High and low temperature environment electromagnetic compatibility test method

Abstract

The application discloses a high-low temperature environment electromagnetic compatibility test method, comprising the following steps: S1, placing a device to be tested in an environment simulation device of an anechoic chamber; S2, a system controller controls the environment simulation device to adjust the temperature of a sealed cavity in the environment simulation device to a temperature to be measured; S3, the system controller controls an electromagnetic test device to start, the electromagnetic test device performs EMC test on the device, and saves an EMC test value in a database; and S4, repeating S2-S3 until the device to be tested is subjected to EMC test at all the temperatures to be measured. The application adopts a mode of arranging an environment simulation device in an anechoic chamber to perform high-low temperature test, does not damage the original anechoic chamber, and does not reduce the service life and the original test feasibility of the anechoic chamber. The high-low temperature environment electromagnetic compatibility comprehensive test system of the application performs EMC test on the above-mentioned device under high-low temperature environment, and comprehensively tests the anti-interference performance of the device.

Description

Technical Field

[0001] This invention belongs to the field of electromagnetic testing technology, specifically relating to a method for electromagnetic compatibility testing in high and low temperature environments. Background Technology

[0002] Most electronic devices require separate electromagnetic compatibility (EMC) and high / low temperature environment tests. However, current EMC tests are conducted within standard temperature and humidity specifications. Many electrical products are not used in these standard environments. For example, photovoltaic and wind power equipment is installed in high-altitude, cold regions; aircraft fly in extremely harsh weather conditions; and equipment for polar expeditions operates in extremely cold conditions. Whether the electromagnetic interference phenomena of the same product differ under different climatic environments is a research area that needs to be explored in the field of EMC. Currently, however, no testing system combines climatic and EMC environmental considerations. Summary of the Invention

[0003] To address the aforementioned technical problems, this invention proposes a method for electromagnetic compatibility testing in high and low temperature environments.

[0004] To achieve the above objectives, the technical solution of the present invention is as follows:

[0005] Electromagnetic compatibility testing methods for high and low temperature environments include the following steps:

[0006] S1: Place the device under test inside the anechoic chamber environment simulation device;

[0007] S2: The system controller controls the environmental simulation device to adjust the temperature of its internal sealed cavity to the temperature to be measured;

[0008] S3: The system controller controls the electromagnetic testing device to start, the electromagnetic testing device performs EMC testing on the equipment, and saves the EMC test values ​​in the database;

[0009] S4: Repeat S2-S3 until the device under test has undergone EMC testing at all test temperatures.

[0010] Based on the above technical solution, the following improvements can be made:

[0011] As a preferred option, N temperatures to be measured are T1, T2, T3…, T… N The data is saved in the first test table, which is then stored in the database.

[0012] As a preferred option, the following steps are also included:

[0013] S5: According to T1 to T N The N EMC test values ​​E1, E2, E3…, E are obtained in the following order.N The N EMC test values and the N to-be-tested temperatures are one-to-one corresponding and saved in the first test table in sequence.

[0014] As a preferred solution, the method further comprises the following steps:

[0015] S6: Taking the average of each group of adjacent k EMC test values, obtaining N-k+1 average values V1, V2, V3, …, V N-k+1 , finding the minimum average value V min and the maximum average value V max , and finding the k temperature values corresponding to the minimum average value V min and the k temperature values corresponding to the maximum average value V max .

[0016] As a preferred solution, the method further comprises the following steps:

[0017] S7: Taking the maximum and minimum of the k temperature values corresponding to the minimum average value V min , forming a first temperature measurement interval;

[0018] Taking the maximum and minimum of the k temperature values corresponding to the maximum average value V max , forming a second temperature measurement interval.

[0019] As a preferred solution, the method further comprises the following steps:

[0020] S8: Equally dividing the first temperature measurement interval, obtaining M1 to-be-tested temperatures P1, P2, P3, …, P M1 , M1>k;

[0021] Equally dividing the second temperature measurement interval, obtaining M2 to-be-tested temperatures Q1, Q2, Q3, …, Q M2 , M2>k;

[0022] S9: Repeating S2-S3 until the to-be-tested device is tested at the M1 to-be-tested temperatures P1, P2, P3, …, P M1 and the M2 to-be-tested temperatures Q1, Q2, Q3, …, Q M2 , and the EMC test values are one-to-one corresponding and saved in a second test table, and the second test table is saved in a database.

