An on-line testing device and method for the insulation wire resistance of a thin-film solar cell

Abstract

The present invention relates to the technical field of thin-film solar cells, and particularly relates to an on-line testing device and method for the insulation wire resistance of a thin-film solar cell. The on-line testing device for the insulation wire resistance of a thin-film solar cell includes: a frame; a support table adapted to support a front electrode layer; a detection frame mounted on the frame and located above the support table; two probes, both of which are mounted on the detection frame and have a fixed distance therebetween, and both of the two probes face the support table and are respectively adapted to abut against areas on both sides of the same insulating wire; the detection frame can move along the length direction of the support table and / or the support table is provided with a support member that can move along its length direction, and the support member is adapted to place the front electrode layer. The on-line testing device and method for the insulation wire resistance of a thin-film solar cell provided by the present invention can be applicable to the detection of front electrode layers with various different segmentation distances and can realize on-line processing of defects.

Description

Technical Field

[0001] The present invention relates to the technical field of thin-film solar cells, and particularly to an on-line testing device and method for the insulation wire resistance of a thin-film solar cell. Background Art

[0002] A thin-film solar cell is a device that converts solar energy into clean electric energy and plays an active role in the strategy of realizing the sustainable development of mankind. It can be seen that in the near future, as the cost of thin-film solar cells gradually decreases, the proportion of clean electric energy provided by them in the total global power consumption will gradually increase.

[0003] A thin-film solar cell includes a front electrode layer, a functional layer (PN junction or PIN junction), and a back electrode. After the front electrode layer is prepared, it needs to be effectively segmented to form multiple front electrode blocks. After segmentation, it is ensured that the area of each front electrode block is equal and two adjacent front electrode blocks are insulated from each other. Two front electrode blocks that are not completely insulated will result in the lack of an effective power generation area and reduce the photoelectric conversion efficiency of the thin-film solar cell. At this time, the front electrode layer needs to be re-segmented.

[0004] Existing devices generally have multiple probes with fixed spacings. The probes are externally connected to a power supply and are connected in series with an ammeter. The insulation wire resistance is calculated through the voltage value and current value between adjacent probes: if the ammeter cannot detect the current or the calculated insulation wire resistance is greater than the preset resistance value, it is qualified; if the calculated insulation wire resistance is less than the preset resistance value, it is unqualified. This structure can only test the insulation resistance at a fixed distance. Once the segmentation distance of the front electrode layer changes, the testing device cannot meet the testing of all insulation wires; in addition, after testing, if the insulation performance does not meet the standard, only rework can be carried out and on-line post-processing is not possible. Summary of the Invention

[0005] Therefore, the technical problem to be solved by the present invention is to overcome the defect that the related devices in the prior art cannot adapt to solar thin-film cells with different segmentation distances and cannot perform on-line post-processing, so as to provide an on-line testing device and method for the insulation wire resistance of a thin-film solar cell.

[0006] To solve the above technical problem, an on-line testing device for the insulation wire resistance of a thin-film solar cell provided by the present invention includes:

[0007] A frame;

[0008] A support table adapted to support the front electrode layer;

[0009] A detection frame installed on the frame and located above the support table;

[0010] Two probes, both installed on the detection frame and having a fixed spacing therebetween. Both probes face the support table and are respectively adapted to abut against the areas on both sides of the same insulating wire;

[0011] The detection frame can move along the length direction of the support table and / or the support table is provided with a support member that can move along its length direction, and the support member is suitable for placing the front electrode layer.

[0012] Furthermore, the support table is provided with a support member that can move along its length direction, the detection frame is a roller rotatably mounted on the frame, and a plurality of probes are evenly distributed along the outer circumferential surface of the roller. The probes include:

[0013] A sleeve, arranged radially along the roller and fixed on the outer circumferential surface of the roller;

[0014] A probe, partially inserted into the sleeve and slidable along the sleeve;

[0015] A probe head, fixed at the end of the probe outside the sleeve;

[0016] A spring, pressed in the sleeve and suitable for driving the probe to slide in a direction away from the roller.

[0017] Furthermore, the detection frame is mounted on the frame and can be adjusted in elevation.

[0018] Furthermore, the probe head is spherical or crescent-shaped.

[0019] Furthermore, the detection frame can move along the length direction of the support table, and the probe is a detection wheel rotatably mounted on the detection frame.

