A radar subarray test apparatus and method of use

Abstract

The application discloses a radar subarray testing device, a frame assembly and a use method. The radar subarray testing device comprises a bottom beam frame, a testing rack capable of being adjusted forward and backward and left and right is arranged on the bottom beam frame, a frame assembly capable of carrying a subarray is arranged on the testing rack, the frame assembly comprises a group plate displacement member capable of being correspondingly adjusted and a demarcated testing frame assembly arranged on the group plate displacement member, the radar subarray testing device use method comprises leveling, loading a subarray to be detected, moving and adjusting a position, connecting line testing and fine adjustment recording. The application can detect the power and phase frequency performances of single or multiple groups of subarray components of a large active phased array radar in a short time, and after the position of the subarray is adjusted on the testing device, the actual fine adjustment requirement can be met through the matched frame assembly, and the application is suitable for popularization and use in radar subarray performance testing.

Description

Technical Field

[0001] This invention relates to radar subarray testing apparatus, corresponding frame assembly, and method of using the testing apparatus, specifically to a radar subarray testing apparatus and its method of use. Background Technology

[0002] Subarrays are an important component of radar. In the actual manufacturing process of radar, when selecting the clutter noise covariance matrix, it is necessary to conduct comprehensive performance tests on the important subarray components of the radar. Then, by combining the power, phase frequency and other detection performance of the subarray components, the specific installation locations of multiple different subarray components can be further determined.

[0003] Performance testing of radar subarray components requires a test frame and its supporting platform assembly. However, ordinary test equipment cannot adjust the position of the subarray components in terms of forward / backward, left / right, and up / down directions. Furthermore, after adjusting the position of the subarray components on the test equipment, there is no supporting platform assembly that can meet the actual requirements for fine-tuning. This makes it impossible to meet the practical needs of performing single or multiple power, phase frequency, and other performance tests on subarray components of large active phased array radars within a short period of time. Therefore, this invention provides a radar subarray testing device, a platform assembly, and a method of use. Summary of the Invention

[0004] This invention provides a radar subarray testing device and its usage method, which can solve the problems mentioned in the background art. This invention can adjust the front-back, left-right, and up-down positions of radar subarrays. Furthermore, after adjusting the subarray positions on the testing device, the accompanying frame assembly can meet the actual requirements for fine-tuning. This allows the invention to test the power, phase frequency, and other performance of single or multiple subarrays of large active phased array radars in a relatively short time. It provides a comprehensive performance testing basis for the specific installation locations of multiple different subarrays in radar manufacturing, making it suitable for widespread use in radar subarray performance testing.

[0005] The technical solution adopted in this invention is as follows:

[0006] A radar subarray testing device includes a radar subarray testing device and a frame assembly disposed on the testing device. The radar subarray testing device includes a bottom beam frame and a test platform disposed on the bottom beam frame that can be adjusted forward and backward and left and right. The device is characterized in that it further includes: a frame assembly disposed on the test platform that can load subarrays.

[0007] The frame assembly includes an adjustable plate shifting component and a zoned test frame assembly that is stably and conveniently positioned on the plate shifting component.

[0008] In order to ensure the horizontal consistency of the bottom beam frame in the testing device and to enable the adjustment of the testing device, the radar subarray testing device further includes a bottom beam frame and rollers set at the bottom of the bottom beam frame. The rollers enable the bottom beam frame to be pushed and moved easily.

[0009] The spiral suction cup column installed on the side of the bottom beam frame can adjust the height of the bottom beam frame up and down, so that the upper horizontal surface of the bottom beam frame is flat and consistent after it is fixed.

[0010] A level is set on the bottom beam frame. The level can show the horizontal level of the upper horizontal plane after the bottom beam frame is fixed, so that the upper horizontal plane of the bottom beam frame is well level after it is fixed.

[0011] Linear slide rails are installed on the bottom beam frame;

[0012] A test stand that can be adjusted forward and backward and left and right on a linear guide rail;

[0013] A frame assembly is mounted on a test bench, and the frame assembly can move up and down on the test bench. The frame assembly can be equipped with a subarray to be tested.

[0014] The frame assembly also includes a zoned test frame assembly;

[0015] The test bench, which can be adjusted forward and backward and left and right, the frame assembly set on the test bench, and the zoned test frame assembly set on the frame assembly can adjust the position of the subarray under test in the forward, backward, left and right and up and down directions, and ensure the stable positioning of the subarray under test.

[0016] To enable left-right and front-back adjustments to the test bench in the testing device and to read the adjustment scale, the bottom beam frame further comprises a bottom beam frame one, a bottom beam frame two, and a bottom beam frame three. Bottom beam frame one has horizontally arranged linear slide rails on its left and right sides. Bottom beam frame two is mounted on the linear slide rails of bottom beam frame one via a slider, allowing it to move back and forth on bottom beam frame one. Bottom beam frame two also has horizontally arranged linear slide rails on its front and back sides. Bottom beam frame three is mounted on the linear slide rails of bottom beam frame two via a slider, allowing it to move left and right on bottom beam frame two.

[0017] A roller is provided at the lower part of the bottom beam frame, and a positioning clip is provided on the roller. The positioning clip can lock or release the roller, and the roller can make the bottom beam frame easy to move.

[0018] The side of the bottom beam frame is provided with a spiral suction cup column, which can adjust the height between the bottom beam frame and the ground, so that the upper horizontal surface is flat and consistent after the bottom beam frame is fixed.

[0019] A handwheel device is provided on the outer right side of the bottom beam frame one. By rotating the handwheel device one, the bottom beam frame two can be moved back and forth on the bottom beam frame one.

[0020] A scale is provided on the outer side of the bottom beam frame one. The scale can accurately measure the specific dimensions of the bottom beam frame two moving back and forth on the bottom beam frame one by rotating the handwheel device one.

