Full-section flaw detection equipment and method for weld seams of rail welding joints at rail welding bases

Abstract

The present invention discloses a full-section flaw detection device and method for the weld seam of the rail welding joint at the rail welding base, including an F base, a lower flaw detection system slidably arranged on the F base, two support columns arranged on the F base, an F top seat arranged on the support columns, and an upper flaw detection system slidably arranged on the F top seat. The sliding direction of the upper flaw detection system is parallel to the sliding direction of the lower flaw detection system. The lower flaw detection system includes a rail bottom side flaw detection structure and a rail bottom upper contour flaw detection structure, and the upper flaw detection system includes a rail head side flaw detection structure and a rail upper part flaw detection structure. The beneficial effects of the present invention are as follows: This solution can perform flaw detection on the rail bottom side, the rail bottom upper contour, the rail head side, the rail web, and the rail head lower jaw of the rail from multiple directions, realizing full-section flaw detection of the rail, and can achieve automatic flaw detection to improve the efficiency and accuracy of flaw detection.

Description

Technical Field

[0001] The present invention relates to the technical field of rail flaw detection, and specifically, to a full-section flaw detection device and method for the weld seam of a rail welding joint at a rail welding base. Background Art

[0002] With the comprehensive speed increase, capacity expansion, and upgrade of China's railways, as well as the rapid development of passenger dedicated lines and high-speed heavy-haul railways, higher requirements are put forward for the quality of rail welding joints. The quality control of rail welding joints directly affects railway transportation production and train operation safety. Therefore, starting from improving flaw detection standards and using new equipment, realizing single and double probe full-section flaw detection for rail welds and heat-affected zones is a double-insurance strategy to improve the weld flaw detection ability and ensure that welded joints leave the factory without defects, and it is also an effective means to ensure railway train operation safety. Especially for high-speed passenger dedicated lines, this work is particularly important.

[0003] In China, flash welding for fixing rails is mainly used to weld rails. Flash welding is a rail welding method with high production efficiency and relatively stable and reliable quality, and it is also the most widely used rail welding method at home and abroad. During the flash welding process, due to problems such as unstable welding equipment, process parameters, oversized rail geometric dimensions, and the material of the rail base metal, various defects will occur in the welded joints. Classified by type, there are mainly the following two types:

[0004] 1. Volume-shaped or point-shaped defects, such as porosity and slag inclusion, etc.;

[0005] 2. Planar defects, such as gray spots, lack of fusion, etc. Among them, planar defects are very dangerous. They not only reduce the effective cross-section of the rail, but also cause stress concentration, and even lead to the opening of the weld seam or the fracture of the rail.

[0006] Currently, there are the following problems in the flaw detection of weld joints of flash-welded rails before leaving the factory:

[0007] 1. Using a manually held probe for flaw detection has many influencing factors, the scanning range is not comprehensive, manual identification and judgment are carried out, the flaw detection results are unreliable, and there is no guarantee for safety technology;

[0008] 2. For planar defects, double-probe K-type and tandem flaw detection methods must be used. The operation is complex, and high technical levels and skills are required for flaw detection operators. Manual flaw detection is difficult to achieve;

[0009] 3. The flaw detection efficiency is low, and the flaw detection process is a bottleneck restricting the production of the rail welding assembly line;

[0010] 4. The informatization level is low, which is not conducive to the preservation of flaw detection data and cannot improve the welding process through data statistical analysis. Summary of the Invention

[0011] In order to overcome the shortcomings of the prior art, the purpose of the present invention is to provide a full-section flaw detection device for the weld of the welded joint of the welded rail base rail, which is used to detect the full section of the weld of the welded rail base rail factory weld, and is conducive to realizing automated flaw detection to improve the efficiency and accuracy of flaw detection.

[0012] The present invention is realized by the following technical scheme: a full-section flaw detection device for weld seams of welded rail base rail joints, comprising an F base, a lower flaw detection system slidably arranged on the F base, two supporting pillars arranged on the F base, an F top seat arranged on the supporting pillars and an upper flaw detection system slidably arranged on the F top seat, wherein the sliding direction of the upper flaw detection system is parallel to the sliding direction of the lower flaw detection system, the lower flaw detection system comprises a rail bottom side flaw detection structure and a rail bottom upper contour flaw detection structure, and the upper flaw detection system comprises a rail head side flaw detection structure and a rail upper flaw detection structure.

[0013] Furthermore, in order to better realize the present invention, two parallel F base slide rails are arranged in the F base, and a flaw detection walking platform is slidably connected to the F base slide rails, and the flaw detection walking platform is transmission-connected to a bottom drive system; the lower flaw detection system is arranged on the flaw detection walking platform.

[0014] Further, in order to better realize the present invention, the rail bottom side flaw detection structure includes a rail bottom flaw detection base located below the rail and arranged on the flaw detection walking platform, two A transmitting structures arranged on the rail bottom flaw detection base, and two A receiving structures arranged on the rail bottom flaw detection base, the A transmitting structure corresponds to the A receiving structure one by one and are respectively arranged on both sides of the rail;

[0015] The A transmitting structure includes an A transmitting probe that emits an A ultrasonic wave oblique to the length direction of the rail, and the A receiving structure includes a plurality of A receiving probes that receive the A ultrasonic wave, and the direction in which the A receiving probe receives the A ultrasonic wave is perpendicular to the transmitting direction of the A ultrasonic wave;

[0016] The directions in which the two A transmitting probes emit ultrasonic waves are not parallel.

[0017] Furthermore, in order to better realize the present invention, the rail bottom contour flaw detection structure includes a B column arranged on the flaw detection walking platform, a B mounting seat arranged on both sides of the B column, a B probe mounting seat arranged on the B mounting seat, and a plurality of B probe mounting grooves arranged on the B probe mounting seat, and the B probe mounting grooves on the two B probe mounting seats are symmetrically arranged on both sides of the B column.

[0018] Furthermore, in order to better realize the present invention, the flaw detection walking platform is provided with rail bottom rollers, and the rail bottom rollers are arranged on a C mounting base on the flaw detection walking platform, two C mounting supports arranged on the C mounting base, a C base plate rotatably mounted between the two C mounting bases, a roller mounting base arranged on the C base plate and a C roller hinged to the roller mounting base, and the C roller is parallel to the rotating axis of the C base plate.

[0019] Furthermore, in order to better realize the present invention, the F top seat is provided with an F top seat slide rail parallel to the F base slide rail, the F top seat slide rail is slidably connected with an F top seat support seat, and the upper flaw detection system is arranged on the F top seat support seat.

[0020] Further, in order to better realize the present invention, the rail head side flaw detection structure includes a D mounting bracket arranged on the F top seat support, a D cylinder arranged on the D mounting bracket and with the piston rod facing downward, a D movable bracket drivingly connected to the piston rod of the D cylinder, and three groups of D detection structures arranged on the D movable bracket, each group of D detection structures includes two D probe mounting brackets located on both sides of the rail and at the same height, and the three groups of D probe mounting brackets have different heights. The three groups of D detection structures overlap in the height direction, ensuring the overlapping coverage of the sound beams.

[0021] Further, in order to better realize the present invention, the rail upper flaw detection structure includes an E mounting bracket arranged on an F top support seat, an E cylinder arranged on the E mounting bracket with a piston rod facing downward, an E movable bracket drivingly connected to the piston rod of the E cylinder, an E probe mounting bracket arranged below the E movable bracket, and an E probe mounting seat arranged in the E probe mounting bracket;

[0022] The E probe mounting seat includes a rail waist probe mounting seat and a jaw probe mounting seat. The rail waist probe mounting seat is equipped with a plurality of rail waist probes for emitting ultrasonic waves downward, and the rail waist probes are distributed along the same straight line. The jaw probe mounting seat is equipped with a plurality of jaw probes for emitting ultrasonic waves downward, and the jaw probes are arranged obliquely with respect to the length direction of the rail, and each jaw probe is inclined at a different angle. A plurality of ultrasonic probes inclined downward and backward at a certain angle are installed in front of the rail waist probe box, and a plurality of receiving ultrasonic probes inclined forward are installed in the rear to receive ultrasonic waves emitted by the transmitting probe.

[0023] Two E cylinders are arranged on the same side of the E mounting bracket, each E cylinder is independently connected to an E movable bracket, a waist probe mounting seat is arranged in one of the E probe mounting brackets, and a chin probe mounting seat is arranged in the other E probe mounting bracket.

[0024] Furthermore, to better implement the present invention, two F top seat support seats are provided, one of which is arranged on the upper surface of the F top seat, and the other is arranged on the side surface of the F top seat.

[0025] A full-section flaw detection method for the weld seam of the rail welding joint at the rail welding base. The rail is flaw-detected by using a full-section flaw detection device. The bottom side of the rail is flaw-detected by using a bottom side flaw detection structure of the rail. The upper contour of the rail bottom is flaw-detected by using an upper contour flaw detection structure of the rail bottom. The side of the rail head is flaw-detected by using a side flaw detection structure of the rail head. The web and the upper jaw of the rail head are flaw-detected by using an upper rail flaw detection structure of the rail. Among them, the bottom side flaw detection structure and the upper contour flaw detection structure of the rail bottom are bidirectional structures, and the ultrasonic beam propagates along the front and back two directions of the flaw detection movement, and the flaw detection is completed in one scan. The side flaw detection structure of the rail head and the upper flaw detection structure are unidirectional structures, and the ultrasonic beam propagates along the forward direction of the flaw detection movement. After the forward flaw detection is completed, the side flaw detection structure of the rail head and the upper flaw detection structure rotate 180°, and the reverse flaw detection is carried out.

