Display panel, display device and its test system

Abstract

The present application discloses a display panel, a display device and a test system thereof, belonging to the field of display technology. The display panel includes: a first pad group and a second pad group located in a non-display area, the first pad group is used to bind and connect with a driver chip, and the second pad group is used to bind and connect with a flexible circuit board; multiple control signal lines located in the non-display area, and multiple test signal lines corresponding to the multiple control signal lines one by one, the multiple control signal lines are used to be electrically connected to the driver chip through the first pad group, and the multiple test signal lines are used to be connected to the flexible circuit board through the second pad group; and, a control circuit located in the non-display area, the control circuit is electrically connected to the multiple control signal lines and the multiple test signal lines respectively, and the control circuit is configured to: in the test phase, time-sharing control each control signal line to be turned on with the corresponding test signal line. Multiple test signal lines are connected to the same test point, so that the volume of the test point can be increased.

Description

Technical Field

[0001] The present application relates to the field of display technology, and in particular to a display panel, a display device and a testing system thereof. Background Art

[0002] At present, display devices have become an indispensable electronic product in people's lives. Display devices such as smart bracelets, mobile phones, tablet computers, etc. have greatly increased the convenience of people's lives.

[0003] The display device may include: a display panel and a flexible circuit board electrically connected to the display panel, and the flexible circuit board is provided with a test point for analysis and testing. For example, during the test phase of the display device, an external test device may be connected to the test point to obtain display data of the display panel during the display process, and after analyzing the display data, the test of the display device can be completed.

[0004] However, the number of functions that need to be integrated into display devices is increasing, which results in more and more wiring on the flexible circuit board in the display device, which in turn results in a smaller space for distributing test points in the flexible circuit board, which affects the volume of the test points in the flexible circuit board. As a result, it is difficult for external test equipment to make an effective electrical connection with the test point, resulting in poor results and low efficiency in testing the display device. Summary of the invention

[0005] The embodiment of the present application provides a display panel, a display device and a test system thereof, which can improve the efficiency of testing the display device. The technical solution is as follows:

[0006] In one aspect, a display panel is provided, wherein the display panel has a non-display area, and the display panel comprises:

[0007] A first pad group and a second pad group located in the non-display area, the first pad group being used for binding and connecting with a driving chip, and the second pad group being used for binding and connecting with a flexible circuit board;

[0008] a plurality of control signal lines located in the non-display area, and a plurality of test signal lines corresponding to the plurality of control signal lines one by one, the plurality of control signal lines being used to be electrically connected to the driving chip through the first pad group, and the plurality of test signal lines being used to be connected to the flexible circuit board through the second pad group;

[0009] And, a control circuit located in the non-display area, the control circuit is electrically connected to the multiple control signal lines and the multiple test signal lines respectively, and the control circuit is configured to: in a test phase, time-sharingly control each of the control signal lines to be conductive with the corresponding test signal lines.

[0010] Optionally, the control circuit is configured to: in the process of controlling the first control signal line to be conductive with the first test signal line, control the second control signal line to be disconnected from the second test signal line;

[0011] Among them, the first control signal line is any control signal line among the multiple control signal lines, the first test signal line is a test signal line among the multiple test signal lines corresponding to the first control signal line, the second control signal line is a control signal line among the multiple control signal lines except the first control signal line, and the second test signal line is a test signal line among the multiple test signal lines except the second test signal line.

[0012] Optionally, the control circuit comprises: a plurality of control units, the plurality of control units being electrically connected to the plurality of control signal lines in a one-to-one correspondence, and being electrically connected to the plurality of test signal lines in a one-to-one correspondence;

[0013] The display panel further includes: a plurality of switch control lines electrically connected to the control unit in a one-to-one correspondence;

[0014] The control unit is configured to: control the corresponding control signal line and the corresponding test signal line to be turned on in response to a first control signal loaded on the corresponding switch control line; or control the corresponding control signal line and the corresponding test signal line to be turned off in response to a second control signal loaded on the corresponding switch control line.

[0015] Optionally, the control unit includes: a transistor, the transistor having a gate, a first electrode and a second electrode, the first electrode of the transistor is electrically connected to the corresponding control signal line, the second electrode of the transistor is electrically connected to the corresponding test signal line, and the gate of the transistor is electrically connected to the corresponding switch control line.

[0016] Optionally, the first pad group comprises: a plurality of first sub-pads corresponding one-to-one to the plurality of control signal lines, and a plurality of second sub-pads corresponding one-to-one to the plurality of switch control lines;

[0017] The first sub-pad is electrically connected to a corresponding control signal line, and the second sub-pad is electrically connected to a corresponding switch control line.

