An integrated circuit electromagnetic radiation immunity test device and its usage method

Abstract

The present invention provides an integrated circuit electromagnetic radiation immunity test device and a usage method, including: a interference signal generating unit generates radio frequency interference signals, which are transmitted through a shielded cable or waveguide to a polarization antenna located in an anechoic chamber. The polarization antenna is calibrated and adjusted to accurately align with the center of the opening of the shielded box body. Then, through a high-field probe and a field strength monitor, the induced field strength is monitored and fed back. The guide rail slider assembly is adjusted to make the high field generated by the polarization antenna reach a predetermined high field range. An IC test board connected to the IC under test is covered at the opening, so that the test surface of the IC under test can receive radio frequency interference signals to the maximum extent, and the non-test surface of the IC under test is prevented from receiving radio frequency interference signals. The working state of the IC under test is monitored through a test bench, and the electromagnetic radiation immunity is evaluated. The accuracy of the integrated circuit electromagnetic radiation immunity test is improved, the test range of the electromagnetic radiation interference signal is increased, and the applicability is stronger.

Description

Technical Field

[0001] The present invention relates to the technical field of integrated circuit testing, and particularly to an integrated circuit electromagnetic radiation immunity testing device and a using method thereof. Background Art

[0002] With the wide application of integrated circuits, the electromagnetic compatibility problems they face have become increasingly prominent. Especially in the automotive chip industry, in order to improve their safety and convenience, millimeter-wave frequency devices such as in-vehicle millimeter-wave radars and 5G communication terminals are widely used in automobiles. Their operating frequency range is as wide as 1 GHz to 80 GHz. The increase in frequency makes the crosstalk problem between chip interconnections more serious. In order to cover the test frequency range of integrated circuit electromagnetic radiation immunity from 18 GHz to 80 GHz or higher. However, the current devices and methods for testing integrated circuit electromagnetic radiation immunity have a lower test frequency and cannot be tested under higher operating frequencies, resulting in a narrow application range. There is an urgent need for a new integrated circuit electromagnetic radiation immunity test device and method to facilitate the evaluation of the electromagnetic radiation immunity performance of integrated circuits in the millimeter-wave band.

[0003] Based on the above, the present invention discloses an integrated circuit electromagnetic radiation immunity testing device and a using method thereof, which can realize more accurate and rapid immunity testing of integrated circuits under electromagnetic radiation with higher frequencies and a wider frequency range. Summary of the Invention

[0004] The present invention provides an integrated circuit electromagnetic radiation immunity testing device and a using method thereof. A radio frequency interference signal is generated by an interference signal generating unit and transmitted to a polarization antenna through a shielded cable or waveguide. The polarization antenna is calibrated and adjusted through a combination of a laser emitter and a guide rail slider, and is accurately aligned with the center of the opening of the shielded box. Then, the induced field strength is monitored and fed back through a high-field probe and a field strength monitor. The guide rail slider combination is adjusted again to make the high field generated by the polarization antenna reach a predetermined high-field range. The IC test board connected to the IC under test is covered at the opening, so that the test surface of the IC under test can receive the radio frequency interference signal to the maximum extent and prevent the non-test surface of the IC under test from receiving the radio frequency interference signal. The working state of the IC under test is monitored by a test bench and the electromagnetic radiation immunity is evaluated. The accuracy of integrated circuit electromagnetic radiation immunity testing is improved, the test range of electromagnetic radiation interference signals is expanded, and the applicability is stronger.

[0005] In the first aspect of the present invention, an integrated circuit electromagnetic radiation immunity testing device is provided, including:

[0006] An anechoic chamber, the anechoic chamber is a sealed box-shaped object, and both the outside and inside of the sealed box-shaped object are covered with absorbing materials and / or electromagnetic shielding materials. The inner bottom surface of the anechoic chamber is made of insulating materials;

[0007] An interference signal generating unit, which is arranged outside the anechoic chamber and is used to generate radio frequency interference signals with a predetermined frequency and a predetermined intensity, and the range of the predetermined frequency is 150 kHz to 80 GHz;

[0008] A polarization antenna, which is arranged inside the anechoic chamber and is electrically connected to the interference signal generating unit through a shielded cable trough. The height and polarization direction of the polarization antenna are adjustable, and it is used to emit radio frequency interference signals in a predetermined direction;

[0009] A shielding box body, which is arranged inside the anechoic chamber. The shielding box body is a square box-shaped object, and one side of the square box-shaped object is provided with an opening, and the other five sides are all covered with absorbing materials and / or electromagnetic shielding materials;

[0010] An IC test board, which is detachably arranged at the opening of the shielding box body and completely covers the opening, and is used to fix the IC under test and be electrically connected to the IC under test; the non-tested surface of the IC under test is attached and connected to one surface of the IC test board, the tested surface of the IC under test faces the polarization antenna, and the center of the IC under test coincides with the center of the opening; the IC test board is made of several layers of circuit boards;

[0011] A laser emitter, which is arranged inside the shielding box body and the emission direction is adjustable, and is used to emit laser from the center of the opening and perpendicular to the opening plane to calibrate the direction of the polarization antenna;

[0012] A field strength probe, which is arranged inside the shielding box body and is located at the center position of the opening, and is used to sense the induced field strength of the radio frequency interference signal emitted by the polarization antenna;

[0013] A guide rail slider assembly, which includes a guide rail and a slider. The guide rail is arranged at the inner bottom of the anechoic chamber and is located outside the shielding box body. The slider is slidably arranged on the guide rail, and the polarization antenna is slidably arranged on the slide rail. The guide rail slider assembly is used to fix the polarization antenna and adjust the displacement of the polarization antenna in the horizontal direction;

[0014] A field strength monitor, which is arranged outside the anechoic chamber and is electrically connected to the field strength probe through a shielded cable trough, and is used to display and monitor the magnitude of the induced field strength;

[0015] A test bench, which is arranged outside the anechoic chamber and is electrically connected to the IC test board through a shielded cable trough, and is used to monitor the working state of the IC under test and evaluate the electromagnetic radiation immunity according to the working state.

