Method and device for performing load measurement on a flexible substrate

Abstract

A flexible substrate testing system includes: a first substrate support structure configured to hold a first portion of a flexible substrate under test; a second substrate support structure configured to hold a second portion of the flexible substrate; one or more actuators configured to move the first and second substrate support structures at respective angles to fold the flexible substrate; and a force cell configured to measure loads on the first and second substrate support structures when the actuators move the first and second substrate support structures.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims the benefit of U.S. Patent Application No. 62 / 865,641, filed on June 24, 2019, entitled “METHODS AND APPARATUS TO PERFORM LOAD MEASUREMENTS ON FLEXIBLESUBSTRATES,” and U.S. Patent Application No. 16 / 900,210, filed on June 12, 2020, entitled “METHODS AND APPARATUS TO PERFORM LOAD MEASUEMENTS ON FLEXIBLE SUBSTRATES.” The entire contents of U.S. Patent Application Nos. 62 / 865,641 and 16 / 900,210 are expressly incorporated herein by reference. Background Art

[0003] The present disclosure relates generally to materials testing and, more particularly, to methods and apparatus for performing load measurements on flexible substrates.

[0004] Reliability testing of a component or moving part of an assembly may involve repeatedly performing expected and / or unexpected movements of the component to verify that the component and / or assembly operates reliably within a defined minimum number of motion cycles. For example, reliability testing of a flexible substrate may involve repeatedly flexing the substrate in one or more ways while testing the device for continued operation and / or monitoring for various failure modes. Summary of the Invention

[0005] The present invention discloses a method and apparatus for performing load measurement on a flexible substrate, substantially as shown in and described in connection with at least one of the accompanying drawings, and more fully set forth in the claims. BRIEF DESCRIPTION OF THE DRAWINGS

[0006] These and other features, aspects, and advantages of the present disclosure will be better understood when the following detailed description is read with reference to the accompanying drawings, in which like reference numerals represent like parts throughout the various drawings, wherein:

[0007] Figure 1A and Figure 1B is a block diagram illustrating an exemplary flexible substrate testing system for performing mechanical property testing on a flexible substrate according to various aspects of the present disclosure.

[0008] Figure 1C is a block diagram of another exemplary flexible substrate testing system configured to perform multiple folds on a substrate.

[0009] Figure 2 is a block diagram of an exemplary embodiment of the flexible substrate testing system of FIG. 1 .

[0010] Figure 3 is a perspective view of an exemplary embodiment of the flexible substrate testing system of FIG. 1 , showing first and second plates in an open or flattened position.

[0011] Figure 4 yes Figure 3 A perspective view of an exemplary flexible substrate testing system in an open or flattened position, omitting the first and second plates.

[0012] Figure 5 yes Figure 3 A perspective view of an exemplary flexible substrate testing system in a center position.

[0013] Figure 6 yes Figure 3 Another perspective view of an exemplary flexible substrate testing system in a middle position.

[0014] Figure 7 yes Figure 3 A perspective view of an exemplary flexible substrate testing system in a closed or folded position.

[0015] Figure 8 yes Figure 3 A side view of an exemplary flexible substrate testing system in a closed or folded position.

[0016] Figure 9 yes Figure 3 Partial exploded view of the translational connection component.

[0017] Figure 10 is a flow chart showing an exemplary method for measuring the load on a flexible substrate, which may be performed from FIG. Figure 9 An exemplary flexible substrate testing system is performed.

[0018] The accompanying drawings are not necessarily drawn to scale. Wherever appropriate, similar or identical reference numerals refer to similar or identical parts. DETAILED DESCRIPTION

[0019] Conventional flexible substrate testing systems cannot measure the load or stress on a flexible substrate during folding or unfolding. Instead, conventional flexible substrate testing systems may involve tests such as defect analysis and other static tests and analyses.

[0020] Disclosed exemplary flexible substrate testing systems and methods provide for stress testing of flexible substrates, including measuring dynamic and / or static loads on the flexible substrate during deformations such as folding and / or unfolding. Some disclosed exemplary systems and methods reduce or minimize additional stress on the flexible substrate caused by the flexible substrate testing system itself. For example, some disclosed flexible substrate testing systems include a fixture that provides for repeated folding and unfolding of a flexible substrate, such as a flexible display screen. Disclosed examples configure the fixture, such as guides for moving components, so that the fixture does not generate additional pressure or tension on the flexible substrate when the ends of the substrate are folded together or unfolded.

[0021] In contrast to conventional flexible substrate testing systems that perform two 90-degree bends, the disclosed exemplary testing system reduces or prevents stress induced on the substrate under test by the test fixture (e.g., stress in addition to the stress the material would naturally and necessarily experience due to folding). Some conventional testing systems that perform two 90-degree bends attempt to eliminate this stress by holding the material so that a portion of the substrate acts as a buffer to resist stretching and compression of the material.

