A device for testing the high overload resistance of electronic components

Abstract

The present invention discloses a device for testing the high overload resistance of electronic components, comprising: a body, the interior of which includes a first cavity and a second cavity that are interconnected; an upper cover, which is detachably connected to one axial end of the body; a power supply, which is installed in the first cavity; a pressing cover, which is arranged between the upper cover and the power supply, with one end of the pressing cover abutting the upper cover and the other end abutting the power supply; a test recording device, which is installed in the first cavity, the test recording device is located below the power supply and is electrically connected to the power supply; a bottom cover, which is detachably connected to the other axial end of the body; and an electronic component, which is installed on the bottom cover and located in the second cavity, and the electronic component is signal-connected to the test recording device. The test device provided by the present invention has a compact structure and improves test accuracy and efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic component testing, and in particular to a device for testing the high overload resistance characteristics of an electronic component. Background Art

[0002] With the development of intelligent ammunition and the continuous increase in firing speed, higher requirements are being placed on the adaptability of the electronic components that control and implement these intelligent components under high shock and high overload conditions. Electronic components may fail under high overload shocks due to component damage or fracture and deformation of metal structures. During the prototype development and verification phase, extensive high-overload shock testing is required to conduct thorough verification and analysis to provide a theoretical basis for further live-fire testing. To evaluate the high-overload resistance of electronic components, a modular and universal electronic component high-overload resistance testing device was invented.

[0003] The invention patent "A New Air Cannon Equivalent Loading Test Device" (CN 105841559 A) proposes an air cannon equivalent loading test device, which obtains impact overload through the collision between the air cannon loaded projectile and the overload simulation projectile, and the test signal is led out through the overload simulation projectile swing line, thereby reducing the test cost and improving operability. This method acts on the air cannon loaded projectile by adjusting the air cannon pressure, and then obtains a high overload impact through mechanical collision. The overload of the test piece cannot be directly controlled. The overload action process is suitable for the study of the endpoint effect of penetration, and cannot equivalently simulate the effect of electronic components being subjected to overload in the barrel during launch. Practical application still has certain limitations.

[0004] The invention patent "A High-Overload Test Device and Method for Inertial Devices" (CN 110440829 A) provides a high-overload test device and method for inertial devices. This device is driven by a propellant charge, with projectile launch and launch parameter control controlled by turret input. After launch, the test projectile's flight information is determined by a ground-based electro-optical tracking and aiming system, and its operational information is obtained through a high-precision measurement system within the projectile. After reaching its highest point, the projectile is decelerated and recovered using outer wings and a parachute.

[0005] This method is costly, difficult to implement in engineering, and close in complexity to live-fire testing. It has poor repeatability and is not suitable for the reciprocating stage of early product research.

[0006] The invention patent "High Impact Acceleration Test System and Method" (CN 110441020 A) provides a high impact acceleration test system and method. This method uses a test projectile to collide with a Hopkinson bar incident rod, and in conjunction with the test system, records the impact environment and characteristics. This method subjects the test piece to two impact overloads: launch overload and collision overload. The weight of the test piece is limited, and the overload pulse width differs significantly from the actual projectile load environment, making it suitable for preliminary overload verification of components.

[0007] The above patents have certain limitations in practical use, which is why the present invention is developed. Summary of the Invention

[0008] Based on the above problems, the present invention aims to provide an electronic component high overload resistance characteristic testing device, which can be used for high overload resistance characteristic testing of electronic components.

[0009] In order to solve the problems in the prior art, the technical solution provided by the present invention is:

[0010] A device for testing the high overload resistance of an electronic component, comprising:

[0011] The elastic body includes a first cavity and a second cavity which are interconnected;

[0012] an upper cover detachably connected to one axial end of the elastic body;

[0013] a power supply installed in the first cavity;

[0014] a pressing cover, which is arranged between the upper cover and the power supply, with one end of the pressing cover abutting against the upper cover and the other end abutting against the power supply;

[0015] a test recording device installed in the first cavity, the test recording device being located below the power supply and electrically connected to the power supply;

[0016] a bottom cover detachably connected to the other axial end of the elastic body; and

[0017] An electronic component is mounted on the bottom cover and located in the second cavity, and the electronic component is signal-connected to the test and recording device.

[0018] Furthermore, the elastic body includes a first elastic body part located in the middle, a second elastic body part located at one end of the first elastic body part, and a third elastic body part located at the other end of the first elastic body part. The second elastic body part, the first elastic body part, and the third elastic body part are connected in sequence to form a dumbbell-shaped structure.