[0023] As a preferred solution, the method further comprises an analysis method of the influence of the antenna tower tilt angle on the EMC test, the antenna tower can be tilted within a range of 0° to 45°, and M3 tilt angles X1, X2, X3, …, X M3 are saved in a third test table, and the method comprises the following steps:

[0024] A1: the system controller controls the environmental simulation device to adjust the temperature of the internal sealed cavity to the first temperature measurement interval or the second temperature measurement interval, and the antenna tower is displaced according to the tilt angle;

[0025] A2: the system controller controls the electromagnetic test device to start, the electromagnetic test device performs EMC test on the equipment, and the EMC test value is saved in the database;

[0026] A3: repeating A2-A3 until the equipment to be tested is tested under M3 tilt angles, and the EMC test values are saved in the third test table one by one, and the third test table is saved in the database.

[0027] As a preferred scheme, it further includes an influence analysis method of antenna tower displacement on EMC test, the antenna tower can be displaced in the range of 1-4m, M4 displacement amounts Y1, Y2, Y3…, Y M4 The fourth test table is saved, and the method comprises the following steps:

[0028] B1: the system controller controls the environmental simulation device to adjust the temperature of the internal sealed cavity to the first temperature measurement interval or the second temperature measurement interval, and the antenna tower is displaced according to the displacement amount;

[0029] B2: the system controller controls the electromagnetic test device to start, the electromagnetic test device performs EMC test on the equipment, and the EMC test value is saved in the database;

[0030] B3: repeating B2-B3 until the equipment to be tested is tested under M4 displacement amounts, and the EMC test values are saved in the fourth test table one by one, and the third test table is saved in the database.

[0031] The application discloses a high-low temperature environment electromagnetic compatibility test method.

[0032] The application adopts the way of setting the environmental simulation device in the anechoic chamber to perform high-low temperature test, does not damage the original anechoic chamber, and does not reduce the service life and original test feasibility of the anechoic chamber. BRIEF DESCRIPTION OF DRAWINGS

[0033] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments. It should be understood that the following drawings only show some of the embodiments of the present application, and therefore should not be considered as limiting the scope. For those skilled in the art, other related drawings can also be obtained without creative labor.

[0034] Figure 1 The flow chart of the high and low temperature environment electromagnetic compatibility test method provided by the embodiments of the present application.

[0035] Figure 2 The block diagram of the high and low temperature environment electromagnetic compatibility test method provided by the embodiments of the present application.

[0036] Figure 3 The structural schematic diagram of the high and low temperature environment electromagnetic compatibility comprehensive test system provided by the embodiments of the present application.

[0037] Figure 4 For Figure 3 The partial enlarged view of A part in the middle.

[0038] Wherein: 11 is an anechoic chamber, 12 is an electromagnetic test device, 13 is a system controller, 14 is an environment simulation device, 21 is a first environment box, 211 is a notch, 212 is a hole, 22 is a second environment box, 221 is a box door, 31 is a first temperature adjusting assembly, 311 is a temperature adjusting source, 312 is a supply pipeline, 4 is a test table, 40 is a groove, 41 is a wear-resistant block, 42 is an elastic block, 43 is a magnetic block, 44 is an electromagnet, 45 is a permanent magnet, 46 is an insulating table, 47 is a wooden board, 48 is a steel plate, 5 is an insulating support block, 6 is a rotary table, 7 is a condensate water circulation pipeline, and 8 is a device to be tested. DETAILED DESCRIPTION

[0039] The preferred embodiments of the present application will be described in detail below with reference to the drawings.

[0040] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without creative labor fall within the scope of the present application.

[0041] The ordinal numbers “first”, “second”, “third” and the like are used to describe common objects only to indicate different instances of the similar objects, and are not intended to imply that the objects thus described must have a given order in time, space, sequence or in any other way.

