Switching device, testing system and storage device testing method

Abstract

The present application relates to the technical field of storage device testing, and discloses a switching device, a test system, and a test method for a storage device. The switching device is connected between a test device and a storage device to be tested, so that the test device can test the storage device to be tested. The switching device includes: a voltage regulating circuit, which connects the test device and the storage device to be tested, and is used to regulate the test voltage provided by the test device, and output the regulated test voltage to the storage device to be tested; a current sampling circuit, which connects the test device and the storage device to be tested, and is used to sample the working current of the storage device to be tested, and send the working current to the test device. In the above manner, the test efficiency of the storage device to be tested can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of storage device testing, and in particular to a switching device, a testing system, and a storage device testing method. Background Art

[0002] During the production process of storage devices, the storage devices need to be tested to distinguish good products from defective products in the storage devices.

[0003] In current storage device production, in order to find defective products in the storage devices, a test device is often used to test the storage devices to find the defective products therein.

[0004] The disadvantage is that when performing a stress test on the storage device, the test voltage must be set through BIOS control, and a restart is required after each setting, resulting in low test efficiency. Summary of the invention

[0005] The main technical problem solved by the present application is to provide a switching device, a testing system and a testing method for a storage device, which can improve the testing efficiency of the storage device to be tested.

[0006] A technical solution adopted in the present application is to provide a switching device, which is connected between a test device and a storage device to be tested so that the test device can test the storage device to be tested. The switching device includes: a voltage regulating circuit, which is connected to the test device and the storage device to be tested, and is used to regulate the test voltage provided by the test device and output the regulated test voltage to the storage device to be tested; a current sampling circuit, which is connected to the test device and the storage device to be tested, and is used to sample the working current of the storage device to be tested and send the working current to the test device.

[0007] Among them, the adapter also includes a control circuit, which connects the test device, the voltage regulation circuit and the current sampling circuit; the control circuit is used to output the test voltage provided by the test device to the voltage regulation circuit, and control the voltage regulation circuit to regulate the test voltage; and the control circuit is also used to obtain the working current sampled by the current sampling circuit, and send the working current to the test device.

[0008] Among them, the adapter also includes a burning circuit, which connects the control circuit and the storage device to be tested; the control circuit is also used to output the first SPD information provided by the test device to the burning circuit, and control the burning circuit to burn the first SPD information into the SPD chip of the storage device to be tested.

[0009] The control circuit is also used to control the burning circuit to obtain the second SPD information from the SPD chip, and confirm whether the first SPD information is consistent with the second SPD information.

[0010] The switching device further includes an indicator light, which is connected to a control circuit; the control circuit is also used to control the indicator light to give an abnormal reminder when it is confirmed that the first SPD information and the second SPD information are inconsistent.

[0011] The adapter also includes a switching circuit, which is connected to a control circuit; the control circuit is used to control the switching circuit to connect to a burning circuit or a voltage regulating circuit.

[0012] Among them, the adapter also includes: a first communication interface, connecting the test device, one end of the voltage regulation circuit and one end of the current sampling circuit, used to output the test voltage provided by the test device to the voltage regulation circuit; and send the working current to the test device; a second communication interface, connecting the storage device to be tested, the other end of the voltage regulation circuit and the other end of the current sampling circuit, used to output the test voltage adjusted by the voltage regulation circuit to the storage device to be tested; and obtain the working current of the storage device to be tested and input it into the current sampling circuit.

[0013] The adapter device further includes: a circuit board, on which the voltage regulating circuit, the current sampling circuit, the first communication interface and the second communication interface are arranged.

[0014] Another technical solution adopted in the present application is to provide a test system, which includes: a test device; a switching device, which is connected between the test device and the storage device to be tested so that the test device can test the storage device to be tested, and the switching device includes: a voltage regulation circuit, which is connected to the test device and the storage device to be tested, and is used to regulate the test voltage provided by the test device and output the regulated test voltage to the storage device to be tested; a current sampling circuit, which is connected to the test device and the storage device to be tested, and is used to sample the working current of the storage device to be tested and send the working current to the test device.

[0015] Another technical solution adopted in the present application is to provide a testing method for a storage device, which is applied to a switching device, and the switching device is connected between the testing device and the storage device to be tested. The method includes: using a voltage regulating circuit of the switching device to adjust the test voltage provided by the testing device, and outputting the adjusted test voltage to the storage device to be tested; wherein the voltage regulating circuit connects the testing device and the storage device to be tested; using a current sampling circuit of the switching device to sample the working current of the storage device to be tested, and sending the working current to the testing device, so that the testing device tests the storage device to be tested; wherein the current sampling circuit connects the testing device and the storage device to be tested.

