Abnormality detection method, device and electronic device

Abstract

The application discloses an abnormality detection method, device and electronic equipment. When the electronic equipment is abnormal, the application determines whether the working parameters of target components of the electronic equipment are abnormal, the target components being at least one. According to the determination result, different diagnosis strategies are used to determine the cause of the abnormality of the electronic equipment, the cause including at least the component of the electronic equipment that is abnormal. The application can accurately and reliably find the cause of the abnormality of the electronic equipment.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of information processing, and more particularly, to an exception detection, device, method and electronic equipment. BACKGROUND

[0002] With the continuous development of electronic equipment, the types of components in electronic equipment are also increasing.

[0003] In the case of an exception in an electronic equipment, the electronic equipment may be down. Manually checking each component in the electronic equipment for an exception is complicated. Therefore, how to conveniently and effectively determine the exception cause of the electronic equipment is a technical problem to be solved by those skilled in the art. SUMMARY

[0004] The present application provides an exception detection method, device and electronic equipment.

[0005] The exception detection method comprises the following steps:

[0006] When the electronic equipment is running abnormally, determining whether the working parameter of a target component of the electronic equipment is abnormal, the target component being at least one;

[0007] According to the determination result, a different diagnosis strategy is used to determine the cause of the abnormal running of the electronic equipment, the cause including at least a component of the electronic equipment running abnormally.

[0008] Preferably, the method further comprises:

[0009] At least outputting a prompt of the component of the electronic equipment running abnormally; and / or,

[0010] At least marking the component of the electronic equipment running abnormally, so that the electronic equipment can skip the component running abnormally to start.

[0011] Preferably, the step of determining the cause of the abnormal running of the electronic equipment according to the determination result using a different diagnosis strategy comprises:

[0012] When the determination result is abnormal, at least determining the component of the electronic equipment running abnormally based on the current working parameter of the target component; and / or,

[0013] When the determination result is normal, entering a preset diagnosis mode to at least determine the component of the electronic equipment running abnormally based on the working parameter of the target component after re-powering.

[0014] Preferably, when the determination result is abnormal, at least determining the component of the electronic equipment running abnormally based on the current working parameter of the target component comprises:

[0015] In the case that the target component is unique, determining whether the target component is abnormal based on preset working parameters and current working parameters of the target component; or,

[0016] In the case that the target component is not unique, determining the component of the electronic device that is abnormal based on a preset working parameter table and current working parameters of each target component.

[0017] Preferably, in the case that the determination result is normal, in response to entering a preset diagnosis mode, determining the component of the electronic device that is abnormal based on at least working parameters of the target component after power-on.

[0018] In the case that the determination result is normal, automatically or passively entering a preset diagnosis mode to be able to trigger power-off and power-on of the target component;

[0019] Obtaining working parameters of the target component after power-on and testing and analyzing the target component after power-on;

[0020] Determining the component of the electronic device that is abnormal based on the working parameters of the target component after power-on and a result of the testing and analyzing.

[0021] Preferably, at least outputting a prompt of the component of the electronic device that is abnormal, comprising:

[0022] Outputting a prompt of the component of the electronic device that is abnormal in a preset manner and at least saving obtained abnormal data of the component of the electronic device that is abnormal.

[0023] Preferably, at least marking the component of the electronic device that is abnormal, comprising: marking the determined component of the electronic device that is abnormal to an embedded controller and / or a specified register; or,

[0024] Marking the determined component of the electronic device that is abnormal to an embedded controller and / or a specified register and cutting off power supply of the component of the electronic device that is abnormal.

[0025] Preferably, after entering the preset diagnosis mode, further comprising:

[0026] Intercepting a boot signal of the electronic device to prohibit the boot signal from being given to an input / output system of the electronic device; and / or,

[0027] In the case that the component of the electronic device that is abnormal is marked, further comprising:

[0028] Giving the boot signal to the input / output system of the electronic device to read information of the marked component of the electronic device that is abnormal in an initialization process, so that the electronic device can skip the component of the electronic device that is abnormal to achieve start-up.

[0029] In another aspect, the present application provides an abnormality detection apparatus, comprising:

[0030] a first abnormality analysis unit configured to determine whether a working parameter of a target component of the electronic device is abnormal when the electronic device is abnormal, the target component being at least one;

[0031] a second abnormality analysis unit configured to determine a cause of the abnormality of the electronic device according to the determination result and different diagnosis strategies, the cause including at least a component of the electronic device that is abnormal.