[0016] Further, the device further includes:

[0017] A control computer, which is arranged outside the anechoic chamber and is electrically connected to the interference signal generating unit and the field intensity monitor respectively, is used for receiving, processing and sending data so as to control the process of the immunity test.

[0018] Furthermore, the interference signal generating unit includes:

[0019] A radio frequency signal generator, which is arranged outside the anechoic chamber and is used for generating radio frequency interference signals;

[0020] A power amplifier, which is arranged outside the anechoic chamber and is electrically connected to the radio frequency signal generator, is used for amplifying the radio frequency interference signals;

[0021] A directional coupler, which is arranged outside the anechoic chamber and is electrically connected to the power amplifier, is used for distributing the power of the radio frequency interference signals according to a predetermined ratio and direction;

[0022] A power meter, which is arranged outside the anechoic chamber and is electrically connected to the directional coupler and the control computer respectively, is used for measuring the forward power and / or reverse power of a predetermined ratio output by the directional coupler.

[0023] Furthermore, the device further includes:

[0024] A laser emitter bracket, which is arranged at the lower end of the laser emitter and is used for fixing and supporting the laser emitter. The laser emitter bracket is adjustable in height and is movably arranged on the inner bottom of the shielding box body;

[0025] A probe bracket, which is arranged at the lower end of the field intensity probe and is used for fixing and supporting the field intensity probe. The probe bracket is adjustable in height and is movably arranged on the inner bottom of the shielding box body.

[0026] Furthermore, the laser emitter bracket and the probe bracket are an integral bracket. The integral bracket includes an upper part and a lower part of the bracket. The laser emitter and the field intensity probe are respectively arranged at two ends in the horizontal direction of the upper part of the bracket. The lower part of the bracket is fixedly arranged on the inner bottom of the shielding box body. The upper part of the bracket is rotatably connected to the lower part of the bracket and is used for aligning the laser emitter or the field intensity probe with the center of the opening of the shielding box body by rotating the upper part of the bracket.

[0027] Furthermore, the device further includes: a non-conductive support, which is arranged on the inner bottom of the anechoic chamber. The guide rail slider assembly and the anechoic chamber are both arranged on the upper part of the non-conductive support;

[0028] The non-conductive support includes at least three non-conductive feet, and the non-conductive foot pads are used to support the non-conductive support and keep the non-conductive support at a predetermined distance from the full anechoic chamber.

[0029] Furthermore, the device also includes:

[0030] An antenna bracket, which is arranged at the lower end of the polarized antenna and is used to fix and support the polarized antenna. The antenna bracket is height-adjustable and movably arranged on the guide rail slider assembly;

[0031] A shielding box support is arranged at the lower end of the shielding box, and is used to fix and support the shielding box and keep the shielding box at a predetermined distance from the full anechoic chamber.

[0032] Furthermore, the IC test board uses at least four layers of printed circuit boards, the top and bottom layers of the four layers of printed circuit boards are both ground layers, these two layers are paved with a large area except for electronic components and electronic circuits, the top and bottom layers are connected by vias around them, the middle two layers are respectively a power supply layer and a signal layer, the power supply layer uses a negative film process to separate the power supply, the signal layer is paved with a large area except for the electronic circuits, and the differential signal lines are wired in the form of differential pairs.

[0033] A second aspect of the present invention provides a method for using an integrated circuit electromagnetic radiation immunity test device, comprising the following steps:

[0034] Start the laser emitter and adjust the position of the laser emitter so that the laser emitter is aligned with the center of the opening of the shielding box, and the emission direction of the laser is in a horizontal direction and perpendicular to the plane of the opening;

[0035] Adjusting the height and polarization direction of the polarized antenna so that the polarization direction and the beam direction of the laser transmitter are in the same straight line;

[0036] The laser transmitter is replaced by a field intensity probe, so that the direction of the field intensity probe is consistent with that of the laser transmitter, the interference signal generating unit is started to make the polarized antenna transmit a radio frequency interference signal, and the field intensity probe and the field intensity monitor are started;

[0037] Within a predetermined frequency range of 150kHz to 80GHz, adjust the power of the interference signal output by the interference signal generating unit, and / or adjust the position of the polarized antenna toward the horizontal direction of the field strength probe, and record the forward power of the interference signal generating unit when the field strength displayed by the field strength monitor reaches a predetermined field strength range;

[0038] Cover the IC test board connected with the tested IC to the opening, start the test bench, inject a radio frequency interference signal into the polarized antenna according to the forward power within the predetermined frequency range, observe the working state of the test bench, and evaluate the electromagnetic radiation immunity according to the working state.

[0039] Further, making the field strength displayed by the field strength monitor reach the predetermined field strength range includes: adjusting the intensity of the radio frequency interference signal according to the difference between the field strength displayed by the field strength monitor and the predetermined field strength range until the field strength displayed by the field strength monitor reaches the predetermined field strength range.

