Micrometer intelligent calibration system and detection method

Abstract

The present invention proposes an intelligent calibration system for a micrometer, the calibration mechanism of which comprises a control module, a table and a clamping mechanism; the clamping mechanism is arranged at a micrometer support plate; a positioning mechanism is arranged at a table frame at the rear of the micrometer support plate; a fixed anvil positioning groove and a movable anvil positioning groove are arranged in the positioning mechanism; a first visual module, a second visual module and a third visual module are also arranged at the table at the rear of the micrometer support plate; when the micrometer is calibrated, the micrometer differential cylinder reaches an initial position; the probe moves and successively connects with the fixed anvil and the movable anvil; the control module obtains the reading of the first linear scale when the probe contacts the fixed anvil, and obtains the lateral relative movement position of the probe through the second linear scale reading by a second camera; the initial position and the end position of the probe are converted into a coordinate sequence to calculate the parallelism error of the measuring surfaces of the fixed anvil and the movable anvil; the present invention can greatly improve the measurement reliability and detection efficiency, and bring convenience to the operation of the detection personnel.

Description

Technical Field

[0001] The invention relates to the technical field of measuring instruments, in particular to an intelligent micrometer verification system and a detection method. Background Art

[0002] Currently, there are some automatic methods for calibrating micrometers, but these calibration methods often have some shortcomings, such as the displacement deformation of the micrometer during calibration, the deformation of the physical gauge block, and the influence of the mechanical deformation of the calibration mechanism on the calibration accuracy. How to solve this problem is a research direction. Summary of the invention

[0003] The present invention provides a micrometer intelligent calibration system and detection method, which can greatly improve measurement reliability and detection efficiency and bring convenience to the operation of detection personnel.

[0004] The present invention adopts the following technical solutions.

[0005] A micrometer intelligent calibration system is used to calibrate a micrometer with a fixed anvil, a movable anvil and a differential cylinder. The calibration mechanism of the calibration system includes a control module, a table, and a clamping mechanism; the clamping mechanism is arranged at the micrometer support plate and can move horizontally; a positioning beam is arranged at the table frame at the rear of the micrometer support plate; a positioning mechanism is arranged at the positioning beam; a fixed anvil positioning groove for placing the fixed anvil of the micrometer and a movable anvil positioning groove for placing the movable anvil of the micrometer are arranged in the positioning mechanism; the rear of the micrometer support plate is provided with a positioning beam; a positioning beam ...; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a positioning beam is provided; a The table is also provided with a first visual module, a second visual module and a third visual module; the first visual module includes a probe motor, a first linear scale and a first camera for photographing the first linear scale; the second visual module has a built-in probe, a second linear scale and a second camera for photographing the first linear scale; the third visual module is provided with a third camera for photographing the micrometer scale and a differential cylinder motor for driving the micrometer differential cylinder to rotate; the probe motor drives the movable connecting plate to move; the movable connecting plate is provided with a probe, a first camera and a second camera;

[0006] When the micrometer is calibrated, the third vision module identifies the micrometer scale and rotates the differential cylinder to the initial position; the probe motor drives the probe to move and successively connects with the fixed anvil and the movable anvil; the control module uses the first camera to obtain the reading of the first linear scale when the probe contacts the fixed anvil, and uses the second camera to obtain the lateral relative movement position of the probe through the reading of the second linear scale; the control module converts the initial position and the end position of the lateral movement of the probe into a position point coordinate sequence of two measuring surfaces in three-dimensional space, so as to calculate the parallelism error of the measuring surfaces of the fixed anvil and the movable anvil of the micrometer.

[0007] The table top is provided with a walking recess formed by magnetically attractive metal; the clamping mechanism can move in the horizontal direction within the range above the walking recess; the front part of the micrometer support plate is provided with an installation position for fixing the block gauge placement device; a notch is opened at the upper corner of the micrometer support plate; a dovetail groove is opened horizontally at the notch, and the dovetail portion of the support plate is installed on the dovetail groove, and the dovetail portion of the support plate is fixed to the dovetail portion by a dovetail fastening bolt.

[0008] The clamping mechanism includes a base, universal ball bearings distributed around the bottom of the base, an electromagnet embedded in the middle position below the base and adjacent to the walking recess of the table top, a support column is provided above the base, a first U-shaped mounting seat with a forward opening is provided above the support column, a key slot is provided in the U-shaped groove of the first U-shaped mounting seat in the vertical direction opposite to the opening side and a guide column is provided in the middle vertical direction, a support spring is sleeved below the guide column, a second U-shaped mounting seat with a forward opening is slidably sleeved on the guide column above the support spring, the second U-shaped mounting seat is provided with an anti-rotation key at the rear, the anti-rotation key is slidably matched with the key slot of the first U-shaped mounting seat, and the A fastening screw hole is longitudinally penetrated at the front portion and corresponding position of the keyway of the combination formed by the anti-rotation key and the first U-shaped mounting seat, and the fastening screw hole is installed with a clamping second locking bolt, and a cylindrical pin is horizontally embedded in the lower portion of the opening of the second U-shaped mounting seat, and a lower pressure plate is embedded in the upper portion of the cylindrical pin. When the clamping mechanism clamps the micrometer, the middle portion of the micrometer body is placed on the lower pressure plate, the front portion of the micrometer body is mounted on the micrometer support plate, and the upper pressure plate is pressed above the middle portion of the micrometer body, and a clamping first locking bolt is provided above the opening of the second U-shaped mounting seat, and a connecting ball head is provided on the head of the clamping first locking bolt, and the connecting ball head is rotatably connected to the upper portion of the upper pressure plate.

[0009] The positioning mechanism includes a first manipulator installed above the positioning beam, a first electric cylinder support installed on the slider of the first manipulator, a first electric cylinder installed longitudinally on the first electric cylinder support, and a positioning block is provided on the head of the first electric cylinder support; a fixed anvil positioning groove is provided below the positioning block at a position corresponding to the fixed anvil of the micrometer to be calibrated, and a transverse positioning block is provided on the right side of the fixed anvil positioning groove; a second electric cylinder support is provided on the right side above the positioning beam, a second electric cylinder is installed longitudinally on the second electric cylinder support, a positioning block is provided on the head of the second electric cylinder, and a movable anvil positioning groove is provided below the positioning block at a position corresponding to the movable anvil of the micrometer; when the micrometer is clamped, the fixed anvil of the micrometer is placed in the fixed anvil positioning groove, the movable anvil of the micrometer is placed in the movable anvil positioning groove, and the fixed anvil measuring surface contacts the transverse positioning block.

