Beacon testing device calibration system

Abstract

The application relates to a calibration system of a position marker test device. The system comprises a signal encoder, a signal recorder and a central controller; the central controller acquires calibration parameters of a device to be calibrated, sequentially determines a target calibration parameter from the calibration parameters, controls the signal encoder to emit a test signal, and determines the output power of the test signal based on a rated power range of the device to be calibrated; the signal recorder receives and measures the test signal, obtains a target measurement value corresponding to the test signal, and sends the target measurement value to the central controller; and the central controller acquires the target measurement value, calibrates the target calibration parameter based on the target measurement value. The method of the application can realize calibration of the position marker test device and improve the calibration efficiency, and can improve the offshore operation efficiency when the position marker test device is put into use.

Description

TECHNICAL FIELD

[0001] The present application relates to the calibration technical field, and in particular to a position marker test equipment calibration system, method, device, computer equipment and storage medium. BACKGROUND

[0002] According to the safety regulations, the units such as warships and fishing vessels for sea operations must be equipped with position markers. The position markers can emit position marker signals and transmit them to the search and rescue center through satellites. The search and rescue center implements emergency rescue according to the received position marker signals. In order to protect the quality and safety of the position markers, the units for sea operations usually configure corresponding position marker test equipment to measure and display the radio frequency information such as the amplitude-frequency characteristics and coding of the position marker signals, so as to monitor and maintain the functions of the position markers.

[0003] Before the position marker test equipment is put into use, it needs to be calibrated. At present, the position marker test equipment is generally calibrated manually, but this method cannot guarantee the accuracy and consistency of the output results of the position marker test equipment, thereby affecting the safety of sea operations. SUMMARY

[0004] Therefore, it is necessary to provide a position marker test equipment calibration system capable of improving the safety of sea operations in view of the above technical problems.

[0005] A position marker test equipment calibration system, the system comprising a signal encoder, a signal recorder and a central controller;

[0006] The central controller obtains each calibration parameter of a to-be-calibrated device, and sequentially determines a target calibration parameter from each calibration parameter. The central controller controls the signal encoder to emit a test signal. The output power of the test signal is determined based on the rated power range of the to-be-calibrated device.

[0007] The signal recorder receives and measures the test signal to obtain a target measurement value corresponding to the test signal, and sends the target measurement value to the central controller.

[0008] The central controller obtains the target measurement value, and calibrates the target calibration parameter based on the target measurement value.

[0009] In one of the embodiments, the central controller further obtains an actual measurement value from the to-be-calibrated device. The actual measurement value is an actual measurement value of the test signal obtained by the to-be-calibrated device receiving and measuring the test signal. The central controller calibrates the target calibration parameter based on the target measurement value and the actual measurement value.

[0010] In one of the embodiments, the target calibration parameter comprises signal frequency stability.

[0011] The central controller controls the signal encoder to transmit the test signal at a first output power for a first preset time duration, the first output power being any one power value within a rated power range of the device to be calibrated.

[0012] In one of the embodiments, the signal recorder receives and measures the test signal to obtain a target signal frequency of the test signal within a second preset time duration, the second preset time duration being less than the first preset time duration, and sends the target signal frequency to the central controller, the target measurement value including the target signal frequency.

[0013] In one of the embodiments, the central controller obtains the target signal frequency, and obtains an actual signal frequency from the device to be calibrated, the actual measurement value including the actual signal frequency, the actual signal frequency being an actual signal frequency of the test signal obtained and measured by the device to be calibrated within the second preset time duration;

[0014] The central controller calculates a signal frequency stability slope of the device to be calibrated according to the target signal frequency and the actual signal frequency, and calibrates the signal frequency stability of the device to be calibrated based on the signal frequency stability slope.

[0015] In one of the embodiments, the target calibration parameter includes pulse power;

[0016] The central controller controls the signal encoder to transmit the test signal at a second output power after determining the signal frequency stability of the device to be calibrated, the second output power being a maximum power value within the rated power range of the device to be calibrated;

[0017] The signal recorder receives and measures the test signal to obtain a target pulse power corresponding to the test signal, and sends the target pulse power to the central controller, the target measurement value including the target pulse power.

[0018] The central controller obtains the target pulse power, and obtains an actual pulse power from the device to be calibrated, the actual measurement value including the actual pulse power, the actual pulse power being an actual pulse power corresponding to the test signal obtained and measured by the device to be calibrated.

[0019] In one of the embodiments, the target calibration parameter includes pulse power;

[0020] The central controller controls the signal encoder to transmit the test signal at a second output power for a third preset time length, the second output power being a maximum power value within a rated power range of the device to be calibrated.

[0021] In one of the embodiments, the signal recorder receives and measures the test signal to obtain a target pulse power of the test signal at a target time point, and sends the target pulse power to the central controller, the target measurement value including the target pulse power.

[0022] The central controller obtains the target pulse power, and obtains an actual pulse power from the device to be calibrated, the actual measurement value including the actual pulse power, the actual pulse power being an actual pulse power of the test signal at the target time point obtained by the device to be calibrated receiving and measuring the test signal.

[0023] In one of the embodiments, the target calibration parameter includes sensitivity, and the system further includes a sea state simulator.

[0024] The central controller controls the signal encoder to transmit the test signal at a third output power after determining that the signal frequency of the device to be calibrated is stable, controls the sea state simulator to receive and process the test signal to obtain a processed test signal, and transmits the processed test signal, the third output power being any one power value within a rated power range of the device to be calibrated, and the third output power being greater than a minimum power value within the rated power range of the device to be calibrated.

[0025] The signal recorder receives and measures the processed test signal to obtain a target sensitivity corresponding to the processed test signal, and sends the target sensitivity to the central controller, the target measurement value including the target sensitivity.

[0026] The central controller obtains an actual sensitivity from the device to be calibrated, the actual measurement value including the actual sensitivity.

[0027] In one of the embodiments, the sensitivity includes at least one of frequency shift sensitivity, time delay sensitivity, and attenuation sensitivity.

[0028] The central controller controls the sea state simulator to increase a frequency shift of the test signal by a preset frequency shift amount to obtain a frequency shift processed test signal, the processed test signal including the frequency shift processed test signal.

[0029] The central controller controls the sea state simulator to increase a time delay of the test signal by a preset time delay amount to obtain a time delay processed test signal, the processed test signal including the time delay processed test signal.

[0030] The central controller controls the sea state simulator to increase the attenuation of the test signal by a preset attenuation amount to obtain an attenuation-processed test signal, and the processed test signal includes the attenuation-processed test signal.

[0031] In one of the embodiments, the target calibration parameter includes a polarity deviation.

[0032] The central controller controls the signal encoder to emit a test signal at a third output power after determining that the signal frequency of the device to be calibrated is stable, the third output power being any one of the power values within the rated power range of the device to be calibrated, and the third output power being greater than the minimum power value within the rated power range of the device to be calibrated.

[0033] The signal recorder receives and measures the test signal to obtain a target signal waveform corresponding to the test signal, and sends the target signal waveform to the central controller, and the target measurement value includes the target signal waveform.

