Access control module testing device and testing method thereof

Abstract

The present invention discloses a door access control module testing device and a testing method thereof. The testing device comprises an environmental simulation container, a plurality of test interfaces, and a test module; the environmental simulation container is used to hold at least one door access control module and provide a test environment condition, and the environmental simulation container is electrically connected to the test module; the plurality of test interfaces are electrically connected to the test module respectively, and the test interface is used to connect the door access control module. A special device is formed by the environmental simulation container, the plurality of test interfaces, and the test module, and the test interface is connected to the door access control module to send or receive a signal through the test module to receive the test interface, and the received signal is recorded, and external leads and multimeters are no longer used, and manual reading and recording are no longer required, which helps to solve the technical problem in the prior art that the test efficiency is extremely low due to the lack of special equipment for door access control module testing.

Description

Technical Field

[0001] The invention relates to the field of testing, and in particular to a door access control module testing device and a testing method thereof. Background Art

[0002] At present, the test of the access control module is often pieced together by a multimeter and a signal input device. In addition, in order to simulate the use environment of the access control module, an independent device for controlling temperature and humidity needs to be set externally. The access control module can adopt a variety of communication methods when in use. According to these different communication methods, a base station needs to be configured, and the devices need to be debugged independently. The access control module needs to be connected to the multimeter by artificial leads, and then the reading of the multimeter is read and recorded by the tester. After the test is completed, it is removed and replaced with a new access control module for testing. When a large number of access control modules need to be tested, the workload is very large. The main reason is that there is no special equipment, resulting in extremely low test efficiency. Therefore, a test device and a test method for access control module are urgently needed to help solve the technical problem that there is no special equipment for access control module testing in the prior art, resulting in extremely low test efficiency. Summary of the invention

[0003] The present application provides an access control module testing device, the purpose of which is to use an environment simulation container and multiple test interfaces, as well as a test module to form a dedicated device, connect the access control module through the test module receiving test interface to send or receive signals, and record the received signals, and no longer use external leads and multimeters, and manually read and record work, which helps to solve the technical problem in the prior art that the test efficiency is extremely low due to the lack of dedicated equipment for access control module testing.

[0004] In an optional embodiment, the test device includes an environmental simulation container and a plurality of test interfaces, and a test module;

[0005] The environmental simulation container is used to hold at least one access control module and provide test environment conditions. The environmental simulation container is electrically connected to the test module to control the test environment conditions of the environmental simulation container through the test module;

[0006] The multiple test interfaces are electrically connected to the test modules respectively, and the test interfaces are used to connect the access control module so that the access control module is electrically connected to the test module, and to establish information interaction between the test module and the access control module, as well as information reading and recording.

[0007] In an optional embodiment, the test module includes a processor and an interface switching module, as well as a measurement circuit and an instruction transmitting station;

[0008] The processor is electrically connected to the interface switching module, and the interface switching module is electrically connected to the multiple test interfaces, and the interface switching module is used to switch the test interface that is connected to the processor;

[0009] The measuring circuit is electrically connected to the processor, and the measuring circuit is electrically connected to the test interface, so that the processor obtains the measuring potential through the measuring circuit to achieve measurement of the access control module;

[0010] The instruction transmitting station is electrically connected to the processor, and is used to send execution instructions to the access control module so that the processor receives a feedback signal from the access control module. The first circuit connection end of the instruction transmitting station is grounded, and the second circuit connection end of the instruction transmitting station is electrically connected to one end of a first power supply. The multiple test interfaces are respectively electrically connected to the other end of the first power supply.

[0011] In an optional embodiment, the measuring circuit includes a second power supply and a first field effect transistor, and a first resistor and a second resistor;

[0012] The plurality of test interfaces include a first test interface;

[0013] One end of the first resistor is electrically connected to the second power supply, and the other end of the first resistor is electrically connected to the first test interface;

[0014] One end of the second resistor is electrically connected to the second power supply, the other end of the second resistor is electrically connected to the drain of the first field effect transistor, the source of the first field effect transistor is grounded, and the gate of the first field effect transistor is electrically connected to the first test interface.

