Software production defect tracing method, device, electronic device and storage medium

By using a binary method to compare defect scenario information with test environment coverage information in the software production environment, the problem of defect tracing in the production environment is solved, rapid positioning and timely repair are achieved, and software reliability is improved.

CN114546870BActive Publication Date: 2025-09-09AGRICULTURAL BANK OF CHINA
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Patent Information

Application Number
CN202210181501.9
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-02-25
Publication Date
2025-09-09
Estimated Expiration
2042-02-25

AI Technical Summary

Technical Problem

Existing software defect tracing methods mainly focus on the test environment and cannot effectively trace defects in the production environment, resulting in delayed defect repair.

Method used

A binary method is used to compare the scenario information of software production defects with the coverage information of the test environment to determine the defect type and quickly locate the cause.

Benefits of technology

Through the dichotomy method, the causes of software production defects can be quickly located, and users can be reminded to fix potential defects in a timely manner to improve software reliability.

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Abstract

The present invention discloses a method, device, electronic device, and storage medium for tracing software production defects. The method obtains information about software production defect generation scenarios, compares the information about software production defect generation scenarios with coverage information of the software testing environment, and uses a binary search method to determine the cause of the software production defect. Since the principle of the binary search method is to discard half of the values ​​in each search to narrow the search range, the present invention can quickly locate the cause of the software production defect in the test environment by using the binary search method to identify the software production defect type, so as to promptly remind users to repair potential software production defects and improve software reliability.
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Description

Technical Field

[0001] The present invention relates to the field of software technology, and more specifically, to a method, device, electronic device, and storage medium for tracing software production defects. Background Art

[0002] Software defects, also known as bugs, are problems, errors, or hidden functional defects in computer software or programs that disrupt normal operation. Software defect tracing is the process of determining the starting point of a software defect's lifecycle. This research is crucial because it analyzes the defect introduction and submission process, studying the characteristics and causes of software defects, thereby guiding subsequent software development and testing to prevent similar defects from recurring. Furthermore, defect tracing allows software development teams to determine when defects were introduced into the software system, enabling them to build defect management systems and promptly alert users to fix potential defects.

[0003] Existing software defect tracing methods primarily focus on tracing software defects in a testing environment. However, after research, the inventors discovered that production defects can already exist in the production environment. Therefore, tracing software production defects has become a pressing technical issue for those skilled in the art. Summary of the Invention

[0004] In view of this, the present invention discloses a method, device, electronic device and storage medium for tracing software production defects, so as to achieve software production defect tracing.

[0005] A method for tracing the source of software production defects, comprising:

[0006] Obtain information on scenarios where software production defects occur;

[0007] The software production defect generation scenario information is compared with the coverage information of the software testing environment, and the cause of the software production defect is determined by using a dichotomy method for the software production defect type.

[0008] Optionally, comparing the software production defect generation scenario information with the coverage information of the software test environment and using a dichotomy method to determine the cause of the software production defect based on the software production defect type includes:

[0009] Determining whether the coverage information of the software testing environment includes the software production defect generation scenario information;

[0010] If yes, then determine whether the software testing environment is running normally;

[0011] If so, it is determined that the cause of the software production defect is incorrect code version deployment.

[0012] Optionally, also include:

[0013] If the software testing environment is not operating normally, determining whether the defect submitted by the software testing environment is repaired;

[0014] If so, it is determined that the cause of the software production defect is incorrect code version deployment.

[0015] Optionally, also include:

[0016] If the defect submitted by the software testing environment has not been repaired, it is determined that the cause of the software production defect is that there is a legacy repair problem in the software testing environment.

[0017] Optionally, also include:

[0018] When the coverage information of the software testing environment does not include the software production defect generation scenario information, determining whether the software testing environment requirements mention a modification scenario corresponding to the software production defect generation scenario information;

[0019] If yes, determine whether the test case covers the software production defect generation scenario information;

[0020] If so, it is determined that the cause of the software production defect is that the test case is not executed in the software testing environment, and the software production defect generation scenario information is put into production ahead of schedule.

[0021] Optionally, also include:

[0022] If the test case does not cover the software production defect generation scenario information, it is determined that the cause of the software production defect is an omission in the design of the software testing environment.

