Chip Open / Short Circuit Test Device

Abstract

The present disclosure provides a chip open / short circuit test device. The device includes: a switch switching module (1) connected to N pins to be tested of a chip (6), where N is an integer greater than 1; a control module (2) connected to the switch switching module (1) to control the switch switching module (1) to sequentially connect the N pins to be tested; a constant current source module (3) connected to the switch switching module (1) to provide a test current for the pin to be tested connected by the switch switching module (1). By using the switch switching module to sequentially connect the pins to be tested of the chip for open / short circuit testing, the test flexibility is improved, and the open / short circuit testing of all pins can be automatically realized, reducing the manual operation cost.

Description

Technical Field

[0001] The present disclosure relates to the technical field of chip testing, and specifically, to a chip open - short circuit testing device. Background Art

[0002] In the field of chip testing, open - short circuit testing is a necessary test item. Open - short circuit testing is used to detect whether there is a short circuit or an open circuit between each pin of the chip and other pins, power supply, or ground. Usually, each pin of the chip is connected to the power supply VDD through a pull - up diode and to the ground VSS through a pull - down diode, and the open - short circuit testing of the chip pins is realized by testing the pull - up diode and the pull - down diode. In the related art, the testing device can only manually move the chip to test other pins after testing one pin, and the testing process is cumbersome. Therefore, how to automatically perform the open - short circuit testing of all pins of the chip is a problem that current researchers are concerned about. Summary of the Invention

[0003] In view of the above problems, the present disclosure provides a chip open - short circuit testing device, which uses a switch - switching module to sequentially connect the pins to be tested of the chip for open - short circuit testing, improves the testing flexibility, and can automatically perform the open - short circuit testing of all pins, reducing the manual operation cost.

[0004] The present disclosure provides a chip open - short circuit testing device, which includes: a switch - switching module 1 connected to N pins to be tested of the chip, where N is an integer greater than 1; a control module 2 connected to the switch - switching module 1, controlling the switch - switching module 1 to sequentially connect the N pins to be tested; a constant - current source module 3 connected to the switch - switching module 1, providing a test current for the pin to be tested connected by the switch - switching module 1.

[0005] Optionally, the switch - switching module 1 includes a first switching module 11 and a second switching module 12. The control module 2 controls the first switching module 11 to sequentially connect the pull - up diodes connected to the N pins to be tested, and the control module 2 controls the second switching module 12 to sequentially connect the pull - down diodes connected to the N pins to be tested.

[0006] Optionally, the first switching module 11 is provided with a first reference circuit 11A, and the first reference circuit 11A provides a reference voltage for the open - short circuit testing of the pull - up diode; and / or, the second switching module 12 is provided with a second reference circuit 12A, and the second reference circuit 12A provides a reference voltage for the open - short circuit testing of the pull - down diode.

[0007] Optionally, the three pins of the first switching module 11 are respectively disconnected, grounded, and connected to the anode of the diode D1, and the cathode of the diode D1 is grounded to form the first reference circuit 11A; the three pins of the second switching module 12 are respectively disconnected, grounded, and connected to the cathode of the diode D2, and the anode of the diode D2 is grounded to form the second reference circuit 12A.

[0008] Optionally, the switch switching module 1 is provided with a third reference circuit 13, and the third reference circuit 13 provides a reference voltage for the open - short circuit test of the pull - up diode and the pull - down diode connected to the N pins to be measured.

[0009] Optionally, the four pins of the switch switching module 1 are respectively disconnected, grounded, connected to the cathode of the diode D3, and connected to the anode of the diode D4, and the anode of the diode D3 and the cathode of the diode D4 are grounded.

[0010] Optionally, the control module 2 is further configured to generate an open - short circuit test result of the chip according to the voltage of the pin to be measured connected by the switch switching module 1 and the reference voltage.

[0011] Optionally, the device further includes: an analog - to - digital conversion module 4, connected to the switch switching module 1 and the control module 2, to convert the analog quantity of the voltage of the pin to be measured connected by the switch switching module 1 into a digital quantity and send it to the control module 2.

[0012] Optionally, the device further includes: a display module 5, connected to the control module 2, to display the open - short circuit test result.

[0013] Optionally, the control module 2 is connected to the constant current source module 3 to control the magnitude and direction of the test current output by the constant current source module 3. Description of the Drawings

[0014] Figure 1 Schematically shows a structural block diagram of a chip open - short circuit test device provided according to an embodiment of the present disclosure;

[0015] Figure 2 Schematically shows a structural block diagram of a switch switching module in a chip open - short circuit test device provided according to an embodiment of the present disclosure;

[0016] Figure 3 Schematically shows a structural block diagram of a switch switching module in a chip open - short circuit test device provided according to another embodiment of the present disclosure.