[0034] The central controller obtains the target signal waveform, and obtains an actual signal waveform from the device to be calibrated, the actual measurement value including the actual signal waveform, and the actual signal waveform being an actual signal waveform corresponding to the test signal obtained by the device to be calibrated after receiving and measuring the test signal.

[0035] In one of the embodiments, the target calibration parameter includes a bit rate and a repetition time.

[0036] The central controller controls the signal encoder to emit a test signal at a fourth output power for a fourth preset time length, the fourth output power being any one of the power values within the rated power range of the device to be calibrated.

[0037] The signal recorder receives and measures the test signal to obtain a target bit rate and a target repetition time corresponding to the test signal, and sends the target bit rate and the target repetition time to the central controller, and the target measurement value includes the target bit rate and the target repetition time.

[0038] In one of the embodiments, the central controller obtains the target bit rate and the target repetition time, and obtains an actual bit rate and an actual repetition time from the device to be calibrated, the actual measurement value including the actual bit rate and the actual repetition time, and the actual bit rate and the actual repetition time being actual bit rate and actual repetition time corresponding to the test signal obtained by the device to be calibrated after receiving and measuring the test signal.

[0039] The central controller calculates target transmission parameters corresponding to the signal recorder according to the target bit rate and target repetition time, calculates actual transmission parameters corresponding to the device to be processed based on the target bit rate and target repetition time and the actual bit rate and actual repetition time, and calibrates the bit rate and repetition time of the device to be calibrated according to the target transmission parameters and the actual transmission parameters.

[0040] In one of the embodiments, the central controller controls the signal encoder to extend the duration of transmitting the test signal when it is determined that the target calibration parameter needs to be corrected according to the target measurement value and the actual measurement value.

[0041] The signal recorder receives and measures the test signal to obtain an extended target measurement value corresponding to the test signal, and sends the extended target measurement value to the central controller.

[0042] The central controller obtains the extended target measurement value, and obtains an extended actual measurement value from the device to be processed, the extended actual measurement value being an actual measurement value of the test signal obtained by the device to be calibrated receiving and measuring the test signal.

[0043] The central controller controls the signal encoder to stop extending the duration of transmitting the test signal when it is determined that the target calibration parameter does not need to be corrected according to the extended target measurement value and the extended actual measurement value.

[0044] In one of the embodiments, the central controller controls to adjust the output power of the signal encoder transmitting the test signal to transmit an adjusted test signal when it is determined that the target calibration parameter needs to be corrected according to the extended target measurement value and the extended actual measurement value.

[0045] The signal recorder receives and measures the adjusted test signal to obtain an adjusted target measurement value corresponding to the adjusted test signal, and sends the adjusted target measurement value to the central controller.

[0046] The central controller obtains the adjusted target measurement value, accumulates the adjusted target measurement value and the extended target measurement value to obtain an accumulated target measurement value, obtains an adjusted actual measurement value from the device to be calibrated, the adjusted actual measurement value being an actual measurement value of the adjusted test signal obtained by the device to be calibrated receiving and measuring the adjusted test signal.

[0047] The center controller calculates a correction parameter corresponding to the target calibration parameter based on the accumulated target measurement value and the actual measurement value and according to a correction type of the device to be calibrated, and calibrates the target calibration parameter based on the correction parameter.

[0048] The above-mentioned calibration system of the demonstrative marker testing device comprises a signal encoder, a signal recorder and a center controller; the center controller acquires each calibration parameter of the device to be calibrated, and sequentially determines a target calibration parameter from each calibration parameter, controls the signal encoder to emit a testing signal, and determines the output power of the testing signal based on the rated power range of the device to be calibrated; the signal recorder receives and measures the testing signal to obtain a target measurement value corresponding to the testing signal, and sends the target measurement value to the center controller; and the center controller acquires the target measurement value, and calibrates the target calibration parameter based on the target measurement value. By using the method of the above-mentioned embodiment, the center controller controls the signal encoder to emit testing signals with different output powers for different target calibration parameters of the demonstrative marker testing device, so that the traceability of the testing signal can be realized, the calibration of the demonstrative marker testing device can be realized, and the calibration efficiency can be improved, thereby improving the offshore operation efficiency when the demonstrative marker testing device is put into use. BRIEF DESCRIPTION OF DRAWINGS

[0049] Figure 1 An application scenario diagram of the calibration system of the demonstrative marker testing device in one embodiment;

[0050] Figure 2 An application schematic diagram of the calibration system of the demonstrative marker testing device in one specific embodiment;

[0051] Figure 3 A flowchart of the calibration method of the demonstrative marker testing device in one embodiment;

[0052] Figure 4 A structural block diagram of the calibration apparatus of the demonstrative marker testing device in one embodiment;

[0053] Figure 5 An internal structure diagram of the computer device in one embodiment. DETAILED DESCRIPTION

[0054] In order to make the objects, technical solutions and advantages of the present application clearer, the present application is further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, and are not used to limit the present application.

[0055] The calibration system of the demonstrative marker testing device provided by the present application is used for calibrating the demonstrative marker testing device, which is also referred to as the device to be calibrated, and the application scenario of the calibration system of the demonstrative marker testing device is as shown in Figure 1As shown, the application scenario includes a to-be-calibrated device 102 and a beacon test device calibration system 104, the to-be-calibrated device 102 communicates with the beacon test device calibration system 104 through a network. The beacon test device calibration system 104 includes a signal encoder 1041, a signal recorder 1042 and a central controller 1043, and the signal encoder 1041, the signal recorder 1042 and the central controller 1043 can communicate through the network.

[0056] Specifically, the central controller 1043 obtains each calibration parameter of the to-be-calibrated device 102, and sequentially determines a target calibration parameter from each calibration parameter, controls the signal encoder 1041 to emit a test signal, and the output power of the test signal is determined based on the rated power range of the to-be-calibrated device 102; the signal recorder 1042 receives and measures the test signal to obtain a target measurement value corresponding to the test signal, and sends the target measurement value to the central controller 1043; the central controller 1043 obtains the target measurement value, and calibrates the target calibration parameter based on the target measurement value.

[0057] Wherein, the to-be-calibrated device 102 can be but is not limited to various beacon test devices for testing emergency radio beacons and satellite emergency radio beacons, the signal encoder 1041 can be an incremental encoder and an absolute encoder, the signal recorder 1042 can be a waveform recorder and a frequency recorder, and the central controller 1043 can be a control chip, a terminal or a server. The terminal can be but is not limited to a personal computer, a smart phone and a portable wearable device, and the server can be implemented by an independent server or a server cluster composed of multiple servers.

[0058] The beacon is one of the signs for sea operation and inland navigation, which can be used for a ship to determine a heading, indicate the ship to enter a river mouth or warn the ship to avoid a dangerous area along the sign. The beacon mainly includes an emergency radio beacon and a satellite emergency radio beacon, which can emit a beacon signal in an emergency. The beacon test device is a beacon test device for testing the emergency radio beacon and the satellite emergency radio beacon, so as to determine whether the beacon can work normally.

[0059] In one of the embodiments, a beacon test device calibration system is provided for calibrating the beacon test device before it is put into use. In the embodiment, the beacon test device is taken as a to-be-calibrated device, and the to-be-calibrated device includes various calibration parameters. Specifically, the various calibration parameters mainly include a signal frequency stability, a pulse power, a sensitivity, a polarity deviation, and a bit rate and a repetition time, and the beacon test device is calibrated by calibrating the various calibration parameters respectively.

