Discharge Location Imaging Method and Device Based on Sparse Pixel Intensity Vector Analysis

Abstract

A discharge positioning imaging method and device based on sparse pixel intensity vector analysis are disclosed. In the method, a visible light image of a detection field of view is collected, and the visible light image is regionally segmented according to the corresponding positions of the units of an n×n avalanche photodiode array to form a field of view segmentation region. The detection field of view is globally scanned using the far-focus mode of the lens. The discharge point of the discharge photons falls on a certain pixel of the avalanche photodiode array. When the response intensity of the unit in the avalanche photodiode array exceeds the noise threshold, it is determined that a discharge is occurring in the field of view segmentation region, and the corresponding region of the pixel is selected as the preliminary screening region of the discharge source. The lens is aligned with the preliminary screening region, and the discharge photons are secondarily detected using the near-focus mode of the lens, and the response intensity of each pixel of the avalanche photodiode array is recorded. The sum of the intensities of adjacent 2×2 pixel arrays is calculated, and the position of the largest adjacent 2×2 pixels is searched. The position coordinates of the discharge point are obtained through a vector superposition algorithm.

Description

Technical Field

[0001] The present invention belongs to the technical field of partial discharge detection, and particularly relates to a discharge positioning imaging method and device based on sparse pixel intensity vector analysis. Background Art

[0002] At present, an ultraviolet imager is an important detection device for partial discharge detection in the power industry. It has good detection accuracy and intuitiveness. However, due to the high hardware costs, large volume and weight of components such as ultraviolet lenses, microchannel plates (MCPs), and high-pixel arrays (CCDs or CMOSs), the detection cost of discharge positioning imaging is also very high, making it difficult to be popularized and applied in airborne and portable patrol inspections. Existing discharge positioning imaging often requires the use of MCP and CCD image arrays with hundreds of thousands or even millions of pixels, resulting in high costs, large volume and weight for ultraviolet discharge imaging.

[0003] The above information disclosed in the background art section is only used to enhance the understanding of the background of the present invention, and thus may include information that does not constitute the prior art known to those of ordinary skill in the art. Summary of the Invention

[0004] The purpose of the present invention is to provide a discharge positioning imaging method and device based on sparse pixel intensity vector analysis, which uses a visible light lens and an avalanche photodiode array to perform visual detection of discharge-type faults in power equipment through sparse pixel intensity vector analysis, overcoming existing deficiencies, significantly reducing costs, volume and weight, and having a fast detection speed and high accuracy.

[0005] To achieve the above purpose, the present invention provides the following technical solutions:

[0006] A discharge positioning imaging method based on sparse pixel intensity vector analysis of the present invention includes:

[0007] In the first step, a visible light image of the detection field of view is collected. The visible light image is segmented into field of view segmentation regions according to the corresponding positions of each unit of the n×n avalanche photodiode array. The detection field of view is globally scanned using the telephoto mode of the lens. The discharge point of the discharge photons falls on a certain pixel of the avalanche photodiode array. When the response intensity of the unit in the avalanche photodiode array exceeds the noise threshold, it is determined that a discharge is occurring in the field of view segmentation region, and the corresponding region of the pixel is selected as the preliminary screening region of the discharge source.

[0008] In the second step, the lens is aligned with the preliminary screening region, and the discharge photons are secondarily detected using the close-focus mode of the lens, and the response intensity of each pixel of the avalanche photodiode array is recorded.

[0009] In the third step, the sum of the intensities of adjacent 2×2 pixel arrays is calculated, and the position of the largest adjacent 2×2 pixels is searched.

[0010] In the fourth step, the position coordinates of the discharge point are obtained by a vector superposition algorithm. Among them, taking the response intensity of the pixel as the length of the vector, the vector direction is determined by the pixel coordinates and the center position of the square formed by the largest adjacent 2×2 pixels, and a vector diagram is generated and vector addition is performed to determine the position of the discharge point.

[0011] In the described discharge positioning imaging method based on sparse pixel intensity vector analysis, the visible light image array collects the visible light image of the detection field of view. Both the visible light image array and the avalanche photodiode array are matched and fused with the field of view of the lens, and are kept synchronized during lens focusing.

