Device, measuring system and measuring arrangement and method for testing a device

Abstract

An apparatus configured for wireless communication in a wireless communication network, comprising: a wireless interface configured for wireless communication; and a controller configured to control a beam pattern of the wireless interface and at least one communication parameter of the wireless interface. The apparatus is configured to receive a lock signal indicating a request for locking at least a portion of the beam pattern and at least one communication parameter. The controller is configured to lock at least a portion of the beam and at least one communication parameter in response to the lock signal.

Description

Technical Field

[0001] The present invention relates to a device to be tested (e.g. in view of its wireless operation), a measurement system and a method for testing a device. The present invention also relates to a measurement setup. The present invention also relates to beam pattern property locking, beam pattern locking, beam locking, power locking and MCS locking, i.e. the functionality of a test interface serving over-the-air (OTA) testing. Background Art

[0002] The ISO open systems interconnection standard [1], which is conceived with a layered model, has been adopted in various computer and telecommunication systems, including those widely referred to as 4G, beyond 4G, 5G and beyond 5G systems. Using this model, the circuitry required to implement the raw data transmission and reception functions over the physical medium (the radio transceiver and its associated antenna system) is located in the so-called physical layer (PHY). Therefore, the parameters used in the PHY layer control the manner in which the radio transceiver and its antenna system operate. During normal operation, these parameters are automatically controlled to ensure that the communication system performs according to the standards determined by the so-called higher layers.

[0003] Beam locking was discussed extensively by 3GPP RAN WG4 and has been the subject of recent consensus regarding its requirements (although the details have not yet been discussed in 3GPP RAN WG5). Beam locking refers to locking, freezing or maintaining unchanged a beam pattern formed by a device to be tested (i.e., a device under test), where such a beam pattern can be used for transmission from the device (i.e., a transmit beam) and / or for reception with the device (i.e., for a receive beam).

[0004] Therefore, there is a need to enhance the measurement of the device. Summary of the invention

[0005] It is an object of the present invention to enhance the measurement of a device.

[0006] The inventors have found that for test and measurement purposes using beam locking, the changes within the beam caused by the automatic control of communication parameters (e.g., transmit power) make the measurement of the radiation behavior of the device inaccurate. The inventors have also found that by locking such communication parameters together with the beam, accurate measurements can be obtained. Therefore, by locking the communication parameters, it can be ensured that specific operations are restricted or locked to ensure the reliability of boundary conditions, such as beam polarization, beam width, beam directivity, transmitter power, resource block allocation (i.e., resource mapping with a portion of the beam for transmission or reception), test or reference signal selection, modulation and coding scheme (MCS) and / or selected power and / or applied power. The inventors have also found that it is advantageous to lock the properties of the beam pattern, and without loss of generality, such properties include time properties, frequency properties, spatial properties and coding properties, such as space time code, space frequency code and space time frequency code. The inventors have also found that these embodiments can be implemented for but not limited to zero point locking.

[0007] According to an embodiment, a device configured for wireless communication in a wireless communication network includes: a wireless interface configured for wireless communication; and a controller configured to control a beam pattern formed using the wireless interface and at least one communication parameter of the wireless interface. The device is configured to receive a lock signal indicating a request for locking at least a portion of the beam pattern and at least one communication parameter. The controller is configured to lock at least a portion of the beam and at least one communication parameter in response to the lock signal. Since a portion of the beam remains unchanged even if the position or condition of the device is changed, measurement with improved accuracy can be achieved.

[0008] According to an embodiment, a measurement system includes: a measurement interface configured to communicate with a device so as to control the device during a test process of the measurement system, the device being configured to wirelessly communicate in a wireless communication network; a signal generator configured to generate a locking signal indicating a request for locking a beam and at least one communication parameter for wireless communication in the wireless communication system; and a transmission interface configured to send the locking signal to the device. By controlling the device using the locking signal, measurement with improved accuracy can be achieved.

[0009] According to an embodiment, a measurement setup comprises: an apparatus according to an embodiment; and a measurement system according to an embodiment. The measurement system is configured to send a lock signal to the apparatus and to determine a characteristic of the apparatus.

[0010] According to an embodiment, a method for testing a device includes:

[0011] sending a lock signal to the device, the lock signal indicating a request to lock at least a portion of a beam pattern formed by the device and at least one communication parameter of the device; and

[0012] A portion of the beam pattern and at least one communication parameter are locked in response to the locking signal.

[0013] According to an embodiment, a method for testing a device includes:

[0014] operating the apparatus so as to obtain freely moving lobes and nulls of a beam pattern produced by the apparatus in normal operation;

[0015] Establishing a connection with the device;

[0016] Instructing the device to lock communication parameters;

[0017] indicating at least a portion of a beam of the device locking the device;

[0018] Determine the measurement of the device;

[0019] Changing the measuring conditions of the device;

[0020] Repeating the determination of a measurement of the device and / or changing a measurement condition of the device; and

[0021] Instructs the device to unlock a portion of the beam and communication parameters.

[0022] According to an embodiment, a non-transitory storage medium has computer-readable instructions stored thereon, wherein the computer-readable instructions are configured to perform a method according to one of the embodiments when executed on a computer.

[0023] Further embodiments are defined in the dependent claims. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Embodiments of the present invention will now be described in further detail with reference to the accompanying drawings, in which:

[0025] Figure 1 A schematic block diagram of an apparatus according to an embodiment is shown;

[0026] Figure 2 shows a schematic block diagram of a measurement setup including a measurement system and a device to be tested according to an embodiment;

[0027] Figure 3a shows a schematic block diagram of a measurement setup according to another embodiment;

[0028] Figure 3b shows a schematic block diagram of a measurement setup with a combined interface for controlling and measuring a DUT according to an embodiment;

[0029] Figure 3c The embodiment of the invention is shown by extending the interference interface Figure 3b A schematic block diagram of a measurement setup formed by a measurement setup of;

[0030] Figures 4a to 4f A schematic flow chart of a method for testing a device according to an embodiment is shown;

[0031] Figure 5a A schematic flow chart of a method for repeatedly measuring a DUT according to an embodiment is shown;

[0032] Figure 5b A schematic flow chart of another method for repeatedly measuring a DUT according to an embodiment is shown;

[0033] Figure 5c A flow chart showing a general method for testing a device with multiple measurements according to an embodiment;

[0034] Figure 6a shows a schematic block diagram of an apparatus with two antenna arrays according to an embodiment;

[0035] Figure 6b A schematic block diagram of an apparatus having multiple antenna subarrays according to an embodiment is shown;

[0036] Figure 7 A schematic block diagram showing an apparatus configured to form a beam to include lobes and nulls; and

[0037] Figures 8a to 8c A schematic diagram of a measurement process that may be performed by a measurement setup according to an embodiment is shown.

[0038] In the following description, the same or equivalent elements or elements having the same or equivalent functions are denoted by the same or equivalent reference numerals even if they appear in different drawings. DETAILED DESCRIPTION

[0039] Embodiments described herein may relate to one or more beam patterns formed by a device. A beam pattern may include one or more beams that should be understood as directing antenna capabilities (i.e., transmission / transmission capabilities and / or reception capabilities toward a specific direction), wherein beam formation as an omnidirectional lobe is not excluded. A beam may include one or more main lobes. Beside the beam, the beam pattern may include one or more side lobes. Between beams and / or lobes, nulls may be arranged. A lobe may be understood as a spatial region along which signals are transmitted / received with higher quality than other regions. A beam pattern may include nulls, for example, between the first and second lobes or at different locations. A null may be understood as a spatial region along which a small amount of transmit power is transmitted or received with lower quality from the spatial region compared to the region of the lobe. For example, the transmit power at the null may be reduced by at least 20 dB, at least 40 dB, or at least 60 dB, or even greater when compared to the center of the lobe. In other words, forming a "null point" can be understood as: the formed beam pattern is spatially constructed so that little power is sent or received from it in a specific direction or spatial sector or no power is sent or received from it in an ideal world. In order not to cause interference in a specific direction (for example, another communication device A communicates with another communication device B on the same time-frequency resource), this "null point" can be important. In other words, the beam may include one or more lobes and may include null points between the lobes. A beam may be formed for the purpose of transmission, that is, as a transmission beam that can be understood as directing the transmission power used to transmit a wireless signal toward a specific direction relative to the device. Alternatively or additionally, a beam may be formed for the purpose of reception, that is, as a receiving beam, that is, adjusting or controlling the antenna gain so as to produce a preferred direction for receiving a wireless signal. Signals can be sent and / or received at radio frequencies using a regular or irregular spatial pattern (which can be used for beamforming) using a beam velocity.

[0040] Embodiments described herein may relate to extended beam patterns. An extended beam pattern may be understood as a single beam pattern or a superposition of at least a first beam pattern and a second beam pattern, wherein such superposition may be obtained for two or more transmit beams or beam patterns, two or more receive beams or beam patterns, and / or at least one transmit beam or beam pattern and at least one receive beam or beam pattern. That is, when performing pattern locking according to an embodiment, this may involve beam locking and / or zero point locking. Beam locking may involve locking one or more beams and / or lobes of a beam pattern, wherein zero point locking may involve locking at least one zero point. Therefore, pattern locking may also involve locking elements of different beams or even one or more complete beams, and / or a combination of beam locking and zero point locking. In other words, transmission includes sending / transmitting signals and receiving signals. Communication parameters may involve parameters that affect at least receiver properties and / or transmitter properties. Therefore, embodiments relate to sending and / or receiving, and are not limited to uplink and downlink.

[0041] The embodiments described herein relate to locking at least a portion of beam properties and / or beam patterns and / or communication parameters. Locking in this context may be understood as controlling the corresponding element or parameter so that it includes an unchanged state or at least a state with a small amount of change (e.g., less than 10%, less than 5%, or less than 1%). Such locking may be performed, for example, during normal operation, during which the beam pattern or at least a portion of the beam pattern and / or parameter is adapted, changed, or controlled to meet the requirements of this operation. Based on locking the beam, a portion of the beam or parameter may be locked (i.e., saved, frozen, or kept constant, possibly within the tolerance range indicated above) so that even when changes in the device (e.g., regarding orientation or position) during normal operation cause it to change, the beam pattern and / or communication parameters remain unchanged. When it comes to unlocking timing, the beam pattern, a portion of the beam pattern and / or communication parameters may be released so that adaptation according to the current operating mode may be performed.

[0042] That is, embodiments relate to locking certain radiation pattern characteristics for measurements of the following antennas: antennas for sending signals (transmitting or transmitting antennas), and antennas for receiving signals (receiving or receiving antennas). Therefore, embodiments involving communication parameters cover both sending and receiving. Embodiments cover beam pattern properties, which include time properties, frequency properties, spatial properties, and coding properties (e.g., space-time coding, space-frequency coding, and space-time-frequency coding) without loss of generality. Again for both sending and receiving, embodiments also cover power locking and modulation coding scheme level locking, resource block allocation locking, and test or reference signal selection locking, etc. Alternatively or additionally, locking communication parameters may involve locking of the resources used, such as in time and / or frequency and / or one or several antennas or multiple input multiple output (MIMO) layers / beams. This may be referred to as locking of radio resource mapping. That is, locking beam patterns and / or communication parameters may involve locking a resource map used for sending and / or receiving. Locking a resource map may include locking related functions (e.g., frequency hopping) or at least performing such functions according to a predefined pattern to enable the measurement system to perform appropriate tests. In 4G-LTE and 5G-NR, modulated and coded symbols are mapped onto OFDM symbols (time) and OFDM subcarriers (frequency) resources. Such resources can be selected by a so-called resource scheduler and communicated within a communication block (so-called physical resources (PR)) or externally using other control channel options. Such resource allocation can be static, quasi-static or dynamic over time, and the mapping can involve degrees of time, frequency and space domains (MIMO layers).

