A high and low temperature in-situ spectral reaction cell

Abstract

This invention discloses a high- and low-temperature in-situ spectroscopic reaction cell, relating to the field of spectroscopic reaction cell technology. The invention includes a base, an optical window, a sample stage, a cooling unit, a heating unit, a ventilation unit, and an electrical testing unit. The top wall of the base has a groove, and the optical window covers the groove to form a sealed cavity. The sample stage is located within the groove and has a cavity inside. The advantages of this invention are: the reaction cell achieves control of the high and low temperature environment field within a small system through a simple structural layout, not only allowing the temperature to vary from an extremely low temperature of 4K to a range of 300°C, but also significantly reducing the wiring layout for various gases and liquids. Furthermore, within a limited space, the reaction cell also incorporates electrode plates and SMA connectors for electrical testing under varying temperature conditions, meeting the electrical testing requirements at both high and low temperatures.

Description

Technical Field

[0001] The present invention relates to the technical field of spectral reaction cells, and in particular to a high and low temperature in-situ spectral reaction cell. Background Art

[0002] Temperature parameters, as an important parameter of physical property change, will affect various properties of materials in many ways. In fact, the behavior of materials will change greatly from ambient temperature to low temperature. Therefore, it is very meaningful from a general engineering point of view to study the mechanism of changes in electrical, thermal, mechanical and magnetic properties of pure metals, alloys and insulators caused by changes in temperature parameters. The properties of materials are generally applicable to specific physical equations, so these physical equations can be used to predict the behavior of the system. They depend on chemical composition, crystal structure, atomic and charge interactions, thermal or mechanical treatment, etc., and are affected by temperature changes. Therefore, when considering the change of materials with temperature, it is very important to understand the mechanism of the relevant characteristics.

[0003] The thermal (and electrical) properties of any material are related to the vibrations of its atoms about their equilibrium positions (in the crystal lattice). The amplitude of these vibrations depends on the temperature and decreases with decreasing temperature. These vibrations may propagate within the material at the speed of sound and are studied as plane waves associated with phonons. If the material is a conductor, the thermal properties also depend on the movement of negative charges (electrons) and positive charges (vacancies). The heat capacity C is defined as the amount of energy (heat) that must be introduced into a certain amount of material to raise its temperature T by 1 K. Reversibly, it is the energy extracted from this amount of material to lower its temperature by 1 K. The heat capacity of a material is therefore its ability to store or release thermal energy. It is an important property during cooling or preheating and can be used to estimate the energy (and cost) involved, as well as for evaluating heat transfer transients associated with thermal diffusivity. In addition to these intrinsic parameters, the electron transport capacity or electrical conductivity of metal conductors or semiconductors is directly related to temperature. For example, in metal conductors, the charge e is transported by n "free electrons". At ambient temperature, the electron free path e is dominated by electron scattering caused by thermal vibrations of the lattice (phonons). At low temperatures, it is mainly limited by scattering from chemical and physical lattice defects (chemical impurities, vacancies, dislocations). For semiconductors, charge is transported by conduction band electrons and holes in the valence band. Near ambient temperature, lattice vibrations dominate, and electrical properties are not affected by impurities. At low temperatures, lattice vibrations are negligible, and impurities play an important role in charge transport. Therefore, the resistivity of semiconductors is very nonlinear, and the temperature generally increases with decreasing temperature due to the reduction of electrons in the conduction band. An important application of this property is to use semiconductors as temperature sensors (thermistors). It can be seen that temperature parameters are of great significance to the various properties of material materials, and how to study the changes in temperature parameters on the changes in the intrinsic properties of materials is also a major problem that plagues researchers.

[0004] At present, there are many devices for high and low temperature environments on the market, but most of them focus on creating high and low temperature environments of the equipment itself, that is, they can only provide an environmental field device with a low temperature or high temperature environment. For example, the patent with announcement number CN203502338U discloses an in-situ infrared spectroscopy reaction cell, but it can only realize reaction monitoring in a high temperature environment.

