Scintillation pulse digitization method, device, equipment and storage medium

Abstract

The present application discloses a scintillation pulse digitization method and device, well logging equipment, electronic equipment and storage medium. The scintillation pulse digitization method includes: based on N preset threshold voltages, determining the number M of scintillation pulse triggering threshold voltages, and obtaining the time information when the M threshold voltages are triggered, where 1≤M≤N; based on the M triggered threshold voltages, determining the translation characteristics that can characterize the time axis translation amount of the scintillation pulse; based on a preset pulse mathematical model, using the triggered threshold voltages, time information and translation characteristics to perform non-iterative linear fitting to reconstruct the scintillation pulse; based on the reconstructed scintillation pulse, determining the energy value of the scintillation pulse. The present application adopts the time shift feature, which can realize the fast, accurate, stable and engineering practice feasible fitting of a large number of scintillation pulses in hardware, thereby allowing the fast calculation of the energy information of the scintillation pulse to be implemented at the well logging site.

Description

Technical Field

[0001] The present application relates to the field of resource exploration, and in particular to a method and apparatus for digitizing scintillation pulses, equipment, and storage medium. Background Art

[0002] Pulsed neutron logging is a type of nuclear logging method. Its principle is to obtain the energy and time spectrum information from the gamma rays released by the energy of pulsed neutrons deposited in the formation. The main method is to use scintillation crystals coupled to photoelectric conversion devices. The scintillation crystals deposit the energy of high-energy radiation to produce visible light, which is converted into an electrical signal by the photoelectric conversion device to obtain information such as the energy of the high-energy radiation. Currently, scintillation crystals commonly used include BGO, lanthanum bromide, and sodium iodide. Photomultiplier tubes capable of operating at high temperatures are usually used as photoelectric conversion devices. The corresponding scintillation pulses are obtained using a scintillation pulse probe. After digitization and subsequent signal processing, the energy and time spectrum of the gamma rays are obtained.

[0003] There are two common traditional digitization methods. The first is direct digitization using a high-speed ADC. This method requires first shaping and widening the electrical pulse signal, and then digitally sampling it using a high-speed ADC up to 1GSps. However, in engineering practice, obtaining relatively accurate energy information from the digitized pulse requires at least 20 sampling points. Furthermore, ADC chips operating at high temperatures of up to 175°C typically have limited sampling rates and are very expensive. Therefore, digitizing high-speed scintillation crystal pulse signals is impossible, making it difficult to apply to oil well logging. The second method is the peak hold method, which uses a peak hold circuit to lock the amplitude of the electrical pulse signal, and then uses an ADC to collect the amplitude to obtain the energy information of the pulse. Although the peak hold method can process pulses from high-speed scintillation crystals, due to the peak hold lock establishment and peak hold circuit recovery process, its dead time is very long, usually reaching hundreds of microseconds. This greatly limits the pulse throughput rate of the digitization part (the number of pulses processed per unit time). In oil well logging, the number of pulse events often grows explosively. In common neutron oil well logging, the number of pulses can reach 100KCPS, with an average of one pulse every 10us. The dead time of the peak hold method will cause the digitization process to lose many pulse signals, thereby causing deviations in the measurement results.

[0004] The introduction of multi-voltage threshold (MVT) digitization methods into the field of oil exploration has also been proposed. Compared to traditional ADC digitization methods, MVT digitization solves some of the challenges of oil well logging pulse digitization. Compared to traditional ADC and other time interval sampling methods, MVT digitization uses fixed threshold voltages and only digitally samples the time when the scintillation pulse crosses the threshold voltage, thereby acquiring multiple sampling points during the rapid rising edge phase. In practice, after obtaining a series of time-voltage pairs, the pulses are iteratively fitted based on a priori scintillation pulse shape information, thereby accurately acquiring particle energy deposition information.

[0005] CN107024711A of the present applicant proposes a fitting method for digital scintillation pulse signals, which uses the Levenberg-Marquardt method to realize nonlinear fitting of digital scintillation pulses obtained based on the MVT method. The Levenberg-Marquardt method is a pulse fitting optimization algorithm and is also the most widely used nonlinear least squares iterative algorithm. It uses the gradient to find the maximum (minimum) value. It is a nonlinear optimization method between the Newton method and the gradient descent method, and has the advantages of both the gradient method and the Newton method.

[0006] However, due to limitations in chip computing power and the computational complexity of the fitting method, this type of iterative nonlinear fitting algorithm cannot be implemented on embedded chips such as FPGAs, STM32s, and DSPs, limiting the implementation of this type of scintillation pulse digitization method at the well logging site. This requires that the original sampling points obtained by the MVT method at the well logging site must be remotely transmitted to a computer via remote communication. The remote computer's relatively powerful computing power can then be used to perform nonlinear iterative fitting using computer software or a combination of computer software and hardware to obtain the scintillation pulse energy.

[0007] Furthermore, during oil well logging, the scintillation time exhibits periodic bursts, and the data volume of the raw sampling points can reach 10Mbps to 1Gbps. However, due to the limitations of the oil exploration application scenario, which involves downhole depths of tens of thousands of meters and high ambient temperatures, transmission can only be achieved via carrier communication, with a bandwidth of only approximately 100Kbps. With existing methods, transmitting numerous raw sampling points inevitably consumes a significant amount of bandwidth, resulting in a decrease in count rate. Furthermore, even when fitting on a remote computer, the repeated iterations required to fit each pulse require a significant amount of computing resources and excessive CPU time on the remote computer. This is unacceptable in oil exploration applications.

[0008] The content of this background technology description is only for facilitating understanding of the relevant technology in this field and is not regarded as an admission of the prior art. Summary of the Invention

[0009] Therefore, the inventors of the present application hope to have a fast, accurate, stable and engineering-practical hardware-based scintillation pulse digitization solution, which allows for the rapid calculation of scintillation pulse energy information at the logging site, and the information transmitted during logging is changed from numerous sampling points to a single energy information, avoiding the loss of counting rate during the transmission process.

[0010] To this end, the present application provides a scintillation pulse digitization method and apparatus, well logging equipment, and related electronic equipment and computer-readable storage medium.