[0018] Optionally, the display panel further includes: a plurality of transfer signal lines corresponding one-to-one to the plurality of control signal lines, the transfer signal lines being electrically connected to the corresponding first sub-pads and the first electrodes of the corresponding transistors respectively;

[0019] Among them, the control signal line and the transfer signal line are arranged on different layers; the transfer signal line, the test signal line, the switch control line are arranged on the same layer as the first and second poles of the transistor and are made of the same material.

[0020] Optionally, the display panel further includes: a plurality of auxiliary control lines respectively and electrically connected to the plurality of switch control lines, and the auxiliary control lines are used to be electrically connected to the same control pad in the lighting test component during the process of performing a lighting test on the display panel using the lighting test component;

[0021] Among them, the auxiliary control line and the switch control line are arranged on different layers, and are arranged on the same layer as the control signal line and are made of the same material.

[0022] Optionally, the display panel further includes: an auxiliary control bus electrically connected to all the plurality of auxiliary control lines, and the auxiliary control bus is used to be electrically connected to the control pad in the lighting test component;

[0023] Among them, after performing a lighting test on the display panel using the lighting test component, the display panel is subjected to a cutting process to cut off the auxiliary control bus in the display panel.

[0024] Optionally, the second pad group has a plurality of third sub-pads corresponding to the plurality of test signal lines one by one, the third sub-pads are electrically connected to the corresponding test signal lines, and the plurality of third sub-pads are used to be electrically connected to the same test point in the flexible circuit board.

[0025] Optionally, the display panel further includes: a gate driver GOA circuit located in the non-display area, and all the plurality of control signal lines are electrically connected to the GOA circuit.

[0026] Optionally, the plurality of control signal lines include: GSTV signal line, GCK signal line and GCB signal line.

[0027] Optionally, the control circuit is further configured to: during the display stage, control each of the control signal lines to be disconnected from the corresponding test signal line.

[0028] On the other hand, a display device is provided, and the device includes: a display panel, a driving chip and a flexible circuit board;

[0029] The display panel is the above-mentioned display panel, the driving chip is bonded to the first pad group in the display panel, and the flexible circuit board is bonded to the second pad group in the display panel;

[0030] The flexible circuit board has test points, and multiple test signal lines in the display panel are electrically connected to the same test point through the second pad group.

[0031] Optionally, the flexible circuit board has a plurality of fourth sub-pads corresponding one-to-one to the plurality of test signal lines. The fourth sub-pads are electrically connected to the corresponding test signal lines through the sub-pads in the second pad group, and the plurality of fourth sub-pads are electrically connected to the same test point.

[0032] On the other hand, a test system for a display device is provided, including: a test device and the above-mentioned display device, and the test device is electrically connected to the test point of the flexible circuit board in the display device.

[0033] The beneficial effects brought by the technical solution provided by the embodiment of the present application at least include:

[0034] The embodiment of the present application provides a display panel, including: a first pad group, a second pad group, a plurality of control signal lines, a plurality of test signal lines, and a control circuit. Since the control circuit is electrically connected to the plurality of control signal lines and the plurality of test signal lines respectively, during the test stage, the control circuit controls each control signal line to be conducted with the corresponding test signal line in a time-sharing manner. In this way, an external test device can receive the control signals transmitted in each control signal line through the same test point, so as to analyze the display data during the display process of the display panel. In this way, the plurality of test signal lines can be connected to the same test point, thereby reducing the number of test points on the flexible circuit board. Furthermore, by increasing the volume of the same test point, it is easier for an external test device to make an effective electrical connection with this test point. Therefore, the test effect of the display device is improved, and the test efficiency is relatively high. Description of the Drawings

[0035] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0036] Figure 1 is a schematic structural diagram of a common display device at present;

[0037] Figure 2 is a schematic structural diagram of a display panel provided by an embodiment of the present application;

[0038] Figure 3 is Figure 2 a schematic diagram showing the display panel, the driving chip, and the flexible circuit board electrically connected;

[0039] Figure 4 is related to Figure 2 a schematic structural diagram of the control circuit of the display panel shown;

[0040] Figure 5 is related to Figure 4 a schematic structural diagram of the control unit shown;

[0041] Figure 6 is Figure 4 a cross-sectional view of the control circuit at D-D';

[0042] Figure 7 is related to Figure 2 a schematic diagram of the display panel during the lighting test;

[0043] Figure 8 is a schematic diagram of the film layer structure of a flexible circuit board provided in an embodiment of the present application. Detailed implementation manners

[0044] To make the objectives, technical solutions, and advantages of the present application clearer, the following will further describe the embodiments of the present application in detail with reference to the accompanying drawings.

[0045] Please refer to Figure 1 , Figure 1 is a schematic structural diagram of a common display device at present. The display device 00 may include: a display panel 01, and a flexible circuit board 02 and a driving chip 03 electrically connected to the display panel 01. The display panel 01 has a non-display area 01a, and the display panel 01 may include: a plurality of control signal lines 011 and a plurality of test signal lines 012 located in the non-display area 01a.