[0060] In one embodiment, the beacon test equipment calibration system comprises a signal encoder, a signal recorder and a central controller. The signal encoder is configured to provide and transmit a test signal, i.e. a simulated beacon signal, which can be a bi-phase L data encoder generator. The signal recorder is configured to receive and measure the test signal to determine a calibration reference, which can be a wave recorder. The central controller is communicatively connected to the signal encoder, the signal recorder and the equipment to be calibrated, and is configured to monitor the equipment operating parameters, store the test results and implement control functions.

[0061] In one embodiment, the central controller obtains calibration parameters of the equipment to be calibrated, and determines target calibration parameters from the calibration parameters in sequence. In order to improve the calibration efficiency, the calibration parameters can be calibrated in sequence, and the calibration sequence can be signal frequency stability, pulse power, sensitivity, polarity deviation, and bit rate and repetition time in sequence, i.e. as target calibration parameters. In addition, the target calibration parameters can be selected arbitrarily from the calibration parameters.

[0062] In one embodiment, the central controller controls the signal encoder to transmit the test signal after determining the target calibration parameter. The output power of the test signal is different for different target calibration parameters, and the output power of the test signal is determined based on the rated power range of the equipment to be calibrated to ensure that the equipment to be calibrated can receive and measure the test signal. In order to ensure the specification of the test signal, the test signal needs to meet the preset conditions, i.e. the signal parameters of the test signal are within the preset range, or the test signal needs to contain preset information.

[0063] Specifically, the transmission frequency of the test signal satisfies the preset range of the emergency radio beacon carrier frequency f, which is expressed as f±1 kHz, and there should be no more than +2 kHz or -5 kHz change within five years, and the short-term deviation of the transmission frequency is not more than 2×10 -9 The residual frequency variation on the average slope is not more than 3×10 -9The test signal includes short information and long information. The short information is a test signal satisfying 280x(l±1%) ms, containing 112 bits of information, and the bit rate is 400x(l±1%) bits per second (bps). The long information is a test signal satisfying 360x(l±1%) ms, containing 144 bits of information, and the bit rate is 400x(l±1%) bps. The short information and the long information both include bit synchronization information and frame synchronization information. The bit synchronization information is composed of a series of digital 1 and occupies the first 15 bits. The frame synchronization information is composed of 9 bits and occupies the 16th bit to the 24th bit. The frame synchronization information under normal operation of the device is represented as 000101111. The transmission antenna polarization direction of the test signal is right-hand circular polarization (RHCP) or linear polarization.

[0064] In one of the embodiments, the signal recorder receives and measures the test signal to obtain the target measurement value corresponding to the test signal. After receiving the test signal, the signal recorder can record the amplitude, waveform rise time, phase, symbol, and other information of the test signal in the time domain, can also intercept a preset time period of the test signal and calculate the frequency, and can also convert the waveform to the frequency domain and calculate the power. The measurement value recorded or calculated by the signal recorder is called the target measurement value, which is the reference for calibrating the target calibration parameter. The preset time period can be set to the part of 10 ms-150 ms at the beginning of the test signal. After obtaining the target measurement value, the signal recorder sends the target measurement value to the central controller.

[0065] In one of the embodiments, the central controller can directly determine the specific value of the target calibration parameter of the device to be calibrated according to the factory setting parameter of the device to be calibrated, and then obtain the target measurement value, and calibrate the target calibration parameter based on the target measurement value. In addition, the central controller can also obtain the actual measurement value from the device to be calibrated. The actual measurement value is the actual measurement value of the test signal obtained by the device to be calibrated receiving and measuring the test signal, and the target calibration parameter is calibrated based on the target measurement value and the actual measurement value.

[0066] Specifically, the central controller can calculate a correction value of the target calibration parameter, and add or subtract the correction value to a specific value of the target calibration parameter to calibrate the target calibration parameter. The central controller can also calculate a correction factor of the target calibration parameter, and multiply or divide the correction factor to the specific value of the target calibration parameter to calibrate the target calibration parameter.

[0067] In one of the embodiments, when the target calibration parameter is the signal frequency stability, the central controller controls the signal encoder to emit the test signal at the first output power and for a first preset time duration. The first output power is any one of the power values in the rated power range of the device to be calibrated, and the first preset time duration can be represented as t, which is set to 10-15 mins, i.e., the central controller controls the signal encoder to continuously emit the test signal within the first preset time duration.

[0068] The signal recorder receives and measures the test signal to obtain the target signal frequency within the second preset time duration, and sends the target signal frequency to the central controller. In order to ensure the accuracy of the measurement, only the target signal frequency when the test signal is relatively stable, the random error ratio is small, and the inherent error ratio is large is measured, i.e., the second preset time duration is less than the first preset time duration. According to experience, the second preset time duration can be the middle time period of the first preset time duration, specifically, the middle three-quarters, which can be represented as 0.75t. The target measurement value includes the target signal frequency, which is represented as f0.

[0069] The central controller obtains the target signal frequency and the actual signal frequency from the device to be calibrated. The actual measurement value includes the actual signal frequency, which is represented as f. The actual signal frequency is obtained by the device to be calibrated by measuring the test signal within the second preset time duration.

[0070] The central controller calculates the signal frequency stability slope of the device to be calibrated according to the target signal frequency and the actual signal frequency. Specifically, the calculation formula of the signal frequency stability slope is: wherein, is the average value of the actual signal frequency f within the second preset time duration 0.75t. Based on the signal frequency stability slope, the signal frequency stability of the device to be calibrated is calibrated. Specifically, if the signal frequency stability slope is less than the preset signal frequency stability slope, no calibration is needed. The preset signal frequency stability slope can be set to 3x10 -10 / mins.

[0071] In one of the embodiments, if the calibration parameters are calibrated in sequence, i.e., the signal frequency of the device to be calibrated is calibrated first, and then the pulse power of the device to be calibrated is calibrated. When the target calibration parameter is determined to be the pulse power, it is determined that the signal frequency of the device to be calibrated is stable. Then, the central controller controls the signal encoder to emit the test signal at the second output power after determining that the signal frequency of the device to be calibrated is stable. In this case, since the signal frequency of the device to be calibrated is stable, in order to improve the calibration efficiency, the test signal is emitted only once. The second output power is the maximum power value in the rated power range of the device to be calibrated, for example, 30 decibel-milliwatts (dBm).

[0072] The signal recorder receives and measures the test signal to obtain the target pulse power corresponding to the test signal, and sends the target pulse power to the central controller. The target measurement value includes the target pulse power. In this case, the pulse power is the power 1 ms before the pulse. The signal recorder records the waveform of 0-1 ms and converts it to the frequency domain to determine the target pulse power.

[0073] The central controller obtains the target pulse power, and obtains the actual pulse power from the device to be calibrated. The actual measurement value includes the actual pulse power. The actual pulse power is obtained by receiving and measuring the test signal by the device to be calibrated. Specifically, when the difference between the target pulse power and the actual pulse power is less than the preset pulse power difference, calibration is not required. In this case, the preset pulse power difference can be set to [(10+lg(f)) / 10] dBm, and f is the signal frequency of the device to be calibrated, in units of hertz (Hz).