[0016] The beneficial effects of the present application are as follows: Different from the prior art, the adapter of the present application is connected between the test device and the storage device to be tested so that the test device can test the storage device to be tested, and the adapter includes: a voltage regulating circuit, connected to the test device and the storage device to be tested, used to adjust the test voltage provided by the test device, and output the adjusted test voltage to the storage device to be tested; a current sampling circuit, connected to the test device and the storage device to be tested, used to sample the working current of the storage device to be tested, and send the working current to the test device. In the above manner, the voltage regulating circuit is used to adjust the test voltage and the current sampling circuit is used to collect the working current of the storage device to be tested based on the adjusted test voltage. There is no need to set the test voltage for the test device separately each time, which can improve the test efficiency of the storage device to be tested, and enable the test device to obtain the working current of the storage device to be tested, so that the test is more comprehensive and the test effect is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. Among them:

[0018] Figure 1 It is a structural schematic diagram of an embodiment of a switching device provided by the present application;

[0019] Figure 2 It is a schematic diagram of an application scenario of the switching device provided by the present application;

[0020] Figure 3 is a structural schematic diagram of another embodiment of the switching device provided by the present application;

[0021] Figure 4 is a structural schematic diagram of another embodiment of the switching device provided by the present application;

[0022] Figure 5 is a structural schematic diagram of another embodiment of the switching device provided by the present application;

[0023] Figure 6 is a structural schematic diagram of another embodiment of the switching device provided by the present application;

[0024] Figure 7 is a structural schematic diagram of another embodiment of the switching device provided by the present application;

[0025] Figure 8 is a structural schematic diagram of another embodiment of the switching device provided by the present application;

[0026] Fig. 9 It is a structural schematic diagram of an embodiment of a test system provided by the present application;

[0027] Fig.10 It is a flowchart of an embodiment of a method for testing a storage device provided by the present application;

[0028] Fig.11 It is a structural schematic diagram of an embodiment of a computer-readable storage medium provided by the present application. DETAILED DESCRIPTION

[0029] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It will be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some but not all structures related to the present application are shown in the drawings. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application.

[0030] The terms "first", "second", etc. in this application are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices.

[0031] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0032] See also Figure 1 , Figure 1 1 is a schematic diagram of the structure of an embodiment of a switching device provided by the present application. The switching device 100 is connected between a test device and a storage device to be tested, so that the test device can test the storage device to be tested.

[0033] The test device may be a PC (Personal Computer). The storage device to be tested may be a RAM (random access memory) or a ROM (Read-Only Memory); or it may be a hard disk, such as a mechanical hard disk, a solid state hard disk, or a mobile hard disk.

[0034] The adapter 100 includes a voltage regulating circuit 10 and a current sampling circuit 20 .

[0035] The voltage regulating circuit 10 is connected to the testing device and the storage device to be tested, and is used for regulating the testing voltage provided by the testing device and outputting the regulated testing voltage to the storage device to be tested.

[0036] The current sampling circuit 20 is connected to the test device and the storage device to be tested, and is used for sampling the working current of the storage device to be tested and sending the working current to the test device.

[0037] In one application scenario, see Figure 2 , the voltage regulating circuit 10 of the adapter 100 connects the test device 200 and the storage device to be tested 300. The current sampling circuit 20 of the adapter 100 connects the test device 200 and the storage device to be tested 300. The test device 200 provides a test voltage to the voltage regulating circuit 10, and the voltage regulating circuit 10 adjusts the test voltage, such as increasing the test voltage or decreasing the test voltage, and outputs the adjusted test voltage to the storage device to be tested 300, so that the storage device to be tested 300 performs a stress test based on the adjusted test voltage. At the same time, the current sampling circuit 20 samples the working current of the storage device to be tested 300 during the stress test process, and sends the working current to the test device 200. The test device 200 tests the storage device to be tested 300 based on the working current. If the working current is abnormal, the test device 200 determines that the storage device to be tested 300 is abnormal, and a prompt may be given to repair or scrap the storage device to be tested 300. In this way, the storage particles in the storage device to be tested can complete the extremely harsh environment test, and the abnormality of the storage device to be tested can be quickly tested, thereby improving the test efficiency.

