A two-port microstrip device test apparatus

Abstract

The application discloses a two-port microstrip device testing device which comprises an X-axis displacement platform, a radio frequency connector support A, a radio frequency connector support B, a Z-axis displacement platform A, a Z-axis displacement platform B, an X-axis displacement platform, a support plate support A and a support plate support B, a support plate, a ball spring screw and a device to be tested support; wherein the radio frequency connector support A and the radio frequency connector support B can move along the X-axis displacement platform in the X direction; the ball spring screw is arranged in the cavity of the support plate support A and the support plate support B and below the support plate; and the device to be tested support is arranged on the support plate between the radio frequency connector support A and the radio frequency connector support B. Through the application, the device testing can be quickly and efficiently completed, the connection of the microstrip line is completed by using the crimping method, welding is not needed, the lossless testing is realized, and the application is suitable for various microstrip line devices, and the devices with different lengths, different widths and different medium thicknesses can be used.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of radio frequency device testing, in particular to a two-port microstrip device testing device. BACKGROUND

[0002] Two-port microstrip devices are important components of radio frequency devices, and are widely used in various communication-related fields, including base stations, backhaul links, satellite communications, military, radars, aerospace, etc. In the production of microstrip devices, the electrical performance of the devices needs to be accurately tested. The conventional vector network analyzer only has coaxial calibration pieces. If microstrip devices are to be tested, a microstrip-to-coaxial transition must be added, which introduces a large test error. Moreover, the traditional microstrip device testing requires soldering, which damages the devices and increases the cost of post-sale. SUMMARY

[0003] The present application provides a two-port microstrip device testing device, which aims to solve the technical problem of device damage during testing.

[0004] In view of the above problems of the prior art, according to one aspect of the present application, the present application adopts the following technical solution:

[0005] A two-port microstrip device testing device, comprising:

[0006] An X-axis displacement platform;

[0007] A radio frequency connector carrier A and a radio frequency connector carrier B, which are arranged on the X-axis displacement platform, and the radio frequency connector carrier A and the radio frequency connector carrier B can move along the X-axis direction on the X-axis displacement platform;

[0008] A Z-axis displacement platform A and a Z-axis displacement platform B, which are arranged on the X-axis displacement platform, the Z-axis displacement platform A and the Z-axis displacement platform B can move along the X-axis direction together with the radio frequency connector carrier A and the radio frequency connector carrier B, respectively;

[0009] A support plate carrier A and a support plate carrier B, which are connected to the Z-axis displacement platform A and the Z-axis displacement platform B, respectively, and can move along the Z-axis direction, and cavities for accommodating support plates are arranged on the support plate carrier A and the support plate carrier B;

[0010] A support plate, which penetrates the cavities of the support plate carrier A and the support plate carrier B;

[0011] Ball spring screws are arranged in the cavities of the support plate platform A and the support plate platform B and below the support plate;

[0012] A test piece platform on which a test piece is placed and between the RF connector platform A and the RF connector platform B.

[0013] In order to better realize the application, further technical solutions are:

[0014] Further, the test piece platform is a 0.5mm thick test piece platform, a 1mm thick test piece platform, a 2mm thick test piece platform, a 4mm thick test piece platform or an 8mm thick test piece platform.

[0015] Further, the Z-axis displacement platform A is provided with a locking screw A for locking the support plate platform A in the Z-axis direction.

[0016] Further, the locking screw A is located on the side surface of the Z-axis displacement platform A.

[0017] Further, the Z-axis displacement platform B is provided with a locking screw B for locking the support plate platform B in the Z-axis direction.

[0018] Further, the locking screw B is located on the side surface of the Z-axis displacement platform B.

[0019] Further, the RF connector platform A is provided with an RF connector A.

[0020] Further, the RF connector platform B is provided with an RF connector B.

[0021] Compared with the prior art, one of the beneficial effects of the application is:

[0022] The two-port microstrip device testing device of the application has the following advantages: 1) the device testing can be quickly and efficiently completed, the connection of the microstrip line is completed by using the crimping method, no welding is needed, and the testing is lossless; and 2) the device testing device is suitable for various microstrip line devices, and devices with different lengths, different widths and different medium thicknesses can be used. BRIEF DESCRIPTION OF DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed in the description of the embodiments or the prior art will be briefly introduced. Obviously, the drawings in the following description are only used to refer to some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0024] Figure 1 The schematic diagram of the overall structure of a two-port microstrip device testing device according to an embodiment of the present application.

[0025] Figure 2 The schematic diagram of a ball spring screw structure according to an embodiment of the present application.

[0026] Figure 3 The schematic diagram of a support plate carrier A assembly structure according to an embodiment of the present application.

[0027] Figure 4 The schematic diagram of a support plate carrier B assembly structure according to an embodiment of the present application.