[0019] Furthermore, a first mounting platform is formed between the second elastic body part and the first elastic body part in the first cavity, and the clamping cover is installed on the first mounting platform; a second mounting platform is formed between the first elastic body part and the third elastic body part in the first cavity, and the test recording device is installed on the second mounting platform, and the second mounting platform is provided with a wire threading hole connecting the first cavity and the second cavity.

[0020] Furthermore, the pressing cover includes a first pressing portion and a second pressing portion connected to each other, the outer diameter of the first pressing portion is larger than that of the second pressing portion, and a limiting platform matching the first mounting platform is formed between the first pressing portion and the second pressing portion.

[0021] Furthermore, a limiting groove is provided on one end of the second pressing portion facing the power supply.

[0022] Furthermore, a hollow groove is provided on one end of the first pressing portion facing the upper cover.

[0023] Furthermore, an elastic band is provided on the outer periphery of the third projectile body portion, which is interference fit with the gun barrel.

[0024] Furthermore, the outer periphery of the second elastic body is provided with a plurality of first grooves, and the outer periphery of the upper cover is provided with a plurality of second grooves correspondingly connected to the plurality of first grooves.

[0025] Furthermore, an escape groove is provided at one end of the upper cover away from the elastic body, and a side wall of the escape groove is gradually tapered from the outer end to the inner end.

[0026] Furthermore, the upper cover is threadedly connected to the elastic body, and at least two through holes for installing a rotary rod are provided on the circumference of the avoidance groove.

[0027] Compared with the prior art, the advantages of the present invention are:

[0028] The technical solution of the present invention adopts a modular design, which is universal for test research on electronic components. The test device adopts gas recovery to avoid secondary damage caused by recovery overload. The overload of the test device is easy to adjust, the pulse width is close to the live ammunition requirement, and it is operational in engineering. Repeated test research can be carried out on the high overload resistance characteristics of electronic components, and the high overload resistance characteristics of electronic components such as inertial measurement components and high-G value accelerometers can be studied. The device is easy to install and test, and the test accuracy and efficiency are improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. The drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0030] Figure 1 This is a schematic structural diagram of an embodiment of a device for testing the high overload resistance of an electronic component according to the present invention;

[0031] Figure 2 A schematic cross-sectional view of an embodiment of the present invention;

[0032] Figure 3 Schematic diagram of the structure of the pressing cover in an embodiment of the present invention;

[0033] Figure 4 This is a schematic diagram of electrical connections according to an embodiment of the present invention;

[0034] Figure 5 This is a usage state diagram of an embodiment of the present invention;

[0035] in:

[0036] 100. Test device; 101. Projectile; 101a. First projectile portion; 101b. Second projectile portion; 101c. Third projectile portion; 101d. Mounting platform; 101e. First groove; 101f. Threading hole; 101g. Second mounting platform; 102. Upper cover; 102a. Second groove; 102b. Avoidance groove; 102c. Perforation; 103. Bottom cover; 104. Power supply; 105. Test recording device; 106. Pressing cover; 106a. First pressing portion; 106b. Second pressing portion; 106c. Hollow groove; 106d. Position limiting groove; 107. Electronic component; 108. Elastic belt;

[0037] 200, high pressure gas chamber;

[0038] 300, launch tube;

[0039] 400, pressure relief chamber;

[0040] 500. Recycling end. DETAILED DESCRIPTION

[0041] The above scheme is further described below in conjunction with specific examples. It should be understood that these examples are used to illustrate the present invention and are not intended to limit the scope of the present invention. The implementation conditions adopted in the examples can be further adjusted according to the conditions of the specific manufacturer. The implementation conditions not specified are generally those in routine experiments.

[0042] See also Figure 1 、 Figure 2, is a structural schematic diagram of an embodiment of the present invention, which provides an electronic component high overload resistance test device 100, including a body 101, an upper cover 102 detachably connected to one axial end of the body 101, and a bottom cover 103 detachably connected to the other axial end of the body 101. The body 101 has a first cavity and a second cavity that are interconnected. A power supply 104 and a test recording device 105 are installed in the first cavity. A clamping cover 106 is provided between the power supply 104 and the upper cover 102. One end of the clamping cover 106 abuts the upper cover 102 and the other end abuts the power supply 104 to clamp the power supply 104 and the test recording device 105 in the first cavity. The test recording device 105 is electrically connected to the power supply 104. An electronic component 107 is installed on the bottom cover 104. The electronic component 107 is located in the second cavity and is signal-connected to the test recording device 105. The test recording device 105 is a prior art, and the connection between the electronic component 107 and the test recording device 105 is also a prior art, which will not be described in detail in the present invention.

