Automatic sampling system, sample analysis system and automatic sampling control method

Abstract

An automatic sampling device (1), a sample analysis system, and an automatic sampling control method. The automatic sampling device (1) comprises a feed channel (10), a loading area (20), a buffer area (30), an emergency area (40), and a transfer scheduling mechanism (50), wherein a sample suction position (10a) of the feed channel (10) is located between the loading area (20) and the buffer area (30); a sample rack moved from the loading area (20) to the feed channel (10) moves in a first direction to the sample suction position (10a), and a sample rack taken out of the buffer area (30) and moved into the feed channel (10) by the transfer scheduling mechanism (50) moves in a direction opposite to the first direction to the sample suction position (10a).

Description

Technical Field

[0001] The invention relates to an automatic sampling system, a sample analysis system and an automatic sampling control method. Background Art

[0002] Analytical equipment, such as biochemical analyzers, immunoassay analyzers, and cell analyzers, are instruments used to analyze and measure samples. They generally do this by adding reagents to the sample and then measuring the chemical composition and concentration of the sample after the sample reacts with the reagents in a certain way.

[0003] There are roughly three types of organizations used to supply samples to analytical equipment. The first is to set up a fixed sample position in the analytical equipment. When a sample needs to be re-examined, the sample is directly taken from the fixed sample position for re-examination, which can meet the demand for priority processing of sample re-examination; but this type of sample supply organization is not suitable for large-scale sample testing. The second sample supply method is to have a sample backup in the analytical equipment. When a sample needs to be re-examined, the sample is taken from the sample backup for re-examination. This type of organization is also not suitable for large-scale sample testing. The third sample supply method is to set up a sample scheduling system independent of the analytical equipment. It can be flexibly designed into a system with different scheduling capabilities according to the number of samples, which can adapt to large-scale sample testing. However, the current sample scheduling system generally has the problem that re-examination and emergency samples need to be dispatched to the placement area for queuing, which makes the output efficiency of the test results of re-examination and emergency samples low, and cannot meet the current demand for priority processing of re-examination and emergency requirements. Summary of the Invention

[0004] The present invention mainly provides an automatic sampling system, a sample analysis system and an automatic sampling control method.

[0005] According to the first aspect, an embodiment provides an automatic sampling device, comprising:

[0006] A feed channel is provided along a first direction, and is used to carry a sample rack and allow the sample rack to move along the feed channel along its length; the feed channel is also provided with a sample aspirating position, and is used to aspirate the sample on the sample rack when the sample on the sample rack is located at the sample aspirating position of the feed channel;

[0007] a loading area, the loading area being in communication with the feed channel and being used to carry a sample rack having a length direction along the first direction, and for the sample rack to be moved along the second direction toward the feed channel and then moved along the first direction to a sample aspiration position;

[0008] A buffer area, the buffer area is used to hold sample racks that have completed sampling and are waiting for test results and / or sample racks that store emergency samples;

[0009] a transfer scheduling mechanism for scheduling sample racks between the buffer area and the feed channel, so that the sample rack that has completed sampling is moved out of the feed channel and then into the buffer area to wait for the test result; when the test result of the sample indicates that the sample needs to be retested, the corresponding sample rack in the buffer area is moved out of the buffer area and into the feed channel; or when an emergency instruction input by the user is received, the sample rack in the buffer area corresponding to the emergency instruction is moved out of the buffer area and into the feed channel;

[0010] The sample aspiration position of the feed channel is located between the loading area and the buffer area; the sample rack moved from the loading area to the feed channel moves in a first direction to the sample aspiration position, and the sample rack taken out of the buffer area and moved into the feed channel by the transfer scheduling mechanism moves in a direction opposite to the first direction to the sample aspiration position.

[0011] According to a second aspect, an embodiment provides a sample analysis system, comprising: an automatic sampling device, and an analysis device for drawing a sample from a sample rack supplied by the automatic sampling device and performing analysis, wherein the automatic sampling device comprises:

[0012] A feed channel is provided along a first direction for carrying a sample rack and allowing the sample rack to move along the feed channel along its length; the feed channel is further provided with a sample aspirating position for allowing the sample aspirating device of the analysis system to aspirate the sample when the sample on the sample rack is located at the sample aspirating position of the feed channel;

[0013] a loading area, the loading area being in communication with the feed channel and being used to carry a sample rack having a length direction along the first direction, and for the sample rack to be moved along the second direction toward the feed channel and then moved along the first direction to a sample aspiration position;

[0014] A buffer area, the buffer area is used to hold sample racks that have completed sampling and are waiting for test results and / or sample racks that store emergency samples;

[0015] a transfer scheduling mechanism for scheduling sample racks between the buffer area and the feed channel, so that the sample rack that has completed sample aspiration is moved out of the feed channel and then into the buffer area to wait for the test result; when the test result of the sample indicates that the sample needs to be retested, the corresponding sample rack in the buffer area is moved out of the buffer area and into the feed channel; when an emergency instruction input by the user is received, the sample rack in the buffer area corresponding to the emergency instruction is moved out of the buffer area and into the feed channel;

[0016] The sample aspiration position of the feed channel is located between the loading area and the buffer area; the sample rack moved from the loading area to the feed channel moves in a first direction to the sample aspiration position, and the sample rack taken out of the buffer area and moved into the feed channel by the transfer scheduling mechanism moves in a direction opposite to the first direction to the sample aspiration position;

[0017] The automatic sampling device is arranged on one side of the analysis equipment, and the first direction is consistent with the length direction of the analysis equipment; the loading area and the buffer area are located on the first side of the feed channel, and the analysis equipment is located on the second side of the automatic sampling device opposite to the first side.

[0018] According to a third aspect, an embodiment provides a method for automatic sample injection control, comprising:

[0019] Sample rack placing step: controlling the sample rack to move from the loading area to the feeding channel along the second direction;

[0020] Sample rack feeding step: controlling the sample rack to move along the feeding channel in a first direction to a sample aspirating position on the feeding channel for aspirating the sample;

[0021] Sample rack caching step: controlling the transfer scheduling mechanism to move the sample rack that has completed sample aspiration and has been removed from the feed channel to the cache area in a direction opposite to the second direction, and driving the sample rack to move into the cache area in a direction that is the same as or opposite to the first direction to wait for test results;

[0022] Re-examination step: When the test result of the sample indicates that the sample needs to be re-examined, the transfer scheduling mechanism is controlled to take out the sample rack corresponding to the re-examination instruction in the buffer area in a direction opposite to or the same as the first direction, and then schedule it to the feed channel along the second direction, so as to move it along the feed channel in a direction opposite to the first direction to the sample aspiration position for sample aspiration. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 Schematic diagram of the structure of an automatic sampling device according to an embodiment;

[0024] Figure 2 A schematic structural diagram of an automatic sampling device according to another embodiment;

[0025] Figure 3 is a three-dimensional diagram of a sample rack;

[0026] Figure 4 Schematic diagram of the structure of a feed channel according to an embodiment;

[0027] Figure 5 A schematic diagram of the structure of a reciprocating feeding mechanism according to an embodiment;

[0028] Figure 6Schematic diagram of the structure of an automatic sampling device according to another embodiment;

[0029] Figure 7 A schematic diagram of the structure of a cache area according to an embodiment;

[0030] Figure 8 A schematic structural diagram of an automatic sampling device according to another embodiment;

[0031] Figure 9 This is a schematic structural diagram for illustrating two channel openings of a feed channel according to an embodiment;

[0032] Figure 10 A schematic diagram of the structure of a transfer dispatching mechanism according to an embodiment;

[0033] Figure 11 Schematic diagram of the structure of an automatic sampling device according to another embodiment;

[0034] Figure 12 is a schematic structural diagram of a sample analysis system according to an embodiment;

[0035] Figure 13 A flowchart of a method for automatic sample injection control according to an embodiment;

[0036] Figure 14 A flow chart of a method for automatic sample injection control according to another embodiment;

[0037] Figure 15 A flowchart of a method for automatic sample injection control according to another embodiment;

[0038] Figure 16 The present invention is a flowchart of a method for automatic injection control according to another embodiment. DETAILED DESCRIPTION

[0039] The present invention will be further described in detail below by means of specific embodiments in conjunction with the accompanying drawings. Similar elements in different embodiments are numbered with associated similar elements. In the following embodiments, many detailed descriptions are provided to enable the present application to be better understood. However, those skilled in the art will readily appreciate that some of the features may be omitted in different circumstances, or may be replaced by other elements, materials, or methods. In some cases, some operations related to the present application are not shown or described in the specification. This is to avoid the core portion of the present application being overwhelmed by excessive descriptions, and for those skilled in the art, it is not necessary to describe these related operations in detail. They will fully understand the related operations based on the description in the specification and the general technical knowledge in the art.