[0015] In an optional embodiment, the measuring circuit further includes a third power supply and a second field effect transistor, and a third resistor and a fourth resistor;

[0016] One end of the third resistor is electrically connected to the third power supply, and the other end of the third resistor is electrically connected to the first test interface;

[0017] One end of the fourth resistor is electrically connected to the third power supply, the other end of the fourth resistor is electrically connected to the drain of the second field effect transistor, the source of the second field effect transistor is grounded, and the gate of the second field effect transistor is electrically connected to the first test interface.

[0018] In an optional embodiment, the first test interface has a power contact interface and a ground contact interface, as well as an input signal interface and an output signal interface;

[0019] The input signal interface comprises a first input signal port and a second input signal port, wherein the first input signal port is electrically connected to the interface switching module;

[0020] The output signal interface comprises a first group of output signal interfaces and a second group of output signal interfaces;

[0021] The first group of output signal interfaces includes a first output signal positive electrode interface and a first output signal negative electrode interface, the first output signal positive electrode interface is electrically connected to the first resistor, and the second output signal negative electrode interface is electrically connected to the second resistor;

[0022] The second group of output signal interfaces includes a second output signal positive electrode interface and a second output signal negative electrode interface, the second output signal positive electrode interface is electrically connected to the third resistor, and the second output signal negative electrode interface is electrically connected to the fourth resistor;

[0023] The power contact interface is electrically connected to the first power source, and the ground contact interface is grounded.

[0024] In an optional embodiment, a CAN transceiver is connected in series between the instruction transmission station and the processor.

[0025] In an optional embodiment, there are five multiple test interfaces, and the multiple test interfaces are all connected in parallel on the interface switching module. The processor has three pins electrically connected to the interface switching module, so that the processor can turn on or off different test interfaces through different signals from the three pins.

[0026] In an optional embodiment, the access control module testing device further includes a control terminal;

[0027] The processor is arranged in a control terminal so as to control the processor to send execution instructions through the control terminal.

[0028] In an optional embodiment, the present application further provides a method for testing an access control module. Based on the access control module testing device, the multiple test interfaces are respectively connected to separate access control modules. The method includes:

[0029] The test module configures the environmental parameters of the environmental simulation container according to a predetermined setting method;

[0030] The test module sends execution instructions to the access control module one by one according to a predetermined instruction triggering method, so that the access control module feeds back execution signals according to the execution instructions;

[0031] The test module receives the execution signals one by one;

[0032] The test module records the execution signals one by one to obtain recording results of different access control modules.

[0033] In an optional embodiment, based on the access control module testing device, the test module sends execution instructions to the access control module one by one according to a predetermined instruction triggering method, so that the access control module feeds back an execution signal according to the execution instruction, including:

[0034] The processor sends the execution instruction to the CAN transceiver;

[0035] The CAN transceiver forwards the execution instruction to the instruction transmitting station;

[0036] The execution instruction transmitting station sends the execution instruction to the access control module by wireless transmission, so that the access control module feeds back an execution signal according to the execution instruction.

[0037] As can be seen above, based on the above embodiment, the test module controls the environment simulation container to provide external test environment conditions, and multiple test interfaces are provided, and are used to simultaneously connect to the access control module to realize information interaction, which helps to solve the technical problem in the prior art that the test efficiency is extremely low due to the lack of dedicated equipment for access control module testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 This is a schematic diagram of the architecture of a door access control module testing device in one embodiment of the present invention;

[0039] Figure 2 A schematic diagram of the circuit structure of a door access control module testing device in another embodiment of the present invention;

[0040] Figure 3 Another embodiment of the present invention is a door access control module testing device Figure 2 Schematic diagram of the circuit structure of local A in the middle;

[0041] Figure 4 Another embodiment of the present invention is a door access control module testing device Figure 2 Schematic diagram of the circuit structure of the local B;

[0042] Figure 5 A schematic diagram of a test interface of a door access control module test device in another embodiment of the present invention;

[0043] Figure 6 A schematic diagram of a process 100 of a method for testing a door access control module in another embodiment of the present invention;

[0044] Figure 7 FIG. 2 is a schematic diagram of a process 200 of a method for testing a door access control module in another embodiment of the present invention.