[0038] Specifically, the voltage regulating circuit 10 may adjust the test voltage at least once, and output the adjusted test voltage to the storage device 300 to be tested, so that the storage device 300 to be tested performs a stress test based on the adjusted test voltage. At the same time, the current sampling circuit 20 samples the working current of the storage device 300 to be tested during the stress test, and sends the working current to the testing device 200. The testing device 200 tests the storage device 300 to be tested based on the working current. At the same time, after the voltage regulating circuit 10 adjusts the test voltage each time, the adjusted voltage value may be sent to the testing device 200. The testing device 200 determines a current threshold value corresponding to the voltage value based on the voltage value, and after obtaining the working current sent by the current sampling circuit 20, the working current is compared with the current threshold value. If the working current exceeds the current threshold value, it is confirmed that the storage device 300 to be tested is abnormal, and the storage device 300 to be tested is a defective product. The working current is compared with the current threshold value. If the working current does not exceed the current threshold value, it is confirmed that the storage device 300 to be tested passes the test, and the storage device 300 to be tested is a good product.

[0039] In some embodiments, the test device is also used to implement both stress testing and functional testing of the storage device to be tested through the adapter 100. If an abnormality occurs in either the stress test or the functional test, it indicates that the storage device to be tested is abnormal.

[0040] In this embodiment, the adapter 100 is connected between the test device 200 and the storage device to be tested 300, so that the test device 200 tests the storage device to be tested 300. The adapter 100 includes: a voltage regulating circuit 10, which is connected to the test device 200 and the storage device to be tested 300, and is used to adjust the test voltage provided by the test device 200, and output the adjusted test voltage to the storage device to be tested 300; a current sampling circuit 20, which is connected to the test device 200 and the storage device to be tested 300, and is used to sample the working current of the storage device to be tested 300, and send the working current to the test device 200. In the above manner, the voltage regulating circuit 10 is used to adjust the test voltage, and the current sampling circuit 20 collects the working current of the storage device to be tested 300 based on the adjusted test voltage, without the need to set the test voltage for the test device 200 separately each time, which can improve the test efficiency of the storage device to be tested 300, and enable the test device 200 to obtain the working current of the storage device to be tested 300, so that the test is more comprehensive and the test effect is improved.

[0041] See also Figure 3 , Figure 31 is a schematic diagram of another embodiment of the switching device provided by the present application. The switching device 100 includes a voltage regulating circuit 10, a current sampling circuit 20 and a control circuit 30. The control circuit 30 is connected to the test device, the voltage regulating circuit 10 and the current sampling circuit 20.

[0042] The control circuit 30 is used to output the test voltage provided by the test device to the voltage regulating circuit 10, and control the voltage regulating circuit 10 to regulate the test voltage; and the control circuit 30 is also used to obtain the working current sampled by the current sampling circuit 20, and send the working current to the test device. In some embodiments, the control circuit 30 may include a control chip, such as an MCU (Microcontroller Unit). The corresponding pins of the control chip are connected to the test device, the voltage regulating circuit 10 and the current sampling circuit 20.

[0043] In some embodiments, the control circuit 30 is further used to obtain the voltage value after the voltage regulating circuit 10 adjusts the test voltage each time, and send the voltage value to the test device. The test device determines the current threshold corresponding to the voltage value based on the voltage value, and after obtaining the working current sent by the current sampling circuit 20, compares the working current with the current threshold. If the working current exceeds the current threshold, it is confirmed that the storage device 300 to be tested is abnormal.

[0044] In some embodiments, the control circuit 30 can also monitor the real-time test voltage power supply of the test device, monitor its ripple and test voltage stability, and when the test voltage is abnormal, control the voltage regulation circuit 10 to stop providing the test voltage to the storage device to be tested to protect the device to be tested.

[0045] In the present embodiment, through the above-mentioned method, the control circuit 30 controls the voltage regulating circuit 10 to adjust the test voltage and the current sampling circuit 20 to collect the working current of the storage device to be tested based on the adjusted test voltage. There is no need to set the test voltage for the test device separately each time, which can improve the test efficiency of the storage device to be tested, and enable the test device to obtain the working current of the storage device to be tested, making the test more comprehensive and improving the test effect.

