defects in the dark level of the sensor will appear in the inspection image. As a result, the defect detection program may erroneously detect the pixel as a panel defect.

[0003] Therefore, Patent Document 1 proposes a technology in which a dark image of the panel to be inspected is captured in advance and stored in memory as pixel defect data of the sensor, and the pixel defect data is subtracted when the inspection image is captured, thereby correcting the sensor defects. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Publication No. 8-201228 Summary of the Invention [Problem to be solved by the invention]

[0005] However, in Patent Document 1, the process of acquiring and storing the defect data of the sensor and the process of storing the defect data are not described. In order to perform the inspection, memory is required to store the data, which leads to an increase in the test time and the number of components of the inspection device. In particular, when inspecting by displaying multiple types of images on the panel (for example, displaying white, red, green, and blue), the shooting conditions (exposure time) are different for each image, so defect data must be prepared for each image. In addition, as the resolution of panels has increased in recent years, the pixels of camera sensors have also increased, making the problems associated with generating defect data more noticeable. Furthermore, the RTS (Random Telegraph Signal) noise generated during sensor readout appears in the inspection image or defect data as bright spots (pixel defects in the sensor with a higher level than the surroundings) but cannot be corrected. In addition, if this noise appears in the defect data, it may be excessively subtracted from the pixel values ​​of the defect data during defect correction, resulting in pseudo dark spots (pixel defects in the sensor with a lower level than the surroundings).

[0006] The present invention has been made in consideration of the above-mentioned points, and has an object to provide a defect inspection device capable of detecting defects in a display device without using defect data from a sensor. [Means for solving the problem]

[0007] In order to solve the above problems, the defect inspection device according to the present invention includes a defect inspection device for detecting defects in a display device in which a plurality of pixels are arranged, the defect inspection device comprising an image acquisition unit for acquiring an image of the pixels of the display device, and a determination unit for determining defects in the display device based on the image acquired by the image acquisition unit, the image acquisition unit acquiring an image of one pixel of the plurality of pixels of the display device by a plurality of sensor pixels. a contour generating unit that generates a contour of the defect candidate of the display device based on the position of the defect candidate of the display device, and a determination unit that determines a defect of the display device from the defect candidate of the display device based on the length of the contour.

[0008] In order to solve the above problem, the present invention provides a method for manufacturing an organic light-emitting device, comprising: an acquisition step of acquiring, by an image acquisition unit, an image of a pixel of a display device in which a plurality of pixels each made of an organic light-emitting element is arranged; and a judgment step of judging a defect of the display device based on the image acquired by the image acquisition unit, the acquisition step being characterized in that an image of one pixel of the plurality of pixels of the display device is acquired by a plurality of sensor pixels of the image acquisition unit. The present invention also provides a method for manufacturing an organic light-emitting device, comprising: an acquisition step of acquiring, by an image acquisition unit, an image of the pixel of a display device in which a plurality of pixels each made of an organic light-emitting element is arranged; an identification step of identifying a position of a defect candidate of the display device in the image acquired by the image acquisition unit; a contour generation step of generating a contour of the defect candidate of the display device based on the position of the defect candidate of the display device; and a judgment step of judging a defect of the display device from the defect candidate of the display device based on the length of the contour. Effect of the Invention

[0009] According to the present invention, it is possible to provide a defect inspection apparatus that is low cost, has a short inspection time, and is highly accurate without using defect data from a sensor. [Brief description of the drawings]

[0010] [Figure 1] FIG. 1 is a configuration diagram of a defect inspection device according to a first embodiment. [Diagram 2] FIG. 1 is a configuration diagram of an address generation unit according to a first embodiment. [Diagram 3] 1 is a diagram showing the configuration of a contour generating unit according to the first embodiment; [Figure 4] 1 is a diagram showing the configuration of a determination unit according to a first embodiment; [Diagram 5] 1 is an example of a flowchart of a process executed by a defect inspection apparatus according to a first embodiment. [Figure 6] 1 is an example of an image of a display device acquired by an image acquisition unit according to the first embodiment. [Figure 7] An example of a binary image generated by the address generation unit of the first embodiment. [Figure 8] Example of contour data generated by the contour generating unit of the first embodiment [Figure 9] 1 is a diagram showing an example of contour data of a defect in a display device generated by the contour generating unit of the first embodiment. [Figure 10] Example of contour data of a defect in a sensor generated by the contour generating unit in the first embodiment [Figure 11] An example of contour data with a contour length of 8 generated by the contour generating unit of the first embodiment [Figure 12] Example of defect information generated by the defect information generating unit of the first embodiment [Figure 13] FIG. 13 is a configuration diagram of an address generation unit according to a second embodiment. [Figure 14] Example of completion of binarized image by the completion unit of the second embodiment [Figure 15] 13 is a diagram showing the configuration of a determination unit according to the third embodiment. [Figure 16] FIG. 13 is a diagram for explaining a judgment result output of a judgment unit according to the third embodiment. [Figure 17] FIG. 13 is a diagram for explaining a contour buffer mode of the determination unit of the third embodiment. [Figure 18] FIG. 1 is a diagram illustrating an example of a display device according to an embodiment. [Figure 19] FIG. 1 illustrates an example of an imaging device and an electronic device according to an embodiment. [Figure 20] FIG. 1 is a diagram illustrating an example of a display device according to an embodiment. [Figure 21] FIG. 1 is a diagram showing an example of a vehicle having a lighting device and a lamp according to an embodiment; [Figure 22] FIG. 1 is a diagram illustrating an example of a wearable device according to an embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0011] Hereinafter, the present invention will be described in detail based on preferred embodiments with reference to the accompanying drawings. Note that the configurations shown in the following embodiments are merely examples, and the present invention is not limited to the configurations shown in the drawings. It's not something like that.

[0012] (First embodiment) The configuration of the defect inspection device according to the first embodiment of the present invention will be described with reference to the block diagram of FIG. 1. As shown in FIG. 1, the defect inspection device 100 includes an image acquisition unit 101, an address generation unit 102, a contour generation unit 103, a judgment unit 104, a threshold input terminal 105, a judgment result output terminal 106, a defect information generation unit 107, and a defect information output terminal 108. The image acquisition unit 101 is a camera or the like that acquires an image of a display device 110 to be inspected. The display device 110 has a display unit in which a plurality of pixels are arranged. The address generation unit 102 generates a binary image that indicates the positions (addresses) of defects of pixels of the display device 110 and defects of pixels of a sensor of the image acquisition unit 101 on the image acquired by the image acquisition unit 101. The contour generation unit 103 generates contour data of the defects. The judgment unit 104 performs a defect judgment process using the contour data generated by the contour generation unit 103 and a defect judgment threshold of the contour length data input from the threshold input terminal 105. Furthermore, the determination unit 104 outputs data on the determination result to the outside from a determination result output terminal 106. The defect information generation unit 107 generates information such as the position, size, and level of a defect determined by the determination unit 104 to be a defect in the display device 110. The defect information generated by the defect information generation unit 107 is output to the outside from a defect information output terminal 108.

[0013] FIG. 2 shows the configuration of the address generating unit 102. The address generating unit 102 has an image data input terminal 201, an image memory 202, a median filter 203, a median value memory 204, a comparison unit 205, a binary image memory 206, and an image data output terminal 207. The address generating unit 102 is an identifying unit that identifies the position of a defect candidate of the display device in an image acquired by the image acquiring unit. The image data acquired by the image acquiring unit 101 is stored in the image memory 202 via the image data input terminal 201. The image memory 202 stores image data for one inspection image. In this embodiment, as an example, the image acquiring unit 101 is a monochrome camera that acquires an 8-bit monochrome image. Note that, when the image acquiring unit 101 is a color camera, the address generating unit 102 converts the image data into a monochrome image by an image monochrome processing unit (not shown), and then stores the image data in the image memory 202.

[0014] The median filter 203 calculates a median value for each pixel of the image data. The median value memory 204 stores the median value for each pixel calculated by the median filter 203. The comparison unit 205 reads out the corresponding median value from the median value memory 204 for each pixel of the image data stored in the image memory 202 and performs a comparison. The comparison unit 205 outputs data of the comparison result as a binary image indicating a defect in the display device 110 or a defect address in the sensor, and the output binary image is stored in the binary image memory 206. The binary image data stored in the binary image memory 206 is output from the image data output terminal 207 to the contour generation unit 103.

