SMT first article test methods, devices, and computer equipment

Abstract

The embodiment of the present invention discloses an SMT first-piece test method, apparatus, computer equipment and computer storage medium, which distinguishes components to be tested in a component data document, determines the qualified measurement range of the components to be tested, wherein the components to be tested are measurement components or visual components, then obtains the coordinates of the components to be tested in the component data document, determines the test path of the components to be tested according to the coordinates of the components to be tested, and then tests the components to be tested in sequence according to the test path of the components to be tested; uses a computer device to plan the test path and provides path instructions for the staff's test, so that the staff is less likely to make mistakes when using an LCR instrument to test components on the SMT first-piece, and the staff's test efficiency is improved with the assistance of the computer equipment.

Description

Technical Field

[0001] The present invention relates to the field of surface mount testing technology, and in particular to an SMT first piece testing method, device, computer equipment and computer storage medium. Background Art

[0002] In surface mount manufacturing, the process involves attaching SMD components to a PCB (printed circuit board) using a machine and then soldering them in a high-temperature reflow oven. Before mass production, a small number of products (called first pieces) are typically mounted. The correctness of the SMD components is checked before soldering. This includes ensuring that the measured values of chip components like resistors, capacitors, and inductors match the BOM (bill of materials), that directional components are oriented correctly, and that the component silkscreen is correct.

[0003] The current method generally involves inspectors locating the corresponding components one by one on the first article according to the BOM sequence, then measuring the components with an LCR meter to see if the readings are consistent with the specification range on the BOM. This testing method is not only slow but also prone to errors. Therefore, it is necessary to change the method of inspectors testing components one by one on the first article according to the BOM sequence to improve the efficiency of SMT first-article testing and reduce the error rate. Summary of the Invention

[0004] To solve the existing technical problems, the embodiments of the present invention provide an SMT first-article test method, an apparatus, a computer device, and a computer storage medium.

[0005] To achieve the above-mentioned purpose, the technical solution of the embodiment of the present invention is implemented as follows:

[0006] An embodiment of the present invention provides an SMT first-article testing method, the method comprising:

[0007] Identifying a component to be tested in a component data file and determining a qualified measurement range of the component to be tested, wherein the component to be tested is a measurement component or a visual component;

[0008] Acquire the coordinates of the component to be tested in a component data file, and determine a test path of the component to be tested according to the coordinates of the component to be tested;

[0009] The components to be tested are tested in sequence according to the test paths of the components to be tested.

[0010] Preferably, the obtaining of the coordinates of the component to be tested in the component data file and determining the test path of the component to be tested according to the coordinates of the component to be tested includes:

[0011] Obtaining the coordinates of the component to be tested in the component data file, and determining the coordinate parent region of the component to be tested;

[0012] According to the coordinate mother region of the component to be tested, the coordinate mother region is evenly divided into a plurality of coordinate sub-regions along the Y axis;

[0013] Determine a starting point in each of the coordinate sub-areas, and calculate the distance between the coordinates of the component to be tested in each of the coordinate sub-areas and the starting point;

[0014] Obtaining a list of inspection items for the components to be tested in each coordinate sub-area according to ascending order of distances between the coordinates of the components to be tested in each coordinate sub-area and the starting point;

[0015] The inspection item lists in each of the coordinate sub-areas are arranged in order along the Y-axis direction to obtain a test list, and a test path of the component to be tested is determined according to the test list.

[0016] Preferably, testing the components to be tested in sequence according to the test paths of the components to be tested includes:

[0017] In response to the DUT being a measuring element, the gear of the test instrument is switched and the parameters of the test instrument are adjusted according to the transformation of the DUT on the test path of the DUT, and the DUT is tested in sequence along the test path.

[0018] Preferably, testing the components to be tested in sequence according to the test paths of the components to be tested includes:

[0019] In response to the DUT being a visual component, determining the direction of the silk screen printing on the surface of each DUT on the test path according to the transformation of the DUT on the test path;

[0020] In response to the component to be tested being a visual component, the gear of the test instrument is switched and the parameters of the test instrument are adjusted according to the transformation of the component to be tested on the test path of the component to be tested, and the components to be tested are tested in sequence along the test path.

