A fast testing device and method for saturation magnetization intensity of ferrite single crystal resonator

Abstract

The invention discloses a device for quickly testing the saturation magnetization intensity of a ferrite single crystal resonator, belonging to the field of microwave component testing. The device comprises a sample rod (1), a resonator (2), an analog signal generator (3), a field sweeping power supply (4) and an oscilloscope (5); wherein the sample rod (1) is placed in the resonator (2); the resonator (2) is connected to the analog signal generator (3) and the field sweeping power supply (4) via a data line respectively; the field sweeping power supply (4) is connected to the oscilloscope (5) via a data line. The invention also discloses a method for quickly testing the saturation magnetization intensity of a ferrite single crystal resonator using the device; the invention can quickly test the saturation magnetization intensity of a sample within 30 seconds, has good test accuracy, can meet the needs of batch product sorting test, is conducive to improving test and work efficiency, and has strong practical value.

Description

Technical Field

[0001] The invention relates to the field of microwave component testing, and in particular to a device and method for quickly testing the saturation magnetization intensity of a ferrite single crystal resonator. Background Art

[0002] With the rapid development and widespread application of microwave magnetic devices, rapid testing of the main microwave characteristic parameters of magnetic material products is indispensable.

[0003] Microwave ferrite single crystal resonators are the core materials of YIG magnetic tuning devices. YIG devices realized using microwave ferrite single crystal sphere resonators have important applications in high-end testing instruments and equipment such as 5G communications, electronic countermeasures technology, and spectrum analyzers.

[0004] At present, the saturation magnetization performance test of microwave ferrite single crystal materials is carried out according to the national military standard GJB4410-2002, and the measurement is completed by the ring balance method or the vibrating sample measurement method.

[0005] These existing testing methods have the following problems:

[0006] (1) The test time is long: the ring balance method or vibrating sample magnetometer generally takes 3-5 minutes to measure the saturation magnetization intensity;

[0007] (2) There are certain requirements for the size of the test sample: it is difficult to obtain a suitable signal-to-noise ratio for a spherical sample with a low saturation magnetization intensity and a diameter less than 1 mm. The actual test error can reach ±50 Gs, which is far beyond the general requirement of YIG devices for the saturation magnetization intensity deviation of the resonator (≤±25 Gs);

[0008] (3) Difficulty in achieving batch testing: The sizes of commonly used ferrite single crystal resonator products are mainly concentrated in the range of 0.2-0.7mm. The existing testing methods cannot meet the requirements of full inspection of batch products of tens of thousands of small ball resonators. Summary of the invention

[0009] One of the purposes of the present invention is to provide a device for quickly testing the saturation magnetization intensity of a ferrite single crystal resonator to solve the above-mentioned problem.

[0010] In order to achieve the above-mentioned purpose, the technical solution adopted by the present invention is as follows: a ferrite single crystal resonator saturation magnetization intensity rapid testing device, including a sample rod for supporting a sample, a resonator, an analog signal generator, a sweeping field power supply and an oscilloscope; wherein the sample rod is placed in the resonator, and the resonator is connected to the analog signal generator and the sweeping field power supply through data lines respectively; the sweeping field power supply is connected to the oscilloscope through the data line.

[0011] In the above structure, the resonator, analog signal generator, sweep power supply and oscilloscope are all existing known instruments. For example, the resonator can adopt the DZD-68 band-stop filter of the 9th Institute of China Electronics Technology; the sweep power supply can adopt the BUP-500W220S5 / 100 constant current source of Xi'an Pop Power Supply Co., Ltd., the analog signal generator can adopt the E8257D of Agilent, and the oscilloscope can adopt the DSO07052A of Agilent.

[0012] As a preferred technical solution: the portion of the sample rod that is connected to the sample ball to be tested is made of high-temperature resistant ceramic material.

[0013] As a preferred technical solution: the resonator is a YIG single-stage band-stop filter.

[0014] The second object of the present invention is to provide a method for quickly testing the saturation magnetization intensity of a ferrite single crystal resonator using the above-mentioned device, comprising the following steps:

[0015] S1: Turn on the resonator, analog signal generator, sweep power supply and oscilloscope power supply, preheat for 10 minutes, then adjust the output frequency of the analog signal generator, use the standard ball for calibration, and determine the distance grid number K1 between the main mode of the standard ball and the ferrite mode;

[0016] S2: The sample ball to be tested is glued with a sample rod and then inserted into the resonator to determine the distance grid number K2 between the

[110] main mode and the

[210] higher-order static magnetomode of the sample ball to be tested;

[0017] S3: According to the formula The saturation magnetization intensity of the sample to be tested is calculated. In the above formula, 4πMs1 is the saturation magnetization intensity of the standard sphere, and 4πMs2 is the saturation magnetization intensity of the sample sphere to be tested.

[0018] As a preferred technical solution: the standard ball is a pure YIG single crystal ball.

[0019] As a preferred technical solution: the sample ball to be tested is a microwave ferrite single crystal material, and its shape is a sphere with a diameter of 0.20-1.5 mm.