[0020] Furthermore, the distance between two detection wheels is adjustable.

[0021] Furthermore, at least two detection frames are provided and distributed along the width direction of the support table, and all the probes on the same side of the insulating wire are connected in parallel.

[0022] Furthermore, it further includes:

[0023] A DC power supply, and each probe is connected to the DC power supply through a lead wire;

[0024] An ammeter, connected in series between two probes, suitable for detecting the current flowing through the probes;

[0025] A data processing module, suitable for calculating the corresponding resistance value according to the voltage value between two probes and the current value of the ammeter.

[0026] Furthermore, it further includes:

[0027] A controller, suitable for controlling the DC power supply to adjust the voltage between two probes to vaporize the conductive material at the defect point when the resistance value calculated by the data processing module is less than a preset resistance value.

[0028] The present invention also provides an on-line testing method for the insulation wire resistance of a thin-film solar cell, which is implemented based on the aforementioned on-line testing device for the insulation wire resistance of a thin-film solar cell, and specifically includes the following steps:

[0029] S1. Place the front electrode layer on the support table, and make the two probes respectively abut against the two side regions of the same insulating wire to detect the resistance of the insulating wire;

[0030] S2. When the detected resistance value is less than the preset resistance value, increase the voltage value between the two probes to vaporize and eliminate the conductive material at the defective position of the insulating wire, and then detect the resistance of the insulating wire again. If the detected resistance value is still less than the preset resistance value, continue to vaporize and eliminate the conductive material at the defective position of the insulating wire until the detected resistance value is greater than the preset resistance value; when the detected resistance value is greater than the preset resistance value, move the detection frame or the support member so that the two probes respectively abut against the two side regions of the next insulating wire to perform resistance detection, so as to complete the detection of the resistance of all insulating wires.

[0031] The technical solution of the present invention has the following advantages:

[0032] 1. The on-line testing device for the insulation wire resistance of a thin-film solar cell provided by the present invention is provided with two probes, which are respectively used to abut against the two side regions of the same insulating wire. When in use, an external voltage is applied, and the current between two adjacent probes is collected to calculate the resistance value, and it is judged whether the insulating wire is completely insulated after being segmented according to the relative size of the resistance value and the preset resistance value; furthermore, the detection frame can be movably installed on the frame or the support table is provided with a movable support member, which can realize the relative movement between the probe and the front electrode layer. For the front electrode layers with different segmentation distances, only need to place the two probes on both sides of the insulating wire to be detected in turn, and it can be applied to the detection of front electrode layers with a variety of different segmentation distances; in addition, in the existing device, since two probes are provided for all insulating wires and all probes operate synchronously, so if any two probes detect that there is a defect in the insulating wire, only rework can be carried out for treatment. In this application, a probe is provided for each insulating wire, and the detection of all insulating wires is realized through the relative movement between the probe and the front electrode layer. Therefore, when it is detected that there is a problem with the insulation, the voltage between the two probes can be changed, and the conductive material at the defective position can be vaporized by the thermal effect of a large current, so as to realize on-line treatment of the defect.

[0033] 2. The thin-film solar cell insulation line resistance online testing device provided by the present invention has a support table provided with a support member that can move along its length direction, and a detection frame is a roller rotatably mounted on the frame. Multiple probes are provided along the roller, and the probe includes a sleeve, a probe, a probe head, a spring, etc. When in use, only two probes are in contact with the front electrode layer and are in a working state, and the other probes are in a ready state. When the support member moves, the roller will also rotate. Through the extension and contraction of the probe and the adjustment of the roller speed, the two probes are controlled to be located on both sides of the lower insulation line. On the one hand, the probe is replaced by rotating, which avoids a lot of friction between the probe and the front electrode layer, and also avoids the friction of the probe on the insulation line, which can reduce the damage of the probe to the front electrode layer; on the other hand, the spring can ensure the elastic contact between the probe head and the front electrode layer, protecting the probe and the front electrode layer.

[0034] 3. In the online testing device for the insulation line resistance of a thin-film solar cell provided by the present invention, a detection frame is installed on a frame and can be adjusted to rise and fall. The distance between the probe head and the front electrode layer can be adjusted by adjusting the height of the detection frame. Since the probes are all arranged along the radial direction of the roller and the probes have an elastic structure, the distance between the two probes in the working state can be adjusted by adjusting the distance between the probe head and the front electrode layer, thereby making the device applicable to occasions with different insulation line widths, thereby improving the application range of the device.

