High-low frequency mutual verification absolute phase noise standard uncertainty verification method and system

Abstract

This application discloses a method and system for verifying the uncertainty of an absolute phase noise standard using high- and low-frequency cross-verification. The method includes: determining the source of the maximum permissible error between a millimeter-wave relative noise standard and a low-frequency absolute phase noise standard; testing the low-frequency absolute phase noise standard and the millimeter-wave absolute phase noise standard based on the source of the maximum permissible error; and verifying the uncertainty of the millimeter-wave absolute phase noise standard based on the parameters obtained from the tests. This application solves the problem of the inability to verify the uncertainty of millimeter-wave absolute phase noise standard devices, thereby verifying the uncertainty of the millimeter-wave absolute phase noise standard.

Description

Technical Field

[0001] This application relates to the field of millimeter-wave absolute phase noise standards, specifically to a method and system for verifying the uncertainty of absolute phase noise standards with high and low frequency cross-verification. Background Technology

[0002] Currently, in the microwave and millimeter-wave frequency range, the absolute phase noise standard device is used to calibrate the phase noise measurement system. This device consists of a low-phase-noise carrier source, a broadband noise source, a modulator, an attenuator, and filters. The absolute phase noise standard device can calibrate the phase noise measurement system because of its accuracy. The working principle of the absolute phase noise standard device is that the broadband noise source modulates the low-phase-noise carrier source through the modulator. Then, the phase noise sidebands of the modulated low-phase-noise carrier source are precisely calibrated to obtain accurate calibration values. These calibration values ​​are used as known values ​​to calibrate the phase noise measurement system. The difference between the measured value and the known value of the phase noise measurement system is the calibration accuracy of this phase noise measurement system. Since the millimeter-wave absolute phase noise standard is specifically designed for calibrating phase noise measurement systems, its calibration uncertainty cannot be simply verified by comparing the consistency of measurement results from different phase noise measurement systems. The disadvantages of this comparative measurement verification method are: 1. The millimeter-wave absolute phase noise standard is large and complex, making direct international traceability inconvenient; 2. The verification uncertainty is relatively large, between 2dB and 3dB, failing to meet the requirement of verification uncertainty less than 1dB; 3. The verification results may exhibit a similar direction bias. Therefore, a traceable verification device is needed to verify the uncertainty of the millimeter-wave absolute phase noise standard.

[0003] Due to the aforementioned drawbacks, the existing comparative verification method cannot verify the uncertainty of the millimeter-wave absolute phase noise standard. Summary of the Invention

[0004] This application provides a method and system for verifying the uncertainty of an absolute phase noise standard with high and low frequency cross-verification, so as to at least solve the problem that the uncertainty of millimeter-wave absolute phase noise standard devices cannot be verified.

[0005] According to one aspect of this application, a method for verifying the uncertainty of an absolute phase noise standard with high and low frequency cross-verification is provided, comprising: a phase noise measurement system determining the source of the maximum permissible error between a millimeter-wave relative noise standard and a low-frequency absolute phase noise standard; the phase noise measurement system testing the low-frequency absolute phase noise standard and the millimeter-wave absolute phase noise standard according to the source of the maximum permissible error; and the phase noise measurement system verifying the uncertainty of the millimeter-wave absolute phase noise standard based on the parameters obtained from the tests.

[0006] Furthermore, the source of the maximum permissible error is determined based on the difference between the first hardware functional module used when measuring the phase noise standard and the second hardware functional module used when testing the millimeter-wave absolute phase noise standard.

[0007] Furthermore, the hardware functional modules that differ from the first hardware functional module include: phase detector and loop configuration; the maximum permissible error originates from the phase detector and the rest of the components other than the phase detector.