[0021] Preferably, distinguishing the components to be tested in the component data file includes:

[0022] The measurement type components or the visual type components are distinguished in the component data document according to the regular expression calculation strategy.

[0023] Preferably, the method further comprises:

[0024] Obtaining the coordinates of the component to be tested in the component data file, and converting the coordinates of the component to be tested into pixel coordinates;

[0025] According to the pixel coordinates of the components to be tested, the components to be tested are superimposed and distributed on the silk screen;

[0026] The silk-screen image with the components to be tested superimposed and distributed is displayed on a screen.

[0027] Preferably, the testing of the components to be tested in sequence according to the test paths of the components to be tested further includes:

[0028] Testing the components to be tested in sequence according to the test paths of the components to be tested and recording the test results of the components to be tested;

[0029] Outputting a test document of the component to be tested according to the test result of the component to be tested.

[0030] An embodiment of the present invention further provides an SMT first article test device, comprising:

[0031] A first determination module is used to distinguish a component to be tested in a component data file and determine a qualified measurement range of the component to be tested;

[0032] A second determining module is configured to obtain the coordinates of the component to be tested from a component data file, and determine a test path of the component to be tested according to the coordinates of the component to be tested;

[0033] The testing module is used to test the components to be tested in sequence according to the test paths of the components to be tested.

[0034] An embodiment of the present invention further provides a computer device, comprising: a processor and a memory for storing a computer program that can be run on the processor, wherein the processor is configured to implement the SMT first article test method when running the computer program.

[0035] An embodiment of the present invention further provides a computer storage medium storing an executable program, wherein when the executable program is executed by a processor, the SMT first article test method is implemented.

[0036] The above-mentioned embodiments provide an SMT first-article test method, apparatus, computer equipment, and computer storage medium. The computer equipment plans a test path for the component to be tested based on the imported component data document of the SMT first-article to be tested. Then, the staff tests the component to be tested according to the test path under the path indication of the computer equipment. Compared with the prior art, this embodiment uses a computer equipment to plan the test path and provide path indications for the staff's testing, so that the staff is less likely to make mistakes when using an LCR instrument to test components on the SMT first-article. Moreover, the staff's testing efficiency is improved with the assistance of the computer equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 A flow chart of a testing method provided in one embodiment of the present invention.

[0038] Figure 2 A partial schematic diagram of a component data file provided by an embodiment of the present invention.

[0039] Figure 3 Schematic diagram of a testing method for evenly dividing a coordinate mother region into a plurality of coordinate sub-regions in accordance with an embodiment of the present invention.

[0040] Figure 4 Schematic diagram of a PDF file of inspection and test records output in one embodiment of the present invention.

[0041] Figure 5 A schematic diagram of a module of an SMT first article test device provided by an embodiment of the present invention.

[0042] Figure 6 A schematic diagram of a computer device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0043] The present invention will be further described in detail below with reference to the following examples. It should be understood that the specific examples described herein are only used to explain the present invention and are not intended to limit the present invention.

[0044] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this invention pertains. The terms used herein in the specification of the present invention are for the purpose of describing specific embodiments only and are not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0045] An SMT first-article test method provided in an embodiment of the present invention belongs to the field of surface mount test technology and can be used in scenarios such as SMT first-article testing. It is understood that in the prior art, the current method generally involves an inspector finding the corresponding component locations on the first article one by one according to the BOM sequence, measuring the components with an LCR meter to determine whether the LCR readings are consistent with the specification range on the BOM. This test is not only slow but also prone to errors.

[0046] Based on this, how to improve the efficiency of SMT first-article testing and reduce the error rate has become a technical problem that needs to be solved urgently.

[0047] It should be noted that the SMT first-article test is performed by a computer. The term "computer" here refers to any device with computing capabilities, including but not limited to fixed or mobile devices. Fixed devices include but are not limited to desktop computers or other computers, while mobile devices include but are not limited to mobile phones, tablets, wearable devices, or laptops.

