A testing device

By designing a test device with a moving mechanism and a guide rod, the existing test tooling is solved for inaccurate positioning and low efficiency during plug-in and pull-up, and the fast, accurate and safe testing of the tested part is achieved.

CN114428181BActive Publication Date: 2025-05-09BEIJING INST OF RADIO MEASUREMENT
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Patent Information

Application Number
CN202111550364.3
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2021-12-17
Publication Date
2025-05-09
Estimated Expiration
2041-12-17

AI Technical Summary

Technical Problem

The special testing tooling for existing electronic products has problems such as inaccurate positioning, low efficiency and possible scratches on the part to be tested during the plug-in and pull-out process.

Method used

A test device is designed, including a base plate, a vertical plate, a moving mechanism and a main body structure. The moving mechanism drives the main body structure to move in the direction of the vertical plate, and the guide rod moves back and forth on the step structure to achieve rapid positioning and electrical connection of the detected part without the need for external force to pull it out.

Benefits of technology

Improves testing efficiency and accuracy, and avoids scratches and damage of the tested parts during connection and extraction.

✦ Generated by Eureka AI based on patent content.

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Abstract

The embodiment of the present application discloses a testing device, comprising: a base plate; a vertical plate extending upward from an edge of one side of the base plate; the vertical plate comprising a first detection end electrically connected to the first detected end of the detected part; a moving mechanism located on the base plate; a main structure located on the moving mechanism; the main structure comprising a first groove for placing the detected part; the bottom surface of the first groove having a second detection end electrically connected to the second detected end of the detected part; the two opposite side edges of the upper surface of the base plate comprising a step structure; the step structure comprising a first step portion and a second step portion; the main structure comprising a through guide hole; a guide rod in the guide hole; the bottom end of the guide rod passes through the guide hole to the step structure; when the guide rod is located at the first step portion, the first detected end can be electrically connected to the first detection end; when the guide rod is located at the second step portion, the top wall of the guide rod is higher than the bottom surface of the first groove, and the bottom surface of the detected part can be separated from the bottom surface of the first groove.
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Description

Technical Field

[0001] The present application relates to the field of testing technology, and more specifically, to a testing device. Background Art

[0002] In the electronics field, it is often necessary to perform overall testing on electronic modules. In particular, for products with blind-plug test interfaces on multiple sides, dedicated test equipment is often used to improve test efficiency and test consistency. The performance of the test equipment directly determines whether the test efficiency and test consistency can meet expectations.

[0003] Common dedicated test fixtures for electronic products generally use manual positioning to achieve the connection of the product test end, and use a lever to remove it after the test is completed. In this way, electronic products with multiple test ends are not accurately positioned when plugged in, and there will be deviations. In addition, the removal process after the test is completed is extremely unstable, and the test efficiency is relatively low.

[0004] Therefore, in order to overcome the defects of the prior art, a testing device needs to be provided. Summary of the invention

[0005] The object of the present invention is to provide a testing device to solve at least one of the above technical problems.

[0006] In order to achieve at least one of the above purposes, the present application adopts the following technical solutions:

[0007] The present application provides a testing device, comprising:

[0008] Base plate;

[0009] A vertical plate extending upward from a side edge of the bottom plate; the vertical plate includes a first detection end electrically connected to a first detected end of the detected component;

[0010] a moving mechanism located on the base plate;

[0011] A main structure located on the moving mechanism;

[0012] The moving mechanism can drive the main structure to move in a direction close to or away from the vertical plate;

[0013] The top surface of the main structure is recessed downward to form a first groove for placing the detected part;

[0014] The bottom surface of the first groove has a second detection end electrically connected to the second detected end of the detected component;

[0015] The upper surface of the bottom plate and the two opposite side edges perpendicular to the vertical plate are both concave downward to form a step structure;

[0016] The step structure includes a first step portion and a second step portion;

[0017] The second step portion is located on a side of the first step portion away from the vertical plate, and a bottom surface of the second step portion is higher than a bottom surface of the first step portion;

[0018] The main structure includes through guide holes on two opposite side portions perpendicular to the vertical plate;

[0019] The guide hole is provided with a guide rod;

[0020] The bottom end of the guide rod passes through the guide hole to the step structure;

[0021] When the guide rod is located at the first step portion, the first detected end of the detected member located in the first groove can be electrically connected to the first detecting end on the vertical plate;

[0022] When the guide rod is located at the second step portion, the top wall of the guide rod is higher than the bottom surface of the first groove, and the bottom surface of the detected component located in the first groove can be separated from the bottom surface of the first groove.

