An alpha, beta surface contamination monitoring training system and a monitoring method thereof

Abstract

The present application relates to a kind of simulation alpha, beta surface contamination monitoring training system and its monitoring method, the system includes simulation monitor, simulation plane radioactive source and simulation radioactive source setting device, data transmission between three parts is realized by wireless way.The system features is to use infrared grid panel to simulate plane radioactive source, and use positioning frame to ensure the detection state of simulation monitor.The monitoring method of the present application is that the surface contamination area and intensity of plane radioactive source are simulated using grid unit data, artificially set the area and intensity of surface contamination, real-time call and transmit grid unit data to fit the set contamination area and intensity, and the monitor receives the transmitted data and converts into simulated measurement value.The simulation plane source and the measurement of simulation plane source of the present application are practical, and the contamination condition of wall surface, desktop and ground can be simulated.The operation alarm measurement value display of simulation monitor is completely same as conventional monitor, and can give trainees immersive experience.

Description

Technical Field

[0001] This invention belongs to the field of nuclear radiation monitoring technology, specifically relating to a simulated α and β surface contamination monitoring training system and its monitoring method. Background Technology

[0002] Explosions during the storage and use of nuclear materials, as well as the release of radioactive materials from dirty bomb explosions, can contaminate the surrounding environment, creating surface radioactive contamination. It is essential to monitor the radioactive contamination of affected walls, floors, work surfaces, personnel, and equipment to confirm whether it exceeds surface contamination control levels and to provide a basis for subsequent disposal measures. Surface contaminants include alpha and beta radioactive substances. The radiation produced by these substances has a short range and a wide energy range in the air, requiring a combination of specialized detection methods and techniques to solve the detection problem.

[0003] To achieve rapid monitoring of large contaminated areas, surface contamination monitors with a large detection sensitivity area are typically used. To avoid radioactive contamination or damage to the measuring instrument and to maintain consistent geometric conditions during measurement, a positioning frame is usually used for surface contamination measurements. When necessary, the instrument detector is fixed to the positioning frame to complete the surface contamination measurement. After measurement, the positioning frame can be decontaminated for reuse. According to the latest national standards, when calibrating α and β surface contamination meters, the distance between the α standard plane source and the surface of the detection window is 5 mm, and the distance between the β standard plane source and the surface of the detection window is 10 mm. This height is the height of the positioning frame. Currently, most surface contamination measuring instruments can measure α or β surface contamination individually, or simultaneously. The instrument displays units such as cps, cpm, or Bq / cm³. 2 For instruments that only display cps and cpm, the activity per unit area can be calculated using formula (1).

[0004] ……………(1)

[0005] In the formula: A S — Activity per unit area of ​​a planar source, Bq / cm² 2 ;

[0006] R a —Surface activity response of α and β surface contamination meters, s -1 Bq -1 cm 2

[0007] —Count rate of standard planar sources by α and β surface contamination meters, s -1 ;

[0008] N b—Background count rates of α and β surface contamination meters, s -1 ;

[0009] R q —Surface emissivity response of α and β surface contamination meters (provided by the instrument metrology department);

[0010] Area of ​​the sensitive zone of the S-α, β surface contaminant detector, cm² 2 Typically, the area ranges from tens of square centimeters to three hundred square centimeters;

[0011] ε — Efficiency of the standard planar source used to measure the surface emissivity response. Recommended value in national standards: ε(α) = 0.51 for α planar source and ε(β) = 0.62 for β planar source.

[0012] During actual measurement, its geometry should be kept consistent with that during instrument calibration. Typically, the detector or probe is fixed to a positioning frame. The instrument and frame are slowly moved while closely monitoring changes in sound density and readings. Once a contaminated area is detected, the instrument is placed in that position and held for a sufficient time to allow the data to stabilize before taking a reading.

[0013] Training personnel involved in nuclear accident emergency response and counter-terrorism on radioactive contamination using α and β surface contamination detectors and measurement methods can effectively improve their emergency monitoring capabilities.

[0014] Currently, in practical teaching and training situations, real alpha and beta radioactive surface sources can be used to train personnel involved in nuclear accident emergency response and counter-terrorism on radioactive contamination monitoring. However, due to the high cost and management difficulty of real radioactive sources, and the fact that high-energy beta radioactive sources can cause external radiation hazards to the human body, using real radioactive sources for training does not improve the training effectiveness. Summary of the Invention

[0015] The purpose of this invention is to provide a completely harmless simulation α and β surface contamination monitoring training system and its monitoring method to meet the teaching and training needs of nuclear accident emergency rescue and anti-nuclear terrorism personnel in the field or workplace for monitoring radioactive surface contamination.

