A single-source dual-ray imaging detection method and device

Abstract

The present invention provides a single-source dual-ray imaging detection method and device, the method comprising: determining the transmission attenuation of the detected object to neutrons and X-rays according to the neutron imaging detection data and X-ray imaging detection data of the detected object; calculating the material property parameters of the detected object according to the transmission attenuation of the detected object to neutrons and X-rays; statistically analyzing the distribution of the material property parameters and fitting a Gaussian distribution curve of the material property parameters; marking the material property parameters that exceed the preset distribution range in the Gaussian distribution curve according to a preset discrimination threshold; and determining the position of the target object in the detected object according to the marked material property parameters. In the fitted Gaussian distribution curve of the material property parameters, the property parameters that exceed the distribution range are marked, and the position of the target object is determined according to the marked property parameters, so that the position of the target object in the detected object can be accurately located, thereby improving the accuracy of detection.

Description

Technical Field

[0001] The present application relates to the technical field of nondestructive testing, and in particular to a single-source dual-ray imaging testing method and device. Background Art

[0002] X-ray imaging technology has been widely used in industrial nondestructive testing, security inspection and other fields. However, due to the physical properties of the interaction between X-rays and matter, the mass attenuation coefficient of X-rays for different materials increases with the increase of the atomic number of the material. Therefore, for some special usage scenarios, such as the need to detect low atomic number materials in high atomic number materials, the detection capability of X-ray means is limited.

[0003] Two or more rays are used for detection in the related art. Although some new detection technologies can identify the type of substances, when faced with detecting objects containing residual substances, the position of the residual substances in the detected objects cannot be accurately located. Summary of the invention

[0004] The embodiment of the present invention provides a single-source dual-ray imaging detection method and device to solve the problem in the prior art that the position of residual material in the detected object cannot be accurately located.

[0005] In a first aspect, an embodiment of the present invention provides a single-source dual-ray imaging detection method, comprising:

[0006] Determining the transmission attenuation of the detected object to neutrons and X-rays according to the neutron imaging detection data and the X-ray imaging detection data of the detected object;

[0007] Calculating material property parameters of the detected object according to the transmission attenuation of the detected object to neutrons and X-rays;

[0008] Counting the distribution of the material property parameters and fitting a Gaussian distribution curve of the material property parameters;

[0009] According to a preset discrimination threshold, marking the material property parameters in the Gaussian distribution curve that exceed a preset distribution range;

[0010] The position of the target object in the detected object is determined according to the marked material property parameters.

[0011] Optionally, before determining the transmission attenuation of the detected object to neutrons and X-rays according to the neutron imaging detection data and the X-ray imaging detection data of the detected object, the method further includes:

[0012] Obtaining a preset thickness value of the target object input by a user;

[0013] According to the preset thickness value of the target object, the material property parameter distribution range is determined as the preset discrimination threshold.

[0014] Optionally, the statistically analyzing the distribution of the material property parameters to fit a Gaussian distribution curve of the material property parameters includes:

[0015] Determining at least two thickness intervals of the object to be detected based on the attenuation of the X-ray;

[0016] According to the at least two thickness intervals of the detected object, Gaussian distribution curves of the material property parameters corresponding to the at least two thickness intervals are fitted.

[0017] Optionally, determining at least two thickness intervals of the detected object with reference to the attenuation of X-rays includes:

[0018] Acquire an attenuation image of the detected object for X-rays, and perform histogram normalization processing on the attenuation image;

[0019] Evenly dividing the attenuation image into at least two grayscale intervals according to grayscale values;

[0020] The detected object is divided into the at least two thickness intervals according to the at least two grayscale intervals.

[0021] Optionally, marking the material property parameter that exceeds the distribution range according to a preset discrimination threshold includes:

[0022] According to the preset discrimination thresholds corresponding to the at least two thickness intervals, the material property parameters that exceed the distribution range in the Gaussian distribution curve corresponding to the at least two thickness intervals are marked.

[0023] Optionally, the target object contains a neutron attenuation material, and the neutron attenuation material is used to attenuate neutron rays in the target object.

[0024] On the other hand, an embodiment of the present invention provides a single-source dual-ray imaging detection processor, including:

[0025] a material property parameter determination module, configured to determine the transmission attenuation of the detected object to neutrons and X-rays according to the neutron imaging detection data and the X-ray imaging detection data of the detected object, and calculate the material property parameters of the detected object according to the transmission attenuation of the detected object to neutrons and X-rays;

[0026] A statistical module is configured to statistically calculate the distribution of the material property parameters and fit a Gaussian distribution curve of the material property parameters;

[0027] The position determination module is configured to mark the material property parameters exceeding the distribution range in the Gaussian distribution curve according to a preset discrimination threshold, and determine the position of the target object according to the marked material property parameters.