[0021] The bottom beam frame 2 is equipped with a handwheel device 2, which allows the bottom beam frame 3 to move left and right on the bottom beam frame 2 by rotating the handwheel device 2.

[0022] The outer side of the bottom beam frame 2 is provided with a scale 2, which can accurately measure the specific dimensions of the bottom beam frame 3 moving left and right on the bottom beam frame 2 by rotating the handwheel device 2.

[0023] A test stand is provided on the bottom beam frame three, and the test stand can move together with the bottom beam frame three.

[0024] To enable vertical adjustment of the test platform assembly and read the adjustment scale, the test platform is further provided with a vertical frame on its front side, a scale ruler is vertically mounted on the vertical frame, a linear slide rail is vertically mounted on the vertical frame, the test platform assembly is mounted on the linear slide rail of the vertical frame, and a handwheel device is provided on the upper outer side of the vertical frame, which allows the test platform assembly to move up and down on the vertical frame by rotating the handwheel device.

[0025] In order to adjust the front-to-back and rotation angle of the subarray to be tested on the assembly plate shifting component in the frame assembly and meet the requirements of fine adjustment, preferably, the assembly plate shifting component has a mounting plate, and a card plate connected to the slider is provided on the back of the mounting plate. The slider and the connecting card plate can move up and down together with the mounting plate to the front and side of the test bench.

[0026] Mounting plate one is provided with mounting plate two, and there is a snap-fit ​​component between mounting plate two and mounting plate one. A bolt adjustment assembly one is also provided on the outer side of mounting plate one and mounting plate two, and the distance between mounting plate one and mounting plate two can be adjusted by bolt adjustment assembly one.

[0027] The mounting plate 2 is provided with a corner connector 1 and a corner connector 2. The corner connector 1 is connected to the upper part of the limiting frame on the outside of the mounting plate 2 through the bolt adjustment assembly 2. The lower part of the limiting frame is connected to the mounting plate 2 through the corner connector 2. By rotating the bolt adjustment assembly 2, the rotation angle between the limiting frame and the mounting plate 2 along the corner connector 2 can be adjusted.

[0028] The limiting frame is provided with a sub-array positioning plate. When the rotating bolt adjusting assembly two adjusts the rotation angle between the limiting frame and the mounting plate two along the corner connector two, the sub-array positioning plate can rotate together with the limiting frame along the corner connector two.

[0029] The subarray positioning plate can be used to fix and install the subarray components to be tested.

[0030] In order to enable the subarray component under test to be stably assembled on the assembly board shifting component and to realize the marking and partitioning of the subarray component under test, and to further refine the performance test of different small areas on the subarray component under test, preferably, the partitioning test frame component has a test board frame and test area lines set on the test board frame. The test area lines can easily divide the area of ​​the subarray component under test, and then record the test data of different areas.

[0031] There are also through-hole windows set in the area between different test zone lines, which facilitate the transmission of signal waves;

[0032] The test board frame is provided with a handle, which makes it easy to pick up and put the test board frame on the assembly and shifting component.

[0033] The test board frame has P-shaped holes near its edge. The P-shaped holes allow the test subarray to be stably fixed to the assembly board shifting component by bolts inserted through them.

[0034] To more clearly and completely describe the specific usage method of the radar subarray testing device, and to achieve the purpose of clearly and completely describing the specific usage steps for power or phase frequency performance testing of a single or multiple radar subarrays, the usage method of the radar subarray testing device includes:

[0035] Step 1: Leveling: By using the rollers located at the bottom of the bottom beam frame, the bottom beam frame and the entire testing device can be moved to a specific position. Adjust the spiral suction cup column on the side of the bottom beam frame and observe the reading through the level ruler on the bottom beam frame to ensure that the horizontal plane of the bottom beam frame is level and consistent, meeting the testing requirements.

[0036] Step 2: Load the subarray to be tested: Install the subarray to be tested on the subarray positioning plate, and then install the test plate frame cover from the sectional test frame assembly on the outside of the subarray to be tested on the subarray positioning plate. Fix the test plate frame, the subarray to be tested, and the subarray positioning plate together as one unit by bolts inserted into the P-shaped holes on the test plate frame.

[0037] Step 3: Adjusting the position: By rotating the handwheel device 1, the bottom beam frame 2 can be moved back and forth on the bottom beam frame 1. The bottom beam frame 3 on the bottom beam frame 2, the testing device on the bottom beam frame 3, and the frame assembly on the testing device can all move back and forth on the bottom beam frame 1 together with the bottom beam frame 2.

[0038] The rotation of the second handwheel device enables the third bottom beam frame to move left and right on the second bottom beam frame. The testing device on the third bottom beam frame and the frame assembly on the testing device can move left and right together with the third bottom beam frame on the second bottom beam frame.

[0039] The frame assembly can be moved up and down on the longitudinal frame by rotating the handwheel device three. The panel shifting component and the zone test frame assembly in the frame assembly, as well as the subarray component to be tested fixedly installed on the subarray positioning plate in the panel shifting component, can all move up and down on the longitudinal frame together with the frame assembly; thereby realizing the adjustment of the position of the subarray component to be tested on the bottom beam frame one in terms of front-back, left-right and up-down, and ensuring the stable limit of the subarray component to be tested.

[0040] Meanwhile, during actual testing, the distance between mounting plate one and mounting plate two can be adjusted by the bolt adjustment component one in the mounting plate shifting component according to actual testing needs, thereby adjusting the connection distance between the sub-array positioning plate set on the outer limit frame of mounting plate two and the test instrument on the test platform plate behind mounting plate one.