[0026] The beneficial effects achieved by this solution are:

[0027] This solution can perform flaw detection on the bottom side of the rail, the bottom contour of the rail, the side of the rail head, the web of the rail, and the lower jaw of the rail head from multiple directions. The lower flaw detection system is a bidirectional structure, and the flaw detection in the forward and reverse two directions is completed at one time. The upper flaw detection frame is a unidirectional structure. After the forward flaw detection, the upper flaw detection system automatically rotates 180° for reverse flaw detection. The flaw detection in two directions ensures the scanning of defects with different orientations, realizes the forward and reverse flaw detection of the full section of the rail, and can achieve automation to improve the efficiency and accuracy of flaw detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 is a schematic structural diagram of this solution;

[0029] Figure 2 is a three-dimensional schematic diagram of this solution;

[0030] Figure 3 is Figure 2 an enlarged view of part B of

[0031] Figure 4 is a schematic diagram of the F top seat slide rail structure;

[0032] Figure 5 is Figure 2 an enlarged view of part A of

[0033] Figure 6 is a schematic diagram of the F base slide rail structure;

[0034] Figure 7 is a schematic diagram of the bottom side flaw detection structure of the rail;

[0035] Figure 8Schematic diagram of the upper structure of the base for rail bottom flaw detection;

[0036] Figure 9 Schematic diagram of the A transmitting structure;

[0037] Figure 10 Schematic diagram of the A receiving structure;

[0038] Figure 11 Schematic diagram of the lifting mechanism of the flaw detection base;

[0039] Figure 12 Stereoscopic diagram of the rail bottom upper contour flaw detection structure;

[0040] Figure 13 Front view schematic diagram of the rail bottom upper contour flaw detection structure;

[0041] Figure 14 Top view schematic diagram of the rail bottom upper contour flaw detection structure;

[0042] Figure 15 For Figure 12 Enlarged view of part A;

[0043] Figure 16 Stereoscopic diagram of the rail bottom idler;

[0044] Figure 17 Front view of the rail bottom idler;

[0045] Figure 18 Stereoscopic diagram of the rail head side flaw detection structure;

[0046] Figure 19 For Figure 18 Front view;

[0047] Figure 20 For Figure 18 Right view;

[0048] Figure 21 Schematic diagram of the D probe mounting bracket;

[0049] Figure 22 Stereoscopic diagram of this solution;

[0050] Figure 23 For Figure 22 Front view;

[0051] Figure 24 For Figure 22 Enlarged view of part E;

[0052] Figure 25a Schematic diagram of artificial damage on the rail bottom side;

[0053] Figure 25bSchematic diagram a of probe arrangement for rail bottom side flaw detection;

[0054] Figure 25c Schematic diagram b of probe arrangement for rail bottom side flaw detection;

[0055] Figure 25d Schematic diagram of sound beam propagation for rail bottom side flaw detection;

[0056] Figure 26a Schematic diagram of artificial damage on rail web;

[0057] Figure 26b Schematic diagram of probe arrangement for rail web flaw detection;

[0058] Figure 26c Schematic diagram of sound beam propagation for rail web flaw detection;

[0059] Figure 27a Schematic diagram of artificial damage on rail head side;

[0060] Figure 27b Schematic diagram a of probe arrangement for rail head side flaw detection;

[0061] Figure 27c Schematic diagram b of probe arrangement for rail head side flaw detection;

[0062] Figure 27d Schematic diagram of sound beam propagation for rail head side flaw detection;

[0063] Figure 28a Schematic diagram of artificial damage on upper contour of rail bottom;

[0064] Figure 28b Schematic diagram of probe arrangement for upper contour of rail bottom flaw detection;

[0065] Figure 28c Schematic diagram of sound beam propagation for upper contour of rail bottom flaw detection;

[0066] Figure 29a Schematic diagram of artificial damage on lower jaw of rail head;

[0067] Figure 29b Schematic diagram of probe arrangement for lower jaw of rail head flaw detection;

[0068] Figure 29c Schematic diagram of sound beam propagation for lower jaw of rail head flaw detection;

[0069] Among them, 1-F base, 3-F top seat support, 4-rail head side flaw detection structure, 41-D mounting bracket, 42-D cylinder mounting seat, 43-D cylinder, 44-D movable bracket, 45-D slide rail, 46-D mounting plate, 47-D probe mounting bracket, 471-D probe mounting base plate, 472-D probe mounting seat, 473-D probe mounting vertical plate, 474-D probe mounting groove, 48-D roller mounting support, 49-roller, 410-D adjusting cylinder, 411-D limiting structure, 412-D mounting bracket connection structure, 5-upper rail flaw detection structure, 51-E mounting bracket, 52-E cylinder, 53-E cylinder mounting seat, 54-E movable bracket, 55-E adjusting cylinder, 56-E probe mounting bracket, 561-rail web probe mounting seat, 562-jaw probe mounting seat, 57-E limiting structure, 58-E slide rail, 59-E guide wheel, 591-guide wheel limiting plate, 592-opening groove, 593-guide wheel limiting block, 594-adjusting plate, 510-E connection structure, 6-F top seat, 61-F top seat slide rail, 62-F limiting structure, 7-rail bottom side flaw detection structure, 71-rail bottom flaw detection base, 72-flaw detection base lifting mechanism, 73-flaw detection base mounting seat, 74-flaw detection base drive structure, 75-rail bottom flaw detection structure drive device, 751-A cylinder, 752-A bottom plate slide rail, 753-A mounting bottom plate, 754-A mounting bottom plate limiting structure, 755-A cylinder mounting seat, 76-A emission structure, 761-A emission vertical plate, 762-A emission probe mounting seat, 763-A emission probe mounting groove, 764-A emission probe wear-resistant plate, 765-A emission probe limiting plate, 77-roller, 78-A receiving structure, 781-A receiving vertical plate, 782-A receiving probe mounting seat, 783-A receiving probe mounting groove, 785-A receiving probe limiting plate, 784-A receiving probe wear-resistant plate, 8-upper rail bottom contour flaw detection structure, 81-B column, 82-B mounting plate, 83-B slide bar, 84-B slider, 85-B driven connecting rod, 86-B driving connecting rod, 87-B mounting seat, 88-B probe mounting seat, 881-B bracket, 882B bracket limiting plate, 89-B probe mounting groove, 810-B guide wheel, 811-B limiting baffle, 812-B limiting plate, 813-B connecting plate, 9-rail bottom idler, 91-C mounting bottom, 92-C mounting support, 93-C bottom plate, 931-C top limiting block, 932-C bottom limiting block, 933-C reinforcing plate, 94-roller mounting seat, 95-C roller, 96-C roller motor, 97-C drive structure, 98-C limiting bottom plate, 99-C bottom limiting block, 910-C limiting connecting plate, 911-C limiting top plate, 912-C top limiting block, 10-flaw detection walking platform, 11-supporting pillar, 12-rail, 13-F base slide rail. Detailed implementation mode

[0070] The present invention is further described in detail below in conjunction with examples, but the embodiments of the present invention are not limited thereto.

[0071] like Figure 1 As shown, in this embodiment, a full-section flaw detection device for the weld of a welded rail base rail welding joint includes an F base 1, a lower flaw detection system slidably arranged on the F base 1, two supporting pillars 11 arranged on the F base 1, an F top seat 6 arranged on the supporting pillars 11 and an upper flaw detection system slidably arranged on the F top seat 6, the sliding direction of the upper flaw detection system is parallel to the sliding direction of the lower flaw detection system, the lower flaw detection system includes a rail bottom side flaw detection structure 7 and a rail bottom upper contour flaw detection structure 8, and the upper flaw detection system includes a rail head side flaw detection structure 4 and a rail upper flaw detection structure 5.

[0072] When it is necessary to inspect the rail 12, the rail 12 is positioned between the lower inspection system and the upper inspection system. The rail bottom inspection structure 7 is provided with an ultrasonic probe for inspecting the rail bottom, the rail bottom upper contour inspection structure 8 is provided with an ultrasonic probe for inspecting the rail bottom upper contour, the rail head side inspection structure 4 is provided with an ultrasonic probe for inspecting the rail head side, and the rail upper inspection structure 5 is provided with an ultrasonic probe for inspecting the rail waist and the rail head lower jaw. By the relative sliding of the lower inspection system, the upper inspection system and the rail 12, the rail 12 can be inspected by the probes in the lower inspection system and the upper inspection system, and the full-section inspection of the rail can be achieved. The mechanical structure is used to drive the probe to move, so that automatic control can be achieved, and the relative position accuracy between the probe and the rail 12 can be guaranteed, thereby ensuring the accuracy of the inspection.

[0073] like Figure 2 , Figure 5 As shown, on the basis of the above embodiment, in this embodiment, two parallel F-base slide rails 13 are arranged in the F-base 1, and a flaw detection walking platform 10 is slidably connected to the F-base slide rails 13, and the flaw detection walking platform 10 is transmission-connected to the bottom drive system; the lower flaw detection system is arranged on the flaw detection walking platform 10. In this embodiment, a plurality of support seats for supporting the F-base slide rails 13 can be arranged on the F-base 1, and an adjustment mechanism for adjusting the position and angle of the F-base slide rails 13 can be arranged on the support seat. The adjustment of the adjustment mechanism can eliminate the influence of processing errors, installation errors, installation terrain and other factors on the position accuracy of the F-base slide rails 13, so that the F-base slide rails 13 are kept horizontal, or the length direction of the F-base slide rails 13 and the steel rails 12 are kept consistent, which is conducive to improving the accuracy of flaw detection.

[0074] The flaw detection walking platform 10 and the F base slide rail 13 are made to slide relative to each other, which can drive the lower flaw detection system to move as a whole. When flaw detection is performed on the rail 12, the length direction of the rail 12 is made parallel to the F base slide rail 13, which is conducive to ensuring the accuracy of flaw detection.

[0075] like Figure 6 As shown, in this embodiment, the F base slide rail 13 adopts the existing steel rail. The bottom drive system adopts a motor and a synchronous belt drive chain. The synchronous belt drive chain is driven by the motor. The flaw detection walking platform 10 is connected to the synchronous belt drive chain. The synchronous belt drive chain is equipped with an automatic tensioning mechanism. When the motor drives the belt in the synchronous belt drive chain to rotate, the belt can drive the flaw detection walking platform 10 to move along the F base slide rail 13. The use of the synchronous belt drive chain can play a role in buffering and absorbing vibration, reducing the vibration transmitted from the motor to the flaw detection walking platform 10, and avoiding the impact on the accuracy of flaw detection.

[0076] A plurality of tensioning wheels rotatably connected to the belt can be arranged between the driving wheel and the driven wheel of the synchronous belt transmission chain to adjust the preload force of the synchronous belt and prevent the belt from loosening.

[0077] like Figure 7 As shown, on the basis of the above embodiment, in this embodiment, the rail bottom flaw detection structure 7 includes a rail bottom flaw detection base 71 located below the rail 12 and arranged on the flaw detection walking platform 10, two A transmitting structures 76 arranged on the rail bottom flaw detection base 71 and two A receiving structures 78 arranged on the rail bottom flaw detection base 71, the A transmitting structure 76 corresponds to the A receiving structure 78 and is respectively arranged on both sides of the rail 12; the A transmitting structure 76 includes an A transmitting probe that emits an A ultrasonic wave inclined to the length direction of the rail 12, and the A receiving structure 78 includes a plurality of A receiving probes that receive ultrasonic waves reflected by defects at different positions, and the spacing of the A transmitting probes and the spacing of the receiving probes are arranged according to the verification value. The mechanical structure ensures that the transmitting probes A and the receiving probes A on the left and right sides are offset from the center of the two sides of the rail 12, and the receiving probe A can receive the ultrasonic wave emitted by the probe A reflected by the defects of the entire rail bottom section; due to the uncertainty of the orientation of the actual defect, a transmitting device A and a receiving device A are arranged on both sides of the rail, and the directions of the sound beams are forward and backward respectively, to ensure that defects exceeding the set equivalent in any direction can be detected. When it is necessary to inspect the bottom side of the rail 12, the rail 12 is placed above the bottom inspection base 71 and between the A transmitting structure 76 and the A receiving structure 78. The A transmitting probe and the A receiving probe are respectively connected to the ultrasonic evaluation unit, and the A transmitting probe is used to emit ultrasonic waves in a direction inclined to the rail 12, and the ultrasonic waves penetrate the rail 12. The A receiving probe is used to receive ultrasonic waves reflected by defects, and the signals received by the A receiving probe are transmitted to the ultrasonic evaluation unit for processing, so as to analyze whether there are defects exceeding the set equivalent inside the rail 12.

