An automatic testing method for IPMI instructions, single chip microcomputer and related devices

Abstract

The present application discloses an automatic test method for IPMI instructions, a single-chip microcomputer and related devices, which are used to improve the test efficiency of IPMI instructions. The automatic test method of the present application includes: obtaining generation information of at least two IPMI test instructions; generating a first simulated keyboard signal according to the first generation information of the first IPMI test instruction; sending the first simulated keyboard signal to the baseboard management controller BMC of the server to be tested, so that the BMC of the server to be tested generates and executes the first IPMI test instruction according to the first simulated keyboard signal; obtaining the first parameter returned by the BMC of the server to be tested; determining the first test result of the first test item of the BMC of the server to be tested according to the first parameter; generating a second simulated keyboard signal according to the second generation information of the second IPMI test instruction; determining the second test result of the second test item of the BMC of the server to be tested according to the second simulated keyboard signal.

Description

Technical Field

[0001] The present application relates to the field of server testing, and in particular to an automatic testing method for IPMI instructions, a single chip microcomputer and related devices. Background Art

[0002] During the development and subsequent maintenance of server products, the Baseboard Manager Controller (BMC) version changes frequently. BMC needs to be tested before it can be put into use. The most important and tedious part of BMC testing is IPMI command testing.

[0003] The Intelligent Platform Management Interface (IPMI) test is mainly used to test the settings and read items of different versions of BMC, and is used to verify whether the expansion and switching of the settings and read items of BMC are in a normal state. In the prior art, technicians are usually required to input IPMI commands one by one to perform corresponding BMC tests. Since the settings and read items of BMC are complicated, the manual testing procedure is cumbersome, time-consuming, and the testing efficiency is low. Summary of the invention

[0004] The present application provides an automatic testing method for IPMI instructions, a single chip microcomputer and related devices, which are used to improve the testing efficiency of IPMI instructions.

[0005] The first aspect of the present application provides an automated testing method for IPMI instructions, comprising:

[0006] The single chip microcomputer obtains generation information of at least two IPMI test instructions;

[0007] The single chip microcomputer generates a first simulated keyboard signal according to first generation information of the first IPMI test instruction;

[0008] The single-chip computer sends the first simulated keyboard signal to the baseboard management controller BMC of the server to be tested, so that the BMC of the server to be tested generates and executes the first IPMI test instruction according to the first simulated keyboard signal;

[0009] The single chip microcomputer obtains a first parameter returned by the BMC of the server to be tested;

[0010] The single-chip computer determines a first test result of a first test item of the BMC of the server to be tested according to the first parameter, where the first test item is a test item corresponding to the first IPMI test instruction;

[0011] The single chip microcomputer generates a second simulated keyboard signal according to second generation information of the second IPMI test instruction;

[0012] The single chip computer determines a second test result of a second test item of the BMC of the server to be tested according to the second simulated keyboard signal, where the second test item is the test item corresponding to the second IPMI test instruction.

[0013] Optionally, the single chip computer determines, according to the first parameter, a first test result of a first test item of the BMC of the server to be tested, including:

[0014] The single chip microcomputer obtains a first preset parameter of the BMC of the server to be tested;

[0015] The single chip computer determines whether the difference between the first parameter and the first preset parameter is less than a preset threshold;

[0016] If yes, the single chip microcomputer determines that the first item to be tested is running normally;

[0017] If not, the single chip microcomputer determines that the first item to be tested is not running normally.

[0018] Optionally, after the single chip computer determines a second test result of a second test item of the BMC of the server to be tested, the method further includes:

[0019] The single chip microcomputer integrates the first test result and the second test result and outputs them to a liquid crystal display screen of the single chip microcomputer for display.

[0020] Optionally, after the single chip microcomputer sends the first simulated keyboard signal to the BMC of the server to be tested, the method further includes:

[0021] The BMC of the server to be tested performs security authentication on the single-chip microcomputer;

[0022] If the security authentication passes, the BMC of the server to be tested returns the first parameter to the single chip microcomputer.

[0023] Optionally, the BMC of the server to be tested performs security authentication on the single-chip microcomputer including:

[0024] The BMC of the server to be tested obtains the MAC address of the single-chip computer;

[0025] The BMC of the server to be tested determines whether the MAC address is the same as a preset MAC address;

[0026] If they are the same, the BMC of the server to be tested determines that the single chip microcomputer has passed the security authentication.