[0032] In another aspect, the present application provides an electronic device, comprising:

[0033] a controller and at least one target component

[0034] The controller is configured to perform the abnormality detection method according to any one of the above.

[0035] According to the above solution, the present application can determine whether a working parameter of a target component of the electronic device is abnormal, and once the electronic device is abnormal, different diagnosis strategies can be flexibly adopted to determine the cause of the abnormality of the electronic device based on the detection result of whether the working parameter of the target component is abnormal, so that the cause of the abnormality of the electronic device can be more targeted and reasonably determined, and the cause of the abnormality of the electronic device can be more accurately and reliably determined. BRIEF DESCRIPTION OF DRAWINGS

[0036] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0037] Figure 1 a flowchart of an embodiment of an abnormality detection method provided by the present application;

[0038] Figure 2 a flowchart of another embodiment of an abnormality detection method provided by the present application;

[0039] Figure 3 a flowchart of another embodiment of an abnormality detection method provided by the present application;

[0040] Figure 4 a flowchart of an abnormality detection method provided by the present application in an application scenario;

[0041] Figure 5A component structure schematic diagram of an abnormality detection device provided in the present application;

[0042] Figure 6 A component structure schematic diagram of an electronic device provided in the present application.

[0043] The terms "first", "second", "third", "fourth" and the like in the description and claims, and above drawings, if any, are used for distinguishing between similar objects, and do not necessarily have a particular chronological or sequential order. It is to be understood that the use of these terms herein is merely for distinguishing between the similar objects, and does not necessarily indicate a particular chronology or order of execution of the embodiments of the present application. DETAILED DESCRIPTION

[0044] The technical solutions in the embodiments of the present application will be apparently and completely described below with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without creative effort belong to the protection scope of the present application.

[0045] Please refer to Figure 1 , Figure 1 A flowchart of an embodiment of an abnormality detection method provided in the embodiments of the present application. The method in the embodiment can be applied to electronic devices such as mobile phones, notebook computers and desktop computers. The method in the embodiment can include:

[0046] S101, determining whether the working parameter of a target component of the electronic device is abnormal when the electronic device is running abnormally.

[0047] The target component is at least one. The target component can be set as different types of components in the electronic device according to the need. For example, the target component can be a memory, a graphics card, a sound card or a driver.

[0048] It is considered that in the case that there are many components of a certain type in the electronic device, even if it can be determined that there is an abnormality in the components of the certain type in some cases, it may still be necessary to manually investigate to determine which component of the certain type has a problem. In order to solve this problem, the present application is particularly suitable for the case that there are many target components of the same type in the electronic device. Accordingly, the target component is one of the many components of the same type in the electronic device. For example, in the case that the electronic device has many memories, the target component can be a memory of the electronic device.

[0049] In a possible implementation, in the case that the target component is unique, it can be determined whether the current working parameter of the target component is abnormal based on a preset working parameter. The preset working parameter can be a working parameter of the target component in a normal case. Correspondingly, in the case that the target component is not unique, it is determined whether the current working parameter of each target component is abnormal based on a preset working parameter reference table. The working parameter reference table includes the preset working parameter corresponding to each target component.

[0050] In another possible implementation, the electronic device can determine whether the working parameter of the target component of the electronic device is abnormal through an embedded controller (EC). In this case, the target component is connected with the EC. For example, the target component and the EC can be directly connected through some physical lines or connected through other components. Taking the target component as the memory as an example, the EC can be connected with each pin of the memory based on a general-purpose input / output (GPIO) port.

[0051] The working parameter of the target component can be a related parameter in the running of the target component, and the working parameter involved will be different according to the different target components. For example, the working parameter of the target component can include a working voltage, a reference voltage and / or a temperature of the target component, and the like.

[0052] It should be noted that, in the embodiments of the present application, the determination of whether the working parameter of the target component of the electronic device is abnormal can be performed when the electronic device is in a running state, and it is not necessary to care whether the electronic device has a running abnormality. However, if the electronic device has a running abnormality, the specific reason for the running abnormality of the electronic device can be determined based on whether the working parameter of the target component is abnormal.

[0053] S102, according to the determination result, a different diagnosis strategy is used to determine the reason for the running abnormality of the electronic device, and the reason at least includes a component of the electronic device that has a running abnormality.

[0054] The component that has a running abnormality belongs to the target component.

[0055] The determination result is used to indicate whether the working parameter of the target component is abnormal. Correspondingly, the determination result can be divided into two cases: abnormal and normal.

[0056] In the two cases of the determination result being abnormal and normal, the diagnosis strategy is also different.