[0010] The probe motor is a linear motor module; the first visual module includes a linear motor module installed on the table, a mover connecting plate mounted on the mover of the linear motor module, a first camera support seat for vertically installing the first camera is provided on the side of the connecting plate, and a first camera lens support seat for vertically installing the first camera lens is provided next to the first camera support seat; a first linear ruler support seat is installed on the table below the mover connecting plate, a first linear ruler is embedded above the first linear ruler support seat in a horizontal direction parallel to the table, a through groove is horizontally penetrated in the middle of the first linear ruler support seat, a first visual light source is provided in the through groove, the first visual light source is connected to the mover connecting plate on the mover of the linear motor module through the first visual light source connecting plate, and the first visual light source is vertically penetrated above the through groove in a horizontal direction. Transmission slot, the light of the visual light source illuminates the first linear scale through the first visual light source transmission slot, the mover connecting plate is vertically penetrated by a first camera lens perspective hole at a position corresponding to the first camera lens, and the first camera lens images the engraved lines of the first linear scale through the first camera lens perspective hole; the linear motor module includes a module support, a first slide rail, a bottom plate, a linear motor module mover and a linear motor module stator, the module support is installed on a table, a bottom plate is provided on the table between the two module supports, a first slide rail is installed on the bottom plate, the first slide rail is connected to the mover by a slider, the linear motor module mover is sleeved on the linear motor module stator, the linear motor module stator is in a thin column shape and the two ends of the linear motor module stator are embedded in the module support.

[0011] The second visual module includes a second camera and a second camera lens longitudinally installed on the movable connecting plate, an inverted T-shaped probe support is installed on the front part above the movable connecting plate, a probe is provided on the head of the probe support, and a guide plate is provided under the probe; a second linear scale support seat for supporting the second linear scale is installed on the upper back of the micrometer support plate, the second linear scale support seat is close to the upper back of the micrometer support plate and is provided with a second visual light source, the second linear scale support seat is arranged in front of the visual light source and a linear scale is embedded, and the second linear scale is connected to the second visual light source on the measuring rod guide plate; a second camera lens perspective hole is opened at the corresponding position of the inverted T-shaped probe support and the second camera lens, and the second camera images the engraved lines of the second linear scale through the second camera lens perspective hole; the probe is opened with a plurality of step holes with step structures on both sides, and the axis of one of the step holes is aligned with the micrometer measuring The measuring axes coincide with each other, and the rest are evenly distributed at corresponding positions near the circumferential edge of the measuring surface of the micrometer. Measuring sensors are installed on both sides of the probe; a measuring column is installed in the step hole of the probe, spherical measuring ends are installed at the center positions of the two ends of the measuring column, and retaining springs are embedded at the two ends of the measuring column. A force measuring spring is sleeved between the retaining springs of the measuring column, and the force measuring spring is embedded in the step hole of the probe. A connecting rod groove passes downward through the center of the step hole of the probe, and a vertical connecting rod is installed on the measuring column. The vertical connecting rod passes through the connecting rod groove, and a transfer boss is provided at the bottom of the vertical connecting rod. An adjusting ring is sleeved on the transfer boss, and the adjusting rings are distributed in sequence according to different heights, and the adjusting ring is fixed by a locking bolt; a horizontal connecting rod is installed on the adjusting ring, and a visual measuring head end is installed on the head of the horizontal connecting rod. The visual measuring head end is adjusted to be distributed in a vertical straight line through the adjusting ring and the horizontal connecting rod, and is located in the field of view of the second camera lens.

[0012] The third vision module includes a second manipulator installed on the right side of the crossbeam, the second manipulator is connected to the inverted L-shaped third camera connecting plate via a slider, a third camera and a third camera lens are installed below the third camera connecting plate, a third visual light source is provided below the third camera lens, and the third visual light source is connected through the third visual light source connecting plates installed on both sides of the third camera connecting plate; a differential cylinder motor is installed below the third visual light source, a flexible coupling is connected to the output shaft of the differential cylinder motor, and the flexible coupling is connected to the micrometer differential cylinder via a force transmission structure; the differential cylinder motor is installed at the motor connecting plate, the motor connecting plate is installed on the second slide rail slider of the second slide rail below, the second slide rail is installed at the slide rail connecting plate, and the slide rail connecting plate is installed on the back of the micrometer support plate.

[0013] The block gauge placement device includes an L-shaped block gauge placement device body, a block gauge placement groove is horizontally opened on the L-shaped body, a block gauge stop end is provided on the right side of the block gauge placement groove, a top ball is provided on the block gauge stop end close to the block gauge side, the block gauge horizontal gap is embedded in the block gauge placement groove, the right side measuring surface of the block gauge contacts with the top ball, the left side measuring surface of the block gauge contacts with the ball probe, a screw hole is opened at the lower part of the L-shaped body, and the L-shaped body is connected to the mounting screw hole on the micrometer support plate through the screw hole in a detachable structure.

[0014] The detection method is implemented by the verification mechanism, and the verification method comprises the following steps in sequence;

[0015] S1. Confirm the type and working parameters of the micrometer. The calibration mechanism moves the fixed anvil positioning groove, the movable anvil positioning groove, the first vision module, and the second vision module to the initial positions according to the type and working parameters of the micrometer.

[0016] S2. Move the micrometer clamping device to the corresponding position, manually install the fixed anvil of the micrometer in the fixed anvil positioning groove, install the movable anvil of the micrometer in the movable anvil positioning groove, move the micrometer laterally to make the fixed anvil measuring surface contact with the lateral positioning block, install the middle part of the micrometer body on the lower pressure plate of the clamping device, and install the two sides of the micrometer body on the micrometer support plate. Press the micrometer body lightly so that the two sides of the micrometer body naturally contact with the upper edge of the micrometer support plate, tighten the first clamping locking bolt and the second clamping locking bolt, and connect the micrometer force measuring device to the differential cylinder motor through the flexible coupling;

[0017] S3, during the verification, the first electric cylinder and the second electric cylinder retract the positioning mechanism longitudinally, the electromagnet of the clamping mechanism automatically engages with the walking recess on the table, the second manipulator drives the third visual module from the initial position to the working position, and the differential cylinder motor calculates and drives the differential cylinder to the zero point or the first detection point position according to the recognition result of the third visual module;

[0018] S4, the probe motor drives the probe to move and contact the fixed anvil and the movable anvil measuring surface successively; the control module uses the first camera to obtain the reading of the first linear scale when the probe contacts the fixed anvil, and uses the second camera to obtain the lateral relative movement position of the visual probe end through the second linear scale reading; the control module converts the initial position and the end position of the lateral movement of the probe into a position point coordinate sequence of two measuring surfaces in three-dimensional space to calculate the parallelism error of the fixed anvil and the movable anvil measuring surface of the micrometer; according to the verification procedure, it is determined whether the parallelism error of the micrometer is qualified, if not qualified, the user is prompted whether to exit the detection process, if qualified, the detection process is continued;

[0019] S5, the control module calculates the absolute position coordinates of each visual probe at the zero point according to the scale reading read by the first visual module and the lateral relative movement position of each visual probe end when the probe contacts the fixed anvil;

[0020] S6, the third visual module drives the differential cylinder to the first detection point according to the recognition result of the third visual module, the third visual module recognizes the current micrometer reading, the linear motor module mover drives the probe to contact the movable anvil measuring surface, the second visual module reads the lateral relative movement position of each visual probe end through the second linear scale, the first visual module reads the reading of the first linear scale, the control module calculates the absolute length of each detection point according to the measurement result of the fixed anvil measuring surface in step S4 and the position coordinate sequence of each visual probe end at the current detection point, and compares the absolute length with the current micrometer reading to obtain the indication error of the current detection point of the micrometer;

[0021] S7. Repeat step S6 until the indication errors of all the detection points are obtained. The absolute value of the indication errors of all the detection points is taken as the maximum indication error, which is used as the indication error of the micrometer.

