Detector capable of double-sided incidence, detector array, imaging system and imaging method

Abstract

The present invention discloses a detector capable of double-sided incidence, a detector array, an imaging system and an imaging method, wherein the detector comprises an upper cover plate, a lower cover plate, an imaging part, a support frame and a circuit board arranged between the upper cover plate and the lower cover plate, the support frame is used to support the imaging part, the circuit board is electrically connected to the imaging part, the imaging part is used to convert a ray signal into a charge signal, and the circuit board converts the charge signal into a digital signal; the upper cover plate, the support frame and the lower cover plate are all made of a material capable of allowing rays to penetrate; the circuit board is arranged in the inner edge area of ​​the detector, and the circuit board is not arranged opposite to the main imaging area of ​​the imaging part. The detector of the present invention can be imaged by front or back incidence, and also provides a technical solution for realizing the coordinated operation of multiple detectors in a detector array and seamless splicing imaging.

Description

Technical Field

[0001] The present invention relates to the field of detector imaging, and in particular to a detector capable of double-sided incidence, a detector array, an imaging system and an imaging method. Background Art

[0002] Digital flat panel detectors are key components in digital X-ray imaging systems. In digital X-ray imaging systems, flat panel detectors convert X-rays carrying information into digital signals that can be detected and expressed.

[0003] The digital X-ray flat panel detectors currently on the market are all independent entities. Apart from data transmission and sharing, there is no other collaborative function between the detectors. The so-called collaborative work means that several detectors can be spliced ​​together to work together without changing the original interface and synchronization mechanism. From the application end, it looks like operating a detector with a larger imaging area.

[0004] In addition, the digital flat panel detectors on the market do not have the function of receiving X-rays from both the upper and lower layers at the same time. The traditional stacking method of digital flat panel detectors is to place the printed circuit board (PCB) and the power module under the imaging part. This only allows X-rays to enter from one direction for imaging. Summary of the invention

[0005] In order to overcome the shortcomings of the prior art, the present invention provides a detector, a detector array, an imaging system and an imaging method that can be incident from both sides, breaking through the limitation that flat panel detectors only allow X-rays to be incident from one direction for imaging, and can flexibly select the appropriate flat panel detector splicing method according to the application scenario, and make dual energy spectrum application possible. The specific technical solution is as follows:

[0006] On the one hand, the present invention provides a flat panel detector capable of double-sided incident imaging, the flat panel detector comprising an upper cover plate, a lower cover plate, an imaging part, a support frame and a circuit board arranged between the upper cover plate and the lower cover plate, the support frame is used to support the imaging part, the circuit board is electrically connected to the imaging part, the imaging part is used to convert a ray signal into a charge signal, and the circuit board converts the charge signal into a digital signal; the upper cover plate, the support frame and the lower cover plate are all made of a material that can allow rays to penetrate;

[0007] The circuit board is arranged in the inner edge area of ​​the detector, and the circuit board is not arranged opposite to the main imaging area of ​​the imaging part.

[0008] Furthermore, contacts and / or sensors for communicating with adjacent flat panel detectors are provided on the oblique side surfaces of the flat panel detectors.

[0009] Furthermore, under the condition that the X-rays are incident on the detector from top to bottom or from bottom to top, the imaging unit can convert the X-ray signals into electrical signals.

[0010] Furthermore, the upper cover plate and the lower cover plate of the flat panel detector are both N-sided polygons, and the flat panel detector also includes N side surfaces.

[0011] On the other hand, the present invention provides a detector array, comprising at least two flat-panel detectors capable of double-sided incidence imaging as described above, each flat-panel detector having at least one oblique side surface inclined inwardly from an upper cover plate toward a lower cover plate, and two adjacent flat-panel detectors being spliced ​​in reverse so that their respective imaging parts have overlapping areas in projection.

[0012] On the other hand, the present invention provides a dual-energy spectrum detector, comprising two flat-panel detectors capable of double-sided incident imaging as described above, the two flat-panel detectors being arranged one above the other.

[0013] On the other hand, the present invention provides an imaging system, including a ray source, an imaging display unit and a flat-panel detector capable of double-sided incidence imaging as described above, wherein the ray emitted by the ray source is directed toward the front side or the back side of the flat-panel detector, and the imaging display unit is electrically connected to a circuit board of the flat-panel detector.