[0012] In the described discharge positioning imaging method based on sparse pixel intensity vector analysis, by spatially scaling the field of view of the lens, the coordinates of each pixel on the avalanche photodiode array are projected one-to-one onto the visible light image captured by the lens.

[0013] In the described discharge positioning imaging method based on sparse pixel intensity vector analysis, when searching for the position of the largest adjacent 2×2 pixel array, the sum of the intensities of each adjacent 2×2 pixel in the avalanche photodiode array is calculated to obtain S a，b = I 1，1 + I 1，2 + I 2，1 + I 2，2 , where a = 1:n - 1, b = 1:n - 1, and the pixel S of the maximum value of the sum of the intensities of adjacent 2×2 pixels is calculated x，y = max(S a，b ).

[0014] In the described discharge positioning imaging method based on sparse pixel intensity vector analysis, with the geometric center of the square formed by pixel S x，y as the origin and the diagonal as the axis, a rectangular coordinate system X - Y is established; vectors are established in the rectangular coordinate system with the intensities of 2×2 pixels and the corresponding coordinate position (j, k) of the vector sum is calculated as the position of the discharge point.

[0015] In the described discharge positioning imaging method based on sparse pixel intensity vector analysis, in the fifth step, the position of the discharge point is mapped to the corresponding position on the visible light image and marked to visualize the discharge on the visible light image.

[0016] A discharge positioning device for implementing the described discharge positioning imaging method based on sparse pixel intensity vector analysis includes

[0017] A variable - focus lens module that collects the visible light image of the detection field of view;

[0018] A spectroscopic system that faces the zoom lens module to split the visible light image;

[0019] A visible light imaging matrix that faces the spectroscopic system;

[0020] An imaging module that connects to the visible light imaging matrix;

[0021] An avalanche photodiode array that faces the spectroscopic system such that the discharge point of the discharging photons falls on a certain pixel of the avalanche photodiode array;

[0022] A signal amplification and processing unit that connects to the avalanche photodiode array;

[0023] A multi-channel signal acquisition unit that connects to the signal amplification and processing unit;

[0024] A central processing unit that connects to the avalanche photodiode array, the imaging module, and the zoom lens module, generates the field-of-view segmentation region, determines that there is a discharge occurring in the field-of-view segmentation region when the response intensity of the unit in the avalanche photodiode array exceeds the noise threshold, selects the corresponding region of the pixel as the initial screening region of the discharge source, controls the zoom lens module to align with the initial screening region, uses the near-focus mode of the lens to perform secondary detection on the discharging photons, records the response intensity of each pixel of the avalanche photodiode array, and determines the position of the discharge point through the vector superposition algorithm.

[0025] In the described discharge positioning device, the avalanche photodiode array includes a solar-blind SiC avalanche photodiode, the quantum efficiency in the ultraviolet band is not less than 20%, and the photoelectric gain in the ultraviolet band is not less than 10 6 .

[0026] In the described discharge positioning device, there is also an image display unit that connects to the central processing unit, and the image display unit visualizes the discharge on the visible light image.

[0027] In the described discharge positioning device, the zoom lens module and the spectroscopic system are replaced by a binocular lens group that respectively cooperates with the visible light imaging array and the avalanche photodiode array.

[0028] In the above technical solution, a discharge positioning imaging method based on sparse pixel intensity vector analysis provided by the present invention has the following beneficial effects: The present invention solves the problems of high cost, large volume and weight of traditional ultraviolet discharge imaging, no longer relies on MCP and high-pixel arrays, and only through an array composed of a limited number of avalanche diodes, it can achieve the function of miniaturized and low-cost discharge visualization positioning. It has a broad application prospect in the operation and maintenance of power equipment, line inspection, live detection and on-line monitoring. Description of the Drawings

[0029] To more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments recorded in the present invention. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings.