[0042] In addition, the expression "comprising" elements is an "open" expression, which only means that the corresponding components or steps exist, and should not be interpreted as excluding additional components or steps.

[0043] To achieve the purpose of the present application, some embodiments of the high and low temperature environment electromagnetic compatibility test method, as shown in Figures 1-2 The high and low temperature environment electromagnetic compatibility test method comprises the following steps:

[0044] S1: placing the device to be tested 8 in the environmental simulation device 14 of the anechoic chamber 11;

[0045] S2: the system controller 13 controls the environmental simulation device 14 to adjust the temperature of the internal sealed cavity to the temperature to be measured;

[0046] S3: the system controller 13 controls the electromagnetic test device 12 to start, and the electromagnetic test device 12 performs EMC test on the device, and saves the EMC test value in the database;

[0047] S4: repeating S2-S3 until the device to be tested 8 has been tested at all temperatures to be measured.

[0048] In order to further optimize the implementation effect of the present application, in some other embodiments, the remaining features are the same, and the difference lies in that the six temperatures to be measured T1, T2, T3, T6 are saved in the first test table, and the first test table is saved in the database.

[0049] In order to further optimize the implementation effect of the present application, in some other embodiments, the remaining features are the same, and the difference lies in that the following steps are further included:

[0050] S5: according to the order of T1 to T6, the six EMC test values E1, E2, E3, E6 obtained are saved in the first test table in turn, and the six EMC test values correspond to the six temperatures to be measured one by one;

[0051] S6: taking the average value of each group of adjacent three EMC test values, obtaining four average values V1, V2, V3, V4, finding the minimum average value V min And the maximum average value V max , and finding the three temperature values corresponding to the minimum average value V min And the three temperature values corresponding to the maximum average value V max ;

[0052] S7: taking the maximum value and the minimum value of the three temperature values corresponding to the minimum average value V min , forming the first temperature interval; for example, V min = V1, then the first temperature interval is [T1, T3].

[0053] Take the maximum and minimum of the three temperature values corresponding to the maximum average value V max , form a second temperature measurement interval; for example: V max = V3, then the second temperature measurement interval is [T3, T5];

[0054] S8: divide the first temperature measurement interval to obtain 10 test temperatures P1, P2, P3, …, P 10 ;

[0055] Divide the second temperature measurement interval to obtain 10 test temperatures Q1, Q2, Q3, …, Q 10 ;

[0056] S9: repeat S2-S3 until the test device 8 has been tested at 10 test temperatures P1, P2, P3, …, P 10 and 10 test temperatures Q1, Q2, Q3, …, Q 10 , and the EMC test values are saved one by one in the second test table, and the second test table is saved in the database.

[0057] The above method can quickly determine the temperature at which the EMC test peak value is located, and provides convenience for analyzing the influence of temperature on EMC test in the later period.

[0058] In order to further optimize the implementation effect of the present application, in some other embodiments, the remaining features are the same, and the difference is that the method for analyzing the influence of the antenna tower inclination angle on the EMC test is further included, the antenna tower can be inclined within the range of 0° to 45°, and 12 inclination angles X1, X2, X3, …, X 12 are saved in the third test table, and specifically comprising the following steps:

[0059] A1: the system controller 13 controls the environmental simulation device 14 to adjust the temperature in the sealed cavity to be within the first temperature measurement interval or the second temperature measurement interval, and the antenna tower is inclined according to the inclination angle;

[0060] A2: the system controller 13 controls the electromagnetic test device 12 to start, and the electromagnetic test device 12 tests the device for EMC, and saves the EMC test value in the database;

[0061] A3: repeat A2-A3 until the test device 8 has been tested at 12 inclination angles, and the EMC test values are saved one by one in the third test table, and the third test table is saved in the database.

[0062] The method can quickly obtain the antenna tower angle at the EMC test peak value, and facilitates the analysis of the influence of the antenna tower angle on the EMC test in the later stage.