[0035] 4. The thin-film solar cell insulation line resistance online testing device provided by the present invention has a probe head that is spherical or crescent-shaped, which can further reduce damage to the front electrode layer.

[0036] 5. The online testing device for the insulation wire resistance of a thin-film solar cell provided by the present invention, the detection frame can move along the length direction of the support platform, the probe is a detection wheel rotatably installed on the detection frame, and the detection of different insulation wire resistances is achieved through the movement of the detection frame. The probe and the front electrode layer are in rolling contact, which can avoid damage to the front electrode layer by the probe and also protect the probe.

[0037] 6. The thin-film solar cell insulation line resistance online testing device provided by the present invention has an adjustable distance between two detection wheels. This structure enables the device to be applicable to occasions with different insulation line widths, thereby increasing the application range of the device.

[0038] 7. The thin-film solar cell insulation line resistance online testing device provided by the present invention has at least two detection frames distributed along the width direction of the support platform. The detection frames can detect different positions in the width direction of the front electrode layer, thereby avoiding the misjudgment of large resistance values ​​caused by defects occurring at the far end when a single-row probe detects current.

[0039] 8. The on-line testing device for the insulation wire resistance of the thin-film solar cell provided by the present invention is provided with a DC power supply, an ammeter, a data processing module and a controller, and can realize automatic detection and defect processing.

[0040] 9. The on-line testing method for the insulation wire resistance of the thin-film solar cell provided by the present invention, because it is implemented based on the foregoing device, has any one of the advantages of the foregoing device. Description of the Drawings

[0041] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0042] Figure 1 It is a schematic structural diagram of the testing device in the first embodiment of the present invention;

[0043] Figure 2 It is Figure 1 a specific structure of the probe in the structure of the testing device shown;

[0044] Figure 3 It is Figure 1 another specific structure of the probe in the structure of the testing device shown;

[0045] Figure 4 It is a schematic structural diagram of the testing device in the second embodiment of the present invention;

[0046] Figure 5 It is Figure 4 an improved structure of the structure of the testing device shown to be applicable to a smaller segmentation distance;

[0047] Figure 6 It is a schematic diagram of the resistance calculation principle when two detection frames are adopted in the embodiment of the present invention;

[0048] Figure 7 It is a schematic diagram of the resistance calculation principle when a single detection frame is adopted in the embodiment of the present invention;

[0049] Figure 8 It is a flowchart of the testing method in the first embodiment of the present invention.

[0050] Description of the Reference Numerals:

[0051] 1, frame; 2, support table; 21, support member; 22, support frame; 3, detection frame; 4, probe; 41, sleeve; 42, probe; 43, probe head; 44, spring; 45, annular end cover; 46, baffle. Detailed Embodiments

[0052] The technical solution of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all of them. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative work shall fall within the protection scope of the present invention.

[0053] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus cannot be construed as a limitation to the present invention. In addition, the terms "first", "second", and "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0054] In the description of the present invention, it should be noted that unless otherwise clearly specified and limited, the terms "installation", "connection", and "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0055] In addition, the technical features involved in different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0056] Embodiment 1

[0057] Combined Figure 1 and Figure 4 As shown, the on-line test device for the insulation resistance of the thin-film solar cell provided in this embodiment includes a frame 1, a support table 2, a detection frame 3, and a probe 4.

[0058] Among them, the frame 1 mainly plays a role of hardware support and can be fixedly connected to the support table 2 or can be independently set.

[0059] Among them, the support table 2 is suitable for supporting the front electrode layer, specifically a support frame 22 and a support member 21, and the support member 21 is used to place the front electrode layer.

[0060] Among them, the detection frame 3 is installed on the frame 1 and is located above the support table 2.

[0061] Among them, there are two probes 4, both of which are installed on the detection frame 3 and have a fixed distance therebetween. Both of the two probes 4 face the support table 2 and are respectively adapted to abut against the areas on both sides of the same insulating wire. The fixed distance here means that the distance is fixed in the working state, but it does not limit its adjustability in the non-working state.

