A universal automatic test device for radio frequency probes

Abstract

The present invention provides a universal automatic test device for radio frequency probes, which belongs to the technical field of automatic test of microwave TR components, and includes a fixed substrate, a direct drive module, a transmission mechanism, a test fixture, a lifting mechanism and a probe test mechanism. The direct drive module is installed above the fixed substrate, and is used to drive the transmission mechanism installed thereon to perform linear motion; the transmission mechanism can drive the test fixture to perform linear transportation, and the microwave TR component to be tested and the PCB test board for conversion are placed in the test fixture; a lifting mechanism is also installed on the fixed substrate, which is used to drive the probe test mechanism to perform vertical lifting motion; the probe test mechanism is installed with multiple groups of radio frequency probes and signal probes. The universal automatic test device for radio frequency probes mentioned in the present invention can realize the test of various microwave TR components, and realizes automatic testing instead of manual work, and has strong versatility and high efficiency.

Description

Technical Field

[0001] The invention belongs to the technical field of microwave TR component automatic testing, and more specifically, relates to a universal automatic testing device for radio frequency probes. Background Art

[0002] Microwave TR components are the core of active phased array radar. In the field of microwave TR component testing, current testing methods mostly use test devices as a type of tool to assist in controlling position or action. The RF output end is connected to the test instrument through a dedicated high-frequency test shielded cable; the transmission of high-frequency signals requires good cable contact and signal shielding, and because of the changeable appearance of microwave TR components, the connection of test lines during the test process is mostly completed manually.

[0003] The testing process of existing microwave TR components is mostly completed manually due to their wide variety and wide range of RF frequencies. During the manual testing process, the test instruments need to be replaced and the test cables need to be frequently removed according to the different types of microwave TR components. The operation process is cumbersome and the testing efficiency is low. Summary of the invention

[0004] The purpose of the present invention is to provide a universal automatic testing device for radio frequency probes, aiming to solve the problems of the existing manual testing method, such as cumbersome process, low testing efficiency, and a wide variety of tests.

[0005] To achieve the above-mentioned purpose, the technical solution adopted by the present invention is: to provide a universal automatic testing device for radio frequency probes, including a fixed base plate, a direct drive module, a transmission mechanism, a test fixture, a lifting mechanism and a probe testing mechanism, wherein the direct drive module is installed on the fixed base plate, the direct drive module is used to drive the transmission mechanism to perform linear motion, the test fixture is installed on the transmission mechanism, and is used to position the microwave TR component to be tested and the PCB test board for conversion, the transmission mechanism is used to drive the test fixture to perform linear motion, the lifting mechanism is installed on the fixed base plate, and is used to drive the probe testing mechanism to perform vertical motion; the probe testing mechanism is installed with multiple groups of radio frequency probes and signal probes, which, driven by the lifting mechanism, drive the radio frequency probes and the signal probes to contact the PCB test board in the test fixture.

[0006] In a possible implementation, the direct-drive module includes a mounting plate and a single-axis module, the mounting plate is fixedly connected to the upper end surface of the fixed base plate, and the single-axis module is fixedly mounted on the upper end surface of the mounting plate.

[0007] In a possible implementation, the conveying mechanism includes a mechanism base and a support plate fixedly connected to both sides of the mechanism base, the support plate extends to the top of the mechanism base, a conveying belt is installed on the support plate, a lifting mechanism is connected between the two conveying belts, the test fixture is installed on the lifting mechanism, and a rotating motor is provided on the mechanism base, and the rotating motor is used to drive the two conveying belts to operate.

[0008] In a possible implementation, an induction switch is installed above the support plate, and the induction switch is electrically connected to the rotating motor through a controller.

[0009] In a possible implementation, the lifting mechanism includes a lifting electric cylinder fixedly mounted on the upper end surface of the mechanism base and a lifting plate fixed at the upper end connected to the lifting electric cylinder, the induction switch is electrically connected to the lifting electric cylinder through a controller, a clamp limit block is installed on one side of the lifting plate, and the clamp limit block is placed above the lifting plate, and a clamping cylinder is installed on the other side of the lifting plate, and the clamping cylinder is placed below the lifting plate.

[0010] In one possible implementation, the lifting mechanism includes a motor bracket fixedly mounted on the upper end surface of the fixed base plate and a motor fixing plate fixedly connected above the motor bracket, a lifting motor is mounted on the upper end surface of the motor fixing plate, and the output end of the lifting motor passes downward through the fixing plate and is connected to the probe testing mechanism for driving the probe testing mechanism to lift and lower.