[0011] In a first aspect, a method for digitizing a scintillation pulse is provided, which includes: determining the number M of scintillation pulse triggering threshold voltages based on N preset threshold voltages, and obtaining time information when the M threshold voltages are triggered, wherein 1≤M≤N; determining a translation feature that can characterize the time axis translation amount of the scintillation pulse based on the triggered M threshold voltages; performing non-iterative linear fitting based on a preset pulse mathematical model using the triggered threshold voltages, the time information and the translation feature to reconstruct the scintillation pulse; and determining the energy value of the scintillation pulse based on the reconstructed scintillation pulse.

[0012] Optionally, the non-iterative linear fitting is a linear least squares fitting.

[0013] Optionally, the preset pulse mathematical model is:

[0014]

[0015] Where y(t) is the voltage variable, t is the time variable, t0 is the start time of the scintillation pulse, and a, b, and c are the characteristic parameters to be determined.

[0016] Optionally, determining the shift feature that can characterize the time axis shift of the scintillation pulse based on the triggered M threshold voltages includes: determining the time difference T between the time t1 when the scintillation pulse first triggers the threshold voltage and the start time t0 of the scintillation pulse based on the triggered M threshold voltages. m , the translation characteristic is the time difference or is determined by the time difference.

[0017] Optionally, based on triggering M threshold voltages, the time difference T between the first triggering threshold voltage t1 of the scintillation pulse and the starting time t0 of the scintillation pulse is determined. m , including: providing N reference time differences T n, wherein each reference time difference corresponds to one of the N preset threshold voltages; the reference time difference corresponding to the triggering threshold voltage of M is selected as the time difference T m .

[0018] Optionally, the providing of N reference time differences T n , comprising: providing one or more prior pulse signals for each of the N preset threshold voltages, obtaining the start time of the one or more prior pulse signals and the time when the threshold voltage is first triggered; determining a reference time difference T corresponding to each preset threshold voltage based on the obtained start time of the one or more prior pulse signals and the time when the threshold voltage is first triggered n .

[0019] Optionally, determining the energy value of the scintillation pulse based on the reconstructed scintillation pulse includes: integrating the reconstructed scintillation pulse to obtain the energy value.

[0020] Optionally, the method may further include: collecting the scintillation pulse.

[0021] Optionally, the method further comprises: outputting the energy value of the scintillation pulse to a remote computer.

[0022] Optionally, the method is implemented based on FPGA hardware.

[0023] In a second aspect, a scintillation pulse digitization device is provided, which includes: a pulse amplitude differentiation module, configured to determine the number M of scintillation pulse triggering threshold voltages based on N preset threshold voltages, and obtain time information when the M threshold voltages are triggered, where 1≤M≤N; a time axis translation module, configured to determine a translation feature that can characterize the time axis translation amount of the scintillation pulse based on the triggered M threshold voltages; a linear fitting module, configured to perform non-iterative linear fitting based on a preset pulse mathematical model using the triggered threshold voltage, the time information and the translation feature to reconstruct the scintillation pulse; and an energy value determination module, configured to determine the energy value of the scintillation pulse based on the reconstructed scintillation pulse.

[0024] Optionally, the non-iterative linear fitting is a linear least squares fitting.

[0025] Optionally, the preset pulse mathematical model is:

[0026]

[0027] Where y(t) is the voltage variable, t is the time variable, t0 is the start time of the scintillation pulse, and a, b, and c are the characteristic parameters to be determined.

[0028] Optionally, the time axis shifting module is configured to determine the time difference between the time when the scintillation pulse triggers the threshold voltage for the first time and the start time of the scintillation pulse based on the triggered M threshold voltages.

[0029] Optionally, the time axis translation module includes: a reference time difference module, configured to provide N reference time differences, wherein each reference time difference corresponds to one of the N preset threshold voltages; and a selection module, configured to select the reference time difference corresponding to the triggered M threshold voltages as the time difference.

[0030] Optionally, the reference time difference module includes: an acquisition submodule, configured to provide one or more prior pulse signals for each of the N preset threshold voltages, and obtain the start time of the one or more prior pulse signals and the time when the threshold voltage is first triggered; a determination submodule, determining the reference time difference corresponding to each preset threshold voltage based on the acquired start time of the one or more prior pulse signals and the time when the threshold voltage is first triggered.

[0031] Optionally, the energy value determination module includes: an integration module configured to integrate the reconstructed scintillation pulse to obtain the energy value.

[0032] Optionally, the digitizing device further includes: a sampling module configured to collect the scintillation pulses.

[0033] Optionally, the digitizing device further includes: an energy value output module configured to output the energy value of the scintillation pulse to a remote computer.

[0034] Optionally, the digitizing device is integrated into or implemented by an FPGA.

[0035] In a third aspect, a logging device is provided, comprising: a downhole detection terminal, comprising a scintillation pulse digitizing device according to any embodiment of the present application and a detection device coupled to the digitizing device, wherein the detection device is used to detect high-energy rays in the well to generate scintillation pulses; a remote computer away from the downhole detection terminal, wherein the scintillation pulse digitizing device is configured to transmit the energy value of the measured scintillation pulse to the remote computer.

[0036] Optionally, the detection device includes a scintillation crystal and a photoelectric converter coupled to the scintillation crystal.

[0037] In a fourth aspect, an electronic device is provided, characterized in that it includes: a processor and a memory storing a computer program, and the processor is configured to execute the method described in any embodiment of the present application when running the computer program.

[0038] In a fifth aspect, a computer-readable storage medium is provided, characterized in that the computer-readable storage medium stores a computer program, and the computer program is configured to execute the method described in any embodiment of the present application when executed.

[0039] The scintillation pulse digitalization solution provided in the embodiments of the present application utilizes a non-iterative direct linear fit and introduces a time-shift feature based on the trigger threshold voltage. This enables fast, accurate, stable, and engineering-practical fitting of a large number of scintillation pulses in hardware, thereby allowing for rapid calculation of scintillation pulse energy information at the logging site. Furthermore, the information transmitted during logging is converted from numerous sampling points to a single energy information source, thus avoiding count rate loss during transmission. Furthermore, the scintillation pulse digitalization solution according to the embodiments of the present application can also be applied to other situations requiring fast, accurate, and stable fitting of scintillation pulses and / or requiring hardware-based fitting and / or avoiding remote transmission of scintillation pulse sampling points.

