Database performance testing method and apparatus, medium, device, and program product

Abstract

The exemplary embodiments of the present specification provide a database performance testing method and device, a computer readable storage medium, an electronic device, and a computer program product. The method comprises: a database performance testing device obtaining a plurality of sets of test instructions about a plurality of databases, each set of test instructions comprising test configuration data for a database; then, based on a concurrent process, the database performance testing device concurrently sends the test configuration data for the plurality of databases to the database servers to which the plurality of databases respectively belong. Further, after receiving the test configuration data in the i-th set of test instructions, the database server in which the i-th database is located performs performance testing on the i-th database according to the test configuration data, and sends the performance testing result to the database performance testing device.

Description

Technical Field

[0001] This specification relates to the field of database technology, and in particular to a database performance testing method and apparatus, a computer-readable storage medium, an electronic device, and a computer program product. Background Technology

[0002] With the development of science and technology, databases have emerged to facilitate data storage. A database is a repository for data, and the data in a database is stored according to certain rules. To ensure that a database can provide better services, performance testing is necessary. However, the testing efficiency of database testing solutions provided by relevant technologies needs to be improved.

[0003] It should be noted that the information disclosed in the background section above is only used to enhance the understanding of the background of this specification, and therefore may include information that does not constitute prior art known to those skilled in the art. Summary of the Invention

[0004] The purpose of this specification is to provide a database performance testing method and apparatus, a computer-readable storage medium, an electronic device, and a computer program product, which at least to some extent improves the testing efficiency of database performance testing.

[0005] Other features and advantages of this specification will become apparent from the following detailed description, or may be learned in part by practice of this specification.

[0006] According to one aspect of this specification, a database performance testing method is provided, applied to a database performance testing apparatus. The method includes: obtaining test instructions for N databases to obtain N sets of test instructions, wherein the i-th set of test instructions includes test configuration data for the i-th database, where N is an integer greater than 1 and i is an integer from 1 to N, inclusive; based on concurrent processes, concurrently sending the test configuration data for the N databases to the database servers to which the N databases belong, so as to perform performance testing on the i-th database according to the test configuration data in the i-th set of test instructions; and obtaining the database performance test results sent by the database servers.

[0007] In an exemplary embodiment, based on the foregoing scheme, before the test configuration data for the N databases is concurrently sent to the database servers to which the N databases belong respectively, the method further includes: determining multiple threads corresponding to the test configuration data for the i-th database, and obtaining a set of i-th threads;

[0008] The above-mentioned test configuration data for the above N databases is concurrently sent to the database servers to which the above N databases belong, including: based on the above-mentioned i-th thread set, sending the test configuration data for the above i-th database to the database server to which the above i-th database belongs, so as to concurrently send the test configuration data for the above N databases to the database servers to which the above N databases belong.

[0009] In an exemplary embodiment, based on the foregoing scheme, the above-mentioned determination of multiple threads corresponding to the test configuration data of the i-th database to obtain the i-th thread set includes: determining multiple threads for performance testing of the i-th database according to the test configuration data of the i-th database, and determining the implementation method among the multiple threads to obtain the i-th thread set.

[0010] In an exemplary embodiment, based on the foregoing scheme, the i-th group of test instructions further includes: the i-th address information corresponding to the i-th database; the concurrent transmission of test configuration data for the N databases to the database servers to which the N databases belong includes: determining the target server to which the i-th database belongs based on the i-th address information; and transmitting the test configuration data for the i-th database to the target server, so as to concurrently transmit the test configuration data for the N databases to the database servers to which the N databases belong.

[0011] In an exemplary embodiment, based on the foregoing scheme, the number of target servers to which the i-th database belongs is multiple;

[0012] The above-mentioned sending of the test configuration data of the i-th database to the target server includes: sending the test configuration data of the i-th database to the switch, and sending the test configuration data of the i-th database to multiple target servers through multiple output interfaces of the switch.

[0013] In an exemplary embodiment, based on the foregoing scheme, the above-mentioned acquisition of test instructions regarding N databases includes: acquiring test instructions regarding the N databases sent by the terminal;

[0014] After obtaining the database performance test results sent by the multiple database servers, the method further includes: generating a test report based on the database performance test results sent by the multiple database servers; and sending the test report to the terminal.

[0015] In an exemplary embodiment, based on the foregoing scheme, the performance test includes: stress test, load test, or capacity test.

[0016] According to another aspect of this specification, a database performance testing method is applied to a database server, the database server being used to store an i-th database. The method includes: receiving test configuration data for the i-th database sent by a database performance testing device, wherein the test configuration data for the i-th database belongs to the i-th group of test instructions in N groups of test instructions, the N groups of test instructions are test instructions for N databases, and the test configuration data for the N databases is sent by the database performance testing device based on a concurrent process, where N is an integer greater than 1, and i is an integer from 1 to N, inclusive; performing a performance test on the i-th database according to the test configuration data for the i-th database; and sending the performance test results for the i-th database to the database performance testing device.

[0017] In an exemplary embodiment, based on the foregoing scheme, the database server is further used to store the k-th database, where k is a positive integer not equal to i and not greater than N;

[0018] Before performing a performance test on the i-th database based on the test configuration data for the i-th database, the method further includes: receiving test configuration data for the k-th database sent by the database performance testing device, wherein the test configuration data for the k-th database belongs to the k-th group of test instructions in the N groups of test instructions.

[0019] The above-mentioned performance test of the i-th database based on the test configuration data of the i-th database includes: simultaneously performing the step of performing a performance test of the i-th database based on the test configuration data of the i-th database, and the step of performing a performance test of the k-th database based on the test configuration data of the k-th database.

[0020] The above-mentioned sending of the performance test results of the i-th database to the database performance testing device includes: sending the performance test results of the i-th database and the performance test results of the k-th database to the database performance testing device.

[0021] According to another aspect of this specification, a database performance testing device is provided, wherein the device includes: a first acquisition module, a sending module, and a second acquisition module.

