A Compact Self-Cooling Thyristor Valve Temperature Rise Test System

Abstract

A compact self-cooling thyristor valve temperature rise test system provided by the present invention includes a power supply unit, a control and synchronization unit, and a measurement unit. Among them, the control and synchronization unit is used to conduct a temperature rise test on the thyristor valve to be tested; the measurement unit is used to collect the temperature and current during the temperature rise test of the thyristor valve group to be tested; the power supply unit is respectively used to provide power to the thyristor valve group to be tested, the control and synchronization unit, and the measurement unit. The present invention uses the equivalent current method to determine the service capacity range of the thyristor valve, effectively avoiding the phenomenon of using a big horse to pull a small cart, thereby saving the use materials of the thyristor valve and reducing the equipment volume.

Description

Technical Field

[0001] The present invention relates to the technical field of reactive power compensation test equipment, and particularly relates to a compact self-cooling thyristor valve temperature rise test system. Background Art

[0002] The Static Var Compensator (SVC), abbreviated as SVC, is the best method and approach to solve problems such as low power factor of the power grid, large voltage fluctuations, high voltage, and reverse reactive power transmission. It can quickly change the reactive power it emits, suppress the bus voltage fluctuations caused by impact loads, facilitate the transient voltage recovery, and improve the stable system voltage level.

[0003] The SVC includes the Thyristor Controlled Reactor (TCR), abbreviated as TCR, the Megnetic Controlled Reactor (MCR), abbreviated as MCR, the ThyristorControlled Transformer (TCT), etc. The MCR uses a thyristor valve group to control the main body excitation, thereby adjusting the MCR capacity. The thyristor is the core of the MCR thyristor valve group, and the normal operation of the thyristor has relatively high requirements for temperature. When the temperature exceeds its case temperature, the probability of tube damage increases greatly, thus causing equipment failures.

[0004] The tap voltage of each newly designed MCR and the control current of the thyristor are different. In order to ensure the safe operation of the MCR equipment, it is necessary to determine the usage range of the thyristor valve and ensure that the thyristor valve is applied at a reasonable temperature level. However, there is currently no corresponding test system to determine the usage range of the thyristor valve. Therefore, it is necessary to study the temperature rise test system of the thyristor valve. Summary of the Invention

[0005] The purpose of the present invention is to provide a compact self-cooling thyristor valve temperature rise test system, which solves the above-mentioned deficiencies in the prior art.

[0006] In order to achieve the above purpose, the technical solution adopted by the present invention is:

[0007] A compact self-cooling thyristor valve temperature rise test system provided by the present invention includes a power supply unit, a control and synchronization unit, and a measurement unit. Among them, the control and synchronization unit is used to perform a temperature rise test on the thyristor valve to be tested;

[0008] The measurement unit is used to collect the temperature and current during the temperature rise test of the thyristor valve group to be tested;

[0009] The power supply unit is respectively used to provide power to the thyristor valve group to be tested, the control and synchronization unit, and the measurement unit.

[0010] Preferably, the measurement unit includes a temperature rise measurement unit and a current measurement unit; wherein, the temperature rise measurement unit is used to measure the temperature information during the temperature rise test of the thyristor valve group to be measured; the current measurement unit is used to measure the flowing current during the temperature rise test of the thyristor valve group to be measured.

[0011] Preferably, the temperature rise measurement unit includes a thermocouple and a temperature controller; wherein, a plurality of thermocouples are provided, and the plurality of thermocouples are arranged on the thyristor valve group to be measured, and are used to collect and measure the temperature information during the temperature rise test of the thyristor valve group to be measured, and transmit the collected temperature information to the temperature controller.

[0012] Preferably, the current measurement unit includes a Hall sensor and an oscilloscope; wherein, the Hall sensor is used to collect and measure the current information flowing through during the temperature rise test of the thyristor valve group to be measured, and transmit the collected current information to the oscilloscope.

[0013] Preferably, a plurality of thermocouples are arranged at corresponding temperature measurement points provided on the thyristor valve group to be measured.