[0027] Optionally, the first parameter and the second parameter include: temperature parameters of the BMC of the server under test, voltage parameters of the BMC of the server under test, fan parameters of the BMC of the server under test, power parameters of the BMC of the server under test, and field replaceable device parameters of the BMC of the server under test.

[0028] Optionally, the IPMI test instructions include: remote power control IPMI test instructions, system status read IPMI test instructions, system log IPMI test instructions, startup settings IPMI test instructions, system command IPMI test instructions, network interface command IPMI test instructions, channel command IPMI test instructions, watchdog command IPMI test instructions and user management command IPMI test instructions.

[0029] A second aspect of the present application provides a single chip microcomputer, comprising:

[0030] A first acquisition unit, used to acquire generation information of at least two IPMI test instructions;

[0031] A first generating unit, configured to generate a first simulated keyboard signal according to first generating information of a first IPMI test instruction;

[0032] A first sending unit, configured to send the first simulated keyboard signal to the BMC of the server to be tested, so that the BMC of the server to be tested generates and executes the first IPMI test instruction according to the first simulated keyboard signal;

[0033] A second acquisition unit, configured to acquire a first parameter returned by the BMC of the server to be tested;

[0034] A first determining unit, configured to determine a first test result of a first test item of the BMC of the server to be tested according to the first parameter, wherein the first test item is a test item corresponding to the first IPMI test instruction;

[0035] A second generating unit, used for generating a second simulated keyboard signal according to second generating information of a second IPMI test instruction;

[0036] The second determining unit is used to determine a second test result of a second test item of the BMC of the server to be tested according to the second simulated keyboard signal, where the second test item is the test item corresponding to the second IPMI test instruction.

[0037] Optionally, the first determining unit is specifically configured to:

[0038] Obtaining a first preset parameter of the BMC of the server to be tested;

[0039] Determine whether the difference between the first parameter and the first preset parameter is less than a preset threshold;

[0040] If yes, it is determined that the first item to be tested is running normally;

[0041] If not, it is determined that the first item to be tested is not running normally.

[0042] Optionally, the single chip microcomputer further includes: a display unit;

[0043] The display unit is used to integrate the first test result and the second test result and output them to the liquid crystal display screen of the single chip computer for display.

[0044] A second aspect of the present application provides a BMC of a server to be tested, including:

[0045] An authentication unit, used for performing security authentication on the single chip microcomputer;

[0046] A returning unit is used to return the first parameter to the single chip microcomputer if the security authentication passes.

[0047] Optionally, the returning unit is specifically used for:

[0048] Obtaining the MAC address of the single chip microcomputer;

[0049] Determine whether the MAC address is the same as a preset MAC address;

[0050] If they are the same, it is determined that the single chip microcomputer has passed the security authentication.

[0051] A third aspect of the present application provides an automatic testing device for IPMI instructions, the automatic testing device comprising:

[0052] Processor, memory, input-output unit, and bus;

[0053] The processor is connected to the memory, the input and output unit, and the bus;

[0054] The memory stores a program, and the processor calls the program to execute the first aspect and an optional automated testing method of an IPMI test instruction in any one of the first aspects.

[0055] A fourth aspect of the present application provides a computer-readable storage medium, on which a program is stored. When the program is executed on a computer, the program executes the first aspect and an optional automated testing method of an IPMI test instruction in any one of the first aspects.

[0056] It can be seen from the above technical scheme that the present application has the following advantages: the present application proposes an automated testing method for IPMI instructions, wherein a single-chip microcomputer is connected to a server to be tested via a USB, the single-chip microcomputer obtains generation information of at least two IPMI test instructions, the single-chip microcomputer generates different simulated keyboard signals according to different IPMI test instructions, and sends simulated keyboard signals to the BMC of the server to be tested, so that the BMC of the server to be tested returns corresponding parameters, and the single-chip microcomputer then determines the test results of different items to be tested of the BMC of the server to be tested according to the parameters, thereby realizing automated testing of different IPMI instructions, thereby saving labor costs, reducing test time, and improving the test efficiency of IPMI instructions. BRIEF DESCRIPTION OF THE DRAWINGS

[0057] In order to more clearly illustrate the technical solution in the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0058] Figure 1 A flowchart of an embodiment of an automated testing method for IPMI instructions provided by the present application;

[0059] Figure 2 A flowchart of another embodiment of an automatic testing method for IPMI instructions provided by the present application;

[0060] Figure 3 A schematic diagram of the structure of an embodiment of a single chip microcomputer provided in this application;

[0061] Figure 4 A schematic diagram of the structure of an embodiment of a baseboard management controller BMC of a server to be tested provided in this application;

[0062] Figure 5 A schematic diagram of the structure of an embodiment of an automatic testing device for IPMI instructions provided in the present application. DETAILED DESCRIPTION

[0063] The present application provides an automatic testing method for IPMI instructions, a single chip microcomputer and related devices, which are used to improve the testing efficiency of IPMI instructions.

