Method and apparatus for monitoring x-ray machine dosage

Abstract

The application provides a method and device for monitoring the dose of an X-ray machine, the method comprising: obtaining a functional relationship between the dose rate of the X-ray machine at a preset detection position and the exposure parameter of the X-ray machine when the X-ray machine operates at a preset frame rate; calculating the dose rate at a target detection position when the X-ray machine operates at a target frame rate and a target exposure parameter according to the functional relationship, the distance between the preset detection position and the target detection position relative to the focal point of the X-ray machine tube; calculating the cumulative dose of the X-ray machine at the target detection position according to the dose rate and the exposure time of the X-ray machine; and calculating the cumulative dose-area product of the X-ray machine according to the cumulative dose and the field area of the X-ray machine at the target detection position. The method and device for monitoring the dose of the X-ray machine can realize accurate measurement of the dose rate, cumulative dose and cumulative dose-area product of the X-ray machine through software, can balance low cost and high accuracy dose monitoring, and has a wide range of applications.

Description

TECHNICAL FIELD

[0001] Embodiments of the present application relate to the technical field of X-ray photography inspection, and particularly relate to a method and device for monitoring dose of an X-ray machine. BACKGROUND

[0002] At present, X-ray inspection has been widely applied in medical fields such as radiodiagnosis and radiotherapy. However, if it is not used properly or the radiation dose is too large, it will inevitably cause serious harm to the human body and induce diseases such as cancer. Therefore, detecting radiation indicators such as dose area product of a medical digital X-ray machine is of great significance for controlling the radiation dose of patients and reducing the radiation damage to patients.

[0003] In the existing technical solutions, a hardware DAP (Dose Area Products) detection method or a software DAP detection method is usually used to detect the dose area product of a digital X-ray machine. The hardware DAP detection method needs to deploy a large number of detection components and design additional control circuits, so the cost is high and large-scale application is limited. The existing software DAP detection method generally uses a dosimeter to collect exposure radiation dose indicator data under different exposure parameters, and then uses these data to establish a mathematical model of different radiation dose indicators. However, this method has a large error although the detection cost is reduced. SUMMARY

[0004] Embodiments of the present application provide a method and device for monitoring dose of an X-ray machine, which can solve the technical problem of a large error in the software DAP detection method in the prior art and have a low cost.

[0005] In a first aspect, embodiments of the present application provide a method for monitoring dose of an X-ray machine, which comprises:

[0006] obtaining a function relationship between a dose rate of the X-ray machine at a preset detection position and exposure parameters of the X-ray machine when the X-ray machine operates at a preset frame rate;

[0007] calculating a dose rate at a target detection position when the X-ray machine operates at a target frame rate and target exposure parameters according to the function relationship, and distances of the preset detection position and the target detection position relative to a focal point of a tube of the X-ray machine;

[0008] calculating a cumulative dose at the target detection position when the X-ray machine operates at the target frame rate and the target exposure parameters according to the dose rate of the X-ray machine at the target detection position and an exposure time of the X-ray machine;

[0009] According to the accumulated dose and a field area of the X-ray machine at the target detection position, a dose area product of the X-ray machine is calculated.

[0010] In an implementable embodiment, before the function relationship between the dose rate of the X-ray machine at the preset detection position and the exposure parameter of the X-ray machine, when the X-ray machine operates at a preset frame rate, the method further comprises:

[0011] detecting the dose rate of the X-ray machine at the preset detection position when the X-ray machine adopts each set of sampling exposure parameters;

[0012] According to the function relationship between the dose rate of the X-ray machine at the preset detection position and the exposure parameter of the X-ray machine, and the dose rate of the X-ray machine at the preset detection position when the X-ray machine adopts each set of sampling exposure parameters, the function relationship is trained.

[0013] In an implementable embodiment, before the detecting the dose rate of the X-ray machine at the preset detection position when the X-ray machine adopts each set of preset exposure parameters, the method further comprises:

[0014] selecting a plurality of sampling kilovolt values between a minimum kilovolt value and a maximum kilovolt value of the X-ray machine, wherein the sampling interval increases as the kilovolt value increases; and selecting a plurality of sampling milliampere values between a minimum milliampere value and a maximum milliampere value of the X-ray machine, wherein the sampling interval increases as the milliampere value increases;

[0015] Based on the plurality of sampling kilovolt values and the plurality of sampling milliampere values, a plurality of sets of sampling exposure parameters are determined.

[0016] In an implementable embodiment, the calculating the dose rate of the X-ray machine at the target detection position when the X-ray machine operates at a target frame rate and a target exposure parameter according to the function relationship, and distances of the preset detection position and the target detection position relative to a focal point of a tube of the X-ray machine, comprises:

[0017] According to the function relationship, a first dose rate of the X-ray machine at the preset detection position when the X-ray machine operates at the preset frame rate and the target exposure parameter is determined.

[0018] According to the first dose rate, and a first distance of the target detection position relative to the focal point of the tube of the X-ray machine and a second distance of the preset detection position relative to the focal point of the tube of the X-ray machine, a second dose rate of the X-ray machine at the target detection position when the X-ray machine operates at the preset frame rate and the target exposure parameter is determined.