[0041] The bolt adjustment assembly 2 in the plate shifting component can adjust the rotation angle between the limiting frame and the mounting plate 2 along the corner connector 2, thereby adjusting the rotation angle of the subarray positioning plate and the limiting frame together along the corner connector 2, so as to adjust the rotation angle of the subarray component to be tested on the subarray positioning plate on the mounting plate 1 in the plate shifting component, and ensure the stable fixed positioning of the subarray component to be tested;

[0042] Step 4: Wiring test: Place the tester on the test platform plate on the back of the mounting plate, and connect the subarray to be tested to the tester on the test platform plate of the test device through the wiring harness;

[0043] Only one tester can be placed on the test platform plate of a test device. The number of testers cannot be greater than one, otherwise signal interference will occur, making the test data inaccurate.

[0044] The testers on the test platform board, which can be an integer number of test devices, can be connected to the central control computer storage and display server through wiring harnesses, so as to realize the performance testing of the sub-array components under test on multiple test devices at the same time.

[0045] Step 5: Fine-tuning and Recording: According to the actual requirements of radar subarray testing, adjust the position of the subarray to be tested in the forward, backward, left, right, and up and down directions using handwheel device 1, handwheel device 2, and handwheel device 3. Record the corresponding positions on scale 1, scale 2, and scale 3, as well as the data displayed on the test instrument on the test platform. When the data displayed on the test instrument fluctuates within a small range, fine-tune the subarray to be tested on the test device using bolt adjustment assembly 1 and bolt adjustment assembly 2. At the same time, observe the changes in the data on the test instrument. When the data on the test instrument shows stable fluctuations or no fluctuations, tighten the bolt adjustment assembly 1 and bolt adjustment assembly 2 to secure them together. Record the power or phase frequency performance test data of the subarray to be tested on the test instrument at this time for subsequent subarray positioning installation of the entire radar.

[0046] Compared with existing technologies, the radar subarray testing device and its usage method provided by the present invention have the following advantages:

[0047] 1. The radar subarray testing device, through the bottom beam frame and the linear slide rail on the bottom beam frame, the test platform set on the linear slide rail that can be adjusted forward and backward and left and right, and the frame assembly set on the test platform that can be moved up and down, can adjust the position of the subarray to be tested on the frame assembly in forward and backward, left and right and up and down, thereby realizing the adjustment of the position of the subarray to be tested on the testing device.

[0048] 2. This radar subarray testing device can adjust the distance between mounting plate one and mounting plate two through the bolt adjustment component one of the assembly plate shifting component in the frame assembly, thereby adjusting the connection distance between the subarray positioning plate set on the outer limit frame of mounting plate two and the test instrument on the test platform plate on the rear side of mounting plate one; by rotating the bolt adjustment component two, the rotation angle between the limit frame and mounting plate two along the corner connector two can be adjusted, thereby adjusting the rotation angle of the subarray positioning plate and the limit frame together along the corner connector two, so that the subarray component to be tested on the subarray positioning plate can be rotated on the mounting plate one in the assembly plate shifting component, and achieve the purpose of stable fixed positioning and fine adjustment of the subarray component to be tested;

[0049] 3. Utilizing a detailed description of the usage method of the radar subarray testing device, this invention describes different steps, including leveling, loading the subarray to be tested, moving and adjusting the position, wiring tests, and fine-tuning records. It also connects the radar subarray testing device, frame assembly, testing instrument, and central control computer storage and display server. This allows for the testing of the power, phase frequency, and other performance parameters of single or multiple subarrays in a large active phased array radar within a short time. This provides a basis for comprehensive performance testing of subarrays, specifying the installation locations of multiple different subarrays in radar manufacturing. Attached Figure Description

[0050] Figure 1 This is a three-dimensional schematic diagram of the radar subarray testing device in the radar subarray testing device and its usage method proposed in this invention.

[0051] Figure 2 This is a right-side schematic diagram of the overall structure of the radar subarray testing device in the radar subarray testing device and its usage method proposed in this invention.

[0052] Figure 3 This is a front view of the overall structure of the radar subarray testing device in the radar subarray testing device and its usage method proposed in this invention.

[0053] Figure 4 This is a rear view of the overall structure of the radar subarray testing device in the radar subarray testing device and its usage method proposed in this invention.

[0054] Figure 5 This is a three-dimensional schematic diagram of the frame assembly in the radar subarray testing device and its usage method proposed in this invention.

[0055] Figure 6 This is a schematic diagram on the right side of the overall structure of the frame assembly in the radar subarray testing device and usage method proposed in this invention.

[0056] Figure 7 This is a schematic diagram showing the connection between the radar subarray testing device, the frame assembly, the testing instrument, and the central control computer storage and display server in the radar subarray testing device and its usage method proposed in this invention.

[0057] Figure 8 This is a block diagram illustrating the steps involved in using a radar subarray testing device and its method as proposed in this invention.

[0058] 1. Bottom beam frame; 101. Bottom beam frame one; 102. Bottom beam frame two; 103. Bottom beam frame three; 2. Spiral suction cup column; 3. Roller; 4. Test bench; 5. Handwheel device one; 501. Handwheel device two; 502. Handwheel device three; 6. Scale one; 601. Scale three; 602. Scale two; 7. Plate shifting component; 701. Mounting plate one; 702. Mounting plate two; 703. Bolt adjustment assembly one; 7 04. Corner Connector 1; 705. Bolt Adjustment Assembly 2; 706. Limiting Frame; 707. Subarray Positioning Plate; 708. Corner Connector 2; 8. Zoned Test Frame Assembly; 801. Test Plate Frame; 802. Handle; 803. Test Zone Line; 804. P-shaped Hole; 805. Through-hole Window; 9. Vertical Frame; 10. Frame Platform Assembly; 11. Test Platform Plate; 12. Test Instrument; 13. Central Control Computer Storage and Display Server. Detailed Implementation

[0059] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the invention.

