A detection device and a test method for an IGBT drive circuit

Abstract

The present invention provides a detection device and a test method for an IGBT drive circuit, wherein the detection device comprises a main control chip, a drive control circuit, a power supply control circuit, an IGBT simulation circuit, a data acquisition circuit and a host computer; the drive control circuit drives and controls the IGBT drive circuit under test; the IGBT simulation circuit is used to simulate the external performance of the IGBT; the IGBT simulation circuit is driven by the IGBT drive circuit under test, and the IGBT simulation circuit is provided with a fault simulation switch K; the data acquisition circuit is used to collect information of each circuit; the main control chip receives the collected information of the data acquisition circuit, receives the host computer instruction, and controls the drive control circuit, the power supply control circuit and the IGBT simulation circuit. The present invention can simulate and test various states of the IGBT drive, such as normal, fault, undervoltage, communication interruption, etc., and the test process and test data are comprehensive, and all parameters of the drive board can be automatically detected quickly, accurately and comprehensively at one time.

Description

Technical Field

[0001] The present invention relates to the technical field of IGBT drive circuit detection, and in particular to a detection device and a test method for an IGBT drive circuit. Background Art

[0002] Flexible direct current transmission technology is also called VSC-HVDC technology. In the modular multi-level flexible direct current transmission system, the converter valve is the core equipment of the direct current transmission system. The smallest unit of the converter valve is the converter valve submodule. The number of submodules of the converter station varies with the capacity and voltage level of the converter station. When the capacity of the converter station reaches more than 1000MW, the number of submodules usually reaches several thousand. At the same time, an equal number of driver boards are required to control the IGBT. In the production process of the equipment, all parameters of the driver board can be tested once, quickly, accurately and comprehensively, and the test data can be retained in the system, which is convenient for future quality tracing of the board, becoming an important link in ensuring the quality of the converter valve product.

[0003] Conventional IGBT drive circuit testing, for example, Chinese patent publication number CN 112462236 discloses a test device for an IGBT drive circuit, which only performs conventional drive testing on the IGBT drive circuit by sending a drive signal to the IGBT drive circuit, and the test process and test data are not comprehensive. Summary of the invention

[0004] In order to solve the technical problems raised by the background technology, the present invention provides a detection device and a test method for an IGBT drive circuit, which can simulate and test various states of the IGBT drive circuit, such as normal, fault, undervoltage, communication interruption, etc. The test process and test data are comprehensive, and all parameters of the drive board can be automatically detected quickly, accurately and comprehensively at one time.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions:

[0006] A detection device for an IGBT drive circuit, the detection device comprising a main control chip, a drive control circuit, a power supply control circuit, an IGBT simulation circuit, a data acquisition circuit and a host computer;

[0007] The drive control circuit is connected to the IGBT drive circuit under test and is used to drive and control the IGBT drive circuit under test;

[0008] The IGBT simulation circuit is used to simulate the external performance of the IGBT; the driving signal end of the IGBT simulation circuit is connected to the IGBT driving circuit under test and is driven by the IGBT driving circuit under test. The IGBT simulation circuit is provided with a fault simulation switch K, and the fault simulation switch K of the IGBT simulation circuit is controlled by the main control chip;

[0009] The data acquisition circuit is used to collect information of the drive control circuit, the IGBT simulation circuit, the power supply control circuit and the IGBT drive circuit under test, and transmit it to the main control chip;

[0010] The main control chip is connected with the drive control circuit, the power supply control circuit, the IGBT analog circuit, the data acquisition circuit and the host computer; the main control chip receives the collected information of the data acquisition circuit, receives the instructions of the host computer, and controls the drive control circuit, the power supply control circuit and the IGBT analog circuit;

[0011] The power supply control circuit supplies power to the main control chip, the drive control circuit, the IGBT analog circuit, and the data acquisition circuit.

[0012] Furthermore, the IGBT simulation circuit includes a MOSFET and a fault simulation switch K, the G terminal and S terminal of the MOSFET are connected to the IGBT drive circuit under test, the D terminal and S terminal of the MOSFET are connected to the power supply via a current limiting resistor, and the fault simulation switch K is connected to the D terminal and S terminal of the MOSFET.