[0064] It should be noted that the automated testing method for IPMI instructions provided in this application can be applied to terminals or servers. For example, the terminal can be a smart phone or computer, tablet computer, smart TV, smart watch, portable computer terminal or a fixed terminal such as a desktop computer. For the convenience of explanation, this application uses the terminal as the execution subject for example.

[0065] See also Figure 1 , Figure 1 An embodiment of an automated testing method for an IPMI instruction provided by the present application, wherein the single chip microcomputer is connected to the server to be tested via a USB, and the automated testing method comprises:

[0066] 101. The single chip computer obtains generation information of at least two IPMI test instructions;

[0067] In this embodiment, the single-chip microcomputer pre-acquires generation information of at least two IPMI test instructions. Specifically, the single-chip microcomputer pre-records the key information sent by the keyboard keys of the server to be tested when the IPMI test instruction is tested through a recording unit in the single-chip microcomputer, or the single-chip microcomputer pre-edits the key information sent by the keyboard keys when the IPMI test instruction is tested into a test script through an editing unit in the single-chip microcomputer. The generation information of the at least two IPMI test instructions includes: key information of letters, numbers and symbols contained in the IPMI test instruction, and the sequence information of these keys.

[0068] 102. The single chip computer generates a first simulated keyboard signal according to first generation information of the first IPMI test instruction;

[0069] In this embodiment, the single chip generates a first simulated keyboard signal according to the first generation information of the first IPMI test instruction, and the first simulated keyboard signal is used to simulate the keyboard signal of manually inputting the first IPMI test instruction when manually testing the first IPMI test instruction.

[0070] 103. The single chip microcomputer sends a first simulated keyboard signal to a baseboard management controller BMC of the server to be tested, so that the BMC of the server to be tested generates and executes a first IPMI test instruction according to the first simulated keyboard signal;

[0071] In this embodiment, after the server to be tested receives the first simulated keyboard signal, the server to be tested parses the first simulated keyboard signal, generates a first IPMI test instruction according to the first simulated keyboard signal, and executes the first IPMI test instruction. For example, the first IPMI test information is: ipmitool-H 192.168.30.101-U root-P tjj123@sel list; the first simulated keyboard signal contains all the key information of the numbers, letters and symbols of the first IPMI test instruction and the sequence information corresponding to these keys, the server to be tested parses the first simulated keyboard signal, and generates the first IPMI test instruction according to the key information of the corresponding numbers, letters and symbols determined in the first simulated keyboard signal and the sequence information corresponding to these keys, and executes the first IPMI test instruction.

[0072] 104. The single chip computer obtains the first parameter returned by the BMC of the server to be tested;

[0073] In this embodiment, the single-chip microcomputer obtains the first parameter returned by the BMC of the server to be tested, and the first parameter is the execution result obtained after the server to be tested executes the first IPMI test instruction. For example: the first IPMI test instruction is an instruction to obtain the maximum speed of the fan of the server: ipmitool-H 192.168.30.101-U root-p tjj123@raw 0x300x30 0x20 0xff 0x60, then the first parameter returned by the BMC of the server to be tested obtained by the single-chip microcomputer at this time is the maximum speed of the fan of the server to be tested. Specifically, the BMC obtains the detection value of the fan speed through the programmable logic controller, and draws the current value, and adjusts the detection value of the fan speed according to the draw current value to obtain the actual maximum speed of the fan speed. At this time, the actual maximum speed of the fan speed is the first parameter returned by the BMC.

