A method and computing device for calculating atomic oxygen flux in a simulated space environment

Abstract

This invention provides a method for calculating atomic oxygen flux in a simulated space environment, relating to the field of spacecraft simulation calculation technology. The method includes dividing the spacecraft surface into multiple polygonal mesh cells and reading instantaneous flux data from each polygonal mesh cell; traversing the instantaneous flux data in each polygonal mesh cell; and calculating the cumulative flux of each polygonal mesh cell at the current moment based on the instantaneous flux data in each polygonal mesh cell, thereby obtaining the cumulative flux of all polygonal mesh cells at each moment. Compared with existing technologies, this invention's method is simple to operate and can accurately and quickly calculate the cumulative and instantaneous atomic oxygen flux on the surface of different materials under different environmental conditions. It provides a necessary basis for optimizing the material's resistance to space environment effects, and has significant implications for the study of the synergistic effects of materials in the space environment, exhibiting obvious advantages and broad application prospects.

Description

Technical Field

[0001] This invention relates to the field of spacecraft simulation calculation technology, and more specifically, to a method and apparatus for calculating atomic oxygen flux in a simulated space environment. Background Technology

[0002] To control temperature, satellites are covered with thermal control coatings, a crucial component of the spacecraft's thermal control system, whose performance directly determines the satellite's lifespan. Because they are in direct contact with the outer space environment, they are more susceptible to damage. According to survey data, many spacecraft accidents were directly caused by damage to the spacecraft's thermal control system. Among the many factors affecting the performance of the spacecraft's thermal control system, the degradation of the thermal control coating material plays a decisive role. Atomic oxygen has a severe impact on the thermal control coating material. To obtain specific damage data of spacecraft in the space environment, we can conduct ground-based exposure experiments on various thermal control coating materials with a certain flux of atomic oxygen and then measure the performance degradation values ​​of the thermal control coating materials. Currently, the ground-based simulated irradiation times for coating materials are relatively short. Therefore, it is essential to use the performance degradation data corresponding to short exposure times to study the performance degradation patterns of coating materials over future irradiation times. However, existing simulation methods are not accurate enough in calculating atomic oxygen flux and are time-consuming. Summary of the Invention

[0003] The problem solved by this invention is that, in the prior art, various simulation methods are not accurate enough in calculating atomic oxygen flux, and take a long time to calculate at least one of the following:

[0004] To address the above problems, this invention provides a method for calculating atomic oxygen flux in a simulated space environment, comprising the following steps:

[0005] Step S1: Divide the spacecraft surface into multiple polygonal grid cells and read the instantaneous flux data in the polygonal grid cells;

[0006] Step S2: Traverse the instantaneous flux data in each of the polygonal grid cells;

[0007] Step S3: Calculate the cumulative flux of each polygonal grid cell at the current moment based on the instantaneous flux data in each polygonal grid cell, so as to obtain the cumulative flux of all polygonal grid cells at each moment.

[0008] Optionally, in step S1, reading the instantaneous flux data in the polygonal mesh cell includes: reading the instantaneous flux data in the polygonal mesh cell according to a specified time range, and parsing it into a specified instantaneous flux memory structure file.

[0009] Optionally, in step S3, calculating the cumulative flux of each polygonal grid cell at the current moment based on the instantaneous flux data in each polygonal grid cell includes: the cumulative flux of each polygonal grid cell at the current moment is the sum of the product of the instantaneous flux of each polygonal grid cell at the previous moment and the flux file time interval, and the instantaneous flux of each polygonal grid cell at the previous moment.

[0010] Optionally, in step S2, the throughput file time interval is the time step of the spacecraft's orbital point.

[0011] Optionally, the method for calculating atomic oxygen flux in a simulated space environment further includes: step S4, saving the cumulative flux of all polygonal grid cells at each time step to a specified cumulative flux memory structure file.

[0012] Optionally, the method for calculating atomic oxygen flux in a simulated space environment, after step S4, further includes: outputting instantaneous / cumulative flux tables or curve data.