[0022] The first acquisition module is configured to: acquire test instructions for N databases, obtaining N sets of test instructions, wherein the i-th set of test instructions includes test configuration data for the i-th database, where N is an integer greater than 1 and i is an integer from 1 to N, including 1 and N; the sending module is configured to: concurrently send the test configuration data for the N databases to the database servers to which the N databases belong, based on concurrent processes, so as to perform performance testing on the i-th database according to the test configuration data in the i-th set of test instructions; and the second acquisition module is configured to: acquire the database performance test results sent by the database servers.

[0023] According to another aspect of this specification, a database performance testing device is applied to a database server, the database server being used to store an i-th database, the device comprising: a receiving module, a testing module, and a sending module.

[0024] The receiving module is configured to: receive test configuration data for the i-th database sent by the database performance testing device, wherein the test configuration data for the i-th database belongs to the i-th group of test instructions in N groups of test instructions, the N groups of test instructions are test instructions for N databases, and the test configuration data for the N databases is sent by the database performance testing device based on a concurrent process, where N is an integer greater than 1, and i is an integer from 1 to N, inclusive; the testing module is configured to: perform performance testing on the i-th database according to the test configuration data for the i-th database; and the sending module is configured to: send the performance test results for the i-th database to the database performance testing device.

[0025] According to one aspect of this specification, a computer-readable storage medium is provided that stores instructions that, when executed on a computer or processor, cause the computer or processor to perform the database performance testing method as described in the above aspect of the specification.

[0026] According to another aspect of this specification, an electronic device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the database performance testing method as described in the preceding aspect of the specification.

[0027] According to another aspect of this specification, a computer program product comprising instructions is provided that, when the computer program product is run on a computer or processor, causes the computer or processor to perform the database performance testing method as described in the foregoing aspect of the specification.

[0028] The database performance testing method and apparatus, computer-readable storage medium, electronic device, and computer program product provided in the embodiments of this specification have the following technical effects:

[0029] The database performance testing method provided in the exemplary embodiments of this specification is based on the information interaction between the database performance testing device and the database server.

[0030] Specifically, the database performance testing device acquires multiple sets of test instructions for multiple databases, each set including test configuration data for one database. Then, based on concurrent processes, the device concurrently sends the test configuration data for multiple databases to the respective database servers of each database. This method of sending the test configuration data from multiple sets of test instructions based on concurrent processes enables high-concurrency testing of multiple databases. Furthermore, the test configuration data in the multiple sets of test instructions can be flexibly configured, improving the flexibility of performance testing for different databases.

[0031] Furthermore, after receiving the test configuration data from the i-th set of test instructions, the database server hosting the i-th database performs a performance test on the i-th database based on the test configuration data and sends the performance test results to the database performance testing device. The database performance testing device then aggregates the performance test results of multiple databases, making it convenient for users to view the test results for multiple databases.

[0032] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this specification. Attached Figure Description

[0033] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this specification and, together with the description, serve to explain the principles of this specification. It is obvious that the drawings described below are merely some embodiments of this specification, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort.

[0034] Figure 1 This is a schematic diagram of the system architecture for the database performance testing scheme provided in the embodiments of this specification.

[0035] Figure 2 This is a flowchart illustrating a database performance testing method provided in one embodiment of this specification.

[0036] Figure 3 This is a schematic diagram of the test instruction setting interface provided in one embodiment of this specification.

[0037] Figure 4 This is a schematic diagram illustrating the information interaction of a database performance testing method provided in one embodiment of this specification.

[0038] Figure 5 This is a schematic diagram illustrating a usage scenario of a database performance testing scheme provided in one embodiment of this specification.

[0039] Figure 6 This is a flowchart illustrating a database performance testing method provided in another embodiment of this specification.

[0040] Figure 7 This is a schematic diagram of the database performance testing device provided in one embodiment of this specification.

[0041] Figure 8 This is a schematic diagram of the structure of a database performance testing device provided in another embodiment of this specification.

[0042] Figure 9 This is a schematic diagram of the database performance testing device provided in another embodiment of this specification.

[0043] Figure 10 This is a schematic diagram of the structure of the electronic device provided in the embodiments of this specification. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of this specification clearer, the embodiments of this specification will be described in further detail below with reference to the accompanying drawings.

[0045] In the following description, when referring to the accompanying drawings, the same numbers in different drawings denote the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this specification. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this specification as detailed in the appended claims.

[0046] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided to make this specification more comprehensive and complete, and to fully convey the concept of the exemplary embodiments to those skilled in the art. The described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a full understanding of the embodiments described herein. However, those skilled in the art will recognize that the technical solutions described herein may be practiced with one or more of the specific details mentioned above omitted, or other methods, components, apparatus, steps, etc., may be employed. In other instances, well-known technical solutions are not shown or described in detail to avoid obscuring various aspects of this specification.

[0047] Furthermore, the accompanying drawings are merely illustrative diagrams of this specification and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and therefore repeated descriptions of them will be omitted. Some block diagrams shown in the drawings are functional entities and do not necessarily correspond to physically or logically independent entities. These functional entities may be implemented in software, in one or more hardware modules or integrated circuits, or in different network and / or processor devices and / or microcontroller devices.

[0048] Since each database server in a data center can only provide one or two network exits, data center database services face high-concurrency bottlenecks. Current technologies typically achieve high-concurrency performance for data center database services by configuring switches.

[0049] For example, Figure 1 This is a schematic diagram of the system architecture for the database performance testing scheme provided in the embodiments of this specification.

[0050] like Figure 1 As shown, the system architecture may include: a database performance testing device 110, a network 120, a terminal 130, and database servers 141-144. The database performance testing device 110 and the terminal 130 can be connected via the network 120, and the database performance testing device 110 and the database server can also be connected via the network 120.

[0051] For example, the database performance testing device 110 described above can be a server or other physical device, including basic configurations such as a processor, memory, hard disk, and network interface, capable of running concurrent programs. For example, it can support test models or test cases of various benchmark types.