[0043] Furthermore, predefined (i.e., pre-agreed / known) patterns may be used, such as the so-called hopping patterns used in WiMax or Bluetooth. Thus, depending on the mapping of time / frequency resources on the different MIMO layers on the beams, the resulting beam pattern and / or its superposition may vary over time in normal operation and may thus be locked, released, possibly locked again, etc. Alternatively or additionally, the radio resource mapping may be set to a predefined and cyclical pattern, allowing the measurement system to synchronize and exploit this knowledge. This is important if the over-the-air (OTA) measurements are performed based on reference symbols (RS), which are mapped on specific time, frequency resources on different spatial layers.

[0044] Furthermore, pattern locking not only covers the shape of the beam, but can also be extended to polarization effects, for example, a particular beam pattern can appear horizontally or vertically polarized, left-handed or right-handed, or different polarization modes. Again for transmission and / or reception, the communication parameters can refer to locking such polarization. Thus, pattern locking and / or locking communication parameters can involve locking a resource mapping for transmission or reception with a portion of the beam and / or locking a polarization for transmission or reception with a portion of the beam.

[0045] Embodiments described herein relate to one or more communication parameters. The communication parameters may affect the properties of a beam pattern, wherein the beam pattern may be used for transmission purposes and / or for reception purposes. Therefore, the communication parameters should not limit the embodiments to parameters for the transmission direction, but rather relate to transmitting wireless signals (including both transmission and reception).

[0046] According to an embodiment, in extending pattern locking with respect to fixing a single beam / lobe and / or null relative to the direction of the device, at least one further parameter (i.e., at least one communication parameter) related to receiving and / or transmitting wireless signals is locked together with the beam pattern. In general, it can be said that certain aspects or characteristics of the antenna radiation pattern are fixed or locked. This may be one or more main lobes of the beam pattern and / or one of its nulls.

[0047] According to an embodiment, for example, locking may be applied to:

[0048] 1. Beam

[0049] a. Single lobe of the beam pattern

[0050] b. Multiple lobes of beam pattern

[0051] 2. The beamforming pattern, i.e. the combination of lobes and / or nulls

[0052] a.TRP (Total Radiated Power) measurement

[0053] b.RTP (received total power) measurement

[0054] 3. Lobe

[0055] a. Main lobe, first side lobe (e.g. left / right / upper / lower beam center)

[0056] b. Second / third / Nth lobe (e.g., left / right / upper / lower beam center)

[0057] c. Sidelobes (e.g. left / right / upper / lower beam center) relative to a given level of the main lobe (i.e., for a given sidelobe level (SLL) of X dB)

[0058] 4. Zero o'clock

[0059] a. Single zero point

[0060] b. Multiple zeros

[0061] c. Null point (left / right / upper / lower beam center) relative to a given level of the main beam (i.e., for a given null level (NL) of X dB)

[0062] 5. Panel or sub-array

[0063] a. The beam or beam pattern emitted by the antenna elements (i.e., antenna subarray) of a single panel

[0064] b. Beams or beam patterns transmitted by multiple panels / sub-arrays

[0065] c. Beams of adjacent / parallel / orthogonal / diagonally / radially opposed panels / sub-arrays

[0066] d. Sidelobes (left / right / upper / lower beam center) relative to a given level of the main beam (i.e., for a given sidelobe level (SLL) of X dB)

[0067] 6. Array

[0068] a. Single Antenna Array

[0069] b. Multiple antenna arrays

[0070] c. Array of arrays

[0071] When comparing the multiple lobes of the beam pattern according to point 1b with the locking of the lobes according to point 3, the difference that can be seen is that the beam is arguably the "strongest" part of the pattern. In general, any pattern that is shaped to form a beam will also have lobes that are not as strong as a (main) beam, which may have one or more lobes. The number of lobes associated with a single (main) beam may depend on the type and / or design of the antenna. Some antennas may be designed with patterns that present more than one beam, examples of which include antenna arrays that use multiple beams to serve multiple users. Nulls may be found between the main beam and the lobes, as well as between adjacent lobes. Without affecting the main beam, the nulls may be directed toward sources of interference to reduce their impact on the desired signal.

[0072] As a general description, the embodiments described herein may be understood to explain concepts that may be referred to as beam pattern property locking and / or null pattern property locking, ie, beams and / or nulls may be locked together with other properties that may be defined by communication parameters.

[0073] Figure 1A schematic block diagram of an apparatus 10 according to an embodiment is shown. The apparatus 10 is configured for wireless communication, for example, in a wireless communication network (e.g., a mobile communication network) operating according to the Long Term Evolution (LTE) standard and / or the 5G standard (also referred to as New Radio). The apparatus 10 includes a wireless interface 12 configured for wireless communication. The wireless interface 12 may include one antenna or multiple antennas (e.g., an antenna array) and may be configured for beamforming, i.e., adapting the direction along which the null of a beam or beam pattern 14 is directed. Thus, control of the direction of a beam or null may allow control of at least one direction along which a transmit signal 16 is preferably transmitted and / or from which a receive signal 18 is preferably received. For reception and transmission, separate beams and / or beam patterns may be formed, for example, each beam and / or beam pattern having one or more main lobes pointing in different directions. Thus, although the apparatus 10 is shown as generating only the beam pattern 14, additional beams and / or beam patterns may also be generated.

[0074] The device 10 includes a controller 22, which is configured to control the pattern of the beam pattern 14 of the wireless interface 12 and at least one communication parameter of the wireless interface 12. That is, the controller 22 can control the wireless interface 12 to form the beam pattern 14 and / or more than one beam or beam pattern, which are spatially superimposed on each other into an extended beam pattern. The at least one communication parameter can be understood as a single parameter and / or multiple parameters. Controlling the beam or beam pattern 14 or the extended beam pattern can include: controlling at least one beam or null of the beam pattern 14 to include a time-varying shape and / or orientation relative to the device 10, and / or including a constant or nearly constant shape and / or orientation in response to a changing environment that affects the shape and / or orientation. By way of non-limiting example only, the communication parameters may include transmit power, beam polarization, beam width, beam directivity, resource block allocation (i.e., resource mapping with a portion of a beam for transmission or reception), test or reference signal selection, and a modulation coding scheme (MCS) for wireless communication for generating or forming the beam pattern 14. The apparatus 10 is configured to receive a lock signal 24. The lock signal 24 may indicate a request for locking the beam pattern 14 and at least one communication parameter. Thus, the lock signal 24 may indicate a request for locking at least one property of the beam pattern 14 (and possibly thereby including at least one communication parameter). These definitions may be combined with one another without limitation, such that embodiments relating to a lock signal indicating a request for locking at least a portion of a beam and a communication parameter may also relate to a lock signal indicating a request for locking a beam property. The lock signal 24 may be received using a wired or wireless dedicated interface (e.g., forming part of a measurement control channel between a measurement system and the apparatus 10), but may also be received using the wireless interface 12.

[0075] When reference is made to the control signal 24 being adapted to include a request for locking at least a portion of the beam pattern 14, this may relate to at least one transmit beam (i.e. a direction along which high transmit power is transmitted), a null point within the transmit beam pattern (i.e. a direction along which no transmit power or low transmit power is transmitted) and / or a receive beam (i.e. a direction from which signals are preferably received).

[0076] Beamforming may include the use of a so-called analog stage and may additionally include the use of a so-called digital stage. Within the analog stage, antenna elements in a group of antenna elements may be controlled individually to form a virtual antenna having antenna properties (e.g., directivity) to be controlled. To this end, elements (e.g., phase shifters, time delay elements, attenuators, etc.) that may operate in the radio frequency range or in the intermediate frequency range may be controlled. Such elements may form a network, which may be referred to as a beam pattern control network, since the beam pattern is created as a result of implementing the network in the analog domain and applying the network to a radio frequency (RF) or intermediate frequency (IF) signal. Alternatively or additionally, the network may be implemented in the digital domain. In the digital domain, the sample clockwise product of the I / Q value and the complex number may be obtained in the baseband, or the sample clockwise product of the complex or real-valued time domain signal and the complex or real-valued matrix may be obtained again in the digital IF (e.g., a digital up-converted signal), where the product may represent a beamforming network element. Thus, the analog portion of locking a portion of the beam pattern may involve controlling antenna elements in order to lock onto the transmit or receive pattern of the virtual antenna.

[0077] Within the digital stage, at least one but also possibly multiple or a large number of virtual antennas may be controlled, for example by using elements such as multipliers or matrix-vector multiplications, for adapting or manipulating the signal in the I / Q or IF domain (i.e., the digital domain). Such operations may be performed in baseband. Thus, the digital part of locking a portion of the beam pattern may involve controlling at least one virtual antenna as a whole.

[0078] The lock signal 24 may include instructions instructing the instructed device to lock at least a portion of the beam pattern 14. This may include instructions indicating that only the analog portion of the beam pattern 14 or a portion thereof is requested to be locked. Alternatively, this may include instructions indicating that only the digital portion of the beam pattern 14 or a portion thereof is requested to be locked. Alternatively, this may include instructions indicating that both the analog portion and the digital portion of the beam pattern 14 or a portion thereof are requested to be locked. Alternatively or additionally, this distinction between the analog domain and the digital domain may be combined with instructions in the lock signal 24 indicating that the transmit beam and / or receive beam is locked, i.e., a distinction between a transmit beam and a receive beam.

[0079] The controller 22 is configured to lock at least a portion of the beam pattern 14. A portion of the beam pattern may relate to a beam, its lobe, a null point and / or a spatial portion or portion thereof, but may also refer to an incomplete portion of the beam in another dimension (e.g., frequency). For example, a beam may be formed in more than one frequency band or using more than one subcarrier (e.g., using carrier aggregation). A transmit band may refer to a frequency band in which communication occurs between a UE and an eNB (receiver or transmitter side). Different subcarriers may be used or applied with different beamformers. Then, locking at least a portion of the beam pattern 14 may involve locking a beam and / or its lobe and / or null point in at least one frequency band and / or subcarrier. Thus, the controller 22 may be configured to form the beam pattern 14 in at least a first portion of the transmit spectrum and a second portion of the transmit spectrum, wherein the controller 22 may be configured to lock a portion of the beam pattern 14 in the first portion of the transmit spectrum in response to a lock signal, while keeping a portion of the beam unlocked in the second portion of the transmit spectrum. Alternatively or additionally, when it comes to the spatial pattern of the beam, locking a portion of the beam may include forming a beam pattern 14 using the wireless interface 12, the beam pattern 14 including at least one or a higher number of lobes and nulls. The controller may be configured to lock a lobe or more than one lobe and / or null while keeping the elements (i.e., at least one lobe or null) unlocked. This does not exclude locking the entire beam.

