Device simulation data generation system and device simulation data generation method

Abstract

The application provides a device simulation data generation system and a device simulation data generation method. The device simulation data generation system comprises a storage device and a processor. The storage device stores simulation configuration data and a plurality of modules. The plurality of modules comprises an initial data generation module, a data calculation module and a data generation module. The processor inputs the simulation configuration data to the initial data generation module. The initial data generation module generates initial data according to the simulation configuration data. The data calculation module performs statistical calculation on the initial data to generate statistical characteristic data. Based on the data type in the simulation configuration data, the data generation module generates simulation data according to the simulation configuration data, the initial data and the statistical characteristic data.

Description

TECHNICAL FIELD

[0001] The present application relates to a production equipment data generation technique, in particular to an equipment simulation data generation system and an equipment simulation data generation method. BACKGROUND

[0002] In a digital factory for simulating, evaluating and optimizing products, a monitoring system is used to detect the operation state of the equipment and each production parameter, and to issue a notification and update the parameter corresponding to the operation state. However, in the test phase of the monitoring equipment, simulation data is usually used to evaluate and test the monitoring equipment. Therefore, the authenticity of the simulation data of the production equipment will affect the test effect of the monitoring equipment, and affect the comprehensiveness of the monitoring scene of the monitoring equipment, resulting in damage and misjudgment of the monitoring equipment in actual operation. SUMMARY

[0003] The present application is directed to an equipment simulation data generation system and an equipment simulation data generation method that can generate simulation data conforming to the data type to provide high authenticity of the equipment simulation data.

[0004] According to an embodiment of the present application, the equipment simulation data generation system of the present application comprises a storage device and a processor. The storage device stores a plurality of modules. The plurality of modules comprises an initial data generation module, a data calculation module and a data generation module. The processor is coupled to the storage device and executes the initial data generation module, the data calculation module and the data generation module. The processor inputs simulation configuration data to the initial data generation module to generate initial data through the initial data generation module. The initial data is statistically calculated through the data calculation module to generate statistical feature data, and the simulation data is generated through the data generation module according to the simulation configuration data, the initial data and the statistical feature data. The simulation data conforms to the data type data in the simulation configuration data.

[0005] According to an embodiment of the present application, the equipment simulation data generation method of the present application comprises the following steps: generating initial data according to simulation configuration data through an initial data generation module. The initial data is statistically calculated through a data calculation module to generate statistical feature data. The simulation data is generated through a data generation module according to the simulation configuration data, the initial data and the statistical feature data. The data generation module generates the simulation data according to the data type in the simulation configuration data.

[0006] Based on the above, the device simulation data generation system and the device simulation data generation method can generate simulation data according to the pre-set data type, so that the trend of the simulation data conforms to the specified data mode (fluctuation type, decreasing type, increasing type, etc.). In this way, the simulation data generated by the device simulation data generation system and the device simulation data generation method of the present application can generate simulation data with high authenticity according to the different simulation conditions (wear type or accumulation type) of each device.

[0007] In order to make the above features and advantages of the present application more obvious and easy to understand, the following specific examples are described in detail below, together with the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS

[0008] Figure 1 is a schematic diagram of a device simulation data generation system of an embodiment of the present application;

[0009] Figure 2 is a flowchart of a device simulation data generation method of an embodiment of the present application;

[0010] Figure 3 is a flowchart of a device simulation data generation system of an embodiment of the present application.

[0011] BRIEF DESCRIPTION OF DRAWINGS

[0012] 100: device simulation data generation system;

[0013] 110: processor;

[0014] 120: storage device;

[0015] 121: initial data generation module;

[0016] 122: data calculation module;

[0017] 123: data generation module;

[0018] 1231: normal data generation unit;

[0019] 1232: abnormal data generation unit;

[0020] 124: simulation configuration data;

[0021] 125: normal data mode library;

[0022] 126: abnormal data mode library;

[0023] 127: abnormal probability triggering module;

[0024] 128: data output component;

[0025] 129: result data set;

[0026] S210-S230: Steps. DETAILED DESCRIPTION

[0027] Reference will now be made in detail to the exemplary embodiments of the present application, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts.

[0028] Figure 1 is a schematic diagram of a device simulation data generation system according to an embodiment of the present application. Referring to Figure 1 , the device simulation data generation system 100 includes a processor 110 and a storage device 120. The processor 110 is coupled to the storage device 120. The storage device 120 can store simulation configuration data and a plurality of modules. The processor 110 can access the storage device 120 to execute the plurality of modules. In this embodiment, the plurality of modules includes an initial data generation module 121, a data calculation module 122, and a data generation module 123.