[0074] In one of the embodiments, if the target calibration parameter is randomly selected from the calibration parameters, i.e., the signal frequency of the device to be calibrated is not determined to be stable, the pulse power of the device to be calibrated is calibrated first. When the target calibration parameter is determined to be the pulse power, the central controller controls the signal encoder to emit the test signal at the second output power and for a third preset time length. In this case, the second output power is the maximum power value in the rated power range of the device to be calibrated. The third preset time length can be the same as the first preset time length, and is set to 10-15 mins, i.e., the central controller controls the signal encoder to continuously emit the test signal within the third preset time length.

[0075] The signal recorder receives and measures the test signal to obtain the target pulse power of the test signal at the target time point, and sends the target pulse power to the central controller. The target measurement value includes the target pulse power. In this case, in order to ensure the accuracy of the measurement, only the target pulse power when the test signal is relatively stable, the random error ratio is small, and the inherent error ratio is large is measured. The target time point can be a time point in the middle time period of the third preset time length, i.e., 0-1 ms before the pulse in the middle time period.

[0076] The central controller obtains a target pulse power, and obtains an actual pulse power from the device to be calibrated. The actual measurement value includes the actual pulse power, and the actual pulse power is obtained by the device to be calibrated receiving and measuring a test signal to obtain an actual pulse power of the test signal at a target time point. Specifically, when a difference between the target pulse power and the actual pulse power is less than a preset pulse power difference value, calibration is not required. The preset pulse power difference value can be set as [(10+lg(f)) / 10] dBm, and f is a signal frequency of the device to be calibrated, in Hz.

[0077] In one of the embodiments, when the target calibration parameter is determined to be sensitivity, the flag test device calibration system further includes a sea state simulator. The sea state simulator can simulate the influence of sea atmospheric absorption, scattering, attenuation and clutter interference on the test signal, and can perform pass-through frequency offset, loss and time delay additional processing on the test signal output by the signal encoder, and transmit the processed test signal. The upper limit of the frequency of the processed test signal is not less than 1.2 GHz, the offset is greater than ±10 kHz, the dynamic range of the loss is greater than 50 dB, and the relative time delay is not less than 30 microseconds (μs). In addition, when the sea state simulator selects a pass-through mode without adding any interference type, i.e. without any processing.

[0078] The central controller controls the signal encoder to transmit the test signal at a third output power after determining that the signal frequency of the device to be calibrated is stable, controls the sea state simulator to receive and process the test signal to obtain a processed test signal, and transmits the processed test signal. The third output power is any power value within the rated power range of the device to be calibrated, and the third output power is greater than the minimum power value within the rated power range of the device to be calibrated, for example, 0 dBm.

[0079] The signal recorder receives and measures the processed test signal to obtain a target sensitivity corresponding to the processed test signal, and sends the target sensitivity to the central controller. The target measurement value includes the target sensitivity.

[0080] The central controller obtains an actual sensitivity from the device to be calibrated. The actual measurement value includes the actual sensitivity, and the factory setting parameter of the device to be calibrated includes the actual sensitivity. When the actual sensitivity is the same as the target sensitivity, calibration is not required.

[0081] In one of the embodiments, the sensitivity includes at least one of frequency shift sensitivity, time delay sensitivity and attenuation sensitivity, and the central controller controls the sea state simulator to perform different processing for different types of sensitivity.

[0082] In a case where the sensitivity is determined as the frequency shift sensitivity, the central controller controls the sea state simulator to increase the frequency shift of the test signal by a preset frequency shift amount, to obtain a frequency shift processed test signal, and the processed test signal includes the frequency shift processed test signal. Specifically, the sea state simulator determines a frequency shift range generated by the sea surface atmospheric waveguide and the sea wave, and determines the preset frequency shift amount within the frequency shift range. The frequency shift range can be 0 kHz to ±10 kHz, and the preset frequency shift amount can be set to 10 Hz. The central controller controls the sea state simulator to continuously increase the frequency shift of the test signal by the preset frequency shift amount, until it is determined that the character of the processed test signal received by the device to be calibrated is inconsistent with the test signal transmitted by the signal encoder, and then the previous frequency shift amount of the sea state simulator is obtained as a target frequency shift sensitivity, and the target sensitivity includes the target frequency shift sensitivity.

[0083] In a case where the sensitivity is determined as the time delay sensitivity, the central controller controls the sea state simulator to increase the time delay of the test signal by a preset time delay amount, to obtain a time delay processed test signal, and the processed test signal includes the time delay processed test signal. Specifically, the sea state simulator determines a relative time delay range generated by the sea surface atmospheric waveguide and the sea wave, and determines the preset time delay amount within the relative time delay range. The relative time delay range can be 0 μs to 30 μs, and the preset time delay amount can be set to 10 μs. The central controller controls the sea state simulator to continuously increase the time delay of the test signal by the preset time delay amount, until it is determined that the character of the processed test signal received by the device to be calibrated is inconsistent with the test signal transmitted by the signal encoder, and then the previous time delay amount of the sea state simulator is obtained as a target time delay sensitivity, and the target sensitivity includes the target time delay sensitivity.

[0084] In a case where the sensitivity is determined as the attenuation sensitivity, the central controller controls the sea state simulator to increase the attenuation of the test signal by a preset attenuation amount, to obtain an attenuation processed test signal, and the processed test signal includes the attenuation processed test signal. Specifically, the sea state simulator determines an attenuation range of the ocean atmospheric absorption, and determines the preset attenuation amount within the attenuation range. The attenuation range can be 0 dB to 50 dB, and the preset attenuation amount can be set to 1 dB. The central controller controls the sea state simulator to continuously increase the attenuation of the test signal by the preset attenuation amount, until it is determined that the character of the processed test signal received by the device to be calibrated is inconsistent with the test signal transmitted by the signal encoder, and then the previous attenuation amount of the sea state simulator is obtained as a target attenuation sensitivity, and the target sensitivity includes the target attenuation sensitivity.

[0085] In one of the embodiments, the central controller obtains the actual frequency shift sensitivity, the actual time delay sensitivity and the actual attenuation sensitivity from the device to be calibrated, and determines that calibration is not needed when the actual frequency shift sensitivity is equal to the target frequency shift sensitivity, the actual time delay sensitivity is equal to the target time delay sensitivity, and the actual attenuation sensitivity is equal to the target attenuation sensitivity.

[0086] In one of the embodiments, when the target calibration parameter is the polarity deviation, the central controller controls the signal encoder to transmit the test signal at a third output power after determining that the signal frequency of the device to be calibrated is stable. The third output power is any power value within the rated power range of the device to be calibrated, and the third output power is greater than the minimum power value within the rated power range of the device to be calibrated, for example, 0 dBm. The test signal also needs to meet a preset duty cycle condition, which is set as |2x-1|≤3.5%, where x represents the duty cycle of the test signal.

[0087] The signal recorder receives and measures the test signal to obtain a target signal waveform corresponding to the test signal, and sends the target signal waveform to the central controller. The target measurement value includes the target signal waveform. The signal recorder collects the waveform of the test signal.