[0048] The technical solution of the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0049] refer to Figure 1 , an embodiment of the present invention provides an SMT first-article test method, the method comprising the following steps:

[0050] Step S11: Identifying a component to be tested in the component data file and determining a qualified measurement range of the component to be tested, wherein the component to be tested is a measurement component or a visual component;

[0051] Step S12: obtaining the coordinates of the component to be tested in the component data file, and determining a test path of the component to be tested according to the coordinates of the component to be tested;

[0052] Step S13: testing the components to be tested in sequence according to the test paths of the components to be tested.

[0053] In some embodiments, the step 11, i.e., the component data document is pre-stored in a computer device, and the component data document includes column information such as component type, specification model, coordinates, reference value and error rate.

[0054] In some embodiments, the step 11, i.e., the component data file pre-stored in the computer device, can be imported using Kingdee Cloud ERP.

[0055] It is understandable that importing component data documents from Kingdee Cloud ERP has more advantages than importing component data documents from other texts. It simplifies the import operation steps to the greatest extent and avoids the defect of needing to sort out the BOM text format when it is not uniform in the component data document. Among them, the component data document is a combination of BOM (component bill of materials, which includes the component type, specification model, reference value and error rate and other column information) and coordinate document (component coordinate column information and blank sticker coordinate column information). You can refer to Figure 2 .

[0056] In some embodiments, the step 11 is to determine the qualified measurement range of the component to be tested, wherein the qualified measurement range of the component to be tested is mainly the upper and lower limits of the component reference value.

[0057] In some embodiments, the step S13 is to test the components to be tested in sequence according to the test path of the components to be tested. Specifically, after the computer device plans the test path, the staff tests the components to be tested according to the test path under the path indication of the computer device, wherein the test equipment used by the staff can be an LCR instrument.

[0058] Illustratively, in the above embodiment, the computer device plans the test path for the component to be tested based on the imported component data document of the SMT first piece to be tested, and then the staff tests the component to be tested according to the test path under the path indication of the computer device. Compared with the prior art, this embodiment uses the computer device to plan the test path and provide path indications for the staff's testing, so that the staff is less likely to make mistakes when using the LCR instrument to test the components on the SMT first piece, and the staff's testing efficiency is improved with the assistance of the computer equipment.

[0059] In some embodiments, obtaining the coordinates of the component to be tested in the component data file and determining the test path of the component to be tested according to the coordinates of the component to be tested includes:

[0060] Obtaining the coordinates of the component to be tested in the component data file, and determining the coordinate parent region of the component to be tested;

[0061] According to the coordinate mother region of the component to be tested, the coordinate mother region is evenly divided into a plurality of coordinate sub-regions along the Y axis;

[0062] Determine a starting point in each of the coordinate sub-areas, and calculate the distance between the coordinates of the component to be tested in each of the coordinate sub-areas and the starting point;

[0063] Obtaining a list of inspection items for the components to be tested in each coordinate sub-area according to ascending order of distances between the coordinates of the components to be tested in each coordinate sub-area and the starting point;

[0064] The inspection item lists in each of the coordinate sub-areas are arranged in order along the Y-axis direction to obtain a test list, and a test path of the component to be tested is determined according to the test list.

[0065] For example, in the process of determining the test path of the device to be tested, the specific principle is as follows: the coordinate mother area of the device to be tested is a rectangular area including all the devices to be tested, and then the coordinate mother area is evenly divided into a number of coordinate sub-areas Range (1), Range (2) ... along the Y axis. Figure 3 , wherein the interval is preferably 2.5 mm. Then, in the sub-area Range(1), the set of X coordinates of all components in the sub-area Range(1) is recorded as Range(1)_x, and the set of Y coordinates of all components in the sub-area Range(1) is recorded as Range(1)_y. Then, a starting point Start(x, y) is defined, wherein the x value takes the minimum value in Range(1)_x, and the y value takes the maximum value in Range(1)_y. Then, the distance between all components in the sub-area Range(1) and the starting point is calculated, and then the components are sorted in ascending order of the distance from the starting point to obtain a list of inspection items of all components in the sub-area Range(1). Thus, the test path of all components in the sub-area Range(1) is obtained. According to the above principle, the test paths of other sub-areas are obtained in turn, which are the test paths of the components to be tested in the mother area.