[0015] 3 shows the configuration of the contour generating unit 103. The contour generating unit 103 has an image data input terminal 301, a contour generating unit 302, a contour buffer 303, and a contour data output terminal 304. The contour generating unit 103 generates contours of defect candidates of the display device based on the positions of the defect candidates of the display device. The binary image data output from the address generating unit 102 is sent to the contour generating unit 302 via the image data input terminal 301. The contour generating unit 302 generates contour data based on the binary image data. The contour data generated by the contour generating unit 302 is stored in the contour buffer 303. This contour data includes contour data for defect candidates of the display device 110 and the sensor. The contour data indicating the defect candidates stored in the contour buffer 303 is output from the contour data output terminal 304 to the determination unit 104.

[0016] 4 shows the configuration of the determination unit 104. The determination unit 104 includes a contour data input terminal 401, a contour length calculation unit 40, a defect determination unit 403, a contour buffer 404, and a contour data output terminal 405. The defect determination unit 403 is connected to the threshold input terminal 105 and the determination result output terminal 106. The determination unit 104 determines a defect of the display device from the defect candidates of the display device based on the length of the contour. The contour data output from the contour generation unit 103 is input to the contour length calculation unit 402 via the contour data input terminal 401. The contour length calculation unit 402 calculates a contour length, which is the length of the contour, based on the contour data. The defect determination unit 403 compares the contour length calculated by the contour length calculation unit 402 with the defect determination threshold of the display device 110 input from the threshold input terminal 105 to determine a defect. The determination result is output from the determination result output terminal 106, which is a notification unit, and notified to the outside. The defect determination unit 403 also outputs a signal indicating the contour data determined to be a defect of the display device 110 to the contour buffer 404. The contour buffer 404 stores the contour data determined to be a defect out of the contour data input from the contour data input terminal 401. The contour data stored in the contour buffer 404 is output to the defect information generating unit 107 via a contour data output terminal 405 .

[0017] FIG. 5 shows an example of a flowchart of a defect inspection process executed by the defect inspection device 100 according to the present embodiment. In step S101, the image acquisition unit 101 acquires an image of a pixel of the display device 110. Next, in step S102, the address generation unit 102 identifies the position of a defect candidate of a pixel of the display device 110 based on the image acquired by the image acquisition unit 101. Next, in step S103, the contour generation unit 103 generates contour data of the defect candidate based on the position of the defect candidate identified by the address generation unit 102. Next, in step S104, the contour length calculation unit 402 calculates the contour length of the defect candidate based on the contour data of the defect candidate generated by the contour generation unit 103. Then, in step S105, the defect determination unit 403 determines a defect of the display device 110 from the defect candidate based on the contour length calculated by the contour length calculation unit 402.

[0018] As an example, in a case where the display device 110 includes a plurality of pixels each made of an organic light-emitting element, the defect inspection apparatus 100 may execute an inspection method according to the process of the above flowchart in a manufacturing method for an organic light-emitting element. This realizes a defect inspection capable of detecting defects in the display device without using defect data from a sensor in the manufacturing process for the organic light-emitting element.

[0019] Next, the operation of the defect inspection apparatus 100 will be described in detail with reference to FIGS.

[0020] First, the defect inspection device 100 captures an image of the display device 110 by the image acquisition unit 101 and acquires image data. The image data is stored in the image memory 202 of the address generation unit 102. FIG. 6A shows image data 500, which is an example of the image data acquired by the image acquisition unit 101. The image data 600 includes a defect 601 (a bright spot (a defect that is brighter than its surroundings)) of the display device 110 and a defect 602 of the sensor. FIG. 6B is an enlarged view of a portion of the image data 600 including the defect 602 of the sensor. In FIG. 6B, the defect of one sensor pixel spreads in the cross direction (the sensor pixel range is 3×3=9 pixels).

[0021] Therefore, in this embodiment, in order to distinguish between a defect of one pixel of the display device 110 and a defect of the sensor, the image acquisition unit 101 acquires an image of one pixel of the display device 110 using a plurality of sensor pixels of at least nine pixels. Therefore, the pixel size of the sensor pixel of the image acquisition unit 101 is 1 / 9 or less of the pixel size of the display device 110.

[0022] Furthermore, the median filter 203 reads image data from the image memory 202, and calculates the median value of each pixel data, for example, 15×15 (=225) pixels. The calculated median value is stored in the median value memory 204. An example of image data of the median values ​​stored in the median value memory 204 is shown in image data 604. Furthermore, the size (range) for which the median value is calculated by the median filter 203 is set so as to eliminate the effects of shading and noise around the pixel of interest. If a satisfactory result can be obtained, a mean filter that calculates a mean value using pixel values ​​of a pixel of interest and pixels surrounding the pixel of interest may be used instead of the median filter.

[0023] Thereafter, the comparison unit 205 reads out the corresponding median value from the median value memory 204 for each pixel of the image data stored in the image memory 202 and performs a comparison. The comparison result is output as a binary image indicating a defect in the display device 110 or a defect address in the sensor, and the image data of the output binary image is stored in the binary image memory 206. Therefore, the address generation unit 102 can generate a binary image indicating the position of the defect candidate based on the result of comparing the pixel value of the sensor pixel with the feature amount calculated from the pixel values ​​of the sensor pixels surrounding the sensor pixel.

[0024] Here, a specific example of the comparison operation executed by the comparison unit 205 will be described. In the following description, x and y coordinates are used when image data is arranged on an XY plane consisting of an X axis and a Y axis that are orthogonal to each other.

[0025] In the case of bright spot detection, if the median data corresponding to the image data P(x, y) is M(x, y) (x: x coordinate of the image, y: y coordinate of the image) and the gain is gain, the value of the binary image data BIN(x, y) is calculated by the following formula (1).

number

[0026] For example, when gain=1.4, when the image data P(x, y) is 1.4 times or more greater than the median value M(x, y), the binary image data BIN(x, y)=1, indicating that there is a defect in the display device 110 or a defect in the sensor at the coordinates (x, y).

[0027] Similarly, in the case of detecting a dark spot (a defect having a lower brightness than the surroundings), the value of the binary image data BIN(x, y) is calculated by the following formula (2).

number

[0028] For example, in the case of gain=0.5, when the image data P(x,y) is 0.5 times or less than the median value M(x,y), the binarized image data BIN(x,y)=1, indicating that there is a defect in the display device 110 or a defect in the sensor at the coordinate (x,y). Note that since the sensor defect is a bright spot, the calculation result of formula (2) is BIN(x,y)=0.

[0029] Fig. 7 shows a binarized image 700 of the image data 600 in Fig. 6. In the binarized image 700, a defect 601 (coordinates indicated by "1" in the figure) in the display device 110 is surrounded by a dotted circle 701, and a defect 602 (coordinates indicated by "1" in the figure) in the sensor is surrounded by a dotted circle 702.

[0030] The binary image data read from the binary image memory 206 is output from the image data output terminal 207 to the contour generating unit 103. FIG. 8 shows an example of contour data 800 generated by the contour generating unit 103 using the binary image data of FIG. 7. In the contour data 800, contour data generated from the coordinates of the defect 601 on the display device 110 (images shown in black in the figure) is The contour data (pixels shown in black in the figure) generated from the coordinates of the defect 602 on the sensor is surrounded by a dotted circle 802.

[0031] Fig. 9 shows the data structure of the contour data enclosed by the circle 801 shown in Fig. 8. As shown in Fig. 9, the coordinates of the start point of the contour data enclosed by the circle 801 are set to [1998, 2999]. Here, the coordinates with the smallest y coordinate among the coordinates with the smallest x coordinates in the contour data are set to be the start point. Coordinates are then extracted along the contour data in a clockwise order from the start point coordinates, and the coordinates extracted up to the end point coordinate [1998, 3000] in Fig. 9 are stored in contour buffer 303 as a single list.

[0032] Similarly, Fig. 10 shows the data structure of the contour data enclosed by the circle 802 shown in Fig. 8. As shown in Fig. 10, the coordinates of the start point of the contour data enclosed by the circle 802 are [999, 8000]. 9, the coordinate with the smallest y coordinate among the coordinates with the smallest x coordinate in the contour data is set as the starting point. Coordinates are then extracted along the contour data in a clockwise order from the coordinate of the starting point, and the coordinates extracted up to the end point coordinate [1988, 8000] in FIG. 10 are stored in contour buffer 303 as one list. The coordinate data of the contour data read out from contour buffer 303 is then output from contour data output terminal 304 to determination unit 104. Note that the order from the starting point to the end point in generating the list of coordinates of the contour data described above is just an example, and the list of coordinates may be generated in an order from the starting point to the end point in a counterclockwise order, for example.

[0033] Next, contour length calculation section 402 of determination section 104 generates a contour length using the coordinate data of the contour data. For example, for contour data surrounded by circle 801 in Fig. 8, contour length calculation section 402 calculates the contour length to be "15" based on the number of coordinates in the list in Fig. 9. Also, for contour data surrounded by circle 802 in Fig. 8, contour length calculation section 402 calculates the contour length to be "4" based on the number of coordinates in the list in Fig. 10. The calculated contour length data is output to defect determination section 403, which determines whether or not there is a defect in display device 110.