[0011] In a possible implementation, the probe testing mechanism includes a mechanism fixing plate fixedly connected to the motor bracket, the mechanism fixing plate is located below the motor fixing plate, a probe fixing block is provided below the mechanism fixing plate, the output end of the lifting motor is connected to the probe fixing block, and a signal probe and a radio frequency probe are provided on the lower end surface of the probe fixing block.

[0012] In a possible implementation, sliding brackets are respectively installed on both sides of the upper end surface of the probe fixing block, and two fixed brackets that slide with the corresponding sliding brackets are fixedly installed on the lower end surface of the mechanism fixing plate, and the upper ends of the two sliding brackets are connected with a nut connecting plate; the output end of the lifting motor is connected with a lead screw nut, and the lead screw nut is connected to the nut connecting plate.

[0013] In a possible implementation, the test fixture includes a fixture mounting plate having a mounting groove opening upward, wherein a positioning plate for positioning the PCB test board and a clamping member for positioning the microwave TR component are respectively provided in the mounting groove.

[0014] In a possible implementation manner, a positioning structure is provided between the probe fixing block and the positioning plate.

[0015] The beneficial effects of a universal automatic test device for radio frequency probes provided by the present invention are as follows: compared with the prior art, the direct drive module is installed above the fixed substrate, and is used to drive the transmission mechanism installed thereon to perform linear motion; the transmission mechanism can drive the test fixture to perform linear transportation, and the microwave TR component to be tested and the PCB test board for conversion are placed in the test fixture; a lifting mechanism is also installed on the fixed substrate, which is used to drive the probe test mechanism to perform vertical lifting motion; the probe test mechanism is installed with multiple groups of radio frequency probes and signal probes, and the probe test mechanism drives the radio frequency probes and the signal probes to contact the contacts of the PCB test board in the test fixture under the drive of the lifting mechanism, completes the test connection and then performs the test. The universal automatic test device for radio frequency probes mentioned in the present invention can realize the testing of various microwave TR components, and realizes automatic testing instead of manual work, and has strong versatility and high efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1 A schematic diagram of the structure of a universal automatic test device for radio frequency probes provided by the present invention;

[0018] Figure 2 A schematic diagram of the structure of the transmission mechanism provided by the present invention;

[0019] Figure 3 A schematic structural diagram of the jacking mechanism provided by the present invention;

[0020] Figure 4 A schematic diagram of the structure of the lifting mechanism provided by the present invention;

[0021] Figure 5 A schematic diagram of the structure of the probe testing mechanism provided by the present invention;

[0022] Figure 6 A schematic diagram of the structure of the test fixture provided by the present invention;

[0023] Figure 7 A schematic diagram of the installation structure of the PCB test board provided by the present invention;

[0024] Figure 8 This is a schematic structural diagram of the ball guide sleeve provided by the present invention.

[0025] Description of reference numerals:

[0026] 100, fixed base plate; 200, transmission mechanism; 210, mechanism base; 220, support plate; 230, transmission belt; 240, pulley set; 250, rotating motor; 260, rotating shaft; 270, synchronous wheel set; 280, induction switch; 300, direct drive module; 410, lifting electric cylinder; 420, lifting plate; 421, clamp limit block; 422, clamping cylinder; 500, lifting mechanism; 510, motor bracket; 520, connecting bracket; 530, motor fixing plate; 540, lifting motor; 550, screw nut; 6 00, probe test mechanism; 610, mechanism fixing plate; 620, probe fixing block; 621, signal probe; 622, radio frequency probe; 623, alignment pin; 630, sliding bracket; 640, fixing bracket; 650, nut connecting plate; 660, guide slide; 700, test fixture; 710, mounting plate; 720, positioning plate; 730, clamping piece; 731, lining plate; 732, PCB positioning pin; 740, ball guide sleeve; 741, guide sleeve; 742, spherical ball; 750, cover plate; 800, PCB test board. DETAILED DESCRIPTION

[0027] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0028] In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, in the description of the present invention, "plurality" means two or more, unless otherwise clearly and specifically defined.