[0017] Description of the Reference Numerals:

[0018] 1-switch switching module; 11-first switching module; 11A-first reference circuit; 12-second switching module; 12A-second reference circuit; 13-third reference circuit; 2-control module; 3-constant current source module; 4-analog-to-digital conversion module; 5-display module; 6-chip. DETAILED DESCRIPTION

[0019] In order to make the objectives, technical solutions and advantages of the present disclosure more clearly understood, the present disclosure is further described in detail below in combination with specific embodiments and with reference to the accompanying drawings.

[0020] Figure 1 The structure block diagram of the chip open-short circuit test device provided according to the embodiment of the present disclosure is schematically shown. Figure 1 , while combining Figures 2 - 3 , the chip open and short circuit testing device in this embodiment is described in detail.

[0021] See also Figure 1 The chip open-short circuit testing device includes a switch switching module 1, a control module 2, a constant current source module 3, an analog-to-digital conversion module 4 and a display module 5.

[0022] The switch module 1 is connected to N pins to be tested of the chip 6, where N is an integer greater than 1. Figure 2 and Figure 3 The N pins to be tested of chip 6 are pins B1, B2, ..., B N , the pins A1, A2, ..., A of the switch switching module 1 N Connect to the pins B1, B2, ..., B of chip 6 respectively N . Pins A1, A2, ..., A N With pins B1, B2, ..., B N There is a one-to-one correspondence between them.

[0023] The control module 2 is connected to the switch switching module 1, and controls the switch switching module 1 to sequentially connect the N pins to be tested of the chip 6. Figure 2 and Figure 3 The switch module 1 is provided with m selection pins C1, C2, ..., C m , to achieve 2 m Select one of the data selector functions, 2 m ≥ N. Control module 2 changes the selection pins C1, C2, ..., C m The level of the pins A1, A2, ..., A N A pin in n , 1≤n≤N, so that the pin A that is connected n Connect the pin B to be tested n In connected state.

[0024] The output end of the constant current source module 3 is connected to the switch switching module 1, which is the pin B to be tested that is connected to the switch switching module 1. n The constant current source module 3 is also connected to the control module 2, which controls the magnitude and direction of the test current output by the constant current source module 3, that is, controls the current flowing into the pin B to be tested of the chip 6. n For details, see Figure 2 and Figure 3 , when testing pin B n The pull-up diode in the pin B n When the diode between the test pin B and the power supply VDD is connected, the control module 2 controls the test current output by the constant current source module 3 to be a forward current; when the test pin B n The pull-down diode in the test pin B n When the test current output by the constant current source module 3 is a diode between the pull-up diode and the ground VSS), the control module 2 controls the test current output by the constant current source module 3 to be a reverse current; the control module 2 also controls the magnitude of the test current output by the constant current source module 3 to change the driving capability of the pull-up diode and the pull-down diode. It can be understood that when the chip is open-circuited and short-circuited, the chip is not powered on, and the power supply VDD is 0V.

[0025] The analog-to-digital conversion module 4 is connected to the switch module 1 and the control module 2 to switch the pin B to be tested connected to the switch module 1. n The analog value of the voltage is converted into a digital value, and the converted digital value is sent to the control module 2. The control module 2 switches the pin B to be tested according to the switch module 1. n The voltage of the chip 6 generates the open-short circuit test result, and the open-short circuit test result includes the test result of each pin to be tested in the chip 6. n Take the pull-up diode as an example. If the pin B to be tested is n The voltage of the pin B is within the normal range, indicating that the pull-up diode is in normal condition. n The voltage of the pin B tends to 0V, indicating that the pull-up diode is short-circuited. n If the voltage is greater than a preset value, it means that the pull-up diode is open. The preset value is, for example, 3V.

[0026] The display module 5 is connected to the control module 2 and is used to display the open-short circuit test result generated by the control module 2. The display module 5 can display, for example, "The pin B1 to be tested is normal", "The pull-up diode of the pin B2 to be tested is open", etc.

[0027] In one embodiment of the present disclosure, the switch module 1 is provided with a third reference circuit 13, such as Figure 2As shown, the third reference circuit 13 provides a reference voltage for the open - short circuit test of the pull - up diodes and pull - down diodes connected to N pins to be measured. At this time, the switch - switching module 1 consists of only one 2 m - to - 1 data selector. Specifically, referring to Figure 2 , the pin S1 of the switch - switching module 1 is connected to the cathode of the diode D3, the pin S2 is connected to the anode of the diode D4, the pin S3 is grounded, the pin S4 is disconnected, the anode of the diode D3 is grounded, and the cathode of the diode D4 is grounded. Thus, the voltages of the pins S1, S2, S3, and S4 are measured by the analog - to - digital conversion module 4 as the reference voltages for the chip open - short circuit test. The voltage of the pin S1 is used as the reference voltage for the normal operation of the pull - down diode, the voltage of the pin S2 is used as the reference voltage for the normal operation of the pull - up diode, the voltage of the pin S3 is used as the short - circuit reference voltage for the pull - up diode and the pull - down diode, and the voltage of the pin S4 is used as the open - circuit reference voltage for the pull - up diode and the pull - down diode. When other components (such as the constant - current source module 3) in the chip open - short circuit test device cannot work properly, the reference voltage is combined with the voltage of the pin to be measured to determine whether the chip open - short circuit test is qualified, avoiding misjudgment and improving the reliability and accuracy of the chip open - short circuit test.