[0040] In addition, the features, operations, or characteristics described in the specification may be combined in any appropriate manner to form various embodiments. Furthermore, the steps or actions in the method description may be reordered or adjusted in a manner readily apparent to those skilled in the art. Therefore, the various sequences in the specification and drawings are provided solely for the purpose of clearly describing a particular embodiment and are not intended to be mandatory, unless otherwise specified.

[0041] Component numbers used herein, such as "first" and "second," are used solely to distinguish the components being described and do not connote any sequential or technical meaning. References to "connection" and "coupling" herein, unless otherwise specified, include both direct and indirect connections (couplings). Furthermore, references to "up," "down," "left," and "right" herein are with respect to the drawings as they appear on the page.

[0042] Please refer to Figure 1 and Figure 2 The automatic sampling device disclosed in some embodiments of the present application includes a feeding channel 10, a loading area 20, a buffer area 30, an emergency area 40 and a transfer scheduling mechanism 50. It should be noted that the automatic sampling device in some embodiments may not include the emergency area 40, for example Figure 1 As an example, the automatic sampling device in some embodiments may include an emergency area 40, such as Figure 2 The following is a detailed description of the various components of the automatic sampling device.

[0043] The feed channel 10 is where the analysis device absorbs the sample. In some embodiments, the feed channel 10 is arranged along a first direction - for example Figure 1 and Figure 2 The feeding channel 10 is used to carry the sample rack and allow the sample rack to move along the length direction of the feeding channel. Figure 3 As shown, an example of a sample rack is shown, wherein the length, width and height of the sample rack are L, W and H respectively. The length direction of the sample rack is the measurement direction of the length L, and the height direction is the measurement direction of the height H. In some embodiments, the feed channel 10 is further provided with a sample suction position, for example Figure 1 and Figure 2 The sample aspiration position 10a is used to aspirate the sample on the sample rack when the sample on the sample rack is located at the sample aspiration position of the feed channel 10; in other words, when the sample on the sample rack is located at the sample aspiration position of the feed channel 10, the analysis device aspirates the sample. The sample rack can be continuously moved along the first direction so that each sample it carries passes through the sample aspiration position one by one, so that all samples on the sample rack are aspirated by the analysis device respectively.

[0044] Please refer to Figure 4In order to allow the sample rack to reciprocate on the feed channel 10, that is, to move in the same direction as the first direction (for example, the positive direction of the X-axis in the figure) and in the opposite direction (for example, the negative direction of the X-axis in the figure), or in other words, to move in the left and right directions in the figure, a reciprocating feed mechanism 11 can be provided on the feed channel 10. By providing a reciprocating feed mechanism 11 on the feed channel 10, the sample rack can be carried in two directions on one track, so that one feed channel can complete the suction of the initial inspection sample, the re-inspection sample, and the emergency sample, and at the same time can realize the priority processing of the re-inspection sample and the emergency sample, thus overcoming the defect in the prior art that the re-inspection sample and the emergency sample need to wait in line. In a specific embodiment, please refer to Figure 5 The reciprocating feeding mechanism 11 includes a motor 11a and a locking portion 11b. A plurality of grooves 11c are provided at the bottom of the sample rack. The locking portion 11b can be driven by the motor 11a to extend and retract along the height direction of the sample rack, and to move in the same direction and the opposite direction to the first direction; when the locking portion 11b is driven to extend, it can cooperate with any groove of the sample rack, so that when the locking portion 11b is driven, it drives the sample rack to move in the same direction and the opposite direction to the first direction. For example, when the locking portion 11b is driven to move in the first direction, it can drive the sample rack to move in the first direction; when the locking portion 11b is driven to move in the direction opposite to the first direction, it can drive the sample rack to move in the direction opposite to the first direction.

[0045] Other components may also be provided on the feed channel 10, such as at least one of a test tube / test tube cap detection mechanism 12, a test tube rotation mechanism 13, and a scanner 14. The scanner 14 is used to scan the test tube label to obtain sample information. The test tube rotation mechanism 13 is a test tube rotation mechanism used to drive the test tube rotation. For example, when the sample rack moves on the feed channel 10, if the scanner 14 cannot scan the test tube carried on the sample rack - the reason may be that the labeled side of the test tube is not facing the scanner 14, then the test tube rotation mechanism 13 drives the test tube to rotate so that the test tube label is aligned with the scanner 14. The test tube / test tube cap detection mechanism 12 is a test tube / test tube cap detection mechanism used to detect the presence of test tubes and the presence of test tube caps on the test tubes. If it is detected that there is no test tube at the sample position on the sample rack, the automatic sampling device can issue an alarm.

[0046] The above is some description of the feed channel 10 .

[0047] The loading area 20 is connected to the feed channel 10 and is used to hold sample racks whose lengths are aligned along a first direction. The sample racks are then moved along a second direction toward the feed channel 10 and then along the first direction to the sample aspiration position. In some embodiments herein, the first and second directions are perpendicular. For example, in the figure, the X-axis is the first direction, and the Y-axis is the second direction. The loading area 20 can be used for users to place batches of sample racks containing samples to be tested.

[0048] The buffer area 30 is used to hold sample racks that have completed sampling and are waiting for test results and / or sample racks for storing emergency samples. In some embodiments, the buffer area 30 holds sample racks, the length direction of which is parallel to the first direction, and allows the sample racks to move out of the buffer area 30 in the same direction or opposite direction to the first direction, and allows the sample racks to move into the buffer area 30 in the direction opposite to or the same direction as the first direction. For specific embodiments, please refer to Figure 6 The cache area 30 includes a plurality of cache positions 31 arranged in sequence along the second direction; any of the cache positions 31 can carry a sample rack whose length direction is parallel to the first direction, and allows the sample rack to move out of the cache area 30 in a direction that is the same as or opposite to the first direction, and allows the sample rack to move into the cache area 30 in a direction that is the same as or opposite to the first direction. Figure 1 and Figure 2 In the example, the sample rack moves out of the buffer area 30 along a first direction and moves into the buffer area along a direction opposite to the first direction.

[0049] In order to ensure that each sample rack can be placed securely in the buffer area, in some embodiments, please refer to Figure 7 The cache area 30 includes a baffle 31a and several partitions 31b. The setting direction of several of the partitions 31b is parallel to the first direction. Several of the partitions 31b are set at intervals and arranged along the second direction. A cache position 31 is formed between two adjacent partitions 31b; the baffle 31a is set in a direction parallel to the second direction, and the baffle 31a is connected to one end of several of the partitions 31b.

[0050] When the total number of cache bits in the cache area 30 remains substantially unchanged, in some embodiments, the number of the cache area 30 may be one, for example Figure 1 and Figure 2 This is an example. In some embodiments, the number of cache areas 30 is at least two, for example, two or more than two, and the total cache bits are distributed to two or more cache areas 30 to achieve a change in the design size in a certain dimension. In some embodiments, when there are multiple cache areas 30, these cache areas are set in parallel. In some embodiments, when there are multiple cache areas 30, these cache areas are set in parallel along a first direction. These cache areas are set in parallel along the first direction, for example Figure 8This is an example. It can be seen that although this increases the length of the automatic sampler in the first direction, the automatic sampler can be set on one side of the analysis device later, and the first direction is consistent with the length direction of the analysis device. Therefore, in actual situations, there is sufficient design space for the length of the automatic analysis device in the first direction; in addition, these buffer areas are set in parallel along the first direction to reduce the length in the second direction, and the design space in the second direction is relatively small. In actual situations, it is hoped to reduce the length of the automatic analysis device in the second direction as much as possible. After this arrangement, when the automatic device is assembled with the analysis device, as described above, the automatic sampler is set on one side of the analysis device, and the first direction is consistent with the length direction of the analysis device, so that the length direction of the final whole machine (i.e., the length in the first direction) remains unchanged, and the longitudinal depth (i.e., the length in the second direction) will not increase much due to the addition of the automatic sampler. In addition, for Figure 8 The buffer area 30 on the left side of the sample rack can be moved into the buffer area 30 along a first direction and out of the buffer area in a direction opposite to the first direction; Figure 8 As for the buffer area 30 on the middle right, the sample rack can be moved out of the buffer area along a first direction, and can be moved into the buffer area along a direction opposite to the first direction.