[0045] Reference numerals:

[0046] 1 Environmental simulation container

[0047] 2 Test interface

[0048] 21 First test interface

[0049] 211 Power contact interface

[0050] 212 Ground contact interface

[0051] 213 Input signal interface

[0052] 2131 First input signal port

[0053] 2132 Second input signal port

[0054] 214 Output signal interface

[0055] 2141 The first group of output signal interface

[0056] 21411 First output signal positive terminal

[0057] 21412 Second output signal negative terminal interface

[0058] 2142 The second output signal interface

[0059] 21421 Second output signal positive terminal

[0060] 21422 Second output signal negative terminal interface

[0061] 3 Test Module

[0062] 31 Processor

[0063] 32 interface switching module

[0064] 33 Measurement circuit

[0065] 331 Second Power Supply

[0066] 332 The first field effect transistor

[0067] 333 First resistor

[0068] 334 Second resistor

[0069] 335 Third Power Supply

[0070] 336 Second Field Effect Transistor

[0071] 337 The third resistor

[0072] 338 Fourth resistor

[0073] 34 Command Transmitter Station

[0074] 341 First circuit connection terminal

[0075] 342 Second circuit connection terminal

[0076] 35 First Power

[0077] 36 CAN transceiver

[0078] 37 Control Terminal

[0079] 10 Access control module DETAILED DESCRIPTION

[0080] In the prior art, the access control module 10 has multiple signal output terminals or signal input terminals, as well as a ground terminal and a power input terminal. During the test process, the corresponding leads in the test equipment need to be connected to the corresponding ports, and the signal output terminal needs to be connected to a multimeter. After the test signal is input through the signal input terminal, the tester reads and records the reading of the multimeter, then removes the leads and installs another access control module 10 for testing. Obviously, this test method is extremely inefficient because there is no dedicated test to test the access control module 10.

[0081] Therefore, a door access control module testing device is provided in the present application. The testing device includes an environment simulation container 1 , a plurality of testing interfaces 2 , and a testing module 3 .

[0082] Among them, the test module 3 is used to implement the test function, provide power and signal input, and receive feedback signals and record them. The access control module 10 only needs to be plugged into the test interface 2, and the access control module 10 can be connected to the corresponding test module 3 circuit. The test module 3 can exchange information with the access control module 10, that is, the test module 3 transmits a test signal and then receives the feedback signal of the access control module 10. In addition, the test module 3 can also control the temperature and humidity of the environmental simulation container 1 to provide a test environment for the access control module 10 in the environmental simulation container 1. The test module 3 integrates all the functions of testing the access control module 10. Through multiple test interfaces 2, multiple access control modules 10 can be tested simultaneously, and the signal test of the access control module 10 can be realized, which greatly improves the test efficiency.

[0083] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0084] Figure 1 This is a schematic diagram of the architecture of a door access control module testing device in one embodiment of the present invention. Figure 2 FIG. 1 is a schematic diagram of the circuit structure of a door access control module testing device in another embodiment of the present invention. Figure 1 and Figure 2 As shown, in one embodiment, the present application provides a door access control module testing device, including the testing device including an environment simulation container 1 and a plurality of test interfaces 2, and a test module 3;

[0085] The environment simulation container 1 is used to hold at least one access control module 10 and provide test environment conditions. The environment simulation container 1 is electrically connected to the test module 3 to control the test environment conditions of the environment simulation container 1 through the test module 3;

[0086] The multiple test interfaces 2 are electrically connected to the test modules 3 respectively, and the test interfaces 2 are used to connect the access control module 10 so that the access control module 10 is electrically connected to the test module 3, and to establish information interaction between the test module 3 and the access control module 10, as well as information reading and recording.