[0046] See also Figure 4 , Figure 4 1 is a schematic diagram of another embodiment of the switching device provided by the present application. The switching device 100 includes a voltage regulating circuit 10, a current sampling circuit 20, a control circuit 30 and a burning circuit 40. The burning circuit 40 is connected to the control circuit 30 and the storage device to be tested.

[0047] The control circuit 30 is also used to output the first SPD (Serial Presence Detect) information provided by the test device to the burning circuit 40, and control the burning circuit 40 to burn the first SPD information into the SPD chip of the storage device to be tested. The first SPD information can be the number of row addresses, the number of column addresses, error detection / correction, refresh rate, data width, interface standard, the serial number of the module, and the manufacturer code. In this embodiment, the storage device to be tested is a memory stick, and the memory stick includes an SPD chip. When the memory stick is used normally, it is necessary to read the SPD information in the SPD to set the working parameters of the memory stick.

[0048] The control circuit 30 is also used to control the burning circuit 40 to obtain the second SPD information from the SPD chip, and confirm whether the first SPD information and the second SPD information are consistent. If they are inconsistent, the burning circuit 40 can be controlled again to burn the first SPD information into the SPD chip of the storage device to be tested, and the burning circuit 40 can be controlled again to obtain the second SPD information from the SPD chip, and confirm whether the first SPD information and the second SPD information are consistent. In this way, it can be confirmed whether the SPD information burned in the SPD chip is correct, so as to avoid abnormalities in the storage device to be tested during use.

[0049] In other embodiments, when there is inconsistency, the control circuit 30 may send abnormal information to the test device, so that the test device knows based on the abnormal information that the device under test cannot be burned, and then a prompt may be given to repair or scrap the storage device under test.

[0050] Through the above-mentioned method, the SPD information in the SPD chip can be burned when the storage device to be tested is tested. Compared with the prior art that requires additional burning and confirmation of the SPD information, in this embodiment, there is no need to burn the SPD information separately for the storage device to be tested, thereby reducing the SPD information burning time. If the prior art requires additional use of a burning device to burn the SPD information for the storage device to be tested, the storage device to be tested needs to be removed from the test device and then connected to the burning device, resulting in a waste of time, thereby improving the testing efficiency and burning efficiency of the storage device to be tested.

[0051] In other embodiments, see Figure 5 , Figure 51 is a schematic diagram of the structure of another embodiment of the adapter provided by the present application. The adapter 100 includes a voltage regulating circuit 10, a current sampling circuit 20, a control circuit 30, a burning circuit 40 and an indicator light 50. The indicator light 50 is connected to the control circuit 30. The control circuit 30 is also used to control the indicator light 50 to give an abnormal reminder when it is confirmed that the first SPD information and the second SPD information are inconsistent. For example, during normal burning, the control circuit 30 controls the indicator light 50 to display green, and when it is confirmed that the first SPD information and the second SPD information are inconsistent, the control circuit 30 controls the indicator light 50 to display red.

[0052] In some embodiments, the indicator light 50 can be a three-color light. During normal burning, the control circuit 30 controls the indicator light 50 to display green. When it is confirmed that the first SPD information and the second SPD information are inconsistent, the control circuit 30 controls the indicator light 50 to display orange. At this time, the control circuit 30 will control the burning circuit 40 again to burn the first SPD information into the SPD chip of the storage device to be tested, and control the burning circuit 40 again to obtain the second SPD information from the SPD chip, and confirm whether the first SPD information and the second SPD information are consistent. If they are still inconsistent at this time, the control circuit 30 controls the indicator light 50 to display red.

[0053] In the above manner, the indicator light 50 is used to prompt whether the SPD information is burned successfully, which can improve the user experience, remind in case of abnormality, improve the burning efficiency, and improve the testing efficiency of the storage device to be tested.

[0054] See also Figure 6 , Figure 6 1 is a schematic diagram of another embodiment of the switching device provided by the present application. The switching device 100 includes a voltage regulating circuit 10 , a current sampling circuit 20 , a control circuit 30 , a programming circuit 40 and a switching circuit 60 .

[0055] The switching circuit 60 is connected to the control circuit 30 .

[0056] The control circuit 30 is used to control the switching circuit 60 to connect to the burning circuit 40 or the voltage regulating circuit 10. In some embodiments, the switching circuit 60 may include a single-pole double-throw switch, which is composed of a moving end and a fixed end, the moving end is connected to the control circuit 30, one fixed end is connected to the burning circuit 40, and the other fixed end is connected to the voltage regulating circuit 10. The control circuit 30 is used to control the moving end to be connected to one of the fixed ends.