[0013] Optionally, the method for outputting instantaneous flux table or curve data includes: looping according to the number of the polygonal grid cell, obtaining the maximum value, minimum value and average value of the instantaneous flux data of each polygonal grid cell at all times from the variables of the specified instantaneous flux memory structure file, and saving them to a file to output instantaneous flux table or curve data.

[0014] Optionally, the method for outputting cumulative flux table or curve data includes: looping according to the number of the polygonal grid cell, obtaining the maximum, minimum and average values ​​of the cumulative flux data of each polygonal grid cell at all times from the variables of the specified cumulative flux memory structure file, and saving them to a file to output the cumulative flux table or curve data.

[0015] The method for calculating atomic oxygen flux in simulated space environments described in this invention has the advantage over existing technologies in that it can accurately calculate the instantaneous atomic oxygen flux on the surface of materials under different space environments, achieving the goal of accurately predicting the atomic oxygen flux on the surface of materials under different atomic oxygen conditions. Therefore, the atomic oxygen flux calculation method of this invention is simple to operate and can accurately and quickly calculate the cumulative and instantaneous atomic oxygen flux on the surface of different materials under different environmental conditions. This provides a necessary basis for optimizing the ability of materials to resist the effects of space environment, and is of great significance to the study of the synergistic effects of materials in space environment, exhibiting significant advantages and broad application prospects.

[0016] To address the aforementioned technical problems, the present invention also provides a device for calculating atomic oxygen flux in a simulated space environment, comprising a computer-readable storage medium storing a computer program and a processor, wherein the computer program is read and executed by the processor to implement the method described above.

[0017] The atomic oxygen flux calculation device and the atomic oxygen flux calculation method in the simulated space environment described in this invention have the same advantages over the prior art, and will not be repeated here.

[0018] To address the aforementioned technical problems, the present invention also provides a computer-readable storage medium storing a computer program, which, when read and executed by a processor, implements the method described above.

[0019] The advantages of the computer-readable storage medium described in this invention and the method for calculating atomic oxygen flux in the simulated space environment compared to the prior art are the same, and will not be repeated here. Attached Figure Description

[0020] Figure 1 This is a flowchart of the method for calculating atomic oxygen flux in a simulated space environment in an embodiment of the present invention;

[0021] Figure 2 This is a schematic diagram illustrating the instantaneous atomic oxygen flux effect obtained using the atomic oxygen flux calculation method in a simulated space environment according to embodiments of the present invention.

[0022] Figure 3 This is a schematic diagram of the cumulative atomic oxygen flux effect obtained by using the atomic oxygen flux calculation method in a simulated space environment in the embodiments of the present invention.

[0023] Figure 4 This is a graph showing the cumulative atomic oxygen flux obtained using the method for calculating atomic oxygen flux in a simulated space environment in this embodiment of the invention. Detailed Implementation

[0024] The technical solutions in the embodiments of this application will be clearly and thoroughly described below with reference to the accompanying drawings.

[0025] In the description of the embodiments in this application, the term "some embodiments" means that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same implementation or instance. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0026] It should also be noted that, in the description of the embodiments of this application, the term "comprising" or any other variations thereof is intended to cover non-exclusive inclusion, such that a process, method, article, or terminal device that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or terminal device. Without further limitations, an element defined by the phrase "comprising..." does not exclude the presence of other identical elements in the process, method, article, or terminal device that includes said element.

[0027] like Figure 1 As shown, this embodiment of the invention provides a method for calculating atomic oxygen flux in a simulated space environment, comprising the following steps:

[0028] Step S1: Divide the spacecraft surface into multiple polygonal grid cells and read the instantaneous flux data in the polygonal grid cells;

[0029] Step S2: Traverse the instantaneous flux data in each of the polygonal grid cells;

[0030] Step S3: Calculate the cumulative flux of each polygonal grid cell at the current moment based on the instantaneous flux data in each polygonal grid cell, so as to obtain the cumulative flux of all polygonal grid cells at each moment.