[0063] In order to further optimize the implementation effect of the application, in some other embodiments, the remaining features are the same, and the difference is that the method further comprises an analysis method of the influence of the displacement of the antenna tower on the EMC test, the antenna tower can be displaced within a range of 1-4m, and 20 displacement amounts Y1, Y2, Y3…, Y 20 The fourth test table is saved, and the fourth test table specifically comprises the following steps:

[0064] B1: the system controller 13 controls the environmental simulation device 14 to adjust the temperature of the internal sealed cavity to the first temperature measurement interval or the second temperature measurement interval, and the antenna tower is displaced according to the displacement amount;

[0065] B2: the system controller 13 controls the electromagnetic test device 12 to start, the electromagnetic test device 12 performs the EMC test on the device, and the EMC test value is saved in the database;

[0066] B3: B2-B3 are repeated until the device to be tested 8 is subjected to the EMC test under 20 displacement amounts, and the EMC test values are saved in the fourth test table one by one, and the third test table is saved in the database.

[0067] The method can quickly obtain the position of the antenna tower at the EMC test peak value, and facilitates the analysis of the influence of the displacement of the antenna tower on the EMC test in the later stage.

[0068] The application discloses a high-low temperature environment electromagnetic compatibility test method, and sets an environmental simulation device 14 in an anechoic chamber 11, places a device to be tested 8 in the environmental simulation device 14 with adjustable temperature, and adopts an electromagnetic test device 12 to test the device to be tested 8 for EMC test.

[0069] The application adopts the mode of setting the environmental simulation device 14 in the anechoic chamber 11 to perform the high-low temperature test, does not damage the original anechoic chamber 11, and does not reduce the service life and the original test feasibility of the anechoic chamber 11.

[0070] The high-low temperature environment electromagnetic compatibility test method can be used in a high-low temperature environment electromagnetic compatibility comprehensive test system, such as Figures 3-4As shown, the high and low temperature environment electromagnetic compatibility comprehensive test system comprises: an anechoic chamber 11, an electromagnetic test device 12, a system controller 13, and a set of environment simulation devices 14 arranged in the anechoic chamber 11. The environment simulation devices 14 have a sealed cavity for placing the device to be tested 8, and the temperature in the sealed cavity can be adjusted between -40 and 80℃.

[0071] The environment simulation devices 14 comprise: a first environment simulation assembly comprising: a first environment box 21 arranged on the test table 4 in the anechoic chamber 11, and a first temperature adjusting assembly 31 for adjusting the temperature in the first environment box 21. The first environment box 21 is an environment cover with a sealed top and an open bottom. An insulating support block 5 is arranged on the test table 4. The environment cover is in transmission connection with a lifting driving device, and the lifting driving device is in electrical connection with the system controller 13. The lifting driving device drives the environment cover to descend, and the bottom of the environment cover contacts the insulating support block 5, forming a sealed cavity inside the environment cover.

[0072] A temperature sensor is arranged in the first environment box 21 (i.e. the environment cover). The temperature sensor is in wireless communication connection with the system controller 13. The temperature sensor detects the temperature in the first environment box 21 in real time, and feeds back the detected temperature value to the system controller 13, which performs real-time regulation and control.

[0073] The first environment box 21 is an environment cover that can be automatically lifted. When EMC testing is needed to be performed alone, the first environment box 21 can be lifted, without affecting the test. When EMC testing is needed to be performed under high and low temperature environment, the first environment box 21 can be lowered to form a sealed cavity.

[0074] The first environment box 21 is made of special EMC wave-transparent material, and can be kept in the anechoic chamber 11 all the time, without affecting the EMC performance of the anechoic chamber 11. The environment cover can be lifted to a height of about 2.5m, and the space below the environment cover after being lifted is sufficient for the test personnel to perform general EMC testing.

[0075] The first temperature adjusting assembly 31 comprises: a temperature adjusting source 311 and a supply pipeline 312. The input end of the supply pipeline 312 is in communication with the temperature adjusting source 311, and the output end of the supply pipeline 312 is supported by the insulating support block 5 arranged on the test table 4. The sidewall of the bottom of the environment cover has a gap 211, and the gap 211 of the bottom of the environment cover forms a hole 212 with the insulating support block 5. The output end of the supply pipeline 312 extends into the hole 212. The first temperature adjusting assembly 31 has simple structure, and uses the supply pipeline 312 to provide heat source or cold source, so as to ensure that the temperature in the sealed cavity of the environment cover can be adjusted in real time.