[0040] Some of the optional features and other effects of the embodiments of the present application are described below, and some can be understood by reading this document. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] The embodiments of the present application are described in detail with reference to the accompanying drawings. The elements shown are not limited to the scale shown in the drawings. The same or similar reference numerals in the drawings represent the same or similar elements, wherein:

[0042] The embodiments of the present application are described in detail with reference to the accompanying drawings. The elements shown are not limited to the scale shown in the drawings. The same or similar reference numerals in the drawings represent the same or similar elements, wherein:

[0043] Figure 1 A flow chart of a method for digitizing scintillation pulses according to an embodiment of the present application is shown;

[0044] Figure 2 A flow chart of a method for digitizing scintillation pulses according to an embodiment of the present application is shown;

[0045] Figure 3 A flow chart of a method for digitizing scintillation pulses according to an embodiment of the present application is shown;

[0046] Figure 4 A flow chart of a method for digitizing scintillation pulses according to an embodiment of the present application is shown;

[0047] Figure 5A A schematic structural diagram of a scintillation pulse digitizing device according to an embodiment of the present application is shown;

[0048] Figure 5BA schematic structural diagram of a time axis translation module of a scintillation pulse digitizing device according to an embodiment of the present application is shown;

[0049] Figure 5C A schematic structural diagram of a reference time difference module of a scintillation pulse digitization device according to an embodiment of the present application is shown;

[0050] Figure 6 A schematic structural diagram of a scintillation pulse digitizing device according to an embodiment of the present application is shown;

[0051] Figure 7A A schematic structural diagram of a well logging device according to an embodiment of the present application is shown;

[0052] Figure 7B A schematic structural diagram of a downhole detection terminal of a well logging device according to an embodiment of the present application is shown;

[0053] Figure 7C A schematic structural diagram of a detection device of a downhole detection terminal of a well logging device according to an embodiment of the present application is shown;

[0054] Figure 8 A schematic diagram of an exemplary hardware structure of an electronic device capable of implementing the method according to an embodiment of the present application is shown. DETAILED DESCRIPTION

[0055] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail below in conjunction with specific embodiments and accompanying drawings. Here, the exemplary embodiments of the present invention and their descriptions are used to explain the present invention, but are not intended to limit the present invention.

[0056] As used herein, the term "including" and its variations represent open inclusion, i.e., "including but not limited to." Unless otherwise stated, the term "or" means "and / or." The term "based on" means "based at least in part on." The terms "an example embodiment" and "an embodiment" mean "at least one example embodiment." The term "another embodiment" means "at least one additional embodiment." The terms "first," "second," etc. may refer to different or the same objects. Other explicit and implicit definitions may also be included below.

[0057] The specific embodiments of the present application will be described in detail below with reference to the accompanying drawings.

[0058] In embodiments of the present application, a scintillation pulse digitization solution is provided that is fast, accurate, stable, and engineering-practical. Specifically, a scintillation pulse digitization method and apparatus are provided, as well as logging equipment, electronic equipment, and computer-readable storage media implemented based on such a digitization solution. Thus, the solution according to embodiments of the present application allows for rapid calculation of scintillation pulse energy information at the logging site or other occasions where scintillation pulse digitization is required, and simplifies the information to be transmitted during logging or other occasions where transmission is required, for example, by converting numerous sampling points into a single energy information, thereby avoiding count rate loss during transmission.

[0059] Reference below Figure 1 , shows a method for digitizing scintillation pulses according to an embodiment of the present application.

[0060] In the embodiment of the present application, for example, Figure 1 As shown, the digitization method of the scintillation pulse is implemented based on hardware, more specifically, based on embedded hardware, more specifically based on an embedded chip and optional peripheral hardware. Preferably, the embedded chip may include a variety of application-specific integrated circuit (ACIS) chips, digital signal processing (DSP) chips, field programmable gate array (FPGA) chips, embedded single-chip microcomputers (such as STM32), etc. In a particularly preferred embodiment, the digitization method of the scintillation pulse is implemented based on FPGA, and here, FPGA may cover FPGA chips and optional peripheral hardware according to specific circumstances. As an example, the method / device and its features, steps, sub-steps, components, sub-components, etc. for implementing the embodiments of the present invention will be described below using FPGA as an example.

[0061] Furthermore, if Figure 1 The digitization method shown includes steps S120 to S150:

[0062] S120: Based on N preset threshold voltages, determine the number M of scintillation pulse triggering threshold voltages, and obtain time information when the M threshold voltages are triggered, where 1≤M≤N.

[0063] In an embodiment of the present application, N preset threshold voltages can be set according to the MVT method, wherein N is preferably a natural number greater than or equal to 3, such as N=4, 8, 16, 32, or 64. In some embodiments, the threshold voltages can be set so that the differences between adjacent threshold voltages are equal, that is, the multiple threshold voltages are set to be equidistant in terms of voltage values. In some embodiments, these preset threshold voltages can be set using parallel analog-to-digital converters (DACs) driven by an FPGA chip. The specific means for setting the preset threshold voltages are not described in detail here.

[0064] In an embodiment of the present application, based on the set threshold voltage, the corresponding module in the FPGA chip can be used to determine the number M of threshold voltages to be triggered, and obtain the time information when the M threshold voltages are triggered. For example, the voltage comparator in the FPGA chip can be used to compare the voltage of the scintillation pulse with the preset threshold voltage. In some embodiments, the time information when the threshold voltage is triggered can be determined based on a clock module in the FPGA, such as a time-to-digital converter (TDC). Here, determining the scintillation pulse triggering threshold voltage and determining the number of triggering threshold voltages will not be repeated. Similarly, the specific means of obtaining the time information when the threshold voltage is triggered will not be repeated.

[0065] Here, depending on the amplitude characteristics of the scintillation pulse itself, the number of threshold voltages triggered may be M, which is less than or equal to N. The aforementioned time information can be expressed as a combination of voltage and time parameters for each trigger point (sampling point) when recording, such as [V i , t i ], where voltage is V, time (point) is t, V i and t i Respectively represent the i-th voltage and the time (point) corresponding to the i-th voltage. It should be understood by those skilled in the art that when the number of trigger threshold voltages is M, the time information (trigger points / sampling points) obtained may be 2M or 2M-1, where the latter may be that one of the trigger threshold voltages roughly corresponds to the maximum amplitude of the scintillation pulse. When the time information (trigger points / sampling points) obtained is 2M, the aforementioned time information may be expressed as [V1, t1], ..., [V M , t M ]、[V M , t M+1 ],···,[V1,t 2M ]; When the acquired time information (trigger point / sampling point) is 2M-1, the aforementioned time information may be expressed as [V1, t1], ..., [V M-1 , t M-1 ]、[V M , t M ]、[V M-1 , t M+1 ],···,[V1,t 2M-1 ].

