Electronic and electrical component testing method, device and related equipment

Abstract

The present disclosure provides a method, apparatus and related equipment for testing electronic and electrical components, relating to the field of electronic technologies. The specific implementation solution is as follows: determining first condensate climate simulation parameters according to the operating characteristic parameters and condensation condition parameters of the target type of electronic and electrical components; wherein, the maximum operating voltage of the target type of electronic and electrical components is less than or equal to a preset value, the operating characteristic parameters include operating temperature characteristic parameters and operating humidity characteristic parameters, and the condensation condition parameters include condensation temperature condition parameters and condensation humidity condition parameters; simulating a condensate climate in a simulation container according to the first condensate climate simulation parameters so as to perform a condensate climate test on a first electronic and electrical component placed in the simulation container, and the first electronic and electrical component belongs to the target type of electronic and electrical components.

Description

Technical Field

[0001] The present disclosure relates to the field of electronic technologies, and in particular, to a method and apparatus for testing electronic and electrical components, and related equipment. Background Art

[0002] As the degree of vehicle intelligence increases, there are more and more in-vehicle low-voltage electronic and electrical components. For example, in-vehicle radars, in-vehicle cameras, in-vehicle instruments, in-vehicle displays, Electronic Toll Collection (ETC), etc. Among them, more and more in-vehicle low-voltage electronic and electrical components adopt a water-cooled cooling method. For example, a water-cooled autonomous driving domain controller. However, this water-cooled cooling method is likely to make the occurrence of condensate climate more serious. Therefore, it is often necessary to conduct a condensate climate test on in-vehicle low-voltage electronic and electrical components to verify the reliability of in-vehicle low-voltage electronic and electrical components.

[0003] Currently, there is only a condensate climate test standard for in-vehicle high-voltage electronic and electrical components. For example, if the ISO19453-4 standard is used to conduct a condensate climate test on in-vehicle low-voltage electronic and electrical components based on the existing condensate climate test standard for in-vehicle high-voltage electronic and electrical components, the test effect is poor, and it is often difficult to accurately evaluate the anti-condensate climate ability of in-vehicle low-voltage electronic and electrical components. Summary of the Invention

[0004] The present disclosure provides a method and apparatus for testing electronic and electrical components, and related equipment.

[0005] According to a first aspect of the present disclosure, there is provided a method for testing electronic and electrical components, including:

[0006] Determining first condensate climate simulation parameters according to the working characteristic parameters and condensate condition parameters of the target type of electronic and electrical components; wherein, the maximum working voltage of the target type of electronic and electrical components is less than or equal to a preset value, the working characteristic parameters include working temperature characteristic parameters and working humidity characteristic parameters, and the condensate condition parameters include condensate temperature condition parameters and condensate humidity condition parameters;

[0007] Simulating a condensate climate in a simulation container according to the first condensate climate simulation parameters to conduct a condensate climate test on a first electronic and electrical component placed in the simulation container, where the first electronic and electrical component belongs to the target type of electronic and electrical components.

[0008] According to a second aspect of the present disclosure, there is provided an apparatus for testing electronic and electrical components, including:

[0009] A determination module, configured to determine first condensate climate simulation parameters according to operating characteristic parameters and condensation condition parameters of an electronic and electrical component of a target type; wherein, a maximum operating voltage of the electronic and electrical component of the target type is less than or equal to a preset value, the operating characteristic parameters include operating temperature characteristic parameters and operating humidity characteristic parameters, and the condensation condition parameters include condensation temperature condition parameters and condensation humidity condition parameters;

[0010] A testing module, configured to simulate a condensate climate in a simulation container according to the first condensate climate simulation parameters, so as to perform a condensate climate test on a first electronic and electrical component placed in the simulation container, where the first electronic and electrical component belongs to the electronic and electrical component of the target type.

[0011] According to a third aspect of the present disclosure, there is provided an electronic device, including:

[0012] At least one processor; and

[0013] A memory communicatively connected to the at least one processor; wherein,

[0014] The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor, so that the at least one processor can execute the method of the first aspect.

[0015] According to a fourth aspect of the present disclosure, there is provided a non-transitory computer-readable storage medium storing computer instructions, and the computer instructions are used to cause a computer to execute the method of the first aspect.

[0016] According to a fifth aspect of the present disclosure, there is provided a computer program product, including a computer program, and the computer program implements the method of the first aspect when executed by a processor.

[0017] According to the technology of the present disclosure, first condensate climate simulation parameters are determined according to operating characteristic parameters and condensation condition parameters of an electronic and electrical component of a target type, and a condensate climate is simulated in a simulation container according to the determined first condensate climate simulation parameters to perform a condensate climate test on a first electronic and electrical component placed in the simulation container. Since the operating characteristic parameters of the electronic and electrical component of the target type are considered when determining the condensate climate simulation parameters, the determined condensate climate simulation parameters can be made more suitable for the condensate climate test requirements of the electronic and electrical components of the target type, thereby improving the condensate climate test effect of the electronic and electrical components of the target type, and further more accurately evaluating the anti-condensate climate ability of the electronic and electrical components of the target type.

[0018] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present disclosure, nor is it used to limit the scope of the present disclosure. Other features of the present disclosure will become easily understood through the following description. Description of the Drawings

[0019] The drawings are used to better understand the present solution and do not constitute a limitation to the present disclosure. Among them:

[0020] Figure 1 is a flowchart of the method for testing electronic and electrical components provided by the present disclosure;

[0021] Figure 2 is a schematic diagram of the temperature and humidity change curve of the condensate climate test provided by the present disclosure;

[0022] Figure 3 is a structural diagram of the electronic and electrical component test device provided by the present disclosure;

[0023] Figure 4 is a structural diagram of the electronic device provided by the present disclosure. Detailed Embodiments

[0024] The following describes exemplary embodiments of the present disclosure with reference to the drawings. Various details of the embodiments of the present disclosure are included to facilitate understanding, and they should be considered merely exemplary. Therefore, those of ordinary skill in the art should recognize that various changes and modifications can be made to the embodiments described herein without departing from the scope and spirit of the present disclosure. Similarly, descriptions of well-known functions and structures are omitted below for clarity and conciseness.

[0025] As Figure 1 shown, the present disclosure provides a method for testing electronic and electrical components, including the following steps:

[0026] Step 101: Determine first condensate climate simulation parameters according to the working characteristic parameters and condensate condition parameters of the target type of electronic and electrical components; wherein, the maximum working voltage of the target type of electronic and electrical components is less than or equal to a preset value, the working characteristic parameters include working temperature characteristic parameters and working humidity characteristic parameters, and the condensate condition parameters include condensate temperature condition parameters and condensate humidity condition parameters;

[0027] Step 102: Simulate a condensate climate in a simulation container according to the first condensate climate simulation parameters to perform a condensate climate test on a first electronic and electrical component placed in the simulation container, and the first electronic and electrical component belongs to the target type of electronic and electrical components.