[0080] By locking a property of a beam or a portion of a beam pattern 14 (e.g., at least a beam or its lobe, and / or a null point and / or a frequency band and / or its subcarrier) and at least one communication parameter in response to a lock signal 24, the locked portion can be controlled to remain unchanged or to vary within a specific tolerance range. For example, the beam pattern 14 may include at least one beam, wherein the controller is configured to control the direction along which at least one beam is emitted relative to the wireless interface 12. In order to lock at least a portion of the property or beam, the controller is configured to maintain the direction. Alternatively or additionally, the beam pattern 14 may include a null point pointing in a specific direction. The null point may be arranged between the first lobe and the second lobe, but may also be arranged elsewhere and refers to a direction along which a small amount of power is sent and / or from which a low sensitivity for receiving signals is obtained. The controller 22 may be configured to control the direction along which the null point is emitted from the wireless interface 22, wherein, in order to lock at least a portion of the beam pattern 14, the controller 22 is configured to maintain the direction. This allows the device 10 and its behavior to be checked while, for example, using a measurement system to maintain a current operating state. For example, the measurement system may include a certain amount of resolution determined at least in part by a plurality of antennas in the measurement system. These antennas may be arranged so as to be distributed in space. The measurement system may be configured to move (e.g., shift and / or rotate) the device 10 so as to measure different orientations and / or positions of the device 10. The measurement system may simultaneously simulate or represent a communication partner of the device 10, for example, a base station when the device 10 is a user equipment, or a user equipment when the device 10 is a base station. Based on the relative orientation of the device 10 relative to the change of the simulated communication partner, the operation of the device 10 (e.g., controlled by the controller 22) may cause the beam of the beam pattern 14 to move relative to the device 10 (e.g., according to the tracking of the communication partner). Even when the shape of the beam of the beam pattern 14 is locked, the controller 22 may cause the communication parameters to change (e.g., antenna gain, transmit power and / or modulation scheme), so that sufficient measurement results will not be obtained by locking the beam alone. By also locking at least one communication parameter, the device 10 may be controlled in a state where the device 10 may be shifted and / or rotated without changing its behavior, so that it may be checked with high accuracy.

[0081] According to an embodiment, the apparatus 10 is configured to lock the transmit power and / or receive power (gain) as communication parameters. The advantages of power locking are explained as follows. During a specific measurement with the beam locked, the device under test is rotated to perform an eccentricity measurement. Figure 3aAs shown, for example, one antenna combination is used to maintain a link between the DUT and the test equipment, while the second antenna combination is used for measurement purposes. Locking the transmit or receive power allows preventing the transmit power management controller of the DUT from compensating for changes in direction. This test case represents, for example, multi-cell, dual connectivity, inter-RAT (Radio Access Technology) or non-independent operation. Alternatively or additionally, therefore, pattern locking and / or locking communication parameters may involve locking a resource mapping for transmission or reception with a portion of the beam and / or locking a polarization for transmission or reception with a portion of the beam.

[0082] Although the null point is referred to as part of the beam and therefore involves locking the null point when referring to pattern locking, pattern locking may involve beam locking and / or null point locking. Note that the description made in conjunction with locking at least a portion of the beam may also apply to null point locking, and vice versa. Thus, beam pattern property locking may involve pattern locking in conjunction with locking at least one or more communication parameters, wherein pattern locking itself refers to beam locking and / or null point locking. In a multi-user embodiment, for example, where the effects of interference (e.g., relatively high-power transmission of signals that can be described as "unwanted" by a particular user) are considered, it may be foreseen that the null point of the radiation pattern of the user antenna needs to be pointed in the direction of the interference source. That is, as an alternative or additional solution to pointing a beam or lobe to a specific location (e.g., a transmitter or receiver), the null point may also be pointed in one or more specific directions (e.g., other devices). Thus, in conjunction with this embodiment, null point locking may be understood as a part of pattern locking similar to beam locking, except that the null point is locked. To distinguish this situation, the term "null point locking" (as an alternative to "beam locking") may be used.

[0083] In the following, a measurement system according to an embodiment will be described, which is configured to communicate with and test an apparatus such as the apparatus 10. When testing an apparatus, it forms a device under test (DUT). The measurement system and the DUT together form a measurement setup. Note that the apparatus may be any device configured for mobile communication, in particular a user equipment (UE) or a base station (BS) (also referred to as an evolved NodeB (eNB) etc.). The measurement system may emulate or simulate corresponding other communication partners, for example a base station that is a UE for the DUT, another UE that is a UE for the DUT, and / or a UE that is a base station for the DUT or a base station that is a base station for the DUT.

[0084] According to an embodiment, alternatively or additionally, for example, in scenarios where the link is spatially bidirectional (including co-located links (UL and DL)), the transmit power is locked again to prevent power management from using the feedback information. For example, EIRP (Equivalent Isotropic Radiated Power or Effective Isotropic Radiated Power) measurement requires the transmitter to operate at full power.

[0085] To lock the transmit power, calibration of the adjustable front-end components (e.g., programmable attenuators, phase shifters, time delays, power amplifiers, low noise amplifiers) used in both the transmit and receive chains may be performed. Advantageously and according to an embodiment, the lock of the communication parameters (e.g., transmit power) should be locked immediately after the beam is locked.

[0086] In addition, in conjunction with the power used to form the beam, and as a specific extension of the power lock function, the power distribution in time, frequency and space (direction) can be selected / configured / requested to support specific measurement and test cases. That is, the power / gain used to form the beam can be set to a specific value, for example, by a corresponding command and / or by generating or simulating a scenario of operation that causes the device to set the power or gain to a corresponding value. According to an embodiment, the device can, for example, signal the corresponding value of the communication parameter used to the measurement system that sends the lock signal 24. This power distribution (power distribution in the frequency domain) that deviates from the usual constant power spectral density commonly used in OFDM systems such as LTE may be uneven, such as a stepped or progressive power ramp in the frequency domain. A prominent example of this situation is the so-called partial frequency reuse, which is a means of forming inter-cell interference between sectors illuminating the same coverage area. Unequal power distributions can be summarized in the time, frequency and space domains, for example, applying different power levels in different time slots or using different powers for beams entering different directions or applying different power spectral densities on different time and / or frequency resources and in different directions. The associated commands to implement such a variable power profile before, during and after the measurement process will be described in more detail.

[0087] As an alternative or in addition to transmit power / receive power, other parameters may be locked, such as the modulation and coding scheme (MCS) level, which allows for precise testing in various test cases. For example, considering a test case (e.g., sensitivity measurements for a specific MCS level, bandwidth, etc., especially in the uplink), the modulation and coding scheme may be configured, selected and / or kept fixed during the measurement, wherein the power, beam with pattern and direction are maintained and / or changed between measurement iterations.

[0088] Examples of prior art from 3GPP technical specifications are described below, which describe methods and procedures for implementing different forms of power control.

[0089] TS 25.141[2]

[0090] Section: 6.2.3.4A Test Methods for MIMO Mode with Four Transmit Antennas

[0091] 6.2.3.4A.1 Initial conditions

[0092] Test environment: Normal; see subclause 4.4.1.

[0093] RF channels to be tested: B, M and T; see subclause 4.8.

[0094] 1) Connect the BS to the code domain analyzer as shown in Figure B.2A of Annex B.1.2.

[0095] 2) Disable inner loop power control.

[0096] 3) Set the BS to transmit at the rated output power per carrier Prated,c declared by the manufacturer. Channel settings shall be in accordance with TM2 subclause 6.1.1.2. The expected primary CPICH code field power per antenna connector shall be declared by the manufacturer.

[0097] 4) Apply the same BS settings to antenna connectors 1, 2, 3, 4.

[0098] Subclause 6.4 gives more information on output power dynamics, including inner loop power control, power control steps, power control dynamic range, DL and UP power control.

[0099] TS 34.114[3]

[0100] This document describes the mechanism to achieve maximum and minimum power by sending up and down power control commands to the UE, for example in subclause 5.4 Total Radiated Power (TRP) for TDD UEs:

[0101] 5.4.4.2: Process

[0102] 1) Continuously send power control commands to the UE.

[0103] 2) When the UE reaches the maximum power, it starts sending the PN15 data mode.

[0104] 3) Position the UE against the SAM mold frame.

[0105] 4) Using a test system with the characteristics described in Annex A, measure the EIRP in the θ and φ directions with a sampling step of 15° θ and EIRP φ .

[0106] 5) Calculate TRP using the formula in Chapter 5.4.1.

[0107] TS 36.521-1[4]

[0108] Subclause 6.3: Output power dynamics:

[0109] 6.3.2.4.2: Testing process

[0110] 1. SS sends uplink scheduling information for each UL HARQ_process via PDCCH DCI format 0 for CRNTI to schedule UL RMC according to Table 6.3.2.1.4.1-1. Since the UE has no payload and no loopback data to send, the UE sends uplink MAC padding bits on UL RMC.

[0111] 2. Continuously send uplink power control "down" commands to the UE in the uplink scheduling information to ensure that the UE transmits at its minimum output power.

[0112] 3. Measure the average power of the UE in the associated measurement bandwidth specified in Table 6.3.2.5-1 for the specific channel bandwidth under test. The measurement period shall be the continuous duration of one subframe (1ms). For TDD timeslots, the transient period is not tested.

[0113] Subclause 7.4A specifies the maximum input level for CA:

[0114] 7.4A.1.4.2: Testing Process

[0115] 1. Configure SCC for all downlink physical channels according to Annexes C.0, C.1 and C.3.1.

[0116] 2. The SS shall configure the SCC according to clause 5.2A.4 of TS 36.508 [7]. The message content is defined in clause 7.4A.1.4.3.

[0117] 3. The SS activates the SCC by sending an Activation MAC-CE (see TS 36.321

[13] , clauses 5.13, 6.1.3.8). Wait for at least 2 seconds (see TS 36.133, clause 8.3.3.2).

[0118] 4. The SS sends PDSCH via PDCCH DCI format 1A for CRNTI to send DL RMC on PCC and SCC according to Table 7.4A.1.4.1-1. The SS sends downlink MAC padding bits on DL RMC.

[0119] 5. SS sends uplink scheduling information for each UL HARQ_process via PDCCH DCI format 0 for CRNTI to schedule UL RMC on both PCC and SCC according to Table 7.4A.1.4.1-1. Since the UE has no payload data to send, the UE sends uplink MAC padding bits on UL RMC.

[0120] 6. Set the downlink signal levels for the PCC and SCC to the values ​​defined in Table 7.4A.1.5-1. Send uplink power control commands to the UE (a step size of less than or equal to 1 dB should be used) to ensure that, for at least the duration of the throughput measurement:

[0121] For carrier frequency f≤3.0GHz or for carrier frequency 3.0GHz<f≤4.2GHz (target level in Table 7.4A.1.5-1 + 10log(P_L CRB / N RB_alloc )) is within (+0dB, -4dB), and the PCC output power is within (the target level in Table 7.4A.1.5-1 + 10log(P_L CRB / N RB_alloc )) is within (+0dB, -3.4dB).

[0122] For carrier frequency f≤3.0GHz or for carrier frequency 3.0GHz<f≤4.2GHz (target level in Table 7.4A.1.5-1 + 10log(S_L CRB / N RB_alloc )) is within (+0dB, -4dB), and the SCC output power is within (the target level in Table 7.4A.1.5-1 + 10log(S_L CRB / N RB_alloc )) is within (+0dB, -3.4dB).

[0123] 7. Measure the average throughput of each component carrier for a duration sufficient to achieve statistical significance, as per Annex G.2A.

[0124] Figure 2 A schematic block diagram of a measurement setup 20 is shown, which includes a measurement system 30 and a device to be tested (i.e., a DUT, such as the device 10). Although described as including a single DUT, the invention described herein is not limited thereto. According to an embodiment, the measurement setup 20 may include multiple DUTs, for example, two or more, five or more, ten or more, 20 or more, or even a higher number. For example, a measurement system operating as a system simulator (SS) (e.g., a base station or a base station simulator) may be used to test multiple UEs. The measurement system is configured to send a lock signal 24 to the device 10 and to determine / measure characteristics of the device.