[0078] Drive the A transmitting structure 76 and the A receiving structure 78 along the length direction of the rail 12 by the rail bottom flaw detection base 71, so as to be able to detect the rail bottom side of the rail 12 within the moving range.

[0079] If the direction of the flaw inside the rail 12 is parallel to the direction of the ultrasonic wave, it is difficult to detect the flaw by using the ultrasonic wave, resulting in missed detection. By using two devices with ultrasonic wave transmitting and receiving installed on both the left and right sides and the directions of the sound beams being opposite, any flaw exceeding the set equivalent in any direction of the entire rail bottom section can be detected, fundamentally avoiding the situation of missed detection, which is beneficial to improving the detection accuracy. And it can complete the detection within the range of one flaw detection stroke, which is beneficial to improving the detection efficiency.

[0080] In this embodiment, the directions of the ultrasonic waves emitted by the two A transmitting probes are distributed on both sides of a plane perpendicular to the length direction of the rail 12. The ultrasonic waves emitted by the probe wafers in the two A transmitters are inclined at a specific angle. The left transmitting device is forward and the right transmitting device is backward, and the ultrasonic waves are emitted at an angle in a positive and negative direction along the length direction of the rail.

[0081] As Figure 25a shown, multiple horizontal flat-bottom holes are made at the end face of the rail 12 manually by the rail bottom, and multiple vertical holes are made at the bottom of the rail. The two types of holes are arranged staggeredly and distributed throughout the rail bottom section, representing flaws of different positions and types.

[0082] As Figure 25b 、 25c shown, the A transmitting probes in the A transmitting structure 76 include T1, T2, T3, and T4 probes for transmitting ultrasonic waves, and the A receiving probes include R5, R6, R7, and R8 probes for receiving ultrasonic waves.

[0083] As Figure 25d shown, the T1 probe emits ultrasonic waves along a direction inclined to the length direction of the rail 12. After the ultrasonic waves emitted by the T1 probe are reflected by flaws at different positions, they can be received by the T1, R5, R6, R7, and R8 probes respectively.

[0084] The T2 probe emits ultrasonic waves along a direction inclined to the length direction of the rail 12. After the ultrasonic waves emitted by the T1 probe are reflected by flaws at different positions, they can be received by the T2, R5, R6, R7, and R8 probes respectively.

[0085] The T3 probe emits ultrasonic waves along a direction inclined to the length direction of the rail 12. After the ultrasonic waves emitted by the T1 probe are reflected by flaws at different positions, they can be received by the T3, R5, R6, R7, and R8 probes respectively.

[0086] The T4 probe emits ultrasonic waves in a direction inclined to the length direction of the rail 12. The ultrasonic waves emitted by the T1 probe are reflected by defects at different positions and can be received by the T4, R5, R6, R7, and R8 probes respectively.

[0087] Similarly, the transmitting and receiving relationships of T9, T10, T11, T12 and R12, R13, R14, R15 in the opposite direction of the sound beam are the same as those of the above-mentioned probes.

[0088] The A transmitting probe and the A receiving probe can be controlled by the ultrasonic evaluation unit, and the movement of the rail bottom flaw detection base 71 can also be automatically controlled, which is conducive to automating the entire flaw detection process, so as to improve the efficiency and accuracy of the detection. Figure 1 , Figure 2 As shown, in this embodiment, two rollers 77 for supporting the rail 12 can be provided on the rail bottom flaw detection base 71, and the axis of the roller 77 is perpendicular to the length direction of the rail 12. The rail 12 is supported by the roller 77 to keep the relative position of the probe and the rail 12 constant, which can prevent the rail from being suspended in the air and causing itself to bend and deform under the action of gravity. The rolling can also be used to reduce friction to prevent the rail bottom flaw detection base 71 and the rail 12 from wearing each other.

[0089] On the basis of the above-mentioned embodiment, in this embodiment, the rail bottom flaw detection base 71 is provided with two rail bottom flaw detection structure driving devices 75 which can respectively drive the A emission structure 76 and the A receiving structure 78 away from or close to the rail 12. The rail bottom flaw detection structure driving device 75 can adjust the distance between the A emission structure 76 or the A receiving structure 78 and the rail 12. When placing the rail 12, the A emission structure 76 and the A receiving structure 78 are controlled to move outward away from the rail 12, which is convenient for installing and placing the rail 12, and avoids collision and structural damage. After the rail is placed, the A emission structure 76 or the A receiving structure is moved inward and close to the rail 12 to reduce external interference and avoid affecting the detection accuracy.

[0090] like Figure 8 As shown, the rail bottom flaw detection structure driving device 75 includes an A mounting base plate 753, an A cylinder 751 transmission-connected to the A mounting base plate 753, and an A base plate slide rail 752 disposed below the A mounting base plate 753 and slidably connected to the A mounting base plate 753.

[0091] The A receiving structure 78 and the A transmitting structure 76 are respectively arranged on the A mounting base plate 753 , and the A receiving structures 78 and the A receiving structures 78 are diagonally distributed or located on the same side of the rail 12 .

[0092] Since the A receiving structure 78 and the A transmitting structure 76 may have different width dimensions, arranging the A receiving structure 78 and the A receiving structure 78 diagonally allows the use of A mounting bases 753 of the same length on both sides of the rail 12, which is conducive to the rational layout of space and can also prevent the ultrasonic waves emitted by the two A receiving structures 78 from interfering with each other.

[0093] Use the A mounting base 753 as the mounting foundation for the A receiving structure 78 or the A transmitting structure 76, and use the A base slide rail 752 to support the A mounting base 753 to maintain the balance and stability of the A mounting base 753.

[0094] Use the A cylinder 751 to push the A mounting base 753 to reciprocate along the A base slide rail 752, so as to control the A receiving probe to approach or move away from the rail 12. In this embodiment, the piston rod of the A cylinder 751 is hinged to the A mounting base 753, so that the direction of the thrust borne by the A mounting base 753 can be adaptively adjusted, avoiding the influence of installation errors on the movement accuracy of the A mounting base 753, and thus avoiding the influence of installation errors on the movement accuracy and position accuracy of the A receiving probe.

[0095] Two springs of the same specification are provided on the rail bottom flaw detection base 71, which are respectively located on both sides of the A cylinder 751 and connected to the A mounting base 753, so that the two springs are parallel and in the same state of compression or tension. The springs help to keep the rail bottom flaw detection base 71 stable and balanced, reducing the influence of installation errors on the movement accuracy of the rail bottom flaw detection base 71 and avoiding the influence on the detection accuracy.

[0096] Two A cylinder mounting seats 755 are provided on the rail bottom flaw detection base 71, which are respectively located on both sides of the A cylinder 751. The A cylinder 751 is hinged to the A cylinder mounting seat 755. Combining with the hinged action of the piston rod and the A mounting base 753, it can increase the adjustable range and flexibility of the A mounting base 753, and avoid interference between the A cylinder 751 and the A mounting base 753, which may affect the progress of the detection work.

[0097] In this embodiment, an A mounting base limiting structure 754 is provided on the rail bottom flaw detection base 71. The A mounting base limiting structure 754 and the A cylinder 751 are located on the same side of the A mounting base 753, and the A mounting base limiting structure 754 is used to limit the maximum distance that the A mounting base 753 can move.

[0098] As Figure 10 shown, the A receiving structure 78 includes two A receiving vertical plates 781 provided on the A mounting base 753 and an A receiving probe mounting seat 782 provided between the two A receiving vertical plates 781. A number of A receiving probe mounting grooves 783 for mounting A receiving probes are provided on the A receiving probe mounting seat 782.

[0099] The A receiving probe mounting base 782 is used as the mounting foundation for the A receiving probe. The A receiving probe is installed in the A receiving probe mounting groove 783, which facilitates the control of the position accuracy such as the height of the A receiving probe and the distance to the rail 12, thereby contributing to improving the detection accuracy.

[0100] The height of the A receiving probe mounting groove 783 can be greater than the height of the A receiving probe, and the width of the A receiving probe mounting groove 783 can be greater than the width of the A receiving probe. In this way, the mounting angle of the A receiving probe can be adjusted within an appropriate range to facilitate controlling the direction of the A receiving probe to receive ultrasonic waves. At this time, corresponding fixing structures are required to keep the position of the A receiving probe fixed. For example, structures such as wedging blocks, pads, and screws are used to lock the A receiving probe. In this embodiment, threaded holes communicating with the A receiving probe mounting groove 783 are provided on the A receiving probe mounting base 782, and the A receiving probe is locked with screws. A gasket can also be provided between the A receiving probe and the screw to prevent the A receiving probe from being damaged by the screw.

[0101] An A receiving probe wear-resistant plate 784 is provided on one side of the A receiving probe mounting base 782 close to the rail 12, and an A receiving probe limiting plate 785 is provided on one side of the A receiving vertical plate 781 close to the rail 12; the A receiving probe mounting base 782 is movably connected to the A receiving vertical plate 781.

[0102] An A receiving probe wear-resistant plate 784 is provided on one side of the A receiving probe mounting base 782 close to the rail 12. During the detection process, the A receiving probe wear-resistant plate 784 is used to contact the rail 12 instead of the A receiving probe mounting base 782, thereby reducing wear and deformation and avoiding the change of the shape accuracy of the A receiving probe mounting base 782 from affecting the detection accuracy.

[0103] Affected by factors such as installation accuracy and machining accuracy, it may be difficult to ensure that the relative position between the rail 12 and the A receiving probe is in the best detection position. In this embodiment, the movable connection between the A receiving probe mounting base 782 and the A receiving vertical plate 781 is beneficial for the A receiving probe mounting base 782 to achieve adaptive adjustment, so that the A receiving probe wear-resistant plate 784 can fit on the outer side of the rail 12, avoiding a large gap between the rail 12 and the A receiving probe wear-resistant plate 784 from affecting the detection accuracy.

[0104] In this embodiment, the so-called movable connection means that the A receiving probe mounting base 782 can move relative to the A receiving vertical plate 781 along the direction close to or away from the rail 12, or the A receiving probe mounting base 782 can rotate relative to the A receiving vertical plate 781.