[0043] In this example, the projectile 101 includes a first projectile portion 101a located in the middle, a second projectile portion 101b located at one end of the first projectile portion 101a, and a third projectile portion 101c located at the other end of the first projectile portion 101a. The second projectile portion 101b, the first projectile portion 101a, and the third projectile portion 101c are connected in sequence to form a dumbbell-shaped structure. The dumbbell-shaped structural design can reduce the weight of the projectile. During the launch process of the air cannon through gas propulsion, under certain pressure conditions, the lighter the weight, the greater the overload that can be achieved. Therefore, the dumbbell-shaped structure is designed, and the adjustable overload range of the test is wider.

[0044] The outer dimensions of the second elastic body part 101b are larger than those of the first elastic body part 101a. A first mounting platform 101d is formed in the first cavity between the second elastic body part 101b and the first elastic body part 101a, and the clamping cover 106 is installed on the first mounting platform 101d. A second mounting platform 101g is formed between the first elastic body part 101a and the third elastic body part 101c, and the test recording device 105 is installed on the second mounting platform 101g. A threading hole 101f connecting the first cavity and the second cavity is provided on the second mounting platform 101g.

[0045] Specifically, the clamping cover 106 includes a first clamping portion 106a and a second clamping portion 106b connected to each other. The outer diameter of the first clamping portion 106a is larger than that of the second clamping portion 106b, and a limit platform matching the first mounting platform 101d is formed between the first clamping portion 106a and the second clamping portion 106b. During installation, the second clamping portion 106b extends into the first elastic body portion 101a, and the first clamping portion 106a abuts against the mounting platform 101d, that is, the height of the first clamping portion 106a is consistent with the height between the second elastic body portion 101b and the upper cover 102.

[0046] In order to facilitate the installation of the power supply 104, a limiting groove 106d is provided at one end of the second pressing portion 106b facing the power supply 104. In practice, the depth of the limiting groove 106d can be adjusted to accommodate the installation of different test recording devices 105.

[0047] A hollow groove 106 c is provided at one end of the first pressing portion 106 a facing the upper cover 102 , which can further reduce the weight of the entire testing device.

[0048] In order to improve the sealing of the launch port, a band 108 with an interference fit with the barrel is provided on the outer periphery of the third body portion 101c. During the gas pressure energy storage stage before launch, the airtightness of the launch port is improved through the interference fit between the band 108 and the barrel.

[0049] A plurality of first grooves 101e are provided on the outer periphery of the second body portion 101b, and a plurality of second grooves 102a correspondingly connected to the plurality of first grooves 101e are provided on the outer periphery of the upper cover 102. The first grooves 101e and the second grooves 102a are connected to form slots. During the launch and recovery stage, high-pressure gas is introduced between the test device 100 (test projectile) and the gun barrel to achieve non-contact suspension, thereby reducing the collision between the test projectile and the gun barrel and reducing the wear of the gun barrel caused by the test.

[0050] An avoidance groove 102b is provided at the end of the upper cover away from the projectile body. The side wall of the avoidance groove 102b is gradually tapered from the outer end to the inner end, which reduces the overall weight while also enhancing the reverse resistance of the recovery end 500, ensuring that the test projectile stops before reaching the muzzle.

[0051] In this example, the upper cover 102 is threadedly connected to the elastic body 101, and four through holes 102c for installing the rotary rod are provided on the circumference of the avoidance groove 102b. By installing the rotary rod in the two through holes 102c, the upper cover 102 can be conveniently screwed onto the elastic body 101, thereby increasing the tightening force and ensuring the installation strength.

[0052] In this example, the bottom cover 103 is mounted on the elastic body 101 by screws. A plurality of different positioning holes are provided on the bottom cover 103 for mounting various electronic components 107 .

[0053] See also Figure 4 , the installation includes the following steps:

[0054] (1) Connect the wiring harness ① and fix the power supply 104 and the test recording device 105 with screws;

[0055] (2) Place the power supply 104 and the test recording device 105 inside the first elastic body 101a, adjust them to a suitable height by pressing the cover 106, and tighten them by the upper cover 102. At this time, the system is not powered, and the power supply line of the power supply 104 is only led out through the test recording device 105. The test recording device 105 has a reserved test line, which is led downward through the wire hole 101f;

[0056] (3) Pressing the elastic band 108 into the elastic body 101;

[0057] (4) Fasten the electronic assembly 107 to the bottom cover 103;

[0058] (5) Connecting harness ②, which includes power supply lines for electronic components 107 and data transmission lines;

[0059] (6) Connect the wiring harness ③. At this time, the entire system is powered and the battery begins to consume;

[0060] (7) The bottom cover 103 is fixed to the projectile body 101 by six hexagon socket screws, completing the assembly of the test projectile and preparing to place it in the air cannon for testing.