[0060] In the description of this invention, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0061] The present invention will be further described in detail below with reference to embodiments and specific implementation methods.

[0062] See the attached diagram. Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 and Figure 6 A radar subarray testing device includes a radar subarray testing device and a frame assembly 10 disposed on the testing device. The radar subarray testing device includes a bottom beam frame 1 and a test platform 4 disposed on the bottom beam frame 1 that can be adjusted forward and backward and left and right. The device is characterized in that it further includes: a frame assembly 10 disposed on the test platform 4 that can load subarray components.

[0063] The frame assembly 10 includes an adjustable plate shifting component 7 and a zone test frame assembly 8 that is set on the plate shifting component 7 for stable and convenient picking and placing.

[0064] In order to ensure the horizontal consistency of the bottom beam frame 1 in the testing device and to realize the adjustment of the testing device, the radar subarray testing device further includes a bottom beam frame 1 and rollers 3 set at the bottom of the bottom beam frame 1. The rollers 3 make it easy to push and move the bottom beam frame 1.

[0065] The spiral suction cup column 2 is set on the side of the bottom beam frame 1. The spiral suction cup column 2 can adjust the height of the bottom beam frame 1 up and down, so that the upper horizontal surface of the bottom beam frame 1 is flat and consistent after it is fixed.

[0066] A level ruler is set on the bottom beam frame 1. The level ruler can show the level of the upper horizontal surface after the bottom beam frame 1 is fixed, so that the upper horizontal surface of the bottom beam frame 1 is level after it is fixed.

[0067] A linear slide rail is installed on the bottom beam frame 1;

[0068] A test stand 4 that can be adjusted forward and backward and left and right on a linear slide rail;

[0069] A frame assembly 10 is mounted on the test bench 4. The frame assembly 10 can move up and down on the test bench 4. The frame assembly 10 can be equipped with the subarray to be tested.

[0070] The frame assembly 10 is also equipped with a zoned test frame assembly 8;

[0071] The test bench 4, which can be adjusted forward and backward and left and right, the frame assembly 10 set on the test bench 4, and the zoned test frame assembly 8 set on the frame assembly 10, can adjust the position of the subarray to be tested in the forward, backward, left and right and up and down directions, and ensure the stable positioning of the subarray to be tested.

[0072] To enable left-right and front-back adjustments to the test bench 4 in the testing device and to read the adjustment scale, the bottom beam frame 1 further comprises a bottom beam frame one 101, a bottom beam frame two 102, and a bottom beam frame three 103. The bottom beam frame one 101 has horizontally arranged linear slide rails on its left and right sides. The bottom beam frame two 102 is mounted on the linear slide rails of the bottom beam frame one 101 via a slider, allowing the bottom beam frame two 102 to move back and forth on the bottom beam frame one 101. The bottom beam frame two 102 has horizontally arranged linear slide rails on its front and back sides. The bottom beam frame three 103 is mounted on the linear slide rails of the bottom beam frame two 102 via a slider, allowing the bottom beam frame three 103 to move left and right on the bottom beam frame two 102.

[0073] The bottom beam frame 101 is provided with a roller 3 at the bottom, and a positioning card is provided on the roller 3. The positioning card can lock or release the roller 3, and the roller 3 can make the bottom beam frame 101 easy to push and move.

[0074] The side of the bottom beam frame 101 is provided with a spiral suction column 2. The spiral suction column 2 can adjust the height between the bottom beam frame 101 and the ground, so that the upper horizontal surface of the bottom beam frame 1 is flat and consistent after it is fixed.

[0075] A handwheel device 5 is provided on the outer right side of the bottom beam frame 101. The rotation of the handwheel device 5 enables the bottom beam frame 2 102 to move back and forth on the bottom beam frame 101.

[0076] A scale 6 is provided on the outer side of the bottom beam frame 101. The scale 6 can accurately measure the specific dimensions of the bottom beam frame 102 moving back and forth on the bottom beam frame 101 by rotating the handwheel device 5.

[0077] The bottom beam frame 102 is equipped with a handwheel device 501, which allows the bottom beam frame 103 to move left and right on the bottom beam frame 102 by rotating the handwheel device 501.

[0078] The outer side of the bottom beam frame 102 is provided with a scale 602, which can accurately measure the specific dimensions of the bottom beam frame 103 moving left and right on the bottom beam frame 102 by rotating the handwheel device 501.

[0079] A test stand 4 is provided on the bottom beam frame 3 103, and the test stand 4 can move together with the bottom beam frame 3 103.

[0080] To enable vertical adjustment of the frame assembly 10 in the testing device and to read the adjustment scale, a longitudinal frame 9 is further provided on the front side of the testing platform 4. A scale 601 is vertically mounted on the longitudinal frame 9, and a linear slide rail is vertically mounted on the longitudinal frame 9. The frame assembly 10 is mounted on the linear slide rail of the longitudinal frame 9. A handwheel 502 is provided on the upper outer side of the longitudinal frame 9. The frame assembly 10 can be moved up and down on the longitudinal frame 9 by rotating the handwheel 502.

[0081] In order to adjust the front-to-back and rotation angle of the subarray to be tested on the assembly plate shifting component 7 in the frame assembly 10 and meet the requirements of fine adjustment, preferably, the assembly plate shifting component 7 has a mounting plate 701, and a card plate connected to the slider is provided on the back of the mounting plate 701. The slider and the connecting card plate can move up and down together with the mounting plate 701 on the front and side of the test bench 4.

[0082] Mounting plate 701 is provided with mounting plate 702. There is a snap-fit ​​between mounting plate 702 and mounting plate 701. A bolt adjustment assembly 703 is also provided on the outer side of mounting plate 701 and mounting plate 702. The distance between mounting plate 701 and mounting plate 702 can be adjusted by bolt adjustment assembly 703.