[0014] Preferably, the temperature measurement points are respectively a thyristor temperature measurement point, a diode temperature measurement point, a first radiator temperature measurement point, a second radiator temperature measurement point, a third radiator temperature measurement point, a fourth radiator temperature measurement point, a fifth radiator temperature measurement point, a sixth radiator temperature measurement point and an ambient temperature measurement point. Among them, the first radiator temperature measurement point is located on the radiator directly below the thyristor; the second radiator temperature measurement point is located on the radiator directly above the thyristor; the third radiator temperature measurement point is located on the radiator at the horizontal position of the thyristor; the fourth radiator temperature measurement point is located on the radiator at the horizontal position of the diode; the fifth radiator temperature measurement point is located on the radiator at the horizontal position of the first radiator temperature measurement point; the sixth radiator temperature measurement point is located on the radiator at the horizontal position of the second radiator temperature measurement point; the ambient temperature measurement point is arranged outside the thyristor valve group.

[0015] Preferably, there are at least three ambient temperature measurement points, and the multiple ambient temperature measurement points are evenly distributed along the circumferential direction of the thyristor valve group, and the distance from the thyristor valve group is 1m - 1.5m.

[0016] Preferably, the control and synchronization unit includes a controller and an optical fiber, wherein the controller is connected to the thyristor valve group to be measured through the optical fiber.

[0017] Compared with the prior art, the beneficial effects of the present invention are:

[0018] A compact self-cooling thyristor valve temperature rise test system provided by the present invention has the advantages of clear system principle and convenient wiring, and is convenient for carrying out temperature rise tests on the tap voltage of different MCRs and the control current of thyristors;

[0019] The present invention determines the service capacity range of the thyristor valve by using the equivalent current method, effectively avoiding the phenomenon of using a big horse to pull a small cart, thus saving the materials used for the thyristor valve and reducing the volume of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 is a schematic diagram of the temperature rise test system for a compact self-cooled thyristor valve;

[0021] Figure 2 is a schematic diagram of the temperature measurement points of a compact self-cooled thyristor valve;

[0022] Figure 3 is a top view of the MCR valve bank;

[0023] Figure 4 is a connection diagram of the RC snubber unit;

[0024] Figure 5 is a flow chart of the temperature rise test of the MCR valve bank;

[0025] Among them, 1 - power supply system, 101 - AC380V single-phase power supply, 102 - AC220V single-phase power supply, 103 - DC12V DC power supply, 104 - DC + - 15V DC power supply, 2 - thyristor gate, 201 - thyristor module, 202 - diode module, 203 - RC snubber unit, 3 - control and synchronization system, 301 - controller, 302 - synchronization signal converter, 303 - fiber optic converter, 304 - optical fiber, 305 - AC380V single-phase voltage regulator, 306 - AC220V single-phase voltage regulator, 307 - test transformer, 4 - measurement system, 401 - Hall sensor, 402 - oscilloscope, 403 - thermocouple, 404 - temperature controller, 5 - temperature measurement points, 501 - thyristor temperature measurement point, 502 - diode temperature measurement point, 503 - radiator temperature measurement point directly below the thyristor, 504 - radiator temperature measurement point directly above the thyristor, 505 - radiator temperature measurement point at the horizontal position of the thyristor, 506 - radiator temperature measurement point at the horizontal position of the diode, 507 - radiator temperature measurement point at the horizontal position corresponding to 503, 508 - radiator temperature measurement point at the horizontal position corresponding to 504, 509 - ambient temperature measurement point, 6 - radiator, 7 - lead wire, 8 - terminal block, 801 - terminal block 1, 802 - terminal block 2, 803 - terminal block 3, 804 - terminal block 4, 805 - terminal block 5, 9 - fuse component, 10 - trigger unit, 11 - housing, 12 - high-voltage insulator. DETAILED DESCRIPTION OF THE INVENTION

[0026] Here, exemplary embodiments will be described in detail, and examples thereof are shown in the drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present invention as detailed in the appended claims.

[0027] SVC is the best method and approach to solve problems such as low power factor of the power grid, large voltage fluctuations, high voltage, and reverse reactive power transmission. It can quickly change the reactive power it emits, suppress the bus voltage fluctuations caused by impact loads, facilitate the transient voltage recovery, and improve the voltage level of the stable system.

