Scanning device and scanning method

Abstract

A scanning device for predicting interstitials includes a scanning platform. The scanning device further includes a first scanner coupled to the scanning platform and a second scanner coupled to the scanning platform. The scanning platform is configured to move the first scanner and the second scanner together along the X-axis and the Z-axis. The scanning platform is further configured to move the first scanner and the second scanner independently of each other and relative to each other along the Y-axis and the Z-axis. When the first scanner and the second scanner move in opposite directions along the Y-axis, a first field of view of the first scanner and a second field of view of the second scanner at least partially overlap.

Description

Technical Field

[0001] The present disclosure generally relates to manufacturing, and more particularly, to a scanning device and a scanning method for predictive shimming of gaps. Background Art

[0002] Modern aircraft may require custom shims to fill the gaps between the fuselage structural components due to manufacturing tolerances. Shims are used to eliminate gaps, maintain structural performance and minimize down-force. The number of shims can increase rapidly in large structures. Currently, the gap filling process involves manual inspection to collect measurement data for shim manufacturing. In either case, the process can result in a significant increase in the time and cost of the manufacturing cycle. Additionally, collecting measurement data can be cumbersome due to the size of the components to be inspected. Summary of the Invention

[0003] Accordingly, a device and method that aim to at least solve the above problems would be useful. The following is a non-exhaustive list of examples of the subject matter according to the present disclosure, which may or may not be claimed.

[0004] In one example, the disclosed scanning device includes a scanning platform. The scanning device further includes a first scanner coupled to the scanning platform and a second scanner coupled to the scanning platform. The scanning platform is configured to move the first scanner and the second scanner together along the X-axis and the Z-axis. The scanning platform is further configured to move the first scanner and the second scanner independently of each other and relative to each other along the Y-axis and the Z-axis.

[0005] In one example, the disclosed scanning method includes the steps of: (1) moving the scanning platform to a scanning position relative to a part; (2) at the scanning position, moving the first scanner and the second scanner relative to the part along the X-axis; (3) with the first scanner in a first X position, moving the first scanner relative to the part along the Y-axis; (4) with the second scanner in a second X position, moving the second scanner relative to the part along the Y-axis; (5) while moving the first scanner, scanning a first portion of the part to form first scan data; and (6) while moving the second scanner, scanning a second portion of the part to form second scan data. A first portion of the part scanned by the first scanner and a second portion of the part scanned by the second scanner partially overlap each other. A first subset of the first scan data and a second subset of the second scan data represent the overlap of the first portion and the second portion.

[0006] Other examples of the disclosed devices, systems, and methods will become apparent from the following detailed description, the drawings, and the appended claims. Brief Description of the Drawings

[0007] Figure 1 is a schematic block diagram of an example of a scanning device;

[0008] Figure 2 is Figure 1 a schematic perspective view of an example of a scanning device;

[0009] Figure 3 is Figure 1 a schematic perspective view of an example of a scanning device;

[0010] Figure 4 is a schematic view of an example of an aircraft;

[0011] Figure 5 is using Figure 1 a schematic view of an example of a part being scanned by the scanning device;

[0012] Figure 6 is using Figure 1 a schematic view of an example of a part being scanned by the scanning device;

[0013] Figure 7 is Figure 1 a schematic perspective view of an example of a scanning device that is located at one of a plurality of scanning positions relative to the part;

[0014] Figure 8 is Figure 1 a schematic perspective view of an example of a scanning device;

[0015] Figure 9 is Figure 1 a schematic perspective view of an example of a scanner of a scanning device;

[0016] Figure 10 is Figure 1 a schematic perspective view of an example of a part of a scanning device;

[0017] Figure 11 is Figure 1 a schematic perspective view of an example of a part of a scanning device;

[0018] Figure 12 is a flowchart of an example of a part of a method of scanning using Figure 1 a scanning device;

[0019] Figure 13 is a flowchart of an example of a part of a method of scanning using Figure 1 a scanning device;

[0020] Figure 14 is Figure 12 a schematic view of an example of a scanning device during a part of the method Figure 1 ;

[0021] Figure 15 is Figure 13 a schematic diagram of a part of the method;

[0022] Figure 16 is an example of a part of a method of scanning using Figure 1 a scanning device;

[0023] Figure 17 is an example of a part of a method of scanning using Figure 1 a scanning device;

[0024] Figure 18 is during a part of the method in Figure 16 which Figure 1 a schematic diagram of an example of a scanning device;

[0025] Figure 19 is Figure 17 a schematic diagram of a part of the method;

[0026] Figure 20 is an example of a part of a method of scanning using Figure 1 a scanning device;

[0027] Figure 21 is an example of a part of a method of scanning using Figure 1 a scanning device;

[0028] Figure 22 is during a part of the method in Figure 20 which Figure 1 a schematic diagram of an example of a scanning device;

[0029] Figure 23 is Figure 21 a schematic diagram of a part of the method;

[0030] Figure 24 is an example of a part of a method of scanning using Figure 1 a scanning device;

[0031] Figure 25 is an example of a part of a method of scanning using Figure 1 a scanning device;

[0032] Figure 26 is during a part of the method in Figure 24 which Figure 1 a schematic diagram of an example of a scanning device;

[0033] Figure 27 is during a part of the method in Figure 24 whichFigure 1 Schematic diagram of an example of a scanning device; and

[0034] Figure 28 is a flowchart of a method for aircraft manufacturing and servicing. Detailed Description

[0035] The following detailed description refers to the accompanying drawings, which illustrate specific examples described by the present disclosure. Other examples with different structures and operations do not depart from the scope of the present disclosure. In different drawings, like reference numerals may refer to the same features, elements, or components.

[0036] Illustrative and non-exhaustive examples are provided below, which may or may not be the claimed subject matter according to the present disclosure. As used herein, the term "example" means that one or more features, structures, elements, components, characteristics, and / or operational steps described in connection with the example are included in at least one embodiment and / or implementation of the claimed subject matter according to the present disclosure. Thus, the phrases "an example", "another example", "one or more examples", and similar language throughout the present disclosure may or may not refer to the same example. Moreover, the subject matter characterizing any one example may or may not include the subject matter characterizing any other example. Also, the subject matter characterizing any one example may or may not be combined with the subject matter characterizing any other example.

[0037] The present disclosure recognizes that during the assembly of an aircraft, due to manufacturing tolerances, gaps may form between mating surfaces of parts of the fuselage. Spacers can be manufactured and placed within gaps that are out of a predetermined tolerance. However, the geometric configuration of the gaps and the corresponding spacers can vary across the parts, so it may be necessary to inspect each spacer location and measure each gap before manufacturing the spacers. Thus, it is desirable to quickly and accurately identify spacer gaps and manufacture spacers.

[0038] The present disclosure recognizes that inspection tools are typically brought into the manufacturing area to inspect parts. The setup and operation of inspection tools increase the time and cost of the manufacturing cycle. The inspection of spacer locations and the manufacture of spacers require precise measurements, which further increase the time and cost of the manufacturing cycle. Thus, it is desirable to reduce the time and cost associated with inspecting parts and manufacturing spacers.

[0039] The present disclosure recognizes that the prediction of gaps to be filled can enable the manufacture of spacers prior to assembling aircraft components. The prediction of gaps and the corresponding spacers can reduce at least one of the manufacturing time and cost, and can lead to a more automated process. However, predicting gap filling requires a high degree of scanning accuracy. Thus, it is desirable to obtain highly accurate and dense scan data of one or both mating parts.

[0040] The present disclosure recognizes that obtaining desired accurate scan data can become challenging for very large parts or for parts having varying geometric configurations. For example, the range of conventional inspection tools may be limited. To inspect a large part, the inspection tool may need to be moved to different positions relative to the part, or additional inspection tools may be required to fully scan the part. Each additional setup can increase the time of the manufacturing cycle of the part. Additionally, multiple setups may result in inconsistent scan data. Accordingly, it is desirable to obtain scan data of large parts quickly and accurately.

[0041] The present disclosure recognizes that the accuracy of scan data obtained by conventional inspection tools (such as laser scanners) decreases as the distance from the inspection tool to the scanned location increases. Accordingly, it is desirable to maintain an optimal and consistent distance between the scan location and the inspection tool.

[0042] Reference Figure 1 , by way of example, the present disclosure describes a scan device 100 for predicting gap filling. For example, the scan device 100 is used to scan at least a portion of a part 200 for a gap filling prediction operation. The part 200 is any one of various types of objects that are subjected to a scan operation performed in preparation for one or more subsequent manufacturing operations. The scan device 100 provides means for scanning at least a portion of the part 200 and collecting scan data 184 representative of the part 200. The scan data 184 is a digital representation of at least a portion of the part 200 and is used to predict a gasket gap between the part 200 and a second part ( Figure 3 ). For example, the scan data 184 includes measurement data or is in the form of measurement data that represents at least a portion of the geometric configuration of the part 200, such as at least a portion of the geometric configuration of the surface 202 of the part 200.

[0043] In one example, the scan data 184 is used to generate a model 130 of the part 200. The model 130 is a virtual (e.g., digital) representation of the actual geometric configuration of the surface 202 of the part 200. In one example, the model 130 of the part 200 (e.g., the actual geometric configuration) is compared with the design of the part 200 (e.g., the theoretical geometric configuration), and a gasket 222 is manufactured based on the difference between the part 200 and the design ( Figure 5 ). In another example, the model 130 of the part 200 is compared with a second model (e.g., the actual geometric configuration) of a second part 220 ( Figure 5 ), and a gasket 222 is manufactured based on the difference between the part 200 and the second part 220.

[0044] Generally referring to Figure 1 and specifically referring to Figure 2 and Figure 3, the scanning device 100 includes a scanning platform 102, a first scanner 104 that forms first scan data 112 for predicting gap filling, and a second scanner 106 that forms second scan data 114 for predicting gap filling. The first scanner 104 is coupled to the scanning platform 102. The second scanner 106 is coupled to the scanning platform 102. The scanning platform 102 is configured to move the first scanner 104 and the second scanner 106 together along the X axis. The scanning platform 102 is further configured to move the first scanner 104 and the second scanner 106 together and / or independently of each other along the Z axis. The scanning platform 102 is further configured to move the first scanner 104 and the second scanner 106 independently of each other and relative to each other along the Y axis.

[0045] Throughout this disclosure, the relative position of an article and / or the direction of movement of an article refers to the spatial condition of the article in three-dimensional space, e.g., relative to a fixed coordinate system 188 ( Figure 2 and Figure 3 ). In one example, the fixed coordinate system 188 is a Cartesian coordinate system defined by three orthogonal axes, such as the X axis, the Y axis, and the Z axis. In one example, the orientation of the coordinate system 188 is fixed relative to the scanning device 100. In another example, the orientation of the coordinate system 188 is fixed relative to the manufacturing environment in which the scanning device 100 operates.

[0046] The scanning platform 102 is configured to move to a scanning position relative to the part 200 at the start of a scanning operation. In one example, the scanning platform 102 is configured to move along at least one of the X axis, the Y axis, and the Z axis. At the scanning position, the scanning platform 102 moves the first scanner 104 and the second scanner 106 relative to the part 200 and relative to each other during the scanning operation.

[0047] In one example, the first scanner 104 moves relative to the part 200 along a first scan path (e.g., parallel to the Y axis) to form (e.g., acquire or generate) a first portion of scan data 184 that represents a first portion 204 of the part 200. In one example, the first portion 204 of the part 200 is a first portion of the surface 202 of the part 200. Thus, throughout this disclosure, the term "first portion 204" generally refers to a portion of the part 200, and in particular, a portion of the surface 202 of the part 200.

[0048] In one example, the second scanner 106 moves relative to the part 200 along a second scan path (e.g., parallel to the Y axis) to form (e.g., acquire or generate) a second portion of the scan data 184, representing a second portion 206 of the part 200. In one example, the second portion 206 of the part 200 is a second portion of the surface 202 of the part 200. Thus, throughout this disclosure, the term "second portion 206" generally refers to a portion of the part 200, and in particular, a portion of the surface 202 of the part 200.

[0049] In one example, when the first scanner 104 is moved along the first scan path, the scan platform 102 is configured to move the first scanner 104 along the Y axis (e.g., the first scan path has a component in the Y direction). In one example, when the first scanner 104 is moved along the first scan path, the scan platform 102 is further configured to move the first scanner 104 along the Z axis (e.g., the first scan path has a component in the Z direction).

[0050] In one example, when the second scanner 106 is moved along the second scan path, the scan platform 102 is configured to move the second scanner 106 along the Y axis (e.g., the second scan path has a component in the Y direction). In one example, when the second scanner 106 is moved along the second scan path, the scan platform 102 is further configured to move the second scanner 106 along the Z axis (e.g., the second scan path has a component in the Z direction).

[0051] Reference Figure 2 and Figure 3 , in one example, the scan platform 102 includes a base 136 and a carriage 138. The carriage 138 is coupled to the base 136 and can move relative to the base 136 along the X axis. The scan platform 102 further includes a support beam 140. The support beam 140 is coupled to the carriage 138 and can move relative to the carriage 138 along the Z axis. The scan platform 102 further includes a first arm 142 and a second arm 144. The first arm 142 is coupled to the support beam 140 and can move relative to the support beam 140 along the Y axis and the Z axis. The second arm 144 is coupled to the support beam 140 and can move relative to the support beam 140 along the Y axis and the Z axis. The first arm 142 and the second arm 144 extend in opposite directions along the Y axis. The first scanner 104 is coupled to the first arm 142. The second scanner 106 is coupled to the second arm 144.