[0019] determining a second dose rate at the target detection position when the X-ray machine is operated at the target frame rate and the target exposure parameter according to the second dose rate.

[0020] In an implementation, the second dose rate at the target detection position when the X-ray machine is operated at the preset frame rate and the target exposure parameter is determined according to the first dose rate, a first distance of the target detection position relative to a focal point of a tube of the X-ray machine, and a second distance of the preset detection position relative to the focal point of the tube of the X-ray machine, including:

[0021] The second dose rate DoseRateTarget at the target detection position when the X-ray machine is operated at the preset frame rate and the target exposure parameter is determined in the following manner: X :

[0022]

[0023] wherein DoseRateTarget represents the second dose rate, SIDTarget represents the target frame rate, TTarget represents an exposure time of each frame of image when the X-ray machine is operated at the target frame rate, RTarget represents the preset frame rate, and TPre represents an exposure time of each frame of image when the X-ray machine is operated at the preset frame rate. R X R

[0024] In an implementation, the dose rate at the target detection position when the X-ray machine is operated at the target frame rate and the target exposure parameter is determined according to the second dose rate, including:

[0025] The dose rate DoseRateTarget at the target detection position when the X-ray machine is operated at the target frame rate and the target exposure parameter is determined in the following manner: Z

[0026]

[0027] wherein DoseRateTarget represents the second dose rate, RTarget represents the target frame rate, TTarget represents an exposure time of each frame of image when the X-ray machine is operated at the target frame rate, RTarget represents the preset frame rate, and TPre represents an exposure time of each frame of image when the X-ray machine is operated at the preset frame rate. X X X R

[0028] In an implementation, the cumulative dose at the target detection position when the X-ray machine is operated at the target frame rate and the target exposure parameter is calculated according to the dose rate of the X-ray machine at the target detection position and an exposure time of the X-ray machine, including:

[0029] ​​​​​​​​The product of the dose rate of the X-ray machine at the target detection position and the exposure time of the X-ray machine is calculated, and the calculated product is determined as the cumulative dose of the X-ray machine at the target detection position when the X-ray machine operates at the target frame rate and the target exposure parameter.

[0030] In an implementation, the calculating the cumulative dose-area product of the X-ray machine according to the cumulative dose and the field area of the X-ray machine at the target detection position comprises:

[0031] The product of the cumulative dose and the field area of the X-ray machine at the target detection position is calculated, and the calculated product is determined as the cumulative dose-area product of the X-ray machine.

[0032] In a second aspect, an embodiment of the present application provides a device for monitoring the dose of an X-ray machine, which comprises:

[0033] An acquisition module is configured to acquire a functional relationship between the dose rate of the X-ray machine at a preset detection position and the exposure parameter of the X-ray machine when the X-ray machine operates at a preset frame rate;

[0034] A first calculation module is configured to calculate the dose rate of the X-ray machine at a target detection position when the X-ray machine operates at a target frame rate and a target exposure parameter according to the functional relationship, and the distances of the preset detection position and the target detection position relative to the focal point of the tube of the X-ray machine;

[0035] A second calculation module is configured to calculate the cumulative dose of the X-ray machine at the target detection position when the X-ray machine operates at the target frame rate and the target exposure parameter according to the product of the dose rate of the X-ray machine at the target detection position and the exposure time of the X-ray machine;

[0036] A third calculation module is configured to calculate the cumulative dose-area product of the X-ray machine according to the cumulative dose and the field area of the X-ray machine at the target detection position.

[0037] In a third aspect, an embodiment of the present application provides an electronic device, which comprises at least one processor and a memory.

[0038] The memory stores computer-executable instructions;

[0039] The at least one processor executes the computer-executable instructions stored in the memory, so that the at least one processor executes the method for monitoring the dose of the X-ray machine provided in the first aspect.

[0040] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, which stores computer-executable instructions, and when a processor executes the computer-executable instructions, the method for monitoring the dose of the X-ray machine provided in the first aspect is implemented.

[0041] The method for monitoring the dose of the X-ray machine provided in the embodiments of the present application calculates the dose rate at the target detection position when the X-ray machine runs at the target frame rate and the target exposure parameter, according to the function relationship between the dose rate of the X-ray machine at the preset detection position and the exposure parameter of the X-ray machine when the X-ray machine runs at the preset frame rate, and the distances of the preset detection position and the target detection position relative to the focal point of the X-ray machine tube. Then, the cumulative dose of the X-ray machine at the target detection position is calculated according to the dose rate of the X-ray machine at the target detection position and the exposure time of the X-ray machine. And the cumulative dose-area product of the X-ray machine is calculated according to the cumulative dose and the field area of the X-ray machine at the target detection position. That is, in the embodiments of the present application, the dose rate, the cumulative dose and the cumulative dose-area product of the X-ray machine can be accurately measured through software without involving additional control circuit, which reduces the monitoring cost of the dose of the X-ray machine, significantly improves the detection accuracy, and can balance low cost and high accuracy, and has a wide range of applications. BRIEF DESCRIPTION OF DRAWINGS