[0029] Figure 2 is a flowchart of a device simulation data generation method according to an embodiment of the present application. Referring to Figure 1 and Figure 2 , the device simulation data generation system 100 according to this embodiment can perform the following steps S210-S230 to generate simulation data corresponding to the simulation configuration data. In step S210, the processor 110 generates initial data according to the simulation configuration data by means of the initial data generation module 121. For example, the processor 110 inputs the simulation configuration data pre-set / selected by a user to the initial data generation module 121, so that the initial data generation module 121 generates the initial data. In this embodiment, the initial data is the first piece / group of data in the simulation data. For example, the initial data can include a serial number 1 and a numerical value 20.

[0030] In step S220, the processor 110 can perform statistical calculation on the initial data by the data calculation module 122 to generate the statistical characteristic data. For example, the processor 110 executes the data calculation module 122 to perform statistical calculation on the initial data by the data calculation module 122 to generate the statistical characteristic data. In step S230, the processor 110 generates the simulation data according to the simulation configuration data, the initial data and the statistical characteristic data by the data generation module 123. That is, the data generation module 123 generates the simulation data according to the simulation configuration data, the initial data and the statistical characteristic data. In this way, the data generation module 123 generates the simulation data according to the data type (e.g. the setting of the simulation data and the trend of the simulation data, etc.) in the simulation configuration data and the parameter setting values (e.g. the mean value, the initial value, the variance, the amount of generated data, the type of abnormal occurrence and the probability of abnormal occurrence, etc.) so that the simulation data has high applicability and high authenticity.

[0031] In an embodiment, the processor 110 can further be coupled with an external or internal database to read / write the simulation data configuration in the database and the simulation configuration set by the user in advance. In another embodiment, the device simulation data generation system 100 can further include a transceiver to receive / transmit the data / setting data transmitted by the client. In this way, the device simulation data generation system 100 of the present application can generate corresponding simulation data according to the selected data type and the parameter setting values, and at the same time, perform statistical calculation on the simulation data each time to calculate again and set the simulation data configuration to match the simulation data, so that the simulation data generated by the device simulation data generation system 100 has the advantage of high authenticity.

[0032] In the present embodiment, the processor 110 may, for example, comprise a central processing unit (CPU), or other programmable general purpose or special purpose microprocessors (Microprocessor), digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuits, ASIC), programmable logic devices (Programmable Logic Device, PLD), other similar processing circuitry, or a combination of these devices. The storage device 120 may, for example, comprise a memory and / or a database. In an embodiment, the storage device 120 may, for example, store simulation configuration data, normal data pattern library, abnormal data pattern library, and result data set. The storage device 120 may, for example, be a non-volatile memory (Non-Volatile Memory, NVM). The storage device 120 may, for example, store related programs, modules, systems, or algorithms for implementing embodiments of the present application, so as to be accessed and executed by the processor 110 to implement related functions and operations described in embodiments of the present application. In an embodiment, the initial data generation module 121, the data calculation module 122, and the data generation module 123, the abnormal probability triggering module, and the data output component may, for example, be implemented in a program language such as JSON (JavaScript Object Notation), Extensible Markup Language (Extensible Markup Language, XML), or YAML, but the present application is not limited thereto. In the present embodiment, the device simulation data generation system 100 may, for example, be implemented in a personal computer (Personal Computer, PC), a local server, or a cloud server, and the present application is not limited thereto. In an embodiment, the device simulation data generation system 100 may, for example, also be integrated in an enterprise resource planning (Enterprise Resource Planning, ERP) system to provide high-fidelity simulation data according to pre-set data types.

[0033] In the present application, the data type can be one of fluctuation type, increment type, increment level type, decrement type, decrement level type, exponential type or linear rule type. And, the processor 110 generates the next set of data in the simulation data to comply with the data type of the previous set of data by the data generation module 123 and the data calculation module 122. In this way, the user can set the data type according to the type of the device to be simulated / simulated, for example, the simulated production device is a tool type device, then the user selects the decrement type data type to simulate the wear and tear of the tool. Or, the device simulation data is water temperature data, then the corresponding data type in the simulation configuration data is increment type, so that the data trend of the simulation data complies with the increment type and is more consistent with the actual device operation. Therefore, the device simulation data generation system 100 and the method thereof of the present application can generate simulation data with high authenticity according to the device simulation setting and the data type.