[0087] In this embodiment, a specific structure of a door access control module test device is provided. Among them, the environmental simulation container 1 can be an environmental test box, and the environmental simulation container 1 can control the test environment conditions therein through the test module 3 to simulate the real working conditions. The test module 3 and the environmental test box can be connected through the RS232 serial port. Multiple test interfaces 2 can connect multiple door access control modules 10, and the test module 3 supports testing of multiple door access control modules 10. The test module 3 can exchange information with the door access control modules 10 connected to the test interface 2, and can also provide power. Among them, the signal sent by the test module 3 can be automatically realized by the built-in program, or it can be controlled by human-computer interaction. The human-computer interaction method is mentioned later, so it will not be repeated here. The test interface 2 is a physical interface, as long as it can be quickly connected to the door access control module 10. In summary, this door access control module test device integrates all the functions in the prior art, and can connect multiple door access control modules 10 through multiple test interfaces 2. The test module 3 can realize autonomous information interaction and reading and recording, which greatly improves the test efficiency. The invention is helpful to solve the technical problem in the prior art that the testing efficiency is extremely low due to the lack of special equipment for testing the access control module.

[0088] In one embodiment, the test module 3 includes a processor 31 and an interface switching module 32, as well as a measurement circuit 33 and an instruction transmitting station 34;

[0089] The processor 31 is electrically connected to the interface switching module 32, and the interface switching module 32 is electrically connected to a plurality of test interfaces 2, and the interface switching module 32 is used to switch the test interface 2 that is connected to the processor 31;

[0090] The measuring circuit 33 is electrically connected to the processor 31, and the measuring circuit 33 is electrically connected to the test interface 2, so that the processor 31 obtains the measurement potential through the measuring circuit 33 to achieve measurement of the access control module 10;

[0091] The instruction transmitting station 34 is electrically connected to the processor 31. The instruction transmitting station 34 is used to send execution instructions to the access control module 10 so that the processor 31 receives the feedback signal of the access control module 10. The first circuit connection terminal 341 of the instruction transmitting station 34 is grounded, and the second circuit connection terminal 342 of the instruction transmitting station 34 is electrically connected to one end of the first power supply 35. Multiple test interfaces 2 are respectively electrically connected to the other end of the first power supply 35.

[0092] In this embodiment, a specific structure of a test module 3 is provided. The interface switching module 32 is used to switch the connected multiple test interfaces 2, determine which access control module 10 is connected to the test module 3, and then test the access control module 10. It should be noted that the potentials of one end and the other end of the first power supply 35 are the same, and both are high potentials of the positive pole, and the negative pole of the first power supply 35 is grounded to ensure power supply. The measurement potential obtained by the processor 31 through the measuring circuit 33 is actually a feedback signal in essence. The instruction transmitting station 34 is used for one of the communication modes, and the instruction transmitting station 34 can transmit. The communication mode will be further explained later, and will not be repeated here. The first circuit connection terminal 341 of the instruction transmitting station 34 is grounded, and the second circuit connection terminal 342 of the instruction transmitting station 34 obtains the potential of the first power supply 35, and the first power supply 35 can provide 24V signal electricity. The measuring circuit 33 is used to provide the potential of the access control module 10. There are many similar circuits. A specific circuit will be provided later, and will not be repeated here.

[0093] Figure 3 Another embodiment of the present invention is a door access control module testing device Figure 2 Schematic diagram of the circuit structure of local A in FIG. Figure 3 As shown, in one embodiment, the measuring circuit 33 includes a second power supply 331 and a first field effect transistor 332, as well as a first resistor 333 and a second resistor 334;

[0094] The plurality of test interfaces 2 include a first test interface 21;

[0095] One end of the first resistor 333 is electrically connected to the second power supply 331 , and the other end of the first resistor 333 is electrically connected to the first test interface 21 ;

[0096] One end of the second resistor 334 is electrically connected to the second power supply 331 , the other end of the second resistor 334 is electrically connected to the drain of the first field effect transistor 332 , the source of the first field effect transistor 332 is grounded, and the gate of the first field effect transistor 332 is electrically connected to the first test interface 21 .