[0028] The MCR type SVC uses thyristor valve groups to control the main body excitation, thereby adjusting the MCR capacity. Thyristors are the core of the MCR thyristor valve groups, and the normal operation of thyristors has relatively high requirements for temperature. When the temperature exceeds its case temperature, the probability of tube damage increases greatly, resulting in equipment failures. The tap voltage of each newly designed MCR and the control current of thyristors are different. To ensure the safe operation of MCR equipment, it is necessary to determine the usage range of thyristor valves and ensure that thyristor valves are applied at a reasonable temperature level. Therefore, it is necessary to study the temperature rise test system of thyristor valves.

[0029] See Figures 1 to 5 , Figure 1 shows the schematic diagram of the temperature rise test system of the compact self-cooling thyristor valve provided by the embodiment of the present invention; Figure 2 shows the schematic diagram of the temperature measurement points of the compact self-cooling thyristor valve provided by the embodiment of the present invention; Figure 3 shows the top view of the MCR valve group provided by the embodiment of the present invention; Figure 4 is the connection diagram of the RC resistor-capacitor absorption unit; Figure 5 shows the temperature rise test flow chart of the MCR valve group provided by the embodiment of the present invention.

[0030] As Figure 1 and Figure 2 shown, the present invention provides a temperature rise test system for a compact self-cooling thyristor valve, including: a power supply unit 1, a thyristor valve group 2, a control and synchronization unit 3, and a measurement unit 4. Among them, the power supply unit 1 is respectively connected to the thyristor valve group 2, the control and synchronization unit 3, and the measurement unit 4 to supply power to the thyristor valve group 2, the control and synchronization unit 3, and the measurement unit 4.

[0031] The measurement unit 4 is used to collect the temperature and current of the measurement point 5 on the thyristor valve group 2.

[0032] The measurement points 5 include a thyristor temperature measurement point 501, a diode temperature measurement point 502, a first radiator temperature measurement point 503, a second radiator temperature measurement point 504, a third radiator temperature measurement point 505, a fourth radiator temperature measurement point 506, a fifth radiator temperature measurement point 507, a sixth radiator temperature measurement point 508, and an ambient temperature measurement point 509. Among them, the first radiator temperature measurement point 503 is located on the radiator directly below the thyristor; the second radiator temperature measurement point 504 is located on the radiator directly above the thyristor; the third radiator temperature measurement point 505 is located on the radiator at the horizontal position of the thyristor; the fourth radiator temperature measurement point 506 is located on the radiator at the horizontal position of the diode; the fifth radiator temperature measurement point 507 is located on the radiator at the horizontal position of the first radiator temperature measurement point 503; the sixth radiator temperature measurement point 508 is located on the radiator at the horizontal position of the second radiator temperature measurement point 504; there are at least three measurement points for the ambient temperature measurement point 509, and multiple measurement points are evenly distributed along the circumferential direction of the thyristor valve group 2, and the distance from the thyristor valve group 2 is 1m - 1.5m.

[0033] Through reasonable arrangement of temperature measurement points, the present invention can not only find out the highest temperature rise point of the thyristor valve, but also calculate the temperature rise of the heating element to the radiator and the temperature difference between the upper and lower parts of the radiator, which is convenient to understand the rationality of the selected radiator.

[0034] Specifically: The power supply unit 1 includes a test AC380V single-phase power supply 101, an AC220V single-phase power supply 102, a DC12V DC power supply 103, and a DC + - 15V DC power supply 104; among them, the test AC380V single-phase power supply 101 provides power for the AC380V single-phase voltage regulator 305 in the control and synchronization unit 3; the AC380V single-phase power supply 101 can continuously adjust the output voltage, and the output capacity meets the test capacity of the thyristor valve group.

[0035] The AC220V single-phase power supply 102 provides power for the controller 301 in the control and synchronization unit 3, the oscilloscope 402 in the measurement unit 4, and the RC resistor-capacitor absorption unit 203 in the thyristor valve group 2 respectively.

[0036] An AC220V single-phase voltage regulator 306 is provided between the AC220V single-phase power supply 102 and the RC resistor-capacitor absorption unit 203.

[0037] The capacity of the AC220V single-phase power supply 102 should meet the test capacity of the controller 301, the synchronization signal converter 302, the oscilloscope 402, and the RC resistor-capacitor absorption unit 203;

[0038] The test DC12V DC power supply 103 provides power for the fiber optic converter 303.

[0039] The test DC +15V DC power supply 104 supplies power to the Hall voltage sensor 401.