[0022] In contrast to conventional testing systems, the disclosed exemplary testing system is geometrically configured to rotate a portion of a substrate so that the substrate can be fully extended in an open or deployed position without being subjected to tensile stresses caused by the rotation of the test fixture. Thus, the disclosed exemplary testing system and test fixture for flexible substrates provide more accurate measurements of stress on the flexible substrate during repeated stress measurements.

[0023] An exemplary flexible substrate testing system is disclosed that includes: a first substrate support structure configured to hold a first portion of a flexible substrate under test; a second substrate support structure configured to hold a second portion of the flexible substrate; one or more actuators configured to move the first and second substrate support structures at respective angles to fold the flexible substrate; and a force cell configured to measure loads on the first and second substrate support structures as the actuators move the first and second substrate support structures.

[0024] In some exemplary flexible substrate testing systems, the first and second substrate support structures are configured to fold the substrate to an angle greater than 0 degrees and less than or equal to 360 degrees. In some exemplary flexible substrate testing systems, the first substrate support structure is configured to rotate up to 90 degrees, and the second substrate support structure is configured to rotate up to 90 degrees and fold the substrate at an angle of up to 180 degrees. In some exemplary flexible substrate testing systems, the one or more actuators are configured to move the first and second substrate support structures simultaneously.

[0025] In some exemplary flexible substrate testing systems, the one or more actuators are configured to move the first and second substrate support structures by driving a single input shaft. In some exemplary flexible substrate testing systems, the input shaft is connected to a first secondary shaft configured to move the first substrate support structure and to a second secondary shaft configured to move the second substrate support structure. In some exemplary flexible substrate testing systems, the first secondary shaft is connected to the first substrate support structure via a first drive system configured to rotate the first substrate support structure about a first axis defined by the first drive system, and the second secondary shaft is connected to the second substrate support structure via a second drive system configured to rotate the second substrate support structure about a second axis defined by the second drive system. In some exemplary flexible substrate testing systems, the first and second drive systems are configured to simultaneously and proportionally rotate the first portion of the flexible substrate and the second portion of the flexible substrate. In some exemplary flexible substrate testing systems, the first and second axes are spaced apart to produce multiple folds in the substrate.

[0026] Some example flexible substrate testing systems include a control circuit configured to determine a load on the flexible substrate based on load information from a load cell.

[0027] In some exemplary flexible substrate testing systems, the first substrate support structure includes a first plate having a first surface, and the second substrate support structure includes a second plate having a second surface. In some exemplary flexible substrate testing systems, the flexible substrate testing system is configured to orient a first plane of the first surface and a second plane of the second surface perpendicularly during folding and unfolding.

[0028] Some exemplary flexible substrate testing systems include a first translational linkage configured to retain a first substrate support structure and restrict movement of the first substrate support structure in a direction parallel to a first surface of the first substrate support structure. Some exemplary flexible substrate testing systems include a second translational linkage configured to retain a second substrate support structure and restrict movement of the second substrate support structure in a direction parallel to a second surface of the second substrate support structure. In some exemplary flexible substrate testing systems, the first translational linkage includes a first four-bar linkage connected to the first substrate support structure, and the second translational linkage includes a second four-bar linkage connected to the second substrate support structure.

[0029] Some exemplary flexible substrate testing systems include control circuitry configured to determine a load on the flexible substrate based on a dynamic load measured by a load cell during folding or unfolding of the flexible substrate. Some exemplary flexible substrate testing systems include control circuitry configured to determine a load on the flexible substrate based on a static load measured by the load cell when folding or unfolding of the flexible substrate is complete.

[0030] An exemplary method of measuring a load on a flexible substrate is disclosed, comprising: moving a first portion and a second portion of a flexible substrate under test by an actuator to fold or unfold the flexible substrate; and measuring a load on the flexible substrate caused by the movement.

[0031] In some example methods, moving the first portion of the flexible substrate involves rotating a first substrate support structure that holds the first portion of the flexible substrate, and moving the second portion of the flexible substrate involves rotating a second substrate support structure that holds the second portion of the flexible substrate.

[0032] Some other disclosed exemplary flexible substrate testing systems include: a first plate including a first surface configured to hold a first side of a flexible substrate under test; a first translational link configured to hold the first plate and restrict movement of the second plate in a direction parallel to the first surface of the first plate; a second plate including a second surface configured to hold a second side of the flexible substrate; a second translational link configured to hold the second plate and restrict movement of the second plate in a direction parallel to the second surface of the second plate; one or more actuators configured to move the first and second plates at respective angles to fold the substrate to an angle greater than 0 degrees and less than or equal to 180 degrees; and a force cell configured to measure loads on the first and second plates as the actuators move the first and second plates.