[0066] In some embodiments, testing the DUT in sequence according to the test path of the DUT includes:

[0067] In response to the fact that the component to be tested is a measurement type component, the gear of the test instrument is switched and the parameters of the test instrument are adjusted according to the transformation of the component to be tested on the test path of the component to be tested, and the components to be tested are tested in sequence along the test path. During the test of each component to be tested, the coordinates of each component to be tested are announced by voice, and after the test is completed, the test results of each component to be tested are announced by voice.

[0068] It should be noted that when workers test various components, this embodiment uses the test path of the component to be tested to automatically point to the next component to be measured in the component data file. The component data file and the pointing identifier are displayed on the computer screen. At the same time, the test instrument gear can be switched and the test instrument parameters can be adjusted to suit the next component to be tested. The test instrument gear switching and parameter adjustment are automatically completed, eliminating the need for manual switching and adjustment of the test instrument parameters. The test results of the completed components can be voice broadcasted, eliminating the need for manual review of the test results, saving testing time and improving testing efficiency. After implementation, inspection time was reduced to 10%-50% of the original time, and the more components there are, the greater the time savings.

[0069] In some embodiments, testing the DUT in sequence according to the test path of the DUT includes:

[0070] In response to the DUT being a visual component, judging the surface printing and orientation of each DUT on the test path according to the transformation of the DUT on the test path;

[0071] In response to the fact that the component to be tested is a visual component, the gear of the testing instrument is switched and the parameters of the testing instrument are adjusted according to the transformation of the component to be tested on the test path of the component to be tested, and the components to be tested are tested in sequence along the test path. During the test of each component to be tested, the coordinates of each component to be tested are announced by voice, and after the test is completed, the test results of each component to be tested are announced by voice.

[0072] In some embodiments, determining the surface printing and orientation of each of the components to be tested on the test path includes:

[0073] The surface printing and direction of each of the components to be tested on the test path are determined according to the historical record library.

[0074] It should be noted that in the above embodiment, the historical records are the test records of the past, and the direction check and silk screen inspection are also included in the inspection items, making the component test more comprehensive. Specifically, when pointing to a component to be measured in the component data file, the component data file and the pointing mark will be displayed on the computer screen. The staff needs to enter the silk screen on the surface of this component (if there is no silk screen, enter "-"). The computer device will call the correct historical record for comparison. If the silk screen is different, the operator will be prompted to confirm. If the operator confirms that it is correct, then this silk screen will be added to the historical record library as a new silk screen for future comparison. At the same time, when testing visual components, if the component has a direction, the direction needs to be entered (if there is no direction, enter "-"), and the computer device will call the historical record for comparison and make a judgment.

[0075] In some embodiments, distinguishing the components to be tested in the component data file includes:

[0076] The measurement type components or the visual type components are distinguished in the component data document according to the regular expression calculation strategy.

[0077] Exemplarily, when distinguishing between the measurement type components and the visual type components, regular expressions are used to distinguish the measurement type components, and a qualified measurement range is given for the measurement type components. The main characteristic expressions of the regular expression are matching capacitance expression, matching inductance expression, matching resistance expression, matching error value expression and matching withstand voltage expression. Components that can match the above characteristic expressions in the BOM are classified as measurement type, components that are in the coordinate document but not in the BOM are classified as blank stickers (that is, the blank stickers only have coordinate column information in the component data document, because the blank stickers do not have column information such as type, specification model, reference value and error rate), and other components are classified as visual type. Specifically, the regular expression can refer to the following table:

[0078]

[0079] In some embodiments, the method further comprises:

[0080] Obtaining the coordinates of the component to be tested in the component data file, and converting the coordinates of the component to be tested into pixel coordinates;

[0081] According to the pixel coordinates of the components to be tested, the components to be tested are superimposed and distributed on the silk screen;

[0082] The silk-screen image with the components to be tested superimposed and distributed is displayed on a screen of a computer device.