[0028] The maximum operating voltage of the above-mentioned target type of electronic and electrical components is less than or equal to a preset value, where the preset value can be reasonably set according to actual requirements. For example, 60V, 30V, 15V, 10V, or 5V, etc. Optionally, the maximum operating voltage of the above-mentioned target type of electronic and electrical components is less than or equal to 30Vac, or the maximum operating voltage of the above-mentioned target type of electronic and electrical components is less than or equal to 60Vdc, where 30Vac represents an alternating voltage of 30V, and 60Vdc represents a direct current voltage of 60V. Exemplarily, the above-mentioned target type of electronic and electrical components may include, but are not limited to, vehicle-mounted radars, vehicle-mounted cameras, vehicle-mounted instruments, vehicle-mounted switches, vehicle-mounted displays, ETCs, and vehicle-mounted controllers, etc. It should be noted that in this embodiment, the above-mentioned target type of electronic and electrical components may also be referred to as low-voltage electronic and electrical components.

[0029] The above-mentioned operating temperature characteristic parameters may include, but are not limited to, at least one of the operating temperature range of the target type of electronic and electrical components, the storage temperature range of the target type of electronic and electrical components, and the temperature range of the working environment where the target type of electronic and electrical components are located, etc.

[0030] Optionally, the operating temperature range of the above-mentioned target type of electronic and electrical components can be determined according to the operating temperature ranges of various electronic and electrical components belonging to the above-mentioned target type of electronic and electrical components (for example, vehicle-mounted radars, vehicle-mounted cameras, vehicle-mounted instruments, etc.). For example, the maximum temperature value and the minimum temperature value in the operating temperature ranges of the above-mentioned various electronic and electrical components can be statistically calculated as the operating temperature range of the above-mentioned target type of electronic and electrical components, or the average value of the maximum temperature values and the average value of the minimum temperature values belonging to the operating temperature ranges of the above-mentioned various electronic and electrical components can be statistically calculated as the operating temperature range of the above-mentioned target type of electronic and electrical components, and so on. Exemplarily, the operating temperature range of the above-mentioned target type of electronic and electrical components can generally be -40°C to 80°C, or -20°C to 65°C, or -40°C to 140°C, etc.

[0031] Optionally, the storage temperature range of the above-mentioned target type of electronic and electrical components can be determined according to the storage temperature ranges of various electronic and electrical components belonging to the above-mentioned target type of electronic and electrical components. For example, the maximum temperature value and the minimum temperature value in the storage temperature ranges of the above-mentioned various electronic and electrical components can be statistically calculated as the storage temperature range of the above-mentioned target type of electronic and electrical components, or the average value of the maximum temperature values and the average value of the minimum temperature values belonging to the storage temperature ranges of the above-mentioned various electronic and electrical components can be statistically calculated as the storage temperature range of the above-mentioned target type of electronic and electrical components, and so on. Exemplarily, the storage temperature range of the above-mentioned target type of electronic and electrical components can generally be -40°C to 80°C.

[0032] Optionally, the temperature range of the working environment of the above-mentioned target type of electronic and electrical components can be determined according to the temperature ranges of the working environments of various electronic and electrical components belonging to the above-mentioned target type of electronic and electrical components. For example, the maximum temperature value and the minimum temperature value in the temperature ranges of the working environments of the above-mentioned various electronic and electrical components can be counted as the temperature range of the working environment of the above-mentioned target type of electronic and electrical components, or the average value of the maximum temperature values and the average value of the minimum temperature values belonging to the temperature ranges of the working environments of the above-mentioned various electronic and electrical components can be counted as the temperature range of the working environment of the above-mentioned target type of electronic and electrical components, and so on. Exemplarily, the temperature range of the working environment of the above-mentioned target type of electronic and electrical components can generally be -40°C to 80°C, or -40°C to 140°C, etc.

[0033] The above-mentioned working humidity characteristic parameters can include, but are not limited to, the humidity range of the working environment of the target type of electronic and electrical components, etc. Optionally, the humidity range of the working environment of the above-mentioned target type of electronic and electrical components can be determined according to the humidity ranges of the working environments of various electronic and electrical components belonging to the above-mentioned target type of electronic and electrical components. For example, the maximum humidity value and the minimum humidity value in the humidity ranges of the working environments of the above-mentioned various electronic and electrical components can be counted as the humidity range of the working environment of the above-mentioned target type of electronic and electrical components, or the average value of the maximum humidity values and the average value of the minimum humidity values belonging to the humidity ranges of the working environments of the above-mentioned various electronic and electrical components can be counted as the humidity range of the working environment of the above-mentioned target type of electronic and electrical components, and so on. Exemplarily, the maximum humidity of the working environment of the above-mentioned target type of electronic and electrical components can reach 95%, that is, the humidity range of the working environment of the above-mentioned target type of electronic and electrical components is generally 0% to 95%.

[0034] The above-mentioned condensation temperature condition parameter refers to the temperature condition parameter at which condensed water can be generated. For example, it can include the condensation temperature range, that is, the lowest temperature value and the highest temperature value at which condensed water can be generated. It should be noted that generally, the dew condensation temperature of water in the environment is around 10°C. Below 10°C, the humidity contained in the air can be almost ignored, and thus condensed water cannot be generated; while above 75°C, the evaporation effect is greater than the condensation effect, which is also not conducive to the accumulation of condensed water. Therefore, in some preferred embodiments, the above-mentioned condensation temperature range can be 10°C to 75°C. It can be understood that in some embodiments, the maximum temperature value of the above-mentioned condensation temperature range can also be set to be greater than 75°C.

[0035] The above-mentioned condensation humidity condition parameters may refer to the humidity condition parameters for generating condensed water. For example, they may include the condensation humidity range, that is, the lowest humidity value and the highest humidity value at which condensed water can be generated. In practical applications, condensed water may be generated when the humidity value is greater than 0%, and generally, the greater the humidity value at the same temperature, the greater the flow rate of the generated condensed water. Therefore, the above-mentioned condensation humidity range may be from 0% to 100%.

[0036] The above-mentioned first condensed water climate simulation parameters may include at least some of the parameters related to simulating the condensed water climate. For example, the temperature value and humidity value in the heating stage, the temperature value and humidity value in the high-temperature and high-humidity stage, the temperature value and humidity value in the cooling stage, etc.

[0037] The above-mentioned first electronic and electrical component may be any electronic and electrical component belonging to the target type of electronic and electrical components, that is, any low-voltage electronic and electrical component. For example, vehicle-mounted radar, vehicle-mounted camera, vehicle-mounted instrument, vehicle-mounted switch, vehicle-mounted display screen, ETC, or vehicle-mounted controller, etc.

[0038] It should be noted that compared with high-voltage electronic and electrical components (such as vehicle-mounted motors, vehicle-mounted batteries, etc.), the working temperature change range of low-voltage electronic and electrical components is larger. For example, for a vehicle-mounted battery, when its working temperature is too high, it will be cooled by the water-cooling liquid, and when the temperature is low in winter, it will be heated first and then work, while low-voltage electronic and electrical components generally do not have corresponding temperature treatment methods. In addition, compared with high-voltage electronic and electrical components, low-voltage electronic and electrical components are more likely to be in a higher temperature and higher humidity environment for a long time. For example, in summer when the temperature is high, the working environment of high-voltage electronic and electrical components is often the same as the outdoor atmospheric environment, and the environmental temperature and humidity are generally not too large, while low-voltage electronic and electrical components are often located in a relatively enclosed environment in the cabin, and it is not easy to dissipate heat and moisture, so the environmental temperature and humidity are generally large.