[0046] Among them, the plurality of control signal lines 011 in the display panel 01 are electrically connected to the plurality of test signal lines 012 in a one-to-one correspondence; and the plurality of control signal lines 011 may be electrically connected to the driving chip 03, and the plurality of test signal lines 012 may be electrically connected to the flexible circuit 02.

[0047] During the display process of the display device 00, the driving chip 03 sends control signals to the display panel 01 through the plurality of control signal lines 011, so that the display panel 01 can display a picture.

[0048] The flexible circuit board 02 is provided with test points 021 for analysis and testing. One end of the test signal line 012 is electrically connected to the test point 021, and the other end of the test signal line 012 is connected to the corresponding control signal line 011. In this way, during the test of the display device 00, an external test device can be connected to this test point 021 to obtain the control signals loaded by the corresponding control signal line 011 during the display process. After analyzing these control signals, the test of the display device 00 can be completed.

[0049] However, in order to separately test the control signals in multiple control signal lines 011, one test signal line 012 corresponding to one control signal line 011 is connected to one test point 021. When there are many control signal lines 011, a plurality of test points 021 need to be arranged on the flexible circuit board. At present, the display device 00 needs to integrate more and more functions, resulting in more and more traces on the flexible circuit board 02 in the display device 00. Furthermore, the space for distributing the test points 021 in the flexible circuit board 02 is small, which will affect the volume of the test points 021 in the flexible circuit board 02. In this way, it is difficult for an external test device to make an effective electrical connection with this test point 021, resulting in a poor test effect and low test efficiency for the display device 00.

[0050] Please refer to Figure 2 , Figure 2 FIG. is a schematic structural diagram of a display panel provided by an embodiment of the present application. The display panel 000 has a non-display area 00a. Here, the display panel 000 can be an organic light-emitting display (English: Organic LightEmitting Display; abbreviation: OLED) display panel or an active matrix organic light-emitting diode (English: ActiveMatrix / Organic Light Emitting Diode; abbreviation: AM-OLED) display panel. When the display panel 000 is an OELD display panel or an AM-OLED display panel, the display panel 000 can be a top-emission display panel or a bottom-emission display panel.

[0051] The display panel 000 may include: a first pad group 100, a second pad group 200, a plurality of control signal lines 300, a plurality of test signal lines 400, and a control circuit 500.

[0052] The first pad group 100 and the second pad group 200 in the display panel 000 are located in the non-display area 00a. The first pad group 100 is used for binding connection with a driving chip ( Figure 2 not shown in the figure), and the second pad group 200 is used for binding connection with a flexible circuit board 002 ( Figure 2 not shown in the figure).

[0053] A plurality of control signal lines 300 in the display panel 000 correspond one-to-one with a plurality of test signal lines 400, and both the plurality of control signal lines 300 and the plurality of test signal lines 400 are located in the non-display area 00a.

[0054] To more clearly explain the test principle of the display panel, please refer to Figure 3 , Figure 3 is Figure 2 a schematic diagram showing the display panel electrically connected to the driving chip and the flexible circuit board. A plurality of control signal lines 300 are used to be electrically connected to the driving chip 001 through the first pad group 100. The driving chip 001 can send control signals to the display panel 000 through the plurality of control signal lines 300 to control the display panel 000 to display an image.

[0055] Exemplarily, the display panel 000 may further include: a gate driving GOA circuit G located in the non-display area 00a. All the plurality of control signal lines 300 are electrically connected to the GOA circuit G. The driving chip 001 can send control signals to the GOA circuit G in the display panel 000 through the plurality of control signal lines 300. The display panel 000 further has a display area 00b. The non-display area 00a can be distributed around the display area 00b. The display panel 000 may further include: a plurality of sub-pixels arranged in an array in the display area 00a. Each row of sub-pixels can be electrically connected to the GOA circuit G. In this way, after the driving chip 001 sends control signals to the GOA circuit G through the plurality of control signal lines 300, the GOA circuit G can control the plurality of sub-pixels to work to control the display panel 000 to display an image. Here, the sub-pixel may include: a pixel driving circuit and a light-emitting device electrically connected to the pixel driving circuit. The GOA circuit G can be electrically connected to each pixel driving circuit in each row of sub-pixels. Optionally, the plurality of control signal lines 300 include GSTV signal lines, GCK signal lines, and GCB signal lines, and the control signals include GSTV control signals, GCK control signals, and GCB control signals.

[0056] The plurality of test signal lines 400 are used to be electrically connected to the flexible circuit board 002 through the second pad group 200. It should be noted that test points 0021 for analysis and testing are provided on the flexible circuit board 002, and the plurality of test signal lines 400 are used to be electrically connected to the same test point 0021 through the second pad group 200.

[0057] The control circuit 500 in the display panel 000 is located in the non-display area 00a, and the control circuit 500 is electrically connected to the plurality of control signal lines 300 and the plurality of test signal lines 400 respectively.