[0083] For example, the components to be tested are superimposed and distributed on a silk-screen diagram and displayed on a screen of a computer device, which helps the staff to intuitively see the distribution positions of the components to be tested, thereby improving the test efficiency and accuracy.

[0084] Preferably, the testing of the components to be tested in sequence according to the test paths of the components to be tested further includes:

[0085] Testing the components to be tested in sequence according to the test paths of the components to be tested and recording the test results of the components to be tested;

[0086] Outputting a test document of the component to be tested according to the test result of the component to be tested.

[0087] Specifically, after all inspection and test items are completed, the PDF file of the inspection and test record will be output. This file will be automatically named with "date time + material number + model name + line font" and archived. Figure 4 .

[0088] like Figure 5 As shown, an embodiment of the present invention further provides an SMT first-article test device, including a first determination module 51, a second determination module 52 and a test module 53, wherein the first determination module 51 is used to distinguish the components to be tested in the component data document, and determine the measurement qualified range of the components to be tested; the second determination module 52 is used to obtain the coordinates of the components to be tested in the component data document, and determine the test path of the components to be tested according to the coordinates of the components to be tested; the test module 53 is used to test the components to be tested in sequence according to the test path of the components to be tested.

[0089] In some embodiments, the first determining module 51 is specifically configured to:

[0090] Identifying a component to be tested in a component data file and determining a qualified measurement range of the component to be tested, wherein the component to be tested is a measurement component or a visual component;

[0091] In some embodiments, the first determining module 51 is further configured to:

[0092] The measurement type components or the visual type components are distinguished in the component data document according to the regular expression calculation strategy.

[0093] The second determining module 52 is configured to:

[0094] Acquire the coordinates of the component to be tested in a component data file, and determine a test path of the component to be tested according to the coordinates of the component to be tested;

[0095] The second determining module 52 is further configured to:

[0096] Based on the image information of the target agricultural land, the contours of the topography such as the pits and / or slopes of the target agricultural land and the coordinate information of each vertex of the contours are determined.

[0097] In some embodiments, the second determining module 23 is specifically configured to:

[0098] Obtaining the coordinates of the component to be tested in the component data file, and determining the coordinate parent region of the component to be tested;

[0099] According to the coordinate mother region of the component to be tested, the coordinate mother region is evenly divided into a plurality of coordinate sub-regions along the Y axis;

[0100] Determine a starting point in each of the coordinate sub-areas, and calculate the distance between the coordinates of the component to be tested in each of the coordinate sub-areas and the starting point;

[0101] Obtaining a list of inspection items for the components to be tested in each coordinate sub-area according to ascending order of distances between the coordinates of the components to be tested in each coordinate sub-area and the starting point;

[0102] The inspection item lists in each of the coordinate sub-areas are arranged in order along the Y-axis direction to obtain a test list, and a test path of the component to be tested is determined according to the test list.

[0103] The testing module 53 is used to:

[0104] Testing the components to be tested in sequence according to the test paths of the components to be tested;

[0105] The testing module 53 is further configured to:

[0106] In response to the component under test being a measurement type component, according to the transformation of the component under test on the test path of the component under test, the gear of the test instrument is switched and the parameters of the test instrument are adjusted, and the components under test are tested in sequence along the test path, wherein during the test of each component under test, the coordinates of each component under test are announced by voice, and after the test is completed, the test results of each component under test are announced by voice;

[0107] The testing module 53 is further configured to:

[0108] In response to the DUT being a visual component, judging the surface printing and orientation of each DUT on the test path according to the transformation of the DUT on the test path;

[0109] In response to the component under test being a visual component, switching gears of a testing instrument and adjusting parameters of the testing instrument according to the transformation of the component under test on the testing path of the component under test, and testing the components under test in sequence along the testing path, wherein during the testing of each component under test, the coordinates of each component under test are announced by voice, and after the test is completed, the test results of each component under test are announced by voice;

[0110] The testing module 53 is further configured to:

[0111] Testing the components to be tested in sequence according to the test paths of the components to be tested and recording the test results of the components to be tested;

[0112] Outputting a test document of the component to be tested according to the test result of the component to be tested.