[0057] As in a possible implementation, in the case that the determination result is abnormal, i.e., the working parameter of the target component is abnormal, the component causing the electronic device to run abnormally can be determined based at least on the current working parameter of the target component. As an example, the component causing the electronic device to run abnormally can be determined based at least on the working parameter of the component. As another example, in the case that the determination result is abnormal, the information of the component with the abnormal working parameter can be directly outputted.

[0058] In yet another possible implementation, in the case that the determination result is normal, the preset diagnosis mode can be entered so as to determine the component causing the electronic device to run abnormally based at least on the working parameter of the target component after being powered on again.

[0059] In the preset diagnosis mode, the target component can be triggered to complete power-off and power-on again. The power-on again of the target component is to enable abnormal detection of the working parameter of the target component, so as to avoid misjudgment that the working parameter of the target component is normal when the electronic device runs abnormally.

[0060] It can be understood that in actual application, the electronic device can automatically or passively enter the preset diagnosis mode to trigger the target component to be powered off and powered on again.

[0061] In the preset diagnosis mode, the electronic device can automatically enter the preset diagnosis mode to power off the target component and power on again when it is determined that the working parameter of the target component is normal in the case that the electronic device runs abnormally.

[0062] In the preset diagnosis mode, the electronic device can passively enter the preset diagnosis mode, i.e., the user triggers the electronic device to obtain an instruction to enter the preset diagnosis mode and enter the preset diagnosis mode. As an example, in the case that the electronic device runs abnormally, if it is detected that the duration of pressing the power-off key exceeds a set duration, the electronic device performs power-off operation and enters the preset diagnosis mode after detecting a power-on instruction of the electronic device.

[0063] The above describes the possible diagnosis strategies in the case that the determination result is normal and abnormal respectively, but it can be understood that in actual application, the diagnosis strategy can include any one or both of the specific determination methods in the case that the determination result is normal and abnormal.

[0064] It can be understood that the determined reason causing the electronic device to run abnormally can further include the abnormal working parameter of the component causing the electronic device to run abnormally and other information related to the component, which is not limited.

[0065] The application can determine whether the working parameters of the target component of the electronic device are abnormal, and once the electronic device has a running abnormality, different diagnosis strategies can be flexibly adopted based on the detection result of whether the working parameters of the target component are abnormal to determine the cause of the running abnormality of the electronic device, so that the cause of the running abnormality of the electronic device can be more targeted and reasonably determined, and the cause of the running abnormality of the electronic device can be more accurately and reliably found.

[0066] It can be understood that after the component of the electronic device with a running abnormality is determined, the application can also at least output a prompt of the component of the electronic device with a running abnormality. By outputting the prompt of the abnormal component, the user can more intuitively and quickly determine the cause of the running abnormality of the electronic device, and the abnormal component can be processed in time to improve the abnormal processing efficiency.

[0067] As an optional mode, the prompt of the component of the electronic device with a running abnormality can be output in a preset mode, and the abnormal data of the obtained component of the electronic device with a running abnormality can be at least saved. Saving the abnormal data of the abnormal component while outputting the prompt can be beneficial to more detailed viewing of the cause and abnormal state of the component abnormality and the like. Of course, in addition to saving the abnormal data of the component of the electronic device with a running abnormality, the data of the component of the electronic device with a running abnormality that does not appear abnormal and the specific situation of the working parameters of the component can also be saved, and the like, which is not limited.

[0068] The specific mode of outputting the prompt of the component of the electronic device with a running abnormality can be various. For example, the prompt can be directly output on the display interface of the electronic device.

[0069] For another example, in the case of determining that the electronic device has a running abnormality through the EC, a display module connected with the EC through a line can also be connected to the outside of the electronic device, and the prompt can be output in the display module. By using the display module connected with the EC separately and arranged outside the electronic device to display the prompt, the situation that the prompt cannot be displayed due to the running abnormality of the electronic device, such as shutdown or shutdown, can be avoided. For example, a digital tube connected with the EC can be connected to the electronic device, and the corresponding prompt can be output on the digital tube.

[0070] It can be understood that after the component of the electronic device with a running abnormality is determined, in addition to the mode of outputting the prompt of the component with a running abnormality, the component of the electronic device with a running abnormality can also be at least marked to enable the electronic device to skip the component with a running abnormality to achieve startup.

[0071] The component of the electronic device with a running abnormality can be marked to the embedded controller EC and / or the specified register.