[0074] 105. The single chip computer determines a first test result of a first test item of the BMC of the server to be tested according to the first parameter, where the first test item is a test item corresponding to the first IPMI test instruction;

[0075] In this embodiment, the single-chip microcomputer determines the first test result of the first test item of the BMC of the server to be tested according to the first parameter, including: the single-chip microcomputer obtains the first preset parameter of the BMC of the server to be tested; the single-chip microcomputer determines whether the difference between the first parameter and the first preset parameter is less than the preset threshold value; if so, the single-chip microcomputer determines that the first test item is running normally; if not, the single-chip microcomputer determines that the first test item is not running normally. For example: if the first test item is to test whether the high-speed rotation of the fan of the server to be tested is running normally, the first preset parameter is the maximum fan speed of the fan of the server to be tested when the fan is rotating at high speed, and the first preset parameter is compared with the first parameter. If the difference between the first parameter and the first preset parameter is within the error range, then at this time, the single-chip microcomputer determines that the high-speed rotation of the fan of the server to be tested is running normally, and if the difference between the first parameter and the first preset parameter is not within the error range, then at this time, the single-chip microcomputer determines that the high-speed rotation of the fan of the server to be tested is not running normally.

[0076] 106. The single chip computer generates a second simulated keyboard signal according to second generation information of the second IPMI test instruction;

[0077] In this embodiment, the second IPMI test instruction refers to any IPMI test instruction that is different from the first IPMI test instruction. The single chip microcomputer generates a second simulated keyboard signal according to the second generation information of the second IPMI test instruction, and the second simulated keyboard signal is used to simulate the keyboard signal of manually inputting the second IPMI test instruction when manually testing the second IPMI test instruction.

[0078] 107. The single chip computer determines a second test result of a second test item of the BMC of the server to be tested according to the second simulated keyboard signal, where the second test item is the test item corresponding to the second IPMI test instruction.

[0079] In this embodiment, the single-chip computer determines the second test result of the second test item of the BMC of the server to be tested according to the second simulated keyboard signal, including: the single-chip computer sends a second simulated keyboard signal to the BMC of the server to be tested, so that the BMC of the server to be tested generates and executes a second IPMI test instruction according to the second simulated keyboard signal; the single-chip computer obtains the second parameter returned by the BMC of the server to be tested; the single-chip computer to be tested obtains the second preset parameter of the BMC of the server to be tested; the single-chip computer determines whether the difference between the second parameter and the second preset parameter is less than a preset threshold value; if so, the single-chip computer determines that the second test item is running normally; if not, the single-chip computer determines that the second test item is not running normally.

[0080] For example, the second IPMI test instruction is an instruction for obtaining the minimum speed of the fan of the server to be tested: ipmitool–H192.168.30.101–U root–p tjj123@raw 0x30 0x30 0x20 0xff 0x10. The single-chip microcomputer obtains the minimum speed of the fan of the server to be tested returned by the BMC of the server to be tested through the second simulated keyboard signal, and determines whether the low-speed rotation of the fan of the server to be tested is normal according to the minimum speed and the preset minimum speed. If the error value between the minimum speed and the preset minimum speed is less than the preset threshold, the single-chip microcomputer determines that the low-speed rotation of the fan of the server to be tested is normal. If the error value between the minimum speed and the preset minimum speed is greater than the preset threshold, the single-chip microcomputer determines that the low-speed rotation of the fan of the server to be tested is abnormal.

[0081] The embodiment of the present application proposes an automated testing method for IPMI instructions, wherein a single-chip microcomputer is connected to a server to be tested via a USB, the single-chip microcomputer obtains generation information of at least two IPMI test instructions, the single-chip microcomputer generates different simulated keyboard signals according to different IPMI test instructions, and sends the simulated keyboard signals to the BMC of the server to be tested, so that the BMC of the server to be tested returns corresponding parameters, and the single-chip microcomputer then determines the test results of different items to be tested of the BMC of the server to be tested according to the parameters, thereby realizing automated testing of different IPMI instructions, thereby saving labor costs, reducing test time, and improving the test efficiency of IPMI instructions.

[0082] See also Figure 2 , Figure 2 Another embodiment of an automated testing method for an IPMI instruction provided by the present application, wherein the single chip microcomputer is connected to the server to be tested via a USB, and the automated testing method comprises:

[0083] 201. The single chip computer obtains generation information of at least two IPMI test instructions;

[0084] In this embodiment, at least two IPMI test instructions include: remote power control IPMI test instructions, read system status IPMI test instructions, system log IPMI test instructions, startup settings IPMI test instructions, system command IPMI test instructions, network interface command IPMI test instructions, channel command IPMI test instructions, watchdog command IPMI test instructions and user management command IPMI test instructions. For example, remote power control IPMI test commands include: IPMI test command for checking power on / off status: ipmitool–H xxx.xxx.xx.xxx–U root–P yy powerstatus; IPMI test command for powering on: ipmitool–H xxx.xxx.xx.xxx–U root–P yy power on; IPMI test command for powering off: ipmitool–H xxx.xxx.xx.xxx–U root–P yy–power off; IPMI test command for restarting: ipmitool–H xxx.xxx.xx.xxx–U root–P yy–power reset; where xxx.xxx.xx.xxx is the management IP address of the BMC of the server to be tested, and yy is the login user name and password of the BMC of the server to be tested.