[0062] Among them, the detection frame 3 can move along the length direction of the support table 2 and / or the support table 2 is provided with a support member 21 that can move along its length direction, and the support member 21 is adapted to place the front electrode layer. Specifically, it can be that the support table 2 does not move, and the detection frame 3 can move along the length direction of the support table 2. By moving the detection frame 3, the probe 4 is driven to move to different insulating wires of the front electrode layer, so as to complete the detection of the resistance of all insulating wires. For example Figure 4 as shown; it can also be that the detection frame 3 does not move, and the support table 2 is provided with a support member 21 that can move along its length direction. By moving the support member 21, different parts of the front electrode layer are driven to move under the probe 4, so as to complete the detection of the resistance of all insulating wires; or both the detection frame 3 and the support member 21 can move, and the detection of the resistance of all insulating wires is completed through the coordinated movement of the two.

[0063] The test device of this embodiment is provided with two probes 4 with a fixed distance therebetween, and the detection of the resistance of all insulating wires is completed by moving the probe 4 or moving the front electrode layer. As long as the distance between adjacent two front electrode blocks is less than the distance between the two probes 4 of this device, and twice the length of the front electrode block is greater than the distance between the two probes 4 of this device, then this device can be used to measure this front electrode layer. Compared with the existing detection structure, this device can be applied to the measurement of front electrode layers with various cutting distances, and has a wide application range; moreover, the probe 4 of this device only aims at the same insulating wire. If it is unqualified, the voltage between the probes 4 can be directly changed, and the conductive material at the defective part of the insulating wire is vaporized by the thermal effect of a large current, so as to complete the on-line treatment of the defect.

[0064] In this embodiment, referring to Figure 1, the support platform 2 is provided with a support member 21 that can move along its length direction. The detection frame 3 is a roller rotatably mounted on the frame 1. A plurality of probes 4 are evenly distributed along the outer circumferential surface of the roller, and the plurality means at least three. The probe 4 includes: a sleeve 41 arranged radially along the roller and fixed on the outer circumferential surface of the roller; a probe 42 partially inserted into the sleeve 41 and slidable along the sleeve 41; a probe head 43 fixed to the end of the probe 42 outside the sleeve 41; and a spring 44 pressed in the sleeve 41 and adapted to drive the probe 42 to slide away from the roller. In specific implementation, to save manpower, it is preferably to externally connect the support member 21 to driving members such as cylinders, linear motors, and electric push rods; specifically, a synchronous belt can be used as the support member 21, and the movement of the support member 21 is achieved through the transmission of the synchronous belt; or the support member 21 is slidably mounted on the frame 1 through a slide rail; or the support member 21 is directly mounted on the output end of a driving member such as a cylinder to complete the movement. To save manpower, it is preferably to externally connect the roller to a rotary driving member such as a rotary cylinder and a motor. Of course, in other embodiments, using manpower to drive the roller and the support member 21 also falls within the protection scope of this application. Of course, to maintain the structural connection relationship of the probe 42 sliding in the sleeve 41, a limiting member needs to be provided on the sleeve 41 to prevent the probe 42 from falling out of the sleeve 41. Specifically, it can be a protrusion on the inner wall of the sleeve 41 or an additional annular end cover 45, etc. For example Figure 2 and Figure 3 As shown in, an annular end cover 45 is fixed at the end of the sleeve 41. The probe 42 passes through it and a baffle 46 is fixed at the inner end. The diameter of the baffle 46 is larger than that of the probe 42 to limit the spring 44, and the diameter of the baffle 46 is larger than the inner hole diameter of the end cover to prevent slipping. The fixing method of the probe head 43 at the end of the probe 42 can be fixed connection such as welding and bolts, or integrally formed.

[0065] The above solution uses the support member 21 as the active part to realize the relative movement between the front electrode layer and the probe 4. When in use, after the resistance of one insulating wire is detected, the support member 21 moves so that the next insulating wire is located below the axis of the roller. While the support member 21 moves, the roller also rotates at a certain speed so that when the next insulating wire moves into place, the two probes 4 just abut against both sides of the insulating wire. By controlling the moving speed of the support member 21 and the rotating speed of the roller, the detection of the front electrode layer with different segmentation distances can be realized. This preferred structure has two additional advantages: First, through the rotation of the roller, the sliding distance of each probe 4 on the front electrode layer is much smaller than the length of a single front electrode block, and it will not slide across the insulating wire, thus greatly reducing the damage of the probe 4 to the front electrode layer and protecting the probe 4 at the same time; Second, the probe 4 of this structure is an elastic structure, which can ensure the close contact between the probe 4 and the front electrode layer, and further protect the probe 4 and the front electrode layer.