[0051] For example, there are two buffer zones 30. In some embodiments, the two buffer zones 30 are separated by a middle zone 32, and the two buffer zones 30 are arranged symmetrically with the middle zone 32 as the axis of symmetry. The length of the middle zone 32 along the first direction is at least the length of the sample rack, so that the sample racks in the two buffer zones 30 can be completely moved into the middle zone 32 in the same direction as or opposite to the first direction. The sample racks can then be moved in the same direction as or opposite to the second direction. Figure 8 For example, for Figure 8 The sample rack can be moved out of the buffer area 30 on the left side in a direction opposite to the first direction and into the middle area, and can be moved into the buffer area from the middle area in the same direction as the first direction; Figure 8 In the buffer area 30 on the right side of the center, sample racks can be moved out of the buffer area in a first direction and into the middle area, and can also be moved into the buffer area from the middle area in a direction opposite to the first direction. The transfer and dispatch mechanism 50 moves back and forth in the middle area 32. The transfer and dispatch mechanism 50 moves in a direction opposite to the second direction to dispatch sample racks from the feed channel 10 to corresponding buffer locations 31 in the buffer area 30. The transfer and dispatch mechanism 50 also moves in a direction identical to the second direction to remove samples from corresponding buffer locations 31 in the buffer area 30 and dispatch them to the feed channel 10 for re-sampling.

[0052] In some embodiments, the loading area 20 and the buffer area 30 are on the same side of the feed channel 10 , for example, below the feed channel 10 in the figure.

[0053] The above is some description about the buffer area 30 .

[0054] The emergency area 40 is used for users to place sample racks—for example, users can place sample racks carrying emergency samples in the emergency area 40. In some embodiments, the emergency area 40 is connected to at least the buffer area 30—when there are multiple buffer areas 30, the emergency area 40 is connected to at least one of the buffer areas 30. The emergency area 40 is used to allow sample racks to be moved from the emergency area 40 to the buffer area 30 connected to the emergency area 40. In some embodiments, the emergency area 40 carries sample racks whose lengths are placed along a first direction, and allows sample racks to be moved from the emergency area 40 to the connected buffer area 30 in a direction that is the same as or opposite to the first direction. In some embodiments, the emergency area 40 includes at least one emergency position 41; the emergency position 41 is aligned with the buffer position 31 of the buffer area 30, and is used to carry sample racks whose lengths are placed along the first direction, and allows sample racks to be moved out of the emergency position 41 in a direction that is the same as or opposite to the first direction and into the buffer position 31 aligned with the emergency position 41. Figure 6 and Figure 8 For example, a sample rack in the emergency area 40 can be moved from the emergency area 40 to the connected buffer area 30 along a first direction, for example, from the emergency position 41 along the first direction to the buffer position 31 aligned with the emergency position 41. As described above, in some embodiments, the buffer area 30 includes a baffle 31a and a partition 31b. It is understandable that when the automatic sampling device has an emergency area 40, the partition 31b does not separate the emergency area 40 from the buffer area 30, that is, the partition 31b does not prevent the sample rack from entering the buffer area 30 connected thereto from the emergency area 40. For example, the partition 31b is not provided at the buffer position 31 connected thereto by the emergency position 41.

[0055] In some embodiments, the emergency area 40 may also be disposed in the buffer area 30. In some embodiments, at least one buffer position 31 of the buffer area 30 is configured as an emergency position for users to place sample racks.

[0056] In some embodiments, the emergency area 40 is provided with a button (not shown in the figure), which, when triggered, generates an instruction to test the sample rack in the emergency area 40, in other words, an emergency instruction.

[0057] The above is some explanation about the emergency area 40.

[0058] The transfer scheduling mechanism 50 is used to schedule sample racks between the buffer area 30 and the feed channel 10. In some embodiments, the transfer scheduling mechanism 50 removes sample racks from the feed channel 10 after sample aspiration and moves them into the buffer area 30 to await test results. When the test results of a sample indicate that the sample requires retesting, the transfer scheduling mechanism 50 removes the corresponding sample rack from the buffer area 30 and moves it into the feed channel 10. In some embodiments, upon receiving an emergency instruction input by the user, the sample rack corresponding to the emergency instruction in the buffer area 30 is removed from the buffer area 30 and moved into the feed channel 10.

[0059] In some embodiments, the sample aspiration position of the feed channel 10 is located between the loading area 20 and the buffer area 30; the sample rack moved from the loading area 20 to the feed channel 10 moves toward the first direction to the sample aspiration position, and the sample rack taken out of the buffer area 30 and moved into the feed channel 10 by the transfer scheduling mechanism 50 moves toward the direction opposite to the first direction to the sample aspiration position, for example, by the reciprocating feeding mechanism 11 of the feed channel 10, the sample rack moved from the loading area 20 to the feed channel 10 is driven to move toward the first direction to the sample aspiration position, and the sample rack taken out of the buffer area 30 and moved into the feed channel 10 by the transfer scheduling mechanism 50 is driven to move toward the direction opposite to the first direction to the sample aspiration position. In some specific embodiments, please refer to Figure 9 The feed channel 10 includes a first channel opening 10b and a second channel opening 10c. The loading area 20 is located at one end of the first channel opening 10b of the feed channel, and the buffer area 30 is located at one end of the second channel opening 10c of the feed channel 10, so that the loading area 20 moves the sample rack from the first channel opening 10b into the feed channel 10, and the transfer and dispatching mechanism 50 removes the sample rack from the buffer area 30 and moves it into the feed channel 10 from the second channel opening 10c. In some specific embodiments, the transfer and dispatching mechanism 50 is configured to move the sample rack at least along a second direction so that the sample rack can be moved from the buffer area 30 to the feed channel 10, and to move the sample rack at least along a direction opposite to the second direction so that the sample rack can be moved from the feed channel 10 to the buffer area 30. It can be seen that the present application has redesigned the arrangement, function and sample rack entry and exit paths among the feed channel 10, the loading area 20 and the buffer area 30, so that normal samples to be tested enter the feed channel 10 from the loading area 20 and move to the sample aspiration position along the first direction to complete the sample aspiration; while samples that need re-examination and emergency can enter the feed channel 10 from the buffer area 30 and move to the sample aspiration position in the direction opposite to the first direction for sample aspiration. Therefore, samples that need re-examination and emergency enter the sample aspiration position through a completely different path from normal samples to be tested, so that samples that need re-examination and emergency can be processed first, and there is no problem of waiting for other normal samples to be tested on the path to enter the sample aspiration position, and thus there is no problem of being excluded or queued together with normal samples to be tested.

[0060] There are many implementation structures of the transfer dispatching mechanism 50. For example, in some embodiments, please refer to Figure 10 The transfer and scheduling mechanism 50 includes a motor 51 and a test tube rack holder 52. The test tube rack holder 52 is configured to carry a sample rack whose length is along a first direction. The motor 51 is capable of driving the test tube rack holder 52 to move in directions that are both the same as and opposite to a second direction, thereby driving the sample rack carried by the test tube rack holder 52 to move in directions that are both the same as and opposite to the second direction. In some embodiments, the transfer and scheduling mechanism 50 also includes a test tube rack transfer mechanism 53, which is configured to move a sample rack whose length is along the first direction into or out of the test tube rack holder 52 in a direction that is both the same as and opposite to the first direction. In some embodiments, the transfer and scheduling mechanism 50 also includes a first test tube rack presence detection mechanism 54 and / or a second test tube rack presence detection mechanism 55. The first test tube rack presence detection mechanism 54 is configured to detect whether the test tube rack holder 52 is carrying a sample rack. The second test tube rack presence detection mechanism 55 is configured to detect whether the buffer position aligned with the test tube rack holder 52 is carrying a sample rack.

[0061] The above is some description about the transit dispatching mechanism 50.

[0062] Please refer to Figure 11 The automatic sampling device of some embodiments of the present application further includes an unloading channel 60 and an unloading area 70.