[0052] For example, the database performance testing device 110 acquires multiple sets of test instructions for multiple databases, each set of test instructions including test configuration data for one database; further, the database performance testing device 110 initiates a concurrent process, and based on the concurrent process, concurrently sends the test configuration data for multiple databases to the database servers to which each database belongs. Based on the concurrent process of the database performance testing device 110, high-concurrency testing of multiple databases can be achieved.

[0053] The aforementioned multiple sets of test commands for multiple databases can include various benchmark types of test models or test cases. This means users can flexibly configure test data for each database according to their performance testing needs. Furthermore, based on the concurrent processes of the aforementioned database performance testing device, multiple test cases are sent to the servers where each database resides, enabling the simultaneous execution of different test contents on multiple databases, effectively improving the efficiency of database performance testing.

[0054] For example, the terminal 130 described above can be a terminal device with a display screen and input / output functions, such as a laptop or mobile phone, etc., and this specification does not limit it. In the solution provided in the embodiments of this specification, the user can set test instructions about the database to be tested through the terminal 130. Furthermore, the test instructions can be sent to the database performance testing device 110 through the network 120.

[0055] For example, network 120 can be a communication medium of various connection types that can provide a communication link between the terminal and the aforementioned database performance testing device, such as a wired communication link, a wireless communication link, or a fiber optic cable, etc., which are not limited herein.

[0056] For example, a database server deploys a database and starts listening for the database to ensure successful access. Specifically, it can be a standalone physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communication, middleware services, domain name services, security services, and big data and artificial intelligence platforms.

[0057] For example, for databases distributed across multiple database servers, test configuration data from the aforementioned database performance testing device 110 can reach multiple database servers via a switch. This effectively improves the execution efficiency of performance testing. For example, refer to... Figure 1 Database D is distributed across database servers 142, 143, and 144. Test configuration data for database D can be sent from the database performance testing device 110 to the switch, which then forwards it to the three database servers.

[0058] Based on the above system architecture, embodiments of this specification provide a database performance testing method and apparatus, a computer-readable storage medium, an electronic device, and a computer program product.

[0059] in, Figure 2This is a flowchart illustrating a database performance testing method provided in one embodiment of this specification. The execution entity of the embodiment shown in the figure is the aforementioned database performance testing device.

[0060] refer to Figure 2 The database performance testing methods provided in the embodiments of this specification include: S210-S230.

[0061] In step S210, test instructions for N databases are obtained, resulting in N sets of test instructions. The i-th set of test instructions includes test configuration data for the i-th database. Here, N is an integer greater than 1, and i is an integer from 1 to N, inclusive.

[0062] In the exemplary embodiments, these embodiments are used for performance testing of any database product, such as MySQL and Oracle, and therefore have high applicability. In these embodiments, test commands for multiple databases can be set via a terminal client or a web interface. For example, Figure 3 This is a schematic diagram of the test instruction setting interface provided in one embodiment of this specification.

[0063] refer to Figure 3 Users can choose whether to execute a high-concurrency database test. If the "Yes" control is selected, the terminal interface displays a settings interface for database test commands. For example, the test commands for database A include: the address information of database A, the type of performance test to be performed on database A (a selection box can be provided for users to choose from various test types), and the selection of test cases. For instance, the interface also provides a control 300 for adding test settings for other databases, allowing users to set different test configuration data for multiple databases through the terminal interface, thereby obtaining the corresponding test commands for each database.

[0064] In an exemplary embodiment, after the user sets the test commands for each database on the terminal, the commands can be sent to the aforementioned database performance testing device via the network.

[0065] Continue to refer to Figure 2 In S220, based on concurrent processes, the test configuration data for the N databases is sent concurrently to the database servers to which the N databases belong, so as to perform performance testing on the i-th database according to the test configuration data in the i-th group of test instructions.

[0066] In an exemplary embodiment, the database performance testing device described above initiates concurrent processes to process test instructions for multiple databases in parallel. Here, a concurrent process refers to several processes that can be executed simultaneously, and the execution of a group of concurrent processes overlaps in time. Overlap means that the first instruction executed by one process begins before the last instruction executed by another process completes. (See reference...) Figure 1 If the database performance testing device 110 receives four sets of test instructions, it can enable four processes to process and send the four sets of test data in parallel, thereby achieving high-concurrency testing of multiple databases.

[0067] In exemplary embodiments, each set of test instructions includes the address information of the database under test. Furthermore, the solutions provided in this specification access the database through standard interfaces, such as Java Database Connectivity (JDBC) and Open Database Connectivity (ODBC). Taking JDBC as an example, the Uniform Resource Locator (URL) for accessing the database can be represented as: jdbc:microsoft:sqlserver: / / <machine_name> <:port>;DatabaseName= <dbname>Here, "machine_name" represents the name of the database server where the database resides; "port" represents the port number; and "DatabaseName" represents the database name. Therefore, the aforementioned database performance testing device can send the corresponding test configuration data to the corresponding database server based on the address information of each database under test.

[0068] refer to Figure 1 The aforementioned database performance testing device sends test configuration data for database A to database server 141 based on the address information of database A; similarly, the aforementioned database performance testing device also sends test configuration data for database A to database server 141 based on the address information of database B. In other words, both database A and database B are deployed on database server 141.

[0069] refer to Figure 1 The aforementioned database performance testing device sends test configuration data for database C to database server 142 based on the address information of database C; similarly, it sends test configuration data for database D to database servers 142, 143, and 144 based on the address information of database D. In other words, database C is deployed entirely on database server 142, while database D is distributed across database servers 142, 143, and 144.

[0070] It should be noted that when this embodiment performs performance testing on a database deployed on multiple database servers, the test configuration information for the database (such as database D mentioned above) sent by the database performance testing device will be distributed to each database server via a switch, thereby improving testing efficiency.