[0008] Furthermore, based on the source of the maximum permissible error, the parameters obtained by testing the low-frequency absolute phase noise standard and the millimeter-wave absolute phase noise standard include: given that the calibration value of the absolute phase noise standard is A0, then the maximum error calibration value of the low-frequency phase detection system is A1, the measurement value of the high-frequency phase detection system at frequency f1 with power P1 is A2, and the measurement value of the high-frequency phase detection system at frequency f1 with power P2 is A3. The measurement value of the millimeter-wave absolute phase noise standard through the high-frequency phase detection system is A, and its calibration value is B.

[0009] Further, the uncertainty of the millimeter-wave absolute phase noise standard is verified based on the parameters obtained from the test, including: the uncertainty is verified by calculating the following formulas: Δ1=A1-A0=low-frequency phase detector error + other component errors; A2=high-frequency phase detector error 1 + other component errors; A3=high-frequency phase detector error 2 + other component errors; Δ2=A3-A2=high-frequency phase detector error; Δ=Δ1+Δ2; Δ3=AB; the criterion is: Δ3-Δ<1dB; the uncertainty of the millimeter-wave absolute phase noise standard is verified by Δ3.

[0010] According to another aspect of this application, a phase noise measurement system is also provided, comprising: a determination module for determining the source of the maximum permissible error between a millimeter-wave relative noise standard and a low-frequency absolute phase noise standard; a testing module for testing the low-frequency absolute phase noise standard and the millimeter-wave absolute phase noise standard according to the source of the maximum permissible error; and a verification module for verifying the uncertainty of the millimeter-wave absolute phase noise standard based on the parameters obtained from the test.

[0011] Furthermore, the source of the maximum permissible error is determined based on the difference between the first hardware functional module used when measuring the phase noise standard and the second hardware functional module used when testing the millimeter-wave absolute phase noise standard.

[0012] Furthermore, the hardware functional modules that differ from the first hardware functional module include: phase detector and loop configuration; the maximum permissible error originates from the phase detector and the rest of the components other than the phase detector.

[0013] Furthermore, the testing module is used to: given that the calibration value of the absolute phase noise standard is A0, then the maximum error calibration value of the low-frequency phase detection system is A1, the measurement value of the high-frequency phase detection system at frequency f1 with power P1 is A2, and the measurement value of the high-frequency phase detection system at frequency f1 with power P2 is A3. The millimeter-wave absolute phase noise standard has a measurement value of A through the high-frequency phase detection system, and its calibration value is B.

[0014] Furthermore, the verification module is used to: complete the uncertainty verification by calculating the following formulas: Δ1=A1-A0=low-frequency phase detector error + other component errors; A2=high-frequency phase detector error 1 + other component errors; A3=high-frequency phase detector error 2 + other component errors; Δ2=A3-A2=high-frequency phase detector error; Δ=Δ1+Δ2; Δ3=AB; the criterion is: Δ3-Δ<1dB; the standard uncertainty of the millimeter-wave absolute phase noise is verified by Δ3.

[0015] In this embodiment, the source of the maximum permissible error between the millimeter-wave relative noise standard and the low-frequency absolute phase noise standard is determined; the low-frequency absolute phase noise standard and the millimeter-wave absolute phase noise standard are tested according to the source of the maximum permissible error; and the uncertainty of the millimeter-wave absolute phase noise standard is verified based on the parameters obtained from the tests. This application solves the problem of the inability to verify the uncertainty of the millimeter-wave absolute phase noise standard device, thereby verifying the uncertainty of the millimeter-wave absolute phase noise standard. Attached Figure Description

[0016] The accompanying drawings, which form part of this application, are used to provide a further understanding of this application. The illustrative embodiments and descriptions of this application are used to explain this application and do not constitute an undue limitation of this application. In the drawings:

[0017] Figure 1 This application discloses a millimeter-wave absolute phase noise standard uncertainty verification device based on high-low frequency mutual verification technology, wherein... Figure 1 In the middle: 1-Low frequency absolute phase noise standard, 2-Millimeter wave absolute phase noise standard, 3-Microwave millimeter wave phase noise measurement system.