[0028] When the switch - switching module 1 is provided with the third reference circuit 13, the m selection pins C1, C2, ……, C m of the switch - switching module 1 are used to connect to one of the pins A1, A2, ……, A N , the pin S1, S2, S3, and S4. The m selection pins C1, C2, ……, C m can implement the function of a 2 m - to - 1 data selector. At this time, 2 m ≥N + 4.

[0029] In another embodiment of the present disclosure, the switch - switching module 1 includes a first switching module 11 and a second switching module 12. The control module 2 controls the first switching module 11 to sequentially connect the pull - up diodes connected to N pins to be measured, and the control module 2 controls the second switching module 12 to sequentially connect the pull - down diodes connected to N pins to be measured. At this time, the switch - switching module 1 consists of two 2 m - to - 1 data selectors (i.e., the first switching module 11 and the second switching module 12). The first switching module 11 is provided with a first reference circuit 11A, and the first reference circuit 11A provides a reference voltage for the open - short circuit test of the pull - up diodes; the second switching module 12 is provided with a second reference circuit 12A, and the second reference circuit 12A provides a reference voltage for the open - short circuit test of the pull - down diodes. Referring to Figure 3, the pin S1 of the first switching module 11 is connected to the anode of the diode D1, the pin S2 of the first switching module 11 is grounded, the pin S3 of the first switching module 11 is disconnected, and the cathode of the diode D1 is grounded to form the first reference circuit 11A; the pin S1 of the second switching module 12 is connected to the cathode of the diode D2, the pin S2 of the second switching module 12 is grounded, the pin S3 of the second switching module 12 is disconnected, and the anode of the diode D2 is grounded to form the second reference circuit 12A. Specifically, when testing the pull-up diode in the test chip 6, the control module 2 controls a pin A in the first switching module 11 n to be turned on, so that the turned-on pin A n is connected to the pin B to be tested n to be in the on state, and controls the constant current source module 3 to output a forward current. Then, the control module 2 generates the open / short circuit test result of the pull-up diode on the pin B to be tested according to the reference voltage of the first reference circuit 11A and the voltage of the pin B to be tested n ; when testing the pull-down diode in the test chip 6, the control module 2 controls a pin A in the second switching module 12 n n to be turned on, so that the turned-on pin A n is connected to the pin B to be tested n to be in the on state, and controls the constant current source module 3 to output a reverse current. Then, the control module 2 generates the open / short circuit test result of the pull-down diode on the pin B to be tested according to the reference voltage of the second reference circuit 12A and the voltage of the pin B to be tested n ; n When the switch switching module 1 includes the first switching module 11 and the second switching module 12, and the first switching module 11 is provided with the first reference circuit 11A and the second switching module 12 is provided with the second reference circuit 12A, m selection pins C1, C2,..., C in the first switching module 11 and the second switching module 12

[0030] are used to turn on one of its pins A1, A2,..., A m , pin S1, S2, S3. The m selection pins C1, C2,..., C N can implement the function of a 2 m -to-1 data selector. At this time, 2 m ≥ N + 3. m The control module 2 is further configured to generate the open / short circuit test result of the chip 6 according to the voltage of the pin to be tested connected by the switch switching module 1 and the reference voltage.

[0031] Figure 3 ​​Taking the chip open - short circuit test device shown as an example, when testing the pull - up diode of the pin to be tested, if the voltage of pin S1 in the first reference circuit 11A is within the normal range, the voltage of pin S2 is 0V, and the voltage of pin S3 is greater than a preset value, for example, the preset value is 3V, the device works normally, and then the open - short circuit test result of chip 6 is generated according to the voltage of the pin to be tested; otherwise, the device does not work properly. When testing the pull - down diode of the pin to be tested, if the voltage of pin S1 in the second reference circuit 12A is within the normal range, the voltage of pin S2 is 0V, and the voltage of pin S3 is greater than a preset value, for example, the preset value is 3V, the device works normally, and then the open - short circuit test result of chip 6 is generated according to the voltage of the pin to be tested; otherwise, the device does not work properly.