[0034] In this embodiment, the determination unit 104 distinguishes between defects in the display device 110 and defects in the sensor pixels of the image acquisition unit 101 based on the size of the defect included in the image acquired by the image acquisition unit 101. Specifically, as an example, in order to determine a defect having a size of 8 sensor pixels or more as a defect in the display device, "8" is set as the threshold value of the contour length in the threshold input terminal 105. Therefore, "8" is set as the defect determination threshold value as the contour length at which the determination unit 104 can determine a defect of a visible size. In this case, the defect 601 is determined to be a defect in the display device 110 because the contour length is "15" and is equal to or greater than the defect determination threshold. The size of the defect 601 is 28 sensor pixels, so the correct defect determination is made. Moreover, the defect 602 is determined to be a defect in the sensor because the contour length is "4", so that the defect is less than the defect determination threshold. The size of the defect 602 is 5 sensor pixels, so the correct defect determination is made.

[0035] 11, a specific example of a contour length that is determined by the defect determination unit 403 to be a defect in the display device 110 will be described. The threshold value of the contour length set in the threshold input terminal 105 is "8", and a defect with a contour length of 8 sensor pixels or more is determined to be a defect in the display device 110. Furthermore, as shown in FIG. 11, an X-axis and a Y-axis that are orthogonal to each other are set.

[0036] 11, defect 1100 is a defect having a size of 3×3=9 sensor pixels, and the contour length is calculated to be "8" according to contour data generation order 1101. Therefore, defect determination unit 403 determines that defect 1100 is a defect of display device 110. Furthermore, defect 1102 is a vertically elongated defect having a size of 2×4=8 sensor pixels, and the contour length is calculated to be "8" according to contour data generation order 1103. Therefore, defect determination unit 403 determines that defect 1102 is a defect of display device 110. Similarly, the defect 1104 is a horizontally elongated defect having a size of 4×2=8 sensor pixels, and the contour length is calculated to be “8” in accordance with the contour data generation order 1105. Therefore, the defect determination unit 403 determines that the defect 1104 is a defect of the display device 110.

[0037] Moreover, the defect 1106 is a vertically elongated defect having a size of 1×8=8 sensor pixels, and the contour length is calculated to be “8” according to the contour data generation order 1107. Here, the contour generation unit 302 generates contour data from the starting point “1” in a clockwise direction (positive Y-axis direction) to “8” in the generation order according to the contour data generation order 1107. Furthermore, the contour generation unit 302 generates contour data from the coordinate of “8” in the generation order to the coordinate of “1” in the negative Y-axis direction. However, the contour generation unit 302 does not add duplicate coordinates that have been added to the list once to generate contour data. As a result, the contour generation unit 302 generates a list including eight coordinates as contour data. Therefore, the contour length calculation unit 402 calculates the contour length of the defect 1106 to be “8”, and the defect determination unit 403 determines that the defect 1106 is a defect of the display device 110.

[0038] Similarly, the defect 1108 is a horizontally elongated defect having a size of 8×1=8 sensor pixels, and the contour length is calculated to be “8” according to the contour data generation order 1109. Here, the contour generation unit 302 generates contour data from the starting point “1” in a clockwise direction (positive direction of the X-axis) to “8” in the generation order according to the contour data generation order 1109. Furthermore, the contour generation unit 302 generates contour data from the coordinate of “8” in the generation order to the coordinate of “1” in the negative direction of the X-axis. As in the case of the defect 1106, the contour generation unit 302 does not add duplicate coordinates that have been added to the list once to generate contour data. As a result, the contour generation unit 302 generates a list including eight coordinates as contour data. Therefore, the contour length calculation unit 402 calculates the contour length of the defect 1108 to be “8”, and the defect determination unit 403 determines that the defect 1108 is a defect of the display device 110.

[0039] Moreover, the defect 1110 is a defect in which two defects of size 2×2=4 sensor pixels are arranged diagonally, and the contour length is calculated to be "8" according to the contour data generation order 1111. Here, the contour generation unit 302 generates contour data from the start point "1" clockwise to the generation order "8" according to the contour data generation order 1111. Here, in the contour data generation order 1111, the coordinates of the generation order "4" and "3" are also traced after the generation order "7", but the contour generation unit 302 does not add the coordinates that were added to the list once to generate the contour data redundantly. As a result, the contour generation unit 302 generates a list including eight coordinates as contour data. Therefore, the contour length calculation unit 402 calculates the contour length of the defect 1110 to be "8", and the defect determination unit 403 determines that the defect 1110 is a defect of the display device 110.

[0040] Next, the defect 1112 is a defect with a size of 8 sensor pixels arranged in a diagonal direction, and the contour length is calculated to be "8" according to the contour data generation order 1113. Here, the contour generation unit 302 generates contour data from the start point "1" in a clockwise direction (X-axis positive direction and Y-axis positive direction) to "8" in the generation order according to the contour data generation order 1113. Here, the contour generation unit 302 generates contour data from the coordinate of "8" in the generation order in the negative X-axis direction and the negative Y-axis direction until it reaches the coordinate of "1" in the generation order. The contour generation unit 302 does not add duplicate coordinates that have been added to the list for generating contour data once. As a result, the contour generation unit 302 generates a list including 8 coordinates as contour data. Therefore, the contour length calculation unit 402 calculates the contour length of the defect 1112 to be "8", and the defect determination unit 403 determines that the defect 1112 is a defect of the display device 110.

[0041] Moreover, the defect 1114 is a defect having a size of 9 sensor pixels, and the contour length is calculated to be "8" according to the contour data generation order 1115. Here, the contour generating unit 302 generates contour data clockwise from the starting point "1" according to the contour data generation order 1115. In this case, the contour generating unit 302 also advances to the coordinate "2" in the generation order after "8" in the generation order, but once the contour data The coordinates added to the list for generating the data are not added twice. As a result, the contour generating unit 302 generates a list including eight coordinates as contour data. Therefore, the contour length calculating unit 402 calculates the contour length of the defect 1114 to be "8", and the defect determining unit 403 determines that the defect 1114 is a defect of the display device 110.

[0042] 11 are merely an example, and for defects of other shapes, generation of contour data and calculation of contour length are performed in the same manner as described above, so that the defect determination unit 403 can determine whether or not there is a defect in the display device 110. The threshold value of the contour length set in the threshold input terminal 105 can be set to a value corresponding to the size of one pixel of the display device to be inspected. The threshold value of the contour length set in the threshold input terminal 105 can also be set to a value corresponding to a defect of a size that is visually acceptable when a person views the display device.

[0043] The judgment result of the defect judgment unit 403 is output from the judgment result output terminal 106 for notification to the outside. For example, if the image data stored in the image memory 202 contains even one defect of the display device 110, the value "1" is output from the judgment result output terminal 106. If the image data stored in the image memory 202 does not contain a defect of the display device 110, the value "0" is output from the judgment result output terminal 106. In addition, in accordance with the signal output from the defect judgment unit 403, contour data indicating a defect of the display device 110 is stored in the contour buffer 404.

[0044] Then, the contour data read out from the contour buffer 404 is output from a contour data output terminal 405 to the defect information generation unit 107. The defect information generation unit 107 generates defect information of the display device 110 using the contour data output from the contour data output terminal 405.

[0045] FIG. 12 shows an example of defect information generated by the defect information generation unit 107 from the contour data shown in FIG. 9. The defect information generation unit 107 identifies coordinates within the defect from the contour data shown in FIG. 9, and calculates the size of the defect (number of sensor pixels) from the number of identified coordinates. In the defect information in FIG. 12, the coordinates of the "defect position" are the first coordinates (coordinates of the starting point) in the list of contour data. Note that the coordinates of the "defect position" may be the center of gravity coordinates of the defect calculated from the contour data. The defect information generated by the defect information generation unit 107 is output from the defect information output terminal 108.

[0046] In this embodiment, a case has been described in which the defect in the display device 110 is a bright spot. However, even if the defect in the display device 110 is a dark spot, defect determination can be performed using the contour length by processing similar to that described above.

[0047] As described above, according to the defect inspection apparatus 100 of this embodiment, it is possible to perform accurate defect judgment regarding defects in the display device 110 based on the contour length of the defect contained in the image data of the display device 110, without using defect data generated in the conventional technology.

[0048] Second embodiment Next, a configuration of a defect inspection device according to a second embodiment of the present invention will be described. The overall configuration of the defect inspection device 100 according to this embodiment is similar to that of the first embodiment, except for the address generation unit 102. In the following description, the same components as those in the first embodiment are given the same reference numerals, and detailed description thereof will be omitted.

