Inspection system

Abstract

To provide an inspection system that can improve a user's working efficiency.SOLUTION: An inspection system inspecting an inspection target comprises: an imaging unit that picks up an image of an inspection target; a setting unit that generates a registered image registered as an image of the inspection target on the basis of the image picked up by the imaging unit, wherein inspection areas forming part of the registered image are set and the same details of inspection are set for every inspection area, and the inspection items in which the details of inspection are itemized are selected and set; an inspection area information generation unit that generates inspection area information in which the inspection item that is set is associated for every inspection area; and an inspection area information display unit that displays the inspection area information and displays the inspection item that is set for every inspection area.SELECTED DRAWING: Figure 7

Description

[Technical Field]

[0001] The present invention relates to an inspection system that photographs an object to be inspected with an imaging means such as a camera and performs an inspection process using the obtained image. [Background technology]

[0002] Conventionally, inspection systems that use image processing to inspect images of an inspection target captured by a camera, for example for the purpose of visual inspection of electronic components, have been widely used. Inspection devices for such applications include inspection systems that allow parameters for setting inspection items or parameters for the inspection area that indicates the range of inspection performed by the inspection items to be set using a GUI (Graphical User Interface). In such inspection systems, coordinate values, which are parameters for the inspection area, are used for each inspection item. For example, if the inspection area is rectangular, the coordinates of the upper left corner and the coordinates of the lower right corner of the rectangle are specified for each inspection item.

[0003] When different inspection items are inspected within the same inspection area, the user must manually set the parameters for each inspection item. This can lead to user errors when there are many inspection items, and the user may not achieve the results they desire. To address this issue, a technique has been proposed to standardize parameters by referencing parameters between inspection items, thereby preventing user errors (see Patent Document 1). For example, parameter standardization is possible by setting coordinate values, which are parameters for the inspection area, in one inspection item and then referencing the same inspection area in another inspection item. Another technique has been proposed to reduce the user's workload by standardizing parameters that can be set by inspection items and assigning the standardized parameters to the inspection items (see Patent Document 2). [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2012-123777 [Patent Document 2] Japanese Patent Application Laid-Open No. 2014-89706 Summary of the Invention [Problem to be solved by the invention]

[0005] However, with the conventional techniques described in Patent Document 1 or Patent Document 2, when a need arises for parameter modification, a large amount of maintenance work is required. Specifically, when improving the accuracy of pass / fail judgment of an inspection object during the operation of an inspection system, it is necessary to check and change the current values ​​of the parameters of the inspection item or the parameters of the inspection area. If there are only a small number of inspection items, for example, two or three, it is easy to search for the parameter reference source by checking each inspection item one by one. However, if there are many inspection items or if parameter references are hierarchical, checking each inspection item one by one to search for the parameter reference source becomes a burden on the user.

[0006] In particular, changing the parameters of an inspection area requires a greater number of maintenance man-hours. Even changing just one parameter of an inspection area changes the inspection range of the inspection target, increasing the possibility of obtaining results that the user does not want, such as incorrectly classifying a product that was previously determined to be defective as non-defective. Therefore, even when changing just one parameter of an inspection area, the user must work carefully, which is a burden on the user and a very time-consuming task.

[0007] An object of the present invention is to provide an inspection system that allows a user to intuitively understand the relationship between inspection items and inspection areas, thereby improving work efficiency. [Means for solving the problem]

[0008] The inspection system of the present invention is an inspection system for inspecting an object to be inspected, and is characterized by comprising: an imaging unit that captures an image of the object to be inspected; a registered image that is registered as an image of the object to be inspected based on the image captured by the imaging unit; an inspection area that constitutes a portion of the registered image; a setting unit that selects and sets inspection items in which the same inspection content is set for each inspection area and the inspection content is itemized; an inspection area information creation unit that creates inspection area information that associates the inspection items that have been set for each inspection area; and an inspection area information display unit that displays the inspection area information and displays the inspection items that have been set for each inspection area. [Effects of the Invention]