[0063] The unloading channel 60 is arranged along a first direction and is used to carry sample racks whose lengths are oriented along the first direction, and to allow the sample racks to be moved from the unloading channel 60 into the unloading area 70 in a direction opposite to the second direction. In some embodiments, the unloading channel 60 is aligned with the feed channel 10. Specifically, in some embodiments, the transfer scheduling mechanism 50 is used to move sample racks in the buffer area 30 whose test results indicate that samples do not require retesting, at least along the second direction, so that they can be moved from the buffer area 30 into the unloading channel 60.

[0064] The unloading area 70 is used to carry sample racks with their lengths along the first direction and to allow the sample racks to move in a direction opposite to the second direction. In some examples, users can remove sample racks that have been tested or are to be recycled from the unloading area 70 .

[0065] It can be seen that the sample rack carrying the samples to be tested enters the feed channel 10 from the loading area 20 and does not need to be dispatched by the transfer scheduling mechanism 50; the transfer scheduling mechanism 50 is mainly responsible for dispatching the sample rack carrying the re-examination samples and the sample rack carrying the emergency samples in the buffer area 30 to the feed channel 10, and dispatching the sample racks that have been tested or are to be recovered to the unloading channel 60; functionally speaking, the scheduling of the aspiration of samples that need to be tested when entering the system for the first time is distinguished from the scheduling of special functions, namely the scheduling of emergency, re-examination and unloading. The scheduling of aspiration is realized by the relevant mechanisms on the loading area 20 and the feed channel 10, and the scheduling of emergency, re-examination and unloading is carried out by the transfer scheduling mechanism 50, with clear division of labor, high efficiency in coordinating, processing and realizing the scheduling process in the entire testing process.

[0066] In some embodiments, the unloading area 70, the buffer area 30, and the loading area 20 are all located on the same side of the feed channel 10, for example, below the feed channel 10 in the figure. In some embodiments, the loading area 20, the buffer area 30, and the unloading area 70 are arranged sequentially along the first direction.

[0067] The above is a description of the automatic sampling device of some embodiments of the present application.

[0068] The automatic sample feeder is used to supply sample racks containing samples to analytical equipment. Figure 12 In some embodiments of the present application, a sample analysis system is disclosed, comprising an automatic sampler 1 and an analysis device 2. The automatic sampler 1 can be any of the embodiments disclosed herein. The analysis device 2 is used to draw a sample from a sample rack supplied by the automatic sampler 1 and perform analysis. The automatic sampler 1 is disposed on one side of the analysis device 2, with its first direction aligned with the length of the analysis device 2. This arrangement allows the length of the final system (i.e., the length in the first direction) to remain unchanged, while the longitudinal depth (i.e., the length in the second direction) does not increase significantly due to the addition of the automatic sampler. This greatly facilitates the placement of the final system in a room and effectively utilizes space in the department. Specifically, the loading area 20 and the buffer area 30 are located on a first side of the feed channel 10—e.g., at the bottom in the figure. If the automatic sampler 1 also includes an unloading area 70, the loading area 20, buffer area 30, and unloading area 70 are located on the first side of the feed channel 10—e.g., at the bottom in the figure. The analysis device 2 is located on a second side of the automatic sampler 1, opposite the first side—e.g., at the top in the figure.

[0069] The following describes the process of how the automatic sampling device supplies sample racks to the analysis equipment.

[0070] Let's take Figure 8 、 Figure 11 or Figure 12 Taking this as an example, the first direction is the positive direction of the X-axis, the direction opposite to the first direction is the negative direction of the X-axis, the second direction is the positive direction of the Y-axis, and the direction opposite to the second direction is the negative direction of the Y-axis.

[0071] The sample rack carrying samples to be tested in the loading area 20 moves in the second direction to enter the feed channel 10, then moves along the first direction on the feed channel 10 to pass through the sample aspiration position. The analytical device aspirates the samples at the sample aspiration position. After all samples on the sample rack have been aspirated, the sample rack continues along the first direction through the feed channel 10 to enter the transfer and scheduling mechanism 50. After receiving the sample rack, the transfer and scheduling mechanism drives the sample rack in a direction opposite to the second direction and stops at an empty buffer position 31. If the empty buffer position 31 is in the buffer area 30 on the left in the figure, the sample rack moves in the first direction to enter the left buffer area 30. If the empty buffer position 31 is in the buffer area 30 on the right in the figure, the sample rack moves in the direction opposite to the first direction to enter the right buffer area 30. The purpose of the sample rack entering the buffer area 30 is to wait for the test results of the samples it carries.

[0072] When the test result of the sample indicates that the sample needs to be retested, the corresponding sample rack in the buffer area 30 is moved out of the buffer area 30 and moved into the feed channel 10 - specifically, the transfer scheduling mechanism 50 moves and aligns with the buffer position 31 where the sample rack is located. If the sample rack is located in the buffer area 30 on the left side of the figure, the sample rack moves in the direction opposite to the first direction to enter the transfer scheduling mechanism 50. If the sample rack is located in the buffer area 30 on the right side of the figure, the sample rack moves in the first direction to enter the transfer scheduling mechanism 50; after the transfer scheduling mechanism 50 receives the sample rack, it moves in the second direction to align with the feed channel 10, and then the sample rack moves in the direction opposite to the first direction to enter the feed channel 10 so that the sample to be retested passes through the sample aspiration position, so that the sample to be retested is aspirated by the analysis device. After all the samples to be retested on the sample rack have been aspirated, the sample rack moves from the feed channel 10 to the transfer position along the first direction. The scheduling mechanism 50, the transfer scheduling mechanism 50 moves in the direction opposite to the second direction to schedule the sample rack back to the buffer area 30. Of course, in some test modes, the sample only needs to be retested once, that is, after the sample is aspirated for the first time, it waits for the test result in the buffer area. If the test result indicates that retesting is required, the sample is retested. After that, the sample does not need to wait for the test result of the retest, but is directly dispatched, for example, to the unloading area. In this mode, after all the samples to be retested on the sample rack are aspirated, the sample rack enters the transfer scheduling mechanism 50 from the feeding channel 10 along the first direction, and then continues to enter the unloading channel 60 from the transfer scheduling mechanism 50 along the first direction, and finally enters the unloading area 70 in the direction opposite to the second direction through the unloading channel 60 - in this process, the sample rack may need to move a distance in the first direction along the unloading channel 60, and then enter the unloading area 70 in the direction opposite to the second direction.

[0073] When the test results of all samples on a sample rack in the buffer area 30 indicate that the corresponding samples do not need to be retested, the corresponding sample rack in the buffer area 30 is moved out of the buffer area 30 and finally moved into the unloading area 70 - the transfer scheduling mechanism 50 moves and aligns with the buffer position 31 where the sample rack is located. If the sample rack is located in the buffer area 30 on the left side of the figure, the sample rack moves in the direction opposite to the first direction to enter the transfer scheduling mechanism 50. If the sample rack is located in the buffer area 30 on the right side of the figure, the sample rack moves in the first direction to enter the transfer scheduling mechanism 50; after the transfer scheduling mechanism 50 receives the sample rack, it moves in the second direction to face the unloading channel 60. The sample rack enters the unloading channel 60 from the transfer scheduling mechanism 50 along the first direction, and finally enters the unloading area 70 in the direction opposite to the second direction through the unloading channel 60 - during this process, the sample rack may need to move a distance in the first direction along the unloading channel 60, and then enter the unloading area 70 in the direction opposite to the second direction.

[0074] The scheduling and testing process of the sample rack carrying the emergency sample is similar. After the user places the sample rack in the emergency area 40, the sample rack moves from the emergency area 40 to the first direction to enter the cache area 30 connected thereto; of course, for an embodiment in which the emergency area 40 is set within the cache area 30, for example, a cache position 31 in the cache area 30 is set as the emergency position 41, then the sample rack carrying the emergency sample itself is already located in the cache area 30. The sample rack is then moved out of the buffer area 30 and into the feed channel 10. Specifically, the transfer and scheduling mechanism 50 moves and aligns with the buffer position 31 where the sample rack is located. The figure shows that the sample rack is located in the buffer area 30 on the right side of the figure, so the sample rack moves in the first direction to enter the transfer and scheduling mechanism 50. After the transfer and scheduling mechanism 50 receives the sample rack, it moves in the second direction to align with the feed channel 10. Then, the sample rack moves in the direction opposite to the first direction to enter the feed channel 10 so that each sample passes through the sample aspiration position one by one, so that each sample on the sample rack is aspirated by the analysis device. After all samples on the sample rack are aspirated, the sample rack enters the feed channel 10 from the first direction to the transfer and scheduling mechanism 50. The transfer and scheduling mechanism 50 then moves in the direction opposite to the second direction to dispatch the sample rack back to the buffer area 30. The purpose of the sample rack entering the buffer area 30 at this time is to wait for the test results of the samples it carries. When the test results of a sample on the sample rack carrying the emergency sample indicate that the sample needs to be re-examined, the sample rack needs to go to the feed channel 10 again to re-examine the corresponding sample - the specific scheduling process can be found in the above and will not be repeated here; similarly, when the test results of all samples on the sample rack carrying the emergency sample indicate that the corresponding samples do not need to be re-examined, the sample rack is moved out of the buffer area 30 and finally moved into the unloading area 70 - the specific scheduling process can be found in the above and will not be repeated here.