[0083] The mounting plate 2 702 is provided with a first corner connector 704 and a second corner connector 708. The first corner connector 704 is connected to the upper part of the limiting frame 706 on the outside of the mounting plate 2 702 through a bolt adjustment assembly 2 705. The lower part of the limiting frame 706 is connected to the mounting plate 2 702 through the second corner connector 2 708. By rotating the bolt adjustment assembly 2 705, the rotation angle between the limiting frame 706 and the mounting plate 2 702 along the second corner connector 2 708 can be adjusted.

[0084] The limiting frame 706 is provided with a sub-array positioning plate 707. When the rotating bolt adjusting assembly 2 705 adjusts the rotation angle between the limiting frame 706 and the mounting plate 2 702 along the corner connector 2 708, the sub-array positioning plate 707 can rotate together with the limiting frame 706 along the corner connector 2 708.

[0085] The subarray positioning plate 707 can be used to fix and install the subarray components to be tested.

[0086] In order to enable the subarray component under test to be stably assembled on the assembly board shifting component 7 and to realize the marking and partitioning of the subarray component under test, and to further refine the performance test of different small areas on the subarray component under test, preferably, the partitioning test frame assembly 8 has a test board frame 801 and a test area line 803 set on the test board frame 801. The test area line 803 can conveniently divide the area of ​​the subarray component under test, and then record the test data of different areas.

[0087] There are also through-hole windows 805 set in the area between different test zone lines 803, which facilitate the transmission of signal waves;

[0088] The test board frame 801 is provided with a handle 802, which facilitates the removal of the test board frame 801 from the assembly shifting component 7.

[0089] The test board frame 801 has a P-shaped hole 804 near its edge. The P-shaped hole 804 can be used to stably fix the subarray to be tested onto the assembly board shifting component 7 by means of bolts inserted into it.

[0090] Refer to the attached diagram. Figure 7 and Figure 8 To more clearly and completely describe the specific usage method of the radar subarray testing device, and to achieve the purpose of clearly and completely describing the specific usage steps for power or phase frequency performance testing of a single or multiple radar subarrays, the usage method of the radar subarray testing device includes:

[0091] Step 1: Leveling: By using the rollers 3 set at the bottom of the bottom beam frame 101, the bottom beam frame 101 and the entire testing device can be moved to a specific position. Adjust the spiral suction cup column 2 on the side of the bottom beam frame 101 and observe the reading through the level ruler on the bottom beam frame 101 to ensure that the horizontal plane on the bottom beam frame 101 is level and consistent, meeting the testing requirements.

[0092] Step 2: Load the subarray to be tested: Install the subarray to be tested on the subarray positioning plate 707, and then cover the outside of the subarray to be tested on the subarray positioning plate 707 with the test plate frame 801 in the area test frame assembly 8. Fix the test plate frame 801, the subarray to be tested, and the subarray positioning plate 707 together as one unit by bolts that pass through the P-shaped holes 804 on the test plate frame 801.

[0093] Step 3: Adjusting the position: By rotating the handwheel device 5, the second bottom beam frame 102 moves back and forth on the first bottom beam frame 101. The third bottom beam frame 103 on the second bottom beam frame 102, the testing device on the third bottom beam frame 103, and the frame assembly 10 on the testing device can all move back and forth on the first bottom beam frame 101 together with the second bottom beam frame 102.

[0094] The rotation of the handwheel device 2 501 enables the bottom beam frame 3 103 to move left and right on the bottom beam frame 2 102. The test device on the bottom beam frame 3 103 and the frame assembly 10 on the test device can move left and right together with the bottom beam frame 3 103 on the bottom beam frame 2 102.

[0095] The rotation of handwheel device 502 enables the frame assembly 10 to move up and down on the longitudinal frame 9. The plate shifting component 7 and the zone test frame assembly 8 in the frame assembly 10, as well as the subarray component to be tested fixedly installed on the subarray positioning plate 707 in the plate shifting component 7, can all move up and down on the longitudinal frame 9 together with the frame assembly 10. This allows the subarray component to be tested to be adjusted in front-back, left-right and up-down positions on the bottom beam frame 101, and ensures the stable positioning of the subarray component to be tested.

[0096] Meanwhile, during actual testing, the distance between mounting plate 1 701 and mounting plate 2 702 can be adjusted by bolt adjustment component 1 703 in the mounting plate shifting component 7 according to actual testing needs, thereby adjusting the connection distance between the sub-array positioning plate 707 set on the outer limit frame 706 of mounting plate 2 702 and the tester 12 on the test platform plate 11 behind mounting plate 1 701.

[0097] The bolt adjustment assembly 705 in the plate shifting component 7 can adjust the rotation angle between the limiting frame 706 and the mounting plate 702 along the corner connector 708, thereby adjusting the rotation angle of the subarray positioning plate 707 and the limiting frame 706 together along the corner connector 708. This allows the rotation angle of the subarray component to be tested on the subarray positioning plate 707 to be adjusted on the mounting plate 701 in the plate shifting component 7, and ensures the stable fixed positioning of the subarray component to be tested.

[0098] Step 4: Wiring test: Place the tester 12 on the test platform plate 11 on the back of the mounting plate 701, connect the subarray to be tested to the tester 12 on the test platform plate 11 of the test device through the wiring harness, and connect the tester 12 to the external power supply through the external wiring harness.

[0099] Only one tester 12 can be placed on the test platform plate 11 in a test device. The number of testers 12 cannot be greater than one, otherwise signal interference will occur, making the test data inaccurate.

[0100] The testers 12 on the test platform board 11 of the test devices with a quantity greater than one can be connected to the central control computer storage and display server 13 through wiring harnesses, and the central control computer storage and display server 13 can be connected to an external power supply through an external wiring harness, so as to realize the performance testing of the sub-array components to be tested on multiple sets of test devices at the same time.