[0009] According to the present invention, it is possible to provide an inspection system that allows a user to intuitively understand the relationship between inspection items and inspection areas, thereby improving the user's work efficiency. [Brief explanation of the drawings]

[0010] [Figure 1] 1 is a configuration diagram illustrating an example of an inspection system according to an embodiment of the present invention. [Figure 2] 2 is a configuration diagram showing an example of an internal hardware configuration of the information processing device shown in FIG. 1. [Figure 3] 2 is a configuration diagram showing an example of a software configuration of the information processing device shown in FIG. 1. FIG. [Figure 4] 4 is a configuration diagram showing an example of a setting unit generated by the display control unit shown in FIG. 3. FIG. [Figure 5] 4 is a configuration diagram showing an example of an examination area editing screen generated by a display control unit shown in FIG. 3. FIG. [Figure 6] 4 is a block diagram showing an example of an examination item editing screen generated by a display control unit shown in FIG. 3. FIG. [Figure 7] 10 is a list showing an example of inspection area information created by an inspection area information creating unit. [Figure 8] 4 is a configuration diagram showing an example of a batch processing screen generated by a display control unit shown in FIG. 3. FIG. DETAILED DESCRIPTION OF THE INVENTION

[0011] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

[0012] <Inspection system configuration> Fig. 1 is a diagram showing an example of the schematic configuration of an inspection system according to a first embodiment of the present invention. As shown in Fig. 1, an image processing system 100 includes an information processing device 110, a display device 120, an input device 130, an imaging unit 140, an illumination device 150, an illumination device controller 160, and a control device 170. An inspection object 180 is an object to be inspected using this inspection system, such as an electronic component on which a visual inspection is performed.

[0013] The information processing device 110 is configured to be able to communicate with the imaging unit 140 that captures an image of the inspection object 180 via a predetermined cable or the like. The information processing device 110 is also configured to be able to communicate with a lighting device controller 160 that controls the lighting device 150 via a predetermined cable or the like. The information processing device 110 is also configured to be able to communicate with a control device 170 in the system via a predetermined cable or the like. The information processing device 110 is also configured to be able to communicate with the display device 120 and the input device 130 via a predetermined cable or the like. That is, the information processing device 110 comprehensively controls the operation of the image processing system 100 by controlling the display device 120, the input device 130, the imaging unit 140, the lighting device 150, and the lighting device controller 160, which are connected via a predetermined cable or the like.

[0014] The display device 120 displays various images, various information, etc. on a display screen in accordance with the control of the information processing device 110.

[0015] The input device 130 is operated by the user when the user inputs various instructions to the information processing device 110, and inputs the input instructions to the information processing device 110 in accordance with an input support operation from the user. The input device 130 is configured with, for example, a keyboard, a mouse, etc.

[0016] The imaging unit 140 takes an image of the inspection object 180 under the control of the information processing device 110, and transmits image data obtained by the image capture to the information processing device 110 via a predetermined cable or the like.

[0017] The lighting device controller 160 controls the lighting of the lighting device 150 under the control of the information processing device 110. Based on the control of the lighting device controller 160, the lighting device 150 switches the lighting on and off and adjusts the brightness.

[0018] The control device 170 is a device that operates under the control of the information processing device 110, and controls, for example, a stage on which the inspection object 180 is placed, and moves the inspection object 180 to a target position.

[0019] <Hardware configuration> Next, a hardware configuration of the information processing device 110 according to one embodiment of the present invention will be described. Fig. 2 is a configuration diagram showing an example of the hardware configuration of the information processing device 110 shown in Fig. 1. In addition to the internal configuration of the information processing device 110, Fig. 2 also shows various devices connected to the information processing device 110.

[0020] As shown in FIG. 2, the information processing device 110 is composed of a CPU 200 that controls each part within the information processing device 110, a hard disk drive (HDD) 220, an HDD controller 210 that controls access to the HDD 220, a RAM 230, a ROM 240, a system bus 250, a video controller 260, an input controller 270, an image input controller 280, a lighting communication I / F controller 290, and a control device communication I / F controller 291.