[0066] In this step, the pulse amplitudes of the scintillation pulses can be effectively distinguished by determining the number of scintillation pulse triggering thresholds.

[0067] S130: Determine a translation feature that can characterize the time axis translation amount of the scintillation pulse based on the M triggered threshold voltages.

[0068] In the embodiment of the present application, based on the M triggered threshold voltages, determining a shift feature that can characterize the time axis shift of the scintillation pulse includes:

[0069] S130′: Based on the M threshold voltages triggered, determine the time difference T between the time t1 when the scintillation pulse first triggers the threshold voltage and the scintillation pulse start time t0. m .

[0070] In the embodiment of the present application, when the number of threshold voltages triggered by the flash pulse is M (1≤M≤N), the shift characteristic is the time difference T m Or the translation feature can be represented by the time difference T m Further deduction and confirmation.

[0071] In a preferred embodiment, the translation characteristic is the time difference.

[0072] In a specific embodiment, the time difference T corresponding to the number of trigger threshold voltages M (M=1, . . . , N) can be provided by providing a lookup table or other queryable form. m .

[0073] In fact, for different energies or different types of scintillation pulses in actual exploration, the number of voltages that can be triggered is not the same. For a certain actual scintillation pulse, after the first triggering threshold voltage, it often corresponds to a specific time difference T between the time t1 of the triggering threshold voltage and the start time t0 of the scintillation pulse. m Therefore, in practice, different types of scintillation pulses can correspond to different time differences T in the fitting process. m Since the starting time t0 of the scintillation pulse in the time difference is often difficult to determine, the fitting is performed by performing a translation transformation on the actually measured time axis.

[0074] In a specific embodiment, M-1 values may be provided according to the number of thresholds actually triggered, namely T1, T2, T3, ..., T M-1 , which respectively represent the corresponding time required for a single pulse to be generated and the pulse amplitude (voltage) to reach the first threshold under different numbers of trigger thresholds (in this embodiment, the case of triggering only one threshold voltage can be ignored).

[0075] Here, the digitization scheme according to the embodiment of the present application may not seek to obtain a specific pulse start time (hereinafter indicated as t0). As an explanation and not constituting an admission of the prior art or a limitation of the invention, when digitally reconstructing the scintillation pulse, generally speaking, it may be important and more intuitive to determine the pulse start time or its derivative value using an iterative or other solution method. However, in order to achieve a fast, accurate, stable and practically feasible scintillation pulse digitization solution, especially to enable the solution to be implemented based on hardware, the time difference T between the time t1 when the threshold voltage is first triggered and the scintillation pulse start time t0 may be used. m Or its derivative characteristics are used as translation characteristics, and the translation characteristics are predetermined based on the number M of triggered threshold voltages. This not only ensures the speed and accuracy of the digitization scheme, but also makes it possible to implement and maintain the stability of the digitization scheme, especially in hardware, in terms of engineering practice. On the contrary, since the occurrence time of the scintillation pulse and the occurrence interval between two adjacent scintillation pulses are uncertain in various application scenarios, iterating or solving the specific pulse start time may consume a lot of computing time, which is not practically feasible in some application scenarios. If the scintillation pulse start time is defined in an assumed, approximate or ignored manner, it may not meet the conditions for accurately reconstructing the pulse signal and obtaining energy information, and it is not practically feasible in some application scenarios.

[0076] Furthermore, using the above-mentioned time difference or its derivative feature as a shift feature and predetermining the shift feature based on the number M of triggered threshold voltages can also achieve a further preferred specific solution and provide further advantageous effects, such as described below.

[0077] Specifically, if Figure 3 As shown, step S130' may include steps S131 and S132:

[0078] S131: Provide N reference time differences T n , wherein each reference time difference corresponds to one of N preset threshold voltages.

[0079] More specifically, if Figure 4 As shown, step S131 may include steps S1311 and S1312:

[0080] S1311: For each of the N preset threshold voltages, provide one or more prior pulse signals, and obtain the start time of the one or more prior pulse signals and the time when the threshold voltage is first triggered.

[0081] S1312: Determine the reference time difference T corresponding to each preset threshold voltage based on the start time of the acquired one or more prior pulse signals and the time when the threshold voltage is first triggered.n .

[0082] S132: Select the reference time difference corresponding to the triggering threshold voltage of M as the time difference T m .

[0083] In such Figure 3 and Figure 4 In the preferred embodiment shown, a priori pulse signal can be generated by providing a pulse generating device. Here, the priori pulse signal of the pulse generating device can simulate the scintillation pulse according to the specific circumstances. At this time, the pulse signal characteristics of the priori pulse signal are known, especially the pulse occurrence time (which may correspond to the start time of the pulse signal or the start time of the pulse signal obtained by conversion), thereby correspondingly determining the time difference between the time of the first triggering threshold voltage and the start time of the scintillation pulse in the priori pulse signal under each number of triggering threshold voltages. In some embodiments, the statistical data of multiple priori pulse signals, such as the average value, can be used as a reference time difference, so as to use the triggering threshold number of the scintillation pulse as the corresponding time difference (translation feature). In the present application, this method ensures extremely high accuracy of reconstruction in the digitization method and allows rapid digitization.

[0084] S140: Based on a preset pulse mathematical model, a non-iterative linear fitting is performed using the triggered threshold voltage, time information, and translation characteristics to reconstruct the scintillation pulse.

[0085] In the embodiment of the present application, the non-iterative linear fitting is a linear least squares fitting.

[0086] In the embodiment of the present application, the preset pulse mathematical model can be shown as the following formula (1):

[0087]

[0088] Where y(t) is the voltage variable, t is the time variable, t0 is the start time of the scintillation pulse, and a, b, and c are the characteristic parameters to be determined.

[0089] In an embodiment of the present application, step S140 may include: optionally processing the threshold voltage and time information (sampling points) using a translation feature; providing a preset pulse mathematical model, and processing the preset pulse mathematical model so that it is suitable for non-iterative linear fitting; using a linear fitting method, such as a linear least squares method, to perform non-iterative linear fitting on the processed preset pulse mathematical model, such as a linear least squares fitting, to determine the variables of the preset pulse mathematical model, thereby realizing reconstruction of the scintillation pulse.