[0101] Step 5: Fine-tuning and Recording: According to the actual requirements of radar subarray testing, adjust the position of the subarray to be tested in the forward, backward, left, right, and up and down directions using handwheel device 1 (5), handwheel device 2 (501), and handwheel device 3 (502). Record the corresponding positions on scale 1 (6), scale 2 (602), and scale 3 (601), as well as the data displayed on the test instrument 12 on the test platform plate 11. When the data displayed on the test instrument 12 fluctuates within a small range, fine-tune the subarray to be tested on the test device using bolt adjustment assembly 1 (703) and bolt adjustment assembly 2 (705), while observing the changes in the data on the test instrument 12. When the data on the test instrument 12 shows stable fluctuations or no fluctuations, tighten the bolt adjustment assembly 1 (703) and bolt adjustment assembly 2 (705) together and fix them in place. Record the power or phase frequency performance test data of the subarray to be tested on the test instrument 12 at this time for subsequent subarray positioning installation of the entire radar. Example

[0102] Reference Figure 7 and Figure 8 A radar subarray testing device and its usage method, wherein when testing a radar subarray to be tested, at this time... Figure 7 N elements in a given number constitute one element:

[0103] Step 1: Leveling: By using the rollers 3 set at the bottom of the bottom beam frame 101, the bottom beam frame 101 and the entire testing device can be moved to a specific position. Adjust the spiral suction cup column 2 on the side of the bottom beam frame 101 and observe the reading through the level ruler on the bottom beam frame 101 to ensure that the horizontal plane on the bottom beam frame 101 is level and consistent, meeting the testing requirements.

[0104] Step 2: Load the subarray to be tested: Install the subarray to be tested on the subarray positioning plate 707, and then cover the outside of the subarray to be tested on the subarray positioning plate 707 with the test plate frame 801 in the area test frame assembly 8. Fix the test plate frame 801, the subarray to be tested, and the subarray positioning plate 707 together as one unit by bolts that pass through the P-shaped holes 804 on the test plate frame 801.

[0105] Step 3: Adjusting the position: By rotating the handwheel device 5, the second bottom beam frame 102 moves back and forth on the first bottom beam frame 101. The third bottom beam frame 103 on the second bottom beam frame 102, the testing device on the third bottom beam frame 103, and the frame assembly 10 on the testing device can all move back and forth on the first bottom beam frame 101 together with the second bottom beam frame 102.

[0106] The rotation of the handwheel device 2 501 enables the bottom beam frame 3 103 to move left and right on the bottom beam frame 2 102. The test device on the bottom beam frame 3 103 and the frame assembly 10 on the test device can move left and right together with the bottom beam frame 3 103 on the bottom beam frame 2 102.

[0107] The rotation of handwheel device 502 enables the frame assembly 10 to move up and down on the longitudinal frame 9. The plate shifting component 7 and the zone test frame assembly 8 in the frame assembly 10, as well as the subarray component to be tested fixedly installed on the subarray positioning plate 707 in the plate shifting component 7, can all move up and down on the longitudinal frame 9 together with the frame assembly 10. This allows the subarray component to be tested to be adjusted in front-back, left-right and up-down positions on the bottom beam frame 101, and ensures the stable positioning of the subarray component to be tested.

[0108] Meanwhile, during actual testing, the distance between mounting plate 1 701 and mounting plate 2 702 can be adjusted by bolt adjustment component 1 703 in the mounting plate shifting component 7 according to actual testing needs, thereby adjusting the connection distance between the sub-array positioning plate 707 set on the outer limit frame 706 of mounting plate 2 702 and the tester 12 on the test platform plate 11 behind mounting plate 1 701.

[0109] The bolt adjustment assembly 705 in the plate shifting component 7 can adjust the rotation angle between the limiting frame 706 and the mounting plate 702 along the corner connector 708, thereby adjusting the rotation angle of the subarray positioning plate 707 and the limiting frame 706 together along the corner connector 708. This allows the rotation angle of the subarray component to be tested on the subarray positioning plate 707 to be adjusted on the mounting plate 701 in the plate shifting component 7, and ensures the stable fixed positioning of the subarray component to be tested.

[0110] Step 4: Wiring Test: Place the tester 12 on the test platform plate 11 on the back of the mounting plate 701. Connect the subarray to be tested to the tester 12 on the test platform plate 11 of the test device through a wiring harness. Connect the tester 12 to the external power supply through an external wiring harness. Connect the tester 12 to the central control computer storage and display server 13 through a wiring harness. Connect the central control computer storage and display server 13 to the external power supply through an external wiring harness. This will enable the performance testing of the subarray to be tested on the test device.

[0111] Step 5: Fine-tuning and Recording: According to the actual requirements of radar subarray testing, adjust the position of the subarray to be tested in the forward, backward, left, right, and up and down directions using handwheel device 1 (5), handwheel device 2 (501), and handwheel device 3 (502). Record the corresponding positions on scale 1 (6), scale 2 (602), and scale 3 (601), as well as the data displayed on the test instrument 12 on the test platform plate 11. When the data displayed on the test instrument 12 fluctuates within a small range, fine-tune the subarray to be tested on the test device using bolt adjustment assembly 1 (703) and bolt adjustment assembly 2 (705), while observing the changes in the data on the test instrument 12. When the data on the test instrument 12 shows stable fluctuations or no fluctuations, tighten the bolt adjustment assembly 1 (703) and bolt adjustment assembly 2 (705) together and fix them in place. Record the power or phase frequency performance test data of the subarray to be tested on the test instrument 12 at this time for subsequent subarray positioning installation of the entire radar. Example

[0112] Reference Figure 7 and Figure 8 A radar subarray testing device and its usage method, wherein when testing a radar subarray of more than one integer number to be tested, at this time... Figure 7 N in the formula represents an integer greater than one:

[0113] Each radar subarray test device, with a corresponding subarray to be tested mounted on it, undergoes the following steps: Step 1: Leveling; Step 2: Loading the subarray to be tested; Step 3: Position adjustment; Step 4: Wiring test; Step 5: Fine-tuning and recording. The difference between testing a single subarray and testing only one subarray is that...