[0125] The measurement system 30 includes a measurement unit or interface 26 configured to communicate with the device 10, which is configured to perform wireless communication in a wireless communication network. The measurement interface 26 can be a wired or wireless interface and is configured to control the device 10 during the test process of the measurement system 30. That is, the measurement interface can establish or utilize a measurement control channel to exchange control information with the device 10. Such a measurement control channel can be wired or wireless. The device can receive control information such as a locking signal through the measurement control channel, and / or can report information to the measurement system 30. For example, the device 10 can report parameters used to form a beam, a portion of a beam and / or a beam pattern, such as the transmit power used, the pattern used, the direction in which the beam or lobe or null is pointing, etc.

[0126] The measurement interface 26 may be configured to perform measurements of the apparatus 10, for example, measuring parameters as will be described later. An example measurement parameter may be a spatial pattern of a beam pattern. Alternatively or additionally, different entities of the measurement system 30 may be configured for such testing, for example, one or more antenna arrays, etc.

[0127] The measurement system 30 comprises a signal generator 28 configured to generate a locking signal such as a locking signal 24 indicating a request for locking at least a portion of a beam pattern and at least one communication parameter of a wireless communication (i.e., of the device 10 and its wireless interface) in a wireless communication network. The measurement system 30 also comprises a transmission interface 32 configured to send the locking signal 24 to the device 10. Alternatively or additionally, the measurement system 30 may receive a signal 33 from the DUT, for example, using the transmission interface 32, which is configured for bidirectional communication with, for example, a measurement interface using a tested beam or a different interface of the measurement system. That is, the device 10 may be configured to send a signal to the measurement system 30. The transmission interface 32 may be a separate interface compared to the measurement interface 26, but may also be an interface integrated therewith, for example, a common wired or wireless interface.

[0128] After performing the measurements, the device 10 may be instructed to release or unlock a portion of the beam pattern and / or the communication parameters. For example, this may be obtained by sending a dedicated unlock signal to the device 10. The signal generator 28 may be configured to generate an unlock signal indicating a request to unlock a portion of the locked beam and / or at least one communication parameter. The locked portion may, but need not, be indicated. The unlock signal may contain general information indicating that the device unlocks all locked portions. Alternatively, the portion to be unlocked may be identified in the unlock signal to allow partial unlocking. The measurement system 30 may be configured to send an unlock signal to the device 10 after determining the characteristics of the device. The device 10 may be configured to receive an unlock signal indicating a request to unlock at least one communication parameter and / or a portion of the beam pattern. The controller of the device may be configured to unlock at least one communication parameter and / or a portion of the beam pattern in response to the unlock signal, thereby again including the change value. As an alternative that may also be used in conjunction with an unlock signal, the signal generator 28 may be configured to generate the lock signal 24 to indicate an unlock condition (e.g., an expiration time or any condition determined by the device 10) that, when occurring, causes an unlock of a portion of the beam pattern and / or communication parameters.

[0129] Figure 3a A schematic block diagram of a measurement setup 301 according to another embodiment is shown. The measurement setup 301 represents the concept of a separate interface for communicating with the device 10 and controlling its behavior. For example, the measurement system 301 may include a measurement interface 27 having a measurement antenna (e.g., for beam center and / or eccentric beam measurement). The measurement antenna 27 may implement the measurement functions of the measurement interface 26. As a separate interface, a control interface 34 may be arranged, which is configured to manipulate or control the device 10. The control interface 34 may implement the control functions of the measurement interface. For example, the control interface 34 may include one or more link antennas for beam steering at the device. For example, the control interface 34 may simulate a corresponding communication partner so that its determined position guides the device 10 to point a transmit beam or a receive beam to the control interface 34 during normal operation, wherein the measurement interface 27 may be used to determine one or more measurement parameters. After pattern lock and locked communication parameters are established, the device 10 can be moved or rotated while maintaining the relative orientation of the beam, portion of the beam, or beam pattern, which during normal operation would be repositioned to track the control interface 34. The lock signal is used to deactivate this function for a specific time.

[0130] Figure 3b A schematic block diagram of a measurement setup 302 according to an embodiment is shown, wherein the measurement setup 302 has a combination of Figure 3aThe combined interface 36 of interfaces 26 and 34 can be used as a link / measurement antenna for beam steering and beam center measurement. In other words, Figure 3b The concept of a combined link-cum-measurement antenna that can be used for beam center measurements. Using the lock signal, eccentricity measurements can also be performed since the device 10 locks the beam even if the control interface is deactivated and / or the device 10 is moved / rotated. Thus, the measurement system can be configured to perform beam center measurements and eccentricity measurements. Eccentricity measurements can be enabled by locking a portion of the beam and communication parameters so that the orientation of the DUT to the measurement antenna can be changed.

[0131] Figure 3c 1 shows a schematic block diagram of a measurement setup 303 according to an embodiment, which is implemented by extending the measurement setup 302 through a jammer interface 38, which may include one or more jammer antennas connected to a controlled jammer source so as to interfere with the wireless communication of the device 10 in the measurement setup 303. In other words, Figure 3c The concept of a combined link-cum-measurement antenna is shown, which can be used for beam center measurement and / or eccentricity measurement in the presence of controlled interference sources. Figure 3a In, separate link and measurement antennas 27 and 34 are described, wherein in Figure 3b and Figure 3c In the embodiment, the link and measurement antennas are combined to an interface 36 which is connected to Figure 3c The additional interference antenna 38 in the link and measurement antenna is as follows. Figure 3b and Figure 3c As shown, it can be used both for establishing and maintaining links and for making measurements.

[0132] The measurement setups 30, 301, 302 and / or 303 may be located inside a measurement cabin, but may also be implemented without a measurement cabin. One or more of the measurement setups 30, 301, 302 and / or 303 may include Figure 3a The locator holder 35 shown in FIG. 1 may be configured to hold and / or move / rotate the device.

[0133] The measurement setup 20 may allow for precise testing of the device 10. Such testing, which will be described in more detail below, is enabled by signaling of the locking signal 24 and the implementation of corresponding functions, i.e. by at least partially locking the beam and by locking the communication parameters. As an alternative or in addition to the measurement system 30, the measurement setup 20 may include measurement systems 301, 302 and / or 303, each of which includes a signal generator 28 and a transmission interface 32, not shown.

[0134] As a non-limiting example, in the uplink, considering a SC-FDMA waveform, a device (an example of which is a user equipment (US)) can select a specific bandwidth (e.g., set by a scheduler (e.g., an eNB tester) via a downlink control channel), and can select a specific MCS level. Depending on the modulation selected, the peak-to-average power ratio (PAPR) will vary (e.g., QPSK has a lower PAPR than 256QAM), which directly affects the allowed output power and the required digital pre-distortion (DPD) to avoid signal distortion for in-band (error vector magnitude EVM degradation) and out-of-band (OOB) transmissions into adjacent resource blocks (RBs), which can affect UEs scheduled to adjacent RBs and potentially outside the system bandwidth used by the system (keeping within the spectrum mask). By doing so, the test case can allow confirmation that the EVM is within specifications at a specific maximum output power (e.g., LTE and New Radio provide EVM limits for transmit signal purity).

[0135] According to another non-limiting example, in the uplink, considering SC-FDMA, the device as a UE can use a carrier aggregation (CA) mechanism. When using the same power amplifier (PA), the entire signal may generally become more like a multi-carrier, so appropriate DPD and power backoff must be applied to meet the EVM requirements of the modulation settings applied on each carrier. In addition, the aggregated two or more carriers can be operated with unequal power per carrier (see the unequal power distribution application above). Therefore, the MCS level can be selected, configured or kept in a locked state again, so as to additionally apply power ramping during measurement, for example.

[0136] Now generally again in the context of electrical engineering when referring to the locking signal 24, the word "command" indicates an instruction for identification that is communicated using a defined method (e.g., a protocol). Here, it is advantageous, or even necessary, that the entity sending the command (e.g., a measurement system) and the entity receiving the command (e.g., the device 10) share a common understanding of the command, or in other words, that the entities share a common "language" or message space. On the other hand, again in the context of electrical engineering, a "function" indicates that an entity has the means to configure itself in a given way in order to work or operate in an appropriate or specific manner. Viewed in this way, "command" and "function" can be understood as different concepts.

[0137] Here are some examples of how this functionality can be implemented:

[0138] Deactivate beam (and null) tracking

[0139] Deactivate beam (and null) scanning

[0140] Freeze the beam for time x

[0141] Freeze zero at time x

[0142] Freeze beam b for time x

[0143] Freeze zero point n at time x

[0144] ·…

[0145] In practice, the corresponding command can be implemented as:

[0146] 1. Control signals to analog components (e.g., returning phase shifters and attenuators to a reference state)

[0147] 2. Control signals to baseband circuits / modules / systems / processors that use digital technology to create beams

[0148] 3. Combination of control signals used to direct / control analog and baseband processors

[0149] In the event that the command / message space is incomplete, examples of commands used within a function could include:

[0150] 1. Lock / Release

[0151] 2. Prepare...

[0152] 3. Do... until...

[0153] 4. After that, do...

[0154] 5. Lock for a while, then release...

[0155] 6. Set the parameter to the value... 7....

[0157] An example of a parameter to be set may be a power spectral density (PSD), which may be indicated as being set to a specific value or level for one or more beams according to "locking beam #3 of possible beams #1 to #8 at PSD level #4", wherein neither the identifier nor the beam quantity should be construed as limiting the embodiments thereto. It should be noted that the signal is not limited to including at least one of electrical, optical, acoustic, mechanical components and hybrid combinations thereof. It should also be noted that analog components include components operating at intermediate frequencies (IF), low IFs, and radio frequencies (RF).

[0158] Although the above discussion includes the term "beam locking", this does not exclude that other entities, such as communication parameters as described above, may be locked.

[0159] In the following, examples are given of signaling information sent to a device, ie, a device under test (DUT / UE), regarding beam locking and / or lobe locking and / or null point locking.

[0160] Example 1 (freeze beam / null and release beam / null, freeze power and release power):

[0161] i. Freely moving beams and nulls: A communication partner (tester, UE, BS) in normal operation establishes a connection with the device (e.g. as a DUT)

[0162] ii. Send a freeze Tx power (communication parameter) command to the DUT

[0163] iii. Send freeze beam and / or freeze zero command to DUT (beam)

[0164] iv. Measurement of certain metrics, measurement parameters (e.g. TRP, RTP of DUT, ...), exchange of measured parameters can be performed at the tester / UE / BS through several interfaces (e.g. standard communication protocols, USB, direct connection to DUT, any kind of memory)

[0165] v. Change one of the measurement settings, such as the rotation of the DUT, the direction of the interference generated, the power of the tester, the power of the interference, the direction of the interference, etc.

[0166] vi. Repeat steps iv and v (e.g., iteratively) until all desired constellations / scenarios are measured

[0167] vii. Signaling the unfreeze beam and / or unfreeze zero command (or free movement beam command) to the DUT

[0168] viii. Repeat steps ii to vii above for different desired settings

[0169] As an alternative and in addition to step vii, the apparatus may be configured to receive an unlock signal indicating a request to unlock at least one communication parameter. The controller may be configured to unlock at least one communication parameter in response to the unlock signal, thereby including the variable value again, for example, during normal operation. This may allow the beam to be adjusted between single measurements. The controller may also be configured to unlock the beam in response to the unlock signal.