[0023] Optionally, the first step portion and the second step portion are connected via an inclined surface.

[0024] Optionally, a top wheel is provided on a side of the top end of the guide rod facing the first groove, and the top wheel is configured to separate the bottom surface of the detected member from the bottom surface of the first groove;

[0025] A moving wheel is arranged on one side of the bottom end of the guide rod facing the first groove, and the moving wheel can reciprocate between the first step portion and the second step portion;

[0026] A guide wheel located inside the guide hole is disposed on one side of the guide rod away from the first groove, and the guide wheel can prevent the moving wheel from deviating from a predetermined direction when moving back and forth on the first step portion and the second step portion.

[0027] Optionally, the top wheel, the moving wheel and the guide wheel are all axially fixed on the side wall of the guide rod through a pivot.

[0028] Optionally, in the vertical direction, the top end of the guide rod is not higher than the top of the top wheel, and the bottom end of the guide rod is not lower than the bottom of the moving wheel.

[0029] Optionally, the testing device further comprises: a buffer structure;

[0030] The buffer structure comprises: a protruding block extending from a side of the guide rod facing the first groove in a direction away from the guide wheel; the protruding block is located below the bottom surface of the main structure;

[0031] A column extending from the upper surface of the protruding block toward the main structure;

[0032] An elastic member sleeved on the column;

[0033] The bottom surface of the main structure is recessed upward to form a second groove, and the top of the column is located in the second groove;

[0034] One end of the elastic member abuts against the top surface of the protruding block, and the other end abuts against the bottom surface of the main structure.

[0035] Optionally, the elastic member is a coil spring.

[0036] Optionally, the moving mechanism comprises:

[0037] A support portion fixed to the base;

[0038] a lead screw located on the support; and

[0039] A moving block located on the lead screw can drive the main structure to move in a direction toward or away from the vertical plate.

[0040] Optionally, the top surface of the support portion is recessed downward to form a third groove;

[0041] The lead screw passes through the third groove from one end of the support portion away from the vertical plate to one end close to the vertical plate.

[0042] Optionally, the distance between the top surface of the main structure and the bottom surface of the first groove is smaller than the thickness of the detected component.

[0043] The beneficial effects of this application are as follows:

[0044] In view of the problems existing in the current prior art, the present application provides a testing device, wherein a moving mechanism can drive the main structure to move in a direction close to or away from the vertical plate, so that the guide rod located in the main structure moves back and forth on the first step portion and the second step portion; when the main structure drives the guide rod to the first step portion and moves in a direction close to the vertical plate, the first detected end of the detected part located in the first groove can be electrically connected with the first detection end on the vertical plate; when the main structure drives the guide rod to move from the first step portion to the second step portion, the top of the guide rod is higher than the bottom surface of the first groove, and the bottom surface of the detected part located in the first groove can be separated from the bottom surface of the first groove. The testing device provided in the present application drives the main structure through a moving mechanism, and the main structure drives the guide rod to move, so that the first detected end and the second detected end on the detected part can be quickly positioned, connected and pulled out with the first detection end and the second detection end on the testing device respectively; no external force is required, which improves the testing efficiency and accuracy. Moreover, the surface of the detected part will not be scratched or damaged during the connection positioning and pulling out process. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] The specific implementation modes of the present invention are further described in detail below in conjunction with the accompanying drawings.

[0046] Figure 1 A schematic diagram of the overall structure of a testing device in an embodiment of the present application is shown.

[0047] Figure 2 An exploded view of a testing device in one embodiment of the present application is shown.

[0048] Figure 3 A schematic structural diagram showing the cooperation between the buffer structure and the guide rod of a testing device in one embodiment of the present application. DETAILED DESCRIPTION

[0049] In the following description, for the purpose of explanation, in order to provide a thorough understanding of one or more embodiments, numerous specific details are set forth. However, it is apparent that these embodiments may also be implemented without these specific details.