[0023] Optionally, also include:

[0024] If the modification scenario is not mentioned, determining whether the problem that the coverage information of the software testing environment does not include the software production defect generation scenario information is a historical issue;

[0025] If yes, it is determined that the cause of the software production defect is a historical problem that has not been addressed;

[0026] If not, it is determined that the cause of the software production defect is not the content of the current demand transformation, but a new demand for subsequent optimization.

[0027] A software production defect tracing device, comprising:

[0028] An information acquisition unit, used to acquire information about scenarios where software production defects occur;

[0029] The traceability unit is used to compare the software production defect generation scenario information with the coverage information of the software testing environment, and use a dichotomy method to determine the cause of the software production defect based on the software production defect type.

[0030] Optionally, the traceability unit includes:

[0031] A first judging subunit is configured to judge whether the coverage information of the software testing environment includes the software production defect generation scenario information;

[0032] a second judging subunit, configured to judge whether the software testing environment is operating normally if the first judging subunit judges that the software testing environment is operating normally;

[0033] The first tracing sub-unit is configured to determine that the cause of the software production defect is incorrect code version deployment when the second judging sub-unit judges that the defect is caused by incorrect code version deployment.

[0034] Optionally, also include:

[0035] a third judging subunit, configured to judge whether the defect submitted by the software testing environment is repaired if the second judging subunit judges that the defect is not repaired;

[0036] The second tracing sub-unit is configured to determine that the cause of the software production defect is incorrect code version deployment if the third judging sub-unit determines that the software production defect is caused by incorrect code version deployment.

[0037] Optionally, also include:

[0038] The third tracing sub-unit is used to determine that the cause of the software production defect is a legacy repair problem in the software testing environment when the third judging sub-unit judges that the defect is caused by the legacy repair problem in the software testing environment.

[0039] Optionally, also include:

[0040] A fourth judging subunit is configured to, when the first judging subunit determines that the software testing environment requirement mentions a modification scenario corresponding to the software production defect generation scenario information, determine whether the software testing environment requirement mentions a modification scenario corresponding to the software production defect generation scenario information;

[0041] A fifth judging subunit is configured to judge whether the test case covers the software production defect generation scenario information if the fourth judging subunit judges that the test case covers the software production defect generation scenario information;

[0042] The fourth tracing sub-unit is used to determine that the cause of the software production defect is that the test case is not executed in the software testing environment, and the software production defect generation scenario information is put into production in advance when the fifth judgment sub-unit judges that it is yes.

[0043] Optionally, also include:

[0044] The fifth tracing sub-unit is used to determine that the cause of the software production defect is an omission in the design of the software testing environment when the fifth judging sub-unit judges that the defect is not caused.

[0045] Optionally, also include:

[0046] a sixth judging subunit, configured to, if the fourth judging subunit determines that the software testing environment coverage information does not include the software production defect generation scenario information, determine whether the problem is a historical issue;

[0047] A sixth tracing subunit is configured to determine, if the sixth judging subunit determines that the software production defect is caused by a historical issue that has not been addressed;

[0048] The seventh tracing sub-unit is used to determine that the cause of the software production defect is not the content of the current demand modification, but a new demand for subsequent optimization when the sixth judgment sub-unit judges that it is not.

[0049] An electronic device comprising a memory and a processor;

[0050] The memory is used to store at least one instruction;

[0051] The processor is used to execute the at least one instruction to implement the above-mentioned tracing method.

[0052] A computer-readable storage medium stores at least one instruction, and when the at least one instruction is executed by a processor, the tracing method described above is implemented.

[0053] As can be seen from the above technical solutions, the present invention discloses a method, device, electronic device and storage medium for tracing software production defects, which obtains information on software production defect generation scenarios, compares the software production defect generation scenario information with the coverage information of the software test environment, and uses a binary method to determine the cause of the software production defect. Since the principle of the binary method is that half of the values ​​can be discarded each time the search is performed to narrow the search range, the present invention can quickly locate the cause of the software production defect in the test environment by using a binary method for the software production defect type, so as to promptly remind users to repair potential software production defects and improve the reliability of the software. BRIEF DESCRIPTION OF THE DRAWINGS

[0054] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are merely embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the disclosed drawings without any creative work.