[0021] The CPU 200 controls each device connected to the system bus 250 based on a program stored in the ROM 240 or the HDD 220 , and performs overall control of the operation of the information processing device 110 .

[0022] The HDD controller 210 controls access to the HDD 220. The HDD 220 stores a boot program, various application programs, edited files, various data, various information, etc. The HDD 220 also stores an OS (Operating System), an image inspection application program that causes the CPU 200 to execute various processes described below, and inspection data used in executing the program.

[0023] The RAM 230 functions as a main memory, a work area, etc. for the CPU 200. When executing a process, the CPU 200 loads necessary programs, etc. into the RAM 230 and executes the programs to realize various operations in the information processing device 110. The ROM 240 stores a BIOS (Basic Input / Output System), which is a control program for the CPU 200, etc.

[0024] The system bus 250 connects the CPU 200, HDD controller 210, RAM 230, ROM 240, video controller 260, input controller 270, image input controller 280, lighting communication I / F controller 290, and control device communication I / F controller 291 so that they can communicate with each other.

[0025] The video controller 260 controls display on the display device 120, which is a display device. The input controller 270 controls input from the input device 130, which is made up of a keyboard, mouse, etc. The image input controller 280 is configured to communicate with the imaging unit 140 and be able to receive image data from the imaging unit 140. The lighting communication I / F controller 290 controls communication with the lighting device controller 160. The control device communication I / F controller 291 controls communication with the control device 170.

[0026] <Software configuration> Next, a description will be given of the software configuration of an image inspection application program executed by the information processing device 110 according to one embodiment of the present invention. Fig. 3 is a diagram showing an example of the software configuration of the image inspection application program according to this embodiment.

[0027] The software configuration 300 includes a display control unit 310 , inspection data 320 , an image processing unit 330 , and an inspection processing unit 340 .

[0028] The display control unit 310 performs processing corresponding to operations from the input device 130, which includes a keyboard, a mouse, and the like, and controls the display of the processing results on the screen of the display device 120. For example, when a button displayed on the screen is clicked with the mouse, a pre-programmed process is performed and the processing results are displayed on the screen. Furthermore, when a user edits the inspection data 320, the display control unit 310 refers to the inspection data 320 and the image processing unit 330 and converts the data into a format that the user can understand. Next, the display control unit 310 generates a dedicated parameter editing screen for displaying the data and controls the display of the generated screen on the screen of the display device 120. Furthermore, when the user changes various parameters on the parameter editing screen, the changed parameters are converted into the format in the inspection data 320, and the inspection data 320 is updated.

[0029] The inspection data 320 is data for carrying out an inspection to be used when carrying out an inspection process using this inspection system, and is composed of a registered image 321, which is image data of the inspection target, and various inspection parameters, namely, positioning parameters 322, inspection area parameters 323, and inspection item parameters 324. The registered image 321 may be either a captured image, which is an image captured by the imaging unit 140 as is, or a processed image obtained by performing processing described below to generate new image data that can be inspected, and is an image in which all or a part of the captured image or the processed image is selected by the user and registered as an inspection image.

[0030] The positioning parameters 322 are parameters for correcting the position of the inspection area based on the amount of positional deviation of the inspection object when performing inspection processing using this inspection system. Hereinafter, in this embodiment, position correction using pattern matching will be described as an example. The inspection area parameters 323 are parameters for specifying the area where an inspection item is to be performed when performing inspection processing using this inspection system. The inspection item parameters 324 are parameters for the item to be inspected on the inspection object when performing inspection processing using this inspection system.

[0031] The image processing unit 330 receives image data from the imaging unit 140, performs image processing on the image data so that the image data can be inspected, and generates new image data as a processed image. Note that the image processing here refers to, for example, processing for correcting a captured image to generate new image data, or processing for generating new image data from image data obtained by multiple captures, and is different from the inspection processing performed by the inspection processing unit 340.