[0090] In a specific embodiment, for each trigger threshold corresponding to the time (time point) t i(i=1,2,……), t-t0 in the above formula (1) can be expressed as (t i -t1)+(t1-t0). Thus, according to the translation characteristics determined based on the number M of trigger threshold voltages in step S130 and / or S130' and / or its sub-steps, such as the time difference Tm, each time point can be determined as (t i -t1+Tm), at this time, each sampling point that has been processed accordingly can be obtained.

[0091] Here, the above-mentioned processed sampling points can be applied to the above-mentioned equation (1), and after further simplifying the equation (1), the (natural) logarithm of both sides of the equation (1) (or the simplified equation (1)) can be calculated, and the terms can be shifted after the logarithm is calculated. The equation after the shifted terms is then subjected to a non-iterative linear fitting algorithm, preferably a non-iterative linear least squares operation, to determine the aforementioned unknown variables, i.e., the characteristic parameters a, b, c to be determined. Those skilled in the art will understand that the determination of the unknown variables a, b, c includes directly determining the variables a, b, c, directly determining the associated variables of the variables a, b, c, or a combination of the two, i.e., directly determining a portion of the variables a, b, c, and directly determining the associated variables of the other portions of the variables a, b, c. For example, in one embodiment, a non-iterative linear least squares operation can be used to directly obtain the variables a', b, c, where the variable a' is the associated variable of the variable a and can be converted into the variable a. In this way, the fitted objective function can be determined, and the reconstruction of the scintillation pulse can be achieved.

[0092] As a result, a reconstruction algorithm is implemented that can calculate and determine the preset pulse mathematical model variables without iteration, only through a linear fitting algorithm, such as the least squares method. This also makes the energy calculation process in subsequent steps more convenient and easy to implement in hardware circuits, such as embedded hardware circuits, more specifically in FPGAs, ASICs, etc.

[0093] By way of example and not limitation, when implementing the non-iterative linear fitting reconstruction step in FPGA hardware (FPGA chip and peripheral hardware), a matrix decomposition method can be used to set up several matrix decomposition units and solver units in the FPGA for implementation. Each unit can include modules such as FIFO (first-in-first-out), multipliers, adders, and subtractors as needed, which are provided by the FPGA chip and / or peripheral hardware. Those skilled in the art will understand that although the specific example briefly describes the means for implementing the above-mentioned reconstruction (linear fitting) using FPGA hardware, various different means for implementing the reconstruction (linear fitting) using other hardware circuits are conceivable, and this falls within the scope of the present invention.

[0094] S150: Determine the energy value of the scintillation pulse based on the reconstructed scintillation pulse.

[0095] In an embodiment not shown, step S150 may specifically include: integrating the reconstructed scintillation pulse to obtain an energy value.

[0096] Although the reconstruction in this embodiment of the present application introduces a translation feature, considering that the time axis translation does not affect the integral value, the method in this embodiment of the present application can directly integrate the fitted reconstructed pulse signal to obtain the energy value of the detected pulse. This avoids the algorithmic complexity caused by further calculations, conversions, or processing, allowing the method according to this embodiment of the present application to be well implemented through hardware operations.

[0097] In the embodiments of the present application, a variety of integration methods can be used to obtain energy values, including but not limited to rectangular integration method, trapezoidal integration method, Simpson integration method, etc.

[0098] In one embodiment, the energy value of the pulse signal can be obtained by using a rectangular integration method. The main idea of the rectangular integration method is to divide the integration interval I=[a, b] of the reconstructed pulse into the sum of many sufficiently small intervals.

[0099] In a specific embodiment, the energy value can be obtained by implementing a rectangular integration method based on the following formula:

[0100]

[0101] Wherein, n (i=1, ···, n) in the formula is the number of sampling points for sampling the reconstructed pulse signal during integration; i is the time of the i-th sampling point, Δt i is the time difference between two adjacent sampling points, Δt i =t i+1 -t i ; f(*) is the reconstructed pulse signal obtained by fitting, that is, the objective function after fitting.

[0102] Those skilled in the art will understand that the sampling during integration is implemented in the reconstructed pulse, while the aforementioned sampling based on the threshold voltage is implemented on the received pulse. It is conceivable that a suitable sampling time t and / or sampling time interval can be selected as needed during integration, which may be different from the pulse-based sampling interval, although the symbol "t" is used to represent the sampling time (point) when describing these two samplings.

[0103] In a specific embodiment, a trapezoidal integration method or a Simpson integration method may be implemented to obtain the energy value. In these embodiments, the trapezoidal integration method or the Simpson integration method may perform differential processing based on a discretized Newton-Cotes integral formula. Sampling using the trapezoidal integration method or the Simpson integration method may be similar to sampling using the rectangular integration method.

[0104] Accordingly, the energy value determination step, such as the process of determining the energy value by integration, is also easy to implement in a hardware circuit, such as an embedded hardware circuit, more specifically, in an FPGA, an ASIC, and the like.

[0105] By way of example and not limitation, when the energy value determination step, such as the integration process, is implemented in FPGA hardware (FPGA chip and peripheral hardware), it can be implemented by implementing a recursive filter or other type of filter, etc., using the FPGA. The filter can include modules such as registers, multipliers, adders, and subtractors as needed. Those skilled in the art will understand that although the specific example briefly describes the means for implementing the above-mentioned energy value determination (integration) using FPGA hardware, various different means for implementing the energy value determination (integration) using other hardware circuits are conceivable and fall within the scope of the present invention.

[0106] like Figure 2 As shown, before determining the triggering number of the threshold voltage, the digitization method may optionally include a pre-step S110:

[0107] S110: Collect scintillation pulses.

[0108] Here, the collection of scintillation pulses can be implemented by any appropriate pulse signal collection hardware as needed.

[0109] exist Figure 2 The embodiment shown also has steps S120 to S150, which can be referred to herein. Figure 1 、 Figure 3 and Figure 4 The description of the illustrated embodiment will not be repeated here.

[0110] like Figure 2 As shown, after determining the energy value of the scintillation pulse, the digitization method may further optionally include step S160:

[0111] S160: Output the energy value of the scintillation pulse to the remote computer.