[0014] On the other hand, the present invention provides an imaging system, including a radiation source, an imaging display unit and the detector array as described above, wherein the radiation source is arranged on one side of a plurality of flat-panel detectors spliced ​​in reverse, the imaging display unit is electrically connected to the circuit boards of the plurality of flat-panel detectors, and each flat-panel detector in the detector array follows a timing sequence to perform synchronous operation.

[0015] In another aspect, the present invention provides an imaging method based on the detector array as described above, comprising the following steps:

[0016] S1, using a first detector in a detector array to obtain first image information, and using a second detector in the detector array to obtain second image information, wherein the first detector and the second detector are reversely spliced;

[0017] S2. performing image feature matching on the first image information and the second image information to obtain a first feature matching area;

[0018] S3: remove the remaining part of the first feature matching area from the first image information and splice it with the second image information, or remove the remaining part of the first feature matching area from the second image information and splice it with the first image information.

[0019] Furthermore, after obtaining the first stitched image in step S3, the following steps are also included:

[0020] S4, acquiring third image information using a third detector in the detector array, wherein the third detector is reversely spliced ​​with the second detector;

[0021] S5, performing image feature matching on the third image information and the first spliced ​​image information to obtain a second feature matching area;

[0022] S6. Remove the remaining portion of the second feature matching area from the first stitched image information and stitch it with the third image information, or remove the remaining portion of the second feature matching area from the third image information and stitch it with the first stitched image information to obtain a second stitched image.

[0023] The beneficial effects brought by the technical solution of the present invention include:

[0024] (a) The flat panel detector can image when X-rays are incident from the front or back, which makes up for the deficiency of the flat panel detector in the prior art that can only receive X-rays incident from one direction for imaging;

[0025] (b) The entire detector array can be operated and imaged as one detector. Several flat-panel detectors work together, and at the application end, it looks like operating a detector with a larger imaging area.

[0026] (c) Depending on the stitching style, the stitched detector array can increase the imaging area or achieve dual-energy spectrum photography. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0028] Figure 1 It is a schematic diagram of the monomer structure of a flat-panel detector capable of double-sided incident imaging provided by an embodiment of the present invention;

[0029] Figure 2 is a partial enlarged cross-sectional view of a flat panel detector provided by an embodiment of the present invention;

[0030] Figure 3 It is a partially enlarged cross-sectional view of two flat panel detectors capable of double-sided incident imaging in a detector array provided by an embodiment of the present invention in a spliced ​​state;

[0031] Figure 4 is a schematic structural diagram of a dual energy spectrum detector provided by an embodiment of the present invention;

[0032] Figure 5 Yes Figure 4 Schematic diagram of the improved structure of the dual energy spectrum detector;

[0033] Figure 6 is a schematic diagram of comparing the energy spectra of two detector X-rays incident on a dual-energy spectrum detector provided by an embodiment of the present invention;

[0034] Figure 7 is a schematic structural diagram of one type of reverse-stitched detector array provided in an embodiment of the present invention;

[0035] Figure 8 It is a schematic diagram of installing the circuit board provided by an embodiment of the present invention on the inner edge of the detector;

[0036] Fig. 9 It is a schematic diagram of installing a circuit board provided by an embodiment of the present invention at the inner edge of a detector.

[0037] Among them, the figure marks include: 1-upper cover, 2-imaging part, 3-circuit board, 4-support frame, 5-lower cover, 6-flat panel detector, 61-oblique side, 7-first layer of filtration, 8-second layer of filtration. DETAILED DESCRIPTION

[0038] In order to enable those skilled in the art to better understand the scheme of the present invention, and to more clearly understand the purpose, technical scheme and advantages of the present invention, the technical scheme in the embodiments of the present invention is clearly and completely described below in combination with specific embodiments and with reference to the accompanying drawings. Obviously, the described embodiments are only embodiments of a part of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in the field without creative work should belong to the scope of protection of the present invention. In addition, the terms "including" and "having" in the specification and claims of the present invention and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, device, product or equipment that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or equipment.

[0039] In one embodiment of the present invention, a flat panel detector capable of double-sided incident imaging is provided. Figure 1 and Figure 2The flat panel detector 6 includes an upper cover plate 1, a lower cover plate 5, and an imaging part 2, a support frame 4 and a circuit board 3 arranged between the upper cover plate 1 and the lower cover plate 5, wherein the support frame 4 is used to support the imaging part 2, the circuit board 3 is electrically connected to the imaging part 2, the imaging part 2 is used to convert the radiation signal into a charge signal, and the circuit board 3 is used to convert the charge signal into a digital signal.