[0033] Figure 1A and Figure 1B is a block diagram illustrating an exemplary flexible substrate testing system 100 for performing mechanical property testing on a flexible substrate 102 . Figure 1A The flexible substrate testing system 100 is shown in an open, flattened, or unfolded position. Figure 1B The test system 100 is shown in a closed or folded position. The exemplary flexible substrate 102 can be a flexible display screen or other device, fabric, material, and / or any other substrate. The system 100 of FIG. 1 is configured to repeatedly fold and unfold the flexible substrate 102 to measure stress (e.g., folding force) on the substrate 102.

[0034] The exemplary system 100 includes a first plate 104, a second plate 106, an actuator 110, first and second load cells 112a, 112b, and first and second translational link members 114a, 114b. The system 100 may include additional features, such as a structural support or frame, processing circuitry, communication and / or input / output (I / O) circuitry, and / or any other components. The load cells 112a, 112b may output measurements during folding and / or unfolding (e.g., measurements of dynamic loads) and / or at the end of the folding and / or unfolding process (e.g., measurements of static loads).

[0035] When folded, the flexible substrate 102 is seen to have a first side 116 and a second side 118 on opposite ends of a bend 120 or fold of the substrate 102. First side 116 and second side 118. Figure 1 shows the substrate in an unfolded or flattened position (solid lines) and a folded position (dashed lines).

[0036] The first plate 104 is a first substrate support structure and has a first surface 122 to which the first side 116 of the substrate 102 is attached or secured and remains stationary relative to the first surface 122. The second plate 106 is a second substrate support structure and has a second surface 124 to which the second side 118 of the substrate 102 is attached or secured and remains stationary relative to the second surface 124. The plates 104, 106 are separated by a gap that is bridged by the portion of the substrate 102 that forms the bend 120 when the substrate 102 is folded.

[0037] Although Figure 1A The first and second substrate support structures in the embodiment are first and second plates, but in other examples, the first and second substrate support structures may be different. For example, other first and second substrate support structures may include clips or clamps to hold a portion of the substrate 102, thereby achieving folding without attaching the substrate 102 to a plate.

[0038] The actuator 110 is connected to the first plate 104 and the second plate 106 to move the plates 104, 106. Figure 1A and Figure 1B As shown, the actuator 110 causes the panels 104, 106 to be in an open, flattened, or deployed position (wherein the base panel 102 is deployed ( Figure 1A )) and a closed or folded position (wherein the base plate 102 is folded ( Figure 1B In some examples, the actuator 110 can be a motor attached to the first and second plates 104, 106 via respective linkages.

[0039] As the actuator 110 moves the plates 104, 106, the load cells 112a, 112b measure the loads on the first plate 104 and the second plate 104, respectively. Specifically, the load cells 112a, 112b measure the stress on the substrate 102 as the substrate 102 folds by measuring the load applied to the first plate 104 by the first side 116 of the substrate 102 and the load applied to the second plate 106 by the second side 118 of the substrate 102.

[0040] The translational linkage members 114a, 114b restrict movement of the first plate 104 and the second plate 106 in directions other than the direction in which loads are applied to the load cells 112a, 112b, respectively, by the first plate 104 and the second plate 106. For example, if the load cell 112a is configured to measure loads in a direction perpendicular to the plane of the first surface 122, the translational linkage member 114a restricts movement of the first plate 104 in a direction parallel to the plane of the first surface 122 while allowing loads to be transferred from the first plate 104 to the load cell 112a (e.g., in a direction perpendicular to the surfaces of the first plate 104 and / or the base plate 102). Similarly, if the force measuring cell 112b is configured to measure a load in a direction perpendicular to the plane of the second surface 124, the translational connection member 114b limits the movement of the second plate 106 to a direction parallel to the plane of the second surface 124 while allowing the load to be transferred from the second plate 106 to the force measuring cell 112b (e.g., in a direction perpendicular to the surface of the second plate 106 and / or the substrate 102).

[0041] Exemplary translational linkages 114a, 114b can each include one or more four-bar linkages connected to a frame fixed relative to the force cells 112a, 112b. In some examples, the translational linkages 114a, 114b are further constrained in a direction toward the force cells 112a, 112b to prevent overloading of the force cells 112a, 112b. For example, stops can be attached to the frame to prevent the four-bar linkage and first plate 104 from moving beyond the stops toward the force cell 112a.

[0042] In operation, after the base plate 102 is secured to the first and second plates 104, 106, the exemplary load cells 112a, 112b can be offset or deflected to subtract preload from test measurements. For example, a preload may be generated on the load cells 112a, 112b due to the weight of the plates 104, 106, the weight of the translational linkage members 114a, 114b, and the weight of the first side 116 of the base plate 102 on the first plate 104 and the weight of the second side 116 of the base plate 102 on the second plate 106. By determining the preload on the load cells 112a, 112b, the load cells 112a, 112b can be calibrated or compensated to measure stress on the base plate 102 during folding and unfolding.