[0088] The central controller obtains the target signal waveform, and obtains an actual signal waveform from the device to be calibrated. The actual measurement value includes the actual signal waveform, which is obtained by receiving and measuring the test signal by the device to be calibrated. The central controller determines the positive polarity deviation of the device to be calibrated in a first preset range and the negative polarity deviation of the device to be calibrated in a second preset range according to the actual signal waveform and the target signal waveform. and the negative polarity deviation of the device to be calibrated in a second preset range If the positive polarity deviation and the negative polarity deviation meet a preset deviation condition, calibration is not needed. Specifically, the first preset range is set to 1.0 rad to 1.2 rad, the second preset range is set to -1.0 rad to -1.2 rad, and the preset deviation condition is set as:

[0089] In one of the embodiments, when the target calibration parameter is the bit rate and the repetition time, the central controller controls the signal encoder to transmit the test signal at a fourth output power for a fourth preset time length. The fourth output power is any power value within the rated power range of the device to be calibrated, and the fourth preset time length can be the same as the first preset time length, which is set to 10-15 mins, i.e., the central controller controls the signal encoder to continuously transmit the test signal within the fourth preset time length.

[0090] The signal recorder receives and measures the test signal, obtains the target bit rate and the target repetition time corresponding to the test signal, and sends the target bit rate and the target repetition time to the central controller, and the target measurement value includes the target bit rate and the target repetition time. Wherein, the signal recorder measures the test signal, obtains the maximum target bit rate B Max , the minimum target bit rate B Min , the target repetition time T i of each test signal, and the average target repetition time T.

[0091] The central controller obtains the target bit rate and the target repetition time, obtains the actual bit rate and the actual repetition time from the device to be calibrated, and the actual measurement value includes the actual bit rate and the actual repetition time. The actual bit rate and the actual repetition time are obtained by the device to be calibrated by measuring the test signal, and the actual bit rate and the actual repetition time corresponding to the test signal are obtained. Wherein, the actual bit rate is expressed as The actual repetition time is expressed as

[0092] The central controller calculates the target transmission parameter corresponding to the signal recorder according to the target bit rate and the target repetition time, calculates the actual transmission parameter corresponding to the device to be processed based on the target bit rate and the target repetition time and the actual bit rate and the actual repetition time, and calibrates the bit rate and the repetition time of the device to be calibrated according to the target transmission parameter and the actual transmission parameter. Wherein, the target transmission parameter is expressed as d1, and the calculation formula is:

[0093]

[0094] The actual transmission parameter is expressed as d2, and the calculation formula is:

[0095]

[0096] If the target transmission parameter is not greater than the preset target transmission parameter, and the actual transmission parameter is not greater than the preset actual transmission parameter, calibration is not required. Wherein, the preset target transmission parameter is set to 2s, and the preset actual transmission parameter is set to 0.5s.

[0097] In one embodiment, the central controller determines that the target calibration parameter needs to be corrected according to the target measurement value and the actual measurement value, that is, the target calibration parameter needs to be calibrated. In order to avoid the situation that the target calibration parameter of the device to be calibrated is not accurate due to the insufficient test time of the device to be calibrated, when it is determined that the target calibration parameter needs to be calibrated, the central controller controls the signal encoder to prolong the time of transmitting the test signal, and enters the first calibration process. For example, when the target calibration parameter is signal frequency stability, the central controller prolongs the first preset time of the signal encoder from t to 2t, and the prolonging mode of each target calibration parameter is the same.

[0098] The signal recorder receives and measures the test signal to obtain the extended target measurement value corresponding to the test signal, and sends the extended target measurement value to the central controller. For example, when the target calibration parameter is signal frequency stability, the signal recorder extends the second preset time length of measuring the test signal from 0.75t to 1.5t.

[0099] The central controller obtains the extended target measurement value, and obtains the extended actual measurement value from the device to be processed. The extended actual measurement value is obtained by receiving and measuring the test signal by the device to be calibrated.

[0100] When the central controller determines that the target calibration parameter does not need to be corrected according to the extended target measurement value and the extended actual measurement value, the central controller controls the signal encoder to stop extending the time length of transmitting the test signal. When the extended target measurement value is the same as the extended actual measurement value, or satisfies the preset relationship in the above embodiment, it is determined that the target calibration parameter does not need to be corrected, and the time length of transmitting the test signal by the signal encoder is stopped, that is, the calibration of the device to be calibrated is completed.

[0101] In one embodiment, if the central controller still needs to calibrate the target calibration parameter after controlling the signal encoder to extend the time length of transmitting the test signal, the correction parameter corresponding to the target calibration parameter needs to be calculated, the correction parameter includes at least one of the correction value or the correction factor, that is, the second calibration process is entered. Specifically, when the central controller determines that the target calibration parameter needs to be corrected according to the extended target measurement value and the extended actual measurement value, the central controller controls the output power of the signal encoder to transmit the test signal to transmit the adjusted test signal. The output power of the adjusted test signal is any power value in the rated power range of the device to be calibrated, and is different from the output power of the original test signal, so that the central controller obtains different target measurement values and actual measurement values. It should be noted that when the central controller controls the output power of the signal encoder to transmit the test signal, the signal encoder does not extend the time length of transmitting the test signal, that is, the time length can be the same as the extended time length, and the time length remains unchanged.

[0102] The signal recorder receives and measures the adjusted test signal to obtain the adjusted target measurement value corresponding to the adjusted test signal, and sends the adjusted target measurement value to the central controller. The signal recorder receives and measures the adjusted test signal in the same way as measuring the original test signal.

[0103] The central controller obtains the adjusted target measurement value, accumulates the adjusted target measurement value and the extended target measurement value to obtain an accumulated target measurement value. The extended target measurement value is a target measurement value obtained after the last extension duration in the first calibration process. The central controller obtains an adjusted actual measurement value from the device to be calibrated. The adjusted actual measurement value is an actual measurement value of the adjusted test signal obtained by the device to be calibrated receiving and measuring the adjusted test signal. The adjusted target measurement value is represented as P i , and the adjusted actual measurement value is represented as The adjusted target measurement values of the n groups of adjusted test signals measured by the signal recorder are accumulated as P.

[0104] The central controller calculates a correction parameter corresponding to the target calibration parameter based on the accumulated target measurement value and the actual measurement value, and according to the correction type of the device to be calibrated, and calibrates the target calibration parameter based on the correction parameter. Specifically, the correction parameter includes a correction value and a correction factor. The calculation formula of the correction value is: The calculation formula of the correction factor is: 0.5(C iMax -C iMin ), wherein When the correction type of the device to be calibrated is point-by-point correction, the central controller performs addition and subtraction operations on the target calibration parameter based on the correction value to calibrate the target calibration parameter. When the correction type of the device to be calibrated is not point-by-point correction, the central controller performs multiplication and division operations on the target calibration parameter based on the correction factor to calibrate the target calibration parameter.

[0105] In order to make the purpose, technical scheme and advantages of the present application more clear, the present application will be further described in detail below in combination with the drawings and one specific embodiment. It should be understood that the specific embodiments described herein are only used to explain the present application and do not limit the present application.