[0028] Optionally, the processor further includes:

[0029] A first receiving module is configured to receive a preset thickness value of the target object input by a user;

[0030] The threshold determination module is configured to determine the material property parameter distribution range as the preset discrimination threshold according to the preset thickness value of the target object.

[0031] In another aspect, an embodiment of the present invention provides a single-source dual-ray imaging detection device, comprising a processor as described in any one of the above items, and a detection imaging device connected to the processor, wherein the detection imaging device is configured to detect and obtain a detection imaging result of the detected object;

[0032] The detection imaging device comprises:

[0033] a single electron accelerator configured to emit electrons toward the neutron conversion target and the X-ray conversion target;

[0034] The neutron conversion target is configured to generate neutron rays under the action of the electrons and emit them from the neutron imaging detection end;

[0035] The X-ray conversion target is configured to generate X-rays under the action of the electrons and emit them from the X-ray imaging detection end;

[0036] The neutron imaging detection end is configured to obtain a neutron imaging detection result of the detected object;

[0037] The X-ray imaging detection end is configured to obtain the X-ray imaging detection result of the detected object.

[0038] On the last aspect, an embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the single-source dual-ray imaging detection method as described in any one of the above items are implemented.

[0039] Compared with the prior art, the present invention has the following advantages:

[0040] In the embodiment of the present invention, the material property parameters are calculated by detecting the neutron imaging detection data and X-ray imaging detection data of the detected object, and the Gaussian distribution curve of the material property parameters is fitted, and the number of pixels in the target object area is marked according to the discrimination threshold preset by the user, so that the position of the target object in the detected object can be accurately located, thereby improving the accuracy of detection.

[0041] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention, it can be implemented according to the contents of the specification. In order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for describing the embodiments are briefly introduced below.

[0043] Figure 1 A schematic diagram of a single-source dual-ray imaging detection method provided by an embodiment of the present invention;

[0044] Figure 2A A schematic diagram of neutron attenuation imaging results of a blade provided in an embodiment of the present invention;

[0045] Figure 2B A schematic diagram of X-ray attenuation imaging results of a blade provided in an embodiment of the present invention;

[0046] Figure 2C A schematic diagram of a double-ray imaging result of a blade provided by an embodiment of the present invention;

[0047] Figure 3 A schematic diagram of a Gaussian distribution curve provided by an embodiment of the present invention;

[0048] Figure 4 A schematic diagram of a method for setting a discrimination threshold provided by an embodiment of the present invention;

[0049] Figure 5 A schematic diagram of the relationship between the atomic number and the X-ray mass attenuation coefficient provided by an embodiment of the present invention;

[0050] Figure 6 A schematic diagram of a method for determining different thickness intervals of an object to be detected using the attenuation of X-rays as a reference in a single-source dual-ray imaging detection method provided in an embodiment of the present invention;

[0051] Figure 7 A schematic diagram of setting the discrimination thresholds at different thicknesses when the minimum detection thickness is 200 microns provided in an embodiment of the present invention;

[0052] Figure 8 A schematic diagram of the detection effect of objects with different thicknesses provided by an embodiment of the present invention;

[0053] Fig. 9 A schematic diagram of a single-source dual-ray imaging detection device provided by an embodiment of the present invention;

[0054] Fig.10 A schematic diagram of the working principle of a single-source dual-ray imaging device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0055] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field belong to the scope of protection of the present invention.

[0056] Before explaining the single-source dual-ray imaging detection method and device provided by the embodiment of the present invention, the application scenario of the single-source dual-ray imaging detection method and device provided by the embodiment of the present invention is specifically described:

[0057] X-ray imaging technology has been widely used in industrial nondestructive testing, security inspection and other fields. However, due to the physical properties of the interaction between X-rays and matter, the mass attenuation coefficient of X-rays for different materials increases with the increase of the atomic number of the material. Therefore, for some special usage scenarios, when it is necessary to detect low atomic number materials in high atomic number materials, the detection capability of X-ray means is limited, such as residual core detection in hollow turbine blades.

[0058] Neutron imaging technology can solve the problem of X-ray imaging's weak penetration ability for metals and insufficient sensitivity for special materials. By adding materials with strong neutron absorption ability, neutron rays can be effectively attenuated, so that the object being tested has a strong contrast at a special position, improving detection efficiency. However, using only a single neutron imaging result cannot obtain information about material properties. When the defect being tested is located in a complex sample, it is difficult to accurately determine the location of the defect being tested based on the strength of the attenuation. This places high demands on the experience of the image reader, and the judgment results usually lack objective basis.