[0042] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the drawings needed to be used in the description of the embodiments of the present application or the prior art will be briefly introduced. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0043] Figure 1 The flowchart of the method for monitoring the dose of the X-ray machine provided in the embodiments of the present application;

[0044] Figure 2 The sub-flowchart of the method for monitoring the dose of the X-ray machine provided in the embodiments of the present application;

[0045] Figure 3 The module diagram of the device for monitoring the dose of the X-ray machine provided in the embodiments of the present application;

[0046] Figure 4 The hardware structure diagram of the electronic device provided in the embodiments of the present application. DETAILED DESCRIPTION

[0047] In order to make the purpose, technical solutions and advantages of the embodiments of the present application more clear, the technical solutions in the embodiments of the present application will be described clearly and completely in the following with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.

[0048] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the drawings are used to distinguish similar objects, and do not necessarily describe a specific order or sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances.

[0049] In addition, the term "comprising" and any variation thereof, is intended to cover not exclusively including, for example, a process, method, system, product or device comprising a series of steps or units, which does not necessarily limit to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0050] At present, the wide application of X-rays in the medical field such as radiodiagnosis and radiotherapy provides an effective method for human beings to explore various diseases. However, in actual use, if it is not used properly or the radiation dose is too large, it is difficult to avoid causing serious harm to the human body and causing various cancer diseases. Therefore, how to detect the radiation indicators such as dose rate, cumulative dose and dose area product of the medical digital X-ray machine has important significance for controlling the radiation dose of patients and reducing the radiation damage of patients.

[0051] At present, the existing technology mainly has hardware DAP detection mode and software DAP detection mode to detect the above-mentioned radiation indicators.

[0052] Among them, the hardware DAP detection mode usually uses a planar rectangular structure, which has 2 detectors, one of which is located at the X-ray center of the planar position for real-time monitoring of the radiation dose of the ray, and the other is located at the X-ray edge of the planar position for capturing the ray range of the planar position. The dose rate, cumulative dose and dose area product are calculated by real-time monitoring of the physical properties of the X-rays passing through the above-mentioned planar rectangular structure.

[0053] The software DAP detection mode usually uses a dosimeter to collect exposure radiation dose indicator data under different exposure parameter conditions, and then uses these data to estimate the mathematical model of different radiation dose indicators. Among them, the existing single-frame DAP modeling method generally selects several exposure parameter combinations of kV and mAs, which cover the entire value range of kV and mAs of the X-ray machine, and then collects the corresponding radiation dose data of the X-ray machine under single-frame radiation conditions when using these exposure parameter combinations by using a dosimeter. By using the relationship between these data and the frame rate of the X-ray machine, a nonlinear relationship model of each radiation dose indicator such as dose rate, cumulative dose, and dose area product with kV and mAs is established.

[0054] However, the above hardware DAP detection method has the advantages of quick deployment, high accuracy and good reliability, but the cost is high, and additional control circuit needs to be designed, so the application range is not wide. The above software DAP detection method has a large error in the fitting model when the mAs value of each frame is small during fluoroscopy, and the kV and mAs data differ by several orders of magnitude.

[0055] To solve the above technical problems, the present application provides a method for monitoring the dose of an X-ray machine. The method calculates the dose rate at a target detection position of the X-ray machine when the X-ray machine is running at a target frame rate and a target exposure parameter, according to the function relationship between the dose rate at a preset detection position of the X-ray machine and the exposure parameter of the X-ray machine when the X-ray machine is running at a preset frame rate, and the distance between the preset detection position and the target detection position relative to the focal point of the X-ray machine tube. Then, the method calculates the cumulative dose at the target detection position of the X-ray machine according to the dose rate at the target detection position of the X-ray machine and the exposure time of the X-ray machine. Finally, the method calculates the cumulative dose-area product of the X-ray machine according to the cumulative dose and the field area of the X-ray machine at the target detection position. The method can balance low cost and high accuracy, and has a wide application range. The following detailed embodiments are described in detail.

[0056] Reference Figure 1 , Figure 1 The flowchart of a method for monitoring the dose of an X-ray machine provided in the embodiments of the present application is shown in the figure. The method includes:

[0057] S101, obtaining the function relationship between the dose rate at a preset detection position of the X-ray machine and the exposure parameter of the X-ray machine when the X-ray machine is running at a preset frame rate.

[0058] In a feasible implementation, a function model between the dose rate and the exposure parameter of the X-ray machine can be established in advance. Several groups of different exposure parameters are selected, each group of exposure parameters including the kilovoltage value kV and the milliampere value mA of the X-ray machine. Then, the X-ray machine is controlled to run at the preset frame rate under each group of different exposure parameters, and the dose meter is used to detect the dose rate at the preset detection position of the X-ray machine when the X-ray machine runs under each group of different exposure parameters.

[0059] After detecting the dose rate data at the preset detection position of the X-ray machine when the X-ray machine runs at the preset frame rate and each group of different exposure parameters, the function model is trained using each group of exposure parameters and the corresponding dose rate of each group of exposure parameters, so that the function relationship between the dose rate DoseRate R and the exposure parameter (kV, mA) of the X-ray machine is obtained:

[0060] DoseRate R =f(kV, mA).