[0022] The steps after step S7 are:

[0023] S8. Determine whether the micrometer indication error is qualified according to the verification procedure. If it is unqualified, prompt the user whether to print the test report. If it is qualified, print the test report directly;

[0024] S9: The electromagnet stops attracting the table, the third visual system moves to the initial position, the second manipulator drives the probe to a safe position, and the micrometer is removed.

[0025] Compared with some previous verification schemes, the present invention has the following advantages:

[0026] In some previous calibration schemes, the micrometer clamping mechanism is to place the micrometer flat on the workbench and clamp it by directly pressing down the micrometer body with a pressure head. This cannot adapt well to micrometers of different shapes and is likely to cause deformation of the micrometer body, affecting the detection accuracy. The present invention uses a clamping mechanism that can move freely on the plane of the walking recess of the table, and can locate micrometers of different ranges and dimensions to the clamping position, which is very convenient and flexible. The mechanical structure of the clamping mechanism can adapt to micrometer bodies of any shape, and the micrometer body is in three-point contact on the clamping mechanism and the micrometer support plate, which can ensure that the micrometer body will not be deformed. The fastening bolts and electromagnets on the clamping mechanism turn the movable connection parts into rigid connections, ensuring that the position of the micrometer remains unchanged during detection, thereby ensuring detection accuracy.

[0027] In some previous calibration schemes, the micrometer detection standard uses physical blocks, which need to be arranged in size sequence on a block gauge box. When in use, two manipulators must be used to perform positioning, clamping, lifting and other control actions before finally transporting them to the detection position. The structure and control are relatively complex, the stability is poor, and the efficiency is also low. The present invention uses a manipulator in conjunction with a linear ruler and machine vision as a measurement benchmark, which greatly simplifies the complexity of the benchmark and improves the flexibility of the benchmark, thereby significantly improving the efficiency of benchmark use.

[0028] In some previous calibration schemes, an adaptive method is used during micrometer detection to allow the two measuring surfaces of the block gauge to automatically swing and rotate as the two measuring surfaces of the micrometer approach, so as to achieve reliable contact between the two measuring surfaces of the block gauge and the two measuring surfaces of the micrometer. However, due to the weight and center of gravity of the gauge block itself, it is impossible for it to be completely at the center of rotation or swing, and the measuring surface of the movable anvil of the micrometer rotates forward, etc., the two measuring surfaces of the block gauge cannot be reliably in contact with the two measuring surfaces of the micrometer, resulting in a large measurement error. The present invention uses multiple independent probes in conjunction with a linear scale and machine vision to measure multiple points on the two measuring surfaces of the micrometer, and calculates the reference length from the recognition results of the first visual module and the second visual module of the equipment. There is no measurement error caused by unreliable contact in the original case, and the measurement efficiency is greatly improved.

[0029] The solution described in the present invention has a simpler structure than the traditional solution, and the product size and weight are greatly reduced. The system achieves a significant improvement in performance with a small increase in overall cost. In comparison with the traditional solution, the detection time of the present invention can be reduced from the original 120-150 seconds to 15-30 seconds.

[0030] In the present invention, the clamping mechanism utilizes the universal ball bearing to move freely in the horizontal direction in the walking recess of the table surface. The rolling friction of the universal ball bearing makes the entire clamping mechanism very labor-saving and can be positioned to the clamping position of the micrometer very conveniently and quickly.

[0031] In the present invention, the guide column on the U-shaped mounting seat can enable the clamping mechanism to adapt to the positioning height difference caused by different micrometer body thicknesses. The spring on the guide column can make the micrometer body float on the spring. Only by gently pressing the micrometer body, the micrometer body can be lowered around the micrometer anvil and contact the micrometer support plate to determine the installation height of the micrometer body, thereby eliminating the need to use a special adjustment mechanism to adjust the position height of the micrometer body.

[0032] In the present invention, the laterally embedded cylindrical pin and the ball head provided on the head of the locking bolt enable the upper pressure plate and the lower pressure plate of the clamping mechanism to adapt to the inclination of the micrometer body caused by different micrometer body thicknesses, and can also cooperate with the key, keyway, first locking bolt, second locking bolt and electromagnet to form a rigid connection between the micrometer and the table to ensure measurement accuracy.

[0033] In the present invention, the table travel recess is made of magnetic metal, and a very small gap is retained between the electromagnet and the travel recess when not attracted, so that the electromagnet neither affects the free movement of the clamping mechanism nor produces a loud noise when attracted.

[0034] In the present invention, before the positioning mechanism is used, the positioning block is in a position longitudinally away from the fixed anvil and the movable anvil. During positioning, the positioning block is driven by the electric cylinder to extend to the positioning position, so that the fixed anvil and the movable anvil can be positioned in the longitudinal and vertical directions. The block on the right side of the fixed anvil positioning groove can position the horizontal position of the fixed anvil. After positioning is completed, the positioning block is driven by the electric cylinder to retract to the initial position, so that the positioning mechanism will not interfere with other motion mechanisms during calibration.

[0035] In the present invention, since some micrometers have a convex surface on the scale body near the differential cylinder, the scale body of the micrometer cannot be suspended horizontally on the upper edge of the micrometer support plate when clamped, resulting in a large tilt. For this type of micrometer, this situation can be avoided by removing the movable dovetail and then clamping.

[0036] As is known to all, when the mover of a linear motor moves in a straight line, there must be a certain error in the parallelism of its movement, which leads to reading errors in the visual system 1 (first visual module) and the visual system 2 (second visual module). Since the system uses a linear motor and a high-precision slide rail with good parallelism, and the visual system 2 reads the relative offset, and the stroke is extremely short, the relative offset reading error caused by the parallelism of the mover is extremely small and can be ignored; while the visual system 1 may produce a larger reading error. In the implementation of the present invention, the influence of the mover's parallelism error on the visual system 1 can be decomposed into the translation and rotation of the camera 1 (first camera) and the camera 2 (second camera) around a certain center in the three axes of X (horizontal), Y (longitudinal) and Z (vertical). Since the lens 1 (first camera lens) and the lens 2 (second camera lens) use telecentric lenses, no matter which direction the translation is, it will not cause an error in the reading of the visual system 1; but the rotation is different. The rotation of camera 1 about a certain center on the X-axis will not cause an error in the reading of visual system 1. The rotation about a certain center on the Z-axis will make the scale lines of linear scale 1 not parallel to the imaging center of camera 1 (intersecting with the scale lines of linear scale 1), causing difficulty in the reading of visual system 1. Although the rotation about a certain center on the Y-axis will not make the scale lines not parallel to the imaging center of visual system 1, it will make the reading of visual system 1 increase or decrease compared to the ideal value.