[0040] The technical solutions provided by the embodiments of the present invention at least bring the following beneficial technical effects:

[0041] The present invention provides a device for testing the electromagnetic radiation immunity of integrated circuits. Compared with the prior art, it improves the accuracy and efficiency of testing the electromagnetic radiation immunity of integrated circuits, increases the test range of interference signals, has stronger applicability, provides a new device for testing the electromagnetic radiation immunity of integrated circuits, and improves the user experience. Description of the Drawings

[0042] Figure 1 is a schematic structural diagram of a device for testing the electromagnetic radiation immunity of integrated circuits according to an embodiment of the present invention;

[0043] Figure 2 is a schematic structural diagram of a shielding box and a laser emitter of a device for testing the electromagnetic radiation immunity of integrated circuits according to an embodiment of the present invention;

[0044] Figure 3 is a schematic structural diagram of a shielding box and a field strength probe of a device for testing the electromagnetic radiation immunity of integrated circuits according to an embodiment of the present invention;

[0045] Figure 4 is a schematic structural diagram of another device for testing the electromagnetic radiation immunity of integrated circuits according to an embodiment of the present invention;

[0046] Figure 5 is a flowchart of the structural usage method of a device for testing the electromagnetic radiation immunity of integrated circuits according to an embodiment of the present invention;

[0047] Reference Signs:

[0048] Fully anechoic chamber - 1, interference signal generating unit - 2, polarization antenna - 3, shielding box - 4, IC test board - 5, laser emitter - 6, field strength probe - 7, guide rail slider assembly - 8, guide rail - 9, slider - 10, field strength monitor - 11, test bench - 12, antenna bracket 13, shielding box bracket 14, shielding cable trough - 15, fixed test IC - 16, control computer - 17, RF signal generator - 18, power amplifier - 19, directional coupler - 20 and power meter - 21, non - conductive support - 22. Detailed implementation manners

[0049] It should be noted that, without conflict, the embodiments in this application and the features in the embodiments can be combined with each other. The terms "first", "second", etc. in the description and claims of the present invention and the accompanying drawings are used to distinguish similar objects, rather than to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so as to implement the embodiments of the present invention described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non - exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps S or units does not necessarily have to be limited to those steps S or units clearly listed, but may include other steps S and units not clearly listed or inherent to these processes, methods, products or devices.

[0050] To enable those skilled in the art to better understand the solution of the present invention, the following clearly and completely describes the solution in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0051] Embodiment 1

[0052] The following details the technical solutions provided by each embodiment of this application with reference to the accompanying drawings.

[0053] The embodiment of the present invention provides an integrated circuit electromagnetic radiation immunity test device. Figure 1 It is a structural schematic diagram of an integrated circuit electromagnetic radiation immunity test device. Figure 2 It is a structural schematic diagram of the shielding box and the laser emitter of an integrated circuit electromagnetic radiation immunity test device. Figure 3 It is a structural schematic diagram of the shielding box and the field strength probe of an integrated circuit electromagnetic radiation immunity test device, as Figure 1 , Figure 2 , Figure 3 shown, and includes:

[0054] Fully anechoic chamber 1, interference signal generating unit 2, polarization antenna 3, shielding box 4, IC test board 5, laser emitter 6, field strength probe 7, guide rail slider assembly 8, field strength monitor 11, test bench 12. The specific implementation is as follows:

[0055] The fully anechoic chamber 1 is a sealed box-shaped object, preferably a cuboid; both the outside and inside of the box-shaped object are covered with absorbing materials and / or electromagnetic shielding materials; the inner bottom surface of the fully anechoic chamber 1 is made of insulating material. Among them, the absorbing material refers to a type of material that can absorb the electromagnetic wave energy projected onto its surface. In engineering applications, in addition to requiring the absorbing material to have a high absorption rate of electromagnetic waves within a relatively wide frequency band, it is also required to have properties such as light weight, temperature resistance, humidity resistance, and corrosion resistance. The electromagnetic shielding material is a type of material that can isolate metals between two spatial regions to control the induction and radiation of electric fields, magnetic fields, and electromagnetic waves from one region to another. Specifically, it is the material used to manufacture the shielding body. The shielding body surrounds the interference sources of components, circuits, assemblies, cables, or the entire system to prevent the interference electromagnetic field from spreading outwards; the receiving circuit, device, or system is surrounded by the shielding body to prevent it from being affected by the external electromagnetic field. The principles of the absorbing material and the shielding material are different. The absorbing material absorbs and converts the electromagnetic wave into heat, preventing the electromagnetic wave from reflecting on its surface, but the shielding material mainly prevents the electromagnetic wave from passing through and can reflect it in other directions. The main difference between the absorbing material and the electromagnetic shielding material lies in the application purpose. Taking military equipment as an example, the absorbing material is mainly used for the stealth protection of the equipment. By adjusting the impedance matching performance and the wave absorption property of the material, the absorption of electromagnetic waves is achieved. At this time, the electromagnetic waves are lost in various ways, minimizing reflection. The electromagnetic shielding material is mainly to protect a certain device from external electromagnetic field interference, and the way the material processes the electromagnetic wave can be absorption or reflection. Among them, the inner bottom surface of the fully anechoic chamber 1 is made of insulating material, which is convenient for other parts arranged on the inner bottom surface of the fully anechoic chamber 1 not to generate electromagnetic interference signals due to the conductivity of the inner bottom surface, affecting the accuracy of the test.

[0056] Among them, the interference signal generating unit 2 is arranged outside the fully anechoic chamber 1 and is used to generate radio frequency interference signals with a predetermined frequency and a predetermined intensity.

[0057] It should be noted that the range of the predetermined frequency of the radio frequency interference signal mainly includes 150 kHz to 80 GHz, and it is also applicable when extended to a higher predetermined frequency range.

[0058] Among them, the polarized antenna 3 is arranged inside the anechoic chamber 1 and is electrically connected to the interference signal generating unit 2 through a shielded cable groove 15. The height and polarization direction of the polarized antenna 3 are adjustable and are used to transmit radio frequency interference signals in a predetermined direction. The polarization of an antenna refers to the direction of the electric field strength formed during antenna radiation. The polarized antenna 3 can be a horn antenna or other linear polarized antenna 3.

