A method for optimizing a test path for a signal of a measured object

Abstract

The application belongs to the technical field of path optimization, and particularly relates to a test path optimization method for a signal of a measured object. The method comprises the following steps: S1: obtaining a test file of the measured object in an automatic test system, and constructing a directed graph of the measured object; S2: obtaining a matching test path of the measured object according to the directed graph of the measured object; S3: detecting the matching test path, and obtaining an optimal test path of the measured object. The test path optimization method compares the test file and a sampling file, constructs the directed graph of the measured object, and thus obtains the matching test path. Finally, the matching test path is detected, so that the accuracy and speed of the entire test path planning process are ensured.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of path optimization, and particularly relates to a test path optimization method for a signal of a measured object. BACKGROUND

[0002] An automatic test system generally faces a signal and performs automatic testing. In the description of test points in a test process, only test signal requirements and test connection ports are expressed, and no specific test instrument is specified. In the execution process, the test instrument needs to be searched and matched according to the test path of the signal. However, the existing test path planning method mainly focuses on reaching the test instrument, and the optimization and efficiency of the test path are not considered. SUMMARY

[0003] The application provides a test path optimization method for a signal of a measured object.

[0004] The technical scheme of the application is as follows: a test path optimization method for a signal of a measured object, comprising the following steps:

[0005] S1: obtaining a test file of the measured object in an automatic test system, and constructing a directed graph of the measured object;

[0006] S2: obtaining a matched test path of the measured object according to the directed graph of the measured object;

[0007] S3: detecting the matched test path to obtain an optimal test path of the measured object.

[0008] The step S1 comprises the following substeps:

[0009] S11: obtaining a test file of the measured object in an automatic test system, and extracting a first application identifier and a first target directory from the test file, taking a test file path set in the first target directory as a basic path file;

[0010] S12: detecting a test instruction corresponding to the first application identifier by using a message hook, and obtaining an instruction identifier corresponding to the test instruction;

[0011] S13: detecting a path change of the basic path file, and mapping the instruction identifier obtained in S12 to obtain a difference file path set;

[0012] S14: constructing a directed graph of the measured object according to the difference file path set.

[0013] The step S2 comprises the following substeps:

[0014] S21: When the DUT receives a signal connection request of the ATS, a sample file of the DUT is obtained, and a test file of the DUT is matched with the sample file, if the matching is passed, step S22 is entered, otherwise, step S23 is entered;

[0015] S22: The instruction identifier corresponding to the test instruction of the test file cached in the ATS is matched with the instruction identifier corresponding to the sample instruction in the sample file, when the DUT receives a latest signal connection request of the ATS, the instruction identifier corresponding to the test instruction in the test file is updated with the instruction identifier corresponding to the sample instruction in the sample file, the updated instruction identifier is taken as a latest instruction identifier, and step S24 is entered;

[0016] S23: The sample file of the DUT is compared with the test file of the DUT, a difference instruction identifier is obtained, the difference instruction identifier is taken as a latest instruction identifier, and step S24 is entered;

[0017] S24: According to the latest instruction identifier and the directed graph, a matching test path of the DUT is obtained.

[0018] In the step S21, the specific method of matching is that a second application identifier and a second target directory are extracted from the sample file, and a sample file path set in the second target directory is taken as a sample path file; a sample instruction corresponding to the second application identifier is detected by using a message hook, and an instruction identifier corresponding to the sample instruction is obtained; the instruction identifier corresponding to the test instruction is matched with the instruction identifier corresponding to the sample instruction, and the matching result of the instruction identifier is taken as the matching result of the test file and the sample file.

[0019] In the step S23, the specific method of obtaining the difference instruction identifier is that the sample path file is compared with the base path file, an occupied file path set is obtained, and the difference instruction identifier is extracted from the occupied file path set.

[0020] In the step S1, the test file of the DUT includes attribute information of a DUT file, attribute information of a test instrument file, attribute information of a test station file, and attribute information of a test adapter file.

[0021] The sample file of the DUT includes signal connection attribute information of a DUT file, signal connection attribute information of a test instrument file, signal connection attribute information of a test station file, and signal connection attribute information of a test adapter file.