[0037] In the present invention, the axis of the measuring column is close to the micrometer measurement center line, avoiding the generation of Abbe error; the vertical connecting rod droops naturally, avoiding the warping deformation caused by other installation methods that are not parallel to the gravity line; the force spring simulates the function of the micrometer force measuring device, eliminating the screw thread gap while making the ball probe reliably contact with the movable anvil or the fixed anvil; through the different lengths of the vertical connecting rod, the adjustment ring and the horizontal connecting rod rotating a certain angle, the visual probe forms a vertical straight line distributed in the field of view of the lens 2, so that the visual system 2 can realize simultaneous measurement of multiple probes, greatly reducing the resolution requirements of the camera and the lens and reducing the size of the lens, thereby greatly reducing the manufacturing cost.

[0038] In the present invention, the fixed invariance of the high-precision engraved line position of the linear scale is utilized to compensate for the reading error caused by the parallelism of the mover movement, thereby greatly improving the measurement accuracy and reducing the manufacturing and processing accuracy requirements for the system mechanical structure.

[0039] In the present invention, the camera 3, the lens 3 (the third camera lens) and the visual combination light source (the third visual light source) are used by the manipulator 2 (the second manipulator) in cooperation with the image recognition of the camera 3 (the third camera) to realize automatic positioning of the differential cylinder and the fixed sleeve of the micrometer, thereby improving the intelligence level of the system. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] The present invention is further described in detail below with reference to the accompanying drawings and specific embodiments:

[0041] Attached Figure 1 This is a schematic diagram of the appearance of the present invention;

[0042] Attached Figure 2 It is a schematic diagram of the internal structure of the present invention;

[0043] Attached Figure 3 It is a structural schematic diagram of the clamping mechanism of the present invention;

[0044] Attached Figure 4 It is a structural schematic diagram of the positioning mechanism of the present invention;

[0045] Attached Figure 5 is a structural diagram of the first visual module;

[0046] Attached Figure 6 It is a structural schematic diagram of a linear motor module;

[0047] Attached Figure 7 is a schematic diagram of the structure of the second visual module;

[0048] Attached Figure 8 This is a schematic diagram of the structure of the second vision module measuring the head;

[0049] Attached Figure 8aThis is a partial enlarged schematic diagram of the second vision module measuring the head;

[0050] Attached Figure 8b Another partial enlarged schematic diagram of the second vision module probe head part (at the vision probe end);

[0051] Attached Fig. 9 is a schematic diagram of the structure of the third visual module;

[0052] Attached Fig.10 It is a structural schematic diagram of a block gauge placement box of the present invention;

[0053] Attached Fig.11 A schematic diagram of the structure of the micrometer calibrated by the present invention;

[0054] Attached Fig.12 It is a partial structural diagram of the second embodiment of the present invention;

[0055] Attached Fig.13 It is a partial structural diagram of the third embodiment of the present invention;

[0056] In the figure:

[0057] 1-table; 10-micrometer support plate; 11-outer cover; 12-travel recess; 13-dovetail fastening bolt; 14-support plate dovetail; 15-dust cover; 16-crossbeam;

[0058] 2-clamping mechanism; 20-universal ball bearing; 21-electromagnet; 22-base 1; 23-support column; 24-support spring; 25-guide column; 26-anti-rotation key; 27-first U-shaped mounting seat; 28-second U-shaped mounting seat; 29-upper pressure plate; 210-clamping first locking bolt; 211-connecting ball head; 212-micrometer; 2120-force measuring device; 2121-differential cylinder; 2122-fixed sleeve; 2123-movable anvil; 2124-micrometer body; 2125-fixed anvil; 213-cylindrical pin; 214-lower pressure plate; 215-clamping second locking bolt;

[0059] 3-positioning mechanism; 30-first manipulator; 31-first electric cylinder support; 32-first electric cylinder; 33-fixed anvil positioning groove; 34-lateral positioning block; 35-second electric cylinder support; 36-second electric cylinder; 37-movable anvil positioning groove;

[0060] 4-first visual module; 40-linear motor module; 401-module support; 402-slider; 403-first slide rail; 404 bottom plate; 405-linear motor module stator; 406-linear motor module mover; 41-motor connecting plate; 42-first camera lens support seat; 43-first camera support seat; 44-first camera lens; 45-first camera; 46-first linear ruler support seat; 47-first linear ruler; 48-first visual light source; 49-first visual light source connecting plate; 410-first visual light source transmission slot; 411-first camera lens perspective hole;

[0061] 5-second visual module; 50-second camera; 51-second camera lens; 52-second camera lens support seat; 53-probe; 531-step hole; 532-connecting rod groove; 533-probe; 534-force measuring spring; 536-circlip; 537-spherical measuring end; 538-vertical connecting rod; 539-visual probe end; 5310-horizontal connecting rod; 5311-locking bolt; 5312-adjusting ring; 5313-adapting boss ; 54-guide plate; 55-second visual light source; 56-second linear scale pressure plate; 57-second linear scale support seat; 58-second linear scale; 59-second camera lens perspective hole; 510-probe support; 511-second camera support seat; 512-measuring sensor; 513-air-floating guide slider; 514-air-floating guide; 515-high-precision grating ruler; 516-flat linear motor stator; 517-flat linear motor mover;

[0062] 6-third visual module; 60-second manipulator fixing plate; 61-second manipulator; 62-third camera connecting plate; 63-third visual light source connecting plate; 64-third camera; 65-third camera lens; 66-third visual light source; 67-flexible coupling; 68-second slide rail; 69-second slide rail slider; 610-slide rail connecting plate; 611-differential cylinder motor; 612-motor connecting plate;

[0063] 7-block gauge placement device; 70-installation position; 71-block gauge placement device body; 72-locking bolt; 73-upper stopper; 74-block gauge; 75-block gauge stop end; 76-top ball; 77-block gauge placement groove. DETAILED DESCRIPTION

[0064] As shown in the figure, a micrometer intelligent calibration system is used to calibrate a micrometer with a fixed anvil, a movable anvil and a differential cylinder. The calibration mechanism of the calibration system includes a control module, a table 1, and a clamping mechanism 2; the clamping mechanism is arranged at the micrometer support plate 10 and can move horizontally; a positioning beam 16 is arranged at the table frame at the rear of the micrometer support plate; a positioning mechanism 3 is arranged at the positioning beam; a fixed anvil positioning groove 33 for placing the fixed anvil 2125 of the micrometer and a movable anvil positioning groove 37 for placing the movable anvil 2123 of the micrometer are arranged in the positioning mechanism; the micrometer support plate rear part is provided with a positioning beam 16; a positioning beam 36 is provided at the positioning beam; a fixed anvil positioning groove 33 for placing the fixed anvil 2125 of the micrometer and a movable anvil positioning groove 37 for placing the movable anvil 2123 of the micrometer are provided in the positioning mechanism; The table is also provided with a first visual module 4, a second visual module 5 and a third visual module 6; the first visual module includes a probe motor, a first linear scale 47 and a first camera 45 for photographing the first linear scale; the second visual module has a built-in probe, a second linear scale 58 and a second camera 50 for photographing the first linear scale; the third visual module is provided with a third camera 64 for photographing the micrometer scale and a differential cylinder motor 611 for driving the micrometer differential cylinder 2121 to rotate; the probe motor drives the movable connecting plate 41 to move; the movable connecting plate is provided with a probe, a first camera and a second camera;

[0065] When the micrometer is calibrated, the third vision module identifies the micrometer scale and rotates the differential cylinder to the initial position; the probe motor drives the probe to move and successively connects with the fixed anvil 2125 and the movable anvil 2123; the control module uses the first camera to obtain the reading of the first linear scale when the probe contacts the fixed anvil, and uses the second camera to obtain the lateral relative movement position of the probe through the second linear scale reading; the control module converts the initial position and the end position of the lateral movement of the probe into a position point coordinate sequence of two measuring surfaces in three-dimensional space to calculate the parallelism error of the measuring surfaces of the fixed anvil and the movable anvil of the micrometer.