[0043] In some examples, the testing system 100 is positioned so that the first plate 104 and the second plate 106 are positioned vertically and the plates 104, 106 move horizontally. For example, the axis of rotation of the plates 104, 106 is vertical, or straight up and down, and the weight of the plates 104, 106 is not toward the load cells 112a, 112b.

[0044] To reduce or prevent stress on the substrate 102 caused by the clamp, the rotation axes 126a, 126b (e.g., pivot points) are offset relative to the substrate 102. The length of the offset can be based on, for example, the folded radius r of the substrate 102. When the substrate 102 is unfolded to the open position, the distance between the panels 104, 106 (e.g., the distance bridged by the substrate 102) can also be based on a radius, such as a distance of approximately 3.14×r, which is approximately equal to the circumference of the folded portion of the substrate 102 in the folded or closed position. Additionally or alternatively, the offset between the axes 126a, 126b and the panels 104, 106 can be configured based on the radius such that the distance between the panels 104, 106 is approximately 2×r. By configuring the axes 126a, 126b and / or configuring the panels 104, 106 based on fixed axes 126a, 126b and a desired fold radius, the testing system 100 allows the substrate 102 to fully extend and fold to a desired fold radius when unfolded without inducing tension or compression stress on the substrate 102 due to the folding. In some examples, the fold radius may cause premature failure of the substrate 102, which can be measured as part of the test.

[0045] exist Figure 1AIn the example of FIG, the measurements output by the load cells 112a, 112b are compensated for the weight of the first and second plates 104, 106, and / or the inertial load of the first plate 104, and / or the inertial load of the second plate 106 to provide a measurement of the force, stress, or load on the flexible substrate 102. For example, a portion of the weight of the second plate 106 and a portion of the inertial load of the second plate 106 that generate the force measurable by the load cell 112 may continuously change during the folding motion. The processing system (e.g., the processor 203 disclosed below) can be configured to compensate the measurements received from the load cells 112a, 112b based on the characteristics of the first plate 104, the second plate 106, and / or the actuator 110, the folding direction, the folding speed, and / or the folding path, and / or any other dynamic forces that occur during the folding and / or unfolding process.

[0046] Figure 1C is a block diagram of another exemplary flexible substrate testing system 150 configured to perform multiple folds on the substrate 102 . Figure 1C The exemplary flexible substrate testing system 150 includes the first and second plates 104 , 106 , and further includes a third substrate support structure 152 , such as a third plate.

[0047] exist Figure 1C In the example shown, the axes 126a, 126b are sufficiently offset to create multiple folds (e.g., triple folds or more) in the substrate 102. For example, a third portion 154 of the substrate 102, such as a central portion of the substrate 102, is secured to the fixed support structure 152 while the panels 104, 106 are actuated to perform folds along multiple axes corresponding to the axes 126a, 126b.

[0048] Additionally or alternatively, although single and dual folding axes are disclosed above, other examples may have three or more folding axes that use corresponding substrate support structures (e.g., plates) and corresponding transmission systems to control the rotation of the substrate support structures. Figure 1C Examples are configured to fold both portions of the base plates 116, 118 toward the same side of the third portion 154, but in other examples, the plates 104, 106 and axes 126a, 126b are configured to fold the portions 116, 118 toward opposite sides of the third portion 154 (e.g., not a U-shaped fold, but a Z-shaped fold).

[0049] Figure 2 yes Figure 1A A block diagram of an exemplary embodiment of a flexible substrate testing system 100 is shown. Figure 2 As shown, the flexible substrate testing system 100 includes a test fixture 201 and a computing device 202 .

[0050] Exemplary computing device 202 may be a general purpose computer, a laptop, a tablet, a mobile device, a server, an all-in-one computer, and / or any other type of computing device. Figure 2 The computing device 202 includes a processor 203, which can be a general-purpose central processing unit (CPU). In some examples, the processor 203 can include one or more special-purpose processing units, such as an FPGA, a RISC processor with an ARM core, a graphics processing unit, a digital signal processor, and / or a system on a chip (SoC). The processor 203 executes machine-readable instructions 204, which can be stored locally in the processor (e.g., in a built-in cache or SoC), random access memory 206 (or other volatile memory), read-only memory 208 (or other non-volatile memory, such as flash memory), and / or a mass storage device 210. An exemplary mass storage device 210 can be a hard drive, a solid-state storage drive, a hybrid drive, a RAID array, and / or any other mass data storage device. A bus 212 enables communication between the processor 203, RAM 206, ROM 208, the mass storage device 210, a network interface 214, and / or an input / output interface 216.

[0051] Exemplary network interface 214 includes hardware, firmware, and / or software to connect computing device 201 to a communications network 218, such as the Internet. For example, network interface 214 may include IEEE 202.X compliant wireless and / or wired communications hardware for sending and / or receiving communications.