[0034] Figure 3 is a flowchart of the device simulation data generation system of an embodiment of the present application. Referring to Figure 1 and Figure 3 In the present embodiment, the plurality of modules further include an abnormality probability triggering module 127 and a data output component 128. And, the storage device 120 further stores a normal data pattern library 125, an abnormal data pattern library 126 and a result data set 129. In an embodiment, the data generation module 123 includes a normal data generation unit 1231 and an abnormal data generation unit 1232. In the present application, the data generation module 123 includes the following steps in the step of generating simulation data according to the simulation configuration data 124, the initial data and the statistical characteristic data: the normal data generation unit 1231 of the data generation module 123 performs normal data generation according to the simulation configuration data 124, the initial data and the statistical characteristic data to generate normal pattern data, and the simulation data includes the initial data and the normal pattern data. Then, the normal data generation unit 1231 inputs the simulation data (i.e. the current simulation data) to the abnormal data generation unit 1232. The abnormal data generation unit 1232 generates abnormal pattern data based on the abnormality occurrence probability in the simulation configuration data 124. When the abnormal data generation unit 1232 generates the abnormal pattern data, the simulation data further includes the abnormal pattern data.

[0035] It is worth mentioning that the normal mode data mentioned in the present application is the data generated according to the setting of the normal mode, that is, even the data generated in the normal mode can be greater than the upper and lower threshold values (i.e. upper and lower limits) in the simulation configuration data, for example, the production equipment to be simulated is a wear type equipment, even if the abnormal occurrence probability is not triggered. However, according to the real operation situation and the normal mode data of the present application, the wear type production equipment will still have data exceeding the threshold value after a certain number of uses / time (for example, the number of uses of the wear type production equipment has reached the threshold value and the equipment temperature is too high). Therefore, the equipment simulation data generation system 100 of the present application can not only be used to generate equipment simulation data with high authenticity, but also can be used to simulate the average operation time of the equipment, so that the user can obtain the operation number of various production equipment and the yield before failure through simulation.

[0036] In an embodiment, the storage device 120 also stores a result data set 129. The result data set 129 connects the initial data generation module 121, the data calculation module 122 and the abnormal data generation unit 1232. The result data set 129 is used to store the initial data, the normal mode data, the abnormal mode data, the simulation data each time, the current simulation data and the simulation data. Moreover, the step of generating the simulation data by the data generation module 123 according to the simulation configuration data 124, the initial data and the statistical characteristic data further comprises the following steps: when the abnormal data generation unit 1232 generates the abnormal mode data based on the abnormal occurrence probability, the abnormal data generation unit 1232 performs abnormal data generation to generate the abnormal mode data according to the simulation configuration data 124, the initial data and the current simulation data, and the abnormal data generation unit 1232 takes the abnormal mode data, the initial data and the current simulation data as the current simulation data and inputs the current simulation data to the data calculation module 122 through the result data set 129.

[0037] For example, the normal data generating unit 1231 generates normal pattern data (e.g., serial numbers 2, 3, 4, and values 22, 24, 24.8) according to the average value 25, the variance 2.5 in the simulation configuration data 124, the single data generation quantity 3, the initial data (e.g., serial number 1 and value 20), and the statistical characteristic data. Thus, the simulation data includes the initial data and the normal pattern data (e.g., serial numbers 1 to 4 and values 20, 22, 24, 24.8, respectively). Next, the abnormal data generating unit 1232 generates abnormal pattern data according to the abnormal occurrence probability (e.g., one percent or one thousandth), the abnormal data type (e.g., single-point abnormality, multi-point continuous abnormality, warning-type abnormality, and no-data-type abnormality) in the simulation configuration data 124, and the setting of the abnormal data (e.g., greater than value 25 or less than value 3) in the simulation configuration data 124. Thus, when the abnormal data generating unit 1232 generates abnormal pattern data (e.g., serial numbers 5, 6, 7, and values 29, 30, 30) based on the abnormal occurrence probability, the simulation data (i.e., the current simulation data) includes the initial data, the normal pattern data, and the abnormal pattern data (e.g., serial numbers 1 to 7 and values 20, 22, 24, 24.8, 29, 30, 30). Next, the abnormal data generating unit 1232 stores the current simulation data in the result data set 129, and the data computing module 122 reads the current simulation data from the result data set 129.