[0066] The table top is provided with a walking recess 12 formed of magnetically attractive metal; the clamping mechanism can move in the horizontal direction within the range above the walking recess; the front part of the micrometer support plate is provided with a mounting position 70 for fixing the block gauge placement device; a notch is opened at the upper corner of the micrometer support plate; a dovetail groove is opened horizontally at the notch, and a support plate dovetail portion 14 is installed on the dovetail groove, and the dovetail portion of the support plate is fixed to the dovetail portion by a dovetail portion fastening bolt 13.

[0067] The clamping mechanism includes a base 22, universal ball bearings 20 distributed around the bottom of the base, an electromagnet 21 embedded in the middle position below the base and adjacent to the walking recess of the table top, a support column 23 is provided above the base, a first U-shaped mounting seat 27 with a forward opening is provided above the support column, a key slot is provided in the U-shaped groove of the first U-shaped mounting seat in the vertical direction opposite to the opening side and a guide column 25 is provided in the middle vertical direction, a support spring 24 is sleeved below the guide column, a second U-shaped mounting seat 28 with a forward opening is slidably sleeved on the guide column above the support spring, an anti-rotation key 26 is provided rearwardly on the second U-shaped mounting seat, the anti-rotation key is slidably matched with the key slot of the first U-shaped mounting seat, and the anti-rotation key is slidably matched with the key slot of the first U-shaped mounting seat. A fastening screw hole is longitudinally penetrated at the front part of the assembly formed by the first U-shaped mounting seat and the corresponding position of the keyway, and the fastening screw hole is installed with a second locking bolt 215 for clamping. A cylindrical pin 213 is horizontally embedded in the lower part of the opening of the second U-shaped mounting seat, and a lower pressure plate 214 is embedded in the upper part of the cylindrical pin. When the clamping mechanism clamps the micrometer 212, the middle part of the micrometer body 2124 is placed on the lower pressure plate, and the front part of the micrometer body is mounted on the micrometer support plate. The upper pressure plate 29 is pressed above the middle part of the micrometer body 2124. A first locking bolt 210 for clamping is provided above the opening of the second U-shaped mounting seat, and a connecting ball head 211 is provided on the head of the first locking bolt for clamping, and the connecting ball head is rotatably connected to the upper part of the upper pressure plate.

[0068] The positioning mechanism includes a first manipulator 30 installed above the positioning beam 16, a first electric cylinder support 31 installed on the slider of the first manipulator, a first electric cylinder 32 installed longitudinally on the first electric cylinder support, and a positioning block is provided at the head of the first electric cylinder support; a fixed anvil positioning groove 33 is provided below the positioning block at a position corresponding to the fixed anvil 2125 of the micrometer to be calibrated, and a transverse positioning block 34 is provided on the right side of the fixed anvil positioning groove 33; a second electric cylinder is provided on the right side above the positioning beam. The support 35, a second electric cylinder 36 is installed in the longitudinal direction of the second electric cylinder support, a positioning block is provided at the head of the second electric cylinder 36, and a movable anvil positioning groove 37 is opened at the position corresponding to the movable anvil 2123 of the micrometer below the positioning block; when the micrometer 212 is clamped, the fixed anvil 2125 of the micrometer is placed in the fixed anvil positioning groove 33, the movable anvil 2123 of the micrometer is placed in the movable anvil positioning groove 37, and the fixed anvil measuring surface contacts with the lateral positioning block 34.

[0069] The probe motor is a linear motor module; the first visual module 4 includes a linear motor module 40 installed on the table 1, a mover connecting plate 41 mounted on the linear motor module mover 406, the side of the connecting plate is provided with a first camera support seat 43 for vertically installing a first camera 45, and the first camera support seat is provided with a first camera lens support seat 42 for vertically installing a first camera lens 44; a first linear ruler support seat 46 is installed on the table below the mover connecting plate, a first linear ruler 47 is embedded above the first linear ruler support seat in a horizontal direction parallel to the table, a through groove is horizontally penetrated in the middle of the first linear ruler support seat, a first visual light source 48 is provided in the through groove, the first visual light source is connected to the mover connecting plate on the linear motor module mover 406 through the first visual light source connecting plate 49, and a first visual light source is vertically penetrated above the through groove in a horizontal direction. The projection slot 410, the light of the first visual light source 48 irradiates the first linear scale 47 through the first visual light source transmission slot 410, the mover connecting plate is vertically penetrated by a first camera lens perspective hole 411 at a position corresponding to the first camera lens, and the first camera lens images the engraved lines of the first linear scale through the first camera lens perspective hole; the linear motor module includes a module support 401, a first slide rail 403, a bottom plate 404, a linear motor module mover 406 and a linear motor module stator 405, the module support is installed on a table, a bottom plate is provided on the table between the two module supports, a first slide rail is installed on the bottom plate, the first slide rail is connected to the mover by a slider, the linear motor module mover is sleeved on the linear motor module stator, the linear motor module stator is in a thin column shape and the two ends of the linear motor module stator are embedded in the module support.

[0070] The second visual module 5 includes a second camera 50 and a second camera lens 51 longitudinally mounted on the movable connecting plate 41, an inverted T-shaped probe support 510 is installed on the front upper part of the movable connecting plate, a probe 53 is provided on the head of the probe support 510, and a guide plate 54 is provided below the probe; a second linear scale support seat 57 for supporting the second linear scale is installed on the upper back of the micrometer support plate 10, the second linear scale support seat 57 is close to the upper back of the micrometer support plate 10 and is provided with a second visual light source 55, the second linear scale support seat is arranged in front of the second visual light source 55 and is embedded with a second linear scale 58, the measuring rod guide plate 54 crosses the second linear scale 58 and is connected to the second visual light source 55; a second camera lens perspective hole 59 is opened at the corresponding position of the inverted T-shaped probe support and the second camera lens, and the second camera images the engraved lines of the second linear scale through the second camera lens perspective hole; the probe 53 is opened with a plurality of step holes 531 with step structures on both sides, and the axis of one of the step holes is aligned with the second linear scale. The measuring axes of the micrometers coincide, and the rest are evenly distributed at corresponding positions near the circumferential edge of the measuring surface of the micrometer. Measuring sensors 512 are installed on both sides of the probe; a measuring column 533 is installed in the step hole of the probe, and spherical measuring ends 537 are installed at the center positions of both ends of the measuring column. Retaining springs 536 are embedded at both ends of the measuring column. A measuring force spring 534 is sleeved between the retaining springs of the measuring column. The measuring force spring is embedded in the step hole of the probe. A connecting rod groove 532 is penetrated downward from the center of the step hole of the probe. The measuring column is installed with a vertical A straight connecting rod 538, the vertical connecting rod passes through a connecting rod groove, a transfer boss 5313 is provided at the bottom of the vertical connecting rod, an adjustment ring 5312 is sleeved on the transfer boss, the adjustment rings are distributed in sequence according to different heights, and the adjustment rings are fixed by locking bolts 5311; a horizontal connecting rod 5310 is installed on the adjusting ring, a visual measuring probe end 539 is installed on the head of the horizontal connecting rod, the visual measuring probe end is adjusted to be distributed in a vertical straight line through the adjusting ring and the horizontal connecting rod, and is located within the field of view of the second camera lens.

