A test device for small semiconductor refrigerator

Abstract

The present invention provides a testing device for a small semiconductor refrigerator, the device has a rectangular base, a gate-shaped bracket is mounted on the base, the gate-shaped bracket straddles a platform on the base, the platform is made of insulating material, a nylon shaft protruding outward is mounted on the lower part of each pillar of the gate-shaped bracket, a square metal rod is sleeved on the nylon shaft, a probe is fixed on the other end of the metal rod, each metal rod is connected to the output end of a DC power supply by a wire, an infrared thermometer is mounted on the horizontal beam of the gate-shaped bracket, and the lens of the thermometer is aimed at the needle tips of two probes. The square metal rod can rotate around the nylon shaft so that the probe can be lifted upward, and the testing device can screen out unqualified products of the incoming materials, ensuring that the products produced will not be scrapped due to unqualified incoming materials, not only improving the yield rate, but also eliminating the waste of raw materials, and improving production efficiency and labor utilization.

Description

Technical Field

[0001] The invention relates to a testing device for semiconductor laser devices, in particular to a testing device for a small semiconductor refrigerator used for manufacturing lasers. Background Art

[0002] At present, many TOSA products (semiconductor lasers) have temperature runaway during product testing, which has led to the appearance of some waste products. The reason is that the incoming TEC (semiconductor refrigerator) products have not been tested, and the supplier mistakenly reversed the positive and negative poles of some TEC devices, resulting in the mixing of good and bad devices. This situation was not discovered until the subsequent products were made and tested. Therefore, not only a large amount of accessory materials for the subsequent process was wasted, but also the production time and labor of the subsequent process were wasted, causing great losses to production. Summary of the invention

[0003] The purpose of the present invention is to provide a testing device for incoming TEC products, so as to screen out unqualified incoming products and improve the defects of existing production from the source, thereby minimizing the loss of raw materials in subsequent production and reducing labor loss and waste of production time.

[0004] In order to achieve the above object, the present invention adopts the following technical solutions:

[0005] A testing device for a small semiconductor refrigerator has a rectangular base with a gate-shaped bracket mounted on the base. The gate-shaped bracket straddles a platform on the base, and the platform is made of insulating material. A nylon shaft protruding outward is mounted at the bottom of each support of the gate-shaped bracket, and a square metal rod is sleeved on the nylon shaft. A probe is fixed to the other end of the metal rod, and each metal rod is connected to the output end of a DC power supply by a wire. An infrared thermometer is mounted on the horizontal beam of the gate-shaped bracket, and the lens of the thermometer is aimed at the needle tips of the two probes.

[0006] A flat bottom groove is formed on the platform for placing the TEC device to be tested.

[0007] The square metal rod can rotate around the nylon shaft so that the probe can be lifted upwards, and a circular insulating gasket is sleeved on the nylon shaft. The insulating gasket is located between the upright post of the gate-shaped bracket and the square metal rod.

[0008] The probe is fixed by opening a slit and a screw hole for clamping at the end of a square metal rod. After the probe is clamped by the slit, it is tightened with a screw. This structure is equipped with a straight rod probe; the end of the metal rod can also be made into a round rod shape and opened with a slit, and the outer circle of the metal rod is made into a tapered thread shape, and a nut with a tapered internal thread is screwed on the tapered thread. After the probe is clamped by the slit, it is fixed with the tapered internal thread nut. This structure is equipped with a bent probe.

[0009] The DC power supply is provided with a time relay, and the output of the DC power supply is controlled by the time relay.

[0010] Compared with the prior art, the present invention has the following beneficial effects:

[0011] Since the present invention provides a testing device for incoming TEC products, unqualified incoming products can be screened out. Therefore, all TEC products entering the production line are qualified products, which ensures that the produced products will not be waste due to unqualified incoming materials. This not only improves the product yield, but also eliminates the waste of raw materials and improves production efficiency and labor time utilization. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a structural schematic diagram of the present invention (front side).

[0013] Figure 2 It is a schematic structural diagram of the present invention (side view).

[0014] The specific implementation modes of the present invention are described in detail below with reference to the accompanying drawings.

