A target plate placement platform, a mass spectrometry imaging ion source device and a mass spectrometer

Abstract

The application discloses a mass spectrum imaging ion source device, belonging to the field of mass spectrometers, comprising a laser, a flight tube and a target plate, the target plate is used for placing a sample, the target plate is located directly below the flight tube, the target plate is made of a light-transmitting material, the mass spectrum imaging ion source device further comprises a target plate placing platform, the target plate placing platform comprises a light guide part and a reflection part, the light guide part is installed on the reflection part, the contact surface of the reflection part and the light guide part forms a reflection surface, the target plate is placed on the surface of the light guide part, the laser emits incident light which passes through the light guide part to the reflection surface and forms reflected light, the reflected light passes through the light guide part and the target plate to the sample, so that the sample is ionized and an ion beam is generated, the ion beam flies into the flight tube and flies along the extension direction of the flight tube, so that the ions fly to the sampling area as much as possible, the ion utilization rate is improved, and the resolution is improved. The application also relates to a mass spectrometer comprising the mass spectrum imaging ion source device and a target plate placing platform comprised by the mass spectrum imaging ion source device.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of mass spectrometer, in particular to a mass spectrometry ion source device and a mass spectrometer comprising the same. BACKGROUND

[0002] The mass spectrometer needs to ionize the sample when working, since the target plate containing the sample must be placed directly below the flight tube, and there cannot be any obstruction on the transmission path, therefore the laser must be a certain distance from the target plate in the horizontal direction, resulting in a certain angle between the laser and the normal of the target plate, the ion excitation is offset, the ion beam moves along the reflection path of the laser, and cannot fly vertically to the flight tube, which is not conducive to the ion flight after ionization, and the ionization efficiency and resolution are not ideal. SUMMARY

[0003] In order to overcome the shortcomings of the prior art, one of the purposes of the present application is to provide a mass spectrometry ion source device in which the ion beam can fly vertically to the flight tube.

[0004] In order to overcome the shortcomings of the prior art, the second purpose of the present application is to provide a target plate placement platform in which the ion beam can fly vertically to the flight tube.

[0005] In order to overcome the shortcomings of the prior art, the third purpose of the present application is to provide a mass spectrometer in which the ion beam can fly vertically to the flight tube.

[0006] One of the purposes of the present application is achieved by the following technical scheme:

[0007] A mass spectrometry ion source device, comprising a laser, a flight tube and a target plate, the target plate being used to place a sample, the target plate being located directly below the flight tube, the target plate being made of a light-transmitting material, the mass spectrometry ion source device further comprising a target plate placement platform, the target plate placement platform comprising a light guide portion and a reflection portion, the light guide portion being mounted to the reflection portion, the contact surface of the reflection portion and the light guide portion forming a reflection surface, the target plate being placed on the surface of the light guide portion, the laser emitting incident light rays through the light guide portion to the reflection surface and forming reflected light rays, the reflected light rays passing through the light guide portion and the target plate to the sample, ionizing the sample and generating an ion beam, the ion beam flying into the flight tube and flying along the extension direction of the flight tube.

[0008] Further, the reflected light rays are perpendicular to the target plate.

[0009] Further, the target plate is parallel to the horizontal plane.

[0010] Further, the reflection portion is made of metal, and the reflection surface is a metal polished surface.

[0011] Further, the reflection surface is an inclined surface.

[0012] Further, the target plate is made of conductive glass.

[0013] Further, the light guide part is made of conductive glass.

[0014] Further, the light guide part and the reflection part are both trapezoidal.

[0015] The second purpose of the present application is achieved by the following technical solutions:

[0016] A target plate placing platform comprises a light guide part and a reflection part, the light guide part is installed on the reflection part, the contact surface of the reflection part and the light guide part forms a reflection surface, the surface of the light guide part is used for placing a target plate, the incident light emitted by a laser passes through the light guide part to the reflection surface and forms reflected light, and the reflected light passes through the light guide part and the target plate to a sample.

[0017] The third purpose of the present application is achieved by the following technical solutions:

[0018] A mass spectrometer comprises any one of the mass spectrometry ion source devices.

[0019] Compared with the prior art, the target plate of the mass spectrometry ion source device is made of a light-transmitting material, the mass spectrometry ion source device further comprises a target plate placing platform, the target plate placing platform comprises a light guide part and a reflection part, the light guide part is installed on the reflection part, the contact surface of the reflection part and the light guide part forms a reflection surface, the target plate is placed on the surface of the light guide part, the incident light emitted by a laser passes through the light guide part to the reflection surface and forms reflected light, the reflected light passes through the light guide part and the target plate to a sample, the sample is ionized and an ion beam is generated, the ion beam flies into a flight tube and flies along the extension direction of the flight tube, through the above design, the ions can fly into an acceleration area perpendicularly to a horizontal plane along with the reflected light, the ions fly along the extension direction of the flight tube, the ions fly to a sampling area as much as possible, the ion utilization rate is improved, and thus the resolution is improved. BRIEF DESCRIPTION OF DRAWINGS

[0020] Figure 1 It is a schematic diagram of a mass spectrometer ionization device in the prior art;

[0021] Figure 2 It is a schematic diagram of a mass spectrometry ion source device of the present application;

[0022] Figure 3 It is Figure 2 It is an angle schematic diagram of the mass spectrometry ion source device;

[0023] Figure 4 It is an existing light spot in the prior art;

[0024] Figure 5 effective spot formed for a mass spectrometry imaging ion source device.