[0066] As a further improvement of the above structure, the detection frame 3 is liftably installed on the frame 1. To save manpower, it is preferred to externally connect the support member 21 to a driving member such as a cylinder, a linear motor, or an electric push rod. If the detection frame 3 cannot be lifted, the distance between the two probes 4 during operation is fixed. In this case, when the splitting distance is small, there may be a situation where there are two insulating wires between the two probes 4, and when the width of the insulating wire is large, there may be a situation where the distance between the probes 4 is not applicable. Therefore, the detection frame 3 is designed to be liftable, so that the lifting of the detection frame 3 in cooperation with the elastic structure of the probes 4 can adjust the distance between the two probes 4 during the working state, thereby further expanding the applicable range of the device. In addition, the detection frame 3 being liftable is also beneficial to the installation of the front electrode layer.

[0067] Referring to Figure 2 and Figure 3 , preferably, the probe head 43 is spherical or crescent-shaped. The spherical or crescent-shaped surface is relatively smooth, which can further reduce the damage to the front electrode layer.

[0068] As a preferred structure of the detection frame 3, the detection frame 3 is provided with at least two and distributed along the width direction of the support table 2, and all the probes 4 located on the same side of the insulating wire are connected in parallel. This structure can avoid misjudgment of too large resistance values caused by defects located at the far end.

[0069] The following is a detailed explanation of this principle:

[0070] Referring to Figure 6 and Figure 7 , A1 and B1 are two probes 42 on the terminal 1, A2 and B2 are two probes 42 on the terminal 2; A3 is the probe 42 on the terminal 3, A4 is the probe 42 on the terminal 4; M and M' are the points where the etching defects occur, and it is assumed that the positions of M and M' are the same; RMA1 is the resistance between M and A1, and so on. Then the resistance between the terminal 1 and the terminal 2:

[0071]

[0072] The resistance between the terminal 3 and the terminal 4:

[0073] R 34 = R M′A3 + R M′ + R M′A4

[0074] It can be known that R12 < R34. Once a defect point occurs, the data analysis outputs a smaller value of resistance, which can more intuitively judge the existence of the defect.

[0075] As a further improvement of the above technical solution, it further includes:

[0076] A DC power supply, and each probe 4 is connected to the DC power supply through a lead;

[0077] An ammeter, connected in series between two probes 4, is adapted to detect the current flowing through the probes 4;

[0078] A data processing module is adapted to calculate the corresponding resistance value according to the voltage value between the two probes 4 and the current value of the ammeter.

[0079] During use, the operator directly judges according to the displayed resistance value of the data processing module and the preset resistance value, and then can know whether there is a defect in the insulating wire at that place: if the displayed resistance value is greater than the preset resistance value, it is qualified; if the displayed resistance value is less than the preset resistance value, it is unqualified.

[0080] Furthermore, it further includes:

[0081] A controller is adapted to control the DC power supply to adjust the voltage between the two probes 4 to vaporize the conductive material at the defect point when the resistance value calculated by the data processing module is less than the preset resistance value.

[0082] The controller can automatically process the defect according to the resistance value calculated by the data processing module, with a higher degree of automation.

[0083] Specifically, for the convenience of positioning the front electrode layer on the support 21, a cylinder is fixed on the support table 2, and the front electrode layer is positioned by the cylinder to ensure that the probes 4 can be located on both sides of the front electrode layer during subsequent detection.

[0084] Specifically, when the number of product insulating wires is large, multiple detection frames 3 of the same specification can be configured in the device to reduce the test time.

[0085] It should be noted that in the present invention, the length direction of the support table 2 is the length direction of the front electrode layer, that is, the direction perpendicular to the insulating wire; the width direction of the support table 2 is the width direction of the front electrode layer, that is, the direction where the insulating wire is located.