[0005] At the same time, this type of equipment is often unable to adapt well to various existing spectroscopic instruments due to its large size, large space occupation, and numerous lines. This will not only occupy the limited experimental space in situ, but also make it difficult for laboratory researchers to study various physical properties under different temperature change conditions. Because, if you want to adapt to various commercial spectroscopic characterization instruments, the high and low temperature device itself must be small in size and very portable. More importantly, a certain optical path must be reserved for various optical characterizations, which puts forward higher design requirements for this type of equipment. In fact, the combination of various in-situ characterization methods with high and low temperature environments is also a rapidly developing research field, because different structural characterization methods can be used to study the conformational changes of substances, which will further provide the possibility of using advanced detection methods to monitor metastable substances online. This is why this type of in-situ testing technology has received much attention in many interdisciplinary scientific fields such as the earth sciences, materials, and chemistry / physics. Summary of the invention

[0006] The technical problem to be solved by the present invention is that the in-situ spectral reaction cell in the prior art can only realize reaction monitoring in a high-temperature or low-temperature environment, and a high-low temperature in-situ spectral reaction cell is provided.

[0007] The present invention solves the above technical problems through the following technical means:

[0008] The present invention provides a high and low temperature in-situ spectral reaction cell, comprising a base, an optical window, a sample stage, a refrigeration unit, a heating unit, a ventilation unit and an electrical testing unit; the top wall of the base is provided with a groove, and the optical window covers the groove to form a sealed cavity;

[0009] The sample stage is located in the groove, and a cavity is provided in the sample stage; the refrigeration unit is a semiconductor refrigeration plate, or the refrigeration unit includes a liquid nitrogen inlet, a liquid nitrogen outlet, a first connecting pipe and a second connecting pipe, the liquid nitrogen inlet and the liquid nitrogen outlet are connected to the cavity of the sample stage, one end of the first connecting pipe is connected to the liquid nitrogen inlet, and the other end of the first connecting pipe extends out of the base, one end of the second connecting pipe is connected to the liquid nitrogen outlet, and the other end of the second connecting pipe extends out of the base;

[0010] The heating unit is wrapped around the outside of the sample stage; the ventilation unit includes an air outlet connector, which is located at one end of the base; the electrical testing unit includes an electrode press and an SMA connector, one end of the electrode press is in contact with the sample on the sample stage, and the other end of the electrode press is connected to the SMA connector.

[0011] Working principle: Place the sample to be tested on the sample stage, cover the optical window on the groove to form a sealed cavity in the groove. After installation, connect the outlet joint to the vacuum device to evacuate the sealed cavity. Then place the reaction cell on the spectroscopy line station. After aligning the optical path, introduce liquid nitrogen from the first connecting tube. After passing through the cavity in the sample stage, the liquid nitrogen flows out from the second connecting tube, thereby cooling the sample on the sample stage and collecting relevant data. Stop introducing liquid nitrogen, start the heating unit, heat the heating unit, and collect relevant data. The sample is in contact with the electrode press, and the sample is electrically tested.

[0012] Beneficial effects: The reaction pool in the present invention realizes the control of the high and low temperature environment field in a small system through a simple structural layout. Not only can the temperature reach an extremely low temperature of 4K and a variation range of 300℃ above zero, the liquid helium system can reach a minimum of 4K, the liquid nitrogen system can reach 77K, and the semiconductor refrigeration plate system can reach minus 50℃, while greatly reducing the line layout of various gases and liquids. At the same time, within the limited space size, the reaction pool in the present invention is also equipped with an electrode pressing piece and an SMA connector that can perform electrical testing wiring components under variable temperature conditions to achieve electrical testing requirements under high and low temperature conditions.

[0013] Preferably, the heating unit comprises a heating body and a resistance wire, the resistance wire is wound around the heating body, the heating body is located on the inner bottom wall of the base groove, and the heating body is connected to the sample stage by bolts.

[0014] Preferably, the heating unit further comprises a thermocouple, one end of the thermocouple is inserted into the heating body, and the other end of the thermocouple extends out of the base.

[0015] Beneficial effects: High and low temperatures are monitored by thermocouples.

[0016] Preferably, the optical window includes an upper cover, a first sealing ring, a window piece and a window cover, the upper cover is located above the groove, the upper cover is connected to the top wall of the base, a first through hole is provided on the upper cover, the sample stage is located below the first through hole, the window piece is located above the first through hole, the first sealing ring is located between the window piece and the upper cover, the window cover is located above the window piece, and the window cover and the upper cover are detachably connected.