[0105] The use of two A receiving probe limiting plates 785 in contact with the rail 12 can limit the adjustable range of the A receiving probe mounting seat 782, preventing damage caused by the movement range of the A receiving probe mounting seat 782 relative to the A receiving vertical plate 781 exceeding the limit.

[0106] In this embodiment, a slider that can slide along the direction of approaching or departing from the rail 12 can be arranged on the A receiving vertical plate 781, and the A receiving probe mounting seat 782 is rotatably connected to the slider. In this way, the movable connection between the A receiving probe mounting seat 782 and the A receiving vertical plate 781 can be realized. Its specific structure and working principle are not the improvement points of this solution. Those skilled in the art can achieve the above effects according to the content recorded in this solution, and the specific manner and specific structure of the movable connection between the A receiving probe mounting seat 782 and the A receiving vertical plate 781 are not limited here.

[0107] As Figure 9 shown, in this embodiment, the A transmitting structure 76 is arranged on the A mounting bottom plate 753. As Figure 3 shown, the A transmitting structure 76 includes two A transmitting vertical plates 761 arranged on the A mounting bottom plate 753 and an A transmitting probe mounting seat 762 arranged between the two A transmitting vertical plates 761. A number of A transmitting probe mounting grooves 763 for mounting A transmitting probes are arranged on the A transmitting probe mounting seat 762.

[0108] An A transmitting probe wear-resistant plate 764 is arranged on the side of the A transmitting probe mounting seat 762 close to the rail 12, and an A transmitting probe limiting plate 765 is arranged on the side of the A transmitting vertical plate 761 close to the rail 12; the A transmitting probe mounting seat 762 is movably connected to the A transmitting vertical plate 761.

[0109] The A transmitting structure 76 is similar in structure to the A receiving structure 78, and the specific structure of the A transmitting structure 76 will not be elaborated here. The A cylinder 751 for driving the A transmitting structure 76 and the A receiving structure 78 is coaxial and perpendicular to the rail 12, which is beneficial to improving the control accuracy and avoiding the influence on the detection accuracy.

[0110] A water outlet hole penetrating the A transmitting probe mounting seat 762 is provided on the A transmitting probe mounting seat 762, and the axis of the water outlet hole points to the rail 12. Correspondingly, a through hole communicating with the water outlet hole is provided on the A transmitting probe wear-resistant plate 764. By connecting a water pipe to the water outlet hole, continuous drainage can be carried out through the water outlet hole to form a water flow between the A transmitting probe wear-resistant plate 764 and the rail 12 to facilitate the coupling agent required for ultrasonic flaw detection. Correspondingly, a water outlet hole can also be arranged on the A receiving probe mounting seat 782. An electromagnetic valve can be arranged on the water pipe, and the use of the electromagnetic valve is beneficial for realizing remote control.

[0111] As Figure 7 、Figure 11 As shown, on the basis of the above embodiments, in this embodiment, a flaw detection base lifting mechanism 72 is provided below the rail bottom flaw detection base 71, a flaw detection base mounting seat 73 is provided below the flaw detection base lifting mechanism 72, and the flaw detection base lifting mechanism 72 is drivingly connected to a flaw detection base driving structure 74. By driving the flaw detection base lifting mechanism 72 with the flaw detection base driving structure 74, the rail bottom flaw detection base 71 can be driven to move in the vertical direction to facilitate controlling the lifting of the rail bottom flaw detection base 71, so that after the rail 12 to be flaw detected is installed, the rail bottom flaw detection base 71 can be moved into place, avoiding the rail bottom flaw detection base 71 and the structures above it from affecting the installation of the rail 12.

[0112] In this embodiment, the flaw detection base lifting mechanism 72 includes four connecting rods distributed in pairs on opposite sides of the rail bottom flaw detection base 71. The four connecting rods are parallel to each other, and the two ends of the connecting rods are respectively hinged to the rail bottom flaw detection base 71 and the flaw detection base mounting seat 73. In this way, the movement of the rail bottom flaw detection base 71 can be driven by controlling the rotation of the connecting rods. Using the four connecting rods is beneficial to keeping the rail bottom flaw detection base 71 stable during movement and realizing parallel movement, avoiding the positional accuracy of the upper structure of the rail bottom flaw detection base 71 from being damaged due to deflection.

[0113] In this embodiment, the flaw detection base driving structure 74 adopts a cylinder. The cylinder body of the flaw detection base driving structure 74 is hinged to the flaw detection base mounting seat 73, the piston rod of the flaw detection base driving structure 74 is hinged to the rail bottom flaw detection base 71, and the flaw detection base driving structure 74 and the connecting rod are distributed in an X-cross shape.

[0114] As Figure 12 shown, on the basis of the above embodiments, in this embodiment, the rail bottom upper contour flaw detection structure 8 includes a B column 81 provided on the flaw detection walking platform 10, B mounting seats 87 provided on both sides of the B column 81, B probe mounting seats 88 provided on the B mounting seats 87, and a plurality of B probe mounting grooves 89 provided on the B probe mounting seats 88. The B probe mounting grooves 89 on the two B probe mounting seats 88 are symmetrically arranged on both sides of the B column 81.

[0115] When the rail needs to be detected, the rail is placed above the B probe mounting seat 88. The B probe mounting seat 88 is used to install an ultrasonic probe so that the ultrasonic probe is aligned with the bottom of the rail. During the detection process, the B probe mounting seat 88 is brought into contact with the rail, and the ultrasonic probe emits ultrasonic waves that pass through the bottom of the rail and receive the ultrasonic waves reflected from the upper contour of the rail bottom. The ultrasonic probe can be connected to an ultrasonic evaluation unit to facilitate sending the detected signal to the ultrasonic evaluation unit for processing. Driving this solution along the length direction of the rail can detect the specific part of the rail that needs to be detected.

[0116] The openings of the B-probe mounting grooves 89 on the B-probe mounting base 88 face in the same direction, but are different in the width direction. In this way, a single ultrasonic probe can detect specific parts, and using multiple ultrasonic probes can effectively cover the entire range of the upper contour of the rail base to avoid missed detections.

[0117] As Figure 28a shown, a plurality of flat-bottomed holes with different angles are made on the upper plane of the rail base and at the junction of the waist and the base on both sides of the rail 12, covering the entire upper plane of the rail base, representing different types of defects.

[0118] As Figure 28b 、 28c shown, the ultrasonic probes include group A and group B. Group A includes probes A1, A2, A3, A4, A5, A6, A7, and A8, and group B includes probes B1, B2, B3, B4, B5, B6, B7, and B8. The probes in group A and group B are symmetrically arranged. The ultrasonic probes adopt single-crystal channel probes, and each probe emits and receives by itself.

[0119] The B-probe mounting grooves 89 on the two B-probe mounting bases 88 are symmetrically arranged on both sides of the B-column 81. In this way, the directions of the ultrasonic waves emitted by the ultrasonic probes on both sides of the B-column 81 are also symmetric, and the ultrasonic waves emitted by the two groups of A and B probes are arranged in a staggered manner, so as to avoid missing detections of defects parallel to the ultrasonic wave direction.

[0120] In this embodiment, the structure for driving the integral movement of the B-column 81 and the B-mounting base 87 can achieve automation. Therefore, this solution is conducive to realizing automated detection to improve the detection efficiency. During the detection process, it can ensure that the position of the ultrasonic probe and the rail remains unchanged, which is conducive to improving the detection accuracy.

[0121] An anti-wear layer can be provided on the upper surface of the B-mounting base 87, so as to increase the strength of the upper surface of the B-mounting base 87 and avoid wear of the B-mounting base 87 caused by the relative movement between the B-mounting base 87 and the rail. This is conducive to ensuring the shape accuracy of the B-mounting base 87 and preventing the shape accuracy of the B-mounting base 87 from being damaged, resulting in a deterioration of the relative position accuracy between the ultrasonic probe and the rail.

[0122] A number of water outlet holes can be provided on the B-mounting base 87, and the water outlet holes are connected to a water source. During detection, water is supplied to the rail through the water outlet holes, and water is used as a couplant for detection. This can simplify the structure, avoid using an additional water supply structure, and the water supplied through the water outlet holes can be distributed between the B-mounting base 87 and the rail to meet the use requirements.

[0123] A plurality of protrusions can be provided on the upper surface of the B-mounting base 87, and the protrusions are in contact with the rail to form small gaps between the B-mounting base 87 and the rail for water flow.

[0124] Figure 12 、Figure 14 As shown, based on the above embodiment, in this embodiment, two B guide wheels 810 are rotatably mounted on the B mounting seat 87 and are respectively located on both sides of the rail. The axis of the B guide wheel 810 is parallel to the height direction of the rail, and the minimum spacing between the two B guide wheels 810 is equal to the bottom width of the rail.

[0125] The B guide wheel 810 can be clamped on both sides of the rail, so that when the B mounting seat 87 and the rail move relative to each other, the ultrasonic probe can always remain in the designed position, thereby avoiding affecting the detection accuracy.

[0126] On the basis of the above embodiment, in this embodiment, the B column 81 is provided with a B driving structure that is transmission-connected to the B mounting seat 87. The driving structure is mainly used to drive the B mounting seat 87 to move in the vertical direction relative to the rail, so as to avoid interference in the early installation process of the rail to be detected.

[0127] like Figure 12 , Figure 13 , Figure 14 As shown, the B driving structure includes a B active link 86 and a B driven link 85 arranged on both sides of the B mounting seat 87. The two ends of the B active link 86 are respectively hinged to the B column 81 and the B mounting seat 87, and the two ends of the B driven link 85 are respectively hinged to the B column 81 and the B mounting seat 87. The hinge points of the B active link 86 and the B driven link 85 are the four vertices of a parallelogram, and the upper surface of the B mounting seat 87 is horizontal. By driving the B active link 86 to rotate around the hinge point on the B column 81, the B mounting seat 87 can be driven to move. Since the hinge points of the B active link 86 and the B driven link 85 are the four vertices of a parallelogram, it can be ensured that the upper surface of the B mounting seat 87 always remains horizontal, thereby facilitating subsequent installation and use.

[0128] In this embodiment, the B column 81 is provided with a B limit baffle 811, and the B driven connecting rod 85 is provided with a B limit plate 812 used in conjunction with the B limit baffle 811. The B limit baffle 811 can hinder the movement of the B limit plate 812, thereby limiting the movable range of the B mounting seat 87. This prevents the B mounting seat 87 from colliding with the rail under the action of the driving force and being damaged.