[0112] The method according to the embodiment of the present application allows for non-iterative linear fitting of scintillation pulses using hardware on-site, and can transmit the fitted data with a relatively small amount of data, still meeting the needs of various application scenarios. Therefore, the method according to the embodiment of the present application is not only effectively applicable to well logging technology, but can also be applied to various situations requiring remote acquisition of scintillation pulse energy values.

[0113] In the embodiments of this application, Figure 5AAs shown, a scintillation pulse digitizing device 500 is also provided. The digitizing device 500 may include a pulse amplitude distinguishing module 520 , a time axis shifting module 530 , a linear fitting module 540 and an energy value determining module 550 .

[0114] The digitizing device for scintillation pulses according to the embodiment of the present application can be integrated in hardware or implemented based on hardware, more specifically, integrated in embedded hardware or implemented based on embedded hardware, more specifically integrated in an embedded chip and optional peripheral hardware or implemented based on an embedded chip and optional peripheral hardware. Preferably, the embedded chip may include a variety of application-specific integrated circuit (ASIC) chips, digital signal processing (DSP) chips, field programmable gate array (FPGA) chips, embedded single-chip microcomputers (such as STM32), etc. In a particularly preferred embodiment, the digitizing device for scintillation pulses is integrated in FPGA hardware or implemented based on FPGA hardware. The FPGA hardware includes an FPGA chip and, as needed, includes optional peripheral hardware or circuit devices.

[0115] exist Figure 5A In the illustrated embodiment, the pulse amplitude distinguishing module 520 may be configured to determine the number M of scintillation pulse triggering threshold voltages based on N preset threshold voltages, and obtain time information when the M threshold voltages are triggered, where 1≤M≤N.

[0116] exist Figure 5A In the illustrated embodiment, the time axis shift module 530 can be configured to determine a shift feature that can characterize the time axis shift of the scintillation pulse based on the M threshold voltages triggered. In a specific embodiment, the time axis shift module is configured to determine the time difference T between the time t1 when the scintillation pulse first triggers the threshold voltage and the scintillation pulse start time t0 based on the M threshold voltages triggered. m .

[0117] like Figure 5B As further shown, the time axis shift module 530 may include a reference time difference module 531 and a selection module 532. The reference time difference module 531 may be configured to provide N reference time differences T n , wherein each reference time difference corresponds to one of the N preset threshold voltages. The selection module 532 can be configured to select the reference time difference corresponding to the triggered M threshold voltages as the time difference T m .

[0118] like Figure 5CAs further shown, the reference time difference module 531 may include an acquisition submodule 5311 and a determination submodule 5312. The acquisition submodule 5311 may be configured to provide one or more prior pulse signals for each of the N preset threshold voltages, and acquire the start time of the one or more prior pulse signals and the time when the threshold voltage is first triggered. The determination submodule 5312 may be configured to determine the reference time difference T corresponding to each preset threshold voltage based on the acquired start time of the one or more prior pulse signals and the time when the threshold voltage is first triggered. n .

[0119] exist Figure 5A In the illustrated embodiment, the linear fitting module 540 can be configured to perform non-iterative linear fitting based on a preset pulse mathematical model using the trigger threshold voltage, time information, and translation characteristics to reconstruct the scintillation pulse. Preferably, the non-iterative linear fitting is a linear least squares fitting. More specifically, the preset pulse mathematical model is:

[0120]

[0121] Where y(t) is the voltage variable, t is the time variable, t0 is the start time of the scintillation pulse, and a, b, and c are the characteristic parameters to be determined.

[0122] exist Figure 5A In the illustrated embodiment, the energy value determination module 550 may be configured to determine the energy value of the scintillation pulse based on the reconstructed scintillation pulse. Preferably, the energy value determination module 550 may include an integration module (not shown) configured to integrate the reconstructed scintillation pulse to obtain the energy value.

[0123] like Figure 6 As shown, the digitizing device 500 may include a sampling module 510 , a pulse amplitude distinguishing module 520 , a time axis shifting module 530 , a linear fitting module 540 , an energy value determining module 550 and an energy value outputting module 560 . Figure 6 The pulse amplitude distinguishing module 520, the time axis shifting module 530, the linear fitting module 540 and the energy value determining module 550 shown in FIG can be referred to as Figure 5A The corresponding modules in the digitizing device 500 shown in FIG will not be described in detail here.

[0124] like Figure 6 As shown, the digitizing device 500 may further include the sampling module 510, which may be configured to collect the scintillation pulses. Here, the collection module may include or be implemented by any suitable pulse signal collection hardware as needed.

[0125] like Figure 6As shown, the digitizing device 500 may further include the energy value output module, which may be configured to output the energy value of the scintillation pulse to a remote computer.

[0126] Thus, the digitizing device according to the embodiment of the present application, while allowing for non-iterative linear fitting of scintillation pulses using hardware on-site, can transmit the fitted data with a relatively small amount of data, still meeting the needs of various application scenarios. Therefore, the digitizing device according to the embodiment of the present application can be effectively applied not only to well logging technology, but can also be used in a variety of applications requiring remote acquisition of scintillation pulse energy values.

[0127] like Figure 7A As shown, in an embodiment of the present application, a logging device 700 is also provided. The logging device 700 is, for example, a nuclear logging device, preferably a pulsed neutron logging device. The logging device 700 may include a downhole detection terminal 710 and a remote computer 720 away from the downhole detection terminal. The remote computer 720 may be communicatively connected to the downhole detection terminal 710. Thus, the remote computer 720 may receive the energy value of the measured scintillation pulse transmitted by the digitizing device of the scintillation pulse. In an embodiment of the present application, the remote computer 720 may be in various forms as needed, and may be a single or distributed computer. In some embodiments, the remote computer 720 may include, for example Figure 8 An electronic device 800 is shown.

[0128] In such Figure 7B In the illustrated embodiment, the downhole detection terminal 710 may include a detection device 711 and a digitizing device 712 coupled to the detection device 711 .