[0025] In the figure: 21, laser; 22, incident light; 23, reflected light; 24, sample; 25, target plate; 26, light guide portion; 27, reflection portion; 31, existing spot; 32, effective spot. DETAILED DESCRIPTION

[0026] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all the other embodiments obtained by a person of ordinary skill in the art without creative work fall within the protection scope of the present application.

[0027] It should be noted that when a component is referred to as being "fixed" to another component, it can be directly on the other component or can be fixed to the other component with another intermediate component. When a component is referred to as being "connected" to another component, it can be directly connected to the other component or can be connected to the other component with another intermediate component. When a component is referred to as being "provided on" another component, it can be directly provided on the other component or can be provided on the other component with another intermediate component. The terms "vertical", "horizontal", "left", "right", and the like used herein are for illustrative purposes only.

[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0029] Figure 1 for an ionization device in the prior art.

[0030] As Figure 1As shown, the existing ionization device includes a laser 21, a target plate 25, and a flight tube. The sample 24 is solidified on the target plate 25. The target plate 25 is located directly below the flight tube, whose extension direction is perpendicular to the horizontal direction. The end of the flight tube is parallel to the horizontal direction. Since there can be no obstruction in the transmission path from the target plate 25 to the flight tube, the laser 21 must be at a certain distance from the target plate 25 in the horizontal direction, resulting in an angle between the incident light beam 22 emitted by the laser 21 and the normal of the target plate 25. An acceleration zone is formed between the target plate 25 and the flight tube. The incident light beam 22 emitted by the laser 21 hits the sample 24, and after ionization, the sample 24 forms an ion beam that aligns with the reflected light beam 23, flying into the acceleration zone and then accelerating before entering the flight tube.

[0031] In existing ionization devices, according to the law of reflection, the angle of incidence of light equals the angle of exit. Therefore, the reflected laser beam 23 is symmetrical to the incident beam 22 with the normal perpendicular to the target plate 25 as its axis of symmetry, and the reflected beam 23 forms an angle with the target plate 25. At this time, the ion beam forms an angle with the extension direction of the flight tube, causing the ion beam to collide with the flight tube wall or be deflected during its passage through the flight tube. Only a small amount of ion beam can reach the sampling area, resulting in low ion utilization of sample 24.

[0032] Figures 2-3 This invention relates to a mass spectrometry imaging ion source device.

[0033] like Figure 2 As shown, the mass spectrometry imaging ion source device of the present invention includes a laser 21, an incident light beam 22, a reflected light beam 23, a target plate 25, a target plate placement platform, and a flight tube (not shown).

[0034] The target plate 25 is made of a transparent material. The target plate 25 is used to support the sample 24.

[0035] The target placement platform includes a light guide 26 and a reflective portion 27. The light guide 26 is made of a light-transmitting and conductive material. Specifically, in this embodiment, the light guide 26 is made of conductive glass. The reflective portion 27 is made of a metal material. Specifically, in this embodiment, the reflective portion 27 is made of stainless steel. The reflective portion 27 has a reflective surface. The reflective surface is formed by polishing the metal material. The reflective surface is beveled. The light guide 26 is mounted on the reflective portion 27, and the upper surface of the light guide 26 is used to place the target plate 25, and the upper surface of the light guide 26 is parallel to the horizontal plane. Specifically, both the light guide 26 and the reflective portion 27 are right-angled trapezoids.

[0036] During the assembly of the mass spectrometry imaging ion source device, sample 24 is solidified on target plate 25. Target plate 25 is located directly below the flight tube, whose extension direction is perpendicular to the horizontal direction. The end of the flight tube is parallel to the horizontal direction. Since there must be no obstruction in the transmission path from target plate 25 to the flight tube, laser 21 must be at a certain distance from target plate 25 in the horizontal direction, resulting in a certain angle between the incident light ray 22 emitted by laser 21 and the normal of target plate 25.

[0037] like Figure 3 As shown, when using the mass spectrometry imaging ion source device, the incident light 22 emitted by the laser 21 is irradiated by the light guide 26 to the reflective surface of the target plate placement platform. After being reflected by the reflective surface, the reflected light 23 passes through the light guide 26 and the target plate 25 and hits the sample 24. After the sample 24 is ionized, it is dispersed with the reflected light 23, flies into the acceleration zone, and enters the flight tube of the mass analysis system.