[0017] Preferably, the electrical testing unit also includes a guide rail, a bearing seat and a support column, the guide rail is located on the inner bottom wall of the groove, the bearing seat is located on the slider of the guide rail, one end of the support column is rotatably connected to the bearing seat, the axis of the support column is perpendicular to the sliding direction of the slider on the guide rail, and the movement of the slider causes the support column to approach or move away from the sample stage; one end of the electrode pressing sheet is connected to one end of the support column, and the other end of the electrode pressing sheet is in contact with the sample on the sample stage.

[0018] Beneficial effect: The distance between the support column and the sample stage is adjusted by moving the slider on the guide rail, thereby adjusting the distance between the electrode pressing plate and the sample stage. The support column is installed on the bearing seat, and the support column can rotate in the groove with the axis of the support column, thereby adjusting the position of the electrode pressing plate and the sample on the sample stage, so as to perform electrical testing on the sample.

[0019] Preferably, a second through hole is provided at one end of the electrode pressing sheet, a corresponding third through hole is provided at one end of the supporting column, bolts are provided in the second through hole and the third through hole, and nuts are provided on the bolts.

[0020] Beneficial effect: After placing the sample on the sample table, adjust the position of the electrode pressing piece according to the sample so that one end of the electrode pressing piece contacts the sample.

[0021] Preferably, the electrode pressing sheet comprises a fixed end and a probe end, the fixed end and the probe end are integrally formed, the fixed end is connected to one end of the support column, and the probe end forms a tip.

[0022] Beneficial effect: reducing the volume of the electrode pressing sheet and reducing the influence of the electrode pressing sheet on the optical path during optical path analysis.

[0023] Preferably, the ventilation unit further comprises an air inlet connector, and the air inlet connector and the air outlet connector are respectively located at two ends of the base.

[0024] Preferably, the air inlet connector and the air outlet connector are both provided with a two-way ball valve.

[0025] The working principle of the present invention is as follows: the sample to be tested is placed on the sample stage, and the optical window cover is closed on the groove to form a sealed cavity in the groove. After the installation is completed, the gas outlet joint is connected to the vacuum pumping device to evacuate the sealed cavity, and then the reaction cell is placed on the spectroscopy line station. After aligning the optical path, taking the liquid nitrogen system as an example, liquid nitrogen is introduced from the first connecting tube. After the liquid nitrogen passes through the cavity in the sample stage, it flows out from the second connecting tube, thereby cooling the sample on the sample stage and collecting relevant data. Stop introducing liquid nitrogen, start the heating unit, heat the heating unit, and collect relevant data. The sample is in contact with the electrode press, and the sample is electrically tested.

[0026] The advantages of the present invention are that the reaction pool in the present invention realizes the control of the high and low temperature environmental fields in a small system through a simple structural layout. Not only can the temperature reach a variation range of 4K to 300°C above zero, but the line layout of various gases and liquids is greatly reduced, thereby meeting the in-situ spectral analysis of samples under high and low temperature conditions.

[0027] At the same time, within the limited space size, the reaction pool in the present invention is also equipped with an electrode pressing piece and an SMA connector that can perform electrical testing wiring components under variable temperature conditions, thereby achieving electrical testing requirements under high and low temperatures.

[0028] The distance between the support column and the sample stage is adjusted by moving the slider on the guide rail, thereby adjusting the distance between the electrode press and the sample stage. The support column is installed on the bearing seat, and the support column can rotate in the groove with the axis of the support column to adjust the position of the electrode press and the sample on the sample stage, so as to perform electrical testing on the sample. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 A top view of a high and low temperature in-situ spectral reaction cell in an embodiment of the present invention;

[0030] Figure 2 for Figure 1 Cross-section view in the A direction;

[0031] Figure 3 for Figure 1 Cross-section along the B direction;

[0032] In the figure: base 111; upper cover 1121; first sealing ring 1122; window piece 1123; window cover 1124; sample stage 113; liquid nitrogen inlet 1141; liquid nitrogen outlet 1142; first connecting pipe 1143; second connecting pipe 1144; heating body 1151; electrode interface 1152; air outlet connector 1161; air inlet connector 1162; electrode pressing piece 1171; fixed end 11711; probe end 11712; SMA connector 1172; guide rail 1173; bearing seat 1174; support column 1175. DETAILED DESCRIPTION

[0033] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in combination with the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0034] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be an intermediate element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be an intermediate element at the same time.