[0059] Based on the complementary characteristics of X-ray and neutron radiation in terms of material transmission, a detection mode that integrates the two radiations can be designed. Based on the difference in the attenuation rate of the two radiations for the same material, the detection results of X-ray and neutron radiation can be integrated to obtain the material property analysis results of the tested sample. In this way, the material at a special position can be automatically identified and located according to the difference in material properties at different positions. In this way, the distribution of the residual core position can be automatically displayed in accordance with the pre-set judgment criteria in a completely objective manner without being affected by prior knowledge.

[0060] Single-source dual-ray imaging is an imaging device that uses a single electron accelerator as an energy driving source to simultaneously generate two imaging beams, X-rays and neutrons. The physical process of the energy driving source is that the high-energy electrons emitted by the electron accelerator generate bremsstrahlung on the anode target, such as tungsten target, lead target, etc. A part of the bremsstrahlung photons produce photoneutrons through photonuclear reactions, and the other part becomes imaging X-rays through scattering. The two rays are generated at the same time, but due to the different speeds of the two rays, after a certain flight distance, they can be distinguished by setting different detection times, thereby realizing two modes of imaging detection.

[0061] Figure 1 A single-source dual-ray imaging detection method provided by an embodiment of the present invention includes:

[0062] Step 101: Determine the transmission attenuation of the detected object to neutrons and X-rays according to the neutron imaging detection data and the X-ray imaging detection data of the detected object.

[0063] The single-source dual-ray imaging detection method provided by the embodiment of the present invention is applied to a single-source dual-ray imaging detection device, which is used to detect the position of a target object in the detected object. In practical applications, the single-source dual-ray imaging detection method provided by the embodiment of the present invention can be used to detect the position of a residual core in a hollow turbine blade, wherein the detected object is a hollow turbine blade, the target object is a residual core, and the base material of the hollow turbine blade and the residual core have different mass attenuation coefficients for rays.

[0064] In an embodiment of the present invention, the above-mentioned single-source dual-ray imaging detection device includes a neutron detection end and an X-ray detection end. When the object to be detected is placed on the neutron detection end, neutron imaging detection data is obtained according to the detection result of the neutron detection end; when the object to be detected is placed on the X-ray imaging detection end, X-ray imaging detection data is obtained according to the detection result of the X-ray imaging detection end.

[0065] Specifically, the single-source dual-ray imaging detection device can be used to obtain neutron imaging detection results and X-ray imaging detection results of the same object to be detected under the same optical path. Based on the neutron imaging detection results and X-ray imaging detection results obtained by the detection, the transmission attenuation of the object to be detected for neutron rays and X-rays is calculated. By comparing the reference detection result when there is no object to be detected with the detection result when there is an object to be detected and then taking the logarithm, the transmission attenuation of neutron rays and X-rays for the sample can be obtained.

[0066] Furthermore, the object to be detected is placed on the neutron imaging detection end of the above detection device to obtain the neutron imaging detection result, and the neutron detection data is obtained according to the neutron imaging detection result; the neutron reference detection data is obtained according to the imaging detection result obtained when the neutron imaging detection end is not placed with the object to be detected. The same method is used to place the same object to be detected on the X-ray imaging detection end of the above detection device to obtain the X-ray detection data; the X-ray reference detection data is obtained according to the imaging detection result obtained when the X-ray detection end is not placed with the object to be detected.

[0067] Based on the above detection data, the transmission attenuation of the detected object to X-rays and the transmission attenuation of neutron rays are calculated respectively.

[0068] According to the formula μt=ln(I 0 / I),

[0069] Among them, μ is the material mass attenuation coefficient of the object being detected, t is the mass thickness of the object being detected, I0 is the reference detection data when there is no object being detected, and I is the measurement data when there is an object being detected. The product of the mass attenuation coefficient and the mass thickness is the transmission attenuation of the object being detected to the radiation.

[0070] It can be obtained that μ X t=ln(I X，0 / I X ) (1)

[0071] Similarly, μ n t=ln(I n，0 / I n ) (2)

[0072] Among them, I X，0 ,I X ,I n，0 and I n are X-ray reference detection data, X-ray detection data, neutron reference detection data and neutron detection data, respectively, μ X t and μ n t are the transmission attenuation of the detected object to X-rays and the transmission attenuation of the detected object to neutrons.

[0073] Step 102: Calculate material property parameters of the object to be inspected according to the transmission attenuation of the object to be inspected for neutrons and X-rays.

[0074] Based on the transmission attenuation of the detected object to X-rays and the transmission attenuation of the detected object to neutrons determined in step 101 , the material property parameters of the detected object are calculated.

[0075] In the embodiment of the present invention, the transmission attenuation μ of the object to be detected under the irradiation of X-rays and neutrons is obtained by the above formulas (1) and (2): X t and μ n t. For a single material, μ n With μ X is the only fixed one, so their ratio is also fixed. Define this ratio as the material property parameter F of the object being tested, and express it in the following formula: Compare the distribution of the attenuation results of the object being tested for X-rays and neutrons, and the expression is:

[0076]

[0077] Among them, F is the material property parameter of the object being tested, I X，0 ,I X ,I n，0 and I n are X-ray reference detection data, X-ray detection data, neutron reference detection data and neutron detection data, respectively, μ X t is the transmission attenuation of the object being tested for X-rays, μ n t is the transmission attenuation of the object being detected for neutrons.