[0085] 202. The single chip computer generates a first simulated keyboard signal according to first generation information of a first IPMI test instruction;

[0086] 203. The single chip microcomputer sends a first simulated keyboard signal to a baseboard management controller BMC of the server to be tested, so that the BMC of the server to be tested generates and executes a first IPMI test instruction according to the first simulated keyboard signal;

[0087] Steps 202 to 203 in this embodiment are similar to those in the above Figure 1 Steps 102 to 103 in the embodiment are similar and will not be described in detail here.

[0088] 204. The BMC of the server to be tested performs security authentication on the single-chip microcomputer;

[0089] In this embodiment, the BMC of the server to be tested performs security authentication on the single-chip microcomputer, including: the BMC of the server to be tested obtains the MAC address of the single-chip microcomputer; the BMC of the server to be tested determines whether the MAC address is the same as the preset MAC address; if they are the same, the BMC of the server to be tested determines that the single-chip microcomputer has passed the security authentication and executes step 205; if they are not the same, the BMC of the server to be tested determines that the single-chip microcomputer has not passed the security authentication and ends the process. Among them, the code for the BMC of the server to be tested to perform security authentication on the single-chip microcomputer is: ipmitool-H (MAC address of the single-chip microcomputer)-U root-p (BMC login username and password) raw 0x320x76 0x01.

[0090] 205. If the security authentication is passed, the BMC of the server to be tested returns the first parameter to the single chip microcomputer;

[0091] In this embodiment, when the server to be tested determines that the security authentication of the single-chip microcomputer has passed, the BMC of the server to be tested returns the first parameter to the single-chip microcomputer, thereby improving the security of the entire test.

[0092] 206. The single chip computer obtains the first parameter returned by the BMC of the server to be tested;

[0093] Step 206 in this embodiment is similar to the aforementioned Figure 1 Step 104 in the embodiment is similar and will not be described in detail here.

[0094] 207. The single-chip computer determines a first test result of a first test item of the BMC of the server to be tested according to the first parameter, where the first test item is a test item corresponding to the first IPMI test instruction.

[0095] In this embodiment, the first parameters include: temperature parameters of the BMC of the server under test, voltage parameters of the BMC of the server under test, fan parameters of the BMC of the server under test, power parameters of the BMC of the server under test, and field replaceable device parameters of the BMC of the server under test.

[0096] 208. The single chip microcomputer generates a second simulated keyboard signal according to second generation information of the second IPMI test instruction;

[0097] 209. The single chip computer determines a second test result of a second test item of the BMC of the server to be tested according to the second simulated keyboard signal, where the second test item is a test item corresponding to the second IPMI test instruction.

[0098] In this embodiment, steps 208 to 209 are the same as those described above. Figure 1 Steps 106 to 107 in the embodiment are similar and will not be described in detail here.

[0099] 210. The single chip microcomputer integrates the first test result and the second test result and outputs them to the liquid crystal display screen of the single chip microcomputer for display.

[0100] In this embodiment, the single chip microcomputer has a display device, and the single chip microcomputer integrates the first test result and the second test result and outputs them to the liquid crystal display screen of the single chip microcomputer for display, so that the test personnel can view the test results conveniently, and the test efficiency is further improved.

[0101] See also Figure 3 , Figure 3 An embodiment of a single chip microcomputer provided in the present application includes:

[0102] A first acquisition unit 301 is used to acquire generation information of at least two IPMI test instructions;

[0103] A first generating unit 302, configured to generate a first simulated keyboard signal according to first generating information of a first IPMI test instruction;

[0104] The first sending unit 303 is used to send the first simulated keyboard signal to the BMC of the server to be tested, so that the BMC of the server to be tested generates and executes the first IPMI test instruction according to the first simulated keyboard signal;

[0105] The second acquisition unit 304 is used to acquire the first parameter returned by the BMC of the server to be tested;

[0106] A first determining unit 305 is configured to determine a first test result of a first test item of the BMC of the server to be tested according to the first parameter, where the first test item is a test item corresponding to the first IPMI test instruction;

[0107] A second generating unit 306, configured to generate a second simulated keyboard signal according to second generating information of a second IPMI test instruction;

[0108] The second determining unit 307 is used to determine a second test result of a second test item of the BMC of the server to be tested according to the second simulated keyboard signal, where the second test item is the test item corresponding to the second IPMI test instruction.