[0059] It should be noted that the shielded cable is a transmission line that wraps the signal wire with a metal mesh braid layer. It can transmit electromagnetic waves inside and has the ability to shield electromagnetic waves on the outer layer; the waveguide is a structure used to direct electromagnetic waves, such as an optical fiber, which has the advantages of strong electromagnetic wave conduction ability and strong electromagnetic interference protection ability.

[0060] Among them, the shielding box 4 is arranged inside the anechoic chamber 1. The shielding box 4 is a square box-shaped object. One side of the square box-shaped object is provided with an opening, and the other five sides are covered with absorbing materials and / or electromagnetic shielding materials to reduce the influence of the shielding box 4 on the electromagnetic field distribution at the tested IC 16. It is connected to the test bench 12 of the anechoic chamber 1 through a shielded cable groove, and the test bench 12 is used to monitor the working state of the tested IC 16.

[0061] Among them, the IC test board 5 is detachably arranged at the opening of the shielding box 4 and completely covers the opening, and is used to fix the tested IC 16 and be electrically connected to the tested IC 16; the non-tested surface of the tested IC 16 is attached to one surface of the IC test board 5, the tested surface of the tested IC 16 faces the polarized antenna 3, and the center of the tested IC 16 coincides with the center of the opening; the IC test board 5 is made of several layers of circuit boards, which can further reduce the influence of the shielding box 4 on the electromagnetic field distribution at the tested IC 16. Among them, the tested surface is the surface that receives the radio frequency interference signal irradiation, and the non-tested surface does not receive signal irradiation, so that the received radio frequency interference signal has less attenuation loss, can more correctly reflect the accuracy of the radio frequency interference signal strength and interference effect, and improves the test accuracy.

[0062] The laser emitter 6 is arranged inside the shielding box 4 and its emission direction is adjustable, and is used to emit laser light from the center of the opening and perpendicular to the opening plane to calibrate the direction of the polarized antenna 3. The polarized antenna 3 calibrated by the laser is more accurately aligned with the tested IC 16, further improving the reception rate of the radio frequency interference signal and the test accuracy.

[0063] Among them, the field strength probe 7 is disposed inside the shielding box body 4 and at the center position of the opening, and is used to sense the induced field strength of the radio frequency interference signal emitted by the polarization antenna 3. It is disposed at the center position to accurately detect the field strength received by the tested IC 16, improve the detection accuracy, and further improve the accuracy of the correction and adjustment of the radio frequency interference signal, thereby improving the test accuracy.

[0064] Among them, the guide rail slider assembly 8 includes a guide rail 9 and a slider 10. The guide rail 9 is disposed at the inner bottom of the anechoic chamber 1 and outside the shielding box body 4. The slider 10 is slidably disposed on the guide rail 9. The polarization antenna 3 is slidably disposed on the slide rail. The guide rail slider assembly 8 is used to fix the polarization antenna 3 and adjust the displacement of the polarization antenna 3 in the horizontal direction, so as to adjust the direction of the polarization antenna 3 and make the induced field strength reach a predetermined field strength range.

[0065] It should be noted that the slider 10 can move only in the horizontal direction perpendicular to the opening plane of the shielding box body 4 on the guide rail 9 and the polarization antenna 3 moves in the horizontal direction parallel to the opening plane on the slide rail. The slider 10 can also move only in the horizontal direction parallel to the opening plane on the guide rail 9 and the polarization antenna 3 moves in the horizontal direction perpendicular to the opening plane on the slide rail. The slider 10 can also move in two horizontal directions parallel and perpendicular to the opening plane on the guide rail 9 and the polarization antenna 3 also moves in two horizontal directions parallel and perpendicular to the opening plane on the slide rail. There is no limitation here. For example, the guide rail 9 can be a single straight line type, or two parallel straight line types, or circular or elliptical. Preferably, the slider 10 is of a straight line type.

[0066] Among them, the field strength monitor 11 is disposed outside the anechoic chamber 1 and is electrically connected to the field strength probe 7 through the shielded cable groove 15, and is used to display and monitor the magnitude of the induced field strength. The field strength monitor 11 and the field strength probe 7 are used together to monitor the field strength at the center position of the opening on one side of the shielding box body 4, and further feed back the monitored induced field strength to the interference signal generating unit 2, so that the interference signal generating unit 2 generates a radio frequency interference signal that conforms to the predetermined field strength range.

[0067] It should be noted that the shielded cable groove 15 is different from the shielded cable or waveguide connecting the polarization antenna 3 and the interference signal generating unit 2, but uses a shielded cable groove, in which wires can be routed, so that multiple shielded circuits can be arranged at the same time to enhance the electromagnetic protection performance of the device.

[0068] Among them, the test bench 12 is arranged outside the anechoic chamber 1 and is electrically connected to the IC test board 5 through a shielded cable trough 15, and is used to monitor the working state of the IC under test 16 and evaluate the electromagnetic radiation immunity according to the working state. Preferably, when the IC under test 16 is powered on and working properly, the test bench 12 does not display a dry interference wave image, and when a radio frequency interference signal is received, an interference wave image with a predetermined frequency will be generated, and an interference wave image with a corresponding frequency will be generated according to the intensity of the received interference signal, so as to monitor the working state of the IC under test 16. Further, the size of the electromagnetic radiation immunity is evaluated according to the interference wave image.