[0035] It should be noted that, in this article, if there are first and second, etc., relational terms are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0036] A high and low temperature in-situ spectral reaction cell, such as Figure 1-Figure 3 As shown, it includes a base 111, an optical window, a sample stage 113, a refrigeration unit, a heating unit, a ventilation unit and an electrical testing unit.

[0037] A groove is provided on the top wall of the base 111 , and the base 111 is made of 316 stainless steel to provide safety protection for the reaction pool.

[0038] like Figure 2 and Figure 3 As shown, the optical window includes an upper cover 1121, a first sealing ring 1122, a window sheet 1123 and a window cover 1124. In this embodiment, the window sheet 1123 is made of a pressure-resistant and highly transparent quartz sheet to ensure the transmittance of laser or X-rays. The cross section of the window sheet 1123 is circular, the diameter of the window sheet 1123 is not less than 46 mm, and the thickness is 0.5 mm. The upper cover 1121 is located above the groove, a hole is provided on the upper cover 1121, and a corresponding threaded hole is provided on the top wall of the base 111. The upper cover 1121 is connected to the top wall of the base 111 through bolts and nuts. A first through hole is provided at the center of the upper cover 1121, and the window sheet 1123 is installed on the first through hole. The first sealing ring 1122 is located between the window sheet 1123 and the upper cover 1121 to seal the window sheet 1123. A second sealing ring is provided between the bottom wall of the upper cover 1121 and the top wall of the base 111. The window cover 1124 is located above the window piece 1123 , and the window cover 1124 is connected to the upper cover 1121 through bolts and nuts, and a sealed cavity is formed between the upper cover 1121 , the window piece 1123 and the groove of the base 111 .

[0039] In this embodiment, the sample stage 113 is formed in a columnar shape and is fixedly installed in the groove. The sample stage 113 is located directly below the window piece 1123. The sample stage 113 is fixedly installed by welding but is not limited to welding. A cavity is set in the sample stage 113, and the material of the sample stage 113 is 316 stainless steel.

[0040] like Figure 1-Figure 3 As shown, the refrigeration unit is a semiconductor refrigeration chip (not shown in the figure). When the refrigeration unit is a semiconductor refrigeration chip, the semiconductor refrigeration chip is located in the groove and below the sample stage 113.

[0041] Or the refrigeration unit includes a liquid nitrogen inlet 1141, a liquid nitrogen outlet 1142, a first connecting tube 1143 and a second connecting tube 1144. The liquid nitrogen inlet 1141 and the liquid nitrogen outlet 1142 are connected to the cavity of the sample stage 113. One end of the liquid nitrogen inlet 1141 and one end of the liquid nitrogen outlet 1142 are respectively welded to the side wall of the sample stage 113. The other end of the liquid nitrogen inlet 1141 is connected to one end of the first connecting tube 1143, and the other end of the liquid nitrogen outlet 1142 is connected to one end of the second connecting tube 1144. The other end of the first connecting tube 1143 passes through the side wall of the base 111, and the other end of the second connecting tube 1144 passes through the side wall of the base 111.

[0042] The first connecting pipe 1143 is connected to a liquid nitrogen pump, and liquid nitrogen is input through the liquid nitrogen pump, and the input liquid nitrogen is output from the second connecting pipe 1144 .

[0043] The heating unit includes a heating body 1151 and a resistance wire (not shown in the figure). The resistance wire is wound around the heating body 1151. A ceramic (not shown) tube is sleeved on the resistance wire for insulation. The heating body 1151 is located on the inner bottom wall of the groove of the base 111. The heating body 1151 is wrapped around the outside of the sample stage 113. In this embodiment, the heating body 1151 is made of 316 stainless steel. The heating plate and the sample stage 113 are connected by bolts and nuts to make the two fit together better and achieve better heat conduction.

[0044] The heating unit also includes a thermocouple (not shown). The thermocouple in this embodiment is Pt100, which is used to test the temperature. One end of the thermocouple is inserted into the side wall of the heating body 1151 and fixed with vacuum glue, and the other end of the thermocouple passes through the base 111. This embodiment also includes an electrode interface 1152, which is installed on the side wall of the base 111, and the resistance wire and the thermocouple wire are connected to the electrode interface 1152.