[0061] The preset frame rate can be randomly selected as long as it is within the frame rate range allowed by the X-ray machine, and is not limited in the embodiments of the present application.

[0062] The preset detection position can be any position within the exposure coverage area of the X-ray machine, and is not limited in the embodiments of the present application.

[0063] Optionally, the exposure parameter in each group can further include a kilovoltage value kV and a millisecond value mAs of the X-ray machine.

[0064] S102, according to the function relationship, and the distances of the preset detection position and the target detection position relative to the focal point of the X-ray machine, the dose rate at the target detection position when the X-ray machine operates at the target frame rate and the target exposure parameter is calculated.

[0065] In the embodiments of the present application, after the function relationship is determined, the dose rate at the target detection position when the X-ray machine operates at the target frame rate and the target exposure parameter can be calculated according to the function relationship. Specifically, it includes:

[0066] Step one, according to the function relationship, the first dose rate at the preset detection position when the X-ray machine operates at the preset frame rate and the target exposure parameter is determined.

[0067] In the embodiments of the present application, assuming that the target exposure parameter is (kV0, mA0), the first dose rate DoseRate R at the preset detection position when the X-ray machine operates at the preset frame rate and the target exposure parameter is:

[0068] DoseRate R = f(kV0, mA0)

[0069] Step two, according to the first dose rate, the distance of the target detection position relative to the focal point of the X-ray machine and the distance of the preset detection position relative to the focal point of the X-ray machine, the second dose rate at the target detection position when the X-ray machine operates at the preset frame rate and the target exposure parameter is determined.

[0070] In the embodiments of the present application, assuming that the distance of the target detection position relative to the focal point of the X-ray machine is SID X , and the distance of the preset detection position relative to the focal point of the X-ray machine is SID R , the second dose rate DoseRate X at the target detection position when the X-ray machine operates at the preset frame rate and the target exposure parameter is:

[0071]

[0072] Step three, according to the above second dose rate, determine the dose rate DoseRate of the X-ray machine at the target detection position when the X-ray machine runs at the target frame rate and the target exposure parameter Z is:

[0073]

[0074] wherein R X represents the target frame rate, T X represents the exposure time of each frame image when the X-ray machine runs at the target frame rate R X , R represents the preset frame rate, and T R represents the exposure time of each frame image when the X-ray machine runs at the preset frame rate R.

[0075] It should be noted that there is no execution sequence between the above-mentioned step two and step three, that is, step two can be executed first and then step three, or step three can be executed first and then step two.

[0076] S103, according to the dose rate of the X-ray machine at the target detection position and the exposure time of the X-ray machine, calculate the cumulative dose of the X-ray machine at the target detection position when the X-ray machine runs at the target frame rate and the target exposure parameter.

[0077] In the embodiment of the present application, after determining the dose rate of the X-ray machine at the target detection position when the X-ray machine runs at the target frame rate and the target exposure parameter, the cumulative dose of the target detection position can be determined according to the dose rate, which specifically includes:

[0078] Step one, calculate the exposure time of the X-ray machine.

[0079] Wherein the exposure time of the X-ray machine can be calculated according to the image frame number and frame rate obtained by the X-ray machine, assuming that the X-ray machine runs at the target frame rate R X If N frames of images are obtained by perspective exposure in a certain period of time, the exposure time T of the X-ray machine can be determined as:

[0080]

[0081] Step two, according to the dose rate of the X-ray machine at the target detection position and the exposure time of the X-ray machine, calculate the cumulative dose of the X-ray machine at the target detection position when the X-ray machine runs at the target frame rate and the target exposure parameter.

[0082] In the embodiment of the present application, in a smaller period of time, the dose rate of the X-ray machine at the target detection position is very small, so it can be considered as a constant.

[0083] Assuming that the dose rate of the X-ray machine at the target detection position is DoseRate ZAccDose X is:

[0084] AccDose X = DoseRate Z * T

[0085] S104, according to the above-mentioned cumulative dose and the field area of the X-ray machine at the target detection position, calculate the cumulative dose area product of the X-ray machine.

[0086] In the embodiments of the present application, assuming that the field area of the X-ray machine at the target detection position is S, then the cumulative dose area product AccDap of the X-ray machine when running at the target frame rate and the target exposure parameter X is:

[0087] AccDap X = AccDose X * S

[0088] The method for monitoring the dose of the X-ray machine provided in the embodiments of the present application calculates the dose rate of the X-ray machine when running at the target frame rate and the target exposure parameter, according to the functional relationship between the dose rate of the X-ray machine at the preset detection position and the exposure parameter of the X-ray machine when running at the preset frame rate, and the distances of the preset detection position and the target detection position relative to the focal point of the X-ray machine ball tube, and then calculates the cumulative dose of the X-ray machine at the target detection position according to the dose rate of the X-ray machine at the target detection position and the exposure time of the X-ray machine, and calculates the cumulative dose area product of the X-ray machine according to the cumulative dose and the field area of the X-ray machine at the target detection position. That is, the method for monitoring the dose of the X-ray machine provided in the embodiments of the present application does not need to involve additional control circuits, and the measurement of the dose rate, the cumulative dose and the cumulative dose area product of the X-ray machine can be realized through software, which reduces the cost of dose detection of the X-ray machine, significantly improves the detection accuracy, and can balance low cost and high accuracy, and has a wide range of applications.