[0040] An optional embodiment of the flat panel detector for realizing dual-side incident imaging is as follows: all the imaging parts 2 form a main imaging area, and the circuit board 3 is not arranged opposite to the main imaging area, that is, the circuit board 3 does not fall within the vertical projection area of ​​the main imaging area. Therefore, in this embodiment, Figure 8 and Fig. 9 As shown, the circuit board 3 is designed to be long and narrow and is respectively arranged in the inner edge area of ​​the detector. Figure 8 In the same detector 6, the circuit board 3 is divided into multiple parts and arranged in the edge area. Fig. 9 The number of the circuit boards 3 in the same detector 6 is single, and they are also arranged in the edge area. The circuit board 3 can be optionally installed on the support frame 4, and the support frame 4 is fixed to the inner wall of the detector by means of snap-on, adhesive or locking parts (such as screws, screws or bolts), or the support frame 4 can be integrally formed with the inner wall of the detector. At the same time, the upper cover plate 1, the support frame 4 and the lower cover plate 5 are all made of materials with high radiation transmittance. Since the circuit board 3 is arranged outside the projection area of ​​the imaging area, the radiation can be incident on the imaging part 2 from top to bottom through the upper cover plate 1, or from bottom to top through the lower cover plate 5 and the support frame 4 in sequence. In one embodiment of the present invention, taking X-rays as an example, the upper cover plate 1, the support frame 4 and the lower cover plate 5 are all made of materials with high X-ray transmittance, and such materials with high X-ray transmittance are prior art. It should be noted that Figure 8 and Fig. 9In the embodiment, the circuit board 3 disposed in the edge area is outside the projection area of ​​the imaging part 2, which is only an embodiment. If the circuit board must be placed under the imaging part due to space limitations, the overlapping area between the circuit board and the imaging area is minimized to increase the imaging area. That is, correspondingly, in one embodiment of the present invention, part of the imaging part 2 forms the main imaging area, which is not blocked by the circuit board 3, and the edge area of ​​the imaging part 2 does not constitute the main imaging area because it may be arranged opposite to the circuit board 3. And for the case where the flat panel detector 6 is incident with X-rays from the front, the PCB circuit board 3 is placed under the imaging area and does not affect the imaging area. Under the condition that the X-rays are incident from top to bottom or from bottom to top on the detector, the imaging part 2 can convert the X-ray signal into an electrical signal. The technology to achieve the above conversion includes but is not limited to amorphous silicon indirect conversion technology or amorphous selenium direct conversion technology.

[0041] like Figure 2 As shown, the imaging unit 2 absorbs visible light and further converts it into a charge signal, which is then converted into a digital signal by the circuit board 3. For the amorphous silicon indirect conversion technology, when the X-ray source is incident on the flat panel detector from the front, the modulation transfer function (MTF) of the imaging is relatively low; when the X-ray source is incident on the flat panel detector from the back, a relatively high MTF imaging can be obtained. Users can choose between high MTF or low MTF according to actual needs.

[0042] This technology enables the flat-panel detector to receive X-ray incident imaging in both the upper and lower directions, filling the deficiency of the prior art that the flat-panel detector can only receive X-ray incident imaging in one direction, improving the flexibility of the flat-panel detector application, and playing an important role in the medical field, the pet field and industrial applications.

[0043] In one embodiment of the present invention, an imaging system corresponding to the above flat panel detector is provided, the imaging system comprising a ray source, an imaging display unit and the flat panel detector 6 capable of double-sided incidence, the ray emitted by the ray source is directed to the front or back side of the flat panel detector 6, and the imaging display unit is electrically connected to the circuit board 3 of the flat panel detector 6. Based on the imaging principle as described above, the imaging unit 2 outputs a charge signal converted from visible light, the charge signal is converted into a digital signal by the circuit board 3, and then displayed by the imaging display unit.