[0097] In this embodiment, a specific circuit structure of a measuring circuit 33 is provided. The above structure is provided because the access control module 10 has IO1+ and IO- contact switches, and the two contacts IO1+ and IO- can be in a disconnected or connected state according to the execution instruction. One of the test items is to determine the state of the points IO1+ and IO- according to different execution instructions. Figure 2 As shown, when IO1+ and IO- in J3 of the access control module 10 are disconnected, the second power supply 331 is 3.3V, and the first field effect tube 332 is in the cut-off state, IO1+ will be directly connected to the second power supply 331, which will form a short circuit, so the first resistor 333 should be connected in series to protect the circuit and prevent short circuit. The potential of IO4 at this time is 3.3V. When the processor 31 recognizes that the potential of IO4 is 3.3V, it means that IO1+ and IO- are disconnected at this time. If the execution instruction received by the access control module 1 at this time is that IO1+ and IO- are disconnected, the recognized result is normal, otherwise, it indicates abnormality. Similarly, if the second resistor 334 is not connected in series between the second power supply 331 and the processor 31, a short circuit will also occur. When IO1+ and IO1- are conducting, the first field effect transistor 332 is in the conducting state, and the potential of IO4 is the ground potential, that is, 0 potential. If the execution instruction received at this time is that IO1+ and IO- are conducting, the result is normal, otherwise, it indicates abnormality. The above is the basic principle of how the test circuit 33 is tested.

[0098] Figure 4 Another embodiment of the present invention is a door access control module testing device Figure 2 The schematic diagram of the circuit structure of the local B in FIG. Figure 4 As shown, in one embodiment, the measuring circuit 33 further includes a third power supply 335 and a second field effect transistor 336, as well as a third resistor 337 and a fourth resistor 338;

[0099] One end of the third resistor 337 is electrically connected to the third power supply 335 , and the other end of the third resistor 337 is electrically connected to the first test interface 21 ;

[0100] One end of the fourth resistor 338 is electrically connected to the third power supply 335 , the other end of the fourth resistor 338 is electrically connected to the drain of the second field effect transistor 336 , the source of the second field effect transistor 336 is grounded, and the gate of the second field effect transistor 336 is electrically connected to the first test interface 21 .

[0101] In this embodiment, another specific circuit structure of the measuring circuit 33 is provided. When the access control module 10 has another pair of contacts IO2+ and IO2- in J4, it has the above structure, and its principle is the same as that of the previous embodiment, which will not be repeated here.

[0102] Figure 5 FIG. 1 is a schematic diagram of a test interface of a door access control module test device according to another embodiment of the present invention. Figure 5 As shown, in one embodiment, the first test interface 21 has a power contact interface 211 and a ground contact interface 212, as well as an input signal interface 213 and an output signal interface 214;

[0103] The input signal interface 213 includes a first input signal port 2131 and a second input signal port 2132 , and the first input signal port 2131 is electrically connected to the interface switching module 32 ;

[0104] The output signal interface 214 includes a first group of output signal interfaces 2141 and a second group of output signal interfaces 2142;

[0105] The first group of output signal interfaces 2141 includes a first output signal positive electrode interface 21411 and a first output signal negative electrode interface 21412, the first output signal positive electrode interface 21411 is electrically connected to the first resistor 333, and the second output signal negative electrode interface 21412 is electrically connected to the second resistor;

[0106] The second group of output signal interfaces 2142 includes a second output signal positive electrode interface 21421 and a second output signal negative electrode interface 21422, the second output signal positive electrode interface 21421 is electrically connected to the third resistor 337, and the second output signal negative electrode interface 21422 is electrically connected to the fourth resistor 338;

[0107] The power contact interface 211 is electrically connected to the first power source 35 , and the ground contact interface 212 is grounded.