[0072] The component marked as running abnormally can also be: marking the determined component running abnormally to the embedded controller and / or designated register, and cutting off the power supply of the component running abnormally. It can be understood that by cutting off the power supply of the component running abnormally, the normal operation of the electronic device affected by the component running abnormally can be reduced.

[0073] It can be understood that after determining the component running abnormally of the electronic device, the prompt of the component running abnormally can also be outputted in combination with marking the component running abnormally of the electronic device.

[0074] It can be understood that in order to facilitate the understanding of the different diagnosis strategies for different cases of determination results, the following will be introduced as an example.

[0075] As shown in Figure 2 FIG. 1 is a flow diagram of another embodiment of an abnormality detection method of the present application, and the method of the present embodiment can include:

[0076] S201, when the electronic device is running abnormally, determining whether the working parameter of the target component of the electronic device is abnormal.

[0077] This step can refer to the related description of the previous embodiment, which will not be repeated here.

[0078] S202, in the case of the determination result being abnormal, determining the component running abnormally of the electronic device based at least on the current working parameter of the target component.

[0079] As can be preset, the working parameter of the target component when it is not abnormal, and on this basis, whether the target component is abnormal can be determined based on the preset working parameter corresponding to the target component and the current working parameter of the target component.

[0080] Specifically, in the case of the target component being unique, whether the target component is abnormal can be determined directly based on the preset working parameter and the current working parameter of the target component. For example, if the current working parameter of the target component is different from the preset working parameter, or the target component has a difference between the current working parameter and the preset working parameter corresponding to the working parameter exceeding a preset range, it is determined that the target component has an abnormality.

[0081] In the case of the target component having multiple, i.e. the target component is not unique, the component running abnormally of the electronic device is determined based on the preset working parameter reference table and the current working parameter of each target component. The preset working parameter reference table includes the preset working parameters of each target component, i.e. the working parameters of each target component when it is not abnormal.

[0082] Of course, if the determination result is abnormal, the component determined to be abnormal is obtained based on the target component's working parameter.

[0083] It can be understood that, similar to the previous embodiment, after this step S203, the component running abnormally can also be marked and / or the information of the component running abnormally can also be output, which can be referred to the previous description.

[0084] S203, in the case where the determination result is normal, in response to entering the preset diagnosis mode, triggering the target component to be powered off and powered on again.

[0085] In the case where the determination result is normal, the entering of the preset diagnosis mode can be waited, such as automatic or passive entering of the diagnosis mode, and in the case where it is confirmed that the current has entered the diagnosis mode, the powering off and powering on again of the target component can be completed.

[0086] For example, in the case where the EC determines that the working parameter of the target component is normal, the passive entering of the diagnosis mode is taken as an example for illustration. The entering of the preset diagnosis mode needs to meet two conditions, the first condition is that the non-normal mode shutdown operation is detected, and the second condition is that the power-on signal is detected after the first condition is met. Among them, the operation time of the non-normal mode shutdown operation exceeds the time threshold.

[0087] Correspondingly, in the case where the EC determines that the target working parameter is normal, if the EC detects the non-normal mode shutdown operation, it is confirmed that the first condition of entering the preset diagnosis mode is met. When the first condition of entering the diagnosis mode is met, the electronic device enters the shutdown state and is powered off to the target component. For example, the so-called user long-press shutdown key triggers the shutdown, in this case, the EC confirms that the first condition of entering the preset diagnosis mode is met, and the electronic device will start the shutdown operation and power off the target component.

[0088] After the EC confirms the first condition of entering the preset diagnosis mode, if the EC detects the power-on signal, it is confirmed that the second condition of entering the preset diagnosis mode is met, and then it is determined that the EC is in the preset diagnosis mode and the target component is powered on.

[0089] Of course, this example is taken as the EC passively entering the preset diagnosis mode, if the EC actively enters the preset diagnosis mode in the case where the determination result is normal, such as the EC performing the powering off and powering on again of the target component and confirming the entering of the diagnosis mode, this embodiment is also applicable, and no limitation is made to this.

[0090] S204, obtaining the working parameter of the target component after being powered on again.

[0091] For example, the EC can obtain one or more working parameters of the target component after the power-up through a port connected with a pin of the target component or a line connected with the target component, etc.

[0092] S205, testing and analyzing the target component after the power-up.

[0093] The purpose of the training and testing analysis of the target component is to detect whether the target component has abnormal conditions other than the working parameters.

[0094] Specifically, the testing can be performed on the data processing and signal response state of the target component to detect whether there is an abnormality in the data processing and signal response.