[0076] The heat / cold air is delivered to the environmental chamber through the supply pipe 312 to heat / cool the environmental chamber, so that the temperature in the environmental chamber can reach-40℃ to 80℃. The heating or cooling machine of the temperature adjusting source 311 is electrically connected with the system controller 13, and the system controller 13 can control the output temperature of the temperature adjusting source 311 in real time.

[0077] The test table 4 is provided with a turntable 6 for carrying the device to be tested 8, the turntable 6 is drivingly connected with a rotating driving device, and the rotating driving device is electrically connected with the system controller 13. The turntable 6 drives the device to be tested 8 to rotate, changes the position of the device to be tested 8, and performs multi-directional test to improve the comprehensiveness of the test.

[0078] The test table 4 is provided with a recess 40, and the turntable 6 is installed in the recess 40, and the carrying surface of the turntable 6 is in the same horizontal plane as the tabletop of the test table 4. The tabletop of the test table 4 and the carrying surface of the turntable 6 are a plane, and when the high and low temperature test is not performed, the test table 4 can be used to test the large size device to be tested 8, and the setting of the turntable 6 will not interfere.

[0079] The side wall surface of the recess 40 is sequentially attached with an elastic block 42 and a magnetic block 43, an electromagnet 44 is arranged in the magnetic block 43, a permanent magnet 45 is arranged in the turntable 6 and close to the side wall, and a gap is left between the side wall of the magnetic block 43 and the side wall of the turntable 6. When the turntable 6 needs to rotate, the electromagnet 44 in the magnetic block 43 has the same magnetism as the permanent magnet, the elastic block 42 is compressed, a certain gap is left between the magnetic block 43 and the turntable 6, the gap can be between 0.5-2mm, the turntable 6 is free to rotate and will not interfere with the magnetic block 43, and the abrasion is reduced.

[0080] When the turntable 6 needs to rotate, the electromagnet 44 in the magnetic block 43 has the opposite magnetism to the permanent magnet, the elastic block 42 is stretched, the side wall of the magnetic block 43 and the side wall of the turntable 6 are in close contact, and the sealing performance of the bottom of the environmental chamber is improved.

[0081] In order to further accelerate the cooling process of the sealed cavity, at least one circle of condensate water circulation pipe 7 can be installed on the inner wall of the environmental chamber.

[0082] The test table 4 comprises an insulating table 46, a wood board 47 arranged outside the insulating table 46 and connected with the insulating table 46, and a steel plate 48 covering the surface of the wood board 47 and the insulating table 46, and the thickness of the steel plate 48 is 2-4mm.

[0083] The groove 40 is arranged on the insulating base 46, and the insulating base 46, the insulating support block 5 and the environmental cover are made of EMC wave-transparent material, which can withstand high and low temperature and high humidity environment and has self heat insulation. The test table 4 has high mechanical strength, is convenient to clean and maintain, has good insulation effect, and does not affect the EMC performance of the anechoic chamber 11.

[0084] In the description of the present application, it should be understood that the terms "coaxial", "bottom", "one end", "top", "middle", "the other end", "upper", "one side", "top", "inner", "front", "central", "both ends" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application.

[0085] In the present application, unless otherwise explicitly specified and limited, the terms "mounting", "arrangement", "connection", "fixing", "screw connection" and the like should be understood broadly, for example, can be fixed connection, can also be detachable connection, or integrated; can be mechanical connection, can also be electrical connection; can be directly connected, can also be indirectly connected through an intermediate medium; can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise explicitly limited, the above-mentioned terms in the present application can be understood according to the specific meaning of the above-mentioned terms in the present application by those skilled in the art.

[0086] The basic principles and main features of the present application and the advantages of the present application have been shown and described above, and those skilled in the art should understand that the present application is not limited by the above-mentioned embodiments, the above-mentioned embodiments and descriptions in the specification are only to illustrate the principles of the present application, and various changes and improvements can be made to the present application without departing from the spirit and scope of the present application, and these changes and improvements all fall within the scope of the present application, the scope of protection of the present application is defined by the appended claims and their equivalents.