[0039] Therefore, determining the first condensed water climate simulation parameters based on the working characteristic parameters of low-voltage electronic and electrical components in this embodiment can better meet the condensed water climate test requirements of low-voltage electronic and electrical components. For example, the temperature range in the condensed water climate test process of low-voltage electronic and electrical components can be designed to be larger, and the temperature value and humidity value in the high-temperature and high-humidity stage in the condensed water climate test process of low-voltage electronic and electrical components can be designed to be larger, so as to more truly reflect the actual working conditions of low-voltage electronic and electrical components. It can be understood that the generation of condensed water is often restricted by temperature and humidity conditions. Therefore, in the process of determining the first condensed water climate simulation parameters in this embodiment, in addition to considering the working characteristic parameters of low-voltage electronic and electrical components, the above-mentioned condensation condition parameters also need to be considered.

[0040] In addition, it should be noted that the prior art often uses an accelerated method to conduct a condensate climate experiment, so as to verify and evaluate the long-term use of electronic and electrical components in a relatively short experimental time. Therefore, optionally, in the process of determining the first condensate climate simulation parameters, this embodiment can often also consider accelerating relevant factors. The specific implementation method of the acceleration method for the condensate climate experiment is not limited in this embodiment. For example, reference can be made to the implementation method of the acceleration method in the prior art.

[0041] Optionally, in the process of determining the first condensate climate simulation parameters, this embodiment can also consider the second condensate climate simulation parameters. Among them, the second condensate climate simulation parameters can include the condensate climate simulation parameters used in multiple historical condensate climate tests on the target type of electronic and electrical components. For example, some historical condensate climate simulation parameters used in condensate climate tests on the target type of electronic and electrical components can be collected, and the collected condensate climate simulation parameters can be statistically analyzed. For example, parameters such as temperature values, humidity values, and the duration of each test stage (such as the heating stage, high-temperature and high-humidity stage, and cooling stage, etc.) of the condensate climate test can be statistically analyzed.

[0042] Specifically, after obtaining the above first condensate climate simulation parameters, the condensate climate can be simulated in a simulation container based on the above first condensate climate simulation parameters. For example, the temperature and humidity in the simulation container can be controlled according to the above first condensate climate simulation parameters to simulate the heating stage, high-temperature and high-humidity stage, and cooling stage, etc. that are prone to generating condensate. Among them, the above simulation container can be any container that can control parameters such as temperature and humidity, and this embodiment does not limit this. It should be noted that in the process of simulating the condensate climate in the simulation container based on the above first condensate climate simulation parameters, the function and / or performance of the first electronic and electrical component placed in the simulation container can be detected to detect the resistance of the first electronic and electrical component to the condensate climate. For example, for a vehicle-mounted controller, its communication function can be detected to see if it is normal.

[0043] The electronic and electrical component testing method provided by the embodiments of the present disclosure determines the first condensate climate simulation parameters according to the working characteristic parameters and condensate condition parameters of the target type of electronic and electrical components, and simulates the condensate climate in a simulation container according to the determined first condensate climate simulation parameters to conduct a condensate climate test on the first electronic and electrical component placed in the simulation container. Since the working characteristic parameters of the target type of electronic and electrical components are considered when determining the condensate climate simulation parameters, the determined condensate climate simulation parameters can be more in line with the condensate climate test requirements of the target type of electronics, thereby improving the condensate climate test effect of the target type of electronic and electrical components, and further more accurately evaluating the anti-condensate climate ability of the target type of electronic and electrical components.

[0044] Optionally, the first condensate climate simulation parameters include a first temperature value, a first humidity value, a second temperature value, a second humidity value, and a third temperature value;

[0045] Simulating a condensate climate in a simulation container according to the condensate climate simulation parameters includes:

[0046] Repeating a first operation according to a preset number of cycles;

[0047] Wherein, the first operation includes the following steps:

[0048] Controlling the temperature in the simulation container to the first temperature value and controlling the humidity in the simulation container to the first humidity value;

[0049] Maintaining the temperature in the simulation container at the first temperature value and controlling the humidity in the simulation container to change from the first humidity value to the second humidity value within a first duration starting from a first time point; wherein, the first time point is the start time point when the temperature in the simulation container is controlled to the first temperature value and the humidity in the simulation container is controlled to the first humidity value;

[0050] Controlling the temperature in the simulation container to increase from the first temperature value to the second temperature value and maintaining the humidity in the simulation container at the second humidity value within a second duration starting from a second time point; wherein, the second time point is the time point after the first duration from the first time point;

[0051] Maintaining the temperature in the simulation container at the second temperature value and maintaining the humidity in the simulation container at the second humidity value within a third duration starting from a third time point; wherein, the third time point is the time point after the second duration from the second time point;

[0052] Controlling the temperature in the simulation container to decrease from the second temperature value to the third temperature value at a preset cooling rate and canceling the humidity control in the simulation container within a fourth duration starting from a fourth time point; wherein, the fourth time point is the time point after the third duration from the third time point.

[0053] In this embodiment, the above first temperature value, first humidity value, second temperature value, second humidity value, and third temperature value can be determined according to the operating characteristic parameters and condensation condition parameters of the target type of electronic and electrical components. For example, the above first temperature value, second temperature value, and third temperature value can be determined according to the operating temperature range and condensation temperature range of the target type of electronic and electrical components, and the above first humidity value and the above second humidity value can be determined according to the condensation humidity range and the humidity range of the working environment where the target type of electronic and electrical components are located.

[0054] The above preset number of cycles can be reasonably set according to actual needs. For example, the above preset number of cycles can be 5, 6, or 7, etc. Optionally, the above preset number of cycles can be set according to the number of cycles in the historical condensation water climate test for the target type of electronic and electrical components.

[0055] The above first duration, second duration, and third duration can also be reasonably set according to actual needs, and this embodiment does not limit this. It should be noted that the above first duration should at least ensure that the temperature in the simulation container reaches a steady state. The above second duration should be set smaller to ensure that the temperature can change rapidly to produce condensation. The above third duration should at least ensure that the temperature in the simulation container reaches a steady state and a certain amount of condensed water can be accumulated for the cooling stage.

[0056] Optionally, the above first duration, second duration, and third duration can be set according to the durations of each test stage in the historical condensation water climate test for the target type of electronic and electrical components. For example, if it is set that the above first duration is greater than or equal to 1 hour during the historical condensation water climate test for the target type of electronic and electrical components and the temperature in the simulation container can reach a steady state, then the above first duration can be set to be greater than or equal to 1 hour; if it is set that the above second duration is less than or equal to 5 minutes during the historical condensation water climate test for the target type of electronic and electrical components and condensation can be produced, then the above second duration can be set to be less than or equal to 5 minutes; if it is set that the third duration is greater than or equal to 3 hours during the historical condensation water climate test for the target type of electronic and electrical components and the temperature in the simulation container can reach a steady state and a certain amount of condensed water can be accumulated, then the third duration can be set to be greater than or equal to 3 hours.

[0057] The above preset cooling rate can be reasonably set according to actual needs, and this embodiment does not limit this. It should be noted that the above preset cooling rate can be set smaller to prevent the influence on the performance and functions of the first electronic and electrical component due to rapid temperature change. For example, the above preset cooling rate can be 1 °C / min, that is, it drops 1 °C per minute.