[0052] In one example, the base 136 includes a support frame and provides or serves as a support structure for the carriage 138. The base 136 is configured to move to a scan position relative to the part 200 at the start of a scan operation. In one example, the base 136 is configured to move along at least one of the X axis, the Y axis, and the Z axis.

[0053] The carriage 138 is configured to move relative to the part 200 and relative to the base 136, for example, along the X-axis. The movement of the carriage 138 along the X-axis relative to the base 136 in turn moves the first scanner 104 and the second scanner 106 along the X-axis relative to the part 200 to corresponding positions.

[0054] In one example, the scanning platform 102 includes a carriage drive mechanism 232. The carriage drive mechanism 232 is operatively coupled to the base 136 and the carriage 138. The carriage drive mechanism 232 is configured to move the carriage 138 relative to the base 136, for example, along the X-axis.

[0055] The carriage drive mechanism 232 includes any suitable drive components configured to move the carriage 138 relative to the base 136 precisely and repeatably. In one example, the carriage drive mechanism 232 includes a drive member. The drive member is configured to generate a driving force sufficient to move the carriage 138. The carriage drive mechanism 232 further includes a transmission member. The transmission member is configured to transfer the driving force from the drive member to the carriage 138.

[0056] In one example, the carriage drive mechanism 232 is a linear drive component, such as a mechanical drive component, a pneumatic drive component, or a hydraulic drive component. For example, the carriage drive mechanism 232 includes an electric motor (drive member) and a gear member (transmission member). In one example, the carriage drive mechanism 232 further includes a brake and a travel limiter.

[0057] In one example, the carriage 138 includes a support frame and provides or serves as a support structure for the support beam 140. The support beam 140 is configured to move relative to the part 200 and relative to the carriage 138, for example, along the Y-axis.

[0058] The movement of the support beam 140 along the Y-axis relative to the carriage 138 in turn moves the first scanner 104 and the second scanner 106 relative to the part 200 along the Y-axis to corresponding positions.

[0059] In one example, the scanning platform 102 includes a support beam drive mechanism 234. The support beam drive mechanism 234 is operatively coupled to the carriage 138 and the support beam 140. The support beam drive mechanism 234 is configured to move the support beam 140 relative to the carriage 138, such as along the Z-axis.

[0060] The support beam drive mechanism 234 includes any suitable drive components configured to move the support beam 140 relative to the carriage 138 precisely and repeatably. In one example, the support beam drive mechanism 234 includes a drive member configured to generate a driving force sufficient to move the support beam 140. The support beam drive mechanism 234 further includes a transmission member configured to transfer the driving force from the drive member to the support beam 140.

[0061] In one example, the support beam drive mechanism 234 is a linear drive assembly, such as a mechanical drive assembly, a pneumatic drive assembly, or a hydraulic drive assembly. For example, the support beam drive mechanism 234 includes a servo motor (drive component) and a ball screw assembly (transmission component). In one example, the support beam drive mechanism 234 further includes a brake and a travel limiter.

[0062] In one example, the support beam 140 includes a support frame and provides a support structure for the first arm 142 and the second arm 144 or serves as the support structure for the first arm 142 and the second arm 144. Each of the first arm 142 and the second arm 144 is configured to move relative to the part 200 and relative to the support beam 140, such as along at least one of the Y-axis and the Z-axis.

[0063] The movement of the first arm 142 along the Y-axis relative to the support beam 140 in turn moves the first scanner 104 along the Y-axis to a corresponding position relative to the part 200. The movement of the first arm 142 along the Z-axis relative to the support beam 140 in turn moves the first scanner 104 along the Z-axis to a corresponding position relative to the part 200.

[0064] The movement of the second arm 144 along the Y-axis relative to the support beam 140 in turn moves the second scanner 106 along the Y-axis to a corresponding position relative to the part 200. The movement of the second arm 144 along the Z-axis relative to the support beam 140 in turn moves the second scanner 106 along the Z-axis to a corresponding position relative to the part 200.

[0065] In one example, the scanning platform 102 includes a first arm drive mechanism 236. The first arm drive mechanism 236 is operatively coupled to the support beam 140 and the first arm 142. The first arm drive mechanism 236 is configured to move the first arm 142 relative to the support beam 140, such as along at least one of the Y-axis and the Z-axis. The first arm drive mechanism 236 includes any suitable drive assembly configured to move the first arm 142 relative to the support beam 140 precisely and repetitively.

[0066] In one example, the scanning platform 102 includes a second arm drive mechanism 238. The second arm drive mechanism 238 is operatively coupled to the support beam 140 and the second arm 144. The second arm drive mechanism 238 is configured to move the second arm 144 relative to the support beam 140, such as along at least one of the Y-axis and the Z-axis. The second arm drive mechanism 238 includes any suitable drive assembly configured to move the second arm 144 relative to the support beam 140 precisely and repetitively.

[0067] Each of the first arm drive mechanism 236 and the second arm drive mechanism 238 includes at least one drive component configured to generate a driving force sufficient to move a corresponding one of the first arm 142 and the second arm 144. Each of the first arm drive mechanism 236 and the second arm drive mechanism 238 further includes at least one transmission component configured to transmit the driving force from the drive component to a corresponding one of the first arm 142 and the second arm 144.

[0068] In one example, each of the first arm drive mechanism 236 and the second arm drive mechanism 238 is a linear drive assembly, such as a mechanical drive assembly, a pneumatic drive assembly, or a hydraulic drive assembly. For example, each of the first arm drive mechanism 236 and the second arm drive mechanism 238 includes at least one servo motor (drive component) and at least one roller pinion assembly (transmission component). In one example, each of the first arm drive mechanism 236 and the second arm drive mechanism 238 further includes a brake and a travel limiter.

[0069] In one example, each of the first arm drive mechanism 236 and the second arm drive mechanism 238 includes a pair of drive components and a pair of transmission components. Each one of the pair is configured to drive movement along one of the Y-axis and the Z-axis.

[0070] Thus, the scanning platform 102 is configured to provide overall movement control of the first scanner 104 and the second scanner 106 in the X and Y directions by the movement of the base 136 relative to the part 200. The scanning platform 102 is configured to provide fine movement control of the first scanner 104 and the second scanner 106 in the X direction by the movement of the carriage 138 relative to the base 136. The scanning platform 102 is configured to provide overall movement control of the first scanner 104 and the second scanner 106 in the Z direction by the movement of the support beam 140 relative to the carriage 138. The scanning platform 102 is configured to provide fine movement control of the first scanner 104 in the Y and Z directions by the movement of the first arm 142 relative to the support beam 140. The scanning platform 102 is configured to provide fine movement control of the second scanner 106 in the Y and Z directions by the movement of the second arm 144 relative to the support beam 140.

[0071] In one example, the support beam 140 is an elongated member that provides a range of movement along the Y-axis for the first arm 142 and the second arm 144. For example, each of the first arm 142 and the second arm 144 can move between a first support beam end 242 of the support beam 140 and a second support beam end 244 of the support beam 140 that is opposite the first support beam end 242. The maximum range of the first scanner 104 is achieved when the first arm 142 moves to one of the first support beam end 242 and the second support beam end 244. Similarly, the maximum range of the second scanner 106 is achieved when the second arm 144 moves to any one of the first support beam end 242 and the second support beam end 244.

[0072] The first arm 142 extending along the Y-axis increases the maximum range of the first scanner 104. For example, when the first arm 142 moves to the second support beam end 244, the first arm 142 extends beyond the second support beam end 244, thus positioning the first scanner 104 at a Y-position outside the second support beam end 244. Similarly, when the second arm 144 moves to the first support beam end 244, the second arm 144 extends beyond the first support beam end 242 and thus positions the second scanner 106 at a Y-position outside the first support beam end 242. In this example, the movement of the first arm 142 and the second arm 144 to the opposite ends of the support beam 140 enables the first scanner 104 and the second scanner 106 to be positioned close to the edges of the part 200 at the maximum and minimum widths of the part 200, such that the entire width W ( Figure 6 ) of the part 200 can be scanned along the length L ( Figure 6 ) of the part 200.

[0073] The first arm 142 and the second arm 144 extending in opposite directions along the Y-axis increase the maximum scan width of the scanning device 100 and reduce its minimum scan width. For example, when the first arm 142 moves to the second support beam end 244 and the second arm 144 moves to the first support beam end 242, the first scanner 104 and the second scanner 106 are located at the maximum distance from each other. This configuration represents the maximum scan width of the scanning device 100 and accommodates the maximum width of the part 200. Conversely, when the first arm 142 moves to the first support beam end 242 and the second arm 144 moves to the second support beam end 244, the first scanner 104 and the second scanner 106 are located at the minimum distance from each other. This configuration represents the minimum scan width of the scanning device 100 and accommodates the minimum width of the part 200.

[0074] In one or more examples, the scanning platform 102 includes one or more additional degrees of freedom. In one example, the first arm 142 and the second arm 144 are configured to rotate relative to the support beam 140 (e.g., about an axis parallel to the X axis). In another example, the support beam 140 is configured to rotate relative to the carriage 138 (e.g., about an axis parallel to the Z axis). Additional degrees of freedom and / or relative movement between the structural components of the scanning platform 102 are also contemplated.

[0075] In one example, the scanning device 100 further includes at least one sensor 240( Figure 1 ). The sensor 240 is configured to detect the position of at least one of the carriage 138, the support beam 140, the first arm 142, and the second arm 144 or measure the relative movement of at least one of the carriage 138, the support beam 140, the first arm 142, and the second arm 144. In one example, the scanning device 100 includes a plurality of sensors 240. Each of the sensors 240 detects the position of a corresponding one of the carriage 138, the support beam 140, the first arm 142, and the second arm 144 relative to, for example, a fixed coordinate system 188.

[0076] The sensor 240 includes any suitable device or machine configured to detect a change in the position of an article and send information indicative of such a change in position to a computer processor. For example, the sensor 240 includes at least one of an encoder, a machine vision system, an optical sensor, a pressure sensor, and the like.

[0077] In one example, each of the sensors 240 is configured to form (e.g., acquire or generate) position data 186( Figure 1 ). The position data 186 is a digital representation of the spatial position of a corresponding one of the carriage 138, the support beam 140, the first arm 142, and the second arm 144 relative to, for example, the fixed coordinate system 188. The position data 186 is used to determine the position of each of the first scanner 104 and the second scanner 106 relative to, for example, the fixed coordinate system 188 and thus relative to the part 200.

[0078] Still referring to Figure 2 and Figure 3 , the first scanner 104 has a first field of view 108 and the second scanner 106 has a second field of view 110. In one example, when the first arm 142 and the second arm 144 move along the Y axis relative to the support beam 140, the first field of view 108 and the second field of view 110 at least partially overlap.

[0079] For example, when the first scanner 104 moves along a first scan path and the second scanner 106 moves along a second scan path, at least a portion of the first field of view 108 and at least a portion of the second field of view 110 overlap each other. At least partial overlap of the first field of view 108 and the second field of view 110 occurs during at least a portion of the movement of the first scanner 104 and the second scanner 106 along their respective scan paths. At least partial overlap of the first field of view 108 and the second field of view 110 enables each of the first scanner 104 and the second scanner 106 to generate scan data 184 representing the same portion of the surface 202 of the part 200 during the scan operation without changing the respective X positions of either the first scanner 104 or the second scanner 106.

[0080] In one example, each of the first field of view 108 and the second field of view 110 is at least ninety degrees. In one example, each of the first field of view 108 and the second field of view 110 is at least one hundred and fifty degrees. In one example, each of the first field of view 108 and the second field of view 110 is at least one hundred and eighty degrees. In one example, each of the first field of view 108 and the second field of view 110 is one hundred and ninety degrees.

[0081] In one example, each of the first arm 142 and the second arm 144 has a first arm end 246 and a second arm end 248 opposite the first arm end 246. The first arm end 246 of the first arm 142 is coupled to the support beam 140, for example, by a first arm drive mechanism 236. The first scanner 104 is coupled to the second arm end 248 of the first arm 142. The first arm end 246 of the second arm 144 is coupled to the support beam 140, for example, by a second arm drive mechanism 238. The second scanner 106 is coupled to the second arm end 248 of the second arm 144.

[0082] In one example, each of the first arm 142 and the second arm 144 is inclined relative to the Y axis. The first arm 142 and the second arm 144 inclined with respect to the Y axis position the first scanner 104 and the second scanner 106 at an appropriate Z position such that the first field of view 108 and the second field of view 110 are not blocked by the support beam 140 during the scan operation. In other words, the first arm 142 and the second arm 144 inclined with respect to the Y axis hold the first scanner 104 and the second scanner 106 above the support beam 140 regardless of the positions of the first arm 142 and the second arm 144 along the Z axis.

[0083] The first arm 142 inclined with respect to the Y axis at the start of the scan operation also initially positions the first scanner 104 at a Z position closer to the part 200. Similarly, at the start of the scan operation, the second arm 144 inclined with respect to the Y axis initially also positions the second scanner 106 at a Z position closer to the part 200.