[0069] In the specific implementation process, through the following steps:

[0070] Step 1: Start the laser transmitter 6 and adjust the position of the laser transmitter 6 so that the laser transmitter 6 is aligned with the center position of the opening of the shielding box body 4, and the emission direction of the laser is in the horizontal direction and perpendicular to the plane of the opening;

[0071] Step 2: Adjust the height and polarization direction of the polarization antenna 3 so that the polarization direction is on the same straight line as the beam direction of the laser transmitter 6;

[0072] Step 3: Replace the laser transmitter 6 with the field strength probe 7, keep the direction of the field strength probe 7 consistent with that of the laser transmitter 6, start the interference signal generating unit 2 to make the polarization antenna 3 emit a radio frequency interference signal, and start the field strength probe 7 and the field strength monitor 11;

[0073] Step 4: In the predetermined frequency range of 150 kHz to 80 GHz, adjust the power of the interference signal output by the interference signal generating unit 2, and / or adjust the position of the polarization antenna 3 in the horizontal direction facing the field strength probe 7, and record the forward power of the interference signal generating unit 2 when the field strength displayed by the field strength monitor 11 reaches the predetermined field strength range;

[0074] Step 5: Cover and connect the IC test board 5 connected with the IC under test 16 to the opening, start the test bench 12, inject a radio frequency interference signal into the polarization antenna 3 according to the forward power in the predetermined frequency range, observe the working state of the test bench 12, and evaluate the electromagnetic radiation immunity according to the working state.

[0075] In an embodiment of the present invention, a radio frequency interference signal with a predetermined frequency and intensity is generated by an interference signal generating unit 2 located outside the anechoic chamber 1, and is transmitted to a polarization antenna 3 through a shielded cable or waveguide. The polarization antenna 3 is calibrated and adjusted by a laser transmitter 6 and a guide rail slider assembly 8, and is accurately aligned with the center of the opening of the shielded box 4. Then, a field strength probe located at the center of the opening is used to obtain the intensity of the radio frequency interference signal generated by the polarization antenna 3. A field strength monitor 11 feeds back the monitored and sensed field strength magnitude, and then adjusts the power magnitude of the interference signal output by the interference signal generating unit 2, and / or adjusts the position of the polarization antenna 3 in the horizontal direction towards the field strength probe 7 through the guide rail slider assembly 8, so that the strong field generated by the polarization antenna 3 reaches a predetermined strong field range. An IC test board 5 connected to the test IC 16 is covered on the opening, and the center of the test surface of the test IC 16 coincides with the center of the opening, so that the test surface of the test IC 16 can receive the radio frequency interference signal generated by the interference signal generating unit 2 to the greatest extent, and the signal loss is minimized and the non-test surface of the test IC 16 is prevented from receiving the radio frequency interference signal, thereby improving the accuracy of the electromagnetic radiation immunity test of integrated circuits.

[0076] It can be seen that in the embodiment of the present invention, compared with the prior art, the integrated circuit electromagnetic radiation immunity test device has at least the following technical effects: improving the accuracy and efficiency of the integrated circuit electromagnetic radiation immunity test, expanding the test range of the electromagnetic radiation interference signal, having stronger applicability, providing a new integrated circuit electromagnetic radiation immunity test device, and enhancing the user experience.

[0077] In a preferred embodiment, the device further includes:

[0078] A control computer 17, which is arranged outside the anechoic chamber 1 and is electrically connected to the interference signal generating unit 2 and the field strength monitor 11 respectively, and is used for receiving, processing and sending data so as to control the process of the immunity test.

[0079] Specifically, the control computer 17 is located outside the anechoic chamber 1. By being electrically connected to the interference signal generating unit 2 and the field strength monitor 11, it identifies and calculates the sensed strong field signal received, generates a corresponding data sending instruction, and sends this data sending instruction to the interference signal generating unit 2. The interference signal generating unit 2 generates an adjusted radio frequency interference signal according to this instruction.

[0080] In a preferred embodiment, the interference signal generating unit 2 includes:

[0081] A radio frequency signal generator 18, which is arranged outside the anechoic chamber 1 and is used for generating a radio frequency interference signal;

[0082] A power amplifier 19, which is arranged outside the anechoic chamber 1 and electrically connected to the RF signal generator 18, is used to amplify the RF interference signal;

[0083] A directional coupler 20, which is arranged outside the anechoic chamber 1 and electrically connected to the power amplifier 19, is used to distribute the power of the RF interference signal in a predetermined ratio and direction;

[0084] A power meter 21, which is arranged outside the anechoic chamber 1 and electrically connected to the directional coupler 20 and the control computer 17 respectively, is used to measure the forward power and / or reverse power of a predetermined ratio output by the directional coupler 20.

[0085] In a preferred embodiment, the device further includes:

[0086] A laser emitter bracket, which is arranged at the lower end of the laser emitter 6 and is used to fix and support the laser emitter 6. The laser emitter bracket is adjustable in height and is movably arranged on the inner bottom of the shielding box body 4;

[0087] A probe bracket, which is arranged at the lower end of the field strength probe 7 and is used to fix and support the field strength probe 7. The probe bracket is adjustable in height and is movably arranged on the inner bottom of the shielding box body 4.

[0088] In the embodiment of the present invention, the laser emitter bracket and the probe bracket respectively make it easier to fix and adjust the height of the laser emitter 6 and the field strength probe 7, which is beneficial to the stability of the device and makes the operation more convenient.

[0089] In a preferred embodiment, the laser emitter bracket and the probe bracket are an integral bracket. The integral bracket includes an upper bracket part and a lower bracket part. The laser emitter 6 and the field strength probe 7 are respectively arranged at two ends in the horizontal direction of the upper bracket part. The lower bracket part is fixedly arranged on the inner bottom of the shielding box body 4. The upper bracket part is rotatably connected to the lower bracket part and is used to align the laser emitter 6 or the field strength probe 7 with the center of the opening of the shielding box body 4 by rotating the upper bracket part.