[0058] The control circuit 500 in the display panel 000 is configured to: in the test phase, time-sharingly control each control signal line 300 to be conductive with the corresponding test signal line 400 .

[0059] For example, Figure 3 As shown, when the control signal line A1 is connected to the corresponding test signal line B1, the control signal in the control signal line A1 can be transmitted through the test signal line B1 to the test point 0021 connected to the test signal line B1. When the control signal line A2 is connected to the corresponding test signal line B2, the control signal in the control signal line A2 can be transmitted through the test signal line B2 to the test point 0021 connected to the test signal line B2. When the control signal line A3 is connected to the corresponding test signal line B3, the control signal in the control signal line A3 can be transmitted through the test signal line B3 to the test point 0021 connected to the test signal line B3.

[0060] In this way, an external test device can receive the control signals transmitted in each control signal line 300 by connecting to the test point 0021, so as to analyze the display data of the display panel 000 during the display process.

[0061] In this case, since multiple test signal lines 400 can be connected to the same test point 0021, the number of test points 0021 on the flexible circuit board 002 is reduced, and the volume of the same test point 0021 can be increased, so that external test equipment can be more easily effectively electrically connected to this test point 0021, thereby improving the effect of testing the display device and increasing the test efficiency.

[0062] It should be noted that the number of GOA circuits G in the display panel 000 is two, and the two GOA circuits G are arranged on both sides of the display area 00b. The multiple control signal lines 300 in the display panel 000 can be divided into two groups, one group of control signal lines 300 is electrically connected to one GOA circuit G, and the other group of control signal lines 300 is electrically connected to another GOA circuit G. The multiple test signal lines 400 in the display panel 000 can also be divided into two groups, and the two groups of control signal lines 300 and the two groups of test signal lines 400 are distributed on both sides of the display panel 000. Figure 2 Only a schematic diagram of the connection relationship between a group of control signal lines 300 and a group of test signal lines 400 located on one side of the display panel 000 is shown. For the connection relationship between another group of control signal lines 300 and another group of test signal lines 400 located on the other side of the display panel 000, reference can be made to FIG. Figure 2 The connection relationship between a group of control signal lines 300 and a group of test signal lines 400 will not be repeated here.

[0063] In summary, the embodiment of the present application provides a display panel, including: a first pad group, a second pad group, a plurality of control signal lines, a plurality of test signal lines, and a control circuit. Since the control circuit is electrically connected to the plurality of control signal lines and the plurality of test signal lines respectively, during the test phase, the control circuit controls each control signal line and the corresponding test signal line to conduct in a time-sharing manner. In this way, an external test device can receive the control signals transmitted in each control signal line through the same test point, so as to analyze the display data during the display process of the display panel. In this way, the plurality of test signal lines can be connected to the same test point, thereby reducing the number of test points on the flexible circuit board. Furthermore, by increasing the volume of the same test point, it is easier for the external test device to make an effective electrical connection with this test point. Therefore, the test effect of the display device is improved, and the test efficiency is relatively high.

[0064] Optionally, during the test phase, the control circuit 500 controls each control signal line 300 and the corresponding test signal line 400 to conduct in a time-sharing manner, that is, only one control signal line 300 and the corresponding test signal line 400 are conducted each time. The control circuit 500 is configured to: during the process of controlling the first control signal line and the first test signal line to conduct, control the second control signal line and the second test signal line to be disconnected; wherein, the first control signal line is any one of the plurality of control signal lines 300, the first test signal line is the test signal line 400 corresponding to the first control signal line among the plurality of test signal lines 400, the second control signal line is the control signal line 300 other than the first control signal line among the plurality of control signal lines 300, and the second test signal line is the test signal line 400 other than the second test signal line among the plurality of test signal lines 400.

[0065] For example, when the control circuit 500 controls the control signal line A1 and the corresponding test signal line B1 to conduct, the control circuit 500 also needs to control the control signal line A2 and the corresponding test signal line B2 to be disconnected, and also needs to control the control signal line A3 and the corresponding test signal line B3 to be disconnected.

[0066] In this case, since during the process of controlling the first control signal line and the first test signal line to conduct, the second control signal line and the second test signal line are disconnected, it is realized that only one control signal line 300 and the corresponding test signal line 400 are conducted each time. In this way, an external test device can receive the control signals transmitted in each control signal line 300 through the same test point 0021, so as to analyze the display data during the display process of the display panel 000.

[0067] To more clearly see the structure of the control circuit 500, please refer to Figure 4 , Figure 4 is related toFigure 2 Schematic structural diagram of the control circuit of the display panel shown. The control circuit 500 includes: a plurality of control units 501, and the plurality of control units 501 are electrically connected to a plurality of control signal lines 300 in a one-to-one correspondence, and are also electrically connected to a plurality of test signal lines 400 in a one-to-one correspondence.