[0029] See also Figure 1, now a universal automatic test device for a radio frequency probe 622 provided by the present invention is described. A universal automatic test device for a radio frequency probe 622 includes a fixed substrate 100, a direct drive module 300, a transmission mechanism 200, a test fixture 700, a lifting mechanism 500 and a probe test mechanism 600, wherein the direct drive module 300 is mounted on the fixed substrate 100, the direct drive module 300 is used to drive the transmission mechanism 200 to perform linear motion, the test fixture 700 is mounted on the transmission mechanism 200, and is used to locate the microwave TR component to be tested and the PCB test board 800 for conversion, the transmission mechanism 200 is used to drive the test fixture 700 to perform linear motion, and the lifting mechanism 500 is mounted on the fixed substrate 100, and is used to drive the probe test mechanism 600 to perform vertical motion; the probe test mechanism 600 is installed with multiple groups of radio frequency probes 622 and signal probes 621, which drive the radio frequency probes 622 and signal probes 621 to contact the PCB test board 800 in the test fixture 700 under the drive of the lifting mechanism 500.

[0030] The present invention provides a universal automatic test device for radio frequency probe 622. Compared with the prior art, the direct drive module 300 is installed above the fixed substrate 100 to drive the transmission mechanism 200 installed thereon to perform linear motion; the transmission mechanism 200 can drive the test fixture 700 to perform linear transportation, and the microwave TR component to be tested and the PCB test board 800 for conversion are placed in the test fixture 700; the fixed substrate 100 is also equipped with a lifting mechanism 500 to drive the probe test mechanism 600 to perform vertical lifting motion; the probe test mechanism 600 is equipped with multiple groups of radio frequency probes 622 and signal probes 621. The probe test mechanism 600 drives the radio frequency probes 622 and the signal probes 621 to contact the contacts of the PCB test board 800 in the test fixture 700 under the drive of the lifting mechanism 500, completes the test connection and then performs the test. The universal automatic test device for radio frequency probe 622 mentioned in the present invention can realize the test of various microwave TR components, and replaces manual automatic testing, and has strong versatility and high efficiency.

[0031] In some embodiments, see Figure 1 The direct drive module 300 includes a mounting plate 710 and a single-axis module. The mounting plate 710 is fixedly connected to the upper end surface of the fixed substrate 100 , and the single-axis module is fixedly mounted on the upper end surface of the mounting plate 710 .

[0032] In this embodiment, the mounting plate 710 is connected to the upper end surface of the fixed base plate 100 by a plurality of screws, and the single-axis module is an electric linear drive module, which can enable the transmission mechanism 200 mounted thereon to move in a linear direction.

[0033] In some embodiments, see Figure 2The conveying mechanism 200 includes a mechanism base 210 and support plates 220 fixedly connected to both sides of the mechanism base 210, the support plates 220 extend to the top of the mechanism base 210, a conveying belt 230 is installed on the support plate 220, a lifting mechanism is connected between the two conveying belts 230, the test fixture 700 is installed on the lifting mechanism, and a rotating motor 250 is provided on the mechanism base 210, and the rotating motor 250 is used to drive the two conveying belts 230 to operate.

[0034] In this embodiment, the mechanism base 210 is connected to the single-axis module and moves along the length direction of the single-axis module by electromagnetic means, thereby realizing the overall movement of the transmission mechanism 200. Two support plates 220 are connected in parallel to both sides of the mechanism base 210 and extend upward respectively. A pulley group 240 is provided at the upper end of the support plate 220, and the transmission belt 230 is wound around the pulley group 240. A rotating shaft 260 linked to the pulley group 240 is connected between the two support plates 220, and a synchronous wheel group 270 is installed in the middle of the rotating shaft 260. The output end of the rotating motor 250 drives the rotating shaft 260 to rotate through the synchronous wheel group 270, thereby finally realizing the operation of the transmission belt 230.

[0035] In some embodiments, see Figure 2 An induction switch 280 is installed above the support plate 220, and the induction switch 280 is electrically connected to the rotating motor 250 through a controller.

[0036] In this embodiment, the induction switch 280 is of the beam recognition type, with two groups of induction switches 280, each group including a transmitting unit and a receiving unit, and the two groups of induction switches 280 are respectively installed on the top of the support plate 220, that is, if the transmitting unit is installed on the top of one support plate 220, the receiving unit is correspondingly installed on the top of the other support plate 220. The induction switch 280 can sense the position of the test fixture 700, and the reasonable position of the test fixture 700 is between the two groups of induction switches 280. When the test fixture 700 is moved between the two groups of induction switches 280, the induction switch 280 sends a sensing signal to the corresponding controller. After receiving the sensing signal, the controller sends a control signal to the rotating motor 250 to control the rotating motor 250 to stop the action. On the contrary, the controller controls the rotating motor 250 to continue to act.