[0095] For example, in a possible implementation, a testing control signal can be sent to the target component after the power-up to make the target component respond to the testing control signal. The testing control signal can carry data or instructions for testing, etc. Accordingly, the running result data of the target component responding to the testing control signal can be obtained to analyze whether the target component has an abnormality in data response based on the running result data. For example, if the running result data is inconsistent with the set running result data corresponding to the testing control signal or the difference exceeds a set range, it can be determined that there is an abnormality in the control signal response.

[0096] The order of S204 and S205 can be interchanged or can be executed simultaneously.

[0097] S206, determining the component with running abnormality of the electronic device based on the working parameters of the target component after the power-up and the testing analysis result.

[0098] The testing analysis result can indicate whether the target component has a testing abnormality. For example, the running result data of the target component can be sent to the target component to determine whether the running result data is abnormal as the testing analysis result.

[0099] Accordingly, if the working parameters of the target component after the power-up and / or the testing analysis result are abnormal, the target component can be determined as the component with running abnormality.

[0100] Similar to the foregoing embodiments, the component with running abnormality can also be outputted and / or marked after the step S206, which will not be described herein again.

[0101] For example, Figure 3 As shown in the figure, the figure shows a flowchart of another embodiment of the abnormality detection method of the present application. The method of the present embodiment can be applied to an electronic device. The present embodiment can include the following steps.

[0102] S301, when the electronic device is running abnormally, determining whether the working parameter of the target component of the electronic device is abnormal.

[0103] S302, in the case of abnormal determination result, determining the component of the electronic device running abnormally based on at least the current working parameter of the target component.

[0104] S303, outputting the prompt of the component of the electronic device running abnormally, and marking the component of the electronic device running abnormally.

[0105] In this embodiment, the prompt of the abnormal component and the marking of the abnormal component are output simultaneously, but it can be understood that only the prompt of the abnormal component or the marking of the abnormal component is also applicable to this embodiment, and the specific output prompt and marking of the abnormal component can refer to the related description above.

[0106] S304, in the case of normal determination result, intercepting the power-on signal of the electronic device in response to entering the preset diagnosis mode.

[0107] It can be understood that in order to make the target component be powered off and powered on again, the electronic device entering the diagnosis mode needs to be powered off first and the power-on signal is obtained. Accordingly, when it is confirmed that the preset diagnosis mode is entered, the power-on signal of the electronic device can be intercepted so as to subsequently test the target component without executing the power-on operation of the electronic device.

[0108] For example, still taking the above example of the EC entering the preset diagnosis mode, after the first condition of the EC entering the preset diagnosis mode is met, the electronic device is powered off, and the target component is powered off accordingly. When the electronic device receives the power-on signal, the second condition of the EC entering the preset diagnosis mode is met, and the EC will intercept the power-on signal in response to having entered the preset diagnosis mode.

[0109] S305, obtaining the working parameter of the target component after being powered on again, and testing and analyzing the target component to determine the component of the electronic device running abnormally.

[0110] The step S305 can refer to the related description of 204-206 above, which will not be repeated here.

[0111] S306, outputting the prompt of the component of the electronic device running abnormally, and marking the component of the electronic device running abnormally, so that the electronic device can skip the component running abnormally to realize startup.

[0112] The step is similar to S303, but since the power-on signal is intercepted when entering the preset diagnosis mode, the component marked as running abnormally can make the electronic device skip the marked component running abnormally during the subsequent boot operation to avoid affecting the normal operation of the electronic device due to the component running abnormally.

[0113] S307, the power-on signal is given to the input and output system of the electronic device to read the information of the marked component running abnormally during the initialization process, so that the electronic device can skip the component running abnormally to start.

[0114] The input and output system can be a module for performing the boot start of the electronic device in response to the power-on signal, for example, the input and output system can be a firmware system, for example, a basic input and output system (BIOS) system or a unified extensible firmware interface (UEFI) and the like.

[0115] For example, the determined component running abnormally is marked in the embedded controller and / or the specified register, and the specified register can be a register required to be read before the input and output system is initialized. Correspondingly, the input and output system can read the information of the marked component running abnormally from the embedded controller or the specified register. In this case, the input and output system does not perform initialization and related preparation required for the marked component to start other components, thereby realizing the boot of the electronic device.

[0116] In order to facilitate understanding of the scheme of the present application, the following will take the EC as an example to determine the abnormal component causing the electronic device to run abnormally, and for the convenience of description, the target component to be detected is taken as the memory of the electronic device. It is assumed that the electronic device has multiple memories, for example, see Figure 4 which shows the flowchart of the abnormality detection method of the present application in an application scenario, the method of the present embodiment can include:

[0117] S401, the EC of the electronic device obtains the current working parameters of each memory through the GPIO port connected to the pin of each memory.