[0068] The display panel 000 further includes: a plurality of switch control lines 600 electrically connected to the control units 501 in a one-to-one correspondence; wherein, the control unit 501 is configured to: in response to a first control signal loaded on the corresponding switch control line 600, control the corresponding control signal line 300 and the corresponding test signal line 400 to conduct; or, in response to a second control signal loaded on the corresponding switch control line 600, control the corresponding control signal line 300 and the corresponding test signal line 400 to disconnect.

[0069] Exemplarily, the control unit 501 may include: a transistor. The first control signal is a low-level signal for controlling the control unit 501 to turn on, and further controlling the corresponding control signal line 300 and the corresponding test signal line 400 to conduct. The second control signal is a high-level signal for controlling the control unit 501 to turn off, and further controlling the corresponding control signal line 300 and the corresponding test signal line 400 to disconnect. Here, the low-level signal may be a low-level signal of -7V, and the high-level signal may be a high-level signal of +7V.

[0070] Optionally, please refer to Figure 5 , Figure 5 is the same as Figure 4 Schematic structural diagram of the control unit 501 shown. When the control unit 501 includes: a transistor, the transistor has a gate 5011, a first pole 5012 and a second pole 5013. The first pole 5012 of the transistor is electrically connected to the corresponding control signal line 300, the second pole 5013 of the transistor is electrically connected to the corresponding test signal line 400, and the gate 5011 of the transistor is electrically connected to the corresponding switch control line 600.

[0071] Exemplarily, the first pole 5012 may be one of the source and the drain in the transistor, and the second pole 5013 may be the other of the source and the drain in the transistor. The active layer in the transistor is a P-type semiconductor. When a first control signal (high-level signal) is loaded on the switch control line 600, the gate 5011 of the transistor is in a high-level state, and the source and the drain in the transistor are disconnected, thereby controlling the corresponding control signal line 300 and the corresponding test signal line 400 to disconnect; when a second control signal (low-level signal) is loaded on the switch control line 600, the gate 5011 of the transistor is in a low-level state, and the source and the drain in the transistor are conducting, thereby controlling the corresponding control signal line 300 and the corresponding test signal line 400 to conduct.

[0072] In this application, by changing the control signal applied to the gate 5011 of the transistor, the conduction states of the source and drain in the transistor can be controlled, thereby achieving the control of the conduction states of the corresponding control signal line 300 and the corresponding test signal line 400. Therefore, by controlling multiple transistors, only one control signal line 300 and the corresponding test signal line 400 are conducted each time.

[0073] Please continue to refer to Figure 4 , the first pad group 100 in the display panel 000 has: a plurality of first sub-pads 101 corresponding one-to-one to a plurality of control signal lines 300, and a plurality of second sub-pads 102 corresponding one-to-one to a plurality of switch control signal lines 600; wherein, the first sub-pads 101 are electrically connected to the corresponding control signal lines 300, and the second sub-pads 102 are electrically connected to the corresponding switch control signal lines 600.

[0074] The control signal lines 300 in the display panel 000 are bound and connected to the driving chip 001 through the first sub-pads 101. In this way, the driving chip 001 can send control signals to the control signal lines 300 to control the display panel 000 to display images. The driving chip 001 can also send control signals to the switch control signal lines 600 through the second sub-pads 102, and control the control circuit 500 to be turned on or off through the control signals, so as to control the conduction or disconnection of the corresponding control signal line 300 and the corresponding test signal line 400.

[0075] Optionally, the second pad group 200 in the display panel 000 has a plurality of third sub-pads 201 corresponding one-to-one to a plurality of test signal lines 400. The third sub-pads 201 are electrically connected to the corresponding test signal lines 400, and the plurality of third sub-pads 201 are used to be electrically connected to the same test point 0021 in the flexible circuit board 002. That is, the plurality of test signal lines 400 are respectively electrically connected to the test point 0021 through the plurality of third sub-pads 201, which is convenient for obtaining the control signals transmitted in each test signal line 400 through the same test point 0021 during the test stage.

[0076] As Figure 4As shown, the display panel 000 also includes: a plurality of transfer signal lines 700 corresponding to the plurality of control signal lines 300 one by one, and the transfer signal lines 700 are electrically connected to the corresponding first sub-pads 101 and the corresponding first poles 5012 of the transistors, respectively. In this way, the plurality of control signal lines 300 are electrically connected to the test signal lines 400 through the transfer signal lines 700. Among them, the control signal lines 300 and the transfer signal lines 700 are arranged in different layers, and the transfer signal lines 700, the test signal lines 400, and the switch control lines 600 are arranged in the same layer and with the same material as the first pole 5012 and the second pole 5013 of the transistor. Since the control signal lines 300 and the transfer signal lines 700 are arranged in different layers, it is possible to avoid short circuits between the control signal lines 300 and the non-corresponding transfer signal lines 700 in the crossing area.