[0129] Based on the above embodiments, in this embodiment, two B mounting plates 82 are respectively arranged on both sides of the B column 81. A B sliding rod 83 is arranged between the two B mounting plates 82. A B slider 84 is slidably arranged on the B sliding rod 83. The B driving connecting rod 86 and the B driven connecting rod 85 are respectively hinged to the B slider 84. In this way, the B mounting seat 87 can be moved along the B sliding rod 83 as needed to adjust the relative position between the B mounting seat 87 and the rail, so that the rail and the B guide wheel 810 can be aligned and installed.

[0130] In this embodiment, a spring sleeved on the B sliding rod 83 is arranged between the B mounting plate 82 and the B slider 84. The spring can play a certain limiting role and finely adjust the relative position between the B mounting seat 87 and the rail. After the detection structure, the B mounting seat 87 can be reset to avoid damage and deformation caused by collision between the B mounting seat 87, the B slider 84 and other structures.

[0131] In this embodiment, a round table surface with a diameter gradually decreasing from bottom to top is arranged at the top of the B guide wheel 810. The round table surface can play a guiding role. When the B guide wheel 810 contacts the rail, the round table surface of the B guide wheel 810 first contacts the rail. The force exerted by the rail on the B guide wheel 810 can compress the spring to adaptively adjust the relative position between the B mounting seat 87 and the rail, so that rapid adaptive adjustment can be realized.

[0132] The B guide wheel 810 can be hinged to the B mounting seat 87. A torsion spring is arranged between the B guide wheel 810 and the B mounting seat 87, which can enable the B guide wheel 810 to adaptively adjust the relative position between the B guide wheel 810 and the B mounting seat 87.

[0133] In this embodiment, a through hole for installing the B sliding rod 83 is arranged on the B mounting plate 82. An opening groove communicated with the through hole is arranged on the B mounting plate 82. A locking screw penetrating the opening groove is arranged on the B mounting plate 82. By arranging the opening groove, the parts on both sides of the opening groove of the B mounting plate 82 can be relatively squeezed and locked by the locking screw, which can increase the connection strength between the B sliding rod 83 and the B mounting plate 82 and prevent the B sliding rod 83 from loosening.

[0134] Based on the above embodiments, in this embodiment, a B connecting plate 813 is arranged below the B column 81. The B connecting plate 813 is used to facilitate connection with other structures.

[0135] Such as Figure 12 、 Figure 15As shown, based on the above embodiments, in this embodiment, two B brackets 881 are provided on the B mounting base 87, and the B probe mounting base 88 is arranged between the two B brackets 881, enabling the B probe mounting base 88 to be rotationally connected to the B brackets 881. After the B probe mounting base 88 contacts the rail, the angle between the B probe mounting base 88 and the rail can be adaptively adjusted.

[0136] The B probe mounting base 88 is slidably connected to the B brackets 881, and the sliding direction is perpendicular to the bottom of the rail. After the B probe mounting base 88 contacts the rail, the position of the B probe mounting base 88 relative to the rail can be adaptively adjusted.

[0137] A B bracket limit plate 882 is provided on the surface of the B bracket 881 close to the rail. After the B bracket limit plate 882 contacts the rail, the force exerted by the rail on the B probe mounting base 88 will no longer cause displacement of the B probe mounting base 88, thereby avoiding damage to the B probe mounting base 88 due to extrusion.

[0138] As Figure 16 shown, based on the above embodiments, in this embodiment, a rail bottom roller 9 is provided on the flaw detection walking platform 10. The rail bottom roller 9 includes a C mounting base 91 on the flaw detection walking platform 10, two C mounting supports 92 provided on the C mounting base 91, a C bottom plate 93 rotatably mounted between the two C mounting bases 91, a roller mounting seat 94 provided on the C bottom plate 93, and a C roller 95 hinged to the roller mounting seat 94. The axis of the C roller 95 is parallel to that of the C bottom plate 93.

[0139] When flaw detecting the rail, it is necessary to support both ends of the rail to make the middle part suspended for easy flaw detection. To avoid the rail from shaking or colliding during installation, the C roller 95 is used to support the rail to keep it stable, and the C bottom plate 93 is controlled to rotate downward as the rail descends, so that the C roller 95 always supports the rail until both ends of the rail are installed in place during the descent of the rail.

[0140] During the process of flaw detecting the rail, the C bottom plate 93 can be controlled to rotate downward to disengage the C roller 95 from the rail, or the C roller 95 can be kept in a state of supporting the rail, enabling the C roller 95 to move synchronously with the detection device. Thus, the middle part of the rail can be supported by the C roller 95 during the flaw detection process by the detection device, which is beneficial to increasing the stability of the rail, avoiding rail shaking, and also avoiding rail bending from affecting the flaw detection accuracy.

[0141] Based on the above embodiments, in this embodiment, a C drive structure 97 is provided between the C bottom plate 93 and the C mounting base 91. The C drive structure 97 facilitates controlling the rotation of the C bottom plate 93.

[0142] In this embodiment, the C driving structure 97 uses an airbag. By controlling the inflation of the airbag, the upward rotation of the C bottom plate 93 is controlled, and by controlling the deflation of the airbag, the downward rotation of the C bottom plate 93 is controlled. In this way, the rotation angle of the C bottom plate 93 can be adjusted flexibly, and since the airbag has the function of buffering and damping vibration, it can avoid the generation of vibration during the rotation of the C bottom plate 93 and prevent the C roller 95 from hitting the rail.

[0143] As Figure 16 、 Figure 17 shown, on the basis of the above embodiment, in this embodiment, a limiting structure for restricting the rotation angle of the C bottom plate 93 is provided on one side of the C mounting base 91 close to the free end of the C bottom plate 93. The limiting structure can be used to control the rotation angle of the C bottom plate 93 and avoid the rotation of the C bottom plate 93 exceeding the necessary range and affecting the flaw detection process.

[0144] In this embodiment, the limiting structure includes a C limiting bottom plate 98 provided on the C mounting base 91, a C limiting connecting plate 910 provided on the C limiting bottom plate 98, a C limiting top plate 911 provided on the C limiting connecting plate 910, a C bottom limiting stop 99 provided on the C limiting bottom plate 98, and a C top limiting stop 912 provided on the lower surface of the C limiting top plate 911.

[0145] The C top limiting stop 912 and the C bottom limiting stop 99 are respectively used to limit the range of the rotatable angle of the C bottom plate 93.

[0146] A C top limiting block 931 for cooperating with the C top limiting stop 912 is provided on the upper surface of the C bottom plate 93, and a C bottom limiting block 932 for cooperating with the C bottom limiting stop 99 is provided on the lower surface of the C bottom plate 93. In this embodiment, the C top limiting block 931 and the C bottom limiting block 932 can be made of soft materials such as rubber, so as to avoid generating large vibration or noise due to collision when the C bottom plate 93 moves to the limit position.

[0147] A screw is provided on the C top limiting block 931. By using the screw to be threadedly connected with the C limiting top plate 911, the height of the C top limiting block 931 can be adjusted as needed, so as to adjust the maximum height that the C bottom plate 93 can reach.

[0148] In this embodiment, reinforcing rib plates are provided between the C limiting connecting plate 910 and the C limiting bottom plate 98, and between the C limiting connecting plate 910 and the C limiting top plate 911. The reinforcing rib plates can be used to increase the strength and rigidity of the C limiting connecting plate 910 and the C limiting top plate 911, and avoid the change of the position and shape of the C limiting connecting plate 910 and the C limiting top plate 911 resulting in the change of the position of the C top limiting stop 912.

[0149] On the basis of the above embodiments, in this embodiment, a plurality of C reinforcing plates 933 perpendicular to the lower surface of the C bottom plate 93 are provided on the C bottom plate 93, and the C reinforcing plates 933 are hinged to the C mounting support 92. The C reinforcing plates 933 can increase the strength, rigidity and load-bearing capacity of the C bottom plate 93, which is beneficial to preventing the C bottom plate 93 from deforming under the action of external forces and affecting the position accuracy of the C roller 95, and avoiding affecting the position accuracy of the rail and the flaw detection accuracy.

[0150] On the basis of the above embodiments, in this embodiment, the C roller 95 is drivingly connected to a roller driving structure. The roller driving structure includes a C roller motor 96 and a speed reducer drivingly connected between the C roller motor 96 and the C roller 95.

[0151] By using the roller driving structure to drive the C roller 95 to rotate, and using the friction between the C roller 95 and the rail, the C roller 95 can move relative to the rail, so that the C mounting base 91 is connected to other structures such as the flaw detection structure, which can play an auxiliary traction role.

[0152] As Figure 2 、 Figure 3 shown, on the basis of the above embodiments, in this embodiment, an F top seat slide rail 61 parallel to the F base slide rail 13 is provided on the F top seat 6, an F top seat support seat 3 is slidably connected to the F top seat slide rail 61, and the upper flaw detection system is arranged on the F top seat support seat 3.

[0153] The F top seat slide rail 61 can play a guiding and limiting role for the F top seat support seat 3, which is beneficial to improving the position accuracy when the F top seat support seat 3 moves and ensuring the relative position accuracy between the probe and the rail 12.

[0154] An upper driving system drivingly connected to the F top seat support seat 3 can be arranged on the F top seat 6. Driving the F top seat support seat 3 to move along the F top seat slide rail 61 by using the upper driving system is beneficial to realizing remote automatic control. In this embodiment, the upper driving system includes a motor and a belt transmission chain. The motor drives the belt transmission chain, and the belt transmission chain then drives the F top seat support seat 3 to move along the F top seat slide rail 61.

[0155] As Figure 4 shown, in this embodiment, the top of the F top seat slide rail 61 is a cylindrical surface with a central angle greater than 180 degrees, and an inclined surface with a gradually increasing width downward is arranged below the cylindrical surface. An inward concave groove is formed between the cylindrical surface and the inclined surface, and a chute with the same profile as the F top seat slide rail 61 is arranged on the F top seat support seat 3. By using the chute and the F top seat slide rail 61 in cooperation, the rotation of the F top seat support seat 3 relative to the F top seat slide rail 61 can be restricted.

[0156] In this embodiment, the central angle of the cylindrical surface at the top of the F top seat slide rail 61 is 270°, and the inclined surface is inclined 45° compared to the vertical direction. The central angle of the cylindrical surface at the top of the F top seat slide rail 61 can also be 300°, and the inclined surface is inclined 30° compared to the vertical direction.

[0157] In this embodiment, the F top seat 6 is provided with two F limiting structures 62 located near the two ends of the F top seat slide rail 61. The F limiting structures 62 are used to limit the F top seat support seat 3 to prevent the F top seat support seat 3 from falling off the F top seat slide rail 61.