[0086] Refer to Figure 8 , based on the above structure, the test method of the test device in this embodiment includes the following steps:

[0087] S1. The product enters the support table 2 and is fixed on the support 21;

[0088] S2. The roller moves to directly above the first insulating wire according to the coordinate position;

[0089] S3. The roller drops a fixed distance so that two adjacent probe heads 43 fall on both sides of the first insulating wire;

[0090] S4. Detect the current, feedback the resistance value, and determine whether it meets the standard: If it meets the standard, the roller rotates by a fixed angle, and the support member 21 moves a fixed distance, so that the adjacent two probe heads 43 fall on both sides of the next insulating wire, and repeat the test operation; If it does not meet the standard, adjust the voltage difference between the adjacent two probe heads 43 to a high voltage difference, perform post-treatment on the non-compliant insulating wire, detect the current again after the treatment, feedback the resistance value, and continue the treatment until it meets the standard if it does not meet the standard;

[0091] S5. After all the insulating wires are tested, the product flows out of the equipment, the roller rises to the initial height and returns to the specified coordinate position, and at the same time returns to the initial angle, waiting for the next product to flow into the equipment for testing.

[0092] Embodiment 2

[0093] The difference between this embodiment and Embodiment 1 is only that the structure of the probe 4 and the installation method of the detection frame 3 are different.

[0094] Refer to Figure 4 , the detection frame 3 can move along the length direction of the support table 2, and the probe 4 is a detection wheel rotatably installed on the detection frame 3. The movement setting of the detection frame 3 on the support table 2 can refer to the movement setting structure of the support member 21 on the support table 2 described above, and will not be elaborated here.

[0095] The above solution adopts the method of keeping the support member 21 stationary and moving the detection frame 3. When in use, after detecting the resistance of an insulating wire, the detection frame 3 moves to drive the two detection wheels to move until they move to the position of the next insulating wire and the two detection wheels are separated on both sides of the insulating wire, and measure the resistance of this insulating wire, so as to complete the measurement of the resistance of all insulating wires. This preferred solution has an additional advantage: the probe 4 of this structure is a detection wheel, and the contact between the detection wheel and the front electrode layer is a rolling contact, which will reduce the friction force compared with the sliding contact, thereby further reducing the damage to the front electrode layer.

[0096] As a further improvement of the above technical solution, the distance between the two detection wheels is adjustable. If the distance between the two detection wheels is not adjustable, there may be a situation where there are two insulating wires between the two detection wheels when the segmentation distance is small, and there may be a situation where the detection wheel spacing is not applicable when the width of the insulating wire is large. Therefore, if the distance between the two detection wheels is adjustable, it can be applicable to the situation of a smaller segmentation distance or a larger insulating wire width, thereby further expanding the applicable range of this device.

[0097] Refer to Figure 5 , add a module on the detection frame 3, select a detection wheel with a smaller diameter, and install it at the lower end of the module. This structure is applicable to the situation of a smaller segmentation distance.

[0098] Specifically, to facilitate the installation of the front electrode layer, the detection frame 3 can be set as a liftable structure.

[0099] Based on the above structure, the test method of the test device in this embodiment includes the following steps:

[0100] S1. The product enters the support table 2 and is fixed on the support table 2;

[0101] S2. The detection frame 3 moves to directly above the first insulating wire according to the coordinate position;

[0102] S3. The detection frame 3 drops a fixed distance so that two adjacent detection wheels fall on both sides of the first insulating wire;

[0103] S4. Detect the current, feedback the resistance value, and judge whether it meets the standard: If it meets the standard, the detection frame 3 moves a fixed distance so that two adjacent detection wheels fall on both sides of the next insulating wire, and repeat the test operation; If it does not meet the standard, adjust the voltage difference between two adjacent detection wheels to a high voltage difference, perform post-treatment on the non-compliant insulating wire, detect the current again after the treatment, feedback the resistance value, and continue the treatment until it meets the standard if it does not meet the standard;

[0104] S5. After all the insulating wires are tested, the product flows out of the device, the detection frame rises to the initial height and returns to the specified coordinate position, waiting for the next product to flow into the device for testing.

[0105] It should be noted that Embodiment 1 and Embodiment 2 are only two preferred solutions. In other embodiments, two conventional probes 4 can also be used to replace the detection wheels in the second solution, or the support member 21 can be set to be movable after using two conventional probes 4 to replace the detection wheels in the second solution, or other easily conceivable deformations.