[0018] Figure 2 This is a schematic diagram of a phase noise measurement system for an orthogonal phase detection mode according to an embodiment of this application.

[0019] Figure 3 This is a flowchart of the method for verifying the standard uncertainty of absolute phase noise through high- and low-frequency mutual verification according to an embodiment of this application. Detailed Implementation

[0020] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0021] It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, and although a logical order is shown in the flowchart, in some cases the steps shown or described may be executed in a different order than that shown here.

[0022] In this embodiment, a method for verifying the standard uncertainty of absolute phase noise through high- and low-frequency mutual verification is provided. Figure 3 This is a flowchart of the method for verifying the standard uncertainty of absolute phase noise through high- and low-frequency mutual verification according to an embodiment of this application. The following describes... Figure 3 The steps are explained below.

[0023] Step S302, the microwave millimeter-wave phase noise measurement system (hereinafter referred to as the phase noise measurement system) 3 determines the source of the maximum permissible error between the millimeter-wave relative noise standard and the low-frequency absolute phase noise standard.

[0024] Step S304: The phase noise measurement system 3 tests the low-frequency absolute phase noise standard and the millimeter-wave absolute phase noise standard according to the source of the maximum permissible error.

[0025] Step S306: The phase noise measurement system 3 verifies the uncertainty of the millimeter-wave absolute phase noise standard based on the parameters obtained from the test.

[0026] In the above steps, the source of the maximum permissible error is determined based on the differences between the first hardware functional module used when measuring the phase noise standard and the second hardware functional module used when testing the millimeter-wave absolute phase noise standard. For example, the hardware functional modules that differ between the second and first hardware functional modules include: the phase detector and the loop configuration; the maximum permissible error originates from the phase detector and the rest of the components.

[0027] The above steps solved the problem of the uncertainty of the millimeter-wave absolute phase noise standard device being unverifiable, thus verifying the uncertainty of the millimeter-wave absolute phase noise standard.

[0028] The following description, in conjunction with the accompanying drawings, illustrates this embodiment, which provides a millimeter-wave absolute phase noise standard uncertainty verification device based on high-low frequency mutual verification technology. Figure 1 This application discloses a millimeter-wave absolute phase noise standard uncertainty verification device based on high-low frequency mutual verification technology, as described in an embodiment of this application. Figure 1 As shown, the device includes: a low-frequency absolute phase noise standard 1, a millimeter-wave absolute phase noise standard 2, and a microwave millimeter-wave phase noise measurement system 3.

[0029] The millimeter-wave absolute phase noise standard 2 is connected to the phase detector RF cable of the microwave millimeter-wave phase noise measurement system 3 in the microwave millimeter-wave frequency range, and the low-frequency absolute phase noise standard 1 is connected to the phase detector RF cable of the microwave millimeter-wave phase noise measurement system 3 in the low-frequency frequency range.

[0030] During operation, low-frequency absolute phase noise, due to its small size and low complexity, can be traced and compared using the NIST laboratory. The NIST laboratory will provide a calibration value A0 for low-frequency absolute phase noise standard 1, which is then measured using the low-frequency phase detector of the phase noise measurement system, yielding a result of A1. For millimeter-wave absolute phase noise standard 2, at an output power of P0, it is measured using the microwave / millimeter-wave frequency range phase detector of the phase noise measurement system, yielding a result of A2. Similarly, for millimeter-wave absolute phase noise standard 2 at an output power of P1, it is measured using the same detector, yielding a result of A3. The specific uncertainty verification principle and method are shown below.

[0031] Microwave and millimeter-wave phase noise measurement systems employing traditional phase noise measurement modes include the HP3047A, HP3048A, E5500 series, and PN9000 series. These systems generally utilize orthogonal phase detection technology, and their principle block diagrams are shown below. Figure 2 As shown in the figure, the only difference between phase noise testing in the microwave and millimeter-wave bands and low-frequency phase noise testing is the phase detector and loop setup; all other components are the same. In other words, the maximum permissible error of the phase noise measurement system comes from two parts: the phase detector and the remaining components.