[0106] In one specific embodiment, a demonstration beacon test device calibration system is used to calibrate a demonstration beacon test device. The system includes a bi-phase L data encoding generator, a sea state simulator, a waveform recorder and a central controller, which is in communication connection with the demonstration beacon test device, the bi-phase L data encoding generator, the sea state simulator and the waveform recorder. The steps of calibrating the demonstration beacon test device by the demonstration beacon test device calibration system are as follows:

[0107] The central controller determines the calibration parameters of the demonstration beacon test device as signal frequency stability, pulse front 1ms power, sensitivity, polarity deviation, and bit rate and repetition time, and determines the target calibration parameters in the above order from the calibration parameters in turn;

[0108] First, the signal frequency stability of the demonstration beacon test device is calibrated.

[0109] The central controller controls the bi-phase L data encoding generator to continuously transmit the test signal and lasts for a fixed time t, t is 10 minutes, wherein the output power of the test signal is any one power value in the rated power range of the range marker test equipment; controls the sea state simulator to select the straight-through mode without adding any interference type;

[0110] The waveform recorder receives and measures the test signal, records the target signal frequency f0 of each test signal in the middle time period 0.75t, i.e. 0-7.5 minutes; the range marker test equipment receives and measures the test signal, records the actual signal frequency f of each test signal in the middle time period 0.75t;

[0111] The central controller calculates the signal frequency stability slope, the calculation formula is If the signal frequency stability slope is less than 3x10 -10 / mins, it is determined that the signal frequency stability does not need to be calibrated;

[0112] Secondly, the pulse front 1ms power of the range marker test equipment is calibrated;

[0113] The central controller controls the bi-phase L data encoding generator to transmit the test signal once, and the output power of the test signal is set to the maximum power value 30dBm in the rated power range of the range marker test equipment; controls the sea state simulator to select the straight-through mode without adding any interference type;

[0114] The waveform recorder receives and measures the test signal, records the waveform of 0-1ms before the pulse, and converts to the frequency domain to determine the target pulse power; the range marker test equipment receives and measures the test signal, the waveform of 0-1ms before the pulse, and converts to the frequency domain to determine the actual pulse power;

[0115] The central controller calculates the difference between the target pulse power and the actual pulse power, and if the difference is less than [(10+lg(f)) / 10]dBm, it is determined that the pulse front 1ms power does not need to be calibrated, wherein f is the signal frequency of the range marker test equipment, and the unit is hertz (Hz);

[0116] Thirdly, the sensitivity of the range marker test equipment is calibrated;

[0117] The central controller controls the bi-phase L data encoding generator to transmit the test signal once, and the output power of the test signal is set to any one power value in the rated power range of the range marker test equipment, and is greater than the minimum power value in the rated power range, the output power of the test signal is 0dBm;

[0118] The sea state simulator determines a frequency offset range of 0 kHz to ±10 kHz generated by the sea surface atmospheric waveguide and sea waves, determines a preset frequency shift amount of 10 Hz, and the central controller controls the sea state simulator to continuously increase the frequency shift of the test signal by the preset frequency shift amount, transmits the processed test signal, until it is determined that the characters of the processed test signal received by the beacon test device and the transmitted test signal are inconsistent, then the central controller takes the previous frequency shift amount of the sea state simulator as the target frequency shift sensitivity;

[0119] The sea state simulator determines a relative time delay range of 0 μs to 30 μs generated by the sea surface atmospheric waveguide and sea waves, determines a preset time delay amount of 10 μs, and the central controller controls the sea state simulator to continuously increase the time delay of the test signal by the preset time delay amount, transmits the processed test signal, until it is determined that the characters of the processed test signal received by the beacon test device and the transmitted test signal are inconsistent, then the central controller takes the previous time delay amount of the sea state simulator as the target time delay sensitivity;

[0120] The sea state simulator determines an attenuation range of 0 dB to 50 dB of the marine atmospheric absorption, determines a preset attenuation amount of 1 dB, and the central controller controls the sea state simulator to continuously increase the attenuation of the test signal by the preset attenuation amount, transmits the processed test signal, until it is determined that the characters of the processed test signal received by the beacon test device and the transmitted test signal are inconsistent, then the central controller takes the previous attenuation amount of the sea state simulator as the target attenuation sensitivity;

[0121] The central controller obtains the actual frequency shift sensitivity, the actual time delay sensitivity and the actual attenuation sensitivity from the factory setting parameters of the beacon test device, and determines that the sensitivity does not need to be calibrated when the actual frequency shift sensitivity is the same as the target frequency shift sensitivity, the actual time delay sensitivity is the same as the target time delay sensitivity, and the actual attenuation sensitivity is the same as the target attenuation sensitivity.

[0122] Fourth, calibrate the polarity deviation of the beacon test device;

[0123] The central controller controls the bi-phase L data encoder generator to transmit the test signal once, the output power of the test signal is set to any power value in the rated power range of the beacon test device, and is greater than the minimum power value in the rated power range, the output power of the test signal is 0 dBm, and the test signal satisfies the preset duty cycle condition: |2x-1|≤3.5%, wherein x represents the duty cycle of the test signal; the sea state simulator is controlled to select the straight-through mode without adding any interference type;

[0124] The waveform recorder receives and measures the test signal, and records the target signal waveform corresponding to the test signal; the beacon test device receives and measures the test signal, and records the actual signal waveform corresponding to the test signal;

[0125] The central controller determines the positive polarity deviation of the beacon test equipment in the range of 1.0rad to 1.2rad based on the actual signal waveform and the target signal waveform. and negative polarity deviations in the range of -1.0rad to -1.2rad like Then no calibration is required to determine the polarity deviation;

[0126] Fifth, calibrate the bit rate and repetition time of the beacon test equipment;

[0127] The central controller controls the bi-phase L data code generator to continuously transmit the test signal for a fixed duration t, which is 10 minutes. The output power of the test signal is any power value within the rated power range of the position-indicating beacon test equipment. The central controller controls the sea condition simulator to select the direct-through mode without adding any interference type.

[0128] The waveform recorder receives and measures n groups of test signals and records the maximum target bit rate B corresponding to the n groups of test signals. Max , minimum target bit rate B Min , target repetition time T of each test signal i , average target repetition time T; the actual bit rate corresponding to the beacon test equipment record Actual repetition time

[0129] The central controller calculates the target transmission parameter d1 and the actual transmission parameter d2, and the calculation formula is:

[0130]

[0131]

[0132] If d1 is not greater than 2s and d2 is not greater than 0.5s, no calibration is required to determine the bit rate and repetition time;

[0133] When it is determined that the target calibration parameters need to be calibrated, the central controller controls the dual-phase L data code generator to extend the duration of the test signal transmission, the waveform recorder receives and measures the test signal, obtains the extended target measurement value corresponding to the test signal, and sends the extended target measurement value to the central controller. The central controller obtains the extended actual measurement value from the device to be processed. When it is determined that the target calibration parameters do not need to be corrected based on the extended target measurement value and the extended actual measurement value, the central controller controls the dual-phase L data code generator to stop extending the duration of the test signal transmission, and the calibration is completed.