[0016] To achieve the above objectives, the present invention provides a monitoring and training system technical solution: a simulated α and β surface contamination monitoring and training system. This system includes a simulated α and β surface contamination monitor, a simulated α and β planar radioactive source, and a simulated α and β planar radioactive source setting device. The simulated α and β surface contamination monitor includes a single-chip computer, a display and alarm module, a wireless communication module, and a power supply module. The simulated α and β planar radioactive source includes a single-chip computer, a wireless communication module, and a power supply module. The simulated α and β planar radioactive source setting device consists of a simulated α and β planar radioactive source setting module, a wireless communication module, and a power supply module. The wireless communication module transmits signals wirelessly with the wireless communication module in the simulated α, β plane radiation source, and wirelessly with the wireless communication module in the simulated α, β plane radiation source setting device. The simulated α, β plane radiation source further includes an infrared grid panel, which is composed of a rectangular substrate and several infrared emitting and receiving tubes. Several infrared emitting tubes are equally spaced along the edges of the rectangular substrate in the horizontal X-axis and the vertical Y-axis, and the same number and spacing of infrared receiving tubes are arranged in the opposite directions of these infrared emitting tubes. A set of horizontal infrared gratings and a set of vertical infrared gratings are constructed on the infrared grating panel. These two sets of gratings divide the rectangular substrate plane into several square infrared gratings of equal area. The simulated α and β surface contamination monitor also includes a positioning frame, which consists of a rectangular frame, a grid-like component, a light-blocking frame, and six columns. The rectangular frame has two layers, and the six columns are located at the four corners and the midpoint of the long side of each layer. The grid-like component is embedded in the lower rectangular frame, forming the support plane of the positioning frame. The six columns are fixed to the upper and lower rectangular frames, thus isolating the support plane of the positioning frame from the infrared grating panel plane and maintaining a distance between them. Within a range of 5mm±0.5mm or 10mm±0.5mm, the light-blocking frame is composed of four strips. The shape of the light-blocking frame is the same as the shape of the central opening of the grid component, and the area inside the light-blocking frame is the same as the area of ​​the central opening of the grid component. The light-blocking frame is located below the central opening of the grid component. The top plane of the light-blocking frame is in contact with the plane of the grid component, and the bottom plane of the light-blocking frame is in contact with the plane of the infrared grid panel. The detection sensitive area of ​​the simulated α and β surface pollution monitor is embedded in the central opening of the grid component of the positioning frame, and the detection plane of the monitor's sensitive area is on the same plane as the support plane of the positioning frame. The light-blocking frame and six columns together support the simulated α and β surface pollution monitor.

[0017] In the above technical solution, the horizontal length L of the rectangular substrate of the infrared grid panel is 100cm along the X-axis, and the vertical width W along the Y-axis is 80cm. 101 infrared emitting diodes are arranged along the X-axis edge, and 81 infrared emitting diodes are arranged along the Y-axis edge, with a spacing of 1cm between each infrared emitting diode. In the opposite direction of the infrared emitting diodes, the same number and spacing of infrared receiving diodes are arranged, dividing the infrared grid panel into 100×80=8000 square infrared grids of equal area, each grid having an area of ​​1cm×1cm=1cm. 2 .

[0018] To achieve the purpose of the invention, the present invention also provides a method for monitoring simulated α and β surface contamination, characterized by the following steps:

[0019] S1, construct a system including a simulated α and β surface contamination monitor, a simulated α and β planar radiation source, and a simulated α and β planar radiation source setting device. The simulated α and β surface contamination monitor consists of a single-chip computer, a display and alarm module, a wireless communication module, a power supply module, and a positioning structure. The simulated α and β planar radiation source consists of a single-chip computer, an infrared grid panel, a wireless communication module, and a power supply module. The simulated α and β planar radiation source setting device consists of a simulated α and β planar radiation source setting module, a computer, a wireless communication module, and a power supply module. The wireless communication module in the simulated α and β surface contamination monitor and the wireless communication module in the simulated α and β planar radiation source transmit signals wirelessly. The wireless communication module in the simulated α and β planar radiation source and the wireless communication module in the simulated α and β planar radiation source setting device also transmit signals wirelessly.

[0020] S2, In the device for setting up simulated α and β planar radiation sources, preset simulated α and β surface contamination intensity data are used. First, a grid layout diagram identical to the infrared grid panel in the simulated α and β planar radiation source is generated on the computer display screen of the simulation source setting device. The number of grids is 100 × 80 = 8000, and each grid represents an area of ​​1 cm × 1 cm = 1 cm². 2 The simulation of α and β surface contamination intensity data is set and displayed for each grid in the layout diagram. Then, using a special drawing tool, one or more α or β surface contamination distribution areas and center points of arbitrary shapes are manually drawn on the grid layout diagram. Finally, the α or β radiation intensity values ​​(Rmax, Rmin) of the center point and boundary are manually set.

[0021] S3 will send the simulated α and β surface contamination intensity data set in the simulated α and β plane radioactive source setting device to the wireless communication module in the simulated α and β plane radioactive source through the wireless communication module in the simulated α and β plane radioactive source setting device, and then send it to the single-chip computer in the simulated α and β plane radioactive source, and save it to the "simulated α plane source data storage area" and "simulated β plane source data storage area" respectively.

[0022] S4. After the simulated α and β plane radiation source is powered on, each infrared emitting tube of the infrared grid panel emits infrared rays simultaneously. The infrared receiving tubes in opposite directions can receive the infrared information of the other party in real time. The infrared rays emitted by the infrared emitting tubes intersect on the infrared grid panel plane to form 8000 1cm×1cm infrared grids that are invisible to the naked eye. Each grid corresponds to a simulated α and β surface contamination intensity data set by the simulated α and β plane radiation source setting device.