[0045] The ventilation unit includes an air outlet connector 1161 and an air inlet connector 1162. One end of the air outlet connector 1161 is fixedly connected to one end of the base 111, and one end of the air inlet connector 1162 is fixedly connected to the other end of the base 111. In this embodiment, both the air outlet connector 1161 and the air inlet connector 1162 are ferrule connectors, and the ferrule connector and the end of the base 111 are sealed by a sealing ring. The air outlet connector 1161 is connected to a vacuum pumping device to vacuumize the sealed cavity, and the sealed cavity can also be ventilated through the air inlet connector 1162. In this embodiment, two-way ball valves are installed on the air inlet connector 1162 and the air outlet connector 1161.

[0046] like Figure 2 and Figure 3 As shown, the electrical testing unit includes an electrode pressing plate 1171, an SMA connector 1172, a guide rail 1173, a bearing seat 1174 and a support column 1175. The guide rail 1173 is fixedly mounted on the inner bottom wall of the groove, the bearing seat 1174 is fixedly mounted on the slider of the guide rail 1173, one end of the support column 1175 is rotatably connected to the bearing seat 1174, the axis of the support column 1175 is perpendicular to the sliding direction of the slider on the guide rail 1173, and the movement of the slider causes the support column 1175 to approach or move away from the sample stage 113.

[0047] The electrode pressing piece 1171 includes a fixed end 11711 and a probe end 11712, the fixed end 11711 and the probe end 11712 are integrally formed, the fixed end of the electrode pressing piece 1171 is connected to one end of the support column 1175, one end of the electrode pressing piece 1171 is provided with a second through hole, one end of the support column 1175 is provided with a corresponding third through hole, bolts are provided in the second through hole and the third through hole, nuts are installed on the bolts, and the inclination angle of the electrode pressing piece 1171 is adjusted by the bolts and nuts. The probe end 11712 of the electrode pressing piece 1171 forms a tip, which reduces the volume of the electrode pressing piece 1171 and reduces the influence of the electrode pressing piece 1171 on the optical path during optical path analysis. The SMA connector 1172 is fixedly installed on the side wall of the base 111 by welding, and the fixed end 11711 of the electrode pressing piece 1171 is connected to the SMA connector 1172 by a wire. The electrode pressing piece 1171 includes but is not limited to the above-mentioned specific mode, and can also be connected with probe ends of other shapes.

[0048] In this embodiment, there are four electrode pressing plates 1171 , four SMA connectors 1172 , four guide rails 1173 , four bearing seats 1174 and four support columns 1175 . The four guide rails 1173 are distributed around the sample stage 113 .

[0049] The working principle of this embodiment is as follows: the sample to be tested is placed on the sample stage 113, and the optical window cover 1124 is closed on the groove to form a sealed cavity in the groove. After the installation is completed, the outlet joint 1161 is connected to the vacuum pumping device to evacuate the sealed cavity, and then the reaction cell is placed on the spectroscopy line station. After aligning the optical path, liquid nitrogen is introduced from the first connecting pipe 1143. After the liquid nitrogen passes through the cavity in the sample stage 113, it flows out from the second connecting pipe 1144, thereby cooling the sample on the sample stage 113 and collecting relevant data. Stop introducing liquid nitrogen, start the heating unit, and the heating unit is heated to collect relevant data.

[0050] By moving the slider on the guide rail 1173, the distance between the support column 1175 and the sample stage 113 is adjusted, thereby adjusting the distance between the electrode pressing plate 1171 and the sample stage 113. The support column 1175 is installed on the bearing seat 1174. The support column 1175 can rotate in the groove along the axis of the support column 1175, thereby adjusting the position of the electrode pressing plate 1171 and the sample on the sample stage 113, thereby performing electrical tests on the sample at different temperatures.