[0071] For example, after receiving the test configuration data in the i-th set of test instructions, the database server where the i-th database resides performs a performance test on the i-th database according to the test configuration data. As mentioned above, the database performance test provided in the embodiments of this specification can be a stress test, a load test, or a capacity test.

[0072] For example, refer to Figure 1 The performance tests for databases A and B are stress tests, the performance test for database D is a load test, and the performance test for database C is a capacity test. Therefore, database server 141 will perform stress tests on databases A and B; database server 142 will perform a capacity test on database C and a load test on database D; and database servers 143 and 144 will both perform load tests on database D.

[0073] Continue to refer to Figure 2 In S230, the database performance test results sent by the database server are obtained.

[0074] After performance tests are performed on each of the aforementioned database servers, the relevant performance test results are sent to the database performance testing device. The device then summarizes the performance test results for each database to generate a test report, which is then available for the user to view.

[0075] In an exemplary embodiment, Figure 4 This diagram illustrates the information interaction process between a database performance testing method provided in one embodiment of this specification. The embodiment shown in the diagram illustrates the information interaction process between the terminal 130, the database performance testing device 110, and the database server.

[0076] refer to Figure 4 The database performance testing methods provided in the embodiments of this specification include: S42-S414.

[0077] In S42, terminal 130 sends test commands for N databases to database performance testing device 110.

[0078] In an exemplary embodiment, the user can configure test parameters (such as...) for the database under test via terminal 130. Figure 3 As shown in the figure, the terminal 130 can send a set of test instructions corresponding to each database under test to the database performance testing device 110.

[0079] In an exemplary embodiment, Figure 5 This diagram illustrates a usage scenario for a database performance testing scheme provided in one embodiment of this specification. (Reference) Figure 5 To further improve concurrency performance, multiple database performance testing devices are connected to a switch, so that multiple sets of test commands output by the terminal reach each database performance testing device after passing through the switch.

[0080] Continue to refer to Figure 4 In S44, the database performance testing device 110 determines multiple threads corresponding to the test configuration data of the i-th database and obtains the i-th thread set.

[0081] As previously described, the database performance testing device 110 initiates a concurrent process to process and send test commands for multiple databases concurrently. The concurrent processing refers to performing the processing corresponding to step S44 on each of the test commands for multiple databases. Here, the i-th database is any one of the N databases being tested. The implementation method for determining the i-th thread set based on the test configuration data of the i-th database is as follows:

[0082] In an exemplary embodiment, multiple threads for performance testing of the i-th database are determined based on the test configuration data for that database. In this embodiment, within the concurrent processes of the database performance testing device, one process corresponds to the processing and sending of test configuration data for one database. Therefore, for the test configuration data of the i-th database, assuming it corresponds to the i-th process, and the multiple threads for performance testing of that database are determined to be included in the i-th process, each thread in the i-th thread set is an actual operating unit within the i-th process. (See reference...) Figure 1 Based on the test configuration data for database A, thread set 10 for database A is determined; based on the test configuration data for database B, thread set 20 for database A is determined; based on the test configuration data for database C, thread set 30 for database A is determined; and based on the test configuration data for database D, thread set 40 for database A is determined.

[0083] Each thread in the set of threads i refers to a single sequential control flow within the i-th process, and each thread executes different tasks in parallel. The implementation of some threads within the i-th process is related to the test configuration data for the i-th data; some threads can be implemented with concurrent execution, while others can be implemented with sequential execution.

[0084] Continue to refer to Figure 4 In S46, the database performance testing device 110 sends test configuration data for the i-th database based on the address information of the i-th database and the i-th thread set.

[0085] For example, the database performance testing device 110 determines the server and port information of the database based on the Uniform Resource Locator (URL) accessed during the test execution, and then sends test configuration data for the i-th database based on the address information of the i-th database and the i-th thread set.

[0086] In S48, the database server performs a performance test on the i-th database based on the test configuration data for the i-th database.

[0087] If the database server deploys a database of type i, the database server performs a performance test on the database of type i based on the test configuration data for the database of type i. As mentioned above, the database performance test provided in the embodiments of this specification can be a stress test, a load test, or a capacity test.

[0088] In an exemplary embodiment, Figure 6 This diagram illustrates a database performance testing method according to another embodiment of this specification. The embodiment shown illustrates a scenario where stress tests are performed on two databases (the i-th database and the k-th database, where k is a positive integer not equal to i and not greater than N) deployed on the same database server. (See reference...) Figure 6 The embodiment shown in the figure includes:

[0089] S610, the database server receives the test configuration data for the i-th database and the test configuration data for the k-th database sent by the database performance testing device based on a concurrent process; and S620, simultaneously executes the step of performing a performance test on the i-th database according to the test configuration data for the i-th database, and the step of performing a performance test on the k-th database according to the test configuration data for the k-th database.

[0090] Continue to refer to Figure 4 In S410, the database server sends the performance test results of the i-th database to the database performance test device 110.

[0091] If the current database contains only the i-th database, after performing performance testing on the i-th database, the test results are sent to the database performance testing device. However, if two databases are deployed under test, then step S630 can be executed to send the performance test results for both the i-th and k-th databases to the database performance testing device.

[0092] In S412, the database performance testing device 110 generates a test report based on the database performance test results sent by multiple database servers.

[0093] Due to factors such as the different types of performance tests performed on different databases, the duration of performance tests may vary. Therefore, the time it takes for the server hosting the database to send the test results to the database performance testing device after the performance test is executed may also differ.

[0094] In one embodiment, after the database performance testing device 110 receives the database performance test results of the N databases, a test report is generated. In another embodiment, to improve the efficiency of obtaining test results, a test report is generated for the first time after a preset time period following the receipt of the database performance test result of the first database (e.g., 10 minutes after the receipt of the database performance test result of the first database), and a test report is generated again after the database performance test results of the N databases are obtained.

[0095] In S414, the database performance testing device 110 sends a test report to the terminal 130. This allows the user to conveniently view the test results of the relevant database on the terminal.

