Image sensor using avalanche diodes and shared output circuits
By employing N-type or P-type transistors in the quenching and readout circuit design of the single-photon avalanche diode image sensor, the problems of minimum pixel unit limitation and reduced fill factor are solved, realizing an image sensor with low pixel size limitation and high fill factor, which can effectively detect extremely weak light and high frequency signals.
Patent Information
- Application Number
- CN202111445695.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2021-02-10
- Filing Date
- 2021-11-15
- Publication Date
- 2025-01-14
- Estimated Expiration
- 2041-11-15
AI Technical Summary
In the existing technology, single-photon avalanche diodes have the problems of minimum pixel unit limitation and reduced fill factor in pixel circuits, making it difficult to achieve low pixel size limitation and high fill factor.
The quenching and readout circuit design uses only N-type or P-type transistors in each pixel circuit. By having only a single negative well area in each pixel and configuring the pull-back circuit outside each pixel circuit, the minimum pixel unit limitation and fill factor reduction are avoided.
A single-photon avalanche diode image sensor with low pixel size limitation and high fill factor has been developed, which can effectively detect extremely weak light and high frequency signals, thus improving the performance of the image sensor.
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Figure CN114915738B_ABST
Abstract
Citation Information
Patent Citations
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