[0077] For example, please refer to Figure 6 , Figure 6 yes Figure 4 The display panel 000 includes a substrate C1, and an active layer pattern C2, a first gate insulating layer C3, a first conductive layer C4, a second gate insulating layer C5, a second conductive layer C6, an interlayer dielectric layer C7, a third conductive layer C8 and a planar layer C9 stacked in a direction perpendicular to and away from the substrate C1.

[0078] The active layer pattern C2 may include: an active layer in a transistor. The first conductive layer C4 may include: a gate electrode 5011 in a transistor. The second conductive layer C6 may include: a control signal line 300. The third conductive layer C8 may include: a first electrode 5012 and a second electrode 5013 in a transistor, a transfer signal line 700 electrically connected to the first electrode 5012, a test signal line 400 electrically connected to the second electrode 5013, and a switch control line 600 electrically connected to the gate electrode 5011.

[0079] The flat layer C9 has a first via hole V1, through which the transfer signal line 700 can be electrically connected to the control signal line 300. The flat layer C9 and the second gate insulating layer C5 have a second via hole V2 interconnected, through which the switch control line 600 can be electrically connected to the gate 5011 of the transistor.

[0080] It should be noted that in Figure 6In this case, there is also an overlapping area between the test signal line 400 and the switch control line 600, and both the test signal line 400 and the switch control line 600 belong to the third conductive layer C8. To avoid short circuit between the test signal line 400 and the switch control line 600 in the overlapping area, one of the test signal line 400 and the switch control line 600 needs to be disconnected at the overlapping area, and a jumper line disposed in a layer different from the third conductive layer C8 is used to connect the test signal line 400 or the switch control line 600 that is disconnected at the overlapping area. For example, the jumper line belongs to the first conductive layer C4 or may also belong to the second conductive layer C6.

[0081] In this application, before binding the display panel 000 to the flexible circuit board 002, a lighting test needs to be performed on the display panel 000. After determining that the display panel 000 can display normally, the display panel 000 is bound to the flexible circuit board 002. Optionally, please refer to Figure 7 , Figure 7 is Figure 2 a schematic diagram of the display panel shown during the lighting test. The display panel 000 further includes: a plurality of auxiliary control lines 800 electrically connected to the plurality of switch control lines 600 in a one-to-one correspondence. The auxiliary control lines 800 are used to be electrically connected to the same control pad 901 in the lighting test component 900 during the process of performing a lighting test on the display panel 000 by using the lighting test component 900.

[0082] During the lighting test, the lighting test component 900 transmits a third control signal to the plurality of auxiliary control lines 800 through the control pad 901. The third control signal is transmitted to the control circuit 500 through the plurality of switch control lines 600, and then the control circuit 500 controls each control signal line 300 to be conducted with the corresponding test signal line 400. In this way, the lighting test component 900 can transmit display data to the control signal line 300 through the test signal line 400 to detect the display function of the display panel 000. Optionally, the third control signal is a low-level signal. For example, the low-level signal may be a low-level signal of -7V.

[0083] Among them, the auxiliary control line 800 and the switch control line 600 are disposed in different layers, and are disposed in the same layer as the control signal line 400 and have the same material. In this way, it is possible to avoid short circuit between the auxiliary control line 800 and the switch control line 600 in the overlapping area.

[0084] Optionally, as Figure 7As shown, the display panel 000 further includes an auxiliary control bus 1000 electrically connected to each of the plurality of auxiliary control lines 800. The auxiliary control bus 1000 is used to be electrically connected to the control pad 901 in the lighting test component 900. In this way, the lighting test component 900 can transmit a third control signal to the plurality of auxiliary control lines 800 through the auxiliary control bus 1000 electrically connected to the control pad 901 in the lighting test component 900.

[0085] After the lighting test of the display panel 000 is performed using the lighting test component 900, the display panel 000 is subjected to a cutting process to cut off the auxiliary control bus 1000 in the display panel 000. Exemplarily, the auxiliary control bus 1000 in the display panel 000 is cut off by a laser device along the cutting line L. After the cutting process, the display panel 000 is bonded to the flexible circuit board 002, and then a control signal is transmitted to the control circuit 500 through the driving chip 001.

[0086] It should be noted that the control circuit 500 is further configured to: in the display stage, control each control signal line 300 to be disconnected from the corresponding test signal line 400 to block the display data from being transmitted from the control signal line 300 to the test signal line 400, thereby reducing the power consumption of the display panel 000.