[0032] Using a low-frequency absolute phase noise standard can solve the maximum tolerance calibration of the remaining components in the phase noise measurement system. Given the calibration value of the absolute phase noise standard as A0, the maximum error calibration value of the low-frequency phase detection system is A1, the measurement value of the high-frequency phase detection system at frequency f1 with power P1 is A2, and the measurement value of the high-frequency phase detection system at frequency f1 with power P2 is A3. The millimeter-wave absolute phase noise standard, measured by the high-frequency phase detection system, has a value of A and a calibration value of B. Uncertainty verification is completed using the following formula.

[0033] Δ1 = A1 - A0 = Low-frequency phase detector error + other component errors;

[0034] A2 = High-frequency phase detection error 1 + Error of other components;

[0035] A3 = High-frequency phase detection error² + Errors of other components;

[0036] Δ2 = A3 - A2 = High-frequency phase detection error;

[0037] Δ = Δ1 + Δ2;

[0038] Δ3 = AB;

[0039] The criterion is: Δ3 - Δ < 1 dB;

[0040] The standard uncertainty of millimeter-wave absolute phase noise is verified by using Δ3 connection.

[0041] This embodiment provides a millimeter-wave absolute phase noise standard uncertainty verification device based on high-low frequency mutual verification technology. The advantage of this device is that it can verify the uncertainty of the millimeter-wave absolute phase noise standard using the low-frequency absolute phase noise standard.

[0042] In this embodiment, an electronic device is provided, including a memory and a processor. The memory stores a computer program, and the processor is configured to run the computer program to perform the methods described in the above embodiments.

[0043] The aforementioned program can run on a processor or be stored in memory (or computer-readable medium). Computer-readable medium includes both permanent and non-permanent, removable and non-removable media, and information storage can be achieved by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable medium does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0044] These computer programs may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes can be implemented using different modules, and different steps can be implemented using different modules.

[0045] This embodiment provides such an apparatus or system. The system, referred to as a phase noise measurement system, includes: a determination module for determining the source of the maximum permissible error between a millimeter-wave relative noise standard and a low-frequency absolute phase noise standard; a testing module for testing the low-frequency absolute phase noise standard and the millimeter-wave absolute phase noise standard based on the source of the maximum permissible error; and a verification module for verifying the uncertainty of the millimeter-wave absolute phase noise standard based on the parameters obtained from the tests.

[0046] The system or apparatus is used to implement the functions of the methods in the above embodiments. Each module in the system or apparatus corresponds to each step in the method, as has been described in the method and will not be repeated here.

[0047] For example, the test module is used to: given that the calibration value of the absolute phase noise standard is A0, then the maximum error calibration value of the low-frequency phase detection system is A1, the measurement value of the high-frequency phase detection system at frequency f1 with power P1 is A2, and the measurement value of the high-frequency phase detection system at frequency f1 with power P2 is A3. The measurement value of the millimeter-wave absolute phase noise standard through the high-frequency phase detection system is A, and its calibration value is B.

[0048] For example, the verification module is used to: complete the uncertainty verification by calculating the following formulas: Δ1=A1-A0=low-frequency phase detector error + other component errors; A2=high-frequency phase detector error 1 + other component errors; A3=high-frequency phase detector error 2 + other component errors; Δ2=A3-A2=high-frequency phase detector error; Δ=Δ1+Δ2; Δ3=AB; the criterion is: Δ3-Δ<1dB; the standard uncertainty of the millimeter-wave absolute phase noise is verified by Δ3.

[0049] The above embodiments solve the problem of the inability to verify the uncertainty of the millimeter-wave absolute phase noise standard device, thereby verifying the uncertainty of the millimeter-wave absolute phase noise standard.