[0084] In one example, the first arm 142 and the second arm 144 are oriented at any desired angle of inclination relative to the Y axis. In one example, the first arm 142 and the second arm 144 are oriented at the same angle of inclination relative to the Y axis. In one example, the first arm 142 and the second arm 144 are oriented at different angles of inclination relative to the Y axis. In one example, the angle of inclination is approximately forty-five degrees. In one example, the angle of inclination is approximately sixty degrees.

[0085] Now referring Figure 4 , in one or more examples, the part 200 is a structure, sub-structure, component, sub-component, part, or other part of the aircraft 1200. For example, the part 200 is any one of a wing section, fuselage section, stringer, spar, rib, frame, interior panel, and outer skin panel of the aircraft 1200 or its components.

[0086] Referring Figure 5 , in one or more examples, the part 200 is a part of the wing 1220 of the aircraft 1200 ( Figure 4 ). The wing 1220 includes a frame 1222, at least one lower panel 1224, and at least one upper panel 1226. In one or more examples, the lower surface of the part 200 is the surface 202 scanned by the scanning device 100. For example, in one example, the lower surface of the frame 1222 is the surface scanned by the scanning device 100. In this example, as Figure 7 shown, the scanning device 100 is located below the frame 1222.

[0087] The frame 1222 forms an underlying support structure for the wing 1220 and includes a combination of structural components (such as stringers, spars, and ribs). The lower panel 1224 is coupled to the frame 1222 and forms a part of the outer skin of the wing 1220. The upper panel 1226 is coupled to the frame 1222, is opposite to the lower panel 1224, and forms a part of the outer skin of the wing 1220.

[0088] In an illustrative example, the part 200 is the frame 1222 and the second part 220 is the lower panel 1224. In this example, the lower surface of the frame 1222 is the surface scanned by the scanning device 100. The part 200 is the lower panel 1224 and the second part 220 is the frame 1222. In this example, the inner surface of the lower panel 1224 is the surface scanned by the scanning device 100. In these examples, the gasket 222 is used to fill the gap between the mating surfaces of the frame 1222 and the lower panel 1224.

[0089] In yet another example, the part 200 is the frame 1222 and the second part 220 is the upper panel 1226. In this example, the gasket 222 is used to fill the gap between the mating surfaces of the frame 1222 and the upper panel 1226.

[0090] Each of the frame 1222, the lower panel 1224, the upper panel 1226, and the gasket 222 is made of any suitable material, such as a metallic material, a composite material, or a combination of materials.

[0091] The present disclosure recognizes that gaps can form between the mating surfaces of the frame 1222 and the lower panel 1224 during the assembly of the airfoil 1220. For example, there can be a gap in the Z direction between the lower surface of the frame 1222 and the upper surface of the lower panel 1224. Some of these gaps can be filled with the gasket 222. Due to the orientation of the airfoil 1220 and the influence of gravity on the lower panel 1224 during the assembly of the airfoil 1220, the gaps between the lower surface of the frame 1222 and the upper surface of the lower panel 1224 can be difficult to identify and measure. Therefore, it is desirable to predict the gasket gaps prior to the assembly of the airfoil 1220.

[0092] In the illustrative example, the gasket 222 is the result of predicted gap filling. In one example, the gasket 222 is manufactured based on the difference between the surface 202 of the part 200 and the design of the part 200. In another example, the gasket 222 is manufactured based on the difference between the surface 202 of the part 200 and the second surface 224 of the second part 220. In yet another example, the gasket 222 is manufactured based on the difference between the second surface 224 of the second part 220 and the design of the second surface 224 of the second part 220.

[0093] In the illustrative example, the difference between the surface 202 of the part 200 and the design of the part 200, or the difference between the surface 202 of the part 200 and the second surface 224 of the second part 220 is in the Z direction, perpendicular to the surface 202 of the part 200. Gaps having dimensions outside a predetermined tolerance can be filled with the gasket 222. In these examples, the gasket 222 is used to fill gaps in a direction perpendicular to the surface 202 of the part 200. Although the differences are described in the Z direction, the differences can exist in any direction or along any axis.

[0094] Reference Figure 6 , generally, the part 200 has a length L measured along a longitudinal axis A1 and a width W measured transverse to the longitudinal axis A. In the illustrative example, the part 200 is the frame 1222 of the airfoil 1220 ( Figure 5)。In one example, the width W of the part 200 decreases along the longitudinal axis from a first part end 226 to a second part end 228 opposite the first part end 226. In such an example, the maximum width of the part 200 is near the first part end 226, and the minimum width of the part 200 is near the second part end 228. For example, the frame 1222 tapers from the root to the tip.

[0095] In one example, the part 200 is asymmetric about the longitudinal axis A1. In one example, the part 200 is asymmetric about a transverse axis A2 perpendicular to the longitudinal axis A1. In one example, the part 200 has a curvature along at least one of the longitudinal axis A1 and the transverse axis A2. For example, the frame 1222 has an in-plane curvature and an out-of-plane curvature.

[0096] Reference Figure 7 , in one example, the part 200 is horizontally fixed in an overhead position. For example, the holding fixture 230 is used to hold the part 200 in the overhead position in the horizontal direction. In one example, the scanning operation performed by the scanning device 100 and subsequent manufacturing operations, such as the placement of the spacer 222 ( Figure 5 ) and the assembly of the part 200 with the second part 220 are performed at the same location in the manufacturing environment. Collocating the scanning operation and at least one manufacturing operation can reduce the time and cost of the manufacturing cycle.

[0097] In one example, the scanning platform 102 is configured to move to any one of a plurality of scanning positions 192 ( Figure 6 ) relative to the part 200. For example, in one example, the scanning platform 102 is configured to be moved to any one of a plurality of scanning positions 192 below the part 200 (e.g., the frame 1222), as Figure 7 shown. For example, the scanning platform 102 is configured to be sequentially moved through a plurality of scanning positions 192 relative to the lower side of the frame 1222 of the wing 1220.

[0098] Figure 7 The example shown shows the scanning platform 102 at one of a plurality of scanning positions 192 relative to the part 200. In one or more examples, the scanning platform 102 is movable (e.g., configured to be moved or configured to move) to any one of a plurality of scanning positions 192 ( Figure 6 ) below the part 200 to position the first scanner 104 and the second scanner 106 relative to the lower side surface of the part 200 (e.g., the frame 1222). In this example, the lower side surface of the part 200 is the surface 202 scanned by the scanning device 100.

[0099] As Figure 7As shown, when the scanning platform 102 is at one of a plurality of scanning positions 192, the first scanner 104 and the second scanner 106 move relative to the part 200 and are located at respective initial X positions based on the movement of the carriage 138 relative to the base 136 along the X axis. The first scanner 104 and the second scanner 106 further move relative to the part 200 and are located at respective initial Z positions based on the movement of the support beam 140 relative to the carriage 138 along the Z axis.

[0100] When at the respective initial X positions, based on the movement of the first arm 142 relative to the support beam 140 along the Y axis (and optionally, along the Z axis), the first scanner 104 moves further relative to the part 200 along a first scan path. Similarly, when at the respective initial X positions, based on the movement of the second arm 144 along the Y axis (and optionally, along the Z axis) relative to the support beam 140, the second scanner 106 moves further relative to the part 200 along a second scan path. Each of the first scanner 104 and the second scanner 106 performs at least one pass along its respective scan path to collect scan data 184 representing an initial portion of the surface 202 of the part 200.

[0101] It should be understood that when the part 200 is coupled to the holding fixture 230, the relative position of the part 200 in the manufacturing environment is known. Further, for example, based on position data 186 Figure 1 provided by the sensor 240 ( Figure 1 ), the relative position of each of the first scanner 104 and the second scanner 106 is known. Thus, the scanning platform 102 is configured to automatically move the first scanner 104 and the second scanner 106 relative to the part 200 under the control of a computer based on the known position of the part 200 and the known positions of the first scanner 104 and the second scanner 106.

[0102] The movement of the first scanner 104 and the second scanner 106 along the Y axis results in the width W of the part 200 ( Figure 6 ), and enables each of the first scanner 104 and the second scanner 106 to scan the surface 202 over at least a portion of the width W of the part 200 and form scan data 184 indicative of at least a portion of the surface 202. For example, as Figure 6 and Figure 7 best shown, at one or more of a plurality of scanning positions 192 ( Figure 6 ) near the first part end 226 ( Figure 6 ), the first arm 142 and the second arm 144 can move away from each other in opposite directions along the Y axis, such that the first scanner 104 and the second scanner 106 can scan the entire width W of the part 200 (e.g., the maximum width WMAX ( Figure 26 ))。At one or more of the plurality of scan positions 192 near the second part end 228( Figure 6 ), the first arm 142 and the second arm 144 can move closer to each other in opposite directions along the Y axis. Thus, the first scanner 104 and the second scanner 106 can scan the entire width W of the part 200 (e.g., the minimum width W MIN ( Figure 27 ))。

[0103] Thus, the connection of the first scanner 104 to the first arm 142 and the connection of the second scanner 106 to the second arm 144 increase the scan width of the scanning device 100. Increasing the scan width advantageously reduces the time required to fully scan the part 200. Additionally, increasing the scan width can reduce the number of passes of the first scanner 104 and the second scanner 106 across the part 200.

[0104] In one example, during the movement of the first scanner 104 and the second scanner 106 along the Y axis (e.g., along the respective first scan path and second scan path), at least a portion of the surface 202 is scanned by the first scanner 104 and the second scanner 106. Thus, at least a portion of the scan data 184 from each of the first scanner 104 and the second scanner 106 represents the same portion of the surface 202 of the part 200.

[0105] The movement of the first scanner 104 and the second scanner 106 along the Z axis results in an out-of-plane curvature of the part 200, e.g., portions of the part 200 having different Z positions along the width W of the part 200. And enables the first scanner 104 and the second scanner 106 to maintain a consistent offset distance from the part 200 during the scan operation.

[0106] Once the first scanner 104 and the second scanner 106 have completed scanning an initial portion of the part 200 at the initial X position, the scan platform 102 is configured to move the first scanner 104 and the second scanner 106 further along the X axis such that subsequent portions of the part 200 along the length L of the part 200( Figure 6 ) can be scanned. For example, with the scan platform 102 remaining at the same one of the plurality of scan positions 192( Figure 6 ), the first scanner 104 and the second scanner 106 move relative to the part 200 and are located at respective subsequent X-positions based on the movement of the carriage 138 relative to the base 136 along the X axis. In one or more examples, based on the movement of the support beam 140 relative to the carriage 138 along the Z axis, the first scanner 104 and the second scanner 106 further move relative to the part 200 and are located at respective subsequent Z positions.

[0107] When at a corresponding subsequent X position, based on the movement of the first arm 142 relative to the support beam 140 along the Y axis (and optionally along the Z axis), the first scanner 104 moves further relative to the part 200 along a first scan path. Similarly, when at a corresponding subsequent X position, based on the movement of the second arm 144 relative to the support beam 140 along the Y axis (and optionally along the Z axis), the second scanner 106 moves further relative to the part 200 along a second scan path. Each of the first scanner 104 and the second scanner 106 performs at least one pass along its respective scan path to collect scan data 184 representative of a subsequent portion of the surface 202 of the part 200.

[0108] By further subsequent movement of the carriage 138 relative to the base 136 along the X axis, at least a portion of the length L of the part 200 ( Figure 6 ) is repeated for the above process. The further subsequent movement of the carriage 138 along the X axis in turn causes the first scanner 104 and the second scanner 106 to move relative to the part 200 along the length L of the part 200 and positions the first scanner 104 and the second scanner 106 at corresponding further subsequent X positions.

[0109] In one example, the base 136 is an elongate member having a length such that a majority of the length L of the part 200 can be scanned at one of the scan positions 192 of the scan platform 102 relative to the part 200 ( Figure 6 ). For example, the carriage 138 is configured to move between a first base end 250 of the base 136 and a second base end 252 of the base 136 opposite the first base end 250 ( Figure 2 and Figure 3 ). The movement of the carriage 138 along the X axis from the first base end 250 to the second base end 252 accommodates at least a portion of the length L of the part 200.

[0110] In the case where the length L of the part 200 ( Figure 6 ) is greater than the length of the base 136, the scan platform 102 is configured to move to a subsequent one of a plurality of scan positions 192 ( Figure 6 ) relative to the part 200 (e.g., below it). Once the scan platform 102 is moved to a subsequent one of the plurality of scan positions 192 relative to the part 200, e.g., further down along the length L of the part 200, the above process is repeated for a subsequent portion of the length L of the part 200.

[0111] Briefly referring to Figure 2 and Figure 3, in one example, the scanning platform 102 includes a plurality of wheel assemblies 146. Each wheel assembly 146 is coupled to the base 136. The wheel assemblies 146 enable the scanning platform 102 to move relative to the part 200 along the floor of the manufacturing environment.

[0112] In one example, each wheel assembly 146 includes at least one of a wheel and a roller. The wheel is coupled to a drive train configured to drive the rotation of the wheel to propel the scanning platform 102. The roller is freely rotatable and thus enables the scanning platform 102 to move by the application of an external force.