[0057] When the control circuit 30 controls the switching circuit 60 to connect to the programming circuit 40 , the control circuit 30 is used to output the first SPD information provided by the test device to the programming circuit 40 , and control the programming circuit 40 to program the first SPD information into the SPD chip of the storage device to be tested.

[0058] When the control circuit 30 controls the switching circuit 60 to connect to the voltage regulating circuit 10, the control circuit 30 is used to output the test voltage provided by the testing device to the voltage regulating circuit 10, and control the voltage regulating circuit 10 to adjust the test voltage; and the control circuit 30 is also used to obtain the working current sampled by the current sampling circuit 20, and send the working current to the testing device.

[0059] In some embodiments, when the adapter 100 is connected between the test device and the storage device to be tested so that the test device tests the storage device to be tested, the switching circuit 60 can be first controlled to connect to the burning circuit 40 to complete the burning of the SPD information of the SPD chip. After the burning is completed, the switching circuit 60 is controlled to connect to the voltage regulating circuit 10, and the control circuit 30 outputs the test voltage provided by the test device to the voltage regulating circuit 10, and controls the voltage regulating circuit 10 to adjust the test voltage; and the control circuit 30 is also used to obtain the working current sampled by the current sampling circuit 20, and send the working current to the test device.

[0060] In some embodiments, when the adapter 100 is connected between the test device and the storage device to be tested so that the test device tests the storage device to be tested, the switching circuit 60 can be controlled to connect to the voltage regulating circuit 10, and the control circuit 30 outputs the test voltage provided by the test device to the voltage regulating circuit 10, and controls the voltage regulating circuit 10 to adjust the test voltage; and the control circuit 30 is also used to obtain the working current sampled by the current sampling circuit 20, and send the working current to the test device. After the test is completed, the switching circuit 60 is controlled to connect to the burning circuit 40 to complete the burning of the SPD information of the SPD chip.

[0061] In the above manner, the switching circuit 60 is used to complete the connection of the voltage regulating circuit 10 or the burning circuit 40, and the function of the adapter 100 is increased, so that the adapter 100 can cooperate with the test device to complete the test of the storage device to be tested, and can also achieve the successful burning of the SPD information. The integrated function integration can improve the burning efficiency and the testing efficiency.

[0062] See also Figure 7 The adapter 100 includes a voltage regulating circuit 10 , a current sampling circuit 20 , a first communication interface 70 and a second communication interface 80 .

[0063] The first communication interface 70 is connected to the test device, one end of the voltage regulating circuit 10 and one end of the current sampling circuit 20, and is used to output the test voltage provided by the test device to the voltage regulating circuit 10; and send the working current to the test device. In some embodiments, the first communication interface 70 can be connected to the test device by means of a data line.

[0064] The second communication interface 80 is connected to the storage device to be tested, the other end of the voltage regulating circuit 10, and the other end of the current sampling circuit 20, and is used to output the test voltage adjusted by the voltage regulating circuit 10 to the storage device to be tested; and obtain the working current of the storage device to be tested and input it into the current sampling circuit 20. In some embodiments, the second communication interface 80 can be connected to the storage device to be tested by means of a data line.

[0065] The adapter 100 further includes a circuit board (as shown in the figure), and the voltage regulating circuit 10, the current sampling circuit 20, the first communication interface 70 and the second communication interface 80 are arranged on the circuit board.

[0066] In some embodiments, the first communication interface 70 and the second communication interface 80 may include multiple interface types, such as a USB (Universal Serial Bus) interface, a SATA (Serial Advanced Technology Attachment) interface, an ATA (Advanced Technology Attachment) interface, and a PCIe (peripheral component interconnect express) interface, etc., to adapt to the connection between test devices with different interfaces and the storage device to be tested.

[0067] See also Figure 8 The adapter 100 includes a voltage regulating circuit 10, a current sampling circuit 20, a control circuit 30, a burning circuit 40, an indicator light 50, a switching circuit 60, a first communication interface 70 and a second communication interface 80.

[0068] The first communication interface 70 connects the test device and the control circuit 30 , and is used to output the test voltage provided by the test device to the control circuit 30 , and to send the working current acquired by the control circuit 30 to the test device.