[0022] In the step S3, the specific method for obtaining the optimal test path of the measured object is: performing path similarity matching on the keywords in the matching test path and the set path keywords to obtain a similarity value, taking the product of the similarity value and the keyword weight as a total similarity, comparing the total similarity with a set similarity threshold, if the total similarity is less than the set similarity threshold, taking the matching test path as the optimal test path, otherwise, updating the keywords in the matching test path, and detecting the matching test path with the updated keywords again until the optimal test path is obtained.

[0023] The present application has the following advantages:

[0024] (1) The test path optimization method compares the test file and the sample file, constructs a directed graph of the measured object, obtains a matching test path, and detects the matching test path to ensure the accuracy and speed of the entire test path planning process.

[0025] (2) The test path optimization method is applied to an automatic test system, can perform signal-oriented automatic optimization of the test path, avoids problems such as path repetition, low path planning efficiency, and resource waste in actual operation, and improves the operation convenience of the automatic test system. BRIEF DESCRIPTION OF DRAWINGS

[0026] Figure 1 The flowchart of the test path optimization method is shown. DETAILED DESCRIPTION

[0027] The embodiments of the present application will be further described below with reference to the accompanying drawings.

[0028] Before describing the specific embodiments of the present application, first, the definitions of the abbreviations and key terms appearing in the present application are described to make the scheme of the present application more clear and complete.

[0029] Automatic test system: ATE, Automatic Test Equipment, refers to a system that automatically performs measurement, processes data, and displays or outputs test results in an appropriate manner with little or no human intervention. Compared with manual testing, automatic testing saves time and effort, improves labor productivity and product quality, and plays an important role in production, scientific research and national defense.

[0030] As shown in Figure 1 The present application provides a test path optimization method for signals of a measured object, comprising the following steps:

[0031] S1: obtaining a test file of a measured object in an automatic test system, and constructing a directed graph of the measured object;

[0032] The step S1 comprises the following sub-steps:

[0033] S11: Acquire a test file of the object under test in the automatic test system, extract a first application identifier and a first target directory from the test file, and use the test file path set in the first target directory as a basic path file;

[0034] S12: Detecting the test instruction corresponding to the first application identifier using the message hook to obtain an instruction identifier corresponding to the test instruction;

[0035] S13: Detect the path change of the basic path file and map it with the instruction identifier of the test file to obtain a set of difference file paths;

[0036] S14: Construct a directed graph of the object under test according to the set of difference file paths.

[0037] S2: Obtain a matching test path of the object under test according to the directed graph of the object under test;

[0038] The step S2 includes the following sub-steps:

[0039] S21: When the tested object receives a signal connection request from the automatic test system, it obtains the sample file of the tested object and matches the test file of the tested object with the sample file. If the match succeeds, it proceeds to step S22; otherwise, it proceeds to step S23.

[0040] S22: Cache the instruction identifier corresponding to the test instruction in the test file and the instruction identifier corresponding to the sampling instruction in the sampling file. When the tested object receives the latest signal connection request from the automatic test system, update the instruction identifier corresponding to the test instruction in the test file and the instruction identifier corresponding to the sampling instruction in the sampling file, use the updated instruction identifier as the latest instruction identifier, and proceed to step S24.

[0041] S23: Compare the sample file of the object under test with the test file to obtain a difference instruction identifier, use the difference instruction identifier as the latest instruction identifier, and proceed to step S24;

[0042] S24: Obtain a matching test path of the object under test according to the latest instruction identifier and the directed graph.

[0043] S3: Detect the matching test path to obtain the optimal test path for the object under test.

[0044] The step S21, the specific method of matching is: extracting the second application identifier and the second target directory from the sampling file, and taking the sampling file path set in the second target directory as a sampling path file; detecting the sampling instruction corresponding to the second application identifier by using a message hook to obtain the instruction identifier corresponding to the sampling instruction; matching the instruction identifier corresponding to the test instruction with the instruction identifier corresponding to the sampling instruction, and taking the matching result of the instruction identifier as the matching result of the test file and the sampling file.

[0045] The step S23, the specific method of obtaining the difference instruction identifier is: comparing the sampling path file with the basic path file to obtain an occupied file path set, and extracting the difference instruction identifier from the occupied file path set.

[0046] The step S1, the test file of the measured object includes attribute information of the measured object file, attribute information of the test instrument file, attribute information of the test station file and attribute information of the test adapter file.