[0013] The test control method of the detection device of the IGBT drive circuit is characterized in that the main control chip receives the collection information of the data collection circuit, receives the host computer instruction, controls the drive control circuit, the power supply control circuit and the IGBT simulation circuit, tests the IGBT drive circuit under normal, faulty, undervoltage and communication interruption conditions, and uploads the data of the test process to the host computer. After the test of each IGBT drive circuit under test is completed, the host computer software uploads the test data of all the IGBT drive circuits under test to the quality data system as part of the traceable data of the IGBT drive circuit production process.

[0014] Furthermore, a test control method for a normal working state of an IGBT driving circuit includes the following steps:

[0015] Step 101, the main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test;

[0016] Step 102: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a feedback signal from the IGBT drive circuit under test;

[0017] Step 103, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time;

[0018] Step 104, the main control chip controls the data acquisition circuit to collect the drive communication instructions received by the IGBT drive circuit under test and the communication feedback signal of the IGBT drive circuit under test;

[0019] Step 105: After the test time is completed, the main control chip uploads the recorded data to the host computer software;

[0020] Step 106, the host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal;

[0021] Step 107: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

[0022] Furthermore, the invention also includes a test control method for an IGBT drive circuit communication interruption fault test, comprising the following steps:

[0023] Step 201, the main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test;

[0024] Step 202: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a communication feedback signal from the IGBT drive circuit under test;

[0025] Step 203, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time;

[0026] Step 204, the main control chip controls the drive control circuit to have no signal output, thereby creating a communication interruption fault;

[0027] Step 205, during the entire test process, the main control chip controls the data acquisition circuit to collect the IGBT drive communication instructions, communication feedback signals, and data during the communication failure;

[0028] Step 206, wait until the IGBT drive circuit under test reports a fault, or stop the test when no fault is reported within a set time after the simulated fault occurs; after the test is completed, the main control chip uploads the recorded data to the upper computer software;

[0029] Step 207, the host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal;

[0030] Step 208: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

[0031] Furthermore, a test control method for an IGBT short-circuit fault test is also provided, comprising the following steps:

[0032] Step 301, the main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test;

[0033] Step 302: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a feedback signal from the IGBT drive circuit under test;

[0034] Step 303, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and at the same time, the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time;

[0035] Step 304: The main control chip controls the fault simulation switch K to be turned on, so that the IGBT simulation circuit simulates an IGBT short circuit fault;

[0036] Step 305, during the entire test process, the main control chip controls the data acquisition circuit to collect the occurrence of IGBT short-circuit faults, IGBT drive communication instructions, and IGBT drive circuit communication feedback signals;

[0037] Step 306, the test is stopped until the IGBT drive circuit under test reports a fault. After the test is completed, the main control chip uploads the recorded wave data to the upper computer software;

[0038] Step 307, the host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal;

[0039] Step 308: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

[0040] Furthermore, a test control method for an undervoltage fault test of an IGBT drive circuit is also included, comprising the following steps:

[0041] Step 401: The main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test;

[0042] Step 402: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a feedback signal from the IGBT drive circuit under test;

[0043] Step 403, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time;

[0044] Step 404: the main control chip instructs the power supply control circuit to gradually lower the power supply voltage of the IGBT drive circuit under test;

[0045] Step 405 , during the entire test process, the main control chip controls the data acquisition circuit to collect the power supply voltage of the IGBT drive circuit under test and the communication feedback signal of the IGBT drive circuit under test.

[0046] Step 406, the test is stopped until the IGBT drive circuit under test reports a fault. After the test is completed, the main control chip uploads the recorded wave data to the upper computer software;

[0047] Step 407: The host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal.

[0048] Step 408: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

[0049] Compared with the prior art, the present invention has the following beneficial effects:

[0050] 1) A detection device and a test method for an IGBT drive circuit of the present invention can simulate and test various states of the IGBT drive, such as normal, fault, undervoltage, communication interruption, etc. The test process and test data are comprehensive, and all parameters of the drive board can be automatically detected quickly, accurately and comprehensively at one time;

[0051] 2) The IGBT simulation circuit designed in the test device can simulate the external performance of the IGBT, and can be driven by the IGBT drive circuit under test and provide real feedback on the output information of the IGBT drive circuit under test;

[0052] 3) The IGBT simulation circuit is also provided with a fault simulation switch K, which can simulate the working state of the IGBT when it is short-circuited;

[0053] 4) The device also has the advantages of high practicality and automated testing. After the test is completed, the test process data can be automatically uploaded to the quality data system, which is convenient for subsequent quality process tracing of the board. It solves the need for rapid detection of IGBT driver boards during the production process and accurate recording of the test process. BRIEF DESCRIPTION OF THE DRAWINGS

[0054] Figure 1The overall structural block diagram of a detection device for an IGBT drive circuit of the present invention;

[0055] Figure 2 It is a circuit structure diagram of the IGBT simulation circuit of the present invention. DETAILED DESCRIPTION

[0056] The specific implementation modes provided by the present invention are described in detail below with reference to the accompanying drawings.