[0075] In some embodiments of the present application, a method for automatic sampling control is also disclosed, which can be applied to the automatic sampling device disclosed in any embodiment of this document.

[0076] Please refer to Figure 13 In some embodiments, the method for automatic injection control comprises the following steps:

[0077] Step 100 , ie, the sample rack placement step, controls the sample rack to be moved from the loading area 20 to the feeding channel 10 along the second direction.

[0078] Step 120 , ie, the sample rack feeding step, controls the sample rack to move along the feeding channel 10 in a first direction to a sample aspirating position on the feeding channel 10 for sample aspirating.

[0079] Step 140, i.e., the sample rack caching step, controls the transfer scheduling mechanism 50 to move the sample rack that has completed sample aspiration and has been removed from the feed channel 10 to the cache area 30 in a direction opposite to the second direction, and drives the sample rack to move into the cache area 30 in a direction that is the same as or opposite to the first direction to wait for the test results.

[0080] Let's take Figure 8 、 Figure 11 or Figure 12 For example, after all samples on the sample rack have been aspirated, the sample rack continues along the first direction and enters the transfer and dispatching mechanism 50 through the feed channel 10. After receiving the sample rack, the transfer and dispatching mechanism drives the sample rack in a direction opposite to the second direction and stops at an empty buffer position 31. If the empty buffer position 31 is in the buffer area 30 on the left in the figure, the sample rack moves in the first direction to enter the left buffer area 30. If the empty buffer position 31 is in the buffer area 30 on the right in the figure, the sample rack moves in a direction opposite to the first direction to enter the right buffer area 30. The purpose of the sample rack entering the buffer area 30 is to wait for the test results of the samples it carries.

[0081] Step 150, i.e., the re-examination step, controls the transfer scheduling mechanism to remove the sample rack corresponding to the re-examination instruction from the buffer area in a direction opposite to or the same as the first direction, and then dispatch it to the feed channel along a second direction, so that it can be moved along the feed channel in a direction opposite to the first direction to the sample aspiration position for sample aspiration. It should be noted that the re-examination instruction can be automatically generated by the sample analysis system, analysis equipment, or automatic sampling device when it determines that a sample needs to be re-examined, or it can be issued by the user via a mouse or keyboard, for example, after the user sees the test results on the display interface, manually designates a sample on a sample rack for re-examination.

[0082] Let's take Figure 8 、 Figure 11 or Figure 12For example, when the test result of the sample indicates that the sample needs to be retested, the corresponding sample rack in the buffer area 30 is moved out of the buffer area 30 and moved into the feed channel 10 - specifically, the transfer scheduling mechanism 50 moves and aligns with the buffer position 31 where the sample rack is located. If the sample rack is located in the buffer area 30 on the left side of the figure, the sample rack moves in a direction opposite to the first direction to enter the transfer scheduling mechanism 50. If the sample rack is located in the buffer area 30 on the right side of the figure, the sample rack moves in the first direction to enter the transfer scheduling mechanism 50. After the transfer scheduling mechanism 50 receives the sample rack, it moves in the second direction to align with the feed channel 10, and then the sample rack moves in the direction opposite to the first direction to enter the feed channel 10 so that the sample to be retested passes through the sample aspiration position, so that the sample to be retested is aspirated by the analysis device. After all samples to be retested on the sample rack have been aspirated, the sample rack is moved from the feed channel 10 along the first direction to the transfer and dispatch mechanism 50. The transfer and dispatch mechanism 50 then moves in a direction opposite to the second direction to dispatch the sample rack back to the buffer area 30. Of course, in some test modes, the sample only needs to be retested once. That is, after the sample is aspirated for the first time, it waits for the test result in the buffer area. If the test result indicates that retesting is required, the sample is retested. Thereafter, the sample does not need to wait for the retest result and is directly dispatched, for example, to the unloading area. In this mode, after all samples to be retested on the sample rack have been aspirated, the sample rack is moved from the feed channel 10 along the first direction to the transfer and dispatch mechanism 50, and then continues to move from the transfer and dispatch mechanism 50 along the first direction to the unloading channel 60. Finally, it passes through the unloading channel 60 in a direction opposite to the second direction to enter the unloading area 70. During this process, the sample rack may need to move a distance in the first direction along the unloading channel 60 and then enter the unloading area 70 in a direction opposite to the second direction.

[0083] In some cases, when a sample rack needs to enter the feed channel 10 from the buffer area 30 for re-inspection, there may already be a sample rack on the feed channel 10. At this time, some avoidance strategies need to be adopted to deal with this more complicated situation.

[0084] In some embodiments, the retesting step 150 may include: when the test result of a sample indicates that the sample needs to be retested, controlling the sample rack located in the sample aspiration position to be moved out along the feed channel. This means that if a sample rack is currently present on the feed channel 10 and the sample on the sample rack is located at the sample aspiration position, then the sample on the sample rack being loaded can be completely aspirated, and then controlling the transfer scheduling mechanism 50 to dispatch the sample rack to the buffer area 30 to await the test result. Thereafter, the transfer scheduling mechanism 50 is controlled to remove the sample rack corresponding to the retest instruction from the buffer area in a direction that is the same as or opposite to the first direction, and then dispatch it to the feed channel in a direction opposite to the second direction, so that it can be moved along the feed channel in a direction opposite to the first direction to the sample aspiration position for sample aspiration.

[0085] In some embodiments, the re-examination step 150 may include: when the test result of the sample indicates that the sample needs to be re-examined, controlling the sample rack located in the sample aspiration position to move out along the feed channel in a direction opposite to the first direction - this means that there is a sample rack on the feed channel 10 at this time, and the sample on the sample rack is located at the sample aspiration position, then the sample rack can be moved in a direction opposite to the first direction to make way for the sample aspiration position; then controlling the transfer scheduling mechanism 50 to take out the sample rack corresponding to the re-examination instruction in the buffer area in a direction that is the same as or opposite to the first direction, and then dispatch it to the feed channel in a direction opposite to the second direction, so as to move it along the feed channel in a direction opposite to the first direction to the sample aspiration position for sampling.

[0086] As can be seen, the avoidance strategy is implemented by controlling the movement of the sample rack on the feed channel to avoid the sample rack. Therefore, in some embodiments, the rechecking step 150 may include: when it is determined that the sample rack exists in the feed channel, controlling the movement of the sample rack on the feed channel to avoid the sample rack.

[0087] In some specific embodiments, the issue can be addressed from the perspective of whether there is currently one sample rack or multiple sample racks on the feed channel 10. In some embodiments, controlling the movement of the sample rack on the feed channel to avoid the sample rack includes: when it is determined that there is only one sample rack on the feed channel 10, controlling the sample rack to move on the feed channel to avoid the sample rack. For example, the sample rack may be first controlled to move to the sample aspiration position to complete aspiration of all samples on the sample rack, and then the sample rack may be controlled to move on the feed channel to avoid the sample rack - for example, controlling the transfer scheduling mechanism 50 to schedule the sample rack that has completed aspiration to the buffer area 30 to await test results, or controlling the sample rack to move in a direction opposite to the first direction to clear the sample aspiration position. In some embodiments, the above-mentioned control of the movement of the sample racks on the feed channel for avoidance includes: when it is determined that there are multiple sample racks on the feed channel 10, controlling the sample rack closest to the sample aspiration position to move to the sample aspiration position so that all samples on the sample rack are aspirated, and then controlling the sample rack that has completed the aspiration to move out of the feed channel - for example, controlling the transfer scheduling mechanism 50 to schedule the sample rack that has completed the aspiration to the buffer area 30 to wait for the test results, and controlling other sample racks on the feed channel to move on the feed channel for avoidance - for example, controlling these other sample racks to move on the feed channel 10 in a direction opposite to the first direction to make way for the sample aspiration position, and even controlling the sample rack to re-enter the loading area 20.

