A material photothermal performance testing platform based on polarized light

Abstract

A material photothermal performance testing platform based on polarized light, comprising a test protection device, an optical device, and a temperature detection device. The test protection device is used to prevent the light emitted by the optical device from leaking to the outside and comprises a cuvette. The optical device comprises a first polarization beam splitter and an optical power meter arranged in the light output direction of the first polarization beam splitter. The temperature detection device is used to detect the instantaneous temperature, maximum temperature, and minimum temperature of the object to be tested when the light is projected onto the object to be tested in the cuvette. This material photothermal performance testing platform can realize the photothermal performance testing of materials with adjustable linear and circular polarized light, and can test both solid samples and liquid samples. In particular, it can test chiral materials, which is more in line with actual testing needs. At the same time, a thin film polarization beam splitter prism is used to purify the linear polarization degree of the laser emitted by the laser, and the transmittance is higher and the laser loss is smaller.

Description

Technical Field

[0001] The invention relates to the technical field of optical design, and in particular to a material photothermal performance testing platform based on polarized light. Background Art

[0002] Photothermal therapy is a non-invasive advanced treatment technology that converts near-infrared light into local heat, thereby inducing cell death. It has been shown to have important application prospects in the treatment of major diseases. Therefore, the development of efficient photothermal conversion materials is a prerequisite for the use of photothermal therapy, and therefore the photothermal performance testing of photothermal materials is an essential task in the study of such materials. In addition, it is well known that chiral materials absorb left-handed and right-handed circularly polarized light differently, and higher photothermal conversion efficiency may be obtained under the excitation of left-handed and right-handed circularly polarized light.

[0003] However, there is no commercial platform for photothermal performance testing of liquids, solid materials, and especially chiral materials. For example, the patent number is 201511015600.6, and the patent name is a material photothermal effect testing device, which includes a laser for generating laser light for irradiating a sample to be tested, a thermal resistor for testing the temperature change of the sample to be tested and converting the measured temperature change into an electrical signal, a signal conditioning unit for amplifying and digitizing the electrical signal from the thermal resistor, and a control unit for controlling the laser to emit laser light. However, the technical solution disclosed in the patent is only applicable to solid materials, and is even less applicable to chiral materials. Its scope of application is relatively small, which is not conducive to the promotion of the testing device, nor is it conducive to reducing the cost of the entire testing system. Summary of the invention

[0004] In view of this, the present invention provides a material photothermal performance testing platform based on polarized light with higher compatibility.

[0005] A material photothermal performance testing platform based on polarized light, which is used to detect the photothermal characteristics of a test object. The material photothermal performance testing platform based on polarized light includes a test protection device, an optical device arranged in the test protection device, and a temperature detection device arranged in the test protection device. The test protection device is used to prevent the light emitted by the optical device from leaking to the outside and includes a cuvette. The optical device includes a first polarization beam splitter and an optical power meter arranged in the light output direction of the first polarization beam splitter. The temperature detection device is used to detect the instantaneous temperature, maximum temperature, and minimum temperature of the test object when the light is projected onto the test object in the cuvette.

[0006] Furthermore, the test protection device includes an optical dark box and a thermal insulation foam arranged in the optical dark box, and the cuvette is arranged in the thermal insulation foam.

[0007] Furthermore, the cuvette is made of quartz powder.

[0008] Furthermore, the first polarization beam splitter is a thin film polarization beam splitter prism.

[0009] Furthermore, the optical device further comprises a quarter wave plate arranged in the light emitting direction of the polarization beam splitter, and right-handed circularly polarized light or left-handed circularly polarized light is obtained by rotating the quarter wave plate.

[0010] Furthermore, the optical device also includes a second polarization beam splitter arranged in the light emitting direction of the quarter wave plate, and the second polarization beam splitter is a thin film polarizer.

[0011] Furthermore, when the object to be measured in the cuvette is a solid material, the first polarization beam splitter is a thin-film polarization beam splitter prism, and the light emitting direction of the thin-film polarization beam splitter prism or the quarter-wave plate is parallel to the height direction of the cuvette.