[0078] In an embodiment of the present invention, a hollow turbine blade is used as the detected object to detect the residual core material in the hollow turbine blade, as shown in FIG2 . Figure 2A This is a schematic diagram of the attenuation imaging results of the blade for neutrons. Figure 2B This is a schematic diagram of the attenuation imaging results of the leaf for X-rays. Figure 2C It is a schematic diagram of the attenuation image of the blade for dual-ray imaging fusion. Figure 2A The middle background area is the attenuation imaging of the neutrons of the blade substrate, and the white dots are the attenuation imaging results of the neutrons of the residual core part of the blade. It can be seen that the neutron attenuation of the residual core part is stronger than that of the blade substrate part. Figure 2B The contrast between the X-ray attenuation imaging results of the middle blade substrate part and the part with residual core is not obvious. Figure 2CThe attenuation imaging results of neutrons and X-rays are integrated in the figure. The white dot area is the attenuation imaging result of the residual core part, and the background area is the attenuation imaging result of the blade substrate part. It can be seen that there is an obvious difference between the attenuation imaging result of the residual core part and the attenuation imaging of the blade substrate part.

[0079] Specifically, there are usually two materials in the tested sample, one is the base material used to cast the blade, and the other is the core material remaining inside the blade after demolding. ref The material property parameters of the blade substrate are represented by F cor Material property parameters of the core. Since the mass thickness of the residual core material in the blade substrate in different areas is different during the inspection of the hollow turbine blade, the F ref With F cor The material property parameters after fusion are different. The position of the residual core can be determined by analyzing the material property parameters obtained by detecting different areas of the hollow turbine blade.

[0080] Furthermore, materials with strong neutron attenuation can be added to the target object, so that the attenuation of neutrons by the target object is much greater than the attenuation of neutrons by the substrate of the object being detected, which makes it easier to determine the position of the target object in the substrate of the object being detected during the detection process, which is beneficial to improving the accuracy and efficiency of detection.

[0081] It should be noted that the material added to the target object may be boron, gadolinium, cadmium or other materials that have strong neutron absorption ability and can effectively attenuate neutron rays. Those skilled in the art may set it according to actual conditions, and the embodiments of the present invention do not specifically limit this.

[0082] Step 103: Count the distribution of the material property parameters of the detected object obtained in step 102, and fit a Gaussian distribution curve of the material property parameters of the detected object.

[0083] In an embodiment of the present invention, there are two kinds of materials in the detected object, one is the matrix material of the detected object, and the other is the target object material in the detected object, wherein the attenuation of neutrons by the target object in the detected object is greater than the attenuation of neutrons by the matrix material of the detected object. When the detected object is detected, since the area where the target object exists strongly absorbs neutrons, even if there is a trace amount of the target object, the attenuation result of this area will be significantly greater than that of other parts.

[0084] In the embodiment of the present invention, Figure 3As shown, the material property parameter F obtained according to the entire detection imaging result is a discrete value, and its characteristics can be obtained using statistical methods. In the implementation of the present invention, the discrete material property parameter F is fitted using the Gaussian distribution (also known as normal distribution) statistical method to obtain a continuous Gaussian distribution curve. The material property parameters of the detection result obey the Gaussian distribution, and the expected value of the distribution is the material property parameter value of the substrate of the detected object at the current thickness. According to the fitted Gaussian distribution area curve, it can be further determined whether the material property parameters obtained by the above calculation are within the normal distribution range of the material property parameters of the substrate of the detected object.

[0085] Step 104: Mark the material property parameters that are out of the distribution range in the Gaussian distribution curve according to a preset discrimination threshold.

[0086] In the embodiment of the present invention, Figure 3 As shown in the Gaussian distribution diagram of the material property parameter F of the detected object, the broadening of the Gaussian distribution is mainly composed of statistical fluctuations, and the detected material property parameters obey the Gaussian distribution. Since the area where the target object exists only accounts for a small part of the entire detected object, most of the detection results in the Gaussian distribution curve of the material property parameters obtained by fitting fall within the expected Gaussian distribution range, such as Figure 3 The curve A in the middle represents the distribution curve of the material property parameters of the substrate of the object being tested. When there is a target object in the object being tested, the material property parameters detected in the area where the target object exists will deviate from the normal Gaussian distribution, such as Figure 3 The curve portion B in the middle represents the distribution curve of the material property parameters of the area where the target object exists in the detected object.