[0058] Based on the above-mentioned first condensate climate simulation parameters, the embodiments of the present disclosure simulate the heating stage, the high-temperature and high-humidity stage, and the cooling stage respectively, and can comprehensively simulate various environments where condensate appears, so as to fully verify the ability of the first electronic and electrical component to resist various environments that can generate condensate. By reducing the temperature in the simulation container at a preset cooling rate during the cooling stage, compared with the natural cooling method in the prior art, the influence of rapid temperature change on the performance and function of the first electronic and electrical component can be reduced, and further the influence on the condensate climate test effect of the first electronic and electrical component can be reduced. In addition, the implementation of the temperature and humidity change in this embodiment has relatively low requirements for the simulation container, and a special simulation container does not need to be developed for testing.

[0059] Optionally, the operating temperature characteristic parameter includes a first temperature range, and the first temperature range is determined according to at least one of the operating temperature range of the target type of electronic and electrical component, the storage temperature range of the target type of electronic and electrical component, and the temperature range of the working environment where the target type of electronic and electrical component is located; the operating humidity characteristic parameter includes a first humidity range, and the first humidity range is the humidity range of the working environment where the target type of electronic and electrical component is located; the condensate temperature condition parameter includes a condensate temperature range, and the condensate humidity condition parameter includes a condensate humidity range;

[0060] The first temperature value is determined according to a fourth temperature value, and the fourth temperature value is the temperature value in the condensate temperature range with the smallest difference from the minimum temperature value of the first temperature range; and / or

[0061] The second temperature value is determined according to a fifth temperature value, and the fifth temperature value is the temperature value in the condensate temperature range with the smallest difference from the maximum temperature value of the first temperature range; and / or

[0062] The third temperature value is determined according to the first temperature value or the fourth temperature value; and / or

[0063] The first humidity value is the humidity value in the condensate humidity range that is greater than or equal to a preset humidity value; and / or

[0064] The second humidity value is determined according to a third humidity value, and the third humidity value is the humidity value in the condensate humidity range with the smallest difference from the maximum humidity value of the first humidity range.

[0065] In this embodiment, the above-mentioned first temperature range is determined according to at least one of the operating temperature range of the target type of electronic and electrical components, the storage temperature range of the target type of electronic and electrical components, and the temperature range of the working environment where the target type of electronic and electrical components are located. For example, the above-mentioned first temperature range is the operating temperature range of the target type of electronic and electrical components, or the storage temperature range of the target type of electronic and electrical components, or the temperature range of the working environment where the target type of electronic and electrical components are located; or, the above-mentioned first temperature range is the temperature range composed of the maximum temperature value and the minimum temperature value of at least two of the operating temperature range of the target type of electronic and electrical components, the storage temperature range of the target type of electronic and electrical components, and the temperature range of the working environment where the target type of electronic and electrical components are located, or the temperature range composed of the average value of all the maximum temperature values and the average value of all the minimum temperature values of at least two of the temperature range of the working environment where the target type of electronic and electrical components are located.

[0066] The above-mentioned first temperature value is determined according to the fourth temperature value. For example, the above-mentioned first temperature value can be the above-mentioned fourth temperature value, or the value range of the above-mentioned first temperature value can be between the above-mentioned fourth temperature value - the first margin value and the above-mentioned fourth temperature value + the first margin value. Among them, the above-mentioned first margin value can be reasonably set according to actual needs. For example, the above-mentioned first margin value can be 1°C, 2°C, 3°C, etc.

[0067] The above-mentioned second temperature value is determined according to the fifth temperature value. For example, the above-mentioned second temperature value can be the above-mentioned fifth temperature value, or the value range of the above-mentioned second temperature value can be between the above-mentioned fifth temperature value - the second margin value and the above-mentioned fifth temperature value + the second margin value. Among them, the above-mentioned second margin value can be reasonably set according to actual needs. For example, the above-mentioned second margin value can be 1°C, 2°C, 3°C, etc.

[0068] The above-mentioned third temperature value can be equal to the above-mentioned first temperature value, or can be determined according to the fourth temperature value. For example, the value range of the above-mentioned first temperature value can be between the above-mentioned fourth temperature value - the first margin value and the above-mentioned fourth temperature value + the first margin value.

[0069] It should be noted that in this embodiment, the first temperature value is determined according to the temperature value with the smallest difference from the minimum temperature value of the first temperature range in the condensation temperature range, the second temperature value is determined according to the temperature value with the smallest difference from the maximum temperature value of the first temperature range in the condensation temperature range, and the third temperature value is determined according to the first temperature value or the temperature value with the smallest difference from the minimum temperature value of the first temperature range in the condensation temperature range. In this way, while ensuring that the first temperature value, the second temperature value, and the third temperature value are within the condensation temperature range, the temperature during the test process can cover the temperature values within the above-mentioned first temperature range to a greater extent, so that the temperature requirements for the condensation water climate test of the target type of electronics can be more closely met.

[0070] The above-mentioned preset humidity value can be reasonably set according to actual needs. For example, it can be 30%, 40%, or 50%, etc. In actual situations, if the starting humidity is too low, it is not only not conducive to forming a condensation climate, but also the rising time of the too low starting humidity is relatively long, which is not conducive to reducing the test duration and may cause waste of resources. By setting the above-mentioned first humidity value to be greater than or equal to the above-mentioned preset humidity value, it is beneficial to reduce the test time. Optionally, the above-mentioned first humidity value can be the humidity value in the condensation humidity range that is greater than or equal to the preset humidity value and less than or equal to the second humidity value.

[0071] The above-mentioned second humidity value is determined according to the third humidity value. For example, the above-mentioned second humidity value can be the third humidity value, or the value range of the above-mentioned second humidity value can be between the third humidity value - the third margin value and the third humidity value + the third margin value, where the above-mentioned third margin value can be reasonably set according to actual needs. For example, the above-mentioned third margin value can be 4%, 5%, or 6%, etc.

[0072] It should be noted that in this embodiment, the above-mentioned first humidity value is the humidity value in the condensation humidity range that is greater than or equal to the preset humidity value, which is beneficial to reducing the test time. The above-mentioned second humidity value is determined according to the maximum humidity value of the first humidity range and the maximum humidity value of the condensation humidity range. In this way, while being more in line with the humidity environment in which the target type of electronics actually operates, it can provide sufficient humidity sources for the high-temperature and high-humidity stage.

[0073] Optionally, the second humidity value is determined according to the third humidity value and the fourth humidity value, and the fourth humidity value is determined according to the highest humidity value used in the historical N times of damp heat tests on the target type of electronic and electrical components, where N is a positive integer.

[0074] In this embodiment, the maximum humidity values used in multiple historical damp heat tests on target type electronic and electrical components can be collected, and the collected maximum humidity values used in historical damp heat tests on target type electronic and electrical components can be statistically analyzed. For example, the humidity value with the highest frequency of occurrence among the maximum humidity values used in historical damp heat tests on target type electronic and electrical components can be statistically analyzed, or the average value of the maximum humidity values used in historical damp heat tests on target type electronic and electrical components can be statistically analyzed, etc. It should be noted that the specific process of the above-mentioned damp heat test can refer to the prior art, and this embodiment does not limit it. The above-mentioned second humidity value is determined according to the third humidity value and the fourth humidity value. For example, the above-mentioned second humidity value can be the average value, larger value, or smaller value of the above-mentioned third humidity value and the fourth humidity value, or the second humidity value can be the fourth humidity value when the difference between the above-mentioned third humidity value and the fourth humidity value is less than a preset difference. Among them, the above-mentioned preset difference can be reasonably set according to actual needs, such as 5% or 10%, etc.