[0012] Furthermore, when the object to be measured in the cuvette is a liquid material, the first polarization beam splitter is a thin film polarization beam splitter prism, and the light emitting direction of the thin film polarization beam splitter prism or quarter wave plate is perpendicular to the height direction of the cuvette.

[0013] Furthermore, the optical device further comprises a laser arranged outside the test protection device, and the laser is arranged in the light incident direction of the first thin-film polarization beam splitter prism.

[0014] Furthermore, the temperature detection device is an infrared thermal imaging thermometer.

[0015] Compared with the prior art, the material photothermal performance testing platform based on polarized light provided by the present invention can realize the photothermal performance testing of materials with adjustable linear and circular polarized light, and can test both solid samples and liquid samples. In particular, chiral materials can be tested, which is more in line with actual test requirements. At the same time, a thin-film polarization beam splitter prism is also used to purify the linear deflection degree of the laser emitted by the laser, and compared with ordinary polarizers, its transmittance is higher and the laser loss is smaller. In addition, the present invention also uses an infrared thermal imaging thermometer, which can perform center point temperature measurement, high and low temperature tracking, computer real-time monitoring and photography, and uses an optical dark box and thermal insulation foam as a test environment protection device, and the light intensity detected by the optical power meter is the light intensity of the laser irradiated on the sample, and the accuracy of the test is higher. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1A schematic structural diagram of an embodiment of a material photothermal performance testing platform based on polarized light provided by the present invention.

[0017] Figure 2 A schematic structural diagram of another embodiment of a material photothermal performance testing platform based on polarized light provided by the present invention. DETAILED DESCRIPTION

[0018] The specific embodiments of the present invention are further described in detail below. It should be understood that the description of the embodiments of the present invention herein is not intended to limit the protection scope of the present invention.

[0019] like Figure 1 to Figure 2 As shown, it is a schematic diagram of the structure of a material photothermal performance testing platform based on polarized light provided by the present invention. The material photothermal performance testing platform based on polarized light includes a test protection device 10, an optical device 20 arranged in the test protection device 10, and a temperature detection device 30 arranged in the test protection device 10. It can be imagined that the material photothermal performance testing platform based on polarized light also includes some other functional modules, such as assembly components, electrical connection components, control modules, etc., which are well known technologies to those skilled in the art and will not be described in detail one by one here.

[0020] The test protection device 10 includes an optical dark box 11, an insulating foam 12 arranged in the optical dark box 11, and a cuvette 13 arranged in the insulating foam 12. The optical dark box 11 itself is a prior art, and is made of black aluminum alloy. The use of the optical dark box 11 can effectively isolate the external environment, reduce external heat radiation, and improve the accuracy of the test. The insulating foam 12 itself is also a prior art, and can be made of phenolic material, which is used to maintain the temperature to avoid heat loss after the object to be tested generates heat, thereby improving the accuracy of the test. The cuvette 13 itself is also a prior art, which is an equipment instrument for spectral analysis, and is mainly a quartz cuvette fired by quartz powder, which has good light transmittance and strong corrosion resistance, and meets a wide range of testing needs. In experimental use, the cuvette 13 can be a container with a certain height, and the object to be tested is contained in the container.