[0071] The third visual module 6 includes a second manipulator 61 installed on the right side of the beam, the second manipulator is connected to the inverted L-shaped third camera connecting plate 62 via a slider, a third camera 64 and a third camera lens 65 are installed below the third camera connecting plate, a third visual light source 66 is provided below the third camera lens 65, and the third visual light source 66 is connected through the third visual light source connecting plates 63 installed on both sides of the third camera connecting plate 62; a differential cylinder motor 611 is installed below the third visual light source 66, a flexible coupling 67 is connected to the output shaft of the differential cylinder motor, and the flexible coupling is connected to the micrometer differential cylinder 2121 via a force transmission structure; the differential cylinder motor is installed at the motor connecting plate 612, and the motor connecting plate is installed on the second slide rail slider 69 of the second slide rail 68 below, the second slide rail 68 is installed at the slide rail connecting plate 610, and the slide rail connecting plate 610 is installed on the back of the micrometer support plate 10.

[0072] The block gauge placement device includes an L-shaped block gauge placement device body 71, a block gauge placement groove 77 is horizontally opened on the L-shaped body, a block gauge stop end 75 is provided on the right side of the block gauge placement groove, a top ball 76 is provided on the block gauge stop end close to the block gauge side, and the block gauge 74 is embedded in the block gauge placement groove with a horizontal gap, the right measuring surface of the block gauge is in contact with the top ball, and the left measuring surface of the block gauge is in contact with the ball probe, a screw hole is opened at the lower part of the L-shaped body, and the L-shaped body is connected to the mounting position 70 on the micrometer support plate 10 through the screw hole in a detachable structure.

[0073] The detection method is implemented by the verification mechanism, and the verification method comprises the following steps in sequence;

[0074] S1. Confirm the type and working parameters of the micrometer. The calibration mechanism moves the fixed anvil positioning groove, the movable anvil positioning groove, the first vision module, and the second vision module to the initial positions according to the type and working parameters of the micrometer.

[0075] S2. Move the micrometer clamping device to the corresponding position, manually install the fixed anvil of the micrometer in the fixed anvil positioning groove, install the movable anvil of the micrometer in the movable anvil positioning groove, move the micrometer laterally to make the fixed anvil measuring surface contact with the lateral positioning block, install the middle part of the micrometer body on the lower pressure plate of the clamping device, and install the two sides of the micrometer body on the micrometer support plate. Press the micrometer body lightly so that the two sides of the micrometer body naturally contact with the upper edge of the micrometer support plate, tighten the first clamping locking bolt and the second clamping locking bolt, and connect the micrometer force measuring device to the differential cylinder motor through the flexible coupling;

[0076] S3, during the verification, the first electric cylinder and the second electric cylinder retract the positioning mechanism longitudinally, the electromagnet of the clamping mechanism automatically engages with the walking recess on the table, the second manipulator drives the third visual module from the initial position to the working position, and the differential cylinder motor calculates and drives the differential cylinder to the zero point or the first detection point position according to the recognition result of the third visual module;

[0077] S4, the probe motor drives the probe to move and contact the fixed anvil and the movable anvil measuring surface successively; the control module uses the first camera to obtain the reading of the first linear scale when the probe contacts the fixed anvil, and uses the second camera to obtain the lateral relative movement position of the visual probe end through the second linear scale reading; the control module converts the initial position and the end position of the lateral movement of the probe into a position point coordinate sequence of two measuring surfaces in three-dimensional space to calculate the parallelism error of the fixed anvil and the movable anvil measuring surface of the micrometer; according to the verification procedure, it is determined whether the parallelism error of the micrometer is qualified, if not qualified, the user is prompted whether to exit the detection process, if qualified, the detection process is continued;

[0078] S5, the control module calculates the absolute position coordinates of each visual probe at the zero point according to the scale reading read by the first visual module and the lateral relative movement position of each visual probe end when the probe contacts the fixed anvil;

[0079] S6, the third visual module drives the differential cylinder to the first detection point according to the recognition result of the third visual module, the third visual module recognizes the current micrometer reading, the linear motor module mover drives the probe to contact the movable anvil measuring surface, the second visual module reads the lateral relative movement position of each visual probe end through the second linear scale, the first visual module reads the reading of the first linear scale, the control module calculates the absolute length of each detection point according to the measurement result of the fixed anvil measuring surface in step S4 and the position coordinate sequence of each visual probe end at the current detection point, and compares the absolute length with the current micrometer reading to obtain the indication error of the current detection point of the micrometer;

[0080] S7. Repeat step S6 until the indication errors of all the detection points are obtained. The absolute value of the indication errors of all the detection points is taken as the maximum indication error, which is used as the indication error of the micrometer.

[0081] The steps after step S7 are:

[0082] S8. Determine whether the micrometer indication error is qualified according to the verification procedure. If it is unqualified, prompt the user whether to print the test report. If it is qualified, print the test report directly;

[0083] S9: The electromagnet stops attracting the table, the third visual system moves to the initial position, the second manipulator drives the probe to a safe position, and the micrometer is removed.

[0084] The above solution is embodiment 1. Example

[0085] like Fig.12 As shown, compared with the first embodiment, in the second embodiment, part of the structure of the visual system 1 (first visual module) is changed into an air-floating guide rail, a flat linear motor and a high-precision grating ruler, and the linear ruler in the visual system 2 (second visual module) is shortened and fixed on the connecting plate 41 together with the second visual light source 55 to move with the probe. The air-floating guide rail has extremely high parallelism, and when combined with the high-precision grating ruler, the reading of the grating ruler can be directly used as the reading of the visual system 1 in the first embodiment without compensation. In this case, the linear ruler of the visual system 2 in the first embodiment can be shortened and fixed on the connecting plate 41, and move with the connecting plate 41, and only used as the offset reading of the probe. The second embodiment simplifies the complexity of the system hardware structure and software algorithm, but due to the use of air-floating guide rails and high-precision grating rulers, the cost is greatly increased. Example

[0086] like Fig.13 As shown, compared with the second embodiment, the length of the linear scale 2 (the second linear scale) is not changed in the third embodiment and is still fixed on the micrometer support plate, the high-precision grating scale is changed to a grating scale with lower precision, and is only used as a feedback encoder for the linear motor, and the absolute offset and the relative offset of the probe are read by the camera 2 (the second camera) from the linear scale 2. The third embodiment has the characteristics of the simple hardware structure and software algorithm of the second embodiment, and does not use the high-precision grating scale reading, and maintains the low-cost linear scale reading method in the first embodiment. Therefore, the third embodiment is the best embodiment among the three embodiments.