[0087] The control mode of the present application is controlled by manually starting and closing the switch, and the wiring diagram of the power element and the provision of the power supply are well known in the art, and the present application is mainly used to protect mechanical devices, so the control mode and wiring arrangement of the present application will not be explained in detail.

[0088] The above-mentioned embodiments are only for illustrating the technical concept and characteristics of the present application, and the purpose is to enable those skilled in the art to understand the content of the present application and implement it, and cannot limit the protection scope of the present application, any equivalent changes or modifications made according to the spirit and essence of the present application should be covered within the protection scope of the present application.

Claims

1. A method for high and low temperature environmental electromagnetic compatibility testing, characterized in that, Comprising the following steps: S1: place the device to be tested in the environmental simulation device of the anechoic chamber, N temperatures T1, T2, T3,..., T N saved in the first test table, which is saved in the database; S2: The system controller controls the environmental simulation device to adjust the temperature of its internal sealed cavity to the temperature to be measured; S3: The system controller controls the electromagnetic test device to start, and the electromagnetic test device performs EMC test on the equipment, and saves the EMC test value in the database; S4: Repeat S2-S3 until the equipment to be tested has been tested at all temperatures to be measured; S5: in the order of T1 to T N The obtained N EMC test values E1, E2, E3…, E N are sequentially saved in the first test table, and the N EMC test values correspond to the N to-be-tested temperatures one by one. S6: Average each group of adjacent k EMC test values to obtain N-k+l average values V1, V2, V3,..., V N-k+1 , find the minimum average value V min and the maximum average value V max , and find the k temperature values corresponding to the minimum average value V min and the k temperature values corresponding to the maximum average value V max ; S7: take the minimum average value V min The maximum and minimum of the k temperature values form a first temperature measurement interval. Take the maximum and minimum of the k temperature values corresponding to the maximum average value V max Form a second temperature measurement interval; S8: divide the first temperature measurement interval to obtain M1 temperatures to be measured P1, P2, P3, …, P M1 , M1>k; The second temperature measurement interval is equally divided to obtain M2 to-be-measured temperatures Q1, Q2, Q3, …, Q M2 , M2>k; S9: repeat S2-S3 until the device under test has been tested at M1 temperatures P1, P2, P3..., P M1 and M2 temperatures Q1, Q2, Q3..., Q M2 The EMC test values are saved in a second test table, which is saved in the database.

2. The high-low temperature environmental electromagnetic compatibility test method of claim 1, wherein, Also included is an antenna tower tilt angle influence analysis method for EMC testing, the antenna tower can be tilted within a range of 0° to 45°, M3 tilt angles X1, X2, X3…, X M3 Saving in the third test table, specifically including the following steps: A1: The system controller controls the environmental simulation device to adjust the temperature of its internal sealed cavity to the first temperature interval or the second temperature interval, and the antenna tower is displaced according to the displacement amount; A2: The system controller controls the electromagnetic test device to start, and the electromagnetic test device performs EMC test on the equipment, and saves the EMC test value in the database; A3: Repeat A2-A3 until the equipment to be tested has been tested at M3 inclination angles, and the EMC test values are saved in the third test table one by one, and the third test table is saved in the database.

3. The high-low temperature environmental electromagnetic compatibility test method of claim 1, wherein, Also included is an antenna tower displacement effect on EMC test analysis method, the antenna tower can be 1-4m range displacement, M4 displacement Y1, Y2, Y3…, Y M4 Saving in the fourth test table, specifically includes the following steps: B1: The system controller controls the environmental simulation device to adjust the temperature of its internal sealed cavity to the first temperature interval or the second temperature interval, and the antenna tower is displaced according to the displacement amount; B2: The system controller controls the electromagnetic test device to start, and the electromagnetic test device performs EMC test on the equipment, and saves the EMC test value in the database; B3: Repeat B2-B3 until the equipment to be tested has been tested at M4 displacement amounts, and the EMC test values are saved in the fourth test table one by one, and the third test table is saved in the database.

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