[0023] S5, in the simulated α and β surface contamination monitor, a software program for generating measurement values ​​of the simulated α and β monitor is written. This software program has two functions: First, it sets the background count of the simulated α and β surface contamination monitor. The background count is set with reference to the background value of the actual training monitor. The average value of the background value of the actual training monitor is taken, and an error range is set. Each background measurement value is randomly generated within the positive and negative error range of the average value. Second, the measurement data of the simulated α and β surface contamination monitor is randomly generated within the ±20% error range of the given values ​​of "simulated α plane source data" and "simulated β plane source data" transmitted from the simulated α and β plane radiation source wireless module.

[0024] S6, In the simulated α and β surface contamination monitor, by writing the α and β surface contamination monitor motion detection and alarm software program, the software program takes out the data from the 100 grids directly below the sensitive area of ​​the simulated α and β surface contamination monitor, averages it, adds the background average value, and then generates sound or alarm signals of different frequencies according to the magnitude of this value.

[0025] S7. A positioning frame is installed on the detection unit of the simulated α and β surface contamination monitor. This positioning frame ensures that the distance between the sensitive area plane of the detection unit of the simulated α and β surface contamination monitor and the infrared grid panel of the simulated α and β plane radiation source is 5 mm when measuring α surface contamination or 10 mm when measuring β surface contamination. It also ensures that the positioning frame, together with the simulated α and β surface contamination monitor, can move smoothly on the infrared grid panel of the simulated α and β plane radiation source. The light-blocking frame in the center of the positioning frame prevents the infrared rays emitted by the infrared emitting tube of the infrared grid panel from being received by the corresponding receiving tube. Thus, the simulated α and β surface contamination monitor... The infrared grid panel directly below the 10cm×10cm sensitive area of ​​the surface pollution monitor becomes the pollution area for this simulated monitoring. At this moment, the simulated α or β plane radiation source retrieves the simulated α or β intensity data of the pollution area from the storage area and transmits it to the simulated α or β surface pollution monitor through the wireless communication module. The simulated α or β surface pollution monitor then processes the received data and converts it into a display value of sound frequency and changes. For areas with higher pollution intensity, the sound frequency increases. At this time, the monitor stops moving and continues to measure for a period of time to obtain a stable measurement value. If the alarm threshold is exceeded, an alarm is triggered.

[0026] S8, when the simulated α and β surface contamination monitor and the positioning frame are moved, the relative positions between the simulated α and β surface contamination monitor and the positioning frame and the infrared grid panel are changed. The light-blocking frame of the positioning frame will block the other two sets of infrared rays, forming a new simulated contamination grid area. At this time, the simulated α and β planar radiation source will retrieve the simulated α or β intensity data corresponding to this simulated contamination grid area from the storage area and transmit it to the simulated α and β surface contamination monitor through the wireless communication module. The simulated α and β surface contamination monitor will then process the received data, convert it into a measurement value, and display or alarm it.

[0027] In the above technical solution, in step S2, the α or β radiation intensity values ​​(Rmax, Rmin) of the center point and boundary are manually set. This is done by calculating the radiation values ​​of all grids within the pollution distribution area using linear interpolation. Let the center point coordinates be (0,0), the grid coordinates be (x,y), and the radius of the circumcircle of the pollution distribution area be r. Then, the radiation intensity of each grid is calculated using formula (2): …………(2)

[0028] In the formula, R is the α or β radiation intensity of any grid, in Bq / cm². 2

[0029] r — radius of the circumcircle of the pollution distribution area, in cm;

[0030] R max —Maximum α or β radiation intensity at the center point, Bq / cm2 ;

[0031] R min —Intensity of α or β radiation on the outer circumference of the region, Bq / cm 2 ;

[0032] x — The position of the grid on the x-axis, in cm;

[0033] y — the position of the grid on the x-axis, in cm.

[0034] In the above technical solution, in step S2, the α or β radiation intensity values ​​(Rmax, Rmin) of the center point and boundary are manually set by a computer random generator first automatically generating one or more pollution distribution areas of arbitrary shape and the center point within the area, and then the computer automatically generates the data in each grid.

[0035] The advantages of this invention are that the simulated planar source and the measurement of the simulated planar source are realistic. The simulated planar source can be set as a wall, table, or ground. When the simulated surface pollution monitor is measuring, a positioning frame is used to isolate the detector surface from the simulated planar source. When α is measured, the distance between the detector surface and the simulated plane is set at 5mm, and when β is measured, it is set at 10mm. Trainees can have an immersive experience. Attached Figure Description

[0036] Figure 1 This is a diagram illustrating the configuration of the simulation α and β surface contamination monitoring training system of this invention.

[0037] Figure 2 This is a schematic diagram of an infrared grid panel used in the present invention to simulate α and β surface contamination sources.

[0038] Figure 3 This is a schematic diagram of the external shape of the positioning frame structure of the present invention.

[0039] Figure 4 These are three views of the positioning frame structure of the present invention.

[0040] Figure 5 This is a schematic diagram of raster contamination data settings.