[0087] In summary, the embodiment of the present application provides a display panel, including: a first pad group, a second pad group, a plurality of control signal lines, a plurality of test signal lines, and a control circuit. Since the control circuit is electrically connected to the plurality of control signal lines and the plurality of test signal lines respectively, in the test stage, the control circuit controls each control signal line to be electrically connected to the corresponding test signal line in a time-sharing manner. In this way, an external test device can receive the control signals transmitted in each control signal line respectively through the same test point, so as to analyze the display data during the display process of the display panel. In this way, the plurality of test signal lines can be connected to the same test point, thereby reducing the number of test points on the flexible circuit board. Furthermore, by increasing the volume of the same test point, it is easier for the external test device to make an effective electrical connection with this test point. Therefore, the test effect of the display device is improved, and the test efficiency is relatively high.

[0088] The embodiment of the present application further provides a display device, which can be: any product or component with a display function such as a mobile phone, a tablet computer, a television, a monitor, a laptop computer, a digital photo frame, a navigator, etc.

[0089] The display device may include: a display panel 000, a driving chip 001, and a flexible circuit board 002. The display panel 000 is the above-mentioned display panel 000. The driving chip 001 is bonded and connected to the first pad group 100 in the display panel 000, and the flexible circuit board 002 is bonded and connected to the second pad group 200 in the display panel 000; the flexible circuit board 002 has a test point 0021, and multiple test signal lines 400 in the display panel 000 are electrically connected to the same test point 0021 through the second pad group 200.

[0090] Optionally, the flexible circuit board 002 has a plurality of fourth sub-pads corresponding one-to-one to the multiple test signal lines 400, and the fourth sub-pads are electrically connected to the third sub-pads 201 in the second pad group 200 one-to-one. In this way, the fourth sub-pads can be electrically connected to the corresponding test signal lines 400 through the third sub-pads 201 in the second pad group 200, and the multiple fourth sub-pads are electrically connected to the same test point 0021. Thus, an external test device can obtain the control signals loaded by the corresponding control signal lines 300 during the display process through the same test point 0021. After analyzing these control signals, the test of the display device can be completed.

[0091] Exemplarily, please refer to Figure 8 , Figure 8 which is a schematic diagram of the film layer structure of a flexible circuit board provided by an embodiment of the present application. The flexible circuit board 002 has a first electrode 002a and a second electrode 002b, and the test point 0021 can be electrically connected to the first electrode 002a. The flexible circuit board 002 may further have a protective layer 002c, and the first electrode 002a can be protected through the protective layer 002c. Exemplarily, the protective layer 002c is white oil. Before the test, the probe of the test device can pass through the white oil and be connected to the first electrode 002a, or after removing the white oil, the probe of the test device is connected to the first electrode 002a.

[0092] In summary, the embodiment of the present application provides a display device, including: a display panel, a driving chip, and a flexible circuit board. Since the control circuits in the display panel are electrically connected to a plurality of control signal lines and a plurality of test signal lines respectively, during the test phase, the control circuits control each control signal line to be conducted with the corresponding test signal line in a time-sharing manner. In this way, an external test device can receive the control signals transmitted in each control signal line through the same test point, so as to analyze the display data during the display process of the display device. In this way, a plurality of test signal lines can be connected to the same test point, thereby reducing the number of test points on the flexible circuit board. Furthermore, by increasing the volume of the same test point, it is easier for the external test device to make an effective electrical connection with this test point. Therefore, the test effect of the display device is improved, and the test efficiency is relatively high.

[0093] The embodiment of the present application further provides a test system for a display device. The test system for the display device includes: a test device and the above-mentioned display device, and the test device is electrically connected to the test point 0021 of the flexible circuit board 002 in the display device. Optionally, the test device is an oscilloscope, and the waveform of the control signal can be detected through the oscilloscope to obtain information such as the voltage and period of the control signal.

[0094] It should be noted that in the drawings, the dimensions of layers and regions may be exaggerated for clarity of illustration. Moreover, it can be understood that when an element or layer is referred to as being "on" another element or layer, it can be directly on the other element, or there may be an intermediate layer. Additionally, it can be understood that when an element or layer is referred to as being "under" another element or layer, it can be directly under the other element, or there may be more than one intermediate layer or element. Additionally, it can also be understood that when a layer or element is referred to as being "between" two layers or two elements, it can be the only layer between the two layers or two elements, or there may be more than one intermediate layer or element. Like reference numerals throughout indicate like elements.

[0095] In the present application, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance. The term "plurality" means two or more, unless otherwise clearly defined.