[0028] Figure 5 The schematic diagram of a two-port microstrip device testing device according to an embodiment of the present application.

[0029] In the drawings, the corresponding drawing names of the reference signs are:

[0030] 1-X axis displacement platform, 2-radio frequency connector carrier A, 3-radio frequency connector carrier B, 4-ball spring screw, 5-support plate carrier A, 6-Z axis displacement platform A, 7-locking screw A, 8-support plate carrier B, 9-Z axis displacement platform B, 10-locking screw B, 11-radio frequency connector A, 12-radio frequency connector B, 13-support plate, 14-0.5 mm thickness device under test carrier, 15-1 mm thickness device under test carrier, 16-2 mm thickness device under test carrier, 17-4 mm thickness device under test carrier, 18-8 mm thickness device under test carrier, 19-device under test. DETAILED DESCRIPTION

[0031] The present application will be further described in conjunction with the embodiments. However, the embodiments of the present application are not limited thereto.

[0032] Referring to Figures 1 to 5 The two-port microstrip device testing device includes:

[0033] X axis displacement platform 1;

[0034] Radio frequency connector carrier A 2 and radio frequency connector carrier B 3 are arranged on the X axis displacement platform 1, and the radio frequency connector carrier A 2 and the radio frequency connector carrier B 3 can move along the X direction on the X axis displacement platform 1.

[0035] The radio frequency connector carrier A 2 can be installed on one side of the X axis displacement platform 1 through a screw, and the radio frequency connector carrier B 3 can be installed on the other side of the X axis displacement platform 1 through a screw. The above structure is mainly to meet the movement of the radio frequency connector carrier A 2 and the radio frequency connector carrier B 3 in the X axis direction, and the movement connection mode can be a lead screw, a slide rail, etc.

[0036] Z-axis displacement platform A6 and Z-axis displacement platform B9, which are arranged on the X-axis displacement platform 1, the Z-axis displacement platform A6 and the radio frequency connector platform A2 can move together along the X-axis direction, the Z-axis displacement platform B9 and the radio frequency connector platform B3 can move together along the X-axis direction. The radio frequency connector A11 is arranged on the radio frequency connector platform A2. The radio frequency connector B12 is arranged on the radio frequency connector platform B3.

[0037] Further preferably, the Z-axis displacement platform A6 is installed at the lower part of the radio frequency connector platform A2 by screws, the Z-axis displacement platform B9 is installed at the lower part of the radio frequency connector platform B3 by screws, the radio frequency connector A11 is installed at the upper part of the radio frequency connector platform A2, and the radio frequency connector B12 is installed at the upper part of the radio frequency connector platform B3.

[0038] Support plate platform A5 and support plate platform B8, which are connected with the Z-axis displacement platform A6 and can move along the Z-axis direction, and the Z-axis displacement platform B9 and can move along the Z-axis direction, and the support plate platform A5 and the support plate platform B8 are arranged with cavities accommodating the support plate 13.

[0039] The support plate 13 penetrates the cavities of the support plate platform A5 and the support plate platform B8; for example Figure 1 The support plate 13 penetrates the support plate platform A5 and the support plate platform B8.

[0040] Ball spring screws 4, which are arranged in the cavities of the support plate platform A5 and the support plate platform B8 and are located below the support plate 13.

[0041] Generally, the ball spring screws 4 are uniformly installed at the lower part of the support plate platform A5 and the support plate platform B8, the support plate platform A5 and the ball spring screw 4 combination are installed on the Z-axis displacement platform A6 by screws, and the support plate platform B8 and the ball spring screw 4 combination are installed on the Z-axis displacement platform B9 by screws.

[0042] And the Z-axis displacement platform A6 can be provided with a locking screw A7 for locking the support plate platform A5 in the Z-axis direction. The locking screw A7 is generally located on the side of the Z-axis displacement platform A6.

[0043] And the Z-axis displacement platform B9 is provided with a locking screw B10 for locking the support plate platform B8 in the Z-axis direction. The locking screw B10 is located on the side of the Z-axis displacement platform B9.

[0044] A test piece carrier on which the test piece 19 is placed and located on the support plate 13 between the RF connector carrier A2 and the RF connector carrier B3.

[0045] The test piece carriers are combined according to the length of the test piece 19, and the test piece carriers are placed on the surface of the support plate 13, and the test piece 19 is placed on the corresponding space surface of the test piece carrier according to its width.

[0046] The specific model of the test piece carrier can be selected according to the test piece 19, for example, the test piece carrier can be a 0.5mm-thick test piece carrier 14, a 1mm-thick test piece carrier 15, a 2mm-thick test piece carrier 16, a 4mm-thick test piece carrier 17, or an 8mm-thick test piece carrier 18, of course, the present application is not limited thereto.