[0041] Figure 6 It refers to the simulated α and β surface contamination areas set for the infrared grid panel, which are visible on the computer screen of the setting device.

[0042] Figure 7 These are simulated α and β surface contamination areas that can be measured on an infrared grid panel using a simulated surface contamination monitor.

[0043] In the attached diagrams above, 1 is a simulated α and β surface contamination monitor, 2 is a simulated α and β planar radiation source, 3 is a simulated α and β planar radiation source setting device, 11 is a single-chip computer, 12 is a display and alarm module, 13 is a wireless communication module, 14 is a power supply module, 15 is a positioning frame, 21 is a single-chip computer, 22 is an infrared grid panel, 23 is a wireless communication module, 24 is a power supply module, 31 is a simulated α and β planar radiation source setting module (computer), 32 is a wireless communication module, 33 is a power supply module, 101 is the upper frame of the rectangle, 102 is the lower frame of the rectangle, 103 is a grid structure, 104 is a light-blocking frame, and 105 is a column. Detailed Implementation

[0044] Example 1: This example simulates an α and β surface contamination monitoring training system as shown in the attached diagram. Figure 1 As shown.

[0045] The system consists of three parts: a simulated α and β surface contamination monitor 1, a simulated α and β plane radioactive source 2, and a simulated α and β plane radioactive source setting device 3.

[0046] The simulated α and β surface contamination monitor 1 consists of a single-chip computer 11, a display and alarm module 12, a wireless communication module 13, a power supply module 14, and a positioning frame 15. The simulated α and β planar radiation source 2 consists of a single-chip computer 21, an infrared grid panel 22, a wireless communication module 23, and a power supply module 24. The simulated α and β planar radiation source setting device 3 consists of a simulated α and β planar radiation source setting module (computer) 31, a wireless communication module 32, and a power supply module 33. The wireless communication module 13 in the simulated α and β surface contamination monitor transmits signals wirelessly to the wireless communication module 23 in the simulated α and β planar radiation source, and the wireless communication module 23 in the simulated α and β planar radiation source transmits signals wirelessly to the wireless communication module 32 in the simulated α and β planar radiation source setting device.

[0047] In this embodiment, the infrared grid panel used to simulate α and β surface contamination sources is shown in the attached figure. Figure 2 As shown, the infrared grid panel consists of a rectangular substrate, an infrared emitting diode, and an infrared receiving diode.

[0048] The rectangular substrate has a length of 100cm along the X-axis and 80cm along the Y-axis. Along the edge of the substrate, 101 infrared emitting diodes are arranged along the X-axis and 81 along the Y-axis, with a spacing of 1cm between each emitting diode. Opposite to the emitting diodes along the edge of the substrate, there are the same number and spacing of infrared receiving diodes. The area between the emitting and receiving diodes is divided by infrared light into 8000 equal-sized square infrared grids (100 × 80 = 8000), each grid having an area of ​​1cm × 1cm = 1 cm².2 . Figure 2 The solid-line frame in the diagram represents the infrared light-blocking frame installed at the center of the positioning frame. The four sides of this frame are perpendicular to both the infrared transceiver plane and the positioning frame plane. The frame has a side length of 11 cm and a height of 0.5 cm (when measuring α-surface contamination) or 1 cm (when measuring β-surface contamination), is made of metal, and has a thickness of 1 mm. When the positioning frame moves along the X or Y axis, this light-blocking frame simultaneously blocks the light emitted by 11 infrared emitters in each of the X and Y axes. Figure 2 In the diagram, the infrared light emitted by 11 infrared emitters (6th to 16th on the X-axis) and 11 infrared emitters (4th to 14th on the Y-axis) is blocked by a metal light-blocking frame. This means the infrared light from the 100 invisible infrared grids formed by their intersection on the X and Y planes is blocked by the metal light-blocking frame. The microcontroller can determine the specific location of these 100 infrared grids based on the numbers of the infrared receivers that did not receive information. Then, it retrieves the data corresponding to each grid from the storage area. The data numbers are as follows: Figure 2 The solid-line box indicates the data. Then, these one hundred data points are transmitted to the analog α and β surface contamination monitor via a wireless communication module.

[0049] In this embodiment, the structure of the positioning frame is as shown in the attached figure. Figure 3 As shown. The positioning frame consists of rectangular frames 101 and 102, a grid-like component 103, a light-blocking frame 104, and six columns 105. The rectangular frames are divided into upper and lower layers. Both the upper rectangular frame 101 and the lower rectangular frame 102 are made of strips with a width of 10mm and a thickness of 1mm. The grid-like component 103 is made of four plate-like strips with a width of 5mm and a thickness of 1mm. The grid-like component 103 is embedded in the lower rectangular frame 102 to form the supporting plane of the positioning frame. The columns 105 have a diameter of 8mm and a height of 15mm. After the lower rectangular frame 102 is fixed to the columns 105, the plane formed by the lower rectangular frame 102 and the grid-like component 103, i.e., the supporting plane of the positioning frame, is 5mm (when measuring α surface contamination) or 10mm from the bottom of the column 105. mm (when measuring β surface contamination), the six columns 105 isolate the positioning frame support plane from the radiation source plane (infrared grid panel) and keep the distance between the two planes within the range of 5mm ± 0.5mm (when measuring α surface contamination) or 10mm ± 0.5mm (when measuring β surface contamination). The part of the positioning frame above the support plane is used to fix the detector.