[0087] Specifically, each calculated material parameter is judged according to the set discrimination threshold. The discrimination threshold is the standard distribution range of the material property parameter determined according to the substrate of the detected object. The user can use different substrate materials in advance and use the unit dual-ray imaging device to measure the standard distribution range of the corresponding material property parameter, which is used as the discrimination threshold of each substrate material.

[0088] Specifically, a hypothesis testing method may be used to determine one by one whether all material property parameter values ​​in the Gaussian distribution curve conform to a preset distribution range, and to mark material property parameters that exceed the distribution range.

[0089] Specifically, in the imaging image of the detection result, each pixel corresponds to a material property parameter value, and each material property parameter is judged. When the material property parameter is judged to be outside the preset range, the pixel corresponding to the material property parameter is color-marked. For example, any color such as red, orange, yellow, green, etc. can be used for marking to distinguish the pixels that are out of the range from the pixels that are within the range.

[0090] Step 105: Determine the position of the target object according to the marked material property parameters.

[0091] In the embodiment of the present invention, since in the detection imaging result, the absorption intensity of the radiation in the area where the target object exists is greater than the absorption intensity of the area where the target object does not exist, therefore, in the detection imaging result, the material property parameter value of the area where the target object exists is usually greater than the material property parameter value of the area where the target object does not exist, and the area composed of the marked material properties is the position where the target object exists in the detected object. Preferably, the pixel points corresponding to the material property parameters outside the preset range are color-marked, and the position where the target object exists in the detected object is determined by color distinction in the detection imaging image.

[0092] Specifically, each detection point in the detection imaging image has a pixel number. By determining the material property parameter value of each detection point one by one, the material property parameter values ​​outside the preset range are identified, thereby determining the pixel number of the detection points corresponding to these material property parameter values ​​in the detection imaging image. By collecting the determined pixel number, the position of the target object in the detection imaging image can be obtained.

[0093] Through the above detection method, based on the neutron imaging detection data and X-ray imaging detection data of the detected object, the material property parameters are calculated, and by fitting the Gaussian distribution curve of the material property parameters, the number of pixels in the target object area is marked according to the user's preset discrimination threshold, so that the position of the target object in the detected object can be accurately located, thereby improving the accuracy of detection.

[0094] In an embodiment of the present invention, for an object to be detected with uneven thickness, Gaussian distribution curves of corresponding material property parameters can be fitted according to different thickness ranges of the object to be detected, thereby further reducing the impact of changes in material thickness of the object to be detected on the detection result.

[0095] Optionally, before determining the transmission attenuation of the detected object to neutrons and X-rays according to the neutron imaging detection data and X-ray imaging detection data of the detected object in step 101, the following steps may also be included. Figure 4 , Figure 4A schematic diagram of a method for setting a discrimination threshold provided by an embodiment of the present invention.

[0096] Step 201: Obtain a preset thickness value of the target object input by a user.

[0097] In an embodiment of the present invention, the detection device is provided with a display operation interface, and the user can input a preset thickness value of the target object on the display operation interface. The preset thickness of the target object refers to the minimum thickness of the target object allowed to exist in the detected object that the user can accept when detecting the detected object.

[0098] In actual applications, different users have different expectations for the thickness of the target object allowed to exist in the detected object, and the user can flexibly set it according to actual needs. For example, if it is expected that there is no target object in the detected object, the preset thickness value can be set to "0", and if it is expected that the minimum thickness of the target object in the detected object is 200 microns, the preset thickness value can be set to "200". It should be noted that those skilled in the art can pre-set different thickness unit options according to actual conditions, and the user can make a selection according to needs in actual operation, and the embodiment of the present invention does not specifically limit this.

[0099] Step 202: According to a preset thickness value of the target object, determine the material property parameter distribution range as the preset discrimination threshold.

[0100] When the thickness of the detected object and the target object is constant, the material property parameter of the detected object where the target object exists is fixed. Therefore, the material property parameter of the detected object when the target object exists can be determined as the first parameter value; the material property parameter value of the substrate of the detected object is determined as the second parameter value, and the first parameter value and the second parameter value form a material property parameter distribution range, and the distribution range is used as the preset discrimination threshold.

[0101] It should be noted that the method for detecting and determining the material property parameters of the detected object when the target object exists and the material property parameters of the substrate of the detected object can refer to the contents described in step 101 and step 102, which will not be repeated here.

[0102] Furthermore, with reference to the attenuation of X-rays, at least two thickness intervals of the detected object are determined, and based on the determined at least two thickness intervals of the detected object, Gaussian distribution curves corresponding to material property parameters corresponding to the at least two thickness intervals are fitted.