[0057] like Figure 1 As shown, a detection device for an IGBT drive circuit includes a main control chip, a drive control circuit, a power supply control circuit, an IGBT simulation circuit, a data acquisition circuit and a host computer;

[0058] The drive control circuit is connected to the IGBT drive circuit under test and is used to drive and control the IGBT drive circuit under test;

[0059] The IGBT simulation circuit is used to simulate the external performance of the IGBT; the driving signal end of the IGBT simulation circuit is connected to the IGBT driving circuit under test and is driven by the IGBT driving circuit under test. The IGBT simulation circuit is provided with a fault simulation switch K, and the fault simulation switch K of the IGBT simulation circuit is controlled by the main control chip;

[0060] The data acquisition circuit is used to collect information of the drive control circuit, the IGBT simulation circuit, the power supply control circuit and the IGBT drive circuit under test, and transmit it to the main control chip;

[0061] The main control chip is connected with the drive control circuit, the power supply control circuit, the IGBT analog circuit, the data acquisition circuit and the host computer; the main control chip receives the collected information of the data acquisition circuit, receives the instructions of the host computer, and controls the drive control circuit, the power supply control circuit and the IGBT analog circuit;

[0062] The power supply control circuit supplies power to the main control chip, the drive control circuit, the IGBT analog circuit, and the data acquisition circuit.

[0063] like Figure 2 As shown, the IGBT simulation circuit of this embodiment includes a MOSFET and a fault simulation switch K, the G terminal and S terminal of the MOSFET are connected to the IGBT driving circuit under test, the D terminal and S terminal of the MOSFET are connected to the power supply via a current limiting resistor, and the fault simulation switch K is connected to the D terminal and S terminal of the MOSFET.

[0064] The test control method of the detection device of the IGBT drive circuit is that the main control chip receives the collected information of the data acquisition circuit, receives the host computer instruction, controls the drive control circuit, the power supply control circuit and the IGBT simulation circuit, and uploads the data of the test process to the host computer. In this embodiment, the main control chip is MCU+FPGA mode, and the test process includes the following:

[0065] 1) After receiving the test content and test start command from the host computer, the MCU in the main control chip parses the command and sends the specific execution steps to the FPGA of the main control chip. The FPGA then controls the power supply control circuit according to the specific command, and the power supply control circuit provides the power supply voltage required for the IGBT drive circuit under test; controls the drive control circuit to send drive control commands to the IGBT drive circuit under test; and controls the IGBT simulation circuit to provide feedback for the output of the IGBT drive circuit under test.

[0066] 2) During the test, the data acquisition circuit collects and records the FPGA drive signal, the communication feedback signal of the IGBT driver board, the supply voltage change, and the output signal of the IGBT driver circuit under test, and transmits the recorded data to the FPGA in the main control chip, which stores the data in the DDR controlled by itself.

[0067] 3) After the test process is completed, each time a test item is completed, the MCU of the main control chip will transmit the recorded data during the test process to the host computer through the network port. The software in the host computer will analyze the test data to determine whether the IGBT drive circuit under test has passed the test item.

[0068] 4) The IGBT drive circuit that passes all the test items will be sent to the next production link as a qualified product; conversely, the IGBT drive circuit that fails any of the test items will be considered a defective product.

[0069] 5) After the test of each IGBT drive circuit is completed, the host computer software will upload the test data of all the IGBT drive circuits under test to the quality data system as part of the traceable data of the IGBT drive circuit production process.