[0114] Step 4: Wiring test: Place N testers 12 on the test platform plate 11 on the back of the N radar subarray test devices and frame assembly mounting plate 701 respectively. Connect the subarray to be tested to the tester 12 on the test platform plate 11 corresponding to each radar subarray test device and frame assembly through the wiring harness. Connect each of the N testers 12 to the external power supply through the external wiring harness.

[0115] At the same time, ensure that only one tester 12 can be placed on the test platform board 11 in a test device, and that no more than one tester 12 can be placed on it, otherwise signal interference will occur, making the test data inaccurate.

[0116] The tester 12 on the test platform board 11 of the N radar subarray test device is connected to the central control computer storage and display server 13 through a wiring harness, and the central control computer storage and display server 13 is connected to an external power supply through an external wiring harness, so as to realize the performance test of the subarrays to be tested on multiple test devices at the same time.

[0117] This invention enables the adjustment of the front-back, left-right, and up-down positions of radar subarray components. After the subarray component positions are adjusted on the testing device, the matching frame assembly 10 can meet the actual requirements for fine-tuning. This invention allows for the testing of the power, phase frequency, and other performance of single or multiple subarray components of large active phased array radars in a short time. It provides a basis for comprehensive performance testing of subarray components for the specific installation locations of multiple different subarray components in radar manufacturing, and is suitable for widespread use in radar subarray component performance testing.

[0118] The above description is only a preferred embodiment of the present invention. It should be noted that those skilled in the art can make several modifications and improvements without departing from the inventive concept of the present invention, and these all fall within the protection scope of the present invention.

Claims

1. A radar subarray testing device, comprising a radar subarray testing device and a frame assembly disposed on the testing device, the radar subarray testing device comprising a base beam frame and a testing platform disposed on the base beam frame that can be adjusted forward and backward and left and right, characterized in that, Also includes: A frame assembly that can be mounted on a test bench to accommodate subarray components; The frame assembly includes an adjustable plate shifting component and a zoned test frame assembly that is set on the plate shifting component for stable and convenient picking and positioning. The assembly plate shifting component includes a mounting plate, and a locking plate connected to the slider is provided on the back of the mounting plate. The slider and the connecting locking plate can move up and down together with the mounting plate on the front and side of the test bench. Mounting plate one is provided with mounting plate two, and there is a snap-fit ​​component between mounting plate two and mounting plate one. A bolt adjustment assembly one is also provided on the outer side of mounting plate one and mounting plate two, and the distance between mounting plate one and mounting plate two can be adjusted by bolt adjustment assembly one. The mounting plate 2 is provided with a corner connector 1 and a corner connector 2. The corner connector 1 is connected to the upper part of the limiting frame on the outside of the mounting plate 2 through the bolt adjustment assembly 2. The lower part of the limiting frame is connected to the mounting plate 2 through the corner connector 2. By rotating the bolt adjustment assembly 2, the rotation angle between the limiting frame and the mounting plate 2 along the corner connector 2 can be adjusted. The limiting frame is provided with a sub-array positioning plate. When the rotating bolt adjusting assembly two adjusts the rotation angle between the limiting frame and the mounting plate two along the corner connector two, the sub-array positioning plate can rotate together with the limiting frame along the corner connector two. The subarray positioning plate can be used to fix and install the subarray components to be tested; The zoning test frame component has a test board frame and test zone lines set on the test board frame. The test zone lines can easily divide the zones of the sub-array components to be tested, and then record the test data of different zones. There are also through-hole windows set in the area between different test zone lines, which facilitate the transmission of signal waves; The test board frame is provided with a handle, which makes it easy to pick up and put the test board frame on the assembly and shifting component. The test board frame has P-shaped holes near its edge. The P-shaped holes allow the test subarray to be stably fixed to the assembly board shifting component by bolts inserted through them.

2. The radar subarray testing device according to claim 1, characterized in that... The radar subarray testing device includes a base beam frame and rollers located at the bottom of the base beam frame. The rollers enable the base beam frame to be easily pushed and moved. The spiral suction cup column installed on the side of the bottom beam frame can adjust the height of the bottom beam frame up and down, so that the upper horizontal surface of the bottom beam frame is flat and consistent after it is fixed. A level is set on the bottom beam frame. The level can show the horizontal level of the upper horizontal plane after the bottom beam frame is fixed, so that the upper horizontal plane of the bottom beam frame is well level after it is fixed. Linear slide rails are installed on the bottom beam frame; A test stand that can be adjusted forward and backward and left and right on a linear guide rail; A frame assembly is mounted on a test bench, and the frame assembly can move up and down on the test bench. The frame assembly can be equipped with a subarray to be tested. The frame assembly also includes a zoned test frame assembly; The test bench, which can be adjusted forward and backward and left and right, the frame assembly set on the test bench, and the zoned test frame assembly set on the frame assembly can adjust the position of the subarray under test in the forward, backward, left and right and up and down directions, and ensure the stable positioning of the subarray under test.