[0089] Based on the above-described content in the embodiments, referring to Figure 2 , Figure 2 is a sub-process diagram of a method for monitoring the dose of the X-ray machine provided in the embodiments of the present application. In a feasible implementation manner of the present application, the way of determining the functional relationship between the dose rate of the X-ray machine at the preset detection position and the exposure parameter of the X-ray machine when running at the preset frame rate can include the following steps:

[0090] S201, select a plurality of sampling kilovoltage values between the minimum kilovoltage value and the maximum kilovoltage value of the X-ray machine, and select a plurality of sampling milliamperage values between the minimum milliamperage value and the maximum milliamperage value of the X-ray machine.

[0091] In the embodiments of the present application, m sampling kilovoltage values [kV1, kV2, …, kV m ] are selected at unequal intervals within the range of the minimum and maximum kilovoltage values allowed by the X-ray machine, where kV1 and kV m respectively correspond to the minimum and maximum values of the kilovoltage values that can be set by the X-ray machine; meanwhile, n sampling milliamperage values [mA1, mA2, …, mA n ] are selected at unequal intervals within the range of the minimum and maximum milliamperage values allowed by the X-ray machine, where mA1 and mA n respectively correspond to the minimum and maximum values of the milliamperage values that can be set by the X-ray machine.

[0092] The sampling interval of the kilovoltage values increases as the kilovoltage value increases, and the sampling interval of the milliamperage values increases as the milliamperage mA increases, which can improve the accuracy of the function model training.

[0093] S202, based on the above plurality of sampling kilovoltage values and the plurality of sampling milliamperage values, determine a plurality of groups of sampling exposure parameters.

[0094] In the embodiments of the present application, the plurality of sampling kilovoltage values [kV1, kV2, …, kV m ] and the plurality of sampling milliamperage values [mA1, mA2, …, mA n ] are combined into m×n groups of sampling exposure parameters [(kV1, mA1), (kV1, mA2), …, (kV m , mA n )].

[0095] S203, control the X-ray machine to operate at a preset frame rate, and detect the dose rate at a preset detection position when the X-ray machine adopts each group of exposure parameters.

[0096] In the embodiments of the present application, when the X-ray machine operates at a preset frame rate, the exposure parameters of the X-ray machine are sequentially adjusted to the above-mentioned each group of sampling exposure parameters, and then the dose rate (DoseRate 11 , DoseRate 12 , …, DoseRate mn ) at the preset detection position when the X-ray machine adopts each group of sampling exposure parameters is detected.

[0097] S204, establish a function model between the dose rate and the exposure parameters of the X-ray machine, train the above-mentioned function model according to the above-mentioned each group of sampling exposure parameters and the dose rate at the preset detection position when the X-ray machine adopts each group of sampling exposure parameters, and obtain the function relationship between the dose rate at the preset detection position of the X-ray machine and the exposure parameters of the X-ray machine.

[0098] In the embodiments of the present application, the relationship between the dose rate and the exposure parameters kV and mA can be modeled by using a polynomial fitting method. The highest order of the polynomial kV and mA is evaluated by cross-validation.

[0099] For example, the function model between the dose rate and the exposure parameters of the X-ray machine is established as follows:

[0100] DoseRate R (kV,mA)=P 00 +P 10 *kV+P 01 *mA+P 20 *kV 2 +P 11 *kV*mA+P 02 *mA 2 +P 21 *kV 2 *mA+P 12 *kV*mA 2 +P 03 *kV 3 +P 22 *kV 2 *mA 2 +P 13 *kV*mA 3 +P 04 *mA 4 +P 23 *kV 2 *mA 3 +P 14 *kV*mA 4 +P 05 *mA 5

[0101] wherein DoseRate R (kV,mA) represents the dose rate when the X-ray machine runs at a preset frame rate and the sampling exposure parameters (kV, mA) are used at a preset detection position, P 00 , P 01 , …, P 05 represent 15 coefficients of the function model respectively.

[0102] It should be noted that the order of the function model can be changed according to actual needs.

[0103] The method for monitoring the dose of an X-ray machine provided in the embodiments of the present application trains a functional relationship between the dose rate of the X-ray machine at a preset detection position and the exposure parameters of the X-ray machine by detecting the dose rate of the X-ray machine at the preset detection position when the X-ray machine adopts each set of exposure parameters at a preset frame rate. According to the functional relationship, the dose rate at any target detection position when the X-ray machine operates at a target frame rate and target exposure parameters can be determined, and the cumulative dose and the cumulative dose-area product of the X-ray machine can be accurately calculated.