[0088] In some specific embodiments, the issue can also be addressed from the perspective of whether the feed channel 10 is fully loaded. In some embodiments, controlling the movement of sample racks on the feed channel for avoidance includes: When determining that the feed channel 10 is not fully loaded, controlling each sample rack to move on the feed channel 10 for avoidance—for example, controlling each sample rack to move on the feed channel 10 in a direction opposite to the first direction to clear the sample aspiration position, or even controlling the sample rack to re-enter the loading area 20. In some embodiments, the above-mentioned control of the movement of the sample racks on the feed channel for avoidance includes: when it is determined that the feed channel is full, controlling the sample rack closest to the sample aspiration position to move to the sample aspiration position so that all samples on the sample rack are aspirated, and then controlling the sample rack that has completed sampling to move out of the feed channel - for example, controlling the transfer scheduling mechanism 50 to schedule the sample rack that has completed sampling to the buffer area 30 to wait for test results, and controlling other sample racks on the feed channel to move on the feed channel for avoidance - for example, controlling these other sample racks to move on the feed channel 10 in a direction opposite to the first direction to make way for the sample aspiration position, and even controlling the sample rack to re-enter the loading area 20.

[0089] Through the above avoidance strategies and specific methods, samples that need to be retested can be given priority as much as possible, so that the final sample result time meets the requirements of the department.

[0090] Please refer to Figure 14In some embodiments, the method for automatic injection control comprises the following steps:

[0091] Step 100 , ie, the sample rack placement step, controls the sample rack to be moved from the loading area 20 to the feeding channel 10 along the second direction.

[0092] Step 120 , ie, the sample rack feeding step, controls the sample rack to move along the feeding channel 10 in a first direction to a sample aspirating position on the feeding channel 10 for sample aspirating.

[0093] Step 140, i.e., the sample rack caching step, controls the transfer scheduling mechanism 50 to move the sample rack that has completed sample aspiration and is removed from the feed channel 10 to the cache area 30 in a direction opposite to the second direction, and drives the sample rack to move into the cache area 30 in a direction that is the same as or opposite to the first direction.

[0094] Step 160, i.e., the emergency step, responds to the emergency instruction input by the user, controls the transfer scheduling mechanism to move the sample rack out of the buffer area 30 in the same direction or opposite to the first direction and moves it to the feed channel 10 in the second direction, so that the sample rack moves along the feed channel 10 in the direction opposite to the first direction to the sample aspiration position for sample aspiration.

[0095] In some examples, the emergency area 40 is an area connected to the buffer area 30, and the emergency step 160 further includes: in response to an emergency instruction input by the user, controlling the sample rack located in the emergency area 40 to move from the emergency area 40 to the connected buffer area 30 in a direction that is the same as or opposite to the first direction. Specifically, step 160 includes a first emergency step, that is, in response to the emergency instruction input by the user, controlling the sample rack located in the emergency area 40 to move from the emergency area 40 to the connected buffer area 30 in a direction that is the same as or opposite to the first direction; controlling the sample rack to move out of the buffer area 30 from the buffer area 30 in a direction that is the same as or opposite to the first direction; controlling the sample rack that has been moved out of the buffer area 30 to move in a second direction; and controlling the sample rack to move into the feed channel 10 and move along the feed channel 10 in a direction opposite to the first direction to the sample aspiration position for aspirating the sample.

[0096] In some examples, an emergency area 40 is provided in the buffer area 30, or a buffer position 31 is set as an emergency position 41. Then, in response to the emergency instruction input by the user, the emergency step 160 directly controls the sample rack in the emergency position 41 in the buffer area 30 to move out of the buffer area 30 in a direction that is the same as or opposite to the first direction and move to the feed channel 10 in a second direction. Specifically, step 160 includes a second emergency step, namely, in response to the emergency instruction input by the user, controlling the sample rack in the emergency position 41 in the buffer area 40 to move out of the buffer area 30 in a direction that is the same as or opposite to the first direction; controlling the sample rack that has been moved out of the buffer area 30 to move in the second direction; and controlling the sample rack to move into the feed channel 10 and move along the feed channel in a direction opposite to the first direction to the sample aspiration position for aspiration.

[0097] In some cases, when a sample rack carrying emergency samples needs to enter the feed channel 10 from the buffer area 30 for testing, there may already be a sample rack on the feed channel 10. At this time, some avoidance strategies need to be adopted to deal with this more complicated situation.

[0098] In some embodiments, the emergency step 160 further includes: when it is determined that there is a sample rack in the feeding channel 10, controlling the sample rack on the feeding channel to move to avoid it.

[0099] In some specific embodiments, the issue can be addressed from the perspective of whether there is currently one sample rack or multiple sample racks on the feed channel 10. In some embodiments, controlling the movement of the sample rack on the feed channel to avoid the sample rack includes: when it is determined that there is only one sample rack on the feed channel 10, controlling the sample rack to move on the feed channel to avoid the sample rack. For example, the sample rack may be first controlled to move to the sample aspiration position to complete aspiration of all samples on the sample rack, and then the sample rack may be controlled to move on the feed channel to avoid the sample rack - for example, controlling the transfer scheduling mechanism 50 to schedule the sample rack that has completed aspiration to the buffer area 30 to await test results, or controlling the sample rack to move in a direction opposite to the first direction to clear the sample aspiration position. In some embodiments, the above-mentioned control of the movement of the sample racks on the feed channel for avoidance includes: when it is determined that there are multiple sample racks on the feed channel 10, controlling the sample rack closest to the sample aspiration position to move to the sample aspiration position so that all samples on the sample rack are aspirated, and then controlling the sample rack that has completed the aspiration to move out of the feed channel - for example, controlling the transfer scheduling mechanism 50 to schedule the sample rack that has completed the aspiration to the buffer area 30 to wait for the test results, and controlling other sample racks on the feed channel to move on the feed channel for avoidance - for example, controlling these other sample racks to move on the feed channel 10 in a direction opposite to the first direction to make way for the sample aspiration position, and even controlling the sample rack to re-enter the loading area 20.

[0100] In some specific embodiments, the issue can also be addressed from the perspective of whether the feed channel 10 is fully loaded. In some embodiments, controlling the movement of sample racks on the feed channel for avoidance includes: When determining that the feed channel 10 is not fully loaded, controlling each sample rack to move on the feed channel 10 for avoidance—for example, controlling each sample rack to move on the feed channel 10 in a direction opposite to the first direction to clear the sample aspiration position, or even controlling the sample rack to re-enter the loading area 20. In some embodiments, the above-mentioned control of the movement of the sample racks on the feed channel for avoidance includes: when it is determined that the feed channel is full, controlling the sample rack closest to the sample aspiration position to move to the sample aspiration position so that all samples on the sample rack are aspirated, and then controlling the sample rack that has completed sampling to move out of the feed channel - for example, controlling the transfer scheduling mechanism 50 to schedule the sample rack that has completed sampling to the buffer area 30 to wait for test results, and controlling other sample racks on the feed channel to move on the feed channel for avoidance - for example, controlling these other sample racks to move on the feed channel 10 in a direction opposite to the first direction to make way for the sample aspiration position, and even controlling the sample rack to re-enter the loading area 20.

[0101] Through the above avoidance strategies and specific methods, samples requiring emergency treatment can be given priority as much as possible, so as to meet the sample result time requirements required by emergency samples.

[0102] After all samples on the emergency sample racks have been aspirated, the sample racks that have completed aspiration at the aspiration station are controlled to move out of the feed channel 10 in the first direction. The transfer scheduling mechanism 50 is then controlled to move the sample racks removed from the feed channel 10 in a second direction opposite to the second direction and then into the buffer area 30 in a direction that is the same as or opposite to the first direction to await test results. If the test results of an emergency sample indicate that the emergency sample requires retesting, a retest step is performed, and the corresponding sample rack is scheduled for retesting. The specific process has been described above and will not be repeated here.