[0037] In some embodiments, see Figure 2 and Figure 3The lifting mechanism includes a lifting electric cylinder 410 fixedly installed on the upper end surface of the mechanism base 210 and a lifting plate 420 fixed on the upper end connected to the lifting electric cylinder 410. The induction switch 280 is electrically connected to the lifting electric cylinder 410 through a controller. A clamp limit block 421 is installed on one side of the lifting plate 420, and the clamp limit block 421 is placed above the lifting plate 420. A clamping cylinder 422 is installed on the other side of the lifting plate 420, and the clamping cylinder 422 is placed below the lifting plate 420.

[0038] In this embodiment, the lifting cylinder 410 is installed on the upper end surface of the mechanism base 210 by screws and is located between the two support plates 220. The lifting plate 420 is horizontally connected to the output end of the upper part of the lifting pole and is lifted and lowered by the output end of the lifting cylinder 410. A clamp limit block 421 and a clamping cylinder 422 are installed on both sides of the lifting plate 420.

[0039] Specifically, when the sensing switch 280 receives the information that the test fixture 700 is in place, the sensing switch 280 sends a control signal to the lifting cylinder 410 through the controller. The lifting cylinder 410 drives the lifting plate 420 to rise vertically. The fixture limit block 421 fixed on the upper side of the lifting plate 420 will limit the test fixture 700, and the clamping cylinder 422 fixed on the lower side of the lifting plate 420 will perform a clamping action; the test fixture 700 is limited in position under the joint action of the fixture limit block 421 and the clamping cylinder 422, thereby ensuring accurate positioning for subsequent actions.

[0040] In some embodiments, see Figure 4 The lifting mechanism 500 includes a motor bracket 510 fixedly mounted on the upper end surface of the fixed base plate 100 and a motor fixing plate 530 fixedly connected above the motor bracket 510. A lifting motor 540 is mounted on the upper end surface of the motor fixing plate 530. The output end of the lifting motor 540 passes through the fixing plate downward and is connected to the probe testing mechanism 600 for driving the probe testing mechanism 600 to lift and lower.

[0041] In this embodiment, the motor bracket 510 is fixed on the base plate 100 by screws and straddles the outside of the conveying mechanism 200. The upper end of the motor bracket 510 is connected to the connecting bracket 520, the motor fixing plate 530 is connected to the upper part of the connecting bracket 520, and the lifting motor 540 is fixedly connected to the middle part of the upper end surface of the motor fixing plate 530. The output end of the lifting motor 540 is installed downward and penetrates the motor fixing plate 530 to connect the probe test mechanism 600. The output end of the lifting motor 540 rises and falls, thereby driving the probe test mechanism 600 to rise and fall.

[0042] In some embodiments, see Figure 5The probe testing mechanism 600 includes a mechanism fixing plate 610 fixedly connected to the motor bracket 510, the mechanism fixing plate 610 is located below the motor fixing plate 530, a probe fixing block 620 is provided below the mechanism fixing plate 610, the output end of the lifting motor 540 is connected to the probe fixing block 620, and a signal probe 621 and a radio frequency probe 622 are provided on the lower end surface of the probe fixing block 620.

[0043] In this embodiment, the two ends of the mechanism fixing plate 610 are respectively connected to the motor bracket 510, the probe fixing plate is located below the mechanism fixing plate 610, the lower end surface of the probe fixing block 620 is provided with a signal probe 621 and a radio frequency probe 622, and the output end of the lifting motor 540 is connected to the probe fixing block 620, so that the signal probe 621 and the radio frequency probe 622 are lifted and lowered to reach a suitable position and come into contact with the PCB test board 800 in the test fixture 700.

[0044] In some embodiments, see Figure 5 Sliding brackets 630 are respectively installed on both sides of the upper end surface of the probe fixing block 620, and two fixed brackets 640 that slide with the corresponding sliding brackets 630 are fixedly installed on the lower end surface of the mechanism fixing plate 610. The upper ends of the two sliding brackets 630 are connected with a nut connecting plate 650; the output end of the lifting motor 540 is connected with a lead screw nut 550, and the lead screw nut 550 is connected to the nut connecting plate 650.