[0090] In the embodiment of the present invention, the integrally arranged laser emitter bracket and probe bracket make it easier to fix and more convenient to adjust the laser emitter 6 and the field strength probe 7, realize the quick switching between the laser emitter 6 and the field strength probe 7, further improve the convenience of the operation, and enhance the user experience.

[0091] In a preferred embodiment, the device further comprises: a non-conductive support 22, wherein the non-conductive support 22 is arranged at the inner bottom of the full anechoic chamber 1, and the guide rail and slider assembly 8 and the full anechoic chamber 1 are both arranged on the upper part of the non-conductive support 22;

[0092] The non-conductive support 22 includes at least three non-conductive feet, and the non-conductive foot pads are used to support the non-conductive support 22 and keep the non-conductive support 22 at a predetermined distance from the full anechoic chamber 1 .

[0093] Specifically, since the test IC 16 and the polarized antenna 3 are arranged at the inner bottom of the full anechoic chamber 1, the distance from the main body of the full anechoic chamber 1 is too close, and the bottom material of the full anechoic chamber 1 will affect the electromagnetic interference test, resulting in measurement errors. By setting the non-conductive support 22, the test IC 16 and the polarized antenna 3 are respectively kept at a predetermined distance from the bottom of the full anechoic chamber 1, reducing accidental errors and improving test accuracy.

[0094] In a preferred embodiment, the device further comprises: an antenna bracket 13 and a shielding box bracket 14, Figure 4 FIG. 1 is a schematic diagram of the structure of another integrated circuit electromagnetic radiation immunity testing device provided according to an embodiment of the present invention. Figure 4 As shown:

[0095] The antenna bracket 13 is disposed at the lower end of the polarized antenna 3 and is used to fix and support the polarized antenna 3. The antenna bracket 13 is height-adjustable and movably disposed on the guide rail slider assembly 8.

[0096] The shielding box support 14 is disposed at the lower end of the shielding box 4 , and is used to fix and support the shielding box 4 and to keep the shielding box 4 at a predetermined distance from the full anechoic chamber 1 .

[0097] In the embodiment of the present invention, the antenna bracket 13 and the shielding box bracket 14 make it easier to fix and adjust the height of the polarized antenna 3 and the shielding box 4, which is beneficial to the stability of the device, makes the operation more convenient, and makes the test IC 16 and the polarized antenna 3 respectively separated by a certain distance from the bottom of the full radio wave darkroom 1, thereby reducing accidental errors and improving the test accuracy.

[0098] In a preferred embodiment, the IC test board uses at least four layers of printed circuit boards, the top layer and the bottom layer of the four layers of printed circuit boards are both ground layers, and these two layers are paved with a large area except for electronic components and electronic circuits. The top layer and the bottom layer are connected by vias around them, and the middle two layers are respectively a power supply layer and a signal layer. The power supply layer uses a negative film process to separate the power supply, and the signal layer is paved with a large area except for the electronic circuits, and the differential signal lines are wired in the form of differential pairs.

[0099] In the embodiment of the present invention, the IC test board made of several layers of PCB circuit boards minimizes the radio frequency interference signals induced on the non-tested surface of the tested IC16, improving the accuracy of the integrated circuit electromagnetic radiation immunity test.

[0100] Embodiment Two

[0101] Based on the above device embodiment, the present invention further provides a usage method of an integrated circuit electromagnetic radiation immunity test device. Figure 5 It is a flowchart of a usage method of an integrated circuit electromagnetic radiation immunity test device according to an embodiment of the present invention, as Figure 5 shown, including the following steps:

[0102] Step S10: Start the laser emitter 6 and adjust the position of the laser emitter 6 so that the laser emitter 6 is aligned with the center position of the opening of the shielding box body 4, and make the emission direction of the laser be in the horizontal direction and perpendicular to the plane of the opening;

[0103] Step S20: Adjust the height and polarization direction of the polarization antenna 3 so that the polarization direction is on the same straight line as the beam direction of the laser emitter 6;

[0104] Step S30: Replace the laser emitter 6 with the field strength probe 7, keep the direction of the field strength probe 7 consistent with that of the laser emitter 6, start the interference signal generating unit 2 to make the polarization antenna 3 emit radio frequency interference signals, and start the field strength probe 7 and the field strength monitor 11;

[0105] Step S40: In the predetermined frequency range of 150 kHz to 80 GHz, adjust the power of the interference signal output by the interference signal generating unit 2, and / or adjust the position of the polarization antenna 3 in the horizontal direction towards the field strength probe 7. When the field strength displayed on the field strength monitor 11 reaches the predetermined field strength range, record the forward power of the interference signal generating unit 2;

[0106] In a preferred embodiment, by adjusting the magnitude of the interference signal output by the radio frequency signal generator 18 in the predetermined frequency range of 150 kHz to 80 GHz, record the forward power injected into the polarization antenna 3 measured by the power meter 21 when the predetermined field strength range is reached at the field strength probe 7;

[0107] Step S50: Cover and connect the IC test board 5 connected with the tested IC16 to the opening, start the test bench 12, inject radio frequency interference signals into the polarization antenna 3 according to the forward power in the predetermined frequency range, observe the working state of the test bench 12, and evaluate the electromagnetic radiation immunity according to the working state.

[0108] For the specific implementation manners, please refer to the detailed description of the above device embodiments, and they will not be elaborated in the embodiments of the present invention.