3. The radar subarray testing device according to claim 2, characterized in that... The bottom beam frame includes bottom beam frame one, bottom beam frame two, and bottom beam frame three. Bottom beam frame one has horizontal linear slide rails arranged on the left and right sides. Bottom beam frame two is mounted on the linear slide rails of bottom beam frame one by a slider, and bottom beam frame two can move back and forth on bottom beam frame one. Bottom beam frame two has horizontal linear slide rails arranged on the front and back sides. Bottom beam frame three is mounted on the linear slide rails of bottom beam frame two by a slider, and bottom beam frame three can move left and right on bottom beam frame two. A roller is provided at the lower part of the bottom beam frame, and a positioning clip is provided on the roller. The positioning clip can lock or release the roller, and the roller can make the bottom beam frame easy to move. The side of the bottom beam frame is provided with a spiral suction cup column, which can adjust the height between the bottom beam frame and the ground, so that the upper horizontal surface is flat and consistent after the bottom beam frame is fixed. A handwheel device is provided on the outer right side of the bottom beam frame one. By rotating the handwheel device one, the bottom beam frame two can be moved back and forth on the bottom beam frame one. A scale is provided on the outer side of the bottom beam frame one. The scale can accurately measure the specific dimensions of the bottom beam frame two moving back and forth on the bottom beam frame one by rotating the handwheel device one. The bottom beam frame 2 is equipped with a handwheel device 2, which allows the bottom beam frame 3 to move left and right on the bottom beam frame 2 by rotating the handwheel device 2. A scale ruler is provided on the outer side of the bottom beam frame 2. The scale ruler 2 can accurately measure the specific dimensions of the bottom beam frame 3 moving left and right on the bottom beam frame 2 by rotating the handwheel device 2. A test stand is provided on the bottom beam frame three, and the test stand can move together with the bottom beam frame three.

4. The radar subarray testing device according to claim 1, characterized in that... The test bench has a vertical frame on its front side, a scale three is vertically mounted on the vertical frame, a linear slide rail is vertically mounted on the vertical frame, the test bench assembly is mounted on the linear slide rail of the vertical frame, and a handwheel device three is mounted on the upper outer side of the vertical frame, which allows the test bench assembly to move up and down on the vertical frame by rotating the handwheel device three.

5. A method of using a radar subarray testing device, wherein the method is applied to the radar subarray testing device of claim 1, characterized in that, Includes the following steps: Step 1: Leveling: By using the rollers located at the bottom of the bottom beam frame, the bottom beam frame and the entire testing device can be moved to a specific position. Adjust the spiral suction cup column on the side of the bottom beam frame and observe the reading through the level ruler on the bottom beam frame to ensure that the horizontal plane of the bottom beam frame is level and consistent, meeting the testing requirements. Step 2: Load the subarray to be tested: Install the subarray to be tested on the subarray positioning plate, and then install the test plate frame cover from the sectional test frame assembly on the outside of the subarray to be tested on the subarray positioning plate. Fix the test plate frame, the subarray to be tested, and the subarray positioning plate together as one unit by bolts inserted into the P-shaped holes on the test plate frame. Step 3: Adjusting the position: By rotating the handwheel device 1, the bottom beam frame 2 can be moved back and forth on the bottom beam frame 1. The bottom beam frame 3 on the bottom beam frame 2, the testing device on the bottom beam frame 3, and the frame assembly on the testing device can all move back and forth on the bottom beam frame 1 together with the bottom beam frame 2. The rotation of the second handwheel device enables the third bottom beam frame to move left and right on the second bottom beam frame. The testing device on the third bottom beam frame and the frame assembly on the testing device can move left and right together with the third bottom beam frame on the second bottom beam frame. The frame assembly can be moved up and down on the longitudinal frame by rotating the handwheel device three. The panel shifting component and the zone test frame assembly in the frame assembly, as well as the subarray component to be tested fixedly installed on the subarray positioning plate in the panel shifting component, can all move up and down on the longitudinal frame together with the frame assembly; thereby realizing the adjustment of the position of the subarray component to be tested on the bottom beam frame one in terms of front-back, left-right and up-down, and ensuring the stable limit of the subarray component to be tested. Meanwhile, during actual testing, the distance between mounting plate one and mounting plate two can be adjusted by the bolt adjustment component one in the mounting plate shifting component according to actual testing needs, thereby adjusting the connection distance between the sub-array positioning plate set on the outer limit frame of mounting plate two and the test instrument on the test platform plate behind mounting plate one. The bolt adjustment assembly 2 in the plate shifting component can adjust the rotation angle between the limiting frame and the mounting plate 2 along the corner connector 2, thereby adjusting the rotation angle of the subarray positioning plate and the limiting frame together along the corner connector 2, so as to adjust the rotation angle of the subarray component to be tested on the subarray positioning plate on the mounting plate 1 in the plate shifting component, and ensure the stable fixed positioning of the subarray component to be tested; Step 4: Wiring test: Place the tester on the test platform plate on the back of the mounting plate, and connect the subarray to be tested to the tester on the test platform plate of the test device through the wiring harness; Only one tester can be placed on the test platform plate of a test device. The number of testers cannot be greater than one, otherwise signal interference will occur, making the test data inaccurate. The testers on the test platform board, which can be an integer number of test devices, can be connected to the central control computer storage and display server through wiring harnesses, so as to realize the performance testing of the sub-array components under test on multiple test devices at the same time. Step 5: Fine-tuning and Recording: According to the actual requirements of radar subarray testing, adjust the position of the subarray to be tested in the forward, backward, left, right, and up and down directions using handwheel device 1, handwheel device 2, and handwheel device 3. Record the corresponding positions on scale 1, scale 2, and scale 3, as well as the data displayed on the test instrument on the test platform. When the data displayed on the test instrument fluctuates within a small range, fine-tune the subarray to be tested on the test device using bolt adjustment assembly 1 and bolt adjustment assembly 2. At the same time, observe the changes in the data on the test instrument. When the data on the test instrument shows stable fluctuations or no fluctuations, tighten bolt adjustment assembly 1 and bolt adjustment assembly 2 to secure them together. Record the power or phase frequency performance test data of the subarray to be tested on the test instrument at this time for subsequent subarray positioning installation of the entire radar.

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