[0050] In this embodiment, the length and width of the detection sensitive area of ​​the simulated α and β surface contamination monitor are both 10 cm. The selected positioning frame's light-blocking frame 104 is also square in shape, with a side length of 11 cm. The light-blocking frame 104 is embedded in the central opening of the positioning frame's planar grid component 103. The light-blocking frame 104 is perpendicular to the plane of the positioning frame. The light-blocking frame 104 is 1 mm thick, and its height is the same as the positioning frame height, either 5 mm (when measuring α surface contamination) or 10 mm (when measuring β surface contamination). The light-blocking frame 104 can block 11 infrared LEDs in the X and Y directions each time, with a blocking width of 10 cm. See Appendix Figure 2 .

[0051] In this embodiment, the detection sensitive area of ​​the simulated α and β surface contamination monitor is embedded in the opening in the center of the positioning frame plane grid component 103, and the light-blocking frame 104 together with the six columns 105 supports the simulated α and β surface contamination monitor.

[0052] The training and monitoring method in this embodiment is as follows:

[0053] First, construct a system as described above, including a simulated α and β surface contamination monitor (hereinafter referred to as the simulated monitor), a simulated α and β plane radioactive source (hereinafter referred to as the simulated radioactive source), and a simulated α and β plane radioactive source setting device (hereinafter referred to as the simulated source setting device).

[0054] Second, in the simulation source setting device, preset the simulated α and β surface contamination intensity data. First, on the computer display screen of the simulation source setting device, generate and set a grid layout identical to the infrared grid panel in the simulated radiation source, with 100 × 80 = 8000 grids, each grid representing an area of ​​1 cm × 1 cm = 1 cm². 2 The system uses α and β simulated planar radiation units to set and display simulated α and β surface contamination intensity data for each grid. Next, using a dedicated drawing tool, one or more arbitrarily shaped α or β surface contamination distribution areas and their center points are manually drawn on the grid layout diagram displayed on the computer of the simulation source setting device. Alternatively, a dedicated spraying tool is used on the computer grid layout diagram to set the boundaries and intensity distribution of the α and β contamination areas. (See appendix.) Figure 6 The intensity baseline value is set by software. Next, the α or β radiation intensity values ​​(Rmax, Rmin) at the center point and boundary are manually set. This involves calculating the radiation values ​​of all grid cells within the pollution distribution area using linear interpolation. See Appendix. Figure 5 Let the center point coordinates be (0,0), the grid coordinates be (x,y), and the radius of the circumcircle of the pollution distribution area be r. Then, the radiation intensity of each grid can be calculated using formula (2):

[0055] …………(2)

[0056] In the formula, R is the α or β radiation intensity of any grid, in Bq / cm². 2

[0057] r — radius of the circumcircle of the pollution distribution area, in cm;

[0058] R max —Maximum α or β radiation intensity at the center point, Bq / cm 2 ;

[0059] R min —Intensity of α or β radiation on the outer circumference of the region, Bq / cm 2 ;

[0060] x — The position of the grid on the x-axis, in cm;

[0061] y — the position of the grid on the x-axis, in cm;

[0062] In addition, the simulated α and β surface contamination intensity data can also be automatically generated by a computer random generator to generate one or more contamination distribution areas of arbitrary shape and the center point within the area, and the computer can automatically generate the data in each grid.

[0063] Third, the simulated α and β surface contamination intensity data set in the simulated radioactive source setting device are sent to the wireless communication module in the simulated radioactive source through the wireless communication module in the simulated radioactive source setting device, and then sent to the single-chip computer of the simulated radioactive source, and saved to the "simulated α plane source data storage area" and "simulated β plane source data storage area" respectively.

[0064] Fourth, after the simulated radiation source is powered on, each infrared emitting tube of the infrared grid panel emits infrared rays simultaneously, and the infrared receiving tubes in the opposite direction can receive the infrared information in the opposite direction in real time. The infrared rays emitted by the infrared emitting tubes on the X and Y axes intersect on the X and Y planes to form 8,000 1cm×1cm infrared grids that are invisible to the naked eye. Each grid corresponds to a simulated α and β surface contamination intensity data set by the simulated radiation source setting device.

[0065] Fifth, in the simulated monitoring instrument, by writing a software program to generate measurement values ​​of the simulated α and β monitoring instruments, the following steps are taken: First, the background count of the simulated α and β surface pollution monitoring instrument is set. This background count is set with reference to the background value of the actual training monitoring instrument. The average value of the background value of the actual training monitoring instrument is taken, and an error range is set. Each background measurement value is randomly generated within the positive and negative error range of the average value. Second, the measurement data of the simulated monitoring instrument is generated. This measurement data is randomly generated within the ±20% error range of the given values ​​of the "simulated α plane source data" and "simulated β plane source data" transmitted from the simulated radiation source.