[0045] In this embodiment, there are two sliding brackets 630, which are relatively arranged on the lower end surface of the mechanism fixing plate 610. The inner wall of the sliding bracket 630 is longitudinally provided with a guide slide 660. The two fixed brackets 640 are located on the inner side of the two sliding brackets 630, and are lifted and slid one by one with the help of the guide slide 660 and the sliding bracket 630.

[0046] Among them, the probe fixing block 620 is connected to the lower ends of the two fixing brackets 640 by screws, the nut connecting plate 650 is connected to the upper ends of the two fixing brackets 640, and a connecting hole is opened in the middle of the nut connecting plate 650. The output end of the lifting motor 540 is processed into a trapezoidal screw and is threadedly connected with the screw nut 550, and the screw nut 550 is installed in the connecting hole of the nut connecting plate 650. Finally, the rotation of the output end of the lifting motor 540 cooperates with the screw nut 550 to form a screw transmission structure, which in turn drives the nut connecting plate 650 to rise and fall, thereby realizing the lifting and falling of the probe fixing plate where the radio frequency probe 622 and the signal probe 621 are set.

[0047] In some embodiments, see Figure 6The test fixture 700 includes a fixture mounting plate 710, on which a mounting groove opening upward is formed, and a positioning plate 720 for positioning the PCB test board 800 and a clamping member 730 for positioning the microwave TR component are respectively provided in the mounting groove.

[0048] In this embodiment, the PCB test board 800 is installed in the installation slot through the positioning plate 720, and the microwave TR component is also installed in the installation slot through the clamping member 730, and the two are arranged side by side. The microwave TR component is placed in the installation slot and is clamped and positioned by the clamping member 730. The microwave TR component and the PCB test board 800 are connected respectively through shielded cables. After the design optimization, the PCB test board 800 can eliminate the mutual influence between the probe points and ensure the accuracy of the connection test between the probe and the probe point.

[0049] Among them, the clamping member 730 includes a column connected to both sides of the lower end surface of the installation groove and a clamping plate rotatably arranged at the upper end of the column. The clamping plate is rotated outward to place the microwave TR component in the installation groove and is located between the two columns. The microwave TR component is clamped in the installation groove by rotating the clamping plate inward in the opposite direction.

[0050] Among them, a lining plate 731 of the PCB test board 800 is provided on the positioning plate 720, and a plurality of PCB positioning pins 732 are arranged in the lining plate 731. The plurality of PCB positioning pins 732 correspond to the mounting holes on the PCB test board 800 to facilitate the positioning of the PCB test board 800 on the lining plate 731.

[0051] In some embodiments, see Figure 6 and 7 A positioning structure is provided between the probe fixing block 620 and the positioning plate 720 .

[0052] In this embodiment, the positioning structure includes ball guide sleeves 740 provided on both sides of the upper end surface of the positioning plate 720, and alignment pins 623 correspondingly provided on the lower end surface of the probe fixing plate. The ball guide sleeves 740 extend downward to the interior of the positioning plate 720, and the alignment pins 623 are inserted into the corresponding ball guide sleeves 740, which can position the probe fixing block 620 and the positioning plate 720, so as to position the RF probe 622 and the signal probe 621, so that the two can accurately contact the PCB test board 800. In addition, a cover plate 750 is installed on the upper end of the ball guide sleeve 740, and a reserved hole is provided on the cover plate 750 for the alignment pin 623 to pass through.

[0053] For details, please refer to Figure 8The ball guide sleeve 740 includes a guide sleeve 741 extending downward to the interior of the positioning plate 720 and a spherical ball 742 embedded in the circumferential side wall of the guide sleeve 741. The spherical ball 742 can roll freely in the nesting hole. The spherical ball 742 cooperates with the alignment pin 623 to facilitate the insertion or detachment of the alignment pin 623 into the ball guide sleeve 740.

[0054] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A universal automatic test device for a radio frequency probe (622), characterized in that: The invention comprises a fixed substrate (100), a direct drive module (300), a transmission mechanism (200), a test fixture (700), a lifting mechanism (500) and a probe test mechanism (600), wherein the direct drive module (300) is mounted on the fixed substrate (100), the direct drive module (300) is used to drive the transmission mechanism (200) to perform linear motion, the test fixture (700) is mounted on the transmission mechanism (200) and is used to position a microwave TR component to be tested and a PCB test board (800) for conversion, and the transmission mechanism (200) is used to drive the test fixture (700) to perform linear motion, and the lifting mechanism (500) is installed on the fixed base plate (100) to drive the probe test mechanism (600) to perform vertical motion; the probe test mechanism (600) is installed with multiple groups of radio frequency probes (622) and signal probes (621), which, under the drive of the lifting mechanism (500), drive the radio frequency probes (622) and the signal probes (621) to contact the PCB test board (800) in the test fixture (700).