[0103] Specifically, for the same material to be inspected, due to the hardening effect of the radiation, the material property parameter F changes with the thickness of the material. Figure 5As shown, the generated X-rays are different from those of the X-ray tube, and the mass attenuation coefficient of the X-rays for materials with different atomic numbers varies very little. Therefore, when the object to be detected is detected, the imaging result of the X-rays is not affected by the presence of the substance to be detected, so the relative thickness of the object to be detected can be determined with the help of the X-ray attenuation relationship. Specifically, the thickness distribution of the object to be detected can be divided with the help of the relationship between the attenuation of the X-rays and the thickness of the object to be detected, so that the corresponding Gaussian distribution curves can be fitted according to different thickness intervals, thereby realizing detection and judgment according to different thickness areas of the object to be detected, effectively avoiding the influence of thickness on the detection results and improving the accuracy of detection.

[0104] Specifically, Figure 6 As shown, for an object to be inspected with uneven thickness, the method of determining different thickness intervals of the object to be inspected with reference to the attenuation of X-rays includes:

[0105] Step 301: Obtain an attenuation image of the detected object for X-rays, and perform histogram normalization processing on the attenuation image.

[0106] In the embodiment of the present invention, the detected X-ray attenuation image is subjected to histogram normalization processing, and the clarity of the image can be increased by the histogram normalization processing. It should be noted that for the method of performing histogram normalization processing on the image, those skilled in the art can refer to the commonly used histogram normalization processing method, which will not be described in detail here.

[0107] It should be noted that the step of obtaining the attenuation image of the detected object to X-rays can refer to the detailed description of the aforementioned method, which will not be repeated here.

[0108] Step 302: Evenly divide the attenuation image into at least two grayscale intervals according to grayscale values.

[0109] In an embodiment of the present invention, the X-ray attenuation image after histogram normalization is evenly segmented according to the grayscale value corresponding to the image, each segment is a grayscale interval, and the processed X-ray attenuation image can be divided into at least two grayscale intervals.

[0110] Step 303: Divide the detected object into the at least two thickness intervals according to the at least two grayscale intervals.

[0111] In the embodiment of the present invention, different grayscale intervals in the X-ray attenuation image represent different thicknesses of the actual detected object. The thickness of the detected object can be divided into different thickness intervals according to the different grayscale intervals divided in step 302, thereby achieving the thickness of the detected object being divided into different intervals according to the grayscale value of the image, facilitating detection and judgment according to different thickness intervals, and improving the precision of detection.

[0112] Furthermore, according to a preset discrimination threshold corresponding to the at least two thickness intervals, the material property parameters exceeding the distribution range in the distribution area curve corresponding to the at least two thickness intervals are marked.

[0113] Specifically, the user can pre-set the discrimination thresholds corresponding to different thickness intervals of the detected object, and according to the preset discrimination thresholds corresponding to different thickness intervals, the hypothesis test method can be used to determine whether all the material property parameter values ​​in the fitted Gaussian distribution curves of different intervals meet the preset distribution range one by one, and mark the material property parameters that exceed the distribution range.

[0114] Specifically, in the imaging image of the detection result, each pixel corresponds to a material property parameter value, and each material property parameter is judged. When the material property parameter is judged to be outside the preset range, the pixel corresponding to the material property parameter is color-marked. For example, any color such as red, orange, yellow, green, etc. can be used for marking to distinguish the pixels that are out of the range from the pixels that are within the range.

[0115] Through this method, it is possible to further divide the thickness of the detected object into different intervals for detection and judgment, thereby improving the accuracy of the detection result.

[0116] In practical applications, for the same object to be detected, within a thickness range, the user can select a certain thickness value in the range as the standard value, such as the two end points of the thickness range as the standard value, or take the center value of the range as the standard value. Then, the material property parameter value of the substrate of the object to be detected with the standard thickness value is detected to obtain the corresponding material property parameter value distribution range, and the material property parameter value distribution range is used as the discrimination threshold of the thickness range. In this way, the discrimination threshold of the object to be detected in different thickness ranges can be determined.

[0117] In this embodiment, Figure 7 As shown in the figure, taking the detection of residual cores in hollow turbine blades as an example, the minimum detection thickness of the core is set to 200 microns, and the discrimination thresholds corresponding to blades in different thickness ranges can be determined, and then all the positions where the cores exist can be marked, as shown in Figure 8As shown in the figure, the white area is the detection area of ​​the core. By setting the expected minimum detection thickness of the target object, the user can automatically determine the discrimination threshold and then determine the position of the target object, making the user's detection operation more convenient.

[0118] Fig. 9 is a schematic diagram of a single-source dual-ray imaging detection processor provided by an embodiment of the present invention, such as Fig. 9 As shown, the single-source dual-ray imaging detection processor includes: a material property parameter determination module 901, a statistics module 902 and a position determination module 903.

[0119] The material property parameter determination module 901 is used to determine the transmission attenuation of the detected object to neutrons and X-rays based on the neutron imaging detection data and X-ray imaging detection data of the detected object, and calculate the material property parameters of the detected object based on the transmission attenuation of the detected object to neutrons and X-rays.