[0096] The database performance testing apparatus provided in this specification can perform various benchmark tests on multiple databases. The solution provided in this specification supports different database products, such as MySQL and Oracle. On one hand, the database performance testing apparatus provided in this specification can achieve high-concurrency database performance testing, such as simultaneously supporting performance testing of multiple database products. On the other hand, the solution provided in this specification supports flexible setting of test configuration parameters for different databases, thereby supporting different test types for different database products simultaneously. Therefore, the solution provided in this specification is beneficial for improving the concurrent transaction capabilities of database products.

[0097] It should be noted that the above figures are merely illustrative of the processes included in the methods according to exemplary embodiments of this specification, and are not intended to be limiting. It is readily understood that the processes shown in the above figures do not indicate or limit the temporal order of these processes. Furthermore, it is readily understood that these processes may, for example, be executed synchronously or asynchronously in multiple modules.

[0098] The example numbers in this specification are for descriptive purposes only and do not represent the superiority or inferiority of the examples.

[0099] The following are embodiments of the apparatus described in this specification, which can be used to execute the embodiments of the methods described in this specification. For details not disclosed in the apparatus embodiments of this specification, please refer to the embodiments of the methods described in this specification.

[0100] in, Figure 7 This is a schematic diagram of the structure of a database performance testing device provided in one embodiment of this specification. The database performance testing device 700 in this embodiment includes: a first acquisition module 710, a sending module 720, and a second acquisition module 730.

[0101] The first acquisition module 710 is configured to: acquire test instructions for N databases, obtaining N sets of test instructions, wherein the i-th set of test instructions includes test configuration data for the i-th database, where N is an integer greater than 1 and i is an integer from 1 to N, including 1 and N; the sending module 720 is configured to: based on concurrent processes, concurrently send the test configuration data for the N databases to the database servers to which the N databases belong, so as to perform performance testing on the i-th database according to the test configuration data in the i-th set of test instructions; and the second acquisition module 730 is configured to: acquire the database performance test results sent by the database servers.

[0102] In an exemplary embodiment, Figure 8 This is a schematic diagram of the structure of a database performance testing device provided in another embodiment of this specification.

[0103] In an exemplary embodiment, based on the foregoing scheme, the database performance testing device 700 further includes an acquisition module 740.

[0104] The acquisition module 740 is used to: before concurrently sending the test configuration data for the N databases to the database servers to which the N databases belong, determine the multiple threads corresponding to the test configuration data for the i-th database and obtain the set of the i-th threads.

[0105] The aforementioned sending module 720 is specifically used to: based on the aforementioned set of i-th threads, send the test configuration data for the i-th database to the database server to which the i-th database belongs, so as to concurrently send the test configuration data for the N databases to the database servers to which the N databases belong respectively.

[0106] In an exemplary embodiment, based on the foregoing scheme, the acquisition module 740 is specifically used to: determine multiple threads for performance testing of the i-th database based on the test configuration data of the i-th database, and determine the implementation method among the multiple threads to obtain the i-th thread set.

[0107] In an exemplary embodiment, based on the foregoing scheme, the i-th group of test instructions further includes: the i-th address information corresponding to the i-th database; the sending module 720 is further specifically used to: determine the target server to which the i-th database belongs based on the i-th address information; and send the test configuration data for the i-th database to the target server, so as to concurrently send the test configuration data for the N databases to the database servers to which the N databases belong respectively.

[0108] In an exemplary embodiment, based on the foregoing scheme, the number of target servers to which the i-th database belongs is multiple;

[0109] The aforementioned sending module 720 is further specifically used to: send the test configuration data of the i-th database to the switch, and send the test configuration data of the i-th database to multiple target servers through multiple output interfaces of the switch.

[0110] In an exemplary embodiment, based on the foregoing scheme, the acquisition module 710 is specifically used to: acquire test instructions sent by the terminal regarding the above-mentioned N databases;

[0111] The aforementioned database performance testing device 700 further includes a sending module 750. The acquiring module 740 is configured to: after acquiring the database performance test results sent by the database server, generate a test report based on the database performance test results sent by multiple database servers; and send the test report to the terminal.

[0112] In an exemplary embodiment, based on the foregoing scheme, the performance test includes one or more of stress testing, load testing, and capacity testing.

[0113] Furthermore, the database performance testing apparatus provided in the above embodiments and the database performance testing method embodiments applied to the first computing device belong to the same concept. Therefore, for details not disclosed in the apparatus embodiments of this specification, please refer to the above-described embodiments of the database performance testing method, which will not be repeated here.

[0114] in, Figure 9 This is a schematic diagram of a database performance testing device provided in another embodiment of this specification, specifically configured in the aforementioned database server. The database performance testing device 900 in this embodiment includes: a receiving module 910, a testing module 920, and a sending module 930.

[0115] The receiving module 910 is configured to: receive test configuration data for the i-th database sent by the database performance testing device, wherein the test configuration data for the i-th database belongs to the i-th group of test instructions in N groups of test instructions, the N groups of test instructions are test instructions for N databases, and the test configuration data for the N databases is sent by the database performance testing device based on a concurrent process, where N is an integer greater than 1, and i is an integer from 1 to N, inclusive of 1 and N; the testing module 920 is configured to: perform performance testing on the i-th database according to the test configuration data for the i-th database; and the sending module 930 is configured to: send the performance test results of the i-th database to the database performance testing device.

[0116] In an exemplary embodiment, based on the foregoing scheme, the database server is further used to store the k-th database, where k is a positive integer not equal to i and not greater than N;

[0117] The receiving module 910 is further configured to: receive test configuration data for the k-th database sent by the database performance testing device before performing performance testing on the i-th database based on the test configuration data for the i-th database, wherein the test configuration data for the k-th database belongs to the k-th group of test instructions in the N groups of test instructions.