[0047] The sampling file of the measured object includes signal connection attribute information of the measured object file, signal connection attribute information of the test instrument file, signal connection attribute information of the test station file and signal connection attribute information of the test adapter file.

[0048] The step S3, the specific method of obtaining the optimal test path of the measured object is: performing path similarity matching on the keywords in the matching test path and the set path keywords to obtain a similarity value, taking the product of the similarity value and the keyword weight as a total similarity, comparing the total similarity with a set similarity threshold, if the total similarity is less than the set similarity threshold, taking the matching test path as the optimal test path, otherwise updating the keywords in the matching test path, and detecting the matching test path with the updated keywords again until the optimal test path is obtained.

[0049] Those skilled in the art will appreciate that the embodiments described herein are presented for the purpose of helping the reader understand the principles of the present application, and should be understood as not limiting the scope of protection of the present application to such specific statements and embodiments. Those skilled in the art can make various other specific modifications and combinations according to the technical inspiration disclosed in the present application without departing from the spirit of the present application, and these modifications and combinations are still within the scope of protection of the present application.

Claims

1. A method of test path optimization for a signal of an object under test, characterized by, The following steps are involved: S1: Obtain the test file of the object under test in the automatic test system and construct a directed graph of the object under test; specifically: S11: Acquire a test file of the object under test in the automatic test system, extract a first application identifier and a first target directory from the test file, and use the test file path set in the first target directory as a basic path file; S12: Detecting the test instruction corresponding to the first application identifier using the message hook to obtain an instruction identifier corresponding to the test instruction; S13: Detect the path change of the base path file and map it with the instruction identifier obtained in S12 to obtain a set of difference file paths; S14: constructing a directed graph of the object under test according to the set of difference file paths; S2: Obtain the matching test path of the object under test according to the directed graph of the object under test; specifically: S21: When the tested object receives a signal connection request from the automatic test system, it obtains the sample file of the tested object and matches the test file of the tested object with the sample file. If the match succeeds, it proceeds to step S22; otherwise, it proceeds to step S23. S22: The automatic test system caches the instruction identifier corresponding to the test instruction in the test file and the instruction identifier corresponding to the sampling instruction in the sampling file. When the tested object receives the latest signal connection request from the automatic test system, the instruction identifier corresponding to the test instruction in the test file and the instruction identifier corresponding to the sampling instruction in the sampling file are updated, and the updated instruction identifier is used as the latest instruction identifier, and the process proceeds to step S24; S23: Compare the sample file of the object under test with the test file of the object under test to obtain a difference instruction identifier, use the difference instruction identifier as the latest instruction identifier, and proceed to step S24; S24: Obtaining a matching test path for the object under test according to the latest instruction identifier and the directed graph; S3: Detect the matching test path to obtain the optimal test path of the object under test; specifically: perform path similarity matching on the keywords in the matching test path and the set path keywords to obtain a similarity value, take the product of the similarity value and the keyword weight as the total similarity, compare the total similarity with the set similarity threshold, if the total similarity is less than the set similarity threshold, then take the matching test path as the optimal test path, otherwise update the keywords of the matching test path, and re-detect the matching test path after the updated keywords until the optimal test path is obtained.

2. The method of claim 1, wherein, In step S21, the specific method of matching is as follows: extracting the second application identifier and the second target directory from the sample file, and using the sample file path set in the second target directory as the sample path file; using the message hook to detect the sample instruction corresponding to the second application identifier, and obtaining the instruction identifier corresponding to the sample instruction; The instruction identifier corresponding to the test instruction is matched with the instruction identifier corresponding to the sampling instruction, and the matching result of the instruction identifiers is used as the matching result of the test file and the sampling file.

3. The method of claim 1, wherein, In step S23, the specific method of obtaining the difference instruction identifier is: comparing the sample path file with the basic path file to obtain an occupied file path set, and extracting the difference instruction identifier from the occupied file path set.

4. The method of claim 1, wherein, The test file of the measured object in the step S1 includes attribute information of the measured object file, attribute information of the test instrument file, attribute information of the test station file, and attribute information of the test adapter file.

5. The method of claim 1, wherein, The sampling file of the measured object includes signal connection attribute information of the measured object file, signal connection attribute information of the test instrument file, signal connection attribute information of the test station file, and signal connection attribute information of the test adapter file.

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