[0044] In one embodiment of the present invention, a detector array is provided, wherein the detector array comprises at least two flat panel detectors capable of double-sided incident imaging as described above, such as Figure 7In particular, in this embodiment, the flat panel detector 6 has at least one inclined side surface 61 which is inclined inward from the upper cover plate 1 to the lower cover plate 5. Figure 3 As shown, two adjacent flat panel detectors 6 in the detector array are reversely spliced ​​so that their corresponding oblique side surfaces 61 are parallel to each other. In particular, in this embodiment, the two reversely spliced ​​oblique side surfaces 61 are close together. The flat panel detector 6 can be square. Obviously, the flat panel detector 6 can also be triangular, hexagonal or octagonal. On the other hand, the two opposite oblique side surfaces 61 on the flat panel detector 6 can be as shown in FIG. Figure 1 The illustrated shape is an "eight" shape, and may also have the inclined side surface 61 on only one side (not shown). Specifically, in the present embodiment, all the inclined side surfaces 61 have the same inclination angle (absolute value).

[0045] See Figure 1 , the upper cover plate 1 is inclined inwardly toward the lower cover plate 5 to form an inclined side surface 61, so that the right edge of the upper cover plate 1 protrudes out of the right edge of the lower cover plate 5, and the imaging portion 2 also protrudes out of the right edge of the lower cover plate 5, that is, Figure 3 The right side of the imaging part 2 below the upper cover plate 1 of the flat-panel detector on the left side exceeds the right edge of the lower cover plate 5, while the left side of the imaging part 2 above the upper cover plate 1 of the flat-panel detector on the right side exceeds the left edge of the lower cover plate 5. This makes it possible for the imaging areas of the corresponding imaging parts 2 to overlap when the two flat-panel detectors are reversely spliced, thereby avoiding the presence of a gap between the imaging parts 2 of the two at the splicing point. In this embodiment, the oblique side surface 61 is made of a material with high X-ray transparency, just like the upper cover plate 1, the support frame 4, and the lower cover plate 5. Obviously, in Figure 3 In the case where the two inclined side surfaces 61 to be spliced ​​have different inclination angles, or the two inclined surfaces 61 are not close together, in theory, no matter what the shapes of the adjacent spliced ​​flat panel detectors 6 are, as long as the imaging areas of the corresponding imaging parts 2 have overlapping parts in projection (realizing seamless splicing, that is, there are no missing gaps at the splicing), the technical solution of the present invention can be implemented. Therefore, a suitable detector splicing method can be selected according to the application scenario, including but not limited to the present embodiment. Figure 3 The reverse stitching of the two flat panel detectors is shown in FIG.

[0046] Furthermore, the oblique side surface 61 is provided with a physical contact and / or sensor for communicating with the adjacent flat panel detector 6. The functions of the physical contact and / or sensor include at least the following two aspects:

[0047] First, the positional relationship between the spliced ​​flat panel detectors 6 can be determined to determine the splicing mode of the respective imaging (the images collected by each of the flat panel detectors 6 can be spliced ​​accordingly according to the relative positions of the flat panel detectors 6);

[0048] Second, all the flat panel detectors 6 in the sensor array are coordinated to work together, that is, each flat panel detector in the detector array follows a time sequence (referred to as timing) to work synchronously, thereby ensuring the synchronous timing of each subsequent spliced ​​imaging and improving the imaging accuracy after splicing.

[0049] The present invention proposes an imaging system for the above-mentioned detector array. The imaging system provided by the embodiment of the present invention includes a ray source, an imaging display unit and the above-mentioned detector array. The ray source is arranged on one side of the plurality of flat panel detectors spliced ​​in reverse. A central timing control unit can be arranged. Under the control of the central timing control unit, each flat panel detector of the detector array follows a time sequence (referred to as timing) to work synchronously. Accordingly, the image collected by each flat panel detector can be marked with timing by the circuit board. Specifically, the timing of the flat panel detectors of the detector array can interact with the external timing through the central timing control unit and the so-called single interface. In the case of multiple flat panel detectors working in coordination, the imaging display unit can be electrically connected to the circuit board 3 of only one of the flat panel detectors 6 (becoming the master detector) (the other flat panel detectors 6 become slave detectors and communicate with the master detector). Obviously, it can also be electrically connected to the circuit boards 3 of multiple or even all flat panel detectors 6.

[0050] The characteristics of the detectors in the detector array and the stitching method are as described in the above embodiment. The structural characteristics of the detector array and the array stitching method in the above embodiment are incorporated into the present imaging system embodiment by reference and will not be repeated here.