[0066] Sixth, in the simulation monitoring instrument, by writing a simulation α and β surface pollution monitoring instrument movement detection and alarm software program, the data in the 100 grids directly below the sensitive area of ​​the simulation monitoring instrument are taken out, averaged, and then added to the background average value, and then different frequencies of sound or alarm signals are generated according to the magnitude of this value.

[0067] Seventh, a positioning frame is installed in the detection section of the analog monitor. This positioning frame ensures that the distance between the sensitive area plane of the analog monitor's detection section and the infrared grid panel of the simulated radiation source is 5mm (when measuring α surface contamination) or 10mm (when measuring β surface contamination). It also ensures that the positioning frame, together with the analog monitor, can move smoothly on the infrared grid panel of the simulated radiation source. The light-blocking frame in the center of the positioning frame prevents the infrared rays emitted by the infrared emitting tube of the infrared grid panel of the simulated radiation source from being received by the receiving tube on the opposite side. Thus, the sensitive area of ​​the analog monitor's detection section (…) The infrared grid panel directly below the 10cm×10cm area becomes the contaminated area for this simulated monitoring. At this moment, the simulated radiation source retrieves the simulated α or β intensity data and simulated distribution data of the contaminated area from the storage area and transmits them to the simulation monitor via the wireless communication module. The simulation monitor then processes the received data and converts it into a display value of sound frequency and changes. For areas with higher contamination intensity, the sound frequency increases. At this time, the monitor stops moving and continues to measure for a period of time to obtain stable simulated measurement values. If the alarm threshold is exceeded, an alarm is triggered.

[0068] Eighth, when the simulated monitoring instrument and positioning frame are moved, thus changing their relative positions with the infrared grid panel, the light-blocking frame of the positioning frame will block another set of infrared rays, forming a new simulated contamination grid area. At this moment, the simulated radiation source will retrieve the simulated α or β intensity data corresponding to the newly formed simulated contamination grid area from its storage area and transmit it to the simulated monitoring instrument via the wireless communication module. The simulated monitoring instrument then processes the received data, converts it into simulated measurement values, and displays or alarms accordingly. As the simulated monitoring instrument and positioning frame continuously move and measure, they will continuously receive information from the simulated radiation source. The simulated radiation source continuously sends data to the simulated monitoring instrument at set time intervals. The simulated monitoring instrument averages the 100 data points received each time and adds the background average to obtain the radiation field intensity. Then, based on the radiation field intensity, it emits sounds and displays data at different frequencies; the greater the radiation field intensity, the higher the sound frequency, and vice versa.

[0069] The actual operation procedure for simulating α and β surface contamination monitoring in this embodiment is as follows:

[0070] First, the training instructors directly set the surface contamination level values, see Appendix. Figure 6 Since it is not the count rate, the surface contamination level can be directly given without substituting the α and β measurements into formula (1).

[0071] According to national standards, when measuring α-surface contamination with an α-surface contamination monitor, the positioning frame height is 0.5 cm; when measuring β-surface contamination, the positioning frame height is 1 cm. When measuring α-surface contamination, first place the simulated α / β surface contamination monitor on the 0.5 cm positioning frame, ensuring the instrument and frame are integrated. When measuring β-surface contamination, first place the simulated α / β surface contamination monitor on the 10 mm positioning frame, ensuring the instrument and frame are integrated. The measurement procedures for α and β surface contamination are the same. When measuring α and β surface contamination, measurements should be taken repeatedly along the X-axis or Y-axis according to the measurement requirements. No measurements should be missed; otherwise, the overall data for the contaminated area will not be obtained. When measuring with the monitor, the measurement time should be three times the instrument's response time. Generally, the response time of a surface contamination monitor is 3-4 seconds; in this embodiment, the measurement time for the simulated monitor is set to 10 seconds.

[0072] Turn on the instrument, press the α or β measurement key, read the instrument's background measurement value 5 or more times, record each data in the record table and store it in the analog monitor.

[0073] After the analog monitoring instrument is placed on the starting point of the analog planar source, the light-blocking frame of the positioning frame immediately blocks the infrared light emitted by the 11 infrared emitting tubes in the X and Y directions respectively. This prevents the 11 infrared receiving tubes with the same relative number from receiving the infrared light, forming 100 grids on the plane where the infrared light is blocked. The single-chip computer in the analog planar source instantly acquires this information, determines the specific code of these 100 grids, retrieves the information from each grid, and sends it to the analog α and β surface contamination monitor via the wireless communication module. The monitor processes and calculates this data to obtain the surface contamination level value. Then, based on the contamination level value plus the background value, it outputs the frequency of the alarm sound and the displayed data value according to the magnitude of the difference. The analog planar source continuously transmits data to the monitor at set time intervals. As the monitor moves slowly, the alarm sound density and values ​​may vary. When the alarm sound density or displayed value is high, the monitor stops moving, and the changes in the reading are observed. Once the reading stabilizes and no longer changes, the data is read, manually recorded, and stored, completing the measurement. Then the monitor is moved to the next measurement point, and the above process is repeated until the entire analog plane source is measured, at which point the measurement program terminates.