[0104] Based on the content described in the above embodiments, the embodiments of the present application further provide a device for monitoring the dose of an X-ray machine, which refers to Figure 3 , Figure 3 A program module schematic diagram of a device for monitoring the dose of an X-ray machine provided in the embodiments of the present application is shown in the figure. The device comprises:

[0105] The acquisition module 301 is configured to acquire a functional relationship between the dose rate of the X-ray machine at a preset detection position and the exposure parameters of the X-ray machine when the X-ray machine operates at a preset frame rate.

[0106] The first calculation module 302 is configured to calculate the dose rate at a target detection position when the X-ray machine operates at a target frame rate and target exposure parameters according to the functional relationship, and the distances of the preset detection position and the target detection position relative to the focal point of the X-ray machine tube.

[0107] The second calculation module 303 is configured to calculate the cumulative dose at the target detection position when the X-ray machine operates at the target frame rate and target exposure parameters according to the dose rate of the X-ray machine at the target detection position and the exposure time of the X-ray machine.

[0108] The third calculation module 304 is configured to calculate the cumulative dose-area product of the X-ray machine according to the cumulative dose and the field area of the X-ray machine at the target detection position.

[0109] The device for monitoring the dose of the X-ray machine provided in the embodiments of the present application calculates the dose rate at the target detection position when the X-ray machine operates at the target frame rate and the target exposure parameter, based on the function relationship between the dose rate at the preset detection position and the exposure parameter of the X-ray machine when the X-ray machine operates at the preset frame rate, and the distances of the preset detection position and the target detection position relative to the focal point of the X-ray machine tube, and then calculates the cumulative dose at the target detection position of the X-ray machine according to the dose rate at the target detection position of the X-ray machine and the exposure time of the X-ray machine, and calculates the cumulative dose-area product of the X-ray machine according to the cumulative dose and the field area of the X-ray machine at the target detection position. That is, the device for monitoring the dose of the X-ray machine provided in the embodiments of the present application can realize accurate measurement of the dose rate, the cumulative dose and the cumulative dose-area product of the X-ray machine through software without involving additional control circuit, thereby reducing the cost of dose detection of the X-ray machine, significantly improving the detection accuracy, and being capable of balancing low cost and high accuracy, and having a wide range of applications.

[0110] In an implementable embodiment, the device further comprises a training module configured to:

[0111] When the X-ray machine operates at the preset frame rate, the dose rate of the X-ray machine at the preset detection position is detected when each group of sampling exposure parameters is used; and the function relationship between the dose rate at the preset detection position and the exposure parameter of the X-ray machine is trained according to each group of sampling exposure parameters and the dose rate of the X-ray machine at the preset detection position when each group of sampling exposure parameters is used.

[0112] In an implementable embodiment, the device further comprises a sampling module configured to:

[0113] A plurality of sampling kilovolt values are selected between the minimum kilovolt value and the maximum kilovolt value of the X-ray machine, wherein the sampling interval increases as the kilovolt value increases; and a plurality of sampling milliampere values are selected between the minimum milliampere value and the maximum milliampere value of the X-ray machine, wherein the sampling interval increases as the milliampere value increases.

[0114] Based on the plurality of sampling kilovolt values and the plurality of sampling milliampere values, a plurality of groups of sampling exposure parameters are determined.

[0115] In an implementable embodiment, the first calculation module 302 is specifically configured to:

[0116] According to the function relationship, the first dose rate at the preset detection position when the X-ray machine runs at the preset frame rate and the target exposure parameter is determined; according to the first dose rate, the first distance of the target detection position relative to the focal point of the X-ray machine ball tube and the second distance of the preset detection position relative to the focal point of the X-ray machine ball tube, the second dose rate at the target detection position when the X-ray machine runs at the preset frame rate and the target exposure parameter is determined; and according to the second dose rate, the dose rate at the target detection position when the X-ray machine runs at the target frame rate and the target exposure parameter is determined.

[0117] In a feasible implementation, the second dose rate DoseRate X at the target detection position when the X-ray machine runs at the preset frame rate and the target exposure parameter is determined in the following manner:

[0118]

[0119] wherein DoseRate R represents the first dose rate, SID X represents the first distance, SID R represents the second distance.

[0120] In a feasible implementation, the dose rate DoseRate Z at the target detection position when the X-ray machine runs at the target frame rate and the target exposure parameter is determined in the following manner:

[0121]

[0122] wherein DoseRate X represents the second dose rate, R X represents the target frame rate, T X represents the exposure time of each frame of image when the X-ray machine runs at the target frame rate, R represents the preset frame rate, and T R represents the exposure time of each frame of image when the X-ray machine runs at the preset frame rate.

[0123] In a feasible implementation, the second calculation module 303 is specifically configured to:

[0124] calculate the product of the dose rate of the X-ray machine at the target detection position and the exposure time of the X-ray machine, and determine the calculated product as the cumulative dose at the target detection position when the X-ray machine runs at the target frame rate and the target exposure parameter.

[0125] In a feasible implementation, the third calculation module 304 is specifically configured to:

[0126] The product of the accumulated dose and the field area of the X-ray machine at the target detection position is calculated, and the calculated product is determined as the accumulated dose area product of the X-ray machine.