[0052] Figure 2 The exemplary I / O interface 216 includes hardware, firmware, and / or software to connect one or more input / output devices 220 to the processor 203 to provide input to and / or output from the processor 203. For example, the I / O interface 216 may include a graphics processing unit for interfacing with a display device, a universal serial bus port for interfacing with one or more USB-compatible devices, FireWire, a fieldbus, and / or any other type of interface. The exemplary extensometer system 10 includes a display device 224 (e.g., an LCD screen) connected to the I / O interface 216. Other exemplary I / O devices 220 may include a keyboard, a keypad, a mouse, a trackball, a pointing device, a microphone, an audio speaker, a display device, an optical media drive, a multi-touch screen, a gesture recognition interface, a magnetic media drive, and / or any other type of input and / or output device.

[0053] Computing device 202 may access non-transitory machine-readable media 222 via I / O interface 216 and / or I / O device 220 . Figure 2Examples of machine-readable media 222 include optical discs (e.g., compact discs (CDs), digital versatile / video discs (DVDs), Blu-ray discs, etc.), magnetic media (e.g., floppy disks), portable storage media (e.g., portable flash drives, secure digital (SD) cards, etc.), and / or any other type of removable and / or installed machine-readable media.

[0054] The test fixture 201 is connected to a computing device 202. Figure 2 In some examples, the test fixture 201 is connected to the computing device via an I / O interface 216, such as a USB port, a Thunderbolt port, a FireWire (IEEE 1394) port, and / or any other type of serial or parallel data port. In some examples, the test fixture 201 is connected to the network interface 214 and / or the I / O interface 216 directly or via a network 218 via a wired or wireless connection (e.g., Ethernet, Wi-Fi, etc.).

[0055] The test fixture 201 includes a frame 228, a force cell 230, a material fixture 236, and a control processor 238. The frame 228 provides rigid structural support for the other components of the test fixture 201 that perform the test. The force cell 230 can be used to Figure 1A The load cell 112 in FIG. 1 and measures the force applied by the actuator 246 via the jaws 248 (eg, plates 104 , 106 ) to the material under test (eg, substrate 102 ).

[0056] The actuator 246 applies a force to the material under test and / or forces the material under test to displace while the jaws 246 grasp the material under test or otherwise connect the material under test to the actuator 234 .

[0057] Example actuators that can be used to provide force and / or motion to components of the test fixture 201 include electric motors, pneumatic actuators, hydraulic actuators, piezoelectric actuators, relays, and / or switches. While the example test fixture 201 uses a motor, such as a servo or direct-drive linear motor, other systems may use different types of actuators. For example, hydraulic actuators, pneumatic actuators, and / or any other type of actuator may be used based on the requirements of the system.

[0058] Exemplary jaws 236 include platens, jaws, and / or other types of grips, depending on the mechanical property under test and / or the material under test. The jaws 236 can be manually configured, controlled by manual input, and / or automatically controlled by a control processor 238.

[0059] The test system 100 may also include one or more control panels 250 including one or more input devices 252. The input devices 252 may include buttons, switches, and / or other input devices located on an operator control panel. For example, the input devices 252 may include buttons that control the actuator 242 to move (e.g., position) the jaws 248 in small increments to a desired position, switches (e.g., foot switches) that control the jaws 248 to close or open (e.g., via another actuator), and / or any other input devices used to control the operation of the test fixture 201.

[0060] The exemplary control processor 238 communicates with the computing device 202, for example, to receive test parameters from the computing device 202 and / or report measurements and / or other results to the computing device 202. For example, the control processor 238 may include one or more communication or I / O interfaces to enable communication with the computing device 202. The control processor 238 may control the actuator 246 to move in a given direction and / or control the speed of the actuator 246, control the gripper 236 to grasp or release the material under test, and / or receive measurements from the displacement transducer 232, the force measuring cell 230, and / or other transducers. In some examples, the control processor 238 monitors the folding angle by monitoring the motor encoder of the actuator 246, which can be used to establish a folding degree ratio per pulse.

[0061] The exemplary control processor 238 is configured to implement a repetitive motion testing process in which a test specimen (e.g., substrate 102) is tested in the test fixture 201. For example, to measure stress on the substrate 102 during or after a series of folding and unfolding motions, the control processor 238 controls the actuator 246 to move the jaws 248 (e.g., first and second plates 104, 106) while monitoring the force cell 230 to measure stress on the substrate 102.

[0062] The example processor 203 can determine the static load on the flexible substrate 102 based on the load measured by the load cell 230 when the flexible substrate 102 is folded or unfolded. The static load measurement can be performed after a relaxation time has been allowed to expire, allowing the substrate 102 to relax after the folding or unfolding process. Additionally or alternatively, the example processor 203 can determine the dynamic load on the flexible substrate 102 based on the load measured by the load cell 230 during the folding or unfolding of the flexible substrate 102. The example processor 203 can perform compensation of the measurements from the load cell 230, for example, to remove the effects of the weight of the first plate 104 and / or the weight and inertial load of the second plate 106 from the load measurements.