[0108] In this embodiment, a specific structure of a first test interface 21 is provided. The first test interface 21 has several contacts so that the access control module 10 can be inserted. The access control module 10 should be powered on, so the first test interface 21 has a power contact interface 211 and a ground contact interface 212 to achieve power connection. The first power supply 35 in the test module 3 is used to power the access control module 10. As mentioned above, the access control module 10 has two pairs of contacts, namely IO1+ and IO-, and IO2+ and IO2-. Therefore, the first group of output signal interfaces 2141 and the second group of output signal interfaces 2142, as well as the corresponding second output signal positive interface 21421 and the second output signal negative interface 21422 are used to connect the above contacts.

[0109] In one embodiment, a CAN transceiver 36 is connected in series between the instruction transmission station 34 and the processor 31 .

[0110] In this embodiment, a specific structure of a serial CAN transceiver 36 is provided. This embodiment provides a new communication method, in which the processor 31 sends the execution instruction to the instruction transmitting station 34 through the CAN transceiver 36, and then broadcasts the execution instruction through the instruction transmitting station 3 in a wireless transmission mode, and the access control module 10 receives the execution instruction after the broadcast.

[0111] In one embodiment, there are five multiple test interfaces 2, and the multiple test interfaces 2 are connected in parallel to the interface switching module 32. The processor 31 has three pins electrically connected to the interface switching module 32, so that the processor 31 can turn on or off different test interfaces 2 through different signals of the three pins.

[0112] In this embodiment, a specific circuit structure is provided for polling the access control module 10 with five test interfaces 2. The three pins of the processor 31 are IO1, IO2, and IO3. The three pins emit different signals corresponding to different switch closing modes. Each test interface 2 is connected in parallel to R X and T X On the pin, the corresponding switching signal table of the interface switching module 32 is as follows: Figure 2 As shown, SW1 to SW5 are five different test switches connected in parallel:

[0113] IO1 IO2 IO3 Low potential Low potential Low potential SW all disconnected High Potential Low potential Low potential SW1 closed Low potential High Potential Low potential SW2 closed High Potential High Potential Low potential SW3 closed Low potential Low potential High Potential SW4 closed High Potential Low potential High Potential SW5 closed

[0114] According to the above table, different test switches can be turned on to implement access to a single test interface 2 and perform polling testing.

[0115] In addition, as shown in the following table:

[0116]

[0117] The above table is a 16-bit code for executing instructions through the J3 contact composed of IO1+ and IO1-, and the J4 contact composed of IO2+ and IO2-. The encoding can be performed through the pins in a timing manner. The specific encoding method can be easily implemented by a technician in this field, so it will not be repeated here. There are five access control modules 10. The first vertical column above is the serial number of different access control modules 10. Different corresponding codes correspond to whether IO1+ and IO1- or IO2+ and IO2- are turned on.

[0118] In one embodiment, the access control module testing device further includes a control terminal 37;

[0119] The processor 31 is disposed in the control terminal 37 so as to control the processor 31 to send the execution instruction through the control terminal 37 .

[0120] In this embodiment, a specific implementation method is provided in which a processor 31 is set in a control terminal 37. From the perspective of circuits and functions, the above-mentioned processor 31 can have a built-in program for automated testing, or it can be set in the control terminal 37 to realize functions such as control and configuration through manual information interaction. The control terminal 37 has an interactive touch screen or other interactive devices for information interaction with testers.

[0121] Figure 6 FIG. 1 is a schematic diagram of a process 100 of a method for testing a door access control module in another embodiment of the present invention. Figure 6 As shown, in one embodiment, the present application provides a method for testing an access control module. Based on the access control module testing device, the multiple test interfaces 2 are respectively connected to separate access control modules 10. The method includes:

[0122] S101, the testing module 3 configures the environmental parameters of the environmental simulation container 1 according to a predetermined setting method.

[0123] In this step, the testing module 3 adjusts the environmental parameters of the access control module 10 placed in the environmental simulation container 1 through the environmental simulation container 1 .

[0124] S102, the test module 3 sends execution instructions to the access control module 10 one by one according to a predetermined instruction triggering method, so that the access control module 10 feeds back execution signals according to the execution instructions.

