A simulation method for the erosion effect of spacecraft surface materials under an autonomous acquisition mode
Through simulation calculation under independent acquisition, the spacecraft surface material etching effect is simulated using polygonal mesh, atomic oxygen and ultraviolet parameters, solving the problems of high test costs and long cycles in the existing technology, and achieving accurate material etching evaluation and optimization.
Patent Information
- Application Number
- CN202210770226.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-06-30
- Publication Date
- 2025-07-22
- Estimated Expiration
- 2042-06-30
AI Technical Summary
In the prior art, space flight tests and ground simulation tests are costly, long periods, and fail to effectively consider the synergistic impact of ultraviolet radiation, resulting in complex calculation processes and inaccurate results.
The independent acquisition method is adopted to select parameters affecting the etching effect, including polygonal mesh parameters, atomic oxygen parameters, ultraviolet parameters and protective layer parameters, and simulate the etching effect of atomic oxygen and ultraviolet to realize the simulation of the material etching effect.
It realizes the accurate simulation of the material erosion effect under different doses of atomic oxygen and ultraviolet radiation, which accelerates the evaluation process, reduces cost and time, and provides an optimization basis for the material to resist space environmental effects.
Smart Images
Figure CN115203923B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of spacecraft simulation calculation, and more specifically, to a simulation method for the erosion effect of spacecraft surface materials in an autonomous acquisition mode. Background Art
[0002] Due to reasons such as the impact of space debris on spacecraft materials and collisions during the transportation of spacecraft, various forms of defects often appear in the protective layer. Atomic oxygen can still penetrate through the defects and react with Kapton, causing the failure of the thermal control layer. The erosion effect of atomic oxygen on materials is mainly the chemical corrosion of materials by highly oxidizing atomic oxygen, ultimately leading to damage to the interior of the materials, changes in performance, and even failure. The presence of ultraviolet radiation will affect the reaction or erosion rate of atomic oxygen with certain materials. Because ultraviolet radiation can cause cross-linking of molecular chains and breakage of valence bonds in thermal control coatings or organic polymers, resulting in internal softening or fragmentation of the materials, providing channels for the erosion of atomic oxygen and exacerbating the erosion of atomic oxygen. In the prior art, many researchers have studied it using various methods such as space flight tests, ground simulation tests, and numerical simulations. Research shows that the experimental method is still the most direct and effective means to evaluate the atomic oxygen erosion effect, but the experimental method has high costs, a long research cycle, and does not take into account the synergistic effect of ultraviolet irradiation, making the calculation process complex and the results inaccurate. Summary of the Invention
[0003] The problem solved by the present invention is at least one aspect of the high cost, long research cycle, and failure to consider the synergistic effect of ultraviolet irradiation in the prior art, such as space flight tests and ground simulation tests, which makes the calculation process complex and the results inaccurate.
[0004] To solve the above problems, the present invention provides a simulation method for the erosion effect of spacecraft surface materials in an autonomous acquisition mode. The simulation method realizes the simulation calculation of the erosion effect of materials under the synergistic action of atomic oxygen and ultraviolet by autonomously selecting and acquiring the influencing parameters of the erosion effect. The influencing parameters of the erosion effect include polygon mesh parameters, atomic oxygen parameters, ultraviolet parameters, eroded material parameters, and protective layer parameters.
[0005] Optionally, the polygon mesh parameters are obtained by setting the directions of each direction in the three-dimensional coordinate system where the polygon mesh is located.
[0006] Optionally, the eroded material parameters are obtained by setting atomic oxygen protection material parameters, ultraviolet protection material parameters, or atomic oxygen / ultraviolet synergistic protection material parameters.
[0007] Optionally, the atomic oxygen protection material parameters include the erosion rate pre-factor, the erosion activation energy, the erosion rate angular distribution index, the atomic oxygen reflection probability, the atomic oxygen scattering probability, the atomic oxygen recombination probability, and the critical energy for atomic oxygen adsorption; the ultraviolet protection material parameters include the complex refractive index, the reflectivity, and the refractive index; the atomic oxygen / ultraviolet synergistic protection material parameters include the synergistic coefficient of the erosion pre-factor and the activation energy.
[0008] Optionally, the protective layer parameters include the protective layer defect type, size, and distribution.
[0009] Optionally, the protective layer defect type is obtained by setting square point defects, circular point defects, or line defects.
[0010] Optionally, the protective layer defect size is obtained by determining the number of the erosion target grid cells on the spacecraft surface and the size of the erosion target grid cells.
[0011] Optionally, the protective layer defect distribution is obtained by determining whether the protective layer is a double-sided protective layer on the top and bottom surfaces.