[0032] The image generated by the image processing unit 330 is referenced by the display control unit 310 when generating a screen, and is displayed in a data format that is understandable to the user. Furthermore, when performing an inspection process using this inspection system, the image data generated by the image processing unit 330 is passed to the inspection processing unit 340, and the inspection process is performed on the passed image data. The image processing performed at this time is the same as the image processing performed when the registered image was generated. Note that the image processing performed by the image processing unit 330 may not be necessary depending on the inspection object. In that case, the image data generated by the image processing unit may simply be the captured image data itself.

[0033] When performing inspection processing using this inspection system, the inspection processing unit 340 performs inspection on the image data of the inspection target passed from the image processing unit 330, based on the contents of the inspection data 320. The results of the inspection processing performed by the inspection processing unit 340 are displayed on the screen of the display device 120 by generating a dedicated display screen in the display control unit.

[0034] <Parameter editing> Next, we will explain parameter editing in the image inspection application program executed by the information processing device 110, which is one embodiment of the present invention. Figure 4 is a configuration diagram showing an example of a setting section that is generated by the display control unit 310 when editing inspection settings in the image inspection application program and is displayed on the screen of the display device 120.

[0035] The setting unit 400 is composed of an image display unit 410 that displays image data obtained from the registered image 321, a positioning setting display unit 420 that is generated based on parameters obtained from the positioning parameters 322, an examination area setting display unit 430 that is generated based on parameters obtained from the examination area parameters 323, and an examination item setting display unit 440 that is generated based on parameters obtained from the examination item parameters 324.

[0036] Hereinafter, in this embodiment, the inspection object will be described as an example of visual inspection of electronic components, particularly visual inspection of the bonding state of electronic components to which wire bonding has been applied.

[0037] First, editing of positioning setting parameters will be described with reference to Fig. 4. When editing the positioning setting parameters, the user operates the positioning setting display unit 420 using the input device 130. The positioning setting display unit 420 is made up of a positioning ID (A1, A2, ... in Fig. 4) for distinguishing positioning, obtained from the positioning parameters 322, and a pattern matching model image for positioning. The user can display a positioning setting editing screen (not shown), which is a screen for editing the parameters of the target positioning setting, by placing the cursor on the positioning ID to be edited and clicking, and edit the positioning parameters.

[0038] Next, editing of inspection area parameters will be described with reference to Fig. 4. When editing the parameters of an inspection area, the user operates the inspection area setting display section 430 using the input device 130. The inspection area setting display section 430 is made up of inspection area IDs (S1, S2, ... in Fig. 4) for distinguishing the inspection areas, which are obtained from the inspection area parameters 323. The user can display the inspection area editing screen 500 (see Fig. 5), which is a screen for editing the target parameters, by placing the cursor on the inspection area ID to be edited and clicking it, and can then edit the inspection area parameters.

[0039] The configuration of the inspection area editing screen 500 in this embodiment will be described with reference to Fig. 5. Fig. 5 is a configuration diagram showing an example of the inspection area editing screen displayed on the display device 120 when editing inspection area parameters in an image inspection application program executed by the information processing device 110.

[0040] The inspection area editing screen 500 is composed of an image display section 410, a positioning parameter reference selection section 510 for setting positioning reference parameters acquired from the inspection area parameters 323, and an inspection area parameter setting input section 520.

[0041] The image display unit 410 displays image data acquired from the registered image 321, generates an edited inspection area 530 based on parameters specified in the setting input unit 520, and displays the generated edited inspection area 530 superimposed on the registered image. The edited inspection area 530 displayed on the image display unit 410 may be changeable in position and size on the image display unit 410. For example, when a cursor is placed on a vertex of the edited inspection area 530 and dragged, the position and size of the edited inspection area 530 may change in accordance with the drag operation. In this case, the parameters specified in the setting input unit 520 may be calculated from information on the edited inspection area 530, and the corresponding parameters in the input unit 520 may be updated.