[0049] 13 shows the configuration of the address generation unit 122 of the defect inspection apparatus 100 of this embodiment. The address generation unit 122 has an image data input terminal 201, an image memory 202, a median filter 203, a median value memory 204, a comparison unit 205, a binary image memory 206, an image data output terminal 207, a complementation unit 1300, and a complement pixel number input terminal 1301.

[0050] As described with reference to FIG. 2, a binary image indicating a defect address of the display device 110 is stored in the binary image memory 206. FIG. 14 shows an example of a calculation process of the contour length of a binary image in this embodiment. A binary image 1400 illustrated in FIG. 14 corresponds to a defect of the display device 110 having a contour length of "4" (size of four sensor pixels), and a binary image 1401 corresponds to a defect of the display device 110 having a contour length of "6" (size of six sensor pixels). Furthermore, the defects of the binary image 1400 and the binary image 1401 are separated from each other by one sensor pixel. Therefore, when a person sees the defect corresponding to the binary image 1400 and the defect corresponding to the binary image 1401, the two defects visually appear to be connected. Therefore, it is preferable that the binary image 1400 and the binary image 1401 are determined as defects of the display device 110. However, if the threshold value for the contour length is set to "8" in the threshold input terminal 105, the contour lengths of the binary image 1400 and the binary image 1401 are each less than 8, so the defect determination unit 403 does not determine these binary images as defects in the display device 110.

[0051] Therefore, in this embodiment, the address generating unit 122 is provided with a complementing unit 1300. For the binary images 1400 and 1401 shown in FIG. 14, the complementing unit 1300 reads out the binary images 1400 and 1401 from the binary image memory 206. Then, the complementing unit 1300 performs a complementing process to complement values ​​between pixels between defective addresses of the binary images 1400 and 1401. The number of pixels to be complemented by the complementing unit 1300 is set via a complement pixel number input terminal 1301. Here, as an example, the number of pixels to be complemented by the complementing unit 1300 is set to "1", whereby one sensor pixel is complemented.

[0052] 14 also shows a binarized image 1402 after the binarized images 1400 and 1401 have been complemented by the complement unit 1300. Because the binarized images 1400 and 1401 are one sensor pixel apart from each other, the complement unit 1300 changes the one sensor pixel between the binarized images 1400 and 1401 to a defective address.

[0053] The complementing unit 1300 outputs the complemented binary image 1402 to the binary image memory 206, and the binary image 1402 is stored in the binary image memory 206. The image data of the binary image 1402 stored in the binary image memory 206 is output to the image data output terminal 207 as a contour generating output. The signal is output to unit 103.

[0054] The binary image 1402 is a binary image in which the binary images 1400 and 1401 are connected to each other by the changed defect address, and the contour length is 12. As a result, the defect determination unit 403 determines that there is a defect in the display device 110 because the contour length of the complemented binary image 1402 is greater than the contour length threshold value of 8.

[0055] As described above, according to the defect inspection apparatus 100 of the present embodiment, the binarized image is complemented by the complementing section 1300 of the address generating section 122, and thus it is expected that the detection accuracy of defects in the display device 110 can be improved.

[0056] Third embodiment Next, a configuration of a defect inspection device according to a third embodiment of the present invention will be described. The overall configuration of the defect inspection device 100 according to this embodiment is similar to that of the first embodiment, except for the judgment unit 104. In the following description, the same components as those in the first embodiment are denoted by the same reference numerals, and detailed description thereof will be omitted.

[0057] 15 shows the configuration of the determination unit 134 of the defect inspection apparatus 100 of this embodiment. The determination unit 134 has a contour data input terminal 401, a contour length calculation unit 40, a defect determination unit 403, a contour buffer 404, a contour data output terminal 405, and a contour buffer mode input terminal 1501.

[0058] As described with reference to FIG. 4, the contour length data is calculated by the contour length calculation unit 402. The defect determination unit 403 compares the contour length data calculated by the contour length calculation unit 402 with defect determination threshold data of the display device 110 input from the threshold input terminal 105 to determine a defect. The determination result is output to the outside from the determination result output terminal 106. The defect determination unit 403 also outputs a signal indicating contour data determined to be a defect of the display device 110 to the contour buffer 404. The defect determination unit 403 also controls the contour data stored in the contour buffer 404 based on a value set in a contour buffer mode input terminal 1501. Details of this control process will be described later. The contour buffer 404 stores the contour data determined to be a defect out of the contour data input from the contour data input terminal 401. The contour data stored in the contour buffer 404 is output to the defect information generation unit 107 via the contour data output terminal 405.

[0059] Next, the operation of the determination unit 134 will be described. Here, similarly to the description of the first embodiment, it is assumed that defect determination is performed on the image data shown in FIG. 6A. In order for the determination unit 134 to determine defects having a size of 8 sensor pixels or more as defects of the display device 110, a threshold value of "8" is set in the threshold input terminal 105 as the threshold value of the contour length. Since the contour length of the defect 601 is "15", which is greater than the threshold value of "8", it is determined to be a defect of the display device 110. Moreover, since the contour length of the defect 602 is "4", which is smaller than the threshold value of "8", it is determined to be a sensor defect.

[0060] Next, the judgment result output from the judgment result output terminal 106 will be described with reference to FIG. 16. For example, if the image data stored in the image memory 202 has neither a defect in the display device 110 nor a defect in the sensor ("both defects not present" in the figure), the value "00" is output from the judgment result output terminal 106. If the image data stored in the image memory 202 has a defect in the display device 110 but has no defect in the sensor ("only the display device has a defect" in the figure), the value "01" is output from the judgment result output terminal 106. If the image data stored in the image memory 202 has no defect in the display device 110 but has a defect in the sensor ("only the sensor has a defect" in the figure), the value "10" is output from the judgment result output terminal 106. If the image data stored in the image memory 202 has a defect in the display device 110 and a defect in the sensor ("both defects" in the figure), the value "11" is output from the judgment result output terminal 106.

[0061] Next, with reference to FIG. 17, the control of the contour buffer 404 by the defect determination unit 403 based on the setting of the contour buffer mode input terminal 1501 will be described. When the value "00" is set to the contour buffer mode input terminal 1501, the contour data stored in the contour buffer 404 is contour data indicating a defect in the display device 110. Therefore, in this case, the defect determination unit 403 controls the contour buffer 404 to store the contour data of the defect in the display device 110 according to the value input from the contour buffer mode input terminal 1501. Also, when the value "01" is set to the contour buffer mode input terminal 1501, the contour data stored in the contour buffer 404 is contour data indicating a defect in the sensor. Therefore, in this case, the defect determination unit 403 controls the contour buffer 404 to store the contour data of the defect in the sensor according to the value input from the contour buffer mode input terminal 1501. Furthermore, when a value "11" is set to the contour buffer mode input terminal, the contour data stored in contour buffer 404 is contour data indicating a defect in the display device 110 and contour data indicating a defect in the sensor. Therefore, in this case, defect determination unit 403 controls contour buffer 404 to store contour data indicating a defect in the display device 110 and contour data indicating a defect in the sensor, in accordance with the value input from contour buffer mode input terminal 1501. Then, the contour data read from contour buffer 404 is output from contour data output terminal 405 to defect information generation unit 107.

[0062] In the third embodiment, not only defect information of the display device 110 but also defect information of the sensor is output from the determination unit 134. As a result, the defect inspection device 100 can detect the defect of the display device 110. Along with the detection, the image acquisition unit 101 can also analyze the change over time of the sensor defects.

[0063] Furthermore, similarly to the first embodiment, the defect inspection apparatus 100 of this embodiment can perform accurate defect judgment regarding defects in the display device 110 based on the contour length of the defect contained in the image data of the display device 110, without using defect data generated by conventional technology.

[0064] The above-described embodiments are provided to simply explain the principles and practical application examples of the present invention, and to enable other persons skilled in the art to understand the present invention. Other embodiments in which the defect inspection apparatus 100 is modified in various ways may be suitable for specific applications, and are also within the scope of the present invention.

[0065] (Other embodiments) The present invention can also be realized by executing the following process: That is, software (programs) that realize the functions of the above-described embodiments are supplied to a system or device via a network or various storage media, and the computer (or CPU, MPU, etc.) of the system or device reads and executes the programs.

[0066] [Structure of organic light-emitting element] Next, an organic light-emitting element used in the defect inspection apparatus 100 according to the above embodiment will be described. As an example, the organic light-emitting element described below can be manufactured by the defect inspection apparatus 100 executing the above inspection method. The organic light-emitting element is provided by forming an insulating layer, a first electrode, an organic compound layer, and a second electrode on a substrate. A protective layer, a color filter, a microlens, etc. may be provided on the cathode. When a color filter is provided, a planarizing layer may be provided between the protective layer. The planarizing layer may be made of acrylic resin, etc. The same applies when a planarizing layer is provided between the color filter and the microlens.