[0038] On the other hand, when the abnormal data generating unit 1232 does not generate abnormal pattern data based on the abnormal occurrence probability, the abnormal data generating unit 1232 generates the initial data and the simulation data as the current simulation data (e.g., serial numbers 1 to 4 and values 20, 22, 24, 24.8, respectively). Next, the abnormal data generating unit 1232 inputs the current simulation data to the data computing module 122 through the result data set 129. Thus, the data computing module 122 performs statistical calculation again based on the current simulation data to generate current statistical characteristic data. Furthermore, the processor 110 repeatedly performs normal data generation and abnormal data generation by executing the normal data generating unit 1231 and the abnormal data generating unit 1232, respectively, to obtain simulation data, until the number of the current simulation data (i.e., the current set of initial data, normal pattern data, and abnormal pattern data) meets the data generation quantity in the simulation configuration data 124.

[0039] That is, the device simulation data generation system 100 and the device simulation data generation method repeatedly generate normal mode data and abnormal mode data multiple times by the normal data generation unit 1231 and the abnormal data generation unit 1232 in the data generation module 123. Moreover, the normal mode data and the abnormal mode data generated each time all use the statistical characteristic data of the current simulation data (i.e. the normal mode data of the current each time, the abnormal mode data of the current each time and the initial data) as reference data to make the simulation data highly conform to the set values in the simulation configuration data 124. For example, the data generation module 123 generates a first set of simulation data, stores the first set of simulation data in the result data set 129, then the data calculation module 122 reads the first set of simulation data and the initial data to perform statistical calculation, thereby generating the statistical characteristic data corresponding to the first set of simulation data and the initial data. Then, the data generation module 123 performs data generation again according to the statistical characteristic data, the initial data and the first set of simulation data to generate a second set of simulation data (i.e. including the initial data, the first simulation data and the second simulation data). Similarly, the data generation module 123 stores the second set of simulation data in the result data set 129, and repeats the above statistical characteristic analysis and data generation until the data amount of the simulation data reaches the data generation amount (i.e. the total data amount set value set by the user in advance) in the simulation configuration data 124.

[0040] In an embodiment, the simulation configuration data 124 can store at least one of the normal data type, the starting value, the average value, the numerical maximum value, the numerical minimum value, the abnormal data type, the data type, the abnormal occurrence probability, the data generation amount and the single data amount. The simulation configuration data 124 can be as shown in Table 1 below. Moreover, the initial data can be as shown in Table 2 below, the statistical characteristic data can be as shown in Table 3, the normal mode data can be as shown in Table 4 and the abnormal mode data can be as shown in Table 5.

[0041]

[0042]

[0043] Table 1

[0044] Serial number 1 Value 20

[0045] Table 2

[0046] Total number of data 1 Mean value 20 Maximum value 20 Minimum value 20 Variance 0

[0047] Table 3

[0048]

[0049] Table 4

[0050]

[0051]

[0052] Table 5

[0053] In one embodiment, the storage device 120 comprises a normal data pattern library 125 and an abnormal data pattern library 126. The normal data pattern library 125 stores normal data patterns, and the abnormal data pattern library 126 stores abnormal data patterns. Thus, the normal data generating unit 1231 generates corresponding normal pattern data based on the normal data patterns in the normal data pattern library 125. The abnormal data generating unit 1232 generates abnormal pattern data based on the abnormal data patterns in the abnormal data pattern library 126. For example, the normal data pattern is one of fluctuation type, increment type, increment level type, decrement type, decrement level type, exponential type, linear regular type. The abnormal data pattern is one of single-point abnormality, multi-point continuous abnormality, alarm type abnormality, no data type abnormality, but the present application is not limited thereto.

[0054] In one embodiment, the plurality of modules further comprises an abnormal probability triggering module 127. The abnormal probability triggering module 127 triggers the abnormal data generating unit 1232 to generate abnormal pattern data based on an abnormal occurrence probability. The abnormal occurrence probability comprises at least one abnormal probability corresponding to at least one abnormal state. That is, the simulation data configuration 124 stores at least one abnormal occurrence probability and at least one abnormal state. For example, the abnormal state is cooling water blockage, power failure, and water temperature too high. The corresponding abnormal occurrence probability can be, for example, 1 in 500,000, 1 in 100, and 1 in 1,000, respectively. And each abnormal state corresponds to an abnormal data pattern (i.e. data type). Thus, the abnormal pattern data generated by the device simulation data generation system 100 and the device simulation data generation method can not only cover a plurality of abnormal states, but also generate corresponding abnormal data for different abnormal states and different abnormal occurrence probabilities. Therefore, the device simulation data generation system 100 and its method have the advantages of being applicable to different production devices and generating corresponding abnormal data, thereby being flexible and comprehensive in application to different production devices.