[0109] In the embodiments of the present invention, a radio frequency interference signal with a predetermined frequency and intensity is generated by an interference signal generating unit 2 located outside the anechoic chamber 1, and is transmitted to a polarization antenna 3 through a shielded cable or waveguide. The polarization antenna 3 is calibrated and adjusted by a laser transmitter 6 and a guide rail slider assembly 8, and is accurately aligned with the center of the opening of the shielding box 4. Then, a high-field probe located at the center of the opening acquires the intensity of the radio frequency interference signal generated by the polarization antenna 3. A field intensity monitor 11 feeds back the magnitude of the monitored and induced field intensity, and adjusts again the power magnitude of the interference signal output by the interference signal generating unit 2, and / or adjusts the position of the polarization antenna 3 in the horizontal direction facing the high-field probe 7 through the guide rail slider assembly 8, so that the high field generated by the polarization antenna 3 reaches a predetermined high-field range. An IC test board 5 connected to the tested IC 16 is covered on the opening, and the center of the tested surface of the tested IC 16 coincides with the center of the opening, so that the tested surface of the tested IC 16 can receive the radio frequency interference signal generated by the interference signal generating unit 2 to the maximum extent, and the signal loss is minimized and the non-tested surface of the tested IC 16 is prevented from receiving the radio frequency interference signal, thereby improving the accuracy of the electromagnetic radiation immunity test of the integrated circuit.

[0110] In a preferred embodiment, making the field intensity displayed by the field intensity monitor 11 reach a predetermined field intensity range includes: adjusting the intensity of the radio frequency interference signal according to the difference between the field intensity displayed by the field intensity monitor 11 and the predetermined field intensity range until the field intensity displayed by the field intensity monitor 11 reaches the predetermined field intensity range.

[0111] Specifically, the high-field probe senses the field intensity signal and sends it to the field intensity monitor 11 located outside the anechoic chamber 1 through a shielded cable groove 15. The field intensity monitor 11 outputs and displays the acquired field intensity signal. According to the difference between the output and displayed field intensity and the predetermined field intensity range, the interference signal generating unit 2 is adjusted manually or automatically, so that the interference signal generating unit 2 inputs a radio frequency interference signal with an intensity or frequency conforming to the predetermined field intensity range to the polarization antenna 3 within the test frequency range according to the forward power calibrated by the field intensity, so that the high field generated by the polarization antenna 3 reaches the predetermined high-field range, improving the operation convenience and test efficiency.

[0112] It can be seen that, in the embodiments of the present invention, compared with the prior art, the integrated circuit electromagnetic radiation immunity test device has at least the following technical effects: improving the accuracy and efficiency of the integrated circuit electromagnetic radiation immunity test, increasing the test range of electromagnetic radiation interference signals, having stronger applicability, providing a new integrated circuit electromagnetic radiation immunity test device, and enhancing the user experience.

[0113] The foregoing are only the preferred embodiments of the present invention, and do not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, shall be similarly included in the patent protection scope of the present invention.

Claims

1. An electromagnetic radiation immunity test device for integrated circuits, characterized in that, it includes: An anechoic chamber (1), the anechoic chamber (1) is a sealed box-shaped object, and both the outside and inside of the sealed box-shaped object are covered with absorbing materials and / or electromagnetic shielding materials, and the inner bottom surface of the anechoic chamber (1) is made of insulating materials; An interference signal generating unit (2), arranged outside the anechoic chamber (1), for generating radio frequency interference signals with a predetermined frequency and a predetermined intensity, and the range of the predetermined frequency is 150 kHz to 80 GHz; A polarization antenna (3), arranged inside the anechoic chamber (1), electrically connected to the interference signal generating unit (2) through a shielded cable or waveguide, and the height and polarization direction of the polarization antenna (3) are adjustable, for transmitting radio frequency interference signals in a predetermined direction; A shielding box body (4), arranged inside the anechoic chamber (1), the shielding box body (4) is a square box-shaped object, and one side of the square box-shaped object is provided with an opening, and the remaining five sides are all covered with absorbing materials and / or electromagnetic shielding materials; An IC test board (5), detachably arranged at the opening of the shielding box body (4) and completely covering the opening, for fixing the IC under test (16) and electrically connecting to the IC under test (16); the non-tested surface of the IC under test (16) is attached to one surface of the IC test board (5), the tested surface of the IC under test (16) faces the polarization antenna (3), and the center of the IC under test (16) coincides with the center of the opening; the IC test board (5) is made of several layers of circuit boards; A laser emitter (6), arranged inside the shielding box body (4) and with an adjustable emission direction, for emitting a laser from the center of the opening and perpendicular to the plane of the opening, so as to calibrate the direction of the polarization antenna (3); A field strength probe (7), arranged inside the shielding box body (4) and located at the center position of the opening, for sensing the induced field strength of the radio frequency interference signal emitted by the polarization antenna (3); A guide rail slider assembly (8), including a guide rail (9) and a slider (10), the guide rail (9) is arranged at the inner bottom of the anechoic chamber (1) and outside the shielding box body (4), the slider (10) is slidably arranged on the guide rail (9), the polarization antenna (3) is slidably arranged on the guide rail (9), and the guide rail slider assembly (8) is used to fix the polarization antenna (3) and adjust the displacement of the polarization antenna (3) in the horizontal direction; A field strength monitor (11), arranged outside the anechoic chamber (1), and electrically connected to the field strength probe (7) through a shielded cable trough (15), for displaying and monitoring the magnitude of the induced field strength; A test bench (12), arranged outside the anechoic chamber (1), and electrically connected to the IC test board (5) through a shielded cable trough (15), for monitoring the working state of the IC under test (16) and evaluating the electromagnetic radiation immunity according to the working state.