[0118] Different pins of the memory can output different working parameters of the memory, and by connecting the EC to the corresponding pins in the memory, the working parameters output by different pins in the memory can be obtained.

[0119] It should be noted that this time is an example of the EC connecting with the pins of the memory through the GPIO port, but the EC connecting with the pins of the memory through other interface forms is also applicable to the embodiment.

[0120] S402, for each memory, the EC determines whether the memory has an exception based on the current working parameter of the memory and the preset normal working parameter.

[0121] The above steps S401 and S402 are the operations performed by the EC after starting up and starting. The specific process can be referred to the similar previous embodiment.

[0122] S403, if the EC determines that there is an abnormal memory, the EC outputs a prompt for the abnormal memory to the data tube connected to the EC, and marks the information of the abnormal memory in the read-only memory (ROM) of the EC and the specified register.

[0123] It can be understood that if the EC has an abnormal memory, it means that the cause of the abnormal operation of the electronic device includes the abnormal memory, so it can be determined that the abnormal memory causes the electronic device to operate abnormally.

[0124] Among them, the prompt output by the EC to the digital tube can at least include the number of the memory, and can also include the working parameter of the memory with an exception, etc. Correspondingly, the specific form of the prompt can also have many possibilities, which are not limited.

[0125] It can be understood that the data tube is a display component provided outside the electronic device and connected to the EC, and the prompt of the abnormal memory displayed through the data tube can not be affected by the abnormal operation of the electronic device, that is, even if the electronic device is down and cannot output information to the display interface, it will not affect the display of the prompt information. Of course, the same is also applicable to the case of outputting the prompt through the display unit of the electronic device.

[0126] Among them, the specified register can be a register for communication between the EC and the input / output system (in this embodiment, the firmware system is taken as an example), so that the input / output system can read the information recorded in the register during the starting process.

[0127] S404, if the EC does not determine that there is an abnormal memory, the EC monitors the start-up signal in response to the shutdown operation in the abnormal mode.

[0128] Among them, the shutdown operation in the abnormal mode refers to the start-up operation different from the normal mode of the electronic device, for example, the key operation in the abnormal mode can be that the shutdown key is pressed for more than a set time.

[0129] It can be understood that if the electronic device has a running exception, the user can wish to restart the electronic device, in which case, the user generally long-presses the shutdown key to trigger the electronic device to shut down, and therefore, the time length of the shutdown key being pressed exceeding the set time length is detected as a condition for the EC to enter the diagnostic mode, which is beneficial to triggering the EC to analyze and test the memory in time.

[0130] It can be understood that in the presence of the abnormal mode of shutdown operation, the electronic device will still affect the key operation, thereby executing the shutdown operation to make the memory power off.

[0131] S405, when the EC detects the boot signal, it is confirmed to enter the diagnostic mode, the boot signal is intercepted, the EC obtains the working parameters of the memory through the GPIO port connected to the pin of the memory, and sends the test control signal to each memory through the DMA controller of the EC.

[0132] After the EC detects the abnormal mode of shutdown operation, if the EC detects the boot signal, the EC enters the diagnostic mode, in which case, in order to avoid booting abnormally due to the presence of abnormal memory, the EC will intercept the boot signal, so that the boot signal will not be temporarily transmitted to the firmware system.

[0133] Among them, the DMA (Direct Memory Access) controller of the EC is the internal controller of the EC, through which the memory can be accessed, and the test control signal required for abnormal test can be sent to the memory. Of course, before sending the test control signal, the EC will control the power supply to the memory to ensure that the memory can be in the test control signal.

[0134] S406, for each memory, the EC obtains the running result data of the memory for the test control signal.

[0135] S407, the EC determines the memory with abnormal working parameters and / or running result data, outputs the prompt for the memory with abnormal working parameters to the data pipe connected to the EC, and records the code of the memory with abnormal working parameters in the register for communication between the EC and the firmware system.

[0136] It can be understood that in order to facilitate viewing of the specific reasons for the abnormal memory, after the memory with abnormal working parameters is determined, the code of the memory with abnormal working parameters, working parameters, test data and other information can be stored in the read-only memory (ROM) of the EC, wherein the test data can include the running result data, and can also include the difference between the running result data and the normal running result.