[0075] In actual situations, the determination of the above-mentioned second humidity value not only needs to consider providing sufficient humidity sources for the high-temperature and high-humidity stage, but also needs to consider the acceleration method. Specifically, although the test purposes of the damp heat test and the condensed water climate test are different, their test environments and test processes are very similar, and both are tested through acceleration methods. Since the damp heat test is already relatively mature, determining the second humidity value according to the third humidity value and the fourth humidity value can not only ensure providing sufficient humidity sources for the high-temperature and high-humidity stage, but also make the severity of the accelerated test more reasonable.

[0076] Optionally, the first temperature range is -40°C to 80°C, the first humidity range is 0% to 95%, the condensation temperature range is 10°C to 75°C, the condensation humidity range is 0% to 100%, the fourth humidity value is 93%, and the preset humidity value is 50%;

[0077] The value range of the first temperature value is 8°C to 12°C; and / or

[0078] The value range of the first humidity value is 50% to 98%; and / or

[0079] The value range of the second temperature value is 73°C to 77°C; and / or

[0080] The value range of the second humidity value is 88% to 98%; and / or

[0081] The value range of the third temperature value is 8°C to 12°C.

[0082] In this embodiment, the fourth temperature value is the temperature value in the condensation temperature range with the smallest difference from the minimum temperature value of the first temperature range, that is, the fourth temperature value is 10°C. The value range of the first temperature value is from 10°C - 2°C to 10°C + 2°C, that is, the value range of the first temperature value is 8°C to 12°C. It should be noted that since the humidity contained in the air below 10°C can be almost ignored and no condensed water can be generated, by setting the value range of the first temperature value to 8°C to 12°C in this embodiment, it is not only beneficial to the generation of condensed water, but also beneficial to quickly rising to the second temperature value, thereby shortening the test time and saving resources.

[0083] The fifth temperature value is the temperature value in the condensation temperature range with the smallest difference from the maximum temperature value of the first temperature range, that is, the fifth temperature value is 75°C. The value range of the second temperature value is from 75°C - 2°C to 75°C + 2°C, that is, the value range of the second temperature value is 73°C to 77°C. It should be noted that by setting the value range of the second temperature value to 73°C to 77°C in this embodiment, it can not only ensure that the second temperature value is within the condensation temperature range, but also make the temperature in the test process cover the temperature values in the first temperature range to the greatest extent.

[0084] The third temperature value is equal to the first temperature value, that is, the value range of the third temperature value is also 8°C to 12°C, which is beneficial to starting the next test cycle.

[0085] The first humidity value can be the humidity value in the condensation humidity range that is greater than or equal to the preset humidity value and less than or equal to the second humidity value, that is, the value range of the first humidity value is 50% to 98%. In some preferred embodiments, considering that too low starting humidity is not conducive to forming a condensation climate and the rising time of too low starting humidity is relatively long, which is not conducive to reasonably reducing the test duration and resulting in waste of resources, while too high starting humidity will cause large fluctuations in humidity control and be difficult to control, and the absolute humidity content at 10°C is relatively low. No matter how large the relative humidity change is, its absolute humidity content is relatively low. In this embodiment, the starting humidity can be set to 50%, which is beneficial to smoothly transitioning the humidity to the highest humidity condition under the condition of constant temperature.

[0086] The above-mentioned third humidity value is the humidity value with the smallest difference from the maximum humidity value of the first humidity range in the condensation humidity range, that is, the above-mentioned third humidity value is 95%. When the difference between the above-mentioned third humidity value and the above-mentioned fourth humidity value is less than the preset difference, the value range of the above-mentioned second humidity value can be between the above-mentioned fourth humidity value - the third margin value and the above-mentioned fourth humidity value + the third margin value, that is, 93% - 5% to 93% + 5%, that is, the value range of the above-mentioned second humidity value is 88% to 98%. Among them, the third margin value is 5%, and the above-mentioned preset difference is 5% or 10%, etc. It should be noted that the value range of the above-mentioned third humidity value is 88% to 98%, which can make the severity of the accelerated test more reasonable, because values lower than this humidity value are often not conducive to the severity of the accelerated test; while values higher than this humidity value will pose risks that the failures that occur during verification will not occur in normal use, and risks that the materials of some low-voltage electronic and electrical components cannot withstand this condition, that is, over-design.

[0087] In some preferred embodiments, the above-mentioned first temperature value can be 10°C, the above-mentioned first humidity value can be 50%, the above-mentioned second temperature value can be 75°C, the above-mentioned second humidity value can be 93%, and the above-mentioned third temperature value is 10°C.

[0088] Optionally, the first duration is 1 hour; and / or

[0089] The second duration is less than or equal to 5 minutes; and / or

[0090] The sum of the third duration and the second duration is 4 hours; and / or

[0091] The fourth duration is 1 hour; and / or

[0092] The preset number of cycles is 6.

[0093] In this embodiment, the above-mentioned first duration, second duration, third duration, fourth duration, and preset number of cycles can all be values determined according to historical condensation water climate tests. Specifically, the above-mentioned first duration is 1 hour, which can ensure that the temperature in the simulation container reaches a steady state. The above-mentioned second duration is less than or equal to 5 minutes, which can ensure that the temperature can change rapidly to produce condensation. The sum of the above-mentioned third duration and the second duration is 4 hours, which can ensure that the temperature in the simulation container reaches a steady state and can accumulate sufficient condensed water for the cooling stage. The preset number of cycles being 6 can ensure that the severity of the test is appropriate.

[0094] The following combines Figure 2 The shown temperature and humidity change curve to illustrate this embodiment:

[0095] In Figure 2Among them, Y represents humidity, and its unit is percentage (%). T represents temperature, and its unit is degree Celsius (°C). T represents time, and its unit is hour (h). a represents a cycle with a duration of 5 hours. b represents a rapid change stage with a duration of no more than 5 minutes (min). c represents a stage where humidity is not controlled.

[0096] Specifically, as Figure 2 shown, for each of the six cycles, the initial temperature in the simulation container at the start of the cycle is 10°C ± 2°C, and the humidity is 50% - 98%. By 1 hour after the start of the cycle, the temperature in the simulation container remains at 10°C ± 2°C, and the humidity changes from 50% - 98% to 93% ± 5%. Within 5 minutes after 1 hour after the start of the cycle, the temperature in the simulation container changes from 10°C ± 2°C to 75°C ± 2°C, and the humidity remains at 93% ± 5%. By 4 hours after the start of the cycle, the temperature in the simulation container remains at 75°C ± 2°C, and the humidity remains at 93% ± 5%. From 4 hours after the start of the cycle to 5 hours after the start of the cycle, the temperature in the simulation container changes from 75°C ± 2°C to 10°C ± 2°C, and the humidity is not controlled.

[0097] Optionally, the first electrical and electronic component operates in the first working mode at the fifth time point and operates in the second working mode at the sixth time point.