[0113] In one example, at the start of a scanning operation, the scanning platform 102 moves relative to the part 200 to a first scanning position among a plurality of scanning positions 192, such as beneath the horizontally oriented part 200. At the first scanning position among the scanning positions 192, the first scanner 104 and the second scanner 106 scan a first portion of the length L ( Figure 6 ) of the part 200, e.g., a first segment of the part 200. After scanning the first portion of the length L of the part 200, the scanning platform 102 moves relative to the part 200 to a second scanning position among the plurality of scanning positions 192 ( Figure 6 ). At the second scanning position among the scanning positions 192, the first scanner 104 and the second scanner 106 scan a second portion of the length L of the part 200, e.g., a second segment of the part 200. This process is repeated over the entire length L of the part 200. After scanning the entire length L of the part 200, the scanning platform 102 moves away from the part 200 and subsequent manufacturing operations, such as placing the spacer 222 ( Figure 5 ) or part assembly, can be performed.

[0114] In one example, the scanning platform 102, such as the base 136 and the wheel assemblies 146, takes the form of or serves as a manually guided vehicle. For example, an operator can provide steering input to the scanning platform 102 to move the scanning platform 102 throughout the manufacturing environment.

[0115] In another example, the scanning platform 102, such as the base 136 and the wheel assemblies 146, takes the form of or serves as an automated guided vehicle (AVG). For example, the scanning platform 102 is configured to automatically travel along a predetermined travel path within the manufacturing environment. The manufacturing environment includes at least one automated guidance system configured to guide the scanning platform 102 along the predetermined travel path. Examples of the automated guidance system include but are not limited to tracks, wires, guide tapes, laser target navigation systems, vision guidance systems, etc.

[0116] Reference Figure 8, in one example, the scanning platform 102 includes a plurality of jacks 174. Each of the plurality of jacks 174 is coupled to the base 136 and is configured to engage the floor of the manufacturing environment. The plurality of jacks 174 are configured to apply a constant force F to the base 136 such that the base 136 maintains a repeatable shape at each of the plurality of scan positions 192( Figure 7 ).

[0117] In one example, each of the plurality of jacks 174 includes a rigid body and an actuator configured to apply a constant force F to the base 136. For example, each of the jacks 174 includes a suitable linear actuator, such as a mechanical actuator, a pneumatic actuator, or a hydraulic actuator. Thus, the jacks 174 advantageously stabilize the base 136 of the scanning platform 102 during the scanning operation and enable the base 136 to maintain a repeatable shape.

[0118] The present disclosure recognizes that in some cases, the manufacturing floor is not perfectly flat. Thus, at each of the scan positions 192( Figure 7 ), the base 136 of the scanning platform 102 may have a different machine shape. The disclosed scanning device 100 addresses variations in the manufacturing floor by applying a constant force F to the base 136. Advantageously, the jacks 174 return the shape of the base 136 to a compensated and repeatable shape, rather than the shape of the floor, which improves the accuracy of the scanning operation of the surface 202 of the part 200 (e.g., the underside of the frame 1222 of the wing 1220), and thus, the accuracy of the predicted gap filling operation.

[0119] In one example, each jack 174 includes a load cell configured to sense an initial force applied by the scanning platform 102 to the jack 174 when the scanning platform 102 is set at an initial scan position. In the case where the X-axis is a known and repeatable position, the jack 174 applies a constant force F that is set to be equal to the initial force. Thus, at each subsequent scan position of the scanning platform 102, the constant force F applied by the jacks 174 to the base 136 returns the base 136 to the same (e.g., repeatable) shape that it had at the initial scan position, regardless of the condition of the production shop floor. Additionally, in one example, the scanning platform 102 is calibrated to compensate for changes in the machine shape during the scanning operation.

[0120] Reference Figure 9, in one example, the first scanner 104 and the second scanner 106 can be moved independently relative to the part 200. For example, the scanning platform 102 is configured to move the first scanner 104 and the second scanner 106 independently relative to each other along the Y axis (and optionally, along the Z axis) via corresponding movements of the first arm 142 and the second arm 144 relative to the support beam 140. It should be understood that Figure 9 shows an example of a portion of one arm of the scanning device 100 and the associated scanner, which represents the first arm 142 and the first scanner 104, and the second arm 144 and the second scanner 106.

[0121] In one example, the first scanner 104 can rotate relative to the first arm 142. Similarly, the second scanner 106 can rotate relative to the second arm 144. For example, the first scanner 104 rotates about a corresponding rotation axis R relative to the first arm 142, and the second scanner 106 rotates about a corresponding rotation axis R relative to the second arm 144. In an illustrative example, the rotation axis R is parallel to the Z axis (e.g., generally vertical).

[0122] The rotation of the first scanner 104 relative to the first arm 142 advantageously increases the maximum scan measurement area provided by the first scanner 104. Similarly, the rotation of the second scanner 106 relative to the second arm 144 advantageously increases the maximum scan measurement area provided by the second scanner 106. Additionally, the rotation of the first scanner 104 relative to the first arm 142 and the rotation of the second scanner 106 relative to the second arm 144 advantageously enable the scanning mechanism (e.g., laser) to be selectively oriented parallel to the part 200 to be scanned. For example, the ribs of the frame 1222 ( Figure 5 and 6 ) and the stringers of the frame 1222 are perpendicular to each other. Thus, in this example, during the scanning operation, the first scanner 104 and / or the second scanner 106 rotate approximately ninety degrees between the ribs and the stringers.

[0123] In one example, the first scanner 104 and the second scanner 106 each include one or more additional degrees of freedom relative to the first arm 142 and the second arm 144. For example, the first scanner 104 also rotates about a corresponding second rotation axis (not shown) relative to the first arm 142, and the second scanner 106 also rotates about a corresponding second rotation axis (not shown) relative to the second arm 144. In an illustrative example, the second rotation axis is perpendicular to the rotation axis R (e.g., generally horizontal or parallel to the Y axis). The rotation of the first scanner 104 and / or the second scanner 106 about the corresponding second rotation axis advantageously enables the scanning device 100 to maintain the laser emitted from the corresponding one of the first scanner 104 and the second scanner 106 perpendicular to the surface being scanned.

[0124] In one example, the scanning platform 102 includes connection assemblies 254 associated with each of the first arm 142 and the second arm 144. The connection assembly 254 of the first arm 142 is configured such that the first scanner 104 can be attached to the first arm 142. The connection assembly 254 of the second arm 144 is configured to attach the second scanner 106 to the second arm 144.

[0125] The connection assembly 254 includes any suitable mechanical attachment that connects and properly aligns the first scanner 104 with the first arm 142 and the second scanner 106 with the second arm 144. The first scanner 104 and the second scanner 106 are coupled to the scanning platform 102 using the connection assembly 254 for a single setup operation. The connection assembly 254 also enables the first scanner 104 and the second scanner 106 to be easily and simply replaced.

[0126] In one example, the scanning platform 102 includes scanner drive mechanisms 256 associated with each of the first arm 142 and the second arm 144. The scanner drive mechanism 256 of the first arm 142 is operatively coupled to the first scanner 104. The scanner drive mechanism 256 of the first arm 142 is configured to rotate the first scanner 104 relative to the first arm 142, e.g., about a rotation axis R. The scanner drive mechanism 256 of the second arm 144 is operatively coupled to the second scanner 106. The scanner drive mechanism 256 of the second arm 144 is configured to rotate the second scanner 106 relative to the second arm 144, e.g., about a rotation axis R.

[0127] The scanner drive mechanism 256 includes any suitable drive components configured to precisely and repeatably rotate the respective one of the first scanner 104 and the second scanner 106 relative to the respective one of the first arm 142 and the second arm 144. In one example, the scanner drive mechanism 256 includes a drive component configured to generate a driving force sufficient to rotate the respective one of the first scanner 104 and the second scanner 106. The scanner drive mechanism 256 also includes a transmission component configured to transfer the driving force from the drive component to the respective one of the first scanner 104 and the second scanner 106.

[0128] In one example, the scanner drive mechanism 256 is a rotary drive assembly, such as a mechanical drive assembly, a pneumatic drive assembly, or a hydraulic drive assembly. For example, the scanner drive mechanism 256 includes a servo motor (drive component) and a bearing assembly (transmission component).

[0129] In one example, at least one of the sensors 240 is associated with each of the first scanner 104 and the second scanner 106 and is configured to detect the rotational orientation of the rotational movement of each of the first scanner 104 and the second scanner 106 or to measure the rotational movement of each of the first scanner 104 and the second scanner 106. In this example, the position data 186 includes information related to the rotation of the first scanner 104 and the second scanner 106, which is used to determine the orientation of each of the first scanner 104 and the second scanner 106, for example, relative to the fixed coordinate system 188 and thus relative to the part 200.

[0130] In one example, the scanning platform 102 includes an indexing component (not shown) that is configured to index the first scanner 104 and the second scanner 106 relative to the scanning platform 102 repeatedly and automatically under computer control. Preferably, the indexing component has sufficient precision such that a single calibration of the first scanner 104 and the second scanner 106 can be applied to subsequent scanning operations. Using a single (e.g., reusable) calibration reduces the setup time required to inspect the part 200.

[0131] In one example, each of the first scanner 104 and the second scanner 106 includes at least one laser scanner 168. The laser scanner 168 includes any suitable laser scanning device configured to emit a laser and collect the laser deflected back from the surface. The scan data 184 is generated based on information from the collected laser.

[0132] In one example, the laser scanner 168 is a two-dimensional (2D) laser scanner. In another example, the laser scanner 168 is a three-dimensional (3D) laser scanner.

[0133] In one example, the first scanner 104 includes a pair of laser scanners 168. Similarly, in one example, the second scanner 106 includes a pair of laser scanners 168. Using a pair of laser scanners 168 advantageously increases the field of view of the associated first scanner 104 and second laser scanner 106 and enables a larger portion of the surface 202 to be scanned each pass. In one example, the combined field of view of the pair of laser scanners 168 of the first scanner 104 forms the first field of view 108. Similarly, the combined field of view of the pair of laser scanners 168 of the second scanner 106 forms the second field of view 110.

[0134] In one example, the laser scanner 168 includes or takes the form of a laser profiler 172. The laser profiler 172 advantageously provides a fast and accurate measurement of the surface profile of the surface 202 of the part 200.

[0135] Generally referring toFigure 1 And with particular reference to Figure 9 , in one example, the scanning device 100 includes a first camera 132 and a second camera 134. The first camera 132 is coupled to the scanning platform 102 and is configured to form (e.g., generate or obtain) a first image 194 of a first portion 204 of the part 200( Figure 1 ). The second camera 134 is coupled to the scanning platform 102 and is configured to form (e.g., generate or obtain) a second image 196 of a second portion 206 of the part 200( Figure 1 ). The scanning platform 102 is configured to move the first camera 132 along the X-axis, Y-axis, and Z-axis using the first scanner 104. The scanning platform 102 is configured to move the second camera 134 along the X-axis, Y-axis, and Z-axis using the second scanner 106.

[0136] In one example, each of the first image 194 and the second image 196 is a still image or a frame of a video. The first image 194 and the second image 196 are processed and used to identify inconsistencies 218 on the part 200( Figure 1 ). For example, the scanning device 100 is configured to determine whether an inconsistency 218 exists on the surface 202 of the part 200.

[0137] In one example, the first camera 132 is coupled to a second arm end 248 of a first arm 142 adjacent to the first scanner 104. In this example, the first image 194 formed by the first camera 132 is a visual representation of a portion of the surface 202 scanned by the first scanner 104 at any given Y-position along a first scan path. For example, the first image 194 depicts a portion of the surface 202 disposed within a first field of view 108 of the first scanner 104. In one example, the first camera 132 and the first scanner 104 are coupled to the first arm 142 via a connection assembly 254. In one example, the first camera 132 rotates about a rotation axis R together with the first scanner 104.

[0138] In one example, the second camera 134 is coupled to a second arm end 248 of a second arm 144 near the second scanner 106. In this example, the second image 196 formed by the second camera 134 is a visual representation of a portion of the surface 202 scanned by the second scanner 106 at any given Y-position along a second scan path. For example, the second image 196 depicts a portion of the surface 202 disposed within a second field of view 110 of the second scanner 106. In one example, the second camera 134 and the second scanner 106 are coupled to the second arm 144 via a connection assembly 254. In one example, the second camera 134 rotates about a rotation axis R together with the second scanner 106.

[0139] ReferenceFigure 1 , in one example, while the first scanner 104 is moved along the Y-axis, the first scanner 104 is configured to form (e.g., acquire or generate) first scan data 112 ( Figure 1 ). The first scan data 112 represents a first portion 204 of the part 200. While the second scanner 106 is moved along the Y-axis, the second scanner 106 is configured to form (e.g., acquire or generate) second scan data 114 ( Figure 1 ). The second scan data 114 represents a second portion 206 of the part 200. The first portion 204 of the part 200 and the second portion 206 of the part 200 at least partially overlap each other such that a first subset 120 of the first scan data 112 ( Figure 1 ) and a second subset 122 of the second scan data 114 ( Figure 1 ) represent an overlap 208 of the first portion 204 and the second portion 206 of the part 200.

[0140] For example, the first scanner 104 scans a first portion 204 of the surface 202 to form the first scan data 112, while the second scanner 106 scans a second portion 206 of the surface 202 to form the second scan data 114. A part of the first portion 204 and at least a part of the second portion 206 are the same part of the surface 202. Thus, the first subset 120 of the first scan data 112 and the second subset 122 of the second scan data 114 represent the same part of the surface 202 formed by the overlapping part of the first portion 204 and the second portion 206, which is referred to as the overlap 208 herein.