[0050] In the description of the present application, it should be noted that the terms "upper", "lower", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. Unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be a connection between the two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to the specific circumstances.

[0051] It should also be noted that, in the description of the present application, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or equipment including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or equipment. In the absence of further restrictions, the elements defined by the statement "comprise one..." do not exclude the presence of other identical elements in the process, method, article or equipment including the elements.

[0052] In order to solve the problems existing in the prior art, an embodiment of the present application provides a testing device, such as Figure 1-3As shown, it includes: the present application provides a testing device, including: a bottom plate 1; a vertical plate 2 extending upward from an edge of one side of the bottom plate 1; the vertical plate 2 includes a first detection end 21 electrically connected to the first detection end 61 of the detected member 6; a moving mechanism 3 located on the bottom plate 1; a main structure 4 located on the moving mechanism 3; the moving mechanism 3 can drive the main structure 4 to move in a direction close to or away from the vertical plate 2; the top surface of the main structure 4 is recessed downward to form a first groove 41 for placing the detected member 6; the bottom surface of the first groove 41 has a second detection end 411 electrically connected to the second detection end (not shown in the figure) of the detected member 6; the upper surface of the bottom plate 1 and the two opposite side edges perpendicular to the vertical plate 2 are both recessed downward to form a step structure; the step structure includes a first step portion 11 and a second step portion 12; the second step portion 12 is located away from the first step portion 11 One side of the vertical plate 2 and the bottom surface of the second step portion 12 is higher than the bottom surface of the first step portion 11; the main structure 4 includes a through guide hole 42 on the two opposite sides perpendicular to the vertical plate 2; specifically, the guide hole 42 can pass through the side wall of the first groove 41 from the top of the two side walls of the first groove 41 perpendicular to the vertical plate 2 to the bottom surface of the main structure 4; the guide hole 42 has a guide rod 43; the bottom end of the guide rod 43 passes through the guide hole 42 to the step structure; when the guide rod 43 is located at the first step portion 11, the first detected end 61 of the detected part 6 located in the first groove 41 can be electrically connected with the first detection end 21 on the vertical plate 2; when the guide rod 43 is located at the second step portion 12, the top end of the guide rod 43 is higher than the bottom surface of the first groove 41, and the bottom surface of the detected part 6 located in the first groove 41 can be separated from the bottom surface of the first groove 41.

[0053] In the above-mentioned embodiment of the present application, the moving mechanism 3 can drive the main structure 4 to move in the direction approaching or away from the vertical plate 2, so that the guide rod 43 located in the main structure 4 can reciprocate on the first step portion 11 and the second step portion 12; when the main structure 4 drives the guide rod 43 to the first step portion 11 and moves in the direction approaching the vertical plate 2, the first detected end 61 of the detected part 6 located in the first groove 41 can be electrically connected with the first detection end 21 on the vertical plate 2; when the main structure 4 drives the guide rod 43 to move from the first step portion 11 to the second step portion 12, the top end of the guide rod 43 is higher than the bottom surface of the first groove 41, and the bottom surface of the detected part 6 located in the first groove 41 can be separated from the bottom surface of the first groove 41. The test device provided by the present application drives the main structure 4 through the moving mechanism 3, and the main structure 4 drives the guide rod 43 to move, so as to realize the rapid positioning, connection and extraction of the first detected end 61 and the second detected end on the detected part 6 with the first detection end 21 and the second detection end 411 on the test device respectively; no external force is required, which improves the test efficiency and accuracy. Moreover, the surface of the detected part 6 will not be scratched or damaged during the connection positioning and extraction process.