2. An electromagnetic radiation immunity test device for an integrated circuit as described in claim 1, characterized in that, it further comprises: A control computer (17), arranged outside the anechoic chamber (1), electrically connected to the interference signal generating unit (2) and the field intensity monitor (11) respectively, for receiving, processing and sending data so as to control the process of the immunity test.

3. An electromagnetic radiation immunity test device for an integrated circuit as described in claim 2, characterized in that, The interference signal generating unit (2) includes: A radio frequency signal generator (18), arranged outside the anechoic chamber (1), for generating radio frequency interference signals; A power amplifier (19), arranged outside the anechoic chamber (1), electrically connected to the radio frequency signal generator (18), for amplifying the radio frequency interference signals; A directional coupler (20), arranged outside the anechoic chamber (1), electrically connected to the power amplifier (19), for distributing the power of the radio frequency interference signals in a predetermined ratio and direction; A power meter (21), arranged outside the anechoic chamber (1), electrically connected to the directional coupler (20) and the control computer (17) respectively, for measuring the forward power and / or reverse power of a predetermined ratio output by the directional coupler (20).

4. An electromagnetic radiation immunity test device for an integrated circuit as described in any one of claims 1 to 3, characterized in that, it further comprises: A laser emitter bracket, which is arranged at the lower end of the laser emitter (6), for fixing and supporting the laser emitter (6), the height of the laser emitter bracket is adjustable and it is movably arranged on the inner bottom of the shielding box body (4); A probe bracket, which is arranged at the lower end of the field intensity probe (7), for fixing and supporting the field intensity probe (7), the height of the probe bracket is adjustable and it is movably arranged on the inner bottom of the shielding box body (4).

5. An electromagnetic radiation immunity test device for an integrated circuit as described in claim 4, characterized in that, The laser emitter bracket and the probe bracket are an integral bracket, the integral bracket includes an upper bracket part and a lower bracket part, the laser emitter (6) and the field intensity probe (7) are respectively arranged at both ends in the horizontal direction of the upper bracket part, the lower bracket part is fixedly arranged on the inner bottom of the shielding box body (4), and the upper bracket part is rotatably connected to the lower bracket part for aligning the laser emitter (6) or the field intensity probe (7) with the center of the opening of the shielding box body (4) by rotating the upper bracket part.

6. An electromagnetic radiation immunity test device for an integrated circuit as described in claim 1, characterized in that, it further comprises: A non-conductive support (22), which is arranged on the inner bottom of the anechoic chamber (1), and the guide rail slider assembly (8) and the anechoic chamber (1) are both arranged on the upper part of the non-conductive support (22); The non-conductive support (22) comprises at least three non-conductive pads, and the non-conductive pads are used to support the non-conductive support (22) and to keep the non-conductive support (22) at a predetermined distance from the full anechoic chamber (1).

7. An integrated circuit electromagnetic radiation immunity testing device as claimed in claim 1, It is characterized in that Also includes: An antenna bracket (13), the antenna bracket (13) being arranged at the lower end of the polarized antenna (3) and used for fixing and supporting the polarized antenna (3), the antenna bracket (13) being height-adjustable and movably arranged on the guide rail and slider assembly (8); A shielding box support (14), wherein the shielding box support (14) is arranged at the lower end of the shielding box (4) and is used to fix and support the shielding box (4) and to keep the shielding box (4) at a predetermined distance from the full anechoic chamber (1).

8. An integrated circuit electromagnetic radiation immunity testing device as claimed in claim 1, It is characterized in that The IC test board uses at least four layers of printed circuit boards, and the top and bottom layers of the four layers of printed circuit boards are both ground layers. These two layers are paved with a large area except for electronic components and electronic circuits. The top and bottom layers are connected by vias around them. The middle two layers are respectively a power supply layer and a signal layer. The power supply layer uses a negative film process to separate the power supply. The signal layer is paved with a large area except for the electronic circuits, and the differential signal lines are wired in the form of differential pairs.

9. A method for using the integrated circuit electromagnetic radiation immunity test device according to any one of claims 1 to 8, It is characterized in that The steps include: Starting the laser emitter (6) and adjusting the position of the laser emitter (6) so that the laser emitter (6) is aligned with the center position of the opening of the shielding box (4), and the emission direction of the laser is in a horizontal direction and perpendicular to the plane of the opening; Adjusting the height and polarization direction of the polarized antenna (3) so that the polarization direction and the beam direction of the laser transmitter (6) are in the same straight line; The laser transmitter (6) is replaced by a field intensity probe (7), the direction of the field intensity probe (7) is kept consistent with that of the laser transmitter (6), the interference signal generating unit (2) is started to make the polarized antenna (3) emit a radio frequency interference signal, and the field intensity probe (7) and the field intensity monitor (11) are started; Within a predetermined frequency range of 150 kHz to 80 GHz, the power of the interference signal output by the interference signal generating unit (2) is adjusted, and / or the position of the polarized antenna (3) in a horizontal direction toward the field strength probe (7) is adjusted, and when the field strength displayed by the field strength monitor (11) reaches a predetermined field strength range, the forward power of the interference signal generating unit (2) is recorded; Cover and connect the IC test board (5) connected with the tested IC (16) to the opening, start the test bench (12), inject a radio frequency interference signal into the polarization antenna (3) according to the forward power within the predetermined frequency range, observe the working state of the test bench (12), and evaluate the electromagnetic radiation immunity according to the working state.

10. The method for using an integrated circuit electromagnetic radiation immunity test device according to claim 9, characterized in that making the field strength displayed by the field strength monitor (11) reach a predetermined field strength range includes: adjusting the intensity of the radio frequency interference signal according to the difference between the field strength displayed by the field strength monitor (11) and the predetermined field strength range until the field strength displayed by the field strength monitor (11) reaches the predetermined field strength range.

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