[0118] The aforementioned test module 920 is specifically used to: simultaneously execute the steps of performing performance testing on the i-th database based on the aforementioned test configuration data for the i-th database, and the steps of performing performance testing on the k-th database based on the aforementioned test configuration data for the k-th database; and the aforementioned sending module 930 is specifically used to: send the performance test results for the i-th database and the performance test results for the k-th database to the aforementioned database performance testing device.

[0119] This specification also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the steps of any of the methods described above.

[0120] Figure 10 This schematic diagram illustrates the structure of an electronic device according to an exemplary embodiment of this specification. Please refer to... Figure 10 As shown, the electronic device 100 includes a processor 1001 and a memory 1002.

[0121] In this embodiment, processor 1001 is the control center of the computer system and can be a processor of a physical machine or a processor of a virtual machine. Processor 1001 may include one or more processing cores, such as a 4-core processor or a 10-core processor. Processor 1001 may be implemented using at least one hardware form selected from Digital Signal Processing (DSP), Field-Programmable Gate Array (FPGA), and Programmable Logic Array (PLA). Processor 1001 may also include a main processor and a coprocessor; the main processor is used to process data in the wake-up state, and the coprocessor is a low-power processor used to process data in the standby state.

[0122] In the embodiments described in this specification, the processor 1001 is configured in the database performance testing device, and the processor 1001 is specifically used for:

[0123] Obtain test instructions for N databases, resulting in N sets of test instructions. The i-th set of test instructions includes: test configuration data for the i-th database, where N is an integer greater than 1, and i is an integer from 1 to N, inclusive of 1 and N; based on concurrent processes, concurrently send the test configuration data for the N databases to the respective database servers of the N databases, so as to perform performance testing on the i-th database according to the test configuration data in the i-th set of test instructions; and obtain the database performance test results sent by the database servers.

[0124] Furthermore, the aforementioned processor 1001 is also specifically used for:

[0125] Before the test configuration data for the above N databases is sent concurrently to the database servers to which the above N databases belong respectively: determine the multiple threads corresponding to the test configuration data for the above i-th database, and obtain the set of the i-th threads;

[0126] The above-mentioned test configuration data for the above N databases is concurrently sent to the database servers to which the above N databases belong, including: based on the above-mentioned i-th thread set, sending the test configuration data for the above i-th database to the database server to which the above i-th database belongs, so as to concurrently send the test configuration data for the above N databases to the database servers to which the above N databases belong.

[0127] Furthermore, the process of determining the multiple threads corresponding to the test configuration data for the i-th database to obtain the i-th thread set includes: determining multiple threads for performance testing of the i-th database based on the test configuration data for the i-th database, and determining the implementation method among the multiple threads to obtain the i-th thread set.

[0128] Furthermore, the aforementioned i-th group of test instructions also includes: the i-th address information corresponding to the aforementioned i-th database;

[0129] The above-mentioned test configuration data for the above N databases is concurrently sent to the database servers to which the above N databases belong, including: determining the target server to which the above i-th database belongs based on the above-mentioned i-th address information; and sending the test configuration data for the above i-th database to the above-mentioned target server, so as to concurrently send the test configuration data for the above N databases to the database servers to which the above N databases belong.

[0130] Furthermore, the number of target servers to which the aforementioned i-th database belongs is multiple;

[0131] The above-mentioned sending of the test configuration data of the i-th database to the target server includes: sending the test configuration data of the i-th database to the switch, and sending the test configuration data of the i-th database to multiple target servers through multiple output interfaces of the switch.

[0132] Furthermore, the above-mentioned acquisition of test instructions regarding N databases includes: acquiring test instructions regarding the aforementioned N databases sent by the terminal;

[0133] The processor 1001 is further configured to: after obtaining the database performance test results sent by the database server, generate a test report based on the database performance test results sent by multiple database servers; and send the test report to the terminal.

[0134] Furthermore, the aforementioned performance tests include one or more of the following: stress testing, load testing, and capacity testing.

[0135] In the embodiments described in this specification, the processor 1001 is configured in the database server, and the processor 1001 is specifically used for:

[0136] The system receives test configuration data for the i-th database sent by a database performance testing device. This test configuration data belongs to the i-th group of test instructions in N groups of test instructions, which are test instructions for N databases. The test configuration data for the N databases is sent by the database performance testing device based on a concurrent process, where N is an integer greater than 1, and i is an integer from 1 to N, inclusive. Based on the test configuration data for the i-th database, the system performs a performance test on the i-th database. Finally, the system sends the performance test results for the i-th database to the database performance testing device.

[0137] Furthermore, the aforementioned database server is also used to store the k-th database, where k is a positive integer not equal to i and not greater than N;

[0138] The processor 1001 is further specifically used to: receive test configuration data for the kth database sent by the database performance testing device before performing performance testing on the i-th database according to the test configuration data for the i-th database, wherein the test configuration data for the k-th database belongs to the k-th group of test instructions in the N groups of test instructions.

[0139] The above-described performance test of the i-th database, based on the test configuration data for the i-th database, includes: simultaneously performing the steps of performing a performance test on the i-th database based on the test configuration data for the i-th database, and performing a performance test on the k-th database based on the test configuration data for the k-th database; and,

[0140] The above-mentioned sending of the performance test results of the i-th database to the database performance testing device includes: sending the performance test results of the i-th database and the performance test results of the k-th database to the database performance testing device.

[0141] Memory 1002 may include one or more computer-readable storage media, which may be non-transitory. Memory 1002 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In some embodiments of this specification, the non-transitory computer-readable storage media in memory 1002 is used to store at least one instruction, which is executed by processor 1001 to implement the methods in the embodiments of this specification.

[0142] In some embodiments, the electronic device 100 further includes a peripheral device interface 1003 and at least one peripheral device. The processor 1001, memory 1002, and peripheral device interface 1003 can be connected via a bus or signal line. Each peripheral device can be connected to the peripheral device interface 1003 via a bus, signal line, or circuit board. Specifically, the peripheral device includes at least one of a display screen 1004, a camera 1005, and an audio circuit 1006.