[0141] In one example, the overlap 208 includes, for example, at least one structural feature 216 of the part 200 formed by the surface 202 of the part 200 ( Figure 1 ). Examples of the structural feature 216 include but are not limited to machined features (e.g., fastener holes), edges, intersections of two parts of the surface 202, joints between two parts of the part 200, etc.

[0142] The first scan data 112 and the second scan data 114 are examples of the scan data 184 and can be in any desired form. In one example, the first scan data 112 and the second scan data 114 include a series of data points or take the form of a series of data points. In one example, a first subset 120 of the first scan data 112 and a second subset 122 of the second scan data 114 provide a greater sampling in the region of interest of the surface 202. As an example, the first subset 120 and the second subset 122 provide a greater sampling of data points for the overlap 208 of the surface 202. As another example, the first subset 120 and the second subset 122 provide a greater sampling of data points in the region of the surface 202 where the part 200 is to mate with a second part 220.

[0143] Generally, the scan data 184 (e.g., the first scan data 112 and the second scan data 114) is stored in any desired location. In one example, the scan data 184 is stored in a computer (e.g., computer 116( Figure 1 ))), such as in the internal memory of the computer. In another example, the scan data 184 is stored in a different location.

[0144] In one example, the scan data 184 is selectively extracted and stored. For example, although the first scanner 104 and the second scanner 106 scan the entire surface 202 of the part 200, the data points within the selected region of interest are extracted and saved. As an example, the data points representing the overlap 208 (e.g., the first subset 120 and the second subset 122) are extracted and saved.

[0145] In one example, the scan data 184 is selectively extracted and discarded. For example, although the first scanner 104 and the second scanner 106 scan the entire surface 202 of the part 200, the data points within the selected region of interest are extracted and discarded. As an example, the data points representing the inconsistency 218( Figure 1 ) are extracted and discarded.

[0146] In one example, the first scan data 112 and the second scan data 114 are used to create a predicted gap. The first scan data 112 and the second scan data 114 are used to determine the difference between the surface 202 of the part 200 and the design of the part 200 or between the surface 202 of the part 200 and the second surface 224 of the second part 220. Based on this difference, the gasket 222 is manufactured.

[0147] In another example, the first scan data 112 and the second scan data 114 are used to perform gasketless manufacturing. The first scan data 112 and the second scan data 114 are used to determine the difference between the surface 202 of the part 200 and the design of the part 200. Using such a method, the design of the second surface 224 of the second part 220 is modified. The difference is used to form a modified design. The modified design of the second surface 224 of the second part 220 is configured to mate with the surface 202 of the part 200 and eliminates the gasket between the part 200 and the second part 220 for gasketless manufacturing.

[0148] Reference Figure 1 , in one example, the scanning device 100 includes a computer 116. The computer 116 communicates with the first scanner 104 and the second scanner 106. The computer 116 is configured to receive the first scan data 112 from the first scanner 104 and the second scan data 114 from the second scanner 106.

[0149] The computer 116 includes a processor 118. The processor 118 is configured to align a first subset 120 of the first scan data 112 and a second subset 122 of the second scan data 114 based on the overlap 208 of the first part 204 and the second part 206 of the part 200.

[0150] It can be understood that the scan data 184 representing the entire surface 202 of the part 200 is composed of a set of the first scan data 112 representing discrete parts of the surface 202 and a set of the second scan data 114 representing other discrete parts of the surface 202. The alignment of the first subset 120 and the second subset 122 enables the first scan data 112 and the second scan data 114 to be precisely combined. Therefore, transforming the first scan data 112 and the second scan data 114 based on the alignment of the first subset 120 and the second subset 122 provides an accurate representation of the geometry (e.g., surface profile) of the entire surface 202 of the entire part 200.

[0151] In one example, the processor 118 is configured to use the first scan data 112 and the second scan data 114 to generate a model 130 of the part 200. In one example, the processor 118 is configured to use the first scan data 112 and the second scan data 114 to determine the difference between the surface 202 of the part 200 and the design of the part 200 or between the surface 202 of the part 200 and the second surface 224 of the second part 220. As described above, a gasket 222 is manufactured based on such a difference ( Figure 5 ).

[0152] In one example, the processor 118 is configured to identify an inconsistency 218 on the surface 202 of the part 200 from a first image 194 provided by the first camera 132 and a second image 196 provided by the second camera 134. In one example, the processor 118 performs image processing or other machine vision operations to determine the presence of the inconsistency 218. When the inconsistency 218 is identified, the processor 118 is configured to associate the location of the inconsistency 218 relative to the image with a data point representing the location of the inconsistency 218. The processor 118 is configured to extract and discard the data point representing the inconsistency 218.

[0153] The present disclosure recognizes that an inconsistency 218 located on the surface 202 of the part 200 may result in inaccurate scan data 184. Accordingly, it is desirable to remove the data points representing the inconsistency 218 from the scan data 184. Examples of the inconsistency 218 include, but are not limited to, tape, sealant, and the like.

[0154] In one example, the computer 116 communicates with the sensor 240. In one example, the processor 118 is configured to receive position data 186 from the sensor 240 and use the position data 186 to determine the relative positions of the first scanner 104 and the second scanner 106.

[0155] In one example, the scanning device 100 includes a controller 124. The controller 124 communicates with the scanning platform 102. Generally, the controller 124 is configured to control the operation of the components of the scanning device 100. For example, the controller 124 is configured to selectively control the movement of the carriage 138 relative to the base 136, the movement of the support beam 140 relative to the carriage 138, the movement of the first arm 142 relative to the support beam 140, the movement of the second arm 144 relative to the support beam 140, the movement of the first scanner 104 relative to the first arm 142, and the movement of the second scanner 106 relative to the second arm 144. In one example, the controller 124 is configured to control the actuation of the first scanner 104 to form the first scan data 112, control the actuation of the second scanner 106 to form the second scan data 114, control the actuation of the first camera 132 to form the first image 194, and control the actuation of the second camera 134 to form the second image 196.

[0156] In one example, the controller 124 communicates with the computer 116. Thus, the controller 124 is configured to move the first scanner 104 and the second scanner 106 relative to the part 200 based on the known location of the part 200 and the known locations of the first scanner 104 and the second scanner 106 relative to the part 200.

[0157] In one example, the controller 124 comprises or takes the form of a computer numerical control (CNC) system. Controlling the movement of the first scanner 104 and the second scanner 106 towards the controller 124 provides the desired high precision and accuracy for the movement of the first scanner 104 and the second scanner 106 relative to the part 200. Compared with an independent metrology system, the first scanner 104 and the second scanner 106 connected to the scanning platform 102 and controlled by the controller 124 provide higher accuracy.

[0158] In some illustrative examples, the X-axis, Y-axis, and Z-axis along which the first scanner 104 and the second scanner 106 move are aligned with the orthogonal axes of the fixed coordinate system 188. For the purposes of the present disclosure, aligned axes refer to axes that are parallel or coincident with each other. In such examples, during the scanning operation, the part 200 is horizontally oriented, and the XY plane of the fixed coordinate system 188 of the scanning device 100 is horizontal. However, the present disclosure recognizes that in some examples, the part 200 has a non-horizontal orientation (e.g., perpendicular or inclined to the horizontal plane). Thus, in one or more examples, the scanning device 100 is not limited to the XYZ coordinate system shown and is arranged, for example, in a non-horizontal orientation during the scanning operation. Figure 10 and Figure 11 An example of the scanning device 100 that is not limited to a specific coordinate system is shown.

[0159] Reference Figure 10 and Figure 11 Referring to and, in one or more examples of the disclosed scanning device 100, the carriage 138 is coupled to the base 136 and is movable relative to the base 136 along a first axis of linear motion 148. The support beam 140 is coupled to the carriage 138 and is movable relative to the carriage 138 along a second axis of linear motion 150. The second axis of linear motion 150 is perpendicular to the first axis of linear motion 148.

[0160] The first arm 142 is movable relative to the support beam 140 along a third axis of linear motion 152 and along a fourth axis of linear motion 154. The third axis of linear motion 152 is perpendicular to the first axis of linear motion 148 and perpendicular to the second axis of linear motion 150. The fourth axis of linear motion 154 is parallel to the second axis of linear motion 150.

[0161] The second arm 144 is movable relative to the support beam 140 along a fifth axis of linear motion 156 and along a sixth axis of linear motion 158. The fifth axis of linear motion 156 is perpendicular to the first axis of linear motion 148 and perpendicular to the second axis of linear motion 150. The sixth axis of linear motion 158 is parallel to the second axis of linear motion 150.

[0162] When the first arm 142 moves along the third axis of the linear motion 152 and the second arm 144 moves along the fifth axis of the linear motion 156, the first field of view 108 of the first scanner 104 and the second field of view 110 of the second scanner 106 at least partially overlap.

[0163] In one example, the first scanner 104 and the second scanner 106 can move independently relative to the part 200. When moving the first arm 142 along the third axis of the linear motion 152, the first scanner 104 is configured to scan the first part 204 of the part 200 and obtain the first scan data 112. When moving the second arm 144 along the fifth axis of the linear motion 156, the second scanner 106 is configured to scan the second part 206 of the part 200 and obtain the second scan data 114. The first part 204 of the part 200 and the second part 206 of the part 200 at least partially overlap, so at least one structural feature 216 of the part 200 is represented by the first scan data 112 and the second scan data 114.

[0164] Generally referring Figures 12 to 27 , by way of example, the present disclosure also describes a method 1000 for scanning a part 200 for predictive gap filling. For example, the method 1000 is used for or forms part of a predictive gap filling operation. Using the scanning device 100 ( Figures 1 - 3 , 7 - 11, 14, 18, 22, 26, and 27) to scan at least a portion of the part 200 ( Figure 1 , 5 - 7, 14, 18, 22, 26, and 27) to implement the method 1000.

[0165] Referring Figure 12 and Figure 14 , the method 1000 includes the step of moving the scanning platform 102 to the scanning position 258 relative to the part 200 (block 1002). For example, the scanning platform 102 is moved to the scanning position 258 below the part 200, as Figure 14 shown. Moving the scanning platform 102 also moves the connected first scanner 104 and second scanner 106 relative to the part 200.

[0166] In one example, the scanning position 258 ( Figure 12 ) is one of a plurality of scanning positions 192 ( Figure 6 ). For example, the scanning position 258 is the first scanning position. In one or more examples, the first scanning position 258 positions the scanning device 100 adjacent to either the first part end 226 ( Figure 6 ) or the second part end 228 ( Figure 6 ) of the part 200.

[0167] The method 1000 includes a step of moving the first scanner 104 and the second scanner 106 relative to the part 200 along the X-axis with the scanning platform 102 in the scanning position 258 (block 1004). In one example, the first scanner 104 and the second scanner 106 are moved relative to the part 200 along the X-axis by moving the carriage 138 relative to the base 136 along the X-axis (block 1004). Figure 14 ), so that the first scanner 104 and the second scanner 106 move together along the X axis. For example, the carriage 138 is moved along the X axis relative to the base 136 to position the first scanner 104 at the first X position 272 ( Figure 14 ), and positioning the second scanner 106 at the second X position 274 ( Figure 14 ). The first X position 272 and the second X position 274 are different.

[0168] In the frame 1222 ( Figure 5 and 6 ), moving the first scanner 104 and the second scanner 106 together along the X-axis advantageously enables the spar of the frame 1222 to be scanned by the first scanner 104 and the second scanner 106 and a single rib of the frame 1222 to be scanned by the first scanner 104 and the second scanner 106 at the same time. In one example, the rib of the frame 1222 is in the overlap 208 formed by the first portion 204 scanned by the first scanner 104 and the second portion 206 scanned by the second scanner 106. For example, the rib or a portion of the rib (e.g., an edge of the rib) is used to align the scan data 184 ( Figure 1 ) data subset structural features 216 ( Figure 1 ).

[0169] The method 1000 includes the step of moving the first scanner 104 and the second scanner 106 relative to the part 200 along the Z axis with the scanning platform 102 in the scanning position 258. In one example, the support beam 140 is moved relative to the carriage 138 ( Figure 14 ) along the Z axis, so that the first scanner 104 and the second scanner 106 move together along the Z axis. For example, the support beam 140 is moved along the Z axis relative to the carriage 138, the first scanner 104 is positioned at a first Z position, and the second scanner 106 is positioned at a second Z position. In one or more examples, the first Z position and the second Z position are the same or different.

[0170] The method 1000 includes the step of moving the first scanner 104 relative to the part 200 along the Y axis when the first scanner 104 is located at the first X position 272 (block 1006). The method 1000 also includes the step of moving the second scanner 106 relative to the part 200 along the Y axis when the second scanner 106 is located at the second X position 274 (block 1008).

[0171] In one example, the first scanner 104 is coupled to the first arm 142, and the second scanner 106 is coupled to the second arm 144. The step of moving the first scanner 104 includes the step of moving the first arm 142 relative to the support beam 140 of the scanning platform 102 along the Y axis (block 1006). The step of moving the second scanner 106 includes the step of moving the second arm 144 relative to the support beam 140 along the Y axis (block 1008). The first arm 142 and the second arm 144 move independently of each other and relative to each other along the Y axis.