[0125] In this step, the test module 3 sends execution instructions to each access control module 10 one by one. In order to reduce the complexity of the circuit and the number of pins, the execution instructions are sent one by one instead of at the same time.

[0126] S103, the test module 3 receives execution signals one by one.

[0127] In this step, a test module 3 receives an execution signal fed back by the access control module 10 .

[0128] S104, the testing module 3 records the execution signals one by one to obtain recording results of different access control modules 10.

[0129] In this step, a specific implementation method of recording the execution signal to obtain a recording result is provided.

[0130] In this embodiment, a method based on an access control module testing device is provided, wherein the testing module 3 is used to execute functions such as sending, receiving, and recording instructions, sends execution instructions to the access control module 10 one by one, receives the execution signal fed back, and finally records the execution signal.

[0131] Figure 7 FIG. 2 is a schematic diagram of a process 200 of a method for testing a door access control module in another embodiment of the present invention. Figure 7 As shown, in one embodiment, based on the access control module testing device, the test module sends execution instructions to the access control module one by one according to a predetermined instruction triggering method, so that the access control module feeds back an execution signal according to the execution instruction, including:

[0132] S201 , the processor 31 sends an execution instruction to the CAN transceiver 36 .

[0133] In this step, a specific step of sending an execution instruction to the CAN transceiver 36 through the processor 31 is provided.

[0134] S202 , the CAN transceiver 36 forwards the execution instruction to the instruction transmitting station 34 .

[0135] In this step, a specific step of receiving the execution instruction and sending it to the instruction transmitting station 34 is provided.

[0136] S203, the instruction transmitting station 34 sends the execution instruction to the access control module 10 via wireless transmission, so that the access control module 10 feeds back an execution signal according to the execution instruction.

[0137] In this step, the instruction transmitting station 34 directly sends the execution instruction to the access control module 10 for testing through wireless transmission, which is different from the previous wired method.

[0138] In this embodiment, another test communication method is provided. It should be noted that the instruction transmitting station 34 should have a wireless transmitting device, and the access control module 10 should have a wireless receiving device.

[0139] Those skilled in the art will appreciate that the features described in the various embodiments and / or claims disclosed in this application may be combined and / or combined in a variety of ways, even if such combinations and / or combinations are not explicitly described in this application. In particular, without departing from the spirit and teachings of this application, the features described in the various embodiments and / or claims of this application may be combined and / or combined in a variety of ways, and all of these combinations and / or combinations fall within the scope disclosed in this application.

[0140] Specific embodiments are used herein to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core ideas, and is not used to limit the present application. For those skilled in the art, changes can be made in the specific implementation methods and application scopes according to the ideas, spirits and principles of the present invention, and any modifications, equivalent substitutions, improvements, etc. made therein should be included in the scope of protection of this application.

Claims

1. A door access control module testing device, characterized in that: The test device includes an environmental simulation container, a plurality of test interfaces, and a test module; The environmental simulation container is used to hold at least one access control module and provide test environment conditions. The environmental simulation container is electrically connected to the test module to control the test environment conditions of the environmental simulation container through the test module; The multiple test interfaces are electrically connected to the test modules respectively, and the test interfaces are used to connect the access control module so that the access control module is electrically connected to the test module, and to establish information interaction between the test module and the access control module, as well as information reading and recording; The test module includes a processor, an interface switching module, and a measurement circuit; The processor is electrically connected to the interface switching module, and the interface switching module is electrically connected to the multiple test interfaces, and the interface switching module is used to switch the test interface that is connected to the processor; The measuring circuit is electrically connected to the processor, and the measuring circuit is electrically connected to the test interface, so that the processor obtains the measuring potential through the measuring circuit to achieve measurement of the access control module; The measuring circuit comprises a second power supply and a first field effect transistor, and a first resistor and a second resistor; The plurality of test interfaces include a first test interface; One end of the first resistor is electrically connected to the second power supply, and the other end of the first resistor is electrically connected to the first test interface; One end of the second resistor is electrically connected to the second power supply, the other end of the second resistor is electrically connected to the drain of the first field effect transistor, the source of the first field effect transistor is grounded, and the gate of the first field effect transistor is electrically connected to the first test interface.