[0137] S408, send the boot signal to the firmware system, so that the firmware system performs boot initialization in response to the boot signal, and skips the initialization of the memory marked in the register during the boot initialization process.

[0138] As can be seen from the embodiment, during the running of the electronic device, the EC continuously detects and analyzes the working parameters of the memory, and on this basis, if the electronic device has a running exception, and the EC determines the abnormal memory, it can be determined which memory has an exception without manually checking each memory one by one, reducing the complexity. Moreover, if the electronic device has a running exception, and the EC does not detect the memory with abnormal working parameters, the EC can shut down and receive the boot signal triggering the reboot, enter the diagnostic mode, intercept the boot signal, and test each memory before booting, so that the memory exception problem can be reproduced, and based on the test results and the working parameters obtained again, the memory with the exception is finally determined. It can not only ensure that the abnormal content can be located effectively, but also reduce the situation that the electronic device has an exception by instructing the firmware system to skip the initialization of the memory with the exception.

[0139] Corresponding to the abnormality detection method of the present application, the present application also provides an abnormality detection device. As shown in Figure 5 The device of the embodiment can include:

[0140] The first abnormality analysis unit 501 is configured to determine whether the working parameters of the target component of the electronic device are abnormal when the electronic device has a running exception, and the target component is at least one;

[0141] The second abnormality analysis unit 502 is configured to determine the cause of the running exception of the electronic device according to the determination result according to different diagnostic strategies, and the cause at least includes the component of the running exception of the electronic device.

[0142] In a possible implementation, the device can further include:

[0143] The abnormality prompting unit is configured to at least output a prompt of the component of the running exception of the electronic device;

[0144] And / or,

[0145] The abnormality marking unit is configured to at least mark the component of the running exception of the electronic device, so that the electronic device can skip the component of the running exception to start.

[0146] Optionally, the abnormality prompting unit is specifically configured to output a prompt of the component of the running exception of the electronic device in a preset manner, and at least save the obtained abnormality data of the component of the running exception of the electronic device.

[0147] Optionally, the exception marking unit, specifically, is configured to mark the determined component with running exception to the embedded controller and / or the specified register; or mark the determined component with running exception to the embedded controller and / or the specified register and cut off the power supply of the component with running exception.

[0148] In yet another possible implementation, the second exception analysis unit comprises:

[0149] The first exception diagnosis unit is configured to, in the case that the determination result is abnormal, determine the component with running exception of the electronic device based on at least the current working parameter of the target component; and / or,

[0150] The second exception diagnosis unit is configured to, in the case that the determination result is normal, enter a preset diagnosis mode to determine the component with running exception of the electronic device based on at least the working parameter of the target component after being powered on again.

[0151] Optionally, the first exception diagnosis unit is specifically configured to, in the case that the target component is unique, determine whether the target component is abnormal based on the preset working parameter and the current working parameter of the target component; or, in the case that the target component is not unique, determine the component with running exception of the electronic device based on the preset working parameter-contrast table and the current working parameter of each target component.

[0152] In an implementation, the second exception diagnosis unit comprises:

[0153] The mode determination unit is configured to, in the case that the determination result is normal, automatically or passively enter a preset diagnosis mode to be able to trigger the target component to be powered off and powered on again;

[0154] The test analysis unit is configured to obtain the working parameter of the target component after being powered on again and make test analysis on the target component after being powered on again;

[0155] The exception determination unit is configured to determine the component with running exception of the electronic device based on the working parameter of the target component after being powered on again and the result of the test analysis.

[0156] In a possible implementation, further comprising:

[0157] The boot interception unit is configured to, after the mode determination unit confirms to automatically or passively enter the preset diagnosis mode, intercept a boot signal of the electronic device to prohibit the boot signal from being input to an input / output system of the electronic device;

[0158] and / or,

[0159] The signal transmission unit is configured to, in the case that the abnormality marking unit marks the component of the electronic device with an abnormality, send a start-up signal to an input / output system of the electronic device, so as to read the information of the marked component with an abnormality in an initialization process, and enable the electronic device to skip the component with an abnormality to start up.

[0160] In another aspect, the present application provides an electronic device. As shown in Figure 6 FIG. 1, the electronic device can include:

[0161] a controller 601;

[0162] and at least one target component 602.

[0163] The controller can be an embedded controller, for example. Figure 6 The controller is taken as an example of an embedded controller. Of course, the embedded controller can also be other controllers in addition to the central processor of the electronic device.