[0032] In this embodiment, when the chip open - short circuit test device works, first, the control module 2 initializes the switch - switching module 1, the analog - to - digital conversion module 4, and the display module 5. Secondly, it enters the reference - circuit self - check stage. Specifically, taking Figure 2 the switch - switching module 1 shown as an example to illustrate the self - check process, the control module 2 controls the switch - switching module 1 to select pins S1, S2, S3, and S4, and correspondingly controls the direction of the test current output by the constant - current source module 3, and sequentially tests the voltages of the selected pins S1, S2, S3, and S4. When the voltages of pins S1 and S2 are within the normal range, the voltage of pin S3 is 0, and the voltage of pin S4 is greater than the preset value of 3V, it indicates that the chip open - short circuit test device works normally and the chip open - short circuit test can be carried out; otherwise, it indicates that the chip open - short circuit test device does not work properly and the chip open - short circuit test cannot be carried out. Then, when the chip open - short circuit test device works normally, the control constant - current source module 3 outputs a reverse test current, and controls the switch - switching module 1 to connect the pins to be tested of chip 6 one by one. After the pull - down diodes of all pins are tested, the control constant - current source module 3 outputs a forward test current, and controls the switch - switching module 1 to connect the pins to be tested of chip 6 one by one to complete the pull - up diode test of all pins.

[0033] In the embodiments of the present disclosure, the switch - switching module in the chip open - short circuit test device is used to sequentially connect the pins to be tested of the chip to perform the open - short circuit test, which improves the test flexibility and can automatically realize the open - short circuit test of all pins, reducing the manual operation cost; it also uses the reference circuit to provide a reference voltage for the chip open - short circuit test, preventing the chip open - short circuit test from being incorrect due to device failure and improving the test stability.

[0034] Although the present disclosure has been shown and described with reference to specific exemplary embodiments thereof, those skilled in the art should understand that various changes in form and detail may be made therein without departing from the spirit and scope of the present disclosure as defined by the appended claims and their equivalents. Accordingly, the scope of the present disclosure should not be limited to the above-described embodiments, but should be determined not only by the appended claims but also by the equivalents of the appended claims.

Claims

1. A chip open - short circuit test device, characterized in that, The device includes: A switch switching module (1) connected to N pins to be measured of a chip (6), where N is an integer greater than 1; A control module (2) connected to the switch switching module (1) to control the switch switching module (1) to sequentially connect the N pins to be measured; A constant current source module (3) connected to the switch switching module (1) to provide a test current for the pin to be measured connected by the switch switching module (1); Wherein, the switch switching module (1) includes a first switching module (11) and a second switching module (12); The first switching module (11) is provided with a first reference circuit (11A), and / or, the second switching module (12) is provided with a second reference circuit (12A); Three pins of the first switching module (11) are respectively disconnected, grounded, and connected to the anode of a diode D1, and the cathode of the diode D1 is grounded to form the first reference circuit (11A); three pins of the second switching module (12) are respectively disconnected, grounded, and connected to the cathode of a diode D2, and the anode of the diode D2 is grounded to form the second reference circuit (12A).

2. The chip open / short circuit test device according to claim 1, wherein The control module (2) controls the first switching module (11) to sequentially connect the pull-up diodes connected to the N pins to be measured, and the control module (2) controls the second switching module (12) to sequentially connect the pull-down diodes connected to the N pins to be measured.

3. The chip open / short circuit test device according to claim 2, wherein The first reference circuit (11A) provides a reference voltage for the open / short circuit test of the pull-up diode; the second reference circuit (12A) provides a reference voltage for the open / short circuit test of the pull-down diode.

4. The chip open / short circuit test device according to claim 1, wherein The switch switching module (1) is provided with a third reference circuit (13), and the third reference circuit (13) provides a reference voltage for the open / short circuit test of the pull-up diodes and pull-down diodes connected to the N pins to be measured.

5. The chip open / short circuit test device according to claim 4, characterized in that, Four pins of the switch switching module (1) are respectively disconnected, grounded, connected to the cathode of a diode D3, and connected to the anode of a diode D4, and the anode of the diode D3 and the cathode of the diode D4 are grounded.

6. The chip open / short circuit test device according to any one of claims 3-5, characterized in that The control module (2) is further configured to generate an open / short circuit test result of the chip (6) according to the voltage of the pin to be measured connected by the switch switching module (1) and the reference voltage.

7. The chip open / short circuit test device according to claim 6, wherein The device further includes: An analog-to-digital conversion module (4) connected to the switch switching module (1) and the control module (2) to convert the analog quantity of the voltage of the pin to be measured connected by the switch switching module (1) into a digital quantity and send it to the control module (2).

8. The chip open - short circuit test device according to claim 6, characterized in that, The device further includes: A display module (5) connected to the control module (2) to display the open / short circuit test result.

9. The chip open-short circuit test device according to claim 1, characterized in that, The control module (2) is connected to the constant current source module (3) to control the magnitude and direction of the test current output by the constant current source module (3).

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