[0067] [substrate] Examples of the substrate include quartz, glass, silicon wafer, resin, and metal. In addition, a switching element such as a transistor and wiring may be provided on the substrate, and an insulating layer may be provided thereon. As the insulating layer, any material can be used as long as it can form a contact hole so that wiring can be formed between the first electrode and the insulating layer, and insulation from wiring that is not connected can be ensured. For example, resin such as polyimide, silicon oxide, silicon nitride, etc. can be used.

[0068] [electrode] A pair of electrodes can be used. The pair of electrodes may be an anode and a cathode. When an electric field is applied in the direction in which the organic light-emitting element emits light, the electrode with a higher potential is the anode, and the other is the cathode. It can also be said that the electrode that supplies holes to the light-emitting layer is the anode, and the electrode that supplies electrons is the cathode.

[0069] The material constituting the anode should have as large a work function as possible. For example, simple metals such as gold, platinum, silver, copper, nickel, palladium, cobalt, selenium, vanadium, tungsten, etc., or mixtures containing these metals can be used. Alternatively, for example, alloys combining these metals, metal oxides such as tin oxide, zinc oxide, indium oxide, indium tin oxide (ITO), and indium zinc oxide can be used. Conductive polymers such as polyaniline, polypyrrole, and polythiophene can also be used.

[0070] These electrode materials may be used alone or in combination of two or more. The anode may be composed of one layer or multiple layers. When used as a reflective electrode, for example, chromium, aluminum, silver, titanium, tungsten, etc. The material may be, for example, tungsten, molybdenum, or an alloy or laminate thereof. The above materials may also function as a reflective film without acting as an electrode. When used as a transparent electrode, a transparent conductive oxide layer such as indium tin oxide (ITO) or indium zinc oxide may be used, but is not limited to these. Photolithography technology may be used to form the electrode.

[0071] On the other hand, the material for the cathode should have a small work function. Examples of the material include alkali metals such as lithium, alkaline earth metals such as calcium, aluminum, titanium, manganese, silver, lead, chromium, and other metals or mixtures containing these metals. Alternatively, alloys combining these metals can be used. For example, magnesium-silver, aluminum-lithium, aluminum-magnesium, silver-copper, zinc-silver, and the like can be used. Metal oxides such as indium tin oxide (ITO) can also be used. These electrode materials may be used alone or in combination of two or more types. The cathode may have a single layer structure or a multilayer structure. Among these, it is preferable to use silver, and it is even more preferable to use a silver alloy to reduce the aggregation of silver. As long as the aggregation of silver can be reduced, the ratio of the alloy is not important. For example, the ratio of silver to other metals may be 1:1, 3:1, and the like.

[0072] The cathode may be a top-emission element using an oxide conductive layer such as ITO, or a bottom-emission element using a reflective electrode such as aluminum (Al), and is not particularly limited. The method for forming the cathode is not particularly limited, but it is more preferable to use a direct current or alternating current sputtering method, etc., since the film coverage is good and the resistance can be easily reduced.

[0073] [Pixel isolation layer] The pixel separation layer is formed of a silicon nitride (SiN) film, a silicon oxynitride (SiON) film, or a silicon oxide (SiO) film formed by chemical vapor deposition (CVD). In order to increase the resistance in the in-plane direction of the organic compound layer, it is preferable that the organic compound layer, particularly the hole transport layer, is thinly formed on the sidewall of the pixel separation layer. Specifically, the thickness of the sidewall can be thinned by increasing the taper angle of the sidewall of the pixel separation layer or the thickness of the pixel separation layer to increase vignetting during deposition.

[0074] On the other hand, it is preferable to adjust the sidewall taper angle and film thickness of the pixel separation layer to such an extent that no voids are formed in the protective layer formed thereon. Since no voids are formed in the protective layer, the occurrence of defects in the protective layer can be reduced. Since the occurrence of defects in the protective layer is reduced, deterioration in reliability such as the occurrence of dark spots and poor conduction of the second electrode can be reduced.

[0075] According to this embodiment, even if the taper angle of the sidewall of the pixel separation layer is not steep, it is possible to effectively suppress charge leakage to adjacent pixels. As a result of this study, it was found that the charge leakage can be sufficiently reduced if the taper angle is in the range of 60 degrees or more and 90 degrees or less. The thickness of the pixel separation layer is preferably 10 nm or more and 150 nm or less. The same effect can be obtained even if the pixel separation layer is composed only of a pixel electrode without a pixel separation layer. However, in this case, it is preferable that the thickness of the pixel electrode is half or less than that of the organic layer, or the edge of the pixel electrode is forward tapered by less than 60 degrees, because this reduces short circuits of the organic light-emitting element.

[0076] [Organic compound layer] The organic compound layer may be formed as a single layer or as multiple layers. When the organic compound layer has multiple layers, it may be called a hole injection layer, a hole transport layer, an electron blocking layer, a light emitting layer, a hole blocking layer, an electron transport layer, an electron injection layer, etc., depending on its function. The organic compound layer is mainly composed of organic compounds, but may also contain inorganic atoms or inorganic compounds. For example, copper , lithium, magnesium, aluminum, iridium, platinum, molybdenum, zinc, etc. The organic compound layer may be disposed between the first electrode and the second electrode, or may be disposed in contact with the first electrode and the second electrode.

[0077] In the case where there are multiple light-emitting layers, a charge generating section may be provided between the first light-emitting layer and the second light-emitting layer. The charge generating section may have an organic compound having a lowest unoccupied molecular orbital energy (LUMO) of -5.0 eV or less. The same applies when the charge generating section is provided between the second light-emitting layer and the third light-emitting layer.

[0078] [Protective layer] A protective layer may be provided on the second electrode. For example, by bonding glass provided with a moisture absorbent on the second electrode, it is possible to reduce the intrusion of water and the like into the organic compound layer and reduce the occurrence of display defects. In another embodiment, a passivation film such as silicon nitride may be provided on the cathode to reduce the intrusion of water and the like into the organic compound layer. For example, after forming the cathode, the cathode may be transported to another chamber without breaking the vacuum, and a silicon nitride film having a thickness of 2 μm may be formed by the CVD method to form a protective layer. A protective layer may be provided using the atomic deposition method (ALD method) after the film formation by the CVD method. The material of the film by the ALD method is not limited, and may be silicon nitride, silicon oxide, aluminum oxide, etc. Silicon nitride may be further formed by the CVD method on the film formed by the ALD method. The film by the ALD method may have a smaller thickness than the film formed by the CVD method. Specifically, it may be 50% or less, or even 10% or less.

[0079] [Color Filter] A color filter may be provided on the protective layer. For example, a color filter taking into consideration the size of the organic light-emitting element may be provided on another substrate and then bonded to the substrate on which the organic light-emitting element is provided, or a color filter may be patterned on the protective layer described above using a photolithography technique. The color filter may be made of a polymer.

[0080] [Planarization layer] A planarization layer may be provided between the color filter and the protective layer. The planarization layer is provided for the purpose of reducing unevenness of the layer below. It may also be called a material resin layer without limiting the purpose. The planarization layer may be composed of an organic compound, and may be either a low molecular weight or a high molecular weight, but is preferably a high molecular weight. The planarization layer may be provided above and below the color filter, and may be made of the same or different materials.Specific examples of the materials include polyvinylcarbazole resin, polycarbonate resin, polyester resin, ABS resin, acrylic resin, polyimide resin, phenol resin, epoxy resin, silicone resin, and urea resin.

[0081] [Microlens] The organic light-emitting device may have an optical member such as a microlens on its light-emitting side. The microlens may be made of acrylic resin, epoxy resin, or the like. The microlens may be intended to increase the amount of light extracted from the organic light-emitting device and control the direction of the extracted light. The microlens may have a hemispherical shape. When the microlens has a hemispherical shape, among the tangents to the hemisphere, there is a tangent that is parallel to the insulating layer, and the tangent and the hemisphere are the vertices of the microlens. The vertex of the microlens can be determined in the same manner in any cross-sectional view. In other words, among the tangents to the semicircle of the microlens in the cross-sectional view, there is a tangent that is parallel to the insulating layer, and the tangent and the semicircle are the vertices of the microlens.

[0082] It is also possible to define the midpoint of a microlens. In the cross section of a microlens, a line segment is imaginary from a point where an arc shape ends to a point where another arc shape ends, and the midpoint of the line segment can be called the midpoint of the microlens. The cross section for determining the vertex and midpoint is an absolute It may be a cross section perpendicular to the edge layer.