[0098] Among them, the fifth time point is the time point for performing the first detection on the first electrical and electronic component during the period of simulating the condensate water climate in the simulation container. The first detection includes at least one of function detection and performance detection. The sixth time point is the time point other than the fifth time point during the period of simulating the condensate water climate in the simulation container.

[0099] The first working mode is the mode of operating according to the maximum working load of the first electrical and electronic component, and the second working mode is the mode of operating according to the minimum working load of the first electrical and electronic component.

[0100] The above-mentioned first working mode, that is, operating according to the maximum working load. For example, it can be the 3.2 mode specified by the ISO 16750-1 (i.e., Environmental conditions and tests for electrical and electronic equipment of road vehicles) standard. The above-mentioned second working mode, that is, operating according to the minimum working load. For example, it can be the 2.1 mode specified by the ISO 16750-1 standard.

[0101] In the embodiment of the present disclosure, the first electronic and electrical component operates at the maximum workload only at the time point of performing function and / or performance detection, and operates at the minimum workload at the time point when the function and / or performance detection is not performed. This can make the test results for the first electronic and electrical component more in line with the actual usage requirements and reduce the verification failure caused by overly stringent verification conditions.

[0102] Optionally, the fifth time point includes:

[0103] The start time point of the first time period; wherein, the first time period is the time period during which the temperature in the simulation container is maintained at the second temperature value and the humidity in the simulation container is maintained at the second humidity value;

[0104] The time points at intervals of a preset duration starting from the start time point of the first time period;

[0105] The end time point of the first time period.

[0106] The above preset duration can be reasonably set according to actual needs. For example, 15 minutes, 30 minutes or 1 hour, etc. Preferably, the above preset duration is 30 minutes. The start time point of the above first time period, that is, the above third time point. The end time point of the above first time period is the above fourth time point.

[0107] Exemplarily, as Figure 2 shown, the start time point of the above first time period is the time point when the temperature in the simulation container just reaches 75°C ± 2°C, and the end time point of the above first time period is the time point of 4 hours after the start of the cycle. Specifically, if the above preset duration is 30 minutes and the start time point of the cycle is t0 and the time point when the temperature in the simulation container just reaches 75°C ± 2°C is t1, then the above fifth time point may include t1 + 0.5 hours, t1 + 1 hour, t1 + 1.5 hours, t1 + 2 hours, t1 + 2.5 hours, and t0 + 4 hours.

[0108] In this embodiment, by performing function and / or performance detection on the first electronic and electrical component at multiple time points during the time period (i.e., the high temperature and high humidity stage) when the temperature in the simulation container is maintained at the second temperature value and the humidity in the simulation container is maintained, it helps to more accurately locate the failure point or fault point of the first electronic and electrical component, and thus can more accurately improve the first electronic and electrical component.

[0109] Optionally, within the time period when the temperature in the simulation container is maintained at the second temperature value and the humidity in the simulation container is maintained at the second humidity value, the wind speed in the simulation container is less than or equal to the preset wind speed.

[0110] The above-mentioned preset wind speed can be reasonably set according to actual requirements. For example, the above-mentioned preset wind speed can be 1.5 m / s. In actual situations, it is often easy to generate a high-temperature and high-humidity environment when the vehicle is not running, and thus condensate is likely to be generated in the on-vehicle low-voltage electronic and electrical components. Therefore, in order to better conform to the actual situation and ensure the reproducibility of test results, during the period when the temperature in the simulation container is maintained at the second temperature value and the humidity in the simulation container is maintained at the second humidity value (i.e., the high-temperature and high-humidity stage), the wind speed in the simulation container should be maintained at the low air flow speed in the working space. For example, the value range of the wind speed in the above-mentioned simulation container can be set to 0.5 m / s to 1.5 m / s.

[0111] In this embodiment, by controlling the wind speed in the simulation container to be less than or equal to the preset wind speed during the period when the temperature in the simulation container is maintained at the second temperature value and the humidity in the simulation container is maintained at the second humidity value (i.e., the high-temperature and high-humidity stage), the influence of air flow on temperature and humidity can be reduced, and the reproducibility of test results can be ensured.

[0112] As Figure 3 shown, the present disclosure provides an electronic and electrical component testing device 300, including:

[0113] A determination module 301, configured to determine first condensate climate simulation parameters according to the working characteristic parameters and condensation condition parameters of the target type of electronic and electrical components; wherein, the maximum working voltage of the target type of electronic and electrical components is less than or equal to a preset value, the working characteristic parameters include working temperature characteristic parameters and working humidity characteristic parameters, and the condensation condition parameters include condensation temperature condition parameters and condensation humidity condition parameters;

[0114] A testing module 302, configured to simulate a condensate climate in the simulation container according to the first condensate climate simulation parameters, so as to perform a condensate climate test on a first electronic and electrical component placed in the simulation container, and the first electronic and electrical component belongs to the target type of electronic and electrical components.

[0115] The testing module 302 is specifically configured to:

[0116] Repeat the first operation according to a preset number of cycles;

[0117] Wherein, the first operation includes the following steps:

[0118] Control the temperature in the simulation container to be the first temperature value, and control the humidity in the simulation container to be the first humidity value;

[0119] Within a first duration starting from a first time point, maintain the temperature inside the simulation container at the first temperature value, and control the humidity inside the simulation container to change from the first humidity value to the second humidity value; wherein, the first time point is the start time point when controlling the temperature inside the simulation container to be the first temperature value and controlling the humidity inside the simulation container to be the first humidity value;

[0120] Within a second duration starting from a second time point, control the temperature inside the simulation container to increase from the first temperature value to the second temperature value, and maintain the humidity inside the simulation container at the second humidity value; wherein, the second time point is the time point after the first duration from the first time point;

[0121] Within a third duration starting from a third time point, maintain the temperature inside the simulation container at the second temperature value, and maintain the humidity inside the simulation container at the second humidity value; wherein, the third time point is the time point after the second duration from the second time point;

[0122] Within a fourth duration starting from a fourth time point, control the temperature inside the simulation container to decrease from the second temperature value to the third temperature value according to a preset cooling rate, and cancel the humidity control inside the simulation container; wherein, the fourth time point is the time point after the third duration from the third time point.

[0123] Optionally, the working temperature characteristic parameter includes a first temperature range, which is determined according to at least one of the working temperature range of the target type of electronic and electrical components, the storage temperature range of the target type of electronic and electrical components, and the temperature range of the working environment where the target type of electronic and electrical components are located; the working humidity characteristic parameter includes a first humidity range, which is the humidity range of the working environment where the target type of electronic and electrical components are located; the condensation temperature condition parameter includes a condensation temperature range, and the condensation humidity condition parameter includes a condensation humidity range;

[0124] The first temperature value is determined according to a fourth temperature value, and the fourth temperature value is the temperature value in the condensation temperature range with the smallest difference from the minimum temperature value of the first temperature range; and / or

[0125] The second temperature value is determined according to a fifth temperature value, and the fifth temperature value is the temperature value in the condensation temperature range with the smallest difference from the maximum temperature value of the first temperature range; and / or

[0126] The third temperature value is determined according to the first temperature value or the fourth temperature value; and / or

[0127] The first humidity value is the humidity value in the condensation humidity range that is greater than or equal to a preset humidity value; and / or

[0128] The second humidity value is determined according to a third humidity value, and the third humidity value is the humidity value in the condensation humidity range with the smallest difference from the maximum humidity value of the first humidity range.