[0113] It should be noted that the description of the area measurement device described above is similar to the description of the agricultural land area measurement method described above, and the beneficial effects of the same method will not be repeated here. For technical details not disclosed in the embodiment of the area measurement device of the present invention, please refer to the description of the agricultural land area measurement method embodiment of the present invention.

[0114] The SMT first article testing device further includes a display module 54 for:

[0115] Obtaining the coordinates of the component to be tested in the component data file, and converting the coordinates of the component to be tested into pixel coordinates;

[0116] The components to be tested are superimposed and distributed on the silk-screen pattern according to the pixel coordinates of the components to be tested.

[0117] like Figure 6 As shown, an embodiment of the present invention further provides a computer device, comprising a processor 61 and a memory 62 for storing a computer program that can be run on the processor, wherein the processor is used to implement the SMT first-article test method when running the computer program.

[0118] In some embodiments, the memory 62 in the embodiments of the present invention may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. The non-volatile memory may be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), or a flash memory. The volatile memory may be a random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of RAM are available, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate synchronous DRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), and direct RAM bus RAM (DRRAM). The memory 62 of the systems and methods described herein is intended to include, but is not limited to, these and any other suitable types of memory.

[0119] Processor 61 may be an integrated circuit chip with signal processing capabilities. During implementation, each step of the above method can be completed by hardware integrated logic circuits or software instructions within processor 61. The processor 61 may be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA), or other programmable logic device, discrete gate or transistor logic device, or discrete hardware component. It can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of the present invention. A general-purpose processor may be a microprocessor or any conventional processor. The steps of the methods disclosed in conjunction with the embodiments of the present invention can be directly implemented and executed by a hardware decoding processor, or by a combination of hardware and software modules within the decoding processor. The software modules can be located in a storage medium well-known in the art, such as random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, or registers. This storage medium is located in memory 62. Processor 61 reads information from memory 62 and, in conjunction with its hardware, completes the steps of the above method.

[0120] In some embodiments, the embodiments described herein may be implemented using hardware, software, firmware, middleware, microcode, or a combination thereof. For hardware implementation, the processing unit may be implemented in one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), general-purpose processors, controllers, microcontrollers, microprocessors, other electronic units for performing the functions described herein, or a combination thereof.

[0121] For software implementation, the techniques described herein can be implemented by modules (e.g., procedures, functions, etc.) that perform the functions described herein. The software code can be stored in a memory and executed by a processor. The memory can be implemented in the processor or external to the processor.

[0122] Another embodiment of the present invention provides a computer storage medium, which stores an executable program. When the executable program is executed by the processor 61, the steps applied to the SMT first article test method can be implemented. For example, Figure 1 One or more of the methods shown.

[0123] In some embodiments, the computer storage medium may include: a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, etc., various media that can store program codes.

[0124] It should be noted that the technical solutions described in the embodiments of the present invention can be arbitrarily combined without conflict.

[0125] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any modifications or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in the present invention should be included in the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be based on the scope of protection of the claims.