[0129] The detection device 711 can be used to detect high-energy rays in the well to generate scintillation pulses. Figure 7CIn the illustrated embodiment, the detection device 711 may include a scintillation crystal 7111 and a photoelectric converter 7112 coupled to the scintillation crystal 7111. In the embodiment of the present application, the scintillation crystal 7111 may be selected from a suitable material, shape, and / or size according to the application scenario. In some embodiments, the scintillation crystal 7111 may include one or more materials such as lutetium yttrium silicate (LYSO), bismuth germanate (BGO), lanthanum bromide (LaBr), sodium iodide (NaI), etc. In some embodiments, the scintillation crystal 7111 may include a scintillation crystal array, that is, in the form of an array. In a preferred embodiment, the scintillation crystal 7111 may be configured as a LaBr3 scintillation crystal array. In some embodiments, the photoelectric converter 7112 may include various conversion devices that can be used to convert photons generated by the scintillation crystal into scintillation pulses, including but not limited to a photomultiplier tube (PMT), a silicon photomultiplier (SiPM), a photoavalanche diode (APD), etc. In a preferred embodiment, the photoelectric converter is a photomultiplier tube (PMT). In the embodiment of the present application, the preset pulse mathematical model, such as those provided in other embodiments, can be constructed based on the characteristics of the LaBr3 scintillation crystal array and the PMT.

[0130] The digitizing device 712 can be used to digitally fit the scintillation pulse. The digitizing device 712 can be a scintillation pulse digitizing device described in any embodiment of the present application and / or can be adaptively combined with the elements, components or features of the digitizing device / method described in any embodiment of the present application. For example, the digitizing device 712 can be Figure 5A to or Figure 6 An apparatus 500 for digitizing scintillation pulses is shown.

[0131] The apparatus described in the embodiments of the present application may be combined with the method features described in the embodiments of the present application, and vice versa. Figures 1 to 4 The various embodiments and / or sub-steps specifically described in the step of determining the time information of the pulse trigger threshold voltage, the step of determining the translation characteristics, the reconstruction step, and the step of determining the energy value described in the embodiment shown can be clearly applied here Figure 5A or Figure 6 The corresponding modules in the illustrated embodiment, namely, the pulse amplitude distinguishing module, the time axis translation module, the linear fitting module and the energy value determining module, are used to obtain a new embodiment.

[0132] The embodiments of the present application also relate to electronic devices capable of implementing the methods of the embodiments of the present application.

[0133] In some embodiments, an electronic device is provided, which may include a processor and a memory storing a computer program, wherein the processor is configured to execute the method of any embodiment of the present application when running the computer program.

[0134] Figure 8 A schematic diagram of an exemplary electronic device 800 that can implement the method of the embodiments of the present application is shown. In some embodiments, more or fewer electronic devices may be included than shown. In some embodiments, the method can be implemented using a single or multiple electronic devices. In some embodiments, the method can be implemented using cloud-based or distributed electronic devices.

[0135] like Figure 8 As shown, the electronic device 800 includes a processor 801, which can perform various appropriate operations and processes according to the programs and / or data stored in the read-only memory (ROM) 802 or the programs and / or data loaded from the storage portion 808 into the random access memory (RAM) 803. The processor 801 can be a single-core or multi-core processor, or it can include multiple processors. In some embodiments, the processor 801 can include a general-purpose main processor (such as a CPU) and one or more special coprocessors, such as a graphics processing unit (GPU), a neural network processor (NPU), a digital signal processor (DSP), or other general or application-specific integrated circuits. In the RAM 803, various programs and data required for the operation of the electronic device 800 are also stored. The CPU 801, ROM 802, and RAM 803 are connected to each other via a bus 804. An input / output (I / O) interface 805 is also connected to the bus 804.

[0136] The processor and memory are used together to execute the program stored in the memory. When the program is executed by the computer, it can implement the steps or functions of the model generation method and recognition method described in the above embodiments.

[0137] The following components are connected to the I / O interface 805: an input section 806 including a keyboard, mouse, and the like; an output section 807 including a display and speakers; a storage section 808 including a hard disk and the like; and a communication section 809 including a network interface card such as a LAN card or a modem. The communication section 809 performs communication processing via a network such as the Internet. A drive 810 is also connected to the I / O interface 805 as needed. Removable media 811, such as a magnetic disk, an optical disk, a magneto-optical disk, or a semiconductor memory, is installed in the drive 810 as needed, so that computer programs read therefrom can be installed into the storage section 808 as needed.

[0138] Figure 8 The electronic device is only schematically shown, but the electronic device according to the embodiment of the present application may include Figure 8 The electronic devices shown may have more or fewer components or may have Figure 8 The devices of the illustrated embodiments may have the same, partially the same or different architectures.

[0139] In addition, the computer described in the various embodiments herein may be Figure 8 The electronic device shown as an example may also include Figure 8 The electronic devices shown may have more or fewer components or may have Figure 8 The devices of the illustrated embodiments may have the same, partially the same or different architectures.

[0140] In addition, as mentioned above, the remote computer according to the embodiment of the present application may include the electronic device or be implemented by the electronic device. Although not shown, in some embodiments, a computer-readable storage medium is further provided, storing a computer program, and the computer program is configured to execute any method of the embodiment of the present application when it is run. The computer program includes various program modules / units that constitute the device according to the embodiment of the present application, and the computer program composed of various program modules / units can implement the functions corresponding to the various steps in the method described in the above embodiment when executed. The computer program can also be run on the electronic device as described in the embodiment of the present application.

[0141] The storage media in the embodiments of the present application include non-volatile and / or volatile items that can be used to store information by any method or technology. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0142] Those skilled in the art will appreciate that the embodiments of this specification may be implemented in various forms, such as methods, systems, or computer program products. Therefore, those skilled in the art will appreciate that the functional modules / units or controllers and related method steps described in the above embodiments may be implemented using software, hardware, or a combination of software / hardware.

[0143] Unless explicitly stated, the actions or steps of the methods, procedures, and embodiments of the present application do not have to be performed in a specific order and can still achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0144] In this document, multiple embodiments are described, but for the sake of brevity, the description of each embodiment is not exhaustive, and the same or similar features or parts between the embodiments may be omitted. In this document, "one embodiment", "some embodiments", "example", "specific example", or "some examples" are intended to apply to at least one embodiment or example according to the present application, rather than all embodiments. The above terms do not necessarily mean to refer to the same embodiment or example. Those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, unless they are contradictory.

[0145] While the exemplary systems and methods of the present application have been specifically shown and described with reference to the foregoing embodiments, these are merely examples of the best modes for implementing the present systems and methods. Those skilled in the art will appreciate that various changes may be made to the embodiments of the systems and methods described herein when implementing the present systems and / or methods without departing from the spirit and scope of the present invention as defined in the appended claims.