[0070] This embodiment includes the following test method

[0071] 1. The test control method for the normal operation of the IGBT drive circuit includes the following steps:

[0072] Step 101, the main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test;

[0073] Step 102: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a feedback signal from the IGBT drive circuit under test;

[0074] Step 103, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time;

[0075] Step 104, the main control chip controls the data acquisition circuit to collect the drive communication instructions received by the IGBT drive circuit under test and the communication feedback signal of the IGBT drive circuit under test;

[0076] Step 105: After the test time is completed, the main control chip uploads the recorded data to the host computer software;

[0077] Step 106, the host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal;

[0078] Step 107: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

[0079] 2. The test control method for the IGBT drive circuit communication interruption fault test includes the following steps:

[0080] Step 201, the main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test;

[0081] Step 202: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a communication feedback signal from the IGBT drive circuit under test;

[0082] Step 203, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time;

[0083] Step 204, the main control chip controls the drive control circuit to have no signal output, thereby creating a communication interruption fault;

[0084] Step 205, during the entire test process, the main control chip controls the data acquisition circuit to collect the IGBT drive communication instructions, communication feedback signals, and data during the communication failure;

[0085] Step 206, wait until the IGBT drive circuit under test reports a fault, or stop the test when no fault is reported within a set time after the simulated fault occurs; after the test is completed, the main control chip uploads the recorded data to the upper computer software;

[0086] Step 207, the host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal;

[0087] Step 208: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

[0088] 3. The test control method for IGBT short circuit fault test includes the following steps:

[0089] Step 301, the main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test;

[0090] Step 302: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a feedback signal from the IGBT drive circuit under test;

[0091] Step 303, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and at the same time, the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time;

[0092] Step 304: The main control chip controls the fault simulation switch K to be turned on, so that the IGBT simulation circuit simulates an IGBT short circuit fault;

[0093] Step 305, during the entire test process, the main control chip controls the data acquisition circuit to collect the occurrence of IGBT short-circuit faults, IGBT drive communication instructions, and IGBT drive circuit communication feedback signals;

[0094] Step 306, the test is stopped until the IGBT drive circuit under test reports a fault. After the test is completed, the main control chip uploads the recorded wave data to the upper computer software;

[0095] Step 307, the host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal;

[0096] Step 308: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

[0097] 4. The test control method for undervoltage fault test of IGBT drive circuit includes the following steps:

[0098] Step 401: The main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test;

[0099] Step 402: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a feedback signal from the IGBT drive circuit under test;

[0100] Step 403, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time;

[0101] Step 404: the main control chip instructs the power supply control circuit to gradually lower the power supply voltage of the IGBT drive circuit under test;

[0102] Step 405 , during the entire test process, the main control chip controls the data acquisition circuit to collect the power supply voltage of the IGBT drive circuit under test and the communication feedback signal of the IGBT drive circuit under test.

[0103] Step 406, the test is stopped until the IGBT drive circuit under test reports a fault. After the test is completed, the main control chip uploads the recorded wave data to the upper computer software;

[0104] Step 407: The host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal.

[0105] Step 408: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

[0106] The above embodiments are implemented based on the technical solution of the present invention, and detailed implementation methods and specific operation processes are given, but the protection scope of the present invention is not limited to the above embodiments. The methods used in the above embodiments are conventional methods unless otherwise specified.

Claims

1. A detection device for an IGBT drive circuit, characterized in that: The detection device includes a main control chip, a drive control circuit, a power supply control circuit, an IGBT simulation circuit, a data acquisition circuit and a host computer; The drive control circuit is connected to the IGBT drive circuit under test and is used to drive and control the IGBT drive circuit under test; The IGBT simulation circuit is used to simulate the external performance of the IGBT; the driving signal end of the IGBT simulation circuit is connected to the IGBT driving circuit under test and is driven by the IGBT driving circuit under test. The IGBT simulation circuit is provided with a fault simulation switch K, and the fault simulation switch K of the IGBT simulation circuit is controlled by the main control chip; The data acquisition circuit is used to collect information of the drive control circuit, the IGBT simulation circuit, the power supply control circuit and the IGBT drive circuit under test, and transmit it to the main control chip; The main control chip is connected with the drive control circuit, the power supply control circuit, the IGBT analog circuit, the data acquisition circuit and the host computer; the main control chip receives the collected information of the data acquisition circuit, receives the instructions of the host computer, and controls the drive control circuit, the power supply control circuit and the IGBT analog circuit; The power supply control circuit supplies power to the main control chip, the drive control circuit, the IGBT simulation circuit, and the data acquisition circuit; the IGBT simulation circuit includes a MOSFET and a fault simulation switch K, the G end and the S end of the MOSFET are connected to the IGBT drive circuit under test, the D end and the S end of the MOSFET are connected to the power supply via a current limiting resistor, and the fault simulation switch K is connected to the D end and the S end of the MOSFET.