[0127] It should be noted that the specific implementation of the obtaining module 301, the first calculating module 302, the second calculating module 303, and the third calculating module 304 in the embodiments of the present application can refer to the related content in the method embodiments shown in Figure 1 or Figure 2 The related content in the method embodiments is not repeated here.

[0128] Further, based on the content described in the above embodiments, the embodiments of the present application also provide an electronic device, which includes at least one processor and a memory; wherein the memory stores computer execution instructions; the at least one processor executes the computer execution instructions stored in the memory to realize each step of the method for monitoring the dose of the X-ray machine as described in the above embodiments, and the embodiments are not repeated here.

[0129] In order to better understand the embodiments of the present application, refer to Figure 4 , Figure 4 for a hardware structure schematic diagram of an electronic device provided by the embodiments of the present application.

[0130] As Figure 4 shown, the electronic device 40 of the present embodiment includes a processor 401 and a memory 402; wherein:

[0131] The memory 402 is configured to store computer execution instructions.

[0132] The processor 401 is configured to execute the computer execution instructions stored in the memory to realize each step of the method for monitoring the dose of the X-ray machine as described in the above embodiments, and the embodiments are not repeated here.

[0133] Optionally, the memory 402 can be independent or integrated with the processor 401.

[0134] When the memory 402 is independently arranged, the device further includes a bus 403 for connecting the memory 402 and the processor 401.

[0135] Further, based on the content described in the above embodiments, the embodiments of the present application also provide a computer readable storage medium, which stores computer execution instructions; when the processor executes the computer execution instructions, each step of the method for monitoring the dose of the X-ray machine as described in the above embodiments is realized, and the embodiments are not repeated here.

[0136] In several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other manners. For example, the embodiments of the device described above are merely schematic. For example, the division of the modules is merely logical function division. There can be another division manner for the actual implementation. For example, a plurality of modules or features can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed mutual couplings or direct couplings or communication connections can be indirect couplings or communication connections through some interfaces, devices or modules, and can be electrical, mechanical or in other forms.

[0137] The modules illustrated as separated components can or can not be physically separated, and the components illustrated as modules can or can not be physical units, i.e., can be located in one place, or can be distributed on a plurality of network units. Some or all of the modules can be selected according to actual needs to achieve the purposes of the embodiments.

[0138] In addition, each functional module in each embodiment of the present application can be integrated in one processing unit, or each module can be physically present alone, or two or more modules can be integrated in one unit. The unit of the above modules can be realized in the form of hardware, or in the form of hardware plus software functional unit.

[0139] The integrated modules realized in the form of software functional modules can be stored in a computer readable storage medium. The software functional modules stored in the storage medium include a plurality of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) or a processor (English: processor) to execute some steps of the method described in each embodiment of the present application.

[0140] It should be understood that the processor can be a central processing unit (English: Central Processing Unit, CPU for short), and can also be other general-purpose processors, digital signal processors (English: Digital Signal Processor, DSP for short), application specific integrated circuits (English: Application Specific Integrated Circuit, ASIC for short), etc. The general-purpose processor can be a microprocessor, or the processor can also be any conventional processor, etc. The steps of the method disclosed in the present application can be directly embodied as a hardware processor to execute, or be executed by a combination of hardware and software modules in the processor.

[0141] The memory can include a high-speed RAM memory, and can also include a non-volatile storage NVM, for example at least one disk memory, and can also be a U disk, a mobile hard disk, a read-only memory, a magnetic disk or an optical disk, etc.

[0142] The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For the sake of representation, the bus in the drawings of the present application does not limit to only one bus or one type of bus.

[0143] The storage medium described above can be realized by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk or optical disk. The storage medium can be any available medium that can be accessed by a general-purpose or special-purpose computer.

[0144] An exemplary storage medium is coupled to the processor, so that the processor can read information from the storage medium, and can write information to the storage medium. Of course, the storage medium can also be an integral part of the processor. The processor and the storage medium can be located in an Application Specific Integrated Circuit (ASIC). Of course, the processor and the storage medium can also exist as discrete components in an electronic device or a host device.

[0145] Those of ordinary skill in the art can understand that all or part of the steps of the above-mentioned method embodiments can be completed by program instruction-related hardware. The foregoing program can be stored in a computer-readable storage medium. When the program is executed, the steps of the above-mentioned method embodiments are executed; and the foregoing storage medium includes ROM, RAM, magnetic disk or optical disk and various storage media that can store program codes.