[0040] The thyristor valve group 2 includes an aluminum profile radiator 6, leads 7, terminal blocks 8, a thyristor module 201, a diode module 202, an RC snubber unit 203, a fuse assembly 12, a trigger unit 13, a housing 14, and a high-voltage insulator 15. Among them, the function of the thyristor module 201 is to control the DC component flowing through the winding, thereby controlling the output capacity of the reactor. The test current of the thyristor module 201 is equal to the rated equivalent current of the thyristor under the corresponding MCR test capacity.

[0041] Among them, the function of the diode module 202 is to provide freewheeling for the control winding. The test current of the diode module 202 is equal to the rated equivalent current of the diode under the corresponding MCR test capacity.

[0042] The test current of the RC snubber unit 203 is equal to the rated equivalent current of the RC snubber unit under the corresponding MCR test capacity.

[0043] Among them, the thyristor module 201, the diode module 202, the RC snubber unit 203, and the fuse assembly 12 are all installed on the aluminum profile radiator 6.

[0044] The RC snubber unit 203 is arranged at the top of the inner cavity of the housing 14. Below the RC snubber unit 203, the diode module 202, the thyristor module 201, and the fuse assembly 12 are arranged in parallel in sequence.

[0045] The trigger unit 13 is arranged beside the diode module 202, the thyristor module 201, and the fuse assembly 12.

[0046] Terminal blocks 8 are provided on both the thyristor module 201 and the diode module 202.

[0047] The high-voltage insulator 15 includes an upper high-voltage insulator and a lower high-voltage insulator. Among them, the upper high-voltage insulator and the lower high-voltage insulator are respectively arranged at the top and bottom of the housing 14.

[0048] The thyristor module 201 has a common cathode structure. The cathode of the thyristor module 201 is connected in series with the cathode of the diode module 202 through a lead 7.

[0049] The anode of the thyristor module 201 is connected in series with the fuse assembly 12 through a lead 7.

[0050] The RC resistor-capacitor absorption unit 203 includes a damping resistor 203-1 and a damping capacitor 203-2, which are connected in series between the damping resistor 203-1 and the damping capacitor 203-2; the capacitor voltage cannot change suddenly, and the electromagnetic energy can be converted into the electric field energy of the capacitor and stored, effectively suppressing overvoltage, and the series resistor can consume part of the energy generating overvoltage.

[0051] The other end pins of each damping resistor 401 are all welded to the resistor-capacitor absorption unit circuit board 403, and are respectively connected in series with the first lead 405, the second lead 406, and the third lead 407 provided on the resistor-capacitor absorption unit circuit board 403.

[0052] The other end pins of the three damping capacitors 402 are connected in parallel and then welded to the resistor-capacitor absorption unit circuit board 403. And it is connected in series with the fourth pin provided on the resistor-capacitor absorption unit circuit board 403.

[0053] The control and synchronization unit 3 includes a controller 301, a synchronization signal converter 302, an optical fiber converter 303, an optical fiber 304, and an AC380V single-phase voltage regulator 305; among them, the output side of the AC380V single-phase voltage regulator 305 is connected to the input side of the synchronization signal converter 302 to provide a synchronization signal; the output side of the synchronization signal converter 302 is connected to the input side of the controller 301. After the synchronization signal is accessed to the controller 301, an optical signal is output through the optical fiber converter 303 and accessed to the trigger unit 13 of the thyristor valve bank 2 through the optical fiber 304.

[0054] The power input terminal of the AC380V single-phase voltage regulator 305 is connected to the AC380V single-phase power supply 101 of the power supply unit 1.

[0055] The power output terminal of the AC380V single-phase voltage regulator 305 is connected in series with a test transformer 307, and the test transformer 307 is connected to the thyristor valve bank 2 to supply power to the thyristor valve bank 2. Among them, the first terminal of the output terminal of the test transformer 307 is connected to the second terminal 802 of the thyristor valve bank 2, the second terminal of the output terminal of the test transformer 307 is connected to the first terminal 801 of the thyristor valve bank 2, and the third terminal of the output terminal is connected to the terminal 804 of the thyristor valve bank 2.

[0056] The measurement unit 4 includes a temperature rise measurement unit and a current measurement unit; among them, the temperature rise measurement unit is used to measure the temperature information at the temperature measurement point; the current measurement unit is used to measure the current passing through the thyristor valve bank 2 and is displayed by an oscilloscope.