2. A universal automatic test device for a radio frequency probe (622) as claimed in claim 1, characterized in that: The direct drive module (300) comprises a mounting plate (710) and a single-axis module, wherein the mounting plate (710) is fixedly connected to the upper end surface of the fixed base plate (100), and the single-axis module is fixedly mounted on the upper end surface of the mounting plate (710).

3. A universal automatic test device for a radio frequency probe (622) as claimed in claim 1, characterized in that: The conveying mechanism (200) comprises a mechanism base (210) and support plates (220) fixedly connected to both sides of the mechanism base (210), the support plates (220) extending to the top of the mechanism base (210), a conveying belt (230) being installed on the support plate (220), a lifting mechanism being connected between the two conveying belts (230), the test fixture (700) being installed on the lifting mechanism, and a rotating motor (250) being provided on the mechanism base (210), the rotating motor (250) being used to drive the two conveying belts (230) to operate.

4. A universal automatic test device for a radio frequency probe (622) as claimed in claim 3, characterized in that: An induction switch (280) is installed above the support plate (220), and the induction switch (280) is electrically connected to the rotating motor (250) through a controller.

5. A universal automatic test device for a radio frequency probe (622) as claimed in claim 4, characterized in that: The lifting mechanism comprises a lifting electric cylinder (410) fixedly mounted on the upper end surface of the mechanism base (210) and a lifting plate (420) fixedly mounted on the upper end connected to the lifting electric cylinder (410); the induction switch (280) is electrically connected to the lifting electric cylinder (410) via a controller; a clamp limit block (421) is mounted on one side of the lifting plate (420), and the clamp limit block (421) is placed above the lifting plate (420); a clamping cylinder (422) is mounted on the other side of the lifting plate (420), and the clamping cylinder (422) is placed below the lifting plate (420).

6. A universal automatic test device for a radio frequency probe (622) as claimed in claim 1, characterized in that: The lifting mechanism (500) comprises a motor bracket (510) fixedly mounted on the upper end surface of the fixed base plate (100) and a motor fixing plate (530) fixedly connected above the motor bracket (510); a lifting motor (540) is mounted on the upper end surface of the motor fixing plate (530); an output end of the lifting motor (540) passes through the fixing plate downward and is connected to the probe testing mechanism (600) for driving the probe testing mechanism (600) to lift and lower.

7. A universal automatic test device for a radio frequency probe (622) as claimed in claim 6, characterized in that: The probe testing mechanism (600) comprises a mechanism fixing plate (610) fixedly connected to the motor bracket (510), the mechanism fixing plate (610) being located below the motor fixing plate (530), a probe fixing block (620) being provided below the mechanism fixing plate (610), the output end of the lifting motor (540) being connected to the probe fixing block (620), and a signal probe (621) and a radio frequency probe (622) being provided on the lower end surface of the probe fixing block (620).

8. A universal automatic test device for a radio frequency probe (622) as claimed in claim 7, characterized in that: Sliding brackets (630) are respectively installed on both sides of the upper end surface of the probe fixing block (620), and two fixed brackets (640) that slide with the corresponding sliding brackets (630) are fixedly installed on the lower end surface of the mechanism fixing plate (610), and the upper ends of the two sliding brackets (630) are connected with a nut connecting plate (650); the output end of the lifting motor (540) is connected with a lead screw nut (550), and the lead screw nut (550) is connected to the nut connecting plate (650).

9. A universal automatic test device for a radio frequency probe (622) as claimed in claim 8, characterized in that: The test fixture (700) comprises a fixture mounting plate (710), the fixture mounting plate (710) is provided with a mounting groove opening upward, and a positioning plate (720) for positioning the PCB test board (800) and a clamping member (730) for positioning the microwave TR component are respectively provided in the mounting groove.

10. A universal automatic test device for a radio frequency probe (622) as claimed in claim 9, characterized in that: A positioning structure is provided between the probe fixing block (620) and the positioning plate (720).

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