[0012] Optionally, the acquisition method of the ultraviolet parameters includes self-definition or import from a mission. In the self-definition method, the ultraviolet parameters are obtained by setting the ray density, the maximum number of ultraviolet reflections, the ultraviolet mode, the minimum ultraviolet intensity ratio, and the ray direction; in the import from a mission method, the ultraviolet parameters are obtained by reading the orbital ultraviolet intensity from the erosion calculation results.
[0013] Optionally, the acquisition method of the atomic oxygen parameters includes a single value, a Maxwell distribution, or import from a mission. In the single value method, the atomic oxygen parameters are obtained by setting the total amount of atomic oxygen, the average velocity, and the incident direction; in the Maxwell distribution method, the atomic oxygen parameters are obtained by setting the total amount of atomic oxygen, the average velocity, the incident direction, and the ambient temperature; in the import from a mission method, the atomic oxygen parameters are obtained by reading the orbital average atomic oxygen velocity distribution and angular distribution from the erosion calculation results.
[0014] The advantage of the simulation method of the ablation effect of spacecraft surface materials in the self-acquisition mode described in the present invention compared with the prior art is that, based on the synergistic effect of atomic oxygen and ultraviolet light, the present invention can realize the self-free selection of the acquisition method of the parameters affecting the ablation effect, and realize the simulation and simulation experiment of the ablation effect of materials under different doses of atomic oxygen and ultraviolet irradiation. It can not only accurately simulate the actual situation, but also accelerate and accurately evaluate the ablation effect of materials under the synergistic effect of atomic oxygen and ultraviolet light. The steps are simple and easy to operate, which can greatly reduce the time and cost of atomic oxygen and ultraviolet simulation tests, and can also provide a necessary basis for optimizing the ability of materials to resist space environment effects, which has great significance for the research on the synergistic effect of materials in the space environment. It has obvious advantages and broad application prospects in the research on the synergistic effect of atomic oxygen and ultraviolet light on materials and the application of anti-space environment effect reinforcement technology. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 It is a flowchart of the simulation method of the ablation effect of spacecraft surface materials in the self-acquisition mode in the embodiment of the present invention;
[0016] Figure 2 It is a schematic diagram of the simulation effect of the ablation effect of materials based on the synergistic effect of atomic oxygen and ultraviolet light in the task import mode in the embodiment of the present invention;
[0017] Figure 3 It is a schematic diagram of the simulation effect of the ablation effect of materials based on the synergistic effect of atomic oxygen and ultraviolet light in the custom mode in the embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0018] The technical solutions in the embodiments of the present application will be clearly and elaborately described below with reference to the accompanying drawings.
[0019] In the description of the embodiments of the present application, the description of the term "some embodiments" means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.
[0020] It should also be noted that in the description of the embodiments of the present application, the term "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or terminal device including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or elements inherent to such a process, method, article or terminal device. Without further limitation, the elements defined by the statement "including..." do not exclude the existence of additional identical elements in the process, method, article or terminal device including the said elements.
[0021] The embodiments of the present invention provide a simulation method for the ablation effect of spacecraft surface materials in the self-acquisition mode, which realizes the simulation calculation of the ablation effect of materials under the combined action of atomic oxygen and ultraviolet by self-selecting the acquisition of ablation effect influence parameters. The ablation effect influence parameters include polygon mesh parameters, atomic oxygen parameters, ultraviolet parameters, ablated material parameters and protection layer parameters.
[0022] In some embodiments, the polygon mesh parameters are obtained by setting the directions of each dimension in the three-dimensional coordinate system where the polygon mesh is located.
[0023] In some specific embodiments, in the three-dimensional coordinate system where the polygon mesh is located, the y direction is the normal direction of the atomic oxygen intrusion surface. The topmost layer of the mesh in the y direction is the reserved vacuum layer, and the protection layer is below the vacuum layer. The actual directions of x and z need to be determined according to the specified spacecraft surface mesh unit.
[0024] In some preferred embodiments, the polygon meshes are all regular meshes of Nx*Ny*Nz, and the size of the polygon mesh in each direction is 1 micron.
[0025] In some embodiments, the ablated material parameters are obtained by setting atomic oxygen protection material parameters, ultraviolet protection material parameters or atomic oxygen / ultraviolet combined protection material parameters.