[0055] Figure 1 A flowchart of a method for tracing the source of software production defects disclosed in an embodiment of the present invention;

[0056] Figure 2 This is a flow chart of a method for determining the cause of software production defects by using a dichotomy method for software production defect types disclosed in an embodiment of the present invention;

[0057] Figure 3 Another method process disclosed in an embodiment of the present invention uses a dichotomy method to determine the cause of software production defects based on the software production defect type;

[0058] Figure 4 A schematic diagram of the structure of a software production defect tracing device disclosed in an embodiment of the present invention;

[0059] Figure 5 The figure is a schematic structural diagram of an electronic device disclosed in an embodiment of the present invention. DETAILED DESCRIPTION

[0060] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0061] The embodiment of the present invention discloses a method, device, electronic device and storage medium for tracing software production defects, which obtains information on scenarios in which software production defects occur, compares the information on scenarios in which software production defects occur with coverage information of a software testing environment, and uses a binary search method to determine the cause of the software production defect. Since the principle of the binary search method is that half of the values ​​can be discarded each time a search is performed to narrow the search range, the present invention can quickly locate the cause of the software production defect in a test environment by using a binary search method on the software production defect type, so as to promptly remind users to repair potential software production defects and improve software reliability.

[0062] See also Figure 1 , a flowchart of a method for tracing the source of software production defects disclosed in an embodiment of the present invention, the tracing method includes:

[0063] Step S101: Obtain software production defect generation scenario information;

[0064] Among them, software production defects refer to defects generated during the software production process.

[0065] Software production defect generation scenario information refers to: scenario information in which software production defects are generated.

[0066] Step S102: Compare the software production defect generation scenario information with the coverage information of the software testing environment, and use a dichotomy method to determine the cause of the software production defect based on the software production defect type.

[0067] The coverage information of the software testing environment refers to the test cases, test scenarios, test content and other information in the software testing environment.

[0068] The bisection method is a method of dividing into two, also known as the half method. It is a search algorithm for finding a specific element in an ordered array. The main principle is that each search can discard half of the values ​​to narrow the search range, so that the branch corresponding to the problem can be clearly found.

[0069] In summary, the present invention discloses a method for tracing the source of software production defects, which obtains information on scenarios in which software production defects occur, compares the information on scenarios in which software production defects occur with coverage information of the software testing environment, and uses a binary search method to determine the cause of the software production defect. Since the principle of the binary search method is that half of the values ​​can be discarded each time a search is performed to narrow the search range, the present invention can quickly locate the cause of the software production defect in a test environment by using a binary search method on the software production defect type, so as to promptly remind users to repair potential software production defects and improve software reliability.

[0070] To further optimize the above embodiment, see Figure 2 , an embodiment of the present invention discloses a flow chart of a method for determining the cause of a software production defect by using a dichotomy method for the type of software production defect, the method comprising:

[0071] Step S201: Determine whether the coverage information of the software testing environment contains software production defect generation scenario information. If yes, execute step S202;

[0072] In practical applications, a dichotomy method can be used to determine whether the software testing environment is covered in the software testing environment.

[0073] Step S202: determine whether the software test environment is running normally. If yes, execute step S203;

[0074] In this embodiment, when the coverage information of the software testing environment includes information on scenarios where software production defects occur, a dichotomy method is used to analyze the running status of the software testing environment to further determine the cause of the software production defect.

[0075] Step S203: Determine that the cause of the software production defect is incorrect code version deployment.

[0076] In practical applications, any scenario where software production defects occur can be traced back to a state in the software testing environment and the cause of the software generation defect.

[0077] The classification states involved in this embodiment are: the software test environment is running normally;

[0078] The corresponding cause of software production defects is: incorrect code version deployment.

[0079] To further optimize the above embodiment, when the judgment in step S202 is no, the following steps are further included:

[0080] Step S204: Determine whether the defect submitted by the software testing environment has been repaired. If so, execute step S203;

[0081] Step S203: Determine that the cause of the software production defect is incorrect code version deployment.

[0082] Although the software testing environment is not running normally, if the defects submitted in the software testing environment are fixed, the software testing environment can still be considered to be running normally.

[0083] Therefore, the classification states involved in this embodiment are: the software test environment operates normally;

[0084] The corresponding cause of software production defects is: incorrect code version deployment.

[0085] To further optimize the above embodiment, when the judgment in step S204 is no, the following steps are further included:

[0086] Step S205: Determine that the cause of the software production defect is a legacy repair issue in the software testing environment.

[0087] Among them, there are legacy repair issues in the software testing environment, which has been confirmed by all parties. The problems will not be repaired this time, but will be optimized later.