[0129] Optionally, the second humidity value is determined according to the third humidity value and a fourth humidity value, and the fourth humidity value is determined according to the highest humidity value used in the historical N times of damp heat tests on the target type of electronic and electrical components, where N is a positive integer.

[0130] Optionally, the first temperature range is -40°C to 80°C, the first humidity range is 0% to 95%, the condensation temperature range is 10°C to 75°C, the condensation humidity range is 0% to 100%, the preset humidity value is 50%, and the fourth humidity value is 93%;

[0131] The value range of the first temperature value is 8°C to 12°C; and / or

[0132] The value range of the first humidity value is 50% to 98%; and / or

[0133] The value range of the second temperature value is 73°C to 77°C; and / or

[0134] The value range of the second humidity value is 88% to 98%; and / or

[0135] The value range of the third temperature value is 8°C to 12°C.

[0136] Optionally, the first duration is 1 hour; and / or

[0137] The second duration is less than or equal to 5 minutes; and / or

[0138] The sum of the third duration and the second duration is 4 hours; and / or

[0139] The fourth duration is 1 hour; and / or

[0140] The preset number of cycles is 6.

[0141] Optionally, the first electronic and electrical component operates in a first working mode at a fifth time point and operates in a second working mode at a sixth time point;

[0142] Wherein, the fifth time point is the time point for performing a function check on the first electronic and electrical component during the period of simulating a condensed water climate in the simulation container, and the sixth time point is the time point other than the fifth time point during the period of simulating a condensed water climate in the simulation container;

[0143] The first working mode is a mode of working according to the maximum working load of the first electronic and electrical component, and the second working mode is a mode of working according to the minimum working load of the first electronic and electrical component.

[0144] Optionally, the fifth time point includes:

[0145] The start time point of the first time period; wherein, the first time period is the time period during which the temperature in the simulation container is maintained at the second temperature value and the humidity in the simulation container is maintained at the second humidity value;

[0146] The time points at preset time intervals starting from the start time point of the first time period;

[0147] The end time point of the first time period.

[0148] Optionally, during the period when the temperature in the simulation container is maintained at the second temperature value and the humidity in the simulation container is maintained at the second humidity value, the wind speed in the simulation container is less than or equal to a preset wind speed.

[0149] The electronic and electrical component testing device provided by the present disclosure can implement each process implemented by the embodiment of the electronic and electrical component testing method, and can achieve the same beneficial effects. To avoid repetition, it will not be elaborated here.

[0150] According to an embodiment of the present disclosure, the present disclosure also provides an electronic device, a readable storage medium, and a computer program product.

[0151] Figure 4 FIG. shows a schematic block diagram of an exemplary electronic device that can be used to implement the embodiments of the present disclosure. The electronic device is intended to represent various forms of digital computers, such as, a laptop computer, a desktop computer, a workbench, a personal digital assistant, a server, a blade server, a mainframe computer, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as, a personal digital processor, a cellular phone, a smart phone, a wearable device, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely exemplary and are not intended to limit the implementation of the present disclosure described herein and / or claimed.

[0152] Such as Figure 4As shown, the electronic device 400 includes a computing unit 401, which can perform various appropriate actions and processes according to a computer program stored in a read-only memory (ROM) 402 or a computer program loaded from a storage unit 408 into a random access memory (RAM) 403. In the RAM 403, various programs and data required for the operation of the device 400 can also be stored. The computing unit 401, the ROM 402, and the RAM 403 are connected to each other via a bus 404. An input / output (I / O) interface 405 is also connected to the bus 404.

[0153] Multiple components in the device 400 are connected to the I / O interface 405, including: an input unit 406, such as a keyboard, a mouse, etc.; an output unit 407, such as various types of displays, speakers, etc.; a storage unit 408, such as a magnetic disk, an optical disc, etc.; and a communication unit 409, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 409 allows the device 400 to exchange information / data with other devices via a computer network such as the Internet and / or various telecommunication networks.

[0154] The computing unit 401 can be various general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the computing unit 401 include but are not limited to a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The computing unit 401 executes the various methods and processes described above, such as the electronic and electrical component testing method. For example, in some embodiments, the electronic and electrical component testing method can be implemented as a computer software program, which is tangibly contained in a machine-readable medium, such as the storage unit 408. In some embodiments, part or all of the computer program can be loaded and / or installed onto the device 400 via the ROM 402 and / or the communication unit 409. When the computer program is loaded into the RAM 403 and executed by the computing unit 401, one or more steps of the electronic and electrical component testing method described above can be executed. Alternatively, in other embodiments, the computing unit 401 can be configured to execute the electronic and electrical component testing method by any other appropriate means (such as by means of firmware).

[0155] The various embodiments of the systems and techniques described above in this document can be implemented in digital electronic circuitry, integrated circuit systems, field programmable gate arrays (FPGA), application specific integrated circuits (ASIC), application specific standard products (ASSP), systems on a chip (SOC), complex programmable logic devices (CPLD), computer hardware, firmware, software, and / or combinations thereof. These various embodiments can include: being implemented in one or more computer programs that are executable and / or interpretable on a programmable system including at least one programmable processor, which can be a special-purpose or general-purpose programmable processor that receives data and instructions from a storage system, at least one input device, and at least one output device, and transmits the data and instructions to the storage system, the at least one input device, and the at least one output device.

[0156] The program code for implementing the methods of the present disclosure can be written in any combination of one or more programming languages. These program codes can be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing device, such that when the program codes are executed by the processor or controller, the functions / operations specified in the flowchart and / or block diagram are implemented. The program code can be executed entirely on the machine, partially on the machine, as a stand-alone software package partially on the machine and partially on a remote machine, or entirely on a remote machine or server.

[0157] In the context of the present disclosure, a machine-readable medium can be a tangible medium that can contain or store a program for use by or in connection with an instruction execution system, apparatus, or device. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium can include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0158] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device for displaying information to the user (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor); and a keyboard and a pointing device (e.g., a mouse or a trackball) through which the user can provide input to the computer. Other kinds of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, speech input, or tactile input).

[0159] The systems and techniques described herein can be implemented in a computing system including backend components (e.g., as a data server), or a computing system including middleware components (e.g., an application server), or a computing system including frontend components (e.g., a user computer having a graphical user interface or a web browser through which the user can interact with an implementation of the systems and techniques described herein), or a computing system including any combination of such backend components, middleware components, or frontend components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local area network (LAN), wide area network (WAN), and the Internet.

[0160] A computer system can include a client and a server. The client and the server are generally remote from each other and typically interact through a communication network. The relationship between the client and the server is generated by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, or a server of a distributed system, or a server incorporating a blockchain.

[0161] It should be understood that various forms of the processes shown above can be used, with steps reordered, added, or deleted. For example, the steps recited in this disclosure can be executed in parallel, sequentially, or in a different order, as long as the desired results of the technical solutions disclosed in this disclosure can be achieved, and no limitation is imposed herein.

[0162] The above specific embodiments do not constitute a limitation on the protection scope of this disclosure. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principle of this disclosure shall be included within the protection scope of this disclosure.