[0020] The testing device and method of the present invention are based on the following principle: under the combined action of a constant magnetic field and an alternating magnetic field, the magnetic moment in a ferrite single crystal ball will precess; the magnetization intensity in the ferromagnetic sample has a uniform and consistent precession with the same amplitude and phase at different points in space, which is the "main mode" of ferromagnetic resonance; however, the magnetization intensity at different points in space has a non-uniform precession with different amplitudes and phases. For a single crystal ball whose size is much smaller than the wavelength, due to thermal agitation and macroscopic and microscopic inhomogeneities, the magnetic moment will precess non-uniformly. This non-uniform precession mode is called a higher-order magnetostatic mode; when the sample resonates, the spatial distance between the

[210] higher-order magnetostatic mode and the

[110] main mode is only proportional to the magnetic moment, that is: Δ∝4πMs.

[0021] The present invention uses the distance between the

[110] main mode and the

[210] higher-order static magnetomode to characterize the saturation magnetization intensity of the small spherical resonator.

[0022] By using the device and method of the present invention, the test frequency range that can be achieved is 0.5-15 GHz, and the test frequency can be adjusted according to the application frequency of the resonator.

[0023] Compared with the prior art, the advantages of the present invention are: the present invention can quickly test the saturation magnetization intensity of the sample within 30 seconds, the test accuracy is good, it can meet the needs of batch product sorting testing, it is beneficial to improve the test and work efficiency, and it has strong practical value. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a structural diagram of the testing device of the present invention;

[0025] In the figure: 1. Sample rod; 2. Resonator; 3. Analog signal generator; 4. Sweep field power supply; 5. Oscilloscope. DETAILED DESCRIPTION

[0026] The present invention will be further described below in conjunction with the accompanying drawings.

[0027] Embodiment 1:

[0028] See also Figure 1 A device for quickly testing the saturation magnetization intensity of a ferrite single crystal resonator comprises a sample rod 1 (for supporting a sample), a resonator 2 (providing a resonance environment and acting as a sample cavity), an analog signal generator 3 (providing a test frequency), a sweeping field power supply 4 (providing a sweeping current) and an oscilloscope 5 (displaying a resonance curve); wherein the sample rod 1 is placed in the resonator 2, and the resonator 2 is respectively connected to the analog signal generator 3 and the sweeping field power supply 4 through data lines; and the sweeping field power supply 4 is connected to the oscilloscope 5 through data lines.

[0029] Example 2

[0030] As described in Example 1 and Figure 1 The ferrite single crystal resonator saturation magnetization intensity rapid test device shown in the figure performs a 200Gs single crystal resonator saturation magnetization intensity rapid sorting test, and the specific steps are as follows:

[0031] Turn on the power of each test instrument and preheat for 10 minutes; adjust the output frequency of the analog signal generator 3, use a pure YIG standard sample ball for calibration, and obtain the distance grid number K1 between the main mode

[110] and the higher-order static magneto mode

[210] of the standard ball; stick the 200Gs sample ball to be tested, that is, the single crystal resonator, with the sample rod 1 and insert it into the resonator 2. The resonator of this embodiment is a YIG band-stop filter, and obtain the distance grid number K2 between the main mode

[110] and the higher-order static magneto mode

[210] of the sample to be tested; according to the formula The saturation magnetization intensity of the spherical single crystal resonator of the sample to be tested is obtained by conversion;

[0032] In order to verify the accuracy of the test, 200Gs ferrite single crystal material was processed into 1.50mm single crystal resonators (10 pieces) and tested using VSM (vibrating sample magnetometer) and the test device of the present invention. The test data are shown in Table 1.

[0033] Table 1200Gs single crystal resonator test data

[0034]

[0035] The test results in Table 1 show that the deviation between the saturation magnetization data measured by the test device of the present invention and the VSM test data is ≤±6Gs, indicating that the test accuracy of the device of the present invention is good; the test of 10 samples takes 4 minutes for the device of the present invention and about 50 minutes for the VSM device, indicating that the test efficiency of the device of the present invention is significantly improved.

[0036] Example 3: Testing of single crystal resonators with medium and low saturation magnetization

[0037] In such Figure 1 The ferrite single crystal resonator saturation magnetization intensity rapid test device shown in the figure performs a 1500Gs single crystal resonator saturation magnetization intensity rapid sorting test, and the specific steps are as follows:

[0038] Turn on the power of each test instrument and preheat for 10 minutes; adjust the output frequency of the analog signal generator 3, use a pure YIG standard sample ball for calibration, and obtain the distance grid number K1 between the main mode

[110] and the higher-order static magneto mode

[210] of the standard ball; stick the 1500Gs sample ball to be tested, that is, the single crystal resonator, with the sample rod 1 and insert it into the resonator 2. The resonator of this embodiment is a YIG band-stop filter, and obtain the distance grid number K2 between the main mode

[110] and the higher-order static magneto mode

[210] of the sample to be tested; according to the formula The saturation magnetization intensity of the spherical single crystal resonator of the sample to be tested is obtained by conversion;

[0039] In order to verify the accuracy of the test, 1500Gs ferrite single crystal material was processed into 1.0mm single crystal resonators (10 pieces) and tested using VSM and the test device of the present invention respectively. The test data are shown in Table 2.