[0109] Optionally, the first determining unit 305 is specifically configured to:

[0110] Obtaining a first preset parameter of the BMC of the server to be tested;

[0111] Determine whether the difference between the first parameter and the first preset parameter is less than a preset threshold;

[0112] If yes, it is determined that the first item to be tested is running normally;

[0113] If not, it is determined that the first item to be tested is not running normally.

[0114] Optionally, the single chip computer further includes: a display unit 308;

[0115] The display unit 308 is used to integrate the first test result and the second test result and output them to the liquid crystal display screen of the single chip computer for display.

[0116] In this embodiment, the first acquisition unit 301 acquires generation information of at least two IPMI test instructions, the first generation unit 302 and the second generation unit 306 generate different simulated keyboard signals according to different IPMI test instructions, the first sending unit 303 and the second determination unit 307 send simulated keyboard signals to the BMC of the server to be tested, so that the BMC of the server to be tested returns corresponding parameters, and the first determination unit 305 and the second determination unit 307 determine the test results of different test items of the BMC of the server to be tested according to the parameters. The above-mentioned single chip microcomputer realizes the automatic test of different IPMI instructions, thereby saving labor costs, reducing the test time, and improving the test efficiency of IPMI instructions.

[0117] See also Figure 4 , Figure 4 An embodiment of a baseboard management controller BMC of a server to be tested provided in the present application includes:

[0118] The authentication unit 401 is used to perform security authentication on the single chip microcomputer;

[0119] The return unit 402 is used to return the first parameter to the single chip microcomputer if the security authentication passes.

[0120] Optionally, the returning unit 402 is specifically configured to:

[0121] Obtaining the MAC address of the microcontroller;

[0122] Determine whether the MAC address is the same as a preset MAC address;

[0123] If they are the same, it is determined that the single chip microcomputer has passed the security authentication.

[0124] This application also provides an automated test device for IPMI instructions, see Figure 5 , Figure 5 An embodiment of an automatic testing device for IPMI instructions provided by the present application includes:

[0125] Processor 501, memory 502, input and output unit 503, bus 504;

[0126] The processor 501 is connected to the memory 502, the input and output unit 503 and the bus 504;

[0127] The memory 502 stores a program, and the processor 501 calls the program to execute any one of the above-mentioned automatic testing methods of IPMI instructions.

[0128] The present application also relates to a computer-readable storage medium on which a program is stored. When the program is run on a computer, the computer is enabled to execute an automated testing method of any one of the above IPMI instructions.

[0129] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0130] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0131] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0132] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0133] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, read-only memory), random access memory (RAM, random access memory), disk or optical disk and other media that can store program code.

Claims

1. An automated testing method for IPMI instructions, characterized in that: The single chip microcomputer is connected to the server to be tested via USB, and the automated testing method includes: The single chip microcomputer obtains generation information of at least two IPMI test instructions; The single chip microcomputer generates a first simulated keyboard signal according to first generation information of the first IPMI test instruction; The single-chip computer sends the first simulated keyboard signal to the baseboard management controller BMC of the server to be tested, so that the BMC of the server to be tested generates and executes the first IPMI test instruction according to the first simulated keyboard signal; The single chip microcomputer obtains a first parameter returned by the BMC of the server to be tested; The single-chip computer determines a first test result of a first test item of the BMC of the server to be tested according to the first parameter, where the first test item is a test item corresponding to the first IPMI test instruction; The single chip microcomputer generates a second simulated keyboard signal according to second generation information of the second IPMI test instruction; The single-chip computer determines a second test result of a second test item of the BMC of the server to be tested according to the second simulated keyboard signal, where the second test item is a test item corresponding to the second IPMI test instruction; After the single chip microcomputer sends the first simulated keyboard signal to the BMC of the server to be tested, the method further includes: The BMC of the server to be tested performs security authentication on the single-chip microcomputer; If the security authentication passes, the BMC of the server to be tested returns the first parameter to the single chip microcomputer; The BMC of the server to be tested performs security authentication on the single-chip microcomputer including: The BMC of the server to be tested obtains the MAC address of the single-chip computer; The BMC of the server to be tested determines whether the MAC address is the same as a preset MAC address; If they are the same, the BMC of the server to be tested determines that the single chip microcomputer has passed the security authentication.