[0055] In one embodiment, the device simulation data generation system 100 further comprises a data output component 128. The data output component 128, for example, a data exchange interface or a data transceiver, is coupled to the storage device 120 and the processor 110. Thus, the data output component 128 is used to output simulation data to an external electronic device. The electronic device / equipment is, for example, a database, a notebook computer, a desktop computer, etc.

[0056] In one embodiment, the result data set 129 can store the initial data, the normal mode data, the abnormal mode data, the current simulation data, and the simulation data according to the columnar storage. The result data set 129 is coupled to the data output component 128 to output the specified data through the data output component 128. For example, the user or the related personnel transmits the data specifying instruction through the data output component 128 or the transceiver. Thus, the processor 110 outputs the specific data (the specified data) through the result data set 129 according to the data specifying instruction.

[0057] In summary, the device simulation data generation system 100 and the device simulation data generation method of the present application can generate simulation data according to the data type. Moreover, each set of simulation data is calculated by the data calculation module 122 to calculate the statistical characteristic data, and then the data generation process is performed. Thus, the simulation data generated by the device simulation data generation system 100 and the method thereof is not simply randomly generated, but causes the adjacent two points to change greatly and present the jumping data trend, resulting in the authenticity of the simulation data. By the simulation configuration data 124 and the characteristics of the statistical characteristic data calculated successively, the data growth trend of the simulation data generated by the device simulation data generation system 100 and the method thereof is highly consistent with the data setting in the simulation configuration data 124, thereby providing the simulation data with high authenticity.

[0058] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement for part or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. An equipment simulation data generation system, characterized by, include: A storage device stores simulation configuration data and multiple modules, wherein the multiple modules include an initial data generation module, a data calculation module, and a data generation module; as well as The processor, coupled to the storage device, executes the initial data generation module, the data calculation module, and the data generation module. The processor inputs the simulated configuration data to the initial data generation module, so that the initial data generation module generates initial data. The data calculation module performs statistical calculations on the initial data to generate statistical feature data. The data generation module generates simulated data based on the simulated configuration data, the initial data, and the statistical feature data, and the data generation module generates the simulated data according to the data type in the simulated configuration data. The data generation module includes a normal data generation unit and an abnormal data generation unit. The normal data generation unit generates normal data based on the simulation configuration data, the initial data, and the statistical feature data to produce normal mode data, and the simulation data includes the initial data and the normal mode data. The abnormal data generation unit generates abnormal pattern data based on the probability of abnormal occurrence in the simulated configuration data, and when the abnormal data generation unit generates the abnormal pattern data, the simulated data also includes the abnormal pattern data. When the abnormal data generation unit generates the abnormal pattern data based on the probability of abnormal occurrence, the abnormal data generation unit performs abnormal data generation to generate the abnormal pattern data according to the simulation configuration data, the initial data, and the current simulation data. The abnormal data generation unit then inputs the abnormal pattern data, the initial data, and the simulation data as the current simulation data into the data calculation module. When the abnormal data generation unit does not generate the abnormal pattern data based on the probability of abnormal occurrence, the abnormal data generation unit uses the initial data and the current simulation data as the current simulation data and inputs them into the data calculation module. The data calculation module performs statistical calculations based on the current simulated data to generate current statistical feature data, and the processor repeatedly executes the normal data generation unit and the abnormal data generation unit to obtain the simulated data until the amount of simulated data matches the amount of data generated in the simulated configuration data.

2. The equipment simulation data generation system of claim 1, wherein, The data type is one of the following: fluctuating, increasing, increasing level, decreasing, decreasing level, exponential, or linear regular, and the processor, through the data generation module and the data calculation module, makes the data of the next set in the simulated data conform to the data type of the previous set.

3. The equipment simulation data generation system of claim 1, wherein, The storage device also stores a normal data pattern library and an abnormal data pattern library. The normal data pattern library stores normal data patterns, and the normal data generation unit generates normal pattern data based on the normal data patterns. The abnormal data pattern library stores abnormal data patterns, and the abnormal data generation unit generates abnormal pattern data based on the abnormal data patterns.