[0042] The positioning parameter reference selection unit 510 sets the parameters to be referenced for the correction amount when performing position correction of the inspection area for the edited inspection area 530. For example, a pull-down control is used to display the positioning ID displayed in the positioning setting display unit 420. The user can set parameters by selecting a positioning setting suitable for the inspection area from the positioning IDs displayed in the pull-down control. When performing inspection processing using this inspection system, the inspection processing unit 340 can refer to the positioning parameters 322 from the information on the positioning ID set in the positioning parameter reference selection unit 510 and apply the results of the positioning processing.

[0043] In the setting input unit 520, parameters for determining the inspection area are set. If the inspection area is rectangular, then, for example, the coordinates of each vertex on one of the diagonal lines of the rectangle can be set as parameters for determining the inspection area. In FIG. 5, the user inputs the parameter settings for the inspection area using a spin control. Furthermore, as the parameters are changed, the inspection area displayed on the image display unit 410 is also updated.

[0044] Returning to the explanation of FIG. 4, editing of parameters of an inspection item will be described with reference to FIG. 4. When editing parameters of an inspection item, the user uses input device 130 to perform operations on inspection item setting display section 440. Inspection item setting display section 440 is divided into tabs for each inspection type (wire, chip, bond notation in FIG. 4), and each inspection type is composed of an inspection item ID (W1, W2, ... in FIG. 4) for distinguishing the inspection item and a pass / fail judgment item (height, bend, length notation in FIG. 4). The user places and clicks the inspection type tab to which the inspection item to be edited belongs, and then clicks the inspection item ID to be edited, thereby displaying inspection item editing screen 600, which is a screen for editing the target parameters, and allowing editing of the inspection item parameters.

[0045] The configuration of an examination item edit screen 600 in this embodiment will be described with reference to Fig. 6. Fig. 6 is a configuration diagram showing an example of an examination item edit screen displayed on the display device 120 when examination item parameters are edited using an image inspection application program.

[0046] The examination item editing screen 600 is composed of an image display section 410, an examination area reference selection section 610 for setting the examination area reference destination parameters acquired from the examination item parameters 324, and an examination item parameter setting input section 620.

[0047] In this embodiment, an examination item with a wire examination type will be described as an example. The image display unit 410 displays reference examination areas (630, 631) superimposed on the registered image based on the parameters specified in the examination area reference selection unit 610. In Fig. 6, two examination areas are prepared to be specified in the examination area reference selection unit 610. In this case, all the examination areas may be displayed, or only the examination area being edited may be displayed.

[0048] In the inspection area reference selection unit 610, the user sets parameters of an inspection area suitable for carrying out the inspection item being edited. For example, a pull-down control is used to display the inspection area ID displayed in the inspection area setting display unit 430. The user can set parameters by selecting an inspection area suitable for the inspection item from the inspection area IDs displayed in the pull-down control. Furthermore, as the parameters are changed, the inspection area displayed in the image display unit 410 is also updated. When carrying out inspection processing using this inspection system, the inspection processing unit 340 can refer to the inspection area parameters 323 from the information on the inspection area ID set in the inspection area reference selection unit 610 and apply the inspection area.

[0049] The inspection item parameter setting input section 620 sets parameters related to the inspection process of the inspection item being edited. In Fig. 6, for example, a check box is used to determine whether or not to implement the inspection item being edited. The user simply checks the check box if the inspection item being edited is to be implemented, and unchecks it if not. In addition, values ​​can be input using a spin control or the like to set the detection parameters and pass / fail judgment threshold.