[0164] As can be known from the foregoing method, the target component can have multiple possibilities. In order to facilitate understanding, Figure 6 the target component is taken as an example of a memory, and the electronic device is configured with multiple memories, as shown in Figure 6

[0165] The controller is configured to perform the abnormality detection method in any one of the foregoing embodiments.

[0166] It can be understood that the electronic device can further include a display 603, an input unit 604, a communication bus 605, a processor 607, and the like. Of course, the electronic device can also have more or fewer components, and is not limited in this regard. Figure 6

[0167] The above description of the disclosed embodiments enables a person skilled in the art to implement or use the present application. Various modifications to the embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.​​

Claims

1. A method for detecting abnormality, comprising: determining whether a working parameter of a target component of an electronic device is abnormal when the electronic device is running abnormally, the target component being at least one; determining a cause of the abnormality of the electronic device according to a different diagnosis strategy based on the determination result, the cause including at least a component of the electronic device that is running abnormally; wherein the diagnosis strategy is different when the determination result is normal or abnormal; wherein when the determination result is normal, a preset diagnosis mode is entered to determine the component of the electronic device that is running abnormally based on at least a working parameter of the target component after a re-powering; wherein after entering the preset diagnosis mode, an EC intercepts a boot signal of the electronic device to prohibit the boot signal from being sent to an input / output system of the electronic device, and sends a test control signal required for an abnormality test to a memory through a DMA controller of the EC. 2.The method of claim 1, further comprising: outputting at least a prompt of the component of the electronic device that is running abnormally; and / or marking at least the component of the electronic device that is running abnormally to enable the electronic device to skip the component that is running abnormally to start up. 3.The method of claim 1 or 2, wherein the determining the cause of the abnormality of the electronic device according to the different diagnosis strategy based on the determination result further comprises: when the determination result is abnormal, determining the component of the electronic device that is running abnormally based on at least a current working parameter of the target component. when the determination result is abnormal, determining the component of the electronic device that is running abnormally based on at least the current working parameter of the target component, comprising:

4. The method of claim 3, wherein, when the target component is unique, determining whether the target component is abnormal based on a preset working parameter and the current working parameter of the target component; or when the target component is not unique, determining the component of the electronic device that is running abnormally based on a preset working parameter-contrast table and the current working parameter of each target component. when the determination result is normal, entering the preset diagnosis mode to determine the component of the electronic device that is running abnormally based on at least the working parameter of the target component after the re-powering, comprising:

5. The method of claim 3, wherein, when the determination result is normal, automatically or passively entering the preset diagnosis mode to enable the target component to be powered off and re-powered; obtaining the working parameter of the target component after the re-powering and performing a test analysis on the target component after the re-powering; determining the component of the electronic device that is running abnormally based on the working parameter of the target component after the re-powering and a result of the test analysis. the outputting at least the prompt of the component of the electronic device that is running abnormally, comprising:

6. The method of claim 2, wherein, outputting the prompt of the component of the electronic device that is running abnormally in a preset manner and saving at least abnormality data of the component of the electronic device that is running abnormally. the marking at least the component of the electronic device that is running abnormally, comprising:

7. The method of claim 2, wherein, marking the determined component of the electronic device that is running abnormally to an embedded controller and / or a specified register; or marking the determined component of the electronic device that is running abnormally to the embedded controller and / or the specified register and cutting off a power supply of the component that is running abnormally.

8. The method of claim 5, wherein, in the case of marking the component of the electronic device running abnormally, further comprising: sending a boot signal to the input and output system of the electronic device to read the information of the marked component of the electronic device running abnormally in the initialization process, so that the electronic device can skip the component of the electronic device running abnormally to achieve startup.

9. An abnormality detection apparatus, comprising: a first abnormality analysis unit for determining whether the working parameters of the target components of the electronic device are abnormal when the electronic device is running abnormally, the target components being at least one; a second abnormality analysis unit for determining the cause of the electronic device running abnormally according to the determination result according to different diagnosis strategies, the cause including at least the component of the electronic device running abnormally; wherein the corresponding diagnosis strategy is different in the case of the determination result being normal or abnormal; wherein in the case of the determination result being normal, a preset diagnosis mode can be entered to determine the component of the electronic device running abnormally based on at least the working parameters of the target components after re-powering; wherein after entering the preset diagnosis mode, the EC intercepts the boot signal of the electronic device to prohibit the boot signal from being sent to the input and output system of the electronic device; and the DMA controller of the EC sends a test control signal required for abnormality test to the memory.

10. An electronic device, comprising: a controller and at least one target component the controller is configured to perform the abnormality detection method according to any one of claims 1 to 8.

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