[0057] The temperature rise measurement unit includes a thermocouple 403 and a temperature controller 404; wherein, multiple thermocouples 403 are provided; one thermocouple 403 is provided at each temperature measurement point, and the thermocouple 403 is used to collect the temperature information at the temperature measurement point and transmit the collected temperature information to the temperature controller 404.

[0058] The current measurement unit includes a Hall sensor 401 and an oscilloscope 402; wherein, the Hall sensor 401 is used to collect the current information of the AC220V single-phase power supply 102 and transmit the collected current information to the oscilloscope 402.

[0059] The oscilloscope 402 is used to display the current measured by the Hall sensor.

[0060] The current transformer collects the DC current passing through the 2 thyristors and diodes and transmits the secondary current to the Hall sensor. After the Hall sensor converts the current signal into a voltage signal, it is transmitted to the oscilloscope through a voltage probe, and the current-related parameters can be directly read on the oscilloscope.

[0061] During the temperature rise test of the thyristor valve group 2, the test environment during normal operation of the MCR should be simulated, that is, indoor, standing upright, and self-cooling;

[0062] The thyristor valve group 2 is fixed on the chassis and kept at a certain height from the ground without affecting the normal heat dissipation of the thyristor valve group 2.

[0063] As Figure 5 shown, the present invention provides a working method for a compact self-cooling thyristor valve temperature rise test system, including the following steps:

[0064] Step 1, calculate the control voltage and control current of the thyristor valve 2 according to the design capacity of the MCR; wherein, the control voltage of the thyristor valve 2 is 1% - 2.5% of the rated voltage of the MCR, denoted as k1;

[0065] The windings of the MCR are usually wound in a delta connection, and the rated voltage of the MCR is denoted as U N and the rated current is denoted as I N ; Therefore, calculate the control voltage U cont of the MCR as:

[0066] U cont = k1U N

[0067] The maximum value of the control current of the thyristor valve group 2 is usually taken as 0.6 - 1.5 times the rated current of the MCR, denoted as k2, that is, I cont = k2I N .

[0068] Calculate the equivalent currents of the thyristor module 201 and the diode module 202 respectively, specifically:

[0069] Since the control current of the thyristor valve is formed by the conduction of two thyristors in turn, the equivalent current of a single thyristor is half of the control current of the thyristor valve, I Tequ = 0.5I cont = 0.5k2I N ;

[0070] The freewheeling diode D plays a freewheeling role, which is beneficial to the turn-off of the thyristor. The effective value current of the diode is basically equivalent to its average value passed, and can be approximately calculated as:

[0071]

[0072] where, α is the thyristor trigger angle, and the value range is

[0073] Calculate the on-state average power of the thyristor through the factory parameters, conduction angle and on-state average current of the thyristor valve:

[0074]

[0075] where, the waveform coefficient F = I T(RMS) / I T(AV)

[0076] Calculate the power of the diode through the factory parameters of the diode and the above equivalent current:

[0077]

[0078] The heat loss of a single resistor-capacitor absorption unit, P R = 2fC10 -6 ×U 2

[0079] Two single thyristors are encapsulated in a thyristor module and both conduct during operation;

[0080] Two single diodes are encapsulated in a diode module, and only one works;

[0081] The resistor-capacitor absorption module is composed of three resistor-capacitor absorption units;

[0082] Step 2, fix the lower high-voltage insulator 12 of the compact self-cooling thyristor valve on the chassis, and make Figure 1 wiring and arrange current measurement points, make Figure 2 arrange temperature measurement points, and fasten them as per the normal factory conditions of the equipment.

[0083] Step 3: Gradually increase the voltage of the thyristor module 201, diode module 202, and RC snubber unit 203 of the compact self-cooling thyristor valve in a 5V gradient for power-on debugging until the AC 380V single-phase voltage regulator 305 is adjusted to make the thyristor module 201 and diode module 202 reach the corresponding calculated equivalent current; adjust the AC 220V single-phase voltage regulator 306 to make the RC snubber unit 203 reach the corresponding calculated equivalent current;

[0084] Step 4: Record the data every 20 minutes during the test, record the temperature rise of the thyristor valve to be tested obtained from the test, and compare the temperature rises of the thyristor temperature measurement point 501 and diode temperature measurement point 502 obtained from the test with the preset threshold. Among them, if the absolute value of the temperature rise obtained from the test is greater than the preset threshold, adjust the design capacity of the MCR, and calculate the equivalent current of the thyristor valve to be tested according to this design capacity; execute Step 3 until the absolute value of the temperature rise of the thyristor valve to be tested is less than or equal to the preset threshold of 0.5K, and the test ends to obtain the final design capacity of the MCR thyristor valve;

[0085] If the absolute value of the temperature rise obtained from the test is less than or equal to the preset threshold of 0.5K, the test ends to obtain the final design capacity of the MCR thyristor valve.