[0088] The classification states involved in this embodiment are: the software testing environment also has problems and all parties confirm that they will not be repaired;

[0089] The corresponding cause of software production defects is: there are legacy repair issues in the software testing environment.

[0090] To further optimize the above embodiment, see Figure 3 , another method for determining the cause of a software production defect using a dichotomy method based on the type of software production defect disclosed in an embodiment of the present invention is a flowchart, the method comprising:

[0091] Step S301: determine whether the coverage information of the software testing environment contains software production defect generation scenario information. If not, execute step S302;

[0092] The principles of step S301 and step S201 are the same.

[0093] Step S302: determine whether the software testing environment requirement mentions a modification scenario corresponding to the software production defect generation scenario information. If yes, execute step S303;

[0094] Step S303: determine whether the test case covers the software production defect generation scenario information. If yes, execute step S304;

[0095] In this embodiment, when the test case covers the software production defect generation scenario information, it indicates that the software testing environment has not executed this test case. This is because if the software testing environment executes this test case, the software production defect generation scenario information will be covered in the software testing environment, and the corresponding step S301 is judged as yes.

[0096] Step S304: Determine that the cause of the software production defect is that the test case is not executed in the software testing environment, and the software production defect generation scenario information is put into production ahead of schedule.

[0097] The classification states involved in this embodiment are: the software test environment does not execute the test case;

[0098] The corresponding causes of software production defects are: test cases are not executed in the software testing environment, and the scenario information of software production defects is put into production ahead of schedule.

[0099] To further optimize the above embodiment, when the judgment in step S303 is no, the following steps are further included:

[0100] Step S305: Determine that the cause of the software production defect is an omission in the design of the software testing environment.

[0101] The classification status involved in this embodiment is: the software testing environment has no test cases designed to cover the software production defect generation scenario information;

[0102] The corresponding cause of software production defects is: omissions in the design of the software testing environment.

[0103] To further optimize the above embodiment, when the judgment in step S302 is no, the following steps are further included:

[0104] Step S306: Determine whether the problem that the coverage information of the software testing environment does not include the software production defect generation scenario information is a historical problem. If yes, execute step S307; if not, execute step S308;

[0105] Step S307: Determine that the cause of the software production defect is a historical issue that has not been addressed;

[0106] Step S308: Determine that the cause of the software production defect is not the content of the current demand modification, but a new demand for subsequent optimization.

[0107] The classification states involved in this embodiment are: historical issues;

[0108] The corresponding causes of software production defects are: historical problems that have not been resolved.

[0109] The classification status involved in this embodiment is: not mentioned in this modification requirement, that is, the content is irrelevant to this modification requirement and will not be repaired this time;

[0110] The corresponding cause of software production defects is: subsequent optimization of new requirements.

[0111] Based on the above discussion, the present invention divides software production defects into six categories and provides the causes of software production defects corresponding to each category, as shown in Table 1.

[0112] Table 1

[0113]

[0114] Referring to Table 1, the present invention divides software production defects in a software testing environment into six categories. By adopting a dichotomy method for the types of software production defects, the causes of software production defects can be quickly located, which helps to draw inferences from one example and improve the quality of software testing.

[0115] Corresponding to the above method embodiment, the present invention also discloses a device for tracing the source of software production defects.

[0116] See also Figure 4 , a schematic diagram of the structure of a software production defect tracing device disclosed in an embodiment of the present invention, the device includes:

[0117] The information acquisition unit 401 is used to acquire software production defect generation scenario information;

[0118] Among them, software production defects refer to defects generated during the software production process.

[0119] Software production defect generation scenario information refers to: scenario information in which software production defects are generated.

[0120] The tracing unit 402 is used to compare the software production defect generation scenario information with the coverage information of the software testing environment, and use a dichotomy method to determine the cause of the software production defect based on the software production defect type.

[0121] The coverage information of the software testing environment refers to the test cases, test scenarios, test content and other information in the software testing environment.

[0122] The bisection method is a method of dividing into two, also known as the half method. It is a search algorithm for finding a specific element in an ordered array. The main principle is that each search can discard half of the values ​​to narrow the search range, so that the branch corresponding to the problem can be clearly found.

[0123] In summary, the present invention discloses a software production defect tracing device, which obtains software production defect generation scenario information, compares the software production defect generation scenario information with the coverage information of the software test environment, and uses a binary search method to determine the cause of the software production defect. Since the principle of the binary search method is that half of the values ​​can be discarded each time the search is performed to narrow the search range, the present invention can quickly locate the cause of the software production defect in the test environment by using the binary search method for the software production defect type, so as to promptly remind users to repair potential software production defects and improve the reliability of the software.