[0047] When the device is working, according to the length of the test piece 19, one or several of the 0.5mm-thick test piece carrier 14, the 1mm-thick test piece carrier 15, the 2mm-thick test piece carrier 16, the 4mm-thick test piece carrier 17, and the 8mm-thick test piece carrier 18 can be selected to form a test piece carrier of corresponding length, the test piece carrier is placed on the surface of the support plate 13, and the test piece 19 is placed in the corresponding width test piece carrier groove according to its width, the screw of the X-axis displacement platform 1, the Z-axis displacement platform A6, and the Z-axis displacement platform B9 is rotated to cooperate with each other, so that the test piece carrier is clamped by the RF connector carrier A2 and the RF connector carrier B3, the needles of the RF connector A11 and the RF connector B12 contact the upper surface of the test piece 19, the ball spring screw 4 has a certain compression amount, the needles of the RF connector A11 and the RF connector A12 are tightly attached to the surface of the test piece 19, and then the RF connector A11 and the RF connector B12 are connected with the external test instrument to complete the test.

[0048] The embodiments in the specification are described in a progressive manner, and each embodiment focuses on the difference from other embodiments. The same or similar parts between the embodiments can be referred to each other.

[0049] In the specification, "one embodiment", "another embodiment", "embodiment", and the like refer to the specific features, structures, or characteristics described in connection with the embodiment, which are included in at least one embodiment described in the general description of the application. The same expression appearing in multiple places in the specification does not necessarily refer to the same embodiment. Further, when a specific feature, structure, or characteristic is described in connection with any embodiment, it is claimed that the implementation of such feature, structure, or characteristic in connection with other embodiments also falls within the scope of the present application.

[0050] While the application has been described with reference to numerous exemplary embodiments, it will be understood that various other modifications can be made within the scope of the application as disclosed herein. More particularly, many modifications can be made to the components and / or arrangements of the subject combinations within the scope and spirit of the disclosure and claims. In addition those skilled in the art will recognize or be able to ascertain using no more than routine experimentation many equivalents to the specific embodiments described herein. It is therefore to be understood that any embodiments disclosed herein are merely illustrative of the principles of the present application and that various modifications can be made by those skilled in the art which will accomplish like results.

Claims

1. A testing device for a two-port microstrip device, characterized in that... include: X-axis displacement platform (1); RF connector stage A (2) and RF connector stage B (3) are disposed on the X-axis displacement platform (1), and the RF connector stage A (2) and RF connector stage B (3) are capable of moving along the X direction on the X-axis displacement platform (1); Z-axis displacement platform A (6) and Z-axis displacement platform B (9) are disposed on the X-axis displacement platform (1). Z-axis displacement platform A (6) and the radio frequency connector stage A (2) can move together along the X-axis direction, and Z-axis displacement platform B (9) and the radio frequency connector stage B (3) can move together along the X-axis direction. Support plate platform A (5) and support plate platform B (8), the support plate platform A (5) is connected to the Z-axis displacement platform A (6) and can move along the Z-axis direction, the support plate platform B (8) is connected to the Z-axis displacement platform B (9) and can move along the Z-axis direction, and the support plate platform A (5) and support plate platform B (8) are provided with cavities for accommodating the support plate (13); Support plate (13), which penetrates the cavity of the support plate platform A (5) and the support plate platform B (8); Ball spring screws (4) are several and are respectively disposed in the cavities of the support plate platform A (5) and the support plate platform B (8) and are located below the support plate (13); Test stage, on which the test device (19) is placed and on a support plate (13) located between the RF connector stage A (2) and the RF connector stage B (3); Radio frequency connector A (11) is provided on radio frequency connector platform A (2); radio frequency connector B (12) is provided on radio frequency connector platform B (3).

2. The two-port microstrip device testing apparatus according to claim 1, characterized in that... The test stage is a 0.5 mm thick test stage (14), a 1 mm thick test stage (15), a 2 mm thick test stage (16), a 4 mm thick test stage (17), or an 8 mm thick test stage (18).

3. The two-port microstrip device testing apparatus according to claim 1, characterized in that... The Z-axis displacement platform A (6) is provided with a locking screw A (7) for locking the support plate platform A (5) in the Z-axis direction.

4. The two-port microstrip device testing apparatus according to claim 3, characterized in that... The locking screw A (7) is located on the side of the Z-axis displacement platform A (6).

5. The two-port microstrip device testing apparatus according to claim 1, characterized in that... The Z-axis displacement platform B (9) is provided with locking screws B (10) for locking the support plate platform B (8) in the Z-axis direction.

6. The two-port microstrip device testing apparatus according to claim 5, characterized in that... The locking screw B (10) is located on the side of the Z-axis displacement platform B (9).

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