[0086] The specific calculation method of the absolute value of the temperature rise is:

[0087] Sum the temperature rise of the thyristor valve 2 to be tested collected and the annual highest ambient temperature to obtain the absolute value of the temperature rise at the test point.

[0088] The specific method for collecting the temperature rise of the thyristor valve 2 to be tested is:

[0089] Sum the average temperature rise of the radiator, the temperature rises at the upper and lower ports of the radiator, the temperature rise from the thyristor housing to the radiator, the thyristor housing temperature rise, and the thyristor junction temperature rise.

[0090] The working principle of the present invention:

[0091] Power the test-related equipment through the power supply system 1 and provide power for the temperature rise test of the thyristor valve bank 2;

[0092] Calculate the losses of the thyristor module 201, diode module 202, and RC snubber unit 203 in the thyristor valve bank 2, and the equivalent current on a single thyristor in the thyristor module 201;

[0093] During the test, temperature measurement points were selected and thermocouples 404 were embedded in the aluminum profile radiator 6 of the thyristor valve bank 2. At the same time, the ambient temperature was measured around the thyristor valve bank 2. The controller 301 was adjusted, and the current on a single thyristor in the thyristor module 201 was read through the oscilloscope 402 until it reached 1.2 times the calculated value of the current on a single thyristor, and continuous power supply was maintained until it was less than 0.5 K of the allowable value of the thyristor junction temperature, and then the temperature rise test was ended.

[0094] After considering the specification and the disclosure of the invention, those skilled in the art will readily conceive of other embodiments of the present invention. This application is intended to cover any variations, uses, or adaptations of the present invention, which follow the general principles of the present invention and include known common general knowledge or conventional technical means in the technical field not disclosed by the present invention. The specification and the embodiments are only regarded as exemplary, and the true scope and spirit of the present invention are pointed out by the following claims.

[0095] It should be understood that the present invention is not limited to the exact structures described above and shown in the drawings, and various modifications and changes can be made without departing from its scope. The scope of the present invention is only limited by the appended claims.

[0096] The above are only the preferred embodiments of the present invention, and do not limit the present invention in any way. Any simple modifications, changes, and equivalent structural changes made to the above embodiments according to the technical essence of the present invention still fall within the protection scope of the technical solution of the present invention.

Claims

1. A working method of a temperature rise test system for a compact self-cooling thyristor valve group, characterized in that, The temperature rise test system includes a power supply unit (1), a control and synchronization unit (3), and a measurement unit (4). Among them, the control and synchronization unit (3) is used to conduct a temperature rise test on the thyristor valve group to be tested (2). The measurement unit is used to collect the temperature and current during the temperature rise test of the thyristor valve group to be tested (2). The power supply unit (1) is respectively used to supply power to the thyristor valve group to be tested (2), the control and synchronization unit (3), and the measurement unit (4). The working method includes the following steps: Step 1, calculate the control voltage and control current of the thyristor valve group according to the design capacity of the MCR, where the control voltage of the MCR is: ; The maximum control current of the thyristor valve group is as follows: ; Calculate the equivalent currents of the thyristor modules and diode modules in the thyristor valve group respectively. Among them, the equivalent current of a single thyristor is: ; The effective value current of the diode is as follows: ; Among them, is 1% - 2.5% of the MCR rated voltage; is the rated voltage of the MCR; is 0.6 - 1.5 times the MCR rated current; is the rated current of the MCR; is the thyristor firing angle, and its value range is ; Step 2: Fix the lower high-voltage insulator of the compact self-cooling thyristor valve group on the chassis, and conduct wiring and arrange current measurement points and temperature measurement points. Step 3: Gradually increase the voltage of the thyristor module, diode module, and RC resistor-capacitor absorption unit of the compact self-cooling thyristor valve group in a gradient of 5V for power-on debugging until the AC380V single-phase voltage regulator is adjusted to make the thyristor module and diode module reach the corresponding calculated equivalent current; adjust the AC220V single-phase voltage regulator to make the RC resistor-capacitor absorption unit reach the corresponding calculated equivalent current. Step 4: Record data every 20 minutes during the test, record the temperature rise of the thyristor valve group to be tested obtained by the test, and compare the temperature rises of the thyristor temperature measurement point and the diode temperature measurement point obtained by the test with the preset threshold. Among them, if the absolute value of the temperature rise obtained by the test is greater than the preset threshold, adjust the design capacity of the MCR, and calculate the equivalent current of the thyristor valve group to be tested according to this design capacity; execute Step 3 until the absolute value of the temperature rise of the thyristor valve group to be tested is less than or equal to the preset threshold of 0.5K, and the test ends to obtain the final design capacity of the MCR thyristor valve group. If the absolute value of the temperature rise obtained by the test is less than or equal to the preset threshold of 0.5K, the test ends to obtain the final design capacity of the MCR thyristor valve group.