4. The equipment simulation data generation system of claim 1, wherein, The plurality of modules further includes an anomaly probability triggering module, which triggers the anomaly data generation unit to generate the anomaly pattern data based on the anomaly occurrence probability, and the anomaly occurrence probability includes at least one anomaly probability corresponding to at least one anomaly state.

5. The equipment simulation data generation system of claim 1, wherein, The simulated configuration data includes at least one of the following: normal data type, starting value, average value, maximum value, minimum value, abnormal data type, the data type, probability of abnormal occurrence, data generation volume, and single data volume.

6. The device simulation data generation system according to claim 1 further includes a data output component coupled to the storage device and the processor, wherein the data output component is used to output the simulation data to an external electronic device.

7. The equipment simulation data generation system of claim 1, wherein, The storage device also stores the result dataset. The resulting dataset is used to store the initial data, normal mode data, abnormal mode data, current simulation data, and the simulation data.

8. The equipment simulation data generation system of claim 7, wherein, The result dataset stores the initial data, the normal mode data, the abnormal mode data, the current simulation data, and the simulation data in a columnar format, and the result dataset is coupled to a data output component to output specified data through the data output component.

9. A device simulation data generation method characterized by comprising: include: The initial data generation module generates initial data based on the simulation configuration data. The initial data is statistically calculated using the data calculation module to generate statistical feature data. Simulated data is generated by the data generation module based on the simulated configuration data, the initial data, and the statistical feature data, wherein the data generation module generates the simulated data according to the data type in the simulated configuration data. The step of generating the simulation data by the data generation module based on the simulation configuration data, the initial data, and the statistical feature data includes: The normal data generation unit generates normal mode data by performing normal data generation based on the simulated configuration data, the initial data, and the statistical feature data, and the simulated data includes the initial data and the normal mode data. An abnormal data generation unit generates abnormal pattern data based on the probability of abnormal occurrence in the simulated configuration data, and when the abnormal data generation unit generates the abnormal pattern data, the simulated data also includes the abnormal pattern data. When the abnormal data generation unit generates the abnormal pattern data based on the probability of abnormal occurrence, the abnormal data generation unit performs abnormal data generation to generate the abnormal pattern data according to the simulation configuration data, the initial data, and the current simulation data. The abnormal data generation unit then inputs the abnormal pattern data, the initial data, and the simulation data as the current simulation data into the data calculation module. When the abnormal data generation unit does not generate the abnormal pattern data based on the probability of abnormal occurrence, the abnormal data generation unit uses the initial data and the current simulation data as the current simulation data and inputs them into the data calculation module. The data calculation module performs statistical calculations based on the current simulated data to generate current statistical feature data, and repeatedly executes the normal data generation unit and the abnormal data generation unit to obtain the simulated data until the quantity of simulated data matches the data generation quantity in the simulated configuration data.

10. The device simulation data generation method according to claim 9, wherein The data type is one of the following: fluctuating, increasing, increasing level, decreasing, decreasing level, exponential, or linear regular type, and the data generation module and the data calculation module are used to make the data of the next set in the simulation data conform to the data type of the previous set.

11. The device simulation data generation method according to claim 9, wherein Also includes: A normal data pattern is stored in a normal data pattern library, wherein the normal data generation unit generates normal pattern data based on the normal data pattern. Anomaly data patterns are stored in an anomaly data pattern library, wherein the anomaly data generation unit generates anomaly pattern data based on the anomaly data patterns.

12. The device simulation data generation method according to claim 9, wherein Also includes: The abnormality probability triggering module triggers the abnormality data generation unit to generate the abnormality pattern data based on the abnormality occurrence probability, wherein the abnormality occurrence probability includes at least one abnormality probability corresponding to at least one abnormal state.

13. The device simulation data generation method according to claim 9, wherein The simulated configuration data includes at least one of the following: normal data type, starting value, average value, maximum value, minimum value, abnormal data type, the data type, probability of abnormal occurrence, data generation volume, and single data volume.

14. The method for generating equipment simulation data according to claim 9, characterized in that, Also includes: The analog data is output to an external electronic device via a data output component.

15. The method for generating equipment simulation data according to claim 9, characterized in that, Also includes: The result dataset is used to store the initial data, normal mode data, abnormal mode data, current simulation data, and the simulation data.

16. The method for generating equipment simulation data according to claim 15, characterized in that, The result dataset stores the initial data, the normal mode data, the abnormal mode data, the current simulation data, and the simulation data in a columnar format, and is coupled to a data output component to output specified data.

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