[0172] Method 1000 includes scanning a first portion 204 of the part 200 while moving the first scanner 104 along the Y axis ( Figure 14 ) to form (e.g., generate or acquire) first scan data 112 ( Figure 15 ) for the step of predicting gaps (block 1010). Method 1000 further includes scanning a second portion 206 of the part 200 while moving the second scanner 106 along the Y axis ( Figure 14 ) to form (e.g., generate or acquire) second scan data 114 for the step of predicting gaps (block 1012).

[0173] As Figure 14 shown, a first portion 204 of the part 200 scanned by the first scanner 104 and a second portion 206 of the part 200 scanned by the second scanner 106 partially overlap each other. A first subset 120 of the first scan data 112 ( Figure 15 ) and a second subset 122 of the second scan data 114 represent the overlap 208 of the first portion 204 and the second portion 206 ( Figure 14 ).

[0174] In one example, method 1000 further includes the steps of moving the first scanner 104 relative to the part 200 along the Z axis and moving the second scanner 106 relative to the part 200 along the Z axis. The step of moving the first scanner 104 includes the step of moving the first arm 142 relative to the support beam along the Z axis. The step of moving the second scanner 106 includes the step of moving the second arm 144 relative to the support beam 140 along the Z axis. The first arm 142 and the second arm 144 move independently of each other and relative to each other along the Z axis. In one example, the step of moving the first scanner 104 along the Z axis is performed while moving the first scanner 104 along the Y axis (block 1006). In one example, the step of moving the second scanner 106 along the Z axis is performed while moving the second scanner 106 along the Y axis (block 1008).

[0175] The first scanner 104 and the second scanner 106 are moved along the Z-axis (e.g., by moving the support beam 140 relative to the carriage 138 and / or moving the respective first arm 142 and second arm 144 relative to the support beam 140) to selectively position the first scanner 104 and the second scanner 106 relative to the part 200. For example, during a scanning operation (e.g., when the first scanner 104 is moved along the Y-axis), selective control of the first scanner 104 along the Z-axis maintains a consistent offset between the first scanner 104 and the surface 202 of the part 200. Similarly, during a scanning operation (e.g., while the second scanner 106 is moved along the Y-axis) selective control of the second scanner 106 along the Z-axis maintains a consistent offset between the second scanner 106 and the surface 202 of the part 200. Maintaining a consistent and precise offset advantageously improves the accuracy of the scan data 184 representing the part 200 ( Figure 1 ).

[0176] In one example, the scanning platform 102 operates under numerical control programming (e.g., via the controller 124) to control the Z-position of the first scanner 104 and the second scanner 106, maintaining a consistent offset from the part 200 based on the known position of the part 200 and the known positions of the first scanner 104 and the second scanner 106 (e.g., determined using the position data 186 during a scanning operation). Thus, the scan data 184 representing the surface 202 of the part 200 and the position data 186 representing the precise positions of the first scanner 104 and the second scanner 106 are used to generate an accurate three-dimensional representation of the part 200.

[0177] Reference Figure 13 and Figure 15 , in one example, method 1000 includes the step of registering the second scan data 114 to the first scan data 112 by aligning a second subset 122 of the second scan data 114 with a first subset 120 of the first scan data 112 (block 1014).

[0178] The registration step (block 1014) is performed using any suitable spatial (e.g., point cloud) transformation operation for aligning two sets of data points, such as by combining multiple data sets into a globally consistent model. For example, the first scan data 112 and the second scan data 114 undergo a conditioning step in which common features (e.g., structural features 216 ( Figure 1 )) are extracted from both sets of scan data. Once both subsets of the extracted data are available, the scan data undergoes a transformation process in which the data sets are combined using a combination of least squares fitting and point cloud merging. In one example, method 1000 includes the step of generating a model 130 ( Figure 1 ) of the part 200 using the first scan data 112 and the second scan data 114.

[0179] In one or more examples, after the operations shown in Figure 12 and Figure 14 , method 1000 includes further sequentially moving the first scanner 104 and the second scanner 106 relative to the part 200 along the X-axis, e.g., moving along a portion of the length L of the part 200 ( Figure 6 ) to position the first scanner 104 and the second scanner 106 at a plurality of respective subsequent X-positions. When at each respective subsequent X-position, the first scanner 104 and the second scanner 106 scan respective subsequent portions of the part 200 to form subsequent scan data.

[0180] Referring to Figure 16 and Figure 18 , in one example, method 1000 includes the step (block 1016) of moving the first scanner 104 and the second scanner 106 relative to the part 200 along the X-axis with the scanning platform 102 in the scanning position 258 ( Figure 18 ). In one instance, the first scanner 104 and the second scanner 106 are further moved together along the X-axis by moving the carriage 138 relative to the base 136 along the X-axis ( Figure 18 ). For example, moving the carriage 138 relative to the base 136 along the X-axis positions the first scanner 104 at a third X-position 276 ( Figure 18 ), and positions the second scanner 106 at a fourth X-position 278 ( Figure 18 ). The third X-position 276 and the fourth X-position 278 are different.

[0181] Method 1000 includes the step (block 1018) of moving the first scanner 104 relative to the part 200 along the Y-axis with the first scanner 104 in the third X-position 276. Method 1000 further includes the step (block 1020) of moving the second scanner 106 along the Y-axis relative to the part 200 with the second scanner 106 in the fourth X-position 278.

[0182] In one example, method 1000 further includes the steps of moving the first scanner 104 relative to the part 200 along the Z-axis and moving the second scanner 106 relative to the part 200 along the Z-axis.

[0183] Method 1000 includes the step (block 1022) of scanning a third portion 264 of the part 200 ( Figure 18 ) to form third scan data 268 ( Figure 19 ) while moving the first scanner 104 along the Y-axis. Method 1000 further includes scanning a fourth portion 266 of the part 200 while moving the second scanner 106Figure 18 ) to form fourth scan data 270 ( Figure 19 ). (Block 1024).

[0184] As Figure 14 shown, in one example, a first portion 204 of part 200 and a second portion 206 of part 200 form a first segment 260 of part 200. As Figure 18 shown, in one example, a third portion 264 of part 200 and a fourth portion 266 of part 200 form a second segment 262 of part 200, which is directly adjacent to the first segment 260 of part 200. The second portion 206 of part 200 scanned by the second scanner 106 ( Figure 14 ) and the third portion 264 of part 200 scanned by the first scanner 104 ( Figure 18 ) partially overlap each other. A third subset 280 of the second scan data 114 ( Figure 19 ) and a fourth subset 282 of the third scan data 268 ( Figure 19 ) represent a second overlap 284 of the second portion 206 and the third portion 264 ( Figure 18 ). The third portion 264 of part 200 scanned by the first scanner 104 and the fourth portion 266 of part 200 scanned by the second scanner 106 partially overlap each other. A fifth subset 286 of the third scan data 268 ( Figure 19 ) and a sixth subset 288 of the fourth scan data 270 ( Figure 18 ) represent a third overlap 290 of the third portion 264 and the fourth portion 266 ( Figure 18 ).

[0185] Referring Figure 17 to Figure 19 , in one example, method 1000 includes the step of registering the third scan data 268 to the second scan data 114 by aligning the fourth subset 282 of the third scan data 268 with the third subset 280 of the second scan data 114 (block 1026). Method 1000 further includes the step of registering the fourth scan data 270 to the third scan data 268 by aligning the sixth subset 288 of the fourth scan data 270 with the fifth subset 286 of the third scan data 268 (block 1028).

[0186] The registration steps (blocks 1026 and 1028) are performed using any suitable spatial (e.g., point cloud) transformation operation that aligns two sets of data points, such as by combining multiple data sets into a globally consistent model. For example, the first scan data 112, the second scan data 114, the third scan data 268, and the fourth scan data 270 undergo a conditioning step, in which common features (e.g., structural features 216 ( Figure 1))。Once a subset of the extracted data is available, the scan data undergoes a transformation process in which the datasets are merged using a combination of waiting best fit and point cloud merging. In one example, method 1000 includes generating a model 130 of part 200 using first scan data 112, second scan data 114, third scan data 268, and fourth scan data 270( Figure 1 ).

[0187] In one or more examples, Figure 16 and Figure 18 the operations shown in can be sequentially repeated at multiple X positions by moving carriage 138 along the length of base 136 to scan multiple subsequent segments of part 200 along a portion of the length L of part 200( Figure 6 ). After a portion of the length L of part 200 corresponding to the length of base 136 has been sequentially scanned, scan platform 102 is moved along the length L of part 200 to another scan position, and the operations shown in Figure 12 , 14 , 16 and 18 are repeated to scan subsequent portions of the length L of part 200.

[0188] Referring to Figure 20 and 22 , in one example, method 1000 includes moving scan platform 102 relative to part 200 to a second scan position 292( Figure 22 )(block 1030). In one example, second scan position 292 is one of multiple scan positions 192( Figure 6 ).

[0189] In one example, method 1000 includes moving first scanner 104 and second scanner 106 relative to part 200 along the X axis with scan platform 102 in the second scan position 292(block 1032). In one example, first scanner 104 and second scanner 106 move together along the X axis by moving carriage 138 relative to base 136( Figure 22 ). For example, moving carriage 138 relative to base 136 along the X axis positions first scanner 104 at a fifth X position 294( Figure 22 ), and positions second scanner 106 at a sixth X position 296( Figure 22 ). The fifth X position 294 and the sixth X position 296 are different.

[0190] Method 1000 includes the step of moving the first scanner 104 relative to the part 200 along the Y-axis when the first scanner 104 is located at the fifth X-position 294 (block 1034). Method 1000 also includes the step of moving the second scanner 106 relative to a section of the part 200 along the Y-axis when the second scanner 106 is at the sixth X-position 296 (block 1036).

[0191] In one example, method 1000 also includes the steps of moving the first scanner 104 relative to the part 200 along the Z-axis and moving the second scanner 106 relative to the part 200 along the Z-axis.

[0192] Method 1000 includes scanning the fifth portion 298 of the part 200 ( Figure 22 ) to obtain fifth scan data 302 ( Figure 23 ) while moving the first scanner 104 (block 1038). Method 1000 also includes scanning the sixth portion 300 of the part 200 ( Figure 22 ) to obtain sixth scan data 304 ( Figure 23 ) while moving the second scanner 106 (block 1040).

[0193] As Figure 22 shown, in one example, the fifth portion 298 of the part 200 and the sixth portion 300 of the part 200 form a third section 306 of the part 200, which is directly adjacent to the second section 262 of the part 200. The fourth portion 266 of the part 200 scanned by the second scanner 106 ( Figure 18 ) and the fifth portion 298 of the part 200 scanned by the first scanner 104 overlap partially with each other. The seventh subset 308 of the fourth scan data 270 ( Figure 23 ) and the eighth subset 310 of the fifth scan data 302 ( Figure 23 ) represent a fourth overlap 312 of the fourth portion 266 and the fifth portion 298 ( Figure 22 ). The fifth portion 298 of the part 200 scanned by the first scanner 104 and the sixth portion 300 of the part 200 scanned by the second scanner 106 overlap partially with each other. The ninth subset 314 of the fifth scan data 302 ( Figure 23 ) and the tenth subset 316 of the sixth scan data 304 ( Figure 23 ) represent a fifth overlap 318 of the fifth portion 298 and the sixth portion 300.

[0194] Refer to Figure 21 and Figure 23, in one example, method 1000 includes the step of registering the fifth scan data 302 to the fourth scan data 270 by aligning the eighth subset 310 of the fifth scan data 302 with the seventh subset 308 of the fourth scan data 270 (block 1042). Method 1000 also includes the step of registering the sixth scan data 304 to the fifth scan data 302 by aligning the tenth subset 316 of the sixth scan data 304 with the ninth subset 314 of the fifth scan data 302 (block 1044).

[0195] The registration steps (blocks 1042 and 1044) are performed using any suitable spatial (e.g., point cloud) transformation operation that aligns two sets of data points, such as by combining multiple data sets into a globally consistent model. For example, the first scan data 112, the second scan data 114, the third scan data 268, the fourth scan data 270, the fifth scan data 302, and the sixth scan data 304 undergo a conditioning step in which common features (e.g., structural feature 216( Figure 1 )) are extracted from the scan data sets. Once subsets of the extracted data are available, the scan data undergoes a transformation process in which the data sets are combined using a combination of best fit and point cloud merging. In one example, method 1000 includes generating a model 130( Figure 1 ) of the part 200 using the first scan data 112, the second scan data 114, the third scan data 268, the fourth scan data 270, the fifth scan data 302, and the sixth scan data 304.

[0196] In one or more examples, Figures 12 - 23 the operations shown in Figure 6 can be sequentially repeated at multiple subsequent X positions along the length L( Figure 6 ) of the part 200 to form scan data 184( Figure 1 ) representing the entire part 200 along the length L and width W( Figure 6 ) of the part 200. It should be understood that in some examples, more than two segments of the part 200 are scanned at a given one of the multiple scan positions 192( Figure 6 ) of the scan platform 102 before moving the scan platform 102 to a subsequent position among the multiple scan positions 192 along the length L of the part 200. Each segment of the part 200 that is scanned overlaps a directly adjacent segment of the part 200, enabling the subsets of the scan data to be aligned during registration of the scan data.