[0158] like Figure 18 , 19 As shown, on the basis of the above embodiments, in this embodiment, the rail head side flaw detection structure 4 includes a D mounting bracket 41 arranged on the F top seat support seat 3, a D cylinder 43 arranged on the D mounting bracket 41 with the piston rod facing downward, a D movable bracket 44 drivingly connected to the piston rod of the D cylinder 43, and three groups of D detection structures arranged on the D movable bracket 44, each group of D detection structures includes two D probe mounting brackets 47 located on both sides of the rail and at the same height, and the three groups of D detection structures have D probe mounting brackets 47 of different heights.

[0159] When it is necessary to detect the flaws of the rail, the rail is transferred and positioned under the scheme, and the scheme is driven to move downward until the rail is located between the same group of D probe mounting brackets 47, and the flaw detection is performed using the probe in the D probe mounting bracket 47. The rail and the D probe mounting bracket 47 are moved relative to each other, so that a certain section of the rail can be detected within the range of motion. The scheme is conducive to realizing braked flaw detection, and can ensure that the distance between the probe and the rail remains unchanged, thereby helping to improve the efficiency and accuracy of flaw detection.

[0160] Since the rail head is relatively high and cannot be covered by a single ultrasonic probe, this solution uses three groups of D detection structures with different heights, which enable three groups of probes with different heights to perform flaw detection on the rail head in three layers respectively. There is repeated coverage among the three groups of probes, which can improve the efficiency of flaw detection.

[0161] like Figure 27a As shown, a plurality of transverse holes are made at different height positions on the side of the rail head of the rail 12, and a plurality of vertical holes are made in different width directions on the rail head tread. The transverse holes and the vertical holes represent different types of defects and are arranged alternately in the overall rail head.

[0162] like Figure 27b , 27cAs shown, A1, A2, A3, A4, A5, and A6 form a group. A1, A2, A3 and A4, A5, A6 are respectively located on both sides of the rail 12. A1, A2, A3 obliquely emit ultrasonic waves in a direction inclined to the length direction of the rail 12 in the horizontal plane. The ultrasonic waves emitted by A1 are received by A1, A4, A5, and A6 respectively due to reflection by defects. The ultrasonic waves emitted by A2 are received by A2, A4, A5, and A6 respectively due to reflection by defects. The ultrasonic waves emitted by A3 are received by A3, A4, A5, and A6 respectively due to reflection by defects.

[0163] B1, B2, B3, B4, B5, and B6 form a group. B1, B2, B3 and B4, B5, B6 are respectively located on both sides of the rail 12. B1, B2, B3 obliquely emit ultrasonic waves in a direction inclined to the length direction of the rail 12 in the horizontal plane. The ultrasonic waves emitted by B1 are received by B1, B4, B5, and B6 respectively due to reflection by defects. The ultrasonic waves emitted by B2 are received by B2, B4, B5, and B6 respectively due to reflection by defects. The ultrasonic waves emitted by B3 are received by B3, B4, B5, and B6 respectively due to reflection by defects.

[0164] C1, C2, C3, C4, C5, and C6 form a group. C1, C2, C3 and C4, C5, C6 are respectively located on both sides of the rail 12. C1, C2, C3 obliquely emit ultrasonic waves in a direction inclined to the length direction of the rail 12 in the horizontal plane. The ultrasonic waves emitted by C1 are received by C1, C4, C5, and C6 respectively due to reflection by defects. The ultrasonic waves emitted by C2 are received by C2, C4, C5, and C6 respectively due to reflection by defects. The ultrasonic waves emitted by C3 are received by C3, C4, C5, and C6 respectively due to reflection by defects.

[0165] In this embodiment, two D slide rails 45 can be arranged on the D mounting bracket 41, which are respectively located on both sides of the D cylinder 43, so that the D movable bracket 44 is slidably connected to the D slide rails 45, which is beneficial to improving the moving accuracy and stability of the D movable bracket 44.

[0166] As Figure 19 、 Figure 20 shown, on the basis of the above embodiment, in this embodiment, a D mounting plate 46 is arranged below the D movable bracket 44. One end of the D mounting plate 46 is hinged to the D movable bracket 44, and a D adjusting cylinder 410 is arranged between the other end of the D mounting plate 46 and the D movable bracket 44. The piston rod of the D adjusting cylinder 410 is hinged to the D mounting plate 46, and the cylinder body of the D adjusting cylinder 410 is hinged to the D movable bracket 44; the D detection structure is arranged on the lower surface of the D mounting plate 46.

[0167] Due to factors such as machining errors and assembly errors, there may be some inclination between the rail and this solution, causing the D mounting plate 46 to be hinged to the D movable bracket 44. Then, by using the D adjustment cylinder 410, the angle of the D mounting plate 46 can be changed, thereby adjusting the angle between the probe and the rail to make the positional relationship between the probe and the rail meet the requirements during flaw detection.

[0168] As Figure 18 , Figure 19 , Figure 20 shown, in this embodiment, a D roller mounting seat 48 is provided on the lower surface of the D mounting plate 46 and is located between the same group of D probe mounting brackets 47. A D roller 49 that can be in rolling connection with the rail is rotatably mounted on the D roller mounting seat 48.

[0169] During flaw detection, when the D roller 49 is in contact with the rail, it can play a positioning role to ensure that the height position between the probe and the rail meets the requirements of flaw detection. During continuous flaw detection of the rail, when there is a relative displacement between the probe and the rail, the D roller 49 can play a guiding and limiting role to keep the position of the probe stable. Moreover, the friction is rolling friction, which is beneficial to reducing wear, reducing the noise generated by the friction between the wear-resistant plate and the rail head tread, and maintaining stable flaw detection.

[0170] Based on the above embodiment, in this embodiment, a D probe adjustment cylinder for driving the D probe mounting bracket 47 to move closer to or away from the rail is provided on the D mounting plate 46. Before flaw detection, in order to avoid interference, the D probe adjustment cylinder is used to drive the D probe mounting bracket 47 to move in a direction away from the rail, increasing the distance between the same group of D probe mounting brackets 47, so as to avoid collision during the downward movement of the D probe mounting bracket 47. After the rail comes into contact with the D roller 49, the D probe adjustment cylinder is then used to drive the D probe mounting bracket 47 to move in a direction close to the rail, so as to adjust the distance between the probe and the rail and avoid the distance between the probe and the rail being too large and affecting the accuracy of flaw detection.

[0171] As Figure 19 shown, based on the above embodiment, in this embodiment, two D cylinder mounting seats 42 are provided on the D mounting bracket 41. The D cylinder 43 is rotatably mounted between the two D cylinder mounting seats 42, and the piston rod of the D cylinder 43 is hinged to the D movable bracket 44.

[0172] When there are factors such as installation error and processing error, there may be a certain deviation between the piston rod axis of the D cylinder 43 and the moving direction of the D movable bracket 44. The D cylinder 43 is rotatably installed between the two D cylinder mounting seats 42, and the piston rod of the D cylinder 43 is hinged to the D movable bracket 44. When the piston rod of the D cylinder 43 is extended, the position of the D cylinder 43 can be adaptively adjusted, so that the piston rod axis of the D cylinder 43 and the moving direction of the D movable bracket 44 are consistent to avoid interference.

[0173] In this embodiment, two D adjusting springs are connected between the D mounting bracket 41 and the D movable bracket 44, which are respectively located on both sides of the D cylinder 43. In this embodiment, the D adjusting spring can be used to keep the D movable bracket 44 stable during the movement of the D movable bracket 44, so that the probe and other structures under the D movable bracket 44 can be kept stable to avoid affecting the flaw detection accuracy.

[0174] like Figure 20 As shown, in this embodiment, two D cylinders 43 are provided on opposite sides of the D mounting bracket 41. The two D cylinders 43 are used to synchronously drive the D movable bracket 44, which is beneficial to improve the stability and position accuracy of the D movable bracket 44 and prevent the probe from tilting relative to the rail.

[0175] In this embodiment, the D mounting bracket 41 is provided with a D limiting structure 411 for limiting the position of the D roller mounting support 48. The D limiting structure 411 is used to control the movement range of the D movable bracket 44 to prevent the structure from being damaged by impact.

[0176] like Figure 21 As shown, based on the above embodiment, in this embodiment, the D probe mounting bracket 47 comprises a D probe mounting base plate 471, two D probe mounting vertical plates 473 arranged on the lower surface of the D probe mounting base plate 471, and a D probe mounting seat 472 installed between the two D probe mounting vertical plates 473, and a D probe mounting slot 474 is arranged in the D probe mounting seat 472. The D probe mounting slot 474 is a through slot, and the opening points to the rail. In the same group of D flaw detection structures, the D probe mounting slot 474 in one D probe mounting bracket 47 is installed with an ultrasonic transmitting probe, and the other D probe mounting slot 474 is installed with an ultrasonic receiving probe. The ultrasonic wave emitted by the ultrasonic transmitting probe is inclined with respect to the length direction of the rail.

[0177] In this embodiment, the D-probe mounting base 472 is movably connected to the D-probe mounting vertical plate 473. The movable connection includes one or more of rotational connection and sliding connection. By movably connecting the D-probe mounting base 472 to the D-probe mounting vertical plate 473, after the D-probe mounting base 472 contacts the rail and receives the reaction force from the rail, the relative position between the D-probe mounting base 472 and the rail can be adaptively adjusted under the action of the reaction force, so as to ensure that the D-probe mounting base 472 can fit the rail, which is beneficial to improving the accuracy of flaw detection.

[0178] Water outlet holes can be provided on the D-probe mounting base 472 to connect the water outlet holes to a water source. During flaw detection, water is supplied between the rail and the D-probe mounting base 472 through the water outlet holes, and water is used as the coupling agent required for flaw detection. Protrusions that contact the rail can be provided on the D-probe mounting base 472. By using the protrusions to contact the rail, a small gap is formed between the D-probe mounting base 472 and the rail for water to flow through.

[0179] Based on the above embodiment, in this embodiment, a D-mounting bracket connection structure 412 is provided on the D-mounting bracket 41. The D-mounting bracket connection structure 412 uses a flange, which facilitates connection with other structures by using the D-mounting bracket connection structure 412. In this embodiment, the D-mounting bracket connection structure 412 is connected to the motor through a transmission chain. Driven by the motor, the D-mounting bracket 41 can be driven to rotate, so that the position of the probe can be changed. After the probe completes the flaw detection work on the rail in one direction, the probe is driven to rotate 180° by rotating the D-mounting bracket 41, and then the rail is flaw detected in the reverse direction by using the probe, which can improve the accuracy of flaw detection and avoid missed detection.

[0180] In this embodiment, a motor is provided on the F-top seat support 3, and a transmission chain is provided between the motor and the D-mounting bracket connection structure 412, so that the motor can be used to drive the D-mounting bracket connection structure 412 to rotate.