[0050] In this way, by setting the inspection item parameters for each inspection area (i.e., for each inspection area ID), the same inspection content is set for each inspection area. After setting the inspection item parameters for all inspection areas to be inspected, the inspection area information creation unit 325 creates inspection area information 650, as shown in FIG. 7, in which the inspection items set for each inspection area are associated. The inspection area information 650 shown in FIG. 7 is a list showing the relationship between the inspection area and the inspection item using the positioning parameters 322, the inspection area parameters 323, and the inspection item parameters 324. The inspection area list section 651 lists all the inspection area IDs displayed in the inspection area setting display section 430. If the inspection area ID in the inspection area list section 651 refers to a positioning ID for position correction, the positioning ID is linked to the inspection area list section 651 and displayed in the positioning list section 652 (to the right of the corresponding inspection area ID in the table in FIG. 7); if no reference is made, the positioning ID is left blank. Furthermore, if the inspection area ID in the inspection area list section 651 is referenced as an inspection area by an inspection item, the inspection item ID is linked to the inspection area list section 651 and displayed in the inspection item list section 653 (to the right of the corresponding inspection area ID and positioning list section 652 in the table in Fig. 7), and is left blank if not referenced. The inspection area information section 650 further has a target area selection section 654 which can be selected for each inspection area ID, and a collective selection section 655 which can select all inspection area IDs.

[0051] <Display of test items and test areas> Next, a description will be given of the display of the relationship between inspection items and inspection areas in the image inspection application program executed by the information processing device 110, which is one embodiment of the present invention. Fig. 8 is a configuration diagram showing an example of a batch processing screen displayed on the display device 120 when the image inspection application program displays the relationship between inspection items and inspection areas.

[0052] The batch processing screen 700 has an image display section 410 and an inspection area information display section 710, and the image display section 410 and the inspection area information display section 710 can be displayed simultaneously. The inspection area information display section 710 displays the inspection area information 650 created by the inspection area information creation section 325, and also displays an inspection area list section 711, a positioning list section 712, an inspection item list section 713, a target area selection section 714, and a batch selection section 715.

[0053] The inspection area information display section 710 displays a list of all inspection area IDs, positioning IDs linked to the inspection area IDs, and inspection item IDs linked to the inspection area IDs in a table format. By checking the inspection area information display section 710, the user can confirm the relationship between all inspection areas, positioning, and inspection items, thereby improving the user's work efficiency. For example, if the user wants to change the parameters of an inspection area, the user can check the inspection items for which the inspection area is used by checking the inspection area information display section 710. This allows the user to immediately understand the range of impact caused by changing the parameters of the inspection area, and makes it possible to determine work policies, such as whether to change the parameters or create a new inspection area, without checking various parameters.

[0054] The image display unit 410 displays the target inspection area shape superimposed on the registered image based on the inspection area information 650. For example, when the user uses the input device 130 to select an arbitrary inspection area from the target area selection unit 714, the inspection area is displayed on the image display unit using the area parameters of the selected inspection area ID. Furthermore, when the cursor is placed on one of the inspection area IDs displayed in the inspection area list unit 711, the inspection area may be displayed on the image display unit using the area parameters of the inspection area ID directly under the cursor. When the inspection area of ​​the selected inspection area ID is displayed on the image display unit 410, the position, size, shape, mask information, etc. of the inspection area can be visually recognized by the user. This allows the user to intuitively understand various information and shortens the time required for confirmation and judgment, thereby improving the efficiency of various tasks such as changing and deleting inspection areas.

[0055] In this embodiment, the inspection area information display unit 710 displays the inspection area ID, inspection item ID, and positioning ID in association with each other to show the relationship between the inspection item and the inspection area, but the parameters of each ID may be edited from the batch processing screen 700. Specifically, by clicking the inspection area ID, inspection item ID, or positioning ID using the input device 130, the corresponding parameter editing screen may be displayed, allowing the parameters to be edited.

[0056] The target area selection unit 714 selects an arbitrary inspection area ID displayed in the inspection area list unit 711. Furthermore, based on the inspection area parameters of the selected inspection area ID, the image display unit 410 displays the selected inspection area superimposed on the registered image.

[0057] The batch selection unit 715 performs batch selection processing or cancels batch selection processing for the target area selection unit 714. The batch selection processing here refers to processing for automatically selecting, among the examination items, an examination area in which no examination items that are candidates for deletion exist. In other words, among the examination items linked to the examination area IDs displayed in the examination area list unit 711, those whose examination item list section is displayed blank are the items selected in the batch selection processing. Furthermore, in the cancel processing, all selection states are canceled.