[0074] Since the recommended values ​​for surface emissivity response and planar efficiency differ for α and β, α and β radiation are measured separately in practice, and then the measured values ​​are substituted into formula (1) for calculation. Currently, a very small number of surface contamination monitoring instruments still provide monitoring results in count rate (cps), which requires converting the count rate (cps) of surface contamination monitoring into the contamination level (Bq / cm²). 2 If the surface emissivity response of the α and β surface contamination monitors (given by the instrument metrology department) and the efficiency of the standard planar source used to measure the surface emissivity response are known, then the surface contamination level (Bq / cm²) can be obtained by conversion using formula (1). 2 ).

Claims

1. A simulated α and β surface contamination monitoring and training system, comprising a simulated α and β surface contamination monitor, a simulated α and β planar radioactive source, and a simulated α and β planar radioactive source setting device, wherein the simulated α and β surface contamination monitor includes a single-chip computer, a display and alarm module, a wireless communication module, and a power supply module; the simulated α and β planar radioactive source includes a single-chip computer, a wireless communication module, and a power supply module; the simulated α and β planar radioactive source setting device includes a simulated α and β planar radioactive source setting module, a wireless communication module, and a power supply module; the wireless communication module in the simulated α and β surface contamination monitor and the wireless communication module in the simulated α and β planar radioactive source transmit signals wirelessly; and the wireless communication module in the simulated α and β planar radioactive source and the wireless communication module in the simulated α and β planar radioactive source setting device transmit signals wirelessly, characterized in that: The simulated α and β planar radiation source also includes an infrared grid panel. This infrared grid panel consists of a rectangular substrate and several infrared emitting and receiving tubes. Several infrared emitting tubes are evenly spaced along the edges of the rectangular substrate's horizontal X-axis and vertical Y-axis. At opposite directions of these emitting tubes, the same number and spacing of infrared receiving tubes are arranged, thus constructing a set of horizontal and a set of vertical infrared gratings on the infrared grid panel. These two sets of infrared gratings divide the rectangular substrate plane into several square infrared grids of equal area. The simulated α and β surface contamination monitor also includes a positioning frame. This positioning frame consists of a rectangular frame, a grid-like structure, a light-blocking frame, and six columns. The rectangular frame has two layers, and the six columns are located at the four corners and the midpoint of the long side of each layer. The grid-like structure is embedded within the lower rectangular frame, forming the support plane for the positioning frame. The six columns are fixed to the upper and lower rectangular frames, which isolates the positioning frame support plane from the infrared grid panel plane and keeps the distance between the positioning frame support plane and the infrared grid panel plane within the range of 5mm±0.5mm or 10mm±0.5mm. The light-blocking frame is formed by four strips, and the shape of the light-blocking frame is the same as the shape of the central opening of the grid component. The area inside the light-blocking frame is the same as the area of ​​the central opening of the grid component. The light-blocking frame is located below the central opening of the grid component. The top plane of the light-blocking frame is in contact with the plane of the grid component, and the bottom plane of the light-blocking frame is in contact with the plane of the infrared grid panel. The detection sensitive area of ​​the simulated α and β surface pollution monitor is embedded in the central opening of the grid component of the positioning frame, and the detection plane of the monitor's sensitive area is on the same plane as the positioning frame support plane. The light-blocking frame and the six columns together support the simulated α and β surface pollution monitor.

2. The simulated α and β surface contamination monitoring training system according to claim 1, characterized in that: The rectangular substrate of the infrared grid panel has a horizontal length L of 100cm along the X-axis and a vertical width W of 80cm along the Y-axis. 101 infrared emitting diodes are arranged along the X-axis edge and 81 along the Y-axis edge, with a spacing of 1cm between each emitting diode. Infrared receiving diodes of the same number and spacing are arranged opposite to the emitting diodes, dividing the infrared grid panel into 100 × 80 = 8000 square infrared grids of equal area, each grid having an area of ​​1cm × 1cm = 1cm. 2 .