Claims

1. An electronic and electrical component testing method, characterized in that, The method includes: Determining first condensate climate simulation parameters according to the operating characteristic parameters and condensate condition parameters of the target type of electronic and electrical components; wherein, the maximum operating voltage of the target type of electronic and electrical components is less than or equal to a preset value, the operating characteristic parameters include operating temperature characteristic parameters and operating humidity characteristic parameters, and the condensate condition parameters include condensate temperature condition parameters and condensate humidity condition parameters; Simulating a condensate climate in a simulation container according to the first condensate climate simulation parameters to perform a condensate climate test on a first electronic and electrical component placed in the simulation container, where the first electronic and electrical component belongs to the target type of electronic and electrical components; The first condensate climate simulation parameters include a first temperature value, a first humidity value, a second temperature value, a second humidity value, and a third temperature value; The simulating a condensate climate in a simulation container according to the condensate climate simulation parameters includes: Repeating a first operation according to a preset number of cycles; Wherein, the first operation includes the following steps: Controlling the temperature in the simulation container to be the first temperature value and controlling the humidity in the simulation container to be the first humidity value; Maintaining the temperature in the simulation container at the first temperature value within a first time period starting from a first time point, and controlling the humidity in the simulation container to change from the first humidity value to the second humidity value; wherein, the first time point is the start time point when the temperature in the simulation container is controlled to be the first temperature value and the humidity in the simulation container is controlled to be the first humidity value; Within a second time period starting from a second time point, controlling the temperature in the simulation container to rise from the first temperature value to the second temperature value and maintaining the humidity in the simulation container at the second humidity value; wherein, the second time point is the time point after the first time period from the first time point; Within a third time period starting from a third time point, maintaining the temperature in the simulation container at the second temperature value and maintaining the humidity in the simulation container at the second humidity value; wherein, the third time point is the time point after the second time period from the second time point; Within a fourth time period starting from a fourth time point, controlling the temperature in the simulation container to decrease from the second temperature value to the third temperature value at a preset cooling rate and canceling the control of the humidity in the simulation container; wherein, the fourth time point is the time point after the third time period from the third time point.

2. The method according to claim 1, characterized in that, The operating temperature characteristic parameters include a first temperature range, which is determined according to at least one of the operating temperature range of the target type of electronic and electrical components, the storage temperature range of the target type of electronic and electrical components, and the temperature range of the working environment where the target type of electronic and electrical components is located; the operating humidity characteristic parameters include a first humidity range, which is the humidity range of the working environment where the target type of electronic and electrical components is located; the condensate temperature condition parameters include a condensate temperature range, and the condensate humidity condition parameters include a condensate humidity range; The first temperature value is determined according to a fourth temperature value, where the fourth temperature value is the temperature value in the condensation temperature range with the smallest difference from the minimum temperature value of the first temperature range; and / or The second temperature value is determined according to a fifth temperature value, where the fifth temperature value is the temperature value in the condensation temperature range with the smallest difference from the maximum temperature value of the first temperature range; and / or The third temperature value is determined according to the first temperature value or the fourth temperature value; and / or The first humidity value is the humidity value in the condensation humidity range that is greater than or equal to a preset humidity value; and / or The second humidity value is determined according to a third humidity value, where the third humidity value is the humidity value in the condensation humidity range with the smallest difference from the maximum humidity value of the first humidity range.

3. The method according to claim 2, characterized in that, The second humidity value is determined according to the third humidity value and a fourth humidity value, where the fourth humidity value is determined according to the highest humidity value used in the historical N times of damp heat tests on the target type of electronic and electrical components, and N is a positive integer.

4. The method according to claim 3, characterized in that, The first temperature range is -40°C to 80°C, the first humidity range is 0% to 95%, the condensation temperature range is 10°C to 75°C, the condensation humidity range is 0% to 100%, the preset humidity value is 50%, and the fourth humidity value is 93%; The value range of the first temperature value is 8°C to 12°C; and / or The value range of the first humidity value is 50% to 98%; and / or The value range of the second temperature value is 73°C to 77°C; and / or The value range of the second humidity value is 88% to 98%; and / or The value range of the third temperature value is 8°C to 12°C; and / or The first duration is 1 hour; and / or The second duration is less than or equal to 5 minutes; and / or The sum of the third duration and the second duration is 4 hours; and / or The fourth duration is 1 hour; and / or The preset number of cycles is 6.

5. The method according to claim 1, characterized in that, The first electronic and electrical component operates in a first working mode at a fifth time point and operates in a second working mode at a sixth time point; Wherein, the fifth time point is the time point for performing a first detection on the first electronic and electrical component during the period of simulating the condensation water climate in the simulation container, and the first detection includes at least one of a function detection and a performance detection. The sixth time point is the time point other than the fifth time point during the period of simulating the condensation water climate in the simulation container; The first working mode is a mode of operating at the maximum working load of the first electronic and electrical component, and the second working mode is a mode of operating at the minimum working load of the first electronic and electrical component.

6. An electronic and electrical component testing device, characterized in that, Including: A determination module, configured to determine first condensation water climate simulation parameters according to the working characteristic parameters and condensation condition parameters of the target type of electronic and electrical components; wherein, the maximum working voltage of the target type of electronic and electrical components is less than or equal to a preset value, the working characteristic parameters include working temperature characteristic parameters and working humidity characteristic parameters, and the condensation condition parameters include condensation temperature condition parameters and condensation humidity condition parameters; A test module for simulating a condensate climate in a simulation container according to the first condensate climate simulation parameters to perform a condensate climate test on a first electronic and electrical component placed in the simulation container, where the first electronic and electrical component belongs to the target type of electronic and electrical components; The first condensate climate simulation parameters include a first temperature value, a first humidity value, a second temperature value, a second humidity value, and a third temperature value; specifically, the test module is configured to: Repeatedly execute a first operation according to a preset number of cycles; Wherein, the first operation includes the following steps: Control the temperature in the simulation container to the first temperature value and control the humidity in the simulation container to the first humidity value; Within a first duration starting from a first time point, maintain the temperature in the simulation container at the first temperature value and control the humidity in the simulation container to change from the first humidity value to the second humidity value; wherein, the first time point is the start time point when the temperature in the simulation container is controlled to the first temperature value and the humidity in the simulation container is controlled to the first humidity value; Within a second duration starting from a second time point, control the temperature in the simulation container to rise from the first temperature value to the second temperature value and maintain the humidity in the simulation container at the second humidity value; wherein, the second time point is the time point after the first duration from the first time point; Within a third duration starting from a third time point, maintain the temperature in the simulation container at the second temperature value and maintain the humidity in the simulation container at the second humidity value; wherein, the third time point is the time point after the second duration from the second time point; Within a fourth duration starting from a fourth time point, control the temperature in the simulation container to decrease from the second temperature value to the third temperature value at a preset cooling rate and cancel the control of the humidity in the simulation container; wherein, the fourth time point is the time point after the third duration from the third time point.

7. An electronic device, comprising: At least one processor; And A memory communicatively connected to the at least one processor; wherein, The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the method according to any one of claims 1-5.

8. A non-transitory computer-readable storage medium storing computer instructions, wherein, The computer instructions are used to cause the computer to execute the method according to any one of claims 1-5.

9. A computer program product, comprising a computer program, wherein the computer program, when executed by a processor, implements the method according to any one of claims 1-5.

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