[0030] Figure 1 Schematic diagram of region segmentation of a visible light image to form a field-of-view segmentation region for an embodiment of the discharge location imaging method based on sparse pixel intensity vector analysis in the present invention;

[0031] Figure 2 Schematic diagram of searching for the maximum value of the sum of adjacent 2×2 pixel intensities for an embodiment of the discharge location imaging method based on sparse pixel intensity vector analysis in the present invention;

[0032] Figure 3 Schematic diagram of calculating the intensity vector of the discharge coordinate position for an embodiment of the discharge location imaging method based on sparse pixel intensity vector analysis in the present invention;

[0033] Figure 4 Schematic diagram of mapping the discharge location coordinate position into the visible light image for an embodiment of the discharge location imaging method based on sparse pixel intensity vector analysis in the present invention;

[0034] Figure 5 Schematic flow chart of an embodiment of implementing the discharge location imaging method based on sparse pixel intensity vector analysis in the present invention;

[0035] Figure 6 Schematic connection diagram of the discharge location device for implementing the discharge location imaging method of sparse pixel intensity vector analysis in the present invention. Detailed implementation manners

[0036] To make the purposes, technical solutions, and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of the present invention.

[0037] Accordingly, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the scope of protection of the present invention.

[0038] It should be noted that like reference numerals and letters denote like items in the following figures, and thus, once an item is defined in one figure, it is not necessary to further define and explain it in subsequent figures.

[0039] In the description of the present invention, it should be understood that the orientation or positional relationship indicated by the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation of the present invention.

[0040] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "a plurality of" means two or more unless otherwise specifically defined.

[0041] In the present invention, unless otherwise clearly defined and limited, the terms "mounted", "connected", "coupled", "fixed", etc. shall be construed in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be directly connected, or indirectly connected through an intermediate medium, and it may be the internal communication of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0042] In the present invention, unless otherwise clearly specified and defined, the first feature being "above" or "below" the second feature may include direct contact between the first and second features, or may include the situation where the first and second features are not in direct contact but in contact through additional features therebetween. Moreover, the first feature being "above", "over" and "on top of" the second feature includes the first feature being directly above and obliquely above the second feature, or merely indicating that the horizontal height of the first feature is higher than that of the second feature. The first feature being "below", "beneath" and "underneath" the second feature includes the first feature being directly below and obliquely below the second feature, or merely indicating that the horizontal height of the first feature is less than that of the second feature.

[0043] To enable those skilled in the art to better understand the technical solution of the present invention, the following will further introduce the present invention in detail in conjunction with the attached Figures 1 to 6 drawings.

[0044] A discharge location imaging method based on sparse pixel intensity vector analysis includes,

[0045] The first step: Collect visible light images of the detection field of view, perform regional segmentation on the visible light images according to the corresponding positions of each unit of the n×n avalanche photodiode array to form a field of view segmentation region, use the telephoto mode of the lens to globally scan the detection field of view. The discharge point of the discharge photons falls on a certain pixel of the avalanche photodiode array. When the response intensity of the unit in the avalanche photodiode array exceeds the noise threshold, it is determined that a discharge is occurring in the field of view segmentation region, and the corresponding region of the pixel is selected as the preliminary screening region of the discharge source;

[0046] The second step: Align the lens with the preliminary screening region, use the close-focus mode of the lens to perform secondary detection on the discharge photons, and record the response intensity of each pixel of the avalanche photodiode array;

[0047] The third step: Calculate the sum of the intensities of adjacent 2×2 pixel arrays and search for the position of the largest adjacent 2×2 pixels;

[0048] The fourth step: Solve the position coordinates of the discharge point through a vector superposition algorithm. Among them, taking the response intensity of the pixel as the length of the vector, determine the vector direction through the center position of the square formed by the pixel coordinates and the largest adjacent 2×2 pixels, generate a vector diagram and perform vector addition to determine the position of the discharge point.

[0049] In a preferred embodiment of the described discharge location imaging method based on sparse pixel intensity vector analysis, a visible light image array collects visible light images of the detection field of view. Both the visible light image array and the avalanche photodiode array are matched and fused with the field of view of the lens and remain synchronized when the lens is focused.