[0143] Peripheral device interface 1003 can be used to connect at least one input / output (I / O) related peripheral device to processor 1001 and memory 1002. In some embodiments of this specification, processor 1001, memory 1002, and peripheral device interface 1003 are integrated on the same chip or circuit board; in some other embodiments of this specification, any one or two of processor 1001, memory 1002, and peripheral device interface 1003 can be implemented on separate chips or circuit boards. This specification does not specifically limit the embodiments in this regard.

[0144] Display screen 1004 is used to display a user interface (UI). The UI may include graphics, text, icons, videos, and any combination thereof. When display screen 1004 is a touch display screen, it also has the ability to collect touch signals on or above its surface. These touch signals can be input as control signals to processor 1001 for processing. In this case, display screen 1004 can also be used to provide virtual buttons and / or a virtual keyboard, also known as soft buttons and / or a soft keyboard. In some embodiments of this specification, there may be one display screen 1004, which serves as the front panel of the electronic device 100; in other embodiments, there may be at least two display screens 1004, respectively disposed on different surfaces of the electronic device 100 or in a folded design; in still other embodiments, display screen 1004 may be a flexible display screen, disposed on a curved or folded surface of the electronic device 100. Furthermore, display screen 1004 may also be configured as a non-rectangular, irregular shape, i.e., a non-rectangular screen. The display screen 1004 can be made of materials such as liquid crystal display (LCD) and organic light-emitting diode (OLED).

[0145] Camera 1005 is used to capture images or videos. Optionally, camera 1005 includes a front-facing camera and a rear-facing camera. Typically, the front-facing camera is located on the front panel of the electronic device, and the rear-facing camera is located on the back of the electronic device. In some embodiments, there are at least two rear-facing cameras, which are any one of a main camera, a depth-sensing camera, a wide-angle camera, and a telephoto camera, to achieve background blurring by fusion of the main camera and the depth-sensing camera, panoramic shooting by fusion of the main camera and the wide-angle camera, virtual reality (VR) shooting, or other fusion shooting functions. In some embodiments of this specification, camera 1005 may also include a flash. The flash can be a single-color temperature flash or a dual-color temperature flash. A dual-color temperature flash refers to a combination of a warm light flash and a cool light flash, which can be used for light compensation at different color temperatures.

[0146] The audio circuit 1006 may include a microphone and a speaker. The microphone is used to collect sound waves from the user and the environment, and convert the sound waves into electrical signals that are input to the processor 1001 for processing. For stereo sound acquisition or noise reduction purposes, there may be multiple microphones, each located in a different part of the electronic device 100. The microphone may also be an array microphone or an omnidirectional microphone.

[0147] Power supply 1007 is used to supply power to various components in electronic device 100. Power supply 1007 can be alternating current, direct current, a disposable battery, or a rechargeable battery. When power supply 1007 includes a rechargeable battery, the rechargeable battery can be a wired rechargeable battery or a wireless rechargeable battery. A wired rechargeable battery is a battery that is charged via a wired line, while a wireless rechargeable battery is a battery that is charged via a wireless coil. The rechargeable battery can also be used to support fast charging technology.

[0148] The block diagrams of the electronic device shown in the embodiments of this specification do not constitute a limitation on the electronic device 100. The electronic device 100 may include more or fewer components than shown, or combine certain components, or use different component arrangements.

[0149] In the description of this specification, it should be understood that the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Those skilled in the art can understand the specific meaning of these terms in this specification based on the specific circumstances. Furthermore, in the description of this specification, unless otherwise stated, "multiple" means two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship.

[0150] This specification also provides a computer-readable storage medium storing instructions that, when executed on a computer or processor, cause the computer or processor to perform one or more steps in the above embodiments. If the constituent modules of the above-described table recognition and reconstruction device are implemented as software functional units and sold or used as independent products, they can be stored in the aforementioned computer-readable storage medium.

[0151] In the above embodiments, implementation can be achieved, in whole or in part, through software, hardware, firmware, or any combination thereof. When implemented in software, it can be implemented, in whole or in part, as a computer program product. The computer program product includes one or more computer instructions. When these computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of this specification are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in or transmitted through a computer-readable storage medium. The computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, Digital Subscriber Line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium accessible to a computer or a data storage device such as a server or data center that integrates one or more available media. The aforementioned available media can be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media (e.g., Digital Versatile Discs (DVDs)), or semiconductor media (e.g., Solid State Disks (SSDs)).

[0152] This specification also provides a computer-readable storage medium storing instructions that, when executed on a computer or processor, cause the computer or processor to perform one or more steps in the above embodiments. If the constituent modules of the above-described database performance testing apparatus are implemented as software functional units and sold or used as independent products, they can be stored in the aforementioned computer-readable storage medium.

[0153] In the above embodiments, implementation can be achieved, in whole or in part, through software, hardware, firmware, or any combination thereof. When implemented in software, it can be implemented, in whole or in part, as a computer program product. The computer program product includes one or more computer instructions. When these computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of this specification are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in or transmitted through a computer-readable storage medium. The computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, Digital Subscriber Line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium accessible to a computer or a data storage device such as a server or data center that integrates one or more available media. The aforementioned available media can be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media (e.g., Digital Versatile Discs (DVDs)), or semiconductor media (e.g., Solid State Disks (SSDs)).