[0120] Specifically, based on the unit dual-ray imaging device, the object to be detected is placed at the X-ray detection end and the neutron detection end respectively to obtain neutron imaging detection data and X-ray imaging detection data of the object to be detected. The above data obtained by the technology are used to calculate the transmission attenuation of the object to be detected for neutrons and X-rays, and then the material property parameter value F of the object to be detected is calculated based on the transmission attenuation.

[0121] The statistical module 902 is used to fit the Gaussian distribution curve of the material property parameters according to the statistical distribution of the material property parameters. Specifically, the detection result of the material property parameters obeys the Gaussian distribution, and the expected value of the distribution is the material property parameter value of the detected object material at the current thickness.

[0122] The position determination module 903 is used to mark the material property parameters that exceed the distribution range in the Gaussian distribution curve according to a preset discrimination threshold, and determine the position of the target object according to the number of marked pixels.

[0123] Furthermore, the determination module includes a detection data acquisition module and a material property parameter calculation module.

[0124] The detection data acquisition module is configured to obtain X-ray detection data, X-ray reference detection data, neutron detection data and neutron reference detection data of the detected object. When the detected object is placed on the X-ray detection end, the X-ray detection data is detected, and when the detected object is not placed on the X-ray detection end, the X-ray reference detection data is detected; when the detected object is placed on the neutron detection end, the neutron detection data is detected, and when the detected object is not placed on the neutron detection end, the neutron reference detection data is detected.

[0125] The material property parameter calculation module is configured to determine the material property parameters of the detected object according to the X-ray detection data, the X-ray reference detection data, the neutron detection data and the neutron reference detection data. The material property parameter calculation module can directly use the formula (3) above to calculate the material property parameter value F.

[0126] In an embodiment of the present invention, the statistical module further includes a distribution curve fitting module.

[0127] The distribution curve fitting module is configured to statistically calculate the distribution of material property parameters and fit the Gaussian distribution curve of the material property parameters. The corresponding Gaussian distribution curve is fitted according to the material property parameters. The material property parameter detection result obeys the Gaussian distribution, and the expected value of the distribution is the material property parameter value of the detected object material at the current thickness.

[0128] In an embodiment of the present invention, the single-source dual-ray imaging detection processor further includes a threshold first receiving module and a threshold determination module.

[0129] A first receiving module is configured to receive a preset thickness value of the target object input by a user;

[0130] The threshold determination module is configured to determine the material property parameter distribution range as the preset discrimination threshold according to the preset thickness value of the target object.

[0131] In an embodiment of the present invention, the single-source dual-ray imaging detection device further includes a single electron accelerator.

[0132] An embodiment of the present invention provides a single-source dual-ray imaging detection device, comprising: a single-source dual-ray imaging detection processor and a detection imaging device connected to the processor.

[0133] Specifically, the single-source dual-ray imaging detection processor may be any single-source dual-ray imaging detection processor mentioned above.

[0134] Specifically, the detection imaging device includes a single electron accelerator, a neutron conversion target, an X-ray conversion target, a neutron imaging detection end, and an X-ray imaging detection end. The single electron accelerator is configured to emit electrons to the neutron conversion target and the X-ray conversion target; the neutron conversion target is configured to generate neutron rays under the action of the electrons and emit them from the neutron imaging detection end; the X-ray conversion target is configured to generate X-rays under the action of the electrons and emit them from the X-ray imaging detection end; the neutron imaging detection end is configured to obtain the neutron imaging detection result of the detected object; and the X-ray imaging detection end is configured to obtain the X-ray imaging detection result of the detected object.

[0135] like Fig.10, a schematic diagram of the working principle of the single-source dual-ray imaging device provided by the present invention, such as Fig.10 As shown, when the single-source dual-ray imaging device is working, a single electron accelerator 1 is used as a driving source to emit high-energy electrons to the conversion target; the high-energy electrons act on the conversion target and generate bremsstrahlung on the conversion target, and a part of the bremsstrahlung photons produces neutron rays 2 through photonuclear reactions, and the neutron rays 2 are emitted from the neutron detection end; another part of the bremsstrahlung photons becomes X-rays 3 through scattering and is emitted from the X-ray detection end, and the neutron rays 2 and X-rays 3 respectively pass through the detected object 4, pass through the sensitive detector 5, and then are recorded by the camera sensor 6 as the visible light generated by the detector 5, thereby obtaining a detection imaging image.

[0136] Specifically, bremsstrahlung photons can react with neutron conversion targets, such as heavy water, to generate neutron rays, which are decelerated by a moderator and emitted from a predetermined direction. The two rays are generated at the same time, and due to their different speeds, they can be separated by setting different detection times after a certain flight distance, thereby realizing two modes of imaging detection with the same detection device.