[0050] In a preferred embodiment of the discharge positioning imaging method based on sparse pixel intensity vector analysis, by performing spatial scaling on the lens field of view, the coordinates of each pixel on the avalanche photodiode array are projected onto the visible light image captured by the lens in a one-to-one correspondence.

[0051] In a preferred embodiment of the discharge positioning imaging method based on sparse pixel intensity vector analysis, when searching for the position of the largest adjacent 2×2 pixel array, calculate the sum of the intensities of each adjacent 2×2 pixel in the avalanche photodiode array to obtain S a，b = I 1，1 + I 1，2 + I 2，1 + I 2，2 , where a = 1:n - 1, b = 1:n - 1, and calculate the pixel S corresponding to the maximum value of the sum of the intensities of adjacent 2×2 pixels x，y = max(S a，b ).

[0052] In a preferred embodiment of the discharge positioning imaging method based on sparse pixel intensity vector analysis, with the geometric center of the square formed by pixels S x，y as the origin and the diagonal as the axis, establish a rectangular coordinate system X - Y; establish a vector with the intensities of 2×2 pixels in the rectangular coordinate system and calculate the corresponding coordinate position (j, k) of the vector sum as the position of the discharge point.

[0053] In a preferred embodiment of the discharge positioning imaging method based on sparse pixel intensity vector analysis, in the fifth step, map the position of the discharge point to the corresponding position on the visible light image and perform annotation to visualize the discharge on the visible light image.

[0054] In one embodiment, the method is implemented based on a discharge positioning device of an avalanche photodiode array and is performed according to the following steps:

[0055] Step S1: Divide the visible light image into field - of - view segmentation regions x according to the corresponding positions of each unit of the n×n avalanche photodiode array i，j , as Figure 1 shown.

[0056] Step S2: Adjust the lens focal length to enter the telephoto mode and perform a preliminary screening of the discharge position. Project the discharge photon signals within a larger field of view onto the avalanche photodiode array through the lens. When the response intensity I′ i，j of a certain unit of the avalanche photodiode array exceeds the noise threshold, it indicates that the corresponding field - of - view segmentation region x i，jDischarge is occurring. At this time, adjust the lens angle so that the discharge signal area is exactly near the center of the field of view. Then, adjust the lens focal length to enter the close-up mode so that the discharge photon signal is projected onto the avalanche photodiode array through the lens, causing the response intensity of multiple diodes to exceed the noise threshold. Record the light pulse intensity of each corresponding area of the avalanche diode at this time as I i，j .

[0057] Step S3: Calculate the sum of the intensities of each adjacent 2×2 pixel in the avalanche photodiode array to obtain S a，b =I 1，1 +I 1，2 +I 2，1 +I 2，2 (a = 1:n - 1, b = 1:n - 1), calculate the maximum value S x，y = max(S a，b ), as Figure 2 shown.

[0058] Step S4: Take the geometric center of the square area composed of S x，y pixels as the origin, and take the diagonal as the axis to establish a rectangular coordinate system (X - Y); establish vectors with the intensities of each 2×2 pixel in the coordinate system and calculate the corresponding coordinate positions (j, k) of the vector sum, as Figure 3 shown.

[0059] Step S5: Map the discharge positioning coordinate positions (j, k) to the corresponding positions on the visible light image and perform annotation to obtain the discharge visualization effect on the visible light image, as Figure 4 shown.

[0060] In the embodiment, refer to Figure 5 , use the long - focus mode of the lens to perform a global scan of the detection field of view. The discharge point will fall on a certain pixel of the avalanche photodiode array. By comparing with the threshold, determine whether discharge occurs and select the corresponding area of this pixel as the preliminary screening area of the discharge source;

[0061] Aim the lens at the preliminary screening area of the discharge source, use the close - focus mode of the lens to perform secondary detection of the discharge photons in the target area, and record the response intensity of each pixel in the array;

[0062] Calculate the sum of the intensities of the adjacent 2×2 pixel arrays and search for the position of the largest adjacent 2×2 pixel array;

[0063] Solve the position coordinates of the discharge point through the vector superposition algorithm, that is, take the response intensity of the pixel as the length of the vector, determine the vector direction through the pixel coordinates and the position of the mid - point of the square, make a vector diagram and perform vector addition to determine the position of the discharge point.