[0021] The optical device 20 includes a laser 21 arranged outside the test protection device 10, a first polarization beam splitter 22 arranged inside the test protection device 10 and arranged in the light emitting direction of the laser 21, a quarter wave plate 23 arranged in the light emitting direction of the first polarization beam splitter 22, and an optical power meter 24 arranged in the light emitting direction of the first polarization beam splitter 22 and the quarter wave plate 23. The laser 21 itself is a prior art, and the wavelength of the light it emits can be a light wave of 808nm. Of course, according to actual needs, the wavelength of the light emitted by the laser 21 can be selected and adjustable. The first polarization beam splitter 22 can be a thin film polarization beam splitter prism or a thin film polarizer, or a thin film polarization film, etc., which is used to purify the linear deflection degree of the laser emitted by the laser 21. In this embodiment, when the laser emitted by the laser 21 is 1.008W, the laser power passing through the thin film polarization beam splitter prism is 0.966W, and the transmittance is 95.8%; the laser power passing through the thin film polarizer is 0.869W, and the transmittance is 86.2%. Therefore, compared with the use of thin film polarizer, the use of thin film polarization beam splitter prism can obtain higher laser transmittance and smaller laser loss. When in use, the angle between the thin film polarization beam splitter prism and the incident plane is 45° to achieve the purpose of polarization. The quarter wave plate 23 is a birefringent single crystal wave plate of a certain thickness. It is well known that when light passes through the wave plate from normal incidence, the phase difference between ordinary light (o light) and extraordinary light (e light) is equal to π / 2 or an odd multiple thereof, and such a chip is called a quarter wave plate or 1 / 4 wave plate. When in use, the quarter wave plate is rotated, and when θ=Π / 4, the outgoing light is right-handed circularly polarized light; when θ=3Π / 4, the outgoing light is left-handed circularly polarized light. By using the right-handed circularly polarized light and the left-handed circularly polarized light, the object to be measured can be tested when it is a chiral material. In addition, when testing non-chiral materials, the quarter wave plate 23 can also be not used, so as to avoid the absorption of light by the quarter wave plate 23 and cause energy loss. For example, when the laser emitted by the laser 21 is 1.008W, when there is no quarter wave plate 23, the laser power passing through the thin film polarization beam splitter prism is 0.966W, and the transmittance is 95.8%. At this time, the laser is linearly polarized light; when there is a quarter wave plate 23, the laser power passing through the quarter wave plate 23 is 0.950W, and the transmittance is 94.2%. The optical power meter 24 is an instrument for measuring absolute optical power or relative loss of optical power through a distance, so it is itself a prior art. The optical power meter 24 is set at the cuvette 13 to test the laser power, that is, the power of the laser irradiated on the object to be measured. It can be understood that the light intensity detected by the optical power meter 24 is the light intensity of the laser irradiated on the sample.In actual testing, when the object to be measured in the cuvette 13 is a liquid material, the light emitting direction of the optical power meter 24 is perpendicular to the height direction of the cuvette 13, that is, the light emitting direction of the thin film polarization splitter prism or quarter wave plate 23 is perpendicular to the height direction of the cuvette 13, such as. Figure 1 The structural diagram of the first embodiment is provided. When the object to be measured in the cuvette 13 is a solid material, the light emitting direction of the optical power meter 24 is parallel to the height direction of the cuvette 13, that is, the light emitting direction of the thin film polarization beam splitter prism or quarter wave plate 23 is parallel to the height direction of the cuvette 13. Figure 2 A schematic structural diagram of a second embodiment is provided.

[0022] In order to check the direction of the polarized light emitted by the quarter wave plate 23, the optical device 20 also includes a second polarization beam splitter 25 arranged in the light output direction of the quarter wave plate 23. In this embodiment, the second polarization beam splitter 25 can be a thin film polarizer. By rotating the second polarization beam splitter 25, the output light can be directed to the cuvette 13. The specific method of use is to rotate the polarizer 360° in the process of using the polarizer to determine the direction of linear polarized light, and measure the intensity of the laser passing through the polarizer. When the polarizer is 0°, the transmitted light of the beam splitter is 0.00072W, which is approximately 0 and is approximately extinction. The light intensity is strongest near 90°, which is 0.884W. If the polarizer is rotated 90° further, extinction will occur again. If it is rotated 90° again, the transmitted light will become the strongest again. It can be judged that the direction of the linear polarized light is parallel to the incident plane.

[0023] The temperature detection device 30 can be an infrared thermal imaging thermometer, which can perform center point temperature measurement and high and low temperature tracking, thereby detecting the instantaneous temperature, maximum temperature, and minimum temperature of the object being measured. It is understandable that the thermal imager can be connected to a computer via a USB data cable, and the image projection host computer software can realize the functions of taking pictures, image projection, over-temperature alarm reminder on the computer side, and automatic saving of pictures when over-temperature occurs.