[0106] Obviously, the above embodiments are only examples given for clear illustration, and are not limitations on the implementation manners. For those of ordinary skill in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to enumerate all the implementation manners here. And the obvious changes or modifications derived therefrom still fall within the protection scope of the present invention.

Claims

1. An on-line testing device for the insulation wire resistance of a thin-film solar cell, characterized in that, it includes: a frame (1); a support table (2), adapted to support the front electrode layer; a detection frame (3), mounted on the frame (1) and located above the support table (2); two probes (4), both mounted on the detection frame (3) and having a fixed spacing therebetween, and both probes (4) are oriented towards the support table (2) and are respectively adapted to abut against areas on both sides of the same insulating wire; a DC power supply, and each probe (4) is connected to the DC power supply through a lead wire; an ammeter, connected in series between the two probes (4), adapted to detect the current flowing through the probes (4); the detection frame (3) can move along the length direction of the support table (2) and / or the support table (2) is provided with a support member (21) that can move along its length direction, and the support member (21) is adapted to place the front electrode layer; the detection frame (3) is provided with at least two and is distributed along the width direction of the support table (2), and are respectively located at both ends of the width direction of the support table (2); all the probes (4) on the same side of the insulating wire are connected in parallel.

2. The on-line testing device for the insulation wire resistance of a thin-film solar cell according to claim 1, characterized in that, the support table (2) is provided with a support member (21) that can move along its length direction, the detection frame (3) is a roller rotatably mounted on the frame (1), and a plurality of the probes (4) are evenly distributed along the outer circumferential surface of the roller, and the probes (4) include: a sleeve (41), arranged along the radial direction of the roller and fixed on the outer circumferential surface of the roller; a probe (42), partially inserted into the sleeve (41) and slidable along the sleeve (41); a probe head (43), fixed at the end of the probe (42) outside the sleeve (41); a spring (44), pressed in the sleeve (41) and adapted to drive the probe (42) to slide in a direction away from the roller.

3. The on-line testing device for the insulation wire resistance of a thin-film solar cell according to claim 2, characterized in that, the detection frame (3) is mounted on the frame (1) and can be adjusted in elevation.

4. The on-line testing device for the insulation wire resistance of a thin-film solar cell according to claim 2, characterized in that, the probe head (43) is spherical or crescent-shaped.

5. The on-line testing device for the insulation wire resistance of a thin-film solar cell according to claim 1, characterized in that, the detection frame (3) can move along the length direction of the support table (2), and the probe (4) is a detection wheel rotatably mounted on the detection frame (3).

6. The on-line testing device for the insulation wire resistance of a thin-film solar cell according to claim 5, characterized in that, the distance between the two detection wheels is adjustable.

7. The on-line testing device for the insulation wire resistance of a thin-film solar cell according to any one of claims 1-6, characterized in that, it further includes: a data processing module, adapted to calculate the corresponding resistance value according to the voltage value between the two probes (4) and the current value of the ammeter.

8. The on-line testing device for the insulation wire resistance of a thin-film solar cell according to claim 7, Characterized in that, further comprising: a controller, adapted to control the DC power supply to adjust the voltage between the two probes (4) to vaporize the conductive material at the defect point when the resistance value calculated by the data processing module is less than a preset resistance value.

9. An on-line testing method for the insulation wire resistance of a thin-film solar cell, characterized in that, it is implemented based on the on-line testing device for the insulation wire resistance of the thin-film solar cell according to any one of claims 1-8, and specifically includes the following steps: S1. Place the front electrode layer on the support table (2), and make the two probes (4) respectively abut against the two side regions of the same insulation wire to detect the resistance of the insulation wire; S2. When the detected resistance value is less than the preset resistance value, increase the voltage value between the two probes (4) to vaporize and eliminate the conductive material at the defect position of the insulation wire, and then detect the resistance of the insulation wire. If the detected resistance value is still less than the preset resistance value, continue to vaporize and eliminate the conductive material at the defect position of the insulation wire until the detected resistance value is greater than the preset resistance value; when the detected resistance value is greater than the preset resistance value, move the detection frame (3) or the support member (21) so that the two probes (4) respectively abut against the two side regions of the next insulation wire to perform resistance detection, and thus complete the resistance detection of all insulation wires.

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