Claims

1. A SMT first article testing method, characterized in that: The method comprises: Identifying a component to be tested in a component data file and determining a qualified measurement range of the component to be tested, wherein the component to be tested is a measurement component and / or a visual component; Acquire the coordinates of the component to be tested in a component data file, and determine a test path of the component to be tested according to the coordinates of the component to be tested; Testing the components to be tested in sequence according to the test paths of the components to be tested; The step of obtaining the coordinates of the component to be tested from the component data file and determining a test path of the component to be tested according to the coordinates of the component to be tested includes: Obtaining the coordinates of the component to be tested in the component data file, and determining the coordinate parent region of the component to be tested; According to the coordinate mother region of the component to be tested, the coordinate mother region is evenly divided into a plurality of coordinate sub-regions along the Y axis; Determine a starting point in each of the coordinate sub-areas, and calculate the distance between the coordinates of the component to be tested in each of the coordinate sub-areas and the starting point; Obtaining a list of inspection items for the components to be tested in each coordinate sub-area according to ascending order of distances between the coordinates of the components to be tested in each coordinate sub-area and the starting point; The inspection item lists in each of the coordinate sub-areas are arranged in order along the Y-axis direction to obtain a test list, and a test path of the component to be tested is determined according to the test list.

2. The method according to claim 1, characterized in that The step of testing the components to be tested in sequence according to the test paths of the components to be tested includes: In response to the DUT being a measuring element, the gear of the test instrument is switched and the parameters of the test instrument are adjusted according to the transformation of the DUT on the test path of the DUT, and the DUT is tested in sequence along the test path.

3. The method according to claim 1, characterized in that The step of testing the components to be tested in sequence according to the test paths of the components to be tested includes: In response to the DUT being a visual component, judging the surface printing and orientation of each DUT on the test path according to the transformation of the DUT on the test path; In response to the component to be tested being a visual component, the gear of the test instrument is switched and the parameters of the test instrument are adjusted according to the transformation of the component to be tested on the test path of the component to be tested, and the components to be tested are tested in sequence along the test path.

4. The method according to claim 1, wherein The step of distinguishing the components to be tested in the component data document includes: The measurement-type components and / or the visual-type components are distinguished in the component data document according to a regular expression calculation strategy.

5. The method according to claim 1, wherein The method further comprises: Obtaining the coordinates of the component to be tested in the component data file, and converting the coordinates of the component to be tested into pixel coordinates; According to the pixel coordinates of the components to be tested, the components to be tested are superimposed and distributed on the silk screen; The silk-screen image with the components to be tested superimposed and distributed is displayed on a screen.

6. The method according to claim 1, characterized in that The testing of the components to be tested in sequence according to the test paths of the components to be tested further includes: Testing the components to be tested in sequence according to the test paths of the components to be tested and recording the test results of the components to be tested; Outputting a test document of the component to be tested according to the test result of the component to be tested.

7. An SMT first article test device, comprising: A first determination module is used to distinguish a component to be tested in a component data file and determine a qualified measurement range of the component to be tested; A second determining module is configured to obtain the coordinates of the component to be tested from a component data file, and determine a test path of the component to be tested according to the coordinates of the component to be tested; A testing module, configured to test the components to be tested in sequence according to the test paths of the components to be tested; The second determining module is configured to: Acquire the coordinates of the component to be tested in a component data file, and determine a test path of the component to be tested according to the coordinates of the component to be tested; The test path includes: Obtaining the coordinates of the component to be tested in the component data file, and determining the coordinate parent region of the component to be tested; According to the coordinate mother region of the component to be tested, the coordinate mother region is evenly divided into a plurality of coordinate sub-regions along the Y axis; Determine a starting point in each of the coordinate sub-areas, and calculate the distance between the coordinates of the component to be tested in each of the coordinate sub-areas and the starting point; Obtaining a list of inspection items for the components to be tested in each coordinate sub-area according to ascending order of distances between the coordinates of the components to be tested in each coordinate sub-area and the starting point; The inspection item lists in each of the coordinate sub-areas are arranged in order along the Y-axis direction to obtain a test list, and a test path of the component to be tested is determined according to the test list.

8. A computer device, characterized in that: include: A processor and a memory for storing a computer program that can be run on the processor, wherein the processor is used to implement the SMT first-article test method according to any one of claims 1 to 6 when running the computer program.

9. A computer storage medium, characterized in that An executable program is stored, and when the executable program is executed by a processor, the SMT first-article test method according to any one of claims 1 to 6 is implemented.

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