3. A method for simulating α and β surface contamination monitoring, characterized in that: The monitoring method involves the following steps. S1, construct a system including a simulated α and β surface contamination monitor, a simulated α and β planar radiation source, and a simulated α and β planar radiation source setting device. The simulated α and β surface contamination monitor consists of a single-chip computer, a display and alarm module, a wireless communication module, a power supply module, and a positioning structure. The simulated α and β planar radiation source consists of a single-chip computer, an infrared grid panel, a wireless communication module, and a power supply module. The simulated α and β planar radiation source setting device consists of a simulated α and β planar radiation source setting module, a computer, a wireless communication module, and a power supply module. The wireless communication module in the simulated α and β surface contamination monitor and the wireless communication module in the simulated α and β planar radiation source transmit signals wirelessly. The wireless communication module in the simulated α and β planar radiation source and the wireless communication module in the simulated α and β planar radiation source setting device also transmit signals wirelessly. S2, In the device for setting up simulated α and β planar radiation sources, preset simulated α and β surface contamination intensity data are used. First, a grid layout diagram identical to the infrared grid panel in the simulated α and β planar radiation source is generated on the computer display screen of the simulation source setting device. The number of grids is 100 × 80 = 8000, and each grid represents an area of ​​1 cm × 1 cm = 1 cm². 2 The simulation of α and β surface contamination intensity data is set and displayed for each grid in the layout diagram. Then, using a special drawing tool, one or more α or β surface contamination distribution areas and center points of arbitrary shapes are manually drawn on the grid layout diagram. Finally, the α or β radiation intensity values ​​(Rmax, Rmin) of the center point and boundary are manually set. S3 will send the simulated α and β surface contamination intensity data set in the simulated α and β plane radioactive source setting device to the wireless communication module in the simulated α and β plane radioactive source through the wireless communication module in the simulated α and β plane radioactive source setting device, and then send it to the single-chip computer in the simulated α and β plane radioactive source, and save it to the "simulated α plane source data storage area" and "simulated β plane source data storage area" respectively. S4. After the simulated α and β plane radiation source is powered on, each infrared emitting tube of the infrared grid panel emits infrared rays simultaneously. The infrared receiving tubes in opposite directions can receive the infrared information of the other party in real time. The infrared rays emitted by the infrared emitting tubes intersect on the infrared grid panel plane to form 8000 1cm×1cm infrared grids that are invisible to the naked eye. Each grid corresponds to a simulated α and β surface contamination intensity data set by the simulated α and β plane radiation source setting device. S5, in the simulated α and β surface contamination monitor, a software program for generating measurement values ​​of the simulated α and β monitor is written. This software program has two aspects: First, it sets the background count of the simulated α and β surface contamination monitor. The background count is set with reference to the background value of the actual training monitor. The average value of the background value of the actual training monitor is taken, and an error range is set. Each background measurement value is randomly generated within the positive and negative error range of the average value. Second, the measurement data of the simulated α and β surface contamination monitor is randomly generated within the ±20% error range of the given values ​​of "simulated α plane source data" and "simulated β plane source data" transmitted from the simulated α and β plane radiation source wireless module. S6, In the simulated α and β surface contamination monitor, by writing the α and β surface contamination monitor motion detection and alarm software program, the software program takes out the data from the 100 grids directly below the sensitive area of ​​the simulated α and β surface contamination monitor, averages it, adds the background average value, and then generates sound or alarm signals of different frequencies according to the magnitude of this value. S7. A positioning frame is installed on the detection unit of the simulated α and β surface contamination monitor. This positioning frame ensures that the distance between the sensitive area plane of the detection unit of the simulated α and β surface contamination monitor and the infrared grid panel of the simulated α and β plane radiation source is 5 mm when measuring α surface contamination or 10 mm when measuring β surface contamination. It also ensures that the positioning frame, together with the simulated α and β surface contamination monitor, can move smoothly on the infrared grid panel of the simulated α and β plane radiation source. The light-blocking frame in the center of the positioning frame prevents the infrared rays emitted by the infrared emitting tube of the infrared grid panel from being received by the corresponding receiving tube. Thus, the simulated α and β surface contamination monitor... The infrared grid panel directly below the 10cm×10cm sensitive area of ​​the surface pollution monitor becomes the pollution area for this simulated monitoring. At this moment, the simulated α or β plane radiation source retrieves the simulated α or β intensity data of the pollution area from the storage area and transmits it to the simulated α or β surface pollution monitor through the wireless communication module. The simulated α or β surface pollution monitor then processes the received data and converts it into a display value of sound frequency and changes. For areas with higher pollution intensity, the sound frequency increases. At this time, the monitor stops moving and continues to measure for a period of time to obtain a stable measurement value. If the alarm threshold is exceeded, an alarm is triggered. S8, when the simulated α and β surface contamination monitor and the positioning frame are moved, the relative positions between the simulated α and β surface contamination monitor and the positioning frame and the infrared grid panel are changed. The light-blocking frame of the positioning frame will block the other two sets of infrared rays, forming a new simulated contamination grid area. At this time, the simulated α and β planar radiation source will retrieve the simulated α or β intensity data corresponding to this simulated contamination grid area from the storage area and transmit it to the simulated α and β surface contamination monitor through the wireless communication module. The simulated α and β surface contamination monitor will then process the received data, convert it into a measurement value, and display or alarm it.

4. The method for simulating α and β surface contamination monitoring according to claim 3, characterized in that: In step S2, the α or β radiation intensity values ​​(Rmax, Rmin) of the center point and boundary are manually set. This is done by calculating the radiation values ​​of all grids within the pollution distribution area using linear interpolation. Let the center point coordinates be (0,0), the grid coordinates be (x,y), and the radius of the circumcircle of the pollution distribution area be r. Then, the radiation intensity of each grid is calculated using formula (2): …………（2） In the formula, R is the α or β radiation intensity of any grid, in Bq / cm². 2 r — radius of the circumcircle of the pollution distribution area, in cm; R max —Maximum α or β radiation intensity at the center point, Bq / cm 2 ; R min —Intensity of α or β radiation on the outer circumference of the region, Bq / cm 2 ; x — The position of the grid on the x-axis, in cm; y — the position of the grid on the x-axis, in cm.

5. The method for simulating α and β surface contamination monitoring according to claim 3, characterized in that: In step S2, the α or β radiation intensity values ​​(Rmax, Rmin) of the center point and boundary are manually set. The computer random generator first automatically generates one or more pollution distribution areas of arbitrary shape and the center point within the area, and then the computer automatically generates the data in each grid.

Images