[0170] As an alternative or additional solution to the above solution, the signaling or freeze beam command may include an identifier of the beam b and / or null point n to be selected, while other beams not equal to b and / or null points not equal to n are turned off and / or continue to operate normally. According to an embodiment, the lock signal may include information indicating one of at least one or more null points in multiple lobes of the beam, wherein the device is configured to lock the indicated lobe or null point in response to the lock signal, and disable at least one lobe or at least one null point different from the indicated lobe or null point.

[0171] Example 2 (frozen beam / null with frozen additional signaling information duration):

[0172] i. Freely moving beams and nulls: A communication partner (tester, UE, BS) in normal operation establishes a connection with the device (e.g. as a DUT)

[0173] ii. Send a freeze Tx power (communication parameter) command to the DUT

[0174] iii. Send a freeze beam and / or freeze zero command to the DUT for a specific time duration (e.g., seconds, minutes, etc.)

[0175] iv. Measurement of certain metrics, measurement parameters (e.g. TRP, RTP of DUT, ...), exchange of measured parameters can be performed at the tester / UE / BS through several interfaces (e.g. standard communication protocols, USB, direct connection to DUT, any kind of memory)

[0176] v. Change one of the measurement settings, such as the rotation of the DUT, the direction of the interference generated, the power of the tester, the power of the interference, the direction of the interference, etc.

[0177] vi. Repeat steps iv and v (e.g., iteratively) until all desired constellations / scenarios are measured

[0178] vii. Repeat steps ii to vi above for different desired settings

[0179] Different signaling may be implemented to implement Example 1 and / or Example 2. Unlocking may be implemented by indicating the duration of locking (eg, using a locking signal).

[0180] In Example 1, the locking signal may include information indicating a request to freeze the communication parameters for a certain time, i.e., the method may include instructing the device to lock at least one of the beam and the communication parameter using time information indicating a duration of the locking, so as to unlock the beam and / or the communication parameter after the duration;

[0181] In Example 2, the lock signal may include information indicating a request to freeze the beam number n / b and / or the null point for a specific time.

[0182] That is, different versions of signaling may be implemented, for example, "freeze power for a specific time xx", "freeze beam b and / or null point n for a specific time x", etc. That is, the device or controller may be configured to unlock at least one communication parameter after a duration indicated by the duration information included in the lock signal. Alternatively, unlocking may be obtained by sending a corresponding unlocking signal (i.e., sending an unlocking signal to the device indicating information requesting the device to unlock the beam and / or communication parameter).

[0183] Below, a specific example of a test / measurement routine according to an embodiment is given. During the measurement, one or more measurement parameters may be measured, for example, a beamforming pattern, i.e., a beam, a portion thereof, TRP (total radiated power), spatial distribution of RTP (total received power) (e.g., the size or width of the beam or its lobe or the null point of the beam and / or beam pattern), spatial distribution of the transmit power of at least a portion of the beam; spatial extension of the beam; stability of the beam direction and / or null point direction; out-of-band (OOB) radiation; adjacent channel leakage ratio (ACLR); beam tracking performance; null point tracking performance; total radiated power; total received power; modulation and coding performance; error vector magnitude (EVM), spurious emission measurements, etc. TRP may be measured based on RSSI (received signal strength indicator) and / or RSRP (reference signal received power). In view of the implemented signaling, the embodiments are described in different versions that differ from each other.

[0184] Version 1:

[0185] i. Freely moving beam, communication partners (tester, UE, BS) in defined directions, DUT placed on positioner at angle _1 (azimuth and elevation pair, polarization)

[0186] ii. Send a freeze beam command to the DUT

[0187] iii. Measurement of measurement parameters at the communication partner (tester, UE, BS) for angle_1 (azimuth and elevation pair, polarization), e.g. pattern / TRP / RTP for complex beamforming, see above

[0188] iv. Rotate or move the DUT (e.g., around angle _1) to measure the main beam direction TRP

[0189] v. Change angle_1 to the next angle and send an unfreeze beam command (or free move beam command) to the DUT

[0190] vi. Send a freeze beam command to the DUT and measure the measurement parameters, such as the complex beamforming pattern / TRP / RTP around the new angle _1, as described above

[0191] vii. Repeat the above steps until the desired angle and polarization coverage area of ​​the DUT is achieved

[0192] Version 2:

[0193] i. Freely moving beam, communication partners (tester, UE, BS) in defined directions, DUT placed on positioner at angle _1 (azimuth and elevation pair, polarization)

[0194] ii. Send a freeze beam command to the DUT and signal the freeze / lock beam command duration to be time xx

[0195] iii. Measurement of measurement parameters such as complex beamforming pattern / TRP / RTP for angle_1 (azimuth and elevation pair, polarization) etc. at the communication partner (tester, UE, BS)

[0196] iv. Rotate or move the DUT (centered around angle_1) to measure the main beam direction TRP

[0197] v. Change angle_1 to the next angle, send freeze beam command to DUT and signal freeze / lock beam command duration for time xx

[0198] vi. Measure the measurement parameters, such as the complex beamforming pattern / TRP / RTP around the new angle _1, as described above

[0199] vii. Repeat the above routine from step i to vi until the desired angle and polarization coverage area of ​​the DUT is achieved

[0200] Note that the corresponding time information according to version 2 may be sent as part of the locking signal and / or as a separate signal. When referring to a locking signal generated, for example, by a signal generator of the measurement system (comprising duration information indicating the duration xx of locking the beam and / or at least one communication parameter), this is equivalent to sending the locking signal and another signal indicating the duration.

[0201] According to an embodiment, a signaling or locking beam command (locking signal) may be generated to include beam information, for example, an identifier of one of a plurality of beams indicating a beam pattern (for example, beam n to be selected, while other beams not equal to n are indicated to be turned off). The device may follow the corresponding instructions and may turn off the beam. Alternatively, a signaling or locking signal may be generated to indicate that a specific beam is to be turned off. According to an embodiment, the same process may alternatively or additionally be applied to the null point, which means that interference is generated by the tester in a certain beam direction, and the interference will also be locked after the locking null point command for the nth null point. Alternatively or additionally, the signal generator may be configured to generate a locking signal and / or an unlocking signal to include beam pattern information indicating that at least a portion of the beam or the null point is to be locked or unlocked.

[0202] Another example measurement process or method is described below. The following process addresses the UE as the DUT while providing a base station (gNB) emulator as part of the test setup, however, these parts are interchangeable, for example, if the base station (gNB) is the network entity, it must be tested.

[0203] process:

[0204] i. Place the UE (device, DUT) in the test position – most likely mounted on a positioner holder

[0205] ii. Place the gNB (base station) emulator as part of the measurement setup at a distance from the DUT, e.g. considering the minimum separation distance to be defined by the 3GPP WR4 community

[0206] iii. Operate the measurement setup so that the cell identification process occurs and a link is established between the UE and the gNB emulator

[0207] iv. Operate the measurement setup so that by testing interference, the gNB can perform a pattern lock routine, during which one or a combination of the following commands can be executed

[0208] v. Configuration of components involved in beamforming at the fixed transmitter – analog beamforming part or digital beamforming part, or both

[0209] vi. Lock the receiver beam in a similar manner as in the Tx part (as described in v)

[0210] vii. Lock the receiver beam to an omni or quasi-omni pattern to maintain a valid connection with the gNB emulator when rotating the UE

[0211] viii.Continuously send up power control commands to the UE to drive the UE to maximum transmit power. In practice, this can be done by increasing the attenuation level at the gNB RF input in a way that forces the UE to increase its transmit power without having to signal / perform specific functions.

[0212] ix. Disable the power control loop at the UE (internal, external, or even both internal and external)

[0213] x.Measure the radio frequency (RF) power through the antenna attached to the gNB emulator. A switch box can be used to route the received signal to the measurement equipment instead of the gNB emulator to ensure more accurate measurements.

[0214] xi. Rotate the DUT to scan all points on a (uniform / non-uniform) spherical grid and take a measurement at each point

[0215] xii. Use the collected measurements to calculate the TRP value and determine the precise EIRP, which may deviate from the value measured at the home axes

[0216] xiii. Verify the presence of the beam main lobe at the origin axis immediately upon reaching the origin axis. This allows you to ensure that nothing disrupts the measurement process

[0217] xiv. Signaling the UE to deactivate pattern lock, for example, by using the time information in the unlock signal or the lock signal

[0218] xv. [Optional step] Repeat this process for all available (UE supported) beam indices or beam indices of interest (alone or in combination).

[0219] After the beam and communication parameters have been locked, one or more measurements may be performed, i.e., measurement parameters may be measured or determined. For example, when the beam is locked, one or more of the following examples are performed: radio frequency (RF), radio resource management (RRM), demodulation, and protocol testing:

[0220] RF transmitter measurements: comparison with limits or minimum requirements

[0221] a. Examples: Spectral emission masking, Error Vector Magnitude (EVM), Out-of-Band Emissions… (See also Power and MCS Lock)

[0222] RF receiver performance (demodulation) measurements

[0223] a. Sensitivity and selectivity (e.g., adjacent and co-channel rejection, blocking)

[0224] (1) For example, using power and / or MCS lock

[0225] b. Throughput and SNR (AWGN channel simulation)

[0226] c. Simulate multi-path environment and business scenarios

[0227] RRM testing: basic behavior in a cellular radio environment

[0228] a.Cell selection / reselection

[0229] b. Handover

[0230] c. Broadcast report function

[0231] Protocol testing

[0232] a. Check the default protocol sequence and failure behavior

[0233] b. Call establishment, call release, channel parameter change, etc.

[0234] Figures 4a to 4f A schematic flow chart of a method for testing an apparatus such as the apparatus 10 is shown. The flow chart describes how a single measurement is performed during a combination of beam and / or null locking. Figure 5a and Figure 5b A schematic flow chart of a method for performing multiple measurements for which the beam and / or null may be locked more than once in different directions is shown. The flow chart shows that a "release command" or a "fix beam and / or null for time Tn / duration x" command may be sent after the measurements have been completed. Thus, the described method is also applicable to the discussed locking of one or more communication parameters, e.g. a power lock and / or MCS lock command and any combination of these commands together or in addition to a pattern lock command.

[0235] Figure 4a A schematic block diagram of a method 1001 for measuring a device according to an embodiment is shown. The method comprises a step 1021 in which the device is controlled according to normal or conventional operation, i.e. the beam is "free to move" and can track or point at least one lobe to a respective transmitting or receiving communication partner.

[0236] In step 1041, the beam or at least a portion thereof may be locked, including the locking of communication parameters. This may be accomplished by sending a locking signal to the device. That is, the method for testing a device according to an embodiment comprises: sending a locking signal to the device indicating a request for locking the beam of the device and at least one communication parameter. The method further comprises: in response to the locking signal, locking the beam and at least one communication parameter. The beam and / or the communication parameter may be set to a specific configuration or value. Alternatively and based on a report of the device to report the beam configuration and communication parameters used, the desired configuration may be waited for and then locked. Alternatively, the device may be stimulated to control itself to a specific configuration, for example, when a corresponding control interface is used to simulate a specific scenario (e.g., position, distance or link quality to a communication partner). According to an embodiment, the measurement system may be configured to control the device so that a beam is generated according to a predefined setting (i.e., to stimulate it) during its normal operation. The measurement system may be configured to send a locking signal so as to maintain the predefined setting and suspend changes in the beam caused by normal operation.