[0038] The incident ray 22 emitted by laser 21 makes an angle α with the horizontal direction. The angle between the reflecting surface of the target platform and the horizontal direction is β′. The angle between the normal of the reflecting surface of the target platform and the horizontal plane is γ = 90° - β′. The angle between the incident ray 22 and the normal of the tangential surface of the target platform is δ = γ′ - α, i.e., δ = 90° - α - β′. The angle between the reflected ray 23 and the horizontal direction is ε = δ + γ′, i.e., ε = 180° - α - 2β′. To ensure that the ions fly vertically into the acceleration region, ε should be 90°. That is, the relationship between the angle α between laser 21 and the horizontal direction and the angle β′ between the reflecting surface of the target platform and the horizontal direction should be α + 2β′ = 90°.

[0039] In the field of mass spectrometry imaging, spatial resolution is particularly important. Traditional tissue imaging techniques based on MALDI-TOF biomolecular mass spectrometry, due to the tilted beam of laser 21 directed towards the analyte, result in an elliptical spot 31 formed on the analyte (e.g., ...). Figure 4 (As shown). The shorter side of the ellipse is a = r, where r is the radius of the laser spot perpendicularly irradiated by laser 21. The longer side of the ellipse has a certain angle α due to the incident laser, i.e., the longer side of the ellipse... Traditional tissue imaging techniques based on MALDI-TOF biomolecular mass spectrometry have a spatial resolution of [missing information]. In the mass spectrometry imaging ionization device of this application, since the laser of laser 21 is directed perpendicularly to the substance to be measured, its effective spot 32 is circular (e.g., ...). Figure 5 As shown), with radius r and spatial resolution πr 2 This design enhances spatial resolution.

[0040] In this application, ions can fly into the acceleration zone perpendicular to the horizontal plane with the reflected light 23, so that the ions fly along the extension direction of the flight tube and fly as far as possible to the sampling area, thereby improving ion utilization and thus improving resolution.

[0041] The present invention also relates to a mass spectrometer comprising the above-described mass spectrometry imaging ion source device.

[0042] The above embodiments merely illustrate several implementation methods of the present invention, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the invention patent. It should be noted that, for those skilled in the art, several modifications and improvements can be made without departing from the concept of the present invention. These are all equivalent modifications and improvements made to the above embodiments based on the essential technology of the present invention, and all of these fall within the protection scope of the present invention.

Claims

1. A mass spectrometry imaging ion source device, comprising a laser, a flight tube, and a target plate, wherein the target plate is used to place a sample and is located directly below the flight tube, characterized in that: The target plate is made of a light-transmitting material. The mass spectrometry imaging ion source device also includes a target plate placement platform. The target plate placement platform includes a light guide and a reflector. The light guide is mounted on the reflector. The contact surface between the reflector and the light guide forms a reflective surface. The target plate is placed on the surface of the light guide. The upper surface of the light guide is parallel to the horizontal plane. The incident light emitted by the laser is located on an inclined straight line. The incident light passes through the light guide to the reflector and forms a reflected light. The reflected light passes through the light guide and the target plate to the sample. The reflected light is perpendicular to the sample, causing the sample to ionize and generate an ion beam. The ion beam flies into the flight tube and flies along the extension direction of the flight tube.

2. The mass spectrometry imaging ion source device according to claim 1, characterized in that: The reflected light is perpendicular to the target plate.

3. The mass spectrometry imaging ion source device according to claim 2, characterized in that: The target plate is parallel to the horizontal plane.

4. The mass spectrometry imaging ion source device according to claim 1, characterized in that: The reflective part is made of metal, and the reflective surface is a polished metal surface.

5. The mass spectrometry imaging ion source device according to claim 1, characterized in that: The reflective surface is an inclined plane.

6. The mass spectrometry imaging ion source device according to claim 1, characterized in that: The target plate is made of conductive glass.

7. The mass spectrometry imaging ion source device according to claim 1, characterized in that: The light guide is made of conductive glass.

8. The mass spectrometry imaging ion source device according to claim 1, characterized in that: Both the light guide and the reflective part are trapezoidal.

9. A target plate placement platform, characterized in that: The target plate placement platform includes a light guide and a reflector. The light guide is mounted on the reflector, and the contact surface between the reflector and the light guide forms a reflective surface. The surface of the light guide is used to place the target plate. The upper surface of the light guide is parallel to the horizontal plane. The incident light emitted by the laser is located on an inclined straight line. The incident light passes through the light guide to the reflector and forms a reflected light. The reflected light passes through the light guide and the target plate to the sample. The reflected light is perpendicular to the sample.

10. A mass spectrometer, characterized in that: The mass spectrometer includes the mass spectrometry imaging ion source device as described in any one of claims 1-8.

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