[0134] If the central controller still needs to calibrate the target calibration parameter after the control of the bi-phase L data encoding generator to extend the time length of the transmission of the test signal, the central controller adjusts the output power of the bi-phase L data encoding generator to transmit the adjusted test signal; the waveform recorder receives and measures the adjusted test signal to obtain an adjusted target measurement value P corresponding to the adjusted test signal i ;

[0135] The central controller obtains the adjusted target measurement value P i , and adds the adjusted target measurement value of the n groups of adjusted test signals and the extended target measurement value to obtain an accumulated target measurement value P; the central controller obtains an adjusted actual measurement value P from the index test equipment The target calibration parameter is calibrated by calculating a correction parameter corresponding to the target calibration parameter, and the correction parameter includes a correction value and a correction factor. The calculation formula of the correction value is: The calculation formula of the correction factor is: 0.5(C iMax -C iMin ), wherein, When the correction type of the index test equipment is point-by-point correction, the central controller performs addition and subtraction operation on the target calibration parameter based on the correction value to calibrate the target calibration parameter. When the correction type of the index test equipment is not point-by-point correction, the central controller performs multiplication and division operation on the target calibration parameter based on the correction factor to calibrate the target calibration parameter, i.e. the calibration is completed.

[0136] In one embodiment, as shown in Figure 3 , a calibration method of an index test equipment is provided. The calibration method is applied to the central controller 1043 of the index test equipment calibration system 104 in Figure 1 , and includes the following steps.

[0137] In step S302, each calibration parameter of the equipment to be calibrated is obtained, and a target calibration parameter is determined from each calibration parameter in sequence.

[0138] In step S304, the signal encoder is controlled to transmit a test signal, and the output power of the test signal is determined based on the rated power range of the equipment to be calibrated.

[0139] In step S306, a target measurement value is obtained, which is a target measurement value corresponding to the test signal obtained by the signal recorder receiving and measuring the test signal.

[0140] In step S308, the target calibration parameter is calibrated based on the target measurement value.

[0141] The specific limitations of the above calibration method of the index test equipment can be referred to the limitations of the index test equipment calibration system in the foregoing, which will not be repeated here. It should be understood that, although Figure 3The steps in the flowcharts are displayed in sequence according to the arrows, but the steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified herein, the steps are not strictly limited in sequence, and the steps can be executed in other orders. Moreover, Figure 3 At least part of the steps in the flowcharts can include multiple steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution order of the steps or stages is not necessarily sequential, but can be alternately executed with other steps or steps or stages in other steps.

[0142] In one embodiment, as shown in Figure 4 A target calibration parameter determination module 410, a signal encoder control module 420, a target measurement value acquisition module 430, and a target calibration parameter calibration module 440 are provided, wherein:

[0143] The target calibration parameter determination module 410 is configured to obtain each calibration parameter of the device to be calibrated, and sequentially determine a target calibration parameter from each of the calibration parameters.

[0144] The signal encoder control module 420 is configured to control the signal encoder to emit a test signal, and the output power of the test signal is determined based on the rated power range of the device to be calibrated.

[0145] The target measurement value acquisition module 430 is configured to obtain the target measurement value, which is obtained by a signal recorder receiving and measuring the test signal.

[0146] The target calibration parameter calibration module 440 is configured to calibrate the target calibration parameter based on the target measurement value.

[0147] For specific limitations of the target calibration parameter calibration device, refer to the limitations of the target calibration parameter calibration system and the target calibration parameter calibration method described above, which will not be repeated here. Each module in the above target calibration parameter calibration device can be realized by software, hardware, and combinations thereof. The above modules can be embedded in or independent of the processor in the computer device in hardware form, or can be stored in the memory in the computer device in software form, so that the processor can call and execute the operations corresponding to each module.

[0148] In one embodiment, a computer device is provided, and its internal structure diagram can be as shown in Figure 5As shown in the figure. The computer device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operating system and the computer program in the non-volatile storage medium to run. The communication interface of the computer device is used to communicate with external devices in a wired or wireless manner. Wireless mode can be achieved through WIFI, operator network, NFC (near field communication) or other technologies. The computer program is executed by the processor to implement a kind of calibration method of demonstration mark test equipment. The display screen of the computer device can be liquid crystal display screen or electronic ink display screen, and the input device of the computer device can be touch layer covered on the display screen, or key, trackball or touchpad etc. arranged on the shell of the computer device.

[0149] Those skilled in the art can understand that, Figure 5 The structure shown in the figure is only a block diagram of part of the structure related to the scheme of the present application, and does not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific computer device can include more or fewer components than those shown in the figure, or combine certain components, or have a different component arrangement.

[0150] In one embodiment, a computer device is provided, comprising a memory and a processor, the memory stores a computer program, and the processor executes the computer program to implement the steps of the above-mentioned calibration method of demonstration mark test equipment.

[0151] In one embodiment, a computer readable storage medium is provided, which stores a computer program, and the computer program is executed by the processor to implement the steps of the above-mentioned calibration method of demonstration mark test equipment.

[0152] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when the computer program is executed, the processes of the above-mentioned embodiments of the methods can be included. Any reference to memory, storage, database or other medium used in each embodiment provided by the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory or optical memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration but not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0153] Any combination of the technical features of the above embodiments can be made. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, but as long as the combination of the technical features does not exist, it should be considered as the scope of the present application.

[0154] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent. It should be pointed out that for those skilled in the art, without departing from the concept of the present application, some modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

Claims

1. A beacon test equipment calibration system, characterized in that: The system includes a signal encoder, a signal recorder and a central controller; The central controller obtains calibration parameters of the device to be calibrated, determines target calibration parameters from the calibration parameters in sequence, and controls the signal encoder to transmit a test signal, wherein the output power of the test signal is determined based on the rated power range of the device to be calibrated; The signal recorder receives and measures the test signal, obtains a target measurement value corresponding to the test signal, and sends the target measurement value to the central controller; The central controller further obtains an actual measurement value from the device to be calibrated, where the actual measurement value is the actual measurement value of the test signal obtained by the device to be calibrated receiving and measuring the test signal; and calibrates the target calibration parameter based on the target measurement value and the actual measurement value; Wherein, the target calibration parameter includes signal frequency stability, the target measurement value includes target signal frequency, and the actual measurement value includes actual signal frequency; the central controller controls the signal encoder to transmit a test signal at a first output power and for a first preset duration, and the first output power is any power value within the rated power range of the device to be calibrated; the signal recorder receives and measures the test signal, obtains the target signal frequency of the test signal within a second preset duration, and sends the target signal frequency to the central controller, and the second preset duration is less than the first preset duration; the central controller obtains the target signal frequency and obtains the actual signal frequency from the device to be calibrated, and the actual signal frequency is the actual signal frequency of the test signal obtained by the device to be calibrated when it obtains and measures the test signal within the second preset duration; the central controller calculates the signal frequency stability slope of the device to be calibrated based on the target signal frequency and the actual signal frequency, and calibrates the signal frequency stability of the device to be calibrated based on the signal frequency stability slope; The calculation formula of the signal frequency stability slope is: f0 is the target signal frequency, is the average value of the actual signal frequency within the second preset time length, the second preset time length is 0.75t, and t represents the first preset time length.