[0103] Please refer to Figure 15 and Figure 16 In some embodiments, the method for automatic sampling control may further include step 170, i.e., an unloading step. When the test results of the samples on the sample rack in the buffer area 30 indicate that the corresponding sample does not need to be retested, the sample rack is controlled to be moved out of the buffer area 30 in a direction that is the same as or opposite to the first direction, and the sample rack moved out of the buffer area 30 is controlled to be moved in a direction that is the same as the second direction. The sample rack is then controlled to move into the unloading channel 60 and move from the unloading channel 60 into the unloading area 70 in a direction opposite to the second direction. During this process, the sample rack may need to move a distance in the first direction along the unloading channel 60 and then enter the unloading area 70 in a direction opposite to the second direction.

[0104] The above is the sample analysis system, analysis equipment, automatic sampling device, and method for dynamic sampling control disclosed in this application. The sample analysis system, analysis equipment, and automatic sampling device of this application have a compact structure and can implement routine sampling, rapid emergency sampling, and rapid retesting. The automatic sampling device can be independent of the analysis equipment and can be removed when the analysis equipment needs to be integrated into the production line system. In addition, when the analysis equipment needs to test a larger number of samples than the designed capacity, an external expansion module can be added. The expansion module transports the sample racks carrying the samples to be tested to the loading area 20 via a track. After the test is completed, the sample racks in the unloading area 70 can be transferred out via the track. In addition, the automatic sampling device can also supply samples to multiple analysis equipment by providing multiple supply channels 10 in the first direction, as well as a buffer area 30 and a transfer scheduling mechanism 50 corresponding to each supply channel 10 (each supply channel 10 supplies samples to a single analysis equipment), thereby achieving cascade connection of multiple analysis equipment.

[0105] This document is described with reference to various exemplary embodiments. However, those skilled in the art will recognize that changes and modifications may be made to the exemplary embodiments without departing from the scope of this document. For example, the various operational steps and components used to perform the operational steps may be implemented in different ways (e.g., one or more steps may be deleted, modified, or incorporated into other steps) depending on the specific application or any number of cost functions associated with the operation of the system.

[0106] The above embodiments may be implemented in whole or in part through software, hardware, firmware, or any combination thereof. Furthermore, as will be appreciated by those skilled in the art, the principles herein may be embodied in a computer program product on a computer-readable storage medium pre-installed with computer-readable program code. Any tangible, non-transitory computer-readable storage medium may be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD-ROMs, DVDs, Blu-ray discs, etc.), flash memory, and / or the like. These computer program instructions may be loaded onto a general-purpose computer, a special-purpose computer, or other programmable data processing device to form a machine, such that the instructions executed on the computer or other programmable data processing device generate a device that implements a specified function. These computer program instructions may also be stored in a computer-readable memory, which may instruct the computer or other programmable data processing device to operate in a specific manner, such that the instructions stored in the computer-readable memory may form an article of manufacture including a device that implements a specified function. The computer program instructions may also be loaded onto a computer or other programmable data processing device to execute a series of operational steps on the computer or other programmable device to generate a computer-implemented process, such that the instructions executed on the computer or other programmable device provide the steps for implementing the specified function.

[0107] Although the principles of this invention have been shown in various embodiments, many modifications of structure, arrangement, proportion, elements, materials and components that are particularly suitable for specific environments and operational requirements can be used without departing from the principles and scope of this invention. The above modifications and other changes or amendments are intended to be included within the scope of this invention.

[0108] The foregoing detailed description has been described with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes can be made without departing from the scope of this disclosure. Therefore, the present disclosure will be considered in an illustrative rather than a restrictive sense, and all such modifications will be included within its scope. Similarly, the advantages, other advantages and solutions to the problems of the various embodiments have been described above. However, the benefits, advantages, solutions to the problems and any elements that can produce these, or make them more specific, should not be interpreted as critical, required or necessary. The term "comprising" and any other variants used in this article are all non-exclusive inclusions, so that a process, method, article or device that includes a list of elements includes not only these elements, but also other elements that are not explicitly listed or do not belong to the process, method, system, article or device. In addition, the term "coupled" and any other variants used in this article refer to physical connections, electrical connections, magnetic connections, optical connections, communication connections, functional connections and / or any other connections.

[0109] Those skilled in the art will recognize that many changes can be made to the details of the above embodiments without departing from the basic principles of the invention. Therefore, the scope of the present invention should be determined solely by the claims.

Claims

1. An automatic sampling device, characterized in that include: A feed channel is provided along a first direction for carrying a sample rack and allowing the sample rack to move along the feed channel along its length; the feed channel is further provided with a sample aspirating position for aspirating the sample on the sample rack when the sample on the sample rack is located at the sample aspirating position of the feed channel; a loading area, the loading area being in communication with the feed channel and being used to carry a sample rack having a length direction along the first direction, and for allowing the sample rack to move into the feed channel along the second direction and then be moved to a sample aspiration position along the first direction; a buffer area, the buffer area being used to carry a sample rack having a length direction along the first direction and allowing the sample rack to move out of and into the buffer area along the first direction; An emergency area, the emergency area being used for placing sample racks by users; the emergency area being connected to the buffer area, being used to carry sample racks whose lengths are placed along the first direction, and allowing sample racks to be moved from the emergency area to the connected buffer area in a direction that is the same as or opposite to the first direction; or the emergency area being disposed within the buffer area; A transfer scheduling mechanism, used for scheduling the sample rack between the buffer area and the feeding channel; Wherein, the sample suction position is located between the loading area and the buffer area; When an emergency instruction input by a user is received, the transfer dispatch mechanism takes out a sample rack corresponding to the emergency instruction from the buffer area and moves it into the feed channel. The sample rack is moved in the feed channel in a direction opposite to the first direction to the sample aspiration position so that the sample on the sample rack is aspirated; The transfer scheduling mechanism moves the sample rack that has completed sample aspiration out of the feed channel and into the buffer area to wait for the test result of the sample; when the test result of the sample indicates that the sample needs to be retested, the transfer scheduling mechanism takes out the sample rack that needs to be retested from the buffer area and moves it into the feed channel, and the sample rack is moved in the feed channel in a direction opposite to the first direction to the sample aspiration position so that the sample on the sample rack can be aspirated.

2. The automatic sample injection device according to claim 1, wherein The loading area and the buffer area are on the same side of the feed channel.

3. The automatic sample injection device according to claim 1 or 2, characterized in that: The feed channel is provided with a reciprocating feeding mechanism to drive the sample rack moved from the loading area into the feed channel to move toward the first direction to the sample aspiration position, and to drive the sample rack taken out of the buffer area and moved into the feed channel by the transfer scheduling mechanism to move toward the direction opposite to the first direction to the sample aspiration position.

4. The automatic sample injection device according to claim 3, wherein The feed channel includes: a first channel opening and a second channel opening, the loading area is located at one end of the first channel opening of the feed channel, and the buffer area is located at one end of the second channel opening of the feed channel, so that the loading area moves the sample rack from the first channel opening into the feed channel, and the transfer scheduling mechanism moves the sample rack out of the buffer area and moves it into the feed channel from the second channel opening.

5. The automatic sample injection device according to claim 1 or 2, characterized in that: The buffer area includes a baffle and several partitions. The arrangement direction of several of the partitions is parallel to the first direction. Several of the partitions are arranged at intervals and along the second direction. A buffer position is formed between two adjacent partitions for carrying the sample rack; the baffle is arranged in a direction parallel to the second direction and is connected to one end of several of the partitions.

6. The automatic sample injection device according to claim 1, wherein It also includes unloading channels and unloading areas; The unloading area is used to carry the sample rack whose length direction is along the first direction, and allows the sample rack to move in a direction opposite to the second direction; The unloading channel is arranged along the first direction, and is used to carry a sample rack whose length direction is along the first direction, and allows the sample rack to move from the unloading channel into the unloading area along a direction opposite to the second direction.

7. The automatic sample injection device according to claim 6, wherein: The unloading area, the buffer area and the loading area are all located on the same side of the feed channel.

8. The automatic sample injection device according to claim 1 or 2, characterized in that: The emergency area is provided with a button, which, when triggered, generates an instruction to test the sample rack in the emergency area.

9. The automatic sample injection device according to claim 1 or 2, characterized in that: The first direction is perpendicular to the second direction.