[0154] It should be noted that the above description describes specific embodiments of this specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims may be performed in a different order than that shown in the embodiments and still achieve the desired results. Furthermore, the processes depicted in the drawings do not necessarily require the specific or sequential order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0155] The above description is merely a specific embodiment of this specification, but the scope of protection of this specification is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this specification should be included within the scope of protection of this specification. Therefore, equivalent variations made in accordance with the claims of this specification are still within the scope of this specification.< / dbname>

Claims

1. A database performance testing method applied to a database performance testing device, the method comprising: obtaining, through a switch, test instructions output by a terminal about N databases, to obtain N groups of test instructions, the i-th group of test instructions comprising test configuration data for the i-th database, N being an integer greater than 1, i being an integer from 1 to N inclusive; based on concurrent processes, sending the test configuration data for the N databases to database servers to which the N databases respectively belong, in a concurrent manner, to perform performance testing on the i-th database according to the test configuration data in the i-th group of test instructions; obtaining database performance testing results sent by the database servers; and wherein the i-th group of test instructions further comprises i-th address information corresponding to the i-th database; and the sending of the test configuration data for the N databases to the database servers to which the N databases respectively belong, in a concurrent manner, comprises: determining, according to the i-th address information, a target server to which the i-th database belongs; sending the test configuration data for the i-th database to the target server, so as to send the test configuration data for the N databases to the database servers to which the N databases respectively belong, in a concurrent manner; and if the number of target servers to which the i-th database belongs is greater than one, sending the test configuration data for the i-th database to the switch, and distributing the test configuration data to the multiple target servers through the switch.

2. The method of claim 1, wherein, Before the sending of the test configuration data for the N databases to the database servers to which the N databases respectively belong, in a concurrent manner, the method further comprises: determining a plurality of threads corresponding to the test configuration data for the i-th database, to obtain an i-th thread set; each thread in the i-th thread set is an actual operating unit in an i-th process corresponding to the i-th database, the i-th process being a process in all concurrent processes for processing and sending the test configuration data for the i-th database; the sending of the test configuration data for the N databases to the database servers to which the N databases respectively belong, in a concurrent manner, comprises: based on the i-th thread set, sending the test configuration data for the i-th database to the database server to which the i-th database belongs, so as to send the test configuration data for the N databases to the database servers to which the N databases respectively belong, in a concurrent manner.

3. The method of claim 2, wherein, The determining of the plurality of threads corresponding to the test configuration data for the i-th database, to obtain the i-th thread set, comprises: determining, according to the test configuration data for the i-th database, a plurality of threads for performing performance testing on the i-th database, and determining an implementation manner between the plurality of threads, to obtain the i-th thread set.

4. The method of claim 1, wherein, The obtaining of the test instructions about the N databases comprises: obtaining test instructions about the N databases sent by a terminal; after the obtaining of the database performance testing results sent by the database servers, the method further comprises: According to the database performance test results sent by the plurality of database servers, a test report is generated and sent to the terminal.

5. The method according to any one of claims 1 to 4, wherein, The performance test includes one or more of a stress test, a load test, and a capacity test. 6.A database performance test method applied to a database server, the database server being configured to store an i-th database, the method comprising: receiving test configuration data for the i-th database sent by a database performance test device, wherein the test configuration data for the i-th database belongs to an i-th group of test instructions in N groups of test instructions, the N groups of test instructions being test instructions for N databases, and the test configuration data for the N databases being sent by the database performance test device based on concurrent processes, N being an integer greater than 1, i being an integer from 1 to N inclusive; performing a performance test on the i-th database according to the test configuration data for the i-th database; sending a performance test result of the i-th database to the database performance test device.

7. The method of claim 6, wherein, The database server is further configured to store a k-th database, k being an integer greater than 0 and not equal to i and not greater than N; Before performing the performance test on the i-th database according to the test configuration data for the i-th database, the method further comprises: receiving test configuration data for the k-th database sent by the database performance test device, the test configuration data for the k-th database belonging to a k-th group of test instructions in the N groups of test instructions; The performance test on the i-th database according to the test configuration data for the i-th database comprises: simultaneously performing the performance test on the i-th database according to the test configuration data for the i-th database and the performance test on the k-th database according to the test configuration data for the k-th database; The sending of the performance test result of the i-th database to the database performance test device comprises: sending the performance test result of the i-th database and the performance test result of the k-th database to the database performance test device.

8. A database performance testing apparatus, wherein, The device comprises: a first obtaining module configured to obtain test instructions for N databases output by a terminal through a switch to obtain N groups of test instructions, an i-th group of test instructions including test configuration data for an i-th database, N being an integer greater than 1, i being an integer from 1 to N inclusive; a sending module configured to send the test configuration data for the N databases to database servers to which the N databases belong respectively based on concurrent processes to perform a performance test on the i-th database according to the test configuration data in the i-th group of test instructions; a second obtaining module configured to obtain database performance test results sent by the database servers; and a sending module configured to send the database performance test results to the terminal. The i-th group of test instructions further comprises i-th address information corresponding to the i-th database; the sending module is further configured to: determine target servers to which the i-th database belongs according to the i-th address information; send test configuration data for the i-th database to the target servers, so as to send test configuration data for the N databases to database servers to which the N databases belong, respectively; if the number of target servers to which the i-th database belongs is more than one, send the test configuration data for the i-th database to a switch, and distribute the test configuration data to the more than one target servers through the switch. 9.A database performance testing apparatus, applied to a database server, the database server being configured to store an i-th database, the apparatus comprising: a receiving module configured to receive test configuration data for the i-th database sent by a database performance testing apparatus, wherein the test configuration data for the i-th database belongs to i-th test instructions in N groups of test instructions, the N groups of test instructions being test instructions for N databases, and the test configuration data for the N databases being sent by the database performance testing apparatus based on a concurrent process, N being an integer greater than 1, and i being an integer ranging from 1 to N inclusive; a testing module configured to perform performance testing on the i-th database according to the test configuration data for the i-th database; a sending module configured to send a performance testing result of the i-th database to the database performance testing apparatus. 10.A computer readable storage medium, having instructions stored therein, which when executed on a computer or a processor, cause the computer or the processor to perform the method of any one of claims 1 to 5, or the method of claim 6 or 7.

11. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein, The processor executes the computer program to implement the method of any one of claims 1 to 5, or the method of claim 6 or 7. 12.A computer program product comprising instructions which, when executed on a computer or a processor, cause the computer or the processor to perform the method of any one of claims 1 to 5, or the method of claim 6 or 7.

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