[0096] The above are only optional embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A display panel, characterized in that, The display panel has a non-display area, and the display panel includes: A first pad group and a second pad group located in the non-display area, the first pad group being used for binding and connecting with a driving chip, and the second pad group being used for binding and connecting with a flexible circuit board; a plurality of control signal lines located in the non-display area, and a plurality of test signal lines corresponding one to one with the plurality of control signal lines, the plurality of control signal lines being used to be electrically connected to the driving chip through the first pad group, and the plurality of test signal lines being used to be connected to the flexible circuit board through the second pad group; A control circuit located in the non-display area, the control circuit being electrically connected to the plurality of control signal lines and the plurality of test signal lines respectively, the control circuit being configured to: in a test phase, time-sharingly control each of the control signal lines to be turned on with the corresponding test signal lines; the control circuit comprising: a plurality of control units, the plurality of control units being electrically connected to the plurality of control signal lines in a one-to-one correspondence, and being electrically connected to the plurality of test signal lines in a one-to-one correspondence; A plurality of switch control lines electrically connected to the control unit in a one-to-one correspondence; a plurality of auxiliary control lines electrically connected to the plurality of switch control lines in a one-to-one correspondence, the auxiliary control lines being used to electrically connect to a same control solder pin in the lighting test assembly during a lighting test of the display panel using the lighting test assembly; The auxiliary control line is arranged in a different layer from the switch control line, and is arranged in the same layer and with the control signal line and made of the same material.

2. The display panel according to claim 1, wherein The control circuit is configured to: in the process of controlling the first control signal line to be conductive with the first test signal line, control the second control signal line to be disconnected from the second test signal line; Among them, the first control signal line is any control signal line among the multiple control signal lines, the first test signal line is a test signal line among the multiple test signal lines corresponding to the first control signal line, the second control signal line is a control signal line among the multiple control signal lines except the first control signal line, and the second test signal line is a test signal line among the multiple test signal lines except the second test signal line.

3. The display panel according to claim 2, wherein The control unit is configured to: in response to a first control signal loaded on the corresponding switch control line, control the corresponding control signal line and the corresponding test signal line to be turned on; or, in response to a second control signal loaded on the corresponding switch control line, control the corresponding control signal line and the corresponding test signal line to be turned off.

4. The display panel according to claim 3, wherein The control unit includes: a transistor, the transistor having a gate, a first electrode and a second electrode, the first electrode of the transistor is electrically connected to the corresponding control signal line, the second electrode of the transistor is electrically connected to the corresponding test signal line, and the gate of the transistor is electrically connected to the corresponding switch control line.

5. The display panel according to claim 4, wherein The first pad group comprises: a plurality of first sub-pads corresponding to the plurality of control signal lines one by one, and a plurality of second sub-pads corresponding to the plurality of switch control lines one by one; The first sub-pad is electrically connected to a corresponding control signal line, and the second sub-pad is electrically connected to a corresponding switch control line.

6. The display panel according to claim 5, wherein The display panel further comprises: a plurality of transfer signal lines corresponding one-to-one to the plurality of control signal lines, the transfer signal lines being electrically connected to the corresponding first sub-pads and the first electrodes of the corresponding transistors respectively; The control signal line and the switching signal line are arranged in different layers; the switching signal line, the test signal line, the switch control line and the first electrode and the second electrode of the transistor are arranged in the same layer and made of the same material.

7. The display panel according to claim 1, wherein The display panel further comprises: an auxiliary control bus electrically connected to the plurality of auxiliary control lines, the auxiliary control bus being used to be electrically connected to the control solder pins in the lighting test assembly; After the lighting test component is used to perform a lighting test on the display panel, the display panel is cut to remove the auxiliary control bus in the display panel.

8. The display panel according to any one of claims 1 to 6, characterized in that, The second pad group has a plurality of third sub-pads corresponding one-to-one to the plurality of test signal lines, the third sub-pads are electrically connected to the corresponding test signal lines, and the plurality of third sub-pads are used to be electrically connected to the same test point in the flexible circuit board.

9. The display panel according to any one of claims 1 to 6, characterized in that, The display panel further includes: a gate drive GOA circuit located in the non-display area, and the plurality of control signal lines are all electrically connected to the GOA circuit.

10. The display panel according to claim 9, wherein The plurality of control signal lines include: a GSTV signal line, a GCK signal line and a GCB signal line.

11. The display panel according to any one of claims 1 to 6, characterized in that, The control circuit is further configured to: in a display phase, control each of the control signal lines to be disconnected from the corresponding test signal line.

12. A display device, characterized in that, include: Display panels, driver chips and flexible circuit boards; The display panel is the display panel according to any one of claims 1 to 11, the driving chip is bound and connected to a first pad group in the display panel, and the flexible circuit board is bound and connected to a second pad group in the display panel; The flexible circuit board has a test point, and a plurality of test signal lines in the display panel are electrically connected to the same test point through the second pad group.

13. The display device according to claim 12, wherein The flexible circuit board has a plurality of fourth sub-pads corresponding one-to-one to the plurality of test signal lines, the fourth sub-pads are electrically connected to the corresponding test signal lines through the sub-pads in the second pad group, and the plurality of fourth sub-pads are electrically connected to the same test point.

14. A test system for a display device, characterized in that, include: A testing device and a display device as claimed in claim 12 or 13, wherein the testing device is electrically connected to a testing point of a flexible circuit board in the display device.

Images