[0197] In one or more examples, the first scanner 104 and the second scanner 106 are moved along the X axis, and then the first scanner 104 and the second scanner 106 are moved along the length L of the part 200 to corresponding X positions. At the corresponding X positions, the first scanner 104 and the second scanner 106 can be moved along the Y axis to scan at least a portion of the width W of the part 200( Figure 6 ). As Figure 6 shown, in one or more examples, the maximum width of the part 200 (e.g., the frame 1222 of the wing 1220) is significantly greater than the minimum width of the part 200. The configuration and movement of the first arm 142 and the second arm 144 result in a significant difference between the maximum width and the minimum width of the part 200 without the need for the scanning platform 102 to move to different scanning positions.

[0198] Referring Figure 24 、 26 and 27, in one example, the first arm 142 and the second arm 144 extend in opposite directions along the Y axis. Each step of moving the first scanner 104 along the Y axis (blocks 1006, 1018, and 1034) includes a step of moving the first arm 142 in a first direction along the Y axis (block 1046). Each step of moving the second scanner 106 along the Y axis (blocks 1008, 1020, and 1036) includes a step of moving the second arm 144 in a second direction along the Y axis (block 1048). The first direction and the second direction are opposite to each other. The step of scanning the first portion 204 of the part 200( Figure 14 ) (block 1010) and the step of scanning the second portion 206 of the part 200( Figure 14 ) (block 1012) include a step of scanning the entire width of the part 200 (block 1050). Similarly, the step of scanning the third portion 264 of the part 200( Figure 18 ) (block 1022) and the step of scanning the fourth portion 266 of the part 200( Figure 18 ) (block 1024) include a step of scanning the entire width of the part 200 (block 1050). Similarly, the step of scanning the fifth portion 298 of the part 200( Figure 22 ) (block 1038) and the step of scanning the sixth portion 300 of the part 200( Figure 22 ) (block 1040) include a step of scanning the entire width of the part 200 (block 1050).

[0199] As Figure 26 shown, moving the first arm 142 and the second arm 144 in opposite directions along the Y axis enables the first scanner 104 and the second scanner 106 to scan at the maximum width W of the part 200 MAXPositioned near opposite edges of the part 200 to scan the entire width W of the part 200 as it moves along the Y-axis. As Figure 27 shown, moving the first arm 142 and the second arm 144 in opposite directions along the Y-axis also enables the first scanner 104 and the second scanner 106 to scan the part 200 at the minimum width W of the part 200 MIN Positioned near opposite edges of the part 200 to scan the entire width W of the part 200 as it moves along the Y-axis.

[0200] Refer to Figure 7 、 8 and 25, in one example, method 1000 includes the step (block 1052) of moving the base 136 of the scanning platform 102 relative to the part 200 to a plurality of scan positions 192 ( Figure 6 ). In one example, the plurality of scan positions 192 are arranged along the X-axis. For example, the base 136 is moved along the length L of the part 200 ( Figure 6 ) to each of the plurality of scan positions 192.

[0201] In one example, method 1000 includes the step (block 1054) of replicating the repeatable shape of the base 136 at each of the plurality of scan positions 192. In one example, the step of replicating the repeatable shape of the base 136 (block 1054) includes applying a constant force F ( Figure 8 ) to the base 136 using a plurality of jacks 174 ( Figure 8 ) coupled to the base 136 such that the base 136 maintains a repeatable shape at each of the plurality of scan positions 192 (block 1056).

[0202] In one example, method 1000 includes a step (block 1058): at each of the plurality of scan positions 192, using the first scanner 104 and the second scanner 106 to scan a segment of the part 200 to form scan data 184 representative of the part 200 for predicting gap filling. In this example, while moving the first scanner 104 and the second scanner 106 relative to the part 200 along the X-axis, Y-axis, and / or Z-axis, the repeatable shape of the base 136 is replicated and maintained at each of the plurality of scan positions 192.

[0203] Now refer to Figure 4 and Figure 28 , examples of the scanning device 100 and method 1000 can be used in the context of an aircraft manufacturing and maintenance method 1100, as shown in the flowchart of Figure 28 and the aircraft 1200 schematically shown in Figure 4 .

[0204] Refer to Figure 4, in one example, aircraft 1200 includes a fuselage 1202 and a plurality of advanced systems 1204. Examples of advanced systems 1204 include one or more of a propulsion system 1208, an electrical system 1210, a hydraulic system 1212, and an environmental system 1214. In another example, aircraft 1200 includes any number of other types of systems, such as communication systems, guidance systems, and the like. The scanning device 100 and method 1000 can be used in the manufacture and / or assembly of at least one component of aircraft 1200. For example, the scan data 184 is used to manufacture a gasket 222 ( Figure 5 ) to form part of the fuselage 1202, the airframe 1218, and / or the wing 1220.

[0205] As Figure 28 shown, during pre-production, method 1100 includes the specification and design of aircraft 1200 (block 1102) and material procurement (block 1104). During the production of aircraft 1200, method 1100 includes component and sub-component manufacturing (block 1106) and system integration (block 1108). Thereafter, method 1100 includes the certification and delivery of aircraft 1200 (block 1110), and aircraft 1200 is put into use (block 1112). Routine maintenance and repair (block 1114) includes modifying, reconfiguring, refurbishing, etc. one or more components, parts, and systems of aircraft 1200.

[0206] Figure 28 Each process of method 1100 shown can be performed or carried out by a system integrator, a third party, and / or an operator (e.g., a customer). For ease of explanation, system integrators can include, but are not limited to, any number of spacecraft manufacturers and prime system subcontractors; third parties can include, but are not limited to, any number of vendors, subcontractors, and suppliers; operators can be airlines, leasing companies, military entities, service organizations, etc.

[0207] Examples of the scanning device 100 and method 1000 shown and described herein can be employed in any one or more stages of the manufacturing and repair method 1100 shown in the Figure 28 flowchart shown. In one example, the scanning device 100 and method 1000 are used to scan parts 200 of aircraft 1200 for predictive gap filling during component and sub-component manufacturing (block 1106) and / or system integration (block 1108). In one example, the scanning device 100 and method 1000 are used to scan replacement parts for predictive gap filling when aircraft 1200 is put into use (block 1112) and / or during maintenance and repair (block 1114).

[0208] To reduce manufacturing costs and time, the disclosed scanning device 100 and method 1000 assist in predicting shims in aircraft parts. Examples of the scanning device 100 and method 1000 provide effective measurement and inspection of these parts and enable rapid acquisition of accurate scan data. Accordingly, a method for predicting the gap between a part 200 and a second part 220 of an aircraft 1200 ( Figure 4 ) and a method for manufacturing a shim 222 ( Figures 1 - 3 and 7-11) using the scanning device 100 ( Figures 12 - 27 ) and / or the method 1000 ( Figure 5 ) during the assembly of a portion of the aircraft 1200 are also disclosed.

[0209] Although the illustrative examples are directed to devices and methods for scanning parts for predicting gaps, the disclosed scanning device 100 and method 1000 can also be applied to any of a variety of other inspection or measurement applications.

[0210] As used herein, a system, device, equipment, structure, article, element, component, or hardware that is "configured to" perform a particular function actually can perform the particular function without any further modification, rather than just having the potential to perform the particular function after further modification. In other words, a system, device, equipment, structure, article, element, component, or hardware that is "configured to" perform a particular function is specifically selected, created, implemented, utilized, programmed, and / or designed for the purpose of performing the particular function. As used herein, "configured to" denotes the existing characteristics of a system, device, structure, article, element, component, or hardware that enable the system, device, structure, article, element, component, or hardware to perform a particular function without further modification. For the purposes of this disclosure, a system, device, equipment, structure, article, element, component, or hardware described as "configured to" perform a particular function may alternatively or additionally be described as "adapted to" and / or "effectively" perform that function.

[0211] Unless otherwise specified, the terms "first," "second," "third," etc. are used herein only as labels and are not intended to impose an order, position, or hierarchical requirement on the items to which these terms refer. Moreover, the mention of, for example, a "second" item does not require or preclude the existence of, for example, a "first" or lower-numbered item and / or, for example, a "third" or higher-numbered item.

[0212] For purposes of this disclosure, the terms "coupled", "coupling", and like terms refer to two or more elements that are joined, linked, fastened, attached, connected, in communication with, or otherwise associated (e.g., mechanically, electrically, fluidically, optically, electromagnetically) with each other. In various examples, the elements may be directly or indirectly associated. As an example, element A may be directly associated with element B. As another example, element A may be indirectly associated with element B via, for example, another element C. It will be understood that not all associations between the various disclosed elements must be shown. Thus, there may also be other couplings other than those depicted in the figures.

[0213] As used herein, relative terms such as "horizontal", "vertical", "parallel", "perpendicular", etc., include cases where the item is exactly the stated condition and cases where the item is approximately the stated condition.

[0214] As used herein, the term "about" refers to a condition that is close to (but not exact) the stated condition that still performs the desired function or achieves the desired result, e.g., a condition within an acceptable predetermined tolerance or precision. For example, the term "about" refers to a condition within 10% of the stated condition. However, the term "about" does not exclude a condition that is exactly the stated condition.

[0215] In the above-referenced Figure 1 wherein, the boxes may represent their functional elements, features, or their components, and the lines connecting the various boxes do not necessarily imply any particular structure. Thus, the depicted structure may be modified, added to, and / or omitted. Additionally, those skilled in the art will recognize that not all of the elements described and shown in Figures 1 - 11 14, 15, 18, 19, 22, 23, 26, and 27 above must be included in every example, and not all of the elements described herein must be depicted in every illustrative example. Unless otherwise explicitly stated, the schematic diagrams of the examples depicted in Figures 1 - 11 14, 15, 18, 19, 22, 23, 26, and 27 above are not meant to imply a structural limitation on the illustrative examples. Rather, although an illustrative structure is indicated, it should be understood that the structure may be modified as appropriate.

[0216] In the above-referenced Figure 12 , 13 16, 17, 20, 21, 24, 25, and 28, the boxes may represent operations, steps, and / or portions thereof, and the lines connecting the various boxes do not denote any particular order or dependence of the operations or portions thereof. It will be understood that not all of the dependencies between the various disclosed operations must be presented. Figure 12 , 13, 16, 17, 20, 21, 24, 25, and 28 and the accompanying disclosure that describes the operation of the disclosed methods set forth herein should not be construed as necessarily determining the order of the operations to be performed. Rather, although an illustrative order is indicated, it should be understood that the order of the operations may be appropriately modified. Accordingly, the operations shown may be modified, added to, and / or omitted, and certain operations may be performed in a different order or simultaneously. Additionally, those skilled in the art will understand that not all of the operations described need to be performed.

[0217] Moreover, references throughout this specification to features, advantages, or similar language do not mean that all features and advantages that can be realized with the examples disclosed herein should be or are in any single example. Rather, the language referring to the features and advantages should be understood to mean that a particular feature, advantage, or characteristic described in connection with an example is included in at least one example. Thus, the discussion of the features, advantages, and similar language throughout this disclosure may, but need not, refer to the same example.

[0218] Moreover, this disclosure includes embodiments in accordance with the following clauses:

[0219] Clause 1. A scanning device for predicting interstitials, comprising:

[0220] A scanning platform;

[0221] A first scanner that forms first scan data for predicting interstitials, the first scanner being coupled to the scanning platform; and

[0222] A second scanner that forms second scan data for predicting interstitials, the second scanner being coupled to the scanning platform,

[0223] wherein the scanning platform is configured to:

[0224] Cause the first scanner and the second scanner to move together along the X-axis and the Z-axis; and

[0225] Cause the first scanner and the second scanner to move independently of and relative to each other along the Y-axis.

[0226] Clause 2. The scanning device according to Clause 1, wherein the scanning platform comprises:

[0227] A base;

[0228] A carriage that is coupled to the base and is movable relative to the base along the X-axis;

[0229] A support beam that is coupled to the carriage and is movable relative to the carriage along the Z-axis;

[0230] A first arm, which is coupled to the support beam and is movable relative to the support beam along the Y axis, wherein the first scanner is coupled to the first arm; and

[0231] A second arm, which is coupled to the support beam and is movable relative to the support beam along the Y axis, wherein the second scanner is coupled to the second arm.

[0232] Clause 3. The scanning device according to clause 2, wherein:

[0233] The first arm is movable relative to the support beam along the Z axis. And

[0234] The second arm is movable relative to the support beam along the Z axis.

[0235] Clause 4. The scanning device according to any one of clauses 2-3, wherein:

[0236] The first scanner has a first field of view;

[0237] The second scanner has a second field of view; and

[0238] When the first arm and the second arm move in opposite directions along the Y axis, the first field of view and the second field of view at least partially overlap.

[0239] Clause 5. The scanning device according to any one of clauses 2-4, wherein:

[0240] The first arm and the second arm extend in opposite directions along the Y axis; and

[0241] The first arm and the second arm are movable independently of and relative to each other.

[0242] Clause 6. The scanning device according to any one of clauses 2-5, wherein:

[0243] The scanning platform further includes a plurality of wheel assemblies coupled to the base; and

[0244] The base is movable to a plurality of scanning positions below the part to position the first scanner and the second scanner relative to the surface of the part.

[0245] Clause 7. The scanning device according to clause 6, wherein the scanning platform further includes a plurality of jacks, the jacks being coupled to the base and configured to apply a constant force to the base so that the base maintains a repeatable shape at each of the plurality of scanning positions.