10. A sample analysis system, characterized in that: include: An automatic sampling device, and an analytical device for drawing a sample from a sample rack supplied by the automatic sampling device and performing analysis, wherein the automatic sampling device comprises: A feed channel is provided along a first direction, and is used to carry a sample rack having a length direction along the first direction, and to allow the sample rack to move within the feed channel; the feed channel is further provided with a sample aspirating position, and is used to aspirate the sample on the sample rack when the sample on the sample rack is located at the sample aspirating position of the feed channel; a loading area, the loading area being in communication with the feed channel and being used to carry a sample rack having a length direction along the first direction and to allow the sample rack to move into the feed channel along the second direction; a buffer area, the buffer area being used to carry a sample rack having a length direction along the first direction and allowing the sample rack to move out of and into the buffer area along the first direction; An emergency area, the emergency area being used for placing sample racks by users; the emergency area being connected to the buffer area, being used to carry sample racks whose lengths are placed along the first direction, and allowing sample racks to be moved from the emergency area to the connected buffer area in a direction that is the same as or opposite to the first direction; or the emergency area being disposed within the buffer area; A transfer scheduling mechanism, used for scheduling the sample rack between the buffer area and the feeding channel; The sample suction position is located between the loading area and the buffer area. When an emergency instruction input by a user is received, the transfer dispatch mechanism takes out a sample rack corresponding to the emergency instruction from the buffer area and moves it into the feed channel. The sample rack is moved in the feed channel in a direction opposite to the first direction to the sample aspiration position so that the sample on the sample rack is aspirated; The transfer scheduling mechanism moves the sample rack that has completed sample aspiration out of the feed channel and into the buffer area to wait for the sample test result; when the sample test result indicates that the sample needs to be retested, the transfer scheduling mechanism takes out the sample rack that needs to be retested from the buffer area and moves it into the feed channel, and the sample rack is moved in the feed channel in a direction opposite to the first direction to the sample aspiration position so that the sample on the sample rack is aspirated; The automatic sampling device is arranged on one side of the analysis equipment, and the first direction is consistent with the length direction of the analysis system; the loading area and the buffer area are located on the first side of the feed channel, and the analysis equipment is located on the second side of the automatic sampling device opposite to the first side.

11. The sample analysis system according to claim 10, wherein: The feed channel is provided with a reciprocating feeding mechanism to drive the sample rack moved from the loading area into the feed channel to move toward the first direction to the sample aspiration position, and to drive the sample rack taken out of the buffer area and moved into the feed channel by the transfer scheduling mechanism to move toward the direction opposite to the first direction to the sample aspiration position.

12. The sample analysis system according to claim 11, wherein: The feed channel includes: a first channel opening and a second channel opening, the loading area is located at one end of the first channel opening of the feed channel, and the buffer area is located at one end of the second channel opening of the feed channel, so that the loading area moves the sample rack from the first channel opening into the feed channel, and the transfer scheduling mechanism moves the sample rack out of the buffer area and moves it into the feed channel from the second channel opening.

13. The sample analysis system according to any one of claims 10 to 12, wherein: The automatic sample injection device further includes an unloading channel and an unloading area; The unloading area is used to carry the sample rack whose length direction is along the first direction, and allows the sample rack to move in a direction opposite to the second direction; The unloading channel is arranged along a first direction, and is used to carry a sample rack with a length direction along the first direction, and allows the sample rack to move from the unloading channel into the unloading area along a direction opposite to the second direction.

14. The sample analysis system according to claim 13, wherein: The unloading area, the buffer area and the loading area are all located on the same side of the feed channel.

15. A method for automatic sample injection control, characterized in that: include: Sample rack placing step: controlling the sample rack to move from the loading area to the feeding channel along the second direction; Sample rack feeding step: controlling the sample rack to move along the feeding channel in a first direction to a sample aspirating position on the feeding channel for aspirating the sample; Sample rack caching step: controlling the transfer scheduling mechanism to move the sample rack that has been removed from the feed channel after sample aspiration to the cache area in a direction opposite to the second direction; Emergency step: in response to an emergency instruction input by a user, controlling the transfer dispatch mechanism to move the sample rack corresponding to the emergency instruction out of the buffer area along a direction that is the same as or opposite to the first direction and move it along a second direction to the feed channel, so that the sample rack moves along the feed channel in a direction opposite to the first direction to the sample aspiration position for aspiration so that the sample on the sample rack is aspirated; The transfer scheduling mechanism moves the sample rack that has completed sample aspiration out of the feed channel and into the buffer area to wait for the test result of the sample; when the test result of the sample indicates that the sample needs to be retested, the transfer scheduling mechanism takes out the sample rack that needs to be retested from the buffer area and moves it into the feed channel, and the sample rack is moved in the feed channel in a direction opposite to the first direction to the sample aspiration position so that the sample on the sample rack can be aspirated.

16. The method according to claim 15, wherein The emergency steps also include: In response to an emergency instruction input by a user, the sample rack located in the emergency area is controlled to move from the emergency area into the connected buffer area along a direction that is the same as or opposite to the first direction.

17. The method according to claim 16, wherein The emergency steps also include: When it is determined that there is a sample rack in the feeding channel, the sample rack on the feeding channel is controlled to move to avoid it.

18. The method according to any one of claims 15 to 17, characterized in that The method also includes a retesting step: when it is determined that there are samples on the sample rack in the buffer area that need to be retested, controlling the retest scheduling; the controlling the retest scheduling includes: Controlling the transfer scheduling mechanism to move the sample rack out of the buffer area along a direction that is the same as or opposite to the first direction; The sample rack moved out of the buffer area is controlled to move along the second direction so that the sample rack moves into the feed channel and is moved along the feed channel in a direction opposite to the first direction to the sample aspirating position for sample aspirating.

19. The method according to claim 18, wherein The control for retest scheduling further includes: When it is determined that there is a sample rack in the feeding channel, the sample rack on the feeding channel is controlled to move to avoid it.

20. The method according to claim 17 or 19, wherein: The controlling the movement of the sample rack on the feeding channel to avoid the movement comprises: When it is determined that there is only one sample rack on the feeding channel, the sample rack is controlled to move on the feeding channel to avoid the sample rack.

21. The method according to claim 20, wherein Before controlling the sample rack to move on the feeding channel for avoidance, the sample rack is first controlled to move to the sample aspirating position so that all samples on the sample rack are aspirated.

22. The method according to claim 17 or 19, wherein: The controlling the movement of the sample rack on the feeding channel to avoid the movement comprises: When it is determined that there are multiple sample racks on the feed channel, the sample rack closest to the sample aspiration position is controlled to move to the sample aspiration position so that all samples on the sample rack are aspirated. The sample rack that has completed the aspiration is then controlled to move out of the feed channel, and the other sample racks on the feed channel are controlled to move on the feed channel to avoid it.

23. The method according to claim 17 or 19, wherein: The controlling the movement of the sample rack on the feeding channel to avoid the movement comprises: When it is determined that the feeding channel is not fully loaded, each sample rack is controlled to move on the feeding channel to avoid the load.

24. The method according to claim 17 or 19, wherein: The controlling the movement of the sample rack on the feeding channel to avoid the movement comprises: When the feed channel is judged to be full, the sample rack closest to the sample aspiration position is controlled to move to the sample aspiration position so that all samples on the sample rack are aspirated. Then, the sample rack that has completed the aspiration is controlled to move out of the feed channel, and the other sample racks on the feed channel are controlled to move on the feed channel to avoid it.

25. The method according to any one of claims 15 to 17, characterized in that Also includes: The sample rack after the sample aspiration is controlled to move in a direction opposite to the second direction, and then the sample rack is controlled to move into the buffer area in a direction that is the same as or opposite to the first direction.

26. The method of claim 17, wherein: Controlling the sample rack to move on the feeding channel to avoid includes: controlling the sample rack to move along the feeding channel in a direction opposite to the first direction.

27. The method according to any one of claims 15 to 17, wherein Also includes uninstall steps: When it is determined that there are no samples on the sample rack in the buffer area that need to be retested, the control performs recycling scheduling; the control performs recycling scheduling including: Moving the sample rack out of the buffer area along a direction that is the same as or opposite to the first direction; Controlling the sample rack removed from the buffer area to move along a second direction; The sample rack is controlled to move into the unloading channel, and then moves from the unloading channel into the unloading area in a direction opposite to the second direction.

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