[0237] In step 106, measurement of one or more parameters may be completed, i.e., measurement parameters may be measured or determined. That is, after the lock signal has been sent, the measurement system may be configured to determine characteristics of wireless communication performed by the device. In step 1081, the beam and / or communication parameters are released or unlocked, e.g., using an unlock signal.

[0238] in other words, Figure 4a An example of the pattern locking process applied to a single measurement is shown.

[0239] Figure 4b A schematic flow chart of another method 1002 for testing a device according to an embodiment is shown, wherein at least one zero point is locked. In step 1021, the device is controlled so that it has a free-moving zero point. The zero point may point to another node in the cell intended to avoid interference. Thus, for example and when again referring to Figure 3a When , the control interface 34 can also simulate such a node (for example, UE), so that the control device 10 points the zero point to the control interface 34.

[0240] In step 1042, the zero point is locked as described with respect to step 1041 but in conjunction with the zero point.

[0241] Step 106 may be performed to perform measurements.

[0242] Method 1002 includes step 1082, wherein, possibly after a measurement has been made, the zero point is released.

[0243] in other words, Figure 4b An example of the zero-point locking procedure applied to a single measurement is shown.

[0244] Figure 4c A schematic flow chart of method 1003 according to an embodiment is shown, wherein steps 1023 , 1043 and 1083 are formed as an OR combination of steps 1021 and 1022 , 1041 and 1042 , 1081 and 1082 , respectively.

[0245] in other words, Figure 4c An example of a beam or null locking procedure applied to a single measurement is shown.

[0246] Figure 4d A schematic flow chart of method 1004 according to an embodiment is shown, wherein steps 1024 , 1044 and 1084 are formed as AND combinations of steps 1021 and 1022 , 1041 and 1042 , 1081 and 1082 , respectively.

[0247] in other words, Figure 4d An example of the beam and null locking process applied to a single measurement is shown.

[0248] Figure 4e A schematic flow chart of method 1005 according to an embodiment is shown, wherein steps 1025, 1045 and 1084 are formed as AND / OR combinations of steps 1021 and 1022, 1041 and 1042, 1081 and 1082, respectively, and involve a single beam and / or null point or multiple beams and / or null points.

[0249] in other words, Figure 4e An example of a generalized beam / null locking procedure applied to a single measurement is shown.

[0250] Figure 4f A schematic flow chart of a method 1006 according to an embodiment is shown, which is modified relative to the method 1005. The lock signal may indicate a request to lock at least one beam for a specific time T1 and / or to lock at least one null for a specific time T2, wherein T1 may be equal to T2 but may also be different from T2. In step 1046, the beam and / or null are fixed / locked accordingly. In step 106, preferably before the end of the time T1 and T2, one or more parameters may be measured. Based on the indicated time, step 1086 may be skipped because the beam and / or null is released after the time T1 and T2 has passed.

[0251] in other words, Figure 4f An example of a generalized beam / null locking procedure for a fixed period of time applied to a single measurement is shown.

[0252] Figures 4a to 4fThe method allows the condition of a locked beam, lobe, null or beam pattern to be measured. It may be desirable to measure multiple locked beams, lobes, nulls or beam patterns. This can be achieved by repeating the method and / or by allowing the state of a beam, part of a beam or a beam pattern to be changed. This is achieved by repeating the method and / or by allowing the state of a beam, part of a beam or a beam pattern to be changed. Figure 5a and Figure 5b is shown in the embodiment of the present invention.

[0253] Figure 5a A schematic flow chart of a method 2001 with steps 1025, 1045 and 106 as described in conjunction with method 1005 is shown. After one or more measurement parameters have been measured, step 202 is performed, wherein one or more conditions are changed. The condition may relate to the beam (i.e. it may be changed or temporarily unlocked), and / or may relate to communication parameters. The measurement 106 may then be performed again. Steps 202 and 106 may be present in any suitable number (i.e. the condition may be changed again (any suitable number)), and the measurement may be followed by the changing of the condition again before step 1085 is performed. After step 1085 and / or before step 1085, step 204 may be performed, in which it is checked whether the end of the test has been reached. If this is not the case, the steps mentioned may be repeated, i.e. a loop 206 may be performed, resulting in the conditions for starting or at least for performing steps 106 and / or 202 again.

[0254] in other words, Figure 5a An example of a generalized beam / null locking procedure applied to multiple measurements is shown.

[0255] Figure 5b A schematic flow chart of a method 2002 with steps 1026, 1046 and 106 as described in connection with method 1006 is shown. After one or more measurement parameters have been measured, step 202 is performed, in which one or more conditions are changed. The condition may relate to the beam (i.e. it may be changed or temporarily unlocked), and / or may relate to communication parameters. The measurement 106 may then be performed again. Steps 202 and 106 may be present in any suitable number (i.e. the condition may be changed again (any suitable number)), preferably the indicated times T1 and T2 have passed, since after those times the beam and / or the null point may return to a "free moving", unlocked state, respectively. After unlocking the beam and / or the null point and / or after step 106, step 204 may be performed, in which it is checked whether the end of the test has been reached. If this is not the case, the steps mentioned may be repeated, i.e. a loop 206 may be performed, resulting in the conditions for starting or at least for performing steps 106 and / or 202 again.

[0256] in other words, Figure 5bAn example of a generalized beam / null locking procedure over a fixed period of time applied to multiple measurements is shown.

[0257] Pattern locking (in particular, the beam locking function) is closely related to the beamforming configuration and can be used separately for the components involved in transmission (Tx) and reception (Rx) in the transceiver in the case where the beam pattern includes a receiving beam and a transmitting beam (i.e., a beam for transmitting and a beam for receiving). According to an embodiment, the test process is performed so that during one or more first instances, the transmit / transmit beam may be measured and locked while the receiving beam is deactivated, and during at least one second instance, the receiving beam may be activated and locked while the transmitting beam is deactivated. Another feature is related to the Rx part and includes locking the configuration of the Rx beamforming related components and / or related communication parameters in order to lock the receiving beam and measure the receiving beam pattern. The results can then be obtained, for example, using the measurement interface 26 or another interface, via a test interface channel that can be established between the measurement system and the device. In order to collect all possible Rx beamforming configurations (i.e., different beamforming patterns), the above features can be repeated several times. The measured beam pattern can be used in many test setups, such as the radiating two-step method. According to an embodiment, method 100 may be performed so that the device is operated so that it forms a beam pattern including a transmit beam and a receive beam. That is, the beam may be a transmit beam or a receive beam, and may overlap or superimpose with another beam. The method may include: sending a lock signal as a first lock signal to instruct the device to lock the transmit beam and deactivate the receive beam, or to lock the receive beam and deactivate the transmit beam. That is, only one of the two beams is in an active state and locked, wherein this does not exclude the presence of additional beams, especially beams of the same type. The method includes measuring the locked beam. In addition, the method includes sending a second lock signal to instruct the device to activate and lock the receive beam and deactivate the transmit beam, or to activate and lock the transmit beam and deactivate the receive beam. This can be understood as replacing the beam, for example, some or all of the previously deactivated beams are activated. For example, when the receive beam is first measured, then in the second iteration, the transmit beam may be active and locked, or vice versa. The method also includes measuring the locked beam.

[0258] Figure 5c A flow chart of a general method 300 for testing a device using a plurality of measurement conditions obtained, for example, via step 202 is shown according to an embodiment.

[0259] Step 302 includes operating the device so that, for example, by using step 102 iThe freely moving lobes and nulls of the beam generated by the device are obtained in normal operation. Step 304 includes establishing a connection to the device. Step 306 includes, for example, by i In step 308, a locking signal is sent to the device to instruct the device to lock the communication parameters. Step 308 includes, for example, by performing step 104 i The device may be configured to lock the beam of the device by sending a locking signal to the device and / or instructing the device to lock the beam of the device by sending an equivalent separate signal. Step 312 includes determining a metric of the device, for example, the measurement performed in step 106. Step 314 includes changing the measurement conditions of the device, for example, a change of a beam, a part of a beam and / or a beam pattern and / or a communication parameter, for example as described in conjunction with step 202. The change may also refer to activating and / or deactivating other lobes or nulls than those measured in step 312. Step 316 includes repeating the determination of the metric of the device and / or changing the measurement conditions of the device, i.e., steps 312 and / or 314 may be repeated. Note that this repetition may be performed more than once, for example, as many different configurations of the device to be measured. Alternatively, step 316 may be omitted. Step 318 includes instructing the device to unlock the beam and communication parameters.

[0260] According to an embodiment, locking a portion of the beam may also include deactivating an unlocked portion of the beam. When the measurement conditions are changed, other portions may be locked so that the other portions are activated while the active portion of the beam is deactivated. This may be understood as sweeping across portions of the beam. Such a pattern locking concept may involve a single (pencil-shaped) beam that may be easily visualized. For example, when a link is established with a single user, such a beam may be the main lobe of an antenna radiation pattern. According to an embodiment, a multi-user scenario is introduced so that more than one beam may be locked in order to evaluate the performance of a device designed to serve multiple users simultaneously. According to such an embodiment, the device may be implemented so that the formed beam includes multiple lobes and / or multiple nulls between the lobes. The device may be configured to deactivate at least a first lobe or null in a time-variable manner during a first time interval in response to a locking signal, and to deactivate at least a second lobe or null during a second time interval.

[0261] As described, this may be achieved, for example, by using a dedicated unlock signal, or automatically, for example, by instructing the device to lock the beam and / or communication parameters until a specific condition is achieved (e.g., an indicated time interval has passed), the device has turned a dedicated angle (e.g., 360°) or each parameter / condition has been set to be tested at least once. That is, instructing the device to unlock the beam and communication parameters may include: using time information indicating the duration of the lock to instruct the device to lock at least one of the beam and communication parameters, so that the beam and / or communication parameters are unlocked after the duration. Alternatively or additionally, instructing the device to unlock the beam and communication parameters may include sending an unlock signal to the device indicating information requesting the device to unlock the beam and / or communication parameters.

[0262] Thus, in addition to locking the beam, other parameters may also be locked. This may include various parameters in addition to beam locking itself or as an alternative to beam locking, which involves locking the (main) beam or lobe in a given direction (boresight) in order to perform a specific test. According to an embodiment, such a concept is extended in order to generate new use cases and test cases. As a non-limiting example, this may include:

[0263] Prepare to lock the beam / null, i.e. create the state or condition of the DUT to be locked

[0264] Prepare to lock onto a specific beam or a specific combination of beams, such as beam 1, beam 2, or beams 1 to N

[0265] o Define a "beam sequence lock with specified time period" command (time period and beam sequence may be signaled via higher layer signaling)

[0266] a. Lock beam #1 within time period t1 seconds

[0267] b. Release beam #1 after t1 seconds

[0268] c. Lock beam #2 within time period t2 seconds

[0269] d. Release beam #2 after t2 seconds

[0270] e. Repeat for all beams in the specified beam sequence

[0271] Prepare to lock a specific zero point or a specific combination of zero points, such as zero point 1, zero point 2, or zero points 1 to N

[0272] o Define a "zero sequence lock with specified time period" command (time period and zero sequence may be signaled via higher layer signaling)

[0273] a. Lock zero point #1 within t1 seconds

[0274] b. Release zero point #1 after t1 seconds

[0275] c. Lock zero point #2 within t2 seconds

[0276] d. Release zero point #2 after t2 seconds

[0277] e. Repeat for all zero points in the specified zero point sequence

[0278] Replace beam pairs, replace multiple beams

[0279] Replace zero point pair, replace multiple zero points

[0280] Prepare tracking beam / null

[0281] Tracking / measurement beam / null point

[0282] Preparing to lock one or more beams or a portion thereof may be understood as establishing conditions for the device / DUT to operate in the mode to be measured locked during measurement. Note that a combination of beams / lobes and nulls may also be locked and / or prepared to be locked.