[0061] See also Figure 5 , is a simplified model of an air cannon. The main body of the air cannon includes a launch tube 300, a high-pressure gas chamber 200, and a gas release mechanism. The gas release mechanism is installed in the high-pressure gas chamber 200, and the test device 100 (test projectile) is installed between the high-pressure gas chamber 200 and the launch tube 300. Assume that the mass of the test projectile is m, the diameter of the launch tube 300 is D, and its cross-sectional area is s; the gas pressure after the projectile is P, and the distance the projectile leaves the initial position is x. Without considering various frictions and losses, the projectile velocity v can be expressed by Newton's equation of motion:

[0062]

[0063] After the internal electrical connections of the test device 100 are assembled, the test device 100 is weighed to obtain the mass of the test device 100. Based on the formula and the required impact overload value, the required gas pressure is calculated in reverse. The test device 100 is placed in the launch tube 300 and an interference fit is achieved with the launch tube 300 via the bullet belt 108. After the assembly work is completed, the high-pressure gas chamber 200 is first evacuated, and then the target chamber at the recovery end 500 is evacuated. After reaching the specified vacuum level, the pump is stopped, and then the high-pressure gas source is connected to inject gas into the high-pressure gas chamber 200 to the specified pressure. During launch, the gas release mechanism is quickly opened, and the gas pressure directly acts on the bottom of the test device 100, accelerating the test device 100. The gas pressure is released in the pressure relief chamber 400, and the test device decelerates until it reaches the recovery end 500.

[0064] The above examples are intended only to illustrate the technical concepts and features of the present invention. Their purpose is to enable those skilled in the art to understand the contents of the present invention and implement them accordingly. They are not intended to limit the scope of protection of the present invention. Any equivalent changes or modifications made in accordance with the spirit of the present invention are intended to be covered by the scope of protection of the present invention.

Claims

1. A device for testing the high overload resistance of electronic components, characterized in that: include: The elastic body includes a first cavity and a second cavity that are interconnected. The elastic body includes a first elastic body portion located in the middle, a second elastic body portion located at one end of the first elastic body portion, and a third elastic body portion located at the other end of the first elastic body portion. The second elastic body portion, the first elastic body portion, and the third elastic body portion are sequentially connected to form a dumbbell-shaped structure. An upper cover is detachably connected to one axial end of the elastic body, and an escape groove is provided at one end of the upper cover away from the elastic body, wherein the sidewall of the escape groove is tapered from the outer end to the inner end; a power supply installed in the first cavity; A pressing cover is provided between the upper cover and the power supply, with one end of the pressing cover abutting against the upper cover and the other end abutting against the power supply, the pressing cover comprising a first pressing portion and a second pressing portion connected to each other, the outer diameter of the first pressing portion being larger than the second pressing portion, and a hollow groove being provided on the end of the first pressing portion facing the upper cover; a test recording device installed in the first cavity, the test recording device being located below the power supply and electrically connected to the power supply; a bottom cover detachably connected to the other axial end of the elastic body; and An electronic component is mounted on the bottom cover and located in the second cavity, and the electronic component is signal-connected to the test and recording device.

2. The electronic component high overload resistance testing device according to claim 1, characterized in that: A first mounting platform is formed between the second elastic body and the first elastic body in the first cavity, and the clamping cover is mounted on the first mounting platform; a second mounting platform is formed between the first elastic body and the third elastic body in the first cavity, and the test recording device is mounted on the second mounting platform, and a wire threading hole connecting the first cavity and the second cavity is provided on the second mounting platform.

3. The electronic component high overload resistance testing device according to claim 2, characterized in that: A limiting platform matching the first mounting platform is formed between the second pressing portion.

4. The electronic component high overload resistance test device according to claim 3, characterized in that: A limiting groove is provided on one end of the second pressing portion facing the power supply.

5. The electronic component high overload resistance test device according to claim 1, characterized in that: An elastic belt which is interference-fitted with the gun barrel is provided on the outer periphery of the third projectile body.

6. The electronic component high overload resistance test device according to claim 1, characterized in that: The outer periphery of the second elastic body is provided with a plurality of first grooves, and the outer periphery of the upper cover is provided with a plurality of second grooves correspondingly connected to the plurality of first grooves.

7. The electronic component high overload resistance test device according to claim 1, characterized in that: The upper cover is threadedly connected to the elastic body, and at least two through holes for installing a rotary rod are provided on the circumference of the avoidance groove.

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