2. The access control module testing device according to claim 1, characterized in that: The test module includes a command transmitting station; The instruction transmitting station is electrically connected to the processor, and is used to send execution instructions to the access control module so that the processor receives a feedback signal from the access control module. The first circuit connection end of the instruction transmitting station is grounded, and the second circuit connection end of the instruction transmitting station is electrically connected to one end of a first power supply. The multiple test interfaces are respectively electrically connected to the other end of the first power supply.

3. The access control module testing device according to claim 2, characterized in that: The measuring circuit also includes a third power supply and a second field effect transistor, as well as a third resistor and a fourth resistor; One end of the third resistor is electrically connected to the third power supply, and the other end of the third resistor is electrically connected to the first test interface; One end of the fourth resistor is electrically connected to the third power supply, the other end of the fourth resistor is electrically connected to the drain of the second field effect transistor, the source of the second field effect transistor is grounded, and the gate of the second field effect transistor is electrically connected to the first test interface.

4. The access control module testing device according to claim 3, characterized in that: The first test interface has a power contact interface and a ground contact interface, as well as an input signal interface and an output signal interface; The input signal interface comprises a first input signal port and a second input signal port, wherein the first input signal port is electrically connected to the interface switching module; The output signal interface comprises a first group of output signal interfaces and a second group of output signal interfaces; The first group of output signal interfaces includes a first output signal positive electrode interface and a first output signal negative electrode interface, the first output signal positive electrode interface is electrically connected to the first resistor, and the first output signal negative electrode interface is electrically connected to the second resistor; The second group of output signal interfaces includes a second output signal positive electrode interface and a second output signal negative electrode interface, the second output signal positive electrode interface is electrically connected to the third resistor, and the second output signal negative electrode interface is electrically connected to the fourth resistor; The power contact interface is electrically connected to the first power source, and the ground contact interface is grounded.

5. The access control module testing device according to claim 4, characterized in that: A CAN transceiver is connected in series between the instruction transmitting station and the processor.

6. The access control module testing device according to claim 5, characterized in that: There are five multiple test interfaces, and the multiple test interfaces are all connected in parallel to the interface switching module. The processor has three pins electrically connected to the interface switching module so that the processor can turn on or off different test interfaces through different signals from the three pins.

7. The access control module testing device according to claim 5, characterized in that: The access control module testing device also includes a control terminal; The processor is arranged in a control terminal so as to control the processor to send execution instructions through the control terminal.

8. A method for testing an access control module, characterized in that: Based on the access control module testing device according to any one of claims 1 to 4, the multiple test interfaces are respectively plugged into separate access control modules, and the method includes: The test module configures the environmental parameters of the environmental simulation container according to a predetermined setting method; The test module sends execution instructions to the access control module one by one according to a predetermined instruction triggering method, so that the access control module feeds back execution signals according to the execution instructions; The test module receives the execution signals one by one; The test module records the execution signals one by one to obtain recording results of different access control modules.

9. A method for testing an access control module, characterized in that: Based on the access control module testing device according to any one of claims 5 to 7, the multiple test interfaces are respectively plugged into separate access control modules, and the method includes: The test module configures the environmental parameters of the environmental simulation container according to a predetermined setting method; The test module sends execution instructions to the access control module one by one according to a predetermined instruction triggering method, so that the access control module feeds back execution signals according to the execution instructions; The test module receives the execution signals one by one; The test module records the execution signals one by one to obtain recording results of different access control modules.

10. The access control module testing method according to claim 9, characterized in that: The step of sending execution instructions to the access control module one by one according to a predetermined instruction triggering mode so that the access control module feeds back an execution signal according to the execution instruction comprises: The processor sends an execution instruction to the CAN transceiver; The CAN transceiver forwards the execution instruction to the instruction transmitting station; The instruction transmitting station sends the execution instruction to the access control module by wireless transmission, so that the access control module feeds back an execution signal according to the execution instruction.

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