[0063] Figure 3 yes Figure 1A1 is a perspective view of an exemplary embodiment of a flexible substrate testing system 100 showing first and second plates 104 , 106 in an open or flattened position. Figure 4 yes Figure 3 A perspective view of an exemplary flexible substrate testing system 100 in an open or flattened position depicting first and second boards. Figure 5 yes Figure 3 A perspective view of an exemplary flexible substrate testing system 100 in an intermediate position (eg, between an open position and a closed position). Figure 6 yes Figure 3 Another perspective view of an exemplary flexible substrate testing system in a center position. Figure 7 yes Figure 3 A perspective view of an exemplary flexible substrate testing system 100 in a closed or folded position. Figure 8 yes Figure 3 FIG. 1 is a side view of an exemplary flexible substrate testing system 100 in a closed or folded position.

[0064] Each exemplary translation link 114a, 114b includes a first four-bar linkage 302a, 302b, a second four-bar linkage 304a, 304b, and a frame 306a, 306b. The frame 306a and the force cell 112a are fixed relative to each other by being attached to the rotation assembly 310a. The frame 306b and the force cell 112b are fixed relative to each other by being attached to the rotation assembly 310b. Each of the first and second four-bar linkages 302a, 302b, 304a, 304b is configured to be attached to the first plate 104 or the second plate 106 via an innermost link. The first and second four-bar linkages 302a, 304a restrict the movement of the first plate 104 to directions parallel to the surface of the first plate 104 on which the base plate 102 is mounted, while allowing loads from the first plate 104 to be transferred in directions perpendicular to the surface of the first plate 104 (e.g., Figure 3 The force (direction Z shown in FIG) is transferred to the force cell 112a (eg, via an extension post 308a connected to the force cell 112a).

[0065] To prevent overloading of the load cells 112a, 112b, the frames 306a, 306b include stops configured to prevent the first and second four-bar linkages 302, 304 and / or the first plate 104 or the second plate 106 from moving toward the load cells 112a, 112b beyond the stops. The stops can be implemented using, for example, pins or other rigid fasteners configured to contact the bottom surfaces of the first and / or second four-bar linkages 302a, 302b, 304a, 304b, the top surfaces of the frames 306a, 306b, buffers or rigid deflectors connected to the top surfaces of the frames 306a, 306b to provide stops by contacting the first plate 104 or the second plate 106, and / or any other technique.

[0066] The rotating arms 301a, 301b are configured to rotate and translate the first and second panels 104, 106 to fold and unfold the base panel 102. The rotating arms 301a, 301b are connected to rotational axes 312a, 312b (e.g., pivot points). An actuator can simultaneously rotate both rotating arms 301a, 301b by driving an input shaft 314. The input shaft 314 is connected to countershafts 316a, 316b, which drive corresponding transmission systems 318a, 318b connected to the rotating arms 301a, 301b. In some examples, the gear ratios between the input shaft 314 and the rotating arms 301a, 301b are identical, so that the two panels 104, 106 fold simultaneously and proportionally.

[0067] Although Figure 3 Examples include a drive system 318a, 318b to define a folding path for the substrate 102, but in other examples, the guides may be different. For example, other guides may include a plurality of gears, wherein a first gear is freely rotatable and aligned with an edge of a first side of the substrate 102, and a second gear is meshed with the first gear and fixed relative to the second half of the substrate 102. Other exemplary guides may include a combination of two linear actuators arranged perpendicular to each other, wherein one linear actuator is mounted on the other linear actuator in a combination. The first plate 104 and the second plate 106 are attached to a respective one of the actuators in the actuator combination and are free to move in the xy plane and describe a folding path. Multiple linear actuators enable the guide to implement different types of paths, including folding paths of different radii and / or non-circular folding paths. Some other exemplary guides may include a series of connecting members that define a folding path.

[0068] Figure 9 yes Figures 4 to 81 is a partially exploded view of a translational linkage of FIG. In particular, the exemplary translational linkage 114 a is shown as having inner linkage members 902, 904 of the four-bar linkage 302, 304, which are spaced apart from intermediate links 906, 908, 910, 912, respectively. The intermediate linkage members 906-912 connect the inner linkage members 902, 904 to the frame 306, which is part of the four-bar linkage 302, 304.

[0069] Figure 10 is a flow chart illustrating an exemplary method 1000 for measuring a load on a flexible substrate, which may be performed by Figure 1A 11. Figure 1A and Figure 2 An exemplary method 1000 is disclosed.

[0070] At block 1002 , the processor 203 and / or the control processor 238 calibrates the load cells 112 , 230 to compensate for the weight of the first and / or second substrate support structures (e.g., the first plate 104 , the second plate 106 ), the translational link member 114 , and / or any other forces that affect the measurements of the load cells 112 , 230 .