[0054] In a specific embodiment, a top wheel 44 is provided on the side of the top end of the guide rod 43 facing the first groove 41, and the top wheel 44 is configured to separate the bottom surface of the detected member 6 from the bottom surface of the first groove 41; specifically, when the main structure 4 drives the guide rod 43 to move to the second step portion 12, the top wheel 44 will also move above the bottom surface of the first groove 41, and at this time, the detected member 6 located in the first groove 41 can be lifted up, so that the second detected end of the detected member 6 is separated from the second detection end 411 on the bottom surface of the first groove 41; the bottom end of the guide rod 43 faces A moving wheel 45 is provided on one side of the first groove 41, and the moving wheel 45 can move back and forth between the first step portion 11 and the second step portion 12; the use of the moving wheel 45 makes it smoother for the guide rod 43 to move back and forth between the first step portion 11 and the second step portion 12 under the drive of the main structure 4; a guide wheel 46 located inside the guide hole 42 is provided on the side of the guide rod 43 away from the first groove 41, and the guide wheel 46 can ensure that the moving wheel 45 does not deviate from the predetermined direction when it moves back and forth on the first step portion 11 and the second step portion 12.

[0055] Furthermore, in the vertical direction, the top end of the guide rod 43 is not higher than the top of the top wheel 44, and the bottom end of the guide rod 43 is not lower than the bottom of the moving wheel 45. In this way, the top wheel 44 can separate the detected member 6 from the first groove 41, and the moving wheel 45 can move back and forth between the first step portion 11 and the second step portion 12.

[0056] Furthermore, the top wheel 44 , the moving wheel 45 and the guide wheel 46 are all axially fixed on the side wall of the guide rod 43 via a pivot.

[0057] In a specific embodiment, the first step portion 11 and the second step portion 12 are connected by an inclined surface 13, which ensures that the moving wheel 45 can move more smoothly between the first step portion 11 and the second step portion 12.

[0058] In a specific embodiment, if Figure 3 As shown, the test device further includes: a buffer structure 5; the buffer structure 5 includes: a protruding block 51 extending from the guide rod 43 toward the first groove 41 in the direction away from the guide wheel 46; the protruding block 51 is located below the bottom surface of the main structure 4; a column 52 extending from the upper surface of the protruding block 51 toward the direction of the main structure 4; an elastic member 53 sleeved on the column 52, the elastic member 53 can be a coil spring, but is not limited to a coil spring; the bottom surface of the main structure 4 is recessed upward to form a second groove (not shown in the figure), and the top of the column 52 is located in the second groove; one end of the elastic member 53 abuts against the top surface of the protruding block 51, and the other end abuts against the bottom surface of the main structure 4. When the main structure 4 is driven by the moving mechanism 3 to move in the direction close to or away from the vertical plate 2, the buffer structure 5 can make the main mechanism move more smoothly without large bumps.

[0059] In a specific embodiment, the moving mechanism 3 includes: a support portion 31 fixed on the base; a lead screw (not shown in the figure) located on the support portion 31; and a moving block 33 located on the lead screw that can drive the main structure 4 to move in a direction toward or away from the vertical plate 2; an end of the support portion 31 away from the vertical plate 2 is provided with a handle 34 for adjusting the moving speed and moving direction of the lead screw. By rotating the adjustment handle 34, the lead screw drives the moving block 33 to move, and the moving block 33 drives the main structure 4 to move. Furthermore, the top surface of the support portion 31 is recessed downward to form a third groove (not shown in the figure); the lead screw passes through the third groove from the end of the support portion 31 away from the vertical plate 2 to the end close to the vertical plate 2.

[0060] In a specific embodiment, the distance between the top surface of the main structure 4 and the bottom surface of the first groove 41 is smaller than the thickness of the detected member 6, so that when the main structure 4 is close to the vertical plate 2, the first detected end 61 on the detected member 6 can be electrically connected to the first detection end 21 on the vertical plate 2.

[0061] In actual application, in the test device provided by the present application, when the main structure 4 is in a position away from the vertical plate 2 and the moving wheel 45 is located at the first step portion 11, the detected part 6 is placed in the first groove 41, and the moving mechanism 3 drives the main structure 4 to move in the direction of the vertical plate 2, and the first detected end 61 of the detected part 6 is electrically connected to the first detection end 21 on the vertical plate 2; after the detection of the detected part 6 is completed, the moving mechanism 3 drives the main structure 4 to move in the direction away from the vertical plate 2 and moves to the second step portion 12, and the first detected end 61 of the detected part 6 is separated from the first detection end 21 on the vertical plate 2, and the top of the top wheel 44 pushes the detected part 6 to separate the second detected end of the detected part 6 from the second detection end 411 at the bottom of the first groove 41. At this time, the top of the detected part 6 is higher than the top of the side wall of the first groove 41, and the operator can take away the detected part 6. When inspecting other inspected parts 6 , the main structure 4 is moved toward the vertical plate 2 until the moving wheel 45 is located at the first step portion 11 .