[0124] To further optimize the above embodiment, the tracing unit 402 specifically includes:

[0125] A first judging subunit is configured to judge whether the coverage information of the software testing environment includes the software production defect generation scenario information;

[0126] a second judging subunit, configured to judge whether the software testing environment is operating normally if the first judging subunit judges that the software testing environment is operating normally;

[0127] The first tracing sub-unit is configured to determine that the cause of the software production defect is incorrect code version deployment when the second judging sub-unit judges that the defect is caused by incorrect code version deployment.

[0128] To further optimize the above embodiment, the tracing unit 402 may further include:

[0129] a third judging subunit, configured to judge whether the defect submitted by the software testing environment is repaired if the second judging subunit judges that the defect is not repaired;

[0130] The second tracing sub-unit is configured to determine that the cause of the software production defect is incorrect code version deployment if the third judging sub-unit determines that the software production defect is caused by incorrect code version deployment.

[0131] To further optimize the above embodiment, the tracing unit 402 may further include:

[0132] The third tracing sub-unit is used to determine that the cause of the software production defect is a legacy repair problem in the software testing environment when the third judging sub-unit judges that the defect is caused by the legacy repair problem in the software testing environment.

[0133] To further optimize the above embodiment, the tracing unit 402 may further include:

[0134] A fourth judging subunit is configured to, when the first judging subunit determines that the software testing environment requirement mentions a modification scenario corresponding to the software production defect generation scenario information, determine whether the software testing environment requirement mentions a modification scenario corresponding to the software production defect generation scenario information;

[0135] A fifth judging subunit is configured to judge whether the test case covers the software production defect generation scenario information if the fourth judging subunit judges that the test case covers the software production defect generation scenario information;

[0136] The fourth tracing sub-unit is used to determine that the cause of the software production defect is that the test case is not executed in the software testing environment, and the software production defect generation scenario information is put into production in advance when the fifth judgment sub-unit judges that it is yes.

[0137] To further optimize the above embodiment, the tracing unit 402 may further include:

[0138] The fifth tracing sub-unit is used to determine that the cause of the software production defect is an omission in the design of the software testing environment when the fifth judging sub-unit judges that the defect is not caused.

[0139] To further optimize the above embodiment, the tracing unit 402 may further include:

[0140] a sixth judging subunit, configured to, if the fourth judging subunit determines that the software testing environment coverage information does not include the software production defect generation scenario information, determine whether the problem is a historical issue;

[0141] A sixth tracing subunit is configured to determine, if the sixth judging subunit determines that the software production defect is caused by a historical issue that has not been addressed;

[0142] The seventh tracing sub-unit is used to determine that the cause of the software production defect is not the content of the current demand modification, but a new demand for subsequent optimization when the sixth judgment sub-unit judges that it is not.

[0143] Corresponding to the above embodiment, Figure 5 As shown, the present invention also provides an electronic device, which may include: a processor 1 and a memory 2;

[0144] The processor 1 and the memory 2 communicate with each other via a communication bus 3.

[0145] Processor 1, configured to execute at least one instruction;

[0146] Memory 2, used to store at least one instruction;

[0147] The processor 1 may be a central processing unit (CPU), or an application-specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present invention.

[0148] The memory 2 may include a high-speed RAM memory, and may also include a non-volatile memory (non-volatile memory), such as at least one disk memory.

[0149] The processor executes at least one instruction to implement the following functions:

[0150] Obtain information on scenarios where software production defects occur;

[0151] The software production defect generation scenario information is compared with the coverage information of the software testing environment, and the cause of the software production defect is determined by using a dichotomy method for the software production defect type.

[0152] The present invention also discloses a computer-readable storage medium, wherein the computer-readable storage medium stores at least one instruction, and when the at least one instruction is executed by a processor, the following functions are realized:

[0153] Obtain information on scenarios where software production defects occur;

[0154] The software production defect generation scenario information is compared with the coverage information of the software testing environment, and the cause of the software production defect is determined by using a dichotomy method for the software production defect type.