[0071] At block 1004 , a first substrate support structure (eg, first plate 104 ) holds a first portion of the flexible substrate 102 in place. At block 1006 , a second substrate support structure (eg, second plate 106 ) holds a second portion of the flexible substrate 102 .

[0072] At block 1008, the processor 203 and / or the control processor 238 determines whether to fold the flexible substrate 102. For example, the processor 203 may determine whether to perform a folding cycle (e.g., folding and unfolding). If folding is not to be performed (block 1008), control repeatedly returns to block 1008 to wait for folding.

[0073] When folding is to be performed (block 1008), at block 1010, the processor 203 and / or the control processor 238 controls the actuator 110 to move the first and second substrate support structures (e.g., the first and second plates 104, 106) in a folding direction to fold the flexible substrate 102. In some examples, a transmission system or other guides may be used to control the bend radius and / or folding path of the flexible substrate 102 during folding. At block 1012, the force measuring cells 112a, 112b, 230 measure the dynamic load on the flexible substrate 102 during folding and / or measure the static load on the flexible substrate 102 after folding.

[0074] At block 1014, the processor 203 and / or the control processor 238 determines whether to deploy the flexible substrate 102. If deployment is not to be performed (block 1014), control iterates back to block 1014 to await deployment.

[0075] When deployment is to be performed (block 1014), at block 1016, the processor 203 and / or the control processor 238 controls the actuator 110 to move the first and second substrate support structures in the deployment direction to deploy the flexible substrate 102. In some examples, a transmission system or other guides may be used to control the bend radius and / or folding path of the flexible substrate 102 during deployment. At block 1018, the force measuring unit 112, 230 measures the dynamic load on the flexible substrate 102 during deployment and / or measures the static load on the flexible substrate 102 after deployment.

[0076] At block 1020, the processor 203 and / or the control processor 238 determines whether to repeat the folding cycle. For example, the flexible substrate 102 may be subjected to a testing process involving multiple folding cycles. If the folding cycle is to be repeated (block 1020), control returns to block 1008. If the folding cycle is not to be repeated (block 1020), the exemplary method 1000 ends.

[0077] The method and system of the present invention can be implemented in hardware, software and / or a combination of hardware and software. The present method and / or system can be implemented in a centralized manner in at least one computing system, or in a distributed manner, with different elements distributed across multiple interconnected computing systems. It is applicable to any type of computing system or other device suitable for executing the methods described herein. A typical combination of hardware and software can include a general-purpose computing system with a program or other code that controls the computing system when loaded and executed so that it executes the methods described herein. Another typical embodiment can include a dedicated integrated circuit or chip. Some embodiments can include a non-transitory machine-readable (e.g., computer-readable) medium (e.g., a flash drive, an optical disc, a magnetic storage disk, etc.) on which one or more lines of machine-executable code are stored, thereby causing the machine to execute the process as described herein. As used herein, the term "non-transitory machine-readable medium" is defined to include all types of machine-readable storage media and excludes propagation signals.

[0078] As used herein, the terms "circuits" and "circuitry" refer to physical electronic components (i.e., hardware) and any software and / or firmware ("code") that can configure, be executed by, and / or otherwise be associated with the hardware. As used herein, for example, a particular processor and memory may constitute a first "circuit" when executing a first line or more lines of code, and may constitute a second "circuit" when executing a second line or more lines of code. As used herein, "and / or" refers to any one or more items connected by "and / or" in a list. For example, "x and / or y" represents any element in a three-element set {(x), (y), (x, y)}. In other words, "x and / or y" refers to "one or both of x and y." As another example, "x, y, and / or z" refers to any element in a seven-element set {(x), (y), (z), (x, y), (x, z), (y, z), (x, y, z)}. In other words, "x, y, and / or z" means "one or more of x, y, and z." As used herein, the term "exemplary" means serving as a non-limiting example, instance, or illustration. As used herein, the terms "such as" and "for example" set forth a list of one or more non-limiting examples, instances, or illustrations. As used herein, a circuit is "operable" to perform a function so long as the circuit contains the necessary hardware and code (if necessary) to perform the function, regardless of whether performance of the function is disabled (e.g., by user-configurable settings, factory calibration, etc.).

[0079] Although the present method and / or system has been described with reference to certain embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents substituted without departing from the scope of the present method and / or system. For example, the blocks and / or components of the disclosed embodiments may be combined, separated, reconfigured and / or otherwise modified. Furthermore, many modifications may be made to adapt particular circumstances or materials to the teachings of the present invention without departing from the scope of this disclosure. Therefore, the present method and / or system is not limited to the specific embodiments disclosed. On the contrary, the present method and / or system will include all embodiments that fall within the scope of the appended claims, both literally and in accordance with the doctrine of equivalents.