[0146] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, but not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement for part or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for monitoring X-ray machine dose, characterized in that, The method includes: When the X-ray machine is running at a preset frame rate, obtain the functional relationship between the dose rate of the X-ray machine at a preset detection position and the exposure parameters of the X-ray machine; Based on the aforementioned functional relationship, the first dose rate at the preset detection position is determined when the X-ray machine is running at the preset frame rate and target exposure parameters. Based on the first dose rate, and the first distance between the target detection position and the focal point of the X-ray machine tube, and the second distance between the preset detection position and the focal point of the X-ray machine tube, a second dose rate is determined at the target detection position when the X-ray machine is running at the preset frame rate and the target exposure parameters; wherein, the second dose rate at the target detection position is DoseRate. X The expression is: Among them, DoseRate R SID represents the first dose rate. X SID represents the first distance. R Indicates the second distance; Based on the second dose rate, the dose rate at the target detection location is determined when the X-ray machine is operating at the target frame rate and the target exposure parameters; wherein, the dose rate at the target detection location is DoseRate. Z The expression is: Among them, DoseRate X R represents the second dose rate. X T represents the target frame rate. X T represents the exposure time of each frame of the X-ray machine when it operates at the target frame rate, R represents the preset frame rate, and T represents the exposure time of each frame of the X-ray machine. R This indicates the exposure time of each frame of the X-ray machine when it operates at the preset frame rate; Based on the dose rate of the X-ray machine at the target detection location and the exposure time of the X-ray machine, calculate the cumulative dose at the target detection location when the X-ray machine is running at the target frame rate and target exposure parameters; The cumulative dose area of ​​the X-ray machine is calculated based on the cumulative dose and the field area of ​​the X-ray machine at the target detection position.

2. The method according to claim 1, characterized in that, Before acquiring the functional relationship between the dose rate of the X-ray machine at the preset detection position and the exposure parameters of the X-ray machine when the X-ray machine is running at a preset frame rate, the method further includes: When the X-ray machine is running at a preset frame rate, the dose rate of the X-ray machine is detected when each set of sampling exposure parameters is used at the preset detection position. Based on the sampling exposure parameters of each group and the dose rate of the X-ray machine when using each group of sampling exposure parameters at the preset detection position, a functional relationship between the dose rate of the X-ray machine at the preset detection position and the exposure parameters of the X-ray machine is trained.

3. The method according to claim 2, characterized in that, Before detecting the dose rate of the X-ray machine at the preset detection position using each set of preset exposure parameters, the method further includes: Multiple sampling kV values ​​are selected between the minimum and maximum kV values ​​of the X-ray machine, wherein the sampling interval increases as the kV value increases; and multiple sampling milliampere values ​​are selected between the minimum and maximum milliampere values ​​of the X-ray machine, wherein the sampling interval increases as the milliampere value increases. Based on the multiple sampled kilovolt values ​​and the multiple sampled milliampere values, several sets of sampling exposure parameters are determined.

4. The method according to claim 1, characterized in that, The step of calculating the cumulative dose at the target detection location based on the dose rate of the X-ray machine at the target detection location and the exposure time of the X-ray machine includes: Calculate the product of the dose rate of the X-ray machine at the target detection location and the exposure time of the X-ray machine, and determine the calculated product as the cumulative dose at the target detection location when the X-ray machine is running at the target frame rate and the target exposure parameters; The step of calculating the cumulative dose-area product of the X-ray machine based on the cumulative dose and the field area of ​​the X-ray machine at the target detection location includes: The product of the cumulative dose and the field area of ​​the X-ray machine at the target detection position is calculated, and the calculated product is determined as the cumulative dose-area product of the X-ray machine.

5. A device for monitoring X-ray machine dose, characterized in that, The device includes: The acquisition module is used to acquire the functional relationship between the dose rate of the X-ray machine at a preset detection position and the exposure parameters of the X-ray machine when the X-ray machine is running at a preset frame rate; A first calculation module is configured to determine, based on the functional relationship, a first dose rate at a preset detection position when the X-ray machine operates at the preset frame rate and target exposure parameters; and, based on the first dose rate, a first distance between the target detection position and the X-ray machine tube focal spot, and a second distance between the preset detection position and the X-ray machine tube focal spot, a second dose rate at the target detection position when the X-ray machine operates at the preset frame rate and target exposure parameters; wherein, the second dose rate at the target detection position is DoseRate. X The expression is: Among them, DoseRate R SID represents the first dose rate. X SID represents the first distance. R The second distance is represented; based on the second dose rate, the dose rate at the target detection location is determined when the X-ray machine is running at the target frame rate and the target exposure parameters; wherein, the dose rate at the target detection location is DoseRate. Z The expression is: Among them, DoseRate X R represents the second dose rate. X T represents the target frame rate. X T represents the exposure time of each frame of the X-ray machine when it operates at the target frame rate, R represents the preset frame rate, and T represents the exposure time of each frame of the X-ray machine. R This indicates the exposure time of each frame of the X-ray machine when it operates at the preset frame rate; The second calculation module is used to calculate the cumulative dose at the target detection location when the X-ray machine is running at the target frame rate and target exposure parameters, based on the dose rate of the X-ray machine at the target detection location and the exposure time of the X-ray machine. The third calculation module is used to calculate the cumulative dose-area product of the X-ray machine based on the cumulative dose and the field area of ​​the X-ray machine at the target detection position.

6. An electronic device, characterized in that, include: At least one processor and memory; The memory stores computer-executed instructions; The at least one processor executes computer execution instructions stored in the memory, causing the at least one processor to perform the method for monitoring X-ray machine dose as described in any one of claims 1 to 4.

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions, which, when executed by a processor, implement the method for monitoring X-ray machine dose as described in any one of claims 1 to 4.

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