[0024] Compared with the prior art, the material photothermal performance testing platform based on polarized light provided by the present invention can realize the photothermal performance testing of materials with adjustable linear and circular polarized light, and can test both solid samples and liquid samples. In particular, chiral materials can be tested, which is more in line with actual test requirements. At the same time, a thin-film polarization beam splitter prism is also used to purify the linear deflection degree of the laser emitted by the laser, and compared with ordinary polarizers, its transmittance is higher and the laser loss is smaller. In addition, the present invention also uses an infrared thermal imaging thermometer, which can perform center point temperature measurement, high and low temperature tracking, computer real-time monitoring and photography, and uses an optical dark box and thermal insulation foam as a test environment protection device, and the light intensity detected by the optical power meter is the light intensity of the laser irradiated on the sample, and the accuracy of the test is higher.

[0025] The above are only preferred embodiments of the present invention and are not intended to limit the protection scope of the present invention. Any modification, equivalent substitution or improvement within the spirit of the present invention is included in the scope of the claims of the present invention.

Claims

1. A material photothermal performance testing platform based on polarized light, which is used to detect the photothermal properties of the object being tested, characterized by: The material photothermal performance test platform based on polarized light includes a test protection device, an optical device arranged in the test protection device, and a temperature detection device arranged in the test protection device. The test protection device is used to prevent the light emitted by the optical device from leaking to the outside and includes a cuvette. The optical device includes a first polarization beam splitter, a quarter wave plate arranged in the light-emitting direction of the polarization beam splitter, a second polarization beam splitter arranged in the light-emitting direction of the quarter wave plate, and an optical power meter arranged in the light-emitting direction of the first polarization beam splitter. By rotating the quarter wave plate When the incident angle θ of the wave plate is Π / 4, the outgoing light is right-handed circularly polarized light, and when θ is 3Π / 4, the outgoing light is left-handed circularly polarized light. The second polarization beam splitter is a thin film polarizer. When the object to be measured in the cuvette is a liquid material, the light emitting direction of the first polarization beam splitter or a quarter wave plate is perpendicular to the height direction of the cuvette. When the object to be measured in the cuvette is a solid material, the light emitting direction of the first polarization beam splitter or a quarter wave plate is parallel to the height direction of the cuvette. The temperature detection device is used to detect the instantaneous temperature, maximum temperature, and minimum temperature of the object to be measured when the light is projected onto the object to be measured in the cuvette.

2. The material photothermal performance testing platform based on polarized light according to claim 1, characterized in that: The test protection device comprises an optical dark box and a heat-insulating foam arranged in the optical dark box, and the cuvette is arranged in the heat-insulating foam.

3. The material photothermal performance testing platform based on polarized light according to claim 2, characterized in that: The cuvette is made of fired quartz powder.

4. The material photothermal performance testing platform based on polarized light according to claim 1, characterized in that: The first polarization beam splitter is a thin film polarization beam splitter prism.

5. The material photothermal performance testing platform based on polarized light according to claim 1, characterized in that: When the object to be measured in the cuvette is a solid material, the first polarization beam splitter is a thin-film polarization beam splitter prism, and the light emitting direction of the thin-film polarization beam splitter prism or quarter-wave plate is parallel to the height direction of the cuvette.

6. The material photothermal performance testing platform based on polarized light according to claim 1, characterized in that: When the object to be measured in the cuvette is a liquid material, the first polarization beam splitter is a thin film polarization beam splitter prism, and the light emitting direction of the thin film polarization beam splitter prism or quarter wave plate is perpendicular to the height direction of the cuvette.

7. The material photothermal performance testing platform based on polarized light according to claim 1, characterized in that: The optical device further comprises a laser arranged outside the test protection device, and the laser is arranged in the light incident direction of the first polarization beam splitter.

8. The material photothermal performance testing platform based on polarized light according to claim 1, characterized in that: The temperature detection device is an infrared thermal imaging thermometer.

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