2. The position-indicating beacon test equipment calibration system according to claim 1, characterized in that: The target calibration parameter includes pulse power; After determining that the signal frequency of the device to be calibrated is stable, the central controller controls the signal encoder to transmit a test signal at a second output power, where the second output power is a maximum power value within a rated power range of the device to be calibrated; The signal recorder receives and measures the test signal, obtains a target pulse power corresponding to the test signal, and sends the target pulse power to the central controller, wherein the target measurement value includes the target pulse power; The central controller obtains the target pulse power and obtains the actual pulse power from the device to be calibrated. The actual measurement value includes the actual pulse power. The actual pulse power is the actual pulse power corresponding to the test signal obtained when the device to be calibrated receives and measures the test signal.

3. The position-indicating beacon test equipment calibration system according to claim 1, characterized in that: The target calibration parameter includes pulse power; The central controller controls the signal encoder to transmit a test signal at a second output power for a third preset time period, wherein the second output power is a maximum power value within a rated power range of the device to be calibrated; The signal recorder receives and measures the test signal, obtains the target pulse power of the test signal at the target time point, and sends the target pulse power to the central controller, wherein the target measurement value includes the target pulse power; The central controller obtains the target pulse power and obtains the actual pulse power from the device to be calibrated. The actual measurement value includes the actual pulse power. The actual pulse power is the actual pulse power of the test signal at the target time point obtained by the device to be calibrated receiving and measuring the test signal.

4. The position-indicating beacon test equipment calibration system according to claim 1, characterized in that: The target calibration parameter includes sensitivity, and the system further includes a sea state simulator; After determining that the signal frequency of the device to be calibrated is stable, the central controller controls the signal encoder to transmit a test signal at a third output power, controls the sea condition simulator to receive and process the test signal, obtains a processed test signal, and transmits the processed test signal, wherein the third output power is any power value within the rated power range of the device to be calibrated, and the third output power is greater than a minimum power value within the rated power range of the device to be calibrated; The signal recorder receives and measures the processed test signal, obtains the target sensitivity corresponding to the processed test signal, and sends the target sensitivity to the central controller, wherein the target measurement value includes the target sensitivity; The central controller obtains actual sensitivity from the device to be calibrated, and the actual measurement value includes the actual sensitivity.

5. The position-indicating beacon test equipment calibration system according to claim 4, characterized in that: The sensitivity includes at least one of frequency shift sensitivity, delay sensitivity, and attenuation sensitivity, and the central controller is configured to perform at least one of the following: Item 1: The central controller controls the sea state simulator to increase the frequency shift of the test signal by a preset frequency shift amount to obtain a frequency-shifted test signal, wherein the processed test signal includes the frequency-shifted test signal; Item 2: the central controller controls the sea state simulator to increase the delay of the test signal by a preset delay amount to obtain a delayed test signal, wherein the processed test signal includes the delayed test signal; Item 3: The central controller controls the sea condition simulator to increase the attenuation of the test signal by a preset attenuation amount to obtain an attenuated test signal, and the processed test signal includes the attenuated test signal.

6. The position-indicating beacon test equipment calibration system according to claim 1, characterized in that: The target calibration parameters include polarity deviation; After determining that the signal frequency of the device to be calibrated is stable, the central controller controls the signal encoder to transmit a test signal at a third output power, where the third output power is any power value within a rated power range of the device to be calibrated, and the third output power is greater than a minimum power value within the rated power range of the device to be calibrated; The signal recorder receives and measures the test signal, obtains a target signal waveform corresponding to the test signal, and sends the target signal waveform to the central controller, wherein the target measurement value includes the target signal waveform; The central controller obtains the target signal waveform and obtains the actual signal waveform from the device to be calibrated. The actual measurement value includes the actual signal waveform. The actual signal waveform is the actual signal waveform corresponding to the test signal obtained when the device to be calibrated receives and measures the test signal.

7. The position-indicating beacon test equipment calibration system according to claim 1, characterized in that: The target calibration parameters include bit rate and repetition time; The central controller controls the signal encoder to transmit a test signal at a fourth output power for a fourth preset time period, where the fourth output power is any power value within a rated power range of the device to be calibrated; The signal recorder receives and measures the test signal, obtains a target bit rate and a target repetition time corresponding to the test signal, and sends the target bit rate and the target repetition time to the central controller, wherein the target measurement value includes the target bit rate and the target repetition time; The central controller obtains the target bit rate and target repetition time, and obtains the actual bit rate and actual repetition time from the device to be calibrated, wherein the actual measurement value includes the actual bit rate and actual repetition time, and the actual bit rate and actual repetition time are the actual bit rate and actual repetition time corresponding to the test signal obtained by the device to be calibrated acquiring and measuring the test signal; The central controller calculates the target transmission parameters corresponding to the signal recorder based on the target bit rate and target repetition time, and calculates the actual transmission parameters corresponding to the device to be calibrated based on the target bit rate and target repetition time and the actual bit rate and actual repetition time; and calibrates the bit rate and repetition time of the device to be calibrated based on the target transmission parameters and the actual transmission parameters.

8. The position-indicating beacon test equipment calibration system according to claim 1, characterized in that: When the central controller determines that the target calibration parameter needs to be corrected based on the target measurement value and the actual measurement value, the central controller controls the signal encoder to extend the duration of transmitting the test signal; The signal recorder receives and measures the test signal, obtains an extended target measurement value corresponding to the test signal, and sends the extended target measurement value to the central controller; The central controller obtains the extended target measurement value and obtains the extended actual measurement value from the device to be calibrated, where the extended actual measurement value is the extended actual measurement value of the test signal obtained by the device to be calibrated receiving and measuring the test signal; When the central controller determines that the target calibration parameter does not need to be corrected based on the extended target measurement value and the extended actual measurement value, the central controller controls the signal encoder to stop extending the duration of transmitting the test signal; When the central controller determines that the target calibration parameter needs to be corrected based on the extended target measurement value and the extended actual measurement value, the central controller controls and adjusts the output power of the test signal transmitted by the signal encoder to transmit the adjusted test signal; The signal recorder receives and measures the adjusted test signal, obtains an adjusted target measurement value corresponding to the adjusted test signal, and sends the adjusted target measurement value to the central controller; The central controller obtains an adjusted target measurement value, accumulates the adjusted target measurement value and the extended target measurement value to obtain an accumulated target measurement value, and obtains an adjusted actual measurement value from the device to be calibrated, where the adjusted actual measurement value is an actual measurement value of the adjusted test signal obtained by the device to be calibrated receiving and measuring the adjusted test signal; The central controller calculates a correction parameter corresponding to the target calibration parameter based on the accumulated target measurement value and the actual measurement value and according to a correction type of the device to be calibrated, and calibrates the target calibration parameter based on the correction parameter.

9. The position-indicating beacon test equipment calibration system according to claim 1, characterized in that: The central controller determines any calibration parameter among the calibration parameters as the target calibration parameter.

10. The position-indicating beacon test equipment calibration system according to claim 1, characterized in that: The central controller calculates a correction value of the target calibration parameter, and performs addition and subtraction operations on the correction value and a specific numerical value of the target calibration parameter to calibrate the target calibration parameter.

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