[0064] In the specific implementation, the visible light image array and the avalanche photodiode array are matched and fused with the field of view of the lens, and are synchronized when the lens is focused. By spatially scaling the camera's field of view, it is ensured that the coordinates of each pixel on the array can be projected onto the visible light image captured by the camera, and there should be a one-to-one corresponding matching relationship between the two.

[0065] As Figure 6 shown, a discharge positioning device for implementing a discharge positioning imaging method based on sparse pixel intensity vector analysis includes

[0066] a variable-focus lens module that collects visible light images of the detection field of view;

[0067] a beam splitting system that faces the variable-focus lens module to split the visible light image;

[0068] a visible light imaging matrix that faces the beam splitting system;

[0069] an imaging module that is connected to the visible light imaging matrix;

[0070] an avalanche photodiode array that faces the beam splitting system such that the discharge point of the discharge photons falls on a certain pixel of the avalanche photodiode array;

[0071] a signal amplification and processing unit that is connected to the avalanche photodiode array;

[0072] a multi-channel signal acquisition unit that is connected to the signal amplification and processing unit;

[0073] a central processing unit that is connected to the avalanche photodiode array, the imaging module, and the variable-focus lens module, generates the field of view segmentation region, when the response intensity of the unit in the avalanche photodiode array exceeds the noise threshold, determines that there is a discharge occurring in the field of view segmentation region, selects the corresponding region of the pixel as the preliminary screening region of the discharge source, controls the variable-focus lens module to align with the preliminary screening region, uses the near-focus mode of the lens to perform secondary detection on the discharge photons, records the response intensity of each pixel of the avalanche photodiode array, and determines the position of the discharge point through the vector superposition algorithm.

[0074] In a preferred embodiment of the described discharge positioning device, the avalanche photodiode array includes a solar-blind SiC avalanche photodiode, the quantum efficiency in the ultraviolet band is not less than 20%, and the photoelectric gain in the ultraviolet band is not less than 10 6 .

[0075] In a preferred embodiment of the described discharge positioning device, it further includes an image display unit that is connected to the central processing unit, and the image display unit visualizes the discharge on the visible light image.

[0076] In a preferred embodiment of the described discharge positioning device, the zoom lens module and the beam splitting system are replaced by a binocular lens group respectively cooperating with a visible light imaging array and an avalanche photodiode array. Whether it is the zoom lens and the beam splitting optical path system or the binocular lens group, the size of the imaging focal plane of the lens should match the size of the visible light imaging array and the size of the avalanche photodiode array.

[0077] The avalanche photodiode array is composed of avalanche photodiodes. Preferably, solar-blind SiC avalanche photodiodes are used and satisfy: the quantum efficiency in the ultraviolet band is not less than 20%, and the optical gain in the ultraviolet band is not less than 10 6 . The response intensity I' of each unit of the avalanche photodiode array i，j or the optical pulse intensity I i，j both refer to the average value of the optical pulse intensity per unit time or the total sum of the pulse intensities within a period of time.

[0078] Finally, it should be noted that: the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts belong to the scope of protection of the present application.

[0079] Only some exemplary embodiments of the present invention have been described by way of illustration above. Undoubtedly, for those of ordinary skill in the art, the described embodiments can be modified in various different ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of the claims of the present invention.