[0040] Table 21500Gs single crystal resonator test data

[0041]

[0042]

[0043] The test results in Table 2 show that the deviation between the saturation magnetization data measured by the test device of the present invention and the VSM test data is ≤±8Gs, indicating that the test accuracy of the device of the present invention is good; the test of 10 samples takes 5 minutes for the device of the present invention and about 50 minutes for the VSM device, indicating that the test efficiency of the device of the present invention is significantly improved.

[0044] Example 4: High and low saturation magnetization single crystal resonator test

[0045] In such Figure 1 The ferrite single crystal resonator saturation magnetization intensity rapid test device shown in the figure performs a 5200Gs single crystal resonator saturation magnetization intensity rapid sorting test, and the specific steps are as follows:

[0046] Turn on the power of each test instrument and preheat for 10 minutes; adjust the output frequency of the analog signal generator 3, use a pure YIG standard sample ball for calibration, and obtain the distance grid number K1 between the main mode

[110] and the higher-order static magneto mode

[210] of the standard ball; stick the 5200Gs sample ball to be tested, that is, the single crystal resonator, with the sample rod 1 and insert it into the resonator 2. The resonator of this embodiment is a YIG band-stop filter, and obtain the distance grid number K2 between the main mode

[110] and the higher-order static magneto mode

[210] of the sample to be tested; according to the formula The saturation magnetization intensity of the spherical single crystal resonator of the sample to be tested is obtained by conversion;

[0047] In order to verify the accuracy of the test, 5200Gs ferrite single crystal material was processed into 0.5mm single crystal resonators (10 pieces) and tested by VSM and the test device of the present invention. The test data are shown in Table 3.

[0048] Table 35200Gs single crystal resonator test data

[0049]

[0050]

[0051] The test results in Table 4 show that the deviation between the saturation magnetization data measured by the test device of the present invention and the VSM test data is ≤±15Gs, indicating that the test accuracy of the device of the present invention is good; the test of 10 samples takes 5 minutes for the device of the present invention and about 60 minutes for the VSM device, indicating that the test efficiency of the device of the present invention is significantly improved.

[0052] In order to prove the technical improvement of the present invention, the inventor of the present application conducted corresponding comparative experiments.

[0053] Comparative Example 1: Comparative test of small size (<Φ1mm) low saturation magnetization single crystal resonator

[0054] Use respectively Figure 1 The ferrite single crystal resonator saturation magnetization fast test device and VSM test device shown in the figure tested the saturation magnetization of 10 small size (Φ0.6mm) low saturation magnetization (200Gs) single crystal resonators. The test data are shown in Table 4.

[0055] Table 4 Φ0.6mm, 200Gs single crystal resonator comparison test data

[0056]

[0057]

[0058] The test results in Table 4 show that the deviation of the saturation magnetization obtained by the VSM test is about ±50Gs; the deviation of the saturation magnetization data measured by the test device of the present invention is about ±20Gs. Combined with the data of Example 2, it is shown that the present invention is significantly superior to the VSM device in the accuracy of the saturation magnetization test of a small-sized (<Φ1mm) low saturation magnetization single crystal resonator.

[0059] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A ferrite single crystal resonator saturation magnetization intensity rapid test device, characterized in that: The invention comprises a sample rod (1), a resonator (2), an analog signal generator (3), a field sweeping power supply (4) and an oscilloscope (5); wherein the sample rod (1) is placed in the resonator (2); the resonator (2) is connected to the analog signal generator (3) and the field sweeping power supply (4) via data lines respectively; and the field sweeping power supply (4) is connected to the oscilloscope (5) via the data line; The portion of the sample rod (1) that is connected to the sample ball to be tested is made of high temperature resistant ceramic material; The resonator (2) is a YIG single-stage band-stop filter.

2. A method for rapidly testing the saturation magnetization intensity of a ferrite single crystal resonator using the device described in claim 1, characterized in that: The following steps are involved: S1: Turn on the power of the resonator (2), the analog signal generator (3), the sweeping power supply (4) and the oscilloscope (5), preheat them, then adjust the output frequency of the analog signal generator (3), calibrate using a standard ball, and determine the distance grid number K1 between the standard ball [110] main mode and the [210] higher-order static magneto mode; S2: The sample ball to be tested is glued with the sample rod (1) and then inserted into the resonator (2), and the distance grid number K2 between the main mode [110] and the higher-order static magneto mode [210] of the sample ball to be tested is determined; S3: According to the formula The saturation magnetization intensity of the sample to be tested is calculated. In the above formula, 4πMs1 is the saturation magnetization intensity of the standard sphere, and 4πMs2 is the saturation magnetization intensity of the sample sphere to be tested.

3. The method according to claim 2, characterized in that: The standard ball is a pure YIG single crystal ball.

4. The method according to claim 2, characterized in that: The sample ball to be tested is a microwave ferrite single crystal material, and is in the shape of a sphere with a diameter of 0.20-1.5 mm.

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