Claims

1. A method for digitizing scintillation pulses, characterized in that: include: Based on N preset threshold voltages, determining the number M of scintillation pulse triggering threshold voltages, and obtaining time information when the M threshold voltages are triggered, where 1≤M≤N; Determining, based on the M triggered threshold voltages, a translation feature that can characterize the time axis translation of the scintillation pulse, comprising: determining, based on the M triggered threshold voltages, a time difference between a time when the scintillation pulse first triggers the threshold voltage and a start time of the scintillation pulse, wherein the translation feature is or is determined by the time difference; Based on a preset pulse mathematical model, a non-iterative linear fitting is performed using the triggered threshold voltage, the time information and the translation characteristics to reconstruct the scintillation pulse; Based on the reconstructed scintillation pulse, an energy value of the scintillation pulse is determined.

2. The scintillation pulse digitization method according to claim 1, characterized in that: The non-iterative linear fitting is a linear least squares fitting.

3. The scintillation pulse digitization method according to claim 2, characterized in that: The preset pulse mathematical model is: Where y(t) is the voltage variable, t is the time variable, t0 is the start time of the scintillation pulse, and a, b, and c are the characteristic parameters to be determined.

4. The scintillation pulse digitization method according to claim 1, characterized in that: The determining, based on triggering M threshold voltages, a time difference between the first triggering threshold voltage of the scintillation pulse and the start time of the scintillation pulse comprises: Providing N reference time differences, wherein each reference time difference corresponds to one of the N preset threshold voltages; A reference time difference corresponding to the triggering threshold voltages of M is selected as the time difference.

5. The scintillation pulse digitization method according to claim 4, characterized in that: The providing of N reference time differences includes: For each of the N preset threshold voltages, provide one or more prior pulse signals, and obtain a start time of the one or more prior pulse signals and a time when the threshold voltage is first triggered; Based on the acquired start time of the one or more priori pulse signals and the time when the threshold voltage is triggered for the first time, a reference time difference corresponding to each preset threshold voltage is determined.

6. The method for digitizing scintillation pulses according to any one of claims 1 to 3, characterized in that: The step of determining the energy value of the scintillation pulse based on the reconstructed scintillation pulse comprises: The reconstructed scintillation pulse is integrated to obtain the energy value.

7. The method for digitizing scintillation pulses according to any one of claims 1 to 3, characterized in that: The method further comprises: The scintillation pulses are collected.

8. The method for digitizing scintillation pulses according to any one of claims 1 to 3, characterized in that: The method further comprises: The energy value of the scintillation pulse is output to a remote computer.

9. The method for digitizing scintillation pulses according to any one of claims 1 to 3, characterized in that: The method is implemented based on FPGA hardware.

10. A scintillation pulse digitizing device, characterized in that: include: a pulse amplitude distinguishing module configured to determine the number M of scintillation pulse triggering threshold voltages based on N preset threshold voltages, and obtain time information when the M threshold voltages are triggered, where 1≤M≤N; a time axis translation module configured to determine a translation feature capable of characterizing a time axis translation amount of the scintillation pulse based on the triggered M threshold voltages, comprising: determining a time difference between a time when the scintillation pulse first triggers the threshold voltage and a start time of the scintillation pulse based on the triggered M threshold voltages, wherein the translation feature is or is determined by the time difference; a linear fitting module configured to perform non-iterative linear fitting based on a preset pulse mathematical model using the triggered threshold voltage, the time information and the translation feature to reconstruct the scintillation pulse; The energy value determination module is configured to determine the energy value of the scintillation pulse based on the reconstructed scintillation pulse.

11. The scintillation pulse digitizing device according to claim 10, characterized in that: The non-iterative linear fitting is a linear least squares fitting.

12. The scintillation pulse digitizing device according to claim 11, characterized in that: The preset pulse mathematical model is: Where y(t) is the voltage variable, t is the time variable, t0 is the start time of the scintillation pulse, and a, b, and c are the characteristic parameters to be determined.

13. The scintillation pulse digitizing device according to claim 10, characterized in that: The time axis translation module includes: a reference time difference module configured to provide N reference time differences, wherein each reference time difference corresponds to one of the N preset threshold voltages; The selection module is configured to select a reference time difference corresponding to the triggered M threshold voltages as the time difference.

14. The scintillation pulse digitizing device according to claim 13, characterized in that: The reference time difference module includes: an acquisition submodule configured to provide one or more prior pulse signals for each of the N preset threshold voltages, and to acquire a start time of the one or more prior pulse signals and a time when the threshold voltage is first triggered; The determination submodule determines a reference time difference corresponding to each preset threshold voltage based on the acquired start time of the one or more prior pulse signals and the time when the threshold voltage is first triggered.

15. The scintillation pulse digitizing device according to any one of claims 10 to 12, characterized in that: The energy value determination module includes: An integration module is configured to integrate the reconstructed scintillation pulse to obtain the energy value.

16. The scintillation pulse digitizing device according to any one of claims 10 to 12, characterized in that: The digitizing device further comprises: The sampling module is configured to collect the scintillation pulse.

17. The scintillation pulse digitizing device according to any one of claims 10 to 12, characterized in that: The digitizing device further comprises: The energy value output module is configured to output the energy value of the scintillation pulse to a remote computer.

18. The scintillation pulse digitizing device according to any one of claims 10 to 12, characterized in that: The digitizing device is integrated into the FPGA or implemented by the FPGA.

19. A well logging device, characterized in that: include: A downhole detection terminal comprising a scintillation pulse digitizing device according to any one of claims 10 to 18 and a detection device coupled to the digitizing device, wherein the detection device is used to detect high-energy rays downhole to generate scintillation pulses; A remote computer is located away from the downhole detection terminal, wherein the scintillation pulse digitizing device is configured to transmit the energy value of the measured scintillation pulse to the remote computer.

20. The well logging device according to claim 19, wherein: The detection device includes a scintillation crystal and a photoelectric converter coupled to the scintillation crystal.

21. An electronic device, characterized in that: include: A processor and a memory storing a computer program, wherein the processor is configured to perform the method according to any one of claims 1 to 9 when running the computer program.

22. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program configured to perform the method according to any one of claims 1 to 9 when executed.

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