[0246] Clause 8. The scanning device according to any one of clauses 1-7, wherein each of the first scanner and the second scanner includes a pair of laser scanners.

[0247] Clause 9. A scanning device as described in any one of Clauses 1 - 8, wherein:

[0248] The first scan data represents a first part of the part;

[0249] The second scan data represents a second part of the part; and

[0250] The first part of the part and the second part of the part at least partially overlap, so that a first subset of the first scan data and a second subset of the second scan data represent the overlap of the first part of the part and the second part of the part.

[0251] Clause 10. The scanning device as described in Clause 9, further comprising:

[0252] A computer that communicates with the first scanner and the second scanner and is configured to receive the first scan data and the second scan data,

[0253] wherein the computer includes a processor that is configured to register the second scan data to the first scan data by aligning the second subset of the second scan data with the first subset of the first scan data.

[0254] Clause 11. The scanning device as described in Clause 10, further comprising:

[0255] A first camera to form a first image of the first part of the part, the first camera being coupled to the scanning platform; and

[0256] A second camera to form a second image of the second part of the part, the second camera being coupled to the scanning platform; and wherein:

[0257] The scanning platform is configured to:

[0258] Move the first camera together with the first scanner along the X-axis, Y-axis, and Z-axis; and

[0259] Move the second camera together with the second scanner along the X-axis, Y-axis, and Z-axis; and

[0260] The processor is further configured to:

[0261] Determine whether there is an inconsistency on the part from one or more of the first image and the second image; and

[0262] Extract a part of one or more of the first scan data and the second scan data representing the inconsistency.

[0263] Clause 12. A method of scanning a part for predictive gap filling, the method comprising:

[0264] Moving a scanning platform relative to the part to a scanning position;

[0265] At the scanning position, moving a first scanner and a second scanner relative to the part along an X-axis;

[0266] With the first scanner at a first X-position, moving the first scanner relative to the part along a Y-axis;

[0267] With the second scanner at a second X-position, moving the second scanner relative to the part along a Y-axis;

[0268] While moving the first scanner, scanning a first portion of the part to form first scan data for predictive gap filling; and

[0269] While moving the second scanner, scanning a second portion of the part to form second scan data for predictive gap filling; and wherein:

[0270] The first portion of the part scanned by the first scanner and the second portion of the part scanned by the second scanner partially overlap each other; and

[0271] A first subset of the first scan data and a second subset of the second scan data represent the overlap of the first portion and the second portion.

[0272] Clause 13. The method of clause 12, further comprising:

[0273] Moving a base of the scanning platform relative to the part to a plurality of scanning positions;

[0274] At each of the plurality of scanning positions, replicating a repeatable shape of the base; and

[0275] At each of the plurality of scanning positions, scanning a segment of the part with the first scanner and the second scanner to form scan data representative of the part for predictive gap filling.

[0276] Clause 14. The method of clause 13, wherein replicating the repeatable shape of the base includes applying a constant force to the base using a plurality of jacks coupled to the base to maintain the repeatable shape of the base at each of the plurality of scanning positions.

[0277] Clause 15. The method according to any one of clauses 13-14, wherein:

[0278] The part includes a frame of an aircraft wing; and

[0279] Moving the base of the scanning platform to the plurality of scanning positions includes moving the base under the frame.

[0280] Clause 16. The method according to any one of Clauses 12 - 15 further includes: registering the second scan data to the first scan data by aligning the second subset of the second scan data with the first subset of the first scan data.

[0281] Clause 17. The method according to any one of Clauses 12 - 16 further includes:

[0282] At the scanning position, moving the first scanner and the second scanner relative to the part along the X axis;

[0283] When the first scanner is in the third X position, moving the first scanner relative to the part along the Y axis;

[0284] When the second scanner is in the fourth X position, moving the second scanner relative to the part along the Y axis;

[0285] While moving the first scanner, scanning a third portion of the part to form third scan data; and

[0286] While moving the second scanner, scanning a fourth portion of the part to form fourth scan data; and wherein:

[0287] The first part of the part and the second part of the part form a first segment of the part;

[0288] The third part of the part and the fourth part of the part form a second segment of the part, which is directly adjacent to the first segment of the part;

[0289] The second part of the part scanned by the second scanner and the third part of the part scanned by the first scanner partially overlap each other;

[0290] The third subset of the second scan data and the fourth subset of the third scan data represent a second overlap of the second segment and the third segment;

[0291] The third part of the part scanned by the first scanner and the fourth part of the part scanned by the second scanner partially overlap each other; and

[0292] The fifth subset of the third scan data and the sixth subset of the fourth scan data represent a third overlap of the third part and the fourth part.

[0293] Clause 18. The method as described in Clause 17 further includes:

[0294] Registering the second scan data to the first scan data by aligning a second subset of the second scan data with a first subset of the first scan data;

[0295] Registering the third scan data to the second scan data by aligning a fourth subset of the third scan data with a third subset of the second scan data; and

[0296] Registering the fourth scan data to the third scan data by aligning a sixth subset of the fourth scan data with a fifth subset of the third scan data.

[0297] Clause 19. The method as described in Clause 17 further includes:

[0298] Moving the scan platform relative to the part to a second scan position;

[0299] At the second scan position, moving the first scanner and the second scanner relative to the part along the X-axis;

[0300] When the first scanner is at a fifth X position, moving the first scanner relative to the part along the Y-axis;

[0301] When the second scanner is at a sixth X position, moving the second scanner relative to the section of the part along the Y-axis;

[0302] While moving the first scanner, scanning a fifth part of the part to form fifth scan data; and

[0303] While moving the second scanner, scanning a sixth part of the part to form sixth scan data; and wherein:

[0304] The fifth part of the part and the sixth part of the part form a third section of the part that is directly adjacent to the second section of the part;

[0305] The fourth part of the part scanned by the second scanner and the fifth part of the part scanned by the first scanner partially overlap each other;

[0306] A seventh subset of the fourth scan data and an eighth subset of the fifth scan data represent a fourth overlap of the fourth part and the fifth part;

[0307] The fifth part of the part scanned by the first scanner and the sixth part of the part scanned by the second scanner overlap each other partially; and

[0308] A ninth subset of the fifth scan data and a tenth subset of the sixth scan data represent a fifth overlap of the fifth part and the sixth part.

[0309] Clause 20. The method as described in Clause 19, further comprising:

[0310] Registering the second scan data to the first scan data by aligning a second subset of the second scan data with a first subset of the first scan data;

[0311] Registering the third scan data to the second scan data by aligning a fourth subset of the third scan data with a third subset of the second scan data;

[0312] Registering the fourth scan data to the third scan data by aligning a sixth subset of the fourth scan data with a fifth subset of the third scan data;

[0313] Registering the fifth scan data to the fourth scan data by aligning an eighth subset of the fifth scan data with a seventh subset of the fourth scan data; and

[0314] Registering the sixth scan data to the fifth scan data by aligning a tenth subset of the sixth scan data with a ninth subset of the fifth scan data.

[0315] Clause 21. The method as described in any one of Clauses 12 - 20, wherein:

[0316] The first scanner is coupled to a first arm of the scanning platform;

[0317] The second scanner is coupled to a second arm of the scanning platform;

[0318] The first arm and the second arm extend in opposite directions along the Y axis;

[0319] Moving the first scanner includes: moving the first arm in a first direction along the Y axis; and

[0320] Moving the second scanner includes: moving the second arm in a second direction along the Y axis, the second direction being opposite to the first direction; and

[0321] Scanning the first part of the part and scanning the second part of the part include scanning the entire width of the part.

[0322] The features, advantages, and characteristics of one example described can be combined in any suitable way in one or more other examples. Those skilled in the relevant art will recognize that the examples described herein can be practiced without one or more specific features or advantages of a particular example. In other cases, other features and advantages may be recognized in certain examples that are not present in all examples. Additionally, although various examples of the scanning device 100 and method 1000 have been shown and described, those skilled in the art can make modifications after reading the specification. This application includes such modifications and is limited only by the scope of the claims.

Claims

1. A scanning device (100) for predicting interstices, comprising: A scanning platform (102), comprising: A base (136); A carriage (138) coupled to the base (136) and movable relative to the base (136) along the X-axis; A support beam (140) coupled to the carriage (138) and movable relative to the carriage (138) along the Z-axis; A first arm (142) coupled to the support beam (140) and movable relative to the support beam (140) along the Y-axis, and A second arm (144) coupled to the support beam (140) and movable relative to the support beam (140) along the Y-axis; A first scanner (104) for forming first scan data (112) for predicting interstices, the first scanner (104) being coupled to the first arm (142) of the scanning platform (102); and A second scanner (106) for forming second scan data (114) for predicting interstices, the second scanner (106) being coupled to the second arm (144) of the scanning platform (102), wherein the scanning platform (102) is configured to: Move the first scanner (104) and the second scanner (106) together along the X-axis and the Z-axis; and Move the first scanner (104) and the second scanner (106) independently of each other and relative to each other along the Y-axis.

2. The scanning device (100) according to claim 1, wherein: The first arm (142) is movable relative to the support beam (140) along the Z-axis; and The second arm (144) is movable relative to the support beam (140) along the Z-axis.

3. The scanning device (100) according to any one of claims 1-2, wherein: The first scanner (104) has a first field of view (108); The second scanner (106) has a second field of view (110); and When the first arm (142) and the second arm (144) move in opposite directions along the Y-axis, the first field of view (108) and the second field of view (110) at least partially overlap.

4. The scanning device (100) according to any one of claims 1-2, wherein: The first arm (142) and the second arm (144) extend in opposite directions along the Y-axis; and The first arm (142) and the second arm (144) are independent of each other and movable relative to each other.

5. The scanning device (100) according to any one of claims 1-2, wherein: The scanning platform (102) further comprises a plurality of wheel assemblies (146) coupled to the base (136); The base (136) is movable to a plurality of scanning positions (192) below the part (200) to position the first scanner (104) and the second scanner (106) relative to the surface (202) of the part (200); and Wherein, the scanning platform (102) further includes a plurality of jacks (174), the plurality of jacks (174) being coupled to the base (136) and configured to apply a constant force (F) to the base (136) so that the base (136) maintains a repeatable shape at each of the plurality of scanning positions (192).

6. The scanning device (100) according to any one of claims 1-2, wherein: The first scan data (112) represents a first portion (204) of the part (200); The second scan data (114) represents a second portion (206) of the part (200); and The first portion (204) of the part (200) and the second portion (206) of the part (200) at least partially overlap such that a first subset (120) of the first scan data (112) and a second subset (122) of the second scan data (114) represent an overlap (208) of the first portion (204) of the part (200) and the second portion (206) of the part (200), the scanning device (100) further including: A computer (116) that communicates with the first scanner (104) and the second scanner (106) and is configured to receive the first scan data (112) and the second scan data (114), Wherein, the computer (116) includes a processor (118), the processor being configured to register the second scan data (114) to the first scan data (112) by aligning the second subset (122) of the second scan data (114) with the first subset (120) of the first scan data (112).

7. The scanning device (100) according to claim 6, further including: A first camera (132) to form a first image (194) of the first portion (204) of the part (200), the first camera (132) being coupled to the scanning platform (102); And A second camera (134) to form a second image (196) of the second portion (206) of the part (200), the second camera (134) being coupled to the scanning platform (102); and wherein: The scanning platform (102) is configured to: Move the first camera (132) together with the first scanner (104) along the X-axis, the Y-axis, and the Z-axis; and Move the second camera (134) together with the second scanner (106) along the X-axis, the Y-axis, and the Z-axis; and The processor (118) is further configured to: Determine whether there is an inconsistency (218) on the part (200) from one or more of the first image (194) and the second image (196); And Extract a portion of one or more of the first scan data (112) and the second scan data (114) representing the inconsistency (218).

8. A method (1000) of using a scanning device (100) as claimed in any one of claims 1-7 to scan a part (200) for predictive gap filling, the method (1000) comprising: Moving a scanning platform (102) relative to the part (200) to a scan position (258); At the scan position (258), moving a first scanner (104) and a second scanner (106) relative to the part (200) along an X axis; With the first scanner (104) in a first X position (272), moving the first scanner (104) relative to the part (200) along a Y axis; With the second scanner (106) in a second X position (274), moving the second scanner (106) relative to the part (200) along the Y axis; While moving the first scanner (104), scanning a first portion (204) of the part (200) to form first scan data (112) for the predictive gap filling; and While moving the second scanner (106), scanning a second portion (206) of the part (200) to form second scan data (114) for the predictive gap filling; and wherein: The first portion (204) of the part (200) scanned by the first scanner (104) and the second portion (206) of the part (200) scanned by the second scanner (106) overlap each other partially; and A first subset (120) of the first scan data (112) and a second subset (122) of the second scan data (114) represent the overlap (208) of the first portion (204) and the second portion (206).

9. The method (1000) according to claim 8, further comprising: Moving a base (136) of the scanning platform (102) relative to the part (200) to a plurality of scan positions (192); At each of the plurality of scan positions (192), replicating a repeatable shape of the base (136); and At each of the plurality of scan positions (192), scanning a section of the part (200) using the first scanner (104) and the second scanner (106) to form scan data (184) representing the part (200) for the predictive gap filling.

Images