2. The working method of a compact self-cooling thyristor valve group temperature rise test system according to claim 1, characterized in that, The measurement unit (4) includes a temperature rise measurement unit and a current measurement unit; among them, the temperature rise measurement unit is used to measure the temperature information during the temperature rise test of the thyristor valve group to be tested (2); the current measurement unit is used to measure the flowing current during the temperature rise test of the thyristor valve group to be tested (2).

3. The working method of a compact self-cooling thyristor valve group temperature rise test system according to claim 2, characterized in that, The temperature rise measurement unit includes a thermocouple (403) and a temperature controller (404); among them, multiple thermocouples (403) are provided, and the multiple thermocouples (403) are arranged on the thyristor valve group to be tested (2) to collect and measure the temperature information during the temperature rise test of the thyristor valve group to be tested (2), and transmit the collected temperature information to the temperature controller (404).

4. The working method of a compact self-cooling thyristor valve group temperature rise test system according to claim 3, characterized in that, Multiple thermocouples (403) are arranged at the corresponding temperature measurement points provided on the thyristor valve group to be tested (2).

5. The working method of a compact self-cooling thyristor valve group temperature rise test system according to claim 4, characterized in that, The temperature measurement points are respectively the thyristor temperature measurement point (501), the diode temperature measurement point (502), the first radiator temperature measurement point (503), the second radiator temperature measurement point (504), the third radiator temperature measurement point (505), the fourth radiator temperature measurement point (506), the fifth radiator temperature measurement point (507), the sixth radiator temperature measurement point (508) and the ambient temperature measurement point (509). Among them, the first radiator temperature measurement point (503) is located on the radiator directly below the thyristor; the second radiator temperature measurement point (504) is located on the radiator directly above the thyristor; the third radiator temperature measurement point (505) is located on the radiator at the horizontal position of the thyristor; the fourth radiator temperature measurement point (506) is located on the radiator at the horizontal position of the diode; the fifth radiator temperature measurement point (507) is located on the radiator at the horizontal position of the first radiator temperature measurement point (503); the sixth radiator temperature measurement point (508) is located on the radiator at the horizontal position of the second radiator temperature measurement point (504); the ambient temperature measurement point (509) is arranged outside the thyristor valve group (2).

6. The working method of a compact self-cooling thyristor valve group temperature rise test system according to claim 5, characterized in that, There are at least three ambient temperature measurement points (509) provided, and multiple ambient temperature measurement points (509) are evenly distributed along the circumferential direction of the thyristor valve group (2), and the distance between them and the thyristor valve group (2) is 1 m - 1.5 m.

7. The working method of a compact self-cooling thyristor valve group temperature rise test system according to claim 2, characterized in that, The current measurement unit includes a Hall sensor (401) and an oscilloscope (402); among them, the Hall sensor (401) is used to collect the current information flowing through during the temperature rise test of the to-be-tested thyristor valve group (2), and transmit the collected current information to the oscilloscope (402).

8. The working method of a compact self-cooling thyristor valve group temperature rise test system according to claim 1, characterized in that, The control and synchronization unit (3) includes a controller (301) and an optical fiber (304), where the controller (301) is connected to the to-be-tested thyristor valve group (2) through the optical fiber (304).

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