2. The automated testing method according to claim 1, characterized in that: The single chip computer determines a first test result of a first test item of the BMC of the server to be tested according to the first parameter, including: The single chip microcomputer obtains a first preset parameter of the BMC of the server to be tested; The single chip computer determines whether the difference between the first parameter and the first preset parameter is less than a preset threshold; If yes, the single chip microcomputer determines that the first item to be tested is running normally; If not, the single chip microcomputer determines that the first item to be tested is not running normally.

3. The automated testing method according to claim 1, characterized in that: After the single chip computer determines a second test result of a second test item of the BMC of the server to be tested according to the second simulated keyboard signal, the method further includes: The single chip microcomputer integrates the first test result and the second test result and outputs them to a liquid crystal display screen of the single chip microcomputer for display.

4. The automated testing method according to any one of claims 1 to 3, characterized in that: The single chip computer determines a second test result of a second test item of the BMC of the server to be tested according to the second simulated keyboard signal, including: The single-chip computer sends the second simulated keyboard signal to the BMC of the server to be tested, so that the BMC of the server to be tested generates and executes a second IPMI test instruction according to the second simulated keyboard signal; The single chip microcomputer obtains a second parameter returned by the BMC of the server to be tested; The single chip microcomputer obtains a second preset parameter of the BMC of the server to be tested; The single chip computer determines whether the difference between the second parameter and the second preset parameter is less than a preset threshold; If yes, the single chip microcomputer determines that the second item to be tested is running normally; If not, the single chip microcomputer determines that the second item to be tested is not running normally; The first parameter and the second parameter include: temperature parameters of the BMC of the server under test, voltage parameters of the BMC of the server under test, fan parameters of the BMC of the server under test, power parameters of the BMC of the server under test, and field replaceable device parameters of the BMC of the server under test.

5. The automated testing method according to any one of claims 1 to 3, characterized in that: The IPMI test instructions include: remote power control IPMI test instructions, system status reading IPMI test instructions, system log IPMI test instructions, startup setting IPMI test instructions, system command IPMI test instructions, network interface command IPMI test instructions, channel command IPMI test instructions, watchdog command IPMI test instructions and user management command IPMI test instructions.

6. A single chip microcomputer, characterized in that: The single chip microcomputer is connected to the server to be tested via USB, and the single chip microcomputer includes: A first acquisition unit, used to acquire generation information of at least two IPMI test instructions; A first generating unit, configured to generate a first simulated keyboard signal according to first generating information of a first IPMI test instruction; A first sending unit, configured to send the first simulated keyboard signal to the BMC of the server to be tested, so that the BMC of the server to be tested generates and executes the first IPMI test instruction according to the first simulated keyboard signal; A second acquisition unit, configured to acquire a first parameter returned by the BMC of the server to be tested; A first determining unit, configured to determine a first test result of a first test item of the BMC of the server to be tested according to the first parameter, wherein the first test item is a test item corresponding to the first IPMI test instruction; A second generating unit, used for generating a second simulated keyboard signal according to second generating information of a second IPMI test instruction; A second determining unit, configured to determine a second test result of a second BMC test item of the server to be tested according to the second simulated keyboard signal, where the second test item is a test item corresponding to the second IPMI test instruction; The BMC of the server to be tested includes: An authentication unit, used for performing security authentication on the single chip microcomputer; A returning unit, configured to return the first parameter to the single chip microcomputer if the security authentication passes; The return unit is specifically used for: Obtaining the MAC address of the single chip microcomputer; Determine whether the MAC address is the same as a preset MAC address; If they are the same, it is determined that the single chip microcomputer has passed the security authentication.

7. An automatic test device for IPMI instructions, characterized in that: The automated testing device comprises: Processor, memory, input-output unit, and bus; The processor is connected to the memory, the input and output unit, and the bus; The memory stores a program, and the processor calls the program to execute the method according to any one of claims 1 to 5.

8. A computer-readable storage medium having a program stored thereon, wherein the program, when executed on a computer, performs the method according to any one of claims 1 to 5.

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