[0083] The microlens has a first surface having a convex portion and a second surface opposite to the first surface. It is preferable that the second surface is disposed closer to the functional layer than the first surface. To achieve such a configuration, it is necessary to form a microlens on the light-emitting device. When the functional layer is an organic layer, it is preferable to avoid processes that result in high temperatures in the manufacturing process. In addition, when the second surface is disposed closer to the functional layer than the first surface, it is preferable that the glass transition temperatures of all organic compounds that form the organic layer are 100°C or higher, and more preferably 130°C or higher.

[0084] [Opposite substrate] A counter substrate may be provided on the planarization layer. The counter substrate is called a counter substrate because it is provided at a position corresponding to the aforementioned substrate. The material of the counter substrate may be the same as that of the aforementioned substrate. When the aforementioned substrate is the first substrate, the counter substrate may be the second substrate.

[0085] [Organic layer] The organic compound layers (hole injection layer, hole transport layer, electron blocking layer, light emitting layer, hole blocking layer, electron transport layer, electron injection layer, etc.) constituting the organic light emitting device according to one embodiment of the present invention are formed by the method described below.

[0086] The organic compound layer constituting the organic light-emitting device according to one embodiment of the present invention can be formed by dry processes such as vacuum deposition, ionization deposition, sputtering, plasma, etc. Alternatively, instead of the dry process, a wet process can be used in which a layer is formed by dissolving the compound in an appropriate solvent and applying a known coating method (e.g., spin coating, dipping, casting, LB method, inkjet method, etc.).

[0087] Here, when the layer is formed by a vacuum deposition method or a solution coating method, crystallization is unlikely to occur and the layer has excellent stability over time. When the layer is formed by a coating method, the layer can be formed by combining with a suitable binder resin.

[0088] Examples of the binder resin include, but are not limited to, polyvinylcarbazole resin, polycarbonate resin, polyester resin, ABS resin, acrylic resin, polyimide resin, phenol resin, epoxy resin, silicone resin, and urea resin.

[0089] These binder resins may be used alone as homopolymers or copolymers, or in combination of two or more kinds. If necessary, known additives such as plasticizers, antioxidants, and ultraviolet absorbers may be used in combination.

[0090] [Pixel circuit] The light emitting device may have a pixel circuit connected to the light emitting element. The pixel circuit may be an active matrix type that controls the light emission of the first light emitting element and the second light emitting element independently. The active matrix type circuit may be a voltage programming circuit or a current programming circuit. The drive circuit has a pixel circuit for each pixel. The pixel circuit may have a light emitting element, a transistor that controls the light emission luminance of the light emitting element, a transistor that controls the light emission timing, a capacitance that holds the gate voltage of the transistor that controls the light emission luminance, and a transistor for connecting to GND without going through the light emitting element.

[0091] The light-emitting device has a display region and a peripheral region disposed around the display region. The display region has a pixel circuit, and the peripheral region has a display control circuit. The mobility of a transistor constituting the pixel circuit may be smaller than the mobility of a transistor constituting the display control circuit.

[0092] The slope of the current-voltage characteristic of the transistor that constitutes the pixel circuit may be smaller than the slope of the current-voltage characteristic of the transistor that constitutes the display control circuit. The slope of the current-voltage characteristic can be measured by the so-called Vg-Ig characteristic.

[0093] The transistor that constitutes the pixel circuit is a transistor that is connected to a light-emitting element, such as the first light-emitting element.

[0094] [Pixels] An organic light emitting device includes a plurality of pixels, each of which includes sub-pixels that emit different colors, for example, RGB colors.

[0095] The pixel emits light in an area also called the pixel aperture. This area is the same as the first area. The pixel aperture may be 15 μm or less, or 5 μm or more. More specifically, it may be 11 μm, 9.5 μm, 7.4 μm, 6.4 μm, etc. The distance between the subpixels may be 10 μm or less, more specifically, it may be 8 μm, 7.4 μm, 6.4 μm.

[0096] The pixels may have a known arrangement in plan view. For example, they may be a stripe arrangement, a delta arrangement, a pentile arrangement, or a Bayer arrangement. The shape of the subpixels in plan view may be any known shape. For example, they may be a rectangle, a quadrangle such as a diamond, or a hexagon. Of course, if the shape is not an exact figure but is close to a rectangle, it is included in the rectangle. The shape of the subpixels and the pixel arrangement may be used in combination.

[0097] [Use of the organic light-emitting device according to one embodiment of the present invention] The organic light-emitting device according to an embodiment of the present invention can be used as a component of a display device or a lighting device, and can also be used as an exposure light source for an electrophotographic image forming device, a backlight for a liquid crystal display device, a light-emitting device having a white light source and a color filter, etc.

[0098] The display device may be an image information processing device having an image input unit that inputs image information from an area CCD, a linear CCD, a memory card, etc., an information processing unit that processes the input information, and displays the input image on a display unit.

[0099] The display unit of the imaging device or inkjet printer may have a touch panel function. The driving method of the touch panel function may be an infrared type, a capacitance type, a resistive film type, or an electromagnetic induction type, and is not particularly limited. The display device may be used in the display unit of a multifunction printer.

[0100] Next, a display device according to an embodiment of the present invention will be described with reference to the drawings.

[0101] 18 is a schematic diagram showing an example of a display device according to an embodiment of the present invention. The display device 1800 may have a touch panel 1803, a display panel 1805, a frame 1806, a circuit board 1807, and a battery 1808 between an upper cover 1801 and a lower cover 1809. The touch panel 1803 and the display panel 1805 are connected to flexible printed circuits FPC 1802 and 1804. A transistor is printed on the circuit board 1807. The battery 1808 may not be provided if the display device is not a portable device, and may be provided in a different position even if the display device is a portable device.

[0102] The display device according to this embodiment may have color filters having red, green, and blue colors, the red, green, and blue colors being arranged in a delta arrangement.

[0103] The display device according to the present embodiment may be used as a display unit of a mobile terminal. The mobile terminal may have both a display function and an operation function. Examples of the mobile terminal include a mobile phone such as a smartphone, a tablet, and a head mounted display.

[0104] The display device according to the present embodiment may be used as a display unit of an imaging device having an optical unit with a plurality of lenses and an imaging element that receives light that has passed through the optical unit. The imaging device may have a display unit that displays information acquired by the imaging element. The display unit may be a display unit exposed to the outside of the imaging device, or may be a display unit disposed within a viewfinder. The imaging device may be a digital camera or a digital video camera.

[0105] 19A is a schematic diagram showing an example of an imaging device according to an embodiment of the present invention. The imaging device 1900 may have a viewfinder 1901, a rear display 1902, an operation unit 1903, and a housing 1904. The viewfinder 1901 may have a display device according to this embodiment. In this case, the display device may display not only an image to be captured, but also environmental information, imaging instructions, and the like. The environmental information may include the intensity of external light, the direction of external light, the moving speed of the subject, the possibility that the subject will be blocked by an obstruction, and the like.

[0106] Since the timing suitable for imaging is short, it is better to display information as soon as possible. Therefore, it is preferable to use a display device using the organic light-emitting element of the present invention. This is because the organic light-emitting element has a fast response speed. A display device using an organic light-emitting element can be used more preferably than a liquid crystal display device, which requires a high display speed.

[0107] The imaging device 1900 has an optical section (not shown). The optical section has a plurality of lenses, which form an image on an imaging element housed in a housing 1904. The focus of the plurality of lenses can be adjusted by adjusting their relative positions. This operation can also be performed automatically. The imaging device may be called a photoelectric conversion device. The photoelectric conversion device can include an imaging method that does not capture images sequentially, but detects the difference from the previous image, cuts out an image from an image that is always recorded, and the like.

[0108] FIG. 19B is a schematic diagram showing an example of an electronic device according to an embodiment of the present invention. The electronic device 1910 has a display unit 1911, an operation unit 1912, and a housing 1913. The housing 1913 may have a circuit, a printed circuit board having the circuit, a battery, and a communication unit. The operation unit 1912 may be a button or a touch panel type reaction unit. The operation unit may be a biometric recognition unit that recognizes a fingerprint and performs unlocking or the like. An electronic device having a communication unit can also be called a communication device. The electronic device may further have a camera function by being provided with a lens and an imaging element. An image captured by the camera function is displayed on the display unit. Examples of the electronic device include a smartphone and a notebook computer.

[0109] Fig. 20A is a schematic diagram showing an example of a display device according to an embodiment of the present invention. Fig. 20A shows a display device such as a television monitor or a PC monitor. The display device 2000 has a frame 2001 and a display unit 2002. The above-mentioned light-emitting device may be used for the display unit 2002.