[0283] Alternatively or additionally, it is possible to combine Figure 3c The measurement of the receiver interference suppression capability is performed as described (freely moving null while keeping the main beam direction fixed).

[0284] This may include creating intra-cell / inter-cell interference scenarios and sending a "beam lock" command (ie, a lock signal indicating the corresponding beam or part of a beam) to the DUT to keep the beam direction fixed. The following steps may then be performed individually or in combination.

[0285] Perform receiver interference rejection measurements (e.g., by varying the receiver sensitivity at the power level of the interfering signal)

[0286] • Perform receiver interference source tracking performance measurements (e.g., time-to-track interference sources, or absolute zero depth by changing the direction of the interference signal, or the generation of new interference signals).

[0287] Alternatively or additionally and with reference to Figure 3c , which may include measurements of the receiver's interference suppression capabilities (fixed null direction and changing main beam direction). The following steps may then be performed individually or in combination.

[0288] • Create intra-cell / inter-cell interference scenarios and send a "null lock" command (i.e., a lock signal indicating the corresponding null) to the DUT to keep the null direction fixed.

[0289] Perform receiver interference rejection measurements (e.g., by varying receiver sensitivity such as Tx signal power level or modulation)

[0290] Perform receiver beam tracking performance measurements (e.g., tracking the beam over time by changing the Tx signal or DUT direction).

[0291] Prepare to scan beam / null point

[0292] Scan the beam / null point with a given step size / for a given duration

[0293] refer to Figure 5a , Figure 5b and Figure 5c The measurement system may be configured to iteratively lock a beam and at least one communication parameter of the device in at least a first iteration and a second iteration. The measurement system may also be configured to determine a characteristic of the device after the beam and at least one communication parameter have been locked (the characteristic being dependent on the at least one communication parameter), and to unlock the beam and at least one communication parameter.

[0294] The measurement system may include a test fixture 35 configured to hold the device 10 and a measurement unit 26 configured to determine a characteristic of the device. The measurement system may be configured to move the device relative to the measurement unit 26 between determining the characteristic in the first iteration and the second iteration.

[0295] Figure 6a A schematic block diagram of a device 101 according to an embodiment is shown. The device includes a plurality of antenna elements 42 combined to form antenna arrays 441 and 442, wherein, by way of non-limiting example only, each of the antenna arrays 441 and 442 includes 8 antenna elements 42. Although described as having 2 antenna arrays, the device 101 may include a different number of antenna arrays, such as 1, 3, 4, 5 or even more. Although described as having the same number of antenna elements 42, the antenna array 44 may include a different number of antenna elements from each other. Although described as having 8 antenna elements 42, the antenna arrays 441 and / or 442 may include different numbers, such as at least 1, at least 2, at least 4, at least 9 or even more. Each of the antenna arrays 441 and 442 may be configured to form its own beam, wherein the beams may overlap, for example, in the far field, and may form a common beam or beam pattern. In response to a locking signal, the device 101 may be configured to lock onto a beam or a portion thereof formed by only some of the total number of antenna arrays.

[0296] in other words, Figure 6a An example of a user equipment consisting of two uniform linear antenna arrays, each containing 8 antenna elements (not drawn to scale) is shown.

[0297] Figure 6b A schematic block diagram of a device 102 is shown, which has 8 subarrays 461 to 468 of antenna elements 42, each antenna subarray 46 including, for example, 256 antenna elements 42 arranged in a 16×16 matrix. The number of subarrays, the number of antenna elements therein and / or the number of antenna elements between different subarrays 46 may be different from the configuration shown. The number of subarrays may be, for example, at least 1, at least 3, at least 4, at least 5, at least 10 or even more. The number of antenna elements therein may be, for example, at least 1, at least 5, at least 10, at least 100 or even at least 500 or more. The antenna elements may be arranged in any suitable order, for example according to a square, a straight line, a rectangle or any other order. The subarrays may be formed equally or differently from each other. As described for the antenna arrays, each subarray may form at least a portion of a beam. Thus, the locking signal may indicate locking a portion of the entire beam pattern generated by a particular subarray or by all subarrays.

[0298] For example, the DUT may include one or more antenna arrays, wherein at least one of the antenna arrays itself includes a plurality of sub-arrays, the number being any number greater than 1. For example, the antenna arrays or sub-arrays may be arranged in a tiled structure. Such a structure may be referred to as an arrangement of antenna panels, wherein each antenna panel may be a functional unit of an antenna array or sub-array. Each of these panels may be designed to form one or more beams for transmission and / or reception purposes. The locking signal may indicate locking of one or more beams generated by the panel, i.e., all beams or only a subset thereof. This may be used for various purposes, including but not limited to testing and measuring patterns generated by antennas included in the panel. Alternatively or additionally, the locking signal may indicate locking of one or more beams associated with each panel. This may allow control of a configuration in which a complete antenna or antenna array includes one or more panels. The DUT may be configured to operate accordingly, i.e., the locking signal may cause the DUT to lock one or more specific beams of a panel or sub-array independently of other beams of the same panel and / or different panels.

[0299] These embodiments may be applied to any arrangement of panels and sub-panels, examples of which may include both regular and irregular tiling schemes. Considering an apparatus such as apparatus 10, the wireless interface of the apparatus may include multiple antenna sub-arrays, each antenna sub-array being configured to form at least a portion of a portion of a beam pattern.

[0300] in other words, Figure 6bAn example of a base station antenna array consisting of 8 sub-panels (sub-arrays) is shown. Each sub-panel consists of a 16×16 uniform rectangular array containing 256 antenna elements (not drawn to scale).

[0301] Figure 7 A schematic block diagram of an apparatus 10 is shown, and the apparatus 10 is configured to transmit a beam pattern 14, for example, so as to include three lobes, wherein lobe 482 can form a main lobe / beam, and lobes 481 and 483 can form side lobes. Null points 521 and 522 are arranged between the two beams 481 and 482, and 482 and 483, respectively. Note that the null point 52 can be arranged independently of the beam or lobe. The apparatus can be configured to form any other beam and / or combination of beams, i.e., an extended beam pattern. In addition, a beam can be formed by more than one lobe. For example, the apparatus 10 can form a quasi-omnidirectional first beam pattern to receive or send control information, and can use a different beam pattern with lobes and / or null points to transmit / send or receive user data. Alternatively or additionally, the apparatus can be configured to form a beam pattern so as to include at least one transmit beam and at least one receive beam.

[0302] The embodiments described herein may relate to a test setup comprising a test system and one or more DUTs (e.g., at least one base station and / or at least one UE). During a test to be performed for testing one or more properties and / or behaviors of at least one DUT, the measurement system and the one or more DUTs may communicate with each other, for example using a lock signal 24 and / or a status signal 33.

[0303] Some embodiments described herein relate to over-the-air (OTA) measurements, i.e., the measurements performed may be performed at least partially but preferably completely over the air (i.e., wirelessly). This does not exclude additional communication between the DUT and the measurement system via additional channels (also referred to as side channels), for example, to instruct the DUT to operate in a dedicated manner. Such side channels may be implemented wired and / or wirelessly as described in conjunction with the device 10 sending the signal 33 to the test setup 20.

[0304] The device can use the corresponding signal 33 for different purposes, such as facilitating measurement. Some embodiments are described below. The signal 33 can be referred to as a status signal indicating the state of the device or the reply to the received query. The status signal 33 can be automatically sent by the device, that is, when a trigger occurs to send such a transmission and / or respond to the received request signal (e.g., from the measurement system 30). The triggering event can be, for example, a change in the operation of the device, such as a change in the operating mode, a change in the control of the beamforming, a deviation from the requested operation (e.g., a part of the beam cannot be locked and / or communication parameters), and / or a time interval. The request signal can be included or included in the locking signal 24 and / or can be sent as a separate signal using an interface (e.g., a transmission interface 32, a measurement interface 26 or a different interface). That is, a communication related to the state, test and / or other purposes of the device can be established between the device 10 and the measurement system 30. Such communication can allow the test performed by the measurement system to be facilitated. In particular, this communication can allow the state of another partner in the measurement setting to be kept transparent, especially the state of the device 10 for the measurement system 30.

[0305] According to an embodiment, by sending a status signal 33, the device 10 can indicate which operating mode is implemented or activated. This can allow the measurement system 30 to adapt the test conditions according to the indicated operating mode. For example, before starting a measurement, the device 10 can be instructed, for example by the measurement system 30, to operate sequentially in multiple operating modes, wherein the operating modes can differ from each other with respect to beam patterns (e.g., the number of beams and / or a subset of a set of beams that may be formed) and communication parameters (e.g., the direction of the beam, the power of the beam, the modulation and coding scheme of the beam, etc.). This can allow the measurement system 30 to test the device in multiple operating modes without having to indicate the device 10 to each separate operating mode between tests. In addition, this can allow time synchronization between the device 10 and the measurement system 30 to be obtained. Alternatively or additionally, this can allow a common time base between the device and the measurement system, for example, for changing configuration, calibration, etc. using a guard interval between measurements.

[0306] When performing a multi-step measurement that includes multiple steps that differ from each other (e.g., with respect to the orientation of device 10, the operating mode of device 10, the number of active DUTs in the measurement setup, etc.), status signal 33 can also be used to indicate that device 10 is ready to respond to the next step.

[0307] As described above, a single-step measurement and / or a step in a multi-step measurement may be indicated. Alternatively or additionally, other parts or properties of the beam pattern may be indicated to be locked. Such locking may include a provocation and / or instruction for setting the corresponding property or communication parameter to a desired value. For example, a power spectral density (PSD) may be indicated to be adjusted at least according to a predefined pattern over a dedicated frequency band, i.e., along one or more steps, the PSD must remain constant or must vary along different steps of the measurement.

[0308] An acknowledgement, response or confirmation signal may be sent between some or even all steps of a measurement. In a single-step measurement, such a signal may also be sent once or a greater number of times. Examples of such an acknowledgement may be:

[0309] "Lock of analog phase to Rx beam #m (e.g., while maintaining digital phase) is complete"

[0310] "Digital phase lock on Rx beam #m complete"

[0311] "Lock of analog and digital phases to Rx beam #m is complete"

[0312] "Lock failure during simulation phase on Rx beam #m"

[0313] "Analog phase lock on Tx beam #m complete"

[0314] "Lock on Tx Zero #n completed"

[0315] “The locking of the simulation phase to the Rx beam {#a, #b, #m}∈M is completed”, where M is the set of all possible Rx beams

[0316] "Digital phase lock on Rx beam #m complete"

[0317] "Activation / deactivation of beam #m completed"

[0318] · Response to inquiries reporting the requested information

[0319] To identify and name one or more beams and / or nulls, the corresponding signal may include an identifier identifying at least one beam / null. The identifier may be a number or any other suitable identifier. For example, beams may be distinguished or differentiated from one another by using predefined known symbols, such as the symbol of a sounding reference signal (SRS) transmitted within a beam. The predefined symbols may vary from beam to beam, so that by determining the symbols, it may be determined which beam(s) are formed. Thus, the lock signal may include one or more parameters, such as one or more of the following:

[0320] A time including a deactivation time (e.g., a value between a minimum and maximum value may indicate a lock for a specific indicated time, where a minimum value (e.g., 0) may indicate an unlock, and a maximum value may indicate a permanent lock)

[0321] Beam number / identifier, e.g. two beams on the same panel or two beams from different panels or different beams for SRS and data

[0322] Part of the beam pattern, such as nulls, side lobes, ...