[0058] In this embodiment, the target area selection unit 714 selects an arbitrary inspection area ID, but the selectable targets may be limited. For example, when selecting a deletion target, it may be possible to make it impossible to select inspection area IDs other than those candidates for deletion. In this case, the display of inspection area IDs that cannot be selected may be grayed out so that the user can visually recognize them. Furthermore, although the batch selection unit 715 is capable of selecting inspection areas to be deleted, it is not necessary for only those to be deleted to be selected in batch. For example, it may be possible to select all inspection areas displayed in the inspection area list unit 711 in order to offset the area positions, or it may be possible to automatically select areas that can be selected in batch based on the shape of the inspection area.

[0059] Although preferred embodiments of the present invention have been described above, the present invention is not limited to these embodiments and various modifications and alterations are possible within the scope of the present invention. For example, the present invention may be applied to visual inspections other than wire bonding. In the embodiment, the shape of the inspection area is rectangular, but shapes other than rectangular, such as rotated rectangles, polygons, circles, ellipses, and sectors, may also be used. In the present embodiment, a list is used as a method for displaying the relationship between the inspection items and the inspection areas, but the format does not need to be limited to a list. For example, a pull-down control or a combo box control may be used to select and display any area. Furthermore, the relationship between the inspection areas and the inspection items may be illustrated in a graph format rather than a list. [Explanation of symbols]

[0060] 100 Inspection Systems 110 Information processing equipment 120 Display device 130 Input Device 140 Imaging unit 170 Inspection subjects 321 registered images 322 Positioning Parameters 323 Inspection Area Parameters 324 Test Item Parameters 325 Inspection area information creation unit 400 Settings 410 Image display unit 650 Inspection area information 710 Inspection area information display section 711 Inspection area list section 712 Positioning List Section 713 Inspection Item List Section 714 Target Area Selection Section 715 Bulk Selection Section

Claims

1. In an inspection system for inspecting an object to be inspected, an imaging unit that captures an image of the inspection object; a registration image registered as an image to be inspected based on an image captured by the imaging unit, an inspection area constituting a portion of the registration image, and a setting unit which selects and sets the inspection items in which the same inspection content is set for each inspection area and the inspection content is itemized; an inspection area information creating unit that creates inspection area information in which the inspection items set for each of the inspection areas are associated; an inspection area information display unit that displays the inspection area information and displays the inspection items set for each inspection area.

2. The inspection system according to claim 1 , wherein the inspection area information display unit includes an inspection area list unit that displays a list of the inspection areas, and an inspection item list unit that displays inspection items linked to the inspection areas.

3. The inspection system according to claim 1 or 2, characterized in that the inspection area information display unit includes a positioning list unit that displays, in association with the inspection area, positioning items for performing position correction of the inspection area based on the amount of positional deviation of the inspection object in the registered image and the captured image or a processed image generated based on the captured image so as to be inspectable.

4. 3. The inspection system according to claim 2, wherein the inspection area information display unit includes a target area selection unit for selecting an arbitrary inspection area from the inspection area list unit.

5. 3. The inspection system according to claim 1, wherein the setting unit includes a setting input unit that sets parameters for determining the inspection area based on the registered image.

6. 3. The inspection system according to claim 1, wherein the setting unit includes an inspection area reference selection unit that selects an inspection area suitable for carrying out the inspection item from the inspection area.

7. 2. The inspection system according to claim 1, further comprising an image display unit that displays the registered image and the inspection area, and the image display unit and the inspection area information display unit are displayed simultaneously.

8. The inspection system described in claim 7, characterized in that the image display unit acquires inspection area information from the inspection area listed in the inspection area information unit, and displays the inspection area shape acquired from the inspection area information by superimposing it on the registered image displayed on the image display unit.

9. 5. The inspection system according to claim 4, wherein the target area selection unit includes a batch selection unit that automatically selects, in batch, inspection areas in the inspection area list unit that do not contain any inspection items that are candidates for deletion.

Images