Claims

1. A discharge location imaging method based on sparse pixel intensity vector analysis, characterized in that It includes the following steps: In the first step, a visible light image of the detection field of view is collected. The visible light image is segmented into field of view segmentation regions according to the corresponding positions of the units of the n×n avalanche photodiode array. The detection field of view is globally scanned using the telephoto mode of the lens. The discharge point of the discharge photons falls on a certain pixel of the avalanche photodiode array. When the response intensity of the unit in the avalanche photodiode array exceeds the noise threshold, it is determined that there is a discharge occurring in the field of view segmentation region, and the corresponding region of the pixel is selected as the preliminary screening region of the discharge source; In the second step, the lens is aligned with the preliminary screening region, and the discharge photons are secondarily detected using the close-focus mode of the lens, and the response intensity of each pixel of the avalanche photodiode array is recorded; In the third step, calculate the sum of the intensities of adjacent 2×2 pixel arrays, and search for the position of the largest adjacent 2×2 pixel. When searching for the position of the largest adjacent 2×2 pixel array, calculate the sum of the intensities of each adjacent 2×2 pixel in the avalanche photodiode array to obtain , where a = 1:n-1 and b = 1:n-1, and calculate the pixel with the maximum sum of the intensities of adjacent 2×2 pixels ; In the fourth step, the position coordinates of the discharge point are obtained by means of a vector superposition algorithm. Herein, taking the response intensity of the pixel as the length of the vector, the vector direction is determined by the pixel coordinates and the center position of the square formed by the largest adjacent 2×2 pixels, a vector diagram is generated and vector addition is performed to determine the position of the discharge point. Herein, taking the geometric center of the formed square as the origin, taking the diagonal as the axis, a rectangular coordinate system X-Y is established; vectors are established in the rectangular coordinate system with the intensities of the 2×2 pixels , and the corresponding coordinate positions of the vector sum are calculated as the position of the discharge point.

2. The discharge positioning imaging method based on sparse pixel intensity vector analysis according to claim 1, wherein, The visible light image array collects the visible light image of the detection field of view. The visible light image array and the avalanche photodiode array are both matched and fused with the field of view of the lens and kept synchronized when the lens is focused.

3. A discharge positioning imaging method based on sparse pixel intensity vector analysis according to claim 1, characterized in that By spatially scaling the field of view of the lens, the coordinates of each pixel on the avalanche photodiode array are projected onto the visible light image captured by the lens one by one.

4. A discharge location imaging method based on sparse pixel intensity vector analysis according to claim 1, characterized in that, In the fifth step, the position of the discharge point is mapped to the corresponding position on the visible light image and marked to visualize the discharge on the visible light image.

5. A discharge positioning device for implementing the discharge positioning imaging method based on sparse pixel intensity vector analysis according to any one of claims 1-4, characterized in that, It includes a zoom lens module that collects the visible light image of the detection field of view; a beam splitting system that faces the zoom lens module to split the visible light image; a visible light imaging matrix that faces the beam splitting system; an imaging module that is connected to the visible light imaging matrix; an avalanche photodiode array that faces the beam splitting system so that the discharge point of the discharge photons falls on a certain pixel of the avalanche photodiode array; a signal amplification and processing unit that is connected to the avalanche photodiode array; a multi-channel signal acquisition unit that is connected to the signal amplification and processing unit; a central processing unit that is connected to the avalanche photodiode array, the imaging module, and the zoom lens module. It generates the field of view segmentation region. When the response intensity of the unit in the avalanche photodiode array exceeds the noise threshold, it is determined that there is a discharge occurring in the field of view segmentation region, and the corresponding region of the pixel is selected as the preliminary screening region of the discharge source. It controls the zoom lens module to align with the preliminary screening region, secondarily detects the discharge photons using the close-focus mode of the lens, records the response intensity of each pixel of the avalanche photodiode array, and determines the position of the discharge point through a vector superposition algorithm.

6. The discharge positioning device according to claim 5, characterized in that, The avalanche photodiode array includes a solar-blind SiC avalanche photodiode, with a quantum efficiency in the ultraviolet band of not less than 20% and a photoelectric gain in the ultraviolet band of not less than 10 6 .

7. The discharge positioning device according to claim 5, wherein, It further includes an image display unit that is connected to the central processing unit, and the image display unit visualizes the discharge on the visible light image.

8. The discharge positioning device according to claim 5, wherein, The zoom lens module and the beam splitting system are replaced with a binocular lens group that respectively cooperates with the visible light imaging array and the avalanche photodiode array.

Images