[0026] It should be noted that the atomic oxygen protection material parameters are used to describe the influence degree of the protection material on the ablation effect under the action of atomic oxygen. In some specific embodiments, the atomic oxygen protection material parameters include the pre-ablation rate coefficient, ablation activation energy, ablation rate angular distribution index, atomic oxygen reflection probability, atomic oxygen scattering probability, atomic oxygen recombination probability and critical energy for atomic oxygen adsorption;
[0027] The ultraviolet protection material parameters are used to describe the influence degree of the protection material on the ablation effect under the action of ultraviolet irradiation. In some specific embodiments, the ultraviolet protection material parameters include complex refractive index, reflectivity and refractive index;
[0028] The atomic oxygen / ultraviolet synergistic protection material parameters are used to describe the degree of influence of the protection material on the etching effect under the synergistic action of atomic oxygen and ultraviolet irradiation. In some specific embodiments, the atomic oxygen / ultraviolet synergistic protection material parameters include the pre-etching coefficient and the synergistic coefficient of the activation energy.
[0029] In some embodiments, the protective layer parameters include the type, size, and distribution of the protective layer defects.
[0030] In some specific embodiments, the type of the protective layer defect is obtained by setting square point defects, circular point defects, or line defects. The type is simple.
[0031] In this embodiment, the point defect is obtained by setting the defect side length / radius and the defect number density; the line defect is obtained by setting the line length, width, and number density. Thus, the influence of the defect on the etching effect can be simulated more accurately.
[0032] In addition, in this embodiment, the size of the protective layer defect is obtained by determining the number of the etching target grid cells on the spacecraft surface and the size of the etching target grid cells.
[0033] In this embodiment, the distribution of the protective layer defect is obtained by determining whether the protective layer is a double-sided protective layer on the top and bottom surfaces. Thus, the distribution of the protective layer defect is determined, making the calculation result more accurate.
[0034] In some embodiments, the acquisition method of the ultraviolet parameters includes self-definition or import from a mission. In the self-definition method, the ultraviolet parameters are obtained by setting the ray density, the maximum number of ultraviolet reflections, the ultraviolet mode, the minimum ultraviolet intensity ratio, and the ray direction; in the import from a mission method, the ultraviolet parameters are obtained by reading the orbital ultraviolet intensity from the erosion calculation results.
[0035] It should be noted that in this embodiment, the acquisition method of the ultraviolet ray direction includes the method of turning off the ultraviolet synergistic function, the method of turning on the fixed angle, and the method of importing according to the mission. Among them, in the method of importing according to the mission, the average orbital ultraviolet incident angle can be directly read from the erosion calculation results. The method is simple.
[0036] In some embodiments, the acquisition method of the atomic oxygen parameters includes a single value, a Maxwell distribution, or import from a mission. In the single value method, the atomic oxygen parameters are obtained by setting the total amount of atomic oxygen, the average velocity, and the incident direction; in the Maxwell distribution method, the atomic oxygen parameters are obtained by setting the total amount of atomic oxygen, the average velocity, the incident direction, and the ambient temperature; in the import from a mission method, the atomic oxygen parameters are obtained by reading the orbital average atomic oxygen velocity distribution and angle distribution from the erosion calculation results.
[0037] Such as Figure 1As shown, in some embodiments, the simulation method for the ablation effect of spacecraft surface materials in the autonomous acquisition mode includes: obtaining the ablation depth of the spacecraft surface materials under the synergistic action of atomic oxygen and ultraviolet according to the cumulative atomic oxygen flux on the spacecraft surface under the synergistic action of atomic oxygen and ultraviolet and the ablation effect influencing parameters, and outputting the schematic diagrams of the changes in the ablation hole size and ablation hole depth with the ablation process or the schematic diagrams of the changes in the three-dimensional ablation hole shape, and further obtaining the schematic diagram of the simulation effect of the ablation effect of the spacecraft surface materials.
[0038] In some specific embodiments, the calculation method of the atomic oxygen flux includes:
[0039] Calculating the instantaneous atomic oxygen flux on the spacecraft surface under the synergistic action of atomic oxygen and ultraviolet;
[0040] Obtaining the on-orbit flight time of the spacecraft, and obtaining the cumulative atomic oxygen flux on the spacecraft surface under the synergistic action of atomic oxygen and ultraviolet according to the instantaneous atomic oxygen flux on the spacecraft surface and the on-orbit flight time of the spacecraft.
[0041] Thus, the ablation depth is obtained through the cumulative atomic oxygen flux on the spacecraft surface, and the simulation is more accurate.
[0042] In addition, it should be noted that in all the acquisition modes in this embodiment, except for the task import mode, other modes can be regarded as custom modes.