[0050] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A method for verifying the standard uncertainty of absolute phase noise through high- and low-frequency mutual verification, characterized in that, include: The phase noise measurement system determines the source of the maximum permissible error between millimeter-wave absolute phase noise standards and low-frequency absolute phase noise standards; The phase noise measurement system tests the low-frequency absolute phase noise standard and the millimeter-wave absolute phase noise standard according to the source of the maximum permissible error; The phase noise measurement system verifies the uncertainty of the millimeter-wave absolute phase noise standard based on the parameters obtained from the test. These parameters include: the measured value A2 of the high-frequency phase detection system at frequency f1 with power P1; the measured value A3 of the high-frequency phase detection system at frequency f1 with power P2; the measured value A of the millimeter-wave absolute phase noise standard through the high-frequency phase detection system; and its calibration value B. Given that the calibration value of the low-frequency absolute phase noise standard is A0, the maximum error calibration value of the low-frequency phase detection system is A1. The verification of the uncertainty of the millimeter-wave absolute phase noise standard based on the parameters obtained from the test includes: Uncertainty verification is completed using the following formula: Δ1 = A1 - A0 = Low-frequency phase detector error + other component errors; A2 = High-frequency phase detection error 1 + Error of other components; A3 = High-frequency phase detection error² + Errors of other components; Δ2 = A3 - A2 = High-frequency phase detection error; Δ = Δ1 + Δ2; Δ3 = AB; The criterion is: Δ3 - Δ < 1 dB; The standard uncertainty of the millimeter-wave absolute phase noise is verified by using Δ3.

2. The method according to claim 1, characterized in that, The source of the maximum permissible error is determined based on the difference between the first hardware functional module used when measuring the low-frequency absolute phase noise standard and the second hardware functional module used when testing the millimeter-wave absolute phase noise standard.

3. The method according to claim 2, characterized in that, The hardware functional modules that differ from the first hardware functional module include: phase detector and loop configuration; the maximum permissible error originates from the phase detector and the rest of the components other than the phase detector.

4. A phase noise measurement system, characterized in that, include: The determination module is used to determine the source of the maximum permissible error between the millimeter-wave absolute phase noise standard and the low-frequency absolute phase noise standard; The testing module is used to test the low-frequency absolute phase noise standard and the millimeter-wave absolute phase noise standard according to the source of the maximum permissible error; The verification module is used to verify the uncertainty of the millimeter-wave absolute phase noise standard based on the parameters obtained from the test. The parameters include: the measured value A2 of the high-frequency phase detection system at frequency f1 with power P1, the measured value A3 of the high-frequency phase detection system at frequency f1 with power P2, the measured value A of the millimeter-wave absolute phase noise standard through the high-frequency phase detection system, and its calibration value B; wherein, given that the calibration value of the low-frequency absolute phase noise standard is A0, then the maximum error calibration value of the low-frequency phase detection system is A1. The verification of the uncertainty of the millimeter-wave absolute phase noise standard based on the parameters obtained from the test includes: Uncertainty verification is completed using the following formula: Δ1 = A1 - A0 = Low-frequency phase detector error + other component errors; A2 = High-frequency phase detection error 1 + Error of other components; A3 = High-frequency phase detection error² + Errors of other components; Δ2 = A3 - A2 = High-frequency phase detection error; Δ = Δ1 + Δ2; Δ3 = AB; The criterion is: Δ3 - Δ < 1 dB; The standard uncertainty of the millimeter-wave absolute phase noise is verified by using Δ3.

5. The system according to claim 4, characterized in that, The source of the maximum permissible error is determined based on the difference between the first hardware functional module used when measuring the low-frequency absolute phase noise standard and the second hardware functional module used when testing the millimeter-wave absolute phase noise standard.

6. The system according to claim 5, characterized in that, The hardware functional modules that differ from the first hardware functional module include: phase detector and loop configuration; the maximum permissible error originates from the phase detector and the rest of the components other than the phase detector.

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