[0015] like Figure 1 to Figure 2As shown in FIG. 1 , an embodiment of the present invention is shown. The test device has a rectangular base 1, on which a gate-shaped bracket 2 is mounted. The gate-shaped bracket 2 stands on a platform 3 on the base 1, and the platform 3 is made of insulating material. A nylon shaft 4 protruding outward is mounted at the lower part of each pillar of the gate-shaped bracket 2, and a square metal rod 5 is sleeved on the nylon shaft 4. A metal probe 6 is fixed at the other end of the metal rod 5. Each metal rod 5 is connected to the output end of a DC power supply 8 by a wire 7. An infrared thermometer 9 is mounted on the horizontal crossbeam of the gate-shaped bracket 2, and the lens of the infrared thermometer 9 is aimed at the needle tips of the two probes 6. A flat bottom groove 10 is opened on the platform 3 for placing the TEC device 11 to be tested. The square metal rod 5 can rotate around the nylon shaft 4 so that the probe 6 can be lifted upward. A circular insulating gasket 12 is also sleeved on the nylon shaft 4, and the insulating gasket 12 is located between the column of the gate-shaped bracket 2 and the square metal rod 5. The probe 6 is fixed by opening a slit and a screw hole for clamping at the end of the metal rod 5. After the probe 6 is clamped by the slit, it is tightened with a screw 13. This structure is equipped with a straight rod-shaped probe 6; the end of the metal rod 5 can also be made into a round rod shape and opened with a slit, and the outer cylindrical surface of the metal rod 5 is made into a tapered thread, and a tapered internal thread nut is screwed on the tapered thread. After the probe 6 is clamped by the slit, it is fixed with a tapered internal thread nut. This structure is equipped with a bent probe 6. The installation height of the nylon shaft 4 on the two pillars should be consistent, and the gap between the square metal rod 5 and the nylon shaft 4 should not be too loose, especially the square metal rod 5 should not have radial movement on the nylon shaft 4. The needle tips of the two probes 6 should also be installed at the same height, and the common plane where the two probes 6 are located should be kept parallel to the gate-shaped bracket 2. The DC power supply 8 is provided with a time relay 14, and the output of the DC power supply 8 is controlled by the time relay 14.

[0016] The operation process of the present invention is as follows: first, the two square metal rods 5 on the gate-shaped bracket 2 are lifted upward with the nylon shaft 4 as the axis, then the TEC device 11 is placed in the groove 10 of the platform 3, with the positive and negative electrodes facing upward, and then the two square metal rods 5 are put down, and the needle tips of the two probes 6 on the square metal rods 5 are pressed on the two electrodes of the TEC device 11, and the time relay 14 on the DC power supply 8 is adjusted within 5 seconds, and then the DC power supply 8 is started to power the TEC device 11, and the power of the added power is determined according to the requirements of the TEC device 11. According to the characteristics of the TEC device 11, the temperature change is monitored by the infrared thermometer 9, and the electrode welding direction of the TEC device 11 is determined according to the temperature change. If the temperature monitored by the infrared thermometer 9 drops, it means that the positive and negative poles of the TEC device 11 are the same as those of the DC power supply 8, the TEC device 11 can achieve cooling, the positive and negative poles are welded correctly, and the TEC device 11 is a qualified product; if the temperature monitored by the infrared thermometer 9 rises, it means that the positive and negative poles of the TEC device 11 are opposite to those of the DC power supply 8, the TEC device 11 cannot achieve cooling, the positive and negative poles are welded reversely, and the TEC device 11 is a defective product. After the test is completed, lift the square metal rod 5 and take out the TEC device 11 under test.

[0017] Compared with the prior art, the present invention has the following beneficial effects:

[0018] Since the present invention provides a testing device for incoming TEC products, unqualified incoming products can be screened out. Therefore, all TEC products entering the production line are qualified products, which ensures that the produced products will not be wasteful due to unqualified incoming materials. This not only improves the product yield, but also eliminates the waste of raw materials, and improves production efficiency and labor time utilization.

Claims

1. A test device for a small semiconductor refrigerator, characterized in that: The device has a rectangular base, on which a gate-shaped bracket is mounted, the gate-shaped bracket straddles a platform on the base, the platform is made of insulating material, a nylon shaft protruding outward is mounted at the bottom of each support of the gate-shaped bracket, a square metal rod is sleeved on the nylon shaft, a probe is fixed at the other end of the metal rod, each metal rod is connected to the output end of a DC power supply by a wire, an infrared thermometer is mounted on the horizontal beam of the gate-shaped bracket, and the lens of the thermometer is aimed at the needle tips of the two probes; The platform is provided with a flat bottom groove for placing the TEC device to be tested; The square metal rod can rotate around the nylon shaft so that the probe can be lifted upwards, and a circular insulating gasket is sleeved on the nylon shaft, and the insulating gasket is located between the column of the gate-shaped bracket and the square metal rod; The probe is fixed by opening a slit and a screw hole for clamping at the end of a square metal rod, and then tightening the probe with a screw after it is clamped. This structure is equipped with a straight rod probe; or the end of the metal rod is made into a round rod shape and a slit is opened, and the outer circle of the metal rod is made into a tapered thread shape, and a nut with a tapered internal thread is screwed on the tapered thread. After the probe is clamped, it is fixed with the tapered internal thread nut. This structure is equipped with a bent probe.

2. A test device for a small semiconductor refrigerator according to claim 1, characterized in that ,The DC power supply is provided with a time relay, and the output of the DC power supply is controlled by the time relay.

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