2. A test control method for the detection device of the IGBT drive circuit according to claim 1, characterized in that: The main control chip receives the collected information from the data acquisition circuit, receives the instructions from the host computer, controls the drive control circuit, power supply control circuit and IGBT simulation circuit, tests the IGBT drive circuit under normal, faulty, undervoltage and communication interruption conditions, and uploads the test process data to the host computer. After the test of each IGBT drive circuit under test is completed, the host computer software uploads the test data of all the IGBT drive circuits under test to the quality data system as part of the traceable data of the IGBT drive circuit production process.

3. The test control method of a detection device for an IGBT drive circuit according to claim 2, characterized in that: The test control method for the normal operation of the IGBT drive circuit includes the following steps: Step 101, the main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test; Step 102: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a feedback signal from the IGBT drive circuit under test; Step 103, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time; Step 104, the main control chip controls the data acquisition circuit to collect the drive communication instructions received by the IGBT drive circuit under test and the communication feedback signal of the IGBT drive circuit under test; Step 105: After the test time is completed, the main control chip uploads the recorded data to the host computer software; Step 106, the host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal; Step 107: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

4. The test control method of a detection device for an IGBT drive circuit according to claim 2, characterized in that: The invention also includes a test control method for an IGBT drive circuit communication interruption fault test, comprising the following steps: Step 201, the main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test; Step 202: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a communication feedback signal from the IGBT drive circuit under test; Step 203, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time; Step 204, the main control chip controls the drive control circuit to have no signal output, thereby creating a communication interruption fault; Step 205: During the entire test process, the main control chip controls the data acquisition circuit to collect the IGBT's drive communication instructions, communication feedback signals, and the occurrence of communication failures; Step 206, wait until the IGBT drive circuit under test reports a fault, or stop the test when no fault is reported within a set time after the simulated fault occurs; after the test is completed, the main control chip uploads the recorded data to the upper computer software; Step 207, the host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal; Step 208: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

5. The test control method of the detection device of the IGBT drive circuit according to claim 2, characterized in that: The invention also includes a test control method for an IGBT short-circuit fault test, comprising the following steps: Step 301, the main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test; Step 302: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a feedback signal from the IGBT drive circuit under test; Step 303, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and at the same time, the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time; Step 304: The main control chip controls the fault simulation switch K to be turned on, so that the IGBT simulation circuit simulates an IGBT short circuit fault; Step 305, during the entire test process, the main control chip controls the data acquisition circuit to collect the occurrence of IGBT short-circuit faults, IGBT drive communication instructions, and IGBT drive circuit communication feedback signals; Step 306, the test is stopped until the IGBT drive circuit under test reports a fault. After the test is completed, the main control chip uploads the recorded wave data to the upper computer software; Step 307, the host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal; Step 308: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

6. The test control method of a detection device for an IGBT drive circuit according to claim 2, characterized in that: The invention also includes a test control method for an undervoltage fault test of an IGBT drive circuit, comprising the following steps: Step 401: The main control chip controls the power supply control circuit to output a normal operating voltage to the IGBT drive circuit under test; Step 402: The main control chip controls the drive control circuit to output a normal working drive signal to the IGBT drive circuit under test, so that the IGBT drive circuit under test works normally, and the main control chip receives a feedback signal from the IGBT drive circuit under test; Step 403, the IGBT simulation circuit receives the driving signal of the IGBT driving circuit under test, simulates the working state of the IGBT, and the main control chip collects the voltage and current changes of the IGBT simulation circuit in real time; Step 404: the main control chip instructs the power supply control circuit to gradually lower the power supply voltage of the IGBT drive circuit under test; Step 405: During the entire test process, the main control chip controls the data acquisition circuit to collect the power supply voltage of the IGBT drive circuit under test and the communication feedback signal of the IGBT drive circuit under test; Step 406, the test is stopped until the IGBT drive circuit under test reports a fault. After the test is completed, the main control chip uploads the recorded wave data to the upper computer software; Step 407: The host computer software analyzes the recorded data to determine whether the IGBT drive circuit under test is normal. Step 408: After all test items of the IGBT drive circuit under test are completed, the host computer software automatically uploads the test process data to the quality data system.

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