[0110] The display device has a frame 2001 and a base 2003 that supports a display unit 2002. The base 2003 is not limited to the form shown in FIG. 20A. The lower side of the frame 2001 may also serve as the base. The frame 2001 and the display unit 2002 may be curved. The radius of curvature may be 5000 mm or more and 6000 mm or less.

[0111] Fig. 20B is a schematic diagram showing another example of a display device according to an embodiment of the present invention. A display device 2010 in Fig. 20B is configured to be foldable, and is a so-called foldable display device. The display device 2010 includes a first display unit 2011, a second display unit 2012, a housing 20, and a display unit 2013. 13, and a bending point 2014. The first display unit 2011 and the second display unit 2012 may have the light emitting device described above. The first display unit 2011 and the second display unit 2012 may be a single display unit without any joints. The first display unit 2011 and the second display unit 2012 can be separated by the bending point. The first display unit 2011 and the second display unit 2012 may each display different images, or the first and second display units may display a single image.

[0112] FIG. 21A is a schematic diagram showing an example of an illumination device according to an embodiment of the present invention. The illumination device 2100 may have a housing 2101, a light source 2102, a circuit board 2103, an optical film 2104, and a light diffusion unit 2105. The light source may have the above-mentioned organic light-emitting element. The optical filter may be a filter that transmits the light of the light source and improves the color rendering of the light source. The light diffusion unit transmits the light of the light source, such as for lighting up, and effectively diffuses it, so that the light can be delivered over a wide range. The optical filter and the light diffusion unit may be provided on the light emission side of the illumination. If necessary, a cover may be provided on the outermost part.

[0113] The lighting device is, for example, a device that illuminates a room. The lighting device may emit white light, neutral white light, or any other color from blue to red. It may have a dimming circuit that adjusts the brightness of the light. The lighting device may have the organic light-emitting element and a power supply circuit connected thereto. The power supply circuit is a circuit that converts AC voltage into DC voltage. Moreover, white has a color temperature of 4200K, and neutral white has a color temperature of 5000K. The lighting device may have a color filter.

[0114] The lighting device according to the present embodiment may also include a heat dissipation section that dissipates heat from within the device to the outside, and examples of the heat dissipation section include metals with high specific heat, liquid silicon, and the like.

[0115] 21B is a schematic diagram of an automobile, which is an example of a moving body according to an embodiment of the present invention. The automobile has tail lamps, which are an example of a lamp. The automobile 2110 has tail lamps 2111, and may be configured to turn on the tail lamps when braking or the like is performed.

[0116] The tail lamp 2111 may have the organic light-emitting element described above. The tail lamp may have a protective member for protecting the organic EL element. The protective member may be made of any material as long as it has a certain degree of strength and is transparent, but it is preferable that the protective member is made of polycarbonate or the like. Polycarbonate may be mixed with a furandicarboxylic acid derivative, an acrylonitrile derivative, or the like.

[0117] The automobile 2110 may have a body 2113 and a window 2112 attached thereto. The window may be a transparent display as long as it is not a window for checking the front and rear of the automobile. The transparent display may have the above-mentioned organic light-emitting element. In this case, the constituent materials of the electrodes and the like of the organic light-emitting element are made of transparent members.

[0118] The moving body according to the present embodiment has a driving unit such as an engine or a motor, and a means of transportation such as wheels, propellers, or tires. Specifically, the moving body may be an automobile, a ship, an aircraft, a drone, a bicycle, a railroad car, or the like. The moving body may have a body and a lamp provided on the body. The lamp may emit light to indicate the position of the body. The lamp has the organic light-emitting element according to the present embodiment.

[0119] An application example of the display device according to an embodiment of the present invention will be described with reference to Fig. 22A and Fig. 22B. The display device can be applied to a system that can be worn as a wearable device, such as smart glasses, HMD, or smart contacts. An image capturing and display device used in such an application example has an image capturing device capable of photoelectrically converting visible light, and a display device capable of emitting visible light.

[0120] 22A illustrates glasses 2200 (smart glasses) according to one application example. An imaging device 2202 such as a CMOS sensor or SPAD is provided on the front side of a lens 2201 of the glasses 2200. In addition, a display device according to any of the above-mentioned embodiments is provided on the back side of the lens 2201.

[0121] The glasses 2200 further include a control device 2203. The control device 2203 functions as a power source that supplies power to the image capture device 2202 and the display device according to each embodiment. The control device 2203 also controls the operations of the image capture device 2202 and the display device. The lens 2201 is formed with an optical system for focusing light on the image capture device 2202.

[0122] FIG. 22B illustrates glasses 2210 (smart glasses) according to one application example. The glasses 2210 have a control device 2212. The control device 2212 is equipped with an imaging device corresponding to the imaging device 2202 and a display device. An optical system for projecting light emitted by the display device in the control device 2212 is formed in the lens 2211, and an image is projected onto the lens 2211. The control device 2212 functions as a power source that supplies power to the imaging device and the display device, and controls the operation of the imaging device and the display device. The control device may have a line-of-sight detection unit that detects the line of sight of the wearer. Infrared light may be used for detecting the line of sight. The infrared light emitting unit emits infrared light toward the eyeball of a user gazing at a display image. An imaging unit having a light receiving element detects the reflected light of the emitted infrared light from the eyeball, thereby obtaining an image of the eyeball. By having a reduction means for reducing light from the infrared light emitting unit to the display unit in a planar view, deterioration of image quality is reduced.

[0123] The gaze of the user with respect to the displayed image is detected from an image of the eyeball obtained by capturing infrared light. Any known method can be applied to gaze detection using the image of the eyeball. As an example, a gaze detection method based on a Purkinje image formed by reflection of irradiated light on the cornea can be used.

[0124] More specifically, the gaze detection process is performed based on the pupil-corneal reflex method. Using the pupil-corneal reflex method, a gaze vector that indicates the direction (rotation angle) of the eyeball is calculated based on the pupil image and the Purkinje image included in the captured image of the eyeball, thereby detecting the user's gaze.

[0125] A display device according to an embodiment of the present invention may have an imaging device having a light receiving element, and may control a display image on the display device based on information about a user's line of sight from the imaging device.

[0126] Specifically, the display device determines a first display area that the user gazes at and a second display area other than the first display area based on the line-of-sight information. The first display area and the second display area may be determined by a control device of the display device, or may be determined by an external control device and received. In the display area of ​​the display device, the display resolution of the first display area may be controlled to be higher than the display resolution of the second display area. In other words, the resolution of the second display area may be lower than that of the first display area.

[0127] The display area includes a first display area and a second display area different from the first display area, and an area having a high priority is determined from the first display area and the second display area based on line-of-sight information. The first display area and the second display area may be determined by a control device of the display device, or may be determined by an external control device and received. The resolution of the area having a high priority may be controlled to be higher than the resolution of areas other than the area having a high priority. In other words, the resolution of an area having a relatively low priority may be lowered.

[0128] AI may be used to determine the first display area or the area with high priority. The AI ​​uses the image of the eyeball and the direction in which the eyeball in the image was actually looking as training data, and calculates the direction from the image of the eyeball. The AI ​​program may be a model configured to estimate the angle of the line of sight from the camera and the distance to an object in the line of sight. The AI ​​program may be included in the display device, the imaging device, or an external device. If included in the external device, it is transmitted to the display device via communication.

[0129] When display control is performed based on visual recognition detection, the present invention is preferably applicable to smart glasses that further include an imaging device for capturing images of the outside world. The smart glasses can display captured outside information in real time.