[0043] In order to verify the effectiveness of the simulation method for the ablation effect of spacecraft surface materials in the autonomous acquisition mode in this embodiment, this embodiment uses this method to perform the simulation calculation of the ablation effect of spacecraft surface materials according to the custom mode and the task import mode respectively. Among them, in the custom mode, the setting conditions of the atomic oxygen parameters and ultraviolet parameters are as follows in the table:
[0044]
[0045] The calculation results are as Figures 2 - 3 shown, Figure 2 This is the schematic diagram of the simulation effect of the ablation effect of materials under the synergistic action of atomic oxygen and ultraviolet in the task import mode in this embodiment; Figure 3This is a schematic diagram of the simulation effect of the material etching effect based on the synergistic effect of atomic oxygen and ultraviolet in the custom mode of this embodiment. It can be seen from the figure that based on the synergistic effect of atomic oxygen and ultraviolet in this embodiment, it is possible to independently and freely select the acquisition method of the parameters affecting the etching effect, and to conduct simulation experiments on the material etching effect under different doses of atomic oxygen and ultraviolet irradiation. It can not only accurately simulate the actual situation, but also accelerate and precisely evaluate the material etching effect under the synergistic effect of atomic oxygen and ultraviolet. The steps are simple and easy to operate, which can greatly reduce the time and cost of the atomic oxygen and ultraviolet simulation tests, and can also provide a necessary basis for optimizing the ability of materials to resist space environment effects, which has great significance for the research on the space environment synergistic effect of materials. It has obvious advantages and broad application prospects in the research on the synergistic effect of atomic oxygen and ultraviolet on materials and the application of anti-space environment effect strengthening technology.
[0046] Although the present invention is disclosed as above, the protection scope of the present invention is not limited thereto. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, and these changes and modifications will all fall within the protection scope of the present invention.
Claims
1. A simulation method for the erosion effect of spacecraft surface materials under an autonomous acquisition mode, characterized in that The simulation method realizes the simulation calculation of the ablation effect of materials under the combined action of atomic oxygen and ultraviolet rays by means of independently selecting and obtaining the parameters affecting the ablation effect. The parameters affecting the ablation effect include polygon mesh parameters, atomic oxygen parameters, ultraviolet parameters, ablated material parameters, and protective layer parameters. The acquisition methods of the atomic oxygen parameters include single value, Maxwell distribution, or import from a task. In the single value method, the atomic oxygen parameters are obtained by setting the total amount of atomic oxygen, average velocity, and incident direction. In the Maxwell distribution method, the atomic oxygen parameters are obtained by setting the total amount of atomic oxygen, average velocity, incident direction, and environmental temperature. In the import from a task method, the atomic oxygen parameters are obtained by reading the orbital average atomic oxygen velocity distribution and angular distribution from the ablation calculation results. The acquisition methods of the ultraviolet parameters include custom definition or import from a task. In the custom definition method, the ultraviolet parameters are obtained by setting the ray density, maximum number of ultraviolet reflections, ultraviolet mode, minimum ultraviolet intensity ratio, and ray direction. In the import from a task method, the ultraviolet parameters are obtained by reading the orbital ultraviolet intensity from the ablation calculation results.
2. The simulation method of the ablation effect of the spacecraft surface material under the autonomous acquisition mode according to claim 1, characterized in that The polygon mesh parameters are obtained by setting the directions of each dimension in the three-dimensional coordinate system where the polygon mesh is located.
3. The simulation method for the ablation effect of spacecraft surface materials in the autonomous acquisition mode according to claim 1, characterized in that The ablated material parameters are obtained by setting atomic oxygen protection material parameters, ultraviolet protection material parameters, or atomic oxygen / ultraviolet combined protection material parameters.
4. The simulation method for the ablation effect of spacecraft surface materials in the autonomous acquisition mode according to claim 3, characterized in that, The atomic oxygen protection material parameters include ablation rate pre-factor, ablation activation energy, ablation rate angular distribution exponent, atomic oxygen reflection probability, atomic oxygen scattering probability, atomic oxygen recombination probability, and critical energy for atomic oxygen adsorption. The ultraviolet protection material parameters include complex refractive index and reflectivity. The atomic oxygen / ultraviolet combined protection material parameters include the combined coefficient of ablation pre-factor and activation energy.
5. The simulation method for the ablation effect of spacecraft surface materials under the autonomous acquisition mode according to claim 1, characterized in that The protective layer parameters include protective layer defect type, protective layer defect size, and protective layer defect distribution.
6. The simulation method for the erosion effect of spacecraft surface materials in the autonomous acquisition mode according to claim 5, characterized in that, The protective layer defect type is obtained by setting square point defects, circular point defects, or line defects.
7. The simulation method of the erosion effect of the spacecraft surface material under the autonomous acquisition mode according to claim 5, characterized in that, The protective layer defect size is obtained by determining the number of the ablation target grid cells on the spacecraft surface and the size of the ablation target grid cells.
8. The simulation method for the erosion effect of the spacecraft surface material under the autonomous acquisition mode according to claim 5, characterized in that The protective layer defect distribution is obtained by determining whether the protective layer is a double-sided protective layer on the top and bottom surfaces.