[0323] Allocated frequency band

[0324] Note that this list is not complete and only shows possible components of status signal 33, which may include the following, among others:

[0325] The action to be performed (e.g., lock / unlock / wait / prepare)

[0326] Part of the beam pattern control network (analog stage, digital stage)

[0327] Communication direction (Rx and / or Tx)

[0328] An indicator of the beam or beams to apply

[0329] The status of the action (e.g., completed, failed, queued, upcoming, number of completed, etc.)

[0330] In conjunction with the status "failed" of the action (e.g. for "link failed" or "lock failed"), the device can, for example, send a report about the reason why it failed or terminated a specific lock command. The device (UE) can send a message or can save the status (e.g. in a log file) even if the link between the SS (measurement system) and the UE (device) is lost or misunderstood. Alternatively or additionally, the SS can send a beam lock status request, requesting the DUT to send information (the request can be an additional command requesting verification that the beam is always locked). In response to this, the device can report its status to the measurement system. In response to this, the measurement system can send an unlock signal to the device to deactivate the beam lock.

[0331] According to an embodiment, the device 10 may send a status signal 33 to indicate another operating mode (e.g., so as not to be tested). For example, the device 10 may indicate that it is recalibrating or ending the current operating mode, and thereby may indicate that the current or subsequent time intervals will be excluded from the test range.

[0332] Depending on the embodiment, the unlocked beam can be deactivated or remain unlocked and active. This allows scenarios where the locking of the Rx beam and the Tx beam are independent, so that, for example, the Rx beam can remain in tracking mode while the Tx beam can be locked. For example, the main beam can be fixed / locked while maintaining null tracking to a certain direction.

[0333] According to an embodiment, the lock signal indicates a certain time that has passed before an event, for example, a command such as "freeze zero / beam for time x" or "do ... until ..." / "do ... after ..." Using the status signal 33, the device 10 can indicate that the indicated time or wait condition has passed.

[0334] According to an embodiment, the device 10 is configured to receive the control signal 24 and can send a status signal 33 as a completion signal, which indicates that the requested lock is completed, done, finished or executed. In other words, the device can answer the requested operation. This allows the measurement system to perform the test based on the knowledge that the device has switched to the requested operation, so unnecessary waiting time before the device is expected to complete the operation can be avoided. The same applies to the unlock signal. The device can send the signal 33 as a completion signal to indicate that the beam pattern or a part of the requested beam pattern is unlocked.

[0335] According to an embodiment, the device may send a status signal 33 to include information indicating the status of the device. An example of such status information is information indicating one or more beams formed by the device, such as the number thereof. For example, a device configured to form N transmit beams and / or M receive beams may indicate which of the N beams and M beams is currently formed and / or which beam is not formed. When the measurement system knows what the device is doing, this may allow the measurement system to determine or check the operation of the device.

[0336] According to an embodiment, the measurement system may be configured to request such status information from the device, for example by including such request in a lock signal and / or by sending a suitable request signal using an interface (eg, measurement interface 26 or a different interface). Alternatively, the device may send the status signal 33 automatically.

[0337] Alternatively or additionally, the measurement system may request status information from the device. For example, using the status signal, the measurement system may request information related to current and / or planned and / or past operations, such as which beam(s) are currently active or which beam(s) will be activated next. Alternatively or additionally, the request or query may include information to indicate a request to send: information indicating the MCS state, power level, Rx gain of the device 10; information related to power control, automatic gain control (AGC), EQ (equalizer) active / inactive, EQ tracking, beam lock status (e.g., active / inactive / identifier of a locked beam, etc.). Alternatively or additionally, the requested information may relate to a power level set by the device 10 and / or a confirmation of the indicated power level. Each parameter and / or each communication parameter that at least partially describes the beam pattern property 14 may be set or indicated by the measurement system, for example using a lock signal or a different signal. Alternatively or additionally, each parameter and / or each communication parameter at least partially describing the beam pattern 14 may be set or indicated by the measurement system and may be confirmed or reported by the device 10, DUT, respectively. The confirmation may be implemented similarly to a reply / complete command, but may be sent on a request / query.

[0338] According to an embodiment, the measurement system 30 may be configured to measure the power and phase of the beam formed by the device. According to other embodiments, the measurement system may be configured to measure the beam pattern purely based on the received power (e.g., using a power meter). Compared to sensors that can measure the amplitude and phase of the received electromagnetic waves, such "power-only" detectors can be configured to measure power levels without phase information. If a power-only detector is used, although the measured test signal may have a constant power over time, the test is performed using only one beam / null formed therein and with the ability for each element to be weighted with the same antenna weight. Suitable test sequences may use continuous wave (CW) transmissions and / or use a suitable SRS.

[0339] Based on the use of beam identifiers and combined Figure 8a , Figure 8b and Figure 8c In the embodiment described in detail, the measurement process can be implemented by the measurement device 20 .

[0340] For example, first and foremost Figure 8aAs shown, a first beam / null or a subset of possible beams / nulls to be formed by the device may be formed. The beam pattern may include at least a main lobe / beam 482 and a null 52, the null 52 pointing in a direction 54 relative to the device 10. The lobe 482 may be pointed at a measurement interface 26 where measurements may be performed. As a second step, the beam pattern 14 may be locked. That is, the method for testing the device may include operating the device 10 so as to obtain a beam pattern 14 produced by the device 10. This may be similar to as described in conjunction with steps 102 and / or 302. As described in conjunction with steps 306 and 308, the device 10 may be instructed to lock at least a portion of the beam pattern 14 and communication parameters.

[0341] like Figure 8b As shown in , thirdly, the device 10 can be moved / turned / rotated / positioned, for example, until the null point 52 points to the link antenna or the measurement interface 24, that is, the direction 54 can be substantially directed to the measurement interface 26. The measurement interface 26 can measure the null point 52. That is, the device can be moved so that the null point 52 of the beam pattern 14 points to the measurement interface 24 configured for measuring the beam pattern 14.

[0342] like Figure 8c As shown, fourthly, the device 10 may be requested to form an additional beam / lobe 483, which may be directed to the measurement interface 26 and may therefore overlap with the null 52. Fifthly, measurements such as crossbeam interference measurements may be performed using the measurement interface 26, i.e., the impact of the additional beam 483 on the null 52 may be measured. In order to indicate which beam must be activated, an identifier of the beam may be used. That is, the device may be instructed to at least form a lobe 483 of the beam pattern 14 to overlap the null 52. The metric of the device 10 may be determined as described, for example, in conjunction with steps 106 and / or 312, i.e., the measurement of the beam pattern 14 may be performed using the measurement interface.

[0343] The measurement system 30 may indicate that it requests the device 10 to send a status signal 33. The measurement system 30 may set a corresponding flag in a lock signal or a different message and / or may send a corresponding signal to the device 10. That is, the measurement system 30 may use a flag indicating a request to react to a set of commands or at least to a lock signal 24 and / or an unlock signal. Alternatively or additionally, a flag may be used to deactivate a response to another set of conditions.

[0344] Although some aspects have been described in the context of an apparatus, it will be clear that these aspects also represent a description of a corresponding method, wherein a block or device corresponds to a method step or a feature of a method step. Similarly, aspects described in the context of a method step also represent a description of an item or feature of a corresponding block or corresponding apparatus.

[0345] Depending on certain implementation requirements, embodiments of the present invention may be implemented in hardware or in software. The implementation may be performed using a digital storage medium (e.g., a floppy disk, DVD, CD, ROM, PROM, EPROM, EEPROM or flash memory) on which electronically readable control signals are stored, which cooperate (or are capable of cooperating) with a programmable computer system to perform the corresponding method.

[0346] Some embodiments according to the invention comprise a data carrier having electronically readable control signals, which are capable of cooperating with a programmable computer system, such that one of the methods described herein is performed.

[0347] Generally, embodiments of the present invention may be partially implemented as a computer program product with a program code, the program code being operable to perform one of the methods when the computer program product runs on a computer.The program code may, for example, be stored on a machine-readable carrier.

[0348] Other embodiments comprise the computer program for performing one of the methods described herein, stored on a machine readable carrier.

[0349] In other words, an embodiment of the inventive method is, therefore, a computer program having a program code for performing one of the methods described herein, when the computer program runs on a computer.

[0350] A further embodiment of the inventive methods is, therefore, a data carrier (or a digital storage medium, or a computer-readable medium) on which is recorded the computer program for performing one of the methods described herein.

[0351] Therefore, another embodiment of the inventive method is a data stream or a sequence of signals representing the computer program for performing one of the methods described herein. The data stream or the sequence of signals may, for example, be configured to be transmitted via a data communication connection (eg, via the Internet).

[0352] A further embodiment comprises a processing means (for example a computer or a programmable logic device) configured to or adapted to perform one of the methods described herein.

[0353] A further embodiment comprises a computer having installed thereon the computer program for performing one of the methods described herein.

[0354] In some embodiments, a programmable logic device (e.g., a field programmable gate array) can be used to perform some or all of the functions of the methods described herein. In some embodiments, a field programmable gate array can collaborate with a microprocessor to perform one of the methods described herein. Typically, the method is preferably performed by any hardware device.

[0355] The above embodiments are merely illustrative of the principles of the present invention. It should be understood that modifications and variations of the arrangements and details described herein will be apparent to other persons skilled in the art. Therefore, it is intended that the scope of the present invention be limited only by the scope of the appended patent claims and not by the specific details given by way of the description and explanation of the embodiments herein.

[0356] References

[0357] [1]ISO / IEC standard 7498-1:1994

[0358] [2]3GPP TR 38.803, "Study on new radio access technology: RadioFrequency(RF) and co-existence aspects(Release 14)", V14.2.0, 2017-09-28: URL

[0359] [3]3GPP TS 25.141, "Base Station(BS)conformance testing(FDD)(Release15)", V15.0.0(2017-09)

[0360] [4] 3GPP TS 34.114, "User Equipment (UE) / Mobile Station (MS) Over The Air (OTA) antenna performance; Conformance testing (Release 12)", V12.2.0 (2016-09).

Claims

1. A measuring device (20), comprising: Measuring systems and devices to be tested using said measuring systems; wherein the measurement system is configured to operate the device (10) to obtain a beam pattern (14) generated by the device (10); wherein the measurement system is configured to instruct the device (10) to lock at least a portion of the beam pattern (14) and communication parameters; wherein the measurement system is configured to move the device (10) so that a zero point (52) of the beam pattern (14) points to a measurement interface (24) configured to measure the beam pattern (14); wherein the measurement system is configured to instruct the device (10) to at least form a lobe of the beam pattern (14) to superimpose the null point; and The measurement system is configured to measure the beam pattern (14) using the measurement interface (24).

2. A method for testing a device (10), the method comprising: operating the device (10) to obtain a beam pattern (14) produced by the device (10); instructing the device (10) to lock onto at least a portion of the beam pattern (14) and communication parameters; Moving the device (10) so that a zero point (52) of the beam pattern (14) points toward a measurement interface (24) configured to measure the beam pattern (14); instructing the device (10) to form at least a lobe of the beam pattern (14) to superimpose the null; as well as The beam pattern (14) is measured using the measurement interface (24).

3. A non-transitory storage medium having computer-readable instructions stored thereon, the computer-readable instructions being configured to perform the method according to claim 2 when executed on a computer.

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