Claims

1. An intelligent micrometer calibration system for calibrating a micrometer with a fixed anvil, a movable anvil and a differential cylinder, characterized in that: The calibration mechanism of the calibration system comprises a control module, a table (1), and a clamping mechanism (2); the clamping mechanism is arranged on the micrometer support plate (10) and can move horizontally; a positioning beam (16) is arranged on the table frame at the rear of the micrometer support plate; a positioning mechanism (3) is arranged on the positioning beam; a fixed anvil positioning groove (33) for accommodating the fixed anvil (2125) of the micrometer and a movable anvil positioning groove (37) for accommodating the movable anvil (2123) of the micrometer are arranged in the positioning mechanism; a first visual module (4) and a second visual module are also arranged on the table at the rear of the micrometer support plate. (5) and a third visual module (6); the first visual module comprises a probe motor, a first linear scale (47) and a first camera (45) for photographing the first linear scale; the second visual module has a built-in probe, a second linear scale (58) and a second camera (50) for photographing the first linear scale; the third visual module is provided with a third camera (64) for photographing the micrometer scale and a differential cylinder motor (611) for driving the micrometer differential cylinder (2121) to rotate; the probe motor drives the movable connecting plate (41) to move; the movable connecting plate is provided with a probe, a first camera and a second camera; The probe motor is a linear motor module; the first visual module (4) comprises a linear motor module (40) mounted on a table (1), a mover connecting plate (41) mounted on a mover (406) of the linear motor module, a first camera support seat (43) for vertically mounting a first camera (45) is provided on a side of the connecting plate, and a first camera lens support seat (42) for vertically mounting a first camera lens (44) is provided next to the first camera support seat; a first linear scale support seat (46) is installed on the table below the mover connecting plate, a first linear scale (47) is embedded above the first linear scale support seat in a horizontal direction parallel to the table, a through groove is horizontally penetrated in the middle of the first linear scale support seat, a first visual light source (48) is provided in the through groove, the first visual light source is connected to the mover connecting plate on the linear motor module mover (406) through a first visual light source connecting plate (49), and a first visual light source is vertically penetrated above the through groove in a horizontal direction. The first visual light source transmission slot (410) is provided with a first visual light source transmission slot (410), and the light of the first visual light source (48) illuminates the first linear scale (47) through the transmission slot of the first visual light source transmission slot (410); the first camera lens perspective hole (411) is vertically penetrated through the movable element connection plate at a position corresponding to the first camera lens, and the first camera lens images the engraved lines of the first linear scale through the first camera lens perspective hole; the linear motor module comprises a module support (401), a first slide rail (403), a bottom plate (404), a linear motor module mover (406) and a linear motor module stator (405); the module support is installed on a table; a bottom plate is provided on the table between the two module supports; a first slide rail is installed on the bottom plate; the first slide rail is connected to the mover by a slider; the linear motor module mover is sleeved on the linear motor module stator; the linear motor module stator is in a thin column shape and both ends of the linear motor module stator are embedded in the module support; The second visual module (5) comprises a second camera (50) and a second camera lens (51) mounted longitudinally on the mover connecting plate (41); an inverted T-shaped probe support (510) is mounted on the front portion above the mover connecting plate; a probe (53) is disposed at the head of the probe support (510); and a guide plate (54) is disposed below the probe; a second linear scale support seat (57) for supporting a second linear scale is mounted on the upper back portion of the micrometer support plate (10); the second linear scale support seat (57) is close to the upper back portion of the micrometer support plate (10). A second visual light source (55) is provided, the second linear scale support seat is provided in front of the second visual light source (55) and is embedded with a second linear scale (58), the guide plate (54) is across the second linear scale (58) and is connected to the second visual light source (55); a second camera lens perspective hole (59) is provided at a position corresponding to the second camera lens of the inverted T-shaped probe support, and the second camera images the engraved lines of the second linear scale through the second camera lens perspective hole; the probe (53) is provided with a plurality of step holes (531) with step structures on both sides, wherein The axis of one stepped hole coincides with the measuring axis of the micrometer, and the others are evenly distributed at corresponding positions close to the circumferential edge of the measuring surface of the micrometer. Measuring sensors (512) are installed on both sides of the probe; a measuring column (533) is installed in the stepped hole of the probe, spherical measuring ends (537) are installed at the center positions of both ends of the measuring column, and retaining springs (536) are embedded at both ends of the measuring column. A force measuring spring (534) is sleeved between the retaining springs of the measuring column, and the force measuring spring is embedded in the stepped hole of the probe. A connecting rod groove (532) is penetrated downwardly from the center of the stepped hole of the probe. The column is installed with a vertical connecting rod (538), the vertical connecting rod passes through the connecting rod groove, the bottom of the vertical connecting rod is provided with a transfer boss (5313), the transfer boss is sleeved with an adjustment ring (5312), the adjustment rings are distributed in sequence according to different heights, and the adjustment rings are fixed by locking bolts (5311); a horizontal connecting rod (5310) is installed on the adjustment ring, and a visual probe end (539) is installed on the head of the horizontal connecting rod. The visual probe end is adjusted to be distributed in a vertical straight line through the adjustment ring and the horizontal connecting rod, and is located within the field of view of the second camera lens; The third visual module (6) comprises a second manipulator (61) mounted on the right side of the crossbeam, the second manipulator being connected to an inverted L-shaped third camera connecting plate (62) via a slider, a third camera (64) and a third camera lens (65) being mounted below the third camera connecting plate, a third visual light source (66) being disposed below the third camera lens (65), the third visual light source (66) being connected via third visual light source connecting plates (63) mounted on both sides of the third camera connecting plate (62); the third visual light source (6 6) A differential cylinder motor (611) is installed at the bottom, and a flexible coupling (67) is connected to the output shaft of the differential cylinder motor, and the flexible coupling is connected to the micrometer differential cylinder (2121) via a force transmission structure; the differential cylinder motor is installed at a motor connecting plate (612), and the motor connecting plate is installed on a second slide rail slider (69) of a second slide rail (68) at the bottom, and the second slide rail (68) is installed at a slide rail connecting plate (610), and the slide rail connecting plate (610) is installed on the back of the micrometer support plate (10).

2. The micrometer intelligent calibration system according to claim 1, characterized in that: The table top is provided with a walking recess (12) formed of magnetically absorbable metal; the clamping mechanism can move in the horizontal direction within the range above the walking recess; the front of the micrometer support plate is provided with a mounting position (70) for fixing the block gauge placement device; a notch is provided at the upper corner of the micrometer support plate; a dovetail groove is provided in the notch along the horizontal direction, and a support plate dovetail portion (14) is installed on the dovetail groove, and the dovetail portion of the support plate is fixed to the dovetail portion by a dovetail portion fastening bolt (13).