[0069] The control circuit 30 is connected to the indicator light 50, the switching circuit 60 and the current sampling circuit 20. The burning circuit 40 and the voltage regulating circuit 10 are connected to the switching circuit 60. The switching circuit 60 is connected to the burning circuit 40 or the voltage regulating circuit 10 under the control of the control circuit 30.

[0070] The second communication interface 80 connects the storage device to be tested, the voltage regulating circuit 10 and the current sampling circuit 20, and is used to output the test voltage regulated by the voltage regulating circuit 10 to the storage device to be tested; and obtain the working current of the storage device to be tested and input it into the current sampling circuit 20.

[0071] It can be understood that the switching device 100 of this embodiment can implement the contents described in any of the above embodiments, which will not be elaborated here.

[0072] See also Fig. 9 , Fig. 9 4 is a schematic diagram of a test system according to an embodiment of the present application. The test system 400 comprises a test device 200 and a switching device 100. The switching device 100 is connected between the test device 200 and a storage device to be tested, so that the test device 200 can test the storage device to be tested.

[0073] In some embodiments, in combination Figure 1 To illustrate, the switching device 100 includes a voltage regulating circuit 10 and a current sampling circuit 20 .

[0074] The voltage regulating circuit 10 is connected to the test device 200 and the storage device to be tested, and is used to regulate the test voltage provided by the test device 200 and output the regulated test voltage to the storage device to be tested.

[0075] The current sampling circuit 20 is connected to the test device 200 and the storage device to be tested, and is used for sampling the working current of the storage device to be tested and sending the working current to the test device 200 .

[0076] It can be understood that the adapter 100 of this embodiment is like the adapter 100 in any of the above embodiments, and forms a test system 400 with the test device 200, which can implement the contents described in any of the above embodiments, and will not be described in detail here.

[0077] See also Fig.10 , Fig.10 1 is a flow chart of an embodiment of a method for testing a storage device provided by the present application. The method comprises:

[0078] Step 101: Utilize the voltage regulating circuit of the adapter device to regulate the test voltage provided by the test device, and output the regulated test voltage to the storage device to be tested.

[0079] The voltage regulating circuit is connected to the testing device and the storage device to be tested.

[0080] Step 102: Using the current sampling circuit of the adapter device to sample the operating current of the storage device to be tested, and sending the operating current to the testing device, so that the testing device tests the storage device to be tested.

[0081] Wherein, the current sampling circuit is connected to the testing device and the storage device to be tested.

[0082] This method is applied to Figure 1 The adapter 100 is shown, and the adapter 100 is connected between the test device and the storage device to be tested. For details, please refer to any of the above embodiments, which will not be described here.

[0083] It can be understood that the method can also be applied to the adapter 100 in any of the above embodiments, where the adapter 100 is connected between the test device and the storage device to be tested. For details, please refer to any of the above embodiments, which will not be described in detail here.

[0084] Through the above method, the test voltage is regulated by the voltage regulating circuit and the current sampling circuit is used to collect the working current of the storage device to be tested based on the regulated test voltage. There is no need to set the test voltage for the test device separately each time. The test efficiency of the storage device to be tested can be improved, and the test device can obtain the working current of the storage device to be tested, making the test more comprehensive and improving the test effect.

[0085] In the present application, the storage device to be tested in any of the above embodiments may be a memory stick, and the type of the memory stick may be a DIMM (Dual-Inline-Memory-Modules), a SIMM (single in-line memory module), a UDIMM (Unbuffered Dual In-Line Memory Modules), or a SODIMM (Small Outline Dual In-line Memory Module).

[0086] See also Fig.11 , Fig.11 1 is a schematic diagram of a computer-readable storage medium according to an embodiment of the present application. The computer-readable storage medium 500 is used to store program data 501. When the program data 501 is executed by a processor, it is used to implement the following method steps:

[0087] The test voltage provided by the test device is adjusted by the voltage adjustment circuit of the adapter device, and the adjusted test voltage is output to the storage device to be tested; wherein the voltage adjustment circuit connects the test device and the storage device to be tested; the working current of the storage device to be tested is sampled by the current sampling circuit of the adapter device, and the working current is sent to the test device, so that the test device can test the storage device to be tested.

[0088] It can be understood that the computer-readable storage medium 500 in this embodiment is applied to the switching device 100 in any of the above embodiments. The specific implementation method thereof can refer to the above embodiments and will not be described in detail here.

[0089] In the several embodiments provided in this application, it should be understood that the disclosed methods and devices can be implemented in other ways. For example, the device implementation described above is only illustrative, for example, the division of the modules or units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed.