[0137] In an embodiment of the present invention, a computer-readable storage medium is further provided, on which a computer program is stored, and when the computer program is executed by a processor, each process of the above-mentioned single-source dual-ray imaging detection method embodiment is implemented, and the same technical effect can be achieved. To avoid repetition, it is not repeated here. The computer-readable storage medium is, for example, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0138] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0139] Each embodiment in this specification is described in a related manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. For the embodiments of the device, electronic device, computer-readable storage medium and computer program products containing instructions, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiments.

[0140] The above description is only a preferred embodiment of the present invention and is not intended to limit the protection scope of the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention are included in the protection scope of the present invention.

Claims

1. A single-source dual-ray imaging detection method, characterized in that: include: Determining the transmission attenuation of the detected object to neutrons and X-rays according to the neutron imaging detection data and the X-ray imaging detection data of the detected object; Calculating material property parameters of the detected object according to the transmission attenuation of the detected object to neutrons and X-rays; Counting the distribution of the material property parameters and fitting a Gaussian distribution curve of the material property parameters; According to a preset discrimination threshold, marking the material property parameters in the Gaussian distribution curve that exceed a preset distribution range; The position of the target object in the detected object is determined according to the marked material property parameters.

2. The single-source dual-ray imaging detection method according to claim 1, characterized in that: Before determining the transmission attenuation of the detected object to neutrons and X-rays according to the neutron imaging detection data and the X-ray imaging detection data of the detected object, the method further includes: Obtaining a preset thickness value of the target object input by a user; According to the preset thickness value of the target object, the material property parameter distribution range is determined as the preset discrimination threshold.

3. The single-source dual-ray imaging detection method according to claim 1, characterized in that: The statistical distribution of the material property parameters and fitting a Gaussian distribution curve of the material property parameters include: Determining at least two thickness intervals of the object to be detected based on the attenuation of the X-ray; According to the at least two thickness intervals of the detected object, Gaussian distribution curves of the material property parameters corresponding to the at least two thickness intervals are fitted.

4. The single-source dual-ray imaging detection method according to claim 3, characterized in that: The step of determining at least two thickness intervals of the object to be detected based on the attenuation of the X-rays includes: Acquire an attenuation image of the detected object for X-rays, and perform histogram normalization processing on the attenuation image; Evenly dividing the attenuation image into at least two grayscale intervals according to grayscale values; The detected object is divided into the at least two thickness intervals according to the at least two grayscale intervals.

5. The single-source dual-ray imaging detection method according to claim 3, characterized in that: The marking of the material property parameters exceeding the distribution range according to a preset discrimination threshold comprises: According to the preset discrimination thresholds corresponding to the at least two thickness intervals, the material property parameters that exceed the distribution range in the Gaussian distribution curve corresponding to the at least two thickness intervals are marked.

6. The single-source dual-ray imaging detection method according to claim 1, characterized in that: The target object contains neutron attenuation material, and the neutron attenuation material is used to attenuate neutron rays in the target object.

7. A single-source dual-ray imaging detection processor, characterized in that: include: a material property parameter determination module, configured to determine the transmission attenuation of the detected object to neutrons and X-rays according to the neutron imaging detection data and the X-ray imaging detection data of the detected object, and calculate the material property parameters of the detected object according to the transmission attenuation of the detected object to neutrons and X-rays; A statistical module is configured to statistically calculate the distribution of the material property parameters and fit a Gaussian distribution curve of the material property parameters; The position determination module is configured to mark the material property parameters that exceed the distribution range in the Gaussian distribution curve according to a preset discrimination threshold, and determine the position of the target object in the detected object according to the marked material property parameters.

8. The single-source dual-ray imaging detection processor according to claim 7, characterized in that: The processor further comprises: A first receiving module is configured to receive a preset thickness value of the target object input by a user; The threshold determination module is configured to determine the material property parameter distribution range as the preset discrimination threshold according to the preset thickness value of the target object.

9. A single-source dual-ray imaging detection device, characterized in that: The device comprises a processor as claimed in any one of claims 7 or 8, and a detection imaging device connected to the processor, wherein the detection imaging device is configured to detect and obtain the detection imaging result of the detected object; The detection imaging device comprises: a single electron accelerator configured to emit electrons toward a neutron conversion target and an X-ray conversion target; The neutron conversion target is configured to generate neutron rays under the action of the electrons and emit them from the neutron imaging detection end; The X-ray conversion target is configured to generate X-rays under the action of the electrons and emit them from the X-ray imaging detection end; The neutron imaging detection end is configured to obtain a neutron imaging detection result of the detected object; The X-ray imaging detection end is configured to obtain the X-ray imaging detection result of the detected object.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the single-source dual-ray imaging detection method according to any one of claims 1 to 6 are implemented.

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