[0051] With respect to the detector array, an embodiment of the present invention provides an imaging method of the detector array, comprising the following steps:

[0052] S1. Acquire first image information using a first detector in the detector array, and acquire second image information using a second detector in the detector array, wherein the first detector and the second detector are reversely spliced ​​(the specific structure and splicing method of the detectors refer to the above embodiment, which will not be repeated here);

[0053] S2. Perform image feature matching on the first image information and the second image information to obtain a first feature matching area.

[0054] Specifically, when the first detector and the second detector communicate through the side physical contact or sensor, the positional relationship of the left and right splicing of the first detector and the second detector can be known, and accordingly, the first image information and the second image information are also spliced ​​according to the left and right splicing positional relationship. Since the respective imaging areas of the first detector and the second detector overlap in projection (see above for details), the first image information and the second image information obtained by imaging have the same image features at the splicing position, and the same image feature area should be a strip parallel to the oblique side of the detector, and the strip width depends on the width of the overlapping area on the projection. Image feature matching can adopt conventional image recognition algorithms in the prior art, for example, using SIFT (Scale Invariance Feature Transform) algorithm to extract key points (or feature points, corner points) from the image, using mathematical vectors to describe the feature points, and then calculating the distance between feature vectors (such as Euclidean distance, Hamming distance, cosine distance) to achieve feature matching. The present invention does not specifically limit the specific algorithm of image feature matching to SIFT algorithm, such as other well-known ORB (Oriented Fast and Rotated Brief) algorithms, grayscale matching-based methods, etc.

[0055] S3. Remove the remaining part of the first feature matching area from the first image information and splice it with the second image information, or remove the remaining part of the first feature matching area from the second image information and splice it with the first image information to obtain first spliced ​​image information.

[0056] Because directly splicing the first image information and the second image information will result in repeated imaging at the splicing point (i.e., the image of the first feature matching area that exists in both the first image information and the second image information), the purpose of the above two splicing methods is to remove the redundant image information, i.e., the image information of the first feature matching area, from the simple and direct splicing image.

[0057] The above is an imaging method corresponding to the splicing of two detectors. For a detector array spliced ​​with three detectors, after obtaining the first spliced ​​image information according to S3, the imaging method can perform the following steps:

[0058] S4, acquiring third image information using a third detector in the detector array, wherein the third detector is reversely spliced ​​with the second detector;

[0059] S5, performing image feature matching on the third image information and the first stitched image information to obtain a second feature matching area, the specific method is the same as S2;

[0060] S6. Remove the remaining part of the second feature matching area from the first stitched image information and stitch it with the third image information, or remove the remaining part of the second feature matching area from the third image information and stitch it with the first stitched image information to obtain second stitched image information. The specific method is the same as S3.

[0061] For a detector array with more than four detectors, the same as above, it is sufficient to repeatedly perform feature matching (see S2) and de-duplication stitching (see S3) of the stitched image and the unstitched detector imaging. Obviously, the timing synchronization of each detector in the detector array is necessary, especially when the imaged object is a non-stationary object, it is necessary to ensure that the local images formed by each detector are formed at the same time.

[0062] The present invention provides a dual-energy spectrum detector, which comprises two flat-panel detectors capable of double-sided incident imaging, wherein the imaging areas of the two flat-panel detectors are arranged opposite to each other up and down.

[0063] In addition, the present technology also makes dual energy spectrum application possible. In one embodiment of the present invention, a dual energy spectrum detector is provided, such as Figure 4 As shown, the dual-energy spectrum detector is composed of two layers of digital X-ray imaging systems. Specifically in this embodiment, each layer of the digital X-ray imaging system includes a flat panel detector 6 as described above and a filter layer, such as Figure 5 As shown, the filter is placed on the incident side of the corresponding flat panel detector, the filter is in contact with the detector or keeps a certain distance, and the imaging areas of the two flat panel detectors are opposite to each other. Figure 5 The filtering ranges of the first filter 7 and the second filter 8 in the digital X-ray imaging system may be the same or different. Optionally, the flat panel detectors in the first and second layers of the digital X-ray imaging system may use the same or different X-ray photon absorbing materials (e.g., scintillator layer fluorescent materials that convert X-rays into visible light in amorphous silicon indirect conversion technology). The working process of the dual energy spectrum detector is as follows:

[0064] When the X-rays carrying the information of the photographed object irradiate the first layer of digital X-ray imaging system, some X-ray photons are absorbed by the first layer of digital X-ray imaging system and generate digital images; further, the unabsorbed X-ray photons will continue to penetrate the first layer of digital X-ray imaging system to reach the digital X-ray imaging system of the next layer, and will be absorbed by the flat panel detector of the next layer and converted into digital signals. Obviously, the energy spectrum of X-rays that penetrate the first layer and reach the surface of the detector of the next layer is weaker than the energy spectrum that reaches the surface of the detector of the first layer, see Figure 6. In this way, by designing the material and thickness of each layer of the fluorescent material and the intermediate filter, the X-ray spectrum reaching each layer can be tailored to capture information of a specific energy spectrum segment. Furthermore, by comparing the original X-ray energy spectrum (the energy spectrum before entering the object) and the two-dimensional spatial image of the object obtained by the flat-panel detectors of each layer, the X-ray energy spectrum absorption characteristics of the object can be restored, and the dual-energy spectrum detector can be well used in the field of angiography.

[0065] Since the two-dimensional spatial image of the object is obtained simultaneously, the flat panel detector using a stacked design can achieve efficient collection and utilization of multiple information including time, space and energy spectrum.

[0066] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A detector array, characterized in that: The invention comprises at least two flat panel detectors capable of double-sided incident imaging, the flat panel detector comprising an upper cover plate (1), a lower cover plate (5), an imaging portion (2) arranged between the upper cover plate (1) and the lower cover plate (5), a support frame (4) and a circuit board (3), the support frame (4) being used to support the imaging portion (2), the circuit board (3) being electrically connected to the imaging portion (2), the imaging portion (2) being used to convert a ray signal into a charge signal, and the circuit board (3) converting the charge signal into a digital signal; the upper cover plate (1), the support frame (4) and the lower cover plate (5) are all made of a material capable of allowing rays to penetrate, and the upper cover plate (1) and the lower cover plate (5) of the flat panel detector are both N-gons; The circuit board (3) is arranged in an inner edge area of ​​the detector, and the circuit board (3) is not arranged opposite to a main imaging area of ​​the imaging part (2); Each flat panel detector has at least one oblique side surface which is inclined inward from the upper cover plate (1) to the lower cover plate (5), and two adjacent flat panel detectors are spliced ​​in reverse so that their respective imaging parts (2) have overlapping areas in projection; The flat panel detector is provided with contacts and / or sensors for communicating with adjacent flat panel detectors on the oblique side surface; Under the condition that the X-rays are incident on the detector from top to bottom or from bottom to top, the imaging unit (2) is capable of converting the X-ray signals into electrical signals.

2. The detector array according to claim 1, characterized in that: The flat panel detector also includes N side surfaces.

3. An imaging system, characterized in that: It comprises a ray source, an imaging display unit and a detector array as claimed in any one of claims 1 to 2, wherein the ray emitted by the ray source is directed to the front side or the back side of the flat panel detector, and the imaging display unit is electrically connected to a circuit board (3) of the flat panel detector.

4. An imaging system, characterized in that: It comprises a radiation source, an imaging display unit and the detector array as claimed in claim 1, wherein the radiation source is arranged on one side of a plurality of flat panel detectors spliced ​​in reverse, the imaging display unit is electrically connected to the circuit boards (3) of the plurality of flat panel detectors, and each flat panel detector in the detector array operates synchronously in accordance with a timing sequence.

5. An imaging method based on the detector array as claimed in claim 1, characterized in that: The following steps are involved: S1, using a first detector in a detector array to obtain first image information, and using a second detector in the detector array to obtain second image information, wherein the first detector and the second detector are reversely spliced; S2. performing image feature matching on the first image information and the second image information to obtain a first feature matching area; S3: remove the remaining part of the first feature matching area from the first image information and splice it with the second image information, or remove the remaining part of the first feature matching area from the second image information and splice it with the first image information.

6. The imaging method of the detector array according to claim 5, characterized in that: After the first stitched image is obtained in step S3, the following steps are also included: S4, acquiring third image information using a third detector in the detector array, wherein the third detector is reversely spliced ​​with the second detector; S5, performing image feature matching on the third image information and the first spliced ​​image information to obtain a second feature matching area; S6. Remove the remaining portion of the second feature matching area from the first stitched image information and stitch it with the third image information, or remove the remaining portion of the second feature matching area from the third image information and stitch it with the first stitched image information to obtain a second stitched image.

Images