[0130] The disclosure of this embodiment includes the following configurations and methods. (Configuration 1) A defect inspection apparatus for detecting defects in a display device having a plurality of pixels arranged therein, an image acquisition unit that acquires an image of the pixel of the display device; a determination unit that determines a defect of the display device based on the image acquired by the image acquisition unit; Equipped with The image acquisition unit acquires an image of one pixel of the plurality of pixels of the display device by a plurality of sensor pixels. A defect inspection device comprising: (Configuration 2) 2. The defect inspection device according to configuration 1, wherein the determination unit distinguishes between defects in the display device and defects in the sensor pixels based on a size of a defect included in the image acquired by the image acquisition unit. (Configuration 3) A defect inspection apparatus for detecting defects in a display device having a plurality of pixels arranged therein, an image acquisition unit that acquires an image of the pixel of the display device by a sensor pixel; an identification unit that identifies a position of a defect candidate of the display device in the image acquired by the image acquisition unit; a contour generating unit that generates a contour of the defect candidate of the display device based on a position of the defect candidate of the display device; a determination unit that determines a defect of the display device from the defect candidates of the display device based on the length of the contour; A defect inspection device comprising: (Configuration 4) 4. The defect inspection device according to configuration 3, wherein the image acquisition section acquires an image of one pixel of the plurality of pixels of the display device by using a plurality of sensor pixels. (Configuration 5) The defect inspection device according to configuration 3, wherein the judgment unit acquires a defect judgment threshold, compares the length of the contour generated by the contour generation unit with the defect judgment threshold, and judges defects in the display device based on a result of the comparison. (Configuration 6) 6. The defect inspection device according to configuration 5, wherein the defect determination threshold is a length of a contour of one pixel of the display device in the image acquired by the image acquisition section. (Configuration 7) 6. The defect inspection apparatus according to configuration 5, wherein the defect determination threshold is a length of a contour at which the determination unit can determine that a defect is of a size that is visible. (Configuration 8) The defect inspection device according to configuration 3, wherein the judgment unit acquires a defect judgment threshold, and judges the defect candidate whose contour length is equal to or greater than the defect judgment threshold to be a defect of the display device. (Configuration 9) The display device may further include a notification unit that notifies a result of the determination of the defect of the display device by the determination unit. 9. The defect inspection device according to any one of configurations 1 to 8, (Configuration 10) The defect inspection device according to configuration 9, wherein the notification unit notifies that the image acquired by the image acquisition unit contains a defect in the display device or a defect in the sensor pixel. (Configuration 11) 11. The defect inspection device according to any one of configurations 3 to 10, wherein the identification unit generates a binary image indicating a position of the defect candidate based on a result of comparing a pixel value of the sensor pixel with a feature amount calculated from pixel values ​​of sensor pixels surrounding the sensor pixel. (Configuration 12) 12. The defect inspection apparatus according to configuration 11, wherein the identifying unit calculates the feature amount using a median filter. (Configuration 13) 12. The defect inspection apparatus according to configuration 11, wherein the identifying unit calculates the feature amount using an average filter. (Configuration 14) 12. The defect inspection device according to configuration 11, wherein the specifying unit performs an interpolation process for values ​​between pixels of the binarized image. (Configuration 15) 15. The defect inspection device according to any one of configurations 1 to 14, wherein a pixel size of the sensor pixel is equal to or smaller than 1 / 9 of a pixel size of the display device. (Configuration 16) an acquisition step of acquiring an image of a pixel of a display device in which a plurality of pixels each having an organic light-emitting element is arranged, by an image acquisition unit; a determination step of determining a defect of the display device based on the image acquired by the image acquisition unit; Including, The acquiring step acquires an image of one pixel of the plurality of pixels of the display device by a plurality of sensor pixels of the image acquiring unit. The present invention relates to a method for producing an organic light-emitting element. (Configuration 17) an acquisition step of acquiring an image of a pixel of a display device in which a plurality of pixels each having an organic light-emitting element is arranged, by an image acquisition unit; a step of identifying a position of a defect candidate of the display device in the image acquired by the image acquisition unit; a contour generating step of generating contours of the defect candidates of the display device based on positions of the defect candidates of the display device; determining whether the display device has a defect from among the display device defect candidates based on the length of the contour; A method for producing an organic light-emitting element, comprising: (Configuration 18) A display device having a plurality of pixels, At least one of the plurality of pixels has an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to the configuration 16 or 17, and a transistor connected to the organic light-emitting element. A display device comprising: (Configuration 19) An optical section having a plurality of lenses; an imaging element that receives light that has passed through the optical unit; a display unit that displays an image captured by the imaging element; having The display unit has an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to the configuration 16 or 17. A photoelectric conversion device comprising: (Configuration 20) A display unit having an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to configuration 16 or 17; A housing provided with the display unit; A communication unit provided in the housing for communicating with an external device; 1. An electronic device comprising: (Configuration 21) A light source having an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to configuration 16 or 17; a light diffusing portion or an optical film that transmits light emitted by the light source; A lighting device comprising: (Configuration 22) A lighting device having an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to configuration 16 or 17; An aircraft having the lighting device provided thereon; A moving object comprising: [Explanation of symbols]

[0131] 100 defect inspection device, 101 image acquisition unit, 102 address generation unit, 103 contour generation unit, 104 determination unit, 110 display device

Claims

1. A defect inspection apparatus for detecting defects in a display device having a plurality of pixels arranged therein, an image acquisition unit that acquires an image of the pixel of the display device; a determination unit that determines a defect of the display device based on the image acquired by the image acquisition unit; Equipped with The image acquisition unit acquires an image of one pixel of the plurality of pixels of the display device by a plurality of sensor pixels. A defect inspection device comprising:

2. 2. The defect inspection device according to claim 1, wherein the determination unit distinguishes between defects in the display device and defects in the sensor pixels based on a size of a defect included in the image acquired by the image acquisition unit.

3. A defect inspection apparatus for detecting defects in a display device having a plurality of pixels arranged therein, an image acquisition unit that acquires an image of the pixel of the display device by a sensor pixel; an identification unit that identifies a position of a defect candidate of the display device in the image acquired by the image acquisition unit; a contour generating unit that generates a contour of the defect candidate of the display device based on a position of the defect candidate of the display device; a determination unit that determines a defect of the display device from the defect candidates of the display device based on the length of the contour; A defect inspection device comprising:

4. 4. The defect inspection device according to claim 3, wherein the image acquisition section acquires an image of one pixel of the plurality of pixels of the display device by using a plurality of sensor pixels.

5. 4. The defect inspection device according to claim 3, wherein the judgment unit acquires a defect judgment threshold, compares the length of the contour generated by the contour generation unit with the defect judgment threshold, and judges defects in the display device based on a result of the comparison.

6. 6. The defect inspection device according to claim 5, wherein the defect determination threshold is a length of a contour of one pixel of the display device in the image acquired by the image acquisition unit.

7. 6. The defect inspection apparatus according to claim 5, wherein the defect determination threshold is a length of a contour at which the determination unit can determine that a defect is of a visible size.

8. 4. The defect inspection device according to claim 3, wherein the determination unit obtains a defect determination threshold, and determines that the defect candidate whose contour has a length equal to or greater than the defect determination threshold is a defect of the display device.

9. 4. The defect inspection device according to claim 3, further comprising a notification section that notifies a result of the determination of the defect in the display device by the determination section.

10. 10. The defect inspection device according to claim 9, wherein the notification section notifies that the image acquired by the image acquisition section contains a defect of the display device or a defect of the sensor pixel.

11. The identifying unit determines a binarized image indicating a position of the defect candidate based on a result of comparing a pixel value of the sensor pixel with a feature amount calculated from pixel values ​​of sensor pixels surrounding the sensor pixel.

4. The defect inspection apparatus according to claim 3, wherein an image is generated.

12. 12. The defect inspection apparatus according to claim 11, wherein the specifying unit calculates the feature amount by using a median filter.

13. The defect inspection apparatus according to claim 11 , wherein the specifying unit calculates the feature amount by using an average filter.

14. The defect inspection device according to claim 11 , wherein the specifying unit performs a process of complementing values ​​between pixels of the binarized image.

15. 4. The defect inspection device according to claim 3, wherein a pixel size of the sensor pixel is equal to or smaller than one-ninth of a pixel size of the display device.

16. an acquisition step of acquiring an image of a pixel of a display device in which a plurality of pixels each having an organic light-emitting element is arranged, by an image acquisition unit; a determination step of determining a defect of the display device based on the image acquired by the image acquisition unit; Including, The acquiring step acquires an image of one pixel of the plurality of pixels of the display device by a plurality of sensor pixels of the image acquiring unit. The present invention relates to a method for producing an organic light-emitting element.

17. an acquisition step of acquiring an image of a pixel of a display device in which a plurality of pixels each having an organic light-emitting element is arranged, by an image acquisition unit; a step of identifying a position of a defect candidate of the display device in the image acquired by the image acquisition unit; a contour generating step of generating contours of the defect candidates of the display device based on positions of the defect candidates of the display device; determining whether the display device has a defect from among the display device defect candidates based on the length of the contour; A method for producing an organic light-emitting element, comprising:

18. A display device having a plurality of pixels, At least one of the plurality of pixels has an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to claim 16 or 17, and a transistor connected to the organic light-emitting element. A display device comprising:

19. An optical section having a plurality of lenses; an imaging element that receives light that has passed through the optical unit; a display unit that displays an image captured by the imaging element; having The display unit has an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to claim 16 or 17. A photoelectric conversion device comprising:

20. A display unit having an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to claim 16 or 17; A housing provided with the display unit; A communication unit provided in the housing for communicating with an external device; 1. An electronic device comprising:

21. A light source having an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to claim 16 or 17; a light diffusing portion or an optical film that transmits light emitted by the light source; A lighting device comprising:

22. A lamp having an organic light-emitting element manufactured by the method for manufacturing an organic light-emitting element according to claim 16 or 17; An aircraft having the lighting device provided thereon; A moving object comprising:

Images