[0051] Beneficial effects of this embodiment: The reaction pool in this embodiment realizes the control of the high and low temperature environment field in a small system through a simple structural layout, and the temperature can not only reach the lowest extremely low temperature of 4K and the variation range of 300℃ above zero, but also the lowest liquid helium system can reach 4K, the liquid nitrogen system can reach 77K, and the semiconductor refrigeration plate system can reach minus 50℃, and the line layout of various gases and liquids is greatly reduced. At the same time, within the limited space size, the reaction pool in the present invention is also equipped with the electrode pressing piece 1171 and the SMA connector 1172 that can perform electrical testing wiring components under variable temperature conditions, so as to realize the electrical testing requirements under high and low temperature conditions.

[0052] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A high and low temperature in-situ spectrum reaction cell, characterized in that: It includes a base, an optical window, a sample stage, a refrigeration unit, a heating unit, a ventilation unit and an electrical testing unit; the top wall of the base is provided with a groove, and the optical window covers the groove to form a sealed cavity; The sample stage is located in the groove, a cavity is provided in the sample stage, the refrigeration unit is a semiconductor refrigeration plate, or the refrigeration unit includes a liquid nitrogen inlet, a liquid nitrogen outlet, a first connecting pipe and a second connecting pipe, the liquid nitrogen inlet and the liquid nitrogen outlet are connected to the cavity of the sample stage, one end of the first connecting pipe is connected to the liquid nitrogen inlet, and the other end of the first connecting pipe extends out of the base, one end of the second connecting pipe is connected to the liquid nitrogen outlet, and the other end of the second connecting pipe extends out of the base; The heating unit is wrapped around the outside of the sample stage; the ventilation unit includes an air outlet connector, which is located at one end of the base; the electrical testing unit includes an electrode pressing sheet and an SMA connector, one end of the electrode pressing sheet contacts the sample on the sample stage, and the other end of the electrode pressing sheet is connected to the SMA connector; The optical window comprises an upper cover, a first sealing ring, a window sheet and a window cover, wherein the upper cover is located above the groove, the upper cover is connected to the top wall of the base, a first through hole is provided on the upper cover, the sample stage is located below the first through hole, the window sheet is located above the first through hole, the first sealing ring is located between the window sheet and the upper cover, the window cover is located above the window sheet, and the window cover is detachably connected to the upper cover; The electrical testing unit also includes a guide rail, a bearing seat and a support column, wherein the guide rail is located on the inner bottom wall of the groove, the bearing seat is located on the slider of the guide rail, one end of the support column is rotatably connected to the bearing seat, the axis of the support column is perpendicular to the sliding direction of the slider on the guide rail, and the movement of the slider causes the support column to approach or move away from the sample stage; one end of the electrode pressing sheet is connected to one end of the support column, and the other end of the electrode pressing sheet is in contact with the sample on the sample stage.

2. The high and low temperature in-situ spectral reaction cell according to claim 1, characterized in that: The heating unit comprises a heating body and a resistance wire, wherein the resistance wire is wound around the heating body, the heating body is located on the inner bottom wall of the base groove, and the heating body is connected to the sample stage by bolts.

3. The high and low temperature in-situ spectral reaction cell according to claim 2, characterized in that: The heating unit further comprises a thermocouple, one end of which is inserted into the heating body and the other end of which extends out of the base.

4. The high and low temperature in-situ spectral reaction cell according to claim 1, characterized in that: A second through hole is provided at one end of the electrode pressing sheet, and a corresponding third through hole is provided at one end of the supporting column. Bolts are provided in the second through hole and the third through hole, and nuts are provided on the bolts.

5. The high and low temperature in-situ spectrum reaction cell according to claim 1, characterized in that: The electrode pressing sheet comprises a fixed end and a probe end, wherein the fixed end and the probe end are integrally formed, the fixed end is connected to one end of a supporting column, and the probe end forms a tip.

6. The high and low temperature in-situ spectrum reaction cell according to claim 1, characterized in that: The ventilation unit also includes an air inlet connector, and the air inlet connector and the air outlet connector are respectively located at two ends of the base.

7. The high and low temperature in-situ spectrum reaction cell according to claim 6, characterized in that: The air inlet joint and the air outlet joint are both provided with two-way ball valves.

8. The high and low temperature in-situ spectrum reaction cell according to claim 1, characterized in that: The upper cover is provided with a hole, the top wall of the base is provided with a corresponding threaded hole, and the upper cover is connected to the top wall of the base through bolts and nuts.

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