[0031] In some embodiments, step S1, reading the instantaneous flux data in the polygonal mesh cell, includes: reading the instantaneous flux data in the polygonal mesh cell according to a specified time range, and parsing it into a specified instantaneous flux memory structure file.

[0032] In some specific implementations, the instantaneous throughput memory structure file is named fluxFiles for convenient data storage.

[0033] In some embodiments, step S3, calculating the cumulative flux of each polygonal grid cell at the current moment based on the instantaneous flux data in each polygonal grid cell, includes: the cumulative flux of each polygonal grid cell at the current moment is the sum of the product of the instantaneous flux of each polygonal grid cell at the previous moment and the flux file time interval, and the instantaneous flux of each polygonal grid cell at the previous moment. This makes the calculation result of the cumulative flux of each polygonal grid cell at the current moment more accurate and convenient.

[0034] It should be noted that in step S2, the throughput file time interval is the time step of the spacecraft's orbital point.

[0035] In some embodiments, the method for calculating atomic oxygen flux in a simulated space environment further includes: step S4, saving the cumulative flux of all polygonal mesh cells at each time step to a specified cumulative flux memory structure file.

[0036] In some specific embodiments, the cumulative flux memory structure file is named totalFlux, where the key in the cumulative flux memory structure file is the time step and the value is the cumulative flux value of each polygonal mesh cell, thereby facilitating data storage.

[0037] In some embodiments, the method for calculating atomic oxygen flux in a simulated space environment, after step S4, further includes: outputting instantaneous / cumulative flux tables or curve data. This makes the calculation results more intuitively displayed.

[0038] In some specific embodiments, the method for outputting instantaneous flux tables or curve data includes: looping according to the number of the polygonal grid cells, obtaining the maximum, minimum, and average values ​​of the instantaneous flux data of each polygonal grid cell at all times from variables in the specified instantaneous flux memory structure file, and saving them to a file to output instantaneous flux tables or curve data. This simplifies the method for outputting instantaneous flux tables or curve data and saves time. Figure 2 As shown, Figure 2 This is a schematic diagram of the instantaneous atomic oxygen flux obtained by the calculation method of atomic oxygen flux in a simulated space environment in the embodiments of the present invention. The magnitude of the instantaneous atomic oxygen flux is represented by the change in color intensity. The darker the color, the greater the instantaneous atomic oxygen flux, and the lighter the color, the smaller the instantaneous atomic oxygen flux.

[0039] In some specific embodiments, the method for outputting cumulative flux tables or curve data includes: looping according to the number of the polygonal grid cells, obtaining the maximum, minimum, and average values ​​of the cumulative flux data of each polygonal grid cell at all times from variables in the specified cumulative flux memory structure file, and saving them to a file to output the cumulative flux table or curve data. This simplifies the method for outputting cumulative flux tables or curve data and saves time. Figure 3 and Figure 4 As shown, Figure 3 This is a schematic diagram illustrating the cumulative atomic oxygen flux effect obtained using the atomic oxygen flux calculation method in a simulated space environment according to embodiments of the present invention. Figure 4 This is a graph showing the cumulative atomic oxygen flux obtained using the method for calculating atomic oxygen flux in a simulated space environment, as described in this embodiment of the invention. Figure 3In this system, the cumulative flux of atomic oxygen is represented by variations in color intensity; the darker the color, the greater the cumulative flux of atomic oxygen, and the lighter the color, the smaller the cumulative flux of atomic oxygen.

[0040] Therefore, the advantage of the atomic oxygen flux calculation method under simulated space environment described in this embodiment compared to the prior art is that this embodiment can accurately calculate the instantaneous atomic oxygen flux on the material surface under different space environments, achieving the goal of accurately predicting the atomic oxygen flux on the material surface under different atomic oxygen conditions. Thus, the atomic oxygen flux calculation method of this embodiment is simple to operate and can accurately and quickly calculate the cumulative and instantaneous atomic oxygen flux on the surface of different materials under different environmental conditions. This provides a necessary basis for optimizing the material's resistance to space environment effects, and is of great significance to the study of the synergistic effects of materials in the space environment, exhibiting significant advantages and broad application prospects.