Claims

1. A flexible substrate testing system, comprising: a first substrate support structure configured to hold a first portion of a flexible substrate under test; a second substrate support structure configured to hold a second portion of the flexible substrate; one or more actuators configured to move the first substrate support structure and the second substrate support structure at respective angles to fold the flexible substrate; a first load cell and a second load cell, the first load cell being configured to measure a first load on the first substrate support structure and the second load cell being configured to measure a second load on the second substrate support structure when the actuator moves the first substrate support structure and the second substrate support structure; Single input shaft; a first sub-axis configured to move the first substrate support structure; as well as a second sub-axis configured to move the second substrate support structure; wherein the one or more actuators are configured to simultaneously move the first substrate support structure and the second substrate support structure by driving the single input shaft, Wherein, the single input shaft is connected to the first countershaft and the second countershaft. 2 . The flexible substrate testing system of claim 1 , further comprising a control circuit configured to determine the load on the flexible substrate based on load information from the first load cell and the second load cell.

3. The flexible substrate testing system according to claim 1, wherein: The first countershaft is connected to the first substrate support structure by a first transmission system configured to rotate the first substrate support structure about a first axis defined by the first transmission system, and the second countershaft is connected to the second substrate support structure by a second transmission system configured to rotate the second substrate support structure about a second axis defined by the second transmission system.

4. The flexible substrate testing system according to claim 3, wherein: The first transmission system and the second transmission system are configured to rotate the first portion of the flexible substrate and the second portion of the flexible substrate simultaneously and proportionally.

5. The flexible substrate testing system according to claim 3, wherein: The first axis and the second axis are spaced apart to create a plurality of folds in the flexible substrate.

6. The flexible substrate testing system according to claim 1, wherein: The first substrate support structure includes a first plate having a first surface, and the second substrate support structure includes a second plate having a second surface.

7. The flexible substrate testing system according to claim 6, wherein: The flexible substrate testing system is configured to vertically position a first plane of the first surface and a second plane of the second surface during folding and unfolding.

8. The flexible substrate testing system of claim 6, further comprising a first translational contact member configured to hold the first substrate support structure and restrict movement of the first substrate support structure in a direction parallel to the first surface of the first substrate support structure.

9. The flexible substrate testing system of claim 8, further comprising a second translational contact member configured to hold the second substrate support structure and restrict movement of the second substrate support structure in a direction parallel to the second surface of the second substrate support structure.

10. The flexible substrate testing system according to claim 9, wherein: The first translational link comprises a first four-bar link connected to the first substrate support structure, and the second translational link comprises a second four-bar link connected to the second substrate support structure.

11. The flexible substrate testing system according to claim 1, wherein: The first substrate supporting structure and the second substrate supporting structure are configured to fold the flexible substrate to an angle greater than 0 degrees and less than or equal to 360 degrees.

12. The flexible substrate testing system according to claim 11, wherein: The first substrate support structure is configured to rotate up to 90 degrees, and the second substrate support structure is configured to rotate up to 90 degrees to fold the flexible substrate at an angle of up to 180 degrees.

13. The flexible substrate testing system of claim 1 , further comprising a control circuit configured to determine the load on the flexible substrate based on dynamic loads measured by the first and second load cells during folding or unfolding of the flexible substrate.

14. The flexible substrate testing system of claim 1 , further comprising a control circuit configured to determine the load on the flexible substrate based on static loads measured by the first and second load cells when folding or unfolding of the flexible substrate is completed.

15. A method of measuring a load on a flexible substrate using a flexible substrate testing system according to any preceding claim, the method comprising: moving the first portion of the flexible substrate under test and the second portion of the flexible substrate by the actuator to fold or unfold the flexible substrate; as well as The load on the flexible substrate caused by the movement is measured.

16. The method according to claim 15, wherein Moving the first portion of the flexible substrate includes rotating a first substrate support structure that holds the first portion of the flexible substrate, and moving the second portion of the flexible substrate includes rotating a second substrate support structure that holds the second portion of the flexible substrate.

17. A flexible substrate testing system, comprising: a first plate comprising a first surface configured to hold a first side of a flexible substrate under test; a first translational link member configured to retain the first plate and restrict movement of the first plate in a direction parallel to the first surface of the first plate; a second plate comprising a second surface configured to hold a second side of the flexible substrate; a second translational link member configured to retain the second plate and restrict movement of the second plate in a direction parallel to the second surface of the second plate; one or more actuators configured to move the first plate and the second plate at respective angles to fold the flexible substrate to an angle greater than 0 degrees and less than or equal to 180 degrees; a first load cell and a second load cell, wherein the first load cell is configured to measure a first load on the first plate and the second load cell is configured to measure a second load on the second plate when the actuator moves the first plate and the second plate; Single input shaft; a first countershaft configured to move the first plate; as well as a second countershaft configured to move the second plate; wherein the one or more actuators are configured to simultaneously move the first plate and the second plate by driving the single input shaft; Wherein, the single input shaft is connected to the first countershaft and the second countershaft.

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