[0181] Such as Figure 22 、 Figure 23As shown, on the basis of the above embodiments, in this embodiment, the rail upper flaw detection structure 5 includes an E mounting bracket 51 arranged on the F top seat support seat 3, an E cylinder 52 arranged on the E mounting bracket 51 and with the piston rod facing downward, an E movable bracket 54 drivingly connected to the piston rod of the E cylinder 52, an E probe mounting bracket 56 arranged below the E movable bracket 54, and an E probe mounting seat arranged in the E probe mounting bracket 56; the E probe mounting seat includes a rail waist probe mounting seat 561 and / or a lower jaw probe mounting seat 562, a plurality of rail waist probes for emitting ultrasonic waves downward are installed in the rail waist probe mounting seat 561, and the rail waist probes are distributed along the same straight line, and a plurality of lower jaw probes for emitting ultrasonic waves downward are installed in the lower jaw probe mounting seat 562, and the lower jaw probes are inclined to the length direction of the rail and the inclination angle of each lower jaw probe is different.

[0182] When it is necessary to inspect the rail, the rail is installed under the E probe mounting seat, and the waist probe mounting seat 561 is aligned with the waist of the rail to facilitate inspection of the waist, or the lower jaw probe mounting seat 562 is aligned with the lower jaw on one side of the rail to facilitate inspection of the lower jaw. In this embodiment, an ultrasonic probe is used to emit ultrasonic waves for inspection.

[0183] like Figure 26a As shown, multiple transverse holes are made at different heights on the side of the rail 12 in the vertical length direction and multiple flat-bottom holes are made on the section parallel to the length direction of the rail. The two types of holes represent different types of defects and are arranged alternately in height to cover the entire rail section.

[0184] like Figure 26b As shown, nine probes T1, T2, T3, R4, R5, R6, R7, R8, and T9 are installed in the rail waist probe mounting seat 561. The nine probes are arranged along the length direction of the rail 12 and aligned with the rail waist. T1, T2, and T3 emit ultrasonic waves within the rail waist along a direction inclined to the vertical direction.

[0185] like Figure 26c As shown, the ultrasonic wave emitted by the T1 probe is reflected by the defect and received by the T1, R4, R5, R6, R7, and R8 probes respectively.

[0186] The ultrasonic wave emitted by T2 probe is reflected by the defect and received by T2, R4, R5, R6, R7 and R8 probes respectively.

[0187] The ultrasonic waves emitted by the T3 probe are reflected by the defects and received by the T3, R4, R5, R6, R7 and R8 probes respectively.

[0188] T9 uses a dual-crystal focusing 0° probe to emit and receive ultrasonic waves within the rail waist along the vertical direction.

[0189] likeFigure 29a As shown, multiple flat bottom holes perpendicular to the plane of the lower jaw are made on both sides of the lower jaw of the rail head of the rail 12, and the multiple flat bottom holes are inclined at different angles to the axis of the rail. Multiple defects at different positions are distributed throughout the lower jaw.

[0190] like Figure 29b , 29c As shown, the mandibular probe includes group A and group B. Group A includes three ultrasonic single crystal channel probes A1, A2, and A3, and group B includes three ultrasonic single crystal channel probes B1, B2, and B3. The mandibular probe is self-transmitting and self-receiving.

[0191] This solution is connected with a track sliding parallel to the rail, which is conducive to realizing automatic control. It can realize automatic control of the E probe mounting seat to move along the length direction of the rail to perform flaw detection within the required range, and is conducive to maintaining the relative position of the probe and the rail stable, so as to improve the efficiency and accuracy of flaw detection.

[0192] The E cylinder 52 can be used to drive the E movable bracket 54 to move up and down to adjust the distance between the probe and the rail, so that during the installation of the rail, the E probe mounting bracket 56 and other structures can be prevented from interfering with the installation of the rail. The E probe mounting bracket 56 can also be remotely controlled to move up and down for easy operation.

[0193] In this embodiment, the top of the E-mounting bracket 51 is provided with an E-connecting structure 510 that can be connected to other structures. The E-connecting structure 510 can be used to connect the rotating shaft, and the E-mounting bracket 51 is driven by the rotating shaft to rotate 180 degrees as a whole. After the E-mounting bracket 51 drives the probe to detect along the length direction of the rail, the E-mounting bracket 51 is rotated, and the E-mounting bracket 51 is driven to drive the probe to move in the direction to detect the rail again, which is conducive to avoiding missed detection.

[0194] In this embodiment, the E connection structure 510 adopts a flange, a motor is arranged on the F top seat support seat 3, and a transmission chain is arranged between the motor and the E connection structure 510, so that the motor can be used to drive the E mounting bracket 51 to rotate.

[0195] On the basis of the above embodiments, in this embodiment, two E cylinders 52 are arranged on the same side of the E mounting bracket 51, and each E cylinder 52 is independently connected to an E movable bracket 54, wherein a waist probe mounting seat 561 is arranged in one of the E probe mounting brackets 56, and a chin probe mounting seat 562 is arranged in the other E probe mounting bracket 56.

[0196] In this way, two sets of detection equipment can be installed on the same E mounting bracket 51, so that the flaw detection of the rail waist and the flaw detection of the lower jaw can be carried out simultaneously, which is beneficial to reducing the space occupied by the structure, reducing the production cost of the equipment, and improving the efficiency of flaw detection.

[0197] In this embodiment, two E cylinders 52 can be symmetrically arranged on opposite sides of the E mounting bracket 51 and connected to an E movable bracket 54 at the same time, so that both opposite sides of the E movable bracket 54 can be supported, which is beneficial to improving the stability and position accuracy of the E movable bracket 54.

[0198] Based on the above embodiment, in this embodiment, the E probe mounting base is movably connected to the E probe mounting bracket 56. When detecting the rail for flaws, it is necessary to make the E probe mounting base contact the rail. However, due to factors such as machining errors and assembly errors, it is difficult for the E probe mounting base to completely fit the rail and there is a certain deviation, resulting in a reduction in flaw detection accuracy. Making the E probe mounting base movably connected to the E probe mounting bracket 56 can utilize the active adaptive adjustment of the E probe mounting base to eliminate unnecessary deviations between the E probe mounting base and the rail, thereby ensuring the relative position accuracy between the probe and the rail and avoiding the influence on flaw detection accuracy.

[0199] In this embodiment, the movable connection includes a rotational connection and / or a sliding connection in the vertical direction.

[0200] Making the E probe mounting base rotatably connected to the E probe mounting bracket 56 can automatically adjust the angle between the E probe mounting base and the rail after the E probe mounting base contacts the rail and receives the reaction force from the rail.

[0201] Making the E probe mounting base slidably connected to the E probe mounting bracket 56 can automatically adjust the position between the E probe mounting base and the rail after the E probe mounting base contacts the rail and receives the reaction force from the rail.

[0202] In this embodiment, both ends of the web probe mounting base 561 are movably connected to the E probe mounting bracket 56 through linear bearings, and the front and rear ends of the jaw probe mounting base 562 are movably connected to the E probe mounting bracket 56 through linear bearings.

[0203] This can meet the requirements for the forward and backward movement and rotation of the web probe mounting base 561 and the jaw probe mounting base 562.

[0204] Linear bearings are arranged in the front and rear directions between the web probe box 561 and the rail head jaw 562, and the probe box can move in the direction parallel to the axis of the linear bearing.

[0205] Based on the above embodiment, in this embodiment, a water outlet hole is provided on the E probe mounting base, and the water outlet hole is connected to a water source, so that water can be supplied outward from the water outlet hole during the flaw detection process as the coupling agent required for flaw detection. Small protrusions can be provided on the surface of the E probe mounting base that contacts the rail to leave a required gap between the E probe mounting base and the rail for the circulation of water.

[0206] Based on the above embodiments, in this embodiment, an E slide rail 58 parallel to the piston rod of the E cylinder 52 is provided on the E mounting bracket 51, and the E movable bracket 54 is slidably connected to the E slide rail 58.

[0207] The E slide rail 58 can play a role in guiding and limiting the movement of the E movable bracket 54, which is beneficial to improving the stability of the E movable bracket 54, avoiding shaking during its movement, and preventing the relative position accuracy between the probe and the rail from being affected.

[0208] In this embodiment, E cylinder mounting seats 53 are provided on the E mounting bracket 51 on both sides of the E cylinder 52. The E cylinder 52 is hinged to the E cylinder mounting seats 53, and the piston rod of the E cylinder 52 is hinged to the E movable bracket 54.

[0209] Due to factors such as machining errors, assembly errors, and wear, there may be a certain deviation between the moving direction of the piston rod of the E cylinder 52 and the length direction of the E slide rail 58, resulting in an interference phenomenon. Hinging the E cylinder 52 to the E cylinder mounting seats 53 and hinging the piston rod of the E cylinder 52 to the E movable bracket 54 can adaptively adjust the position and angle of the E cylinder 52 during the movement of the piston rod of the E cylinder 52, so as to ensure that the moving direction of the piston rod of the E cylinder 52 is always consistent with the length direction of the E slide rail 58, thereby avoiding unnecessary vibration and wear.

[0210] In this embodiment, E springs are provided on both sides of the E cylinder 52 and are connected between the E movable bracket 54 and the E mounting bracket 51. The E springs can improve the stability of the E movable bracket 54 and are beneficial to keeping the position accuracy of the E movable bracket 54.

[0211] An E limit structure 57 for limiting the lowest position of the E movable bracket 54 is provided on the E mounting bracket 51. The E limit structure 57 includes an L-shaped support plate and a limit block provided on the support plate. The limit block is located directly below the E movable bracket 54. When the E movable bracket 54 descends to contact the limit block, the E movable bracket 54 can no longer move downward, which is beneficial to protecting structures such as the E probe mounting seat below and avoiding damage due to pressure.

[0212] Based on the above embodiments, in this embodiment, two E guide wheels 59 that can be in rolling connection with the rail are provided on both sides of the E probe mounting seat, and the rotation center of the E guide wheels 59 is vertically arranged.

[0213] The E guide wheels 59 can play a role in clamping the rail, can limit the relative position between the E probe mounting seat and the rail to remain unchanged, and thus is beneficial to keeping the relative position between the probe and the rail unchanged.

[0214] Position the E guide wheel 59 at the outer end of the E probe mounting base. When two E probe mounting brackets 56 are mounted on the E mounting bracket 51, four E guide wheels 59 are formed under the E probe mounting base, and the probe is located within the range surrounded by the four E guide wheels 59, which is conducive to keeping all probes in a relatively stable position relative to the rail and avoiding affecting the flaw detection accuracy.

[0215] In this embodiment, the lower end of the E guide wheel 59 is a conical surface with a gradually decreasing diameter downward.