[0041] Another embodiment of the present invention provides a calculation device for simulating atomic oxygen flux in a space environment, including a computer-readable storage medium storing a computer program and a processor, wherein the computer program is read and executed by the processor to implement the method described above.

[0042] The atomic oxygen flux calculation device and the atomic oxygen flux calculation method in the simulated space environment described in this embodiment have the same advantages over the prior art, and will not be repeated here.

[0043] Another embodiment of the present invention provides a computer-readable storage medium storing a computer program that is read and executed by a processor to implement the method described above.

[0044] The computer-readable storage medium described in this embodiment and the method for calculating atomic oxygen flux in the simulated space environment have the same advantages over the prior art, and will not be repeated here.

[0045] It should be noted that the computer-readable storage medium in this embodiment can be a tangible device capable of holding and storing instructions used by an instruction execution device. The computer-readable storage medium can be, for example, but not limited to, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination thereof. In some specific examples, the computer-readable storage medium includes: a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static random access memory (SRAM), portable compact disc read-only memory (CD-ROM), digital multifunction disc (DVD), memory stick, floppy disk, mechanical encoding device, and any suitable combination thereof.

[0046] While the disclosure is as stated above, its scope of protection is not limited thereto. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of this disclosure, and all such changes and modifications will fall within the protection scope of this invention.

Claims

1. A method for calculating atomic oxygen flux under simulated space conditions, characterized in that, Includes the following steps: Step S1: Divide the spacecraft surface into multiple polygonal grid cells and read the instantaneous flux data in the polygonal grid cells; Step S2: Traverse the instantaneous flux data in each of the polygonal grid cells; Step S3: Calculate the cumulative flux of each polygonal grid cell at the current time based on the instantaneous flux data in each polygonal grid cell, so as to obtain the cumulative flux of all polygonal grid cells at each time. The cumulative flux of each polygonal grid cell at the current time is the sum of the product of the instantaneous flux of each polygonal grid cell at the previous time and the flux file time interval, and the instantaneous flux of each polygonal grid cell at the previous time.

2. The method for calculating atomic oxygen flux in a simulated space environment according to claim 1, characterized in that, In step S1, reading the instantaneous flux data in the polygonal mesh cell includes: reading the instantaneous flux data in the polygonal mesh cell according to a specified time range, and parsing it into a specified instantaneous flux memory structure file.

3. The method for calculating atomic oxygen flux in a simulated space environment according to claim 1, characterized in that, In step S2, the throughput file time interval is the time step of the spacecraft's orbital point.

4. The method for calculating atomic oxygen flux in a simulated space environment according to claim 1, characterized in that, It also includes step S4, which saves the cumulative flux of all the polygonal mesh cells at each time step to a specified cumulative flux memory structure file.

5. The method for calculating atomic oxygen flux in a simulated space environment according to claim 4, characterized in that, After step S4, the method further includes: outputting instantaneous / cumulative flux tables or curve data.

6. The method for calculating atomic oxygen flux in a simulated space environment according to claim 5, characterized in that, The method for outputting instantaneous flux table or curve data includes: looping according to the number of the polygonal grid cell, obtaining the maximum value, minimum value and average value of the instantaneous flux data of each polygonal grid cell at all times from the variables of the specified instantaneous flux memory structure file, and saving them to a file to output instantaneous flux table or curve data.

7. The method for calculating atomic oxygen flux in a simulated space environment according to claim 5, characterized in that, The method for outputting cumulative flux table or curve data includes: looping according to the number of the polygonal grid cell, obtaining the maximum, minimum and average values ​​of the cumulative flux data of each polygonal grid cell at all times from the variables of the specified cumulative flux memory structure file, and saving them to a file to output the cumulative flux table or curve data.

8. A device for calculating atomic oxygen flux in a simulated space environment, characterized in that, The method includes a computer-readable storage medium storing a computer program, which is read and executed by the processor to implement the method as described in any one of claims 1-7.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when read and executed by a processor, implements the method as described in any one of claims 1-7.

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