[0062] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not limitations on the implementation methods of the present invention. For ordinary technicians in the relevant field, other different forms of changes or modifications can be made based on the above description. It is impossible to list all the implementation methods here. All obvious changes or modifications derived from the technical solution of the present invention are still within the protection scope of the present invention.

Claims

1. A testing device, characterized in that: include: Base plate; A vertical plate extending upward from a side edge of the bottom plate; the vertical plate includes a first detection end electrically connected to a first detected end of the detected component; a moving mechanism located on the base plate; A main structure located on the moving mechanism; The moving mechanism can drive the main structure to move in a direction close to or away from the vertical plate; The top surface of the main structure is recessed downward to form a first groove for placing the detected part; The bottom surface of the first groove has a second detection end electrically connected to the second detected end of the detected component; The upper surface of the bottom plate and the two opposite side edges perpendicular to the vertical plate are both concave downward to form a step structure; The step structure includes a first step portion and a second step portion; The second step portion is located on a side of the first step portion away from the vertical plate, and a bottom surface of the second step portion is higher than a bottom surface of the first step portion; The main structure includes through guide holes on two opposite side portions perpendicular to the vertical plate; The guide hole is provided with a guide rod; The bottom end of the guide rod passes through the guide hole to the step structure; When the guide rod is located at the first step portion, the first detected end of the detected member located in the first groove can be electrically connected to the first detecting end on the vertical plate; When the guide rod is located at the second step portion, the top end of the guide rod is higher than the bottom surface of the first groove, and can separate the bottom surface of the detected component located in the first groove from the bottom surface of the first groove.

2. The testing device according to claim 1, characterized in that: The first step portion and the second step portion are connected via an inclined surface.

3. The testing device according to claim 1, characterized in that: A top wheel is provided on one side of the top end of the guide rod facing the first groove, and the top wheel is configured to separate the bottom surface of the detected member from the bottom surface of the first groove; A moving wheel is provided on one side of the bottom end of the guide rod facing the first groove, and the moving wheel can reciprocate between the first step portion and the second step portion; A guide wheel located inside the guide hole is arranged on one side of the guide rod away from the first groove, and the guide wheel can prevent the moving wheel from deviating from a predetermined direction when moving back and forth on the first step portion and the second step portion.

4. The testing device according to claim 3, characterized in that: The top wheel, the moving wheel and the guide wheel are all axially fixed on the side wall of the guide rod through a pivot.

5. The testing device according to claim 4, characterized in that: In the vertical direction, the top end of the guide rod is not higher than the top of the top wheel, and the bottom end of the guide rod is not lower than the bottom of the moving wheel.

6. The testing device according to claim 1, characterized in that: The testing device further comprises: a buffer structure; The buffer structure comprises: a protruding block extending from a side of the guide rod facing the first groove in a direction away from the guide wheel; the protruding block is located below the bottom surface of the main structure; A column extending from the upper surface of the protruding block toward the main structure; An elastic member sleeved on the column; The bottom surface of the main structure is recessed upward to form a second groove, and the top of the column is located in the second groove; One end of the elastic member abuts against the top surface of the protruding block, and the other end abuts against the bottom surface of the main structure.

7. The testing device according to claim 6, characterized in that: The elastic member is a coil spring.

8. The testing device according to claim 1, characterized in that: The moving mechanism comprises: A support portion fixed to the base plate; a lead screw located on the support; and A moving block located on the lead screw can drive the main structure to move in a direction toward or away from the vertical plate.

9. The testing device according to claim 8, characterized in that: The top surface of the support portion is recessed downward to form a third groove; The lead screw passes through the third groove from one end of the support portion away from the vertical plate to one end close to the vertical plate.

10. The testing device according to claim 1, characterized in that: The distance between the top surface of the main body structure and the bottom surface of the first groove is smaller than the thickness of the detected component.

Citation Information

Patent Citations

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