3. The micrometer intelligent calibration system according to claim 2, characterized in that: The clamping mechanism comprises a base (22), universal ball bearings (20) arranged around the bottom of the base, an electromagnet (21) embedded in the middle position of the bottom of the base and adjacent to the walking recess of the table top, a support column (23) is provided above the base, a first U-shaped mounting seat (27) with a forward opening is provided above the support column, a key slot is provided in the U-shaped groove of the first U-shaped mounting seat in the vertical direction opposite to the opening side and a guide column (25) is provided in the middle in the vertical direction, a support spring (24) is sleeved below the guide column, a second U-shaped mounting seat (28) with a forward opening is slidably sleeved on the guide column above the support spring, and an anti-rotation key (26) is provided on the rear of the second U-shaped mounting seat, the anti-rotation key is slidably matched with the key slot of the first U-shaped mounting seat, and the anti-rotation key is slidably matched with the key slot of the first U-shaped mounting seat. A fastening screw hole is longitudinally penetrated at a position corresponding to the keyway at the front of the assembly formed by the first U-shaped mounting seat, and a second locking bolt (215) is installed in the fastening screw hole for clamping. A cylindrical pin (213) is horizontally embedded in the lower part of the opening of the second U-shaped mounting seat, and a lower pressure plate (214) is embedded in the upper part of the cylindrical pin. When the clamping mechanism clamps the micrometer (212), the middle part of the micrometer body (2124) is placed on the lower pressure plate, the front part of the micrometer body is mounted on the micrometer support plate, and the upper pressure plate (29) is pressed above the middle part of the micrometer body (2124). A first locking bolt (210) for clamping is provided above the opening of the second U-shaped mounting seat, and a connecting ball head (211) is provided at the head of the first locking bolt for clamping, and the connecting ball head is rotatably connected to the upper part of the upper pressure plate.

4. The micrometer intelligent calibration system according to claim 1, characterized in that: The positioning mechanism comprises a first manipulator (30) mounted above a positioning beam (16), a first electric cylinder support (31) mounted on a slider of the first manipulator, a first electric cylinder (32) mounted longitudinally on the first electric cylinder support, a positioning block being provided at the head of the first electric cylinder support; a fixed anvil positioning groove (33) is provided below the positioning block at a position corresponding to a fixed anvil (2125) of a micrometer to be calibrated, a transverse positioning stopper (34) being provided on the right side of the fixed anvil positioning groove (33); a second electric cylinder support (32) is provided on the right side above the positioning beam 35), a second electric cylinder (36) is mounted in the longitudinal direction of the second electric cylinder support, a positioning block is provided at the head of the second electric cylinder (36), and a movable anvil positioning groove (37) is provided below the positioning block at a position corresponding to the movable anvil (2123) of the micrometer; when the micrometer (212) is clamped, the fixed anvil (2125) of the micrometer is placed in the fixed anvil positioning groove (33), the movable anvil (2123) of the micrometer is placed in the movable anvil positioning groove (37), and the fixed anvil measuring surface contacts the lateral positioning block (34).

5. The micrometer intelligent calibration system according to claim 2, characterized in that: The block gauge placement device comprises an L-shaped block gauge placement device body (71), a block gauge placement groove (77) is transversely opened on the L-shaped body, a block gauge stop end (75) is provided on the right side of the block gauge placement groove, a top ball (76) is provided on the block gauge stop end close to the block gauge, the block gauge (74) is horizontally gap-embedded in the block gauge placement groove, the right measuring surface of the block gauge contacts the top ball, and the left measuring surface of the block gauge contacts the ball probe, a screw hole is opened at the lower part of the L-shaped body, and the L-shaped body is connected to the mounting position (70) on the micrometer support plate (10) through the screw hole in a detachable structure.

6. A detection method for a micrometer intelligent calibration system, characterized in that: The detection method is implemented by the detection mechanism described in claim 1, and the detection method comprises the following steps in sequence; S1. Confirm the type and working parameters of the micrometer. The calibration mechanism moves the fixed anvil positioning groove, the movable anvil positioning groove, the first vision module, and the second vision module to the initial positions according to the type and working parameters of the micrometer. S2. Move the micrometer clamping device to the corresponding position, manually install the fixed anvil of the micrometer in the fixed anvil positioning groove, install the movable anvil of the micrometer in the movable anvil positioning groove, move the micrometer laterally to make the fixed anvil measuring surface contact with the lateral positioning block, install the middle part of the micrometer body on the lower pressure plate of the clamping device, and install the two sides of the micrometer body on the micrometer support plate. Press the micrometer body lightly so that the two sides of the micrometer body naturally contact with the upper edge of the micrometer support plate, tighten the first clamping locking bolt and the second clamping locking bolt, and connect the micrometer force measuring device to the differential cylinder motor through the flexible coupling; S3, during the verification, the first electric cylinder and the second electric cylinder retract the positioning mechanism longitudinally, the electromagnet of the clamping mechanism automatically engages with the walking recess on the table, the second manipulator drives the third visual module from the initial position to the working position, and the differential cylinder motor calculates and drives the differential cylinder to the zero point or the first detection point position according to the recognition result of the third visual module; S4, the probe motor drives the probe to move and contact the fixed anvil and the movable anvil measuring surface successively; the control module uses the first camera to obtain the reading of the first linear scale when the probe contacts the fixed anvil, and uses the second camera to obtain the lateral relative movement position of the visual probe end through the second linear scale reading; the control module converts the initial position and the end position of the lateral movement of the probe into a position point coordinate sequence of two measuring surfaces in three-dimensional space to calculate the parallelism error of the fixed anvil and the movable anvil measuring surface of the micrometer; according to the verification procedure, it is determined whether the parallelism error of the micrometer is qualified, if not qualified, the user is prompted whether to exit the detection process, if qualified, the detection process is continued; S5, the control module calculates the absolute position coordinates of each visual probe at the zero point according to the scale reading read by the first visual module and the lateral relative movement position of each visual probe end when the probe contacts the fixed anvil; S6, the third visual module drives the differential cylinder to the first detection point according to the recognition result of the third visual module, the third visual module recognizes the current micrometer reading, the linear motor module mover drives the probe to contact the movable anvil measuring surface, the second visual module reads the lateral relative movement position of each visual probe end through the second linear scale, the first visual module reads the reading of the first linear scale, the control module calculates the absolute length of each detection point according to the measurement result of the fixed anvil measuring surface in step S4 and the position coordinate sequence of each visual probe end at the current detection point, and compares the absolute length with the current micrometer reading to obtain the indication error of the current detection point of the micrometer; S7. Repeat step S6 until the indication errors of all the detection points are obtained. The absolute value of the indication errors of all the detection points is taken as the maximum indication error, which is used as the indication error of the micrometer.

7. The detection method of a micrometer intelligent calibration system according to claim 6, characterized in that: The steps after step S7 are: S8. Determine whether the micrometer indication error is qualified according to the verification procedure. If it is unqualified, prompt the user whether to print the test report. If it is qualified, print the test report directly; S9: The electromagnet stops attracting the table, the third visual system moves to the initial position, the second manipulator drives the probe to a safe position, and the micrometer is removed.

Images