[0090] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0091] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0092] If the integrated units in the above other embodiments are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) or a processor (processor) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, RandomAccess Memory), disk or optical disk and other media that can store program codes.

[0093] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A switching device, It is characterized in that The adapter is connected between the test device and the storage device to be tested, so that the test device tests the storage device to be tested, and the adapter includes: a voltage regulating circuit, connected to the test device and the storage device to be tested, for regulating the test voltage provided by the test device and outputting the regulated test voltage to the storage device to be tested; a current sampling circuit, connected to the test device and the storage device to be tested, for sampling the working current of the storage device to be tested and sending the working current to the test device; A control circuit, wherein the control circuit is connected to the test device, the voltage regulating circuit and the current sampling circuit; the control circuit is used to output the test voltage provided by the test device to the voltage regulating circuit, and control the voltage regulating circuit to regulate the test voltage; and the control circuit is also used to obtain the working current sampled by the current sampling circuit, and send the working current to the test device; A burning circuit, wherein the burning circuit is connected to the control circuit and the storage device to be tested; The control circuit is also used to output the first SPD information provided by the test device to the burning circuit, and control the burning circuit to burn the first SPD information into the SPD chip of the storage device to be tested; A switching circuit, the switching circuit being connected to the control circuit; The control circuit is used to control the switching circuit to connect to the burning circuit or the voltage regulating circuit.

2. The switching device according to claim 1, It is characterized in that The control circuit is further used to control the burning circuit to obtain second SPD information from the SPD chip, and confirm whether the first SPD information is consistent with the second SPD information.

3. The switching device according to claim 2, It is characterized in that The switching device also includes an indicator light, which is connected to the control circuit; The control circuit is further configured to control the indicator light to give an abnormal reminder when it is confirmed that the first SPD information and the second SPD information are inconsistent.

4. The switching device according to claim 1, It is characterized in that The switching device also includes: A first communication interface, connected to the test device, one end of the voltage regulating circuit and one end of the current sampling circuit, for outputting the test voltage provided by the test device to the voltage regulating circuit; and sending the working current to the test device; A second communication interface is connected to the storage device to be tested, the other end of the voltage regulating circuit and the other end of the current sampling circuit, and is used to output the test voltage adjusted by the voltage regulating circuit to the storage device to be tested; and to obtain the working current of the storage device to be tested and input it into the current sampling circuit.

5. The switching device according to claim 4, It is characterized in that The switching device also includes: A circuit board, the voltage regulating circuit, the current sampling circuit, the first communication interface and the second communication interface are arranged on the circuit board.

6. A test system, It is characterized in that The test system comprises: Test equipment; A switching device, the switching device is connected between the test device and the storage device to be tested, so that the test device tests the storage device to be tested, and the switching device includes: a voltage regulating circuit, connected to the test device and the storage device to be tested, for regulating the test voltage provided by the test device and outputting the regulated test voltage to the storage device to be tested; a current sampling circuit, connected to the test device and the storage device to be tested, for sampling the working current of the storage device to be tested and sending the working current to the test device; A control circuit, wherein the control circuit is connected to the test device, the voltage regulating circuit and the current sampling circuit; the control circuit is used to output the test voltage provided by the test device to the voltage regulating circuit, and control the voltage regulating circuit to regulate the test voltage; and the control circuit is also used to obtain the working current sampled by the current sampling circuit, and send the working current to the test device; A burning circuit, wherein the burning circuit is connected to the control circuit and the storage device to be tested; The control circuit is also used to output the first SPD information provided by the test device to the burning circuit, and control the burning circuit to burn the first SPD information into the SPD chip of the storage device to be tested; A switching circuit, the switching circuit being connected to the control circuit; The control circuit is used to control the switching circuit to connect to the burning circuit or the voltage regulating circuit.

7. A method for testing a storage device, It is characterized in that Applied to a switching device, the switching device is the switching device according to any one of claims 1 to 5, and the method comprises: The test voltage provided by the test device is adjusted by the voltage adjustment circuit of the adapter device, and the adjusted test voltage is output to the storage device to be tested; wherein the voltage adjustment circuit connects the test device and the storage device to be tested; The operating current of the storage device to be tested is sampled by the current sampling circuit of the adapter device, and the operating current is sent to the test device so that the test device tests the storage device to be tested; wherein the current sampling circuit connects the test device and the storage device to be tested.

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