[0155] In summary, the present invention discloses an electronic device and a storage medium, which obtains information on scenarios in which software production defects occur, compares the information on scenarios in which software production defects occur with coverage information of a software testing environment, and uses a binary search method to determine the cause of the software production defect. Since the principle of the binary search method is that half of the values ​​can be discarded each time a search is performed to narrow the search range, the present invention can quickly locate the cause of the software production defect in a test environment by using a binary search method on the software production defect type, so as to promptly remind users to repair potential software production defects and improve software reliability.

[0156] Finally, it should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or device comprising the element.

[0157] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.

[0158] The above description of the disclosed embodiments is intended to enable one skilled in the art to implement or use the present invention. Various modifications to these embodiments will be readily apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not limited to the embodiments shown herein but is intended to conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A method for tracing the source of software production defects, characterized in that: include: Obtain information on scenarios where software production defects occur; Determining whether the coverage information of the software testing environment includes the software production defect generation scenario information; If the coverage information of the software testing environment includes the software production defect generation scenario information, determining whether the software testing environment operates normally; If the software testing environment operates normally, it is determined that the cause of the software production defect is incorrect deployment of the code version; if the software testing environment operates abnormally, it is determined whether the defect submitted by the software testing environment is repaired; if the defect submitted by the software testing environment is repaired, it is determined that the cause of the software production defect is incorrect deployment of the code version; if the defect submitted by the software testing environment is not repaired, it is determined that the cause of the software production defect is a legacy repair issue in the software testing environment; When the coverage information of the software testing environment does not include the software production defect generation scenario information, determining whether the software testing environment requirements mention a modification scenario corresponding to the software production defect generation scenario information; If the software testing environment requirement mentions a modification scenario corresponding to the software production defect generation scenario information, determining whether the test case covers the software production defect generation scenario information; If the test case covers the software production defect generation scenario information, it is determined that the cause of the software production defect is that the test case is not executed in the software test environment and the software production defect generation scenario information is put into production ahead of schedule; If the test case does not cover the software production defect generation scenario information, determining that the cause of the software production defect is an omission in the software test environment design; If the modification scenario is not mentioned, determining whether the problem that the coverage information of the software testing environment does not include the software production defect generation scenario information is a historical issue; If it is a historical problem, it is determined that the cause of the software production defect is a historical problem that has not been handled; if it is not a historical problem, it is determined that the cause of the software production defect is not included in the current demand transformation and is a new demand for subsequent optimization.

2. A software production defect tracing device, characterized in that: include: An information acquisition unit, used to acquire information about scenarios where software production defects occur; A traceability unit, configured to determine whether the coverage information of the software testing environment includes information on scenarios where software production defects occur; If the coverage information of the software testing environment includes the software production defect generation scenario information, determining whether the software testing environment operates normally; If the software testing environment operates normally, it is determined that the cause of the software production defect is incorrect deployment of the code version; if the software testing environment operates abnormally, it is determined whether the defect submitted by the software testing environment is repaired; if the defect submitted by the software testing environment is repaired, it is determined that the cause of the software production defect is incorrect deployment of the code version; if the defect submitted by the software testing environment is not repaired, it is determined that the cause of the software production defect is a legacy repair issue in the software testing environment; When the coverage information of the software testing environment does not include the software production defect generation scenario information, determining whether the software testing environment requirements mention a modification scenario corresponding to the software production defect generation scenario information; If the software testing environment requirement mentions a modification scenario corresponding to the software production defect generation scenario information, determining whether the test case covers the software production defect generation scenario information; If the test case covers the software production defect generation scenario information, it is determined that the cause of the software production defect is that the test case is not executed in the software test environment and the software production defect generation scenario information is put into production ahead of schedule; If the test case does not cover the software production defect generation scenario information, determining that the cause of the software production defect is an omission in the software test environment design; If the modification scenario is not mentioned, determining whether the problem that the coverage information of the software testing environment does not include the software production defect generation scenario information is a historical issue; If it is a historical problem, it is determined that the cause of the software production defect is a historical problem that has not been handled; if it is not a historical problem, it is determined that the cause of the software production defect is not included in the current demand transformation and is a new demand for subsequent optimization.

3. An electronic device, characterized in that: The electronic device includes a memory and a processor; The memory is used to store at least one instruction; The processor is configured to execute the at least one instruction to implement the source tracing method according to claim 1 .

4. A computer-readable storage medium, characterized in that The computer-readable storage medium stores at least one instruction, and when the at least one instruction is executed by a processor, the traceability method according to claim 1 is implemented.

Citation Information

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