[0216] As Figure 24 shown, two guide wheel limit plates 591 are provided at one end of the E probe mounting bracket 56 close to the E guide wheel 59. Open slots 592 that are open outward and horizontal are formed in the guide wheel limit plates 591, and the openings of the two open slots 592 face in opposite directions. The guide wheel limit plates 591 and the end of the E probe mounting bracket 56 form a U-shaped structure. An adjusting plate 594 located between the guide wheel limit plates 591 and the E probe mounting bracket 56 is provided at one end of the E probe mounting base close to the guide wheel limit plates 591. Guide wheel limit blocks 593 that can slide in the open slots 592 are respectively provided on the adjusting plate 594. If the rail is not aligned with the E probe mounting base, when the E probe mounting bracket 56 moves downward until the E guide wheel 59 contacts the rail, the conical surface on the E guide wheel 59 first contacts the rail and receives the reaction force of the rail. Under the action of the reaction force, the E probe mounting base moves along the length direction of the open slot 592 for adaptive adjustment until the rail can enter the position between the two E guide wheels 59. Making the opening directions of the two open slots 592 opposite can use the cooperation between the guide wheel limit blocks 593 and the open slots 592 for mutual limitation to prevent the guide wheel limit blocks 593 from disengaging from the open slots 592, thereby avoiding the detachment of the E probe mounting base. In this embodiment, mounting shafts are provided on both sides of the E probe mounting base, the E guide wheels 59 are slidably arranged on the mounting shafts, springs sleeved on the mounting shafts are provided between the E guide wheels 59 and the E probe mounting base, and a limiting structure for limiting the E guide wheels 59 is provided at the end of the mounting shaft. This can enable the distance between the E guide wheels 59 and the E probe mounting base to be adjusted, which is conducive to keeping the center of the E probe mounting base consistent with the rail, thereby ensuring the flaw detection accuracy.

[0217] An adjusting shaft penetrating the E probe mounting base is provided at the end of the E probe mounting bracket 56 opposite to the guide wheel limit plate 591. The E probe mounting base is slidably connected to the adjusting shaft, and a spring sleeved on the adjusting shaft is provided between the E probe mounting base and the E probe mounting bracket 56. The springs are used in cooperation with the E guide wheels 59 to facilitate the auxiliary adjustment of the position of the E probe mounting base, enabling the two ends of the E probe mounting base to be adjusted synchronously to ensure the relative position accuracy between the probe and the rail.

[0218] Based on the above embodiments, in this embodiment, one end of the E movable bracket 54 along the length direction of the rail is hinged to the E probe mounting bracket 56, and an E guide shaft 55 slidably connected to the E probe mounting bracket 56 is provided at the other end of the E movable bracket 54. A compression spring sleeved on the E guide shaft 55 is provided between the E movable bracket 54 and the E probe mounting bracket 56.

[0219] Due to factors such as machining errors, assembly errors, and wear, there is a certain angular deviation between the E probe mounting base and the upper surface of the rail, resulting in the inability of the E probe mounting base to fit the rail. One end of the E movable bracket 54 is hinged to the E probe mounting bracket 56, and the other end of the E movable bracket 54 is slidably connected to the E probe mounting bracket 56. After the E probe mounting bracket 56 contacts the rail, the position of the E probe mounting bracket 56 can be adaptively adjusted, so that the E probe mounting bracket 56 can fit the rail, facilitating the fitting of the E probe mounting base to the rail, which is beneficial to ensuring the accuracy of flaw detection. The compression spring can apply a pressing force to the E probe mounting bracket 56, so that during the relative movement between the E probe mounting bracket 56 and the rail, the E probe mounting bracket 56 always remains in contact with the rail, ensuring that the relative position accuracy between the E probe mounting base and the rail is not damaged.

[0220] As Figure 3 shown, based on the above embodiments, in this embodiment, two F top seat slide rails 61 are provided. One is provided on the upper surface of the F top seat 6, and the other is provided on the side surface of the F top seat 6. Using the two F top seat slide rails 61 can enhance the load-bearing capacity of the F top seat slide rails 61.

[0221] In this embodiment, since the upper detection system is located on one side of the F top seat support 3, the center of gravity of the F top seat support 3 does not fall on the F top seat 6, causing the F top seat support 3 equipped with the upper detection system to have a tendency to rotate. The F top seat slide rail 61 located on the upper surface of the F top seat 6 can also limit the rotation tendency of the F top seat support 3 and enhance the stability of the F top seat support 3.

[0222] In this embodiment, the other un-described content is the same as that of the above embodiments, so it will not be repeated.

[0223] The above is only a preferred embodiment of the present invention, and does not impose any form of limitation on the present invention. Any simple modification or equivalent change made to the above embodiments based on the technical essence of the present invention falls within the protection scope of the present invention.

Claims

1. A full-section flaw detection device for the weld seam of the rail welding joint at the rail welding base, Characterized in that: It includes an F base (1), a lower flaw detection system slidably arranged on the F base (1), two support columns (11) arranged on the F base (1), an F top seat (6) arranged on the support columns (11), and an upper flaw detection system slidably arranged on the F top seat (6). The sliding direction of the upper flaw detection system is parallel to the sliding direction of the lower flaw detection system. The lower flaw detection system includes a rail bottom side flaw detection structure (7) and a rail bottom upper contour flaw detection structure (8), and the upper flaw detection system includes a rail head side flaw detection structure (4) and a rail upper part flaw detection structure (5); Two parallel F base slide rails (13) are arranged in the F base (1), and a flaw detection walking platform (10) is slidably connected to the F base slide rails (13). The flaw detection walking platform (10) is drivingly connected to a bottom driving system; The lower flaw detection system is arranged on the flaw detection walking platform (10); The rail bottom side flaw detection structure (7) includes a rail bottom flaw detection base (71) located below the rail (12) and arranged on the flaw detection walking platform (10), two A emission structures (76) arranged on the rail bottom flaw detection base (71), and two A receiving structures (78) arranged on the rail bottom flaw detection base (71). The A emission structures (76) and the A receiving structures (78) are in one-to-one correspondence and are respectively arranged on both sides of the rail (12); The A emission structure (76) includes an A emission probe whose emitted A ultrasonic wave is inclined to the length direction of the rail (12), and the A receiving structure (78) includes several A receiving probes for receiving the A ultrasonic wave. The direction in which the A receiving probe receives the A ultrasonic wave is perpendicular to the emission direction of the A ultrasonic wave; The directions in which the two A transmitting probes emit ultrasonic waves are not parallel; the rail bottom upper contour flaw detection structure (8) comprises a B column (81) arranged on the flaw detection walking platform (10), a B mounting seat (87) arranged on both sides of the B column (81), a B probe mounting seat (88) arranged on the B mounting seat (87), and a plurality of B probe mounting grooves (89) arranged on the B probe mounting seat (88), and the B probe mounting grooves (89) on the two B probe mounting seats (88) are symmetrically arranged on both sides of the B column (81); the F top seat (6) is provided with an F top seat slide rail (61) parallel to the F base slide rail (13), the F top seat slide rail (61) is slidably connected to the F top seat support seat (3), and the upper flaw detection system is arranged on the F top seat support seat (3); the rail head side flaw detection structure (4) comprises a D mounting seat arranged on the F top seat support seat (3); A mounting bracket (41), a D cylinder (43) disposed on the D mounting bracket (41) and with its piston rod facing downward, a D movable bracket (44) drivingly connected to the piston rod of the D cylinder (43), and three groups of D detection structures disposed on the D movable brackets (44), each group of D detection structures comprising two D probe mounting brackets (47) located on both sides of the rail and at the same height, and the three groups of D detection structures comprising D probe mounting brackets (47) of different heights; the rail upper flaw detection structure (5) comprising an E mounting bracket (51) disposed on an F top support seat (3), an E cylinder (52) disposed on the E mounting bracket (51) and with its piston rod facing downward, an E movable bracket (54) drivingly connected to the piston rod of the E cylinder (52), an E probe mounting bracket (56) disposed below the E movable bracket (54), and an E probe mounting seat disposed in the E probe mounting bracket (56); The E probe mounting seat comprises a rail waist probe mounting seat (561) and / or a lower jaw probe mounting seat (562), wherein a plurality of rail waist probes for emitting ultrasonic waves downward are mounted in the rail waist probe mounting seat (561), and the rail waist probes are distributed along the same straight line, and a plurality of lower jaw probes for emitting ultrasonic waves downward are mounted in the lower jaw probe mounting seat (562), and the lower jaw probes are arranged to be inclined with respect to the length direction of the rail, and each lower jaw probe has a different inclination angle; Two E cylinders (52) are arranged on the same side of the E mounting bracket (51), and each E cylinder (52) is independently connected to an E movable bracket (54) by transmission, wherein a waist probe mounting seat (561) is arranged in one of the E probe mounting brackets (56), and a chin probe mounting seat (562) is arranged in the other E probe mounting bracket (56).

2. A full-section flaw detection device for weld seams of welded rail base rail joints according to claim 1, Features: A rail bottom supporting roller (9) is arranged on the flaw detection walking platform (10). The rail bottom supporting roller (9) comprises a C-shaped mounting base (91) arranged on the flaw detection walking platform (10), two C-shaped mounting supports (92) arranged on the C-shaped mounting base (91), a C-shaped bottom plate (93) rotatably mounted between the two C-shaped mounting bases (91), a roller mounting seat (94) arranged on the C-shaped bottom plate (93), and a C-shaped roller (95) hinged to the roller mounting seat (94). The rotating shaft of the C-shaped roller (95) is parallel to the C-shaped bottom plate (93).

3. The full-section flaw detection device for the weld seam of the rail welding joint in the rail welding base according to claim 1, characterized in that: There are two F-shaped top seat supporting seats (3), one of which is arranged on the upper surface of the F-shaped top seat (6), and the other is arranged on the side surface of the F-shaped top seat (6).

4. A full-section flaw detection method for the weld seam of the rail welding joint in the rail welding base, characterized in that: The full-section flaw detection device according to any one of claims 1-3 is used to detect the rail (12). The rail bottom side flaw detection structure (7) is used to detect the rail bottom side of the rail (12), the rail bottom upper contour flaw detection structure (8) is used to detect the rail bottom upper contour of the rail (12), the rail head side flaw detection structure (4) is used to detect the rail head side of the rail (12), and the rail upper part flaw detection structure (5) is used to detect the rail web and the lower jaw of the rail head of the rail (12); wherein the rail bottom side flaw detection structure (7) and the rail bottom upper contour flaw detection structure (8) are bidirectional structures, and the ultrasonic beam propagates in the front and back directions of the flaw detection movement, and the flaw detection is completed by one scan. The rail head side flaw detection structure (4) and the upper part flaw detection structure (5) are unidirectional structures, and the ultrasonic beam propagates in the forward direction of the flaw detection movement. After the forward flaw detection is completed, the rail head side flaw detection structure (4) and the upper part flaw detection structure (5) rotate 180° for reverse flaw detection.

Images